Radiation Lot Acceptance Testing (RLAT) of the Radiation Assured

RLAT Final Report
10-009 100420 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Radiation Lot Acceptance Testing (RLAT) of the Radiation Assured Devices
RAD1419 14-Bit, 800ksps Sampling A/D Converter with Shutdown
Customer: Radiation Assured Devices
RAD Job Number: 10-009
Part Type Tested/SMD: Radiation Assured Devices RAD1419 14-Bit, 800ksps Sampling A/D Converter with
Shutdown
Traceability Information: Wafer Lot: W0945251-05, Wafer 3, Lot Date code: 1012; see Appendix A for a
photograph of a sample unit-under-test.
Quantity of Units: 7 units total, 5 units for biased irradiation and 2 control units. Serial numbers 31, 32, 34-36
were biased during irradiation. Serial numbers 1 and 2 was used as the control. See Appendix B for the radiation
bias connection table.
Traveler: RAD 10-009 1419, 1200-903-Rev. 4-3-09
TID Dose Rate and Test Increments: 50-300rad(Si)/s with readings at pre-irradiation, 10krad(Si), 30krad(Si),
50krad(Si) and 100krad(Si).
TID Overtest and Post-Irradiation Anneal: No overtest or anneal included in this report.
Referenced TID Test Standard: MIL-STD-883G, Method 1019.7, Condition A
TID Electrical Test Conditions: Pre-irradiation, and within one hour following each radiation exposure.
Test Hardware: Static Tests: LTS-2020 Entity ID TS03, calibration performed on 04/28/2010 calibration due on
04/28/2011. LTS2200 family board, Entity ID: FB03 and RAD1419W BGSS-090815 DUT Board; Test program
RAD1419.SRC. Dynamic Tests: LTC1419W BGSS-090816, Stanford Research DS360, Entity ID: SG08,
RAD100128 Rev 1.0 Dynamic Filter, Entity ID: FLT01, Test Program: LTC1419w_b
Facility and Radiation Source: Radiation Assured Devices Longmire Laboratories, Colorado Springs, CO using
the JLSA 81-24 high dose rate Co60 source. Dosimetry performed by CaF TLDs traceable to NIST. RAD’s
dosimetry has been audited by DSCC and RAD has been awarded Laboratory Suitability for MIL-STD-750 TM
1019 and MIL-STD-883 TM1019.
Irradiation and Test Temperature: Room temperature for irradiation and test controlled to 24°C ± 6°C per
MIL-STD-883.
RLAT Result: Units PASSED to the maximum tested dose level of 100krad(Si)
with all parameters remaining within their post-irradiation datasheet limits.
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1.0. Overview and Background
It is well known that total dose ionizing radiation can cause parametric degradation and ultimately
functional failure in electronic devices. The damage occurs via electron-hole pair production, transport
and trapping in the dielectric and interface regions. In discrete devices the bulk of the damage is
frequently manifested as a reduction in the gain and/or breakdown voltage of the device. The damage
will usually anneal with time following the end of the radiation exposure. Due to this annealing, and to
ensure a worst-case test condition MIL-STD-883 TM1019.7 calls out a dose rate of 50 to 300rad(Si)/s as
Condition A and further specifies that the time from the end of an incremental radiation exposure and
electrical testing shall be 1-hour or less and the total time from the end of one incremental irradiation to
the beginning of the next incremental radiation step should be 2-hours or less. The work described in
this report was performed to meet MIL-STD-883 TM1019.7 Condition A.
2.0. Radiation Test Apparatus
The total ionizing dose testing described in this final report was performed using the facilities at
Radiation Assured Devices’ Longmire Laboratories in Colorado Springs, CO. The high dose rate total
ionizing dose (TID) source is a JLSA 84-21 irradiator modified to provide a panoramic exposure. The
Co-60 rods are held in the base of the irradiator heavily shielded by lead, during the radiation exposures
the rod is raised by an electronic timer/controller and the exposure is performed in air. The dose rate for
this irradiator in this configuration ranges from <1rad(Si)/s to a maximum of approximately
120rad(Si)/s, determined by the distance from the source. For high-dose rate experiments the bias
boards are placed in a radial fashion equidistant from the raised Co-60 rods with the distance adjusted to
provide the required dose rate. The irradiator calibration is maintained by Radiation Assured Devices
Longmire Laboratories using thermoluminescent dosimeters (TLDs)) traceable to the National Institute
of Standards and Technology (NIST). Figure 2.1 shows a photograph of the JLSA 81-24 Co-60
irradiator at RAD’s Longmire Laboratory facility.
RAD is currently certified by the Defense Supply Center Columbus (DSCC) for Laboratory Suitability
under MIL-STD-750 and MIL-STD-883. Additional details regarding Radiation Assured Devices
dosimetry for TM1019 Condition A testing are available in RAD’s report to DSCC entitled: “Dose Rate
Mapping of the J.L. Shepherd and Associates Model 81 Irradiator Installed by Radiation Assured
Devices”
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Figure 2.1. Radiation Assured Devices’ high dose rate Co-60 irradiator. The dose rate is obtained by
positioning the device-under-test at a fixed distance from the gamma cell. The dose rate for this
irradiator varies from approximately 120rad(Si)/s close to the rods down to 1rad(Si)/s at a distance of
approximately 2-feet.
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3.0. Radiation Test Conditions
The RAD1419 14-Bit, 800ksps Sampling A/D Converter with Shutdown described in this final report
was irradiated in a dynamic configuration using a split supply potential of 5.5V on VDD and VSS. See
the TID Bias Table in Appendix B for the full bias circuits. In our opinion, this bias circuits satisfy the
requirements of MIL-STD-883G TM1019.7 Section 3.9.3 Bias and Loading Conditions for units
irradiated under electrical bias which states “The bias applied to the test devices shall be selected to
produce the greatest radiation induced damage or the worst-case damage for the intended application, if
known. While maximum voltage is often worst case some bipolar linear device parameters (e.g. input
bias current or maximum output load current) exhibit more degradation with 0 V bias.”
The devices were irradiated to a maximum total ionizing dose level of 100krad(Si) with incremental
readings at 10krad(Si), 30krad(Si) and 50krad(Si). Electrical testing occurred within one hour following
the end of each irradiation segment. For intermediate irradiations, the parts were tested and returned to
total dose exposure within two hours from the end of the previous radiation increment.
The TID bias board was positioned in the Co-60 cell to provide the required dose rate range of
50rad(Si)/s to 300rad(Si)/s and was located inside a lead-aluminum enclosure. The lead-aluminum
enclosure is required under MIL-STD-883G TM1019.7 Section 3.4 that reads as follows:
“Lead/Aluminum (Pb/Al) container. Test specimens shall be enclosed in a Pb/Al container to minimize
dose enhancement effects caused by low-energy, scattered radiation. A minimum of 1.5 mm Pb,
surrounding an inner shield of at least 0.7 mm Al, is required. This Pb/Al container produces an
approximate charged particle equilibrium for Si and for TLDs such as CaF2. The radiation field intensity
shall be measured inside the Pb/Al container (1) initially, (2) when the source is changed, or (3) when
the orientation or configuration of the source, container, or test-fixture is changed. This measurement
shall be performed by placing a dosimeter (e.g., a TLD) in the device-irradiation container at the
approximate test-device position. If it can be demonstrated that low energy scattered radiation is small
enough that it will not cause dosimetry errors due to dose enhancement, the Pb/Al container may be
omitted”.
The final dose rate within the lead-aluminum enclosure was determined based on TLD dosimetry
measurements (see previous section). The final dose rate for this work was 55.8rad(Si)/s with a precision
of ±5%.
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4.0. Tested Parameters
During the radiation lot acceptance testing the following electrical parameters were measured pre- and
post-irradiation:
1. Power Supply Current, ICC SHDN=1 CS=0
2. Power Supply Current, Nap Mode, ICC SHDN=0 CS=0
3. Power Supply Current, Sleep Mode, ICC SHDN=0 CS=1
4. Power Supply Current, IEE, SHDN=1 CS=0
5. Power Supply Current, Nap Mode, IEE SHDN=0 CS=0
6. Power Supply Current, Sleep Mode, IEE SHDN=0 CS=1
7. Output Reference Voltage, VREF
8. VOL @ 1.6mA Outputs D0-D13
9. VOH @ 1.6mA Outputs D0-D13
10. VOH @ 0.2mA BUSY
11. IOZH @ VO=5V Outputs D0-D13
12. IOZL @ VO=5V Outputs D0-D13
13. IIL CS @ 0V
14. IIL RD @ 0V
15. IIL SHDN @ 0V
16. IIL CONVST @ 0V
17. IIH CS @ 5V
18. IIH RD @ 5V
19. IIH SHDN @ 5V
20. IIH CONVST @ 5V
21. Analog Input Leakage Current IIN, VAIN=2.5V
22. Analog Input Leakage Current IIN, VAIN=-2.5V
23. Bipolar Offset
24. Bipolar Gain Error
25. Integral Linearity Error, Positive
26. Integral Linearity Error, Negative
27. Differential Linearity Error CODEWIDTH LONG
28. Differential Linearity Error CODEWIDTH SHORT
29. Spurious Free Dynamic Range, SFDR
30. Total Harmonic Distortion, THD
31. Signal-to-Noise + Distortion Ratio, SINAD
Appendix C details the measured parameters, test conditions, pre-irradiation specification and
measurement resolution for each of the measurements.
The parametric data was obtained as read and record and all the raw data plus an attributes summary are
contained in this report as well as in a separate Excel file. The attributes data contains the average,
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(719) 531-0800
standard deviation and the average with the KTL values applied. The KTL value used in this work is
2.742 per MIL-HDBK-814 using one sided tolerance limits of 90/90 and a 5-piece sample size. The
90/90 KTL values were selected to match the statistical levels specified in the MIL-PRF-38535
sampling plan for the qualification of a radiation hardness assured (RHA) component. Note that the
following criterion must be met for a device to pass the RLAT: following the radiation exposure each of
the 5 pieces irradiated under electrical bias shall pass the specification value. The KTL statistics are
included in this report for reference only. If any of the 5 pieces irradiated under electrical bias exceed
the datasheet specifications, then the lot could be logged as a failure.
5.0. Total Ionizing Dose Test Results
Based on the criterion established above, the units-under-test (from the lot date code / traceability
information provided on the first page of this report) PASSED to the maximum tested total dose of
100krad(Si) with the all of the units-under-test remaining within their post-irradiation datasheet limits.
Figures 5.1 and 5.83 show plots of all the measured parameters versus total ionizing dose while Tables
5.1 – 5.83 show the corresponding raw data for each of these parameters. Appendix D lists all the
figures used in this section for convenience in locating a particular parameter.
In the data plots the solid diamonds are the average of the measured data points for the sample irradiated
under electrical bias while the black lines (solid or dashed) are the average of the data points after
application of the KTL statistics on the sample irradiated in the biased condition. The red dotted line(s)
are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the
datasheet and/or test plan.
The control units, as expected, show no significant changes throughout the test indicating that the
electrical testing remained in control for the duration of the radiation exposures.
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Average Biased
Ps90%/90% (+KTL) Biased
Specification MAX
2.50E-02
1_ICCSHDN=1CS=0 (A)
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.1. Plot of 1_ICCSHDN=1CS=0 (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
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Table 5.1. Raw data for 1_ICCSHDN=1CS=0 (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
1_ICCSHDN=1CS=0 (A)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
1.42E-02
1.43E-02
1.43E-02
1.44E-02
1.42E-02
1.39E-02
1.41E-02
10
1.37E-02
1.39E-02
1.38E-02
1.39E-02
1.36E-02
1.39E-02
1.41E-02
30
1.27E-02
1.30E-02
1.30E-02
1.31E-02
1.26E-02
1.39E-02
1.41E-02
50
1.24E-02
1.24E-02
1.24E-02
1.25E-02
1.20E-02
1.40E-02
1.41E-02
100
1.18E-02
1.17E-02
1.16E-02
1.17E-02
1.09E-02
1.39E-02
1.41E-02
1.43E-02
8.50E-05
1.45E-02
1.41E-02
2.00E-02
PASS
1.38E-02
1.18E-04
1.41E-02
1.35E-02
2.00E-02
PASS
1.29E-02
1.94E-04
1.34E-02
1.23E-02
2.00E-02
PASS
1.23E-02
1.96E-04
1.29E-02
1.18E-02
2.00E-02
PASS
1.15E-02
3.77E-04
1.26E-02
1.05E-02
2.00E-02
PASS
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Average Biased
Ps90%/90% (+KTL) Biased
Specification MAX
3.50E-03
2_ICCSHDN=0CS=0 (A)
3.00E-03
2.50E-03
2.00E-03
1.50E-03
1.00E-03
5.00E-04
0.00E+00
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.2. Plot of 2_ICCSHDN=0CS=0 (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
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Table 5.2. Raw data for 2_ICCSHDN=0CS=0 (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
2_ICCSHDN=0CS=0 (A)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
1.71E-03
1.71E-03
1.70E-03
1.70E-03
1.71E-03
1.70E-03
1.69E-03
10
1.72E-03
1.70E-03
1.71E-03
1.69E-03
1.72E-03
1.71E-03
1.70E-03
30
1.73E-03
1.71E-03
1.71E-03
1.72E-03
1.70E-03
1.71E-03
1.68E-03
50
1.79E-03
1.76E-03
1.74E-03
1.76E-03
1.67E-03
1.70E-03
1.69E-03
100
2.18E-03
2.04E-03
2.00E-03
2.05E-03
1.69E-03
1.71E-03
1.68E-03
1.71E-03
5.48E-06
1.72E-03
1.69E-03
3.00E-03
PASS
1.71E-03
1.30E-05
1.74E-03
1.67E-03
3.00E-03
PASS
1.71E-03
1.14E-05
1.75E-03
1.68E-03
3.00E-03
PASS
1.74E-03
4.51E-05
1.87E-03
1.62E-03
3.00E-03
PASS
1.99E-03
1.82E-04
2.49E-03
1.49E-03
3.00E-03
PASS
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Average Biased
Ps90%/90% (+KTL) Biased
Specification MAX
3.50E-03
3_ICCSHDN=0CS=1 (A)
3.00E-03
2.50E-03
2.00E-03
1.50E-03
1.00E-03
5.00E-04
0.00E+00
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.3. Plot of 3_ICCSHDN=0CS=1 (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
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Table 5.3. Raw data for 3_ICCSHDN=0CS=1 (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
3_ICCSHDN=0CS=1 (A)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
8.00E-05
6.00E-05
7.00E-05
5.00E-05
5.00E-05
8.00E-05
7.00E-05
10
6.00E-05
5.00E-05
5.00E-05
5.00E-05
6.00E-05
6.00E-05
6.00E-05
30
1.00E-05
4.00E-05
4.00E-05
4.00E-05
6.00E-05
6.00E-05
7.00E-05
50
4.00E-05
1.00E-05
1.00E-05
2.00E-05
6.00E-05
6.00E-05
6.00E-05
100
4.10E-04
2.90E-04
2.40E-04
3.20E-04
6.00E-05
7.00E-05
6.00E-05
6.20E-05
1.30E-05
9.78E-05
2.62E-05
3.00E-03
PASS
5.40E-05
5.48E-06
6.90E-05
3.90E-05
3.00E-03
PASS
3.80E-05
1.79E-05
8.71E-05
-1.11E-05
3.00E-03
PASS
2.80E-05
2.17E-05
8.74E-05
-3.14E-05
3.00E-03
PASS
2.64E-04
1.30E-04
6.20E-04
-9.17E-05
3.00E-03
PASS
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Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
0.00E+00
4_IEESHDN=1CS=0 (A)
-5.00E-03
-1.00E-02
-1.50E-02
-2.00E-02
-2.50E-02
-3.00E-02
-3.50E-02
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.4. Plot of 4_IEESHDN=1CS=0 (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
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Table 5.4. Raw data for 4_IEESHDN=1CS=0 (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
4_IEESHDN=1CS=0 (A)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
