PD - 91508D IRLMS1503 HEXFET® Power MOSFET l l l l Generation V Technology Micro6 Package Style Ultra Low RDS(on) N-Channel MOSFET Description Fifth Generation HEXFET® power MOSFETs from International Rectifier utilize advanced processing techniques to achieve extremely low on-resistance per silicon area. This benefit, combined with the fast switching speed and ruggedized device design that HEXFET® power MOSFETs are well known for, provides the designer with an extremely efficient and reliable device for use in a wide variety of applications. A D D 1 6 D 2 5 D G 3 4 S VDSS = 30V RDS(on) = 0.10Ω Top View The Micro6 package with its customized leadframe produces a HEXFET® power MOSFET with RDS(on) 60% less than a similar size SOT-23. This package is ideal for applications where printed circuit board space is at a premium. It's unique thermal design and RDS(on) reduction enables a current-handling increase of nearly 300% compared to the SOT-23. Micro6 Absolute Maximum Ratings Parameter ID @ TA = 25°C ID @ TA = 70°C IDM PD @TA = 25°C V GS dv/dt TJ, TSTG Max. Continuous Drain Current, VGS @ 10V Continuous Drain Current, VGS @ 10V Pulsed Drain Current Power Dissipation Linear Derating Factor Gate-to-Source Voltage Peak Diode Recovery dv/dt Junction and Storage Temperature Range Units 3.2 2.6 18 1.7 13 ± 20 5.0 -55 to + 150 A W mW/°C V V/ns °C Thermal Resistance Ratings Parameter RθJA www.irf.com Maximum Junction-to-Ambient Min. Typ. Max Units 75 °C/W 1 3/17/04 IRLMS1503 Electrical Characteristics @ TJ = 25°C (unless otherwise specified) Parameter Drain-to-Source Breakdown Voltage ∆V(BR)DSS/∆TJ Breakdown Voltage Temp. Coefficient V (BR)DSS RDS(on) Static Drain-to-Source On-Resistance VGS(th) gfs Gate Threshold Voltage Forward Transconductance IDSS Drain-to-Source Leakage Current I GSS Qg Qgs Qgd td(on) tr td(off) tf Ciss Coss Crss Gate-to-Source Forward Leakage Gate-to-Source Reverse Leakage Total Gate Charge Gate-to-Source Charge Gate-to-Drain ("Miller") Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Input Capacitance Output Capacitance Reverse Transfer Capacitance Min. 30 1.0 1.1 Typ. 0.037 6.4 1.1 1.9 4.6 4.4 10 2.0 210 90 32 Max. Units Conditions V V GS = 0V, ID = 250µA V/°C Reference to 25°C, ID = 1mA 0.100 V GS = 10V, ID = 2.2A Ω 0.20 V GS = 4.5V, ID = 1.1A V V DS = V GS, ID = 250µA S V DS = 10V, I D = 1.1A 1.0 V DS = 24V, V GS = 0V µA 25 V DS = 24V, VGS = 0V, TJ = 125°C -100 V GS = -20V nA 100 V GS = 20V 9.6 I D = 2.2A 1.7 nC V DS = 24V 2.8 V GS = 10V, See Fig. 6 and 9 V DD = 15V I D = 2.2A ns R G = 6.0Ω R D = 6.7Ω, See Fig. 10 V GS = 0V pF V DS = 25V = 1.0MHz, See Fig. 5 Source-Drain Ratings and Characteristics IS I SM V SD trr Qrr Parameter Continuous Source Current (Body Diode) Pulsed Source Current (Body Diode) Diode Forward Voltage Reverse