MX30UF1G18AC, 1.8V, 1Gb, v1.2

MX30UF1G16(18)AC
1.8V, 1G-bit NAND Flash Memory
MX30UF1G16(18)AC
P/N: PM2140
REV. 1.2, MAY 02, 2016
1
MX30UF1G16(18)AC
Contents
1.FEATURES........................................................................................................................................5
2. GENERAL DESCRIPTIONS..............................................................................................................6
Figure 1. Logic Diagram.......................................................................................................................... 6
2-1. ORDERING INFORMATION....................................................................................................7
3. PIN CONFIGURATIONS....................................................................................................................8
3-1. PIN DESCRIPTIONS..............................................................................................................13
4. BLOCK DIAGRAM...........................................................................................................................15
5. SCHEMATIC CELL LAYOUT AND ADDRESS ASSIGNMENT.......................................................16
Table 1-1. Address Allocation (for x8): MX30UF1G18AC...................................................................... 16
Table 1-2. Address Allocation (for x16): MX30UF1G16AC.................................................................... 16
6. DEVICE OPERATIONS....................................................................................................................17
6-1. Address Input/Command Input/Data Input.........................................................................17
Figure 2. AC Waveforms for Command / Address / Data Latch Timing................................................ 17
Figure 3. AC Waveforms for Address Input Cycle................................................................................. 17
Figure 4. AC Waveforms for Command Input Cycle............................................................................. 18
Figure 5. AC Waveforms for Data Input Cycle...................................................................................... 18
6-2. Page Read.............................................................................................................................19
Figure 6. AC Waveforms for Read Cycle.............................................................................................. 19
Figure 7. AC Waveforms for Read Operation (Intercepted by CE#)..................................................... 20
Figure 8. AC Waveforms for Read Operation (with CE# Don't Care).................................................... 21
Figure 9-1. AC Waveforms for Sequential Data Out Cycle (After Read)............................................... 21
Figure 9-2. AC Waveforms for Sequential Data Out Cycle (After Read) - EDO Mode.......................... 22
Figure 10. AC Waveforms for Random Data Output............................................................................. 23
6-3. Cache Read Sequential........................................................................................................24
Figure 11-1. AC Waveforms for Cache Read Sequential...................................................................... 25
6-4. Cache Read Random............................................................................................................26
Figure 11-2. AC Waveforms for Cache Read Random......................................................................... 27
6-5. Page Program.......................................................................................................................28
Figure 12. AC Waveforms for Program Operation after Command 80H............................................... 28
Figure 13. AC Waveforms for Random Data In (For Page Program).................................................... 29
Figure 14. AC Waveforms for Program Operation with CE# Don't Care............................................... 30
6-6. Cache Program.....................................................................................................................31
Figure 15-1. AC Waveforms for Cache Program ................................................................................. 32
Figure 15-2. AC Waveforms for Sequence of Cache Program ............................................................ 33
6-7. Block Erase...........................................................................................................................34
Figure 16. AC Waveforms for Erase Operation..................................................................................... 34
6-8. ID Read..................................................................................................................................35
P/N: PM2140
REV. 1.2, MAY 02, 2016
2
MX30UF1G16(18)AC
Table 2. ID Codes Read Out by ID Read Command 90H..................................................................... 35
Table 3. The Definition of Byte2~Byte4 of ID Table............................................................................... 36
Figure 17-1. AC Waveforms for ID Read Operation.............................................................................. 37
Figure 17-2. AC Waveforms for ID Read (ONFI Identifier) Operation................................................... 37
6-9. Status Read...........................................................................................................................38
Table 4. Status Output........................................................................................................................... 38
Figure 18. Bit Assignment (HEX Data).................................................................................................. 39
Figure 19. AC Waveforms for Status Read Operation.......................................................................... 39
6-10. Block Protection Status Read ............................................................................................40
Table 5. Block-Protection Status Output............................................................................................... 40
Table 6-1. Address Cycle Definition of Block (For x 8).......................................................................... 40
Table 6-2. Address Cycle Definition of Block (For x 16)........................................................................ 40
Figure 20. AC Waveforms for Block Protection Status Read................................................................ 41
6-11.Reset......................................................................................................................................42
Figure 21. AC waveforms for Reset Operation..................................................................................... 42
6-12. Parameter Page Read (ONFI)...............................................................................................43
Figure 22. AC waveforms for Parameter Page Read (ONFI) Operation .............................................. 43
Figure 23. AC Waveforms for Parameter Page Read (ONFI) Random Operation (For 05h-E0h)........ 44
Table 7. Parameter Page (ONFI).......................................................................................................... 45
6-13. Unique ID Read (ONFI).........................................................................................................46
Figure 24. AC waveforms for Unique ID Read Operation..................................................................... 47
Figure 25. AC waveforms for Unique ID Read Operation (For 05h-E0h).............................................. 48
6-14. Feature Set Operation (ONFI)..............................................................................................49
Table 8-1. Definition of Feature Address............................................................................................... 49
Table 8-2. Sub-Feature Parameter Table of Feature Address - 90h (Array Operation Mode)...............................49
Table 8-3. Sub-Feature Parameter Table of Feature Address - A0h (Block Protection Operation) (Note 1).........49
6-14-1.Set Feature (ONFI).................................................................................................................. 50
Figure 26. AC Waveforms for Set Feature (ONFI) Operation .............................................................. 50
6-14-2.Get Feature (ONFI).................................................................................................................. 51
Figure 27. AC Waveforms for Get Feature (ONFI) Operation............................................................... 51
6-14-3.Secure OTP (One-Time-Programmable) Feature................................................................. 52
Figure 28. AC Waveforms for OTP Data Read..................................................................................... 52
Figure 29. AC Waveforms for OTP Data Read with Random Data Output........................................... 53
Figure 30. AC Waveforms for OTP Data Program................................................................................ 54
Figure 31. AC Waveforms for OTP Data Program with Random Data Input......................................... 55
Figure 32. AC Waveforms for OTP Protection Operation ..................................................................... 56
6-14-4.Block Protection..................................................................................................................... 57
Table 9. Definition of Protection Bits..................................................................................................... 57
Figure 33. PT Pin and Block Protection Mode Operation..................................................................... 58
7.PARAMETERS.................................................................................................................................59
7-1. ABSOLUTE MAXIMUM RATINGS........................................................................................59
Figure 34. Maximum Negative Overshoot Waveform........................................................................... 59
Figure 35. Maximum Positive Overshoot Waveform............................................................................. 59
Table 10. Operating Range................................................................................................................... 60
P/N: PM2140
REV. 1.2, MAY 02, 2016
3
MX30UF1G16(18)AC
Table 11. DC Characteristics................................................................................................................. 60
Table 12. Capacitance........................................................................................................................... 61
Table 13. AC Testing Conditions........................................................................................................... 61
Table 14. Program and Erase Characteristics....................................................................................... 61
Table 15. AC Characteristics................................................................................................................. 62
8. OPERATION MODES: LOGIC AND COMMAND TABLES.............................................................63
Table 16. Logic Table............................................................................................................................ 63
Table 17. HEX Command Table............................................................................................................ 64
8-1. R/B#: Termination for The Ready/Busy# Pin (R/B#).........................................................65
Figure 36. R/B# Pin Timing Information................................................................................................ 66
8-2. Power On/Off Sequence.......................................................................................................67
Figure 37. Power On/Off Sequence ..................................................................................................... 67
8-2-1. WP# Signal ............................................................................................................................ 68
Figure 38-1. Enable Programming of WP# Signal................................................................................ 68
Figure 38-2. Disable Programming of WP# Signal................................................................................... 68
Figure 38-3. Enable Erasing of WP# Signal.......................................................................................... 68
Figure 38-4. Disable Erasing of WP# Signal......................................................................................... 68
9. SOFTWARE ALGORITHM...............................................................................................................69
9-1. Invalid Blocks (Bad Blocks) ................................................................................................69
Figure 39. Bad Blocks........................................................................................................................... 69
Table 18. Valid Blocks........................................................................................................................... 69
9-2. Bad Block Test Flow.............................................................................................................70
Figure 40. Bad Block Test Flow............................................................................................................. 70
9-3. Failure Phenomena for Read/Program/Erase Operations................................................70
Table 19. Failure Modes........................................................................................................................ 70
9-4.Program.................................................................................................................................71
Figure 41. Failure Modes...................................................................................................................... 71
Figure 42. Program Flow Chart............................................................................................................. 71
9-5.Erase......................................................................................................................................71
Figure 43. Erase Flow Chart................................................................................................................. 72
Figure 44. Read Flow Chart.................................................................................................................. 72
10.PACKAGE INFORMATION..............................................................................................................73
11.REVISION HISTORY .......................................................................................................................76
P/N: PM2140
REV. 1.2, MAY 02, 2016
4
MX30UF1G16(18)AC
1.8V 1Gb NAND Flash Memory
1. FEATURES
• 1G-bit
• Hardware Data Protection: WP# pin
SLC NAND Flash
- Bus: x8, x16
• Device Status Indicators
- Page size: (2048+64) byte for x8 bus,
(1024+32) word for x16 bus
- Block size: (128K+4K) byte for x8 bus,
- Ready/Busy (R/B#) pin
- Status Register
• Chip Enable Don't Care
(64K+2K) word for x16 bus
- Plane size:
1024-block/plane x 1
- Simplify System Interface
• Unique ID Read support (ONFI)
• Secure OTP support
• ONFI 1.0 compliant
• Electronic Signature (5 Cycles)
• Multiplexed Command/Address/Data
• High Reliability
• User Redundancy
- Endurance: typical 100K cycles
(with 4-bit ECC per (512+16) Byte)
- 64-byte attached to each page
• Fast Read Access
- Data Retention: 10 years
- Latency of array to register: 25us
• Wide Temperature Operating Range
- Sequential read: 25ns
-40°C to +85°C
• Cache Read Support
• Package:
• Page Program Operation
1) 48-TSOP(I) (12mm x 20mm)
- Page program time: 320us (typ.)
2) 63-ball 9mmx11mm VFBGA
3) 48-ball 6mmx8mm VFBGA
• Cache Program Support
• Block Erase Operation
All packaged devices are RoHS Compliant
and Halogen-free.
- Block erase time: 1ms (typ.)
• Single Voltage Operation:
- VCC: 1.7 ~ 1.95V
• Low Power Dissipation
- Max. 30mA (1.8V)
Active current (Read/Program/Erase)
• Sleep Mode
- 50uA (Max) standby current
P/N: PM2140
REV. 1.2, MAY 02, 2016
5
MX30UF1G16(18)AC
2. GENERAL DESCRIPTIONS
The MX30UF1G16(18)AC is a 1Gb SLC NAND Flash memory devices. Its standard NAND Flash features and
reliable quality of typical P/E cycles 100K (with ECC), which make it most suitable for embedded system code
and data storage.
