PIC24FJ128GA310 FAMILY PIC24FJ128GA310 Family Silicon Errata and Data Sheet Clarification The PIC24FJ128GA310 family devices that you have received conform functionally to the current Device Data Sheet (DS30009996G), except for the anomalies described in this document. The silicon issues discussed in the following pages are for silicon revisions with the Device and Revision IDs listed in Table 1. The silicon issues are summarized in Table 2. The errata described in this document will be addressed in future revisions of the PIC24FJ128GA310 family silicon. Note: This document summarizes all silicon errata issues from all revisions of silicon, previous as well as current. Only the issues indicated in the last column of Table 2 apply to the current silicon revision (C0). Data Sheet clarifications and corrections start on Page 6, following the discussion of silicon issues. The silicon revision level can be identified using the current version of MPLAB® IDE and Microchip’s programmers, debuggers and emulation tools, which are available at the Microchip corporate web site (www.microchip.com). TABLE 1: 2. 3. 4. Using the appropriate interface, connect the device to the MPLAB ICD 2 programmer/ debugger or PICkit™ 3. From the main menu in MPLAB IDE, select Configure>Select Device, and then select the target part number in the dialog box. Select the MPLAB hardware tool (Debugger>Select Tool). Perform a “Connect” operation to the device (Debugger>Connect). Depending on the development tool used, the part number and Device Revision ID value appear in the Output window. Note: If you are unable to extract the silicon revision level, please contact your local Microchip sales office for assistance. The DEVREV values for the various PIC24FJ128GA310 family silicon revisions are shown in Table 1. Revision ID for Silicon Revision(2) Device ID(1) PIC24FJ64GA306 46C0h PIC24FJ64GA308 46C4h PIC24FJ64GA310 46C8h PIC24FJ128GA306 46C2h PIC24FJ128GA308 46C6h PIC24FJ128GA310 46CAh 2: 1. SILICON DEVREV VALUES Part Number Note 1: For example, to identify the silicon revision level using MPLAB IDE in conjunction with MPLAB ICD 2 or PICkit™ 3: B2 C0 4 6 The Device IDs (DEVID and DEVREV) are located at the last two implemented addresses of configuration memory space. They are shown in hexadecimal in the format, “DEVID DEVREV”. Refer to the “PIC24FJXXXDA1/DA2/GB2/GA3/GC0 Families Flash Programming Specification” (DS39970) for detailed information on Device and Revision IDs for your specific device. 2011-2014 Microchip Technology Inc. DS80000532G-page 1 PIC24FJ128GA310 FAMILY TABLE 2: SILICON ISSUE SUMMARY Module Feature Item Number Affected Revisions(1) Issue Summary B2 C0 A/D Threshold Detect 1. Auto-scan feature may not trigger correctly in Sleep mode. X A/D Threshold Detect 2. In Auto-scan mode, the highest number A/D channel may not cause an interrupt. X A/D Accuracy 3. Noise injection on A/D input pin during A/D operation (when reading a high-impedance input). X X Core VBAT mode 4. VBTBOR (CW3<7>) is not functional. X X 5. During a Power-on Reset, the RTCC may be enabled. X 6. DNL will not meet data sheet specifications and possible missing codes. X RTCC A/D — DNL Core Deep Sleep 7. IPD maximum numbers are higher than in the data sheet. X A/D DMA PIA Mode 8. DMA with A/D in PIA mode will not work. X X Reset Low-Voltage/ Retention Sleep 9. POR and BOR bits may get set after Reset. X X X — 10. Band gap input (VBG/2) is not functional. X Reset VBAT and POR 11. POR failure without proper voltage on VBAT pin. X LCD SEG37 12. LCD pin, SEG37, does not work on 80-pin devices. X X Power-on Reset POR 13. Power-on Reset is not getting reinitialized. X X A/D Note 1: Only those issues indicated in the last column apply to the current silicon revision. DS80000532G-page 2 2011-2014 Microchip Technology Inc. PIC24FJ128GA310 FAMILY Silicon Errata Issues Note: Corrections are shown in bold. Where possible, the original bold text formatting. 