RLAT Report 10-435 101017 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Radiation Lot Acceptance Testing (RLAT) Radiation Testing of the RH117K Positive Adjustable Regulator for Linear Technology Customer: Linear Technology, PO# 57481L RAD Job Number: 10-435 Part Type Tested: RH117K Positive Adjustable Regulator. Traceability Information/Lot Number/ Date Code: Lot Date Code: 1024A, Assembly Lot# 576815.1, FAB Lot# WP1058.1, Wafer 6. Information obtained from Linear Technology PO# 57481L. See photograph of unit under test in Appendix A. Quantity of Units: 12 units received, 5-units for biased, 5-units for unbiased irradiation and 2 units for control. Serial numbers 57, 58, 59, 60 and 92 were biased during irradiation, serial numbers 93, 94, 95, 97 and 98 were unbiased during irradiation and serial numbers 99 and 100 were used as controls. See Appendix B for the radiation bias connection tables. Radiation and Electrical Test Increments: 50-300rad(Si)/s ionizing radiation with electrical test increments: preirradiation, 20krad(Si), 50krad(Si), 100krad(Si), and 200krad(Si). Note that LINEAR TECHNOLOGY datasheet guarantees post-irradiation performance to only the 100krad(Si) dose level. Testing to 200krad(Si), as reported herein is an overtest of the datasheet guaranteed radiation performance specification Pre-Irradiation Burn-In: None Specified Overtest and Post-Irradiation Anneal: No overtest. No anneal. Radiation Test Standard: MIL-STD 883 and/or MIL-STD-750 TM1019 (latest revision), Condition A. Test Hardware and Software: LTS2020 Automated Tester, Entity ID TS04, Calibration Date: 04-28-10, Calibration Due 04-28-11. LTS2101 Family Board, Entity ID FB02. LTS0606 Test Fixture, Entity ID TF05. RH117 DUT Board. Test Program: RH117LT.SRC Facility and Radiation Source: Radiation Assured Devices' Longmire Laboratories, Colorado Springs, CO. Gamma rays provided by JLSA 81-24 Co60 source. Dosimetry performed by CaF2 TLDs traceable to NIST. RAD's dosimetry has been audited by DSCC and RAD has been awarded Laboratory Suitability for MIL-STD-750 and MIL-STD-883 TM 1019. Irradiation and Test Temperature: Room temperature controlled to 24°C±6°C per MIL-STD-883 and MIL-STD750. RLAT Result: PASSED. The units showed no significant degradation with total dose. All parameters remained within their datasheet specifications to the maximum dose level tested of 200krad(Si) An ISO 9001:2008 and DSCC Certified Company 1 RLAT Report 10-435 101017 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 1.0. Overview and Background It is well known that total dose ionizing radiation can cause parametric degradation and ultimately functional failure in electronic devices. The damage occurs via electron-hole pair production, transport and trapping in the dielectric and interface regions. In discrete devices the bulk of the damage is frequently manifested as a reduction in the gain and/or breakdown voltage of the device. The damage will usually anneal with time following the end of the radiation exposure. Due to this annealing, and to ensure a worst-case test condition MIL-STD-883 TM1019.8 calls out a dose rate of 50 to 300rad(Si)/s as Condition A and further specifies that the time from the end of an incremental radiation exposure and electrical testing shall be 1-hour or less and the total time from the end of one incremental irradiation to the beginning of the next incremental radiation step should be 2-hours or less. The work described in this report was performed to meet MIL-STD-883 TM1019.8 Condition A. 2.0. Radiation Test Apparatus The total ionizing dose testing described in this final report was performed using the facilities at Radiation Assured Devices’ Longmire Laboratories in Colorado Springs, CO. The high dose rate total ionizing dose (TID) source is a JLSA 84-21 irradiator modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily shielded by lead, during the radiation exposures the rod is raised by an electronic timer/controller and the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from <1rad(Si)/s to a maximum of approximately 120rad(Si)/s, determined by the distance from the source. For high-dose rate experiments the bias boards are placed in a radial fashion equidistant from the raised Co-60 rods with the distance adjusted to provide the required dose rate. The irradiator calibration is maintained by Radiation Assured Devices Longmire Laboratories using thermoluminescent dosimeters (TLDs)) traceable to the National Institute of Standards and Technology (NIST). Figure 2.1 shows a photograph of the JLSA 81-24 Co-60 irradiator at RAD’s Longmire Laboratory facility. RAD is currently certified by the Defense Supply Center Columbus (DSCC) for Laboratory Suitability under MIL STD 750. Additional details regarding Radiation Assured Devices dosimetry for TM1019 Condition A testing are available in RAD’s report to DSCC entitled: “Dose Rate Mapping of the J.L. Shepherd and Associates Model 81 Irradiator Installed by Radiation Assured Devices” An ISO 9001:2008 and DSCC Certified Company 2 RLAT Report 10-435 101017 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Figure 2.1. Radiation Assured Devices’ high dose rate Co-60 irradiator. The dose rate is obtained by positioning the device-under-test at a fixed distance from the gamma cell. The dose rate for this irradiator varies from approximately 120rad(Si)/s close to the rods down to 1rad(Si)/s at a distance of approximately 2-feet. An ISO 9001:2008 and DSCC Certified Company 3 RLAT Report 10-435 101017 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 