NTD18N06L Power MOSFET 18 Amps, 60 Volts, Logic Level N−Channel DPAK Designed for low voltage, high speed switching applications in power supplies, converters and power motor controls and bridge circuits. http://onsemi.com V(BR)DSS Features • Pb−Free Packages are Available 60 V RDS(on) TYP ID MAX 54 m5.0 V 18 A (Note 1) Typical Applications • • • • N−Channel Power Supplies Converters Power Motor Controls Bridge Circuits D G MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) Value Unit VDSS 60 Vdc Drain−to−Gate Voltage (RGS = 10 M) VDGR 60 Vdc VGS VGS 15 20 ID ID 18 10 54 Adc PD 55 0.36 2.1 W W/°C W Operating and Storage Temperature Range TJ, Tstg −55 to +175 °C Single Pulse Drain−to−Source Avalanche Energy − Starting TJ = 25°C (VDD = 50 Vdc, VGS = 5.0 Vdc, L = 1.0 mH, IL(pk) = 12 A, VDS = 60 Vdc) EAS 72 mJ Gate−to−Source Voltage − Continuous − Non−repetitive (tp10 ms) Drain Current − Continuous @ TA = 25°C − Continuous @ TA = 100°C − Single Pulse (tp10 s) Total Power Dissipation @ TA = 25°C Derate above 25°C Total Power Dissipation @ TA = 25°C (Note 2) Thermal Resistance − Junction−to−Case − Junction−to−Ambient (Note 1) − Junction−to−Ambient (Note 2) Maximum Lead Temperature for Soldering Purposes, 1/8″ from case for 10 seconds August, 2004 − Rev. 3 MARKING DIAGRAMS Vdc 4 Drain 4 IDM Apk 1 2 DPAK CASE 369C STYLE 2 3 2 1 3 Drain Gate Source 4 Drain 4 DPAK−3 CASE 369D STYLE 2 °C/W RJC RJA RJA 2.73 100 71.4 TL 260 1 2 3 1 2 3 Gate Drain Source °C Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied, damage may occur and reliability may be affected. 1. When surface mounted to an FR−4 board using the minimum recommended pad size. 2. When surface mounted to an FR−4 board using the 0.5 sq in drain pad size. Semiconductor Components Industries, LLC, 2004 S AYWW 18N6L Symbol AYWW 18N6L Rating Drain−to−Source Voltage 1 18N6L A Y WW Device Code = Assembly Location = Year = Work Week ORDERING INFORMATION See detailed ordering and shipping information in the package dimensions section on page 2 of this data sheet. Publication Order Number: NTD18N06L/D NTD18N06L ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted) Characteristic Symbol Drain−to−Source Breakdown Voltage (Note 3) (VGS = 0 Vdc, ID = 250 Adc) Temperature Coefficient (Positive) V(BR)DSS Min Typ Max Unit 60 − 70 57.6 − − − − − − 1.0 10 − − ±100 1.0 − 1.8 5.2 2.0 − − 54 65 − − 1.0 0.86 1.3 − gFS − 13.5 − mhos pF OFF CHARACTERISTICS Zero Gate Voltage Drain Current (VDS = 60 Vdc, VGS = 0 Vdc) (VDS = 60 Vdc, VGS = 0 Vdc, TJ = 150°C) IDSS Gate−Body Leakage Current (VGS = ± 15 Vdc, VDS = 0 Vdc) IGSS Vdc mV/°C Adc nAdc ON CHARACTERISTICS (Note 3) Gate Threshold Voltage (Note 3) (VDS = VGS, ID = 250 Adc) Threshold Temperature Coefficient (Negative) VGS(th) Static Drain−to−Source On−Resistance (Note 3) (VGS = 5.0 Vdc, ID = 9.0 Adc) RDS(on) Static Drain−to−Source On−Resistance (Note 3) (VGS = 5.0 Vdc, ID = 18 Adc) (VGS = 5.0 Vdc, ID = 9.0 Adc, TJ = 150°C) VDS(on) Forward Transconductance (Note 3) (VDS = 7.0 Vdc, ID = 9.0 Adc) Vdc mV/°C m Vdc DYNAMIC CHARACTERISTICS Input Capacitance (VDS = 25 Vdc, Vdc VGS = 0 Vdc, Vdc f=1 1.0 0 MHz) Output Capacitance Transfer Capacitance Ciss − 482 675 Coss − 166 230 Crss − 56 80 td(on) − 9.9 20 tr − 79 160 td(off) − 19 40 tf − 38 80 QT − 11 22 Q1 − 3.2 − Q2 − 6.5 − VSD − − 0.94 0.83 1.15 − Vdc trr − 41 − nss ta − 26 − tb − 15 − QRR − 0.057 − SWITCHING CHARACTERISTICS (Note 4) Turn−On Delay Time