PRELIMINARY KM681002A, KM681002AI CMOS SRAM Document Title 128Kx8 High Speed Static RAM(5V Operating), Revolutionary Pin out. Operated at Commercial and Industrial Temperature Range. Revision History Rev. No. History Draft Data Remark Rev. 0.0 Initial release with Preliminary. Apr. 22th, 1995 Preliminary Rev. 1.0 Release to final Data Sheet. 1.1. Delete Preliminary Feb. 29th, 1996 Final Rev. 2.0 Update D.C parameters. 2.1. Update D.C parameters Previous spec. Items (12/15/17/20ns part) Icc 200/190/180/170mA Isb 30mA Isb1 10mA Jul. 16th, 1996 Final Updated spec. (12/15/17/20ns part) 170/165/165/160mA 25mA 8mA Rev. 3.0 Add Industrial Temperature Range parts and 300mil-SOJ PKG. 3.1. Add 32-Pin 300mil-SOJ Package. 3.2. Add Industrial Temperature Range parts with the same parameters as Commercial Temperature Range parts. 3.2.1. Add KM68002AI parts for Industrial Temperature Range. 3.2.2. Add ordering information. 3.2.3. Add the condition for operating at Industrial Temp. Range. 3.3. Add the test condition for Voh1 with Vcc=5V±5% at 25°C 3.4. Add timing diagram to define tWP as ″(Timing Wave Form of Write Cycle(CS=Controlled)″ Jun. 2nd, 1997 Final Rev. 4.0 4.1. Delete 17ns Part Feb. 25th, 1998 Final The attached data sheets are prepared and approved by SAMSUNG Electronics. SAMSUNG Electronics CO., LTD. reserve the right to change the specifications. SAMSUNG Electronics will evaluate and reply to your requests and questions on the parameters of this device. If you have any questions, please contact the SAMSUNG branch office near your office, call or contact Headquarters. -1- Rev 4.0 Ferruary 1998 PRELIMINARY KM681002A, KM681002AI CMOS SRAM 128K x 8 Bit High-Speed CMOS Static RAM FEATURES GENERAL DESCRIPTION • Fast Access Time 12, 15, 20ns(Max.) • Low Power Dissipation Standby (TTL) : 25mA(Max.) (CMOS) : 8mA(Max.) Operating KM681002A - 12 : 170mA(Max.) KM681002A - 15 : 165mA(Max.) KM681002A - 20 : 160mA(Max.) • Single 5.0V±10% Power Supply • TTL Compatible Inputs and Outputs • I/O Compatible with 3.3V Device • Fully Static Operation - No Clock or Refresh required • Three State Outputs • Center Power/Ground Pin Configuration • Standard Pin Configuration KM681002AJ : 32-SOJ-400 KM681002AT: 32-TSOP2-400F The KM681002A is a 1,048,576-bit high-speed Static Random Access Memory organized as 131,072 words by 8 bits. The KM681002A uses 8 common input and output lines and has an output enable pin which operates faster than address access time at read cycle. The device is fabricated using Samsung′s advanced CMOS process and designed for high-speed circuit technology. It is particularly well suited for use in high-density high-speed system applications. The KM681002A is packaged in a 400mil 32-pin plastic SOJ or TSOP2 forward. ORDERING INFORMATION KM681002A -12/15/20 Commercial Temp. KM681002AI -12/15/20 Industrial Temp. PIN CONFIGURATION(Top View) A0 1 32 A16 A1 2 31 A15 A2 3 30 A14 A3 4 29 A13 CS 5 28 I/O1 6 27 I/O8 I/O2 7 26 I/O7 A1 Vcc 8 A2 Vss 9 FUNCTIONAL BLOCK DIAGRAM Clk Gen. Pre-Charge Circuit A3 A4 Row Select A0 I/O3 10 Memory Array 512 Rows 256x8 Columns SOJ/ OE 25 Vss 24 Vcc TSOP2 23 I/O6 I/O4 11 22 I/O5 WE 12 21 A12 A7 A4 13 20 A11 A8 A5 14 19 A10 A6 15 18 A9 A7 16 17 A8 A5 A6 I/O1 ~I/O8 Data Cont. I/O Circuit Column Select CLK Gen. PIN FUNCTION A9 A10 A11 A12 A13 A14 A15 A16 Pin Name A0 - A16 CS Pin Function Address Inputs WE Write Enable WE CS Chip Select OE OE Output Enable I/O1 ~ I/O8 -2- Data Inputs/Outputs VCC Power(+5.0V) VSS Ground Rev 4.0 Ferruary 1998 PRELIMINARY KM681002A, KM681002AI CMOS SRAM ABSOLUTE MAXIMUM RATINGS* Parameter Symbol Rating Unit VIN, VOUT -0.5 to 7.0 V Voltage on VCC Supply Relative to VSS VCC -0.5 to 7.0 V Power Dissipation PD 1.0 W TSTG -65 to 150 °C Commercial TA 0 to 70 °C Industrial TA -40 to 85 °C Voltage on Any