NSS40300MDR2G, NSV40300MDR2G Dual Matched 40 V, 6.0 A, Low VCE(sat) PNP Transistor These transistors are part of the ON Semiconductor e2PowerEdge family of Low VCE(sat) transistors. They are assembled to create a pair of devices highly matched in all parameters, including ultra low saturation voltage VCE(sat), high current gain and Base/Emitter turn on voltage. Typical applications are current mirrors, differential amplifiers, DC−DC converters and power management in portable and battery powered products such as cellular and cordless phones, PDAs, computers, printers, digital cameras and MP3 players. Other applications are low voltage motor controls in mass storage products such as disc drives and tape drives. In the automotive industry they can be used in air bag deployment and in the instrument cluster. The high current gain allows e2PowerEdge devices to be driven directly from PMU’s control outputs, and the Linear Gain (Beta) makes them ideal components in analog amplifiers. Features Current Gain Matching to 10% Base Emitter Voltage Matched to 2 mV AEC−Q101 Qualified and PPAP Capable NSV Prefix for Automotive and Other Applications Requiring Unique Site and Control Change Requirements These are Pb−Free Devices* http://onsemi.com 40 VOLTS 6.0 AMPS PNP LOW VCE(sat) TRANSISTOR EQUIVALENT RDS(on) 80 mW SOIC−8 CASE 751 STYLE 29 COLLECTOR 7,8 1 BASE COLLECTOR 5,6 3 BASE 2 EMITTER 4 EMITTER MARKING DIAGRAM 8 MAXIMUM RATINGS (TA = 25C) Symbol Max Unit Collector-Emitter Voltage VCEO −40 Vdc Collector-Base Voltage VCBO −40 Vdc Emitter-Base Voltage VEBO −7.0 Vdc IC −3.0 A Collector Current − Peak ICM −6.0 A Electrostatic Discharge ESD Rating Collector Current − Continuous HBM Class 3B MM Class C Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. Semiconductor Components Industries, LLC, 2011 November, 2011 − Rev. 2 1 1 P40300 A Y WW G P40300 AYWWG G = Specific Device Code = Assembly Location = Year = Work Week = Pb−Free Package (Note: Microdot may be in either location) ORDERING INFORMATION Package Shipping† NSS40300MDR2G SOIC−8 (Pb−Free) 2,500 / Tape & Reel NSV40300MDR2G SOIC−8 (Pb−Free) 2,500 / Tape & Reel Device †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specification Brochure, BRD8011/D. Publication Order Number: NSS40300MD/D NSS40300MDR2G, NSV40300MDR2G THERMAL CHARACTERISTICS Characteristic Symbol Max Unit 576 4.6 mW mW/C SINGLE HEATED Total Device Dissipation (Note 1) TA = 25C Derate above 25C PD Thermal Resistance Junction−to−Ambient (Note 1) RqJA Total Device Dissipation (Note 2) TA = 25C Derate above 25C PD Thermal Resistance Junction−to−Ambient (Note 2) RqJA 217 676 5.4 185 C/W mW mW/C C/W DUAL HEATED (Note 3) Total Device Dissipation (Note 1) TA = 25C Derate above 25C PD Thermal Resistance Junction−to−Ambient (Note 1) RqJA Total Device Dissipation (Note 2) TA = 25C Derate above 25C PD Thermal Resistance Junction−to−Ambient (Note 2) RqJA Junction and Storage Temperature Range TJ, Tstg 1. FR−4 @ 10 mm2, 1 oz. copper traces, still air. 2. FR−4 @ 100 mm2, 1 oz. copper traces, still air. 3. Dual heated values assume total power is the sum of two equally powered devices. http://onsemi.com 2 653 5.2 191 783 6.3 160 −55 to +150 mW mW/C C/W mW mW/C C/W C NSS40300MDR2G, NSV40300MDR2G ELECTRICAL CHARACTERISTICS (TA = 25C unless otherwise noted) Characteristic Symbol Min Typ Max −40 − − −40 − − −7.0 − − − − −0.1 − − −0.1 250 220 180 150 0.9 380 340 300 230 0.99 − − − − − − − − − −0.013 −0.075 −0.130 −0.135 −0.017 −0.095 −0.170 −0.170 − −0.780 −0.900 − − −0.660 0.3 −0.750 2.0 100 − − Unit OFF CHARACTERISTICS Collector −Emitter Breakdown Voltage (IC = −10 mAdc, IB = 0) V(BR)CEO Collector −Base Breakdown Voltage (IC = −0.1 mAdc, IE = 0) V(BR)CBO Emitter −Base Breakdown Voltage (IE = −0.1 mAdc, IC = 0) V(BR)EBO Collector Cutoff Current (VCB = −40 Vdc, IE = 0) ICBO Emitter Cutoff Current (VEB = −6.0 Vdc) IEBO Vdc Vdc Vdc mAdc mAdc ON CHARACTERISTICS DC Current Gain (Note 4) (IC = −10 mA, VCE = −2.0 V) (IC = −500 mA, VCE = −2.0 V) (IC = −1.0 A, VCE = −2.0 V) (IC = −2.0 A, VCE = −2.0 V) (IC = −2.0 A, VCE = −2.0 V) (Note 5) hFE hFE(1)/hFE(2) Collector −Emitter Saturation Voltage (Note 4) (IC = −0.1 A, IB = −0.010 A) (IC = −1.0 A, IB = −0.100 A) (IC = −1.0 A, IB = −0.010 A) (IC = −2.0 A, IB = −0.200 A) VCE(sat) Base −Emitter Saturation Voltage (Note 4) (IC = −1.0 A, IB = −0.01 A) VBE(sat) Base −Emitter Turn−on Voltage (Note 4) (IC = −0.1 A, VCE = −2.0 V) (IC = −0.1 A, VCE = −2.0 V) (Note 6) VBE(on) VBE(1) − VBE(2) V V V mV Cutoff Frequency (IC = −100 mA, VCE = −5.0 V, f = 100 MHz) fT MHz Input Capacitance (VEB = −0.5 V, f = 1.0 MHz) Cibo − 250 300 pF Output Capacitance (VCB = −3.0 V, f = 1.0 MHz) Cobo − 50 65 pF td − − 60 ns Rise (VCC = −30 V, IC = −750 mA, IB1 = −15 mA) tr − − 120 ns Storage (VCC = −30 V, IC = −750 mA, IB1 = −15 mA) ts − − 400 ns Fall (VCC = −30 V, IC = −750 mA, IB1 = −15 mA) tf − − 130 ns SWITCHING CHARACTERISTICS Delay (VCC = −30 V, IC = −750 mA, IB1 = −15 mA) 4. Pulsed Condition: Pulse Width = 300 msec, Duty Cycle 2%. 5. hFE(1)/hFE(2) is the ratio of one transistor compared to the other transistor within the same package. The smaller hFE is used as numerator. 6. VBE(1) − VBE(2) is the absolute difference of one transistor compared to the other transistor within the same package. http://onsemi.com 3 NSS40300MDR2G, NSV40300MDR2G TYPICAL CHARACTERISTICS 0.30 150C 0.20 −55C 0.15 25C 0.10 0.05 0 0.001 0.01 0.1 1 10 300 −55C (5.0 V) 200 −55C (2.0 V) 100 0 0.001 0.01 0.1 1 0 0.001 0.01 0.1 1 10 IC/IB = 10 1.0 0.9 −55C 0.8 25C 0.7 0.6 150C 0.5 0.4 0.001 0.01 0.1 1 IC, COLLECTOR CURRENT (A) Figure 3. DC