Controller Area Network (CAN) UT64CAN333x CAN FD Transceivers Preliminary Datasheet Cobham.com/HiRel January 28, 2016 The most important thing we build is trust FEATURES □ □ □ □ □ □ □ □ □ □ □ □ □ □ □ □ □ □ □ □ □ □ INTRODUCTION Single 3.3V supply voltage 5V tolerant digital I/O Compatible with ISO 11898-2 and 11898-5 standards 10kbps to 8Mbps baud rates Class 2 ESD for non-CAN bus pins Class 3A ESD for CAN bus pins (CANL, CANH) Bus-Pin fault protection: ±36V terrestrial ±16 V in orbit Common-mode range: -7 to +12V Over current protection Low current standby mode: IDD ≤ 1500µA Cold spare of digital I/O Product options: Sleep mode (Figure 1) Diagnostic loopback mode (Figure 2) Loopback for auto-baud mode (Figure 3) Packaging: 8-lead ceramic flat pack Standard Microelectronics Drawing (SMD) 5962-15232 QML Q qualified, QML V pending Evaluation board available (UT64CANEVB333x) Cobham Semiconductor Solutions UT64CAN333x series of Controller Area Network (CAN) transceivers are developed in accordance with the ISO 11898-2 standard. The CAN transceiver provides the physical layer that permits operation on a differential CAN bus. This series of CAN transceivers are capable of baud rates between 10 kbps to 8 Mbps and include a slope-control mode to control the slew rate of the transmissions for baud rates of up to 500kbps. A standby mode disables the transmitter circuit to conserve power while monitoring the bus for activity. The UT64CAN333x series of transceivers can support up to 120 nodes. The three transceiver options are: □ The UT64CAN3330 provides a low power sleep mode of operation □ The UT64CAN3331 supports a bus isolated diagnostic loopback □ The UT64CAN3332 offers the ability to monitor bus traffic enabling the local controller to change its baud rate to match the operations of the bus OPERATIONAL ENVIRONMENT □ □ Total dose: up to 100 krad(Si) Latch-up immune (LET ≤ 117 MeV-cm2/mg) APPLICATIONS □ □ □ □ □ □ □ Avionic/Aerospace sensor monitoring Avionic/Aerospace system telemetry Avionic/Aerospace command and control Utility Plane Communication Smart Sensor Communication ARINC825 applications Time Triggered (TTP/C and TTP/A) applications 00-00-00-000 Version 2.2.0 1 Cobham Semiconductor Solutions Cobham.com/HiRel OVERVIEW The UT64CAN333x series CAN transceivers are low power serial communications devices developed to handle the demands of harsh space and terrestrial environments. The UT64CAN333x transceivers are compatible with the ISO 11898-2 and 11898-5 standards, operating as the physical layer between the bus and the CAN controller. All of the transceivers operate on a single +3.3V power supply and receive data with an input common-mode in the range of -7V to +12V. The CANH and CANL outputs are fault protected against short-circuits by over-current shutdown circuitry. Each UT64CAN333x CAN transceiver is capable of: □ □ □ □ □ □ Operations on any 5V bus or 3V bus o The CAN bus is not actively driven during recessive (logic high) transmission and actively driven during the dominant (logic low) transmission. During this time, the differential voltage of both 5V and 3.3V devices is the same; however, the common mode output voltage will vary between the 5V and 3.3V devices. Since the common mode output voltage may vary slightly, Cobham recommends that system level testing be performed to understand and maximize the performance of operations when using mixed supply CAN buses. Cobham also recommends using split termination to filter common mode high frequency noise from bus lines to reduce emissions. Being a cold spare back-up to an active transceiver Programmable slew control on the bus driver Operating at baud rates up to 8 Mbps Low-power standby mode. The standby mode permits the transceiver to enter a low-current, listen only, mode by disabling the driver while the receiver remains active. The local controller has the option to disable low-power standby mode