PHILIPS LPC11C12FBD48/301

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32-bit ARM Cortex-M0 microcontroller; 16/32 kB flash, 8 kB
SRAM; C_CAN
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Preliminary data sheet
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Rev. 00.05 — 6 May 2010
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LPC11C12/C14
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1. General description
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The LPC11C12/C14 operate at CPU frequencies of up to 50 MHz.
The peripheral complement of the LPC11C12/C14 includes 16/32 kB of flash memory,
8 kB of data memory, one C_CAN controller, one Fast-mode Plus I2C-bus interface, one
RS-485/EIA-485 UART, two SPI interfaces with SSP features, four general purpose
counter/timers, a 10-bit ADC, and 40 general purpose I/O pins.
On-chip C_CAN drivers and flash In-System Programming tools via C_CAN are included.
2. Features and benefits
„ System:
‹ ARM Cortex-M0 processor, running at frequencies of up to 50 MHz.
‹ ARM Cortex-M0 built-in Nested Vectored Interrupt Controller (NVIC).
‹ Serial Wire Debug.
‹ System tick timer.
„ Memory:
‹ 32 kB (LPC11C14) or 16 kB (LPC11C12) on-chip flash programming memory.
‹ 8 kB SRAM.
‹ In-System Programming (ISP) and In-Application Programming (IAP) via on-chip
bootloader software.
‹ Flash ISP commands can be issued via UART or C_CAN.
„ Digital peripherals:
‹ 40 General Purpose I/O (GPIO) pins with configurable pull-up/pull-down resistors.
‹ GPIO pins can be used as edge and level sensitive interrupt sources.
‹ High-current output driver (20 mA) on one pin.
‹ High-current sink drivers (20 mA) on two I2C-bus pins in Fast-mode Plus.
‹ Four general purpose counter/timers with a total of four capture inputs and 13
match outputs.
‹ Programmable WatchDog Timer (WDT).
„ Analog peripherals:
‹ 10-bit ADC with input multiplexing among 8 pins.
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The LPC11C12/C14 are an ARM Cortex-M0 based, low-cost 32-bit MCU family, designed
for 8/16-bit microcontroller applications, offering performance, low power, simple
instruction set and memory addressing together with reduced code size compared to
existing 8/16-bit architectures.
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LPC11C12/C14
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NXP Semiconductors
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„ Serial interfaces:
‹ UART with fractional baud rate generation, internal FIFO, and RS-485 support.
‹ Two SPI controllers with SSP features and with FIFO and multi-protocol
capabilities.
‹ I2C-bus interface supporting full I2C-bus specification and Fast-mode Plus with a
data rate of 1 Mbit/s with multiple address recognition and monitor mode.
‹ C_CAN controller. On-chip C_CAN drivers included.
„ Clock generation:
‹ 12 MHz internal RC oscillator trimmed to 1 % accuracy that can optionally be used
as a system clock.
‹ Crystal oscillator with an operating range of 1 MHz to 25 MHz.
‹ Programmable watchdog oscillator with a frequency range of 7.8 kHz to 1.8 MHz.
‹ PLL allows CPU operation up to the maximum CPU rate without the need for a
high-frequency crystal. May be run from the system oscillator or the internal RC
oscillator.
‹ Clock output function with divider that can reflect the system oscillator, IRC, CPU
clock, or the Watchdog clock.
„ Power control:
‹ Integrated PMU (Power Management Unit) to minimize power consumption during
Sleep, Deep-sleep, and Deep power-down modes.
‹ Three reduced power modes: Sleep, Deep-sleep, and Deep power-down.
‹ Processor wake-up from Deep-sleep mode via a dedicated start logic using 13 of
the GPIO pins.
‹ Power-On Reset (POR).
‹ Brownout detect with four separate thresholds for interrupt and forced reset.
„ Unique device serial number for identification.
„ Single 3.3 V power supply (1.8 V to 3.6 V).
„ Available as 48-pin LQFP package.
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Table 1.
Ordering information
Type number
Package
Name
Description
LPC11C12FBD48/301
LQFP48
LQFP48: plastic low profile quad flat package; 48 leads; body 7 × 7 × sot313-2
1.4 mm
LPC11C14FBD48/301
LQFP48
LQFP48: plastic low profile quad flat package; 48 leads; body 7 × 7 × sot313-2
1.4 mm
LPC11C12_C14_0
Preliminary data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
Version
© NXP B.V. 2010. All rights reserved.
2 of 49
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4. Ordering information
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„ Industrial and sensor based networks
„ White goods
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„ eMetering
„ Elevator systems
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3. Applications
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Flash
Total
SRAM
UART
RS-485
I2C/
Fast+
SPI
C_CAN
ADC
channels
Package
LPC11C12FBD48/301
16 kB
8 kB
1
1
2
1
8
LQFP48
LPC11C14FBD48/301
32 kB
8 kB
1
1
2
1
8
LQFP48
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Type number
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Ordering options
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4.1 Ordering options
Table 2.
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LPC11C12/C14
NXP Semiconductors
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5. Block diagram
XTALIN
XTALOUT
RESET
SWD
LPC11C12/C14
IRC
TEST/DEBUG
INTERFACE
CLOCK
GENERATION,
POWER CONTROL,
SYSTEM
FUNCTIONS
POR
ARM
CORTEX-M0
system bus
clocks and
controls
FLASH
16/32 kB
slave
GPIO ports
PIO0/1/2/3
HIGH-SPEED
GPIO
CLKOUT
SRAM
8 kB
slave
ROM
slave
slave
AHB-LITE BUS
slave
AHB TO APB
BRIDGE
RXD
TXD
DTR, DSR, CTS,
DCD, RI, RTS
CT32B0_MAT[3:0]
CT32B0_CAP0
CT32B1_MAT[3:0]
CT32B1_CAP0
CT16B0_MAT[2:0]
CT16B0_CAP0
CT16B1_MAT[1:0]
CT16B1_CAP0
CAN_TXD
CAN_RXD
UART
AD[7:0]
10-bit ADC
SPI0
SCK0, SSEL0
MISO0, MOSI0
SPI1
SCK1, SSEL1
MISO1, MOSI1
32-bit COUNTER/TIMER 0
32-bit COUNTER/TIMER 1
SCL
SDA
I2C-BUS
16-bit COUNTER/TIMER 0
WDT
16-bit COUNTER/TIMER 1
IOCONFIG
C_CAN
SYSTEM CONTROL
PMU
002aaf265
Fig 1.
LPC11C12/C14 block diagram
LPC11C12_C14_0
Preliminary data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
© NXP B.V. 2010. All rights reserved.
3 of 49
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6.1 Pinning
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6. Pinning information
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LPC11C12/C14
NXP Semiconductors
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37 PIO3_1/DSR
38 PIO2_3/RI/MOSI1
39 SWDIO/PIO1_3/AD4/CT32B1_MAT2
40 PIO1_4/AD5/CT32B1_MAT3/WAKEUP
41 VSS
42 PIO1_11/AD7
43 PIO3_2/DCD
44 VDD
A
45 PIO1_5/RTS/CT32B0_CAP0
R
46 PIO1_6/RXD/CT32B0_MAT0
D
47 PIO1_7/TXD/CT32B0_MAT1
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48 PIO3_3/RI
A
PIO2_6
1
36 PIO3_0/DTR
PIO2_0/DTR/SSEL1
2
35 R/PIO1_2/AD3/CT32B1_MAT1
RESET/PIO0_0
3
34 R/PIO1_1/AD2/CT32B1_MAT0
PIO0_1/CLKOUT/CT32B0_MAT2
4
33 R/PIO1_0/AD1/CT32B1_CAP0
VSS
5
XTALIN
6
XTALOUT
7
VDD
8
29 SWCLK/PIO0_10/SCK0/CT16B0_MAT2
PIO1_8/CT16B1_CAP0
9
28 PIO0_9/MOSI0/CT16B0_MAT1
PIO0_2/SSEL0/CT16B0_CAP0 10
27 PIO0_8/MISO0/CT16B0_MAT0
32 R/PIO0_11/AD0/CT32B0_MAT3
30 PIO1_10/AD6/CT16B1_MAT1
PIO2_9 24
PIO0_7/CTS 23
PIO0_6/SCK0 22
PIO2_5 21
CAN_TXD 20
CAN_RXD 19
PIO2_4 18
PIO1_9/CT16B1_MAT0 17
PIO0_5/SDA 16
25 PIO2_10
PIO0_4/SCL 15
26 PIO2_2/DCD/MISO1
PIO2_8 12
PIO0_3 14
PIO2_7 11
PIO2_1/DSR/SCK1 13
Fig 2.
31 PIO2_11/SCK0
LPC11C12FBD48/301
LPC11C14FBD48/301
002aaf266
Pin configuration LQFP48 package
LPC11C12_C14_0
Preliminary data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
© NXP B.V. 2010. All rights reserved.
4 of 49
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Description
I/O
Port 0 — Port 0 is a 12-bit I/O port with individual direction and function
controls for each bit. The operation of port 0 pins depends on the function
selected through the IOCONFIG register block.
I
RESET — External reset input: A LOW on this pin resets the device,
causing I/O ports and peripherals to take on their default states, and
processor execution to begin at address 0.
I/O
PIO0_0 — General purpose digital input/output pin.
I/O
PIO0_1 — General purpose digital input/output pin. A LOW level on this pin
during reset starts the flash ISP command handler via UART (if PIO0_3 is
HIGH) or via C_CAN (if PIO0_3 is LOW).
O
CLKOUT — Clockout pin.
O
CT32B0_MAT2 — Match output 2 for 32-bit timer 0.
I/O
PIO0_2 — General purpose digital input/output pin.
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PIO0_0 to PIO0_11
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Pin
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LPC11C14 pin description table (LQFP48 package)
Symbol
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6.2 Pin description
Table 3.
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LPC11C12/C14
NXP Semiconductors
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3[1][2]
PIO0_1/CLKOUT/
CT32B0_MAT2
4[3][2]
PIO0_2/SSEL0/
CT16B0_CAP0
10[3][2]
O
SSEL0 — Slave Select for SPI0.
I
CT16B0_CAP0 — Capture input 0 for 16-bit timer 0.
A
RESET/PIO0_0
PIO0_3
14[3][2]
I/O
PIO0_3 — General purpose digital input/output pin. This pin is monitored
during reset: Together with a LOW level on pin PIO0_1, a LOW level starts
the flash ISP command handler via C_CAN and a HIGH level starts the
flash ISP command handler via UART.
PIO0_4/SCL
15[4][2]
I/O
PIO0_4 — General purpose digital input/output pin (open-drain).
I/O
SCL — I2C-bus, open-drain clock input/output. High-current sink only if I2C
Fast-mode Plus is selected in the I/O configuration register.
I/O
PIO0_5 — General purpose digital input/output pin (open-drain).
I/O
SDA — I2C-bus, open-drain data input/output. High-current sink only if I2C
Fast-mode Plus is selected in the I/O configuration register.
I/O
PIO0_6 — General purpose digital input/output pin.
I/O
SCK0 — Serial clock for SPI0.
PIO0_7/CTS
23[3][2]
I/O
PIO0_7 — General purpose digital input/output pin (high-current output
driver).
I
CTS — Clear To Send input for UART.
PIO0_8/MISO0/
CT16B0_MAT0
27[3][2]
I/O
PIO0_8 — General purpose digital input/output pin.
I/O
MISO0 — Master In Slave Out for SPI0.
O
CT16B0_MAT0 — Match output 0 for 16-bit timer 0.
PIO0_9/MOSI0/
CT16B0_MAT1
28[3][2]
I/O
PIO0_9 — General purpose digital input/output pin.
I/O
MOSI0 — Master Out Slave In for SPI0.
O
CT16B0_MAT1 — Match output 1 for 16-bit timer 0.
SWCLK/PIO0_10/
SCK0/CT16B0_MAT2
29[3][2]
I
SWCLK — Serial wire clock.
PIO0_5/SDA
PIO0_6/SCK0
LPC11C12_C14_0
Preliminary data sheet
16[4][2]
22[3][2]
I/O
PIO0_10 — General purpose digital input/output pin.
I/O
SCK0 — Serial clock for SPI0.
O
CT16B0_MAT2 — Match output 2 for 16-bit timer 0.
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
© NXP B.V. 2010. All rights reserved.
5 of 49
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Pin
Type
Description
R/PIO0_11/
AD0/CT32B0_MAT3
32[5][2]
I
R — Reserved. Configure for an alternate function in the IOCONFIG block.
I/O
PIO0_11 — General purpose digital input/output pin.
I
AD0 — A/D converter, input 0.
O
CT32B0_MAT3 — Match output 3 for 32-bit timer 0.
I/O
Port 1 — Port 1 is a 12-bit I/O port with individual direction and function
controls for each bit. The operation of port 1 pins depends on the function
selected through the IOCONFIG register block.
I
R — Reserved. Configure for an alternate function in the IOCONFIG block.
I/O
PIO1_0 — General purpose digital input/output pin.
I
AD1 — A/D converter, input 1.
I
CT32B1_CAP0 — Capture input 0 for 32-bit timer 1.
O
R — Reserved. Configure for an alternate function in the IOCONFIG block.
I/O
PIO1_1 — General purpose digital input/output pin.
I
AD2 — A/D converter, input 2.
O
CT32B1_MAT0 — Match output 0 for 32-bit timer 1.
I
R — Reserved. Configure for an alternate function in the IOCONFIG block.
I/O
PIO1_2 — General purpose digital input/output pin.
I
AD3 — A/D converter, input 3.
O
CT32B1_MAT1 — Match output 1 for 32-bit timer 1.
I/O
SWDIO — Serial wire debug input/output.
I/O
PIO1_3 — General purpose digital input/output pin.
I
AD4 — A/D converter, input 4.
O
CT32B1_MAT2 — Match output 2 for 32-bit timer 1.
I/O
PIO1_4 — General purpose digital input/output pin.
I
AD5 — A/D converter, input 5.
O
CT32B1_MAT3 — Match output 3 for 32-bit timer 1.
I
WAKEUP — Deep power-down mode wake-up pin. This pin must be pulled
HIGH externally to enter Deep power-down mode and pulled LOW to exit
Deep power-down mode.
I/O
PIO1_5 — General purpose digital input/output pin.
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Symbol
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LPC11C14 pin description table (LQFP48 package) …continued
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Table 3.
