FREESCALE MPC8378E_12

Freescale Semiconductor
Document Number: MPC8378EEC
Rev. 8, 05/2012
Technical Data
MPC8378E
PowerQUICC II Pro Processor
Hardware Specifications
This document provides an overview of the MPC8378E
PowerQUICC II Pro processor features, including a block
diagram showing the major functional components. This
chip is a cost-effective, low-power, highly integrated host
processor that addresses the requirements of several
printing and imaging, consumer, and industrial
applications, including main CPUs and I/O processors in
printing systems, networking switches and line cards,
wireless LANs (WLANs), network access servers (NAS),
VPN routers, intelligent NIC, and industrial controllers.
This chip extends the PowerQUICC family, adding higher
CPU performance, additional functionality, and faster
interfaces while addressing the requirements related to
time-to-market, price, power consumption, and package
size.
1
Overview
This chip incorporates the e300c4s core, which includes
32 KB of L1 instruction and data caches and on-chip
memory management units (MMUs). The device offers
two enhanced three-speed 10, 100, 1000 Mbps Ethernet
interfaces, a DDR1/DDR2 SDRAM memory controller, a
flexible, a 32-bit local bus controller, a 32-bit PCI
controller, an optional dedicated security engine, a USB
2.0 dual-role controller, a programmable interrupt
Freescale reserves the right to change the detail specifications as may be required
to permit improvements in the design of its products.
© 2008-2012 Freescale Semiconductor, Inc. All rights reserved.
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Contents
Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
Electrical Characteristics . . . . . . . . . . . . . . . . . . . . . . 6
Power Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 10
Clock Input Timing . . . . . . . . . . . . . . . . . . . . . . . . . 13
RESET Initialization . . . . . . . . . . . . . . . . . . . . . . . . 15
DDR1 and DDR2 SDRAM . . . . . . . . . . . . . . . . . . . 16
DUART . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
Ethernet: Enhanced Three-Speed Ethernet (eTSEC) 23
USB . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
Local Bus . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40
Enhanced Secure Digital Host Controller (eSDHC) 49
JTAG . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57
I2C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61
PCI . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 63
PCI Express . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65
Timers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 74
GPIO . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75
IPIC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 76
SPI . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 77
High-Speed Serial Interfaces (HSSI) . . . . . . . . . . . . 79
Package and Pin Listings . . . . . . . . . . . . . . . . . . . . . 89
Clocking . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 108
Thermal . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 115
System Design Information . . . . . . . . . . . . . . . . . . 121
Ordering Information . . . . . . . . . . . . . . . . . . . . . . . 123
Document Revision History . . . . . . . . . . . . . . . . . . 125
controller, dual I2C controllers, a 4-channel DMA controller, an enhanced secured digital host controller,
and a general-purpose I/O port. This figure shows the block diagram of the chip.
MPC8378E
DUART
Dual I2C
Timers
GPIO
SPI
Interrupt
Controller
Security
e300 Core
32 KB
D-Cache
USB 2.0
Hi-Speed
DMA
PCI
Host
Device
32 KB
I-Cache
DDR1/DDR2
SDRAM
Controller
Enhanced
Local Bus
eTSEC
eTSEC
SGMII,
RGMII, RMII,
RTBI, MII
SGMII,
RGMII, RMII,
RTBI, MII
PCI
Express
x1
SD/MMC
Controller
x2
Figure 1. MPC8378E Block Diagram and Features
The following features are supported in the chip:
• e300c4s core built on Power Architecture® technology with 32 KB instruction cache and 32 KB
data cache, a floating point unit, and two integer units
• DDR1/DDR2 memory controller supporting a 32/64-bit interface
• Peripheral interfaces, such as a 32-bit PCI interface with up to 66-MHz operation
• 32-bit local bus interface running up to 133-MHz
• USB 2.0 (full/high speed) support
• Power management controller for low-power consumption
• High degree of software compatibility with previous-generation PowerQUICC processor-based
designs for backward compatibility and easier software migration
• Optional security engine provides acceleration for control and data plane security protocols
The optional security engine (SEC 3.0) is noted with the extension “E” at the end. It allows CPU-intensive
cryptographic operations to be offloaded from the main CPU core. The security-processing accelerator
provides hardware acceleration for the DES, 3DES, AES, SHA-1, and MD-5 algorithms.