when bus activity resumes The RS pin on the UT64CAN333x series CAN transceivers provides three functional modes of operation: o o o High-speed: The high-speed mode of operation is selected by connecting pin 8 directly to ground, allowing the driver output to achieve a baud rate up to 8 Mbps Slope control: The rise and fall slopes are adjusted by connecting a resistor to ground at pin 8. The slope of the driver output signal is proportional to the pin's output current. This slope control is implemented with an external resistor value between 10kΩ to 100kΩ. These values control to slew rates between ~2.0 V/µs to ~20 V/µs Low-power standby mode: If RS is set to a high-level input (> 0.75*VDD), the transceiver enters a lowcurrent, listen only mode of operation. In this mode, the CAN bus driver is disabled and the receiver remains active. The CAN controller has ability to disable low-power standby mode once bus activity resumes Along with the common functionality described, the UT64CAN333x family of transceivers includes three members, each with a unique mode of operation. The UT64CAN3330, Figure 1, provides the option to place the transceiver into a low power sleep mode to conserves power when CAN activity is suspended. Sleep mode disables the driver and receiver circuit when the ZZ pin is biased ≤ VIL. The part resumes operations when the ZZ pin is biased ≥ VIH. TXD 8 7 RS VSS 1 2 VDD 3 CANL RXD 4 6 5 CANH ZZ Figure 1: UT64CAN3330 (Sleep) 00-00-00-000 Version 2.2.0 2 Cobham Semiconductor Solutions Cobham.com/HiRel The UT64CAN3331, Figure 2, provides the option to isolate the transceiver bus connections to permit local node diagnostics, without interrupting operations on the bus. Diagnostic Loopback mode is enabled when the LBK pin is biased ≥ VIH. Diagnostic Loopback mode is disabled when the LBK pin is biased ≤ VIL. RS 8 1 TXD 8 7 RS VSS 1 2 4 VDD 3 5 RXD 4 6 5 CANL LBK RXD LBK 7 CANH TXD 6 CANL CANH Figure 2: UT64CAN3331 (Diagnostic Loopback) The UT64CAN3332, Figure 3, provides the option to automatically synchronize the baud rate of the transceiver by matching the bit timing to the traffic on the bus. The Auto Baud Loopback mode is enabled when the AB pin is biased ≥ VIH. Auto Baud Loopback mode is disabled when the AB pin is biased ≤ VIL. AB RS TXD RXD 5 8 1 7 CANH 6 CANL 4 Figure 3: UT64CAN3332 (Auto-Baud Loopback) 00-00-00-000 Version 2.2.0 3 Cobham Semiconductor Solutions Cobham.com/HiRel PINLIST I = LVTTL Compatible Input IPU = LVTTL Compatible Input with Internal Pull-up IPD = LVTTL Compatible Input with Internal Pull-down O = LVTTL Compatible Output I/O = LVTTL Compatible Bi-Direct AI = Analog Multi-Function Input AO = Analog Output DIO = Differential Input/Output Table 1: Pinlist NUMBER 1 4 7 6 NAME TXD RXD CANH CANL TYPE IPU O DIO DIO IPD ZZ 5 LBK AB IPD IPD DEFAULT -* * * DESCRIPTION Driver Input Data Receiver Output Data High-Level CAN Voltage Input/Output Low-Level CAN Voltage Input/Output Active LOW, low-current sleep mode driver/receiver circuits deactivate (UT64CAN3330 only) Active High, diagnostic loopback mode pin (UT64CAN3331 only) Active HIGH, bus listen-only loopback mode pin (UT64CAN3332 only) Operational Mode Select: Slope Control High speed Standby ---- 8 RS AI 0.7V 3 2 VDD VSS POWER POWER --- Supply voltage Ground NOTE: * Output follows the input (TXD = Logic Low (Dominant) causes CANH-CANL = 3.0V (Dominant) and RXD = Logic Low (Dominant) or input (TXD = Logic High (Recessive) causes CANH-CANL = 0V (Recessive) and RXD = Logic High (Recessive) 00-00-00-000 Version 2.2.0 4 Cobham Semiconductor Solutions Cobham.com/HiRel ABSOLUTE MAXIMUM RATINGS (1, 2) Table 2: Absolute Maximum Ratings SYMBOL VDD VI/O VCANH/L II/O ӨJC TJ TSTG PD ESDHBM ESDHBM NOTE: 1. 2. 3. 4. 