View detail for AT27C256R Reliability Qualification Report

PAGE 1 OF 16
ATMEL CORPORATION
Tel:(408)441-0311
Fax:(408)436-4200
AT-27C256R CMOS EPROM RELIABILITY DATA*
*
-
200C DATA RETENTION BAKE
-
125C DYNAMIC OPERATING LIFE TEST
-
125C HIGH TEMPERATURE REVERSE BIAS (HTRB)
-
TEMPERATURE CYCLE, CENTRIFUGE, FINE AND GROSS
LEAK
-
MECHANICAL SHOCK, VIBRATION VARIABLE FREQUENCY
CONSTANT ACCELERATION, FINE AND GROSS LEAK.
-
TEMPERATURE CYCLING, THERMAL SHOCK, FINE AND
GROSS LEAK
-
INTERNAL WATER-VAPOR CONTENT
-
PROGRAM ERASE CYCLING
-
125C DYNAMIC OPERATING LIFE TEST (PLASTIC)
-
150C DATA RETENTION BAKE (PLASTIC)
-
15 PSIG PRESSURE POT
-
85C, 85% RELATIVE HUMIDITY OPERATING LIFE TEST
This report was generated from AT-27C256R reliability testing.
This data is applicable to the following device types due to
same technology grouping as defined in MIL-M-38535 Appendix A:
AT27C512R
AT27C010
OCTOBER 2008
2325 Orchard Parkway San Jose CA. 95131
PAGE 2 OF 16
AT-27C256R
125C DYNAMIC OPERATING LIFE TEST
LOT
NUMBER
284
285
416-3
419
342
8427
83718
87211
90043
902-1-4003
30067
03128-2
04011-3
08732
10486
10296
10193
10161
131132
132270-13
132278-8
133191-5
233051-14
233717-14
233455-9
234937-7
234938-4
2D1006-2
3A0635
A3B1129-2
A3B1297-1
4A0994
4B0691-5
4D2789
5D0110
6A2912-2
6A0734
6A0734-2
DATE
CODE
9A8908
9B8923
9D9006
OA9022
0D9045
1A9110
1A9105
1B9120
1B9120
1B9120
1B9121
1C9138
1C9136
1C9136
1C9144
2C9237
2C9242
2C9242
2D9306
3A9308
2D9309
3B9319
3B9333
3B9336
4A9420
4B9432
4D9512
5D9602
6A9626
6A9613
6A9613
SAMPLE
SIZE
77
39
27
27
77
77
78
77
78
77
77
77
82
77
80
80
78
78
78
78
78
45
78
58
78
78
80
80
88
84
80
91
80
80
80
254
77
200
TOTAL
CKT-HRS(K)
89.3
58.5
27.0
25.0
77.0
77.0
78.0
77.0
78.0
77.0
77.0
77.0
82.0
77.0
80.0
80.0
78.0
78.0
78.0
78.0
78.0
45.0
78.0
58.0
78.0
78.0
80.0
80.0
88.0
84.0
80.0
91.0
80.0
200.0
200.0
254.0
77.0
200.0
NUMBER
OF FAILURES
0
0
0
0
0
0
0
0
0
0(AT27C256R)
0(R-CSO)
0(R-CSO)
0(R-CSO)
0
0
0
0
0
0
0(R-CSO)
0(R-CSO)
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
PAGE 3 OF 16
AT-27C256R
125C DYNAMIC OPERATING LIFE TEST (CONT’)
LOT
NUMBER
DATE
CODE
6A2912-1
6A2912A
6A2912AA
6A9628
6A9628
6A9627
SAMPLE
SIZE
132
256
256
TOTAL
CKT-HRS(K)
NUMBER
OF FAILURES
132.0
256.0
256.0
0
0
0
FAILURE RATE
TOTAL DEVICE HOURS
BEST ESTIMATE
2,850,800 DEVICE HOURS

= 0.02% PER 1,000 HOURS

EXTRAPOLATION TO 50C VIA ARRHENNIUS
EQUATION AND ACTIVATION ENERGY OF 0.5eV
= 0.001% PER 1,000 HOURS (8 FITS)
50C AMBIENT
CONFIDENCE ESTIMATE