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
2
Freescale Semiconductor
In addition to the security engine, new high-speed interfaces, such as SGMII interface on enhanced
Ethernet and PCI Express, are included. This table compares the differences between MPC837xE
derivatives and provides the number of ports available for each interface.
Table 1. High-Speed Interfaces on the MPC8377E, MPC8378E, and MPC8379E
1.1
Descriptions
MPC8377E
MPC8378E
MPC8379E
SGMII
0
2
0
PCI Express®
2
2
0
SATA
2
0
4
DDR Memory Controller
The DDR1/DDR2 memory controller includes the following features:
• Single 32- or 64-bit interface supporting both DDR1 and DDR2 SDRAM
• Support for up to 400-MHz data rate
• Support up to 4 chip selects
• 64-Mbit to 2-Gbit (for DDR1) and to 4-Gbit (for DDR2) devices with ×8/×16/×32 data ports (no
direct ×4 support)
• Support for up to 32 simultaneous open pages
• Supports auto refresh
• On-the-fly power management using CKE
• 1.8-/2.5-V SSTL2 compatible I/O
1.2
USB Dual-Role Controller
The USB controller includes the following features:
• Supports USB on-the-go mode, including both device and host functionality, when using an
external ULPI (UTMI + low-pin interface) PHY
• Complies with USB Specification, Rev. 2.0
• Supports operation as a stand-alone USB device
— Supports one upstream facing port
— Supports three programmable USB endpoints
• Supports operation as a stand-alone USB host controller
— Supports USB root hub with one downstream-facing port
— Enhanced host controller interface (EHCI) compatible
• Supports high-speed (480 Mbps), full-speed (12 Mbps), and low-speed (1.5 Mbps) operation;
low-speed operation is supported only in host mode
• Supports UTMI + low pin interface (ULPI)
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
3
1.3
Dual Enhanced Three-Speed Ethernet Controllers (eTSECs)
The eTSECs include the following features:
• Two enhanced Ethernet interfaces can be used for RGMII/MII/RMII/RTBI/SGMII
• Two controllers conform to IEEE Std 802.3®, IEEE 802.3u, IEEE 802.3x, IEEE 802.3z,
IEEE 802.3au, IEEE 802.3ab, and IEEE Std 1588™ standards
• Support for Wake-on-Magic Packet™, a method to bring the device from standby to full operating
mode
• MII management interface for external PHY control and status
1.4
Integrated Programmable Interrupt Controller (IPIC)
The integrated programmable interrupt controller (IPIC) implements the necessary functions to provide a
flexible solution for general-purpose interrupt control. The IPIC programming model is compatible with
the MPC8260 interrupt controller, and it supports 8 external and 34 internal discrete interrupt sources.
Interrupts can also be redirected to an external interrupt controller.
1.5
Power Management Controller (PMC)
The power management controller includes the following features:
• Provides power management when the device is used in both host and agent modes
• Supports PCI Power Management 1.2 D0, D1, D2, and D3hot states
• Support for PME generation in PCI agent mode, PME detection in PCI host mode
• Supports Wake-on-LAN (Magic Packet), USB, GPIO, and PCI (PME input as host)
• Supports MPC8349E backward-compatibility mode
1.6
Serial Peripheral Interface (SPI)
The serial peripheral interface (SPI) allows the device to exchange data between other PowerQUICC
family chips, Ethernet PHYs for configuration, and peripheral devices such as EEPROMs, real-time
clocks, A/D converters, and ISDN devices.
The SPI is a full-duplex, synchronous, character-oriented channel that supports a four-wire interface
(receive, transmit, clock, and slave select). The SPI block consists of transmitter and receiver sections, an
independent baud-rate generator, and a control unit.
1.7
DMA Controller, Dual I2C, DUART, Enhanced Local Bus Controller
(eLBC), and Timers
The device provides an integrated four-channel DMA controller with the following features:
• Allows chaining (both extended and direct) through local memory-mapped chain descriptors
(accessible by local masters)
• Supports misaligned transfers
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
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Freescale Semiconductor
There are two I2C controllers. These synchronous, multi-master buses can be connected to additional
devices for expansion and system development.