1. Module: A/D (Threshold Detect) When the auto-scan feature of the Threshold Detect is enabled (AD1CON5<15> = 1), automatic scan may fail when these conditions occur together: • The Device is in Sleep mode, and • Timer1 is selected as the sample trigger clock source (AD1CON1<7:4> = 0110). Timer1 and other timers will function correctly as sample triggers in other power-saving modes, such as Idle mode. Work around Use INT0 to trigger the A/D in Sleep mode. Affected Silicon Revisions B2 C0 X 2. Module: A/D (Threshold Detect) In Auto-Scan mode (AD1CON5<15> = 1), when the Auto-Scan Interrupt mode bits are set to ‘11’ (AD1CON5<9:8> = 11), the highest number channel selected for scanning in AD1CSSL, or AD1CSSH, may not trigger an interrupt on a valid comparison. Work around Add a dummy channel to the scanning sequence. For example, when scanning AN0 and AN1, set AD1CSSL to 0x0007 or 0x8003, or whatever is practical given the implementation. Also, if the highest number channel needs to be scanned, the AD1CHITH bit can be polled to observe a valid comparison. 3. Module: A/D (Accuracy) Noise injection on the A/D input pin during A/D operation (when reading a high-impedance input) may adversely affect the conversion results. Work around Increase the sample time for the channel that is being converted or reduce the source impedance. Affected Silicon Revisions B2 C0 X X 4. Module: Core (VBAT Mode) VBTBOR (CW3<7>) will not work correctly. The behavior of this bit is different in Revision B2 and C0. In Revision B2, it does not matter if this bit (CW3<7>) is ‘1’ or ‘0’, the feature will not work. In Revision C0, the feature is available but may not work correctly, so it is recommended to maintain CW3<7> = 0 to disable the VBTBOR. If the bit is maintained as ‘1’, the RTCC may be reset above VBT voltage (1.6V). Work around The application can monitor the VBAT voltage using ADC after a POR in VBAT mode. The ADC is internally connected to VBAT to measure VBAT/2 (CH0SB<4:0>= 11111). The VBAT can be monitored using ADC, and if the VBAT has gone below VBT (1.6V), RTCC needs to be reconfigured with the correct date and time. Affected Silicon Revisions B2 C0 X X Affected Silicon Revisions B2 C0 X 2011-2014 Microchip Technology Inc. DS80000532G-page 3 PIC24FJ128GA310 FAMILY 5. Module: RTCC After a POR, execute the code shown in Example 1 to disable the RTCC. During a Power-on Reset, the RTCC may be enabled. Affected Silicon Revisions Work around B2 To ensure that the RTCC is not enabled, make sure to clear the RTCEN bit after a POR. This is recommended whether RTCC is used or not. EXAMPLE 1: C0 X DISABLING THE RTCC FOLLOWING POR MOV #NVMKEY, W1 MOV #0x55, W2 MOV W2, [W1] MOV #0xAA, W3 MOV W3, [W1] BSET RCFGCAL, #13 RCFGCALbits.RTCEN=0; ;move the address of NVMKEY into W1 ;start 55/AA sequence ;set the RTCWREN bit 6. Module: A/D 8. Module: A/D The DNL will not meet the data sheet specification; the DNL will be 1.5. There may be possible missing codes in 12-bit mode in locations: 511, 1023, 1535, 2047, 2559, 3071, 3583. The A/D will not work with DMA in PIA mode. Work around Affected Silicon Revisions None. None. B2 Affected Silicon Revisions B2 Work around C0 X C0 X 9. Module: Reset 7. Module: Core (Deep Sleep) The IPD maximum number for Deep Sleep may not meet the data sheet specification (DC70). The maximum value for Deep Sleep at 3.3V will be 6 µA. When the device is in Low-Voltage/Retention Sleep (Sleep with CW1<10> = 0 and RETEN = 1), if a Master Clear Reset is given, the POR (RCON<0>) and BOR (RCON<1>) bits may get set after the Reset. Work around None. Use registers, such as DSGPR0 or DSGPR1, to indicate the device was in Low-Voltage/Retention Sleep before the MCLR Reset is given. Affected Silicon Revisions Affected Silicon Revisions Work around B2 C0 B2 C0 X X X X DS80000532G-page 4 2011-2014 Microchip Technology Inc. PIC24FJ128GA310 FAMILY 10. Module: A/D The internal VBG/2 input channel is not functional. When this input is selected as the channel to be converted, no conversion will occur and a device Reset will occur. Work around 12. Module: LCD LCD segment, SEG37, will not function as an LCD segment pin. The issue only exists on the 80-pin devices (PIC24FJ128GA308 and PIC24FJ64GA308). The SEG37 pin works correctly on 100-pin devices. Work around None. Affected Silicon Revisions B2 C0 X X None. Affected Silicon Revisions B2 C0 X X 11. Module: Reset (VBAT and POR) For applications that use the VBAT feature, the device may fail to start/restart on POR if VBAT voltage is below 1.2V. Work around If the VBAT mode features will be used in the application, ensure that a VBAT source of at least 1.2V is always connected to the VBAT pin. If the VBAT mode features are not to be used, always connect the VBAT pin to VDD, as recommended in the data sheet. Affected Silicon Revisions B2 C0 X 13. Module: Power-on Reset When the device is operating with Brown-out Reset (BOR) disabled, it is recommended to follow the data sheet specification of starting the VDD from VSS to ensure an internal Power-on Reset. Failing to do so may result in the device failing to start up or other unexpected behavior. Work around There are three work arounds to resolve the issue: 1. Enable the BOR to ensure that the device gets a proper Power-on Reset. 