PIC24FV32KA304 FAMILY PIC24FV32KA304 Family Silicon Errata and Data Sheet Clarification The PIC24FV32KA304 family devices that you have received conform functionally to the current Device Data Sheet (DS39995D), except for the anomalies described in this document. The silicon issues discussed in the following pages are for silicon revisions with the Device and Revision IDs listed in Table 1. The silicon issues are summarized in Table 2. The errata described in this document will be addressed in future revisions of the PIC24FV32KA304 family silicon. Note: This document summarizes all silicon errata issues from all revisions of silicon, previous as well as current. Only the issues indicated in the last column of Table 2 apply to the current silicon revision (A7). Data sheet clarifications and corrections start on Page 6, following the discussion of silicon issues. The silicon revision level can be identified using the current version of MPLAB® IDE and Microchip’s programmers, debuggers and emulation tools, which are available at the Microchip corporate web site (www.microchip.com). TABLE 1: For example, to identify the silicon revision level using MPLAB IDE in conjunction with MPLAB ICD 2 or PICkit™ 3: 1. 2. 3. 4. Using the appropriate interface, connect the device to the MPLAB ICD 2 programmer/ debugger or PICkit™ 3. From the main menu in MPLAB IDE, select Configure>Select Device, and then select the target part number in the dialog box. Select the MPLAB hardware tool (Debugger>Select Tool). Perform a “Connect” operation to the device (Debugger>Connect). Depending on the development tool used, the part number and Device Revision ID value appear in the Output window. Note: If you are unable to extract the silicon revision level, please contact your local Microchip sales office for assistance. The DEVREV values for the various PIC24FV32KA304 family silicon revisions are shown in Table 1. SILICON DEVREV VALUES Part Number Device ID(1) Revision ID for Silicon Revision(2) A4 A6 Part Number Device ID(1) A7 A4 PIC24F32KA304 4516h PIC24FV32KA304 4517h PIC24F32KA302 4512h PIC24FV32KA302 4513h PIC24F32KA301 4518h PIC24FV32KA301 4519h PIC24F16KA304 4506h PIC24FV16KA304 4507h PIC24F16KA302 4502h PIC24FV16KA302 4503h PIC24F16KA301 4508h PIC24FV16KA301 4509h Note 1: 2: 0004h 0006h 00007h Revision ID for Silicon Revision(2) A6 A7 0004h 0006h 0007h The Device IDs (DEVID and DEVREV) are located at the last two implemented addresses of configuration memory space. They are shown in hexadecimal in the format, “DEVID DEVREV”. Refer to the “PIC24FXXKA1XX/FVXXKA3XX Family Flash Programming Specifications” (DS39919) for detailed information on Device and Revision IDs for your specific device. 2011-2015 Microchip Technology Inc. DS80000522F-page 1 PIC24FV32KA304 FAMILY TABLE 2: Module SILICON ISSUE SUMMARY Feature Item Number Affected Revisions(1) Issue Summary A4 Core Low-Voltage Regulator 1. High-voltage programming entry unavailable in Low-Voltage Sleep modes. X Reset BOR 2. Unexpected BOR events when BOR is disabled in Sleep mode. X A/D Threshold Detect 3. Auto-scan feature may not trigger correctly in Sleep mode. X UART TX Buffer 4. Out-of-order transmit data when buffer is filled. X UART Transmit 5. UTXBF flag may not indicate correctly. X A/D Threshold Detect 6. Current in Auto-Scan mode may exceed expected values. X A/D Threshold Detect 7. Interrupt may not trigger in certain Auto-Scan modes. X HLVD DC18 Value Changes 8. Change in trip points. X Note 1: A6 A7 X X X X Only those issues indicated in the last column apply to the current silicon revision. DS80000522F-page 2 2011-2015 Microchip Technology Inc. PIC24FV32KA304 FAMILY Silicon Errata Issues Note: This document summarizes all silicon errata issues from all revisions of silicon, previous as well as current. Only the issues indicated by the shaded column in the following tables apply to the current silicon revision (A7). 