PHK18NQ03LT N-channel TrenchMOS logic level FET Rev. 01 — 18 December 2006 Product data sheet 1. Product profile 1.1 General description Logic level N-channel enhancement mode Field-Effect Transistor (FET) in a plastic package using TrenchMOS technology. 1.2 Features n Optimized for use in DC-to-DC converters n Logic level compatible n Very low switching and conduction losses 1.3 Applications n DC-to-DC converters n Voltage regulators n Switched-mode power supplies n Notebook computers 1.4 Quick reference data n VDS ≤ 30 V n RDSon ≤ 8.9 mΩ n ID ≤ 20.3 A n QGD = 2.5 nC (typ) 2. Pinning information Table 1. Pinning Pin Description 1, 2, 3 source (S) 4 gate (G) 5, 6, 7, 8 drain (D) Simplified outline 8 Symbol D 5 G 1 4 SOT96-1 (SO8) mbb076 S PHK18NQ03LT NXP Semiconductors N-channel TrenchMOS logic level FET 3. Ordering information Table 2. Ordering information Type number PHK18NQ03LT Package Name Description Version SO8 plastic small outline package; 8 leads; body width 3.9 mm SOT96-1 4. Limiting values Table 3. Limiting values In accordance with the Absolute Maximum Rating System (IEC 60134). Symbol Parameter Conditions Min Max Unit VDS drain-source voltage 25 °C ≤ Tj ≤ 150 °C - 30 V VDGR drain-gate voltage (DC) 25 °C ≤ Tj ≤ 150 °C; RGS = 20 kΩ - 30 V VGS gate-source voltage - ±20 V ID drain current Tsp = 25 °C; VGS = 10 V; see Figure 2 and 3 - 20.3 A Tsp = 100 °C; VGS = 10 V; see Figure 2 - 12.1 A IDM peak drain current Tsp = 25 °C; pulsed; tp ≤ 10 µs; see Figure 3 - 80 A Ptot total power dissipation Tsp = 25 °C; see Figure 1 - 6.25 W Tstg storage temperature −55 +150 °C Tj junction temperature −55 +150 °C Source-drain diode IS source current Tsp = 25 °C - 5.2 A ISM peak source current Tsp = 25 °C; pulsed; tp ≤ 10 µs - 20.8 A unclamped inductive load; ID = 31.5 A; tp = 0.07 ms; VDS ≤ 25 V; RGS = 50 Ω; VGS = 10 V; starting at Tj = 25 °C - 50 mJ Avalanche ruggedness EDS(AL)S non-repetitive drain-source avalanche energy PHK18NQ03LT_1 Product data sheet © NXP B.V. 2006. All rights reserved. Rev. 01 — 18 December 2006 2 of 12 PHK18NQ03LT NXP Semiconductors N-channel TrenchMOS logic level FET 03aa17 120 03aa25 120 Ider (%) Pder (%) 80 80 40 40 0 0 0 50 100 150 Tsp (°C) 200 P tot P der = ------------------------ × 100 % P tot ( 25°C ) 0 50 100 150 Tsp (°C) 200 ID I der = -------------------- × 100 % I D ( 25°C ) Fig 1. Normalized total power dissipation as a function of solder point temperature Fig 2. Normalized continuous drain current as a function of solder point temperature 003aaa680 103 ID (A) Limit RDSon = VDS / ID 102 tp = 10 µ s 100 µ s 10 1 ms DC 10 ms 1 100 ms 10-1 10-1 1 10 102 VDS (V) Tsp = 25 °C; IDM is single pulse Fig 3. Safe operating area; continuous and peak drain currents as a function of drain-source voltage PHK18NQ03LT_1 Product data sheet © NXP B.V. 2006. All rights reserved. Rev. 01 — 18 December 2006 3 of 12 PHK18NQ03LT NXP Semiconductors N-channel TrenchMOS logic level FET 5. Thermal characteristics Table 4. Thermal characteristics Symbol Parameter thermal resistance from junction to solder point Rth(j-sp) Conditions Min Typ Max Unit see Figure 4 - - 20 K/W 003aaa681 102 Zth(j-sp) (K/W) 10 δ = 0.5 0.2 0.1 1 0.05 δ= P tp T 0.02 single pulse 10 10-5 t tp T -1 10-4 10-3 10-2 10-1 1 tp (s) 10 Fig 4. Transient thermal impedance from junction to solder point as a function of pulse duration PHK18NQ03LT_1 Product data sheet © NXP B.V. 2006. All rights reserved. Rev. 01 — 18 December 2006 4 of 12 PHK18NQ03LT NXP Semiconductors N-channel TrenchMOS logic level FET 6. Characteristics Table 5. Characteristics Tj = 25 °C unless otherwise specified. Symbol Parameter Conditions Min Typ Max Unit Tj = 25 °C 30 - - V Tj = −55 °C 27 - - V Static characteristics V(BR)DSS drain-source breakdown voltage VGS(th) IDSS gate-source threshold voltage drain leakage current ID = 