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LPC11C12/C14
NXP Semiconductors
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R/PIO1_0/
AD1/CT32B1_CAP0
R/PIO1_1/
AD2/CT32B1_MAT0
R/PIO1_2/
AD3/CT32B1_MAT1
SWDIO/PIO1_3/AD4/
CT32B1_MAT2
33[5][2]
34[5]
35[5]
39[5]
PIO1_4/AD5/
40[5]
CT32B1_MAT3/WAKEUP
PIO1_5/RTS/
CT32B0_CAP0
45[3]
PIO1_6/RXD/
CT32B0_MAT0
46[3]
PIO1_7/TXD/
CT32B0_MAT1
47[3]
PIO1_8/CT16B1_CAP0
9[3]
PIO1_9/CT16B1_MAT0
LPC11C12_C14_0
Preliminary data sheet
17[3]
O
RTS — Request To Send output for UART.
I
CT32B0_CAP0 — Capture input 0 for 32-bit timer 0.
I/O
PIO1_6 — General purpose digital input/output pin.
I
RXD — Receiver input for UART.
O
CT32B0_MAT0 — Match output 0 for 32-bit timer 0.
I/O
PIO1_7 — General purpose digital input/output pin.
O
TXD — Transmitter output for UART.
O
CT32B0_MAT1 — Match output 1 for 32-bit timer 0.
I/O
PIO1_8 — General purpose digital input/output pin.
I
CT16B1_CAP0 — Capture input 0 for 16-bit timer 1.
I/O
PIO1_9 — General purpose digital input/output pin.
O
CT16B1_MAT0 — Match output 0 for 16-bit timer 1.
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
© NXP B.V. 2010. All rights reserved.
6 of 49
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PIO1_0 to PIO1_11
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Pin
Type
Description
PIO1_10/AD6/
CT16B1_MAT1
30[5]
I/O
PIO1_10 — General purpose digital input/output pin.
I
AD6 — A/D converter, input 6.
O
CT16B1_MAT1 — Match output 1 for 16-bit timer 1.
PIO1_11/AD7
42[5]
I/O
PIO1_11 — General purpose digital input/output pin.
I
AD7 — A/D converter, input 7.
I/O
Port 2 — Port 2 is a 12-bit I/O port with individual direction and function
controls for each bit. The operation of port 2 pins depends on the function
selected through the IOCONFIG register block.
I/O
PIO2_0 — General purpose digital input/output pin.
O
DTR — Data Terminal Ready output for UART.
F
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Symbol
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R
R
D
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LPC11C14 pin description table (LQFP48 package) …continued
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Table 3.
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LPC11C12/C14
NXP Semiconductors
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PIO2_0/DTR/SSEL1
PIO2_1/DSR/SCK1
PIO2_2/DCD/MISO1
PIO2_3/RI/MOSI1
2[3]
13[3]
26[3]
38[3]
O
SSEL1 — Slave Select for SPI1.
I/O
PIO2_1 — General purpose digital input/output pin.
I
DSR — Data Set Ready input for UART.
I/O
SCK1 — Serial clock for SPI1.
I/O
PIO2_2 — General purpose digital input/output pin.
I
DCD — Data Carrier Detect input for UART.
I/O
MISO1 — Master In Slave Out for SPI1.
I/O
PIO2_3 — General purpose digital input/output pin.
I
RI — Ring Indicator input for UART.
I/O
MOSI1 — Master Out Slave In for SPI1.
A
PIO2_0 to PIO2_11
PIO2_4
18[3]
I/O
PIO2_4 — General purpose digital input/output pin.
PIO2_5
21[3]
I/O
PIO2_5 — General purpose digital input/output pin.
PIO2_6
1[3]
I/O
PIO2_6 — General purpose digital input/output pin.
PIO2_7
11[3]
I/O
PIO2_7 — General purpose digital input/output pin.
PIO2_8
12[3]
I/O
PIO2_8 — General purpose digital input/output pin.
PIO2_9
24[3]
I/O
PIO2_9 — General purpose digital input/output pin.
PIO2_10
25[3]
I/O
PIO2_10 — General purpose digital input/output pin.
PIO2_11/SCK0
31[3]
I/O
PIO2_11 — General purpose digital input/output pin.
I/O
SCK0 — Serial clock for SPI0.
I/O
Port 3 — Port 3 is a 12-bit I/O port with individual direction and function
controls for each bit. The operation of port 3 pins depends on the function
selected through the IOCONFIG register block. Pins PIO3_6 to PIO3_11
are not available.
PIO3_0 to PIO3_5
PIO3_0/DTR
36[3]
I/O
PIO3_0 — General purpose digital input/output pin.
O
DTR — Data Terminal Ready output for UART.
PIO3_1/DSR
37[3]
I/O
PIO3_1 — General purpose digital input/output pin.
I
DSR — Data Set Ready input for UART.
PIO3_2/DCD
43[3]
I/O
PIO3_2 — General purpose digital input/output pin.
I
DCD — Data Carrier Detect input for UART.
PIO3_3/RI
48[3]
I/O
PIO3_3 — General purpose digital input/output pin.
I
RI — Ring Indicator input for UART.
CAN_RXD
19[6]
I
CAN_RXD — C_CAN receive data input.
LPC11C12_C14_0
Preliminary data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
© NXP B.V. 2010. All rights reserved.
7 of 49
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A
A
FT
FT
FT
FT
A
A
R
R
D
D
D
D
R
R
A
FT
FT
FT
A
A
R
R
D
D
D
R
Pin
Type
Description
CAN_TXD
20[6]
O
CAN_TXD — C_CAN transmit data output.
VDD
8;44
I
Supply voltage to the internal regulator, the external rail, and the ADC. Also
used as the ADC reference voltage.
XTALIN
6[7]
I
Input to the oscillator circuit and internal clock generator circuits. Input
voltage must not exceed 1.8 V.
XTALOUT
7[7]
O
Output from the oscillator amplifier.
VSS
5; 41
I
Ground.
F
FT
FT
Symbol
A
A
A
R
R
D
D
D
LPC11C14 pin description table (LQFP48 package) …continued
FT
FT
FT
FT
Table 3.
D
D
D
D
D
LPC11C12/C14
NXP Semiconductors
D
FT
FT
A
A
R
R
D
D
D
R
A
FT
D
R
A
[1]
See Figure 25 for reset pad configuration. RESET functionality is not available in Deep power-down mode. Use the WAKEUP pin to
reset the chip and wake up from Deep power-down mode.
[2]
Serves as Deep-sleep wake-up input pin to the start logic independently of selected pin function (see the LPC111x/11C1x user manual).
[3]
5 V tolerant pad providing digital I/O functions with configurable pull-up/pull-down resistors and configurable hysteresis (see Figure 24).
[4]
I2C-bus pads compliant with the I2C-bus specification for I2C standard mode and I2C Fast-mode Plus.
[5]
5 V tolerant pad providing digital I/O functions with configurable pull-up/pull-down resistors, configurable hysteresis, and analog input.
When configured as a ADC input, digital section of the pad is disabled and the pin is not 5 V tolerant (see Figure 24).
[6]
5 V tolerant digital I/O pad without pull-up/pull-down resistors.
[7]
When the system oscillator is not used, connect XTALIN and XTALOUT as follows: XTALIN can be left floating or can be grounded
(grounding is preferred to reduce susceptibility to noise). XTALOUT should be left floating.
LPC11C12_C14_0
Preliminary data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
© NXP B.V. 2010. All rights reserved.
8 of 49
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R
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A
A
A
A
D
R
R
A
A
FT
FT
FT
FT
A
A
R
R
D
D
D
D
R
R
A
FT
FT
FT
A
A
R
R
D
D
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F
D
FT
FT
A
A
R
R
D
7.1 ARM Cortex-M0 processor
A
FT
FT
A
A
R
R
D
D
D
7. Functional description
FT
FT
FT
FT
FT
LPC11C12/C14
NXP Semiconductors
D
D
R
The ARM Cortex-M0 is a general purpose, 32-bit microprocessor, which offers high
performance and very low power consumption.
A
FT
D
R
A
7.2 On-chip flash program memory
The LPC11C12/C14 contain 32 kB (LPC11C14) or 16 kB (LPC11C12) of on-chip flash
memory.
7.3 On-chip SRAM
The LPC11C12/C14 contain a total of 8 kB on-chip static RAM memory.
7.4 Memory map
The LPC11C12/C14 incorporates several distinct memory regions, shown in the following
figures. Figure 3 shows the overall map of the entire address space from the user
program viewpoint following reset. The interrupt vector area supports address remapping.
The AHB peripheral area is 2 megabyte in size, and is divided to allow for up to 128
peripherals. The APB peripheral area is 512 kB in size and is divided to allow for up to 32
peripherals. Each peripheral of either type is allocated 16 kilobytes of space. This allows
simplifying the address decoding for each peripheral.
LPC11C12_C14_0
Preliminary data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
© NXP B.V. 2010. All rights reserved.
9 of 49
R
R
R
R
R
A
A
A
A
A
FT
FT
FT
FT
FT
D
R
R
A
A
FT
FT
FT
FT
A
A
R
R
D
D
D
D
R
R
A
FT
FT
FT
A
A
R
R
D
D
D
R
F
0x5020 0000
D
FT
FT
A
A
R
R
D
0xFFFF FFFF
A
FT
FT
A
A
R
R
D
D
D
AHB peripherals
LPC11C12/C14
4 GB
D
D
D
D
D
LPC11C12/C14
NXP Semiconductors
D
D
127- 4 reserved
R
A
reserved
FT
0x5004 0000
GPIO PIO2
1
GPIO PIO1
0
GPIO PIO0
APB peripherals
reserved
0x5003 0000
A
0x5000 0000
2
R
AHB peripherals
GPIO PIO3
D
0x5020 0000
3
0x5002 0000
0x5001 0000
0x5000 0000
0x4008 0000
23 - 31 reserved
0x4005 C000
APB peripherals
1 GB
SPI1
22
0x4008 0000
0x4005 4000
C_CAN
20
reserved
reserved
0x2000 0000
0.5 GB
18
system control
17
IOCONFIG
16
15
SPI0
flash controller
14
PMU
reserved
reserved
0x1000 2000
0x1000 0000
reserved
0x0000 8000
32 kB on-chip flash (LPC11C14)
16 kB on-chip flash (LPC11C12)
0 GB
0x0000 4000
0x4004 C000
0x4004 8000
0x4004 4000
0x4004 0000
0x4003 C000
0x4003 8000
0x4002 8000
0x1FFF 0000
8 kB SRAM
0x4005 0000
10 - 13 reserved
0x1FFF 4000
16 kB boot ROM
0x4005 8000
reserved
0x4000 0000
9
reserved
8
reserved
0x4002 0000
7
ADC
0x4001 C000
6
32-bit counter/timer 1
0x4001 8000
5
32-bit counter/timer 0
0x4001 4000
4
16-bit counter/timer 1
0x4001 0000
3
16-bit counter/timer 0
0x4000 C000
2
UART
0x4000 8000
1
0
WDT
0x4000 4000
I2C-bus
0x4000 0000
+ 512 byte
active interrupt vectors
0x4002 4000
0x0000 0200
0x0000 0000
0x0000 0000
002aaf268
Fig 3.
LPC11C12/C14 memory map
7.5 Nested Vectored Interrupt Controller (NVIC)
The Nested Vectored Interrupt Controller (NVIC) is an integral part of the Cortex-M0. The
tight coupling to the CPU allows for low interrupt latency and efficient processing of late
arriving interrupts.
7.5.1 Features
• Controls system exceptions and peripheral interrupts.
• In the LPC11C12/C14, the NVIC supports 32 vectored interrupts including 13 inputs to
the start logic from individual GPIO pins.
LPC11C12_C14_0
Preliminary data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
© NXP B.V. 2010. All rights reserved.
10 of 49
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D
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R
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R
R
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A
A
A
A
FT
FT
FT
FT
FT
LPC11C12/C14
D
R
R
A
A
FT
FT
FT
FT
A
A
R
R
D
D
D
NXP Semiconductors
D
R
R
A
FT
FT
FT
A
A
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R
D
D
D
D
R
A
F
FT
FT
A
A
R
R
D
D
• Four programmable interrupt priority levels, with hardware priority level masking.
• Relocatable vector table.
• Software interrupt generation.
D
FT
FT
A
A
R
R
D
D
D
R
7.5.2 Interrupt sources
A
Peripherals should be connected to the appropriate pins prior to being activated and prior
to any related interrupt(s) being enabled. Activity of any enabled peripheral function that is
not mapped to a related pin should be considered undefined.
7.7 Fast general purpose parallel I/O
Device pins that are not connected to a specific peripheral function are controlled by the
GPIO registers. Pins may be dynamically configured as inputs or outputs. Multiple outputs
can be set or cleared in one write operation.
LPC11C12/C14 use accelerated GPIO functions:
• GPIO registers are a dedicated AHB peripheral so that the fastest possible I/O timing
can be achieved.
• Entire port value can be written in one instruction.
Additionally, any GPIO pin (total of 40 pins) providing a digital function can be
programmed to generate an interrupt on a level, a rising or falling edge, or both.
7.7.1 Features
• Bit level port registers allow a single instruction to set or clear any number of bits in
one write operation.
• Direction control of individual bits.
• All GPIO pins default to inputs with pull-ups enabled after reset except for the I2C-bus
true open-drain pins PIO0_4 and PIO0_5.
• Pull-up/pull-down resistor configuration can be programmed through the IOCONFIG
block for each GPIO pin (except PIO0_4 and PIO0_5).
7.8 UART
The LPC11C12/C14 contain one UART.
LPC11C12_C14_0
Preliminary data sheet
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Rev. 00.05 — 6 May 2010
© NXP B.V. 2010. All rights reserved.
11 of 49
A
The IOCONFIG block allows selected pins of the microcontroller to have more than one
function. Configuration registers control the multiplexers to allow connection between the
pin and the on-chip peripherals.
R
7.6 IOCONFIG block
D
Any GPIO pin (total of 40 pins) regardless of the selected function, can be programmed to
generate an interrupt on a level, or rising edge or falling edge, or both.
FT
Each peripheral device has one interrupt line connected to the NVIC but may have several
interrupt flags. Individual interrupt flags may also represent more than one interrupt
source.