1. Module: Core (Low-Voltage Regulator) When operating in Low-Voltage Sleep mode, LVREN = 1 (RCON<12>) and LVRCFG = 0 (FPOR<2>), the device may not be able to enter programming modes using high-voltage entry (VIHH applied to MCLR). If entry into a programming mode is required while the device is in Low-Voltage Sleep mode, use low-voltage entry into programming. Verify that MCLR functionality is enabled, MCLRE = 1 (FPOR<7>), before attempting programming. Affected Silicon Revisions A6 A7 X 2. Module: Reset (BOR) Under certain conditions, the device may improperly perform a Brown-out Reset upon wake-up from a Sleep mode. This has been observed under two conditions: 1. 2. Do not use Sleep mode when BOREN<1:0> = 10. If the BOR is to operate under software control, always enable the HLVD module, HLVDEN = 1 (HLVDCON<15>), before enabling the BOR in software (SBOREN = 1). This procedure activates the internal band gap reference and assures its stability for the BOR circuit. Affected Silicon Revisions A4 A6 A7 X X X 3. Module: A/D (Threshold Detect) Work around A4 Work around When the BOR is disabled in Sleep mode, BOREN<1:0> = 10 (FPOR<1:0>), a BOR may occur when the device wakes from Sleep, regardless of the supply voltage. When the BOR is configured for software control (BOREN<1:0> = 01), the device enters and wakes from Sleep normally while the BOR is disabled in software, SBOREN = 0 (RCON<13>). However, if the BOR was disabled prior to entering Sleep mode and is subsequently enabled after waking from Sleep, a BOR may occur, regardless of the supply voltage. When the auto-scan feature of the Threshold Detect is enabled (AD1CON5<15> = 1), automatic scan may fail when these conditions occur together: • the Device is in Sleep mode, and • Timer1 is selected as the sample trigger clock source (AD1CON1<7:4> = 0101). Timer1 and other timers will function correctly as sample triggers in other power-saving modes, such as Idle mode. Work around If auto-scan functionality is required during Sleep, use INT0 as the sample trigger. Affected Silicon Revisions A4 A6 A7 X BOR functions normally when it is always enabled or disabled (BOREN<1:0> = 11 or 00). 2011-2015 Microchip Technology Inc. DS80000522F-page 3 PIC24FV32KA304 FAMILY 4. Module: UART (TX Buffer) If the transmit buffer is filled sequentially with four characters, the characters may not be transmitted in the correct order. Work around Do not completely fill the buffer before transmitting data; send three characters or less at a time. Affected Silicon Revisions A4 A6 A7 X 6. Module: A/D (Threshold Detect) In Auto-Scan mode, with low power enabled (AD1CON5<15> = 1, AD1CON5<14> = 1) and the device in Sleep mode, the ADRC may not turn off between scans, resulting in a higher current draw than anticipated. Work around None. Affected Silicon Revisions A4 A6 A7 X 5. Module: UART (Transmit) 7. Module: A/D (Threshold Detect) The UARTx Transmit Buffer Full flag, UTXBF (UxSTA<9>), may become cleared before data starts moving out of the full buffer. If the flag is used to determine when data can be written to the buffer, new data may not be accepted and data may not be transmitted. In Auto-Scan mode (AD1CON5<15> = 1), when the Auto-Scan Interrupt mode bits are set to ‘11’ (AD1CON5<9:8> = 11), the highest number channel selected for scanning in AD1CSSL or AD1CSSH may not trigger an interrupt on a valid comparison. Work around Work around Poll the Transmit Buffer Empty flag (TRMT, UxSTA<8>) to determine when the transmit buffer is empty and can be written to. Add a dummy channel to the scanning sequence. For example, when scanning AN0 and AN1, set AD1CSSL to 0x0007 or 0x8003, or whatever is practical given the implementation. Alternatively, configure the UART to set the UARTx Transmit Interrupt Flag (UxTXIF) whenever a character is shifted into the Transmit Shift Register (UTXISEL<1:0> = 00). When a transmit interrupt occurs, this indicates that at least one buffer position is open and that the buffer can be written to. Affected Silicon Revisions A4 A6 Also, if the highest number channel needs to be scanned, the AD1CHITH register can be polled to observe a valid comparison. Affected Silicon Revisions A4 A6 A7 X A7 X DS80000522F-page 4 2011-2015 Microchip Technology Inc. PIC24FV32KA304 FAMILY 8. Module: HLVD (DC18 Value Changes) The maximum and minimum values of the