The product family requires 4-bit ECC per 528B.
This device is typically accessed in pages of 2,112 bytes (x8) or 1,056 words (x16), both for read and for
program operations.
The device's array is organized as thousands of blocks, which is composed by 64 pages of (1,024+32) words
in one single NAND strings structure with 32 serial connected cells in each string. Each page has an additional
32 words for ECC and other purposes. The device has an on-chip buffer of 2,112 bytes or 1,056 words (x16)
for data load and access.
The Cache Read Operation of the MX30UF1G16(18)AC enables first-byte read-access latency of 25us and
sequential read of 25ns and the latency time of next sequential page will be shorten from tR to tRCBSY.
The MX30UF1G16(18)AC power consumption is 30mA during all modes of operations (Read/Program/Erase),
and 50uA in standby mode.
Figure 1. Logic Diagram
ALE
IOx - IO0
CLE
CE#
RE#
1Gb
WE#
R/B#
WP#
PT
P/N: PM2140
REV. 1.2, MAY 02, 2016
6
MX30UF1G16(18)AC
2-1. ORDERING INFORMATION
Part Name Description
MX 30 U F 1G 16A C XK
I
xx
RESERVE
OPERATING TEMPERATURE:
I: Industrial (-40°C to 85°C)
PACKAGE TYPE:
T: 48TSOP
XK: 0.8mm Ball Pitch, 0.45mm Ball Size and 1.0mm height of VFBGA
XQ: 0.8mm Ball Pitch, 0.4mm Ball Size and 1.0mm height of VFBGA
Package: RoHS Compliant & Halogen-free
GENERATION (Tech. Code): C
OPTION CODE:
18A= 4-bit ECC with standard feature, x8, mode A
16A= 4-bit ECC with standard feature, x16, mode A
(Mode A: number of die=1, number of CE#=1, number of R/B#=1)
DENSITY:
1G= 1G-bit
CLASSIFICATION:
F = SLC + Large Block
VOLTAGE:
U = 1.7V to 1.95V
TYPE:
30 = NAND Flash
BRAND:
MX
Please contact Macronix regional sales for the latest product selection and available form factors.
Part Number
Density
Organization
VCC Range
Package
Temperature Grade
MX30UF1G18AC-XKI
1Gb
x8
1.8V
63-VFBGA
Industrial
MX30UF1G16AC-XKI
1Gb
x16
1.8V
63-VFBGA
Industrial
MX30UF1G18AC-TI
1Gb
x8
1.8V
48-TSOP
Industrial
MX30UF1G16AC-XQI
1Gb
x16
1.8V
48-VFBGA
Industrial
MX30UF1G18AC-XQI
1Gb
x8
1.8V
48-VFBGA
Industrial
P/N: PM2140
REV. 1.2, MAY 02, 2016
7
MX30UF1G16(18)AC
3. PIN CONFIGURATIONS
48-TSOP (x8)
NC
NC
NC
NC
NC
NC
R/B#
RE#
CE#
NC
NC
VCC
VSS
NC
NC
CLE
ALE
WE#
WP#
NC
NC
NC
NC
NC
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
VSS1
NC
NC
NC
IO7
IO6
IO5
IO4
NC
VCC1
PT
VCC
VSS
NC
VCC1
NC
IO3
IO2
IO1
IO0
NC
NC
NC
VSS1
Note 1. These pins might not be connected internally. However, it is recommended to connect these pins to power(or ground) as designated for ONFI compatibility.
P/N: PM2140
REV. 1.2, MAY 02, 2016
8
MX30UF1G16(18)AC
48-ball 6mmx8mm VFBGA (x8)
1
2
3
4
5
6
A
WP#
ALE
VSS
CE#
WE#
R/B#
B
VCC
1
RE#
CLE
NC
NC
NC
C
NC
NC
NC
NC
NC
NC
D
NC
NC
NC
NC
VSS
NC
E
NC
VCC
PT
NC
NC
NC
F
NC
I/O0
NC
NC
NC
VCC
G
NC
IO1
NC
VCC
IO5
IO7
H
VSS
IO2
IO3
IO4
I/O6
VSS
1
1
Note 1. These pins might not be connected internally; however, it is recommended to connect these pins to power (or ground) as designated for ONFI compatibility.
P/N: PM2140
REV. 1.2, MAY 02, 2016
9
MX30UF1G16(18)AC
48-ball 6mmx8mm VFBGA (x16)
1
2
A
WP#
ALE
B
VCC
1
C
4
5
VSS
CE#
WE#
R/B#
RE#
CLE
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
VSS
NC
NC
VCC1
PT
I/O13
I/O15
NC
F
I/O8
I/O0
I/O10
I/O12
I/O14
Vcc
G
I/O9
IO1
I/O11
VCC
IO5
IO7
H
VSS
IO2
IO3
IO4
I/O6
VSS
D
E
3
6
1
Note 1. These pins might not be connected internally; however, it is recommended to connect these pins to power (or ground) as designated for ONFI compatibility.
P/N: PM2140
REV. 1.2, MAY 02, 2016
10
MX30UF1G16(18)AC
63-ball 9mmx11mm VFBGA (x8)
1
2
A
NC
NC
B
NC
3
4
6
5
8
7
C
WP#
ALE
Vss
CE#
WE#
R/B#
D
Vcc
1
RE#
CLE
NC
NC
NC
E
NC
NC
NC
NC
NC
NC
F
NC
NC
NC
NC
Vss
1
NC
G
NC
Vcc
PT
NC
NC
NC
H
NC
I/O0
NC
NC
NC
Vcc
J
NC
IO1
NC
Vcc
IO5
IO7
K
Vss
IO2
IO3
IO4
I/O6
Vss
1
9
10
NC
NC
NC
NC
L
NC
NC
NC
NC
M
NC
NC
NC
NC
Note 1. These pins might not be connected internally; however, it is recommended to connect these pins to power (or ground) as designated for ONFI compatibility.
P/N: PM2140
REV. 1.2, MAY 02, 2016
11
MX30UF1G16(18)AC
63-ball 9mmx11mm VFBGA (x16)
1
2
A
NC
NC
B
NC
3
4
6
5
8
7
C
WP#
ALE
Vss
CE#
WE#
R/B#
D
Vcc
1
RE#
CLE
NC
NC
NC
E
NC
NC
NC
NC
NC
NC
F
NC
NC
NC
NC
Vss
1
NC
G
NC
Vcc
1
PT
I/O13
I/O15
NC
H
I/O8
I/O0
I/O10
I/O12
I/O14
Vcc
J
I/O9
IO1
I/O11
Vcc
IO5
IO7
K
Vss
IO2
IO3
IO4
I/O6
Vss
9
10
NC
NC
NC
NC
L
NC
NC
NC
NC
M
NC
NC
NC
NC
Note 1. These pins might not be connected internally; however, it is recommended to connect these pins to power (or ground) as designated for ONFI compatibility.
P/N: PM2140
REV. 1.2, MAY 02, 2016
12
MX30UF1G16(18)AC
3-1. PIN DESCRIPTIONS
SYMBOL
PIN NAME
CE#
Data I/O port: IO7-IO0 for x8 device,
IO15-IO0 for x16 device
Chip Enable (Active Low)
RE#
Read Enable (Active Low)
WE#
Write Enable (Active Low)
CLE
Command Latch Enable
ALE
Address Latch Enable
WP#
Write Protect (Active Low)
R/B#
VSS
Ready/Busy (Open Drain)
Protection (Active High) for entire chip
protection. A weak pull-down internally
Ground
VCC
Power Supply for Device Operation
IOx - IO0
PT
NC
Not Connected Internally
P/N: PM2140
REV. 1.2, MAY 02, 2016
13
MX30UF1G16(18)AC
PIN FUNCTIONS
ADDRESS LATCH ENABLE: ALE
The MX30UF1G16(18)AC device is a sequential
access memory that utilizes multiplexing input of
Command/Address/Data.
The ALE controls the address input. When the ALE
goes high, the address is latched at the rising edge
of WE#.
I/O PORT: IOx - IO0
WRITE PROTECT: WP#
The IOx to IO0 pins are for address/command
input and data output to/from the device. IO7-IO0
pins are for x8 device, IO15-IO0 pins are for x16
device.
The WP# signal keeps low and then the memory will
not accept the program/erase operation. It is recommended to keep WP# pin low during power on/off
sequence. Please refer to the waveform of "Power
On/Off Sequence".
CHIP ENABLE: CE#
The device goes into low-power Standby Mode
when CE# goes high during a read operation and
not at busy stage.
READY/Busy: R/B#
The R/B# is an open-drain output pin. The R/B#
outputs the ready/busy status of read/program/
erase operation of the device. When the R/B# is at
low, the device is busy for read or program or erase
operation. When the R/B# is at high, the read/
program/erase operation is finished.
The CE# goes low to enable the device to be
ready for standard operation. When the CE# goes
high, the device is deselected. However, when the
device is at busy stage, the device will not go to
standby mode when CE# pin goes high.
Please refer to Section 9-1 for details.
READ ENABLE: RE#
PROTECTION: PT
The RE# (Read Enable) allows the data to be
output by a tREA time after the falling edge of
RE#. The internal address counter is automatically
increased by one at the falling edge of RE#.
The PT pin is the hardware method to protect the
whole chip from program/erase operation. When
the PT pin is at high at power-on, the whole chip is
protected even the WP# is at high; the un-protect
command and procedure is necessary before
any program/erase operation. When the PT pin is
connected to low or floating, the Protection function
is disabled.
WRITE ENABLE: WE#
When the WE# goes low, the address/data/
command are latched at the rising edge of WE#.
Please refer to Section - Block Protection for
details.
COMMAND LATCH ENABLE: CLE
The CLE controls the command input. When the
CLE goes high, the command data is latched at
the rising edge of the WE#.
P/N: PM2140
REV. 1.2, MAY 02, 2016
14
MX30UF1G16(18)AC
CE#
High Voltage
Circuit
WE#
WP#
RE#
PT
IO Port
CLE
ALE
Control
Logic
X-DEC
4. BLOCK DIAGRAM
Memory Array
Page Buffer
ADDRESS
COUNTER
Y-DEC
R/B#
IO[x:0]
Data
Buffer
P/N: PM2140
REV. 1.2, MAY 02, 2016
15
MX30UF1G16(18)AC
5. SCHEMATIC CELL LAYOUT AND ADDRESS ASSIGNMENT
The device is a 1Gb single plane device, which is composed by 64 pages of (2,048+64)-byte in two NAND
strings structure with 32 serial connected cells in each string. Each page has an additional 64 bytes for ECC
and other purposes. The device has an on-chip buffer of 2,112 bytes for data load and access. Each 2K-Byte
page has the two area, one is the main area which is 2048-bytes and the other is spare area which is 64-byte.