Rise Time Turn−Off Delay Time Vd ID = 18 Adc, Ad (VDD = 30 Vdc, VGS = 5.0 5 0 Vdc, Vdc RG = 9.1 ) (Note 3) Fall Time Gate Charge Ga eC a ge Vdc ID = 18 Adc, Adc (VDS = 48 Vdc, VGS = 5.0 5 0 Vdc) (Note 3) ns nC SOURCE−DRAIN DIODE CHARACTERISTICS Forward On−Voltage (IS = 18 Adc, VGS = 0 Vdc) (Note 3) (IS = 18 Adc, VGS = 0 Vdc, TJ = 150°C) Reverse e e se Recovery eco e y Time e (IS = 18 Adc, Adc VGS = 0 Vdc, Vdc dIS/dt = 100 A/s) (Note 3) Reverse Recovery Stored Charge 3. Pulse Test: Pulse Width ≤ 300 s, Duty Cycle ≤ 2%. 4. Switching characteristics are independent of operating junction temperatures. C ORDERING INFORMATION Device NTD18N06L Package Shipping† DPAK 75 Units/Rail NTD18N06LG DPAK (Pb−Free) 75 Units/Rail NTD18N06L−1 DPAK−3 75 Units/Rail DPAK−3 (Pb−Free) 75 Units/Rail DPAK 2500 Tape & Reel DPAK (Pb−Free) 2500 Tape & Reel NTD18N06L−1G NTD18N06LT4 NTD18N06LT4G †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. http://onsemi.com 2 NTD18N06L 40 40 ID, DRAIN CURRENT (AMPS) ID, DRAIN CURRENT (AMPS) VDS ≥ 10 V 5V 8V 30 6V 4.5 V 20 4V 3.5 V 10 3V 0 1 3 2 TJ = −55°C TJ = 100°C 3.2 2.4 4 4.8 Figure 2. Transfer Characteristics TJ = 100°C 0.08 TJ = 25°C 0.06 TJ = −55°C 0.04 0.02 0 20 10 40 30 5.6 0.12 VGS = 10 V 0.1 0.08 TJ = 100°C 0.06 TJ = 25°C 0.04 TJ = −55°C 0.02 0 0 20 10 40 30 ID, DRAIN CURRENT (AMPS) ID, DRAIN CURRENT (AMPS) Figure 3. On−Resistance versus Gate−to−Source Voltage Figure 4. On−Resistance versus Drain Current and Gate Voltage 10000 VGS = 0 V ID = 9 A VGS = 5 V TJ = 150°C 1000 IDSS, LEAKAGE (nA) RDS(on), DRAIN−TO−SOURCE RESISTANCE (NORMALIZED) TJ = 25°C Figure 1. On−Region Characteristics 0.1 1.8 10 VGS, GATE−TO−SOURCE VOLTAGE (VOLTS) VGS = 5 V 2 20 VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS) 0.12 0 30 0 1.6 4 RDS(on), DRAIN−TO−SOURCE RESISTANCE () 0 RDS(on), DRAIN−TO−SOURCE RESISTANCE () 5.5 V VGS = 10 V 1.6 1.4 1.2 1 100 TJ = 100°C 10 0.8 0.6 −50 −25 1 0 25 50 75 100 125 150 175 0 10 20 30 40 50 TJ, JUNCTION TEMPERATURE (°C) VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS) Figure 5. On−Resistance Variation with Temperature Figure 6. Drain−to−Source Leakage Current versus Voltage http://onsemi.com 3 60 NTD18N06L POWER MOSFET SWITCHING Switching behavior is most easily modeled and predicted by recognizing that the power MOSFET is charge controlled. The lengths of various switching intervals (t) are determined by how fast the FET input capacitance can be charged by current from the generator. The published capacitance data is difficult to use for calculating rise and fall because drain−gate capacitance varies greatly with applied voltage. Accordingly, gate charge data is used. In most cases, a satisfactory estimate of average input current (IG(AV)) can be made from a rudimentary analysis of the drive circuit so that t = Q/IG(AV) The capacitance (Ciss) is read from the capacitance curve at a voltage corresponding to the off−state condition when calculating td(on) and is read at a voltage corresponding to the on−state when calculating td(off). At high switching speeds, parasitic circuit elements complicate the analysis. The inductance of the MOSFET source lead, inside the package and in the circuit wiring which is common to both the drain and gate current paths, produces a voltage at the source which reduces the gate drive current. The voltage is determined by Ldi/dt, but since di/dt is a function of drain current, the mathematical solution is