3.0. Radiation Test Conditions The RH117K Positive Adjustable Regulator described in this final report was irradiated using a split ±15V supply and with all pins tied to ground, that is biased and unbiased. See the TID Bias Tables in Appendix B for the full bias circuits. In our opinion, these bias circuits satisfy the requirements of MILSTD-883H TM1019 Section 3.9.3 Bias and Loading Conditions which states “The bias applied to the test devices shall be selected to produce the greatest radiation induced damage or the worst-case damage for the intended application, if known. While maximum voltage is often worst case some bipolar linear device parameters (e.g. input bias current or maximum output load current) exhibit more degradation with 0 V bias.” Note that the determination of pass / fail for this lot is based on the response of the biased units only. The devices were irradiated to a maximum total ionizing dose level of 200krad(Si) with incremental readings at 20krad(Si), 50krad(Si) and 100krad(Si). Electrical testing occurred within one hour following the end of each irradiation segment. For intermediate irradiations, the parts were tested and returned to total dose exposure within two hours from the end of the previous radiation increment. The TID bias board was positioned in the Co-60 cell to provide the required minimum of 50rad(Si)/s and was located inside a lead-aluminum enclosure. The lead-aluminum enclosure is required under MIL-STD-883H TM1019.8 Section 3.4 that reads as follows: “Lead/Aluminum (Pb/Al) container. Test specimens shall be enclosed in a Pb/Al container to minimize dose enhancement effects caused by lowenergy, scattered radiation. A minimum of 1.5 mm Pb, surrounding an inner shield of at least 0.7 mm Al, is required. This Pb/Al container produces an approximate charged particle equilibrium for Si and for TLDs such as CaF2. The radiation field intensity shall be measured inside the Pb/Al container (1) initially, (2) when the source is changed, or (3) when the orientation or configuration of the source, container, or test-fixture is changed. This measurement shall be performed by placing a dosimeter (e.g., a TLD) in the device-irradiation container at the approximate test-device position. If it can be demonstrated that low energy scattered radiation is small enough that it will not cause dosimetry errors due to dose enhancement, the Pb/Al container may be omitted”. The final dose rate within the high dose rate lead-aluminum enclosure was determined based on TLD dosimetry measurements (see previous section). The final dose rate for this work was 69.8rad(Si)/s with a precision of ±5%. An ISO 9001:2008 and DSCC Certified Company 4 RLAT Report 10-435 101017 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 4.0. Tested Parameters During the radiation lot acceptance testing the following pre- and post-irradiation electrical parameters were measured: 1. Reference Voltage, VDIFF=VIN-VOUT=3V, IL=10mA 2. Reference Voltage, VDIFF=40V, IL=10mA 3. Reference Voltage, VDIFF=3V, IL=1.5A 4. Reference Voltage, VDIFF=40V, IL=0.3A 5. Line Regulation, VDIFF=3V to 40V, IL=10mA 6. Load Regulation, VOUT≤5V VDIFF=5V, VIN=6.25V, IL=10mA to 1.5A 7. Load Regulation, VOUT≥5V VDIFF=5V, VIN=11.25V, IL=10mA to 1.5A 8. Adjust Pin Current, VDIFF=2.5V, IL=10mA 9. Adjust Pin Current, VDIFF=5V, IL=10mA 10. Adjust Pin Current, VDIFF=40V, IL=10mA 11. Adjust Pin Current Change, VDIFF=5V, IL=10mA to 1.5A 12. Adjust Pin Current Change, VDIFF=2.5V to 40V, IL=10mA 13. Minimum Load Current, VDIFF=40V 14. Current Limit VDIFF≤15V, VDIFF=15V 15. Current Limit VDIFF=40V, VDIFF=40V The parametric data was obtained as “read and record” and all the raw data plus an attributes summary are contained in this report as well as in a separate Excel file. The attributes data contains the average, standard deviation and the average with the KTL values applied. The KTL values used is 2.742 per MIL HDBK 814 using one sided tolerance limits of 90/90 and a 5-piece sample size. This survival probability/level of confidence is consistent with a 22-piece sample size and zero failures analyzed using a lot tolerance percent defective (LTPD) approach. Note that the following criteria must be met for a device to pass the low dose rate test: following the radiation exposure each of the 5 pieces irradiated under electrical bias shall pass the specification value. The units irradiated without electrical bias and the KTL statistics are included in this report for reference only. If any of the 5 pieces irradiated under electrical bias exceed the datasheet specifications, then the lot could be logged as a failure. An ISO 9001:2008 and DSCC Certified Company 5 RLAT Report 10-435 101017 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 5.0. Total Ionizing Dose Test Results Using the conditions stated above, the RH117K-Positive Adjustable Regulator (from the lot date code identified on the first page of this test report) passed the enhanced low dose rate sensitivity test to 200krad(Si) with all parameters remaining within their pre- and/or post-radiation specification limits. As noted above (Section 4) the data for the units-under-test irradiated in the unbiased condition and the KTL statistics presented in this report are for reference only and are not used for the determination of “PASS/FAIL” for the lot. Note that the KTLs statistics are “out of specification” for several parameters (including VREF1 through VREF4 and the Current Limit (VOUT=15V)). This “out of specification” is due to the precision of the measurements and is not reflective of any