High/ Low-Voltage Detect Characteristics (DC18), shown in Table 29-4 of the data sheet, have changed for this revision. The new values are shown in Table 3. Affected Silicon Revisions A4 A6 A7 X X X TABLE 3: HIGH/LOW-VOLTAGE DETECT CHARACTERISTICS Standard Operating Conditions: 1.8V to 3.6V PIC24F32KA3XX 2.0V to 5.5V PIC24FV32KA3XX Operating temperature -40°C TA +85°C for Industrial Param Symbol No. DC18 VHLVD Characteristic HLVD Voltage on VDD Transition Min Typ Max Units — — 2.01 V HLVDL<3:0> = 0001 1.91 — 2.25 V HLVDL<3:0> = 0010 2.12 — 2.48 V HLVDL<3:0> = 0011 2.27 — 2.67 V HLVDL<3:0> = 0100 2.36 — 2.76 V HLVDL<3:0> = 0101 2.55 — 2.99 V HLVDL<3:0> = 0110 2.79 — 3.27 V HLVDL<3:0> = 0111 2.93 — 3.43 V HLVDL<3:0> = 1000 3.06 — 3.60 V HLVDL<3:0> = 0000(2) HLVDL<3:0> = 1001 3.23 — 3.79 V HLVDL<3:0> = 1010(1) 3.40 — 4.00 V HLVDL<3:0> = 1011(1) 3.61 — 4.23 V HLVDL<3:0> = 1100(1) 3.83 — 4.49 V 1101(1) 4.08 — 4.80 V HLVDL<3:0> = 1110(1) 4.38 — 5.14 V HLVDL<3:0> = Note 1: 2: Conditions These trip points should not be used on PIC24FXXKA30X devices. This trip point should not be used on PIC24FVXXKA30X devices. 2011-2015 Microchip Technology Inc. DS80000522F-page 5 PIC24FV32KA304 FAMILY Data Sheet Clarifications The following typographic corrections and clarifications are to be noted for the latest version of the device data sheet (DS39995D): 1. Module: Electrical Characteristics The extended temperature data, shown in bold, has been added to Table 29-21. TABLE 29-21: AC CHARACTERISTICS: INTERNAL RC ACCURACY AC CHARACTERISTICS Param No. Characteristic Standard Operating Conditions: 1.8V to 3.6V PIC24F32KA3XX 2.0V to 5.5V PIC24FV32KA3XX Operating temperature -40°C TA +85°C for Industrial -40°C TA +125°C for Extended Min Typ Max Units Conditions Internal FRC Accuracy @ 8 MHz(1) F20 FRC -2 — +2 % +25ºC 3.0V VDD 3.6V, F device 3.2V VDD 5.5V, FV device -5 — +5 % -40°C TA +85°C 1.8V VDD 3.6V, F device 2.0V VDD 5.5V, FV device -6 — +6 % -40°C TA +125°C 1.8V VDD 3.6V, F device 2.0V VDD 5.5V, FV device -15 — 15 % LPRC @ 31 kHz(2) F21 Note 1: 2: Frequency is calibrated at +25°C and 3.3V. The OSCTUN bits can be used to compensate for temperature drift. The change of LPRC frequency as VDD changes. DS80000522F-page 6 2011-2015 Microchip Technology Inc. PIC24FV32KA304 FAMILY APPENDIX A: DOCUMENT REVISION HISTORY Rev A Document (3/2011) Initial release of this document; issued for revision A4. Includes silicon issues 1 (Core, Low-Voltage Regulator) and 2 (Reset, BOR). Rev B Document (5/2011) Adds silicon issue 3 (A/D, Threshold Detect) to silicon revision A4. Adds data sheet clarifications 1 (Overview and Other Locations), 2 (Overview) and 3 (A/D, Threshold Detect) for data sheet revision B. Rev C Document (9/2011) Adds silicon issues 4 (UART, TX Buffer), 5 (UART, Transmit), 6 (A/D, Threshold Detect), 7 (A/D, Threshold Detect) and 8 (HLVD, DC18 Value Changes) to silicon revision A4. Typographical correction in issue 1 (Core, Low-Voltage Regulator). Adds data sheet clarifications 4 through 7 (A/D Converter), 8 and 9 (Comparator), 10 (Flash Program Memory), 11 (Electrical Specifications), 12 (A/D Converter) and 13 (Pin Diagrams) to data sheet revision B. Rev D Document (8/2012) Adds latest silicon revision (A6) and shows that both silicon issues 2 (Reset, BOR) and 8 (HLVD, DC18 Value Changes) are affected. Removes all data sheet clarifications that were addressed in the latest release of the data sheet. Rev E Document (11/2013) Adds data sheet clarification 1 (Electrical Characteristics. Rev F Document (7/2015) Adds current silicon revision A7. 