250 µA; VGS = 0 V ID = 1 mA; VDS = VGS; see Figure 9 and 10 Tj = 25 °C 1.3 1.7 2.15 V Tj = 150 °C 0.8 - - V Tj = −55 °C - - 2.6 V VDS = 30 V; VGS = 0 V Tj = 25 °C - - 1 µA Tj = 150 °C - - 100 µA IGSS gate leakage current VGS = ±16 V; VDS = 0 V - - 100 nA RG gate resistance f = 1 MHz; VGSS(AC) = 150 mV - 1.6 - Ω RDSon drain-source on-state resistance VGS = 10 V; ID = 25 A; see Figure 6 and 8 Tj = 25 °C - 7.1 8.9 mΩ Tj = 150 °C - 12.1 15.1 mΩ VGS = 4.5 V; ID = 25 A; see Figure 6 and 8 - 10.1 12.5 mΩ ID = 15 A; VDS = 12 V; VGS = 4.5 V; see Figure 11 and 12 - 10.6 - nC - 4.85 - nC - nC Dynamic characteristics QG(tot) total gate charge QGS gate-source charge QGS1 pre-VGS(th) gate-source charge - 2.4 QGS2 post-VGS(th) gate-source charge - 2.45 - nC QGD gate-drain charge - 2.5 - nC VGS(pl) gate-source plateau voltage - 3 - V Ciss input capacitance - 1380 - pF Coss output capacitance - 290 - pF Crss reverse transfer capacitance - 135 - pF Ciss input capacitance VGS = 0 V; VDS = 0 V; f = 1 MHz - 1590 - pF td(on) turn-on delay time VDS = 12 V; RL = 0.8 Ω; VGS = 4.5 V; RG = 5.6 Ω - 19 - ns VGS = 0 V; VDS = 12 V; f = 1 MHz; see Figure 14 tr rise time - 22 - ns td(off) turn-off delay time - 19 - ns tf fall time - 11 - ns Source-drain diode VSD source-drain voltage IS = 20 A; VGS = 0 V; see Figure 13 - 0.95 1.2 V trr reverse recovery time IS = 15 A; dIS/dt = −100 A/µs; VGS = 0 V - 34 - ns Qr recovered charge - 14 - nC PHK18NQ03LT_1 Product data sheet © NXP B.V. 2006. All rights reserved. Rev. 01 — 18 December 2006 5 of 12 PHK18NQ03LT NXP Semiconductors N-channel TrenchMOS logic level FET 003aaa682 20 10 4.5 3.4 3.2 003aaa684 50 RDSon (mΩ) ID (A) 40 3 15 3 VGS (V) = 2.8 30 10 3.2 2.8 20 3.4 5 4.5 10 10 2.6 VGS (V) = 2.4 0 0 0 0.2 0.4 0.6 VDS (V) 0.8 0 Tj = 25 °C 5 10 15 ID (A) 20 Tj = 25 °C Fig 5. Output characteristics: drain current as a function of drain-source voltage; typical values Fig 6. Drain-source on-state resistance as a function of drain current; typical values 003aaa683 40 ID (A) 003aab467 2 a 1.6 30 1.2 20 0.8 10 Tj = 150 °C 25 °C 0.4 0 0 1 2 3 VGS (V) 4 Tj = 25 °C and 150 °C; VDS > ID × RDSon 0 -60 60 120 Tj (°C) 180 R DSon a = ----------------------------R DSon ( 25°C ) Fig 7. Transfer characteristics: drain current as a function of gate-source voltage; typical values Fig 8. Normalized drain-source on-state resistance factor as a function of junction temperature PHK18NQ03LT_1 Product data sheet 0 © NXP B.V. 2006. All rights reserved. Rev. 01 — 18 December 2006 6 of 12 PHK18NQ03LT NXP Semiconductors N-channel TrenchMOS logic level FET 003aab272 3 VGS(th) (V) 2.5 003aab271 10-3 ID (A) max 10-4 2 min typ 1.5 typ max min 10-5 1 0.5 10-6 0 -60 0 60 120 Tj (°C) 180 0 0.5 1 1.5 2 VGS (V) 2.5 Tj = 25 °C; VDS = 5 V ID = 1 mA; VDS = VGS Fig 9. Gate-source threshold voltage as a function of junction temperature Fig 10. Sub-threshold drain current as a function of gate-source voltage 003aaa685 10 ID = 15 A Tj = 25 °C VGS (V) 8 VDS ID 6 VDS = 19 V 12 V VGS(pl) 4 VGS(th) VGS 2 QGS1 QGS2 QGS 0 0 5 10 15 20 25 QG (nC) QGD QG(tot) 003aaa508 ID = 15 A; VDS = 12 V and 19 V Fig 11. Gate-source voltage as a function of gate charge; typical values Fig 12. Gate charge waveform definitions PHK18NQ03LT_1 Product data sheet © NXP B.V. 2006. All rights reserved. Rev. 01 — 18 December 2006 7 of 12 PHK18NQ03LT NXP Semiconductors N-channel TrenchMOS logic level FET 003aaa686 40 003aaa687 104 IS (A) 30 C (pF) 20 103 Ciss 10 150 °C Tj = 25 °C Coss 0 0.4 0.8 VSD (V) Crss 102 10-1 0 1.2 Tj = 25 °C and 150 °C; VGS = 0 V 1 10 VDS (V) 102 VGS = 0 V; f = 1 MHz Fig 13. Source current as a function of source-drain voltage; typical values Fig 14. Input, output and reverse transfer capacitances as a function of drain-source voltage; typical values 003aaa688 104 C (pF) Ciss Crss 10 3 102 10-1 1 VGS (V) 10 VGS = 0 V; f = 1 MHz Fig 15. Input and reverse transfer capacitances as a function of gate-source voltage; typical values PHK18NQ03LT_1 Product data sheet © NXP B.V. 2006. All rights reserved. Rev. 01 — 18 December 2006 8 of 12 PHK18NQ03LT NXP Semiconductors N-channel TrenchMOS logic level FET 7. Package outline SO8: plastic small outline package; 8 leads; body width 3.9 mm SOT96-1 D E A X c y HE v M A Z 5 8 Q A2 A (A 3) A1 pin 1 index θ Lp 1 L 4 e detail X w M bp 0 2.5 5 mm scale DIMENSIONS (inch dimensions are derived from the original mm dimensions) UNIT A max. A1 A2 A3 bp c D (1) E (2) e HE L Lp Q v w y Z (1) mm 1.75 0.25 0.10 1.45 1.25 0.25 0.49 0.36 0.25 0.19 5.0 4.8 4.0 3.8 1.27 6.2 5.8 1.05 1.0 0.4 0.7 0.6 0.25 0.25 0.1 0.7 0.3 inches 0.069 0.010 0.057 0.004 0.049 0.01 0.019 0.0100 0.014 0.0075 0.20 0.19 0.16 0.15 0.05 0.01 0.01 0.004 0.028 0.012 0.244 0.039 0.028 0.041 0.228 0.016 0.024 θ 8o o 0 Notes 1. Plastic or metal protrusions of 0.15 mm (0.006 inch) maximum per side are not included. 2. Plastic or metal protrusions of 0.25 mm (0.01 inch) maximum per side are not included. REFERENCES OUTLINE VERSION IEC JEDEC SOT96-1 076E03 MS-012 JEITA EUROPEAN PROJECTION ISSUE DATE 99-12-27 03-02-18 Fig 16. Package outline SOT96-1 (SO8) PHK18NQ03LT_1 Product data sheet © NXP B.V. 2006. All rights reserved. Rev. 01 — 18 December 2006 9 of 12 PHK18NQ03LT NXP Semiconductors N-channel TrenchMOS logic level FET 8. Revision history Table 6. Revision history Document ID Release date Data sheet status Change notice Supersedes PHK18NQ03LT_1 20061218 Product data sheet - - PHK18NQ03LT_1 Product data sheet © NXP B.V. 2006. All rights reserved. Rev. 01 — 18 December 2006 10 of 12 PHK18NQ03LT NXP Semiconductors N-channel TrenchMOS logic level FET 9. Legal information 9.1 Data sheet status Document status[1][2] Product status[3] Definition Objective [short] data sheet Development This document contains data from the objective specification for product development. Preliminary [short] data sheet Qualification This document contains data from the preliminary specification. Product [short] data sheet Production This document contains the product specification. [1] Please consult the most recently issued document before initiating or completing a design. [2] The term ‘short data sheet’ is explained in section “Definitions”. [3] The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status information is available on the Internet at URL http://www.nxp.com. 9.2 Definitions Draft — The document is a draft version only. The content is still under internal review and subject to formal approval, which may result in modifications or additions. NXP Semiconductors does not give any representations or warranties as to the accuracy or completeness of information included herein and shall have no liability for the consequences of use of such information. Short data sheet — A short data sheet is an extract from a full data sheet with the same product type number(s) and title. A short data sheet is intended for quick reference only and should not be relied upon to contain detailed and full information. For detailed and full information see the relevant full data sheet, which is available on request via the local NXP Semiconductors sales office. In case of any inconsistency or conflict with the short data sheet, the full data sheet shall prevail. 