TC4027BP/BF/BFN TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic TC4027BP,TC4027BF,TC4027BFN TC4027B Dual J-K Master-Slave Flip Flop TC4027B is J-K master-slave flip-flop having RESET and SET functions. In the case of J-K made, when the clock input is given with both RESET and SET at “L”, the output changes at rising edge of the clock according to the states of J and K. When SET input is placed at “H”, and RESET input is placed at “L”, outputs become Q = “H”, and Q = “L”. When RESET input is placed at “H”, and SET input is placed at “L”, outputs become Q = “L”, and Q = “H”. When both of RESET input and SET input are at “H”, outputs become Q = “H” and Q = “H”. Note: xxxFN (JEDEC SOP) is not available in Japan. TC4027BP TC4027BF Pin Assignment TC4027BFN Block Diagram Weight DIP16-P-300-2.54A SOP16-P-300-1.27A SOL16-P-150-1.27 1 : 1.00 g (typ.) : 0.18 g (typ.) : 0.13 g (typ.) 2007-10-01 TC4027BP/BF/BFN Truth Table Inputs Outputs RESET SET J K CLOCKΔ Qn + 1 Qn + 1 L H * * * H L H L * * * L H H H * * * H H L L L L Qn* Qn* L L L H L H L L H L H L L L H H Qn ** Qn** L L * * Qn* Qn * *: Don’t care Δ: Level change *: No change **: Change Logic Diagram 1/2 TC4027B Absolute Maximum Ratings (Note) Characteristics DC supply voltage Symbol Rating Unit VDD VSS − 0.5 to VSS + 20 V V VIN VSS − 0.5 to VDD + 0.5 VOUT VSS − 0.5 to VDD + 0.5 V IIN ±10 mA Power dissipation PD 300 (DIP)/180 (SOIC) mW Operating temperature range Topr −40 to 85 °C Storage temperature range Tstg −65 to 150 °C Input voltage Output voltage DC input current Note: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). 2 2007-10-01 TC4027BP/BF/BFN Operating Ranges (VSS = 0 V) (Note) Characteristics Symbol Test Condition Min Typ. Max Unit DC supply voltage VDD ⎯ 3 ⎯ 18 V Input voltage VIN ⎯ 0 ⎯ VDD V Note: The operating ranges must be maintained to ensure the normal operation of the device. Unused inputs must be tied to either VDD or VSS. Static Electrical Characteristics (VSS = 0 V) Characteristics High-level output voltage Low-level output voltage Symbol VOH VOL IOH 25°C 85°C VDD (V) Min Max Min Typ. Max Min Max 5 4.95 ⎯ 4.95 5.00 ⎯ 4.95 ⎯ 10 9.95 ⎯ 9.95 10.00 ⎯ 9.95 ⎯ 15 14.95 ⎯ 14.95 15.00 ⎯ 14.95 ⎯ 5 ⎯ 0.05 ⎯ 0.00 0.05 ⎯ 0.05 10 ⎯ 0.05 ⎯ 0.00 0.05 ⎯ 0.05 15 ⎯ 0.05 ⎯ 0.00 0.05 ⎯ 0.05 5 −0.61 ⎯ −0.51 −1.0 ⎯ −0.42 ⎯ VOH = 2.5 V 5 −2.50 ⎯ −2.10 −4.0 ⎯ −1.70 ⎯ VOH = 9.5 V 10 −1.50 ⎯ −1.30 −2.2 ⎯ −1.10 ⎯ VOH = 13.5 V 15 −4.00 ⎯ −3.40 −9.0 ⎯ −2.80 ⎯ VOL = 0.4 V 5 0.61 ⎯ 0.51 1.2 ⎯ 0.42 ⎯ VOL = 0.5 V 10 