TC4049,4050BP/BF/BFN TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic TC4049BP,TC4049BF,TC4049BFN, TC4050BP,TC4050BF,TC4050BFN TC4049B Hex Buffer/Converter (inverting type) TC4050B Hex Buffer/Converter (non-inverting type) Note: xxxFN (JEDEC SOP) is not available in Japan. TC4049BP, TC4050BP TC4049B, TC4050B contain six circuits of buffers. TC4049B is inverter type and TC4050B is non-inverter type. Since one TTL or DTL can be directly driven having large output current, these are useful for interfacing from CMOS to TTL or DTL. As voltage up to VSS + 18 volts can be applied to the input regardless of VDD, these can be also used as the level converter IC’s which converts CMOS logical circuits of 15 volts or 10 volts system to CMOS/TTL logical circuits of 5 volts system. Ideal switching characteristic has been obtained by the circuit diagram of three stage inverters for TC4049B and two stage inverters for TC4050B. TC4049BF, TC4050BF TC4049BFN, TC4050BFN Weight DIP16-P-300-2.54A SOP16-P-300-1.27A SOL16-P-150-1.27 1 : 1.00 g (typ.) : 0.18 g (typ.) : 0.13 g (typ.) 2007-10-01 TC4049,4050BP/BF/BFN Pin Assignment TC4049B TC4050B Circuit Diagram 1/6 TC4049B 1/6 TC4050B Absolute Maximum Ratings (Note) Characteristics DC supply voltage Input voltage Output voltage Symbol Rating Unit VDD VSS − 0.5~VSS + 20 V VIN VSS − 0.5~VSS + 20 V VOUT VSS − 0.5~VDD + 0.5 V DC input current IIN ±10 mA Power dissipation PD 300 (DIP)/180 (SOIC) mW Operating temperature range Topr −40~85 °C Storage temperature range Tstg −65~150 °C Note: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). 2 2007-10-01 TC4049,4050BP/BF/BFN Operating Ranges (VSS = 0 V) (Note) Characteristics Symbol Test Condition Min Typ. Max Unit DC supply voltage VDD ⎯ 3 ⎯ 18 V Input voltage VIN ⎯ 0 ⎯ 18 V Note: The operating ranges must be maintained to ensure the normal operation of the device. Unused inputs must be tied to either VDD or VSS. Static Electrical Characteristics (VSS = 0 V) Characteristics High-level output voltage Low-level output voltage Symbol VOH VOL IOH 25°C 85°C VDD (V) Min Max Min Typ. Max Min Max 5 4.95 ⎯ 4.95 5.00 ⎯ 4.95 ⎯ 10 9.95 ⎯ 9.95 10.00 ⎯ 9.95 ⎯ 15 14.95 ⎯ 14.95 15.00 ⎯ 14.95 ⎯ 5 ⎯ 0.05 ⎯ 0.00 0.05 ⎯ 0.05 10 ⎯ 0.05 ⎯ 0.00 0.05 ⎯ 0.05 15 ⎯ 0.05 ⎯ 0.00 0.05 ⎯ 0.05 5 −0.73 ⎯ −0.65 −1.2 ⎯ −0.58 ⎯ VOH = 2.5 V 5 −2.40 ⎯ −2.10 −3.9 ⎯ −1.90 ⎯ VOH = 9.5 V 10 −1.80 ⎯ −1.65 −2.5 ⎯ −1.35 ⎯ VOH = 13.5 V 15 −4.80 ⎯ −4.30 −8.0 ⎯ −3.50 ⎯ VOL = 0.4 V 5 3.8 ⎯ 3.2 6.4 ⎯ 2.9 ⎯ VOL = 0.5 V 10 9.6 ⎯ 8.0 16.0 ⎯ 6.6 ⎯ VOL = 1.5 V 15 28.0 ⎯ 24.0 48.0 ⎯ 20.0 ⎯ VOUT = 0.5 V, 4.5 V 5 3.5 ⎯ 3.5 2.75 ⎯ 3.5 ⎯ VOUT = 1.0 V, 9.0 V 10 7.0 ⎯ 7.0 5.50 ⎯ 7.0 ⎯ VOUT = 1.5 V, 13.5 V 15 11.0 ⎯ 11.0 8.25 ⎯ 11.0 ⎯ ⎪IOUT⎪< 1 μA VIN = VSS, VDD ⎪IOUT⎪< 1 μA VIN = VSS, VDD VOH = 4.6 V Output high current −40°C Test Condition Unit V V mA VIN = VSS, VDD Output low current IOL mA VIN = VSS, VDD Input high voltage VIH V ⎪IOUT⎪ < 1 μA Input low voltage VIL VOUT = 0.5 V, 4.5 V 5 ⎯ 1.5 ⎯ 2.25 1.5 ⎯ 1.5 VOUT = 1.0 V, 9.0 V 10 ⎯ 3.0 ⎯ 4.50 3.0 ⎯ 3.0 VOUT = 1.5 V, 13.5 V 15 ⎯ 4.0 ⎯ 6.75 4.0 ⎯ 4.0 18 ⎯ 0.1 ⎯ 10− 5 0.1 ⎯ 1.0 −5 −0.1 ⎯ −1.0 30 V ⎪IOUT⎪ < 1 μA Input current “H” level “L” level Quiescent supply current IIH IIL IDD VIH = 18 V VIL = 0 V VIN = VSS, VDD (Note) 18 ⎯ −0.1 ⎯ −10 5 ⎯ 1 ⎯ 0.002 1 ⎯ 10 ⎯ 2 ⎯ 0.004 2 ⎯ 60 15 ⎯ 4 ⎯ 0.008 4 ⎯ 120 μA μA Note: All valid input combinations. 3 2007-10-01 TC4049,4050BP/BF/BFN Dynamic Electrical Characteristics (Ta = 25°C, VSS = 0 V, CL = 50 pF) Characteristics Output transition time (low to high) Output transition time (high to low) TC4049B Propagation delay time (low to high) Propagation delay time (high to low) TC4050B Propagation delay time (low to high) Propagation delay time (high to low) Input capacitance Test Condition Symbol VDD (V) ⎯ tTLH ⎯ tTHL ⎯ tpLH ⎯ tpHL ⎯ tpLH ⎯ tpHL ⎯ CIN Min Typ. Max 5 ⎯ 60 160 10 ⎯ 30 80 15 ⎯ 25 60 5 ⎯ 120 60 10 ⎯ 10 40 15 ⎯ 8 30 5 ⎯ 60 120 10 ⎯ 35 65 15 ⎯ 30 50 5 ⎯ 40 60 10 ⎯ 20 30 15 ⎯ 15 20 5 ⎯ 50 130 10 ⎯ 30 70 15 ⎯ 25 55 5 ⎯ 30 70 10 ⎯ 17 35 15 ⎯ 14 25 ⎯ 5 7.5 Unit ns ns ns ns ns ns pF Waveform for Measurement of Dynamic Characteristics Waveform 4 2007-10-01 TC4049,4050BP/BF/BFN Package Dimensions Weight: 1.00 g (typ.) 5 2007-10-01 TC4049,4050BP/BF/BFN Package Dimensions Weight: 0.18 g (typ.) 6 2007-10-01 TC4049,4050BP/BF/BFN Package Dimensions (Note) Note: This package is not available in Japan. Weight: 0.13 g (typ.) 7 2007-10-01 TC4049,4050BP/BF/BFN RESTRICTIONS ON PRODUCT USE 20070701-EN GENERAL • The information contained herein is subject to change without notice. • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 8 2007-10-01