There are four address cycles for the address allocation, please refer to the lable below.
Table 1-1. Address Allocation (for x8): MX30UF1G18AC
Addresses
IO7
IO6
IO5
IO4
IO3
IO2
IO1
IO0
Column address - 1st cycle
Column address - 2nd cycle
Row address - 3rd cycle
Row address - 4th cycle
A7
L
A19
A27
A6
L
A18
A26
A5
L
A17
A25
A4
L
A16
A24
A3
A11
A15
A23
A2
A10
A14
A22
A1
A9
A13
A21
A0
A8
A12
A20
Table 1-2. Address Allocation (for x16): MX30UF1G16AC
Addresses
IO15-IO8
IO7
IO6
IO5
IO4
IO3
IO2
IO1
IO0
Column address - 1st cycle
Column address - 2nd cycle
Row address - 3rd cycle
Row address - 4th cycle
L
L
L
L
A7
L
A18
A26
A6
L
A17
A25
A5
L
A16
A24
A4
L
A15
A23
A3
L
A14
A22
A2
A10
A13
A21
A1
A9
A12
A20
A0
A8
A11
A19
P/N: PM2140
REV. 1.2, MAY 02, 2016
16
MX30UF1G16(18)AC
6. DEVICE OPERATIONS
6-1. Address Input/Command Input/Data Input
Address input bus operation is for address input to select the memory address. The command input bus
operation is for giving command to the memory. The data input bus is for data input to the memory device.
Figure 2. AC Waveforms for Command / Address / Data Latch Timing
CLE
ALE
CE#
tCS
/
/ tCLS / tALS
tCH tCLH
tWP
WE#
tDS
tDH
IO[x:0]
Figure 3. AC Waveforms for Address Input Cycle
tCLS
CLE
tWC
tWC
tWC
CE#
tWP
tWH
tWP
tWH
tWP
tWH
tWP
WE#
tALS
tALH
ALE
tDS
IO[x:0]
tDH
1st Address
Cycle
tDS
tDH
2nd Address
Cycle
P/N: PM2140
tDS
tDH
3rd Address
Cycle
tDS
tDH
4th Address
Cycle
REV. 1.2, MAY 02, 2016
17
MX30UF1G16(18)AC
Figure 4. AC Waveforms for Command Input Cycle
CLE
tCLS
tCLH
tCS
tCH
CE#
tWP
WE#
tALS
tALH
ALE
tDS
tDH
IO[x:0]
Figure 5. AC Waveforms for Data Input Cycle
tCLH
CLE
tCH
CE#
tWC
tWP
tWH
tWP
tWH
tWP
tWP
WE#
ALE
tALS
tDS
IO[x:0]
tDH
Din0
tDS
tDH
Din1
P/N: PM2140
tDS
tDH
Din2
tDS
tDH
DinN
REV. 1.2, MAY 02, 2016
18
MX30UF1G16(18)AC
6-2. Page Read
The MX30UF1G16(18)AC array is accessed in Page of 2,112 bytes or 1,056 words. External reads begins
after the R/B# pin goes to READY.
The Read operation may also be initiated by writing the 00h command and giving the address (column
and row address) and being confirmed by the 30h command, the device begins the internal read operation
and the chip enters busy state. The data can be read out in sequence after the chip is ready. Refer to the
waveform for Read Operation as below.
If the host side uses a sequential access time (tRC) of less than 30ns, the data can be latched on the next
falling edge of RE# as the waveform of EDO mode (Figure 9-2).
To access the data in the same page randomly, a command of 05h may be written and only column address
following and then confirmed by E0h command.
Figure 6. AC Waveforms for Read Cycle
CLE
tCLS
tCLS
tCLH
tCLH
tCS
CE#
tWC
WE#
tALS
tCHZ
tAR
tALH
tALH
tOH
ALE
tRR
tWB
RE#
tR
tDS
IO[x:0]
tRC
00h
tDH
tDS tDH
1st Address
Cycle
tDS
2nd Address
Cycle
tDH
tDS tDH
3rd Address
Cycle
tDS
tDH
4th Address
Cycle
tREA
tDS tDH
Dout
30h
Dout
R/B#
Busy
P/N: PM2140
REV. 1.2, MAY 02, 2016
19
MX30UF1G16(18)AC
Figure 7. AC Waveforms for Read Operation (Intercepted by CE#)
CLE
CE#
tCHZ
WE#
tAR
ALE
tOH
tRC
RE#
tRR
tWB
tR
IO[x:0]
00h
1st Address
Cycle
2nd Address
Cycle
3rd Address
Cycle
4th Address
Cycle
30h
Dout N
Dout N+1
Dout N+2
R/B#
Busy
P/N: PM2140
REV. 1.2, MAY 02, 2016
20
MX30UF1G16(18)AC
Figure 8. AC Waveforms for Read Operation (with CE# Don't Care)
CLE
CE# Don’t Care
CE#
WE#
ALE
RE#
IO[x:0]
Start Addr (4 Cycles)
00h
Data Output (Sequential)
30h
R/B#
Busy
Note: The CE# "Don't Care" feature may simplify the system interface, which allows controller to directly
download the code from flash device, and the CE# transitions will not stop the read operation
during the latency time.
Figure 9-1. AC Waveforms for Sequential Data Out Cycle (After Read)
t CEA
CE#
tRC
tRP
RE#
t REH
t RP
t RHZ
tREA
IO[x:0]
tOH
Dout0
t REH
t RP
tRHZ
t REA
tOH
Dout1
t REA
t RP
tCOH
t CHZ
t RHZ
tRHZ
t OH
tOH
Dout2
DoutN
tRR
R/B#
P/N: PM2140
REV. 1.2, MAY 02, 2016
21
MX30UF1G16(18)AC
Figure 9-2. AC Waveforms for Sequential Data Out Cycle (After Read) - EDO Mode
t CEA
CE#
tRC
tRP
RE#
t REH
tRHZ
t REA
IO[x:0]
t RP
tRLOH t
Dout0
t REH
tRHZ
REA
t RP
tRLOH t
Dout1
t RP
t REH
t CHZ
t COH
tRHZ
REA
t RLOH
Dout2
tOH
DoutN
tRR
R/B#
P/N: PM2140
REV. 1.2, MAY 02, 2016
22
MX30UF1G16(18)AC
Figure 10. AC Waveforms for Random Data Output
A
tCLR
CLE
CE#
WE#
tAR
ALE
tRHW
tRC
RE#
tRR
tWB
tR
IO[x:0]
00h
1st Address
Cycle
2nd Address
Cycle
3rd Address
Cycle
4th Address
Cycle
30h
Dout M
Dout M+1
05h
R/B#
CLE
Busy
A
CE#
WE#
tWHR
ALE
RE#
tREA
IO[x:0]
05h
A7-A0
A11-A8
E0h
4th Address
Cycle
Dout N
Dout N+1
R/B#
Repeat if needed
P/N: PM2140
REV. 1.2, MAY 02, 2016
23
MX30UF1G16(18)AC
6-3. Cache Read Sequential
The cache read sequential operation is for throughput enhancement by using the internal cache buffer. It
allows the consecutive pages to be read-out without giving next page address, which reduces the latency
time from tR to tRCBSY between pages or blocks. While the data is read out on one page, the data of next
page can be read into the cache buffer.
After writing the 00h command, the column and row address should be given for the start page selection,
and followed by the 30h command for address confirmation. After that, the CACHE READ operation starts
after a latency time tR and following a 31h command with the latency time of tRCBSY, the data can be readout sequentially from 1st column address (A[11:0]=000h for x8; A[10:0]=000h for x16) without giving next
page address input. The 31h command is necessary to confirm the next cache read sequential operation and
followed by a tRCBSY latency time before next page data is necessary. The CACHE READ SEQUENTIAL
command is also valid for the consecutive page cross block.
The random data out (05h-E0h) command set is available to change the column address of the current page
data in the cache register.
The user can check the chip status by the following method:
- R/B# pin ("0" means the data is not ready, "1" means the user can read the data)
- Status Register (SR[6] functions the same as R/B# pin, SR[5] indicates the internal chip operation, "0"
means the chip is in internal operation and "1" means the chip is idle.) Status Register can be checked
after the Read Status command (70h) is issued. Command 00h should be given to return to the cache read
sequential operation.
To confirm the last page to be read-out during the cache read sequential operation, a 3Fh command is
needed to replace the 31h command prior to the last data-out.
P/N: PM2140
REV. 1.2, MAY 02, 2016
24
MX30UF1G16(18)AC
Figure 11-1. AC Waveforms for Cache Read Sequential
A
tCLR
CLE
CE#
WE#
tAR
ALE
tRC
RE#
tRR
tRCBSY
tR
tWB
IO[x:0]
00h
1st Address
Cycle
3rd Address
Cycle
2nd Address
Cycle
4th Address
Cycle
tWB
Page 1
Page 1
Dout 1
Page 1
Dout 0
31h
30h
Dout 2111
R/B#
Busy
Busy
CLE
A
tCLR
tCLR
tAR
tAR
CE#
WE#
ALE
tRC
tRC
RE#
tRR
tRR
tRCBSY
tRCBSY
tWB
tWB
IO[x:0]
Page 1
Dout 2111
Page 2
Dout 0
31h
Page 2
Page 2
Dout 1
Dout 2111
Page 3
Dout 0
3Fh
Page 3
Dout 1
Page 3
Dout 2111
R/B#
Busy
Busy
P/N: PM2140
REV. 1.2, MAY 02, 2016
25
MX30UF1G16(18)AC
6-4. Cache Read Random
The main difference from the Cache Read Sequential operation is the Cache Read Random operation may
allow the random page to be read-out with cache operation not just for the consecutive page only.
After writing the 00h command, the column and row address should be given for the start page selection,
and followed by the 30h command for address confirmation. The column address is ignored in the cache
read random operation. And then, the CACHE READ RANDOM operation starts after a latency time tR and
following a 00h command with the selected page address and following a 31h command, the data can be
read-out sequentially from 1st column address (A[11:0]=000h for x8; A[10:0]=000h for x16) after the latency
time of tRCBSY. After the previous selected page data out, a new selected page address can be given
by writing the 00h-31h command set again. The CACHE READ RANDOM command is also valid for the
consecutive page cross block.
The random data out (05h-E0h) command set is available to change the column address of the current page
data in the cache register.