Pin Relative to VSS Storage Temperature Operating Temperature * Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operating sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. RECOMMENDED DC OPERATING CONDITIONS(TA=0 to 70°C) Parameter Symbol Min Typ Max Unit Supply Voltage VCC 4.5 5.0 5.5 V Ground VSS 0 0 0 V Input High Voltage VIH 2.2 - VCC + 0.5** V Input Low Voltage VIL -0.5* - 0.8 V NOTE: The above parameters are also guaranteed at industrial temperature range. * VIL(Min) = -2.0V a.c(Pulse Width≤10ns) for I≤20mA ** VIH(Max) = VCC + 2.0V a.c (Pulse Width≤10ns) for I≤20mA DC AND OPERATING CHARACTERISTICS(TA=0 to 70°C, Vcc=5.0V±10%, unless otherwise specified) Min Max Unit Input Leakage Current Parameter Symbol ILI VIN=VSS to VCC Test Conditions -2 2 µA Output Leakage Current ILO CS=VIH or OE=VIH or WE=VIL VOUT=VSS to VCC -2 2 µA Operating Current ICC Min. Cycle, 100% Duty CS=VIL, VIN=VIH or VIL, IOUT=0mA mA 12ns - 170 15ns - 165 20ns - 160 ISB Min. Cycle, CS=VIH - 25 mA ISB1 f=0MHz, CS ≥VCC-0.2V, VIN≥VCC-0.2V or VIN≤0.2V - 8 mA Output Low Voltage Level VOL IOL=8mA - 0.4 V Output High Voltage Level VOH IOH=-4mA 2.4 - V - 3.95 V Standby Current VOH1* IOH1=-0.1mA NOTE: The above parameters are also guaranteed at industrial temperature range. * VCC=5.0V, Temp.=25°C CAPACITANCE*(TA=25°C, f=1.0MHz) Item Symbol Test Conditions MIN Max Unit Input/Output Capacitance CI/O VI/O=0V - 8 pF Input Capacitance C IN VIN=0V - 6 pF * NOTE : Capacitance is sampled and not 100% tested. -3- Rev 4.0 Ferruary 1998 PRELIMINARY KM681002A, KM681002AI CMOS SRAM AC CHARACTERISTICS(TA=0 to 70°C, VCC=5.0V±10%, unless otherwise noted.) TEST CONDITIONS Parameter Value Input Pulse Levels 0V to 3V Input Rise and Fall Times 3ns Input and Output timing Reference Levels 1.5V Output Loads See below NOTE : The above test conditions are also applied at industrial temperature range. Output Loads(A) Output Loads(B) for tHZ, tLZ, tWHZ, tOW, tOLZ & tOHZ +5.0V +5.0V 480Ω 480Ω D OUT D OUT 255Ω 255Ω 30pF* 5pF* * Including Scope and Jig Capacitance READ CYCLE Parameter Read Cycle Time Symbol tRC KM681002A-12 KM681002A-15 KM681002A-20 Unit Min Max Min Max Min Max 12 - 15 - 20 - ns Address Access Time tAA - 12 - 15 - 20 ns Chip Select to Output tCO - 12 - 15 - 20 ns Output Enable to Valid Output tOE - 6 - 7 - 9 ns Chip Enable to Low-Z Output tLZ 3 - 3 - 3 - ns Output Enable to Low-Z Output tOLZ 0 - 0 - 0 - ns Chip Disable to High-Z Output tHZ 0 6 0 7 0 9 ns Output Disable to High-Z Output tOHZ 0 6 0 7 0 9 ns Output Hold from Address Change tOH 3 - 3 - 3 - ns Chip Selection to Power Up Time tPU 0 - 0 - 0 - ns Chip Selection to Power DownTime tPD - 12 - 15 - 20 ns NOTE : The above parameters are also guaranteed at industrial temperature range. -4- Rev 4.0 Ferruary 1998 PRELIMINARY KM681002A, KM681002AI CMOS SRAM WRITE CYCLE Parameter Symbol KM681002A-12 KM681002A-15 KM681002A-20 Min Max Min Max Min Max Unit Write Cycle Time tWC 12 - 15 - 20 - ns Chip Select to End of Write tCW 8 - 10 - 12 - ns Address Set-up Time tAS 0 - 0 - 0 - ns Address Valid to End of Write tAW 8 - 10 - 12 - ns Write Pulse Width(OE High) tWP 8 - 10 - 12 - ns Write Pulse Width(OE Low) tWP1 12 - 15 - 20 - ns Write Recovery Time tWR 0 - 0 - 0 - ns Write to Output High-Z tWHZ 0 6 0 7 0 9 ns Data to Write Time Overlap tDW 6 - 7 - 9 - ns Data Hold from Write Time tDH 0 - 0 - 0 - ns End Write to Output Low-Z tOW 3 - 3 - 3 - ns NOTE : The above parameters are also guaranteed at industrial temperature range. TIMMING DIAGRAMS TIMING WAVEFORM OF READ CYCLE(1) (Address Controlled, CS=OE=VIL, WE=VIH) tRC Address tAA tOH Data Out Valid Data Previous Valid Data TIMING WAVEFORM OF READ CYCLE(2) (WE=VIH) tRC Address tAA tCO CS tHZ(3,4,5) tOE tOHZ OE tOH tOLZ tLZ(4,5) Data out Valid Data VCC ICC Current ISB tPU tPD 50% 50% -5- Rev 4.0 Ferruary 1998 PRELIMINARY KM681002A, KM681002AI CMOS SRAM NOTES(READ CYCLE) 1. WE is high for read cycle. 