60 = 0.001% PER 1,000 HOURS
60% CONFIDENCE (11 FITS)
90 = 0.003% PER 1,000 HOURS
90% CONFIDENCE (27 FITS)
AT-27C256R
PAGE 4 OF 16
200C DATA RETENTION BAKE
LOT
NUMBER
DATE
CODE
284
285
416-3
419
82243
85294
90685
91792
902
30065
10296
10486
10193
10161
132270-13
132278-8
133464-12
233455-9
234937-7
234938-4
2D1006-2
3A0635
A3B1129-2
3B1297-1
4A0994
4B0691-5
4D1701
4D2789
A6B1214-2
A6B1214-1
6A2912-1
8D8848
9A8920
9B8924
9D9006
0A9022
1B9120
1B9120
1B9120
1B9121
1C9136
1C9141
1D9206
2D9242
2D9306
3A9308
3A9309
3B9319
3B9333
3B9336
4A9420
4B9432
4D9606
409512
6B9627
6B9627
6A9628
SAMPLE
SIZE
23
23
16
16
80
78
78
80
25
45
80
80
79
77
76
78
78
77
80
77
78
80
80
80
77
77
77
77
264
260
150
TOTAL
CKT-HRS(K)
23.0
23.0
16.0
16.0
80.0
78.0
78.0
80.0
25.0
45.0
80.0
80.0
79.0
77.0
76.0
78.0
78.0
77.0
80.0
77.0
78.0
80.0
80.0
80.0
77.0
77.0
77.0
77.0
264.0
260.0
150.0
NUMBER
OF FAILURES
0
0
0
0
0
0
0
0
0
0(R-CSO)
0(R-CSO)
0
0
0
0(R-CSO)
0(R-CSO)
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
FAILURE RATE
TOTAL DEVICE HOURS
1,872,000 DEVICE HOURS
BEST ESTIMATE
 = 0.04% PER 1,000 HOURS
50C AMBIENT
EXTRAPOLATION TO 50C VIA ARRHENNIUS
EQUATION AND ACTIVATION ENERGY OF 0.5eV
 = 0.0001% PER 1,000 HOURS (1 FITS)
CONFIDENCE ESTIMATE
 60 = 0.0002% PER 1,000 HOURS
60% CONFIDENCE (2 FITS)
 90 = 0.0005% PER 1,000 HOURS
90% CONFIDENCE (4 FITS)
AT-27C256R
PAGE 5 OF 16
125C HIGH TEMPERATURE REVERSE BIAS (HTRB)
LOT
NUMBER
SAMPLE
SIZE
TOTAL
CKT-HRS(K)
NUMBER
OF FAILURES
284
46
49.7
0
285
46
45,250
1(Vcc MARGIN)
416-3
33
33.0
0
419
33
33.0
0
30065
77
77.0
0(R-CSO)
02357
75
75.0
0(R-CSO)
FAILURE RATE
TOTAL DEVICE HOURS
312,900 DEVICE HOURS
BEST ESTIMATE
 = 0.054% PER 1,000 HOURS
50C AMBIENT
EXTRAPOLATION TO 50C VIA ARRHENNIUS
EQUATION AND ACTIVATION ENERGY OF 0.5eV
 = 0.017% PER 1,000 HOURS (166 FITS)
CONFIDENCE ESTIMATE
 60 = 0.02% PER
60% CONFIDENCE
 90 = 0.04% PER
90% CONFIDENCE
1,000 HOURS
(200 FITS)
1,000 HOURS
(380 FITS)
PAGE 6 OF 16
AT-27C256R
ENVIRONMENTAL
TEST
SAMPLE
SIZE
CONDITIONS
TEMPERATURE
CYCLING
M-S-883
M-1010
COND C
TA= -65 TO +150C 10 CYCLES
CONSTANT
ACCELERATION
M-S-883
20 KG's
M-2001
COND D
Y, ORIENTATION
FINE LEAK