The user can check the chip status by the following method:
- R/B# pin ("0" means the data is not ready, "1" means the user can read the data)
- Status Register can be checked after the Read Status command (70h) is issued. (SR[6] behaves the same
as R/B# pin, SR[5] indicates the internal chip operation, "0" means the chip is in internal operation and "1"
means the chip is idle.) Command 00h should be given to return to the cache read operation.
To confirm the last page to be read-out during the cache read operation, a 3Fh command is needed to replace
the 31h command prior to the last data-out.
P/N: PM2140
REV. 1.2, MAY 02, 2016
26
MX30UF1G16(18)AC
Figure 11-2. AC Waveforms for Cache Read Random
tCLR
CLE
A
CE#
WE#
tAR
ALE
tRC
RE#
tRR
tR
tWB
tWB
IO[x:0]
00h
1st Address
Cycle
2nd Address 3rd Address
Cycle
Cycle
4th Address
Cycle
1st Address
Cycle
00h
30h
2nd Address 3rd Address
Cycle
Cycle
4th Address
Cycle
tRCBSY
Page n
Dout 0
31h
Page n
Dout 1
Page n
Dout 2111
Page m address
Page n address
R/B#
Busy
Busy
A
CLE
tCLR
CE#
WE#
tAR
ALE
tRC
RE#
tRR
tWB
IO[x:0]
Page n
Dout 0
Page n
Dout 1
Page n
Dout 2111
00h
1st Address
Cycle
2nd Address 3rd Address
Cycle
Cycle
4th Address
Cycle
tRCBSY
Page m
Dout 0
31h
Page m
Dout 1
Page m
Dout 2111
Page x address
R/B#
Busy
P/N: PM2140
REV. 1.2, MAY 02, 2016
27
MX30UF1G16(18)AC
6-5. Page Program
The memory is programmed by page, which is 2,112 bytes, or 1056 words. After Program load command
(80h) is issued and the row and column address is given, the data will be loaded into the chip sequentially.
Random Data Input command (85h) allows multi-data load in non-sequential address. After data load is
complete, program confirm command (10h) is issued to start the page program operation. The page program
operation in a block should start from the low address to high address. Partial program in a page is allowed
up to 4 times. However, the random data input mode for programming a page is allowed and number of times
is not limited.
The status of the program completion can be detected by R/B# pin or Status register bit SR[6].
The program result is shown in the chip status bit (SR[0]). SR[0] = 1 indicates the Page Program is not
successful and SR[0] = 0 means the program operation is successful.
During the Page Program progressing, only the read status register command and reset command are
accepted, others are ignored.
Figure 12. AC Waveforms for Program Operation after Command 80H
CLE
tCLS
tCLH
CE#
tCS
tWC
WE#
tALS
tALH
tWB
tALH
ALE
RE#
tDS
IO[x:0]
80h
tDH
-
1st Address
Cycle
Din
1
-
2nd Address
Cycle
3rd Address
Cycle
Din
N
10h
70h
Status
Output
4th Address
Cycle
tPROG
R/B#
P/N: PM2140
REV. 1.2, MAY 02, 2016
28
MX30UF1G16(18)AC
Figure 13. AC Waveforms for Random Data In (For Page Program)
A
CLE
CE#
tWC
tADL
WE#
ALE
RE#
IO[x:0]
80h
1st Address 2nd Address 3rd Address 4th Address
Din A
Cycle
Cycle
Cycle
Cycle
Din A+N
R/B#
A
CLE
CE#
tWC
tADL
WE#
tWB
ALE
RE#
IO[x:0]
85h
1st Address 2nd Address
Cycle
Cycle
Din B+M
Din B
70h
10h
Status
tPROG
R/B#
Repeat if needed
IO0 = 0; Pass
IO0 = 1; Fail
Note: Random Data In is also supported in cache program.
P/N: PM2140
REV. 1.2, MAY 02, 2016
29
MX30UF1G16(18)AC
Figure 14. AC Waveforms for Program Operation with CE# Don't Care
A
CLE
CE#
WE#
ALE
IO[x:0]
Start Add. (4 Cycles)
80h
Data Input
A
CLE
CE#
WE#
ALE
IO[x:0]
Data Input
Data Input
10h
Note: The CE# "Don't Care" feature may simplify the system interface, which allows the controller to
directly write data into flash device, and the CE# transitions will not stop the program operation
during the latency time.
P/N: PM2140
REV. 1.2, MAY 02, 2016
30
MX30UF1G16(18)AC
6-6. Cache Program
The cache program feature enhances the program performance by using the cache buffer of 2,112-byte or
1,056 words. The serial data can be input to the cache buffer while the previous data stored in the buffer are
programming into the memory cell. Cache Program command sequence is almost the same as page program
command sequence. Only the Program Confirm command (10h) is replaced by cache Program command (15h).
After the Cache Program command (15h) is issued. The user can check the status by the following methods.
- R/B# pin
- Cache Status Bit (SR[6] = 0 indicates the cache is busy; SR[6] = 1 means the cache is ready).
The user can issue another Cache Program Command Sequence after the Cache is ready. The user can
always monitor the chip state by Ready/Busy Status Bit (SR[5]). The user can issues either program confirm
command (10h) or cache program command (15h) for the last page if the user monitor the chip status by
issuing Read Status Command (70h).
However, if the user only monitors the R/B# pin, the user needs to issue the program confirm command (10h)
for the last page.
The user can check the Pass/Fail Status through P/F Status Bit (SR[0]) and Cache P/F Status Bit (SR[1]).
SR[1] represents Pass/Fail Status of the previous page. SR[1] is updated when SR[6] change from 0 to 1 or
Chip is ready. SR[0] shows the Pass/Fail status of the current page. It is updated when SR[5] change from "0"
to "1" or the end of the internal programming. For more details, please refer to the related waveforms.
P/N: PM2140
REV. 1.2, MAY 02, 2016
31
MX30UF1G16(18)AC
Figure 15-1. AC Waveforms for Cache Program
A
CLE
CE#
tADL
tWC
WE#
tWB
ALE
RE#
IO[x:0]
80h
1st Address
Cycle
2nd Address
Cycle
3rd Address
Cycle
4th Address
Cycle
Din
Din
15h
tCBSY
R/B#
Busy
A
CLE
CE#
tADL
WE#
tWB
ALE
RE#
IO[x:0]
80h
1st Address
Cycle
2nd
Address
A11-A8
Cycle
3rd Address
Cycle
4th Address
Cycle
Din
Din
70h
10h
Status
Output
tPROG
R/B#
Note
Busy
Note: It indicates the last page Input & Program.
P/N: PM2140
REV. 1.2, MAY 02, 2016
32
MX30UF1G16(18)AC
Figure 15-2. AC Waveforms for Sequence of Cache Program
A
IO[x:0]
1st Address 2nd Address 3rd Address 4th Address
Cycle
Cycle
Cycle
Cycle
80h
Din
Din
15h
80h
1st Address 2nd Address 3rd Address 4th Address
Cycle
Cycle
Cycle
Cycle
Din
Din
15h
80h
R/B#
Busy - tCBSY
Busy - tCBSY
A
IO[x:0]
80h
1st Address 2nd Address 3rd Address 4th Address
Cycle
Cycle
Cycle
Cycle
Din
Din
15h
80h
1st Address 2nd Address 3rd Address 4th Address
Cycle
Cycle
Cycle
Cycle
Din
Din
10h
70h
R/B#
Busy - tPROG
Busy - tCBSY
Note: tPROG = Page(Last) programming time + Page (Last-1) programming time - Input cycle time of
command & address - Data loading time of page (Last).
Note 2
P/N: PM2140
REV. 1.2, MAY 02, 2016
33
MX30UF1G16(18)AC
6-7. Block Erase
This device supports a block erase command. This command will erase a block of 64 pages associated with
the most significant address bits.
The completion of the erase operation can be detected by R/B# pin or Status register bit (IO6). Recommend
to check the status register bit IO0 after the erase operation completes.
During the erasing process, only the read status register command and reset command can be accepted,
others are ignored.
Figure 16. AC Waveforms for Erase Operation
CLE
tCLS
tCLH
CE#
tCS
tWC
WE#
tALH
tALS
ALE
tWB
RE#
tDS
IO[x:0]
tDH
tDS
tDH
tDS
tDH
60h
70h
D0h
Row Address 1
Row Address ２
Stauts
Output
tERASE
R/B#
P/N: PM2140
REV. 1.2, MAY 02, 2016
34
MX30UF1G16(18)AC
6-8. ID Read
The device contains ID codes that identify the device type and the manufacturer. The ID READ command
sequence includes one command Byte (90h), one address byte (00h). The Read ID command 90h may
provide the manufacturer ID (C2h) of one-byte and device ID (A1h for x8; B1h for x16) of one-byte, also
Byte2, Byte3, and Byte4 ID code are followed.
The device support ONFI Parameter Page Read, by sending the ID Read (90h) command and following one
byte address (20h), the four-byte data returns the value of 4Fh-4Eh-46h-49h for the ASCII code of "O"-"N""F"-"I" to identify the ONFI parameter page.
Table 2. ID Codes Read Out by ID Read Command 90H
ID Code
Byte0-Manufacturer
Byte1: Device ID
Byte2
1Gb, x8, 1.8V
C2h
A1h
80h
1Gb, x16, 1.8V
C2h
B1h
80h
15h
02h
55h
02h
Byte3
Byte4
Note: For x16, high byte is don't care.
P/N: PM2140
REV. 1.2, MAY 02, 2016
35
MX30UF1G16(18)AC
Table 3. The Definition of Byte2~Byte4 of ID Table
Terms
Description
IO7
IO6
IO5
IO4
IO3
IO2
IO1
IO0
0
0
0
1
0
1
1
0
Byte 2
Die# per CE
1
2
Cell type
SLC
# of Simultaneously
Programmed page
1
0
0
2
0
1
Interleaved operations
between Multiple die
Cache Program
Byte 3
Page size
Spare area size
Block size (without spare)
Organization
Sequential access (min.)
