SAMSUNG KM68512ALG-5L

KM68512A Family
CMOS SRAM
Document Title
64Kx8 bit Low Power CMOS Static RAM
Revision History
History
Draft Data
Remark
0.0
Initial draft
Novemer 28, 1993
Design target
0.1
Revision
May 13, 1994
Preliminary
1.0
Finalize
December 1, 1994
Final
2.0
Revision
- Add 45ns part with 30pf test load.
August 12, 1995
Final
3.0
Revision
- Change Data Sheet format :
One data sheets for industrial and commercial product
April 15, 1996
Final
4.0
Revision
- Change Data Sheet format
- Remove 45ns part from commercial product and 100ns part
from industrial product
- Remove low power part form TSOP package
January 9, 1998
Final
Revision No.
The attached data, sheets are provided by SAMSUNG Electronics. SAMSUNG Electronics CO., LTD. reserve the right to change the specifications and
products. SAMSUNG Electronics will answer to your questions about device. If you have any questions, please contact the SAMSUNG branch offices.
1
Revision 4.0
January 1997
KM68512A Family
CMOS SRAM
64Kx8 bit Low Power CMOS Static RAM
FEATURES
GENERAL DESCRIPTION
• Process Technology: Poly Load
• Organization: 64Kx8
• Power Supply Voltage: 4.5~5.5V
• Low Data Retention Voltage: 2V(Min)
• Three state output and TTL Compatible
• Package Type: 32-SOP-525, 32-TSOP1-0820F
The KM68512A families are fabricated by SAMSUNG′s
advanced CMOS process technology. The families support
various operating temperature ranges and have various
package types for user flexibility of system design. The
families also support low data retention voltage for battery
back-up operation with low data retention current.
PRODUCT FAMILY
Power Dissipation
Product Family
KM68512AL
Operating Temperature
VCC Range
Commercial (0~70°C)
KM68512AL-L
Speed
Standby
(ISB1, Max)
100µA
55/70ns
20µA
4.5 to 5.5V
KM68512ALI
Industrial (-40~85°C)
32-SOP
32-TSOP1-F
70mA
100µA
70ns
KM68512ALI-L
50µA
PIN DESCRIPTION
N.C
1
32
VCC
N.C
2
31
A15
A14
3
30
CS2
A12
4
29
WE
A7
5
28
A13
A6
6
27
A8
A5
7
26
A9
A4
8
25
A11
A3
9
24
OE
A2
10
23
A10
A1
11
22
CS1
A0
12
21
I/O8
I/O1
13
20
I/O7
I/O2
14
19
I/O6
I/O3
15
18
I/O5
VSS
16
17
I/O4
32-SOP
PKG Type
Operating
(ICC2, Max)
FUNCTIONAL BLOCK DIAGRAM
Clk gen.
A11
A9
A8
A13
WE
CS2
A15
VCC
NC
NC
A14
A12
A7
A6
A5
A4
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
32-TSOP
Type1 - Forward
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
Precharge circuit.
A3
OE
A10
CS1
I/O8
I/O7
I/O6
I/O5
I/O4
VSS
I/O3
I/O2
I/O1
A0
A1
A2
A3
A4
A5
A6
A7
Memory array
512 rows
128×8 columns
Row
select
A12
A13
A14
A15
Data
cont
I/O1
I/O8
I/O Circuit
Column select
Data
cont
Name
CS1, CS 2
Function
OE
Output Enable Input
WE
Write Enable Input
A0~A15
I/O1~I/O8
A0
Chip Select Inputs
A1
A2
A8
A9 A10 A11
CS1
CS2
WE
Address Inputs
Control
Logic
OE
Data Inputs/Outputs
Vcc
Power
Vss
Ground
N.C
No Connection
SAMSUNG ELECTRONICS CO., LTD. reserves the right to change products and specifications without notice.