5. PARAMETER Supply Voltage Range Voltage on TTL pins during operation RXD, TXD, RS, AB, ZZ Voltage on CANH and CANL bus terminal pin (On-orbit) (3) Voltage on CANH and CANL bus terminal pin (Terrestrial) (3) LVTTL Input/Output DC Current Thermal resistance, junction-to-case Junction Temperature Storage Temperature Maximum package power dissipation permitted at TC=125°C(4) ESD Protection (CANL, CANH) (5) ESD Protection (TXD, RXD, RS, ZZ,AB) (5) SYMBOL TID SEL 2. 3. MAX 6.0 UNITS V -0.3 5.5 V -16 -36 -10 ---65 ---- +16 +36 +10 15 +150 +165 1.67 4000 2000 V V mA °C/W °C °C W V V Stresses outside the listed absolute maximum ratings may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions beyond limits indicated in the operational sections of this specification are not recommended. Exposure to absolute maximum rating conditions for extended periods may affect device reliability and performance. All voltages referenced to VSS Radiation effects can adversely affect the reliability and performance of the device during this condition. Contact a factory representative to evaluate the reliability based on the exposure to exposure to radiation. Per MIL-STD-883, method 1012, section 3.4.1, PD=(TJ(max)-TC(max))/θJC) Per MIL-STD-883, method 3015, Table 3 OPERATIONAL ENVIRONMENT(1) NOTE: 1. MIN -0.3 Table 3: Operational Environment PARAMETER Total Ionizing Dose(2) Single Event Latchup Immunity(3) LIMIT 100 ≤117 UNITS krad(Si) MeV-cm2/mg For devices with procured with a total ionizing dose tolerance guarantee, post-irradiation performance is guaranteed at 25°C per MIL-STD-883 Method 1019, Condition A up to maximum TID level procured. Per MIL-STD-883, method 1019, condition A SEL is performed at VDD = 3.6V at 125°C 00-00-00-000 Version 2.2.0 5 Cobham Semiconductor Solutions Cobham.com/HiRel RECOMMENDED OPERATING CONDITIONS (1) Table 4: Recommended Operating Conditions SYMBOL VDD VCANH VCANL TC VI/O VID RSBIAS NOTE: 1. IOHC IOLC IIHC IILC PARAMETER Supply Voltage Range Voltage on CANH bus terminal pin Voltage on CANL bus terminal pin Case Temperature Range Voltage on TTL pins during operation RXD, TXD, RS, AB, ZZ Differential input voltage Bias input to RS pin for standby Resistor value between the RS pin and ground for slope control Bias input to RS pin for high speed (8 Mbps) High-level output current CANH, CANL Low-level output current CANH, CANL High-level input current CANH, CANL Low-level input current CANH, CANL MIN 3.0 -7.0 -7.0 -55 MAX 3.6 +12.0 +12.0 +125 UNITS V V V °C 0 5.5 V -6 0.75*VDD 6 VDD V V 10 100 k VSS -50 --10 -- 0.3 -50 -10 V mA mA mA mA All voltages referenced to VSS 00-00-00-000 Version 2.2.0 6 Cobham Semiconductor Solutions Cobham.com/HiRel DC ELECTRICAL CHARACTERISTICS (1) (VDD= 3.3V ± 0.3V, -55°C< TC <+125°C); Unless otherwise noted, TC is per the temperature range ordered Table 5: DC Electrical Characteristics SYMBOL IDD1 IDD2 IDD3 IDD4 IDD5 IDD6 IDD7 IDD7A IDD8 IDD9 IDD10 IDD11 IDD12 IDD13 IDD13A IDD13B IDD14 IDD14A NOTE: 1. 2. PARAMETER CONDITIONS TXD=0V, RL=∞, RS=0V, AB=0V, ZZ=VDD or LBK=0V See Figure 4 Supply current maintaining a dominant output TXD=0V, RL=60Ω ±1%, RS=0V, AB=0V, ZZ=VDD, LBK=0V See Figure 4 TXD=VDD, RL=60Ω ±1%, RS=0V, AB=0V or Supply current receiving a ZZ=VDD or LBK=0V, VID=1.4V, VIC=2.5V dominant bus input See Figure 4 TXD=VDD, RL=∞, RS= 0V, AB=0V or ZZ=VDD or LBK=0V See Figure 4 TXD=VDD, RL=60Ω ±1%, RS=0V, AB=0V or Supply current maintaining a ZZ=VDD or LBK=0V Recessive output See Figure 4 TXD=VDD, RL=60Ω ±1%, RS=0V, AB=0V or ZZ=VDD or LBK=0V, VID=0.0V, VIC=2.5V See Figure 4 RL=∞, ZZ=0V, TXD=VDD, RS=0V or VDD See Figure 4 R =60Ω ±1%, ZZ =0V, TXD=VDD, RS=0V or VDD L Sleep supply current See Figure 4 (UT64CAN 3330 only) RL=60Ω ±1%, , ZZ=0V, TXD=VDD, RS=0V or VDD, VID=0.0V, VIC=2.5V See Figure 4 RL=∞, RS=VDD, TXD=VDD, AB=0V or ZZ=VDD or LBK=0V See Figure 4 RL=60Ω ±1%, RS=VDD, TXD=VDD, AB=0V or ZZ=VDD or LBK=0V Standby supply current See Figure 4 RL=60Ω ±1%, RS=VDD, TXD=VDD, AB=0V or ZZ=VDD or LBK=0V, VID=0.0V, VIC=2.5V See Figure 4 R L=∞, RS=0V, TXD=VDD, AB=0V or ZZ=VDD or Supply Current Under