2. If the BOR cannot be enabled, always start the VDD from VSS to ensure a proper Poweron Reset (Parameter No. DC16 in Table 32-3 of Section 32.0 “Electrical Characteristics” in the data sheet). 3. Use an external voltage supervisor chip on the MCLR pin to hold the MCLR low when the power supply voltage is between 1.4V and 2.0V. Release MCLR after the VDD is in the operating range. Affected Silicon Revisions 2011-2014 Microchip Technology Inc. B2 C0 X X DS80000532G-page 5 PIC24FJ128GA310 FAMILY Data Sheet Clarifications The following typographic corrections and clarifications are to be noted for the latest version of the device data sheet (DS30009996G): Note: Corrections are shown in bold. Where possible, the original bold text formatting has been removed for clarity. None. DS80000532G-page 6 2011-2014 Microchip Technology Inc. PIC24FJ128GA310 FAMILY APPENDIX A: DOCUMENT REVISION HISTORY Rev A Document (11/2011) Initial release of this document. Includes silicon issues 1 (A/D Conversion During Sleep), 2 (A/D Auto-Scan Mode), 3 (A/D Accuracy), 4 (VBTBOR) and 5 (RTCC). Added data sheet clarification 1 (Section 22.0 Real Time Clock and Calendar). Rev B Document (4/2012) Included changes to silicon issue 1 (A/D Conversion During Sleep) and added silicon issues 8 (A/D) and 9 (Reset), and added data sheet clarifications 2 (Special Features), 3 (Special Features), 4 (Special Features), 5 (Timer1), 6 (Pin Diagrams), 7 (Pin Diagrams), 8 (Guidelines for Getting Started with 16-Bit Microcontrollers), 9 (Memory Organization), 10 (I/O Ports), 11 (Memory Organization), 12 (I/O Ports), 13 (Electrical Characteristics), 14 (Electrical Characteristics), 15 (12-Bit A/D Converter with Threshold Scan), 16 (Real-Time Clock and Calendar – RTCC) and 17 (A/D Converter). Rev E Document (2/2013) Indicated that silicon issue 7 is also applicable to silicon revision C0. Added data sheet clarification 31 (Power-Saving Features). Rev F Document (10/2013) Added silicon issue 12 (LCD). Rev G Document (6/2014) Updated silicon issue 4 (Core, VBAT mode) with information regarding VBTBOR in Revision B2 and Revision C0. Added silicon issue 13 (Power-on Reset). Removed all previous data sheet clarifications that have been addressed in the latest data sheet revision. Rev C Document (7/2012) Added silicon revision C0 to document, with existing silicon issues 3 (A/D, Accuracy) and 9 (Reset). Added new silicon issues 10 (A/D) and 11 (Reset, VBAT and POR) to silicon revision B2. Issue 10 is also added to silicon revision C0. Added data sheet clarifications 18-19 (A/D), 2021 (Memory Organization), 22-24 (Oscillator) and 25 (Power-Saving Features). Corrected the titles of several existing silicon issues (1, 2, 3, 4, 7 and 8) for compatibility with existing errata documentation. No changes are made to the text of any issues. Updated the title of data sheet clarification 8 (“Getting Started with 16-bit Microcontrollers”) to “Overview”. Updated several data sheet clarification issues (3, 4, 13 and 17) to remove extraneous tables, rows and other information not relevant to the items being changed. Other minor typographic corrections throughout. Rev D Document (1/2013) In silicon issue 7 (Core (Deep Sleep)), changed the maximum value for Deep Sleep at 3.3V from 2.5 A to 6 A. Added data sheet clarifications 26 (Power-Saving Features, 27 (Oscillator Configuration), 28 (Packaging Information), 29 (Serial Peripheral Interface (SPI)) and 30 (I/O Ports). 