-2.28E-02
-2.28E-02
-2.24E-02
-2.29E-02
-2.26E-02
-2.27E-02
-2.24E-02
10
-2.15E-02
-2.16E-02
-2.13E-02
-2.18E-02
-2.13E-02
-2.27E-02
-2.23E-02
30
-1.96E-02
-1.95E-02
-1.93E-02
-1.98E-02
-1.90E-02
-2.27E-02
-2.23E-02
50
-1.81E-02
-1.79E-02
-1.77E-02
-1.83E-02
-1.75E-02
-2.27E-02
-2.23E-02
100
-1.50E-02
-1.50E-02
-1.49E-02
-1.52E-02
-1.49E-02
-2.28E-02
-2.24E-02
-2.27E-02
2.04E-04
-2.21E-02
-2.32E-02
-3.00E-02
PASS
-2.15E-02
2.15E-04
-2.09E-02
-2.21E-02
-3.00E-02
PASS
-1.94E-02
3.17E-04
-1.86E-02
-2.03E-02
-3.00E-02
PASS
-1.79E-02
3.39E-04
-1.70E-02
-1.88E-02
-3.00E-02
PASS
-1.50E-02
1.50E-04
-1.46E-02
-1.54E-02
-3.00E-02
PASS
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Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
1.00E-04
0.00E+00
5_IEESHDN=0CS=0 (A)
-1.00E-04
-2.00E-04
-3.00E-04
-4.00E-04
-5.00E-04
-6.00E-04
-7.00E-04
-8.00E-04
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.5. Plot of 5_IEESHDN=0CS=0 (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
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RLAT Final Report
10-009 100420 R1.0
Table 5.5. Raw data for 5_IEESHDN=0CS=0 (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
5_IEESHDN=0CS=0 (A)
Device
30
-4.52E-05
-2.57E-05
-2.08E-05
-3.06E-05
3.70E-06
3.70E-06
3.70E-06
50
-1.09E-04
-6.97E-05
-6.48E-05
-8.43E-05
3.70E-06
3.70E-06
-1.20E-06
100
-4.12E-04
-2.90E-04
-2.65E-04
-3.39E-04
-1.20E-06
3.60E-06
3.60E-06
Biased Statistics
Average Biased
1.74E-06 1.74E-06 -2.37E-05
Std Dev Biased
4.38E-06 2.68E-06 1.78E-05
Ps90%/90% (+KTL) Biased 1.38E-05 9.10E-06 2.52E-05
Ps90%/90% (-KTL) Biased -1.03E-05 -5.62E-06 -7.26E-05
Specification MIN
-5.00E-04 -5.00E-04 -5.00E-04
Status
PASS
PASS
PASS
-6.48E-05
4.19E-05
5.02E-05
-1.80E-04
-5.00E-04
PASS
-2.61E-04
1.56E-04
1.66E-04
-6.89E-04
-7.50E-04
PASS
31
32
34
35
36
1
2
0
3.70E-06
3.70E-06
3.70E-06
-6.10E-06
3.70E-06
-1.20E-06
3.70E-06
10
-1.20E-06
3.70E-06
3.70E-06
-1.20E-06
3.70E-06
3.70E-06
3.70E-06
An ISO 9001:2008 and DSCC Certified Company
16
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
0.00E+00
6_IEESHDN=0CS=1 (A)
-5.00E-05
-1.00E-04
-1.50E-04
-2.00E-04
-2.50E-04
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.6. Plot of 6_IEESHDN=0CS=1 (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
17
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.6. Raw data for 6_IEESHDN=0CS=1 (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
6_IEESHDN=0CS=1 (A)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
-7.00E-07
-7.00E-07
-7.00E-07
-8.70E-06
-7.00E-07
-7.00E-07
-7.00E-07
10
-2.70E-06
-1.70E-06
-7.00E-07
-4.10E-06
-9.00E-07
-6.00E-07
-7.00E-07
30
-4.50E-05
-2.95E-05
-2.35E-05
-3.59E-05
-2.60E-06
-5.00E-07
-6.00E-07
50
-8.05E-05
-7.28E-05
-6.46E-05
-7.83E-05
-3.40E-06
-6.00E-07
-6.00E-07
100
-1.03E-04
-9.49E-05
-9.38E-05
-9.85E-05
-7.30E-06
-6.00E-07
-7.00E-07
-2.30E-06
3.58E-06
7.51E-06
-1.21E-05
-1.00E-04
PASS
-2.02E-06
1.40E-06
1.83E-06
-5.87E-06
-1.00E-04
PASS
-2.73E-05
1.59E-05
1.64E-05
-7.10E-05
-1.00E-04
PASS
-5.99E-05
3.22E-05
2.83E-05
-1.48E-04
-1.50E-04
PASS
-7.94E-05
4.04E-05
3.15E-05
-1.90E-04
-2.00E-04
PASS
An ISO 9001:2008 and DSCC Certified Company
18
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
2.53E+00
2.52E+00
2.52E+00
7_VREF (V)
2.51E+00
2.51E+00
2.50E+00
2.50E+00
2.49E+00
2.49E+00
2.48E+00
2.48E+00
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.7. Plot of 7_VREF (V) versus total dose. The solid diamonds are the average of the measured data
points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average
of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The
red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined
in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
19
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.7. Raw data for 7_VREF (V) versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
7_VREF (V)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
2.50E+00
2.50E+00
2.50E+00
2.50E+00
2.50E+00
2.50E+00
2.50E+00
10
2.50E+00
2.50E+00
2.50E+00
2.50E+00
2.50E+00
2.50E+00
2.50E+00
30
2.50E+00
2.50E+00
2.50E+00
2.50E+00
2.50E+00
2.50E+00
2.50E+00
50
2.50E+00
2.50E+00
2.50E+00
2.50E+00
2.50E+00
2.50E+00
2.50E+00
100
2.50E+00
2.50E+00
2.50E+00
2.50E+00
2.50E+00
2.50E+00
2.50E+00
2.50E+00
8.37E-04
2.50E+00
2.50E+00
2.48E+00
PASS
2.52E+00
PASS
2.50E+00
1.64E-03
2.50E+00
2.49E+00
2.48E+00
PASS
2.52E+00
PASS
2.50E+00
1.14E-03
2.50E+00
2.50E+00
2.48E+00
PASS
2.52E+00
PASS
2.50E+00
1.10E-03
2.50E+00
2.50E+00
2.48E+00
PASS
2.52E+00
PASS
2.50E+00
1.87E-03
2.51E+00
2.49E+00
2.48E+00
PASS
2.52E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
20
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (+KTL) Biased
Specification MAX
4.50E-01
4.00E-01
9_VOL1p6MA_D0 (V)
3.50E-01
3.00E-01
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.8. Plot of 9_VOL1p6MA_D0 (V) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
21
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.8. Raw data for 9_VOL1p6MA_D0 (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
9_VOL1p6MA_D0 (V)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
9.50E-02
8.90E-02
9.00E-02
8.90E-02
9.70E-02
9.70E-02
8.80E-02
10
9.40E-02
8.90E-02
8.90E-02
8.80E-02
9.50E-02
9.70E-02
8.80E-02
30
9.20E-02
8.60E-02
8.60E-02
8.50E-02
9.50E-02
9.60E-02
8.80E-02
50
8.80E-02
8.30E-02
8.30E-02
8.30E-02
9.40E-02
9.70E-02
8.70E-02
100
8.40E-02
8.00E-02
8.00E-02
7.90E-02
9.50E-02
9.70E-02
8.80E-02
9.20E-02
3.74E-03
1.02E-01
8.17E-02
4.00E-01
PASS
9.10E-02
3.24E-03
9.99E-02
8.21E-02
4.00E-01
PASS
8.88E-02
4.44E-03
1.01E-01
7.66E-02
4.00E-01
PASS
8.62E-02
4.87E-03
9.95E-02
7.29E-02
4.00E-01
PASS
8.36E-02
6.66E-03
1.02E-01
6.53E-02
4.00E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
22
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (+KTL) Biased
Specification MAX
4.50E-01
4.00E-01
10_VOL1p6MA_D1 (V)
3.50E-01
3.00E-01
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.9. Plot of 10_VOL1p6MA_D1 (V) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
23
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.9. Raw data for 10_VOL1p6MA_D1 (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
10_VOL1p6MA_D1 (V)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
9.80E-02
8.90E-02
8.90E-02
9.10E-02
1.00E-01
1.00E-01
8.60E-02
10
9.60E-02
8.90E-02
8.80E-02
8.80E-02
9.90E-02
1.01E-01
8.70E-02
30
9.40E-02
8.60E-02
8.60E-02
8.60E-02
9.80E-02
1.00E-01
8.80E-02
50
9.10E-02
8.30E-02
8.30E-02
8.40E-02
9.80E-02
1.00E-01
8.80E-02
100
8.70E-02
7.90E-02
7.90E-02
8.00E-02
9.70E-02
1.00E-01
8.70E-02
9.34E-02
5.22E-03
1.08E-01
7.91E-02
4.00E-01
PASS
9.20E-02
5.15E-03
1.06E-01
7.79E-02
4.00E-01
PASS
9.00E-02
5.66E-03
1.06E-01
7.45E-02
4.00E-01
PASS
8.78E-02
6.61E-03
1.06E-01
6.97E-02
4.00E-01
PASS
8.44E-02
7.80E-03
1.06E-01
6.30E-02
4.00E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
24
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (+KTL) Biased
Specification MAX
4.50E-01
4.00E-01
11_VOL1p6MA_D2 (V)
3.50E-01
3.00E-01
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.10. Plot of 11_VOL1p6MA_D2 (V) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
25
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.10. Raw data for 11_VOL1p6MA_D2 (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
11_VOL1p6MA_D2 (V)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
9.70E-02
9.00E-02
8.90E-02
9.10E-02
9.90E-02
9.90E-02
8.60E-02
10
9.60E-02
8.80E-02
8.90E-02
8.90E-02
9.90E-02
1.00E-01
8.80E-02
30
9.30E-02
8.60E-02
8.60E-02
8.70E-02
9.70E-02
9.90E-02
8.80E-02
50
9.20E-02
8.30E-02
8.30E-02
8.40E-02
9.70E-02
9.90E-02
8.80E-02
100
8.70E-02
7.90E-02
7.90E-02
8.10E-02
9.80E-02
1.00E-01
8.80E-02
9.32E-02
4.49E-03
1.06E-01
8.09E-02
4.00E-01
PASS
9.22E-02
4.97E-03
1.06E-01
7.86E-02
4.00E-01
PASS
8.98E-02
4.97E-03
1.03E-01
7.62E-02
4.00E-01
PASS
8.78E-02
6.38E-03
1.05E-01
7.03E-02
4.00E-01
PASS
8.48E-02
8.07E-03
1.07E-01
6.27E-02
4.00E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
26
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (+KTL) Biased
Specification MAX
4.50E-01
4.00E-01
12_VOL1p6MA_D3 (V)
3.50E-01
3.00E-01
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.11. Plot of 12_VOL1p6MA_D3 (V) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
27
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.11. Raw data for 12_VOL1p6MA_D3 (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
12_VOL1p6MA_D3 (V)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
9.80E-02
8.90E-02
8.80E-02
9.10E-02
9.90E-02
9.90E-02
8.60E-02
10
9.70E-02
8.80E-02
8.80E-02
8.90E-02
9.80E-02
1.01E-01
8.80E-02
30
9.40E-02
8.60E-02
8.60E-02
8.70E-02
9.80E-02
9.90E-02
8.70E-02
50
9.20E-02
8.30E-02
8.40E-02
8.40E-02
9.70E-02
1.00E-01
8.70E-02
100
8.70E-02
7.90E-02
7.90E-02
8.00E-02
9.80E-02
1.00E-01
8.80E-02
9.30E-02
5.15E-03
1.07E-01
7.89E-02
4.00E-01
PASS
9.20E-02
5.05E-03
1.06E-01
7.82E-02
4.00E-01
PASS
9.02E-02
5.50E-03
1.05E-01
7.51E-02
4.00E-01
PASS
8.80E-02
6.20E-03
1.05E-01
7.10E-02
4.00E-01
PASS
8.46E-02
8.20E-03
1.07E-01
6.21E-02
4.00E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
28
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (+KTL) Biased
Specification MAX
4.50E-01
4.00E-01
13_VOL1p6MA_D4 (V)
3.50E-01
3.00E-01
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.12. Plot of 13_VOL1p6MA_D4 (V) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
29
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.12. Raw data for 13_VOL1p6MA_D4 (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
13_VOL1p6MA_D4 (V)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
9.80E-02
8.90E-02
8.90E-02
9.10E-02
9.80E-02
9.90E-02
8.70E-02
10
9.70E-02
8.80E-02
8.80E-02
8.90E-02
9.80E-02
1.00E-01
8.70E-02
30
9.40E-02
8.50E-02
8.50E-02
8.70E-02
9.70E-02
9.90E-02
8.70E-02
50
9.20E-02
8.30E-02
8.20E-02
8.50E-02
9.60E-02
1.00E-01
8.70E-02
100
8.70E-02
7.90E-02
7.90E-02
8.00E-02
9.70E-02
1.00E-01
8.70E-02
9.30E-02
4.64E-03
1.06E-01
8.03E-02
4.00E-01
PASS
9.20E-02
5.05E-03
1.06E-01
7.82E-02
4.00E-01
PASS
8.96E-02
5.55E-03
1.05E-01
7.44E-02
4.00E-01
PASS
8.76E-02
6.11E-03
1.04E-01
7.09E-02
4.00E-01
PASS
8.44E-02
7.80E-03
1.06E-01
6.30E-02
4.00E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
30
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (+KTL) Biased
Specification MAX
4.50E-01
4.00E-01
14_VOL1p6MA_D5 (V)
3.50E-01
3.00E-01
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.13. Plot of 14_VOL1p6MA_D5 (V) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
31
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.13. Raw data for 14_VOL1p6MA_D5 (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
14_VOL1p6MA_D5 (V)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
9.80E-02
8.80E-02
8.90E-02
8.90E-02
9.70E-02
9.90E-02
8.60E-02
10
9.60E-02
8.80E-02
8.80E-02
8.90E-02
9.60E-02
9.90E-02
8.70E-02
30
9.40E-02
8.50E-02
8.50E-02
8.60E-02
9.50E-02
9.90E-02
8.70E-02
50
9.00E-02
8.20E-02
8.30E-02
8.40E-02
9.50E-02
9.80E-02
8.70E-02
100
8.60E-02
7.90E-02
7.90E-02
8.00E-02
9.40E-02
9.90E-02
8.70E-02
9.22E-02
4.87E-03
1.06E-01
7.89E-02
4.00E-01
PASS
9.14E-02
4.22E-03
1.03E-01
7.98E-02
4.00E-01
PASS
8.90E-02
5.05E-03
1.03E-01
7.52E-02
4.00E-01
PASS
8.68E-02
5.54E-03
1.02E-01
7.16E-02
4.00E-01
PASS
8.36E-02
6.50E-03
1.01E-01
6.58E-02
4.00E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
32
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (+KTL) Biased
Specification MAX
4.50E-01
4.00E-01
15_VOL1p6MA_D6 (V)
3.50E-01
3.00E-01
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.14. Plot of 15_VOL1p6MA_D6 (V) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
33
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.14. Raw data for 15_VOL1p6MA_D6 (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
15_VOL1p6MA_D6 (V)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
9.90E-02
8.90E-02
8.80E-02
8.90E-02
9.60E-02
9.90E-02
8.60E-02
10
9.70E-02
8.80E-02
8.70E-02
8.80E-02
9.60E-02
1.00E-01
8.80E-02
30
9.40E-02
8.50E-02
8.50E-02
8.60E-02
9.40E-02
9.80E-02
8.80E-02
50
9.10E-02
8.20E-02
8.20E-02
8.40E-02
9.30E-02
9.80E-02
8.80E-02
100
8.70E-02
7.90E-02
7.90E-02
8.00E-02
9.30E-02
9.80E-02
8.80E-02
9.22E-02
4.97E-03
1.06E-01
7.86E-02
4.00E-01
PASS
9.12E-02
4.87E-03
1.05E-01
7.79E-02
4.00E-01
PASS
8.88E-02
4.76E-03
1.02E-01
7.57E-02
4.00E-01
PASS
8.64E-02
5.22E-03
1.01E-01
7.21E-02
4.00E-01
PASS
8.36E-02
6.23E-03
1.01E-01
6.65E-02
4.00E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
34
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (+KTL) Biased
Specification MAX
4.50E-01
4.00E-01
16_VOL1p6MA_D7 (V)
3.50E-01
3.00E-01
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.15. Plot of 16_VOL1p6MA_D7 (V) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
35
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.15. Raw data for 16_VOL1p6MA_D7 (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
16_VOL1p6MA_D7 (V)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
9.90E-02
9.00E-02
8.90E-02
9.00E-02
9.60E-02
1.00E-01
8.90E-02
10
9.70E-02
8.80E-02
8.80E-02
9.00E-02
9.40E-02
1.01E-01
9.00E-02
30
9.40E-02
8.50E-02
8.60E-02
8.70E-02
9.40E-02
9.90E-02
8.80E-02
50
9.20E-02
8.30E-02
8.30E-02
8.40E-02
9.30E-02
9.90E-02
8.80E-02
100
8.70E-02
7.90E-02
7.90E-02
8.00E-02
9.30E-02
1.00E-01
8.90E-02
9.28E-02
4.44E-03
1.05E-01
8.06E-02
4.00E-01
PASS
9.14E-02
3.97E-03
1.02E-01
8.05E-02
4.00E-01
PASS
8.92E-02
4.44E-03
1.01E-01
7.70E-02
4.00E-01
PASS
8.70E-02
5.05E-03
1.01E-01
7.32E-02
4.00E-01
PASS
8.36E-02
6.23E-03
1.01E-01
6.65E-02
4.00E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
36
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (+KTL) Biased
Specification MAX
4.50E-01
4.00E-01
17_VOL1p6MA_D8 (V)
3.50E-01
3.00E-01
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.16. Plot of 17_VOL1p6MA_D8 (V) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
37
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.16. Raw data for 17_VOL1p6MA_D8 (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
17_VOL1p6MA_D8 (V)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
9.90E-02
9.00E-02
8.90E-02
9.10E-02
9.50E-02
1.00E-01
8.80E-02
10
9.80E-02
8.90E-02
8.80E-02
9.00E-02
9.40E-02
1.01E-01
8.90E-02
30
9.50E-02
8.70E-02
8.60E-02
8.70E-02
9.30E-02
1.00E-01
8.90E-02
50
9.30E-02
8.40E-02
8.30E-02
8.50E-02
9.30E-02
1.00E-01
8.90E-02
100
8.80E-02
8.00E-02
7.90E-02
8.10E-02
9.20E-02
1.00E-01
8.90E-02
9.28E-02
4.15E-03
1.04E-01
8.14E-02
4.00E-01
PASS
9.18E-02
4.15E-03
1.03E-01
8.04E-02
4.00E-01
PASS
8.96E-02
4.10E-03
1.01E-01
7.84E-02
4.00E-01
PASS
8.76E-02
4.98E-03
1.01E-01
7.39E-02
4.00E-01
PASS
8.40E-02
5.70E-03
9.96E-02
6.84E-02
4.00E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
38
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (+KTL) Biased
Specification MAX
4.50E-01
4.00E-01
18_VOL1p6MA_D9 (V)
3.50E-01
3.00E-01
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.17. Plot of 18_VOL1p6MA_D9 (V) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
39
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.17. Raw data for 18_VOL1p6MA_D9 (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
18_VOL1p6MA_D9 (V)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
9.60E-02
8.80E-02
8.90E-02
9.00E-02
9.50E-02
9.60E-02
8.90E-02
10
9.30E-02
8.90E-02
8.80E-02
8.80E-02
9.40E-02
9.70E-02
8.90E-02
30
9.20E-02
8.70E-02
8.50E-02
8.70E-02
9.30E-02
9.70E-02
8.80E-02
50
9.00E-02
8.50E-02
8.40E-02
8.50E-02
9.20E-02
9.60E-02
8.90E-02
100
8.60E-02
8.00E-02
8.00E-02
8.10E-02
