Standard Product
UT7R995/C RadClock Jitter Performance
Application Note
Cobham.com/HiRel
January 21, 2016
The most important thing we build is trust
Table 1: Cross Reference of Applicable Products
PRODUCT NAME
RadClock Multi-phase
PLL Clock Buffer
1.0
MANUFACTURER
PART NUMBER
UT7R995
UT7R995C
SMD #
DEVICE TYPE
5962-05214
01-04
INTERNAL PIC
NUMBER
WD27
WD35
Overview
Clock jitter is a critical performance parameter in most electronic systems today. As next generation system clocks run
faster, the direct impact of jitter also increases proportionately. For example, excess jitter on the system clock can have
the following results: 1) adversely impacts the bit error rate (BER) in serial data systems, 2) degrades accuracy of, and
therefore reduces speed for clocks in computer central processing units (CPUs) and digital signal processors (DSPs), and
3) limits the signal-to-noise ratio (SNR), reducing the effective number of bits (ENOB) of resolution of analog-to-digital
converters (ADCs). The UT7R995/C RadClock Multi-phase PLL Clock Buffer provides a multi-phase, multiple output, low
jitter clock with selectable, user-defined output frequencies from a single input reference clock. The UT7R995/C includes
an internal phase-locked loop (PLL). The internal PLL provides “zero delay” operation when using an external feedback
path, and can reduce jitter transfer from the input reference clock due to the low-pass filter (LPF) operation of the PLL
loop bandwidth (BW).
This Application Note (AN) provides a brief overview of clock jitter, including definitions and general measurement
methods. The primary purpose of this AN is to present additional measured jitter data for the UT7R995/C RadClock and
is supplemental to the data sheet. The measured jitter data contained in this AN is for reference only and not
guaranteed, since the RadClock has not been fully characterized over all conditions specified in the data sheet during
testing for this AN. These data include time domain cycle-to-cycle (C2C) jitter (JC2C) and period jitter (JPER) from
oscilloscope measurements, and phase, or random jitter (JR) derived from frequency domain phase noise measurements.
2.0
Technical Background
The UT7R995/C RadClock 2.5V/3.3V 200 MHz High-Speed Multi-Phase PLL Clock Buffer is a low-voltage low-power,
eight-output, 6-200 MHz clock driver with output clock phase programmability. The core power supply is 3.3V. The
outputs can be operated on either 2.5V or 3.3V power supplies, where output banks 1-4 can be operated using either
2.5V or 3.3V independently of one another.
3.0
Clock Jitter: General Description and Information
Timing jitter is defined as the unwanted phase modulation of a digital or analog signal and is considered one of the most
important requirements for specifying, or measuring a device’s signal integrity and quality. Jitter is an unwanted variation
in signal period, frequency, phase, duty cycle or other timing characteristic and can be of interest from cycle to cycle,
over many consecutive cycles, or even longer-term. This section of the AN describes some of the basic terminology and
measurement techniques used in quantifying and characterizing jitter in general and for clock jitter specifically.
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3.1
Elements of Clock Jitter
Clock signals are periodic. Clock jitter is primarily determined by random noise processes in the clock source and not by
deterministic jitter (JD), or data-dependent jitter (JDD) contributors as can be the case for high-speed data signals, for
example. Since clock jitter is a random process, it is best described by Gaussian (normal) statistics with units of seconds
(s), root mean square (rms).
Clock random jitter (JR) is primarily dependent on the clock signal rise and fall times (tr,tf) for square wave signals and its
analog, slew rate (SR), for sine wave signals, as well as device input noise voltage (vn, rms) in both cases. The simple
relationships between JR, SR, and vn for a sine wave clock are shown below in Equations 3.1a,b and Figures 3.1a,b.
