TC4512BP/BF/BFN TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic TC4512BP,TC4512BF,TC4512BFN TC4512B 8-Channel Data Selector TC4512B is data selector which selects 8 channel data inputs (X0 through X7) according to binary address inputs A, B and C. Since high impedance can be given to output Z by setting DISABLE input to “H”, the wired-OR arrangement can be achieved. DISABLE input takes precedence over other inputs giving the output high impedance. If DISABLE = “L” and INHIBIT = “H”, the data select operation is inhibited and output Z becomes “L” Level. Note: xxxFN (JEDEC SOP) is not available in Japan. TC4512BP Pin Assignment TC4512BF TC4512BFN Truth Table Inputs Output A B C Inhibit Disable Z L L L L L X0 H L L L L X1 L H L L L X2 H H L L L X3 L L H L L X4 H L H L L X5 L H H L L X6 H H H L L X7 * * * H L L * * * * H HZ Weight DIP16-P-300-2.54A SOP16-P-300-1.27A SOL16-P-150-1.27 : 1.00 g (typ.) : 0.18 g (typ.) : 0.13 g (typ.) *: Don’t care HZ: High impedance 1 2007-10-01 TC4512BP/BF/BFN Logic Diagram Absolute Maximum Ratings (Note) Characteristics DC supply voltage Input voltage Output voltage DC input current Power dissipation Operating temperature range Storage temperature range Note: Symbol Rating Unit VDD VIN VOUT IIN PD Topr Tstg VSS − 0.5~VSS + 20 VSS − 0.5~VDD + 0.5 VSS − 0.5~VDD + 0.5 ±10 300 (DIP)/180 (SOIC) −40~85 −65~150 V V V mA mW °C °C Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Operating Ranges (VSS = 0 V) (Note) Characteristics DC supply voltage Input voltage Note: Symbol Test Condition Min Typ. Max Unit VDD VIN ⎯ ⎯ 3 0 ⎯ ⎯ 18 VDD V V The operating ranges must be maintained to ensure the normal operation of the device. Unused inputs must be tied to either VDD or VSS. 2 2007-10-01 TC4512BP/BF/BFN Static Electrical Characteristics (VSS = 0 V) Characteristics High-level output voltage Low-level output voltage Symbol VOH VOL IOH 25°C 85°C VDD (V) Min Max Min Typ. Max Min Max 5 4.95 ⎯ 4.95 5.00 ⎯ 4.95 ⎯ 10 9.95 ⎯ 9.95 10.00 ⎯ 9.95 ⎯ 15 14.95 ⎯ 14.95 15.00 ⎯ 14.95 ⎯ 5 ⎯ 0.05 ⎯ 0.00 0.05 ⎯ 0.05 10 ⎯ 0.05 ⎯ 0.00 0.05 ⎯ 0.05 15 ⎯ 0.05 ⎯ 0.00 0.05 ⎯ 0.05 5 −0.61 ⎯ −0.51 −1.0 ⎯ −0.42 ⎯ VOH = 2.5 V 5 −2.5 ⎯ −2.1 −4.0 ⎯ −1.7 ⎯ VOH = 9.5 V 10 −1.5 ⎯ −1.3 −2.2 ⎯ −1.1 ⎯ VOH = 13.5 V 15 −4.0 ⎯ −3.4 −9.0 ⎯ −2.8 ⎯ VOL = 0.4 V 5 0.61 ⎯ 0.51 1.2 ⎯ 0.42 ⎯ VOL = 0.5 V 10 1.5 ⎯ 1.3 3.2 ⎯ 1.1 ⎯ VOL = 1.5 V 15 4.0 ⎯ 3.4 12.0 ⎯ 2.8 ⎯ VOUT = 0.5 V, 4.5 V 5 3.5 ⎯ 3.5 2.75 ⎯ 3.5 ⎯ VOUT = 1.0 V, 9.0 V 10 7.0 ⎯ 7.0 5.5 ⎯ 7.0 ⎯ VOUT = 1.5 V, 13.5 V 15 11.0 ⎯ 11.0 8.25 ⎯ 11.0 ⎯ ⎪IOUT⎪< 1 μA VIN = VSS, VDD ⎪IOUT⎪ < 1 μA VIN = VSS, VDD VOH = 4.6 V Output high current −40°C Test Condition Unit V V mA VIN = VSS, VDD Output low current IOL mA VIN = VSS, VDD Input high voltage VIH V ⎪IOUT⎪ < 1 μA Input low voltage VIL VOUT = 0.5 V, 4.5 V 5 ⎯ 1.5 ⎯ 2.25 1.5 ⎯ 1.5 VOUT = 1.0 V, 9.0 V 10 ⎯ 3.0 ⎯ 4.5 3.0 ⎯ 3.0 VOUT = 1.5 V, 13.5 V 15 ⎯ 4.0 ⎯ 6.75 4.0 ⎯ 4.0 18 ⎯ 0.1 ⎯ 10− 5 0.1 ⎯ 1.0 −5 −0.1 ⎯ −1.0 4 0.4 ⎯ 12 −0.4 ⎯ −12 V ⎪IOUT⎪ < 1 μA “H” level “L” level IIL VIL = 0 V 18 ⎯ −0.1 ⎯ −10 3-state output leakage current “H” level IDH VOH = 18 V 18 ⎯ 0.4 ⎯ 10− “L” level IDL VOL = 0 V 18 ⎯ −0.4 ⎯ −10− Quiescent supply current IIH VIH = 18 V Input current IDD μA μA VIN = VSS, VDD (Note) 4 5 ⎯ 5 ⎯ 0.005 5 ⎯ 150 10 ⎯ 10 ⎯ 0.010 10 ⎯ 300 15 ⎯ 20 ⎯ 0.015 20 ⎯ 600 μA Note: All valid input combinations. 3 2007-10-01 TC4512BP/BF/BFN Dynamic Electrical Characteristics (Ta = 25°C, VSS = 0 V, CL = 50 pF) Characteristics Output transition time (low to high) Output transition time (high to low) VDD (V) ⎯ tTLH ⎯ tTHL Propagation delay time tpLH (INHIBIT-Z) tpHL Propagation delay time tpLH (A, B, C-Z) tpHL Propagation delay time tpLH (X-Z) tpHL Three state disable time tpZL, tpLZ (DISABLE-Z) tpHZ, tpZH Input capacitance Test Condition Symbol ⎯ ⎯ ⎯ RL = 1 kΩ ⎯ CIN 4 Min Typ. Max 5 ⎯ 80 200 10 ⎯ 50 100 15 ⎯ 40 80 5 ⎯ 80 200 10 ⎯ 50 100 15 ⎯ 40 80 5 ⎯ 140 280 10 ⎯ 60 140 15 ⎯ 40 100 5 ⎯ 240 400 10 ⎯ 95 170 15 ⎯ 65 120 5 ⎯ 210 360 10 ⎯ 85 150 15 ⎯ 60 110 5 ⎯ 60 120 10 ⎯ 25 60 15 ⎯ 20 40 ⎯ 5 7.5 Unit ns ns ns ns ns ns pF 2007-10-01 TC4512BP/BF/BFN Waveforms for Measurement of Dynamic Characteristics Waveform 1 Waveform 2 (X = “H”) Waveform 3 Waveform 4 5 2007-10-01 TC4512BP/BF/BFN Package Dimensions Weight: 1.00 g (typ.) 6 2007-10-01 TC4512BP/BF/BFN Package Dimensions Weight: 0.18 g (typ.) 7 2007-10-01 TC4512BP/BF/BFN Package Dimensions (Note) Note: This package is not available in Japan. Weight: 0.13 g (typ.) 8 2007-10-01 TC4512BP/BF/BFN RESTRICTIONS ON PRODUCT USE 20070701-EN GENERAL • The information contained herein is subject to change without notice. • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 9 2007-10-01