9.20E-02
9.70E-02
8.90E-02
9.16E-02
3.65E-03
1.02E-01
8.16E-02
4.00E-01
PASS
9.04E-02
2.88E-03
9.83E-02
8.25E-02
4.00E-01
PASS
8.88E-02
3.49E-03
9.84E-02
7.92E-02
4.00E-01
PASS
8.72E-02
3.56E-03
9.70E-02
7.74E-02
4.00E-01
PASS
8.38E-02
5.22E-03
9.81E-02
6.95E-02
4.00E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
40
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (+KTL) Biased
Specification MAX
4.50E-01
4.00E-01
19_VOL1p6MA_D10 (V)
3.50E-01
3.00E-01
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.18. Plot of 19_VOL1p6MA_D10 (V) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
41
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.18. Raw data for 19_VOL1p6MA_D10 (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
19_VOL1p6MA_D10 (V)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
9.60E-02
9.00E-02
8.90E-02
8.90E-02
9.30E-02
9.60E-02
8.90E-02
10
9.40E-02
8.90E-02
8.80E-02
8.90E-02
9.30E-02
9.70E-02
8.80E-02
30
9.10E-02
8.70E-02
8.70E-02
8.70E-02
9.20E-02
9.60E-02
8.90E-02
50
9.00E-02
8.50E-02
8.50E-02
8.50E-02
9.20E-02
9.70E-02
8.90E-02
100
8.70E-02
8.10E-02
8.10E-02
8.10E-02
9.20E-02
9.60E-02
8.90E-02
9.14E-02
3.05E-03
9.98E-02
8.30E-02
4.00E-01
PASS
9.06E-02
2.70E-03
9.80E-02
8.32E-02
4.00E-01
PASS
8.88E-02
2.49E-03
9.56E-02
8.20E-02
4.00E-01
PASS
8.74E-02
3.36E-03
9.66E-02
7.82E-02
4.00E-01
PASS
8.44E-02
4.98E-03
9.81E-02
7.07E-02
4.00E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
42
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (+KTL) Biased
Specification MAX
4.50E-01
4.00E-01
20_VOL1p6MA_D11 (V)
3.50E-01
3.00E-01
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.19. Plot of 20_VOL1p6MA_D11 (V) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
43
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.19. Raw data for 20_VOL1p6MA_D11 (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
20_VOL1p6MA_D11 (V)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
9.60E-02
9.00E-02
9.10E-02
9.20E-02
9.40E-02
9.70E-02
8.90E-02
10
9.40E-02
8.90E-02
8.90E-02
9.00E-02
9.30E-02
9.80E-02
9.00E-02
30
9.20E-02
8.80E-02
8.80E-02
8.80E-02
9.20E-02
9.70E-02
9.00E-02
50
9.00E-02
8.60E-02
8.70E-02
8.70E-02
9.20E-02
9.70E-02
9.00E-02
100
8.50E-02
8.30E-02
8.30E-02
8.30E-02
9.30E-02
9.60E-02
9.00E-02
9.26E-02
2.41E-03
9.92E-02
8.60E-02
4.00E-01
PASS
9.10E-02
2.35E-03
9.74E-02
8.46E-02
4.00E-01
PASS
8.96E-02
2.19E-03
9.56E-02
8.36E-02
4.00E-01
PASS
8.84E-02
2.51E-03
9.53E-02
8.15E-02
4.00E-01
PASS
8.54E-02
4.34E-03
9.73E-02
7.35E-02
4.00E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
44
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (+KTL) Biased
Specification MAX
4.50E-01
4.00E-01
21_VOL1p6MA_D12 (V)
3.50E-01
3.00E-01
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.20. Plot of 21_VOL1p6MA_D12 (V) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
45
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.20. Raw data for 21_VOL1p6MA_D12 (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
21_VOL1p6MA_D12 (V)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
9.70E-02
9.40E-02
9.40E-02
9.50E-02
9.40E-02
9.60E-02
9.40E-02
10
9.50E-02
9.20E-02
9.50E-02
9.30E-02
9.40E-02
9.70E-02
9.40E-02
30
9.30E-02
9.00E-02
9.10E-02
9.10E-02
9.20E-02
9.60E-02
9.30E-02
50
9.10E-02
8.80E-02
9.00E-02
8.90E-02
9.20E-02
9.60E-02
9.40E-02
100
8.60E-02
8.40E-02
8.60E-02
8.50E-02
9.10E-02
9.70E-02
9.30E-02
9.48E-02
1.30E-03
9.84E-02
9.12E-02
4.00E-01
PASS
9.38E-02
1.30E-03
9.74E-02
9.02E-02
4.00E-01
PASS
9.14E-02
1.14E-03
9.45E-02
8.83E-02
4.00E-01
PASS
9.00E-02
1.58E-03
9.43E-02
8.57E-02
4.00E-01
PASS
8.64E-02
2.70E-03
9.38E-02
7.90E-02
4.00E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
46
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (+KTL) Biased
Specification MAX
4.50E-01
4.00E-01
22_VOL1p6MA_D13 (V)
3.50E-01
3.00E-01
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.21. Plot of 22_VOL1p6MA_D13 (V) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
47
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.21. Raw data for 22_VOL1p6MA_D13 (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
22_VOL1p6MA_D13 (V)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
9.70E-02
9.30E-02
9.60E-02
9.50E-02
9.40E-02
9.60E-02
9.30E-02
10
9.50E-02
9.20E-02
9.40E-02
9.30E-02
9.20E-02
9.70E-02
9.50E-02
30
9.10E-02
9.00E-02
9.20E-02
9.10E-02
9.10E-02
9.60E-02
9.40E-02
50
8.80E-02
8.70E-02
8.80E-02
8.80E-02
9.00E-02
9.70E-02
9.50E-02
100
8.10E-02
7.90E-02
8.10E-02
7.90E-02
8.40E-02
9.70E-02
9.50E-02
9.50E-02
1.58E-03
9.93E-02
9.07E-02
4.00E-01
PASS
9.32E-02
1.30E-03
9.68E-02
8.96E-02
4.00E-01
PASS
9.10E-02
7.07E-04
9.29E-02
8.91E-02
4.00E-01
PASS
8.82E-02
1.10E-03
9.12E-02
8.52E-02
4.00E-01
PASS
8.08E-02
2.05E-03
8.64E-02
7.52E-02
4.00E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
48
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
4.80E+00
4.70E+00
24_VOH0p2MA_D0 (V)
4.60E+00
4.50E+00
4.40E+00
4.30E+00
4.20E+00
4.10E+00
4.00E+00
3.90E+00
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.22. Plot of 24_VOH0p2MA_D0 (V) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
49
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.22. Raw data for 24_VOH0p2MA_D0 (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
24_VOH0p2MA_D0 (V)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.75E+00
10
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
30
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
50
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
100
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
1.79E-03
4.75E+00
4.74E+00
4.00E+00
PASS
4.74E+00
1.79E-03
4.75E+00
4.74E+00
4.00E+00
PASS
4.74E+00
2.19E-03
4.75E+00
4.74E+00
4.00E+00
PASS
4.74E+00
3.58E-03
4.75E+00
4.73E+00
4.00E+00
PASS
4.74E+00
2.19E-03
4.75E+00
4.74E+00
4.00E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
50
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
4.80E+00
4.70E+00
25_VOH0p2MA_D1 (V)
4.60E+00
4.50E+00
4.40E+00
4.30E+00
4.20E+00
4.10E+00
4.00E+00
3.90E+00
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.23. Plot of 25_VOH0p2MA_D1 (V) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
51
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.23. Raw data for 25_VOH0p2MA_D1 (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
25_VOH0p2MA_D1 (V)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
10
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
30
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
50
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
100
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
0.00E+00
4.74E+00
4.74E+00
4.00E+00
PASS
4.74E+00
2.19E-03
4.75E+00
4.74E+00
4.00E+00
PASS
4.74E+00
3.35E-03
4.75E+00
4.73E+00
4.00E+00
PASS
4.74E+00
1.79E-03
4.74E+00
4.73E+00
4.00E+00
PASS
4.74E+00
3.35E-03
4.75E+00
4.73E+00
4.00E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
52
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
4.80E+00
4.70E+00
26_VOH0p2MA_D2 (V)
4.60E+00
4.50E+00
4.40E+00
4.30E+00
4.20E+00
4.10E+00
4.00E+00
3.90E+00
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.24. Plot of 26_VOH0p2MA_D2 (V) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
53
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.24. Raw data for 26_VOH0p2MA_D2 (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
26_VOH0p2MA_D2 (V)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
10
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
30
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.75E+00
50
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
100
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
1.79E-03
4.75E+00
4.74E+00
4.00E+00
PASS
4.74E+00
1.79E-03
4.75E+00
4.74E+00
4.00E+00
PASS
4.74E+00
2.19E-03
4.75E+00
4.74E+00
4.00E+00
PASS
4.74E+00
2.83E-03
4.75E+00
4.73E+00
4.00E+00
PASS
4.74E+00
3.35E-03
4.75E+00
4.73E+00
4.00E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
54
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
4.80E+00
4.70E+00
27_VOH0p2MA_D3 (V)
4.60E+00
4.50E+00
4.40E+00
4.30E+00
4.20E+00
4.10E+00
4.00E+00
3.90E+00
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.25. Plot of 27_VOH0p2MA_D3 (V) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
55
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.25. Raw data for 27_VOH0p2MA_D3 (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
27_VOH0p2MA_D3 (V)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
10
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
30
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
50
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
100
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
1.79E-03
4.75E+00
4.74E+00
4.00E+00
PASS
4.74E+00
1.79E-03
4.75E+00
4.74E+00
4.00E+00
PASS
4.74E+00
2.19E-03
4.75E+00
4.74E+00
4.00E+00
PASS
4.74E+00
1.79E-03
4.74E+00
4.73E+00
4.00E+00
PASS
4.74E+00
2.19E-03
4.74E+00
4.73E+00
4.00E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
56
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
4.80E+00
4.70E+00
28_VOH0p2MA_D4 (V)
4.60E+00
4.50E+00
4.40E+00
4.30E+00
4.20E+00
4.10E+00
4.00E+00
3.90E+00
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.26. Plot of 28_VOH0p2MA_D4 (V) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
57
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.26. Raw data for 28_VOH0p2MA_D4 (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
28_VOH0p2MA_D4 (V)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
10
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
30
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
50
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
100
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
2.19E-03
4.75E+00
4.74E+00
4.00E+00
PASS
4.74E+00
1.79E-03
4.75E+00
4.74E+00
4.00E+00
PASS
4.74E+00
2.19E-03
4.75E+00
4.74E+00
4.00E+00
PASS
4.74E+00
2.19E-03
4.75E+00
4.73E+00
4.00E+00
PASS
4.74E+00
2.83E-03
4.75E+00
4.73E+00
4.00E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
58
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
4.80E+00
4.70E+00
29_VOH0p2MA_D5 (V)
4.60E+00
4.50E+00
4.40E+00
4.30E+00
4.20E+00
4.10E+00
4.00E+00
3.90E+00
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.27. Plot of 29_VOH0p2MA_D5 (V) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
59
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.27. Raw data for 29_VOH0p2MA_D5 (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
29_VOH0p2MA_D5 (V)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
10
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
30
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
50
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
100
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
1.79E-03
4.75E+00
4.74E+00
4.00E+00
PASS
4.74E+00
2.19E-03
4.75E+00
4.74E+00
4.00E+00
PASS
4.74E+00
1.79E-03
4.75E+00
4.74E+00
4.00E+00
PASS
4.74E+00
2.83E-03
4.75E+00
4.73E+00
4.00E+00
PASS
4.74E+00
2.83E-03
4.75E+00
4.73E+00
4.00E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
60
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
4.80E+00
4.70E+00
30_VOH0p2MA_D6 (V)
4.60E+00
4.50E+00
4.40E+00
4.30E+00
4.20E+00
4.10E+00
4.00E+00
3.90E+00
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.28. Plot of 30_VOH0p2MA_D6 (V) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
61
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.28. Raw data for 30_VOH0p2MA_D6 (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
30_VOH0p2MA_D6 (V)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
10
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
30
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
50
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
100
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
2.19E-03
4.75E+00
4.74E+00
4.00E+00
PASS
4.74E+00
2.19E-03
4.75E+00
4.74E+00
4.00E+00
PASS
4.74E+00
1.79E-03
4.75E+00
4.74E+00
4.00E+00
PASS
4.74E+00
2.19E-03
4.75E+00
4.73E+00
4.00E+00
PASS
4.74E+00
1.79E-03
4.75E+00
4.74E+00
4.00E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
62
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
4.80E+00
4.70E+00
31_VOH0p2MA_D7 (V)
4.60E+00
4.50E+00
4.40E+00
4.30E+00
4.20E+00
4.10E+00
4.00E+00
3.90E+00
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.29. Plot of 31_VOH0p2MA_D7 (V) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
63
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.29. Raw data for 31_VOH0p2MA_D7 (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
31_VOH0p2MA_D7 (V)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
10
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
30
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
50
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
100
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
1.79E-03
4.75E+00
4.74E+00
4.00E+00
PASS
4.74E+00
0.00E+00
4.74E+00
4.74E+00
4.00E+00
PASS
4.74E+00
1.79E-03
4.75E+00
4.74E+00
4.00E+00
PASS
4.74E+00
0.00E+00
4.74E+00
4.74E+00
4.00E+00
PASS
4.74E+00
3.35E-03
4.75E+00
4.73E+00
4.00E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
64
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
4.80E+00
4.70E+00
32_VOH0p2MA_D8 (V)
4.60E+00
4.50E+00
4.40E+00
4.30E+00
4.20E+00
4.10E+00
4.00E+00
3.90E+00
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.30. Plot of 32_VOH0p2MA_D8 (V) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
65
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.30. Raw data for 32_VOH0p2MA_D8 (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
32_VOH0p2MA_D8 (V)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
10
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
30
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
50
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
100
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
1.79E-03
4.75E+00
4.74E+00
4.00E+00
PASS
4.74E+00
2.19E-03
4.75E+00
4.74E+00
4.00E+00
PASS
4.74E+00
2.19E-03
4.75E+00
4.74E+00
4.00E+00
PASS
4.74E+00
2.19E-03
4.75E+00
4.74E+00
4.00E+00
PASS
4.74E+00
3.35E-03
4.75E+00
4.73E+00
4.00E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
66
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
4.80E+00
4.70E+00
33_VOH0p2MA_D9 (V)
4.60E+00
4.50E+00
4.40E+00
4.30E+00
4.20E+00
4.10E+00
4.00E+00
3.90E+00
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.31. Plot of 33_VOH0p2MA_D9 (V) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
67
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.31. Raw data for 33_VOH0p2MA_D9 (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
33_VOH0p2MA_D9 (V)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
10
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
30
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
50
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
100
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
0.00E+00
4.74E+00
4.74E+00
4.00E+00
PASS
4.74E+00
2.19E-03
4.75E+00
4.74E+00
4.00E+00
PASS
4.74E+00
1.79E-03
4.75E+00
4.74E+00
4.00E+00
PASS
4.74E+00
1.79E-03
4.75E+00
4.74E+00
4.00E+00
PASS
4.74E+00
1.79E-03
4.75E+00
4.74E+00
4.00E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
68
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
4.80E+00
4.70E+00
34_VOH0p2MA_D10 (V)
4.60E+00
4.50E+00
4.40E+00
4.30E+00
4.20E+00
4.10E+00
4.00E+00
3.90E+00
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.32. Plot of 34_VOH0p2MA_D10 (V) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
69