Slew Rate (SR) = 2πfA = ωA; A=Vpk=Amplitude (V), f=frequency (Hz)
(3.1a)
Figure 3.1a: Random Jitter vs. Slew Rate for a Sine Wave Signal (Simulated)
JR = vn(rms)/SR
(3.1b)
Figure 3.1b: Random Jitter vs. Input Noise Voltage for a Sine Wave Signal (Simulated)
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In general, increasing slew rate (SR) or clock frequency, and decreasing vn or receiver (Rx) rms input noise voltage for a
sine wave input results in lower JR. Figure 3.1c shows the time uncertainty (∆τ), or random jitter (JR) for two different
SR, but fixed amplitude sine wave clock signals. Consider an arbitrary active Rx device (e.g. clock buffer) in the clock
signal path with input voltage noise vn, where vn is the same rms value for both SR cases in Figure 3.1c. The lower
frequency clock (left-hand figure), with lower slew rate (SR1), will spend more time in the linear region where the noise of
the input circuit , resulting in greater time uncertainty, as represented by ∆τ1, versus the higher frequency clock (righthand figure), with higher slew rate (SR2) and smaller time uncertainty ∆τ2.
Figure 3.1c: Slew Rate Dependence of Random Jitter
A square wave clock may be used to achieve faster input tr, tf, however, there are additional considerations for a square
wave clock. A square wave clock must also contain additional frequency content over the fundamental clock frequency,
as shown by Fourier Analysis, while a sine wave clock is a much closer approximation to a single frequency or tone. A
square wave clock, for example, may have higher jitter versus a sine wave clock due to additional frequency content,
harmonics, spurs, etc., which can nullify any jitter reduction due to higher edge rate/slew rate. Phase noise
measurements and associated jitter calculations using a predetermined integration bandwidth for either clock source
shows the actual phase jitter and so can be used as a selection tool for choosing between different clock sources and
signal formats.
Clock jitter is random jitter (JR) and its distribution is unbounded. This means that the peak-to-peak (p-p) value is not
well defined. Because JR is unbounded, determining p-p value is best accomplished by defining the p-p value at a given
bit error rate (BER). The rms JR clock jitter value can be converted to a peak-to-peak (p-p) value by multiplying by the
Gaussian statistics crest factor corresponding to the desired BER. This method, and in the example calculation, below,
assumes that there is no deterministic jitter (JD) component, which is a good assumption for clock signals.
Example calculation:
Inputs:
BER = 1e-12; Typical value for many high-speed data communication systems = 1 error per 1 Trillion bits transmitted.
JR = Random Jitter = 1 ps (rms)
Data Transition Density (DTD) for a clock signal =1
Crest Factor = α = 14.261
JD = Deterministic Jitter = 0 ps (p-p)
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Calculation:
JR p-p = α * JR rms
(3.1c)
jitter (p-p) = 1 ps (rms) * 14.261 = 14.261 ps (p-p)
Crest factors for a range of BER and data or clock signal formats is given in Table 3.1a, below.
Table 3.1a: JR rms to JR p-p conversion: Crest Factor (α) vs. BER
BER
1e-01
1e-02
1e-03
1e-04
1e-05
1e-06
1e-07
1e-08
1e-09
1e-10
1e-11
1e-12
1e-13
1e-14
1e-15
1e-16
Crest Factor = α*
Data Transition Density (DTD) = 0.5
Data Transition Density (DTD) = 1
(Typical Data Signals)
(Clock Signals)
2.563
3.290
4.653
5.152
6.180
6.581
7.438
7.781
8.530
8.834
9.507
9.783
10.399
10.653
11.224
11.461
11.996
12.219
12.723
12.934
13.412
13.613
14.069
14.261
14.698
14.882
15.301
15.479
15.883
16.054
16.444
16.610
* From Gaussian statistics:
Q(x) = 0.5 * erfc(x/√2); x = BER, erfc(x) is the complementary error function
(3.1d)
BER(QBER) = 0.5*DTD*erfc(QBER /√2);
(3.1e)
-1
3.2
QBER =√2 * erfc (2*BER/DTD)
(3.1f)
α = 2*QBER
(3.1g)
Jitter: Time Domain vs. Frequency Domain
Clock jitter is typically defined as three main types. These are 1) cycle-to-cycle jitter (JC2C), 2) period jitter (JPER), and 3)
phase jitter (RPH), which is also called random jitter (JR). All three types of jitter can be measured in the time domain,
while RPH (JR) is measured most accurately in the frequency domain from phase noise data.