The DUART supports full-duplex operation and is compatible with the PC16450 and PC16550
programming models. 16-byte FIFOs are supported for both the transmitter and the receiver.
The main component of the enhanced local bus controller (eLBC) is its memory controller, which provides
a seamless interface to many types of memory devices and peripherals. The memory controller is
responsible for controlling eight memory banks shared by a NAND Flash control machine (FCM), a
general-purpose chip-select machine (GPCM), and up to three user-programmable machines (UPMs). As
such, it supports a minimal glue logic interface to SRAM, EPROM, NOR Flash EPROM, NAND Flash,
EPROM, burstable RAM, regular DRAM devices, extended data output DRAM devices, and other
peripherals. The eLBC external address latch enable (LALE) signal allows multiplexing of addresses with
data signals to reduce the device pin count.
The enhanced local bus controller also includes a number of data checking and protection features, such
as data parity generation and checking, write protection, and a bus monitor to ensure that each bus cycle
is terminated within a user-specified period. The local bus can operate at up to 133 MHz.
The system timers include the following features: periodic interrupt timer, real time clock, software
watchdog timer, and two general-purpose timer blocks.
1.8
Security Engine
The optional security engine is optimized to handle all the algorithms associated with IPSec,
IEEE 802.11i, and iSCSI. The security engine contains one crypto-channel, a controller, and a set of crypto
execution units (EUs). The execution units are as follows:
• Data encryption standard execution unit (DEU), supporting DES and 3DES
• Advanced encryption standard unit (AESU), supporting AES
• Message digest execution unit (MDEU), supporting MD5, SHA1, SHA-256, and HMAC with any
algorithm
• One crypto-channel supporting multi-command descriptor chains
1.9
PCI Controller
The PCI controller includes the following features:
• PCI Specification Revision 2.3 compatible
• Single 32-bit data PCI interface operates at up to 66 MHz
• PCI 3.3-V compatible (not 5-V compatible)
• Support for host and agent modes
• On-chip arbitration, supporting 5 external masters on PCI
• Selectable hardware-enforced coherency
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
5
1.10
PCI Express Controller
The PCI Express controller includes the following features:
• PCI Express 1.0a compatible
• Two ×1 links or one ×2 link width
• Auto-detection of number of connected lanes
• Selectable operation as root complex or endpoint
• Both 32- and 64-bit addressing
• 128-byte maximum payload size
• Support for MSI and INTx interrupt messages
• Virtual channel 0 only
• Selectable Traffic Class
• Full 64-bit decode with 32-bit wide windows
• Dedicated four channel descriptor-based DMA engine per interface
1.11
Enhanced Secured Digital Host Controller (eSDHC)
The enhanced SD host controller (eSDHC) has the following features:
• Conforms to SD Host Controller Standard Specification, Rev 2.0 with Test Event register support.
• Compatible with the MMC System Specification, Rev 4.0
• Compatible with the SD Memory Card Specification, Rev 2.0, and supports High Capacity SD
memory cards
• Compatible with the SDIO Card Specification Rev, 1.2
• Designed to work with SD Memory, miniSD Memory, SDIO, miniSDIO, SD Combo, MMC,
MMCplus, MMC 4x, and RS-MMC cards
• SD bus clock frequency up to 50 MHz
• Supports 1-/4-bit SD and SDIO modes, 1-/4-bit MMC modes
• Supports internal DMA capabilities
2
Electrical Characteristics
This section provides the AC and DC electrical specifications and thermal characteristics for the chip. The
device is currently targeted to these specifications. Some of these specifications are independent of the I/O
cell, but are included for a more complete reference. These are not purely I/O buffer design specifications.
2.1
Overall DC Electrical Characteristics
This section covers the ratings, conditions, and other characteristics.
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
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Freescale Semiconductor
2.1.1
Absolute Maximum Ratings
This table provides the absolute maximum ratings.