2. All read cycle timing is referenced from the last valid address to the first transition address. 3. tHZ and tOHZ are defined as the time at which the outputs achieve the open circuit condition and are not referenced to VOH or VOL levels. 4. At any given temperature and voltage condition, tHZ(Max.) is less than tLZ(Min.) both for a given device and from device to device. 5. Transition is measured ±200mV from steady state voltage with Load(B). This parameter is sampled and not 100% tested. 6. Device is continuously selected with CS=VIL. 7. Address valid prior to coincident with CS transition low. 8. For common I/O applications, minimization or elimination of bus contention conditions is necessary during read and write cycle. TIMING WAVEFORM OF WRITE CYCLE(1) (OE= Clock) tWC Address tWR(5) tAW OE tCW(3) CS tWP(2) tAS(4) WE tDW Data in High-Z tDH Valid Data tOHZ(6) High-Z(8) Data out TIMING WAVEFORM OF WRITE CYCLE(2) (OE=Low Fixed) tWC Address tWR(5) tAW tCW(3) CS tAS(4) tWP1(2) WE tDW Data in High-Z tDH Valid Data tWHZ(6) tOW (10) (9) High-Z(8) Data out -6- Rev 4.0 Ferruary 1998 PRELIMINARY KM681002A, KM681002AI CMOS SRAM TIMING WAVEFORM OF WRITE CYCLE(3) (CS = Controlled) tWC Address tAW tWR(5) tCW(3) CS tAS(4) tWP(2) WE tDW High-Z Data in Data Valid tLZ High-Z tWHZ(6) High-Z(8) High-Z Data out tDH NOTES(WRITE CYCLE) 1. All write cycle timing is referenced from the last valid address to the first transition address. 2. A write occurs during the overlap of a low CS and WE. A write begins at the latest transition CS going low and WE going low A write ends at the earliest transition CS going high or WE going high. tWP is measured from the beginning of write to the end of write. 3. tCW is measured from the later of CS going low to end of write. 4. tAS is measured from the address valid to the beginning of write. 5. tWR is measured from the end of write to the address change. tWR applied in case a write ends as CS or WE going high. 6. If OE, CS and WE are in the Read Mode during this period, the I/O pins are in the output low-Z state. Inputs of opposite phase of the output must not be applied because bus contention can occur. 7. For common I/O applications, minimization or elimination of bus contention conditions is necessary during read and write cycle. 8. If CS goes low simultaneously with WE going or after WE going low, the outputs remain high impedance state. 9. Dout is the read data of the new address. 10. When CS is low : I/O pins are in the output state. The input signals in the opposite phase leading to the output should not be applied. FUNCTIONAL DESCRIPTION CS WE OE Mode I/O Pin Supply Current H X L H X* Not Select High-Z ISB, ISB1 H Output Disable High-Z ICC L L H L Read DOUT ICC L X Write DIN ICC * NOTE : X means Don′t Care. -7- Rev 4.0 Ferruary 1998 PRELIMINARY KM681002A, KM681002AI CMOS SRAM PACKAGE DIMENSIONS 32-SOJ-400 Units:millimeters/Inches #17 10.16 0.400 #32 11.18 ±0.12 0.440 ±0.005 9.40 ±0.25 0.370 ±0.010 0.20 #1 0.69 0.027 MIN 21.36 MAX 0.841 20.95 ±0.12 0.825 ±0.005 ( 1.30 ) 0.051 ( 1.30 ) 0.051 ( 0.95 ) 0.0375 0.43 +0.10 -0.05 0.017 +0.004 -0.002 1.27 0.050 +0.10 -0.05 0.008 +0.004 -0.002 #16 0.71 0.10 MAX 0.004 3.76 MAX 0.148 +0.10 -0.05 0.028 +0.004 -0.002 Units:millimeters/Inches 32-TSOP2-400F 0~8° ( 0.25 ) 0.010 #17 0.45 ~0.75 0.018 ~ 0.030 11.76 ±0.20 0.463 ±0.008 #1 10.16 0.400 #32 ( 0.50 ) 0.020 #16 0.15 +0.10 -0.05 0.006 +0.004 -0.002 21.35 MAX 0.841 20.95 ±0.10 0.825 ±0.004 1.00 ±0.10 0.039 ±0.004 ( 0.95 ) 0.037 0.40 ±0.10 0.016 ±0.004 1.27 0.050 1.20 0.047MAX 0.10 MAX 0.004 MAX 0.05 0.002MIN -8- Rev 4.0 Ferruary 1998 PRELIMINARY KM681002A, KM681002AI CMOS SRAM PACKAGE DIMENSIONS -9- Rev 4.0 Ferruary 1998