2011-2014 Microchip Technology Inc. DS80000532G-page 7 PIC24FJ128GA310 FAMILY NOTES: DS80000532G-page 8 2011-2014 Microchip Technology Inc. Note the following details of the code protection feature on Microchip devices: • Microchip products meet the specification contained in their particular Microchip Data Sheet. • Microchip believes that its family of products is one of the most secure families of its kind on the market today, when used in the intended manner and under normal conditions. • There are dishonest and possibly illegal methods used to breach the code protection feature. All of these methods, to our knowledge, require using the Microchip products in a manner outside the operating specifications contained in Microchip’s Data Sheets. Most likely, the person doing so is engaged in theft of intellectual property. • Microchip is willing to work with the customer who is concerned about the integrity of their code. • Neither Microchip nor any other semiconductor manufacturer can guarantee the security of their code. Code protection does not mean that we are guaranteeing the product as “unbreakable.” Code protection is constantly evolving. We at Microchip are committed to continuously improving the code protection features of our products. Attempts to break Microchip’s code protection feature may be a violation of the Digital Millennium Copyright Act. If such acts allow unauthorized access to your software or other copyrighted work, you may have a right to sue for relief under that Act. Information contained in this publication regarding device applications and the like is provided only for your convenience and may be superseded by updates. It is your responsibility to ensure that your application meets with your specifications. MICROCHIP MAKES NO REPRESENTATIONS OR WARRANTIES OF ANY KIND WHETHER EXPRESS OR IMPLIED, WRITTEN OR ORAL, STATUTORY OR OTHERWISE, RELATED TO THE INFORMATION, INCLUDING BUT NOT LIMITED TO ITS CONDITION, QUALITY, PERFORMANCE, MERCHANTABILITY OR FITNESS FOR PURPOSE. Microchip disclaims all liability arising from this information and its use. Use of Microchip devices in life support and/or safety applications is entirely at the buyer’s risk, and the buyer agrees to defend, indemnify and hold harmless Microchip from any and all damages, claims, suits, or expenses resulting from such use. No licenses are conveyed, implicitly or otherwise, under any Microchip intellectual property rights. Trademarks The Microchip name and logo, the Microchip logo, dsPIC, FlashFlex, KEELOQ, KEELOQ logo, MPLAB, PIC, PICmicro, PICSTART, PIC32 logo, rfPIC, SST, SST Logo, SuperFlash and UNI/O are registered trademarks of Microchip Technology Incorporated in the U.S.A. and other countries. FilterLab, Hampshire, HI-TECH C, Linear Active Thermistor, MTP, SEEVAL and The Embedded Control Solutions Company are registered trademarks of Microchip Technology Incorporated in the U.S.A. Silicon Storage Technology is a registered trademark of Microchip Technology Inc. in other countries. Analog-for-the-Digital Age, Application Maestro, BodyCom, chipKIT, chipKIT logo, CodeGuard, dsPICDEM, dsPICDEM.net, dsPICworks, dsSPEAK, ECAN, ECONOMONITOR, FanSense, HI-TIDE, In-Circuit Serial Programming, ICSP, Mindi, MiWi, MPASM, MPF, MPLAB Certified logo, MPLIB, MPLINK, mTouch, Omniscient Code Generation, PICC, PICC-18, PICDEM, PICDEM.net, PICkit, PICtail, REAL ICE, rfLAB, Select Mode, SQI, Serial Quad I/O, Total Endurance, TSHARC, UniWinDriver, WiperLock, ZENA and Z-Scale are trademarks of Microchip Technology Incorporated in the U.S.A. and other countries. SQTP is a service mark of Microchip Technology Incorporated in the U.S.A. GestIC and ULPP are registered trademarks of Microchip Technology Germany II GmbH & Co. KG, a subsidiary of Microchip Technology Inc., in other countries. All other trademarks mentioned herein are property of their respective companies. © 2011-2014, Microchip Technology Incorporated, Printed in the U.S.A., All Rights Reserved. Printed on recycled paper. ISBN: 978-1-63276-300-6 QUALITY MANAGEMENT SYSTEM CERTIFIED BY DNV == ISO/TS 16949 == 2011-2014 Microchip Technology Inc. Microchip received ISO/TS-16949:2009 certification for its worldwide headquarters, design and wafer fabrication facilities in Chandler and Tempe, Arizona; Gresham, Oregon and design centers in California and India. The Company’s quality system processes and procedures are for its PIC® MCUs and dsPIC® DSCs, KEELOQ® code hopping devices, Serial EEPROMs, microperipherals, nonvolatile memory and analog products. In addition, Microchip’s quality system for the design and manufacture of development systems is ISO 9001:2000 certified. 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