High LBK=0V, VCANH/L=+/-24V Voltage Fault(2) See Figure 4 RL=∞, RS=0V, TXD=0V, AB=VDD See Figure 4 Supply Current Operating in RL=60Ω ±1%, RS=0V, TXD=0V, AB=VDD Auto Loopback See Figure 4 (UT64CAN 3332 only) RL=60Ω ±1%, RS=0V, TXD=0V, AB=VDD, VID=1.4V, VIC=2.5V See Figure 4 RL=∞, RS=0V, TXD=0V, LBK=VDD Supply Current Operating in See Figure 4 Diagnostic Loopback RL=60Ω ±1%, RS=0V, TXD=0V, LBK=VDD (UT64CAN 3331 only) See Figure 4 MIN MAX -- 18.00 UNITS mA -- 60.00 -- 3.00 -- 3.00 -- 3.00 -- 3.00 -- 60.00 -- 60.00 -- 115.00 -- 1.6 -- 1.65 -- 1.6 -- 6.00 -- 3.00 -- 3.00 -- 3.00 -- 3.00 -- 3.00 mA mA µA mA mA mA mA All voltages referenced to VSS Guaranteed by characterization for VCANH/L = +/-36V 00-00-00-000 Version 2.2.0 7 Cobham Semiconductor Solutions Cobham.com/HiRel DRIVER (1) (VDD= 3.3V ± 0.3V, -55°C< TC <+125°C); Unless otherwise noted, TC is per the temperature range ordered Table 6: DC Electrical Characteristics SYMBOL PARAMETER VCANH1 Bus output voltage (dominant) CANH VCANL1 Bus output voltage (dominant) CANL VCANH2 VCANL2 VODD1 Bus output voltage (recessive) CANH Bus output voltage (recessive) CANL Differential output voltage (dominant) VODD2 VODR1 Differential output voltage (recessive) VODR2 IOSH1 IOSH2 Short-circuit output(2) IOSL1 IOSL2 CONDITIONS TXD=0V, RS=0V, RL=60Ω ±1%, AB=0V or ZZ=VDD or LBK=0V See Figure 5 and Figure 6 TXD=0V, RS=0V, RL=60Ω ±1%, AB=0V or ZZ=VDD or LBK=0V See Figure 5 and Figure 6 TXD= VDD, RS=0V, RL=60Ω ±1%, AB=0V or ZZ=VDD or LBK=0V See Figure 5 and Figure 6 TXD=VDD, RS=0V, RL=60Ω ±1%, AB=0V or ZZ=VDD or LBK=0V See Figure 5 and Figure 6 TXD=0V, RS=0V, RL=60Ω ±1%, AB=0V or ZZ=VDD or LBK=0V See Figure 5 and Figure 6 TXD=0V, RS=0V, VTEST = -7 to +12V, AB=0V or ZZ=VDD or LBK=0V See Figure 6 and Figure 7 TXD=VDD, RS=0V, RL=60Ω ±1%, AB=0V or ZZ=VDD or LBK=0V See Figure 5 and Figure 6 TXD=VDD, RS=0V, RL=∞, AB=0V or ZZ=VDD or LBK=0V See Figure 5 and Figure 6 VCANH=–7 V, CANL=∞, TXD=0V, RS=0V, AB=0V or ZZ=VDD or LBK=0V See Figure 8 VCANH=12 V, CANL=∞, TXD=0V, RS=0V, AB=0V or ZZ=VDD or LBK=0V See Figure 8 VCANL=–7 V, CANH=∞, TXD=0V, RS=0V, AB=0V or ZZ=VDD or LBK=0V See Figure 8 VCANL=12 V, CANH=∞, TXD=0V, RS=0V, AB=0V or ZZ=VDD or LBK=0V See Figure 8 MIN MAX 2.45 VDD 0.50 1.25 V 2.0 3.0 V 2.0 3.0 1.5 3.0 8 V V V 1.2 3.0 –120 12 mV –500 50 mV –250 -- -- 1 mA –1 -- -- 250 NOTE: 1. All voltages referenced to VSS 2. Guaranteed by characterization 00-00-00-000 Version 2.3.0 UNITS Cobham Semiconductor Solutions Cobham.com/HiRel RECEIVER (1) (VDD= 3.3V ± 0.3V, -55°C< TC <+125°C); Unless otherwise noted, TC is per the temperature range ordered Table 7: DC Electrical Characteristics SYMBOL VIT+ VIT– VHST IIR1 IIR2 IIR3 PARAMETER Positive-going input threshold voltage Negative-going input threshold voltage Hysteresis voltage Bus input current IIR4 CH CANH capacitance(2) CL CANL capacitance(2) CID Differential capacitance(2) RID Differential input resistance RH RL RM Single ended input resistance CANH Single ended input resistance CANL Percent difference between RH and RL CONDITIONS AB=0V or ZZ=VDD or LBK=0V, VIC=2.5V See Figure 9 and Table 6 VHST=VIT+ – VIT– VCANH or VCANL = 12V TXD=VDD, VCANH or VCANL = 12V and VDD ≤ AB=0V or VSS+0.3V ZZ=VDD or VCANH or VCANL = –7V LBK=0V, Other VCANH or VCANL = –7V and VDD ≤ bus pin (VCANH or VCANL) at 0V VSS+0.3V CANH to VSS, VI= 0.025*Sin(2E6t)+2.3V, TXD=VDD, AB=0V or ZZ=VDD or LBK=0V CANL to VSS, VI= 0.025*Sin(2E6t)+2.3V, TXD=VDD, AB=0V or ZZ=VDD or LBK=0V CANH to CANL, VI = 0.025*Sin(2E6t), TXD=VDD, AB=0V or ZZ=VDD or LBK=0V AB=0V or ZZ=VDD or LBK=0V R 2∗| R R R | ∗ 100 MIN MAX -- 900 500 -- 20 -- -500 -- 600 –610 -- –450 -- -- 50 -- 50 -- 25 40 100 20 50 20 50 -- 3.0 NOTE: 1. All voltages referenced to VSS 2. Capacitance is measured for initial qualification and when design changes might affect the input/output capacitance 00-00-00-000 Version 2.3.0 9 Cobham Semiconductor Solutions Cobham.com/HiRel