Byte 4
ECC level requirement
#Plane per CE
Plane size
Reserved
0
Not supported
Supported
2KB
64B
128KB
x8
x16
25ns
20ns
0
0
1
1
0
1
0
1
0
1
4-bit ECC/512B
1
2
4
1Gb
0
0
0
0
1
0
0
0
1
0
0
0
P/N: PM2140
REV. 1.2, MAY 02, 2016
36
MX30UF1G16(18)AC
Figure 17-1. AC Waveforms for ID Read Operation
CLE
tCLS
tCS
CE#
tCHZ
WE#
tALH
tALS
tAR
ALE
tOH
RE#
tWHR
tDS
IO[x:0]
90h
tREA
tDH
00h
C2h
(note)
(note)
(note)
(note)
Notes:
1. See also Table 2. ID Codes Read Out by ID Read Command 90H.
2. For x16 option, high byte is don't care.
Figure 17-2. AC Waveforms for ID Read (ONFI Identifier) Operation
CLE
tCLS
tCS
CE#
tCHZ
WE#
tALH
tALS
tAR
ALE
tOH
RE#
tWHR
tDS
IO[x:0]
90h
tDH
20h
tREA
4Fh
P/N: PM2140
4Eh
46h
49h
REV. 1.2, MAY 02, 2016
37
MX30UF1G16(18)AC
6-9. Status Read
The MX30UF1G16(18)AC provides a status register that outputs the device status by writing a command
code 70h, and then the IO pins output the status at the falling edge of CE# or RE# which occurs last. Even
though when multiple flash devices are connecting in system and the R/B#pins are common-wired, the two
lines of CE# and RE# may be checked for individual devices status separately.
The status read command 70h will keep the device at the status read mode unless next valid command is
issued. The resulting information is outlined in Table 4 as below.
Table 4. Status Output
Pin
SR[0]
SR[1]
SR[2-4]
SR[5]
SR[6]
SR[7]
Status
Chip Status
Cache Program
Result
Not Used
Related Mode
Page Read, Cache Read,
Page Program, Cache
Program (Page N),
Block Erase
Cache Program
(Page N-1)
Cache Program/Cache
Ready / Busy
Read operation, other Page
(For P/E/R Controller) Program/Block Erase/Read
are same as IO6 (Note 1)
Page Program, Block Erase,
Ready / Busy
Cache Program, Read,
Cache Read (Note 2)
Page Program, Block Erase,
Write Protect
Cache Program, Read
Value
0: Passed
1: Failed 0: Passed
1: Failed
0: Busy
1: Ready
0: Busy
1: Ready
0: Protected
1: Unprotected
Notes:
1. During the actual programming operation, the SR[5] is "0" value; however, when the internal operation is completed during the cache mode, the SR[5] returns to "1".
2. The SR[6] returns to "1" when the internal cache is available to receive new data. The SR[6] value is
consistent with the R/B#.
P/N: PM2140
REV. 1.2, MAY 02, 2016
38
MX30UF1G16(18)AC
The following is an example of a HEX data bit assignment:
Figure 18. Bit Assignment (HEX Data)
Status Read: 70h
0
1
1
1
0
0
0
0
SR7
6
5
4
3
2
1 SR0
Figure 19. AC Waveforms for Status Read Operation
tCLR
CLE
tCLS
tCLH
CE#
tCS
tWP
WE#
tCHZ
tWHR
RE#
tOH
tIR
tDS tDH
IO[x:0]
tREA
Status
Output
70h
P/N: PM2140
REV. 1.2, MAY 02, 2016
39
MX30UF1G16(18)AC
6-10. Block Protection Status Read
The Block Protection Status Read command (7Ah) may check the protect/un-protect status of blocks. The
status output is shown in Table 5. Block Protection Status Output and the address cycle is referred to
Table 6-1 & 6-2. Address Cycle Definition of Block.
Table 5. Block-Protection Status Output
Block-Protection Status
Block is protected, and device is
solid-protected
Block is protected, and device is
not solid-protected
Block is un-protected, and device
is solid-protected
Block is un-protected, and device
is not solid-protected
IO[15:3]
IO2(PT#)
IO1(SP#)
IO0(SP)
x
0
0
1
x
0
1
0
x
1
0
1
x
1
1
0
Note: SP stands for Solid-protected. Once the SP bit sets as 1, the rest of the protection bits (BPx bits,
Invert bit, Complementary bit) cannot be changed during the current power cycle.
Table 6-1. Address Cycle Definition of Block (For x 8)
Address Cycle
IO7
IO6
IO5
IO4
IO3
IO2
IO1
IO0
Block Address 1
A19
A18
L
L
L
L
L
L
Block Address 2
A27
A26
A25
A24
A23
A22
A21
A20
Table 6-2. Address Cycle Definition of Block (For x 16)
Address Cycle
IO15-IO8
IO7
IO6
IO5
IO4
IO3
IO2
IO1
IO0
Block Address 1
L
A18
A17
L
L
L
L
L
L
Block Address 2
L
A26
A25
A24
A23
A22
A21
A20
A19
P/N: PM2140
REV. 1.2, MAY 02, 2016
40
MX30UF1G16(18)AC
Figure 20. AC Waveforms for Block Protection Status Read
CLE
CE#
tWC
WE#
tWHR
ALE
WP#
RE#
IO[x:0]
7Ah
Block
address 1
Status
Output
Block
address 2
R/B#
P/N: PM2140
REV. 1.2, MAY 02, 2016
41
MX30UF1G16(18)AC
6-11. Reset
The reset command FFh resets the read/program/erase operation and clear the status register to be E0h after
chip returns to ready state (when WP# is high). The reset command during the program/erase operation will
result in the content of the selected locations(perform programming/erasing) might be partially programmed/
erased.
If the Flash memory has already been set to reset stage with reset command, the additional new reset
command is invalid.
Figure 21. AC waveforms for Reset Operation
CLE
CE#
WE#
ALE
RE#
tWB
IO[x:0]
FFh
tRST
R/B#
P/N: PM2140
REV. 1.2, MAY 02, 2016
42
MX30UF1G16(18)AC
6-12. Parameter Page Read (ONFI)
The NAND Flash device support ONFI Parameter Page Read and the parameter can be read out by sending
the command of ECh and giving the address 00h. The NAND device information may refer to the table of
parameter page(ONFI), there are three copies of 256-byte data and additional redundant parameter pages.
Once sending the ECh command, the NAND device will remain in the Parameter Page Read mode until next
valid command is sent.
The Random Data Out command set (05h-E0h) can be used to change the parameter location for the specific
parameter data random read out.
The Status Read command (70h) can be used to check the completion with a following read command (00h)
to enable the data out.
Figure 22. AC waveforms for Parameter Page Read (ONFI) Operation
tCLR
CLE
CE#
WE#
tAR
ALE
tRC
RE#
tRR
tWB
tR
IO[x:0]
ECh
Parameter 0
Dout 0
00h
Parameter 0
Dout 1
Parameter 0
Dout 255
Parameter 1
Dout 0
R/B#
Busy
Note: For x16 option, high byte is don't care.
P/N: PM2140
REV. 1.2, MAY 02, 2016
43
MX30UF1G16(18)AC
Figure 23. AC Waveforms for Parameter Page Read (ONFI) Random Operation (For 05h-E0h)
tCLR
CLE
CE#
WE#
tWHR
tAR
ALE
tRC
RE#
tRR
tWB
tR
IO[x:0]
ECh
tREA
Parameter 0
Dout 0
00h
Parameter 0
Dout 1
05h
R/B#
1st Address
Cycle
2nd Address
Cycle
E0h
Parameter m
Dout n
Parameter m
Dout n+1
Repeat if needed
Busy
P/N: PM2140
REV. 1.2, MAY 02, 2016
44
MX30UF1G16(18)AC
Table 7. Parameter Page (ONFI)
Revision Information and Features Block
Description
Data
Byte#
0-3
4-5
Parameter Page Signature
Revision Number
6-7
Features Supported
8-9
10-31
Optional Commands
Supported
Reserved
44-63
64
65-66
67-79
Byte#
80-83
84-85
86-89
90-91
92-95
96-99
100
101
102
103-104
105-106
107
108-109
110
111
112
113
114
115-127
00h
Manufacturer Information Block
Description
Data
Byte#
32-43
1Gb, x8
1Gb, x16
1Gb
4Fh, 4Eh, 46h, 49h
02h, 00h
10h, 00h
11h, 00h
37h, 00h
4Dh,41h,43h,52h,4Fh,4Eh,49h,58h,
20h,20h,20h,20h
4Dh,58h,33h,30h,55h,46h,31h,47h,
MX30UF1G18AC 31h,38h,41h,43h,20h,20h,20h,20h,2
0h,20h,20h,20h,
4Dh,58h,33h,30h,55h,46h,31h,47h,
MX30UF1G16AC 31h,36h,41h,43h,20h,20h,20h,20h,2
0h,20h,20h,20h,
C2h
00h, 00h
00h
Device Manufacturer (12 ASCII characters)
Device Model
(20 ASCII Characters)
JEDEC Manufacturer ID
Date Code
Reserved
Memory Organization Block
Description
Number of Data Bytes per Page
Number of Spare Bytes per Page
Number of Data Bytes per Partial Page
Number of Spare Bytes per Partial Page
Number of Pages per Block
Number of Blocks per Logical Unit
Number of Logical Units (LUNs)
Number of Address Cycles
Number of Bits per Cell
Bad Blocks Maximum per LUN
Block endurance
Guarantee Valid Blocks at Beginning of Target
Block endurance for guaranteed valid blocks
Number of Programs per Page
Partrial Programming Attributes
Number of Bits ECC Correctability
Number of Interleaved Address Bits
Interleaved Operation Attributes
Reserved
P/N: PM2140
2048-byte
64-byte
512-byte
16-byte
Data
00h,08h,00h,00h
40h,00h
00h,02h,00h,00h
10h,00h
40h,00h,00h,00h
00h,04h,00h,00h
01h
22h
01h
14h,00h
01h, 05h
01h
01h, 03h
04h
00h
04h
00h
00h
00h
REV. 1.2, MAY 02, 2016
45
MX30UF1G16(18)AC
Electrical Parameters Block
Description
Byte#
128
Data
I/O Pin Capacitance
0Ah
129-130 Timing Mode Support
131-132 Program Cache Timing Mode Support
25ns
25ns
1Fh,00h
1Fh,00h
133-134 tPROG Maximum Page Program Time (uS)
600us
58h,02h
135-136 tBERS(tERASE) Maximum Block Erase Time (uS)
3,500us
ACh,0Dh
137-138 tR Maximum Page Read Time (uS)
25us
19h,00h
139-140 tCCS Minimum Change Column Setup Time (ns)
80ns
141-163 Reserved
50h,00h
00h
Vendor Blocks
Description
Byte#
Data
164-165 Vendor Specific Revision Number
166-253 Vendor Specific
254-255 Integrity CRC
00h
00h
Set at Test (Note)
Byte#
Data
Redundant Parameter Pages
Description
256-511 Value of Bytes 0-255
512-767 Value of Bytes 0-255
768+
Additional Redundant Parameter Pages
Note: The Integrity CRC (Cycling Redundancy Check) field is used to verify that the contents of the
parameters page were transferred correctly to the host. Please refer to ONFI 1.0 specifications for
details.