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.32. Raw data for 34_VOH0p2MA_D10 (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
34_VOH0p2MA_D10 (V)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
10
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
30
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
50
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
100
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
0.00E+00
4.74E+00
4.74E+00
4.00E+00
PASS
4.74E+00
1.79E-03
4.75E+00
4.74E+00
4.00E+00
PASS
4.74E+00
2.19E-03
4.75E+00
4.74E+00
4.00E+00
PASS
4.74E+00
1.79E-03
4.74E+00
4.73E+00
4.00E+00
PASS
4.74E+00
2.83E-03
4.75E+00
4.73E+00
4.00E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
70
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
4.80E+00
4.70E+00
35_VOH0p2MA_D11 (V)
4.60E+00
4.50E+00
4.40E+00
4.30E+00
4.20E+00
4.10E+00
4.00E+00
3.90E+00
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.33. Plot of 35_VOH0p2MA_D11 (V) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
71
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.33. Raw data for 35_VOH0p2MA_D11 (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
35_VOH0p2MA_D11 (V)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
10
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
30
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
50
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
100
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
2.19E-03
4.75E+00
4.74E+00
4.00E+00
PASS
4.74E+00
0.00E+00
4.74E+00
4.74E+00
4.00E+00
PASS
4.74E+00
2.19E-03
4.75E+00
4.74E+00
4.00E+00
PASS
4.74E+00
2.19E-03
4.75E+00
4.74E+00
4.00E+00
PASS
4.74E+00
2.83E-03
4.75E+00
4.73E+00
4.00E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
72
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
4.80E+00
4.70E+00
36_VOH0p2MA_D12 (V)
4.60E+00
4.50E+00
4.40E+00
4.30E+00
4.20E+00
4.10E+00
4.00E+00
3.90E+00
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.34. Plot of 36_VOH0p2MA_D12 (V) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
73
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.34. Raw data for 36_VOH0p2MA_D12 (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
36_VOH0p2MA_D12 (V)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
10
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
30
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
50
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
100
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
1.79E-03
4.75E+00
4.74E+00
4.00E+00
PASS
4.74E+00
0.00E+00
4.74E+00
4.74E+00
4.00E+00
PASS
4.74E+00
0.00E+00
4.74E+00
4.74E+00
4.00E+00
PASS
4.74E+00
2.19E-03
4.75E+00
4.73E+00
4.00E+00
PASS
4.74E+00
2.19E-03
4.75E+00
4.74E+00
4.00E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
74
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
4.80E+00
4.70E+00
37_VOH0p2MA_BUSY (V)
4.60E+00
4.50E+00
4.40E+00
4.30E+00
4.20E+00
4.10E+00
4.00E+00
3.90E+00
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.35. Plot of 37_VOH0p2MA_BUSY (V) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
75
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.35. Raw data for 37_VOH0p2MA_BUSY (V) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
37_VOH0p2MA_BUSY (V)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
10
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
30
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
50
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
100
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
1.79E-03
4.75E+00
4.74E+00
4.00E+00
PASS
4.74E+00
0.00E+00
4.74E+00
4.74E+00
4.00E+00
PASS
4.74E+00
1.79E-03
4.75E+00
4.74E+00
4.00E+00
PASS
4.74E+00
2.19E-03
4.75E+00
4.73E+00
4.00E+00
PASS
4.74E+00
2.19E-03
4.75E+00
4.74E+00
4.00E+00
PASS
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Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
4.80E+00
4.70E+00
38_VOH0p2MA_D13 (V)
4.60E+00
4.50E+00
4.40E+00
4.30E+00
4.20E+00
4.10E+00
4.00E+00
3.90E+00
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.36. Plot of 38_VOH0p2MA_D13 (V) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
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Table 5.36. Raw data for 38_VOH0p2MA_D13 (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
38_VOH0p2MA_D13 (V)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
10
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
30
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
50
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
100
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
4.74E+00
2.19E-03
4.75E+00
4.74E+00
4.00E+00
PASS
4.74E+00
0.00E+00
4.74E+00
4.74E+00
4.00E+00
PASS
4.74E+00
1.79E-03
4.75E+00
4.74E+00
4.00E+00
PASS
4.74E+00
2.19E-03
4.75E+00
4.73E+00
4.00E+00
PASS
4.74E+00
1.79E-03
4.74E+00
4.73E+00
4.00E+00
PASS
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Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
1.50E-05
39_IOZHVO=5V_D0 (A)
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.37. Plot of 39_IOZHVO=5V_D0 (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
79
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RLAT Final Report
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Table 5.37. Raw data for 39_IOZHVO=5V_D0 (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
39_IOZHVO=5V_D0 (A)
Device
10
5.60E-08
4.90E-08
5.10E-08
5.00E-08
5.00E-08
4.80E-08
4.90E-08
30
5.10E-08
4.90E-08
4.70E-08
5.00E-08
5.00E-08
4.70E-08
4.60E-08
50
5.50E-08
5.00E-08
5.00E-08
4.80E-08
4.80E-08
4.60E-08
5.00E-08
100
5.10E-08
5.10E-08
4.90E-08
5.20E-08
5.20E-08
5.00E-08
5.00E-08
Biased Statistics
Average Biased
5.06E-08 5.12E-08
Std Dev Biased
3.58E-09 2.77E-09
Ps90%/90% (+KTL) Biased 6.04E-08 5.88E-08
Ps90%/90% (-KTL) Biased
4.08E-08 4.36E-08
Specification MIN
-1.00E-05 -1.00E-05
Status
PASS
PASS
Specification MAX
1.00E-05 1.00E-05
Status
PASS
PASS
4.94E-08
1.52E-09
5.36E-08
4.52E-08
-1.00E-05
PASS
1.00E-05
PASS
5.02E-08
2.86E-09
5.81E-08
4.23E-08
-1.00E-05
PASS
1.00E-05
PASS
5.10E-08
1.22E-09
5.44E-08
4.76E-08
-1.00E-05
PASS
1.00E-05
PASS
31
32
34
35
36
1
2
0
5.60E-08
5.10E-08
5.00E-08
4.60E-08
5.00E-08
4.90E-08
5.20E-08
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Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
1.50E-05
40_IOZHVO=5V_D1 (A)
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.38. Plot of 40_IOZHVO=5V_D1 (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
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Table 5.38. Raw data for 40_IOZHVO=5V_D1 (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
40_IOZHVO=5V_D1 (A)
Device
10
7.00E-08
7.10E-08
6.80E-08
6.80E-08
6.70E-08
6.50E-08
6.40E-08
30
6.50E-08
6.50E-08
6.50E-08
6.60E-08
6.30E-08
6.20E-08
6.50E-08
50
6.80E-08
6.50E-08
6.80E-08
6.60E-08
6.40E-08
6.30E-08
6.40E-08
100
6.30E-08
6.40E-08
6.60E-08
6.60E-08
6.60E-08
6.70E-08
6.50E-08
Biased Statistics
Average Biased
6.72E-08 6.88E-08
Std Dev Biased
8.37E-10 1.64E-09
Ps90%/90% (+KTL) Biased 6.95E-08 7.33E-08
Ps90%/90% (-KTL) Biased
6.49E-08 6.43E-08
Specification MIN
-1.00E-05 -1.00E-05
Status
PASS
PASS
Specification MAX
1.00E-05 1.00E-05
Status
PASS
PASS
6.48E-08
1.10E-09
6.78E-08
6.18E-08
-1.00E-05
PASS
1.00E-05
PASS
6.62E-08
1.79E-09
7.11E-08
6.13E-08
-1.00E-05
PASS
1.00E-05
PASS
6.50E-08
1.41E-09
6.89E-08
6.11E-08
-1.00E-05
PASS
1.00E-05
PASS
31
32
34
35
36
1
2
0
6.70E-08
6.80E-08
6.60E-08
6.70E-08
6.80E-08
6.50E-08
6.90E-08
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Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
1.50E-05
41_IOZHVO=5V_D2 (A)
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.39. Plot of 41_IOZHVO=5V_D2 (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
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Table 5.39. Raw data for 41_IOZHVO=5V_D2 (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
41_IOZHVO=5V_D2 (A)
Device
10
7.30E-08
7.30E-08
7.50E-08
7.50E-08
7.00E-08
7.10E-08
6.80E-08
30
6.90E-08
6.80E-08
6.70E-08
6.90E-08
6.80E-08
6.90E-08
6.90E-08
50
7.20E-08
6.90E-08
6.70E-08
7.10E-08
7.20E-08
7.00E-08
6.70E-08
100
6.70E-08
6.80E-08
6.80E-08
7.00E-08
7.00E-08
7.20E-08
7.10E-08
Biased Statistics
Average Biased
7.02E-08 7.32E-08
Std Dev Biased
1.64E-09 2.05E-09
Ps90%/90% (+KTL) Biased 7.47E-08 7.88E-08
Ps90%/90% (-KTL) Biased
6.57E-08 6.76E-08
Specification MIN
-1.00E-05 -1.00E-05
Status
PASS
PASS
Specification MAX
1.00E-05 1.00E-05
Status
PASS
PASS
6.82E-08
8.37E-10
7.05E-08
6.59E-08
-1.00E-05
PASS
1.00E-05
PASS
7.02E-08
2.17E-09
7.61E-08
6.43E-08
-1.00E-05
PASS
1.00E-05
PASS
6.86E-08
1.34E-09
7.23E-08
6.49E-08
-1.00E-05
PASS
1.00E-05
PASS
31
32
34
35
36
1
2
0
6.90E-08
7.00E-08
6.90E-08
7.30E-08
7.00E-08
7.20E-08
7.10E-08
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Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
1.50E-05
42_IOZHVO=5V_D3 (A)
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.40. Plot of 42_IOZHVO=5V_D3 (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
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Table 5.40. Raw data for 42_IOZHVO=5V_D3 (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
42_IOZHVO=5V_D3 (A)
Device
10
7.60E-08
7.60E-08
7.30E-08
7.70E-08
7.30E-08
7.20E-08
7.00E-08
30
7.10E-08
7.40E-08
6.90E-08
7.30E-08
7.00E-08
6.90E-08
7.20E-08
50
7.60E-08
7.40E-08
7.20E-08
7.30E-08
7.30E-08
6.90E-08
6.90E-08
100
7.30E-08
7.60E-08
7.10E-08
7.10E-08
7.20E-08
7.30E-08
7.40E-08
Biased Statistics
Average Biased
7.32E-08 7.50E-08
Std Dev Biased
1.64E-09 1.87E-09
Ps90%/90% (+KTL) Biased 7.77E-08 8.01E-08
Ps90%/90% (-KTL) Biased
6.87E-08 6.99E-08
Specification MIN
-1.00E-05 -1.00E-05
Status
PASS
PASS
Specification MAX
1.00E-05 1.00E-05
Status
PASS
PASS
7.14E-08
2.07E-09
7.71E-08
6.57E-08
-1.00E-05
PASS
1.00E-05
PASS
7.36E-08
1.52E-09
7.78E-08
6.94E-08
-1.00E-05
PASS
1.00E-05
PASS
7.26E-08
2.07E-09
7.83E-08
6.69E-08
-1.00E-05
PASS
1.00E-05
PASS
31
32
34
35
36
1
2
0
7.60E-08
7.30E-08
7.20E-08
7.30E-08
7.20E-08
7.20E-08
7.30E-08
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Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
1.50E-05
43_IOZHVO=5V_D4 (A)
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.41. Plot of 43_IOZHVO=5V_D4 (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
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Table 5.41. Raw data for 43_IOZHVO=5V_D4 (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
43_IOZHVO=5V_D4 (A)
Device
10
7.80E-08
7.70E-08
7.80E-08
8.00E-08
7.50E-08
7.30E-08
7.40E-08
30
7.20E-08
7.10E-08
7.40E-08
7.10E-08
7.10E-08
7.10E-08
7.10E-08
50
7.40E-08
7.50E-08
7.60E-08
7.30E-08
7.30E-08
7.10E-08
7.40E-08
100
7.30E-08
7.50E-08
7.30E-08
7.40E-08
7.40E-08
7.60E-08
7.50E-08
Biased Statistics
Average Biased
7.56E-08 7.76E-08
Std Dev Biased
1.52E-09 1.82E-09
Ps90%/90% (+KTL) Biased 7.98E-08 8.26E-08
Ps90%/90% (-KTL) Biased
7.14E-08 7.26E-08
Specification MIN
-1.00E-05 -1.00E-05
Status
PASS
PASS
Specification MAX
1.00E-05 1.00E-05
Status
PASS
PASS
7.18E-08
1.30E-09
7.54E-08
6.82E-08
-1.00E-05
PASS
1.00E-05
PASS
7.42E-08
1.30E-09
7.78E-08
7.06E-08
-1.00E-05
PASS
1.00E-05
PASS
7.38E-08
8.37E-10
7.61E-08
7.15E-08
-1.00E-05
PASS
1.00E-05
PASS
31
32
34
35
36
1
2
0
7.50E-08
7.80E-08
7.40E-08
7.60E-08
7.50E-08
7.40E-08
7.60E-08
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Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
1.50E-05
44_IOZHVO=5V_D5 (A)
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.42. Plot of 44_IOZHVO=5V_D5 (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
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Table 5.42. Raw data for 44_IOZHVO=5V_D5 (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
44_IOZHVO=5V_D5 (A)
Device
10
7.80E-08
7.70E-08
7.40E-08
7.70E-08
7.40E-08
7.20E-08
7.20E-08
30
7.10E-08
7.10E-08
6.90E-08
7.00E-08
7.20E-08
7.00E-08
7.00E-08
50
7.60E-08
7.40E-08
7.60E-08
7.20E-08
7.40E-08
6.80E-08
7.20E-08
100
7.00E-08
7.40E-08
7.10E-08
7.00E-08
7.30E-08
7.40E-08
7.20E-08
Biased Statistics
Average Biased
7.38E-08 7.60E-08
Std Dev Biased
2.49E-09 1.87E-09
Ps90%/90% (+KTL) Biased 8.06E-08 8.11E-08
Ps90%/90% (-KTL) Biased
6.70E-08 7.09E-08
Specification MIN
-1.00E-05 -1.00E-05
Status
PASS
PASS
Specification MAX
1.00E-05 1.00E-05
Status
PASS
PASS
7.06E-08
1.14E-09
7.37E-08
6.75E-08
-1.00E-05
PASS
1.00E-05
PASS
7.44E-08
1.67E-09
7.90E-08
6.98E-08
-1.00E-05
PASS
1.00E-05
PASS
7.16E-08
1.82E-09
7.66E-08
6.66E-08
-1.00E-05
PASS
1.00E-05
PASS
31
32
34
35
36
1
2
0
7.20E-08
7.80E-08
7.40E-08
7.30E-08
7.20E-08
7.20E-08
7.40E-08
An ISO 9001:2008 and DSCC Certified Company
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Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
1.50E-05
45_IOZHVO=5V_D6 (A)
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.43. Plot of 45_IOZHVO=5V_D6 (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
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Table 5.43. Raw data for 45_IOZHVO=5V_D6 (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
45_IOZHVO=5V_D6 (A)
Device
10
8.00E-08
7.70E-08
7.80E-08
7.60E-08
7.60E-08
7.30E-08
7.20E-08
30
7.30E-08
7.40E-08
7.20E-08
7.30E-08
7.20E-08
7.10E-08
7.20E-08
50
7.50E-08
7.20E-08
7.60E-08
7.30E-08
7.40E-08
7.00E-08
7.10E-08
100
7.30E-08
7.40E-08
7.30E-08
7.60E-08
7.30E-08
7.40E-08
7.60E-08
Biased Statistics
Average Biased
7.46E-08 7.74E-08
Std Dev Biased
5.48E-10 1.67E-09
Ps90%/90% (+KTL) Biased 7.61E-08 8.20E-08
Ps90%/90% (-KTL) Biased
7.31E-08 7.28E-08
Specification MIN
-1.00E-05 -1.00E-05
Status
PASS
PASS
Specification MAX
1.00E-05 1.00E-05
Status
PASS
PASS
7.28E-08
8.37E-10
7.51E-08
7.05E-08
-1.00E-05
PASS
1.00E-05
PASS
7.40E-08
1.58E-09
7.83E-08
6.97E-08
-1.00E-05
PASS
1.00E-05
PASS
7.38E-08
1.30E-09
7.74E-08
7.02E-08
-1.00E-05
PASS
1.00E-05
PASS
31
32
34
35
36
1
2
0
7.40E-08
7.50E-08
7.40E-08
7.50E-08
7.50E-08
7.40E-08
7.50E-08
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Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
1.50E-05
46_IOZHVO=5V_D7 (A)
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.44. Plot of 46_IOZHVO=5V_D7 (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
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Table 5.44. Raw data for 46_IOZHVO=5V_D7 (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
46_IOZHVO=5V_D7 (A)
Device
10
7.90E-08
8.20E-08
8.20E-08
7.90E-08
7.90E-08
7.60E-08
7.60E-08
30
7.40E-08
7.70E-08
7.30E-08
7.60E-08
7.50E-08
7.30E-08
7.20E-08
50
7.70E-08
7.70E-08
7.30E-08
7.50E-08
7.40E-08
7.10E-08
7.30E-08
100
7.50E-08
7.50E-08
7.60E-08
7.40E-08
7.50E-08
7.70E-08
7.50E-08
Biased Statistics
Average Biased
7.50E-08 8.02E-08
Std Dev Biased
1.00E-09 1.64E-09
Ps90%/90% (+KTL) Biased 7.77E-08 8.47E-08
Ps90%/90% (-KTL) Biased
7.23E-08 7.57E-08
Specification MIN
-1.00E-05 -1.00E-05
Status
PASS
PASS
Specification MAX
1.00E-05 1.00E-05
Status
PASS
PASS
7.50E-08
1.58E-09
7.93E-08
7.07E-08
-1.00E-05
PASS
1.00E-05
PASS
7.52E-08
1.79E-09
8.01E-08
7.03E-08
-1.00E-05
PASS
1.00E-05
PASS
7.50E-08
7.07E-10
7.69E-08
7.31E-08
-1.00E-05
PASS
1.00E-05
PASS
31
32
34
35
36
1
2
0
7.50E-08
7.60E-08
7.40E-08
7.60E-08
7.40E-08
7.60E-08
7.80E-08
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Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
1.50E-05
47_IOZHVO=5V_D8 (A)
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.45. Plot of 47_IOZHVO=5V_D8 (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
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Table 5.45. Raw data for 47_IOZHVO=5V_D8 (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