D
D
R
R
R
R
R
D
D
D
A
A
A
A
A
FT
FT
FT
FT
FT
LPC11C12/C14
D
R
R
A
A
FT
FT
FT
FT
A
A
R
R
D
D
D
NXP Semiconductors
D
R
R
A
FT
FT
FT
A
A
R
R
D
D
D
D
R
F
D
FT
FT
A
A
R
R
D
D
D
The UART includes a fractional baud rate generator. Standard baud rates such as
115200 Bd can be achieved with any crystal frequency above 2 MHz.
A
FT
FT
A
A
R
R
D
D
Support for RS-485/9-bit mode allows both software address detection and automatic
address detection using 9-bit mode.
R
A
FT
D
7.8.1 Features
R
A
•
•
•
•
•
Maximum UART data bit rate of 3.125 MBit/s.
16 Byte Receive and Transmit FIFOs.
Register locations conform to 16C550 industry standard.
Receiver FIFO trigger points at 1 B, 4 B, 8 B, and 14 B.
Built-in fractional baud rate generator covering wide range of baud rates without a
need for external crystals of particular values.
• FIFO control mechanism that enables software flow control implementation.
• Support for RS-485/9-bit mode.
• Support for modem control.
7.9 SPI serial I/O controller
The LPC11C12/C14 contain two SPI controllers. Both SPI controllers support SSP
features.
The SPI controller is capable of operation on a SSP, 4-wire SSI, or Microwire bus. It can
interact with multiple masters and slaves on the bus. Only a single master and a single
slave can communicate on the bus during a given data transfer. The SPI supports full
duplex transfers, with frames of 4 bits to 16 bits of data flowing from the master to the
slave and from the slave to the master. In practice, often only one of these data flows
carries meaningful data.
7.9.1 Features
• Maximum SPI speed of 25 Mbit/s (master) or 4.17 Mbit/s (slave) (in SSP mode)
• Compatible with Motorola SPI, 4-wire Texas Instruments SSI, and National
Semiconductor Microwire buses
•
•
•
•
Synchronous serial communication
Master or slave operation
8-frame FIFOs for both transmit and receive
4-bit to 16-bit frame
7.10 I2C-bus serial I/O controller
The LPC11C12/C14 contain one I2C-bus controller.
The I2C-bus is bidirectional for inter-IC control using only two wires: a Serial Clock line
(SCL) and a Serial Data line (SDA). Each device is recognized by a unique address and
can operate as either a receiver-only device (e.g., an LCD driver) or a transmitter with the
capability to both receive and send information (such as memory). Transmitters and/or
LPC11C12_C14_0
Preliminary data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
© NXP B.V. 2010. All rights reserved.
12 of 49
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D
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R
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R
R
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A
A
A
A
FT
FT
FT
FT
FT
LPC11C12/C14
D
R
R
A
A
FT
FT
FT
FT
A
A
R
R
D
D
D
NXP Semiconductors
D
R
R
A
FT
FT
FT
A
A
R
R
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D
D
D
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A
F
FT
FT
A
A
R
R
D
D
receivers can operate in either master or slave mode, depending on whether the chip has
to initiate a data transfer or is only addressed. The I2C is a multi-master bus and can be
controlled by more than one bus master connected to it.
D
FT
FT
A
A
R
R
D
D
D
7.10.1 Features
R
A
R
A
•
•
•
•
•
Easy to configure as master, slave, or master/slave.
Programmable clocks allow versatile rate control.
Bidirectional data transfer between masters and slaves.
Multi-master bus (no central master).
Arbitration between simultaneously transmitting masters without corruption of serial
data on the bus.
• Serial clock synchronization allows devices with different bit rates to communicate via
one serial bus.
• Serial clock synchronization can be used as a handshake mechanism to suspend and
resume serial transfer.
• The I2C-bus can be used for test and diagnostic purposes.
• The I2C-bus controller supports multiple address recognition and a bus monitor mode.
7.11 C_CAN controller
Controller Area Network (CAN) is the definition of a high performance communication
protocol for serial data communication. The C_CAN controller is designed to provide a full
implementation of the CAN protocol according to the CAN Specification Version 2.0B. The
C_CAN controller allows to build powerful local networks with low-cost multiplex wiring by
supporting distributed real-time control with a very high level of security.
On-chip C_CAN drivers provide an API for initialization and communication using CAN
and CANopen standards.
7.11.1 Features
•
•
•
•
•
•
•
Conforms to protocol version 2.0 parts A and B.
Supports bit rate of up to 1 Mbit/s.
Supports 32 Message Objects.
Each Message Object has its own identifier mask.
Provides programmable FIFO mode (concatenation of Message Objects).
Provides maskable interrupts.
Supports Disabled Automatic Retransmission (DAR) mode for time-triggered CAN
applications.
• Provides programmable loop-back mode for self-test operation.
• The C_CAN API includes the following functions:
– C_CAN set-up and initialization
– C_CAN send and receive messages
LPC11C12_C14_0
Preliminary data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
D
I2C-bus interface also supports Fast-mode Plus with bit rates up to 1 Mbit/s.
FT
• The I2C-interface is a standard I2C-bus compliant interface with open-drain pins. The
© NXP B.V. 2010. All rights reserved.
13 of 49
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A
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A
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A
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A
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D
– CANopen SDO segmented communication primitives
R
A
FT
– CANopen SDO fall-back handler
D
R
• Flash ISP programming via C_CAN supported.
A
7.12 10-bit ADC
The LPC11C12/C14 contains one ADC. It is a single 10-bit successive approximation
ADC with eight channels.
7.12.1 Features
10-bit successive approximation ADC.
Input multiplexing among 8 pins.
Power-down mode.
Measurement range 0 V to VDD.
10-bit conversion time ≥ 2.44 μs.
Burst conversion mode for single or multiple inputs.
Optional conversion on transition of input pin or timer match signal.
Individual result registers for each ADC channel to reduce interrupt overhead.
7.13 General purpose external event counter/timers
The LPC11C12/C14 includes two 32-bit counter/timers and two 16-bit counter/timers. The
counter/timer is designed to count cycles of the system derived clock. It can optionally
generate interrupts or perform other actions at specified timer values, based on four
match registers. Each counter/timer also includes one capture input to trap the timer value
when an input signal transitions, optionally generating an interrupt.
7.13.1 Features
• A 32-bit/16-bit timer/counter with a programmable 32-bit/16-bit prescaler.
• Counter or timer operation.
• One capture channel per timer, that can take a snapshot of the timer value when an
input signal transitions. A capture event may also generate an interrupt.
• Four match registers per timer that allow:
– Continuous operation with optional interrupt generation on match.
– Stop timer on match with optional interrupt generation.
– Reset timer on match with optional interrupt generation.
• Up to four external outputs corresponding to match registers, with the following
capabilities:
– Set LOW on match.
– Set HIGH on match.
– Toggle on match.
LPC11C12_C14_0
Preliminary data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
F
D
D
– CANopen SDO expedited communication
A
FT
FT
A
A
R
R
D
D
D
– CANopen object dictionary
FT
FT
FT
FT
FT
– C_CAN status
•
•
•
•
•
•
•
•
A
A
A
A
A
LPC11C12/C14
NXP Semiconductors
© NXP B.V. 2010. All rights reserved.
14 of 49
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A
A
A
A
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R
A
A
FT
FT
FT
FT
A
A
R
R
D
D
D
D
A
FT
R
A
F
FT
FT
A
A
R
R
D
D
D
D
FT
FT
A
A
R
R
D
7.14 System tick timer
R
R
FT
FT
A
A
R
R
D
D
D
– Do nothing on match.
FT
FT
FT
FT
FT
LPC11C12/C14
NXP Semiconductors
D
D
The ARM Cortex-M0 includes a system tick timer (SYSTICK) that is intended to generate
a dedicated SYSTICK exception at a fixed time interval (typically 10 ms).
R
A
FT
D
R
A
7.15 Watchdog timer
The purpose of the watchdog is to reset the microcontroller within a selectable time
period.
7.15.1 Features
• Internally resets chip if not periodically reloaded.
• Debug mode.
• Enabled by software but requires a hardware reset or a watchdog reset/interrupt to be
disabled.
•
•
•
•
Incorrect/Incomplete feed sequence causes reset/interrupt if enabled.
Flag to indicate watchdog reset.
Programmable 32-bit timer with internal prescaler.
Selectable time period from (Tcy(WDCLK) × 256 × 4) to (Tcy(WDCLK) × 232 × 4) in
multiples of Tcy(WDCLK) × 4.
• The Watchdog Clock (WDCLK) source can be selected from the Internal RC oscillator
(IRC), the Watchdog oscillator, or the main clock. This gives a wide range of potential
timing choices of Watchdog operation under different power reduction conditions. It
also provides the ability to run the WDT from an entirely internal source that is not
dependent on an external crystal and its associated components and wiring for
increased reliability.
7.16 Clocking and power control
7.16.1 Crystal oscillators
The LPC11C12/C14 include three independent oscillators. These are the system
oscillator, the Internal RC oscillator (IRC), and the Watchdog oscillator. Each oscillator can
be used for more than one purpose as required in a particular application.
Following reset, the LPC11C12/C14 will operate from the Internal RC oscillator until
switched by software. This allows systems to operate without any external crystal and the
bootloader code to operate at a known frequency.
See Figure 4 for an overview of the LPC11C12/C14 clock generation.
LPC11C12_C14_0
Preliminary data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
© NXP B.V. 2010. All rights reserved.
15 of 49
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FT
FT
FT
A
A
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R
D
D
D
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R
A
FT
FT
FT
A
A
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A
F
FT
FT
A
A
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FT
FT
A
A
R
R
D
SYSTEM CLOCK
DIVIDER
AHB clock 0
(system)
system clock
FT
FT
FT
FT
FT
LPC11C12/C14
NXP Semiconductors
D
D
A
A
MAINCLKSEL
(main clock select)
SPI0
UART PERIPHERAL
CLOCK DIVIDER
UART
SPI1 PERIPHERAL
CLOCK DIVIDER
SPI1
WDT CLOCK
DIVIDER
WDT
IRC oscillator
SYSTEM PLL
system oscillator
IRC oscillator
SYSPLLCLKSEL
(system PLL clock select)
watchdog oscillator
WDTUEN
(WDT clock update enable)
IRC oscillator
system oscillator
watchdog oscillator
CLKOUTUEN
(CLKOUT update enable)
Fig 4.
CLKOUT PIN CLOCK
DIVIDER
CLKOUT pin
002aae514
LPC11C12/C14 clock generation block diagram
7.16.1.1
Internal RC oscillator
The IRC may be used as the clock source for the WDT, and/or as the clock that drives the
PLL and subsequently the CPU. The nominal IRC frequency is 12 MHz. The IRC is
trimmed to 1 % accuracy over the entire voltage and temperature range.
Upon power-up or any chip reset, the LPC11C12/C14 use the IRC as the clock source.
Software may later switch to one of the other available clock sources.
7.16.1.2
System oscillator
The system oscillator can be used as the clock source for the CPU, with or without using
the PLL.
The system oscillator operates at frequencies of 1 MHz to 25 MHz. This frequency can be
boosted to a higher frequency, up to the maximum CPU operating frequency, by the
system PLL.
LPC11C12_C14_0
Preliminary data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
R
SPI0 PERIPHERAL
CLOCK DIVIDER
main clock
watchdog oscillator
D
AHBCLKCTRL[1:18]
(AHB clock enable)
IRC oscillator
FT
AHB clocks 1 to 18
(memories
and peripherals)
R
18
© NXP B.V. 2010. All rights reserved.
16 of 49
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R
R
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A
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R
A
A
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FT
FT
FT
A
A
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R
D
D
D
D
R
R
A
FT
FT
FT
A
A
R
R
D
D
D
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A
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FT
A
A
R
R
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D
The watchdog oscillator can be used as a clock source that directly drives the CPU, the
watchdog timer, or the CLKOUT pin. The watchdog oscillator nominal frequency is
programmable between 7.8 kHz and 1.7 MHz. The frequency spread over processing and
temperature is ±40 % (see Table 11).
F
FT
FT
A
A
R
R
D
D
D
Watchdog oscillator
FT
FT
FT
FT
7.16.1.3
D
D
D
D
D
LPC11C12/C14
NXP Semiconductors
D
D
R
A
FT
D
7.16.2 System PLL
R
A
The PLL accepts an input clock frequency in the range of 10 MHz to 25 MHz. The input
frequency is multiplied up to a high frequency with a Current Controlled Oscillator (CCO).
The multiplier can be an integer value from 1 to 32. The CCO operates in the range of
156 MHz to 320 MHz, so there is an additional divider in the loop to keep the CCO within
its frequency range while the PLL is providing the desired output frequency. The output
divider may be set to divide by 2, 4, 8, or 16 to produce the output clock. Since the
minimum output divider value is 2, it is insured that the PLL output has a 50 % duty cycle.
The PLL is turned off and bypassed following a chip reset and may be enabled by
software. The program must configure and activate the PLL, wait for the PLL to lock, and
then connect to the PLL as a clock source. The PLL settling time is 100 μs.
7.16.3 Clock output
The LPC11C12/C14 features a clock output function that routes the IRC oscillator, the
system oscillator, the watchdog oscillator, or the main clock to an output pin.
7.16.4 Wake-up process
The LPC11C12/C14 begin operation at power-up and when awakened from Deep
power-down mode by using the 12 MHz IRC oscillator as the clock source. This allows
chip operation to resume quickly. If the system oscillator or the PLL is needed by the
application, software will need to enable these features and wait for them to stabilize
before they are used as a clock source.
7.16.5 Power control
The LPC11C12/C14 support a variety of power control features. There are three special
modes of processor power reduction: Sleep mode, Deep-sleep mode, and Deep
power-down mode. The CPU clock rate may also be controlled as needed by changing
clock sources, reconfiguring PLL values, and/or altering the CPU clock divider value. This
allows a trade-off of power versus processing speed based on application requirements.
In addition, a register is provided for shutting down the clocks to individual on-chip
peripherals, allowing fine tuning of power consumption by eliminating all dynamic power
use in any peripherals that are not required for the application. Selected peripherals have
their own clock divider which provides even better power control.
7.16.5.1
Sleep mode
When Sleep mode is entered, the clock to the core is stopped. Resumption from the Sleep
mode does not need any special sequence but re-enabling the clock to the ARM core.
In Sleep mode, execution of instructions is suspended until either a reset or interrupt
occurs. Peripheral functions continue operation during Sleep mode and may generate
interrupts to cause the processor to resume execution. Sleep mode eliminates dynamic
power used by the processor itself, memory systems and related controllers, and internal
buses.