1.50 ⎯ 1.30 3.2 ⎯ 1.10 ⎯ VOL = 1.5 V 15 4.00 ⎯ 3.40 12.0 ⎯ 2.80 ⎯ VOUT = 0.5 V, 4.5 V 5 3.5 ⎯ 3.5 2.75 ⎯ 3.5 ⎯ VOUT = 1.0 V, 9.0 V 10 7.0 ⎯ 7.0 5.50 ⎯ 7.0 ⎯ VOUT = 1.5 V, 13.5 V 15 11.0 ⎯ 11.0 8.25 ⎯ 11.0 ⎯ VOUT = 0.5 V, 4.5 V 5 ⎯ 1.5 ⎯ 2.25 1.5 ⎯ 1.5 VOUT = 1.0 V, 9.0 V 10 ⎯ 3.0 ⎯ 4.50 3.0 ⎯ 3.0 VOUT = 1.5 V, 13.5 V 15 ⎯ 4.0 ⎯ 6.75 4.0 ⎯ 4.0 18 ⎯ 0.1 ⎯ 10− 5 0.1 ⎯ 1.0 −5 −0.1 ⎯ −1.0 30 ⎪IOUT⎪ < 1 μA VIN = VSS, VDD ⎪IOUT⎪ < 1 μA VIN = VSS, VDD VOH = 4.6 V Output high current −40°C Test Condition Unit V V mA VIN = VSS, VDD Output low current IOL mA VIN = VSS, VDD Input high voltage VIH V ⎪IOUT⎪ < 1 μA Input low voltage VIL V ⎪IOUT⎪ < 1 μA Input current “H” level “L” level Quiescent supply current IIH IIL IDD VIH = 18 V VIL = 0 V VIN = VSS, VDD (Note) 18 ⎯ −0.1 ⎯ −10 5 ⎯ 1 ⎯ 0.002 1 ⎯ 10 ⎯ 2 ⎯ 0.004 2 ⎯ 60 15 ⎯ 4 ⎯ 0.008 4 ⎯ 120 μA μA Note: All valid input combinations. 3 2007-10-01 TC4027BP/BF/BFN Dynamic Electrical Characteristics (Ta = 25°C, VSS = 0 V, CL = 50 pF) Characteristics Output transition time (low to high) Output transition time (high to low) (CLOCK-Q, Q ) tpHL Propagation delay time tpLH (SET, RESET-Q, Q ) tpHL trCL Max clock input fall time tfCL Min clock pulse width Min set-up time (J, K-CLOCK) Min hold time (J, K-CLOCK) Min removal time (SET, RESET-CLOCK) Input capacitance ⎯ ⎯ ⎯ ⎯ fCL Max clock input rise time (SET, RESET) ⎯ tTHL tpLH Min pulse width VDD (V) tTLH Propagation delay time Max clock frequency Test Condition Symbol Min Typ. Max 5 ⎯ 70 200 10 ⎯ 35 100 15 ⎯ 30 80 5 ⎯ 70 200 10 ⎯ 35 100 15 ⎯ 30 80 5 ⎯ 150 300 10 ⎯ 75 130 15 ⎯ 60 90 5 ⎯ 120 300 10 ⎯ 60 130 15 ⎯ 45 90 5 3.5 8 ⎯ 10 8.0 16 ⎯ 15 12.0 20 ⎯ Unit ns ns ns ns MHz 5 ⎯ 10 μs No limit 15 ⎯ tW ⎯ tW ⎯ tSU ⎯ tH ⎯ trem ⎯ CIN 4 5 ⎯ 60 180 10 ⎯ 35 80 15 ⎯ 25 50 5 ⎯ 60 140 10 ⎯ 35 60 15 ⎯ 25 40 5 ⎯ 30 140 10 ⎯ 10 50 15 ⎯ 5 35 5 ⎯ ⎯ 140 10 ⎯ ⎯ 50 15 ⎯ ⎯ 35 5 ⎯ ⎯ 40 10 ⎯ ⎯ 20 15 ⎯ ⎯ 15 ⎯ 5 7.5 ns ns ns ns ns pF 2007-10-01 TC4027BP/BF/BFN Waveforms for Measurement of Dynamic Characteristics Waveform 1 Waveform 2 Waveform 3 5 2007-10-01 TC4027BP/BF/BFN Package Dimensions Weight: 1.00 g (typ.) 6 2007-10-01 TC4027BP/BF/BFN Package Dimensions Weight: 0.18 g (typ.) 7 2007-10-01 TC4027BP/BF/BFN Package Dimensions (Note) Note: This package is not available in Japan. Weight: 0.13 g (typ.) 8 2007-10-01 TC4027BP/BF/BFN RESTRICTIONS ON PRODUCT USE 20070701-EN GENERAL • The information contained herein is subject to change without notice. • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 9 2007-10-01