UNIT mV µA pF kΩ % ANALOG INPUT (RS)(1) (VDD= 3.3V ± 0.3V, -55°C< TC <+125°C); Unless otherwise noted, TC is per the temperature range ordered Table 8: DC Electrical Characteristics SYMBOL VRS1 VRS2 PARAMETER Input voltage for enabling Highspeed mode (8Mbps operation) Input Voltage for enabling Standby mode MIN MAX UNIT VSS 300 mV 0.75*VDD 5.5 V VRS=0V -500 -100 µA CONDITIONS TXD=VDD, RL=60Ω ±1%, AB=0V or ZZ=VDD or LBK=0V TXD=VDD, RL=60Ω ±1%, AB=0V or ZZ=VDD or LBK=0V IRS1 High-Speed mode input current IRS2 Standby mode input current VRS=0.75*VDD -- 30 µA IRS3 Standby mode input current VRS=5.5V -- 50 µA IRS4 Cold sparing leakage current VRS=5.5V or VRS ≤ 0.3V, VDD ≤ VSS+0.3V -20 20 µA NOTE: 1. All voltages referenced to VSS TTL I/O (TXD, ZZ, AB, RXD, LBK) (1) (VDD= 3.3V ± 0.3V, -55°C< TC <+125°C); Unless otherwise noted, TC is per the temperature range ordered Table 9: DC Electrical Characteristics SYMBOL PARAMETER CONDITIONS MIN MAX UNIT VIH Input Voltage High 2 -- V VIL Input Voltage Low -- 0.8 V IIOD Input leakage current on TXD Vin=0V or Vin=5.5V -60 100 µA IIO Input leakage current on pins (ZZ, AB, LBK) Vin=0V or Vin=5.5V -10 100 µA ICS Cold sparing leakage current (TXD, ZZ, AB, RXD, LBK) Vin=0.0V and Vin=5.5V, -20 20 µA VOH Output high voltage on RXD IOH=-4mA 2.4 -- V VOL Output Low voltage on RXD IOL=4mA -- 0.4 V CIO Input Capacitance(2) -- 10 pF VDD ≤ VSS+0.3V TXD or ZZ or AB or RXD or LBK to VSS, VI= 0.025*Sin(2E6t), RS=0V NOTE: 1. All voltages referenced to VSS 2. Guaranteed by characterization 00-00-00-000 Version 2.3.0 10 Cobham Semiconductor Solutions Cobham.com/HiRel AC ELECTRICAL CHARACTERISTICS DRIVER (1) (VDD= 3.3V ± 0.3V, -55°C< TC <+125°C); Unless otherwise noted, TC is per the temperature range ordered Table 10: DC Electrical Characteristics SYMBOL PARAMETER CONDITIONS MIN MAX RS=0V, RL=60Ω ±1%, AB=0V or ZZ=VDD or LBK=0V, VTXD ≤ 125kHz (Square wave, 50% duty cycle, tr ≤ 6ns, tf ≤ 6ns, ZO=50Ω), See Figure 10 -- 85 RS with 10kΩ to VSS, RL=60Ω ±1%, AB=0V or ZZ=VDD or LBK=0V, VTXD ≤ 125 kHz (Square wave, 50% duty cycle, tr ≤ 6ns, tf ≤ 6ns, ZO=50Ω), See Figure 10 -- 260 tPLHT3 RS with 100kΩ to VSS, RL=60Ω ±1%, AB=0V or ZZ=VDD or LBK= V, VTXD ≤ 125 kHz (Square wave, 50% duty cycle, tr ≤ 6ns, tf ≤ 6ns, ZO=50Ω), See Figure 10 -- 870 tPHLT1 RS=0V, RL=60Ω ±1%, AB=0V or ZZ=VDD or LBK=0V, VTXD ≤ 125kHz (Square wave, 50% duty cycle, tr ≤ 6ns, tf ≤ 6ns, ZO=50Ω), See Figure 10 -- 120 RS with 10kΩ to VSS, RL=60Ω ±1%, AB=0V or ZZ=VDD or LBK=0V, VTXD ≤ 125kHz (Square wave, 50% duty cycle, tr ≤ 6ns, tf ≤ 6ns, ZO=50Ω), See Figure 10 -- 485 RS with 100kΩ to VSS, RL=60Ω ±1%, AB=0V or ZZ=VDD or LBK=0V, VTXD ≤ 125kHz (Square wave, 50% duty cycle, tr ≤ 6ns, tf ≤ 6ns, ZO=50Ω), See Figure 10 -- 1650 tPLHT1 tPLHT2 tPHLT2 Propagation delay time (TXD input dominant to CAN dominant)(2) Propagation delay time, (TXD recessive to CAN recessive) (2) tPHLT3 00-00-00-000 Version 2.3.0 11 Cobham Semiconductor Solutions Cobham.com/HiRel UNIT ns ns SYMBOL PARAMETER CONDITIONS MIN MAX RS=0V, RL=60Ω ±1%, AB=0V or ZZ=VDD or LBK=0V, VTXD ≤ 125kHz (Square wave, 50% duty cycle, tr ≤ 6ns, tf ≤ 6ns, ZO=50Ω), See Figure 10 -- 75 RS with 10kΩ to VSS, RL=60Ω ±1%, AB=0V or ZZ=VDD or LBK=0V, VTXD ≤ 125kHz (Square wave, 50% duty cycle, tr ≤ 6ns, tf ≤ 6ns, ZO=50Ω), See Figure 10 -- 450 tSKPT3 RS with 100kΩ to VSS, RL=60Ω ±1%, AB=0V or ZZ=VDD or LBK=0V, VTXD ≤ 125kHz (Square wave, 50% duty cycle, tr ≤ 6ns, tf ≤ 6ns, ZO 50Ω), See Figure 10 -- 1250 tRT1 RS=0V, RL=60Ω ±1%, AB=0V or ZZ=VDD or LBK=0V, VTXD ≤ 125kHz (Square wave, 50% duty cycle, tr ≤ 6ns, tf ≤ 6ns, ZO=50Ω), See Figure 10 5 80 tRT2 RS with 10kΩ to VSS, RL=60Ω ±1%, AB=0V or ZZ=VDD or LBK=0V, VTXD ≤ 125kHz (Square wave, 50% duty cycle, tr ≤ 6 s, tf ≤ 6ns, ZO=50Ω), See Figure 10 14 250 tRT3 RS with 100kΩ to VSS, RL=60Ω ±1%, AB=0V or ZZ=VDD or LBK=0V, VTXD ≤ 125kHz (Square wave, 50% duty cycle, tr ≤ 6ns, tf ≤ 6ns, ZO=50Ω), See Figure 