Recovery Time Reverse RecoveryCharge Min. Typ. Max. Units 1.7 18 36 39 1.2 54 58 A V ns nC Conditions MOSFET symbol showing the G integral reverse p-n junction diode. TJ = 25°C, IS = 2.2A, VGS = 0V TJ = 25°C, I F = 2.2A di/dt = 100A/µs D S Notes: Repetitive rating; pulse width limited by Pulse width ≤ 300µs; duty cycle ≤ 2%. ISD ≤ 2.2A, di/dt ≤ 150A/µs, VDD ≤ V(BR)DSS, Surface mounted on FR-4 board, t ≤ 5sec. max. junction temperature. ( See fig. 11 ) TJ ≤ 150°C 2 www.irf.com IRLMS1503 100 100 VGS 15V 10V 7.0V 5.5V 4.5V 4.0V 3.5V BOTTOM 3.0V I D , Drain-to-Source Current (A) I D , Drain-to-Source Current (A) 10 1 3.0V 20µs PULSE WIDTH TJ = 25 °C 0.1 0.1 1 10 1 RDS(on) , Drain-to-Source On Resistance (Normalized) I D , Drain-to-Source Current (A) 2.0 TJ = 25 ° C TJ = 150 ° C 1 V DS = 10V 20µs PULSE WIDTH 5.0 6.0 7.0 VGS , Gate-to-Source Voltage (V) Fig 3. Typical Transfer Characteristics www.irf.com 1 10 Fig 2. Typical Output Characteristics 100 4.0 20µs PULSE WIDTH TJ = 150 °C VDS , Drain-to-Source Voltage (V) Fig 1. Typical Output Characteristics 10 3.0V 0.1 0.1 10 VDS , Drain-to-Source Voltage (V) 0.1 3.0 VGS 15V 10V 7.0V 5.5V 4.5V 4.0V 3.5V BOTTOM 3.0V TOP TOP 8.0 ID = 2.2A 1.5 1.0 0.5 0.0 -60 -40 -20 VGS = 10V 0 20 40 60 80 100 120 140 160 TJ , Junction Temperature ( °C) Fig 4. Normalized On-Resistance Vs. Temperature 2 IRLMS1503 VGS = 0V, f = 1MHz Ciss = Cgs + Cgd , Cds SHORTED Crss = Cgd Coss = Cds + Cgd C, Capacitance (pF) 300 250 Ciss 200 Coss 150 100 Crss 50 20 VGS , Gate-to-Source Voltage (V) 350 0 1 10 ID = 2.2A VDS = 24V VDS = 15V 16 12 8 4 FOR TEST CIRCUIT SEE FIGURE 9 0 100 0 VDS , Drain-to-Source Voltage (V) Fig 5. Typical Capacitance Vs. Drain-to-Source Voltage 4 6 8 10 Fig 6. Typical Gate Charge Vs. Gate-to-Source Voltage 100 100 OPERATION IN THIS AREA LIMITED BY RDS(on) ID , Drain Current (A) ISD , Reverse Drain Current (A) 2 QG , Total Gate Charge (nC) 10 TJ = 150 ° C TJ = 25 ° C 1 10us 10 100us 1ms 1 10ms 0.1 0.4 V GS = 0 V 0.6 0.8 1.0 1.2 1.4 VSD ,Source-to-Drain Voltage (V) Fig 7. Typical Source-Drain Diode Forward Voltage 4 1.6 TC = 25 °C TJ = 150 °C Single Pulse 0.1 1 10 100 VDS , Drain-to-Source Voltage (V) Fig 8. Maximum Safe Operating Area www.irf.com IRLMS1503 VDS QG 10V QGS VGS QGD RD D.U.T. RG + - VDD VG 10V Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 % Charge Fig 9a. Basic Gate Charge Waveform Fig 10a. Switching Time Test Circuit Current Regulator Same Type as D.U.T. VDS 90% 50KΩ .2µF 12V .3µF D.U.T. + V - DS 10% VGS VGS td(on) 3mA IG tr t d(off) tf ID Current Sampling Resistors Fig 9b. Gate Charge Test Circuit Fig 10b. Switching Time Waveforms Thermal Response (Z thJA ) 100 D = 0.50 0.20 10 0.10 0.05 0.02 1 PDM 0.01 t1 SINGLE PULSE (THERMAL RESPONSE) t2 Notes: 1. Duty factor D = t 1 / t 2 2. Peak T J = P DM