Test and measurement equipment for jitter characterization consists of time domain oscilloscopes or frequency domain
signal source analyzers (SSAs), spectrum analyzers (SAs), or phase noise analyzers (PNAs). The frequency domain
equipment has the lowest noise floor compared to oscilloscopes and so phase noise techniques are the preferred method
for clock jitter measurements since they are the most accurate. The rms phase jitter can be derived from phase noise
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measurements by integrating phase noise over a specified bandwidth (BW). It is common to use the SONET OC-48 jitter
BW of 12kHz-20MHz, as a reference, for example. An SA with phase noise measurement software can also be used for
measuring phase noise and for calculating JR.
These three jitter types are detailed and defined below in Equations 3.2a-c and Figures 3.2a-f, below.
Cycle-to-Cycle Jitter (JC2C) is the maximum time difference between two adjacent clock periods over N clock
3
cycles, where N = 10 .
JC2C = max {|Tper(n) – Tper(n+1)|} ; 1 ≤ n ≤ N, ps p-p
(3.2a)
Figure 3.2a: Cycle-to-Cycle jitter definition
Period Jitter (JPER) is the time difference between the ideal clock period Tper(0) and the measured clock period
3
4
Tper(n) over N clock cycles, where N = 10 , or 10 .
JPER = |Tper(0) – Tper(n)| ; 1 ≤ n ≤ N, ps p-p.
(3.2b)
Figure 3.2b: Period jitter definition
Phase jitter (RPH) is most accurately measured in the frequency domain as derived from phase noise measurements. The
following equation is used for calculating phase jitter (JPH), or random jitter (JR), and is typically performed by software
included as part of the phase noise measurement equipment.
JR = (1/2πf)*√(2⨜L(f)df; L(f)
(3.2c)
L(f) is the single sideband (SSB) phase noise spectrum (dBc/Hz). The integration BW is specified by the user, as
described above.
Figures 3.2c-f , below, depict phase noise calculation and plotting from frequency spectrum measurements and also
shows the integration bandwidth on the phase noise plot that is used to calculate phase or random jitter. Only random
jitter (JR) components are shown.
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Figure 3.2c: Frequency Spectrum of Single Tone
without Phase Noise
Figure 3.2d: Frequency Spectrum of Single Tone
with Phase Noise
Figure 3.2e: Phase Noise vs. Frequency
without Integration BW shown
Figure 3.2f: Phase Noise vs. Frequency
with Integration BW for JR calculations
The SONET OC-48 integration band, or mask of 12kHz-20MHz is widely used as a standard integration BW when
calculating phase jitter from phase noise for typical system clock signals. This mask was chosen for UT7R995 RadClock
Phase Jitter measurements. Other bands, or masks can be implemented, depending on the selected data protocol, or
other user requirements, such as phase noise (dBc/Hz) at a limited set of frequencies (Hz), for example.
3.3
UT7R995/C RadClock Measured Jitter Data
Measured jitter data for : Cycle-to-Cycle Jitter (JC2C), Period Jitter (JPER), and Phase, or Random Jitter (JR) are presented in
this section as summary plots of the respective jitter vs. RadClock output frequency, divider settings and temperature.
Details of the test conditions and RadClock settings are provided in Section 3.3.0.
3.3.1
Test Equipment Setup and Measurement Conditions
Test equipment setup is presented in this section for both Time-Domain and Frequency-Domain measurements. The
custom low noise, low jitter, dedicated 3.3V LVCMOS clock source is used for all measurements. The complete integrated
test equipment setup configuration is shown below as a block diagram in Figure 3.3.0.a.