10 40 1000 tFT1 RS=0V, RL=60Ω ±1%, AB=0V or ZZ=VDD or LBK=0V, VTXD ≤ 125kHz (Square wave, 50% duty cycle, tr ≤ 6ns, tf ≤ 6ns, ZO=50Ω), See Figure 10 20 75 RS with 10kΩ to VSS, RL=60Ω ±1%, AB=0V or ZZ=VDD or LBK=0V, VTXD ≤ 125kHz (Square wave, 50% duty cycle, tr ≤ 6ns, tf ≤ 6ns, ZO=50Ω), See Figure 10 30 185 tFT3 RS with 100kΩ to VSS, RL=60Ω ±1%, AB=0V or ZZ=VDD or LBK=0V, VTXD ≤ 125kHz (Square wave, 50% duty cycle, tr ≤ 6ns, tf ≤ 6ns, ZO=50Ω), See Figure 10 40 800 tENS TXD=0V, RL=60Ω ±1%, AB=0V or ZZ=VDD or LBK=0V, VRS ≤ 125kHz (Square wave, 50% duty cycle, tr ≤ 6ns, tf ≤ 6ns, ZO=50Ω, RS ˂ 0.75*VDD), See Figure 11 -- 1.50 tSKPT1 tSKPT2 tFT2 Pulse skew (|tPHL – tPLH|) (2) Differential CAN signal rise time(2) (3) Differential CAN signal fall time(2) (3) Enable time from standby deactivate to CAN dominant 00-00-00-000 Version 2.3.0 12 Cobham Semiconductor Solutions Cobham.com/HiRel UNIT ns ns ns µs SYMBOL PARAMETER tENZ Enable time from sleep deactivate to CAN dominant tDISS Disable time from standby assert to CAN recessive tDISZ Disable time from sleep assert to CAN recessive CONDITIONS MIN MAX UNIT ≤ 50kHz RS=0V, TXD=0V, RL=60Ω ±1%, (Square wave, 50% duty cycle, tr ≤ 6ns, tf ≤ 6ns, ZO=50Ω), See Figure 12 (UT64CAN3330 Only) -- 7 µs TXD=0V, RL=60Ω ±1%, AB=0V or ZZ=VDD or LBK=0V, VRS ≤ 125kHz (Square wave , 50% duty cycle, tr ≤ 6ns, tf ≤ 6ns, ZO=50Ω, RS ≥ 0.75*VDD), See Figure 11 -- 150 ns ≤ 50kHz RS=0V, TXD=0V, RL=60Ω ±1%, (Square wave, 50% duty cycle, tr ≤ 6ns, tf ≤ 6ns, ZO=50Ω), See Figure 12 (UT64CAN3330 Only) -- 100 ns NOTE: 1. Per MIL-STD-883, method 3012 2. CL = 75pF or equivalent on the ATE or 15pF ±20% for bench test characterization 3. Guaranteed by characterization 00-00-00-000 Version 2.3.0 13 Cobham Semiconductor Solutions Cobham.com/HiRel RECEIVER (1) (VDD= 3.3V ± 0.3V, -55°C< TC <+125°C); Unless otherwise noted, TC is per the temperature range ordered Table 11: DC Electrical Characteristics SYMBOL PARAMETER tPLHR Propagation delay time (CANH recessive to RXD recessive) (2) tPHLR Propagation delay time (CANH dominant to RXD dominant) (2) tSKPR Pulse skew tRR RXD output signal rise time(2) (3) tFR RXD output signal fall time(2) (3) CONDITIONS RS=0V, TXD=VDD, RL=∞ Ohms ±1%, AB=0V or ZZ=VDD or LBK=0V, VCANH ≤ 125kHz (Square wave, 50% duty cycle, tr ≤ 6ns, tf ≤ 6ns, ZO =50Ω), VCANL=1.25V, See Figure 13 TXD=V RS=0V, DD, RL=∞ Ohms ±1%, AB=0V or ZZ=VDD or LBK=0V, VCANH ≤ 125kHz (Square wave, 50% duty cycle, tr ≤ 6ns, tf ≤ 6ns, ZO=50Ω), VCANL=1.25V, See Figure 13 MIN MAX UNIT -- 60 ns -- 60 ns tSKPR =(|tPHLR – tPLHR|), See Figure 13 -- 25 ns -- 5 ns -- 5 ns RS=0V, TXD=VDD, RL=60Ω ±1%, AB=0V or ZZ=VDD or LBK=0V, VCANH ≤ 125kHz (Square wave, 50% duty cycle, tr ≤ 6ns, tf ≤ 6ns, ZO=50Ω), VCANL=1.50V, See Figure 13 RS=0V, TXD=VDD, RL=60Ω ±1%, AB=0V or ZZ=VDD or LBK=0V, VCANH ≤ 125kHz (Square wave, 50% duty cycle, tr ≤ 6ns, tf ≤ 6ns, ZO=50Ω), VCANL=1.50V, See Figure 13 NOTE: 1. Per MIL-STD-883, method 3012 2. CL = 75pF or equivalent on the ATE or 15pF ±20% for bench test characterization 3. Guaranteed by characterization 00-00-00-000 Version 2.3.0 14 Cobham Semiconductor Solutions Cobham.com/HiRel TRANSCEIVER LOOPBACK (1) (VDD= 3.3V ± 0.3V, -55°C< TC <+125°C); Unless otherwise noted, TC is per the temperature range ordered Table 12: DC Electrical Characteristics SYMBOL PARAMETER CONDITIONS MIN MAX RS=0V, RL=60Ω ±1%, AB=0V or ZZ=VDD or LBK=0V, VTXD ≤ 125kHz (Square wave, 50% duty cycle, tr ≤ 6ns, tf ≤ 6ns, ZO=50Ω), See Figure 14 -- 125 RS with 10kΩ to VSS, RL=60Ω ±1%, AB=0V or ZZ=VDD or LBK=0V, VTXD ≤ 125kHz (Square wave, 50% duty cycle, tr ≤ 6ns, tf ≤ 6ns, ZO=50Ω), See Figure 14 -- 800 tLOOPD3 RS with 100kΩ to VSS, RL=60Ω ±1%, AB=0V or ZZ=VDD or LBK=0V, VTXD ≤ 125kHz (Square wave, 50% duty cycle, tr ≤ 6ns, tf ≤ 6ns, ZO=50Ω), See Figure 14 -- 1500 tLOOPR1 RS=0V, RL=60Ω ±1%, AB=0V or ZZ=VDD or LBK=0V, VTXD ≤ 125kHz (Square wave, 50% duty cycle, tr ≤ 6ns, tf ≤ 