radiation-induced degradation. We have upgraded the test program to include auto-ranging for future tests and should see an improvement in the overall precision of the test data. Figures 5.1 through 5.15 show plots of all the measured parameters versus total ionizing dose while Tables 5.1 – 5.15 show the corresponding raw data for each of these parameters. In these data plots the solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated in the biased condition while the shaded lines (solid or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. The control units, as expected, show no significant changes to any of the parameters. Therefore we can conclude that the electrical testing remained in control throughout the duration of the tests and the observed degradation was due to the radiation exposure. Note that Appendix D lists all of the figures and tables used in this section. An ISO 9001:2008 and DSCC Certified Company 6 RLAT Report 10-435 101017 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Reference Voltage VDIFF=3V IL=10mA (V) 1.340 1.320 1.300 1.280 1.260 1.240 1.220 1.200 1.180 0 50 100 150 Total Dose (krad(Si)) Figure 5.1. Plot of Reference Voltage VDIFF=3V IL=10mA (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 7 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-435 101017 R1.1 Table 5.1. Raw data for Reference Voltage VDIFF=3V IL=10mA (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Reference Voltage VDIFF=3V IL=10mA (V) Device 57 58 59 60 92 93 94 95 97 98 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 1.290 1.286 1.273 1.288 1.274 1.299 1.274 1.296 1.276 1.285 1.277 1.270 20 1.263 1.261 1.264 1.263 1.268 1.266 1.287 1.285 1.266 1.280 1.290 1.271 50 1.291 1.263 1.288 1.280 1.297 1.288 1.284 1.277 1.278 1.276 1.287 1.286 100 1.284 1.285 1.299 1.262 1.275 1.261 1.266 1.256 1.254 1.271 1.291 1.281 200 1.289 1.274 1.253 1.251 1.281 1.249 1.253 1.240 1.268 1.278 1.267 1.288 1.282 0.008 1.304 1.260 1.264 0.003 1.271 1.257 1.284 0.013 1.320 1.248 1.281 0.014 1.318 1.244 1.270 0.017 1.316 1.223 1.286 0.011 1.317 1.255 1.200 1.277 0.010 1.305 1.249 1.200 1.281 0.005 1.295 1.266 1.200 1.262 0.007 1.281 1.242 1.200 1.258 0.015 1.299 1.216 1.200 PASS PASS 1.300 PASS PASS 1.300 PASS PASS 1.300 PASS An ISO 9001:2008 and DSCC Certified Company 8 PASS 1.300 PASS 1.300 PASS RLAT Report 10-435 101017 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Reference Voltage VDIFF=40V IL=10mA (V) 1.340 1.320 1.300 1.280 1.260 1.240 1.220 1.200 1.180 0 50 100 150 Total Dose (krad(Si)) Figure 5.2. Plot of Reference Voltage VDIFF=40V IL=10mA (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 9 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-435 101017 R1.1 Table 5.2. Raw data for Reference Voltage VDIFF=40V IL=10mA (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Reference Voltage VDIFF=40V IL=10mA (V) Device 57 58 59 60 92 93 94 95 97 98 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 1.290 1.287 1.274 1.289 1.275 1.297 1.275 1.297 1.276 1.285 1.277 1.271 20 1.264 1.262 1.264 1.264 1.268 1.266 1.288 1.286 1.267 1.281 1.291 1.271 50 1.292 1.264 1.289 1.280 1.298 1.288 1.284 1.278 1.279 1.277 1.288 1.287 100 1.285 1.285 1.299 1.263 1.276 1.262 1.266 1.257 1.255 1.271 1.292 1.281 200 1.290 1.274 1.254 1.253 1.282 1.255 1.257 1.246 1.271 1.285 1.268 1.288 1.283 0.008 1.305 1.261 1.264 0.002 1.270 1.258 1.285 0.013 1.321 1.248 1.282 0.013 1.318 1.245 1.271 0.017 1.316 1.225 1.286 0.011 1.316 1.256 1.200 1.278 0.010 1.306 1.249 1.200 1.281 0.005 1.294 1.268 1.200 1.262 0.007 1.280 1.244 1.200 1.263 0.015 1.305 1.221 1.200 PASS PASS 1.300 PASS PASS 1.300 PASS PASS 1.300 PASS An ISO 9001:2008 and DSCC Certified Company 10 PASS 1.300 PASS 1.300 PASS RLAT Report 10-435 101017 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Reference Voltage VDIFF=3V IL=1.5A (V) 1.340 1.320 1.300 1.280 1.260 1.240 1.220 1.200 1.180 0 50 100 150 Total Dose (krad(Si)) Figure 5.3. Plot of Reference Voltage VDIFF=3V IL=1.5A (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 11 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-435 101017 R1.1 Table 5.3. Raw data for Reference Voltage VDIFF=3V IL=1.5A (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Reference Voltage VDIFF=3V IL=1.5A (V) Device 57 58 59 60 92 93 94 95 97 98 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 1.290 1.286 1.274 1.290 1.274 1.292 1.274 1.296 1.276 1.284 1.277 1.270 20 1.263 1.261 1.264 1.263 1.268 1.266 1.287 1.283 1.266 1.280 1.290 1.271 50 1.292 1.263 1.289 1.279 1.297 1.287 1.284 1.277 1.278 1.276 1.287 1.286 100 1.284 1.284 1.298 1.262 1.275 1.261 1.265 1.256 1.254 1.271 1.289 1.281 200 1.277 1.271 1.253 1.251 1.280 1.250 1.253 1.241 1.267 1.275 1.266 1.286 1.283 0.008 1.305 1.260 1.264 0.003 1.271 1.257 1.284 0.013 1.321 1.247 1.281 0.013 1.317 1.244 1.266 0.014 1.304 1.229 1.284 0.010 1.311 1.258 1.200 1.276 0.010 1.303 1.249 1.200 1.280 0.005 1.294 1.267 1.200 1.261 0.007 1.280 1.243 1.200 1.257 0.014 1.295 1.220 1.200 PASS PASS 1.300 PASS PASS 1.300 PASS PASS 1.300 PASS An ISO 9001:2008 and DSCC Certified Company 12 PASS 1.300 PASS 1.300 PASS RLAT Report 10-435 101017 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Reference Voltage VDIFF=40V IL=0.3A (V) 1.320 1.300 1.280 1.260 1.240 1.220 1.200 1.180 0 50 100 150 Total Dose (krad(Si)) Figure 5.4. Plot of Reference Voltage VDIFF=40V IL=0.3A (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 13 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-435 101017 R1.1 Table 5.4. Raw data for Reference Voltage VDIFF=40V IL=0.3A (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Reference Voltage VDIFF=40V IL=0.3A (V) Device 57 58 59 60 92 93 94 95 97 98 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 1.274 1.277 1.272 1.277 1.273 1.273 1.274 1.282 1.271 1.285 1.277 1.269 20 1.264 1.262 1.264 1.264 1.268 1.266 1.286 1.294 1.266 1.281 1.275 1.271 50 1.292 1.263 1.277 1.280 1.276 1.281 1.284 1.278 1.277 1.276 1.283 1.287 100 1.280 1.285 1.292 1.260 1.274 1.263 1.266 1.257 1.255 1.267 1.273 1.269 200 1.254 1.271 1.254 1.253 1.282 1.250 1.253 1.244 1.253 1.268 1.268 1.276 1.275 0.002 1.281 1.268 1.264 0.002 1.270 1.258 1.278 0.010 1.306 1.249 1.278 0.012 1.311 1.245 1.263 0.013 1.299 1.227 1.277 0.006 1.294 1.260 1.200 1.279 0.012 1.313 1.245 1.200 1.279 0.003 1.288 1.270 1.200 1.262 0.005 1.276 1.247 1.200 1.254 0.009 1.278 1.229 1.200 PASS PASS 1.300 PASS PASS 1.300 PASS PASS 1.300 PASS An ISO 9001:2008 and DSCC Certified Company 14 PASS 1.300 PASS 1.300 PASS RLAT Report 10-435 101017 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 3.50E-02 Line Regulation (%/V) 3.00E-02 2.50E-02 2.00E-02 1.50E-02 1.00E-02 5.00E-03 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.5. Plot of Line Regulation (%/V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 15 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-435 101017 R1.1 Table 5.5. Raw data for Line Regulation (%/V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Line Regulation (%/V) Device 57 58 59 60 92 93 94 95 97 98 99 100 0 1.30E-03 1.10E-03 1.10E-03 1.30E-03 1.30E-03 9.00E-04 1.40E-03 1.50E-03 1.60E-03 1.00E-03 1.60E-03 1.00E-03 20 1.20E-03 1.30E-03 1.10E-03 1.40E-03 1.10E-03 1.80E-03 1.10E-03 9.00E-04 1.30E-03 1.30E-03 1.50E-03 7.00E-04 50 1.30E-03 1.50E-03 1.20E-03 1.50E-03 1.40E-03 1.60E-03 1.70E-03 1.80E-03 1.40E-03 1.40E-03 1.40E-03 1.30E-03 100 1.60E-03 2.00E-03 2.10E-03 2.30E-03 1.90E-03 1.90E-03 1.70E-03 2.20E-03 1.50E-03 1.50E-03 1.20E-03 1.20E-03 200 2.30E-03 2.00E-03 2.50E-03 2.90E-03 2.70E-03 1.03E-02 7.10E-03 1.08E-02 5.10E-03 1.01E-02 1.60E-03 9.00E-04 Biased Statistics Average Biased 1.22E-03 1.22E-03 1.38E-03 1.98E-03 2.48E-03 Std Dev Biased 1.10E-04 1.30E-04 1.30E-04 2.59E-04 3.49E-04 Ps90%/90% (+KTL) Biased 1.52E-03 1.58E-03 1.74E-03 2.69E-03 3.44E-03 Ps90%/90% (-KTL) Biased 9.20E-04 8.62E-04 1.02E-03 1.27E-03 1.52E-03 Un-Biased Statistics Average Un-Biased 1.28E-03 1.28E-03 1.58E-03 1.76E-03 8.68E-03 Std Dev Un-Biased 3.11E-04 3.35E-04 1.79E-04 2.97E-04 2.47E-03 Ps90%/90% (+KTL) Un-Biased 2.13E-03 2.20E-03 2.07E-03 2.57E-03 1.55E-02 Ps90%/90% (-KTL) Un-Biased 4.26E-04 3.62E-04 1.09E-03 9.47E-04 1.90E-03 Specification MAX 2.00E-02 2.00E-02 2.00E-02 3.00E-02 3.00E-02 Status PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 16 RLAT Report 10-435 101017 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 7.00E+01 Load Regulation VOUT<=5V (mV) 6.00E+01 5.00E+01 4.00E+01 3.00E+01 2.00E+01 1.00E+01 0.00E+00 -1.00E+01 0 50 100 150 Total Dose (krad(Si)) Figure 5.6. Plot of Load Regulation VOUT<=5V (mV) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 17 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-435 101017 R1.1 Table 5.6. Raw data for Load Regulation VOUT<=5V (mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Load Regulation VOUT<=5V (mV) Device 57 58 59 60 92 93 94 95 97 98 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 3.87E-04 8.40E-05 6.70E-05 2.36E-04 2.86E-04 6.06E-04 -1.70E-05 0.00E+00 -2.02E-04 4.88E-04 3.40E-05 -6.70E-05 20 2.02E-04 0.00E+00 3.03E-04 -3.40E-05 1.70E-05 -6.70E-05 1.68E-04 3.81E-03 -1.70E-05 2.36E-04 6.70E-05 -2.19E-04 50 -8.40E-05 8.40E-05 6.57E-04 8.40E-05 1.52E-04 -2.02E-04 0.00E+00 1.18E-04 -1.70E-05 3.70E-04 4.04E-04 -2.36E-04 100 1.68E-04 -1.70E-05 5.10E-05 -8.40E-05 -1.01E-04 2.02E-04 -1.18E-04 -1.18E-04 -5.10E-05 -3.40E-05 0.00E+00 5.10E-05 200 3.40E-05 2.53E-04 1.52E-04 3.87E-04 2.53E-04 -3.20E-04 -2.36E-04 -5.05E-04 1.18E-04 0.00E+00 0.00E+00 4.38E-04 2.12E-04 1.36E-04 5.85E-04 -1.61E-04 9.76E-05 1.47E-04 5.01E-04 -3.05E-04 1.79E-04 2.81E-04 9.50E-04 -5.93E-04 3.40E-06 1.10E-04 3.05E-04 -2.98E-04 2.16E-04 1.32E-04 5.76E-04 -1.45E-04 1.75E-04 8.25E-04 5.38E-05 -2.38E-05 -1.89E-04 3.51E-04 1.67E-03 2.11E-04 1.32E-04 2.50E-04 1.14E-03 5.41E-03 6.31E-04 3.38E-04 4.96E-04 -7.88E-04 -3.76E-03 -5.24E-04 -3.85E-04 -8.73E-04 1.50E+01 4.20E+01 4.80E+01 6.00E+01 6.00E+01 PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 18 RLAT Report 10-435 101017 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 1.40E+00 Load Regulation VOUT>=5V (%) 1.20E+00 1.00E+00 8.00E-01 6.00E-01 4.00E-01 2.00E-01 0.00E+00 -2.00E-01 0 50 100 150 Total Dose (krad(Si)) Figure 5.7. Plot of Load Regulation VOUT>=5V (%) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 19 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-435 101017 R1.1 Table 5.7. Raw data for Load Regulation VOUT>=5V (%) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Load Regulation VOUT>=5V (%) Device 57 58 59 60 92 93 94 95 97 98 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 -4.10E-02 -1.20E-02 -5.00E-03 8.00E-03 4.00E-03 -4.00E-03 -1.00E-03 -3.00E-03 -2.90E-02 -1.30E-02 1.20E-02 1.70E-02 20 -8.00E-02 -7.60E-02 1.90E-02 -1.30E-02 -1.63E-01 -7.00E-03 -2.80E-02 -1.00E-03 -4.00E-02 -3.70E-02 -7.00E-03 8.00E-03 50 -3.90E-02 -2.40E-02 -2.00E-02 -2.00E-03 -1.50E-02 -1.80E-02 6.70E-02 -6.00E-03 -2.10E-02 5.00E-03 -1.90E-02 -3.50E-02 100 -2.40E-02 1.10E-02 -1.40E-02 -2.30E-02 -3.40E-02 3.40E-02 0.00E+00 8.00E-03 -1.70E-02 -2.20E-02 2.00E-03 1.30E-02 200 -1.59E-01 -1.60E-02 -7.90E-02 -7.00E-02 -9.00E-03 3.50E-02 4.00E-02 -1.50E-02 -3.20E-02 -5.00E-03 2.30E-02 0.00E+00 -9.20E-03 1.94E-02 4.40E-02 -6.24E-02 -6.26E-02 7.01E-02 1.30E-01 -2.55E-01 -2.00E-02 1.35E-02 1.69E-02 -5.69E-02 -1.68E-02 1.71E-02 3.00E-02 -6.36E-02 -6.66E-02 6.04E-02 9.90E-02 -2.32E-01 -1.00E-02 -2.26E-02 5.40E-03 6.00E-04 4.60E-03 1.16E-02 1.77E-02 3.59E-02 2.23E-02 3.16E-02 2.17E-02 2.59E-02 1.04E-01 6.18E-02 9.12E-02 -4.17E-02 -7.11E-02 -9.32E-02 -6.06E-02 -8.20E-02 3.00E-01 8.40E-01 9.60E-01 1.20E+00 1.20E+00 PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 20 RLAT Report 10-435 101017 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Adjust Pin Current VDIFF=2.5V IL=10mA (A) 1.20E-04 1.00E-04 8.00E-05 6.00E-05 4.00E-05 2.00E-05 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.8. Plot of Adjust Pin Current VDIFF=2.5V IL=10mA (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 21 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-435 101017 R1.1 Table 5.8. Raw data for Adjust Pin Current VDIFF=2.5V IL=10mA (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Adjust Pin Current VDIFF=2.5V IL=10mA (A) Device 57 58 59 60 92 93 94 95 97 98 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 3.96E-05 3.96E-05 3.99E-05 3.94E-05 3.94E-05 4.03E-05 3.87E-05 4.04E-05 4.02E-05 3.93E-05 4.10E-05 4.01E-05 20 3.98E-05 3.98E-05 3.98E-05 3.96E-05 3.94E-05 4.00E-05 3.89E-05 4.02E-05 3.98E-05 3.89E-05 4.02E-05 3.98E-05 50 3.97E-05 3.98E-05 3.98E-05 3.95E-05 3.93E-05 3.99E-05 3.88E-05 3.98E-05 3.98E-05 3.88E-05 4.06E-05 3.98E-05 100 3.99E-05 3.99E-05 3.99E-05 3.97E-05 3.94E-05 3.99E-05 3.83E-05 3.99E-05 3.99E-05 3.90E-05 4.05E-05 3.99E-05 200 3.92E-05 3.90E-05 3.92E-05 3.88E-05 3.88E-05 3.90E-05 3.78E-05 3.90E-05 3.90E-05 3.74E-05 3.99E-05 3.93E-05 3.96E-05 2.08E-07 4.02E-05 3.90E-05 3.97E-05 1.70E-07 4.01E-05 3.92E-05 3.96E-05 1.95E-07 4.02E-05 3.91E-05 3.97E-05 1.93E-07 4.03E-05 3.92E-05 3.90E-05 1.55E-07 3.94E-05 3.86E-05 3.98E-05 3.96E-05 3.94E-05 3.94E-05 3.84E-05 7.44E-07 6.18E-07 5.63E-07 7.27E-07 7.58E-07 4.18E-05 4.13E-05 4.10E-05 4.14E-05 4.05E-05 3.77E-05 3.79E-05 3.79E-05 3.74E-05 3.63E-05 1.00E-04 1.00E-04 1.00E-04 1.00E-04 1.00E-04 PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 22 RLAT Report 10-435 101017 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Adjust Pin Current VDIFF=5V IL=10mA (A) 1.20E-04 1.00E-04 8.00E-05 6.00E-05 4.00E-05 2.00E-05 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.9. Plot of Adjust Pin Current VDIFF=5V IL=10mA (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 23 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-435 101017 R1.1 Table 5.9. Raw data for Adjust Pin Current VDIFF=5V IL=10mA (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Adjust Pin Current VDIFF=5V IL=10mA (A) Device 57 58 59 60 92 93 94 95 97 98 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 3.96E-05 4.02E-05 4.02E-05 3.98E-05 3.95E-05 4.04E-05 3.91E-05 4.04E-05 4.02E-05 3.93E-05 4.06E-05 4.02E-05 20 3.98E-05 3.97E-05 3.98E-05 3.97E-05 3.93E-05 4.01E-05 3.87E-05 4.04E-05 3.98E-05 3.89E-05 4.01E-05 3.97E-05 50 3.97E-05 3.97E-05 3.98E-05 3.94E-05 3.94E-05 3.98E-05 3.87E-05 3.99E-05 3.98E-05 3.88E-05 4.04E-05 3.98E-05 100 3.97E-05 3.99E-05 3.99E-05 3.99E-05 3.92E-05 3.99E-05 3.83E-05 3.99E-05 3.99E-05 3.85E-05 4.05E-05 3.98E-05 200 3.91E-05 3.97E-05 3.90E-05 3.88E-05 3.88E-05 3.92E-05 3.78E-05 3.90E-05 3.90E-05 3.79E-05 4.01E-05 3.93E-05 3.98E-05 3.02E-07 4.07E-05 3.90E-05 3.96E-05 2.11E-07 4.02E-05 3.91E-05 3.96E-05 1.68E-07 4.01E-05 3.91E-05 3.97E-05 2.90E-07 4.05E-05 3.89E-05 3.91E-05 3.60E-07 4.01E-05 3.81E-05 3.99E-05 3.96E-05 3.94E-05 3.93E-05 3.86E-05 6.40E-07 7.60E-07 5.98E-07 8.08E-07 6.60E-07 4.16E-05 4.16E-05 4.10E-05 4.15E-05 4.04E-05 3.81E-05 3.75E-05 3.78E-05 3.71E-05 3.67E-05 1.00E-04 1.00E-04 1.00E-04 1.00E-04 1.00E-04 PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 24 RLAT Report 10-435 101017 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Adjust Pin Current VDIFF=40V IL=10mA (A) 1.20E-04 1.00E-04 8.00E-05 6.00E-05 4.00E-05 2.00E-05 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.10. Plot of Adjust Pin Current VDIFF=40V IL=10mA (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 25 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-435 101017 R1.1 Table 5.10. Raw data for Adjust Pin Current VDIFF=40V IL=10mA (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Adjust Pin Current VDIFF=40V IL=10mA (A) Device 57 58 59 60 92 93 94 95 97 98 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 3.95E-05 4.00E-05 4.02E-05 3.96E-05 3.95E-05 4.02E-05 3.93E-05 4.05E-05 4.02E-05 3.92E-05 4.09E-05 4.02E-05 20 3.98E-05 3.98E-05 3.98E-05 3.96E-05 3.98E-05 4.02E-05 3.89E-05 4.04E-05 4.00E-05 3.89E-05 4.04E-05 3.98E-05 50 3.97E-05 3.98E-05 3.98E-05 3.95E-05 3.97E-05 4.03E-05 3.87E-05 4.01E-05 3.98E-05 3.89E-05 4.04E-05 3.98E-05 100 3.99E-05 3.99E-05 3.99E-05 3.99E-05 3.99E-05 4.01E-05 3.83E-05 4.00E-05 4.00E-05 3.86E-05 4.08E-05 3.99E-05 200 3.93E-05 3.94E-05 3.91E-05 3.90E-05 3.90E-05 3.90E-05 3.81E-05 3.90E-05 3.91E-05 3.81E-05 4.01E-05 3.93E-05 3.98E-05 2.94E-07 4.06E-05 3.89E-05 3.98E-05 8.67E-08 4.00E-05 3.95E-05 3.97E-05 1.10E-07 4.00E-05 3.94E-05 3.99E-05 0.00E+00 3.99E-05 3.99E-05 3.92E-05 2.11E-07 3.97E-05 3.86E-05 3.99E-05 3.97E-05 3.96E-05 3.94E-05 3.86E-05 5.96E-07 7.17E-07 7.04E-07 8.68E-07 5.05E-07 4.15E-05 4.16E-05 4.15E-05 4.18E-05 4.00E-05 3.82E-05 3.77E-05 3.76E-05 3.70E-05 3.72E-05 1.00E-04 1.00E-04 1.00E-04 1.00E-04 1.00E-04 PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 26 RLAT Report 10-435 101017 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Adjust