M-S-883
M-1014
COND B
GROSS LEAK
M-S-883
M-1014
COND C
MECHANICAL SHOC
M-S-883
M-2002
COND B
VIBRATION VAR
FREQUENCY
M-S-883
M-2007
COND A
CONSTANT
ACCELERATION
FINE LEAK
M-S-883
M-2001
COND E
M-S-883
M-1014
COND A1
GROSS LEAK
M-S-883
M-1014
COND C1
TEMPERATURE
CYCLING
M-S-883
M-1010
COND C
TA= -65 TO +150C 10 CYCLES
THERMAL SHOCK
M-S-883
15 CYCLES
M-1011
COND B
FINE LEAK
M-S-883
M-1014
COND A1
GROSS LEAK
M-S-883
M-1014
COND C1
INTERNAL WATERVAPOR CONTENT
M-S-883
M-1018
280 PPM
260 PPM
190 PPM
NUMBER
OF FAILURES
30
0
25
0
77
0
3
0
PAGE 7 OF 16
AT-27C256R
PROGRAM/ ERASE CYCLING
LOT
NUMBER
DATE
CODE
SAMPLE
SIZE
NUMBER OF FAILURES AT CYCLE
10
25
50
902
9D9006
15
0
0
0(R-CSO)
02357
OB9033
80
0
0
0(R-CSO)
08732
1A9105
82
0
0
0
10193
1B9120
79
0
0
0
10161
1B9121
80
0
0
0
132270
1C9136
82
0
0
0(R-CSO)
132278
1C9136
80
0
0
0(R-CSO)
233455-9
2C9242
81
0
0
0
234937-7
2D9306
98
0
0
0
A3B1129-2
3B9333
84
0
0
0
4B0691-5
4B9432
82
0
0
0
4D2789
4D9512
81
0
0
0
PAGE 8 OF 16
AT-27C256R
PLASTIC PACKAGE
125C DYNAMIC OPERATING LIFE TEST
LOT
NUMBER
DATE
CODE
74003
8B8830
9B8923
9C8952
9D9016
0B9028
1A9112
1C9138
1D9146
1D9146
1D9146
1D9152
1D9203
1D9207
2A9213
2B9227
2D9303
3A9308
3A9309
3A9311
3A9311
3C9341
3D9352
4A9416
4B9431
4B9438
4D9504
5D9551
8A9828
8B0010
0C0042
1A0124
2E0215
5F0521
7G0750
91540
94088
97832
014114
132543
13074
130025
131740
131192
131110
133464
132327
232319
234319AN3
234938
2D1007
2D1006
2D1104
3C0058A
3D0611
4A1307
4B0691
4B2366A
4D1701A
5D0444
8A0291A
8B1179
0C1674-1
1A2208
2E1235
5F0742A-1
7G1561-1
SAMPLE
SIZE
20
78
77
39
77
78
49
40
45
34
77
79
80
79
77
77
80
80
77
80
77
77
80
159
80
80
100
250
250
250
250
250
100
100
TOTAL
CKT-HRS(K)
20.0
78.0
77.0
39.0
77.0
78.0
49.0
40.0
45.0
34.0
77.0
79.0
80.0
79.0
77.0
77.0
80.0
80.0
77.0
80.0
77.0
77.0
80.0
159.0
80.0
90.0
100.0
250.0
250.0
250.0
250.0
250.0
100.0
100.0
NUMBER
OF FAILS
0
0
0
0
0
1(LEAKAGE)
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
PAGE 9 OF 16
AT-27C256R
PLASTIC PACKAGE
125C DYNAMIC OPERATING LIFE TEST
LOT
NUMBER
DATE
CODE
SAMPLE
SIZE
TOTAL
CKT-HRS(K)
NUMBER
OF FAILS
FAILURE RATE
TOTAL DEVICE HOURS
3,500,000 DEVICE HOURS
BEST ESTIMATE