6ns, ZO=50Ω), See Figure 14 -- 125 RS with 10kΩ to VSS, RL=60Ω ±1%, AB=0V or ZZ=VDD or LBK=0V, VTXD ≤ 125kHz (Square wave, 50% duty cycle, tr ≤ 6ns, tf ≤ 6ns, ZO=50Ω), See Figure 14 -- 800 RS with 100kΩ to VSS, RL=60Ω ±1%, AB=0V or ZZ=VDD or LBK=0V, VTXD ≤ 125kHz (Square wave, 50% duty cycle, tr ≤ 6ns, tf ≤ 6ns, ZO=50Ω), See Figure 14 -- 1650 -- 20 -- 20 tLOOPD1 tLOOPD2 tLOOPR2 Total loop delay, TXD to RXD, dominant(2) Total loop delay, TXD to RXD, recessive(2) tLOOPR3 tLBK Loopback delay, TXD to RXD(2) RS=0V, RL=60Ω ±1%, LBK=VDD, VTXD ≤ 125kHz (Square wave, 50% duty cycle, tr ≤ 6ns, tf ≤ 6ns, ZO=50Ω), See Figure 15 (UT64CAN3331 Only) tAB1 (2) RS=0V, RL=60Ω, AB=VDD, VTXD ≤ 125kHz (Square wave, 50% duty cycle, tr ≤ 6ns, tf ≤ 6ns, ZO=50Ω), See Figure 16 (UT64CAN3332 Only) tAB2 Loopback delay, TXD to RXD Loopback delay, CAN input to RXD(2) RS=0V, TXD=VDD, RL=∞ Ohms ±1%, AB=VDD, VCANH ≤ 125kHz (Square wave, 50% duty cycle, tr ≤ 6ns, tf ≤ 6ns, ZO=50Ω), See Figure 17 (UT64CAN3332 Only) 15 ns ns ns ns -- 60 NOTE: 1. Per MIL-STD-883, method 3012 2. CL = 75pF or equivalent on the ATE or 15pF ±20% for bench test characterization 00-00-00-000 Version 2.3.0 UNIT Cobham Semiconductor Solutions Cobham.com/HiRel Table 13: Differential Input Voltage Threshold Test INPUT (V) OUTPUT MEASURED (V) R |VID| VCANH VCANL –6.1 –7.0 L 12.0 V –1.0 V 12.0 V –6.5 11.1 L –7.0 L 6.0 L 6.0 –7.0 H 0.5 12.0 V –7.0 V 6.0 V Open 11.5 H –1.0 H 6.0 12.0 H 6.0 Open H X VRS VOL CL=75pF or equiv. ATE load or 15pF ±20% Bench test load 0.9 6.0 VOH 0.5 UT64CAN333x RS CANH VTXDTXD VOD VLBK, VAB, VZZ 60Ω ±1% CANL RXD VRXD 0.9 LBK, AB, ZZ Figure 4: DC Test Configuration Figure 5: Driver Voltage, Current, and Test Definition 00-00-00-000 Version 2.3.0 16 Cobham Semiconductor Solutions Cobham.com/HiRel Dominant Recessive ~3.0V (CANH) ~2.3V ~1.0V (CANL) Figure 6: Bus Logic State Voltages Definitions Figure 7: Driver VOD RS IOSH TXD + 0 V or VDD IOSL VI VRS - Figure 8: IOS Test Circuit and Waveforms 00-00-00-000 Version 2.3.0 17 Cobham Semiconductor Solutions Cobham.com/HiRel Figure 9: Receiver Voltage and Current Definitions RS CANH TXD + VRS - 60Ω ±1% VO CL=75pF or equiv. ATE load or 15pF ±20% Bench test load CANL VI Figure 10: Drive Test Circuit and Voltage Waveforms VRS RS UT64CAN333x CANH VTXDTXD VLBK, VAB, VZZ 60Ω ±1% CANL RXD VRXD CL=75pF or equiv. ATE load or 15pF ±20% Bench test load VOD LBK, AB, ZZ Figure 11: tENS and tDISS Test Circuit and Voltage Waveforms 00-00-00-000 Version 2.3.0 18 Cobham Semiconductor Solutions Cobham.com/HiRel VRS UT64CAN333x RS CANH VTXDTXD VLBK, VAB, VZZ 60Ω ±1% CANL RXD VRXD CL=75pF or equiv. ATE load or 15pF ±20% Bench test load VOD LBK, AB, ZZ Figure 12: tENZ Test Circuit and Voltage Waveforms Figure 13: Receiver Test Circuit and Voltage Waveforms VRS RS UT64CAN333x CANH VTXDTXD VLBK, VAB, VZZ 60Ω ±1% CANL RXD VRXD CL=75pF or equiv. ATE load or 15pF ±20% Bench test load VOD LBK, AB, ZZ Figure 14: tLOOP Test Circuit and Voltage Waveforms 00-00-00-000 Version 2.3.0 19 Cobham Semiconductor Solutions Cobham.com/HiRel Figure 15: tLBK Test Circuit and Voltage Waveforms Figure 16: tAB1 Test Circuit and Voltage Waveforms Figure 17: tAB2 Test Circuit and Voltage Waveforms 00-00-00-000 Version 2.3.0 20 Cobham Semiconductor Solutions Cobham.com/HiRel TEST LOADS Figure 18: Standard Test Load NOTE: 1. CL = 78 pF minimum or equivalent (includes scope probe and test socket) 2. Measurement of data output occurs at the low to high or high to low transition mid-point, typically VDD/2 00-00-00-000 Version 2.3.0 21 Cobham Semiconductor Solutions Cobham.com/HiRel PACKAGING 4. Finished Package Weight: 450 mg (maximum) Figure 19: 8-lead Ceramic Flatpack (Units in mm) 00-00-00-000 Version 2.3.0 22 Cobham Semiconductor Solutions Cobham.com/HiRel Recommended PCB mounting guidelines (Following J-STD-001E): □ Body to first bend: 0.040” min. □ Standoff Height: Customer determined □ Foot Width: 0.050” Figure 20: Recommended Footprint 00-00-00-000 Version 2.3.0 23 Cobham Semiconductor Solutions Cobham.com/HiRel ORDERING INFORMATION Generic Datasheet Part Numbering UT64CAN **** * * * * Lead Finish: (Notes 1, 2) (A) = Hot solder dipped (C) = Gold (X) = Factory option (gold or solder) Screening: (Notes 3, 4) (P) = Prototype flow (Temperature Range: +25°C only) (C) = HiRel flow (Temperature Range: -55°C to +125°C) Package Type: (X) = 8-lead Flatpack (dual-in-line) Access Time: (-) Device Type: 3330 = Sleep 3331 = Diagnostic Loopback 3332 = Auto-baud Loopback NOTES: 1. 