LPC11C12_C14_0
Preliminary data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
© NXP B.V. 2010. All rights reserved.
17 of 49
R
R
R
R
R
A
A
A
A
A
FT
D
R
R
A
A
FT
FT
FT
FT
A
A
R
R
D
D
D
D
R
R
A
FT
FT
FT
A
A
R
R
D
D
D
R
A
FT
FT
A
A
R
R
D
D
In Deep-sleep mode, the chip is in Sleep mode, and in addition analog blocks can be shut
down for increased power savings. The user can configure the Deep-sleep mode to a
large extent, selecting any of the oscillators, the PLL, BOD, the ADC, and the flash to be
shut down or remain powered during Deep-sleep mode. The user can also select which of
the oscillators and analog blocks will be powered up after the chip exits from Deep-sleep
mode.
F
FT
FT
A
A
R
R
D
D
D
Deep-sleep mode
FT
FT
FT
FT
7.16.5.2
D
D
D
D
D
LPC11C12/C14
NXP Semiconductors
D
D
R
A
FT
D
R
A
The GPIO pins (13 pins total: PIO0_0 to PIO0_11 and PIO1_1) serve as external wake-up
pins to a dedicated start logic to wake up the chip from Deep-sleep mode.
The timing of the wake-up process from Deep-sleep mode depends on which blocks are
selected to be powered down during deep-sleep.
For lowest power consumption, the clock source should be switched to IRC before
entering Deep-sleep mode, all oscillators and the PLL should be turned off during
deep-sleep, and the IRC should be selected as clock source when the chip wakes up from
deep-sleep. The IRC can be switched on and off glitch-free and provides a clean clock
signal after start-up.
If power consumption is not a concern, any of the oscillators and/or the PLL can be left
running in Deep-sleep mode to obtain short wake-up times when waking up from
deep-sleep.
7.16.5.3
Deep power-down mode
In Deep power-down mode, power is shut off to the entire chip with the exception of the
WAKEUP pin. The LPC11C12/C14 can wake up from Deep power-down mode via the
WAKEUP pin.
7.17 System control
7.17.1 Reset
Reset has four sources on the LPC11C12/C14: the RESET pin, the Watchdog reset,
power-on reset (POR), and the BrownOut Detection (BOD) circuit. The RESET pin is a
Schmitt trigger input pin. Assertion of chip reset by any source, once the operating voltage
attains a usable level, starts the IRC and initializes the flash controller.
When the internal Reset is removed, the processor begins executing at address 0, which
is initially the Reset vector mapped from the boot block. At that point, all of the processor
and peripheral registers have been initialized to predetermined values.
7.17.2 Brownout detection
The LPC11C12/C14 includes four levels for monitoring the voltage on the VDD pin. If this
voltage falls below one of the four selected levels, the BOD asserts an interrupt signal to
the NVIC. This signal can be enabled for interrupt in the Interrupt Enable Register in the
NVIC in order to cause a CPU interrupt; if not, software can monitor the signal by reading
a dedicated status register. Four additional threshold levels can be selected to cause a
forced reset of the chip.
LPC11C12_C14_0
Preliminary data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
© NXP B.V. 2010. All rights reserved.
18 of 49
D
D
R
R
R
R
R
D
D
D
A
A
A
A
A
FT
D
R
R
A
A
FT
FT
FT
FT
A
A
R
R
D
D
D
D
R
R
A
FT
FT
FT
A
A
R
R
D
D
D
R
A
FT
FT
A
A
R
R
D
D
This feature of the LPC11C12/C14 allows user to enable different levels of security in the
system so that access to the on-chip flash and use of the Serial Wire Debugger (SWD)
and In-System Programming (ISP) can be restricted. When needed, CRP is invoked by
programming a specific pattern into a dedicated flash location. IAP commands are not
affected by the CRP.
F
FT
FT
A
A
R
R
D
D
D
7.17.3 Code security (Code Read Protection - CRP)
FT
FT
FT
FT
LPC11C12/C14
NXP Semiconductors
D
D
R
A
FT
D
R
There are three levels of Code Read Protection:
1. CRP1 disables access to the chip via the SWD and allows partial flash update
(excluding flash sector 0) using a limited set of the ISP commands. This mode is
useful when CRP is required and flash field updates are needed but all sectors can
not be erased.
2. CRP2 disables access to the chip via the SWD and only allows full flash erase and
update using a reduced set of the ISP commands.
3. Running an application with level CRP3 selected fully disables any access to the chip
via the SWD pins and the ISP. This mode effectively disables ISP override using
PIO0_1 pin, too. It is up to the user’s application to provide (if needed) flash update
mechanism using IAP calls or call reinvoke ISP command to enable flash update via
the UART.
CAUTION
If level three Code Read Protection (CRP3) is selected, no future factory testing can be
performed on the device.
In addition to the three CRP levels, sampling of pin PIO0_1 for valid user code can be
disabled. For details see the LPC11Cx user manual.
7.17.4 Boot loader
The boot loader controls initial operation after reset and also provides the means to
program the flash memory. This could be initial programming of a blank device, erasure
and re-programming of a previously programmed device, or programming of the flash
memory by the application program in a running system.
The boot loader code is executed every time the part is reset or powered up. The loader
can either execute the user application code or the ISP command handler via UART or
C_CAN. A LOW level during reset applied to the PIO0_1 pin is considered as an external
hardware request to start the ISP command handler. The state of PIO0_3 at reset
determines whether the UART (PIO0_3 HIGH) or the C_CAN (PIO0_3 LOW) interface will
be used.
The C_CAN ISP command handler uses the CANopen protocol and data organization
method. C_CAN ISP commands have the same functionality as UART ISP commands.
7.17.5 APB interface
The APB peripherals are located on one APB bus.
LPC11C12_C14_0
Preliminary data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
© NXP B.V. 2010. All rights reserved.
19 of 49
A
In addition, ISP entry via the PIO0_1 pin can be disabled without enabling CRP. For
details see the LPC11Cx user manual.
D
D
R
R
R
R
R
D
D
D
A
A
A
A
A
FT
D
R
R
A
A
FT
FT
FT
FT
A
A
R
R
D
D
D
D
R
R
A
FT
FT
FT
A
A
R
R
D
D
D
R
A
FT
FT
A
A
R
R
D
D
The AHBLite connects the CPU bus of the ARM Cortex-M0 to the flash memory, the main
static RAM, and the Boot ROM.
F
FT
FT
A
A
R
R
D
D
D
7.17.6 AHBLite
FT
FT
FT
FT
LPC11C12/C14
NXP Semiconductors
D
D
R
7.17.7 External interrupt inputs
A
FT
D
All GPIO pins can be level or edge sensitive interrupt inputs.
R
A
7.17.8 Memory mapping control
The Cortex-M0 incorporates a mechanism that allows remapping the interrupt vector table
to alternate locations in the memory map. This is controlled via the Vector Table Offset
Register contained in the NVIC.
The vector table may be located anywhere within the bottom 1 GB of Cortex-M0 address
space. The vector table must be located on a 128 word (512 byte) boundary.
7.18 Emulation and debugging
Debug functions are integrated into the ARM Cortex-M0. Serial wire debug with four
breakpoints and two watchpoints is supported.
LPC11C12_C14_0
Preliminary data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
© NXP B.V. 2010. All rights reserved.
20 of 49
D
D
R
R
R
R
D
R
R
A
A
FT
R
FT
FT
A
A
R
D
D
R
A
FT
+5.5
V
IDD
supply current
per supply pin
[3]
-
100
mA
[3]
-
100
mA
-
100
mA
D
−0.5
R
A
Tj < 125 °C
[4]
storage temperature
Tj(max)
maximum junction temperature
Ptot(pack)
total power dissipation (per package)
based on package
heat transfer, not
device power
consumption
VESD
electrostatic discharge voltage
human body
model; all pins
[1]
[5]
−65
+150
°C
-
150
°C
-
1.5
W
−5000
+5000
V
The following applies to the limiting values:
a) This product includes circuitry specifically designed for the protection of its internal devices from the damaging effects of excessive
static charge. Nonetheless, it is suggested that conventional precautions be taken to avoid applying greater than the rated
maximum.
b) Parameters are valid over operating temperature range unless otherwise specified. All voltages are with respect to VSS unless
otherwise noted.
[2]
Including voltage on outputs in 3-state mode.
[3]
The peak current is limited to 25 times the corresponding maximum current.
[4]
Dependent on package type.
[5]
Human body model: equivalent to discharging a 100 pF capacitor through a 1.5 kΩ series resistor.
LPC11C12_C14_0
Preliminary data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
F
D
D
V
[2]
Tstg
A
FT
FT
3.6
5 V tolerant I/O
pins; only valid
when the VDD
supply voltage is
present
−(0.5VDD) < VI <
(1.5VDD);
R
A
A
1.8
input voltage
I/O latch-up current
D
R
R
Unit
supply voltage (core and external rail)
Ilatch
R
A
D
D
Max
VDD
per ground pin
D
R
FT
FT
A
A
R
R
D
D
D
Min
VI
ground current
FT
FT
FT
FT
A
A
R
R
D
D
D
Conditions
ISS
FT
FT
FT
FT
FT
Table 4.
Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).[1]
Parameter
A
A
A
A
A
8. Limiting values
Symbol
R
D
D
D
LPC11C12/C14
NXP Semiconductors
© NXP B.V. 2010. All rights reserved.
21 of 49
D
D
R
R
R
R
R
D
D
D
D
R
R
A
A
FT
FT
FT
FT
A
A
R
R
D
D
D
FT
D
D
FT
FT
A
A
R
R
D
D
D
Min
Typ[1]
Max
Unit
1.8
3.3
3.6
V
-
3
-
mA
-
9
-
mA
-
2
-
mA
-
6
-
μA
-
220
-
nA
R
A
Conditions
R
A
system clock = 12 MHz
VDD = 3.3 V
system clock = 50 MHz
VDD = 3.3 V
Sleep mode;
system clock = 12 MHz
[2][3][4]
[5][6][7]
[2][3][6]
[5][7][8]
[2][3][4]
[5][6][7]
VDD = 3.3 V
Deep-sleep mode;
VDD = 3.3 V
Deep power-down mode;
VDD = 3.3 V
[2][3][5]
[9]
[2][10]
Standard port pins, RESET
IIL
LOW-level input current VI = 0 V; on-chip pull-up
resistor disabled
-
0.5
10
nA
IIH
HIGH-level input
current
VI = VDD; on-chip
pull-down resistor
disabled
-
0.5
10
nA
IOZ
OFF-state output
current
VO = 0 V; VO = VDD;
on-chip pull-up/down
resistors disabled
-
0.5
10
nA
VI
input voltage
pin configured to provide
a digital function
0
-
5.0
V
[11][12]
[13]
VO
output voltage
0
-
VDD
V
VIH
HIGH-level input
voltage
0.7VDD
-
-
V
VIL
LOW-level input voltage
-
-
0.3VDD
V
Vhys
hysteresis voltage
VOH
HIGH-level output
voltage
LPC11C12_C14_0
Preliminary data sheet
D
while(1){}
LOW-level output
voltage
FT
Active mode; code
executed from flash
VOL
F
FT
FT
supply current
A
A
A
IDD
R
R
R
supply voltage (core
and external rail)
R
A
D
D
VDD
D
R
FT
FT
A
A
R
R
D
D
D
Table 5.
Static characteristics
Tamb = −40 °C to +85 °C, unless otherwise specified.
Parameter
FT
FT
FT
FT
FT
9. Static characteristics
Symbol
A
A
A
A
A
LPC11C12/C14
NXP Semiconductors
output active
-
0.4
-
V
2.0 V ≤ VDD ≤ 3.6 V;
IOH = −4 mA
[14]
VDD − 0.4
-
-
V
1.8 V ≤ VDD < 2.0 V;
IOH = −3 mA
[14]
VDD − 0.4
-
-
V
2.0 V ≤ VDD ≤ 3.6 V;
IOL = 4 mA
[14]
-
-
0.4
V
1.8 V ≤ VDD < 2.0 V;
IOL = 3 mA
[14]
-
-
0.4
V
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
© NXP B.V. 2010. All rights reserved.
22 of 49
D
R
R
A
FT
FT
FT
R
-
[14]
−3
-
-
mA
[14]
4
-
-
mA
[14]
3
-
-
mA
-
-
−45
mA
-
-
50
mA
A
A
R
FT
FT
mA
D
D
R
A
D
LOW-level short-circuit
output current
VOL = VDD
[15]
Ipd
pull-down current
VI = 5 V
10
50
150
μA
Ipu
pull-up current
VI = 0 V;
−15
−50
−85
μA
−10
−50
−85
μA
0
0
0
μA
2.0 V ≤ VDD ≤ 3.6 V
1.8 V ≤ VDD < 2.0 V
VDD < VI < 5 V
High-drive output pin (PIO0_7)
IIL
LOW-level input current VI = 0 V; on-chip pull-up
resistor disabled
-
0.5
10
nA
IIH
HIGH-level input
current
VI = VDD; on-chip
pull-down resistor
disabled
-
0.5
10
nA
IOZ
OFF-state output
current
VO = 0 V; VO = VDD;
on-chip pull-up/down
resistors disabled
-
0.5
10
nA
VI
input voltage
pin configured to provide
a digital function
0
-
5.0
V
[11][12]
[13]
VO
output voltage
0
-
VDD
V
VIH
HIGH-level input
voltage
output active
0.7VDD
-
-
V
VIL
LOW-level input voltage
-
-
0.3VDD
V
Vhys
hysteresis voltage
VOH
HIGH-level output
voltage
0.4
-
-
V
2.0 V ≤ VDD ≤ 3.6 V;
IOH = −4 mA
[14]
VDD − 0.4
-
-
V
1.8 V ≤ VDD < 2.0 V;
IOH = −3 mA
[14]
VDD − 0.4
-
-
V
2.0 V ≤ VDD ≤ 3.6 V;
IOL = 4 mA
[14]
-
-
0.4
V
1.8 V ≤ VDD < 2.0 V;
IOL = 3 mA
[14]
-
-
0.4
V
IOH
HIGH-level output
current
VOH = VDD − 0.4 V;
VDD ≥ 2.5 V
[14]
20
-
-
mA
IOL
LOW-level output
current
VOL = 0.4 V
[14]
4
-
-
mA
[14]
3
-
-
mA
2.0 V ≤ VDD ≤ 3.6 V
1.8 V ≤ VDD < 2.0 V
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
© NXP B.V. 2010. All rights reserved.