Pin Current Change IL=10mA-1.5A (A) 6.00E-06 4.00E-06 2.00E-06 0.00E+00 -2.00E-06 -4.00E-06 -6.00E-06 0 50 100 150 Total Dose (krad(Si)) Figure 5.11. Plot of Adjust Pin Current Change IL=10mA-1.5A (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 27 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-435 101017 R1.1 Table 5.11. Raw data for Adjust Pin Current Change IL=10mA-1.5A (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Adjust Pin Current Change IL=10mA-1.5A (A) Device 57 58 59 60 92 93 94 95 97 98 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 2.00E-08 -2.70E-07 -9.00E-08 -8.70E-07 1.80E-07 -4.50E-07 1.60E-07 -8.00E-07 0.00E+00 -1.80E-07 1.80E-07 -9.00E-08 20 0.00E+00 0.00E+00 0.00E+00 -1.60E-07 -5.30E-07 2.90E-07 0.00E+00 4.00E-08 9.00E-08 0.00E+00 -4.70E-07 0.00E+00 50 -2.70E-07 3.10E-07 0.00E+00 5.30E-07 4.90E-07 2.00E-08 5.80E-07 4.00E-08 0.00E+00 4.50E-07 2.50E-07 0.00E+00 100 0.00E+00 0.00E+00 0.00E+00 1.30E-07 -9.00E-08 -2.20E-07 4.00E-07 0.00E+00 0.00E+00 -6.20E-07 -2.70E-07 0.00E+00 200 1.80E-07 -4.70E-07 4.00E-08 -2.20E-07 0.00E+00 0.00E+00 3.60E-07 0.00E+00 0.00E+00 8.90E-07 7.00E-08 -3.60E-07 -2.06E-07 4.06E-07 9.07E-07 -1.32E-06 -1.38E-07 2.30E-07 4.92E-07 -7.68E-07 2.12E-07 3.41E-07 1.15E-06 -7.23E-07 8.00E-09 7.85E-08 2.23E-07 -2.07E-07 -9.40E-08 2.55E-07 6.04E-07 -7.92E-07 -2.54E-07 8.40E-08 2.18E-07 -8.80E-08 2.50E-07 3.80E-07 1.21E-07 2.75E-07 3.72E-07 3.90E-07 7.88E-07 4.16E-07 9.73E-07 9.33E-07 1.32E-06 -1.30E-06 -2.48E-07 -5.37E-07 -1.11E-06 -8.20E-07 -5.00E-06 -5.00E-06 -5.00E-06 -5.00E-06 -5.00E-06 PASS PASS PASS PASS PASS 5.00E-06 5.00E-06 5.00E-06 5.00E-06 5.00E-06 PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 28 Adjust Pin Current Change VDIFF=2.5V-40V (A) RLAT Report 10-435 101017 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 6.00E-06 4.00E-06 2.00E-06 0.00E+00 -2.00E-06 -4.00E-06 -6.00E-06 0 50 100 150 Total Dose (krad(Si)) Figure 5.12. Plot of Adjust Pin Current Change VDIFF=2.5V-40V (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 29 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-435 101017 R1.1 Table 5.12. Raw data for Adjust Pin Current Change VDIFF=2.5V-40V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Adjust Pin Current Change VDIFF=2.5V-40V (A) Device 57 58 59 60 92 93 94 95 97 98 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 -4.00E-08 0.00E+00 0.00E+00 -1.10E-07 4.00E-08 -1.80E-07 -9.00E-08 -3.10E-07 0.00E+00 0.00E+00 1.30E-07 0.00E+00 20 -9.00E-08 0.00E+00 0.00E+00 0.00E+00 -5.80E-07 3.30E-07 9.00E-08 3.80E-07 2.00E-08 0.00E+00 -1.80E-07 0.00E+00 50 0.00E+00 -9.00E-08 0.00E+00 -1.80E-07 0.00E+00 -1.30E-07 -2.00E-07 -2.00E-07 -2.00E-08 -9.00E-08 -1.30E-07 0.00E+00 100 -3.10E-07 9.00E-08 0.00E+00 -2.70E-07 9.00E-08 -9.00E-08 -2.70E-07 0.00E+00 0.00E+00 -4.00E-08 7.00E-08 -9.00E-08 200 -2.00E-08 -6.20E-07 -5.80E-07 -3.10E-07 -1.80E-07 -4.00E-07 -1.80E-07 -1.80E-07 -1.80E-07 -1.80E-07 -2.90E-07 -9.00E-08 -2.20E-08 5.67E-08 1.34E-07 -1.78E-07 -1.34E-07 2.52E-07 5.58E-07 -8.26E-07 -5.40E-08 8.05E-08 1.67E-07 -2.75E-07 -8.00E-08 1.96E-07 4.57E-07 -6.17E-07 -3.42E-07 2.57E-07 3.64E-07 -1.05E-06 -1.16E-07 1.64E-07 -1.28E-07 -8.00E-08 -2.24E-07 1.32E-07 1.78E-07 7.66E-08 1.12E-07 9.84E-08 2.45E-07 6.53E-07 8.21E-08 2.28E-07 4.58E-08 -4.77E-07 -3.25E-07 -3.38E-07 -3.88E-07 -4.94E-07 -5.00E-06 -5.00E-06 -5.00E-06 -5.00E-06 -5.00E-06 PASS PASS PASS PASS PASS 5.00E-06 5.00E-06 5.00E-06 5.00E-06 5.00E-06 PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 30 RLAT Report 10-435 101017 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 6.00E-03 Minimum Load Current (A) 5.00E-03 4.00E-03 3.00E-03 2.00E-03 1.00E-03 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.13. Plot of Minimum Load Current (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 31 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-435 101017 R1.1 Table 5.13. Raw data for Minimum Load Current (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Minimum Load Current (A) Device 57 58 59 60 92 93 94 95 97 98 99 100 0 1.93E-03 1.87E-03 1.85E-03 1.91E-03 1.85E-03 1.93E-03 1.81E-03 1.95E-03 2.02E-03 1.83E-03 1.93E-03 1.87E-03 20 1.93E-03 1.89E-03 1.83E-03 1.93E-03 1.85E-03 1.96E-03 1.81E-03 1.96E-03 2.02E-03 1.85E-03 1.95E-03 1.89E-03 50 1.96E-03 1.98E-03 1.89E-03 1.98E-03 1.91E-03 1.98E-03 1.83E-03 1.98E-03 2.04E-03 1.85E-03 1.95E-03 1.89E-03 100 2.02E-03 2.08E-03 1.96E-03 2.06E-03 2.00E-03 2.06E-03 1.87E-03 2.06E-03 2.06E-03 1.90E-03 1.94E-03 1.89E-03 200 2.18E-03 2.32E-03 2.14E-03 2.24E-03 2.18E-03 2.24E-03 2.06E-03 2.28E-03 2.24E-03 2.06E-03 1.92E-03 1.89E-03 Biased Statistics Average Biased 1.88E-03 1.88E-03 1.94E-03 2.03E-03 2.21E-03 Std Dev Biased 3.63E-05 4.56E-05 4.38E-05 4.79E-05 7.01E-05 Ps90%/90% (+KTL) Biased 1.98E-03 2.01E-03 2.06E-03 2.16E-03 2.40E-03 Ps90%/90% (-KTL) Biased 1.78E-03 1.76E-03 1.82E-03 1.89E-03 2.02E-03 Un-Biased Statistics Average Un-Biased 1.90E-03 1.92E-03 1.93E-03 1.99E-03 2.18E-03 Std Dev Un-Biased 8.86E-05 8.92E-05 9.34E-05 9.80E-05 1.04E-04 Ps90%/90% (+KTL) Un-Biased 2.15E-03 2.16E-03 2.19E-03 2.26E-03 2.46E-03 Ps90%/90% (-KTL) Un-Biased 1.66E-03 1.67E-03 1.68E-03 1.72E-03 1.89E-03 Specification MAX 5.00E-03 5.00E-03 5.00E-03 5.00E-03 5.00E-03 Status PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 32 RLAT Report 10-435 101017 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased 2.50E+00 Current Limit VOUT=15V (A) 2.00E+00 1.50E+00 1.00E+00 5.00E-01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.14. Plot of Current Limit VOUT=15V (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 