2. 3. 4. Lead finish (A,C, or X) must be specified. If and "X" is specified when ordering, then the part marking will match the lead finish applied to the device shipped Prototype Flow per Aeroflex Manufacturing Flows Document. Lead finish is GOLD "C" only. Radiation is neither tested nor guaranteed. HiRel Flow per Aeroflex Manufacturing Flows Document. Radiation TID tolerance may be ordered. 00-00-00-000 Version 2.3.0 24 Cobham Semiconductor Solutions Cobham.com/HiRel ORDERING INFORMATION SMD Part Numbering 5962 - 15232 ** * * * Lead Finish: (Notes 1 & 2) A = Solder C = Gold X = Optional Package Type: X = 8-lead ceramic bottom-brazed dual-in-line Flatpack Class Designator: Q = QML Class Q V = QML Class V Device Type: 01 = UT64CAN3330 w/Sleep 02 = UT64CAN3331 w/Diagnostic Loopback 03 = UT64CAN3332 w/Auto-baud Loopback Drawing Number: 15232 Total Dose: (Note 3) R = 1E5 rads(Si) NOTES: 1. Lead finish (A,C, or X) must be specified. 2. If and "X" is specified when ordering, then the part marking will match the lead finish applied to the device shipped 00-00-00-000 Version 2.3.0 25 Cobham Semiconductor Solutions Cobham.com/HiRel REVISION HISTORY Table 14: Revision History Date Rev. # Change Description 11/17/15 2.0.0 12/15/15 2.1.0 12/17/15 2.2.0 1/28/15 2.3.0 Initial release of Preliminary Datasheet Removed VOCPP spec, corrected typos, updated RXD rise and fall time spec, and updated figure 13. Updated SEL limit on feature page, Changed note 3 in table 2, changed note 3 and SEL limit in table 3, updated figures and tables, updated RXD rise and fall time spec, removed transient overvoltage spec, removed I/O capacitance minimum QML Q approved. Minor updates to formatting and added ATE equivalent circuit. Added mixed signal bus operation and split termination verbiage. Template Revision: A 00-00-00-000 Version 2.3.0 26 Cobham Semiconductor Solutions Cobham.com/HiRel Cobham Semiconductor Solutions – Datasheet Definitions Advanced Datasheet - Product In Development Preliminary Datasheet - Shipping Prototype Datasheet - Shipping QML & Reduced Hi – Rel The following United States (U.S.) Department of Commerce statement shall be applicable if these commodities, technology, or software are exported from the U.S.: These commodities, technology, or software were exported from the United States in accordance with the Export Administration Regulations. Diversion contrary to U.S. law is prohibited. Cobham Semiconductor Solutions 4350 Centennial Blvd Colorado Springs, CO 80907 E: [email protected] T: 800 645 8862 Aeroflex Colorado Springs Inc., dba Cobham Semiconductor Solutions, reserves the right to make changes to any products and services described herein at any time without notice. Consult Aeroflex or an authorized sales representative to verify that the information in this data sheet is current before using this product. Aeroflex does not assume any responsibility or liability arising out of the application or use of any product or service described herein, except as expressly agreed to in writing by Aeroflex; nor does the purchase, lease, or use of a product or service from Aeroflex convey a license under any patent rights, copyrights, trademark rights, or any other of the intellectual rights of Aeroflex or of third parties. 00-00-00-000 Version 2.3.0 27 Cobham Semiconductor Solutions Cobham.com/HiRel