23 of 49
A
IOLS
R
2.0 V ≤ VDD ≤ 3.6 V
HIGH-level short-circuit VOH = 0 V
output current
Preliminary data sheet
FT
VOL = 0.4 V
IOHS
LPC11C12_C14_0
F
-
R
−4
Unit
D
Max
[14]
D
Typ[1]
[15]
LOW-level output
voltage
A
FT
FT
A
A
R
R
D
D
D
Min
2.0 V ≤ VDD ≤ 3.6 V
1.8 V ≤ VDD < 2.0 V
VOL
FT
FT
D
A
A
LOW-level output
current
A
FT
R
R
VOH = VDD − 0.4 V;
R
A
D
D
HIGH-level output
current
D
R
FT
FT
A
A
R
R
D
D
D
Conditions
FT
FT
FT
FT
Parameter
1.8 V ≤ VDD < 2.0 V
IOL
A
A
A
A
A
IOH
R
R
R
R
R
Table 5.
Static characteristics …continued
Tamb = −40 °C to +85 °C, unless otherwise specified.
Symbol
D
D
D
D
D
LPC11C12/C14
NXP Semiconductors
D
R
R
A
A
FT
FT
FT
FT
A
A
R
R
D
D
D
D
R
R
A
FT
FT
FT
A
A
R
R
D
D
D
R
−45
-
-
50
mA
A
A
R
IOLS
LOW-level short-circuit
output current
VOL = VDD
[15]
Ipd
pull-down current
VI = 5 V
10
50
150
μA
Ipu
pull-up current
VI = 0 V
−15
−50
−85
μA
−10
−50
−85
μA
0
0
0
μA
0.7VDD
-
-
V
FT
FT
mA
D
D
R
A
D
R
VDD < VI < 5 V
I2C-bus pins (PIO0_4 and PIO0_5)
VIH
HIGH-level input
voltage
VIL
LOW-level input voltage
-
-
0.3VDD
V
Vhys
hysteresis voltage
-
0.5VDD
-
V
[14]
4
-
-
mA
[14]
3
-
-
[14]
20
-
-
[14]
16
-
-
[16]
-
2
4
μA
-
10
22
μA
I2C-bus
VOL = 0.4 V;
pins
configured as standard
mode pins
2.0 V ≤ VDD ≤ 3.6 V
1.8 V ≤ VDD < 2.0 V
I2C-bus
VOL = 0.4 V;
pins
configured as Fast-mode
Plus pins
mA
2.0 V ≤ VDD ≤ 3.6 V
1.8 V ≤ VDD < 2.0 V
input leakage current
VI = VDD
VI = 5 V
Oscillator pins
Vi(xtal)
crystal input voltage
−0.5
1.8
1.95
V
Vo(xtal)
crystal output voltage
−0.5
1.8
1.95
V
[1]
Typical ratings are not guaranteed. The values listed are at room temperature (25 °C), nominal supply voltages.
[2]
Tamb = 25 °C.
[3]
IDD measurements were performed with all pins configured as GPIO outputs driven LOW and pull-up resistors disabled.
[4]
IRC enabled; system oscillator disabled; system PLL disabled.
[5]
Pin CAN_RXD pulled LOW externally.
[6]
BOD disabled.
[7]
All peripherals disabled in the AHBCLKCTRL register. Peripheral clocks to UART and SPI0/1 disabled in system configuration block.
[8]
IRC disabled; system oscillator enabled; system PLL enabled.
[9]
All oscillators and analog blocks turned off in the PDSLEEPCFG register; PDSLEEPCFG = 0xFFFF FDFF.
[10] WAKEUP pin pulled HIGH externally.
[11] Including voltage on outputs in 3-state mode.
[12] VDD supply voltage must be present.
[13] 3-state outputs go into 3-state mode in Deep power-down mode.
[14] Accounts for 100 mV voltage drop in all supply lines.
LPC11C12_C14_0
Preliminary data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
© NXP B.V. 2010. All rights reserved.
24 of 49
A
1.8 V ≤ VDD < 2.0 V
ILI
FT
2.0 V ≤ VDD ≤ 3.6 V
LOW-level output
current
F
-
R
-
Unit
D
Max
D
Typ[1]
HIGH-level short-circuit VOH = 0 V
output current
IOL
A
FT
FT
A
A
R
R
D
D
D
Min
IOHS
LOW-level output
current
FT
FT
FT
FT
FT
Conditions
[15]
IOL
A
A
A
A
A
Parameter
R
R
R
R
R
Table 5.
Static characteristics …continued
Tamb = −40 °C to +85 °C, unless otherwise specified.
Symbol
D
D
D
D
D
LPC11C12/C14
NXP Semiconductors
D
D
R
R
R
R
R
D
D
D
D
R
R
A
A
FT
FT
FT
FT
A
A
R
R
D
D
D
D
R
R
A
FT
FT
FT
A
A
R
R
D
D
D
R
R
-
-
1
pF
[1][2]
-
-
±1
LSB
EL(adj)
integral non-linearity
-
-
± 1.5
LSB
EO
offset error
[4]
-
-
± 3.5
LSB
gain error
[5]
-
-
0.6
%
ET
absolute error
[6]
-
-
±4
LSB
Rvsi
voltage source interface
resistance
-
-
40
kΩ
Ri
input resistance
-
-
2.5
MΩ
[7][8]
[1]
The ADC is monotonic, there are no missing codes.
[2]
The differential linearity error (ED) is the difference between the actual step width and the ideal step width. See Figure 5.
[3]
The integral non-linearity (EL(adj)) is the peak difference between the center of the steps of the actual and the ideal transfer curve after
appropriate adjustment of gain and offset errors. See Figure 5.
[4]
The offset error (EO) is the absolute difference between the straight line which fits the actual curve and the straight line which fits the
ideal curve. See Figure 5.
[5]
The gain error (EG) is the relative difference in percent between the straight line fitting the actual transfer curve after removing offset
error, and the straight line which fits the ideal transfer curve. See Figure 5.
[6]
The absolute error (ET) is the maximum difference between the center of the steps of the actual transfer curve of the non-calibrated
ADC and the ideal transfer curve. See Figure 5.
[7]
Tamb = 25 °C; maximum sampling frequency fs = 4.5 MHz and analog input capacitance Cia = 1 pF.
[8]
Input resistance Ri depends on the sampling frequency fs: Ri = 1 / (fs × Cia).
LPC11C12_C14_0
Preliminary data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
© NXP B.V. 2010. All rights reserved.
25 of 49
A
V
R
Unit
D
Max
VDD
FT
Typ
-
A
Min
0
[3]
EG
D
R
differential linearity error
ED
D
analog input capacitance
FT
Cia
Conditions
FT
A
analog input voltage
A
R
Parameter
F
D
D
Table 6.
ADC static characteristics
Tamb = −40 °C to +85 °C unless otherwise specified; ADC frequency 4.5 MHz, VDD = 2.5 V to 3.6 V.
Symbol
A
FT
FT
A
A
R
R
D
D
D
[16] To VSS.
FT
FT
FT
FT
FT
[15] Allowed as long as the current limit does not exceed the maximum current allowed by the device.
VIA
A
A
A
A
A
LPC11C12/C14
NXP Semiconductors
D
D
R
R
R
R
R
D
D
D
A
A
A
A
A
D
R
R
A
A
FT
FT
FT
FT
A
A
R
R
D
D
D
D
R
R
A
FT
FT
FT
A
A
R
R
D
D
D
R
A
F
FT
gain
error
EG
FT
A
A
R
R
D
D
D
D
FT
FT
A
A
R
R
D
offset
error
EO
FT
FT
FT
FT
FT
LPC11C12/C14
NXP Semiconductors
D
D
R
1023
A
FT
D
R
1022
A
1021
1020
1019
1018
(2)
7
code
out
(1)
6
5
(5)
4
(4)
3
(3)
2
1 LSB
(ideal)
1
0
1
2
3
4
5
6
7
1018
1019
1020
1021
1022
1023
1024
VIA (LSBideal)
offset error
EO
1 LSB =
VDD − VSS
1024
002aaf426
(1) Example of an actual transfer curve.
(2) The ideal transfer curve.
(3) Differential linearity error (ED).
(4) Integral non-linearity (EL(adj)).
(5) Center of a step of the actual transfer curve.
Fig 5.
ADC characteristics
LPC11C12_C14_0
Preliminary data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
© NXP B.V. 2010. All rights reserved.
26 of 49
D
D
R
R
R
R
R
D
D
D
A
A
A
A
A
D
R
R
A
A
FT
A
F
D
FT
FT
A
A
R
R
D
Max
Unit
assertion
-
1.65
-
V
de-assertion
-
1.80
-
V
D
Typ
R
Min
D
interrupt level 0
FT
FT
threshold voltage
R
A
A
Vth
D
R
R
Conditions
R
A
D
D
Parameter
D
R
FT
FT
A
A
R
R
D
D
D
Table 7.
BOD static characteristics[1]
Tamb = 25 °C.
Symbol
FT
FT
FT
FT
A
A
R
R
D
D
D
9.1 BOD static characteristics
FT
FT
FT
FT
FT
LPC11C12/C14
NXP Semiconductors
A
FT
D
R
A
interrupt level 1
assertion
-
2.22
-
V
de-assertion
-
2.35
-
V
assertion
-
2.52
-
V
de-assertion
-
2.66
-
V
assertion
-
2.80
-
V
de-assertion
-
2.90
-
V
assertion
-
1.46
-
V
de-assertion
-
1.63
-
V
interrupt level 2
interrupt level 3
reset level 0
reset level 1
assertion
-
2.06
-
V
de-assertion
-
2.15
-
V
assertion
-
2.35
-
V
de-assertion
-
2.43
-
V
assertion
-
2.63
-
V
de-assertion
-
2.71
-
V
reset level 2
reset level 3
[1]
Interrupt levels are selected by writing the level value to the BOD control register BODCTRL, see LPC11Cx
user manual.
9.2 Power consumption
Power measurements in Active, Sleep, and Deep-sleep modes were performed under the
following conditions (see LPC11Cx user manual):
• Configure all pins as GPIO with pull-up resistor disabled in the IOCONFIG block.
• Configure GPIO pins as outputs using the GPIOnDIR registers.
• Write 0 to all GPIOnDATA registers to drive the outputs LOW.
LPC11C12_C14_0
Preliminary data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
© NXP B.V. 2010. All rights reserved.
27 of 49
D
D
R
R
R
R
R
D
D
D
A
A
A
A
A
D
R
R
A
A
FT
FT
FT
FT
A
A
R
R
D
D
D
D
R
R
A
FT
FT
FT
A
A
R
R
D
D
D
R
A
F
FT
FT
A
A
R
R
D
D
D
002aaf390
FT
FT
A
A
R
R
D
D
12
FT
FT
FT
FT
FT
LPC11C12/C14
NXP Semiconductors
D
D
IDD
(mA)
R
48 MHz(2)
A
FT
D
8
R
36 MHz(2)
A
24 MHz(2)
4
12 MHz(1)
0
1.8
2.4
3.0
3.6
VDD (V)
Conditions: Tamb = 25 °C; active mode entered executing code while(1){} from flash; all
peripherals disabled in the AHBCLKCTRL register (AHBCLKCTRL = 0x1F); all peripheral clocks
disabled; internal pull-up resistors disabled; BOD disabled; pin CAN_RXD pulled LOW externally.
(1) System oscillator and system PLL disabled; IRC enabled.
(2) System oscillator and system PLL enabled; IRC disabled.
Fig 6.
Active mode: Typical supply current IDD versus supply voltage VDD for different
system clock frequencies
002aaf391
12
IDD
(mA)
48 MHz(2)
8
36 MHz(2)
24 MHz(2)
4
0
−40
12 MHz(1)
−15
10
35
60
85
temperature (°C)
Conditions: VDD = 3.3 V; active mode entered executing code while(1){} from flash; all
peripherals disabled in the AHBCLKCTRL register (AHBCLKCTRL = 0x1F); all peripheral clocks
disabled; internal pull-up resistors disabled; BOD disabled; pin CAN_RXD pulled LOW externally.
(1) System oscillator and system PLL disabled; IRC enabled.
(2) System oscillator and system PLL enabled; IRC disabled.
Fig 7.
LPC11C12_C14_0
Preliminary data sheet
Active mode: Typical supply current IDD versus temperature for different system
clock frequencies
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
© NXP B.V. 2010. All rights reserved.
28 of 49
D
D
R
R
R
R
R
D
D
D
A
A
A
A
A
D
R
R
A
A
FT
FT
FT
FT
A
A
R
R
D
D
D
D
R
R
A
FT
FT
FT
A
A
R
R
D
D
D
R
F
D
FT
FT
A
A
R
R
D
IDD
(mA)
A
FT
FT
A
A
R
R
D
D
D
002aaf392
8
FT
FT
FT
FT
FT
LPC11C12/C14
NXP Semiconductors
D
D
48 MHz(2)
R
A
6
FT
D
36 MHz(2)
R
A
4
24 MHz(2)
12 MHz(1)
2
0
−40
−15
10
35
60
85
temperature (°C)
Conditions: VDD = 3.3 V; sleep mode entered from flash; all peripherals disabled in the
AHBCLKCTRL register (AHBCLKCTRL = 0x1F); all peripheral clocks disabled; internal pull-up
resistors disabled; BOD disabled; pin CAN_RXD pulled LOW externally.
(1) System oscillator and system PLL disabled; IRC enabled.
(2) System oscillator and system PLL enabled; IRC disabled.
Fig 8.
Sleep mode: Typical supply current IDDversus temperature for different system
clock frequencies
002aaf394
40
IDD
(μA)
30
3.6 V
3.3 V
2.0 V
1.8 V
20
10
0
−40
−15
10
35
60
85
temperature (°C)
Conditions: BOD disabled; all oscillators and analog blocks disabled in the PDSLEEPCFG register
(PDSLEEPCFG = 0xFFFF FDFF); pin CAN_RXD pulled LOW externally.
Fig 9.
LPC11C12_C14_0
Preliminary data sheet
Deep-sleep mode: Typical supply current IDD versus temperature for different
supply voltages VDD
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
© NXP B.V. 2010. All rights reserved.