2
Revision 4.0
January 1997
KM68512A Family
CMOS SRAM
PRODUCT LIST
Commercial Temperature Products(0~70°C)
Industrial Temperature Products(-40~85°C)
Part Name
Function
KM68512ALG-5
32-SOP, 55ns, L-pwr
KM68512ALGI-7
Part Name
32-SOP, 70ns, L-pwr
Function
KM68512ALG-5L
32-SOP, 55ns, LL-pwr
KM68512ALGI-7L
32-SOP, 70ns, LL-pwr
KM68512ALG-7
32-SOP, 70ns, L-pwr
KM68512ALG-7L
32-SOP, 70ns, LL-pwr
KM68512ALTI-7L
32-TSOP1-F, 70ns, LL-pwr
KM68512ALT-5L
32-TSOP1-F, 55ns, LL-pwr
KM68512ALT-7L
32-TSOP1-F, 70ns, LL-pwr
FUNCTIONAL DESCRIPTION
CS1
CS2
OE
WE
I/O Pin
Mode
Power
H
X1)
X1)
X1)
High-Z
Deselected
Standby
X1)
L
X1)
X1)
High-Z
Deselected
Standby
L
H
H
H
High-Z
Output Disabled
Active
L
H
L
H
Dout
Read
Active
L
H
X1)
L
Din
Write
Active
1. X means don′t care.(Must be low or high state)
ABSOLUTE MAXIMUM RATINGS1)
Item
Voltage on any pin relative to Vss
Voltage on Vcc supply relative to Vss
Power Dissipation
Storage temperature
Operating Temperature
Soldering temperature and time
Symbol
Ratings
Unit
Remark
VIN,VOUT
-0.5 to 7.0
V
-
VCC
-0.5 to 7.0
V
-
PD
1.0
W
-
TSTG
-65 to 150
°C
-
0 to 70
°C
KM68512A
-40 to 85
°C
KM68512AI
260°C, 10sec(Lead Only)
-
-
TA
TSOLDER
1. Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. Functional operation should be
restricted to recommended operating condition. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
3
Revision 4.0
January 1997
KM68512A Family
CMOS SRAM
RECOMMENDED DC OPERATING CONDITIONS1)
Item
Symbol
Min
Typ
Max
Unit
Supply voltage
Vcc
4.5
5.0
5.5
V
Ground
Vss
0
0
0
Input high voltage
VIH
2.2
-
Input low voltage
VIL
-0.53)
-
V
Vcc+0.5V
V
2)
0.8
V
Note
1. Commercial Product : TA=0 to 70°C, unless otherwise specified
Industrial Product : TA=-40 to 85°C, unless otherwise specified
2. Overshoot : V CC+3.0V in case of pulse width≤30ns
3. Undershoot : -3.0V in case of pulse width≤30ns
4. Overshoot and undershoot are sampled, not 100% tested
CAPACITANCE1)(f=1MHz, TA=25°C)
Item
Symbol
Test Condition
Min
Max
Unit
Input capacitance
CIN
VIN=0V
-
6
pF
Input/Output capacitance
CIO
VIO=0V
-
8
pF
1. Capacitance is sampled, not 100% tested
DC AND OPERATING CHARACTERISTICS
Item
Input leakage current
Symbol
Test Conditions
Min
Typ Max Unit
VIN=Vss to Vcc
-1
Output leakage current
ILO
CS 1=VIH or CS 2=VIL or OE=VIH or WE=VIL, VIO=Vss to Vcc
-1
-
1
µA
Operating power supply current
ICC
IIO=0mA, CS1=VIL, CS2=VIH, VIN=VIH or VIL
-
7
15
mA
ICC1
Cycle time=1µs, 100% duty, IIO=0mA
CS 1≤0.2V, CS2≥VCC-0.2V, VIN≤0.2V or VIN≥Vcc -0.2V
-
-
10
mA
ICC2
Cycle time=Min, 100% duty, IIO=0mA, CS1=VIL, CS 2=VIH, VIN=VIH or VIL
-
-
70
mA
Output low voltage
VOL
IOL=2.1mA
-
-
0.4
V