A) Time-Domain measurements: Cycle-to-Cycle Jitter (JC2C) and Period Jitter (JPER) are defined and measured in the timedomain, and so a digital sampling oscilloscope (DSO) is used for this purpose. A LeCroy oscilloscope is used to observe
and measure the device under test (DUT) output waveforms, and calculate JC2C.and JPER . The LeCroy (WRXi-) JTA2-OME Rev. A Jitter & Timing Analysis software option is the primary application used for time-domain jitter measurement and
analysis. The number of clock cycles for Time-Domain measurements was set per JEDEC standard JESD65B, Table 2,
p.2; Definition of Skew Specifications for Standard Logic Devices.
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Table 3.3.1.a: Number of Clock Cycles for Time-Domain Jitter Measurements
Jitter Type
Cycle-to-Cycle Jitter (JC2C)
Period Jitter (JPER)
Number of Clock Cycles
1,000
10,000
B) Frequency-Domain measurements: Phase, or Random Jitter (JR) is most accurately measured in the frequency-domain.
A Spectrum Analyzer with Phase Noise (PN) software is used for this purpose. An Agilent N9030A PXA Spectrum Analyzer
combined with N9068A PN Application software is used to measure PN, and calculate JR by integrating PN over a specified
bandwidth (BW). The integration BW selected is the SONET OC-48 mask of 12kHz-20MHz. The lower frequency bound
for Phase/Random Jitter measurements was limited to 50 MHz due to noise floor limitations of the test equipment.
The remaining equipment shown is used for VDD biasing, temperature control, and for automation of the measurements,
including data collection. Both Time- and Frequency-Domain measurements are made during each test program step,
where the RadClock configuration settings are fixed. Configuration settings are /N, /R divider ratios and input
frequencies. The program then moves to the next step with different configuration settings. The VDD power supplies are
set to nominal 3.3V and temperature is held constant for each complete set of RadClock configuration settings. Jitter
measurements are made at three temperatures: -55°C, +25°C, and +125°C. The data presented in this AN reflects the
maximum jitter value measured for each jitter type (i.e. JC2C, JPER, JR), across three different DUTs. All measurements
were performed in an Engineering lab via bench measurements and not in a production test environment.
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Figure 3.3.1.a: Test Equipment Setup Block Diagram
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3.3.2
Measured Data - Cycle-to-Cycle Jitter (JC2C)
Figure 3.3.2.a: Cycle-to-Cycle (C2C) Jitter (JC2C) vs. Output Frequency and PLL Divider Settings: /N, /R - Summary