complex. The MOSFET output capacitance also complicates the mathematics. And finally, MOSFETs have finite internal gate resistance which effectively adds to the resistance of the driving source, but the internal resistance is difficult to measure and, consequently, is not specified. The resistive switching time variation versus gate resistance (Figure 9) shows how typical switching performance is affected by the parasitic circuit elements. If the parasitics were not present, the slope of the curves would maintain a value of unity regardless of the switching speed. The circuit used to obtain the data is constructed to minimize common inductance in the drain and gate circuit loops and is believed readily achievable with board mounted components. Most power electronic loads are inductive; the data in the figure is taken with a resistive load, which approximates an optimally snubbed inductive load. Power MOSFETs may be safely operated into an inductive load; however, snubbing reduces switching losses. During the rise and fall time interval when switching a resistive load, VGS remains virtually constant at a level known as the plateau voltage, VSGP. Therefore, rise and fall times may be approximated by the following: tr = Q2 x RG/(VGG − VGSP) tf = Q2 x RG/VGSP where VGG = the gate drive voltage, which varies from zero to VGG RG = the gate drive resistance and Q2 and VGSP are read from the gate charge curve. During the turn−on and turn−off delay times, gate current is not constant. The simplest calculation uses appropriate values from the capacitance curves in a standard equation for voltage change in an RC network. The equations are: td(on) = RG Ciss In [VGG/(VGG − VGSP)] td(off) = RG Ciss In (VGG/VGSP) 1400 Ciss C, CAPACITANCE (pF) 1200 TJ = 25°C VDS = 0 V VGS = 0 V 1000 800 Crss 600 Ciss 400 Coss 200 Crss 0 10 5 5 0 VGS 10 15 20 25 VDS GATE−TO−SOURCE OR DRAIN−TO−SOURCE VOLTAGE (VOLTS) Figure 7. Capacitance Variation http://onsemi.com 4 1000 8 6 VGS QT Q1 4 t, TIME (ns) VGS , GATE−TO−SOURCE VOLTAGE (VOLTS) NTD18N06L Q2 100 tr tf td(off) 10 td(on) 2 VDS = 30 V ID = 18 A VGS = 5 V ID = 18 A TJ = 25°C 0 1 0 2 4 6 10 8 QG, TOTAL GATE CHARGE (nC) 12 1 Figure 8. Gate−To−Source and Drain−To−Source Voltage versus Total Charge 10 RG, GATE RESISTANCE () 100 Figure 9. Resistive Switching Time Variation versus Gate Resistance DRAIN−TO−SOURCE DIODE CHARACTERISTICS IS, SOURCE CURRENT (AMPS) 20 VGS = 0 V TJ = 25°C 16 12 8 4 0 0.6 0.68 0.76 0.84 0.92 VSD, SOURCE−TO−DRAIN VOLTAGE (VOLTS) 1 Figure 10. Diode Forward Voltage versus Current SAFE OPERATING AREA The Forward Biased Safe Operating Area curves define the maximum simultaneous drain−to−source voltage and drain current that a transistor can handle safely when it is forward biased. Curves are based upon maximum peak junction temperature and a case temperature (TC) of 25°C. Peak repetitive pulsed power limits are determined by using the thermal response data in conjunction with the procedures discussed in AN569, “Transient Thermal Resistance − General Data and Its Use.” Switching between the off−state and the on−state may traverse any load line provided neither rated peak current (IDM) nor rated voltage (VDSS) is exceeded and the transition time (tr,tf) do not exceed 10 s. In addition the total power averaged over a complete switching cycle must not exceed (TJ(MAX) − TC)/(RJC). A Power MOSFET designated E−FET can be safely used in switching circuits