The CRC shall be calculated using the following 16-bit generator polynomial:
G(X) = X16 + X15 +X2 + 1
6-13. Unique ID Read (ONFI)
The unique ID is 32-byte and with 16 copies for back-up purpose. After writing the Unique ID read command
(EDh) and following the one address byte (00h), the host may read out the unique ID data. The host need to
XOR the 1st 16-byte unique data and the 2nd 16-byte complement data to get the result, if the result is FFh,
the unique ID data is correct; otherwise, host need to repeat the XOR with the next copy of Unique ID data.
Once sending the EDh command, the NAND device will remain in the Unique ID read mode until next valid
command is sent.
To change the data output location, it is recommended to use the Random Data Out command set (05h-E0h).
The Status Read command (70h) can be used to check the completion. To continue the read operation, a
following read command (00h) to re-enable the data out is necessary.
P/N: PM2140
REV. 1.2, MAY 02, 2016
46
MX30UF1G16(18)AC
Figure 24. AC waveforms for Unique ID Read Operation
tCLR
CLE
CE#
WE#
tAR
ALE
tRC
RE#
tRR
tWB
tR
IO[x:0]
EDh
Unique ID 0
Dout 0
00h
Unique ID 0
Dout 1
Unique ID 0
Dout 31
Unique ID 1
Dout 0
R/B#
Busy
Note: For x16 option, high byte is don't care.
P/N: PM2140
REV. 1.2, MAY 02, 2016
47
MX30UF1G16(18)AC
Figure 25. AC waveforms for Unique ID Read Operation (For 05h-E0h)
tCLR
CLE
CE#
WE#
tWHR
tAR
ALE
tRC
RE#
tRR
tWB
tR
IO[x:0]
EDh
tREA
Unique ID 0
Dout 0
00h
Unique ID 0
Dout 1
05h
R/B#
1st Address
Cycle
2nd Address
Cycle
E0h
Unique ID m
Dout n
Unique ID m
Dout n+1
Repeat if needed
Busy
P/N: PM2140
REV. 1.2, MAY 02, 2016
48
MX30UF1G16(18)AC
6-14. Feature Set Operation (ONFI)
The Feature Set operation is to change the default power-on feature sets by using the Set Feature and Get
Feature command and writing the specific parameter data (P1-P4) on the specific feature addresses. The
NAND device may remain the current feature set until next power cycle since the feature set data is volatile.
However, the reset command (FFh) can not reset the current feature set.
Table 8-1. Definition of Feature Address
Feature Address
00h
02h-7Fh
80h-8Fh, 91h-9Fh,A1h-FFh
90h
A0h
Description
Reserved
Reserved
Reserved
Array Operation Mode
Block Protection Operation
Table 8-2. Sub-Feature Parameter Table of Feature Address - 90h (Array Operation Mode)
Sub Feature
Parameter
Definition
P1
Normal
Array
Operation OTP Operation
Mode
OTP Protection
P2
P3
P4
IO7 IO6 IO5 IO4 IO3 IO2 IO1 IO0
Reserved (0)
Reserved (0)
0
0
Reserved (0)
0
0
Reserved (0)
Reserved (0)
Reserved (0)
0
0
1
Values
Note
0 0000 0000b
1 0000 0001b
1 0000 0011b
0000 0000b
0000 0000b
0000 0000b
*
Note: The value is clear to 00h at power cycle.
Table 8-3. Sub-Feature Parameter Table of Feature Address - A0h (Block Protection Operation) (Note 1)
Sub Feature
Parameter
P1
Definition
Default
Block
mode
Protection
Protection
Operation
Bit Setting
IO7 IO6 IO5 IO4 IO3
0
0
0
0
1
1
1
IO2
IO1
0
0
BP2 BP1 BP0 Invert Complementary
P2
P3
P4
IO0 Values Note
0
38h
2
SP
note 3
4
Reserved (0)
Reserved (0)
Reserved (0)
Notes:
1. If the PT pin is not connected to high, this sub-feature address A0h command is not valid.
2. The value is returned to 38h at power cycle.
3. The value is defined in the "Table 9. Definition of Protection Bits".
4. The SP stands for Solid-Protection. Once the SP bit sets as 1, the rest of protection bits cannot be changed during the current power cycle.
P/N: PM2140
REV. 1.2, MAY 02, 2016
49
MX30UF1G16(18)AC
6-14-1.Set Feature (ONFI)
The Set Feature command is to change the power-on default feature set. After sending the Set Feature
command (EFh) and following specific feature and then input the P1-P4 parameter data to change the default
power-on feature set. Once sending the EFh command, the NAND device will remain in the Set Feature
mode until next valid command is sent.
The Status Read command (70h) may check the completion of the Set Feature.
Figure 26. AC Waveforms for Set Feature (ONFI) Operation
CLE
CE#
tADL
tWC
WE#
tWB
ALE
RE#
IO[x:0]
EFh
Feature
Address
Din
Din
Din
Din
tFEAT
R/B#
Busy
Note: For x16, IO[15:8] should be 00h.
P/N: PM2140
REV. 1.2, MAY 02, 2016
50
MX30UF1G16(18)AC
6-14-2.Get Feature (ONFI)
The Get Feature command is to read sub-feature parameter. After sending the Get Feature command (EEh)
and following specific feature, the host may read out the P1-P4 sub- feature parameter data. Once sending
the EEh command, the NAND device will remain in the Get Feature mode until next valid command is sent.
The Status Read command (70h) can be used to check the completion. To continue the read operation, a
following read command (00h) to re-enable the data out is necessary.
Please refer to the following waveform of Get Feature Operation for details.
Figure 27. AC Waveforms for Get Feature (ONFI) Operation
tCLR
CLE
CE#
WE#
tAR
ALE
tRC
RE#
tRR
tWB
tFEAT
IO[x:0]
EEh
Feature
Address
Feature
Dout 0
Feature
Dout 1
Feature
Dout 2
Feature
Dout 3
R/B#
Busy
Note: For x16 option, the high byte is don't care
P/N: PM2140
REV. 1.2, MAY 02, 2016
51
MX30UF1G16(18)AC
6-14-3.Secure OTP (One-Time-Programmable) Feature
There is an OTP area which has thirty full pages (30 x 2,112-byte) guarantee to be good for system
device serial number storage or other fixed code storage. The OTP area is a non-erasable and one-timeprogrammable area, which is default to “1” and allows whole page or partial page program to be “0”, once the
OTP protection mode is set, the OTP area becomes read-only and cannot be programmed again.
The OTP operation is operated by the Set Feature/ Get Feature operation to access the OTP operation mode
and OTP protection mode.
To check the NAND device is ready or busy in the OTP operation mode, either checking the R/B# or writing
the Status Read command (70h) may collect the status.
To exit the OTP operation or protect mode, it can be done by writing 00h to P1 at feature address 90h.
OTP Read/Program Operation
To enter the OTP operation mode, it is by using the Set Feature command (EFh) and followed by the feature
address (90h) and then input the 01h to P1 and 00h to P2-P4 of sub-Feature Parameter data( please refer to
the sub-Feature Parameter table). After enter the OTP operation mode, the normal Read command (00h-30h)
or Page program( 80h-10h) command can be used to read the OTP area or program it. The address of OTP
is located on the 02h-1Fh of page address.
Besides the normal Read command, the Random Data Output command (05h-E0h) can be used for read
OTP data. However, the Cache Read command is not supported in the OTP area.
Besides the normal page program command, the Random Data Input command (85h) allows multi-data load
in non-sequential address. After data load is completed, a program confirm command (10h) is issued to start
the page program operation. The number of partial-page OTP program is 8 per each OTP page.
Figure 28. AC Waveforms for OTP Data Read
tCLR
CLE
CE#
WE#
tAR
ALE
tRC
RE#
tRR
tR
tWB
IO[x:0]
00h
1st Address 2nd Address
Cycle
Cycle
OTP
Page
00h
Dout 0
30h
Dout 1
Dout n
R/B#
Busy
P/N: PM2140
REV. 1.2, MAY 02, 2016
52
MX30UF1G16(18)AC
Figure 29. AC Waveforms for OTP Data Read with Random Data Output
A
tCLR
CLE
CE#
WE#
tAR
ALE
tRC
RE#
tRHW
tRR
tWB
IO[x:0]
00h
1st Address
Cycle
2nd Address
Cycle
OTP
Page
00h
tR
Dout M
30h
Dout M+1
05h
R/B#
Busy
CLE
A
CE#
WE#
tWHR
ALE
RE#
tREA
IO[x:0]
05h
1st Address
Cycle
2nd Address
Cycle
E0h
Dout N
Dout N+1
R/B#
Repeat if needed
P/N: PM2140
REV. 1.2, MAY 02, 2016
53
MX30UF1G16(18)AC
Figure 30. AC Waveforms for OTP Data Program
CLE
CE#
tADL
WE#
tWB
ALE
RE#
IO[x:0]
80h
1st Address 2nd Address 3rd Address 4th Address
Cycle
Cycle
Cycle
Cycle
Din
Din
70h
10h
Status
Output
tPROG
R/B#
Busy
P/N: PM2140
REV. 1.2, MAY 02, 2016
54
MX30UF1G16(18)AC
Figure 31. AC Waveforms for OTP Data Program with Random Data Input
A
CLE
CE#
tADL
tWC
WE#
ALE
RE#
IO[x:0]
80h
1st Address
Cycle
2nd Address
Cycle
OTP
Page
00h
Din
Din
R/B#
A
CLE
CE#
tADL
WE#
tWB
ALE
RE#
IO[x:0]
85h
1st Address
Cycle
2nd Address
Cycle
Din
Din
70h
10h
Status
Output
tPROG
R/B#
Busy
P/N: PM2140
REV. 1.2, MAY 02, 2016
55
MX30UF1G16(18)AC
OTP Protection Operation
To prevent the further OTP data to be changed, the OTP protection mode operation is necessary. To enter the
OTP protection mode, it can be done by using the Set Feature command (EFh) and followed by the feature
address (90h) and then input the 03h to P1 and 00h to P2-P4 of sub-Feature Parameter data (please refer to
the sub-Feature Parameter table). And then the normal page program command (80h-10h) with the address
00h before the 10h command is required.
The OTP Protection mode is operated by the whole OTP area instead of individual OTP page. Once the OTP
protection mode is set, the OTP area cannot be programmed or unprotected again.