29 of 49
D
D
R
R
R
R
R
D
D
D
A
A
A
A
A
D
R
R
A
A
FT
FT
FT
FT
A
A
R
R
D
D
D
D
R
R
A
FT
FT
FT
A
A
R
R
D
D
D
R
F
D
FT
FT
A
A
R
R
D
IDD
(μA)
A
FT
FT
A
A
R
R
D
D
D
002aaf457
0.8
FT
FT
FT
FT
FT
LPC11C12/C14
NXP Semiconductors
D
D
R
A
0.6
FT
VDD = 3.6 V
3.3 V
2.0 V
1.8 V
D
R
A
0.4
0.2
0
−40
−15
10
35
60
85
temperature (°C)
Fig 10. Deep power-down mode: Typical supply current IDD versus temperature for
different supply voltages VDD
9.3 Electrical pin characteristics
002aae990
3.6
VOH
(V)
T = 85 °C
25 °C
−40 °C
3.2
2.8
2.4
2
0
10
20
30
40
50
60
IOH (mA)
Conditions: VDD = 3.3 V; on pin PIO0_7.
Fig 11. High-drive output: Typical HIGH-level output voltage VOH versus HIGH-level
output current IOH.
LPC11C12_C14_0
Preliminary data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
© NXP B.V. 2010. All rights reserved.
30 of 49
D
D
R
R
R
R
R
D
D
D
A
A
A
A
A
D
R
R
A
A
FT
FT
FT
FT
A
A
R
R
D
D
D
D
R
R
A
FT
FT
FT
A
A
R
R
D
D
D
R
F
D
FT
FT
A
A
R
R
D
T = 85 °C
25 °C
−40 °C
D
D
IOL
(mA)
A
FT
FT
A
A
R
R
D
D
D
002aaf019
60
FT
FT
FT
FT
FT
LPC11C12/C14
NXP Semiconductors
R
A
FT
D
40
R
A
20
0
0
0.2
0.4
0.6
VOL (V)
Conditions: VDD = 3.3 V; on pins PIO0_4 and PIO0_5.
Fig 12. I2C-bus pins (high current sink): Typical LOW-level output current IOL versus
LOW-level output voltage VOL
002aae991
15
IOL
(mA)
T = 85 °C
25 °C
−40 °C
10
5
0
0
0.2
0.4
0.6
VOL (V)
Conditions: VDD = 3.3 V; standard port pins and PIO0_7.
Fig 13. Typical LOW-level output current IOL versus LOW-level output voltage VOL
LPC11C12_C14_0
Preliminary data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
© NXP B.V. 2010. All rights reserved.
31 of 49
D
D
R
R
R
R
R
D
D
D
A
A
A
A
A
D
R
R
A
A
FT
FT
FT
FT
A
A
R
R
D
D
D
D
R
R
A
FT
FT
FT
A
A
R
R
D
D
D
R
F
D
FT
D
D
T = 85 °C
25 °C
−40 °C
R
A
3.2
FT
A
A
R
R
D
VOH
(V)
A
FT
FT
A
A
R
R
D
D
D
002aae992
3.6
FT
FT
FT
FT
FT
LPC11C12/C14
NXP Semiconductors
FT
D
R
A
2.8
2.4
2
0
8
16
24
IOH (mA)
Conditions: VDD = 3.3 V; standard port pins.
Fig 14. Typical HIGH-level output voltage VOH versus HIGH-level output source current
IOH
002aae988
10
Ipu
(μA)
−10
−30
T = 85 °C
25 °C
−40 °C
−50
−70
0
1
2
3
4
5
VI (V)
Conditions: VDD = 3.3 V; standard port pins.
Fig 15. Typical pull-up current Ipu versus input voltage VI
LPC11C12_C14_0
Preliminary data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
© NXP B.V. 2010. All rights reserved.
32 of 49
D
D
R
R
R
R
R
D
D
D
A
A
A
A
A
D
R
R
A
A
D
R
R
A
FT
FT
FT
A
A
R
R
D
D
D
R
A
F
FT
FT
A
A
R
R
D
D
D
D
FT
FT
A
A
R
R
D
T = 85 °C
25 °C
−40 °C
Ipd
(μA)
FT
FT
FT
FT
A
A
R
R
D
D
D
002aae989
80
FT
FT
FT
FT
FT
LPC11C12/C14
NXP Semiconductors
D
D
R
A
60
FT
D
R
A
40
20
0
0
1
2
3
4
5
VI (V)
Conditions: VDD = 3.3 V; standard port pins.
Fig 16. Typical pull-down current Ipd versus input voltage VI
LPC11C12_C14_0
Preliminary data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
© NXP B.V. 2010. All rights reserved.
33 of 49
D
D
R
R
R
R
R
D
D
D
A
A
A
A
A
D
R
R
A
A
FT
FT
FT
FT
A
A
R
R
D
D
D
D
R
R
A
FT
FT
FT
A
A
R
R
D
D
D
R
F
D
FT
FT
A
A
R
R
D
10.1 Flash memory
A
FT
FT
A
A
R
R
D
D
D
10. Dynamic characteristics
FT
FT
FT
FT
FT
LPC11C12/C14
NXP Semiconductors
D
D
R
A
Table 8.
Flash characteristics
Tamb = −40 °C to +85 °C, unless otherwise specified.
FT
D
endurance
Conditions
tret
retention time
Min
Typ
Max
Unit
10000
-
-
cycles
powered
10
-
-
years
unpowered
20
-
-
years
sector or multiple
consecutive
sectors
95
100
105
ms
0.95
1
1.05
ms
[1]
ter
erase time
tprog
programming
time
[2]
[1]
Number of program/erase cycles.
[2]
Programming times are given for writing 256 bytes from RAM to the flash. Data must be written to the flash
in blocks of 256 bytes.
10.2 External clock
Table 9.
Dynamic characteristic: external clock
Tamb = −40 °C to +85 °C; VDD over specified ranges.[1]
Conditions
Typ[2]
Symbol
Parameter
Min
Max
Unit
fosc
oscillator frequency
1
Tcy(clk)
clock cycle time
40
-
25
MHz
-
1000
ns
tCHCX
clock HIGH time
Tcy(clk) × 0.4
-
-
ns
tCLCX
clock LOW time
Tcy(clk) × 0.4
-
-
ns
tCLCH
tCHCL
clock rise time
-
-
5
ns
clock fall time
-
-
5
ns
[1]
Parameters are valid over operating temperature range unless otherwise specified.
[2]
Typical ratings are not guaranteed. The values listed are at room temperature (25 °C), nominal supply
voltages.
tCHCL
tCHCX
tCLCH
tCLCX
Tcy(clk)
002aaa907
Fig 17. External clock timing (with an amplitude of at least Vi(RMS) = 200 mV)
LPC11C12_C14_0
Preliminary data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
© NXP B.V. 2010. All rights reserved.
34 of 49
A
Parameter
R
Symbol
Nendu
D
D
R
R
R
R
R
D
D
D
A
A
A
A
A
D
R
R
A
A
FT
A
F
FT
FT
D
FT
FT
A
A
R
R
D
Typ[2]
Max
Unit
11.88
12
12.12
MHz
D
Min
D
R
internal RC oscillator frequency -
R
A
A
fosc(RC)
D
R
R
Conditions
R
A
D
D
Parameter
D
R
FT
FT
A
A
R
R
D
D
D
Table 10. Dynamic characteristic: internal oscillators
Tamb = −40 °C to +85 °C; 2.7 V ≤ VDD ≤ 3.6 V.[1]
Symbol
FT
FT
FT
FT
A
A
R
R
D
D
D
10.3 Internal oscillators
FT
FT
FT
FT
FT
LPC11C12/C14
NXP Semiconductors
A
D
[2]
Typical ratings are not guaranteed. The values listed are at room temperature (25 °C), nominal supply
voltages.
R
Parameters are valid over operating temperature range unless otherwise specified.
A
002aaf403
12.15
f
(MHz)
VDD = 3.6 V
3.3 V
3.0 V
2.7 V
2.4 V
2.0 V
12.05
11.95
11.85
−40
−15
10
35
60
85
temperature (°C)
Conditions: Frequency values are typical values. 12 MHz ± 1 % accuracy is guaranteed for
2.7 V ≤ VDD ≤ 3.6 V and Tamb = −40 °C to +85 °C. Variations between parts may cause the IRC to
fall outside the 12 MHz ± 1 % accuracy specification for voltages below 2.7 V.
Fig 18. Internal RC oscillator frequency vs. temperature
Table 11.
Dynamic characteristics: Watchdog oscillator
Min
Typ[1]
Max
Unit
internal oscillator DIVSEL = 0x1F, FREQSEL = 0x1
frequency
in the WDTOSCCTRL register;
[2][3]
-
7.8
-
kHz
DIVSEL = 0x00, FREQSEL = 0xF
in the WDTOSCCTRL register
[2][3]
-
1700
-
kHz
Symbol Parameter
fosc
LPC11C12_C14_0
Preliminary data sheet
Conditions
[1]
Typical ratings are not guaranteed. The values listed are at room temperature (25 °C), nominal supply
voltages.
[2]
The typical frequency spread over processing and temperature (Tamb = −40 °C to +85 °C) is ±40 %.
[3]
See the LPC11Cx user manual.
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
FT
[1]
© NXP B.V. 2010. All rights reserved.
35 of 49
D
D
R
R
R
R
R
D
D
D
A
A
A
A
A
D
R
R
A
A
FT
FT
FT
FT
A
A
R
R
D
D
D
R
A
FT
R
A
F
FT
FT
A
A
R
R
D
D
D
D
FT
FT
A
A
R
R
D
Table 12. Dynamic characteristic: I/O pins[1]
Tamb = −40 °C to +85 °C; 1.8 V ≤ VDD ≤ 3.6 V.
D
R
FT
FT
A
A
R
R
D
D
D
10.4 I/O pins
FT
FT
FT
FT
FT
LPC11C12/C14
NXP Semiconductors
Conditions
Min
Typ
Max
Unit
tr
rise time
pin
configured as
output
3.0
-
5.0
ns
tf
fall time
pin
configured as
output
2.5
-
5.0
ns
D
Parameter
D
Symbol
R
A
D
R
A
Applies to standard port pins and RESET pin.
10.5 I2C-bus
Table 13. Dynamic characteristic: I2C-bus pins[1]
Tamb = −40 °C to +85 °C.[2]
Symbol
Parameter
Conditions
Min
Max
Unit
fSCL
SCL clock
frequency
Standard-mode
0
100
kHz
Fast-mode
0
400
kHz
Fast-mode Plus
0
1
MHz
of both SDA and
SCL signals
-
300
ns
Fast-mode
20 + 0.1 × Cb
300
ns
Fast-mode Plus
-
120
ns
Standard-mode
4.7
-
μs
Fast-mode
1.3
-
μs
[4][5][6][7]
fall time
tf
Standard-mode
tLOW
tHIGH
tHD;DAT
tSU;DAT
LPC11C12_C14_0
Preliminary data sheet
LOW period of
the SCL clock
HIGH period of
the SCL clock
data hold time
data set-up
time
[3][4][8]
[9][10]
Fast-mode Plus
0.5
-
μs
Standard-mode
4.0
-
μs
Fast-mode
0.6
-
μs
Fast-mode Plus
0.26
-
μs
Standard-mode
0
-
μs
Fast-mode
0
-
μs
Fast-mode Plus
0
-
μs
Standard-mode
250
-
ns
Fast-mode
100
-
ns
Fast-mode Plus
50
-
ns
[1]
See the I2C-bus specification UM10204 for details.
[2]
Parameters are valid over operating temperature range unless otherwise specified.
[3]
tHD;DAT is the data hold time that is measured from the falling edge of SCL; applies to data in transmission
and the acknowledge.
[4]
A device must internally provide a hold time of at least 300 ns for the SDA signal (with respect to the
VIH(min) of the SCL signal) to bridge the undefined region of the falling edge of SCL.
[5]
Cb = total capacitance of one bus line in pF.
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
FT
[1]
© NXP B.V. 2010. All rights reserved.
36 of 49
D
D
R
R
R
R
R
D
D
D
A
A
A
A
A
FT
FT
FT
FT
FT
LPC11C12/C14
D
R
R
A
A
FT
FT
FT
FT
A
A
R
R
D
D
D
NXP Semiconductors
D
R
R
A
FT
FT
FT
A
A
R
R
D
D
D
The maximum tf for the SDA and SCL bus lines is specified at 300 ns. The maximum fall time for the SDA
output stage tf is specified at 250 ns. This allows series protection resistors to be connected in between the
SDA and the SCL pins and the SDA/SCL bus lines without exceeding the maximum specified tf.
[7]
In Fast-mode Plus, fall time is specified the same for both output stage and bus timing. If series resistors
are used, designers should allow for this when considering bus timing.
[8]
The maximum tHD;DAT could be 3.45 μs and 0.9 μs for Standard-mode and Fast-mode but must be less than
the maximum of tVD;DAT or tVD;ACK by a transition time (see UM10204). This maximum must only be met if
the device does not stretch the LOW period (tLOW) of the SCL signal. If the clock stretches the SCL, the
data must be valid by the set-up time before it releases the clock.
[9]
tSU;DAT is the data set-up time that is measured with respect to the rising edge of SCL; applies to data in
transmission and the acknowledge.
D
R
A
F
FT
FT
A
A
R
R
D
D
[6]
D
FT
FT
A
A
R
R
D
D
D
R
A
70 %
30 %
tHD;DAT
tf
70 %
30 %
SCL
tVD;DAT
tHIGH
70 %
30 %
70 %
30 %
70 %
30 %
tLOW
S
1 / fSCL
002aaf425
Fig 19. I2C-bus pins clock timing
10.6 SPI interfaces
Table 14.
Dynamic characteristics of SPI pins in SPI mode
Symbol
Parameter
Tcy(PCLK)
PCLK cycle time
Tcy(clk)
Conditions
clock cycle time
Min
Typ
Max
Unit
20
-
-
ns
[1]
40
-
-
ns
[2]
27
-
-
ns
SPI master (in SPI mode)
tDS
data set-up time
in SPI mode
2.0 V ≤ VDD ≤ 3.6 V
1.8 V ≤ VDD < 2.0 V
tDH
tv(Q)
th(Q)
36
-
-
ns
in SPI mode
[2]
0
-
-
ns
data output valid time in SPI mode
[2]
-
-
10
ns
data output hold time in SPI mode
[2]
0
-
-
ns
[3][4]
0
-
-
ns
data hold time
SPI slave (in SPI mode)
tDS
data set-up time
LPC11C12_C14_0
Preliminary data sheet
in SPI mode
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
© NXP B.V. 2010. All rights reserved.
