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Final Product/Process Change Notification
Document # : FPCN20487XB
Issue Date: 10 February 2016
Title of Change:
SOT-553 package qualification of Assembly & Test in ON Semiconductor Leshan, China
Proposed first ship date:
17 May 2016
Contact information:
Contact your local ON Semiconductor Sales Office or <[email protected]>
Samples:
Contact your local ON Semiconductor Sales Office or <[email protected]>.
Additional Reliability Data:
Contact your local ON Semiconductor Sales Office or <[email protected]>.
Type of notification:
This is a Final Product/Process Change Notification (FPCN) sent to customers. FPCNs are issued 90 days prior
to implementation of the change.
ON Semiconductor will consider this change accepted, unless an inquiry is made in writing within 30 days of
delivery of this notice. To do so, contact <[email protected]>.
Change Part Identification:
Affected products from ON semiconductor with date code 1619 representing WW19, 2016 and greater may
be sourced from either the Seremban factory or the Leshan factory.
Change category:
☐ Wafer Fab Change
☒ Assembly Change
☒ Test Change
☐ Other _______________
Change Sub-Category(s):
☒ Manufacturing Site Change/Addition
☐ Manufacturing Process Change
☐ Material Change
☐ Product specific change
☐ Datasheet/Product Doc change
☐ Shipping/Packaging/Marking
☐ Other: _______________________
Sites Affected:
☐ All site(s)
☒ ON Semiconductor site(s) :
☐ External Foundry/Subcon site(s)
☐ not applicable
On Semiconductor Leshan Facility
Description and Purpose:
ON Semiconductor is notifying customers of the qualification and transfer of the assembly and test of SOT553 and SOT563 packages from ON
Semiconductor Seremban facility to ON Semiconductor Leshan facility.
The ON Semiconductor Leshan facility is certified with ISO/TS 16949:2009.
The bill of materials used in the SOT553 packages will remain the same between both ON Semiconductor’s Seremban and Leshan’s facilities.
Reliability qualification and full electrical characterization over temperature has been performed to ensure device functionality and electrical
specifications are met.
TEM001092 Rev. F
Page 1 of 4
Final Product/Process Change Notification
Document # : FPCN20487XB
Issue Date: 10 February 2016
Reliability Data Summary:
PACKAGE : SOT563
QV DEVICE NAME:
NST3906DXV6T1G Cu wire
Test
HTRB
HAST+PC
RSH
SD
DPA
Specification
JESD22-A108
JESD22-A110
JESD22- B106
JSTD002
Condition
Ta=150C,80% Rated Voltage
Ta=130 C RH=85%, ~18.8 psig, bias
Ta=260C, 10 sec, elec test
Ta=245C, 10 sec
per AEC Q101 post HAST 96 hrs
Interval
1008 hrs
96 hrs
Results
0/156
0/156
0/60
0/30
0/6
Interval
1008 hrs
96 hrs
Results
0/78
0/78
0/30
0/4
QV DEVICE NAME:
NST3906DXV6T1G Cu wire
Test
HTRB
HAST+PC
RSH
DPA
Specification
JESD22-A108
JESD22-A110
JESD22- B106
Condition
Ta=150C,80% Rated Voltage
Ta=130 C RH=85%, ~18.8 psig, bias
Ta=260C, 10 sec, elec test
per AEC Q101 post HAST 96 hrs
QV DEVICE NAME:
NSV12100XV6T1G Cu wire
Test
HAST+PC
HTRB
RSH
DPA
Specification
JESD22-A110
JESD22-A108
JESD22- B106
Condition
Ta=130 C RH=85%, ~18.8 psig, bias
Ta=150C,80% Rated Voltage
Ta=260C, 10 sec, elec test
per AEC Q101 post HAST 96 hrs
Interval
96 hrs
1008 hrs
Results
0/93
0/78
0/30
0/4
Specification
J-STD-020 JESD-A113
JESD22-A108
JESD22-A108
JESD22-A110