Table 2. Absolute Maximum Ratings1
Characteristic
Symbol
Max Value
Unit
Note
Core supply voltage
VDD
–0.3 to 1.1
V
—
PLL supply voltage (e300 core, eLBC, and system)
AVDD
–0.3 to 1.1
V
—
DDR1 and DDR2 DRAM I/O voltage
GVDD
–0.3 to 2.75
–0.3 to 1.98
V
—
LVDD[1,2]
–0.3 to 3.63
V
—
PCI, DUART, system control and power management, I2C, and
JTAG I/O voltage
OVDD
–0.3 to 3.63
V
—
Local bus
LBVDD
–0.3 to 3.63
V
—
L[1,2]_nVDD
–0.3 to 1.1
V
6
MVIN
–0.3 to (GVDD + 0.3)
V
2, 4
MVREF
–0.3 to (GVDD + 0.3)
V
2, 4
Three-speed Ethernet signals
LVIN
–0.3 to (LVDD + 0.3)
V
—
PCI, DUART, CLKIN, system control and power
management, I2C, and JTAG signals
OVIN
–0.3 to (OVDD + 0.3)
V
3, 4, 5
Local Bus
LBIN
–0.3 to (LBVDD + 0.3)
V
—
TSTG
–55 to 150
°C
—
Three-speed Ethernet I/O, MII management voltage
SerDes
Input voltage
DDR DRAM signals
DDR DRAM reference
Storage temperature range
Notes:
1. Functional and tested operating conditions are given in Table 3. Absolute maximum ratings are stress ratings only, and
functional operation at the maximums is not guaranteed. Stresses beyond those listed may affect device reliability or cause
permanent damage to the device.
2. Caution: MVIN must not exceed GVDD by more than 0.3 V. This limit may be exceeded for a maximum of 20 ms during
power-on reset and power-down sequences.
3. Caution: OVIN must not exceed OVDD by more than 0.3 V. This limit may be exceeded for a maximum of 20 ms during
power-on reset and power-down sequences.
4. (M,O)VIN and MVREF may overshoot/undershoot to a voltage and for a maximum duration as shown in Figure 2.
5. Overshoot/undershoot by OV IN on the PCI interface does not comply to the PCI Electrical Specification for 3.3-V operation,
as shown in Figure 2.
6. L[1,2]_nVDD includes SDAVDD_0, XCOREVDD, and XPADVDD power inputs.
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
7
2.1.2
Power Supply Voltage Specification
This table provides recommended operating conditions for the device. Note that the values in this table are
the recommended and tested operating conditions. Proper device operation outside of these conditions is
not guaranteed.
Table 3. Recommended Operating Conditions
Symbol
Recommended
Value
Unit
Note
VDD
1.0 ± 50 mV
V
1
1.05 ± 50 mV
V
1
1.0 ± 50 mV
V
1, 2
1.05 ± 50 mV
V
1, 2
GVDD
2.5 V ± 125 mV
1.8 V ± 90 mV
V
1
LV DD[1,2]
3.3 V ± 165 mV
2.5 V ± 125 mV
V
—
PCI, local bus, DUART, system control and power management, I2C, and
JTAG I/O voltage
OVDD
3.3 V ± 165 mV
V
1
Local Bus
LBV DD
1.8 V ± 90 mV
2.5 V ± 125 mV
3.3 V ± 165 mV
V
—
L[1,2]_nVDD
1.0 ± 50 mV
V
1, 3
1.05 V ± 50 mV
V
1, 3
Characteristic
Core supply voltage
up to 667 MHz
800 MHz
PLL supply voltage (e300 core, eLBC and
system)
up to 667 MHz
800 MHz
DDR1 and DDR2 DRAM I/O voltage
Three-speed Ethernet I/O, MII management voltage
SerDes
AVDD
up to 667 MHz
800 MHz
Operating temperature range
commerical
Ta
Tj
Ta=0 (min)—
Tj=125 (max)
°C
—
extended temperature
Ta
Tj
Ta=–40 (min)—
Tj=125 (max)
°C
—
Notes:
1. GVDD, OVDD, AVDD, and V DD must track each other and must vary in the same direction—either in the positive or negative
direction.
2. AVDD is the input to the filter discussed in Section 24.1, “PLL Power Supply Filtering,” and is not necessarily the voltage at
the AVDD pin.