47_IOZHVO=5V_D8 (A)
Device
10
7.70E-08
7.70E-08
7.80E-08
7.70E-08
7.50E-08
7.20E-08
7.50E-08
30
7.40E-08
7.10E-08
7.20E-08
7.10E-08
7.10E-08
6.90E-08
7.10E-08
50
7.60E-08
7.40E-08
7.30E-08
7.20E-08
7.30E-08
6.90E-08
6.90E-08
100
7.30E-08
7.20E-08
7.10E-08
7.20E-08
7.20E-08
7.40E-08
7.20E-08
Biased Statistics
Average Biased
7.40E-08 7.68E-08
Std Dev Biased
1.58E-09 1.10E-09
Ps90%/90% (+KTL) Biased 7.83E-08 7.98E-08
Ps90%/90% (-KTL) Biased
6.97E-08 7.38E-08
Specification MIN
-1.00E-05 -1.00E-05
Status
PASS
PASS
Specification MAX
1.00E-05 1.00E-05
Status
PASS
PASS
7.18E-08
1.30E-09
7.54E-08
6.82E-08
-1.00E-05
PASS
1.00E-05
PASS
7.36E-08
1.52E-09
7.78E-08
6.94E-08
-1.00E-05
PASS
1.00E-05
PASS
7.20E-08
7.07E-10
7.39E-08
7.01E-08
-1.00E-05
PASS
1.00E-05
PASS
31
32
34
35
36
1
2
0
7.30E-08
7.40E-08
7.20E-08
7.60E-08
7.50E-08
7.50E-08
7.20E-08
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Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
1.50E-05
48_IOZHVO=5V_D9 (A)
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.46. Plot of 48_IOZHVO=5V_D9 (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
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Table 5.46. Raw data for 48_IOZHVO=5V_D9 (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
48_IOZHVO=5V_D9 (A)
Device
10
7.90E-08
8.00E-08
7.80E-08
7.60E-08
7.50E-08
7.40E-08
7.30E-08
30
7.30E-08
7.20E-08
7.20E-08
7.30E-08
7.30E-08
7.40E-08
7.30E-08
50
7.50E-08
7.30E-08
7.30E-08
7.40E-08
7.50E-08
7.20E-08
7.40E-08
100
7.30E-08
7.50E-08
7.30E-08
7.60E-08
7.30E-08
7.50E-08
7.30E-08
Biased Statistics
Average Biased
7.48E-08 7.76E-08
Std Dev Biased
1.10E-09 2.07E-09
Ps90%/90% (+KTL) Biased 7.78E-08 8.33E-08
Ps90%/90% (-KTL) Biased
7.18E-08 7.19E-08
Specification MIN
-1.00E-05 -1.00E-05
Status
PASS
PASS
Specification MAX
1.00E-05 1.00E-05
Status
PASS
PASS
7.26E-08
5.48E-10
7.41E-08
7.11E-08
-1.00E-05
PASS
1.00E-05
PASS
7.40E-08
1.00E-09
7.67E-08
7.13E-08
-1.00E-05
PASS
1.00E-05
PASS
7.40E-08
1.41E-09
7.79E-08
7.01E-08
-1.00E-05
PASS
1.00E-05
PASS
31
32
34
35
36
1
2
0
7.40E-08
7.60E-08
7.60E-08
7.40E-08
7.40E-08
7.50E-08
7.60E-08
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Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
1.50E-05
49_IOZHVO=5V_D10 (A)
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.47. Plot of 49_IOZHVO=5V_D10 (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
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Table 5.47. Raw data for 49_IOZHVO=5V_D10 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
49_IOZHVO=5V_D10 (A)
Device
10
8.00E-08
7.90E-08
7.80E-08
7.80E-08
7.60E-08
7.30E-08
7.40E-08
30
7.30E-08
7.20E-08
7.40E-08
7.10E-08
7.20E-08
7.10E-08
7.00E-08
50
7.70E-08
7.30E-08
7.60E-08
7.50E-08
7.40E-08
6.90E-08
7.10E-08
100
7.40E-08
7.40E-08
7.20E-08
7.30E-08
7.30E-08
7.50E-08
7.30E-08
Biased Statistics
Average Biased
7.44E-08 7.82E-08
Std Dev Biased
5.48E-10 1.48E-09
Ps90%/90% (+KTL) Biased 7.59E-08 8.23E-08
Ps90%/90% (-KTL) Biased
7.29E-08 7.41E-08
Specification MIN
-1.00E-05 -1.00E-05
Status
PASS
PASS
Specification MAX
1.00E-05 1.00E-05
Status
PASS
PASS
7.24E-08
1.14E-09
7.55E-08
6.93E-08
-1.00E-05
PASS
1.00E-05
PASS
7.50E-08
1.58E-09
7.93E-08
7.07E-08
-1.00E-05
PASS
1.00E-05
PASS
7.32E-08
8.37E-10
7.55E-08
7.09E-08
-1.00E-05
PASS
1.00E-05
PASS
31
32
34
35
36
1
2
0
7.50E-08
7.40E-08
7.50E-08
7.40E-08
7.40E-08
7.50E-08
7.50E-08
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Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
1.50E-05
50_IOZHVO=5V_D11 (A)
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.48. Plot of 50_IOZHVO=5V_D11 (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
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Table 5.48. Raw data for 50_IOZHVO=5V_D11 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
50_IOZHVO=5V_D11 (A)
Device
10
7.90E-08
7.90E-08
7.90E-08
7.50E-08
7.50E-08
7.30E-08
7.50E-08
30
7.10E-08
7.40E-08
7.40E-08
7.30E-08
7.00E-08
7.00E-08
6.90E-08
50
7.90E-08
7.50E-08
7.60E-08
7.20E-08
7.30E-08
6.90E-08
7.40E-08
100
7.20E-08
7.40E-08
7.40E-08
7.60E-08
7.30E-08
7.50E-08
7.20E-08
Biased Statistics
Average Biased
7.56E-08 7.74E-08
Std Dev Biased
1.52E-09 2.19E-09
Ps90%/90% (+KTL) Biased 7.98E-08 8.34E-08
Ps90%/90% (-KTL) Biased
7.14E-08 7.14E-08
Specification MIN
-1.00E-05 -1.00E-05
Status
PASS
PASS
Specification MAX
1.00E-05 1.00E-05
Status
PASS
PASS
7.24E-08
1.82E-09
7.74E-08
6.74E-08
-1.00E-05
PASS
1.00E-05
PASS
7.50E-08
2.74E-09
8.25E-08
6.75E-08
-1.00E-05
PASS
1.00E-05
PASS
7.38E-08
1.48E-09
7.79E-08
6.97E-08
-1.00E-05
PASS
1.00E-05
PASS
31
32
34
35
36
1
2
0
7.70E-08
7.60E-08
7.30E-08
7.60E-08
7.60E-08
7.40E-08
7.50E-08
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Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
1.50E-05
51_IOZHVO=5V_D12 (A)
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.49. Plot of 51_IOZHVO=5V_D12 (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
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Table 5.49. Raw data for 51_IOZHVO=5V_D12 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
51_IOZHVO=5V_D12 (A)
Device
10
7.80E-08
7.70E-08
7.50E-08
7.40E-08
7.40E-08
7.40E-08
7.40E-08
30
7.30E-08
7.40E-08
7.40E-08
7.30E-08
7.00E-08
7.10E-08
7.20E-08
50
7.50E-08
7.50E-08
7.30E-08
7.70E-08
7.30E-08
7.20E-08
7.10E-08
100
7.20E-08
7.20E-08
7.40E-08
7.30E-08
7.30E-08
7.70E-08
7.60E-08
Biased Statistics
Average Biased
7.52E-08 7.56E-08
Std Dev Biased
1.30E-09 1.82E-09
Ps90%/90% (+KTL) Biased 7.88E-08 8.06E-08
Ps90%/90% (-KTL) Biased
7.16E-08 7.06E-08
Specification MIN
-1.00E-05 -1.00E-05
Status
PASS
PASS
Specification MAX
1.00E-05 1.00E-05
Status
PASS
PASS
7.28E-08
1.64E-09
7.73E-08
6.83E-08
-1.00E-05
PASS
1.00E-05
PASS
7.46E-08
1.67E-09
7.92E-08
7.00E-08
-1.00E-05
PASS
1.00E-05
PASS
7.28E-08
8.37E-10
7.51E-08
7.05E-08
-1.00E-05
PASS
1.00E-05
PASS
31
32
34
35
36
1
2
0
7.70E-08
7.40E-08
7.50E-08
7.60E-08
7.40E-08
7.60E-08
7.20E-08
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Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
1.50E-04
52_IOZHVO=5V_D13 (A)
1.00E-04
5.00E-05
0.00E+00
-5.00E-05
-1.00E-04
-1.50E-04
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.50. Plot of 52_IOZHVO=5V_D13 (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
105
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.50. Raw data for 52_IOZHVO=5V_D13 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
52_IOZHVO=5V_D13 (A)
Device
10
7.90E-08
7.60E-08
7.60E-08
7.60E-08
7.30E-08
7.20E-08
7.40E-08
30
7.20E-08
7.10E-08
7.00E-08
7.10E-08
7.00E-08
6.90E-08
6.90E-08
50
7.60E-08
7.20E-08
7.20E-08
7.30E-08
7.10E-08
6.90E-08
7.00E-08
100
4.20E-05
1.27E-05
1.53E-05
1.23E-05
7.10E-08
7.40E-08
7.20E-08
Biased Statistics
Average Biased
7.42E-08 7.60E-08
Std Dev Biased
1.92E-09 2.12E-09
Ps90%/90% (+KTL) Biased 7.95E-08 8.18E-08
Ps90%/90% (-KTL) Biased
6.89E-08 7.02E-08
Specification MIN
-1.00E-05 -1.00E-05
Status
PASS
PASS
Specification MAX
1.00E-05 1.00E-05
Status
PASS
PASS
7.08E-08
8.37E-10
7.31E-08
6.85E-08
-1.00E-05
PASS
1.00E-05
PASS
7.28E-08
1.92E-09
7.81E-08
6.75E-08
-1.00E-05
PASS
1.00E-05
PASS
1.65E-05
1.54E-05
5.87E-05
-2.58E-05
-1.00E-04
PASS
1.00E-04
PASS
31
32
34
35
36
1
2
0
7.40E-08
7.50E-08
7.30E-08
7.70E-08
7.20E-08
7.30E-08
7.40E-08
An ISO 9001:2008 and DSCC Certified Company
106
Radiation Assured Devices
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Colorado Springs, CO 80919
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RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
1.50E-05
53_IOZLVO=0V_D0 (A)
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.51. Plot of 53_IOZLVO=0V_D0 (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
107
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.51. Raw data for 53_IOZLVO=0V_D0 (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
53_IOZLVO=0V_D0 (A)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
-7.70E-08
-7.70E-08
-7.60E-08
-7.70E-08
-7.80E-08
-7.80E-08
-7.60E-08
10
-8.20E-08
-8.50E-08
-8.30E-08
-8.40E-08
-8.50E-08
-8.60E-08
-8.50E-08
30
-9.10E-08
-8.60E-08
-8.60E-08
-8.80E-08
-8.80E-08
-9.20E-08
-8.90E-08
50
-8.80E-08
-8.70E-08
-8.80E-08
-8.90E-08
-8.70E-08
-8.90E-08
-8.40E-08
100
-9.50E-08
-9.00E-08
-8.80E-08
-9.10E-08
-8.80E-08
-8.90E-08
-8.40E-08
-7.70E-08
7.07E-10
-7.51E-08
-7.89E-08
-1.00E-05
PASS
1.00E-05
PASS
-8.38E-08
1.30E-09
-8.02E-08
-8.74E-08
-1.00E-05
PASS
1.00E-05
PASS
-8.78E-08
2.05E-09
-8.22E-08
-9.34E-08
-1.00E-05
PASS
1.00E-05
PASS
-8.78E-08
8.37E-10
-8.55E-08
-9.01E-08
-1.00E-05
PASS
1.00E-05
PASS
-9.04E-08
2.88E-09
-8.25E-08
-9.83E-08
-1.00E-05
PASS
1.00E-05
PASS
An ISO 9001:2008 and DSCC Certified Company
108
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
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RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
1.50E-05
54_IOZLVO=0V_D1 (A)
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.52. Plot of 54_IOZLVO=0V_D1 (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
109
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.52. Raw data for 54_IOZLVO=0V_D1 (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
54_IOZLVO=0V_D1 (A)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
-7.90E-08
-7.80E-08
-7.90E-08
-7.90E-08
-7.70E-08
-8.10E-08
-8.00E-08
10
-8.50E-08
-8.60E-08
-8.50E-08
-8.50E-08
-8.60E-08
-9.00E-08
-8.70E-08
30
-9.30E-08
-8.80E-08
-9.00E-08
-9.10E-08
-8.80E-08
-9.40E-08
-8.90E-08
50
-9.00E-08
-9.10E-08
-9.00E-08
-9.00E-08
-9.00E-08
-9.20E-08
-9.00E-08
100
-1.05E-07
-9.20E-08
-9.40E-08
-9.00E-08
-9.10E-08
-9.20E-08
-8.90E-08
-7.84E-08
8.94E-10
-7.59E-08
-8.09E-08
-1.00E-05
PASS
1.00E-05
PASS
-8.54E-08
5.48E-10
-8.39E-08
-8.69E-08
-1.00E-05
PASS
1.00E-05
PASS
-9.00E-08
2.12E-09
-8.42E-08
-9.58E-08
-1.00E-05
PASS
1.00E-05
PASS
-9.02E-08
4.47E-10
-8.90E-08
-9.14E-08
-1.00E-05
PASS
1.00E-05
PASS
-9.44E-08
6.11E-09
-7.77E-08
-1.11E-07
-1.00E-05
PASS
1.00E-05
PASS
An ISO 9001:2008 and DSCC Certified Company
110
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
1.50E-05
55_IOZLVO=0V_D2 (A)
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.53. Plot of 55_IOZLVO=0V_D2 (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
111
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.53. Raw data for 55_IOZLVO=0V_D2 (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
55_IOZLVO=0V_D2 (A)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
-7.70E-08
-7.80E-08
-7.60E-08
-7.60E-08
-7.70E-08
-7.80E-08
-7.60E-08
10
-8.50E-08
-8.50E-08
-8.40E-08
-8.30E-08
-8.40E-08
-8.70E-08
-8.50E-08
30
-9.10E-08
-8.70E-08
-8.60E-08
-8.70E-08
-8.80E-08
-9.30E-08
-8.70E-08
50
-8.80E-08
-8.70E-08
-8.70E-08
-8.80E-08
-9.00E-08
-9.00E-08
-8.70E-08
100
-1.05E-07
-8.80E-08
-8.90E-08
-9.00E-08
-8.60E-08
-8.80E-08
-8.60E-08
-7.68E-08
8.37E-10
-7.45E-08
-7.91E-08
-1.00E-05
PASS
1.00E-05
PASS
-8.42E-08
8.37E-10
-8.19E-08
-8.65E-08
-1.00E-05
PASS
1.00E-05
PASS
-8.78E-08
1.92E-09
-8.25E-08
-9.31E-08
-1.00E-05
PASS
1.00E-05
PASS
-8.80E-08
1.22E-09
-8.46E-08
-9.14E-08
-1.00E-05
PASS
1.00E-05
PASS
-9.16E-08
7.64E-09
-7.07E-08
-1.13E-07
-1.00E-05
PASS
1.00E-05
PASS
An ISO 9001:2008 and DSCC Certified Company
112
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
1.50E-05
56_IOZLVO=0V_D3 (A)
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.54. Plot of 56_IOZLVO=0V_D3 (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
113
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.54. Raw data for 56_IOZLVO=0V_D3 (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
56_IOZLVO=0V_D3 (A)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
-7.90E-08
-7.90E-08
-7.80E-08
-7.70E-08
-7.90E-08
-8.20E-08
-7.60E-08
10
-8.80E-08
-8.70E-08
-8.70E-08
-8.50E-08
-8.70E-08
-9.00E-08
-8.70E-08
30
-9.20E-08
-9.10E-08
-8.80E-08
-9.00E-08
-8.80E-08
-9.30E-08
-9.10E-08
50
-9.10E-08
-8.80E-08
-9.10E-08
-9.00E-08
-9.20E-08
-9.20E-08
-8.70E-08
100
-1.05E-07
-9.30E-08
-9.20E-08
-9.20E-08
-9.00E-08
-9.20E-08
-8.70E-08
-7.84E-08
8.94E-10
-7.59E-08
-8.09E-08
-1.00E-05
PASS
1.00E-05
PASS
-8.68E-08
1.10E-09
-8.38E-08
-8.98E-08
-1.00E-05
PASS
1.00E-05
PASS
-8.98E-08
1.79E-09
-8.49E-08
-9.47E-08
-1.00E-05
PASS
1.00E-05
PASS
-9.04E-08
1.52E-09
-8.62E-08
-9.46E-08
-1.00E-05
PASS
1.00E-05
PASS
-9.44E-08
6.02E-09
-7.79E-08
-1.11E-07
-1.00E-05
PASS
1.00E-05
PASS
An ISO 9001:2008 and DSCC Certified Company
114
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
1.50E-05
57_IOZLVO=0V_D4 (A)
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.55. Plot of 57_IOZLVO=0V_D4 (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
115
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.55. Raw data for 57_IOZLVO=0V_D4 (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
57_IOZLVO=0V_D4 (A)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
-7.70E-08
-7.90E-08
-7.80E-08
-7.80E-08
-7.90E-08
-7.80E-08
-7.50E-08
10
-8.50E-08
-8.70E-08
-8.60E-08
-8.50E-08
-8.70E-08
-8.80E-08
-8.70E-08
30
-9.20E-08
-8.70E-08
-8.80E-08
-8.90E-08
-8.90E-08
-9.30E-08
-9.10E-08
50
-9.10E-08
-9.00E-08
-9.10E-08
-9.00E-08
-8.70E-08
-9.10E-08
-8.80E-08
100
-1.06E-07
-9.30E-08
-9.40E-08
-9.30E-08
-8.70E-08
-9.00E-08
-8.60E-08
-7.82E-08
8.37E-10
-7.59E-08
-8.05E-08
-1.00E-05
PASS
1.00E-05
PASS
-8.60E-08
1.00E-09
-8.33E-08
-8.87E-08
-1.00E-05
PASS
1.00E-05
PASS
-8.90E-08
1.87E-09
-8.39E-08
-9.41E-08
-1.00E-05
PASS
1.00E-05
PASS
-8.98E-08
1.64E-09
-8.53E-08
-9.43E-08
-1.00E-05
PASS
1.00E-05
PASS
-9.46E-08
6.95E-09
-7.55E-08
-1.14E-07
-1.00E-05
PASS
1.00E-05
PASS
An ISO 9001:2008 and DSCC Certified Company
116
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
1.50E-05
58_IOZLVO=0V_D5 (A)
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.56. Plot of 58_IOZLVO=0V_D5 (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
117
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.56. Raw data for 58_IOZLVO=0V_D5 (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
58_IOZLVO=0V_D5 (A)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
-7.10E-08
-7.30E-08
-7.00E-08
-7.40E-08
-7.30E-08
-7.40E-08
-7.30E-08
10
-7.90E-08
-7.90E-08
-7.90E-08
-8.10E-08
-7.90E-08
-8.20E-08
-8.00E-08
30
-8.70E-08
-8.30E-08
-8.20E-08
-8.40E-08
-8.40E-08
-8.60E-08
-8.50E-08
50
-8.50E-08
-8.10E-08
-8.20E-08
-8.50E-08
-8.30E-08
-8.70E-08
-8.30E-08
100
-1.01E-07
-8.60E-08
-8.80E-08
-8.80E-08
-8.40E-08
-8.60E-08
-8.20E-08
-7.22E-08
1.64E-09
-6.77E-08
-7.67E-08
-1.00E-05
PASS
1.00E-05
PASS
-7.94E-08
8.94E-10
-7.69E-08
-8.19E-08
-1.00E-05
PASS
1.00E-05
PASS
-8.40E-08
1.87E-09
-7.89E-08
-8.91E-08
-1.00E-05
PASS
1.00E-05
PASS
-8.32E-08
1.79E-09
-7.83E-08
-8.81E-08
-1.00E-05
PASS
1.00E-05
PASS
-8.94E-08
6.69E-09
-7.10E-08
-1.08E-07
-1.00E-05
PASS
1.00E-05
PASS
An ISO 9001:2008 and DSCC Certified Company
118
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
1.50E-05
59_IOZLVO=0V_D6 (A)
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.57. Plot of 59_IOZLVO=0V_D6 (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
119
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.57. Raw data for 59_IOZLVO=0V_D6 (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
59_IOZLVO=0V_D6 (A)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
-7.80E-08
-7.70E-08
-7.70E-08
-7.90E-08
-7.90E-08
-8.00E-08
-7.60E-08
10
-8.30E-08
-8.70E-08
-8.50E-08
-8.60E-08
-8.40E-08
-8.60E-08
-8.70E-08
30
-9.10E-08
-9.00E-08
-8.80E-08
-8.90E-08
-9.00E-08
-9.30E-08
-9.10E-08
50
-9.10E-08
-9.00E-08
-8.90E-08
-9.10E-08
-9.10E-08
-9.10E-08
-8.70E-08
100
-1.09E-07
-9.30E-08
-9.20E-08
-9.10E-08
-8.90E-08
-9.00E-08
-8.70E-08