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Figure 3.3.2.b: Cycle-to-Cycle (C2C) Jitter (JC2C) vs. Output Frequency and PLL Divider Settings: /N=1, /R=1
Figure 3.3.2.c: Cycle-to-Cycle (C2C) Jitter (JC2C) vs. Output Frequency and PLL Divider Settings: /N=2, /R=2
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Figure 3.3.2.d: Cycle-to-Cycle (C2C) Jitter (JC2C) vs. Output Frequency and PLL Divider Settings: /N=1, /R=2
Figure 3.3.2.e: Cycle-to-Cycle (C2C) Jitter (JC2C) vs. Output Frequency and PLL Divider Settings: /N=2, /R=1
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Figure 3.3.2.f: Cycle-to-Cycle (C2C) Jitter (JC2C) vs. Output Frequency and PLL Divider Settings: /N=3, /R=1
Figure 3.3.2.g: Cycle-to-Cycle (C2C) Jitter (JC2C) vs. Output Frequencyand and PLL Divider Settings: /N=4, /R=1
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Measured Data - Period Jitter (JPER)
3.3.3
Figure 3.3.3.a: Period Jitter (JPER) vs. Output Frequency and PLL Divider Settings: /N, /R - Summary
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Figure 3.3.3.b: Period Jitter (JPER) vs. Output Frequency and PLL Divider Settings: /N=1, /R=1
Figure 3.3.3.c: Period Jitter (JPER) vs. Output Frequency and PLL Divider Settings: /N=2, /R=2
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Figure 3.3.3.d: Period Jitter (JPER) vs. Output Frequency and PLL Divider Settings: /N=1, /R=2
Figure 3.3.3.e: Period Jitter (JPER) vs. Output Frequency and PLL Divider Settings: /N=2, /R=1
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Figure 3.3.3.f: Period Jitter (JPER) vs. Output Frequency and PLL Divider Settings: /N=3, /R=1
Figure 3.3.3.g: Period Jitter (JPER) vs. Output Frequency and PLL Divider Settings: /N=4, /R=1
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Measured Data - Phase or Random Jitter (JR)
3.3.4
Figure 3.3.4.a: Phase or Random Jitter (JR) vs. Output Frequency and PLL Divider Settings: /N, /R - Summary
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Figure 3.3.4.b: Phase or Random Jitter (JR) vs. Output Frequency and PLL Divider Settings: /N=1, /R=1
Figure 3.3.4.c: Phase or Random Jitter (JR) vs. Output Frequency and PLL Divider Settings: /N=2, /R=2
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Figure 3.3.4.d: Phase or Random Jitter (JR) vs. Output Frequency and PLL Divider Settings: /N=1, /R=2
Figure 3.3.4.e: Phase or Random Jitter (JR) vs. Output Frequency and PLL Divider Settings: /N=2, /R=1
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Figure 3.3.4.f: Phase or Random Jitter (JR) vs. Output Frequency and PLL Divider Settings: /N=3, /R=1
Figure 3.3.4.g: Phase or Random Jitter (JR) vs. Output Frequency and PLL Divider Settings: /N=4, /R=1
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Measured Data – Summary Table
3.3.5