3. L[1,2]_nVDD, SDAVDD_0, XCOREVDD, and XPADV DD power inputs.
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
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Freescale Semiconductor
This figure shows the undershoot and overshoot voltages at the interfaces of the device.
G/L/O/LBVDD + 20%
G/L/O/LBVDD + 5%
G/L/O/LBVDD
VIH
GND
GND – 0.3 V
VIL
GND – 0.7 V
Not to Exceed 10%
of tinterface1
Note:
1. Note that tinterface refers to the clock period associated with the bus clock interface.
2. Note that with the PCI overshoot allowed (as specified above), the device does
not fully comply with the maximum AC ratings and device protection guideline outlined in
the PCI Rev. 2.3 Specification (Section 4.2.2.3).
Figure 2. Overshoot/Undershoot Voltage for GVDD/LVDD/OVDD/LBVDD
2.1.3
chipOutput Driver Characteristics
This table provides information on the characteristics of the output driver strengths. The values are
preliminary estimates.
Table 4. Output Drive Capability
Driver Type1
Output Impedance (Ω)
Supply Voltage
45
LBVDD = 2.5 V, 3.3 V
40
LBVDD = 1.8 V
PCI signals
25
OVDD = 3.3 V
DDR1 signal
18
GVDD = 2.5 V
DDR2 signal
18
GVDD = 1.8 V
45
LVDD = 2.5 V, 3.3 V
45
OVDD = 3.3 V
45
OVDD = 3.3 V
Local bus interface utilities signals
eTSEC 10/100/1000 signals
DUART, system control,
I2C,
GPIO signals
JTAG, SPI, and USB
Note:
1. Specialized SerDes output capabilities are described in the relevant sections of these specifications (such as SGMII and
PCI Express)
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
9
2.2
Power Sequencing
The device requires its power rails to be applied in a specific sequence in order to ensure proper device
operation. During the power ramp up, before the power supplies are stable and if the I/O voltages are
supplied before the core voltage, there may be a period of time that all input and output pins will actively
be driven and cause contention and excessive current. To avoid actively driving the I/O pins and to
eliminate excessive current draw, apply the core voltages (VDD and AVDD) before the I/O voltages and
assert PORESET before the power supplies fully ramp up. VDD and AVDD must reach 90% of their
nominal value before GVDD, LVDD, and OVDD reach 10% of their value, see the following figure. I/O
voltage supplies—GVDD, LVDD, and OVDD—do not have any ordering requirements with respect to one
another.
I/O Voltage (GVDD, LVDD, and OVDD)
V
Core Voltage (VDD, AVDD)
0.7 V
90%
t
0
Figure 3. Power-Up Sequencing Example
Note that the SerDes power supply (L[1,2]_nVDD) should follow the same timing as the core supply
(VDD).
The device does not require the core supply voltage and I/O supply voltages to be powered down in any
particular order.
3
Power Characteristics
The estimated typical power dissipation for the chip device is shown in this table.
Table 5. Power Dissipation 1
Core Frequency CSB/DDR Frequency
Sleep Power
Typical Application Typical Application Max Application
(MHz)
(MHz)
at Tj = 65°C (W) 2 at Tj = 65°C (W) 2
at Tj = 125°C (W) 3 at Tj = 125°C (W) 4
333
1.45
1.9
3.2
3.8
167
1.45
1.8
3.0
3.6
400
1.45
2.0
3.3
4.0
266
1.45
1.9
3.1
3.8
333
400
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
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Freescale Semiconductor
Table 5. Power Dissipation 1 (continued)
Core Frequency CSB/DDR Frequency
Sleep Power
Typical Application Typical Application Max Application
(MHz)
(MHz)
at Tj = 65°C (W) 2 at Tj = 65°C (W) 2
at Tj = 125°C (W) 3 at Tj = 125°C (W) 4
300
1.45
2.0
3.2
3.8
225
1.45
1.9
3.1
3.7
333
1.45
2.0
3.3
3.9
250
1.45
1.9
3.2
3.8
355
1.45
2.0
3.3
4.0
266
1.45
2.0
3.2
3.9
400
1.45
2.1
3.4
4.1
300
1.45
2.0
3.3
4.0
333
1.45
2.1
3.3
4.1
266
1.45
2.0
3.3
3.9
400
1.45
2.5
3.8
4.3
450
500
533
600
667
800
Notes:
1. The values do not include I/O supply power (OVDD, LVDD, GVDD) or AVDD. For I/O power values, see Table 6.
2. Typical power is based on a voltage of V DD = 1.0 V for core frequencies ≤ 667 MHz or V DD = 1.05 V for core frequencies of
800 MHz, and running a Dhrystone benchmark application.
3. Typical power is based on a voltage of V DD = 1.0 V for core frequencies ≤ 667 MHz or V DD = 1.05 V for core frequencies of
800 MHz, and running a Dhrystone benchmark application.
4. Maximum power is based on a voltage of VDD = 1.0 V for core frequencies ≤ 667 MHz or VDD = 1.05 V for core frequencies
of 800 MHz, worst case process, and running an artificial smoke test.
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
11
This table shows the estimated typical I/O power dissipation for the device.
Table 6. Typical I/O Power Dissipation
Interface
DDR I/O
65%
utilization
2 pair of
clocks
PCI I/O
Load =
30 pf
Local Bus
I/O
Load =
25 pf
OVDD LVDD LVDD L[1,2]_nVDD
(3.3 V) (3.3 V) (2.5 V)
(1.0 V)
GVDD
(1.8 V)
GVDD/LBVDD
(2.5 V)
200 MHz data
rate, 32-bit
0.28
0.35
—
—
—
200 MHz data
rate, 64-bit
0.41
0.49
—
—
266 MHz data
rate, 32-bit
0.31
0.4
—
266 MHz data
rate, 64-bit
0.46
0.56
300 MHz data
rate, 32-bit
0.33
300 MHz data
rate, 64-bit
Unit
Comments
—
W
—
—
—
W
—
—
—
W
—
—
—
—
W
0.43
—
—
—
—
W
0.48
0.6
—
—
—
—
W
333 MHz data
rate, 32-bit
0.35
0.45
—
—
—
—
W
333 MHz data
rate, 64-bit
0.51
0.64
—
—
—
—
W
400 MHz
data rate,
32-bit
0.38
—
—
—
—
—
W
400 MHz
data rate,
64-bit
0.56
—
—
—
—
—
W
33 MHz,
32-bit
—
—
0.04
—
—
—
W
66 MHz,
32-bit
—
—
0.07
—
—
—
W
167 MHz,
32-bit
0.09
0.17
0.29
—
—
—
W
133 MHz,
32-bit
0.07
0.14
0.24
—
—
—
W
83 MHz,
32-bit
0.05
0.09
0.15
—
—
—
W
66 MHz,
32-bit
0.04
0.07
0.13
—
—
—
W
50 MHz,
32-bit
0.03
0.06
0.1
—
—
—
W
Parameter
—
—
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
12
Freescale Semiconductor
Table 6. Typical I/O Power Dissipation (continued)
Interface
Parameter
MII or RMII
eTSEC I/O
SGMII
Load =
25 pf
RGMII or
RTBI
OVDD LVDD LVDD L[1,2]_nVDD
(3.3 V) (3.3 V) (2.5 V)
(1.0 V)
GVDD
(1.8 V)
GVDD/LBVDD
(2.5 V)
—
—
—
0.02
—
—
W
—
—
—
—
—
0.029
W
—
—
—
—
—
0.05
—
W
—
—
Unit
Comments
Multiply by
number of
interfaces used.
USB
(60MHz
Clock)
12 Mbps
—
—
0.01
—
—
—
W
480 Mbps
—
—
0.2
—
—
—
W
SerDes
per lane
—
—
—
—
0.029
W
—
—
—
—
—
—
—
W
—
Other I/O
0.01
Note: The values given are for typical, and not worst case, switching.
4
Clock Input Timing
This section provides the clock input DC and AC electrical characteristics for the chip. Note that the
PCI_CLK/PCI_SYNC_IN signal or CLKIN signal is used as the PCI input clock depending on whether
the device is configured as a host or agent device. CLKIN is used when the device is in host mode.
4.1
DC Electrical Characteristics
This table provides the clock input (CLKIN/PCI_CLK) DC timing specifications for the device.