-7.80E-08
1.00E-09
-7.53E-08
-8.07E-08
-1.00E-05
PASS
1.00E-05
PASS
-8.50E-08
1.58E-09
-8.07E-08
-8.93E-08
-1.00E-05
PASS
1.00E-05
PASS
-8.96E-08
1.14E-09
-8.65E-08
-9.27E-08
-1.00E-05
PASS
1.00E-05
PASS
-9.04E-08
8.94E-10
-8.79E-08
-9.29E-08
-1.00E-05
PASS
1.00E-05
PASS
-9.48E-08
8.07E-09
-7.27E-08
-1.17E-07
-1.00E-05
PASS
1.00E-05
PASS
An ISO 9001:2008 and DSCC Certified Company
120
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
1.50E-05
60_IOZLVO=0V_D7 (A)
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.58. Plot of 60_IOZLVO=0V_D7 (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
121
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.58. Raw data for 60_IOZLVO=0V_D7 (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
60_IOZLVO=0V_D7 (A)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
-8.30E-08
-8.30E-08
-8.10E-08
-8.10E-08
-8.20E-08
-8.30E-08
-8.30E-08
10
-8.90E-08
-9.10E-08
-8.90E-08
-9.00E-08
-9.00E-08
-9.10E-08
-9.10E-08
30
-9.60E-08
-9.00E-08
-9.30E-08
-9.40E-08
-9.30E-08
-9.80E-08
-9.40E-08
50
-9.40E-08
-9.40E-08
-9.30E-08
-9.50E-08
-9.60E-08
-9.50E-08
-9.20E-08
100
-1.14E-07
-9.50E-08
-9.60E-08
-9.60E-08
-9.60E-08
-9.40E-08
-9.00E-08
-8.20E-08
1.00E-09
-7.93E-08
-8.47E-08
-1.00E-05
PASS
1.00E-05
PASS
-8.98E-08
8.37E-10
-8.75E-08
-9.21E-08
-1.00E-05
PASS
1.00E-05
PASS
-9.32E-08
2.17E-09
-8.73E-08
-9.91E-08
-1.00E-05
PASS
1.00E-05
PASS
-9.44E-08
1.14E-09
-9.13E-08
-9.75E-08
-1.00E-05
PASS
1.00E-05
PASS
-9.94E-08
8.17E-09
-7.70E-08
-1.22E-07
-1.00E-05
PASS
1.00E-05
PASS
An ISO 9001:2008 and DSCC Certified Company
122
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
1.50E-05
61_IOZLVO=0V_D8 (A)
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.59. Plot of 61_IOZLVO=0V_D8 (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
123
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.59. Raw data for 61_IOZLVO=0V_D8 (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
61_IOZLVO=0V_D8 (A)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
-6.70E-08
-6.70E-08
-6.70E-08
-6.80E-08
-6.80E-08
-6.80E-08
-6.70E-08
10
-7.40E-08
-7.60E-08
-7.20E-08
-7.30E-08
-7.20E-08
-7.60E-08
-7.40E-08
30
-8.00E-08
-7.60E-08
-7.50E-08
-8.00E-08
-7.90E-08
-8.00E-08
-7.80E-08
50
-7.40E-08
-7.70E-08
-7.90E-08
-7.80E-08
-7.80E-08
-7.80E-08
-7.40E-08
100
-9.80E-08
-8.20E-08
-8.10E-08
-8.00E-08
-7.60E-08
-7.70E-08
-7.50E-08
-6.74E-08
5.48E-10
-6.59E-08
-6.89E-08
-1.00E-05
PASS
1.00E-05
PASS
-7.34E-08
1.67E-09
-6.88E-08
-7.80E-08
-1.00E-05
PASS
1.00E-05
PASS
-7.80E-08
2.35E-09
-7.16E-08
-8.44E-08
-1.00E-05
PASS
1.00E-05
PASS
-7.72E-08
1.92E-09
-7.19E-08
-8.25E-08
-1.00E-05
PASS
1.00E-05
PASS
-8.34E-08
8.47E-09
-6.02E-08
-1.07E-07
-1.00E-05
PASS
1.00E-05
PASS
An ISO 9001:2008 and DSCC Certified Company
124
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
1.50E-05
62_IOZLVO=0V_D9 (A)
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.60. Plot of 62_IOZLVO=0V_D9 (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
125
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.60. Raw data for 62_IOZLVO=0V_D9 (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
62_IOZLVO=0V_D9 (A)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
-6.80E-08
-6.90E-08
-6.90E-08
-6.90E-08
-6.90E-08
-6.90E-08
-6.90E-08
10
-7.70E-08
-7.50E-08
-7.50E-08
-7.50E-08
-7.50E-08
-7.60E-08
-7.80E-08
30
-7.90E-08
-7.80E-08
-7.70E-08
-7.80E-08
-7.80E-08
-8.20E-08
-8.00E-08
50
-7.90E-08
-7.90E-08
-7.90E-08
-7.80E-08
-7.90E-08
-7.90E-08
-7.60E-08
100
-9.80E-08
-7.90E-08
-8.00E-08
-8.00E-08
-8.00E-08
-7.80E-08
-7.60E-08
-6.88E-08
4.47E-10
-6.76E-08
-7.00E-08
-1.00E-05
PASS
1.00E-05
PASS
-7.54E-08
8.94E-10
-7.29E-08
-7.79E-08
-1.00E-05
PASS
1.00E-05
PASS
-7.80E-08
7.07E-10
-7.61E-08
-7.99E-08
-1.00E-05
PASS
1.00E-05
PASS
-7.88E-08
4.47E-10
-7.76E-08
-8.00E-08
-1.00E-05
PASS
1.00E-05
PASS
-8.34E-08
8.17E-09
-6.10E-08
-1.06E-07
-1.00E-05
PASS
1.00E-05
PASS
An ISO 9001:2008 and DSCC Certified Company
126
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
1.50E-05
63_IOZLVO=0V_D10 (A)
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.61. Plot of 63_IOZLVO=0V_D10 (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
127
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.61. Raw data for 63_IOZLVO=0V_D10 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
63_IOZLVO=0V_D10 (A)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
-6.70E-08
-6.90E-08
-6.80E-08
-6.90E-08
-6.70E-08
-6.80E-08
-6.70E-08
10
-7.60E-08
-7.40E-08
-7.60E-08
-7.50E-08
-7.50E-08
-7.70E-08
-7.40E-08
30
-8.00E-08
-7.80E-08
-7.70E-08
-7.70E-08
-7.80E-08
-8.20E-08
-7.90E-08
50
-7.70E-08
-7.90E-08
-7.60E-08
-7.80E-08
-7.80E-08
-7.90E-08
-7.60E-08
100
-9.80E-08
-8.10E-08
-8.00E-08
-8.10E-08
-8.00E-08
-7.80E-08
-7.50E-08
-6.80E-08
1.00E-09
-6.53E-08
-7.07E-08
-1.00E-05
PASS
1.00E-05
PASS
-7.52E-08
8.37E-10
-7.29E-08
-7.75E-08
-1.00E-05
PASS
1.00E-05
PASS
-7.80E-08
1.22E-09
-7.46E-08
-8.14E-08
-1.00E-05
PASS
1.00E-05
PASS
-7.76E-08
1.14E-09
-7.45E-08
-8.07E-08
-1.00E-05
PASS
1.00E-05
PASS
-8.40E-08
7.84E-09
-6.25E-08
-1.06E-07
-1.00E-05
PASS
1.00E-05
PASS
An ISO 9001:2008 and DSCC Certified Company
128
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
1.50E-05
64_IOZLVO=0V_D11 (A)
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.62. Plot of 64_IOZLVO=0V_D11 (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
129
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.62. Raw data for 64_IOZLVO=0V_D11 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
64_IOZLVO=0V_D11 (A)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
-6.80E-08
-6.60E-08
-6.60E-08
-6.60E-08
-6.70E-08
-6.80E-08
-6.40E-08
10
-7.50E-08
-7.40E-08
-7.20E-08
-7.10E-08
-7.30E-08
-7.30E-08
-7.40E-08
30
-7.80E-08
-7.50E-08
-7.60E-08
-7.60E-08
-7.60E-08
-8.00E-08
-7.60E-08
50
-7.50E-08
-7.50E-08
-7.70E-08
-7.60E-08
-7.70E-08
-7.70E-08
-7.70E-08
100
-9.70E-08
-7.90E-08
-7.90E-08
-7.90E-08
-7.70E-08
-7.40E-08
-7.40E-08
-6.66E-08
8.94E-10
-6.41E-08
-6.91E-08
-1.00E-05
PASS
1.00E-05
PASS
-7.30E-08
1.58E-09
-6.87E-08
-7.73E-08
-1.00E-05
PASS
1.00E-05
PASS
-7.62E-08
1.10E-09
-7.32E-08
-7.92E-08
-1.00E-05
PASS
1.00E-05
PASS
-7.60E-08
1.00E-09
-7.33E-08
-7.87E-08
-1.00E-05
PASS
1.00E-05
PASS
-8.22E-08
8.32E-09
-5.94E-08
-1.05E-07
-1.00E-05
PASS
1.00E-05
PASS
An ISO 9001:2008 and DSCC Certified Company
130
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
1.50E-05
65_IOZLVO=0V_D12 (A)
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.63. Plot of 65_IOZLVO=0V_D12 (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
131
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.63. Raw data for 65_IOZLVO=0V_D12 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
65_IOZLVO=0V_D12 (A)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
-7.20E-08
-6.90E-08
-7.10E-08
-7.20E-08
-7.10E-08
-7.00E-08
-7.00E-08
10
-7.60E-08
-7.70E-08
-7.70E-08
-7.60E-08
-7.80E-08
-7.70E-08
-7.90E-08
30
-8.00E-08
-7.70E-08
-7.70E-08
-8.00E-08
-7.90E-08
-8.20E-08
-8.00E-08
50
-7.90E-08
-8.00E-08
-8.00E-08
-7.90E-08
-8.00E-08
-8.10E-08
-7.80E-08
100
-9.90E-08
-8.40E-08
-8.20E-08
-8.20E-08
-7.90E-08
-7.90E-08
-7.70E-08
-7.10E-08
1.22E-09
-6.76E-08
-7.44E-08
-1.00E-05
PASS
1.00E-05
PASS
-7.68E-08
8.37E-10
-7.45E-08
-7.91E-08
-1.00E-05
PASS
1.00E-05
PASS
-7.86E-08
1.52E-09
-7.44E-08
-8.28E-08
-1.00E-05
PASS
1.00E-05
PASS
-7.96E-08
5.48E-10
-7.81E-08
-8.11E-08
-1.00E-05
PASS
1.00E-05
PASS
-8.52E-08
7.92E-09
-6.35E-08
-1.07E-07
-1.00E-05
PASS
1.00E-05
PASS
An ISO 9001:2008 and DSCC Certified Company
132
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
1.50E-05
66_IOZLVO=0V_D13 (A)
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.64. Plot of 66_IOZLVO=0V_D13 (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
133
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.64. Raw data for 66_IOZLVO=0V_D13 (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
66_IOZLVO=0V_D13 (A)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
-6.60E-08
-6.80E-08
-6.80E-08
-6.80E-08
-6.80E-08
-6.80E-08
-6.80E-08
10
-7.20E-08
-7.40E-08
-7.40E-08
-7.30E-08
-7.20E-08
-7.30E-08
-7.40E-08
30
-7.80E-08
-7.40E-08
-7.60E-08
-7.60E-08
-7.50E-08
-8.00E-08
-7.60E-08
50
-7.60E-08
-7.60E-08
-7.60E-08
-7.80E-08
-7.50E-08
-7.70E-08
-7.60E-08
100
-5.20E-08
-6.40E-08
-6.30E-08
-6.50E-08
-7.50E-08
-7.50E-08
-7.70E-08
-6.76E-08
8.94E-10
-6.51E-08
-7.01E-08
-1.00E-05
PASS
1.00E-05
PASS
-7.30E-08
1.00E-09
-7.03E-08
-7.57E-08
-1.00E-05
PASS
1.00E-05
PASS
-7.58E-08
1.48E-09
-7.17E-08
-7.99E-08
-1.00E-05
PASS
1.00E-05
PASS
-7.62E-08
1.10E-09
-7.32E-08
-7.92E-08
-1.00E-05
PASS
1.00E-05
PASS
-6.38E-08
8.17E-09
-4.14E-08
-8.62E-08
-1.00E-05
PASS
1.00E-05
PASS
An ISO 9001:2008 and DSCC Certified Company
134
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
1.50E-05
67_IIL0V_CS (A)
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.65. Plot of 67_IIL0V_CS (A) versus total dose. The solid diamonds are the average of the measured
data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated under electrical bias.
The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as
defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
135
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.65. Raw data for 67_IIL0V_CS (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
67_IIL0V_CS (A)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
-4.00E-09
0.00E+00
0.00E+00
-4.00E-09
-4.00E-09
-4.00E-09
-1.00E-09
10
-3.00E-09
-2.00E-09
-3.00E-09
-3.00E-09
-3.00E-09
-3.00E-09
-4.00E-09
30
-3.00E-09
-3.00E-09
-1.00E-09
-5.00E-09
-4.00E-09
-2.00E-09
-3.00E-09
50
-2.00E-09
-4.00E-09
-5.00E-09
0.00E+00
-3.00E-09
-5.00E-09
-4.00E-09
100
-2.00E-09
-2.00E-09
-3.00E-09
0.00E+00
3.00E-09
-2.00E-09
-4.00E-09
-2.40E-09
2.19E-09
3.61E-09
-8.41E-09
-1.00E-05
PASS
1.00E-05
PASS
-2.80E-09
4.47E-10
-1.57E-09
-4.03E-09
-1.00E-05
PASS
1.00E-05
PASS
-3.20E-09
1.48E-09
8.67E-10
-7.27E-09
-1.00E-05
PASS
1.00E-05
PASS
-2.80E-09
1.92E-09
2.47E-09
-8.07E-09
-1.00E-05
PASS
1.00E-05
PASS
-8.00E-10
2.39E-09
5.75E-09
-7.35E-09
-1.00E-05
PASS
1.00E-05
PASS
An ISO 9001:2008 and DSCC Certified Company
136
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
1.50E-05
68_IIL0V_RD (A)
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.66. Plot of 68_IIL0V_RD (A) versus total dose. The solid diamonds are the average of the measured
data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated under electrical bias.
The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as
defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
137
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.66. Raw data for 68_IIL0V_RD (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
68_IIL0V_RD (A)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
-2.00E-09
-3.00E-09
0.00E+00
-5.00E-09
-4.00E-09
-3.00E-09
-2.00E-09
10
-2.00E-09
-4.00E-09
-2.00E-09
-3.00E-09
-3.00E-09
-3.00E-09
-3.00E-09
30
-3.00E-09
-3.00E-09
-1.00E-09
-3.00E-09
-1.00E-09
-2.00E-09
-2.00E-09
50
-5.00E-09
-4.00E-09
0.00E+00
-3.00E-09
-2.00E-09
-3.00E-09
-3.00E-09
100
-2.00E-09
0.00E+00
0.00E+00
-2.00E-09
5.00E-09
-2.00E-09
-2.00E-09
-2.80E-09
1.92E-09
2.47E-09
-8.07E-09
-1.00E-05
PASS
1.00E-05
PASS
-2.80E-09
8.37E-10
-5.06E-10
-5.09E-09
-1.00E-05
PASS
1.00E-05
PASS
-2.20E-09
1.10E-09
8.04E-10
-5.20E-09
-1.00E-05
PASS
1.00E-05
PASS
-2.80E-09
1.92E-09
2.47E-09
-8.07E-09
-1.00E-05
PASS
1.00E-05
PASS
2.00E-10
2.86E-09
8.05E-09
-7.65E-09
-1.00E-05
PASS
1.00E-05
PASS
An ISO 9001:2008 and DSCC Certified Company
138
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
1.50E-05
69_IIL0V_SHDN (A)
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.67. Plot of 69_IIL0V_SHDN (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
139
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.67. Raw data for 69_IIL0V_SHDN (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
69_IIL0V_SHDN (A)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
0.00E+00
-3.00E-09
-4.00E-09
-3.00E-09
-3.00E-09
-3.00E-09
-1.00E-09
10
-2.00E-09
-4.00E-09
-4.00E-09
-4.00E-09
-3.00E-09
-3.00E-09
-3.00E-09
30
-3.00E-09
-3.00E-09
-4.00E-09
-4.00E-09
-1.00E-09
-2.00E-09
-3.00E-09
50
-4.00E-09
-2.00E-09
-3.00E-09
-5.00E-09
0.00E+00
-3.00E-09
-3.00E-09
100
2.50E-08
4.10E-08
3.20E-08
1.90E-08
7.00E-09
-4.00E-09
-2.00E-09
-2.60E-09
1.52E-09
1.56E-09
-6.76E-09
-1.00E-05
PASS
1.00E-05
PASS
-3.40E-09
8.94E-10
-9.47E-10
-5.85E-09
-1.00E-05
PASS
1.00E-05
PASS
-3.00E-09
1.22E-09
3.58E-10
-6.36E-09
-1.00E-05
PASS
1.00E-05
PASS
-2.80E-09
1.92E-09
2.47E-09
-8.07E-09
-1.00E-05
PASS
1.00E-05
PASS
2.48E-08
1.29E-08
6.01E-08
-1.05E-08
-1.00E-05
PASS
1.00E-05
PASS
An ISO 9001:2008 and DSCC Certified Company
140
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
1.50E-05
70_IIL0V_CONVST (A)
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.68. Plot of 70_IIL0V_CONVST (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
141
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.68. Raw data for 70_IIL0V_CONVST (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
70_IIL0V_CONVST (A)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
-3.10E-08
-3.10E-08
-2.80E-08
-3.10E-08
-3.00E-08
-2.80E-08
-2.70E-08
10
-3.00E-08
-3.10E-08
-3.10E-08
-2.70E-08
-3.10E-08
-2.80E-08
-3.20E-08
30
-2.60E-08
-2.40E-08
-2.60E-08
-2.50E-08
-2.60E-08
-2.80E-08
-3.00E-08
50
-2.80E-08
-2.80E-08
-2.60E-08
-2.50E-08
-2.70E-08
-3.00E-08
-3.00E-08
100
-6.00E-09
1.40E-08
0.00E+00
-1.60E-08
-1.60E-08
-2.70E-08
-2.50E-08
-3.02E-08
1.30E-09
-2.66E-08
-3.38E-08
-1.00E-05
PASS
1.00E-05
PASS
-3.00E-08
1.73E-09
-2.53E-08
-3.47E-08
-1.00E-05
PASS
1.00E-05
PASS
-2.54E-08
8.94E-10
-2.29E-08
-2.79E-08
-1.00E-05
PASS
1.00E-05
PASS
-2.68E-08
1.30E-09
-2.32E-08
-3.04E-08
-1.00E-05
PASS
1.00E-05
PASS
-4.80E-09
1.25E-08
2.96E-08
-3.92E-08
-1.00E-05
PASS
1.00E-05
PASS
An ISO 9001:2008 and DSCC Certified Company
142
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
1.50E-05
71_IIH5V_CS (A)
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.69. Plot of 71_IIH5V_CS (A) versus total dose. The solid diamonds are the average of the measured
data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated under electrical bias.
The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as
defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
143
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.69. Raw data for 71_IIH5V_CS (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
71_IIH5V_CS (A)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
0.00E+00
2.00E-09
2.00E-09
0.00E+00
2.00E-09
2.00E-09
0.00E+00
10
2.00E-09
-3.00E-09
1.00E-09
2.00E-09
0.00E+00
0.00E+00
2.00E-09
30
0.00E+00
0.00E+00
3.00E-09
-1.00E-09
0.00E+00
2.00E-09
1.00E-09
50
2.00E-09
1.00E-09
0.00E+00
2.00E-09
0.00E+00
0.00E+00
2.00E-09
100
1.00E-09
5.00E-09
2.00E-09
1.00E-09
7.00E-09
1.00E-09
0.00E+00
1.20E-09
1.10E-09
4.20E-09
-1.80E-09
-1.00E-05
PASS
1.00E-05
PASS
4.00E-10
2.07E-09
6.09E-09
-5.29E-09
-1.00E-05
PASS
1.00E-05
PASS
4.00E-10
1.52E-09
4.56E-09
-3.76E-09
-1.00E-05
PASS
1.00E-05
PASS
1.00E-09
1.00E-09
3.74E-09
-1.74E-09
-1.00E-05
PASS
1.00E-05
PASS
3.20E-09
2.68E-09
1.06E-08
-4.16E-09
-1.00E-05
PASS
1.00E-05
PASS
An ISO 9001:2008 and DSCC Certified Company
144
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
1.50E-05
72_IIH5V_RD (A)
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.70. Plot of 72_IIH5V_RD (A) versus total dose. The solid diamonds are the average of the measured
data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated under electrical bias.