37 of 49
A
70 %
30 %
R
SDA
tSU;DAT
D
tf
FT
[10] A Fast-mode I2C-bus device can be used in a Standard-mode I2C-bus system but the requirement tSU;DAT =
250 ns must then be met. This will automatically be the case if the device does not stretch the LOW period
of the SCL signal. If such a device does stretch the LOW period of the SCL signal, it must output the next
data bit to the SDA line tr(max) + tSU;DAT = 1000 + 250 = 1250 ns (according to the Standard-mode I2C-bus
specification) before the SCL line is released. Also the acknowledge timing must meet this set-up time.
D
R
R
A
A
FT
FT
FT
FT
A
A
R
R
D
D
D
D
R
R
A
FT
FT
FT
A
A
R
R
D
D
D
R
Max
in SPI mode
3 × Tcy(PCLK) + 4
-
-
data output valid time in SPI mode
[3][4]
-
-
3 × Tcy(PCLK) + 11
data output hold time in SPI mode
[3][4]
-
-
2 × Tcy(PCLK) + 5
ns
Unit
D
FT
A
A
R
R
D
D
D
ns
R
A
Tcy(clk)
tclk(H)
tclk(L)
SCK (CPOL = 0)
SCK (CPOL = 1)
tv(Q)
th(Q)
DATA VALID
MOSI
DATA VALID
tDS
DATA VALID
MISO
tDH
DATA VALID
tv(Q)
MOSI
DATA VALID
th(Q)
DATA VALID
tDH
tDS
MISO
DATA VALID
CPHA = 1
CPHA = 0
DATA VALID
002aae829
Pin names SCK, MISO, and MOSI refer to pins for both SPI peripherals, SPI0 and SPI1.
Fig 20. SPI master timing in SPI mode
LPC11C12_C14_0
Preliminary data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
© NXP B.V. 2010. All rights reserved.
38 of 49
A
Tcy(clk) = 12 × Tcy(PCLK).
Tamb = 25 °C; for normal voltage supply range: VDD = 3.3 V.
R
Tamb = −40 °C to 85 °C.
D
[2]
FT
Tcy(clk) = (SSPCLKDIV × (1 + SCR) × CPSDVSR) / fmain. The clock cycle time derived from the SPI bit rate Tcy(clk) is a function of the
main clock frequency fmain, the SPI peripheral clock divider (SSPCLKDIV), the SPI SCR parameter (specified in the SSP0CR0 register),
and the SPI CPSDVSR parameter (specified in the SPI clock prescale register).
[3]
F
FT
ns
[1]
[4]
A
Typ
FT
Min
[3][4]
FT
A
A
R
R
D
D
D
th(Q)
Conditions
FT
FT
FT
FT
FT
Parameter
data hold time
A
A
A
A
A
Dynamic characteristics of SPI pins in SPI mode
Symbol
tv(Q)
R
R
R
R
R
Table 14.
tDH
D
D
D
D
D
LPC11C12/C14
NXP Semiconductors
D
D
R
R
R
R
R
D
D
D
A
A
A
A
A
D
R
R
A
A
FT
R
F
FT
FT
A
A
A
D
FT
SCK (CPOL = 0)
FT
A
A
R
R
D
tDH
D
R
R
tDS
R
A
D
D
tclk(L)
D
R
FT
FT
A
A
R
R
D
D
D
tclk(H)
FT
FT
FT
FT
A
A
R
R
D
D
D
Tcy(clk)
FT
FT
FT
FT
FT
LPC11C12/C14
NXP Semiconductors
D
D
R
A
FT
D
SCK (CPOL = 1)
R
DATA VALID
DATA VALID
tv(Q)
MISO
th(Q)
DATA VALID
DATA VALID
tDH
DATA VALID
tv(Q)
MISO
DATA VALID
CPHA = 1
DATA VALID
tDS
MOSI
A
MOSI
th(Q)
CPHA = 0
DATA VALID
002aae830
Pin names SCK, MISO, and MOSI refer to pins for both SPI peripherals, SPI0 and SPI1.
Fig 21. SPI slave timing in SPI mode
LPC11C12_C14_0
Preliminary data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
© NXP B.V. 2010. All rights reserved.
39 of 49
D
D
R
R
R
R
R
D
D
D
A
A
A
A
A
R
A
A
FT
FT
D
R
R
A
FT
FT
FT
A
A
R
R
D
D
D
R
A
F
FT
FT
A
A
R
R
D
D
D
D
FT
FT
A
A
R
R
D
11.1 ADC usage notes
FT
D
R
FT
FT
A
A
R
R
D
D
D
11. Application information
FT
FT
FT
FT
LPC11C12/C14
NXP Semiconductors
D
D
R
A
FT
The following guidelines show how to increase the performance of the ADC in a noisy
environment beyond the ADC specifications listed in Table 6:
D
• The ADC input traces must be shielded from fast switching digital signals and noisy
power supply lines.
• Because the ADC and the digital core share the same power supply, the power supply
line must be adequately filtered.
• To improve the ADC performance in a very noisy environment, put the device in Sleep
mode during the ADC conversion.
11.2 XTAL input
The input voltage to the on-chip oscillators is limited to 1.8 V. If the oscillator is driven by a
clock in slave mode, it is recommended that the input be coupled through a capacitor with
Ci = 100 pF. To limit the input voltage to the specified range, choose an additional
capacitor to ground Cg which attenuates the input voltage by a factor Ci/(Ci + Cg). In slave
mode, a minimum of 200 mV(RMS) is needed.
LPC1xxx
XTALIN
Ci
100 pF
Cg
002aae788
Fig 22. Slave mode operation of the on-chip oscillator
In slave mode the input clock signal should be coupled by means of a capacitor of 100 pF
(Figure 22), with an amplitude between 200 mV(RMS) and 1000 mV(RMS). This
corresponds to a square wave signal with a signal swing of between 280 mV and 1.4 V.
The XTALOUT pin in this configuration can be left unconnected.
External components and models used in oscillation mode are shown in Figure 23 and in
Table 15 and Table 16. Since the feedback resistance is integrated on chip, only a crystal
and the capacitances CX1 and CX2 need to be connected externally in case of
fundamental mode oscillation (the fundamental frequency is represented by L, CL and
RS). Capacitance CP in Figure 23 represents the parallel package capacitance and should
not be larger than 7 pF. Parameters FOSC, CL, RS and CP are supplied by the crystal
manufacturer (see Table 15).
LPC11C12_C14_0
Preliminary data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
© NXP B.V. 2010. All rights reserved.
40 of 49
A
chip.
R
• The ADC input trace must be short and as close as possible to the LPC11C12/C14
D
D
R
R
R
R
R
D
D
D
A
A
A
A
A
D
R
R
A
A
FT
FT
FT
FT
A
A
R
R
D
D
D
D
R
R
A
FT
FT
FT
A
A
R
R
D
D
D
R
A
F
FT
FT
A
A
R
R
D
D
D
D
FT
FT
A
A
R
R
D
LPC1xxx
D
D
R
L
A
XTALOUT
FT
XTALIN
FT
FT
FT
FT
FT
LPC11C12/C14
NXP Semiconductors
D
CP
A
CL
R
=
XTAL
RS
CX2
CX1
002aaf424
Fig 23. Oscillator modes and models: oscillation mode of operation and external crystal
model used for CX1/CX2 evaluation
Table 15.
Recommended values for CX1/CX2 in oscillation mode (crystal and external
components parameters) low frequency mode
Fundamental oscillation
frequency FOSC
Crystal load
capacitance CL
Maximum crystal
series resistance RS
External load
capacitors CX1, CX2
1 MHz - 5 MHz
10 pF
< 300 Ω
18 pF, 18 pF
20 pF
< 300 Ω
39 pF, 39 pF
30 pF
< 300 Ω
57 pF, 57 pF
10 pF
< 300 Ω
18 pF, 18 pF
20 pF
< 200 Ω
39 pF, 39 pF
5 MHz - 10 MHz
10 MHz - 15 MHz
15 MHz - 20 MHz
Table 16.
30 pF
< 100 Ω
57 pF, 57 pF
10 pF
< 160 Ω
18 pF, 18 pF
20 pF
< 60 Ω
39 pF, 39 pF
10 pF
< 80 Ω
18 pF, 18 pF
Recommended values for CX1/CX2 in oscillation mode (crystal and external
components parameters) high frequency mode
Fundamental oscillation
frequency FOSC
Crystal load
capacitance CL
Maximum crystal
series resistance RS
External load
capacitors CX1, CX2
15 MHz - 20 MHz
10 pF
< 180 Ω
18 pF, 18 pF
20 pF
< 100 Ω
39 pF, 39 pF
10 pF
< 160 Ω
18 pF, 18 pF
20 pF
< 80 Ω
39 pF, 39 pF
20 MHz - 25 MHz
11.3 XTAL Printed Circuit Board (PCB) layout guidelines
The crystal should be connected on the PCB as close as possible to the oscillator input
and output pins of the chip. Take care that the load capacitors Cx1, Cx2, and Cx3 in case of
third overtone crystal usage have a common ground plane. The external components
must also be connected to the ground plain. Loops must be made as small as possible in
LPC11C12_C14_0
Preliminary data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
© NXP B.V. 2010. All rights reserved.
41 of 49
D
D
R
R
R
R
R
D
D
D
A
A
A
A
A
FT
FT
FT
FT
FT
LPC11C12/C14
D
R
R
A
A
FT
FT
FT
FT
A
A
R
R
D
D
D
NXP Semiconductors
D
R
R
A
FT
FT
FT
A
A
R
R
D
D
D
D
R
A
F
FT
FT
A
A
R
R
D
D
order to keep the noise coupled in via the PCB as small as possible. Also parasitics
should stay as small as possible. Values of Cx1 and Cx2 should be chosen smaller
accordingly to the increase in parasitics of the PCB layout.
D
FT
FT
A
A
R
R
D
D
D
11.4 Standard I/O pad configuration
R
A
FT
D
Figure 24 shows the possible pin modes for standard I/O pins with analog input function:
R
A
•
•
•
•
•
Digital output driver
Digital input: Pull-up enabled/disabled
Digital input: Pull-down enabled/disabled
Digital input: Repeater mode enabled/disabled
Analog input
VDD
output enable
pin configured
as digital output
driver
ESD
output
PIN
ESD
VDD
VSS
weak
pull-up
pull-up enable
pin configured
as digital input
weak
pull-down
repeater mode
enable
pull-down enable
data input
select analog input
pin configured
as analog input
analog input
002aaf304
Fig 24. Standard I/O pad configuration
LPC11C12_C14_0
Preliminary data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
© NXP B.V. 2010. All rights reserved.
42 of 49
D
D
R
R
R
R
R
D
D
D
A
A
A
A
A
D
R
R
A
A
FT
FT
FT
FT
A
A
R
R
D
D
D
D
R
R
A
FT
FT
FT
A
A
R
R
D
D
D
R
F
D
FT
FT
A
A
R
R
D
VDD
A
FT
FT
A
A
R
R
D
D
D
11.5 Reset pad configuration
FT
FT
FT
FT
FT
LPC11C12/C14
NXP Semiconductors
D
D
R
VDD
A
FT
D
VDD
R
reset
A
Rpu
ESD
20 ns RC
GLITCH FILTER
PIN
ESD
VSS
002aaf274
Fig 25. Reset pad configuration
LPC11C12_C14_0
Preliminary data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
© NXP B.V. 2010. All rights reserved.
43 of 49
D
D
R
R
R
R
R
D
D
D
A
A
A
A
A
D
R
R
A
A
FT
FT
FT
FT
A
A
R
R
D
D
D
D
R
R
A
FT
FT
FT
A
A
R
R
D
D
D
R
A
F
FT
FT
A
A
R
R
D
D
D
12. Package outline
FT
FT
FT
FT
FT
LPC11C12/C14
NXP Semiconductors
D
FT
A
A
R
R
D
LQFP48: plastic low profile quad flat package; 48 leads; body 7 x 7 x 1.4 mm
FT
SOT313-2
D
D
R
A
FT
D
R
A
c
y
X
36
25
A
37
24
ZE
e
E HE
A A2
(A 3)
A1
w M
θ
bp
pin 1 index
Lp
L
13
48
detail X
12
1
ZD
e
v M A
w M
bp
D
B
HD
v M B
0
2.5
5 mm
scale
DIMENSIONS (mm are the original dimensions)
UNIT
A
max.
A1
A2
A3
bp
c
D (1)
E (1)
e
HD
HE
L
Lp
v
w
y
mm
1.6
0.20
0.05
1.45
1.35
0.25
0.27
0.17
0.18
0.12
7.1
6.9
7.1
6.9
0.5
9.15
8.85
9.15
8.85
1
0.75
0.45
0.2
0.12
0.1
Z D (1) Z E (1)
θ
0.95
0.55
7o
o
0
0.95
0.55
Note
1. Plastic or metal protrusions of 0.25 mm maximum per side are not included.
REFERENCES
OUTLINE
VERSION
IEC
JEDEC
SOT313-2
136E05
MS-026
JEITA
EUROPEAN
PROJECTION
ISSUE DATE
00-01-19
03-02-25
Fig 26. Package outline SOT313-2 (LQFP48)
LPC11C12_C14_0
Preliminary data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
© NXP B.V. 2010. All rights reserved.
44 of 49
D
D
R
R
R
R
D
R
R
A
A
FT
Serial Peripheral Interface
SSI
Serial Synchronous Interface
SSP
Synchronous Serial Port
TTL
Transistor-Transistor Logic
UART
Universal Asynchronous Receiver/Transmitter
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
A
SPI
R
Service Data Object
D
Resistor-Capacitor
SDO
D
RC
F
Phase-Locked Loop
FT
PLL
FT
General Purpose Input/Output
A
GPIO
A
Controller Area Network
R
BrownOut Detection
CAN
R
BOD
D
Application Programming Interface
D
API
FT
Advanced Peripheral Bus
A
APB
R
Advanced Microcontroller Bus Architecture
D
Advanced High-performance Bus
AMBA
A
FT
FT
AHB
R
A
A
Analog-to-Digital Converter
D
R
R
ADC
R
A
D
D
Description
D
R
FT
FT
A
A
R
R
D
D
D
Acronym
FT
FT
FT
FT
A
A
R
R
D
D
D
Preliminary data sheet
Abbreviations
FT
FT
FT
FT
FT
LPC11C12_C14_0
A
A
A
A
A
13. Abbreviations
Table 17.
