View detail for AT28C010 Reliability Qualification Report

PAGE 1 OF 10
ATMEL CORPORATION
Tel:(408)441-0311
Fax:(408)436-4200
AT-28C010 CMOS EEPROM RELIABILITY DATA*
- 150C DYNAMIC OPERATING LIFE TEST
- CYCLE TEST
- 200C RETENTION BAKE
- 125C OPERATING LIFE TEST (PLASTIC)
- 150C RETENTION BAKE (PLASTIC)
- 15 PSIG PRESSURE POT
- 85C/85% RELATIVE HUMIDITY OPERATING LIFE TEST
- EXTENDED TEMPERATURE CYCLE
- 131°C/85% RELATIVE HUMIDITY HAST TEST
*This report was generated from AT-28C010 reliability testing.
This data is applicable to the following device types due to
same technology grouping as defined in MIL-M-38535 Appendix A:
AT-28C256
AT-28C040
JULY 2009
2325 Orchard Parkway San Jose CA. 95131
PAGE 2 OF 10
AT-28C010
150C DYNAMIC LIFE TEST
LOT
NUMBER
03307
11158
04329-1
132106-2
131571
133345-3
232270OA
234337
3C3089
4A0594
4A0083
A4A0083
4A1406
4B2397
4C0168
4B1469
4B1968
4B1967
4C2585
4H5229
4H5789
4H5247
5A0544
5F0116
5H1115A
6F0122A
6C0494-1
6H1224
7J0975
DATE
CODE
SAMPLE
SIZE
OD9051
1A9111
1A9112
1B9129
1C9131
1D9150
2C9230
2D9306
3C9341
4A9412
4A9414
4A9421
4A9427
4B9432
4C9436
4B9435
4B9436
4B9438
4C9447
4H9506
4H9508
4H9508
5A9519
5F9527
5H9604
6F9630
6C9638
6H9701
7J9806
77
53
77
76
55
78
45
79
79
80
49
79
77
77
60
75
81
68
78
249
176
113
79
80
80
80
45
80
80
TOTAL
CKT-HRS(K)
77.0
53.0
77.0
76.0
55.0
78.0
45.0
79.0
79.0
80.0
49.0
79.0
77.0
77.0
150.0
187.5
202.5
170.0
195.0
622.5
440.0
282.5
197.5
240.0
80.0
80.0
45.0
80.0
80.0
NUMBER
OF FAILURES
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
FAILURE RATE
TOTAL DEVICE HOURS
BEST ESTIMATE
3,953,500 DEVICE HOURS

= 0.02% PER 1,000 HOURS

EXTRAPOLATION TO 50C VIA
ARRHENNIUS EQUATION AND ACTIVATION
ENERGY OF 0.5eV
= 0.0003% PER 1,000 HOURS (3 FITS)
50C AMBIENT
CONFIDENCE ESTIMATE


60 = 0.0003% PER 1,000 HOURS
60% CONFIDENCE (3 FITS)
90 = 0.0009% PER 1,000 HOURS
90% CONFIDENCE (9 FITS)
PAGE 3 OF 10
AT-28C010
200C DATA RETENTION BAKE
LOT
NUMBER
DATE
CODE
132106-2
131571
232270A-1
4A0083
4B2397
4C0168
4B2397
4C0168
4H5187
4H5247
5A0544
5F0116
6E0122A
6C0494-1
6H1224
7J0975A2
1B9129
1C9131
2C9230
4A9421
4B9432
4C9435
4B9432
4C9436
4H9508
4H9508
5A9519
5F9527
6F9630
6C9638
6H9702
7J9806
SAMPLE
SIZE
TOTAL
CKT-HRS(K)
77
64
45
79
48
59
48
59
190
338
79
80
80
45
80
80
NUMBER
OF FAILURES
77.0
64.0
45.0
79.0
48.0
59.0
48.0
59.0
190.0
338.0
79.0
80.0
80.0
45.0
80.0
80.0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
FAILURE RATE
TOTAL DEVICE HOURS