Current Gain vs. Collector Current Figure 4. Base Emitter Saturation Voltage vs. Collector Current 10 2.0 VCE = −2.0 V 0.7 VCE(sat), COLLECTOR−EMITTER VOLTAGE (V) VBE(on), BASE−EMITTER TURN−ON VOLTAGE (V) 0.05 IC, COLLECTOR CURRENT (A) 0.8 −55C 25C 0.6 0.5 150C 0.4 0.3 0.2 0.10 0.3 10 1.0 0.9 0.15 1.1 25C (2.0 V) 400 0.20 150C Figure 2. Collector Emitter Saturation Voltage vs. Collector Current 25C (5.0 V) 500 25C Figure 1. Collector Emitter Saturation Voltage vs. Collector Current 150C (2.0 V) 600 −55C IC, COLLECTOR CURRENT (A) 150C (5.0 V) 700 IC/IB = 100 0.25 IC, COLLECTOR CURRENT (A) 800 hFE, DC CURRENT GAIN VCE(sat), COLLECTOR−EMITTER SATURATION VOLTAGE (V) IC/IB = 10 VBE(sat), BASE−EMITTER SATURATION VOLTAGE (V) VCE(sat), COLLECTOR−EMITTER SATURATION VOLTAGE (V) 0.25 0.001 0.01 0.1 1 10 1.8 100 mA 1.6 1A 3A 2A 1.4 1.2 1.0 0.8 0.6 0.4 0.2 0 0.0001 0.001 0.01 IC, COLLECTOR CURRENT (A) Ib, BASE CURRENT (A) Figure 5. Base Emitter Turn−On Voltage vs. Collector Current Figure 6. Saturation Region http://onsemi.com 4 0.1 NSS40300MDR2G, NSV40300MDR2G TYPICAL CHARACTERISTICS 100 Cobo, OUTPUT CAPACITANCE (pF) 300 250 200 Cibo (pF) 150 100 0 1 2 3 4 5 90 80 70 60 50 Cobo (pF) 40 30 6 0 5 10 15 20 25 30 VEB, EMITTER BASE VOLTAGE (V) Vcb, COLLECTOR BASE VOLTAGE (V) Figure 7. Input Capacitance Figure 8. Output Capacitance 10 1 ms 1s 10 ms 100 ms 1.0 IC (A) Cibo, INPUT CAPACITANCE (pF) 350 0.1 Thermal Limit 0.01 0.001 Single Pulse Test at TA = 25C 0.01 0.1 1.0 10 VCE (Vdc) Figure 9. Safe Operating Area http://onsemi.com 5 100 35 40 NSS40300MDR2G, NSV40300MDR2G PACKAGE DIMENSIONS SOIC−8 NB CASE 751−07 ISSUE AK −X− NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982. 2. CONTROLLING DIMENSION: MILLIMETER. 3. DIMENSION A AND B DO NOT INCLUDE MOLD PROTRUSION. 4. MAXIMUM MOLD PROTRUSION 0.15 (0.006) PER SIDE. 5. DIMENSION D DOES NOT INCLUDE DAMBAR PROTRUSION. ALLOWABLE DAMBAR PROTRUSION SHALL BE 0.127 (0.005) TOTAL IN EXCESS OF THE D DIMENSION AT MAXIMUM MATERIAL CONDITION. 6. 751−01 THRU 751−06 ARE OBSOLETE. NEW STANDARD IS 751−07. A 8 5 S B 0.25 (0.010) M Y M 1 4 −Y− K G C N DIM A B C D G H J K M N S X 45 _ SEATING PLANE −Z− 0.10 (0.004) H D 0.25 (0.010) M Z Y S X M J S INCHES MIN MAX 0.189 0.197 0.150 0.157 0.053 0.069 0.013 0.020 0.050 BSC 0.004 0.010 0.007 0.010 0.016 0.050 0 _ 8 _ 0.010 0.020 0.228 0.244 STYLE 29: PIN 1. BASE, DIE #1 2. EMITTER, #1 3. BASE, #2 4. EMITTER, #2 5. COLLECTOR, #2 6. COLLECTOR, #2 7. COLLECTOR, #1 8. COLLECTOR, #1 SOLDERING FOOTPRINT* 1.52 0.060 7.0 0.275 MILLIMETERS MIN MAX 4.80 5.00 3.80 4.00 1.35 1.75 0.33 0.51 1.27 BSC 0.10 0.25 0.19 0.25 0.40 1.27 0_ 8_ 0.25 0.50 5.80 6.20 4.0 0.155 0.6 0.024 1.270 0.050 SCALE 6:1 mm Ǔ ǒinches *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). 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