x Z thJA + TA 0.1 0.00001 0.0001 0.001 0.01 0.1 1 10 100 t1 , Rectangular Pulse Duration (sec) Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Ambient www.irf.com 4 IRLMS1503 Peak Diode Recovery dv/dt Test Circuit Circuit Layout Considerations • Low Stray Inductance • Ground Plane • Low Leakage Inductance Current Transformer + D.U.T + - - + RG • • • • dv/dt controlled by RG Driver same type as D.U.T. ISD controlled by Duty Factor "D" D.U.T. - Device Under Test Driver Gate Drive P.W. Period D= + - V DD P.W. Period VGS=10V * D.U.T. ISD Waveform Reverse Recovery Current Body Diode Forward Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt Re-Applied Voltage Body Diode VDD Forward Drop Inductor Curent Ripple ≤ 5% ISD * VGS = 5V for Logic Level Devices Fig 13. For N-channel HEXFET® power MOSFET s 6 www.irf.com IRLMS1503 Package Outline Micro6ä 3.00 (.118 ) 2.80 (.111 ) 1.75 (.068 ) 1.50 (.060 ) 6 -A- 5 1 2 LEAD ASSIGNMENTS 4 3.00 (.118 ) 2.60 (.103 ) 3 0.95 ( .0375 ) 6X 2X RECOMMENDED FOOTPRINT -B2X 0.95 (.0375 ) D D S 6 5 4 1 2 3 D D G 6X (1.06 (.042 ) 2.20 (.087 ) 0.50 (.019 ) 0.35 (.014 ) 6X 0.65 (.025 ) 0.15 (.006 ) M C A S B S O O 0 -10 1.30 (.051 ) 0.90 (.036 ) 6X 1.45 (.057 ) 0.90 (.036 ) -C- 0.10 (.004 ) 6 SURFACES 0.15 (.006 ) MAX. 0.20 (.007 ) 0.09 (.004 ) 0.60 (.023 ) 0.10 (.004 ) NOTES : 1. DIMENSIONING & TOLERANCING PER ANSI Y14.5M-1982. 2. CONTROLLING DIMENSION : MILLIMETER. 3. DIMENSIONS ARE SHOWN IN MILLIMETERS (INCHES). Part Marking Information Micro6ä 1RWHV7KLVSDUWPDUNLQJLQIRUPDWLRQDSSOLHVWRGHYLFHVSURGXFHGEHIRUH (;$03/(7+,6,6$1,5/06 3$57180%(5 723 :$)(5/27 180%(5&2'( %27720 3$57180%(5&2'(5()(5(1&( $ ,5/06 % ,5/06 & ,5/06 ' ,5/06 ( ,5/06 ) ,5/06 * ,5/06 + ,5/06 '$7(&2'((;$03/(6 <:: & <:: )) www.irf.com '$7( &2'( :: ,)35(&('('%</$67',*,72)&$/(1'$5<($5 :25. :((. <($5 < : $ % & ' ; < = :: ,)35(&('('%<$/(77(5 :25. <($5 < : :((. $ $ % % & & ' ' ( ) * + . ; < 1RWHV 7KLV SDUW PDUNLQJLQIRUPDWLRQ DSSOLHV WR GHYLFHV SURGXFHG DIWHU : < : 3$57 180%(5 723 ,) 35(&('(' %< /$67 ',*,7 2) &$/(1'$5 <($5 <($5 :((. /27 &2'( <($5 < 3$57 180%(5 &2'( 5()(5(1&( $ ,5/06 % ,5/06 & ,5/06 ' ,5/06 <($5 < ( ,5/06 ) ,5/06 * ,5/06 + ,5/06 $ % & ' ( ) * + . Note: A line above the work week (as shown here) indicates Lead-Free. : :25. :((. : $ % & ' ; < = ,) 35(&('(' %< $ /(77(5 :25. :((. : $ % & ' ; < = 6 IRLMS1503 Tape & Reel Information Micro6ä 8mm FEED DIRECTION 4mm NOTES : 1. OUTLINE CONFORMS TO EIA-481 & EIA-541. 178.00 ( 7.008 ) MAX. 9.90 ( .390 ) 8.40 ( .331 ) NOTES: 1. CONTROLLING DIMENSION : MILLIMETER. 2. OUTLINE CONFORMS TO EIA-481 & EIA-541. Data and specifications subject to change without notice. IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105 TAC Fax: (310) 252-7903 Visit us at www.irf.com for sales contact information. 03/04 8 www.irf.com