1,342,000 DEVICE HOURS
BEST ESTIMATE

= 0.06% PER 1,000 HOURS

EXTRAPOLATION TO 50C VIA
ARRHENNIUS EQUATION AND ACTIVATION
ENERGY OF 0.5eV
= 0.0002% PER 1,000 HOURS (2 FITS)
50C AMBIENT
CONFIDENCE ESTIMATE


60 = 0.0002% PER 1,000 HOURS
60% CONFIDENCE (2 FITS)
90 = 0.0006% PER 1,000 HOURS
90% CONFIDENCE (6 FITS)
PAGE 4 OF 10
Data cycling followed by 200C bakes were performed to determine the
device endurance. All addresses were cycled the specified number of
times. The parts were baked and then verified. The results of the
cycling tests are shown below. No device failures have been found.
CYCLE TEST RESULTS OF AT-28C010
LOT
NUMBER
DATE
CODE
SAMPLE
SIZE
03307
OD9051
77
04329-1
1A9112
132106-2
NO. OF
CYCLES
NO. OF
FAILURES
BAKE
TEMP
BAKE
TEMP
10,000
0
200C
176 HRS
77
100,000
0
200C
176 HRS
1B9129
77
10,000
0
200C
176 HRS
4A0594
4A9412
80
10,000
0
200C
176 HRS
4A0083
4A9414
49
10,000
0
200C
176 HRS
A4A0083
4A9421
79
10,000
0
200C
176 HRS
4B2397
4B9432
77
10,000
0
200C
176 HRS
4C0168
4C9436
59
10,000
0
200C
176 HRS
4C2585
4C9447
78
10,000
0
200C
176 HRS
4C2586
4C9449
100
10,000
0
200C
176 HRS
4H5229
4H9506
89
10,000
0
200C
176 HRS
6H3159-1
6H9708
64
10,000
0
200°C
176 HRS
PAGE 5 OF 10
AT28C010
PLASTIC PACKAGE
125C DYNAMIC OPERATING LIFE TEST
LOT
NUMBER
4A1243
4C5253
4H5249
4H5187
5E0344
5E0344
6C3006
7G1008
9G5407
9G5412
4H4250
5F0575
5F0576
7H2476-2
9F0681
DATE
CODE
4A9422
4C9517
4H9524
4H9525
5E9536
5E9536
6C9649
7G9822
9G9937
9G9939
4H0452
5F0513
5F0513
7H0747
9F0916
PKG
32
32
32
32
32
32
32
32
32
32
32
32
32
32
32
SAMPLE
SIZE
PLCC
PLCC
PDIP
PDIP
PLCC
PDIP
PDIP
PDIP
TSOP
TSOP
TSOP
TSOP
TSOP
PLCC
PLCC
TOTAL
CKT-HRS(K)
76
77
219
112
210
249
80
100
100
100
100
160
160
77
80
NUMBER
OF FAILURES
76.0
77.0
219.0
112.0
210.0
249.0
80.0
100.0
100.0
100.0
100.0
160.0
160.0
77.0
80.0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
FAILURE RATE
TOTAL DEVICE HOURS
BEST ESTIMATE
1,900,000 DEVICE HOURS

= 0.03% PER 1,000 HOURS

EXTRAPOLATION TO 50C VIA
ARRHENNIUS EQUATION AND ACTIVATION
ENERGY OF 0.5eV
= 0.001% PER 1,000 HOURS (12 FITS)
50C AMBIENT
CONFIDENCE ESTIMATE


