TC75S56F/FU/FE TOSHIBA CMOS Linear Integrated Circuit Silicon Monolithic TC75S56F,TC75S56FU,TC75S56FE Single Comparator The TC75S56F/TC75S56FU/TC75S56FE is a CMOS generalpurpose single comparator. The device can operate off a single power supply and draws a lower supply current than a conventional bipolar general-purpose comparator. This device’s push-pull output stage can be directly connected to TTL or CMOS logic ICs, among others. TC75S56F Features • Low-current power supply • Single power supply operation • Wide common mode input voltage range : VSS~VDD − 0.9 V • Push-pull output circuit • Low input bias current • Small package : IDD = 10 μA (typ.) TC75S56FU TC75S56FE Weight SSOP5-P-0.95 : 0.014 g (typ.) SSOP5-P-0.65A : 0.006 g (typ.) SON5-P-0.50 : 0.003 g (typ.) Marking (top view) 5 Pin Connection (top view) 4 VDD OUT 5 4 TC 1 2 1 IN (−) 3 1 2 VSS 3 IN (+) 2007-11-01 TC75S56F/FU/FE Absolute Maximum Ratings (Ta = 25°C) Characteristics Symbol Rating Unit VDD, VSS ±3.5 or 7 V DVIN ±7 V Input voltage VIN VSS~VDD V Output Current IOUT ±35 mA Supply voltage Differential input voltage Power dissipation TC75S56F/FU TC75S56FE 200 PD 100 mW Operating temperature Topr −40~85 °C Storage temperature Tstg −55~125 °C Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note: This device’s CMOS structure makes it prone to latch-up. To prevent latch-up, please take the following precautions: • Ensure that no I/O pin’s voltage level ever exceeds VDD or drops below VSS. In addition, check the power-on timing. • Do not subject the device to excessive noise. 2 2007-11-01 TC75S56F/FU/FE Electrical Characteristics (unless otherwise specified, VDD = 5 V, VSS = GND, Ta = 25°C) Symbol Test Circuit Test Condition Min Typ. Max Unit Input offset voltage VIO ⎯ ⎯ ⎯ ±1 ±7 mV Input offset current IIO ⎯ ⎯ ⎯ 1 ⎯ pA II ⎯ ⎯ ⎯ 1 ⎯ pA Characteristics Input bias current Common mode input voltage CMVIN ⎯ ⎯ 0 ⎯ 4.1 V Supply current IDD (Note) ⎯ ⎯ ⎯ 11 22 μA ⎯ ⎯ 94 ⎯ dB Voltage gain GV ⎯ Sink current Isink ⎯ VOL = 0.5 V 13 25 ⎯ mA Isource ⎯ VOH = 4.5 V 9 21 ⎯ mA VOL ⎯ Isink = 5.0 mA ⎯ 0.1 0.3 VOH ⎯ Isource = 5.0 mA 4.7 4.9 ⎯ VDD ⎯ 1.8 ⎯ 7.0 tPLH (1) ⎯ Over drive = 100 mV ⎯ 680 ⎯ tPLH (2) ⎯ TTL step input ⎯ 500 ⎯ tPHL (1) ⎯ Over drive = 100 mV ⎯ 250 ⎯ tPHL (2) ⎯ TTL step input ⎯ 380 ⎯ tTLH ⎯ Over drive = 100 mV ⎯ 60 ⎯ tTHL ⎯ Over drive = 100 mV ⎯ 8 ⎯ Source current Output voltage Operating supply voltage Propagation delay time (turn on) Propagation delay time (turn off) Response time ⎯ V V ns ns ns Electrical Characteristics (unless otherwise specified, VDD = 3 V, VSS = GND, Ta = 25°C) Symbol Test Circuit Test Condition Min Typ. Max Unit Input offset voltage VIO ⎯ ⎯ ⎯ ±1 ±7 mV Input offset current IIO ⎯ ⎯ ⎯ 1 ⎯ pA II ⎯ ⎯ ⎯ 1 ⎯ pA Common mode input voltage CMVIN ⎯ ⎯ 0 ⎯ 2.1 V Supply current IDD (Note) ⎯ ⎯ ⎯ 10 20 μA Characteristics Input bias current Isink ⎯ VOL = 0.5 V 6 18 ⎯ mA Isource ⎯ VOH = 2.5 V 3 15 ⎯ mA VOL ⎯ Isink = 5.0 mA ⎯ 0.15 0.35 VOH ⎯ Isource = 5.0 mA 2.65 2.85 ⎯ Propagation delay time (turn on) tPLH ⎯ Over drive = 100 mV ⎯ 550 ⎯ ns Propagation delay time (turn off) tPHL ⎯ Over drive = 100 mV ⎯ 250 ⎯ ns tTLH ⎯ Over drive = 100 mV ⎯ 30 ⎯ tTHL ⎯ Over drive = 100 mV ⎯ 8 ⎯ Sink current Source current Output voltage Response time V ns Note: This device’s current consumption increases as its operating frequency increases. Note that the power dissipation should not exceed the allowable power dissipation. 3 2007-11-01 TC75S56F/FU/FE IDD – f 1000 VDD = 3 V VSS = GND Supply current IDD (μA) Ta = 25°C 100 10 1 0.001 0.01 0.1 1 Frequency f 10 100 1000 10 100 1000 (kHz) IDD – f 1000 VDD = 5 V VSS = GND Supply current IDD (μA) Ta = 25°C 100 10 1 0.001 0.01 0.1 1 Frequency f 4 (kHz) 2007-11-01 TC75S56F/FU/FE VOL – Isink VOL – Isink 3.0 5.0 VDD = 3 V 2.5 4.0 (V) Ta = 25°C (V) 2.0 Output voltage VOL Output voltage VOL 4.5 VSS = GND 1.5 1.0 0.5 VDD = 5 V VSS = GND Ta = 25°C 3.5 3.0 2.5 2.0 1.5 1.0 0.5 0.0 0 5 10 15 20 25 Sink current Isink 30 35 0.0 0 40 5 (mA) 10 15 20 25 Sink current Isink 30 35 40 35 40 (mA) VOH – Isource VOH – Isource 5.0 3.0 4.5 2.5 (V) 2.0 Output voltage VOH Output voltage VOH (V) 4.0 1.5 1.0 VDD = 3 V 0.5 0.0 0 3.5 3.0 2.5 2.0 1.5 VSS = GND 1.0 Ta = 25°C 0.5 5 10 15 20 25 Source current Isource 30 35 0.0 0 40 VDD = 5 V VSS = GND Ta = 25°C 5 10 15 20 25 Source current Isource (mA) 30 (mA) PD – Ta 300 Power dissipation PD (mW) This data was obtained from an unmounted standalone IC. If the IC is mounted on a PCB, its power dissipation will be greater. Note that, depending on the PCB’s thermal characteristics, the curves may differ substantially from those shown. 200 100 0 −40 0 40 80 120 Ambient temperature Ta (°C) 5 2007-11-01 TC75S56F/FU/FE Package Dimensions Weight: 0.014 g (typ.) 6 2007-11-01 TC75S56F/FU/FE Package Dimensions Weight: 0.006 g (typ.) 7 2007-11-01 TC75S56F/FU/FE Package Dimensions Weight: 0.003 g (typ.) 8 2007-11-01 TC75S56F/FU/FE RESTRICTIONS ON PRODUCT USE 20070701-EN GENERAL • The information contained herein is subject to change without notice. • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 9 2007-11-01