with unclamped inductive loads. For reliable operation, the stored energy from circuit inductance dissipated in the transistor while in avalanche must be less than the rated limit and adjusted for operating conditions differing from those specified. Although industry practice is to rate in terms of energy, avalanche energy capability is not a constant. The energy rating decreases non−linearly with an increase of peak current in avalanche and peak junction temperature. Although many E−FETs can withstand the stress of drain−to−source avalanche at currents up to rated pulsed current (IDM), the energy rating is specified at rated continuous current (ID), in accordance with industry custom. The energy rating must be derated for temperature as shown in the accompanying graph (Figure 12). Maximum energy at currents below rated continuous ID can safely be assumed to equal the values indicated. http://onsemi.com 5 NTD18N06L I D, DRAIN CURRENT (AMPS) 100 VGS = 15 V SINGLE PULSE TC = 25°C 10 s 10 100 s 1 ms 10 ms 1 dc RDS(on) LIMIT THERMAL LIMIT PACKAGE LIMIT 0.1 10 1 VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS) r(t), EFFECTIVE TRANSIENT THERMAL RESISTANCE (NORMALIZED) 0.1 100 EAS , SINGLE PULSE DRAIN−TO−SOURCE AVALANCHE ENERGY (mJ) SAFE OPERATING AREA 80 ID = 12 A 60 40 20 0 25 Figure 11. Maximum Rated Forward Biased Safe Operating Area 175 50 75 100 125 150 TJ, STARTING JUNCTION TEMPERATURE (°C) Figure 12. Maximum Avalanche Energy versus Starting Junction Temperature 1.0 D = 0.5 0.2 0.1 0.1 0.05 P(pk) 0.02 0.01 SINGLE PULSE 0.01 1.0E−05 t1 t2 DUTY CYCLE, D = t1/t2 1.0E−04 1.0E−03 1.0E−02 t, TIME (s) RJC(t) = r(t) RJC D CURVES APPLY FOR POWER PULSE TRAIN SHOWN READ TIME AT t1 TJ(pk) − TC = P(pk) RJC(t) 1.0E−01 Figure 13. Thermal Response di/dt IS trr ta tb TIME 0.25 IS tp IS Figure 14. Diode Reverse Recovery Waveform http://onsemi.com 6 1.0E+00 1.0E+01 NTD18N06L PACKAGE DIMENSIONS DPAK CASE 369C−01 ISSUE O SEATING PLANE −T− C B V E R 4 Z A S 1 2 DIM A B C D E F G H J K L R S U V Z 3 U K F J L H D G 2 PL 0.13 (0.005) M T INCHES MIN MAX 0.235 0.245 0.250 0.265 0.086 0.094 0.027 0.035 0.018 0.023 0.037 0.045 0.180 BSC 0.034 0.040 0.018 0.023 0.102 0.114 0.090 BSC 0.180 0.215 0.025 0.040 0.020 −−− 0.035 0.050 0.155 −−− STYLE 2: PIN 1. GATE 2. DRAIN 3. SOURCE 4. DRAIN SOLDERING FOOTPRINT* 6.20 0.244 3.0 0.118 2.58 0.101 5.80 0.228 1.6 0.063 6.172 0.243 SCALE 3:1 mm inches *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. http://onsemi.com 7 MILLIMETERS MIN MAX 5.97 6.22 6.35 6.73 2.19 2.38 0.69 0.88 0.46 0.58 0.94 1.14 4.58 BSC 0.87 1.01 0.46 0.58 2.60 2.89 2.29 BSC 4.57 5.45 0.63 1.01 0.51 −−− 0.89 1.27 3.93 −−− NTD18N06L PACKAGE DIMENSIONS DPAK−3 CASE 369D−01 ISSUE B V NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982. 2. CONTROLLING DIMENSION: INCH. C B E R 4 Z A S 1 2 3 −T− SEATING PLANE K J F H D G 3 PL 0.13 (0.005) M DIM A B C D E F G H J K R S V Z INCHES MIN MAX 0.235 0.245 0.250 0.265 0.086 0.094 0.027 0.035 0.018 0.023 0.037 0.045 0.090 BSC 0.034 0.040 0.018 0.023 0.350 0.380 0.180 0.215 0.025 0.040 0.035 0.050 0.155 −−− MILLIMETERS MIN MAX 5.97 6.35 6.35 6.73 2.19 2.38 0.69 0.88 0.46 0.58 0.94 1.14 2.29 BSC 0.87 1.01 0.46 0.58 8.89 9.65 4.45 5.45 0.63 1.01 0.89 1.27 3.93 −−− STYLE 2: PIN 1. GATE 2. DRAIN 3. SOURCE 4. DRAIN T ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice to any products herein. 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