= 0.02% PER 1,000 HOURS
50C AMBIENT

EXTRAPOLATION TO 50C VIA ARRHENNIUS
EQUATION AND ACTIVATION ENERGY OF 0.5eV
0.0007% PER 1,000 HOURS (7 FITS)

CONFIDENCE ESTIMATE

60 = 0.0009% PER 1,000 HOURS
60% CONFIDENCE (9 FITS)
90 = 0.002% PER 1,000 HOURS
90% CONFIDENCE (22 FITS)
PAGE 10 OF 16
AT-27C256R
PLASTIC PACKAGE
150C RETENTION BAKE
LOT
NUMBER
DATE
CODE
PKG
TYPE
00301
03155
03128-1
132543
132327
232319
234319
234349BN
234695
234696
234697
234698L
234938
234936
2D1006A
234938
2D1006
2D1104
3C0058A
3D0611
4A0994
4A1272
4B0691
4B0691-3
4B2366A
4D1701
4A0786
5B0675
5D0444
8A0291A
0B1179
0C1674-1
1A2208
2E1234
2E1235
3E0570
4E1206-1
5F0742A-1
7G1561-1
0B9028
0D9045
0D9045
1C9138
2A9213
2B9227
2D9303
2D9303
2D9303
2D9303
2D9303
2D9303
3A9308
3A9309
3A9309
3A9311
3A9311
3A9311
3C9341
3D9352
4A9414
4A9415
4B9431
4B9431
4B9438
4D9504
4A9513
5B9528
5D9550
8A9828
0B0010
0C0042
1A0124
2E0215
2E0215
3E0319
4E0413
5F0521
7G0750
32
32
28
32
32
32
32
32
32
32
32
32
32
32
32
28
28
32
28
32
32
32
32
28
32
32
32
32
32
32
32
32
32
32
32
28
28
32
32
PLCC
PLCC
PDIP
PLCC
PLCC
PLCC
PLCC
PLCC
PLCC
PLCC
PLCC
PLCC
PLCC
PLCC
PLCC
TSOP
TSOP
PLCC
PDIP
PLCC
PLCC
PLCC
PLCC
TSOP
PLCC
PLCC
PLCC
PLCC
PLCC
PLCC
PLCC
PLCC
PLCC
PLCC
PLCC
SOIC
PLCC
PLCC
PDIP
SAMPLE
SIZE
77
50
77
200
77
77
308
154
460
231
462
154
77
76
77
77
78
77
77
77
400
45
192
77
106
80
77
481
279
250
250
250
350
250
250
250
500
50
77
NUMBER OF FAILURES
AT INDICATED HOURS
(250) (500) (1000)
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
PAGE 11 OF 16
AT-27C256R
PLASTIC PACKAGE
150C RETENTION BAKE
LOT
NUMBER
DATE
CODE
PKG
TYPE
SAMPLE
SIZE
NUMBER OF FAILURES
AT INDICATED HOURS
(250) (500) (1000)
FAILURE RATE
TOTAL DEVICE HOURS
8,229,000 DEVICE HOURS
BEST ESTIMATE

= 0.009% PER 1,000 HOURS
50C AMBIENT

EXTRAPOLATION TO 50C VIA ARRHENNIUS
EQUATION AND ACTIVATION ENERGY OF 0.5eV
= 0.0001% PER 1,000 HOURS (1 FITS)