9.3 Disclaimers General — Information in this document is believed to be accurate and reliable. However, NXP Semiconductors does not give any representations or warranties, expressed or implied, as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. Right to make changes — NXP Semiconductors reserves the right to make changes to information published in this document, including without limitation specifications and product descriptions, at any time and without notice. This document supersedes and replaces all information supplied prior to the publication hereof. Suitability for use — NXP Semiconductors products are not designed, authorized or warranted to be suitable for use in medical, military, aircraft, space or life support equipment, nor in applications where failure or malfunction of a NXP Semiconductors product can reasonably be expected to result in personal injury, death or severe property or environmental damage. NXP Semiconductors accepts no liability for inclusion and/or use of NXP Semiconductors products in such equipment or applications and therefore such inclusion and/or use is at the customer’s own risk. Applications — Applications that are described herein for any of these products are for illustrative purposes only. NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification. Limiting values — Stress above one or more limiting values (as defined in the Absolute Maximum Ratings System of IEC 60134) may cause permanent damage to the device. Limiting values are stress ratings only and operation of the device at these or any other conditions above those given in the Characteristics sections of this document is not implied. Exposure to limiting values for extended periods may affect device reliability. Terms and conditions of sale — NXP Semiconductors products are sold subject to the general terms and conditions of commercial sale, as published at http://www.nxp.com/profile/terms, including those pertaining to warranty, intellectual property rights infringement and limitation of liability, unless explicitly otherwise agreed to in writing by NXP Semiconductors. In case of any inconsistency or conflict between information in this document and such terms and conditions, the latter will prevail. No offer to sell or license — Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights. 9.4 Trademarks Notice: All referenced brands, product names, service names and trademarks are the property of their respective owners. TrenchMOS — is a trademark of NXP B.V. 10. Contact information For additional information, please visit: http://www.nxp.com For sales office addresses, send an email to: [email protected] PHK18NQ03LT_1 Product data sheet © NXP B.V. 2006. All rights reserved. Rev. 01 — 18 December 2006 11 of 12 PHK18NQ03LT NXP Semiconductors N-channel TrenchMOS logic level FET 11. Contents 1 1.1 1.2 1.3 1.4 2 3 4 5 6 7 8 9 9.1 9.2 9.3 9.4 10 11 Product profile . . . . . . . . . . . . . . . . . . . . . . . . . . 1 General description. . . . . . . . . . . . . . . . . . . . . . 1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 Quick reference data. . . . . . . . . . . . . . . . . . . . . 1 Pinning information . . . . . . . . . . . . . . . . . . . . . . 1 Ordering information . . . . . . . . . . . . . . . . . . . . . 2 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 2 Thermal characteristics. . . . . . . . . . . . . . . . . . . 4 Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . 5 Package outline . . . . . . . . . . . . . . . . . . . . . . . . . 9 Revision history . . . . . . . . . . . . . . . . . . . . . . . . 10 Legal information. . . . . . . . . . . . . . . . . . . . . . . 11 Data sheet status . . . . . . . . . . . . . . . . . . . . . . 11 Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 Trademarks . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 Contact information. . . . . . . . . . . . . . . . . . . . . 11 Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 Please be aware that important notices concerning this document and the product(s) described herein, have been included in section ‘Legal information’. © NXP B.V. 2006. All rights reserved. For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: [email protected] Date of release: 18 December 2006 Document identifier: PHK18NQ03LT_1