R
D
D
D
LPC11C12/C14
NXP Semiconductors
© NXP B.V. 2010. All rights reserved.
45 of 49
D
D
R
R
R
R
D
R
R
A
A
R
A
FT
R
A
F
FT
FT
A
A
R
R
D
D
D
D
A
Preliminary data sheet -
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
-
© NXP B.V. 2010. All rights reserved.
46 of 49
A
Deep-sleep wake-up pins described in Table note 2 and Section 7.16.5.2.
R
•
D
Corrected pin description: PIO2_4 on pin 18, PIO2_5 on pin 21; PIO3_4 and PIO3_5
are not available.
FT
•
<tbd>
D
R
Preliminary data sheet
D
<tbd>
Supersedes
FT
LPC11C12_C14_0.06
Change notice
FT
A
A
R
R
D
Data sheet status
Preliminary data sheet
D
R
FT
FT
A
A
R
R
D
D
D
Release date
LPC11C12_C14_0
FT
FT
FT
FT
A
A
R
R
D
D
D
Document ID
LPC11C12_C14_0.05
FT
FT
FT
FT
FT
Revision history
Modifications:
A
A
A
A
A
14. Revision history
Table 18.
R
D
D
D
LPC11C12/C14
NXP Semiconductors
D
D
R
R
R
R
R
D
D
D
A
A
A
A
A
FT
D
R
R
A
A
FT
FT
FT
FT
A
A
R
R
D
D
D
D
R
R
A
FT
FT
FT
A
A
R
R
D
D
D
R
F
D
FT
FT
A
A
R
R
D
15.1 Data sheet status
A
FT
FT
A
A
R
R
D
D
D
15. Legal information
FT
FT
FT
FT
LPC11C12/C14
NXP Semiconductors
D
D
R
Document status[1][2]
Product status[3]
Objective [short] data sheet
Development
This document contains data from the objective specification for product development.
Preliminary [short] data sheet
Qualification
This document contains data from the preliminary specification.
Product [short] data sheet
Production
This document contains the product specification.
A
Definition
FT
D
R
A
[1]
Please consult the most recently issued document before initiating or completing a design.
[2]
The term ‘short data sheet’ is explained in section “Definitions”.
[3]
The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status
information is available on the Internet at URL http://www.nxp.com.
15.2 Definitions
Draft — The document is a draft version only. The content is still under
internal review and subject to formal approval, which may result in
modifications or additions. NXP Semiconductors does not give any
representations or warranties as to the accuracy or completeness of
information included herein and shall have no liability for the consequences of
use of such information.
Short data sheet — A short data sheet is an extract from a full data sheet
with the same product type number(s) and title. A short data sheet is intended
for quick reference only and should not be relied upon to contain detailed and
full information. For detailed and full information see the relevant full data
sheet, which is available on request via the local NXP Semiconductors sales
office. In case of any inconsistency or conflict with the short data sheet, the
full data sheet shall prevail.
Product specification — The information and data provided in a Product
data sheet shall define the specification of the product as agreed between
NXP Semiconductors and its customer, unless NXP Semiconductors and
customer have explicitly agreed otherwise in writing. In no event however,
shall an agreement be valid in which the NXP Semiconductors product is
deemed to offer functions and qualities beyond those described in the
Product data sheet.
15.3 Disclaimers
Limited warranty and liability — Information in this document is believed to
be accurate and reliable. However, NXP Semiconductors does not give any
representations or warranties, expressed or implied, as to the accuracy or
completeness of such information and shall have no liability for the
consequences of use of such information.
In no event shall NXP Semiconductors be liable for any indirect, incidental,
punitive, special or consequential damages (including - without limitation - lost
profits, lost savings, business interruption, costs related to the removal or
replacement of any products or rework charges) whether or not such
damages are based on tort (including negligence), warranty, breach of
contract or any other legal theory.
Notwithstanding any damages that customer might incur for any reason
whatsoever, NXP Semiconductors’ aggregate and cumulative liability towards
customer for the products described herein shall be limited in accordance
with the Terms and conditions of commercial sale of NXP Semiconductors.
malfunction of an NXP Semiconductors product can reasonably be expected
to result in personal injury, death or severe property or environmental
damage. NXP Semiconductors accepts no liability for inclusion and/or use of
NXP Semiconductors products in such equipment or applications and
therefore such inclusion and/or use is at the customer’s own risk.
Applications — Applications that are described herein for any of these
products are for illustrative purposes only. NXP Semiconductors makes no
representation or warranty that such applications will be suitable for the
specified use without further testing or modification.
Customers are responsible for the design and operation of their applications
and products using NXP Semiconductors products, and NXP Semiconductors
accepts no liability for any assistance with applications or customer product
design. It is customer’s sole responsibility to determine whether the NXP
Semiconductors product is suitable and fit for the customer’s applications and
products planned, as well as for the planned application and use of
customer’s third party customer(s). Customers should provide appropriate
design and operating safeguards to minimize the risks associated with their
applications and products.
NXP Semiconductors does not accept any liability related to any default,
damage, costs or problem which is based on any weakness or default in the
customer’s applications or products, or the application or use by customer’s
third party customer(s). Customer is responsible for doing all necessary
testing for the customer’s applications and products using NXP
Semiconductors products in order to avoid a default of the applications and
the products or of the application or use by customer’s third party
customer(s). NXP does not accept any liability in this respect.
Limiting values — Stress above one or more limiting values (as defined in
the Absolute Maximum Ratings System of IEC 60134) will cause permanent
damage to the device. Limiting values are stress ratings only and (proper)
operation of the device at these or any other conditions above those given in
the Recommended operating conditions section (if present) or the
Characteristics sections of this document is not warranted. Constant or
repeated exposure to limiting values will permanently and irreversibly affect
the quality and reliability of the device.
Terms and conditions of commercial sale — NXP Semiconductors
products are sold subject to the general terms and conditions of commercial
sale, as published at http://www.nxp.com/profile/terms, unless otherwise
agreed in a valid written individual agreement. In case an individual
agreement is concluded only the terms and conditions of the respective
agreement shall apply. NXP Semiconductors hereby expressly objects to
applying the customer’s general terms and conditions with regard to the
purchase of NXP Semiconductors products by customer.
Right to make changes — NXP Semiconductors reserves the right to make
changes to information published in this document, including without
limitation specifications and product descriptions, at any time and without
notice. This document supersedes and replaces all information supplied prior
to the publication hereof.
No offer to sell or license — Nothing in this document may be interpreted or
construed as an offer to sell products that is open for acceptance or the grant,
conveyance or implication of any license under any copyrights, patents or
other industrial or intellectual property rights.
Suitability for use — NXP Semiconductors products are not designed,
authorized or warranted to be suitable for use in life support, life-critical or
safety-critical systems or equipment, nor in applications where failure or
Quick reference data — The Quick reference data is an extract of the
product data given in the Limiting values and Characteristics sections of this
document, and as such is not complete, exhaustive or legally binding.
LPC11C12_C14_0
Preliminary data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
© NXP B.V. 2010. All rights reserved.
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whenever customer uses the product for automotive applications beyond
NXP Semiconductors’ specifications such use shall be solely at customer’s
own risk, and (c) customer fully indemnifies NXP Semiconductors for any
liability, damages or failed product claims resulting from customer design and
use of the product for automotive applications beyond NXP Semiconductors’
standard warranty and NXP Semiconductors’ product specifications.
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15.4 Trademarks
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: [email protected]
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 6 May 2010
© NXP B.V. 2010. All rights reserved.
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I2C-bus — logo is a trademark of NXP B.V.
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Notice: All referenced brands, product names, service names and trademarks
are the property of their respective owners.
16. Contact information
Preliminary data sheet
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In the event that customer uses the product for design-in and use in
automotive applications to automotive specifications and standards, customer
(a) shall use the product without NXP Semiconductors’ warranty of the
product for such automotive applications, use and specifications, and (b)
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Non-automotive qualified products — Unless this data sheet expressly
states that this specific NXP Semiconductors product is automotive qualified,
the product is not suitable for automotive use. It is neither qualified nor tested
in accordance with automotive testing or application requirements. NXP
Semiconductors accepts no liability for inclusion and/or use of
non-automotive qualified products in automotive equipment or applications.
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Export control — This document as well as the item(s) described herein
may be subject to export control regulations. Export might require a prior
authorization from national authorities.
LPC11C12_C14_0
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LPC11C12/C14
NXP Semiconductors
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All rights reserved.
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: [email protected]
Date of release: 6 May 2010
Document identifier: LPC11C12_C14_0
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Please be aware that important notices concerning this document and the product(s)
described herein, have been included in section ‘Legal information’.
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7.16.5.3 Deep power-down mode . . . . . . . . . . . . . . . .
7.17
System control . . . . . . . . . . . . . . . . . . . . . . . .
7.17.1
Reset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
7.17.2
Brownout detection . . . . . . . . . . . . . . . . . . . .
7.17.3
Code security (Code Read Protection - CRP)
7.17.4
APB interface . . . . . . . . . . . . . . . . . . . . . . . . .
7.17.5
AHBLite . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
7.17.6
External interrupt inputs . . . . . . . . . . . . . . . . .
7.17.7
Memory mapping control . . . . . . . . . . . . . . . .
7.18
Emulation and debugging . . . . . . . . . . . . . . .
8
Limiting values . . . . . . . . . . . . . . . . . . . . . . . .
9
Static characteristics . . . . . . . . . . . . . . . . . . .
9.1
BOD static characteristics . . . . . . . . . . . . . . .
9.2
Power consumption . . . . . . . . . . . . . . . . . . .
9.3
Electrical pin characteristics. . . . . . . . . . . . . .
10
Dynamic characteristics. . . . . . . . . . . . . . . . .
10.1
Flash memory . . . . . . . . . . . . . . . . . . . . . . . .
10.2
External clock. . . . . . . . . . . . . . . . . . . . . . . . .
10.3
Internal oscillators . . . . . . . . . . . . . . . . . . . . .
10.4
I/O pins . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
10.5
I2C-bus . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
10.6
SPI interfaces. . . . . . . . . . . . . . . . . . . . . . . . .
11
Application information . . . . . . . . . . . . . . . . .
11.1
ADC usage notes. . . . . . . . . . . . . . . . . . . . . .
11.2
XTAL input . . . . . . . . . . . . . . . . . . . . . . . . . . .
11.3
XTAL Printed Circuit Board (PCB) layout
guidelines. . . . . . . . . . . . . . . . . . . . . . . . . . . .
11.4
Standard I/O pad configuration . . . . . . . . . . .
11.5
Reset pad configuration . . . . . . . . . . . . . . . . .
12
Package outline. . . . . . . . . . . . . . . . . . . . . . . .
13
Abbreviations . . . . . . . . . . . . . . . . . . . . . . . . .
14
Revision history . . . . . . . . . . . . . . . . . . . . . . .
15
Legal information . . . . . . . . . . . . . . . . . . . . . .
15.1
Data sheet status . . . . . . . . . . . . . . . . . . . . . .
15.2
Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . .
15.3
Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . .
15.4
Trademarks . . . . . . . . . . . . . . . . . . . . . . . . . .
16
Contact information . . . . . . . . . . . . . . . . . . . .
17
Contents. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
© NXP B.V. 2010.
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General description . . . . . . . . . . . . . . . . . . . . . . 1
Features and benefits . . . . . . . . . . . . . . . . . . . . 1
Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2
Ordering information . . . . . . . . . . . . . . . . . . . . . 2
Ordering options . . . . . . . . . . . . . . . . . . . . . . . . 3
Block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . 3
Pinning information . . . . . . . . . . . . . . . . . . . . . . 4
Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 5
Functional description . . . . . . . . . . . . . . . . . . . 9
ARM Cortex-M0 processor . . . . . . . . . . . . . . . . 9
On-chip flash program memory . . . . . . . . . . . . 9
On-chip SRAM . . . . . . . . . . . . . . . . . . . . . . . . . 9
Memory map. . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Nested Vectored Interrupt Controller (NVIC) . 10
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
Interrupt sources. . . . . . . . . . . . . . . . . . . . . . . 11
IOCONFIG block . . . . . . . . . . . . . . . . . . . . . . 11
Fast general purpose parallel I/O . . . . . . . . . . 11
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
UART . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
SPI serial I/O controller. . . . . . . . . . . . . . . . . . 12
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
I2C-bus serial I/O controller . . . . . . . . . . . . . . 12
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
C_CAN controller . . . . . . . . . . . . . . . . . . . . . . 13
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
10-bit ADC . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
General purpose external event
counter/timers . . . . . . . . . . . . . . . . . . . . . . . . . 14
7.13.1
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
7.14
System tick timer . . . . . . . . . . . . . . . . . . . . . . 14
7.15
Watchdog timer. . . . . . . . . . . . . . . . . . . . . . . . 14
7.15.1
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
7.16
Clocking and power control . . . . . . . . . . . . . . 15
7.16.1
Crystal oscillators . . . . . . . . . . . . . . . . . . . . . . 15
7.16.1.1 Internal RC oscillator . . . . . . . . . . . . . . . . . . . 16
7.16.1.2 System oscillator . . . . . . . . . . . . . . . . . . . . . . 16
7.16.1.3 Watchdog oscillator . . . . . . . . . . . . . . . . . . . . 17
7.16.2
System PLL . . . . . . . . . . . . . . . . . . . . . . . . . . 17
7.16.3
Clock output . . . . . . . . . . . . . . . . . . . . . . . . . . 17
7.16.4
Wake-up process . . . . . . . . . . . . . . . . . . . . . . 17
7.16.5
Power control . . . . . . . . . . . . . . . . . . . . . . . . . 17
7.16.5.1 Sleep mode . . . . . . . . . . . . . . . . . . . . . . . . . . 17
7.16.5.2 Deep-sleep mode . . . . . . . . . . . . . . . . . . . . . . 18
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17. Contents
1
2
3
4
4.1
5
6
6.1
6.2
7
7.1
7.2
7.3
7.4
7.5
7.5.1
7.5.2
7.6
7.7
7.7.1
7.8
7.8.1
7.9
7.9.1
7.10
7.10.1
7.11
7.11.1
7.12
7.12.1
7.13
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LPC11C12/C14
NXP Semiconductors