Output high voltage
VOH
IOH=-1.0mA
2.4
-
-
V
Standby Current(TTL)
ISB
CS 1=VIH, CS2=VIL, Other inputs =VIH or VIL
-
-
3
mA
-
2
1
100
20
µA
ISB1
Low Power
CS 1≥Vcc-0.2V, CS2≥Vcc-0.2V or CS2≤0.2V Low Low Power
Other inputs =0 ~ Vcc
Low Power
Low Low Power
-
2
1
100
50
µA
Average operating current
Standby
Current
(CMOS)
KM68512AL/L-L
KM68512ALI/LI-L
4
-
1
µA
ILI
Revision 4.0
January 1997
KM68512A Family
CMOS SRAM
AC OPERATING CONDITIONS
TEST CONDITIONS( Test Load and Input/Output Reference)
Input pulse level : 0.8 to 2.4V
Input rising and falling time : 5ns
Input and output reference voltage :1.5V
Output load(see right) : CL=100pF+1TTL
CL1)
1. Including scope and jig capacitance
AC CHARACTERISTICS (Vcc=4.5~5.5V, KM68512A Family:TA=0 to 70°C,
KM68512AI Family:TA=-40 to 85°C)
Speed Bins
Parameter List
Symbol
Write
Units
70ns
Max
Min
Max
tRC
55
-
70
-
ns
Address access time
tAA
-
55
-
70
ns
Chip select to output
tCO1, tCO2
-
55
-
70
ns
Read cycle time
Read
55ns
Min
Output enable to valid output
tOE
-
25
-
35
ns
Chip select to low-Z output
tLZ
10
-
10
-
ns
Output enable to low-Z output
tOLZ
5
-
5
-
ns
Chip disable to high-Z output
tHZ
0
20
0
25
ns
Output disable to high-Z output
tOHZ
0
20
0
25
ns
Output hold from address change
tOH
10
-
10
-
ns
Write cycle time
tWC
55
-
70
-
ns
Chip select to end of write
tCW
45
-
60
-
ns
Address set-up time
tAS
0
-
0
-
ns
Address valid to end of write
tAW
45
-
60
-
ns
Write pulse width
tWP
40
-
50
-
ns
Write recovery time
tWR
0
-
0
-
ns
Write to output high-Z
tWHZ
0
20
0
25
ns
Data to write time overlap
tDW
25
-
30
-
ns
Data hold from write time
tDH
0
-
0
-
ns
End write to output low-Z
tOW
5
-
5
-
ns
Typ
Max
Unit
V
DATA RETENTION CHARACTERISTICS
Item
Vcc for data retention
Symbol
CS ≥Vcc-0.2V
VDR
KM68512AL/L-L
Data retention current
IDR
KM68512ALI/LI-L
Data retention set-up time
tSDR
Recovery time
tRDR
Min
Test Condition
2.0
-
5.5
L-Ver
LL-Ver
-
1
0.5
50
10
L-Ver
LL-Ver
-
-
50
25
0
-
-
5
-
-
11)
Vcc=3.0V CS1≥Vcc-0.2V
CS2≥Vcc-0.2V or CS2≤0.2V
See data retention waveform
µA
ms
1. CS1≥Vcc-0.2V, CS2 ≥Vcc-0.2V( CS1 controlled) or CS2≤0.2V(CS2 controlled).
5
Revision 4.0
January 1997
KM68512A Family
CMOS SRAM
TIMMING DIAGRAMS
TIMING WAVEFORM OF READ CYCLE(1) (Address Controlled, CS1=OE=VIL, WE=VIH)
tRC
Address
tAA
tOH
Data Out
Data Valid
Previous Data Valid
TIMING WAVEFORM OF READ CYCLE(2) (WE=VIH)
tRC
Address
tOH
tAA
tCO1
CS 1
tHZ(1,2)
CS 2
tCO2
tOE
OE
Data out
High-Z
tOHZ
tOLZ
tLZ
Data Valid
NOTES (READ CYCLE)
1. tHZ and tOHZ are defined as the time at which the outputs achieve the open circuit conditions and are not referenced to output voltage
levels.
