TOSHIBA TC4001BF_12

TC4001BP/BF/BFT
TOSHIBA CMOS Digital Integrated Circuit
Silicon Monolithic
TC4001BP,TC4001BF,TC4001BFT
TC4001B Quad 2 Input NOR Gate
The TC4001B is 2-input positive NOR gate, respectively.
Since the outputs of these gates are equipped with the buffers,
the input/output transmission characteristics have been
improved and the variation of transmission time due to an
increase in the load capacity is kept minimum.
TC4001BP
Pin Assignment
A1
1
14
VDD
B1
2
13
A4
X1
3
12
B4
X2
4
11
X4
B2
5
10
X3
A2
6
9
B3
VSS
7
8
A3
TC4001BF
TC4001BFT
(top view)
Logic Diagram
1/4 TC4001B
A
X = A +B
X
B
Weight
DIP14-P-300-2.54
SOP14-P-300-1.27A
TSSOP14-P-0044-0.65A
1
: 0.96 g (typ.)
: 0.18 g (typ.)
: 0.06 g (typ.)
2012-02-29
TC4001BP/BF/BFT
Absolute Maximum Ratings (Note)
Characteristics
Symbol
Rating
Unit
DC supply voltage
VDD
VSS − 0.5 to VSS + 20
V
Input voltage
VIN
VSS − 0.5 to VDD + 0.5
V
VOUT
VSS − 0.5 to VDD + 0.5
V
Output voltage
DC input current
IIN
±10
mA
Power dissipation
PD
300 (DIP)/180 (SOIC)
mW
Operating temperature range
Topr
−40 to 85
°C
Storage temperature range
Tstg
−65 to 150
°C
Note:
Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or
even destruction.
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute
maximum ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Operating Ranges (VSS = 0 V) (Note)
Characteristics
Symbol
Test Condition
Min
Typ.
Max
Unit
DC supply voltage
VDD
―
3
―
18
V
Input voltage
VIN
―
0
―
VDD
V
Note:
The operating ranges must be maintained to ensure the normal operation of the device.
Unused inputs must be tied to either VDD or VSS.
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TC4001BP/BF/BFT
Static Electrical Characteristics (VSS = 0 V)
−40°C
Test Condition
Characteristics
High-level
output voltage
Low-level
output voltage
Symbol
VOH
VOL
IOH
85°C
Min
Max
Min
Typ.
Max
Min
Max
5
4.95
―
4.95
5.00
―
4.95
―
10
9.95
―
9.95
10.00
―
9.95
―
15
14.95
―
14.95
15.00
―
14.95
―
5
―
0.05
―
0.00
0.05
―
0.05
10
―
0.05
―
0.00
0.05
―
0.05
15
―
0.05
―
0.00
0.05
―
0.05
5
−0.61
―
−0.51
−1.0
―
−0.42
―
VOH = 2.5 V
5
−2.50
―
−2.10
−4.0
―
−1.70
―
VOH = 9.5 V
10
−1.50
―
−1.30
−2.2
―
−1.10
―
VOH = 13.5 V
15
−4.00
―
−3.40
−9.0
―
−2.80
―
VOL = 0.4 V
5
0.61
―
0.51
1.2
―
0.42
―
VOL = 0.5 V
10
1.50
―
1.30
3.2
―
1.10
―
VOL = 1.5 V
15
4.00
―
3.40
12.0
―
2.80
―
VOUT = 0.5 V
5
3.5
―
3.5
2.75
―
3.5
―
VOUT = 1.0 V
10
7.0
―
7.0
5.50
―
7.0
―
VOUT = 1.5 V
15
11.0
―
11.0
8.25
―
11.0
―
|IOUT| < 1 μA
VIN = VSS, VDD
|IOUT| < 1 μA
VIN = VSS, VDD
VOH = 4.6 V
Output high
current
25°C
VDD
(V)
Unit
V
V
mA
VIN = VSS
Output low
current
IOL
mA
VIN = VSS, VDD
Input high
voltage
VIH
V
|IOUT| < 1 μA
Input low
voltage
VIL
VOUT = 4.5 V
5
―
1.5
―
2.25
1.5
―
1.5
VOUT = 9.0 V
10
―
3.0
―
4.50
3.0
―
3.0
VOUT = 13.5 V
15
―
4.0
―
6.75
4.0
―
4.0
−5
0.1
―
1.0
V
|IOUT| < 1 μA
“H”
level
Input
current “L”
level
Quiescent
supply current
IIH
VIH = 18 V
18
―
0.1
―
10
IIL
VIL = 0 V
18
―
−0.1
―
−10
−5
−0.1
―
−1.0
5
―
0.25
―
0.001
0.25
―
7.5
10
―
0.50
―
0.001
0.50
―
15.0
15
―
1.00
―
0.002
1.00
―
30.0
μA
IDD
VIN = VSS, VDD
(Note)
μA
Note: All valid input combinations.
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TC4001BP/BF/BFT
Dynamic Electrical Characteristics (Ta = 25°C, VSS = 0 V, CL = 50 pF)
Characteristics
Test Condition
Symbol
Output transition time
VDD (V)
tTLH
Output transition time
―
tTHL
Propagation delay time
―
tpLH
Propagation delay time
―
tpHL
Input capacitance
―
CIN
―
Min
Typ.
Max
5
―
70
200
10
―
35
100
15
―
30
80
5
―
70
200
10
―
35
100
15
―
30
80
5
―
65
200
10
―
30
100
15
―
25
80
5
―
65
200
10
―
30
100
15
―
25
80
―
5
7.5
Unit
ns
ns
ns
ns
pF
Circuit and Waveform for Measurement of Dynamic Characteristics
Circuit
Waveform
20 ns
VDD
P.G.
Input
Input
Output
20 ns
90%
50%
10%
90%
50%
10%
tTHL
CL = 50 pF
VSS
90%
50%
10%
Output
tpHL
4
tTLH
90%
50%
10%
tpLH
2012-02-29
TC4001BP/BF/BFT
Package Dimensions
Weight: 0.96 g (typ.)
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2012-02-29
TC4001BP/BF/BFT
Package Dimensions
Weight: 0.18 g (typ.)
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2012-02-29
TC4001BP/BF/BFT
Package Dimensions
Weight: 0.06 g (typ.)
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2012-02-29
TC4001BP/BF/BFT
RESTRICTIONS ON PRODUCT USE
• Toshiba Corporation, and its subsidiaries and affiliates (collectively "TOSHIBA"), reserve the right to make changes to the information
in this document, and related hardware, software and systems (collectively "Product") without notice.
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TOSHIBA's written permission, reproduction is permissible only if reproduction is without alteration/omission.
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responsible for complying with safety standards and for providing adequate designs and safeguards for their hardware, software and
systems which minimize risk and avoid situations in which a malfunction or failure of Product could cause loss of human life, bodily
injury or damage to property, including data loss or corruption. Before customers use the Product, create designs including the
Product, or incorporate the Product into their own applications, customers must also refer to and comply with (a) the latest versions of
all relevant TOSHIBA information, including without limitation, this document, the specifications, the data sheets and application notes
for Product and the precautions and conditions set forth in the "TOSHIBA Semiconductor Reliability Handbook" and (b) the
instructions for the application with which the Product will be used with or for. Customers are solely responsible for all aspects of their
own product design or applications, including but not limited to (a) determining the appropriateness of the use of this Product in such
design or applications; (b) evaluating and determining the applicability of any information contained in this document, or in charts,
diagrams, programs, algorithms, sample application circuits, or any other referenced documents; and (c) validating all operating
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2012-02-29