60 = 0.002% PER 1,000 HOURS
60% CONFIDENCE (16 FITS)
90 = 0.004% PER 1,000 HOURS
90% CONFIDENCE (41 FITS)
PAGE 6 OF 10
AT28C010
PLASTIC PACKAGE
150°C RETENTION BAKE
LOT
NUMBER
4A1243
4C2523
4H5249
5E0344
5E0344
6C3006
7G1008
6H3159-1
9G5407
9G5412
4H4250
5F0575
5F0576
7H2476-2
DATE
CODE
4A9422
4C9517
4H9524
5E9536
5E9536
6C9649
7G9822
6H9708
9G9937
9G9939
4H0452
5F0513
5F0513
7H0747
PKG
32
32
32
32
32
32
32
32
32
32
32
32
32
32
SAMPLE
SIZE
PLCC
PLCC
PDIP
PLCC
PDIP
PDIP
PDIP
TSOP
TSOP
TSOP
TSOP
TSOP
TSOP
PLCC
TOTAL
CKT-HRS(K)
39
94
150
84
254
80
100
50
50
50
50
200
200
77
NUMBER
OF FAILURES
39.0
94.0
150.0
84.0
254.0
80.0
100.0
50.0
50.0
50.0
50.0
200.0
200.0
77.0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
FAILURE RATE
TOTAL DEVICE HOURS
BEST ESTIMATE
1,478,000 DEVICE HOURS

= 0.05% PER 1,000 HOURS

EXTRAPOLATION TO 50C VIA
ARRHENNIUS EQUATION AND ACTIVATION
ENERGY OF 0.5eV
= 0.0007% PER 1,000 HOURS (7 FITS)
50C AMBIENT
CONFIDENCE ESTIMATE


60 = 0.0009% PER 1,000 HOURS
60% CONFIDENCE (9 FITS)
90 = 0.002% PER 1,000 HOURS
90% CONFIDENCE (22 FITS)
PAGE 7 OF 10
AT28C010
PLASTIC PACKAGE
85C/85% RELATIVE HUMIDITY OPERATIVE LIFE TEST
LOT
NUMBER
DATE
CODE
PACKAGE
TYPE
SAMPLE
SIZE
NUMBER OF FAILURES
AT INDICATED HOURS
(168)
4B1469
4B9435
32 PLCC
45
0
(500)
0
(1000)
0
PAGE 8 OF 10
AT28C010
PLASTIC PACKAGE
PRESSURE POT TEST
DATE
CODE
PKG
TYPE
SAMPLE
SIZE
NUMBER OF FAILURES
AT INDICATED HOURS
(24)
(48)
(72)
(96)
4A9422
32 PLCC
44
0
0
0
0
4B9426
32 PLCC
47
0
0
0
0
4C9517
32 PLCC
77
0
0
0
0
5E9536
32 PLCC
77
0
0
0
0
7G9822
32 PDIP
50
0
0
0
0
6H9708
32 TSOP
50
0
0
0
0
9G9937
32 TSOP
50
0
0
0
0
9G9939
32 TSOP
50
0
0
0
0
4H0452
32 TSOP
50
0
0
0
0
7H0747
32 PLCC
77
0
0
0
0
9F0916
32 PLCC
77
0
0
0
0
PAGE 9 OF 10
AT28C010
PLASTIC PACKAGE
EXTENDED TEMPERATURE CYCLE
-65°C to +150°C PLCC/TSOP/SOIC/PDIP
-55°C to +125°C CBGA
DATE
CODE
PACKAGE
TYPE
SAMPLE
SIZE
NUMBER OF
CYCLES
NUMBER OF
FAILURES
9G9937
32 TSOP
50
1000
0
9G9939
32 TSOP
50
1000
0
4H0452
32 TSOP
50
1000
0
7H0747
32 PLCC
77
1000
0
9F0916
32 PLCC
77
1000
0
PAGE 10 OF 10
AT28C010
PLASTIC PACKAGE
131C/85% RELATIVE HUMIDITY HAST TEST
LOT
NUMBER
DATE
CODE
PACKAGE
TYPE
SAMPLE
SIZE
NUMBER OF FAILURES
AT INDICATED HOURS
(96)
9G5407
9G9937
32 TSOP
50
0
4H4250
4H0452
32 TSOP
50
0
7H2476-2
7H0747
32 PLCC
77
0
9F0681
9F0916
32 PLCC
77
0