TC74LVX04F/FN/FT TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic TC74LVX04F,TC74LVX04FN,TC74LVX04FT Hex Inverter The TC74LVX04F/FN/FT is a high-speed CMOS hex inverter fabricated with silicon gate CMOS technology. Designed for use in 3-V systems, it achieves high-speed operation while maintaining the CMOS low power dissipation. This device is suitable for low-voltage and battery operated systems. The internal circuit is composed of 3 stages including buffer output, which provide high noise immunity and stable output. An input protection circuit ensures that 0 to 5.5V can be applied to the input pins without regard to the supply voltage. This device can be used to interface 5V to 3V systems and two supply systems such as battery back up. This circuit prevents device destruction due to mismatched supply and input voltages. Note: xxxFN (JEDEC SOP) is not available in Japan. TC74LVX04F TC74LVX04FN Features • High-speed: tpd = 4.1 ns (typ.) (VCC = 3.3 V) • Low power dissipation: ICC = 2 μA (max) (Ta = 25°C) • Input voltage level: VIL = 0.8 V (max) (VCC = 3 V) VIH = 2.0 V (min) (VCC = 3 V) • Power-down protection provided on all inputs Balanced propagation delays: tpLH ∼ − tpHL • • Low noise: VOLP = 0.5 V (max) • Pin and function compatible with 74HC04 TC74LVX04FT Weight SOP14-P-300-1.27A SOL14-P-150-1.27 TSSOP14-P-0044-0.65A 1 : 0.18 g (typ.) : 0.12 g (typ.) : 0.06 g (typ.) 2007-10-17 TC74LVX04F/FN/FT Pin Assignment (top view) 1A 1 IEC Logic Symbol 14 1A VCC 1Y 2 13 6A 2A 3 12 6Y 2Y 4 11 5A 3A 5 10 5Y 3Y 6 9 4A GND 7 8 4Y 2A 3A 4A 5A 6A (1) (3) 1 (2) (4) (5) (6) (9) (8) (11) (10) (13) (12) 1Y 2Y 3Y 4Y 5Y 6Y Truth Table Inputs Outputs A Y L H H L Absolute Maximum Ratings (Note) Characteristics Symbol Rating Unit Supply voltage range VCC −0.5 to 7.0 V DC input voltage VIN −0.5 to 7.0 V DC output voltage VOUT −0.5 to VCC + 0.5 V Input diode current IIK −20 mA Output diode current IOK ±20 mA DC output current IOUT ±25 mA DC VCC/ground current ICC ±50 mA Power dissipation PD 180 mW Storage temperature Tstg −65 to 150 °C Note: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Operating Ranges (Note) Characteristics Symbol Rating Supply voltage VCC 2.0 to 3.6 V Input voltage VIN 0 to 5.5 V VOUT 0 to VCC V Operating temperature Topr −40 to 85 °C Input rise and fall time dt/dv 0 to 100 ns/V Output voltage Unit Note: The operating ranges must be maintained to ensure the normal operation of the device. Unused inputs must be tied to either VCC or GND. 2 2007-10-17 TC74LVX04F/FN/FT Electrical Characteristics DC Characteristics Characteristics H-level Symbol VCC (V) Min Typ. Max Min Max 2.0 1.5 ⎯ ⎯ 1.5 ⎯ 3.0 2.0 ⎯ ⎯ 2.0 ⎯ 3.6 2.4 ⎯ ⎯ 2.4 ⎯ 2.0 ⎯ ⎯ 0.5 ⎯ 0.5 3.0 ⎯ ⎯ 0.8 ⎯ 0.8 3.6 ⎯ ⎯ 0.8 ⎯ 0.8 IOH = −50 μA 2.0 1.9 2.0 ⎯ 1.9 ⎯ VIN = VIL IOH = −50 μA 3.0 2.9 3.0 ⎯ 2.9 ⎯ IOH = −4 mA 3.0 2.58 ⎯ ⎯ 2.48 ⎯ IOL = 50 μA 2.0 ⎯ 0.0 0.1 ⎯ 0.1 VIN = VIH IOL = 50 μA 3.0 ⎯ 0.0 0.1 ⎯ 0.1 IOL = 4 mA 3.0 ⎯ ⎯ 0.36 ⎯ 0.44 ⎯ VIH Input voltage L-level H-level ⎯ VIL VOH Output voltage L-level VOL Ta = −40 to 85°C Ta = 25°C Test Condition Unit V V Input leakage current IIN VIN = 5.5 V or GND 3.6 ⎯ ⎯ ±0.1 ⎯ ±1.0 μA Quiescent supply current ICC VIN = VCC or GND 3.6 ⎯ ⎯ 2.0 ⎯ 20.0 μA AC Characteristics (input: tr = tf = 3 ns) Characteristics Symbol VCC (V) tpLH Min Typ. Max Min Max 15 ⎯ 5.4 10.1 1.0 12.5 50 ⎯ 7.9 13.6 1.0 16.0 15 ⎯ 4.1 6.2 1.0 7.5 50 ⎯ 6.6 9.7 1.0 11.0 2.7 50 ⎯ ⎯ 1.5 ⎯ 1.5 3.3 ± 0.3 50 ⎯ ⎯ 1.5 ⎯ 1.5 2.7 3.3 ± 0.3 tpHL Output to output skew CL (pF) ⎯ Propagation delay time tosLH tosHL (Note 1) Ta = −40 to 85°C Ta = 25°C Test Condition Unit ns ns Input capacitance CIN (Note 2) ⎯ 4 10 ⎯ 10 pF Power dissipation capacitance CPD (Note 3) ⎯ 18 ⎯ ⎯ ⎯ pF Note 1: Parameter guaranteed by design. (tosLH = |tpLHm − tpLHn|, tosHL = |tpHLm − tpHLn|) Note 2: Parameter guaranteed by design. Note 3: CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current consumption. Average operating current can be obtained by the equation: ICC (opr) = CPD･VCC･fIN + ICC/6 (per gate) 3 2007-10-17 TC74LVX04F/FN/FT Noise Characteristics (Ta = 25°C, input: tr = tf = 3 ns, CL = 50 pF) Characteristics Typ. Limit Unit 3.3 0.3 0.5 V ⎯ 3.3 −0.3 −0.5 V VIHD ⎯ 3.3 ⎯ 2.0 V VILD ⎯ 3.3 ⎯ 0.8 V Symbol Test Condition Quiet output maximum dynamic VOL VOLP ⎯ Quiet output minimum dynamic VOL VOLV Minimum high level dynamic input voltage VIH Maximum low level dynamic input voltage VIL VCC (V) Input Equivalent Circuit INPUT 4 2007-10-17 TC74LVX04F/FN/FT Package Dimensions Weight: 0.18 g (typ.) 5 2007-10-17 TC74LVX04F/FN/FT Package Dimensions (Note) Note: This package is not available in Japan. Weight: 0.12 g (typ.) 6 2007-10-17 TC74LVX04F/FN/FT Package Dimensions Weight: 0.06 g (typ.) 7 2007-10-17 TC74LVX04F/FN/FT RESTRICTIONS ON PRODUCT USE 20070701-EN GENERAL • The information contained herein is subject to change without notice. • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 8 2007-10-17