33 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-435 101017 R1.1 Table 5.14. Raw data for Current Limit VOUT=15V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Current Limit VOUT=15V (A) Device 57 58 59 60 92 93 94 95 97 98 99 100 0 1.66E+00 2.00E+00 1.61E+00 1.66E+00 2.06E+00 2.09E+00 2.03E+00 2.08E+00 1.79E+00 2.09E+00 2.09E+00 2.06E+00 20 1.53E+00 1.66E+00 1.54E+00 1.53E+00 1.64E+00 1.70E+00 1.79E+00 1.70E+00 1.61E+00 1.97E+00 1.97E+00 2.06E+00 50 2.15E+00 1.66E+00 1.56E+00 1.55E+00 1.55E+00 1.55E+00 1.70E+00 1.61E+00 1.57E+00 1.61E+00 2.06E+00 2.06E+00 100 1.57E+00 1.66E+00 1.57E+00 1.61E+00 1.61E+00 1.58E+00 1.53E+00 1.53E+00 1.53E+00 1.53E+00 2.01E+00 2.06E+00 200 1.53E+00 1.57E+00 1.58E+00 1.53E+00 1.55E+00 1.49E+00 1.53E+00 1.45E+00 1.53E+00 1.88E+00 2.06E+00 2.05E+00 Biased Statistics Average Biased 1.80E+00 1.58E+00 1.69E+00 1.60E+00 1.55E+00 Std Dev Biased 2.12E-01 6.57E-02 2.58E-01 3.72E-02 2.51E-02 Ps90%/90% (+KTL) Biased 2.38E+00 1.76E+00 2.40E+00 1.71E+00 1.62E+00 Ps90%/90% (-KTL) Biased 1.21E+00 1.40E+00 9.85E-01 1.50E+00 1.48E+00 Un-Biased Statistics Average Un-Biased 2.02E+00 1.76E+00 1.61E+00 1.54E+00 1.57E+00 Std Dev Un-Biased 1.28E-01 1.35E-01 5.82E-02 2.36E-02 1.74E-01 Ps90%/90% (+KTL) Un-Biased 2.37E+00 2.13E+00 1.77E+00 1.60E+00 2.05E+00 Ps90%/90% (-KTL) Un-Biased 1.66E+00 1.39E+00 1.45E+00 1.47E+00 1.10E+00 Specification MIN 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.50E+00 Status PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 34 RLAT Report 10-435 101017 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased 9.00E-01 Current Limit VOUT=40V (A) 8.00E-01 7.00E-01 6.00E-01 5.00E-01 4.00E-01 3.00E-01 2.00E-01 1.00E-01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.15. Plot of Current Limit VOUT=40V (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 35 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-435 101017 R1.1 Table 5.15. Raw data for Current Limit VOUT=40V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Current Limit VOUT=40V (A) Device 57 58 59 60 92 93 94 95 97 98 99 100 0 4.97E-01 4.75E-01 5.02E-01 5.02E-01 4.80E-01 4.86E-01 5.02E-01 4.86E-01 4.97E-01 5.02E-01 4.91E-01 4.86E-01 20 5.70E-01 5.53E-01 5.64E-01 5.64E-01 5.64E-01 5.64E-01 5.53E-01 5.36E-01 5.53E-01 5.70E-01 4.92E-01 4.92E-01 50 6.36E-01 6.14E-01 6.36E-01 6.36E-01 6.20E-01 6.31E-01 6.14E-01 5.92E-01 6.09E-01 6.20E-01 4.86E-01 4.98E-01 100 6.97E-01 6.86E-01 6.97E-01 7.25E-01 6.91E-01 6.86E-01 6.69E-01 6.63E-01 6.75E-01 6.86E-01 4.91E-01 4.91E-01 200 8.02E-01 7.97E-01 7.91E-01 8.30E-01 8.13E-01 7.75E-01 7.58E-01 7.75E-01 7.75E-01 7.63E-01 4.91E-01 4.86E-01 Biased Statistics Average Biased 4.91E-01 5.63E-01 6.28E-01 6.99E-01 8.07E-01 Std Dev Biased 1.28E-02 6.16E-03 1.06E-02 1.51E-02 1.54E-02 Ps90%/90% (+KTL) Biased 5.26E-01 5.80E-01 6.58E-01 7.41E-01 8.49E-01 Ps90%/90% (-KTL) Biased 4.56E-01 5.46E-01 5.99E-01 6.58E-01 7.64E-01 Un-Biased Statistics Average Un-Biased 4.95E-01 5.55E-01 6.13E-01 6.76E-01 7.69E-01 Std Dev Un-Biased 8.11E-03 1.30E-02 1.44E-02 1.02E-02 8.14E-03 Ps90%/90% (+KTL) Un-Biased 5.17E-01 5.91E-01 6.53E-01 7.04E-01 7.92E-01 Ps90%/90% (-KTL) Un-Biased 4.72E-01 5.20E-01 5.74E-01 6.48E-01 7.47E-01 Specification MIN 3.00E-01 3.00E-01 3.00E-01 3.00E-01 3.00E-01 Status PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 36 RLAT Report 10-435 101017 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 6.0. Summary / Conclusions The total ionizing dose testing described in this final report was performed using the facilities at Radiation Assured Devices’ Longmire Laboratories in Colorado Springs, CO. The high dose rate total ionizing dose (TID) source is a JLSA 84-21 irradiator modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily shielded by lead, during the radiation exposures the rod is raised by an electronic timer/controller and the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from <1rad(Si)/s to a maximum of approximately 120rad(Si)/s, determined by the distance from the source. The parametric data was obtained as “read and record” and all the raw data plus an attributes summary are contained in this report as well as in a separate Excel file. The attributes data contains the average, standard deviation and the average with the KTL values applied. The KTL values used is 2.742 per MIL HDBK 814 using one sided tolerance limits of 90/90 and a 5-piece sample size. This survival probability/level of confidence is consistent with a 22-piece sample size and zero failures analyzed using a lot tolerance percent defective (LTPD) approach. Note that the following criteria must be met for a device to pass the low dose rate test: following the radiation exposure each of the 5 pieces irradiated under electrical bias shall pass the specification value. The units irradiated without electrical bias and the KTL statistics are included in this report for reference only. If any of the 5 pieces irradiated under electrical bias exceed the datasheet specifications, then the lot could be logged as a failure. Using the conditions stated above, the RH117K-Positive Adjustable Regulator (from the lot date code identified on the first page of this test report) passed the enhanced low dose rate sensitivity test to 200krad(Si) with all parameters remaining within their pre- and/or post-radiation specification limits. As noted above (Section 4) the data for the units-under-test irradiated in the unbiased condition and the KTL statistics presented in this report are for reference only and are not used for the determination of “PASS/FAIL” for the