The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as
defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
145
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.70. Raw data for 72_IIH5V_RD (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
72_IIH5V_RD (A)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
1.00E-09
0.00E+00
0.00E+00
0.00E+00
0.00E+00
2.00E-09
2.00E-09
10
0.00E+00
0.00E+00
0.00E+00
1.00E-09
2.00E-09
1.00E-09
3.00E-09
30
2.00E-09
1.00E-09
2.00E-09
0.00E+00
3.00E-09
2.00E-09
1.00E-09
50
2.00E-09
1.00E-09
0.00E+00
2.00E-09
2.00E-09
1.00E-09
0.00E+00
100
2.00E-09
5.00E-09
2.00E-09
3.00E-09
7.00E-09
2.00E-09
0.00E+00
2.00E-10
4.47E-10
1.43E-09
-1.03E-09
-1.00E-05
PASS
1.00E-05
PASS
6.00E-10
8.94E-10
3.05E-09
-1.85E-09
-1.00E-05
PASS
1.00E-05
PASS
1.60E-09
1.14E-09
4.73E-09
-1.53E-09
-1.00E-05
PASS
1.00E-05
PASS
1.40E-09
8.94E-10
3.85E-09
-1.05E-09
-1.00E-05
PASS
1.00E-05
PASS
3.80E-09
2.17E-09
9.74E-09
-2.14E-09
-1.00E-05
PASS
1.00E-05
PASS
An ISO 9001:2008 and DSCC Certified Company
146
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
1.50E-05
73_IIH5V_SHDN (A)
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.71. Plot of 73_IIH5V_SHDN (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
147
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.71. Raw data for 73_IIH5V_SHDN (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
73_IIH5V_SHDN (A)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
1.00E-09
1.00E-09
0.00E+00
2.00E-09
2.00E-09
0.00E+00
0.00E+00
10
2.00E-09
2.00E-09
2.00E-09
0.00E+00
0.00E+00
2.00E-09
0.00E+00
30
1.00E-09
3.00E-09
2.00E-09
2.00E-09
1.00E-09
2.00E-09
3.00E-09
50
0.00E+00
3.00E-09
0.00E+00
0.00E+00
3.00E-09
0.00E+00
0.00E+00
100
3.30E-08
5.10E-08
3.80E-08
2.80E-08
1.60E-08
2.00E-09
3.00E-09
1.20E-09
8.37E-10
3.49E-09
-1.09E-09
-1.00E-05
PASS
1.00E-05
PASS
1.20E-09
1.10E-09
4.20E-09
-1.80E-09
-1.00E-05
PASS
1.00E-05
PASS
1.80E-09
8.37E-10
4.09E-09
-4.94E-10
-1.00E-05
PASS
1.00E-05
PASS
1.20E-09
1.64E-09
5.71E-09
-3.31E-09
-1.00E-05
PASS
1.00E-05
PASS
3.32E-08
1.29E-08
6.85E-08
-2.10E-09
-1.00E-05
PASS
1.00E-05
PASS
An ISO 9001:2008 and DSCC Certified Company
148
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
1.50E-05
74_IIH5V_CONVST (A)
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.72. Plot of 74_IIH5V_CONVST (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
149
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.72. Raw data for 74_IIH5V_CONVST (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
74_IIH5V_CONVST (A)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
-1.40E-08
-1.10E-08
-1.50E-08
-1.60E-08
-1.80E-08
-1.50E-08
-1.40E-08
10
-1.50E-08
-1.50E-08
-1.50E-08
-1.30E-08
-1.50E-08
-1.60E-08
-1.80E-08
30
-1.40E-08
-1.40E-08
-1.60E-08
-1.60E-08
-1.30E-08
-1.50E-08
-1.90E-08
50
-1.60E-08
-1.50E-08
-1.70E-08
-1.60E-08
-1.40E-08
-1.30E-08
-1.80E-08
100
1.00E-08
3.50E-08
2.10E-08
0.00E+00
-4.00E-09
-1.60E-08
-1.40E-08
-1.48E-08
2.59E-09
-7.70E-09
-2.19E-08
-1.00E-05
PASS
1.00E-05
PASS
-1.46E-08
8.94E-10
-1.21E-08
-1.71E-08
-1.00E-05
PASS
1.00E-05
PASS
-1.46E-08
1.34E-09
-1.09E-08
-1.83E-08
-1.00E-05
PASS
1.00E-05
PASS
-1.56E-08
1.14E-09
-1.25E-08
-1.87E-08
-1.00E-05
PASS
1.00E-05
PASS
1.24E-08
1.59E-08
5.60E-08
-3.12E-08
-1.00E-05
PASS
1.00E-05
PASS
An ISO 9001:2008 and DSCC Certified Company
150
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
1.50E-06
75_IINp2p5VAIN (A)
1.00E-06
5.00E-07
0.00E+00
-5.00E-07
-1.00E-06
-1.50E-06
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.73. Plot of 75_IINp2p5VAIN (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
151
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.73. Raw data for 75_IINp2p5VAIN (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
75_IINp2p5VAIN (A)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
1.80E-08
1.80E-08
1.80E-08
4.30E-08
1.80E-08
1.80E-08
1.80E-08
10
1.80E-08
4.30E-08
1.80E-08
4.30E-08
1.80E-08
1.80E-08
4.30E-08
30
4.30E-08
4.30E-08
4.30E-08
4.30E-08
4.30E-08
4.30E-08
1.80E-08
50
4.30E-08
1.80E-08
1.80E-08
4.30E-08
4.30E-08
1.80E-08
4.30E-08
100
4.30E-08
4.30E-08
4.30E-08
1.80E-08
1.80E-08
4.30E-08
1.80E-08
2.30E-08
1.12E-08
5.37E-08
-7.66E-09
-1.00E-06
PASS
1.00E-06
PASS
2.80E-08
1.37E-08
6.55E-08
-9.55E-09
-1.00E-06
PASS
1.00E-06
PASS
4.30E-08
0.00E+00
4.30E-08
4.30E-08
-1.00E-06
PASS
1.00E-06
PASS
3.30E-08
1.37E-08
7.05E-08
-4.55E-09
-1.00E-06
PASS
1.00E-06
PASS
3.30E-08
1.37E-08
7.05E-08
-4.55E-09
-1.00E-06
PASS
1.00E-06
PASS
An ISO 9001:2008 and DSCC Certified Company
152
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
1.50E-06
76_IINm2p5VAIN (A)
1.00E-06
5.00E-07
0.00E+00
-5.00E-07
-1.00E-06
-1.50E-06
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.74. Plot of 76_IINm2p5VAIN (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
153
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.74. Raw data for 76_IINm2p5VAIN (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
76_IINm2p5VAIN (A)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
-5.50E-08
-3.00E-08
-7.90E-08
-3.00E-08
-3.00E-08
-5.50E-08
-3.00E-08
10
-3.10E-08
-3.10E-08
-3.10E-08
-3.10E-08
-5.50E-08
-3.10E-08
-5.50E-08
30
-5.50E-08
-5.50E-08
-5.50E-08
-5.50E-08
-3.10E-08
-5.50E-08
-5.50E-08
50
-3.10E-08
-3.10E-08
-3.10E-08
-1.04E-07
-3.10E-08
-3.10E-08
-5.50E-08
100
-3.10E-08
-3.10E-08
-5.50E-08
-5.50E-08
-7.90E-08
-3.10E-08
-5.50E-08
-4.48E-08
2.20E-08
1.54E-08
-1.05E-07
-1.00E-06
PASS
1.00E-06
PASS
-3.58E-08
1.07E-08
-6.37E-09
-6.52E-08
-1.00E-06
PASS
1.00E-06
PASS
-5.02E-08
1.07E-08
-2.08E-08
-7.96E-08
-1.00E-06
PASS
1.00E-06
PASS
-4.56E-08
3.26E-08
4.39E-08
-1.35E-07
-1.00E-06
PASS
1.00E-06
PASS
-5.02E-08
2.01E-08
4.86E-09
-1.05E-07
-1.00E-06
PASS
1.00E-06
PASS
An ISO 9001:2008 and DSCC Certified Company
154
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
3.00E+01
77_BIPOLAROFFSET (LSB)
2.00E+01
1.00E+01
0.00E+00
-1.00E+01
-2.00E+01
-3.00E+01
-4.00E+01
-5.00E+01
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.75. Plot of 77_BIPOLAROFFSET (LSB) versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
155
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.75. Raw data for 77_BIPOLAROFFSET (LSB) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
77_BIPOLAROFFSET (LSB)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
-2.34E+00
-5.04E+00
-7.05E-01
-6.11E+00
-4.05E+00
-2.69E+00
-7.02E+00
10
-3.03E+00
-5.20E+00
-8.25E-01
-6.83E+00
-5.09E+00
-2.58E+00
-7.05E+00
30
-4.34E+00
-6.72E+00
-1.96E+00
-8.75E+00
-7.55E+00
-2.07E+00
-6.58E+00
50
-5.87E+00
-7.93E+00
-2.96E+00
-1.02E+01
-9.68E+00
-3.22E+00
-7.34E+00
100
-1.47E+01
-1.84E+01
-9.48E+00
-2.13E+01
-2.19E+01
-2.52E+00
-6.45E+00
-3.65E+00
2.15E+00
2.25E+00
-9.55E+00
-2.00E+01
PASS
2.00E+01
PASS
-4.19E+00
2.32E+00
2.16E+00
-1.05E+01
-2.00E+01
PASS
2.00E+01
PASS
-5.87E+00
2.71E+00
1.57E+00
-1.33E+01
-2.00E+01
PASS
2.00E+01
PASS
-7.34E+00
2.98E+00
8.47E-01
-1.55E+01
-3.00E+01
PASS
2.00E+01
PASS
-1.72E+01
5.14E+00
-3.07E+00
-3.13E+01
-4.00E+01
PASS
2.00E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
156
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
8.00E+01
78_BIPOLARGAINERROR (LSB)
6.00E+01
4.00E+01
2.00E+01
0.00E+00
-2.00E+01
-4.00E+01
-6.00E+01
-8.00E+01
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.76. Plot of 78_BIPOLARGAINERROR (LSB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
157
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.76. Raw data for 78_BIPOLARGAINERROR (LSB) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
78_BIPOLARGAINERROR (LSB)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
1.33E+00
3.91E+00
2.46E+00
2.20E+00
4.46E+00
3.93E+00
4.41E+00
10
1.49E+00
4.20E+00
2.43E+00
2.72E+00
4.92E+00
2.95E+00
4.29E+00
30
2.13E+00
4.05E+00
2.75E+00
2.13E+00
5.52E+00
2.61E+00
3.77E+00
50
2.11E+00
3.99E+00
2.68E+00
1.95E+00
5.61E+00
3.64E+00
4.14E+00
100
1.87E+00
4.47E+00
2.77E+00
2.52E+00
7.54E+00
3.05E+00
3.83E+00
2.87E+00
1.29E+00
6.40E+00
-6.56E-01
-6.00E+01
PASS
6.00E+01
PASS
3.15E+00
1.39E+00
6.95E+00
-6.53E-01
-6.00E+01
PASS
6.00E+01
PASS
3.32E+00
1.46E+00
7.32E+00
-6.84E-01
-6.00E+01
PASS
6.00E+01
PASS
3.27E+00
1.54E+00
7.48E+00
-9.43E-01
-6.00E+01
PASS
6.00E+01
PASS
3.83E+00
2.28E+00
1.01E+01
-2.42E+00
-6.00E+01
PASS
6.00E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
158
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (+KTL) Biased
Specification MAX
6.00E+00
79_INT(p)NONmLIN (LSB)
5.00E+00
4.00E+00
3.00E+00
2.00E+00
1.00E+00
0.00E+00
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.77. Plot of 79_INT(p)NONmLIN (LSB) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
159
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Final Report
10-009 100420 R1.0
Table 5.77. Raw data for 79_INT(p)NONmLIN (LSB) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
79_INT(p)NONmLIN (LSB)
Device
50
1.39E+00
1.31E+00
1.21E+00
1.28E+00
1.63E+00
9.24E-01
7.81E-01
100
1.78E+00
1.95E+00
1.85E+00
1.67E+00
3.31E+00
1.03E+00
9.21E-01
Biased Statistics
Average Biased
9.66E-01 1.03E+00 1.11E+00 1.36E+00
Std Dev Biased
5.83E-02 9.75E-02 1.97E-01 1.64E-01
Ps90%/90% (+KTL) Biased 1.13E+00 1.30E+00 1.65E+00 1.81E+00
Ps90%/90% (-KTL) Biased
8.06E-01 7.62E-01 5.75E-01 9.13E-01
Specification MAX
2.00E+00 2.00E+00 2.00E+00 3.00E+00
Status
PASS
PASS
PASS
PASS
2.11E+00
6.76E-01
3.96E+00
2.57E-01
5.00E+00
PASS
31
32
34
35
36
1
2
0
9.58E-01
1.07E+00
9.23E-01
9.59E-01
9.23E-01
9.93E-01
7.80E-01
10
1.10E+00
1.03E+00
8.87E-01
9.95E-01
1.14E+00
9.22E-01
7.44E-01
30
1.28E+00
1.10E+00
9.23E-01
9.24E-01
1.35E+00
8.16E-01
7.45E-01
An ISO 9001:2008 and DSCC Certified Company
160
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
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RLAT Final Report
10-009 100420 R1.0
Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
0.00E+00
80_INT(m)NONmLIN (LSB)
-1.00E+00
-2.00E+00
-3.00E+00
-4.00E+00
-5.00E+00
-6.00E+00
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.78. Plot of 80_INT(m)NONmLIN (LSB) versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
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Table 5.78. Raw data for 80_INT(m)NONmLIN (LSB) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
80_INT(m)NONmLIN (LSB)
Device
0
-7.81E-01
-5.68E-01
-3.90E-01
-6.04E-01
-4.62E-01
-7.09E-01
-3.90E-01
10
-6.74E-01
-3.90E-01
-3.19E-01
-6.39E-01
-6.75E-01
-8.51E-01
-4.61E-01
30
-7.45E-01
-5.32E-01
-5.68E-01
-6.75E-01
-7.10E-01
-9.23E-01
-4.26E-01
50
-1.03E+00
-7.81E-01
-6.75E-01
-9.23E-01
-8.88E-01
-6.04E-01
-2.49E-01
100
-1.07E+00
-1.28E+00
-1.53E+00
-1.21E+00
-3.02E+00
-6.38E-01
-4.25E-01
Biased Statistics
Average Biased
-5.61E-01
Std Dev Biased
1.49E-01
Ps90%/90% (+KTL) Biased -1.51E-01
Ps90%/90% (-KTL) Biased
-9.71E-01
Specification MIN
-2.00E+00
Status
PASS
-5.39E-01
1.71E-01
-6.98E-02
-1.01E+00
-2.00E+00
PASS
-6.46E-01
9.19E-02
-3.94E-01
-8.98E-01
-2.00E+00
PASS
-8.59E-01
1.36E-01
-4.86E-01
-1.23E+00
-3.00E+00
PASS
-1.62E+00
8.01E-01
5.75E-01
-3.82E+00
-5.00E+00
PASS
31
32
34
35
36
1
2
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Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
81_CODEWIDTH(DNL)LONG (LSB)
6.00E+00
5.00E+00
4.00E+00
3.00E+00
2.00E+00
1.00E+00
0.00E+00
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.79. Plot of 81_CODEWIDTH(DNL)LONG (LSB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
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Table 5.79. Raw data for 81_CODEWIDTH(DNL)LONG (LSB) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
81_CODEWIDTH(DNL)LONG (LSB)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
0
2.24E+00
1.60E+00
1.56E+00
1.67E+00
2.45E+00
2.24E+00
1.63E+00
10
2.17E+00
1.56E+00
1.67E+00
1.71E+00
1.95E+00
2.34E+00
1.63E+00
30
1.81E+00
1.81E+00
1.92E+00
1.85E+00
2.02E+00
2.38E+00
1.60E+00
50
2.10E+00
2.41E+00
2.24E+00
2.34E+00
2.42E+00
2.38E+00
1.63E+00
100
2.38E+00
2.63E+00
2.45E+00
2.67E+00
4.02E+00
2.23E+00
1.52E+00
1.90E+00
4.11E-01
3.03E+00
7.77E-01
1.00E+00
PASS
2.50E+00
PASS
1.81E+00
2.45E-01
2.48E+00
1.14E+00
1.00E+00
PASS
2.50E+00
PASS
1.88E+00
9.09E-02
2.13E+00
1.63E+00
1.00E+00
PASS
2.50E+00
PASS
2.30E+00
1.36E-01
2.67E+00
1.93E+00
1.00E+00
PASS
2.50E+00
PASS
2.83E+00
6.74E-01
4.68E+00
9.80E-01
1.00E+00
PASS
5.00E+00
PASS
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Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Specification MAX
Ps90%/90% (+KTL) Biased
82_CODEWIDTH(DNL)SHORT (LSB)
2.00E+00
1.00E+00
0.00E+00
-1.00E+00
-2.00E+00
-3.00E+00
-4.00E+00
-5.00E+00
-6.00E+00
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.80. Plot of 82_CODEWIDTH(DNL)SHORT (LSB) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias and the black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
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Table 5.80. Raw data for 82_CODEWIDTH(DNL)SHORT (LSB) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
82_CODEWIDTH(DNL)SHORT (LSB)
Device
0
10
31 -3.50E-02 1.42E-01
32 4.61E-01 3.90E-01
34 4.26E-01 4.26E-01
35 4.62E-01 3.55E-01
36 3.60E-02 1.42E-01
1 1.06E-01 0.00E+00
2 4.25E-01 3.54E-01
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
Specification MAX
Status
2.70E-01
2.48E-01
9.49E-01
-4.09E-01
-5.00E+00
PASS
1.00E+00
PASS
2.91E-01
1.38E-01
6.70E-01
-8.83E-02
-5.00E+00
PASS
1.00E+00
PASS
30
1.42E-01
-7.10E-02
-7.10E-02
-3.60E-02
0.00E+00
-3.50E-02
3.19E-01
50
7.10E-02
-1.42E-01
-1.78E-01
-2.13E-01
-1.07E-01
-7.10E-02
4.62E-01
100
-1.42E-01
-2.13E-01
-2.13E-01
-2.49E-01
-2.84E-01
-7.10E-02
3.90E-01
-7.20E-03
8.84E-02
2.35E-01
-2.50E-01
-5.00E+00
PASS
1.00E+00
PASS
-1.14E-01
1.11E-01
1.90E-01
-4.17E-01
-5.00E+00
PASS
1.00E+00
PASS
-2.20E-01
5.27E-02
-7.56E-02
-3.65E-01
-5.00E+00
PASS
1.00E+00
PASS
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Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
9.20E+01
9.10E+01
9.00E+01
SFDR (dB)
8.90E+01
8.80E+01
8.70E+01
8.60E+01
8.50E+01
8.40E+01
8.30E+01
8.20E+01
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.81. Plot of SFDR (dB) versus total dose. The solid diamonds are the average of the measured data
points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average
of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The
red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined
in the datasheet and/or test plan.
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Table 5.81. Raw data for SFDR (dB) versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
SFDR (dB)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
8.78E+01
8.78E+01
8.78E+01
8.82E+01
8.85E+01
9.18E+01
8.89E+01
10
8.85E+01
8.81E+01
8.78E+01
9.27E+01
8.80E+01
8.78E+01
8.79E+01
30
8.77E+01
9.23E+01
9.17E+01
9.19E+01
9.21E+01
8.82E+01
8.83E+01
50
8.78E+01
9.10E+01
9.18E+01
9.14E+01
8.76E+01
8.73E+01
8.82E+01
100
9.08E+01
8.98E+01
9.06E+01
9.02E+01
8.80E+01
9.24E+01
8.81E+01
8.80E+01
3.28E-01
8.89E+01
8.71E+01
8.60E+01
PASS
8.90E+01
2.09E+00
9.48E+01
8.33E+01
8.60E+01
PASS
9.11E+01
1.91E+00
9.64E+01
8.59E+01
8.60E+01
PASS
8.99E+01
2.07E+00
9.56E+01
8.42E+01
8.60E+01
PASS
8.99E+01
1.11E+00
9.29E+01
8.68E+01
8.60E+01
PASS
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Average Biased
Ps90%/90% (-KTL) Biased
Specification MIN
8.20E+01
8.00E+01
SINAD (dB)
7.80E+01
7.60E+01
7.40E+01
7.20E+01
7.00E+01
6.80E+01
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.82. Plot of SINAD (dB) versus total dose. The solid diamonds are the average of the measured data
points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average
of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The
red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined
in the datasheet and/or test plan.
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Table 5.82. Raw data for SINAD (dB) versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
SINAD (dB)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status
0
7.96E+01
7.96E+01
8.03E+01
7.98E+01
7.95E+01
7.95E+01
8.03E+01
10
7.97E+01
8.03E+01
8.02E+01
8.01E+01
7.96E+01
7.96E+01
8.04E+01
30
7.91E+01
7.94E+01
7.93E+01
7.94E+01
7.89E+01
7.94E+01
8.03E+01
50
7.88E+01
7.85E+01
7.86E+01
7.87E+01
7.73E+01
7.95E+01
8.03E+01
100
7.70E+01
7.66E+01
7.63E+01
7.70E+01
7.21E+01
7.96E+01
8.02E+01
7.98E+01
3.24E-01
8.06E+01
7.89E+01
7.80E+01
PASS
8.00E+01
2.81E-01
8.07E+01
7.92E+01
7.80E+01
PASS
7.92E+01
2.28E-01
7.98E+01
7.86E+01
7.80E+01
PASS
7.84E+01
6.05E-01
8.01E+01
7.67E+01
7.50E+01
PASS
7.58E+01
2.06E+00
8.14E+01
7.01E+01
7.00E+01
PASS
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Average Biased
Ps90%/90% (+KTL) Biased
Specification MAX
-8.10E+01
-8.20E+01
-8.30E+01
THD (dB)
-8.40E+01
-8.50E+01
-8.60E+01
-8.70E+01
-8.80E+01
-8.90E+01
0
20
40
60
80
Total Dose (krad(Si))
Figure 5.83. Plot of THD (dB) versus total dose. The solid diamonds are the average of the measured data
points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average
of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The
red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined
in the datasheet and/or test plan.
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Table 5.83. Raw data for THD (dB) versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
THD (dB)
Device
31
32
34
35
36
1
2
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MAX
Status
0
-8.83E+01
-8.84E+01
-8.84E+01
-8.76E+01
-8.83E+01
-8.75E+01
-8.84E+01
10
-8.88E+01
-8.85E+01
-8.82E+01
-8.76E+01
-8.88E+01
-8.84E+01
-8.88E+01
30
-8.76E+01
-8.73E+01
-8.73E+01
-8.70E+01
-8.70E+01
-8.81E+01
-8.82E+01
50
-8.70E+01
-8.68E+01
-8.67E+01
-8.63E+01
-8.64E+01
-8.83E+01
-8.88E+01
100
-8.53E+01
-8.56E+01
-8.53E+01
-8.58E+01
-8.42E+01
-8.80E+01
-8.79E+01
-8.82E+01
3.33E-01
-8.73E+01
-8.91E+01
-8.60E+01
PASS
-8.84E+01
5.05E-01
-8.70E+01
-8.98E+01
-8.60E+01
PASS
-8.72E+01
2.58E-01
-8.65E+01
-8.79E+01
-8.60E+01
PASS
-8.66E+01
2.82E-01
-8.59E+01
-8.74E+01
-8.40E+01
PASS
-8.52E+01
6.17E-01
-8.35E+01
-8.69E+01
-8.20E+01
PASS
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6.0. Summary / Conclusions
The total ionizing dose testing described in this final report was performed using the facilities at
Radiation Assured Devices’ Longmire Laboratories in Colorado Springs, CO. The high dose rate total
ionizing dose (TID) source is a JLSA 84-21 irradiator modified to provide a panoramic exposure. The
Co-60 rods are held in the base of the irradiator heavily shielded by lead, during the radiation exposures
the rod is raised by an electronic timer/controller and the exposure is performed in air. The dose rate for
this irradiator in this configuration ranges from <1rad(Si)/s to a maximum of approximately
120rad(Si)/s, determined by the distance from the source.