CONFIDENCE ESTIMATE


60 = 0.0002% PER 1,000 HOURS
60% CONFIDENCE (2 FITS)
90 = 0.0004% PER 1,000 HOURS
90% CONFIDENCE (4 FITS)
PAGE 12 OF 16
AT-27C256R
PLASTIC PACKAGE
PRESSURE POT TEST
DATE
CODE
PACKAGE
TYPE
8731
8801
8803
8821
8839
8D8903
9A8912
9C8951
0A9018
0A9018
0B9024
0C9035
0B9037
0C9038
0C9043
0D9044
0D9045
0D9045
1A9105
0D9102
1C9135
1C9133
1C9139
1C9141
1D9151
1D9204
1D9203
2A9210
2A9216
2A9219
2B9221
2B9222
2B9226
2B9226
2B9227
2C9234
2B9236
2D9247
2D9247
2D9248
2D9252
2D9303
6A2912A
28
28
32
28
28
28
28
32
28
32
28
28
32
28
32
32
32
28
28
32
28
32
32
32
32
32
28
32
32
32
32
32
32
28
32
32
32
28
28
28
28
32
32
PDIP
SOIC
PLCC
PDIP
PDIP
PDIP
PDIP
PLCC
PDIP
PLCC
SOIC
SOIC
PLCC
SOIC
PLCC
PLCC
PLCC
PDIP
PDIP
PLCC
PDIP
PLCC
PLCC
PLCC
PLCC
PLCC
PDIP
PLCC
PLCC
PLCC
PLCC
PLCC
PLCC
PDIP
PLCC
PLCC
PLCC
PDIP
SOIC
PDIP
SOIC
PLCC
PLCC
SAMPLE
SIZE
53
41
37
41
42
52
60
15
45
45
45
45
45
45
45
45
45
45
45
45
44
45
45
244
44
45
45
90
45
45
45
90
45
45
90
43
45
45
45
44
44
315
132
NUMBER OF FAILURES
AT INDICATES HOURS
(24) (48) (72) (96)
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
PAGE 13 OF 16
AT-27C256R
PLASTIC PACKAGE
PRESSURE POT TEST (CONT.)
DATE
CODE
PACKAGE
TYPE
3A9309
3A9311
3B9321
3B9341
3C9342
4A9414
4B9431
4B9431
5A9513
5B9528
5D9550
6A9613
6A2912A
6A2912AA
6B1194AB
6B1194B
A6B1214-2
A6B1214-1
A6B1214-2
6B1194AB
6A2912-2
6A2912-2
6A0734
8A0291A
8B0010
0C0042
1A0124
4E0413
5F0521
7G0750
32
28
28
28
28
32
32
28
32
32
32
32
32
32
32
32
32
32
32
32
28
28
32
32
32
32
28
28
32
32
PLCC
TSOP
TSOP
PDIP
PDIP
PLCC
PLCC
TSOP
PLCC
PLCC
PLCC
PLCC
PLCC
PLCC
PLCC
PLCC
PLCC
PLCC
PLCC
PLCC
SOIC
SOIC
PLCC
PLCC
PLCC
PLCC
PDIP
PLCC
PLCC
PLCC
SAMPLE
SIZE
45
90
45
45
92
08
62
91
77
231
77
201
132
45
132
131
132
132
132
132
77
77
51
99
100
98
100
100
50
77
NUMBER OF FAILURES
AT INDICATES HOURS
(24) (48) (72) (96)
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
PAGE 14 OF 16
AT-27C256R
PLASTIC PACKAGE
85C/85% RELATIVE HUMIDITY OPERATING LIFE TEST
LOT
NUMBER
DATE
CODE
PACKAGE
TYPE
SAMPLE
SIZE
NUMBER OF FAILURES
AT INDICATED HOURS
(168) (500) (1000)
8745
28 PDIP
34
0
0
0
9B8923
32 PLCC
49
0
0
0
94088
9D9016
32 PLCC
36
0
0
0
03128-1
0D9045
28 PDIP
45
0
0
0
03155
0D9045
32 PLCC
45
0
0
0
231676
2B9222
32 PLCC
45
0
0
0
2D1006A
3A9309
32 PLCC
45
0
0
0
234938
3A9308
32 PLCC
45
0
0
0
6A2912A
6A9628
32 PLCC
54
0
0
0
PAGE 15 OF 16
Date:
October 7, 1994
Subject:
AT27C256R (18703A) Latchup Characterization
From:
May Lai
To:
G. Korsh, E. Hui, C. Lionbarger, L. Y. Lee
Three packaged parts of the AT27C256R (18703A Stepping) from LOT
#4B0691 were tested for latchup. A curve tracer was used to force
current into each pin and observe the latchup trigger and voltage.
A 9 ohm resistor was connected in parallel across the Vcc power
supply to allow current to be forced out of the Vcc pin during
testing. A separate ammeter was connected in series with the Vcc
power supply to verify when latchup occurred.
The results are shown in page 2 and indicate that the new AT27C256R
(18703A) is quite immune to latchup under normal operating
conditions (Vcc = 5.0V, Room Temperature). Inputs can sustain 4.0V with respect to ground and no latchup is observed. No latchup
is observed for positive input voltages up to 23V where destructive
junction breakdown occurs. Outputs latchup above ±600mA and above
10.0V and -2.7V, except for pin 11 (output 0) which latches at
580mA and 10V.
PAGE 16 OF 16
AT27C256R Latchup Trigger Current and Voltage at 5.5V
LOT #4B0691 (18703A)
Pin
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
Function
VPP
A12
A7
A6
A5
A4
A3
A2
A1
A0
O0
O1
O2
GND
O3
O4
O5
O6
O7
CE
A10
OE
A11
A9
A8
A13
A14
Vcc
-V(Volts) -I(mA)
3.4
4.4
4.6
4.65
4.65
4.8
4.7
4.0
4.0
4.0
2.8
2.7
2.75
>600
>600
>600
>600
>600
>600
>600
>600
>600
>600
>600
>600
>600
2.8
2.7
2.75
2.8
2.8
4.1
4.0
4.9
4.9
4.7
4.65
4.6
4.6
>600
>600
>600
>600
>600
>600
>600
>600
>600
>600
>600
>600
>600
+V (Volts)
+I(mA)
10
10
10
580
>600
>600
10
10
10.2
10
10.2
>600
>600
>600
>600
>600