Figure 32. AC Waveforms for OTP Protection Operation
CLE
tCLS
tCLH
CE#
tCS
tWC
WE#
tALS
tALH
tWB
tALH
ALE
RE#
tDS
IO[x:0]
tDH
-
80h
1st Address
Cycle
00h
2nd Address
Cycle
-
00h
00h
10h
70h
Status
Output
Dummy data
input
tPROG
R/B#
P/N: PM2140
REV. 1.2, MAY 02, 2016
56
MX30UF1G16(18)AC
6-14-4.Block Protection
The block protect operation can protect the whole chip or selected blocks from erasing or programming. Through
the PT pin at power-on stage, it decides the block protection operation is enabled or disabled. At power-on, if the
PT pin is connected to high, the block protection operation is enabled, all the blocks are default to be protected from
programming/erasing even the WP# is disabled. If the PT pin is low, block protection operation is disabled. Please
refer to the Figure 33. PT Pin and Block Protection Mode Operation.
When program or erase attempt at a protected block is happened, the R/B# keeps low for the time of tPBSY, and the
Status Read command (70h) may get the 60h result.
There are Temporary Protection/un-Protection and Solid Protection features as below description.
Temporary Protection/un-Protection
At power-on, if the PT pin is connected to high, all the blocks are default to be protected for the BPx protection bits are
all “1”. The Set feature command with feature address A0h followed by the destined protection bits data is necessary
to un-protect those selected blocks before those selected blocks to be updated. The WP# pin needs to connect to
high before writing the Set Feature command for the block protection operation. After the selected blocks are unprotected, those un-protected blocks can be protected again by Block Protection procedure if required.
Solid Protection
The “solid-protection” feature can be set by writing the Set Feature command with address A0h and the “SP” solidprotection bit as “1”, after that, the selected block is solid-protected and cannot be up-protected until next power cycle.
Table 9. Definition of Protection Bits
BP2
0
0
0
0
1
1
1
1
0
0
0
1
1
1
0
0
0
1
1
1
0
0
0
1
1
1
BP1
0
0
1
1
0
0
1
1
0
1
1
0
0
1
0
1
1
0
0
1
0
1
1
0
0
1
BP0
0
1
0
1
0
1
0
1
1
0
1
0
1
0
1
0
1
0
1
0
1
0
1
0
1
0
Invert
x
0
0
0
0
0
0
x
1
1
1
1
1
1
0
0
0
0
0
0
1
1
1
1
1
1
P/N: PM2140
Complementary
x
0
0
0
0
0
0
x
0
0
0
0
0
0
1
1
1
1
1
1
1
1
1
1
1
1
Protection Area
all unlocked
upper 1/64 locked
upper 1/32 locked
upper 1/16 locked
upper 1/8 locked
upper 1/4 locked
upper 1/2 locked
all locked (default)
lower 1/64 locked
lower 1/32 locked
lower 1/16 locked
lower 1/8 locked
lower 1/4 locked
lower 1/2 locked
lower 63/64 locked
lower 31/32 locked
lower 15/16 locked
lower 7/8 locked
lower 3/4 locked
block 0
upper 63/64 locked
upper 31/32 locked
upper 15/16 locked
upper 7/8 locked
upper 3/4 locked
block0
REV. 1.2, MAY 02, 2016
57
MX30UF1G16(18)AC
Figure 33. PT Pin and Block Protection Mode Operation
Power On
PT pin = low
PT pin = high
WP# Protection Mode
Block Protection Mode (PT)
1. WP# pin = low to protect whole chip
2. Block Protection mode disable
1. Blcok Protection mode enable with BPx bit = 1
2. Whole Blocks are protected after power on
Temporary Protection/
Un-Proteciton (By CMD)
1. Set Feature command (EFh) sets BPx bit,
Invert bit and complementary bit value
Block Protection Area (By CMD)
SP bit = 1
Solid Protection Mode
1. Set Feature command with SP bit = 1 fixes
current block protecion/un-protection status
2. Only next Power On cycle can disable
Solid Protection mode
P/N: PM2140
REV. 1.2, MAY 02, 2016
58
MX30UF1G16(18)AC
7. PARAMETERS
7-1. ABSOLUTE MAXIMUM RATINGS
Temperature under Bias
-50°C to +125°C
Storage temperature
-65°C to +150°C
All input voltages with respect to ground (Note 2)
-0.6V to 2.4V
VCC supply voltage with respect to ground (Note 2)
-0.6V to 2.4V
ESD protection
>2000V
Notes:
1. The reliability of device may be impaired by exposing to extreme maximum rating conditions for long range of time.
2. Permanent damage may be caused by the stresses higher than the "Absolute Maximum Ratings"
listed.
3. During voltage transitions, all pins may overshoot to VCC +1.0V or -1.0V for period up to 20ns.
See the two waveforms as below.
Figure 34. Maximum Negative Overshoot Waveform
Figure 35. Maximum Positive Overshoot Waveform
20ns
0V
VCC+1.0V
-1.0V
VCC
20ns
P/N: PM2140
REV. 1.2, MAY 02, 2016
59
MX30UF1G16(18)AC
Table 10. Operating Range
Temperature
-40°C to +85°C
VCC
Tolerance
+1.8V
1.7 ~ 1.95V
Table 11. DC Characteristics
Symbol
Parameter
VIL
Input low level
VIH
Input high level
VOL
VOH
ISB1
ISB2
IST
ICC1
ICC2
ICC3
Test Conditions
Min.
Typical
-0.3
0.8VCC
IOL= 100uA,
Outout low voltage
VCC= VCC Min.
IOH= -100uA,
Outout high voltage
VCC-0.1V
VCC= VCC Min.
CE# = VCC -0.2V,
VCC standby current (CMOS)
WP# = 0/VCC
CE# = VIH Min.,
VCC standby current (TTL)
WP# = 0/VCC
Rise time = 1ms,
Staggered power-up current Line capacitance =
0.1uF
VCC active current
tRC Min., CE# = VIL,
(Sequential Read)
IOUT= 0mA
VCC active current
(Program)
VCC active current (Erase)
10
Max.
Unit Notes
0.2VCC
V
VCC + 0.3
V
0.1
V
1
V
1
50
uA
1
mA
20
30
mA
2
23
30
mA
3
23
30
mA
3
15
30
mA
3
ILI
Input leakage current
VIN= 0 to VCC Max.
+/- 10
uA
ILO
Output leakage current
VOUT= 0 to VCC
Max.
+/- 10
uA
ILO
Output current of R/B# pin
(R/B#)
VOL=0.2V
3
4
mA
1
Notes:
1. The test can be initiated after VCC goes VCC (min) and performed under the condition of 1mS interval.
2. It is necessary to set ILO(R/B#) to be relaxed if the strength of R/B# pull-down is not set to full.
And the VOL/VOH will be relaxed if the strength of I/O drive is not full.
P/N: PM2140
REV. 1.2, MAY 02, 2016
60
MX30UF1G16(18)AC
Table 12. Capacitance
TA = +25°C, F = 1 MHz
Symbol
Parameter
CIN
COUT
Typ.
Max.
Units
Conditions
Input capacitance
10
pF
VIN = 0 V
Output capacitance
10
pF
VOUT = 0 V
Table 13. AC Testing Conditions
Testing Conditions
Value
Unit
0 to VCC
V
1TTL+CL(30)
pF
2.5
VCC/2
VCC/2
ns
V
V
Input pulse level
Output load capacitance
Input rise and fall time
Input timing measurement reference levels
Output timing measurement reference levels
Table 14. Program and Erase Characteristics
Symbol
tPROG
tCBSY (Program)
tRCBSY (Read)
tFEAT
tOBSY
tPBSY
NOP
tERASE (Block)
Parameter
Page programming time
Dummy busy time for cache program
Dummy busy time for cache read
The busy time for Set Feature/ Get Feature
The busy time for OTP program at OTP protection mode
The busy time for program/erase at protected blocks
Number of partial program cycles in same page
Block erase time
P/N: PM2140
Min. Typ. Max. Unit Note
320
5
5
1
600
us
600
us
25
us
1
us
30
us
3
us
4 cycles
3.5
ms
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Table 15. AC Characteristics
Symbol
Parameter
Min. Typical
Max.
Unit
Note
tCLS
tCLH
tCS
tCH
tWP
tALS
CLE setup time
CLE hold time
CE# setup time
CE# hold time
Write pulse width
ALE setup time
10
5
20
5
12
10
ns
ns
ns
ns
ns
ns
1
1
1
1
1
1
tALH
ALE hold time
5
ns
1
tDS
Data setup time
10
ns
1
tDH
Data hold time
5
ns
1
tWC
Write cycle time
25
ns
1
tWH
WE# high hold time
10
ns
1
tADL
70
ns
1
tWW
tRR
Last address latched to data loading time during
program operations
WP# transition to WE# high
Read to RE# falling edge
100
20
ns
ns
1
1
tRP
Read pulse width
12
ns
1
tRC
Read cycle time
25
ns
1
tREA
RE# access time (serial data access)
22
ns
1
tCEA
CE# access time
25
ns
1
tRLOH
RE#-low to data hold time (EDO)
3
ns
tOH
Data output hold time
15
ns
1
tRHZ
RE#-high to output-high impedance
60
ns
1
tCHZ
CE#-high to output-high impedance
50
ns
1
tCOH
CE# high to output hold time
15
ns
tREH
RE# high hold time
10
ns
1
tIR
Output high impedance to RE# falling edge
0
ns
1
tRHW
RE# high to WE# low
60
ns
1
tWHR
WE# high to RE# low
80
ns
1
tR
The data transfering from array to buffer
25
us
1,2
tWB
WE# high to busy
60
ns
1
tCLR
CLE low to RE# low
10
ns
1
tAR
ALE low to RE# low
10
ns
1
tRST
Device reset time (Idle/ Read/ Program/ Erase)
us
1
5/5/10/500
Notes:
1. ONFI Mode 4 compliant
2. The timing spec needs to be relaxed if the I/O drive strength is not full.
P/N: PM2140
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8. OPERATION MODES: LOGIC AND COMMAND TABLES
Address input, command input and data input/output are managed by the CLE, ALE, CE#, WE#, RE# and
WP# signals, as shown in Table 16. Logic Table below.
Program, Erase, Read and Reset are four major operations modes controlled by command sets, please refer
to Table 17.