The parametric data was obtained as read and record and all the raw data plus an attributes summary are
contained in this report as well as in a separate Excel file. The attributes data contains the average,
standard deviation and the average with the KTL values applied. The KTL value used in this work is
2.742 per MIL-HDBK-814 using one sided tolerance limits of 90/90 and a 5-piece sample size. The
90/90 KTL values were selected to match the statistical levels specified in the MIL-PRF-38535
sampling plan for the qualification of a radiation hardness assured (RHA) component. Note that the
following criterion must be met for a device to pass the RLAT: following the radiation exposure each of
the 5 pieces irradiated under electrical bias shall pass the specification value. The KTL statistics are
included in this report for reference only. If any of the 5 pieces irradiated under electrical bias exceed
the datasheet specifications, then the lot could be logged as a failure.
Based on the criterion established above, the units-under-test (from the lot date code / traceability
information provided on the first page of this report) PASSED to the maximum tested total dose of
100krad(Si) with the all of the units-under-test remaining within their post-irradiation datasheet limits.
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Appendix A: Photograph of Sample Unit-Under-Test to Show Device Traceability
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Appendix B: TID Bias Connections
Biased Samples:
FUNCTION
PIN NUMBER
BIAS CONNECTIONS DURING IRRADIATION
+AIN
-AIN
VREF
REFCOMP
AGND
D13 (MSB)
D12
D11
D10
D9
D8
D7
D6
DGND
D5
D4
D3
D2
D1
D0
SHDN/
RD/
CONVST/
CS/
BUSY/
VSS
DVDD
AVDD
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
+2.5V, 1000pF Ceramic to -AIN
GND
10μF Ceramic to GND
10μF Ceramic to GND
GND
Open
Open
Open
Open
Open
Open
Open
Open
GND
Open
Open
Open
Open
Open
Open
+5.5 V ± 0.15 V
GND
500 kHz Square Wave @ 5 % Duty Cycle
GND
Open
-5.5 V ± 0.15 V, 10μF Ceramic to GND
Pin 28
+5.5 V ± 0.15 V, 10μF Ceramic to GND
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Figure B.1. RAD1419 28-Pin Flat pack package drawing (for reference only).
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Appendix C: Electrical Test Parameters and Conditions
All electrical tests for this device are performed on one of Radiation Assured Device’s LTS2020 Test
Systems. The LTS2020 Test System is a programmable parametric tester that provides parameter
measurements for a variety of digital, analog and mixed signal products including voltage regulators,
voltage comparators, D to A and A to D converters. The LTS2020 Test System achieves accuracy and
sensitivity through the use of software self-calibration and an internal relay matrix with separate family
boards and custom personality adapter boards. The tester uses this relay matrix to connect the required
test circuits, select the appropriate voltage / current sources and establish the needed measurement loops
for all the tests performed. The measured parameters and test conditions are shown in Table C.1.
A listing of the measurement precision/resolution for each parameter is shown in Table C.2. The
precision/resolution values were obtained either from test data or from the DAC resolution of the LTS2020. To generate the precision/resolution shown in Table C.2, one of the units-under-test was tested
repetitively (a total of 10-times with re-insertion between tests) to obtain the average test value and
standard deviation. Using this test data MIL-HDBK-814 90/90 KTL statistics were applied to the
measured standard deviation to generate the final measurement range. This value encompasses the
precision/resolution of all aspects of the test system, including the LTS2020 mainframe, family board,
socket assembly and DUT board as well as insertion error. In some cases, the measurement resolution is
limited by the internal DACs, which results in a measured standard deviation of zero. In these instances
the precision/resolution will be reported back as the LSB of the DAC.
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Table C.1. Measured parameters and test conditions for the RAD1419.
Parameter
Test Condition
Power Supply Current
Power Supply Current, Nap Mode
Power Supply Current, Sleep Mode
Power Supply Current
Power Supply Current, Nap Mode
Power Supply Current, Sleep Mode
VREF
VOL D0-D13
VOH D0-D13
VOH0p2MA_BUSY
IOZH D0-D13
IOZLVO D0-13
IIL CS
IIL RD
IIL SHDN
IIL CONVST
IIH CS
IIH RD
IIH SHDN
IIH CONVST
+Analog Input Leakage Current
-Analog Input Leakage Current
Bipolar Offset
Bipolar Gain (Full Scale) Error
Integral Linearity Error-Positive
Integral Linearity Error-Negative
Differential Linearity Error-Long
Differential Linearity Error-Short
SFDR
THD
SINAD
SHDN=VCC, CS=0
SHDN=0 CS=0
SHDN=0 CS=1
SHDN=1 CS=0
SHDN=0 CS=0
SHDN=0 CS=1
IOUT = 0
IOUT = 1.6mA
IOUT = –200μA
IOUT = –200μA
VOUT=5V, CS/ = High
VOUT=0V, CS/ = High
VIN=0V
VIN=0V
VIN=0V
VIN=0V
VIN=5V
VIN=5V
VIN=5V
VIN=5V
VIN=2.5V
VIN=-2.5V
VDD = 5V, VSS = – 5V
VDD = 5V, VSS = – 5V
VDD = 5V, VSS = – 5V
VDD = 5V, VSS = – 5V
VDD = 5V, VSS = – 5V
VDD = 5V, VSS = – 5V
100kHz Input Signal
100kHz Input Signal, First 5 Harmonics
100kHz Input Signal
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Table C.2.
Measured parameters, pre-irradiation specifications and measurement
resolution/precision for the RAD1419.
Parameter
Spec Min Spec Max
ICCSHDN=1CS=0
ICCSHDN=0CS=0
ICCSHDN=0CS=1
IEESHDN=1CS=0
IEESHDN=0CS=0
IEESHDN=0CS=1
VREF
VOL1p6MA_D0
VOL1p6MA_D1
VOL1p6MA_D2
VOL1p6MA_D3
VOL1p6MA_D4
VOL1p6MA_D5
VOL1p6MA_D6
VOL1p6MA_D7
VOL1p6MA_D8
VOL1p6MA_D9
VOL1p6MA_D10
VOL1p6MA_D11
VOL1p6MA_D12
VOL1p6MA_D13
VOH0p2MA_D0
VOH0p2MA_D1
VOH0p2MA_D2
VOH0p2MA_D3
VOH0p2MA_D4
VOH0p2MA_D5
VOH0p2MA_D6
VOH0p2MA_D7
VOH0p2MA_D8
VOH0p2MA_D9
VOH0p2MA_D10
VOH0p2MA_D11
VOH0p2MA_D12
VOH0p2MA_BUSY
2.00E-02
3.00E-03
3.00E-03
-3.00E-02
-5.00E-04
-1.00E-04
2.48E+00
4.00E+00
4.00E+00
4.00E+00
4.00E+00
4.00E+00
4.00E+00
4.00E+00
4.00E+00
4.00E+00
4.00E+00
4.00E+00
4.00E+00
4.00E+00
4.00E+00
2.52E+00
4.00E-01
4.00E-01
4.00E-01
4.00E-01
4.00E-01
4.00E-01
4.00E-01
4.00E-01
4.00E-01
4.00E-01
4.00E-01
4.00E-01
4.00E-01
4.00E-01
Precision
(stdev*2.065)
±6.14E-05
±8.71E-06
±1.07E-05
±5.40E-05
±8.26E-06
±1.81E-07
±9.67E-16
±1.63E-03
±1.46E-03
±1.75E-03
±1.63E-03
±1.17E-03
±1.63E-03
±1.39E-03
±1.52E-03
±1.17E-03
±1.52E-03
±1.52E-03
±1.31E-03
±1.17E-03
±1.52E-03
±4.27E-03
±3.99E-03
±4.35E-03
±3.99E-03
±3.99E-03
±3.48E-03
±4.27E-03
±3.48E-03
±3.48E-03
±4.27E-03
±2.61E-03
±1.00E-03
±1.00E-03
±1.00E-03
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VOH0p2MA_D13
IOZHVO=5V_D0
IOZHVO=5V_D1
IOZHVO=5V_D2
IOZHVO=5V_D3
IOZHVO=5V_D4
IOZHVO=5V_D5
IOZHVO=5V_D6
IOZHVO=5V_D7
IOZHVO=5V_D8
IOZHVO=5V_D9
IOZHVO=5V_D10
IOZHVO=5V_D11
IOZHVO=5V_D12
IOZHVO=5V_D13
IOZLVO=0V_D0
IOZLVO=0V_D1
IOZLVO=0V_D2
IOZLVO=0V_D3
IOZLVO=0V_D4
IOZLVO=0V_D5
IOZLVO=0V_D6
IOZLVO=0V_D7
IOZLVO=0V_D8
IOZLVO=0V_D9
IOZLVO=0V_D10
IOZLVO=0V_D11
IOZLVO=0V_D12
IOZLVO=0V_D13
IIL0V_CS
IIL0V_RD
IIL0V_SHDN
IIL0V_CONVST
IIH5V_CS
IIH5V_RD
IIH5V_SHDN
IIH5V_CONVST
IINp2p5VAIN
IINm2p5VAIN
BIPOLAROFFSET
BIPOLARGAINERROR
INT(p)NONmLIN
INT(m)NONmLIN
4.00E+00
-1.00E-05
-1.00E-05
-1.00E-05
-1.00E-05
-1.00E-05
-1.00E-05
-1.00E-05
-1.00E-05
-1.00E-05
-1.00E-05
-1.00E-05
-1.00E-05
-1.00E-05
-1.00E-05
-1.00E-05
-1.00E-05
-1.00E-05
-1.00E-05
-1.00E-05
-1.00E-05
-1.00E-05
-1.00E-05
-1.00E-05
-1.00E-05
-1.00E-05
-1.00E-05
-1.00E-05
-1.00E-05
-1.00E-05
-1.00E-05
-1.00E-05
-1.00E-05
-1.00E-05
-1.00E-05
-1.00E-05
-1.00E-05
-1.00E-06
-1.00E-06
-2.00E+01
-6.00E+01
-2.00E+00
1.00E-05
1.00E-05
1.00E-05
1.00E-05
1.00E-05
1.00E-05
1.00E-05
1.00E-05
1.00E-05
1.00E-05
1.00E-05
1.00E-05
1.00E-05
1.00E-05
1.00E-05
1.00E-05
1.00E-05
1.00E-05
1.00E-05
1.00E-05
1.00E-05
1.00E-05
1.00E-05
1.00E-05
1.00E-05
1.00E-05
1.00E-05
1.00E-05
1.00E-05
1.00E-05
1.00E-05
1.00E-05
1.00E-05
1.00E-05
1.00E-05
1.00E-05
1.00E-06
1.00E-06
2.00E+01
6.00E+01
2.00E+00
±3.48E-03
±2.95E-09
±5.22E-09
±3.54E-09
±3.52E-09
±3.92E-09
±4.89E-09
±4.87E-09
±5.08E-09
±6.06E-09
±5.78E-09
±3.65E-09
±5.06E-09
±4.27E-09
±4.91E-09
±3.48E-09
±4.89E-09
±3.89E-09
±3.43E-09
±4.27E-09
±3.26E-09
±3.57E-09
±2.27E-09
±2.58E-09
±3.43E-09
±3.40E-09
±2.39E-09
±2.83E-09
±3.65E-09
±3.48E-09
±2.76E-09
±3.38E-09
±1.63E-09
±1.63E-09
±2.93E-09
±1.44E-09
±3.62E-09
±4.65E-08
±4.15E-08
±1.65E-01
±2.43E-01
±1.79E-01
±1.34E-01
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CODEWIDTH(DNL)LONG
CODEWIDTH(DNL)SHORT
SFDR
THD
SINAD
1.00E+00
-5.00E+00
8.60E+01
2.50E+00
1.00E+00
-8.60E+01
7.80E+01
±2.04E-01
±9.99E-02
±3.96E+00
±4.10E-01
±1.14E-01
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Appendix D: List of Figures used in Section 5: Total Ionizing Dose Test Results
5.1
5.2
5.3
5.4
5.5
5.6
5.7
5.8
5.9
5.10
5.11
5.12
5.13
5.14
5.15
5.16
5.17
5.18
5.19
5.20
5.21
5.22
5.23
5.24
5.25
5.26
5.27
5.28
5.29
5.30
5.31
5.32
5.33
5.34
5.35
5.36
5.37
5.38
5.39
1_ICCSHDN=1CS=0 (A)
2_ICCSHDN=0CS=0 (A)
3_ICCSHDN=0CS=1 (A)
4_IEESHDN=1CS=0 (A)
5_IEESHDN=0CS=0 (A)
6_IEESHDN=0CS=1 (A)
7_VREF (V)
8_CONVERTTOmFS
9_VOL1p6MA_D0 (V)
10_VOL1p6MA_D1 (V)
11_VOL1p6MA_D2 (V)
12_VOL1p6MA_D3 (V)
13_VOL1p6MA_D4 (V)
14_VOL1p6MA_D5 (V)
15_VOL1p6MA_D6 (V)
16_VOL1p6MA_D7 (V)
17_VOL1p6MA_D8 (V)
18_VOL1p6MA_D9 (V)
19_VOL1p6MA_D10 (V)
20_VOL1p6MA_D11 (V)
21_VOL1p6MA_D12 (V)
22_VOL1p6MA_D13 (V)
23_CONVERTTOpFS
24_VOH0p2MA_D0 (V)
25_VOH0p2MA_D1 (V)
26_VOH0p2MA_D2 (V)
27_VOH0p2MA_D3 (V)
28_VOH0p2MA_D4 (V)
29_VOH0p2MA_D5 (V)
30_VOH0p2MA_D6 (V)
31_VOH0p2MA_D7 (V)
32_VOH0p2MA_D8 (V)
33_VOH0p2MA_D9 (V)
34_VOH0p2MA_D10 (V)
35_VOH0p2MA_D11 (V)
36_VOH0p2MA_D12 (V)
37_VOH0p2MA_BUSY (V)
38_VOH0p2MA_D13 (V)
39_IOZHVO=5V_D0 (A)
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5.40
5.41
5.42
5.43
5.44
5.45
5.46
5.47
5.48
5.49
5.50
5.51
5.52
5.53
5.54
5.55
5.56
5.57
5.1
5.2
5.3
5.4
5.5
5.6
5.7
5.8
5.9
5.10
5.11
5.12
5.13
5.14
5.15
5.16
5.17
5.18
5.19
5.20
5.21
5.22
5.23
40_IOZHVO=5V_D1 (A)
41_IOZHVO=5V_D2 (A)
42_IOZHVO=5V_D3 (A)
43_IOZHVO=5V_D4 (A)
44_IOZHVO=5V_D5 (A)
45_IOZHVO=5V_D6 (A)
46_IOZHVO=5V_D7 (A)
47_IOZHVO=5V_D8 (A)
48_IOZHVO=5V_D9 (A)
49_IOZHVO=5V_D10 (A)
50_IOZHVO=5V_D11 (A)
51_IOZHVO=5V_D12 (A)
52_IOZHVO=5V_D13 (A)
53_IOZLVO=0V_D0 (A)
54_IOZLVO=0V_D1 (A)
55_IOZLVO=0V_D2 (A)
56_IOZLVO=0V_D3 (A)
57_IOZLVO=0V_D4 (A)
1_ICCSHDN=1CS=0 (A)
2_ICCSHDN=0CS=0 (A)
3_ICCSHDN=0CS=1 (A)
4_IEESHDN=1CS=0 (A)
5_IEESHDN=0CS=0 (A)
6_IEESHDN=0CS=1 (A)
7_VREF (V)
9_VOL1p6MA_D0 (V)
10_VOL1p6MA_D1 (V)
11_VOL1p6MA_D2 (V)
12_VOL1p6MA_D3 (V)
13_VOL1p6MA_D4 (V)
14_VOL1p6MA_D5 (V)
15_VOL1p6MA_D6 (V)
16_VOL1p6MA_D7 (V)
17_VOL1p6MA_D8 (V)
18_VOL1p6MA_D9 (V)
19_VOL1p6MA_D10 (V)
20_VOL1p6MA_D11 (V)
21_VOL1p6MA_D12 (V)
22_VOL1p6MA_D13 (V)
24_VOH0p2MA_D0 (V)
25_VOH0p2MA_D1 (V)
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5.24
5.25
5.26
5.27
5.28
5.29
5.30
5.31
5.32
5.33
5.34
5.35
5.36
5.37
5.38
5.39
5.40
5.41
5.42
5.43
5.44
5.45
5.46
5.47
5.48
5.49
5.50
5.51
5.52
5.53
5.54
5.55
5.56
5.57
5.58
5.59
5.60
5.61
5.62
5.63
5.64
26_VOH0p2MA_D2 (V)
27_VOH0p2MA_D3 (V)
28_VOH0p2MA_D4 (V)
29_VOH0p2MA_D5 (V)
30_VOH0p2MA_D6 (V)
31_VOH0p2MA_D7 (V)
32_VOH0p2MA_D8 (V)
33_VOH0p2MA_D9 (V)
34_VOH0p2MA_D10 (V)
35_VOH0p2MA_D11 (V)
36_VOH0p2MA_D12 (V)
37_VOH0p2MA_BUSY (V)
38_VOH0p2MA_D13 (V)
39_IOZHVO=5V_D0 (A)
40_IOZHVO=5V_D1 (A)
41_IOZHVO=5V_D2 (A)
42_IOZHVO=5V_D3 (A)
43_IOZHVO=5V_D4 (A)
44_IOZHVO=5V_D5 (A)
45_IOZHVO=5V_D6 (A)
46_IOZHVO=5V_D7 (A)
47_IOZHVO=5V_D8 (A)
48_IOZHVO=5V_D9 (A)
49_IOZHVO=5V_D10 (A)
50_IOZHVO=5V_D11 (A)
51_IOZHVO=5V_D12 (A)
52_IOZHVO=5V_D13 (A)
53_IOZLVO=0V_D0 (A)
54_IOZLVO=0V_D1 (A)
55_IOZLVO=0V_D2 (A)
56_IOZLVO=0V_D3 (A)
57_IOZLVO=0V_D4 (A)
58_IOZLVO=0V_D5 (A)
59_IOZLVO=0V_D6 (A)
60_IOZLVO=0V_D7 (A)
61_IOZLVO=0V_D8 (A)
62_IOZLVO=0V_D9 (A)
63_IOZLVO=0V_D10 (A)
64_IOZLVO=0V_D11 (A)
65_IOZLVO=0V_D12 (A)
66_IOZLVO=0V_D13 (A)
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5.65
5.66
5.67
5.68
5.69
5.70
5.71
5.72
5.73
5.74
5.75
5.76
5.77
5.78
5.79
5.80
5.81
5.82
5.83
67_IIL0V_CS (A)
68_IIL0V_RD (A)
69_IIL0V_SHDN (A)
70_IIL0V_CONVST (A)
71_IIH5V_CS (A)
72_IIH5V_RD (A)
73_IIH5V_SHDN (A)
74_IIH5V_CONVST (A)
75_IINp2p5VAIN (A)
76_IINm2p5VAIN (A)
77_BIPOLAROFFSET (LSB)
78_BIPOLARGAINERROR (LSB)
79_INT(p)NONmLIN (LSB)
80_INT(m)NONmLIN (LSB)
81_CODEWIDTH(DNL)LONG (LSB)
82_CODEWIDTH(DNL)SHORT (LSB)
SFDR (dB)
SINAD (dB)
THD (dB)
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