2. At any given temperature and voltage condition, tHZ(Max.) is less than tLZ(Min.) both for a given device and from device to device
interconnection.
6
Revision 4.0
January 1997
KM68512A Family
CMOS SRAM
TIMING WAVEFORM OF WRITE CYCLE(1) (WE Controlled)
tWC
Address
tCW(2)
tWR(4)
CS1
tAW
CS2
tCW(2)
tWP(1)
WE
tAS(3)
tDW
tDH
Data Valid
Data in
tWHZ
Data out
tOW
Data Undefined
TIMING WAVEFORM OF WRITE CYCLE(2) (CS1
Controlled)
tWC
Address
tAS(3)
tCW(2)
tWR(4)
CS1
tAW
CS2
tWP(1)
WE
tDW
Data in
Data out
tDH
Data Valid
High-Z
High-Z
7
Revision 4.0
January 1997
KM68512A Family
CMOS SRAM
TIMING WAVEFORM OF WRITE CYCLE(3)
(CS2 Controlled)
tWC
Address
tAS(3)
tCW(2)
tWR(4)
CS 1
tAW
CS 2
tCW(2)
tWP(1)
WE
tDW
Data Valid
Data in
Data out
tDH
High-Z
High-Z
NOTES (WRITE CYCLE)
1. A write occurs during the overlap of a low CS1, a high CS 2 and a low WE. A write begins at the latest transition among CS1 goes low,
CS2 going high and WE going low : A write end at the earliest transition among CS1 going high, CS2 going low and WE going high,
tWP is measured from the begining of write to the end of write.
2. t CW is measured from the CS1 going low or CS2 going high to the end of write.
3. t AS is measured from the address valid to the beginning of write.
4. tWR is measured from the end of write to the address change. tWR(1) applied in case a write ends as CS1 or WE going high tWR(2)
applied in case a write ends as CS2 going to low.
DATA RETENTION WAVE FORM
CS1 controlled
VCC
tSDR
Data Retention Mode
tRDR
4.5V
2.2V
VDR
CS1≥VCC - 0.2V
CS1
GND
CS2 controlled
Data Retention Mode
VCC
4.5V
CS2
tSDR
tRDR
VDR
0.4V
CS2≤0.2V
GND
8
Revision 4.0
January 1997
KM68512A Family
CMOS SRAM
PACKAGE DIMENSIONS
Units: millimeter(Inch)
32 PIN SMALL OUTLINE PACKAGE (525mil)
0~8°
#17
14.12±0.30
0.556±0.012
#1
13.34
0.525
#32
11.43±0.20
0.450±0.008
#16
2.74±0.20
0.108±0.008
3.00
0.118 MAX
20.87 MAX
0.822
20.47±0.20
0.806±0.008
0.80±0.20
0.031±0.008
0.20 +0.10
-0.05
0.008+0.004
-0.002
0.10 MAX
0.004 MAX
+0.100
-0.050
+0.004
0.016 -0.002
0.41
( 0.71 )
0.028
1.27
0.050
0.05 MIN
0.002
32-THIN SMALL OUTLINE PACKAGE TYPE I (0820F)
+0.10
-0.05
0.008+0.004
-0.002
0.20
20.00±0.20
0.787±0.008
#1
#32
MAX
8.40
0.331
0.50
0.0197
#16
0.25
0.010 TYP
#17
18.40±0.10
0.724±0.004
0.25
)
0.010
8.00
0.315
(
1.00±0.10
0.039±0.004
1.20
0.047 MAX
+0.10
-0.05
0.006+0.004
-0.002
0.05
0.002 MIN
0~8°
0.45 ~0.75
0.018 ~0.030
(
9
0.10 MAX
0.004 MAX
0.15
0.50
)
0.020
Revision 4.0
January 1997