Table 16. Logic Table
Mode
CE#
RE#
Address Input (Read Mode)
L
Address Input (Write Mode)
WE#
CLE
ALE
WP#
H
L
H
X
L
H
L
H
H
Command Input (Read Mode)
L
H
H
L
X
Command Input (Write Mode)
L
H
H
L
H
Data Input
L
H
L
L
H
Data Output
L
H
L
L
X
During Read (Busy)
X
H
H
L
L
X
During Programming (Busy)
X
X
X
X
X
H
During Erasing (Busy)
X
X
X
X
X
H
Program/Erase Inhibit
X
X
X
X
X
L
Stand-by
H
X
X
X
X
0V/VCC
Notes:
1. H = VIH; L = VIL;
X = VIH or VIL
2. WP# should be biased to CMOS high or CMOS low for stand-by.
P/N: PM2140
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MX30UF1G16(18)AC
Table 17. HEX Command Table
Read Mode
Random Data Input
Random Data Output
Cache Read Random
Cache Read Sequential
Cache Read End
ID Read
Parameter Page Read (ONFI)
Unique ID Read (ONFI)
Set Feature (ONFI)
Get Feature (ONFI)
Reset
Page Program
Cache Program
Block Erase
Status Read
Block Protection Status Read
First Cycle
Second Cycle
00H
85H
05H
00H
31H
3FH
90H
ECH
EDH
EFH
EEH
FFH
80H
80H
60H
70H
7AH
30H
E0H
31H
10H
15H
D0H
-
Acceptable While Busy
V
V
Caution: None of the undefined command inputs can be accepted except for the command set in the above table.
Note: The IO15-IO8 should be "0" while writing command code for the x16 NAND device.
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MX30UF1G16(18)AC
8-1. R/B#: Termination for The Ready/Busy# Pin (R/B#)
The R/B# is an open-drain output pin and a pull-up resistor is necessary to add on the R/B# pin. The R/B#
outputs the ready/busy status of read/program/ erase operation of the device. When the R/B# is at low, the
device is busy for read or program or erase operation. When the R/B# is at high, the read/program/erase
operation is finished.
Rp Value Guidence
The rise time of the R/B# signal depends on the combination of Rp and capacitive loading of the R/B# circuit.
It is approximately two times constants (Tc) between the 10% and 90% points on the R/B# waveform.
TC = R × C
Where R = Rp (Resistance of pull-up resistor), and C = CL (Total capacitive load)
The fall time of the R/B# signal majorly depends on the output impedance of the R/B# signal and the total
load capacitance.
Rp (Min.) =
Vcc (Max.) - VOL (Max.)
IOL+ΣIL
Notes:
1. Considering of the variation of device-by-device, the above data is for reference to decide the resistor value.
2. Rp maximum value depends on the maximum permissible limit of tr.
3. IL is the total sum of the input currents of all devices tied to the R/B pin.
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MX30UF1G16(18)AC
Figure 36. R/B# Pin Timing Information
@ Vcc = 1.8 V, Ta = 25°C, CL=100pF
Tc
800
800ns
600
400
400ns
200
2k
4k
6k
8k
Rp (ohm)
@ Vcc = 1.8 V, Ta = 25°C, CL=100pF
ibusy
0.9
1mA
0.45
0.4mA
0.3
0.23
2k
4k
6k
8k
Rp (ohm)
VCC
VCC
Device
Ready State
Rp
CL
R/B#
~90%
VCC
~90%
VOH
VOH
VOL
VOL
VSS
~10%
tf
P/N: PM2140
Busy State
~10%
tr
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MX30UF1G16(18)AC
8-2. Power On/Off Sequence
After the Chip reaches the power on level (Vth = Vcc min.), the internal power on reset sequence will be
triggered. During the internal power on reset period, no any external command is accepted. There are two
ways to identify the termination of the internal power on reset sequence. Please refer to Figure 37. Power
On/Off Sequence.
•
R/B# pin
•
Wait 1 ms
During the power on and power off sequence, it is recommended to keep the WP# = Low for internal data
protection.
Figure 37. Power On/Off Sequence
VCC (Min.)
Vcc
WP#
CE#
WE#
1 ms (Max.)
10 us (Max.)
R/B#
P/N: PM2140
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MX30UF1G16(18)AC
8-2-1. WP# Signal
WP# going Low can cause program and erase operations automatically reset.
The enabling & disabling of the both operations are as below:
Figure 38-1. Enable Programming of WP# Signal
WE#
IO[x:0]
WP#
Figure 38-2. Disable Programming of WP# Signal
80h
10h
tWW
WE#
IO[x:0]
80h
10h
tWW
WP#
Figure 38-3. Enable Erasing of WP# Signal
WE#
IO[x:0]
WP#
Figure 38-4. Disable Erasing of WP# Signal
60h
D0h
tWW
WE#
IO[x:0]
60h
D0h
tWW
WP#
P/N: PM2140
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MX30UF1G16(18)AC
9. SOFTWARE ALGORITHM
9-1. Invalid Blocks (Bad Blocks)
The bad blocks are included in the device while it gets shipped. During the time of using the device, the
additional bad blocks might be increasing; therefore, it is recommended to check the bad block marks
and avoid using the bad blocks. Furthermore, please read out the bad block information before any erase
operation since it may be cleared by any erase operation.
Figure 39. Bad Blocks
Bad Block
Bad Block
While the device is shipped, the value of all data bytes of the good blocks are FFh. The 1st byte of the 1st
and 2nd page in the spare area for bad block will be 00h for x8; and 0000h for x16. The erase operation at
the bad blocks is not recommended.
After the device is installed in the system, the bad block checking is recommended. The figure shows the brief
test flow by the system software managing the bad blocks while the bad blocks were found. When a block
gets damaged, it should not be used any more.
Due to the blocks are isolated from bit-line by the selected gate, the performance of good blocks will not be
impacted by bad ones.
Table 18. Valid Blocks
Valid (Good)
Block Number
Density
Min.
1Gb
1004
Typ.
Max.
Unit
1024
Block
P/N: PM2140
Remark
Block 0 is guaranteed to be good.
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MX30UF1G16(18)AC
9-2. Bad Block Test Flow
Although the initial bad blocks are marked by the flash vendor, they could be inadvertently erased and
destroyed by a user that does not pay attention to them. To prevent this from occurring, it is necessary to
always know where any bad blocks are located. Continually checking for bad block markers during normal
use would be very time consuming, so it is highly recommended to initially locate all bad blocks and build a
bad block table and reference it during normal NAND flash use. This will prevent having the initial bad block
markers erased by an unexpected program or erase operation. Failure to keep track of bad blocks can be
fatal for the application. For example, if boot code is programmed into a bad block, a boot up failure may
occur. The following section shows the recommended flow for creating a bad block table.
Figure 40. Bad Block Test Flow
Start
Block No. = 0
Yes
(Note1)
Read 00h Check
Bad Block
Create
(or Update)
Bad Block Table
No
Block No. = Block No. + 1
Block No. = 1023
No
Yes
End
Note 1. Read 00h check is at the 1st bytes of the 1st and 2nd pages of the block spare area
9-3. Failure Phenomena for Read/Program/Erase Operations
The device may fail during a Read, Program or Erase operation. The following possible failure modes should
be considered when implementing a highly reliable system:
Table 19. Failure Modes
Failure Mode
Detection and Countermeasure
Sequence
Erase Failure
Status Read after Erase
Block Replacement
Programming Failure
Status Read after Program
Block Replacement
Read Failure
Read Failure
P/N: PM2140
ECC
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MX30UF1G16(18)AC
9-4. Program
It is feasible to reprogram the data into another page (Page B) when an error occurred in Page A by loading
from an external buffer. Then create a bad block table or by using another appropriate scheme to prevent
further system accesses to Page A.
Figure 41. Failure Modes
Program error occurs in Page A
Buffer
Memory
Block
Another good block
Page B
Figure 42. Program Flow Chart
Start
Command 80h
Program
Command
Flow
Set Address
Write Data
Write 10h
Read Status Register
No
SR[6] = 1 ?
(or R/B# = 1 ?)
Yes
* Program Error
No
SR[0] = 0 ?
Yes
Program Completed
9-5. Erase
To prevent future accesses to this bad block, it is feasible to create a table within the system or by using
another appropriate scheme when an error occurs in an Erase operation.
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MX30UF1G16(18)AC
Figure 43. Erase Flow Chart
Start
Command 60h
Set Block Address
Command D0h
Read Status Register
No
SR[6] = 1 ?
(or R/B# = 1 ?)
Yes
No
SR[0] = 0 ?
* Erase Error
Yes
Erase Completed
*
The failed blocks will be identified and given errors
in status register bits for attempts on erasing them.
Figure 44. Read Flow Chart
Start
Command 00h
Set Address
Command 30h
Read Status Register
SR[6] = 1 ?
(or R/B# = 1 ?)
No
Yes
Read Data Out
ECC Generation
ECC handling
by the host controller
Verify ECC
No
Reclaim the Error
Yes
Page Read Completed
P/N: PM2140
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MX30UF1G16(18)AC
10. PACKAGE INFORMATION
P/N: PM2140
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MX30UF1G16(18)AC
Title: Package Outline for 63-VFBGA (9x11x1.0mm, Ball-pitch: 0.8mm, Ball-diameter: 0.45mm)
P/N: PM2140
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MX30UF1G16(18)AC
Title: Package Outline for 48-VFBGA (6x8x1.0mm, Ball-pitch: 0.8mm, Ball-diameter: 0.40mm)
P/N: PM2140
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MX30UF1G16(18)AC
11. REVISION HISTORY
Rev. No.
DescriptionsPage
Date
1.0
1. Removed "Advanced Information" Title
2. Modified Pad Location for 48-ball VFBGA (x8)
ALL
P9
JAN/08/2015
3. Added a note to Figure 15-2. AC Waveforms for Sequence of Cache Program
P31 4. Added Figure 32. PT pin and Block Protection Mode Operation
P54 5. Corrected the Max. value of tRHZ in AC Table.
6. Revised the bad block mark from non-FFh to 00h,
and non-FFFFh to 0000h also revised the page of bad block mark
from 1st or 2nd page to 1st and 2nd page
P58
P65,66
1.1
1. Corrected tALS timing waveform as ALE high till WE# high and tWB timing waveform as WE#high to busy
P26,54 MAR/06/2015
2. Supplement the missing VFBGA package information
P5, 11-12
1.2
1. Modified Ordering Information: (1) "-" in "Part Name Descrition"
(2.) Additional statement
P7
2. Corrected the BGA ball-out from "NC" as "VCC1"/"VSS1" to align the ONFI compatibility
P9-10
3. Added "Block Protection status read" section
P40,41
4. Corrected the value of Feature address 90h
P49
5. Added overshoot/undershoot waveforms
P59
6. Added the tRST=5us for the device reset time from idle
P62
MAY/02/2016
7. Removed redundant Note No. of "Block Protection Status Read" item P64
8. Modification of the power-on/off sequence: supplement the CE# P67
signal, supplement the WE# single waveform with WE#=0 without
toggle during the power-on period.
P/N: PM2140
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MX30UF1G16(18)AC
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P/N: PM2140
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