JESD22-A103
MIL-STD-750
(M1037)
AEC-Q101
JESD22-A104
JESD22- B106
JSTD002
Condition
Ta=121C, RH=100%, ~15psig
Ta=150C,80% Rated Voltage
Ta=150C,80% Rated Voltage
Ta=130 C RH=85%, ~18.8 psig, bias
Ta=150C
Interval
96 hrs
1008 hrs
1008 hrs
96 hrs
1512 hrs
Results
0/84
0/84
0/84
0/89
0/89
Ta=25C, delta TJ = 100C Ton=Toff =
2min
15000 cyc
0/84
2000 cyc
0/84
0/30
0/15
0/2
0/2
QV DEVICE NAME:
NTZD3155CT1H Cu wire
Test
Autoclave+PC
HTRB
HTGB
HAST+PC
HTSL
IOL
TC
RSH
SD
DPA
DPA
TEM001092 Rev. F
Ta= -65/150C
Ta=260C, 10 sec, elec test
Ta=245C, 10 sec
per AEC Q101 post TC 1k cyc
per AEC Q101 post HAST 96hrs
Page 2 of 4
Final Product/Process Change Notification
Document # : FPCN20487XB
Issue Date: 10 February 2016
QV DEVICE NAME:
NUF2230XV6T1G Cu wire
Test
Autoclave+PC
HTRB
HTSL
IOL
TC
RSH
SD
DPA
DPA
Specification
J-STD-020 JESD-A113
JESD22-A108
JESD22-A103
MIL-STD-750
(M1037)
AEC-Q101
JESD22-A104
JESD22- B106
JSTD002
Condition
Ta=121C, RH=100%, ~15psig
Ta=150C,80% Rated Voltage
Ta=150C
Interval
96 hrs
1008 hrs
1512 hrs
Results
0/84
0/84
0/89
Ta=25C, delta TJ = 100C Ton=Toff =
2min
15000 cyc
0/84
Ta= -55/150C
Ta=260C, 10 sec, elec test
Ta=245C, 10 sec
per AEC Q101 post TC 1k cyc
per AEC Q101 post HAST 96hrs
2000 cyc
0/84
0/30
0/15
0/2
0/2
Specification
J-STD-020 JESD-A113
JESD22-A110
JESD22-A108
JESD22-A103
JESD22-A104
JESD22- B106
JSTD002
Condition
Ta=121C, RH=100%, ~15psig
Ta=130 C RH=85%, ~18.8 psig, bias
Ta=150C,80% Rated Voltage
Ta=150C
Ta= -65/150C
Ta=260C, 10 sec, elec test
Ta=245C, 10 sec
per AEC Q101 post TC 1k cyc
per AEC Q101 post HAST 96hrs
Interval
96 hrs
96 hrs
1008 hrs
1512 hrs
2000 cyc
Results
0/84
0/89
0/84
0/89
0/84
0/30
0/15
0/2
0/2
Specification
JESD22-A108
JESD22-A108
J-STD-020 JESD-A113
JESD22-A110
JESD22-A103
MIL-STD-750
(M1037)
AEC-Q101
JESD22-A104
JESD22- B106
JSTD002
Condition
Ta=150C,80% Rated Voltage
Ta=150C,80% Rated Voltage
Ta=121C, RH=100%, ~15psig
Ta=130 C RH=85%, ~18.8 psig, bias
Ta=150C
Interval
1008 hrs
1008 hrs
96 hrs
96 hrs
1512 hrs
Results
0/84
0/84
0/84
0/89
0/89
Ta=25C, delta TJ = 100C Ton=Toff =
2min
15000 cyc
0/84
2000 cyc
0/84
0/30
0/15
0/2
0/2
QV DEVICE NAME:
NUP5120X6T1G Cu wire
Test
Autoclave+PC
HAST+PC
HTRB
HTSL
TC
RSH
SD
DPA
DPA
QV DEVICE NAME:
NTZS3151PT1G Cu wire
Test
HTRB
HTGB
Autoclave+PC
HAST+PC
HTSL
IOL
TC
RSH
SD
DPA
DPA
TEM001092 Rev. F
Ta= -65/150C
Ta=260C, 10 sec, elec test
Ta=245C, 10 sec
per AEC Q101 post TC 1k cyc
per AEC Q101 post HAST 96hrs
Page 3 of 4
Final Product/Process Change Notification
Document # : FPCN20487XB
Issue Date: 10 February 2016
PACKAGE : SOT553
QV DEVICE NAME:
NL17SZ126XV5T2G
Test
HTOL
HTSL
TC
HAST+PC
uHAST+PC
RSH
SD
DPA
DPA
Specification
JESD22-A108
JESD22-A103
JESD22-A104
JESD22-A110
JESD22-A118
JESD22- B106
JSTD002
Condition
Tj=150C, Vcc=5.5V
Ta=150C
Ta= -65/150C
Ta130C RH=85%, ~18.8 psig, bias
Ta130C RH=85%, ~18.8 psig, unbias
Ta=260C, 10 sec, elec test
Ta = 245C, 10 sec
per AEC Q101 post TC 500 cyc
per AEC Q101 post HAST 96hrs
Interval
1008 hrs
1008 hrs
1000 cyc
96 hrs
96 hrs
Electrical Characteristic Summary:
Electrical characteristics are not impacted.
List of Affected Standard Parts:
Part Number
TEM001092 Rev. F
Qualification Vehicle
NL17SZ14XV5T2G
NL17SZ126XV5T2G
NL17SZ17XV5T2G
NL17SZ126XV5T2G
NL17SZU04XV5T2G
NL17SZ126XV5T2G
Page 4 of 4
Results
0/84
0/84
0/84
0/84
0/84
0/30
0/15
0/2
0/5