TC4017BP/BF TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic TC4017BP,TC4017BF TC4017BP/TC4017BF Decade Counter/Divider TC4017BP/BF is decimal Johnson counter consisting of 5 stage D-type flip-flop equipped with the decoder to convert the output to decimal. Depending on the number of count pulses fed to CLOCK or CLOCK INHIBIT one output among 10 output lines “Q0” through “Q9” becomes “H” level. The counter advances its state at rising edge of CLOCK (CLOCK INHIBIT = “L”) or falling edge of CLOCK INHIBIT (CLOCK = “H”). RESET input to “H” level resets the counter to Q0 = “H” and Q1 through Q9 = “L” regardless of CLOCK and CLOCK INHIBIT. TC4017BP TC4017BF Pin Assignment Weight DIP16-P-300-2.54A SOP16-P-300-1.27A : 1.00 g (typ.) : 0.18 g (typ.) Truth Table Inputs Selected Output CLOCKΔ CLOCK INHIBITΔ RESET * * H Q0 * H L Qn (NC) L * L Qn (NC) L L Qn + 1 L L Qn (NC) H L Qn (NC) H L Qn + 1 Δ: Level change *: Don’t care NC: No change carry out “H”........... Q0~Q4 = “H” “L” ........... Q5~Q9 = “H” 1 2007-10-01 TC4017BP/BF Logic Diagram Timing Chart 2 2007-10-01 TC4017BP/BF Absolute Maximum Ratings (Note) Characteristics Symbol Rating Unit DC supply voltage VDD VSS − 0.5~VSS + 20 V Input voltage VIN VSS − 0.5~VDD + 0.5 V VOUT VSS − 0.5~VDD + 0.5 V Output voltage DC input current IIN ±10 mA Power dissipation PD 300 (DIP)/180 (SOIC) mW Operating ambient temperature range Topr −40~85 °C Storage temperature range Tstg −65~150 °C Note: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Operating Ranges (VSS = 0 V) (Note) Characteristics Symbol Test Condition Min Typ. Max Unit DC supply voltage VDD ⎯ 3 ⎯ 18 V Input voltage VIN ⎯ 0 ⎯ VDD V Note: The operating ranges must be maintained to ensure the normal operation of the device. Unused inputs must be tied to either VDD or VSS. 3 2007-10-01 TC4017BP/BF Static Electrical Characteristics (VSS = 0 V) Characteristics High-level output voltage Low-level output voltage Symbol VOH VOL IOH 25°C 85°C VDD (V) Min Max Min Typ. Max Min Max 5 4.95 ⎯ 4.95 5.00 ⎯ 4.95 ⎯ 10 9.95 ⎯ 9.95 10.00 ⎯ 9.95 ⎯ 15 14.95 ⎯ 14.95 15.00 ⎯ 14.95 ⎯ 5 ⎯ 0.05 ⎯ 0.00 0.05 ⎯ 0.05 10 ⎯ 0.05 ⎯ 0.00 0.05 ⎯ 0.05 15 ⎯ 0.05 ⎯ 0.00 0.05 ⎯ 0.05 5 −0.61 ⎯ −0.51 −1.0 ⎯ −0.42 ⎯ VOH = 2.5 V 5 −2.50 ⎯ −2.10 −4.0 ⎯ −1.70 ⎯ VOH = 9.5 V 10 −1.50 ⎯ −1.30 −2.2 ⎯ −1.10 ⎯ VOH = 13.5 V 15 −4.00 ⎯ −3.40 −9.0 ⎯ −2.80 ⎯ VOL = 0.4 V 5 0.61 ⎯ 0.51 1.5 ⎯ 0.42 ⎯ VOL = 0.5 V 10 1.50 ⎯ 1.30 3.8 ⎯ 1.10 ⎯ VOL = 1.5 V 15 4.00 ⎯ 3.40 15.0 ⎯ 2.80 ⎯ VOUT = 0.5 V, 4.5 V 5 3.5 ⎯ 3.5 2.75 ⎯ 3.5 ⎯ VOUT = 1.0 V, 9.0 V 10 7.0 ⎯ 7.0 5.50 ⎯ 7.0 ⎯ VOUT = 1.5 V, 13.5 V 15 11.0 ⎯ 11.0 8.25 ⎯ 11.0 ⎯ ⎪IOUT⎪ < 1 μA VIN = VSS, VDD ⎪IOUT⎪ < 1 μA VIN = VSS, VDD VOH = 4.6 V Output high current −40°C Test Condition Unit V V mA VIN = VSS, VDD Output low current IOL mA VIN = VSS, VDD Input high voltage VIH V ⎪IOUT⎪ < 1 μA Input low voltage VIL VOUT = 0.5 V, 4.5 V 5 ⎯ 1.5 ⎯ 2.25 1.5 ⎯ 1.5 VOUT = 1.0 V, 9.0 V 10 ⎯ 3.0 ⎯ 4.50 3.0 ⎯ 3.0 VOUT = 1.5 V, 13.5 V 15 ⎯ 4.0 ⎯ 6.75 4.0 ⎯ 4.0 18 ⎯ 0.1 ⎯ 10− 5 0.1 ⎯ 1.0 −5 −0.1 ⎯ −1.0 V ⎪IOUT⎪ < 1 μA Input current “H” level “L” level Quiescent supply current IIH IIL IDD VIH = 18 V VIL = 0 V VIN = VSS, VDD (Note) 18 ⎯ −0.1 ⎯ −10 5 ⎯ 5 ⎯ 0.005 5 ⎯ 150 10 ⎯ 10 ⎯ 0.010 10 ⎯ 300 15 ⎯ 15 ⎯ 0.015 20 ⎯ 600 μA μA Note: All valid input combinations. 4 2007-10-01 TC4017BP/BF Dynamic Electrical Characteristics (Ta = 25°C, VSS = 0 V, CL = 50 pF) Characteristics Output transition time (low to high) Output transition time (high to low) (CLOCK-Qn) tpHL Propagation delay time tpLH (CLOCK-CARRY OUT) tpHL RESET-CARRY OUT Max clock frequency Min clock pulse width Min pulse width (RESET) Input capacitance ⎯ ⎯ ⎯ tW ⎯ tWH tfCL (RESET-CLOCK) ⎯ fCL Max clock fall time Min removal time ⎯ tpHL trCL (CLOCK INHIBIT-CLOCK) ⎯ tpLH Max clock rise time Min set-up time ⎯ tTHL tpLH RESET-Qn VDD (V) tTLH Propagation delay time Propagation delay time Test Condition Symbol Min Typ. Max 5 ⎯ 80 200 10 ⎯ 50 100 15 ⎯ 40 80 5 ⎯ 80 200 10 ⎯ 50 100 15 ⎯ 40 80 5 ⎯ 325 650 10 ⎯ 135 270 15 ⎯ 85 170 5 ⎯ 280 600 10 ⎯ 110 250 15 ⎯ 75 160 5 ⎯ 265 530 10 ⎯ 115 230 15 ⎯ 85 170 5 2.5 6.0 ⎯ 10 5.0 12.0 ⎯ 15 6.7 13.5 ⎯ 5 ⎯ 85 200 10 ⎯ 40 90 15 ⎯ 35 60 5 ⎯ 50 260 10 ⎯ 20 110 15 ⎯ 15 60 Unit ns ns ns ns ns MHz ns ns 5 ⎯ 10 μs No limit 15 ⎯ tSU ⎯ trem 5 ⎯ 30 230 10 ⎯ 15 100 15 ⎯ 10 70 5 ⎯ −55 400 10 ⎯ −20 275 ⎯ −15 150 ⎯ 5 7.5 15 ⎯ CIN 5 ns ns pF 2007-10-01 TC4017BP/BF Waveforms for Measurement of Dynamic Characteristics Waveform 1 Waveform 2 Waveform 3 6 2007-10-01 TC4017BP/BF Package Dimensions Weight: 1.00 g (typ.) 7 2007-10-01 TC4017BP/BF Package Dimensions Weight: 0.18 g (typ.) 8 2007-10-01 TC4017BP/BF RESTRICTIONS ON PRODUCT USE 20070701-EN GENERAL • The information contained herein is subject to change without notice. • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 9 2007-10-01