Table 3.3.5.a: RadClock Measured Jitter Data Summary
RadClock Frequency Input, Output Settings
PD*
fin
fout
Divide
DS[1:0]
DS1 DS0 FS /DIV
(MHz)
(MHz)
Ratio
M M
L
H
50.01
50.01
1.0
M M M
H
58.83
58.83
1.0
M M M
H
76.94
76.94
1.0
M M M
H
100.02
100.02
1.0
M M
H
H
100.02
100.00
1.0
M M
H
H
111.13
111.13
1.0
M M
H
H
125.02
125.02
1.0
M M
H
H
142.87
142.89
1.0
M M
H
H
166.69
166.68
1.0
M M
H
H
200.03
200.04
1.0
L
L
M
H
50.01
100.01
2.0
L
L
H
H
58.83
117.66
2.0
L
L
H
H
76.94
153.88
2.0
L
L
H
H
100.01
200.04
2.0
L
M
H
H
50.01
150.02
3.0
L
M
H
H
58.83
176.49
3.0
L
H
H
H
50.01
200.03
4.0
M M
L
M
58.83
29.42
0.5
M M
L
M
76.93
38.47
0.5
M M
L
M
100.01
50.01
0.5
M M M M
111.13
55.56
0.5
M M M M
125.02
62.51
0.5
M M M M
142.88
71.44
0.5
M M M M
166.69
83.35
0.5
M M M M
200.03
100.02
0.5
L
L
L
M
50.01
50.01
1.0
L
L
M M
58.83
58.83
1.0
L
L
M M
76.93
76.93
1.0
L
L
M M
100.01
100.01
1.0
L
L
H
M
111.13
111.13
1.0
L
L
H
M
125.01
125.01
1.0
L
L
H
M
142.89
142.87
1.0
L
L
H
M
166.68
166.68
1.0
L
L
H
M
200.02
200.04
1.0
4.0
Cycle‐to‐Cycle Jitter Measured Data
J_C2C_‐55°C
J_C2C_+125°C
J_C2C_+25C°
(s p‐p)
(s p‐p)
(s p‐p)
5.50E‐11
6.70E‐11
5.70E‐11
5.60E‐11
6.30E‐11
6.00E‐11
5.10E‐11
5.70E‐11
5.20E‐11
4.90E‐11
5.60E‐11
5.70E‐11
5.30E‐11
7.40E‐11
5.20E‐11
4.20E‐11
5.40E‐11
5.30E‐11
5.10E‐11
5.80E‐11
6.30E‐11
5.20E‐11
7.30E‐11
5.60E‐11
6.40E‐11
6.00E‐11
6.50E‐11
5.40E‐11
5.70E‐11
5.10E‐11
5.50E‐11
9.20E‐11
6.40E‐11
5.90E‐11
1.01E‐10
8.50E‐11
7.20E‐11
1.00E‐10
6.50E‐11
9.60E‐11
6.10E‐11
9.50E‐11
9.40E‐11
8.00E‐11
1.03E‐10
1.16E‐10
9.60E‐11
9.40E‐11
7.90E‐11
9.40E‐11
8.50E‐11
5.40E‐11
5.80E‐11
6.30E‐11
5.00E‐11
5.80E‐11
6.10E‐11
5.80E‐11
6.80E‐11
5.70E‐11
4.50E‐11
5.70E‐11
4.70E‐11
5.40E‐11
5.50E‐11
5.20E‐11
5.30E‐11
7.70E‐11
6.50E‐11
4.80E‐11
5.50E‐11
5.30E‐11
5.50E‐11
6.30E‐11
6.00E‐11
4.90E‐11
5.90E‐11
5.40E‐11
5.80E‐11
5.80E‐11
5.20E‐11
6.20E‐11
7.30E‐11
6.60E‐11
5.90E‐11
7.90E‐11
6.00E‐11
6.30E‐11
7.20E‐11
5.40E‐11
4.60E‐11
7.60E‐11
7.40E‐11
8.10E‐11
6.50E‐11
6.70E‐11
5.70E‐11
8.70E‐11
6.60E‐11
9.20E‐11
6.50E‐11
8.70E‐11
Period Jitter Measured Data
J_Period_‐55°C J_Period_+125°C J_Period_+25°C
(s p‐p)
(s p‐p)
(s p‐p)
6.60E‐11
6.30E‐11
7.10E‐11
7.00E‐11
6.30E‐11
6.90E‐11
7.00E‐11
6.90E‐11
7.50E‐11
8.00E‐11
7.90E‐11
7.60E‐11
8.20E‐11
6.60E‐11
6.90E‐11
7.20E‐11
7.60E‐11
6.70E‐11
7.10E‐11
7.60E‐11
7.30E‐11
8.00E‐11
7.00E‐11
6.90E‐11
5.90E‐11
5.80E‐11
6.00E‐11
6.70E‐11
7.00E‐11
7.00E‐11
7.80E‐11
7.60E‐11
7.70E‐11
8.00E‐11
6.70E‐11
8.30E‐11
6.90E‐11
8.10E‐11
6.80E‐11
7.20E‐11
7.80E‐11
6.80E‐11
8.90E‐11
7.60E‐11
7.40E‐11
7.00E‐11
7.10E‐11
7.60E‐11
7.40E‐11
8.60E‐11
7.50E‐11
6.00E‐11
6.40E‐11
7.00E‐11
6.30E‐11
6.70E‐11
7.00E‐11
6.30E‐11
8.30E‐11
6.90E‐11
6.20E‐11
6.50E‐11
5.90E‐11
7.40E‐11
6.60E‐11
6.70E‐11
7.90E‐11
7.40E‐11
6.80E‐11
5.90E‐11
6.70E‐11