lot. An ISO 9001:2008 and DSCC Certified Company 37 RLAT Report 10-435 101017 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Appendix A: Photograph of a Sample Unit-Under-Test to Show Part Traceability An ISO 9001:2008 and DSCC Certified Company 38 RLAT Report 10-435 101017 R1.1 Appendix B: Radiation Bias Connections TID Radiation Biased Conditions: Pin Function Connection / Bias 1 ADJ 2kΩ to -15V 2 VIN To 15V, 0.1μF decoupling to -15V 3 VOUT CASE 61.9Ω to -15V TID Radiation Unbiased Conditions: Pin Function Connection / Bias 1 ADJ GND 2 VIN GND 3 VOUT CASE GND An ISO 9001:2008 and DSCC Certified Company 39 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-435 101017 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Figure B.1. Irradiation bias drawing for the units to be irradiated under electrical bias. This figure was extracted from LINEAR TECHNOLOGY CORPORATION, RH117 Datasheet. Figure B.2. K package drawing (for reference only). This figure was extracted from the LINEAR TECHNOLOGY CORPORATION RH117 Datasheet. An ISO 9001:2008 and DSCC Certified Company 40 RLAT Report 10-435 101017 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Appendix C: Electrical Test Parameters and Conditions All electrical tests for this device are performed on one of Radiation Assured Device's LTS2020 Test Systems. The LTS2020 Test System is a programmable parametric tester that provides parameter measurements for a variety of digital, analog and mixed signal products including voltage regulators, voltage comparators, D to A and A to D converters. The LTS2020 Test System achieves accuracy and sensitivity through the use of software self-calibration and an internal relay matrix with separate family boards and custom personality adapter boards. The tester uses this relay matrix to connect the required test circuits, select the appropriate voltage / current sources and establish the needed measurement loops for all the tests performed. The measured parameters and test conditions are shown in Table C.1. A listing of the measurement precision/resolution for each parameter is shown in Table C.2. The precision/resolution values were obtained from test data or from the DAC resolution of the LTS-2020 for the particular test shown, whichever is greater. To generate the precision/resolution shown in Table C.2, one of the units-under-test was tested repetitively (a total of 10-times with re-insertion between tests) to obtain the average test value and standard deviation. Using this test data MIL-HDBK-814 90/90 KTL statistics were applied to the measured standard deviation to generate the final measurement range. This value encompasses the precision/resolution of all aspects of the test system, including the LTS2020 mainframe, family board, socket assembly and DUT board as well as insertion error. In some cases, the measurement resolution is limited by the internal DACs, which results in a measured standard deviation of zero. In these instances the precision/resolution will be reported back as the LSB of the DAC. Note that the testing and statistics used in this document are based on an “analysis of variables” technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p. 91 for a discussion of statistical treatments). Not all measured parameters are well suited to this approach due to inherent large variations. If necessary, larger samples sizes could be used to qualify these parameters using an “attributes” approach. An ISO 9001:2008 and DSCC Certified Company 41 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-435 101017 R1.1 Table C.1. Measured parameters and test conditions for the RH117K. TEST DESCRIPTION TEST CONDITIONS VDIFF=VIN-VOUT=3V, IL=10mA VDIFF=40V, IL=10mA Reference Voltage VDIFF=3V, IL=1.5A VDIFF=40V, IL=0.3A Line Regulation VDIFF=3V to 40V, IL=10mA Load Regulation VOUT≤5V VDIFF=5V, VIN=6.25V, IL=10mA to 1.5A Load Regulation VOUT≥5V VDIFF=5V, VIN=11.25V, IL=10mA to 1.5A VDIFF=2.5V, IL=10mA Adjust Pin Current VDIFF=5V, IL=10mA VDIFF=40V, IL=10mA VDIFF=5V, IL=10mA to 1.5A Adjust Pin Current Change VDIFF=2.5V to 40V, IL=10mA Minimum Load Current VDIFF=40V Current Limit VDIFF≤15V VDIFF=15V Current Limit VDIFF=40V VDIFF=40V Table C.2. Measured parameters, pre-irradiation specifications and measurement precision for the RH117K. Measured Parameter Pre-Irradiation Specification Reference Voltage 1.25V±50mV Line Regulation 0.02%/V MAX Load Regulation VOUT≤5V 15mV MAX Load Regulation VOUT≥5V 0.3% MAX Adjust Pin Current 100µA MAX Adjust Pin Current Change ± 5µA MAX Minimum Load Current 5mA MAX Current Limit VDIFF≤15V 1.5A MAX Current Limit VDIFF=40V 0.3A MAX Measurement Resolution/Precision ± 1.09E-03V ± 3.40E-04%/V 2.40E-04V 4.48E-03% 2.26E-06A 4.20E-07A 2.84E-05A 5.22E-03A 6.53E-03A An ISO 9001:2008 and DSCC Certified Company 42 RLAT Report 10-435 101017 R1.1 Appendix D: List of Figures Used in Section 5 (RLAT Test Results) 5.1 5.2 5.3 5.4 5.5 5.6 5.7 5.8 5.9 5.10 5.11 5.12 5.13 5.14 5.15 Reference Voltage VDIFF=3V IL=10mA (V) Reference Voltage VDIFF=40V IL=10mA (V) Reference Voltage VDIFF=3V IL=1.5A (V) Reference Voltage VDIFF=40V IL=0.3A (V) Line Regulation (%/V) Load Regulation VOUT<=5V (mV) Load Regulation VOUT>=5V (%) Adjust Pin Current VDIFF=2.5V IL=10mA (A) Adjust Pin Current VDIFF=5V IL=10mA (A) Adjust Pin Current VDIFF=40V IL=10mA (A) Adjust Pin Current Change IL=10mA-1.5A (A) Adjust Pin Current Change VDIFF=2.5V-40V (A) Minimum Load Current (A) Current Limit VOUT=15V (A) Current Limit VOUT=40V (A) An ISO 9001:2008 and DSCC Certified Company 43 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800