2011-2015 Microchip Technology Inc. DS80000522F-page 7 PIC24FV32KA304 FAMILY NOTES: DS80000522F-page 8 2011-2015 Microchip Technology Inc. Note the following details of the code protection feature on Microchip devices: • Microchip products meet the specification contained in their particular Microchip Data Sheet. • Microchip believes that its family of products is one of the most secure families of its kind on the market today, when used in the intended manner and under normal conditions. • There are dishonest and possibly illegal methods used to breach the code protection feature. All of these methods, to our knowledge, require using the Microchip products in a manner outside the operating specifications contained in Microchip’s Data Sheets. Most likely, the person doing so is engaged in theft of intellectual property. • Microchip is willing to work with the customer who is concerned about the integrity of their code. • Neither Microchip nor any other semiconductor manufacturer can guarantee the security of their code. Code protection does not mean that we are guaranteeing the product as “unbreakable.” Code protection is constantly evolving. We at Microchip are committed to continuously improving the code protection features of our products. Attempts to break Microchip’s code protection feature may be a violation of the Digital Millennium Copyright Act. If such acts allow unauthorized access to your software or other copyrighted work, you may have a right to sue for relief under that Act. Information contained in this publication regarding device applications and the like is provided only for your convenience and may be superseded by updates. It is your responsibility to ensure that your application meets with your specifications. MICROCHIP MAKES NO REPRESENTATIONS OR WARRANTIES OF ANY KIND WHETHER EXPRESS OR IMPLIED, WRITTEN OR ORAL, STATUTORY OR OTHERWISE, RELATED TO THE INFORMATION, INCLUDING BUT NOT LIMITED TO ITS CONDITION, QUALITY, PERFORMANCE, MERCHANTABILITY OR FITNESS FOR PURPOSE. Microchip disclaims all liability arising from this information and its use. Use of Microchip devices in life support and/or safety applications is entirely at the buyer’s risk, and the buyer agrees to defend, indemnify and hold harmless Microchip from any and all damages, claims, suits, or expenses resulting from such use. No licenses are conveyed, implicitly or otherwise, under any Microchip intellectual property rights unless otherwise stated. Trademarks The Microchip name and logo, the Microchip logo, dsPIC, FlashFlex, flexPWR, JukeBlox, KEELOQ, KEELOQ logo, Kleer, LANCheck, MediaLB, MOST, MOST logo, MPLAB, OptoLyzer, PIC, PICSTART, PIC32 logo, RightTouch, SpyNIC, SST, SST Logo, SuperFlash and UNI/O are registered trademarks of Microchip Technology Incorporated in the U.S.A. and other countries. The Embedded Control Solutions Company and mTouch are registered trademarks of Microchip Technology Incorporated in the U.S.A. Analog-for-the-Digital Age, BodyCom, chipKIT, chipKIT logo, CodeGuard, dsPICDEM, dsPICDEM.net, ECAN, In-Circuit Serial Programming, ICSP, Inter-Chip Connectivity, KleerNet, KleerNet logo, MiWi, MPASM, MPF, MPLAB Certified logo, MPLIB, MPLINK, MultiTRAK, NetDetach, Omniscient Code Generation, PICDEM, PICDEM.net, PICkit, PICtail, RightTouch logo, REAL ICE, SQI, Serial Quad I/O, Total Endurance, TSHARC, USBCheck, VariSense, ViewSpan, WiperLock, Wireless DNA, and ZENA are trademarks of Microchip Technology Incorporated in the U.S.A. and other countries. SQTP is a service mark of Microchip Technology Incorporated in the U.S.A. Silicon Storage Technology is a registered trademark of Microchip Technology Inc. in other countries. GestIC is a registered trademark of Microchip Technology Germany II GmbH & Co. KG, a subsidiary of Microchip Technology Inc., in other countries. All other trademarks mentioned herein are property of their respective companies. © 2011-2015, Microchip Technology Incorporated, Printed in the U.S.A., All Rights Reserved. ISBN: 978-1-63277-628-0 QUALITY MANAGEMENT SYSTEM CERTIFIED BY DNV == ISO/TS 16949 == 2011-2015 Microchip Technology Inc. Microchip received ISO/TS-16949:2009 certification for its worldwide headquarters, design and wafer fabrication facilities in Chandler and Tempe, Arizona; Gresham, Oregon and design centers in California and India. The Company’s quality system processes and procedures are for its PIC® MCUs and dsPIC® DSCs, KEELOQ® code hopping devices, Serial EEPROMs, microperipherals, nonvolatile memory and analog products. In addition, Microchip’s quality system for the design and manufacture of development systems is ISO 9001:2000 certified. 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