6.60E‐11
7.10E‐11
7.20E‐11
7.10E‐11
7.00E‐11
6.70E‐11
6.70E‐11
6.50E‐11
6.60E‐11
6.90E‐11
7.00E‐11
8.10E‐11
7.30E‐11
7.80E‐11
7.50E‐11
7.80E‐11
6.70E‐11
7.60E‐11
8.50E‐11
7.90E‐11
7.50E‐11
8.40E‐11
8.30E‐11
7.70E‐11
7.80E‐11
6.00E‐11
6.20E‐11
7.20E‐11
7.00E‐11
7.40E‐11
6.20E‐11
Phase Jitter Measured Data
J_Phase_‐55°C J_Phase_+125°C J_Phase_+25°C
(s rms)
(s rms)
(s rms)
1.46E‐12
1.42E‐12
2.21E‐12
7.95E‐12
2.35E‐11
2.29E‐11
1.91E‐12
1.85E‐12
2.98E‐12
1.20E‐12
1.19E‐12
1.98E‐12
4.67E‐12
8.35E‐12
1.02E‐11
1.37E‐11
2.07E‐12
4.97E‐12
1.05E‐11
1.81E‐12
5.31E‐12
1.66E‐12
1.43E‐12
1.82E‐12
4.83E‐12
1.11E‐12
1.80E‐12
1.04E‐12
3.89E‐11
3.25E‐12
1.15E‐12
1.61E‐12
2.13E‐12
1.32E‐11
2.05E‐12
1.21E‐11
1.58E‐12
1.34E‐12
3.05E‐12
1.38E‐12
2.67E‐11
6.40E‐12
2.05E‐12
1.49E‐12
6.75E‐12
1.37E‐12
1.49E‐12
1.76E‐12
4.56E‐12
3.61E‐11
1.26E‐11
1.25E‐11
1.40E‐11
1.59E‐11
4.77E‐12
2.60E‐12
7.53E‐12
2.04E‐12
1.96E‐12
2.44E‐12
1.75E‐11
1.97E‐11
1.91E‐11
1.31E‐11
1.08E‐11
1.26E‐11
7.55E‐12
2.43E‐12
7.85E‐12
4.27E‐12
1.56E‐12
2.71E‐12
2.11E‐12
1.35E‐12
1.82E‐12
1.48E‐12
1.46E‐12
1.78E‐12
2.13E‐11
2.44E‐11
1.87E‐11
1.87E‐12
1.77E‐12
8.66E‐12
1.23E‐12
1.22E‐12
2.02E‐12
1.51E‐11
2.11E‐12
1.38E‐11
1.05E‐11
1.74E‐12
5.04E‐12
5.68E‐12
1.45E‐12
7.62E‐12
2.82E‐12
1.09E‐12
1.63E‐12
1.06E‐12
4.77E‐11
5.01E‐12
Summary and Conclusion
This Application Note (AN) provides an overview of clock jitter principles, including definitions and general measurement
methods. The main purpose of this AN is to present measured jitter data for the UT7R995/C RadClock for customers.
These data include time domain Cycle-to-Cycle jitter (JC2C) and Period Jitter (JPER) from oscilloscope measurements, and
Phase or Random jitter (JR) derived from frequency domain phase noise (PN) measurements.
The UT7R995/C RadClock 2.5V/3.3V 200 MHz High-Speed Multi-Phase PLL Clock Buffer simplifies system design by
providing low jitter outputs with adjustable phase and frequency to meet a variety of clock requirements. The time and
frequency domain jitter data presented in this AN gives the user additional product information for the UT7R995/C
RadClock that is complementary to the data sheet and facilitates customer clock designs.
950002-002
Version 1.0.0
21
Cobham Semiconductor Solutions
Cobham.com/HiRel
REVISION HISTORY
Date
Rev. #
Change Description
01/21/2016
1.0.0
New
950002-002
Version 1.0.0
22
Cobham Semiconductor Solutions
Cobham.com/HiRel
Cobham Semiconductor Solutions
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data 00-00-00-000
sheet is current before using this product. Aeroflex does not assume23any responsibility or liability arising
outSemiconductor
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or use
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