Table 7. CLKIN DC Electrical Characteristics
Parameter
Condition
Symbol
Min
Max
Unit
Note
Input high voltage
—
VIH
2.7
OVDD + 0.3
V
1
Input low voltage
—
VIL
–0.3
0.4
V
1
0 V ≤ VIN ≤ OVDD
IIN
—
± 10
μA
—
0 V ≤ VIN ≤ 0.5 V or
OVDD – 0.5 V ≤ VIN ≤ OV DD
IIN
—
± 30
μA
—
CLKIN Input current
PCI_CLK Input current
Note:
1. In PCI agent mode, this specification does not comply with PCI 2.3 Specification.
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
13
4.2
AC Electrical Characteristics
The primary clock source for the device can be one of two inputs, CLKIN or PCI_CLK, depending on
whether the device is configured in PCI host or PCI agent mode. This table provides the clock input
(CLKIN/PCI_CLK) AC timing specifications for the device.
Table 8. CLKIN AC Timing Specifications
Parameter
Symbol
Min
Typical
Max
Unit
Note
CLKIN/PCI_CLK frequency
fCLKIN
25
—
66.666
MHz
1, 6
CLKIN/PCI_CLK cycle time
tCLKIN
15
—
40
ns
—
CLKIN/PCI_CLK rise and fall time
tKH, tKL
0.6
1.0
2.3
ns
2
tKHK/tCLKIN
40
—
60
%
3
—
—
—
± 150
ps
4, 5
CLKIN/PCI_CLK duty cycle
CLKIN/PCI_CLK jitter
Notes:
1. Caution: The system, core and security block must not exceed their respective maximum or minimum operating
frequencies.
2. Rise and fall times for CLKIN/PCI_CLK are measured at 0.4 V and 2.7 V.
3. Timing is guaranteed by design and characterization.
4. This represents the total input jitter-short term and long term-and is guaranteed by design.
5. The CLKIN/PCI_CLK driver’s closed loop jitter bandwidth should be < 500 kHz at –20 dB. The bandwidth must be set low
to allow cascade-connected PLL-based devices to track CLKIN drivers with the specified jitter.
6. Spread spectrum is allowed up to 1% down-spread on CLKIN/PCI_CLK up to 60 KHz.
4.3
eTSEC Gigabit Reference Clock Timing
This table provides the eTSEC gigabit reference clocks (EC_GTX_CLK125) AC timing specifications.
Table 9. EC_GTX_CLK125 AC Timing Specifications
At recommended operating conditions with LVDD = 2.5 ± 0.125 mV/ 3.3 V ± 165 mV
Parameter/Condition
Symbol
Min
Typical
Max
Unit
Note
EC_GTX_CLK125 frequency
tG125
—
125
—
MHz
—
EC_GTX_CLK125 cycle time
tG125
—
8
—
ns
—
EC_GTX_CLK rise and fall time
LV DD = 2.5 V
LV DD = 3.3 V
tG125R/tG125F
—
—
ns
1
EC_GTX_CLK125 duty cycle
1000Base-T for RGMII, RTBI
tG125H/tG125
%
2
ps
2
EC_GTX_CLK125 jitter
0.75
1.0
—
47
—
—
53
—
±150
Notes:
1. Rise and fall times for EC_GTX_CLK125 are measured from 0.5 and 2.0 V for LVDD = 2.5 V and from 0.6 and 2.7 V for
LVDD = 3.3 V.
2. EC_GTX_CLK125 is used to generate the GTX clock for the eTSEC transmitter with 2% degradation. The
EC_GTX_CLK125 duty cycle can be loosened from 47%/ 53% as long as the PHY device can tolerate the duty cycle
generated by the eTSEC GTX_CLK. See Section 8.3.4, “RGMII and RTBI AC Timing Specifications,” for the duty cycle for
10Base-T and 100Base-T reference clock.
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
14
Freescale Semiconductor
5
RESET Initialization
This section describes the DC and AC electrical specifications for the reset initialization timing and
electrical requirements of the chip.
5.1
RESET DC Electrical Characteristics
This table provides the DC electrical characteristics for the RESET pins of the device.
Table 10. RESET Pins DC Electrical Characteristics
Characteristic
Symbol
Condition
Min
Max
Unit
Input high voltage
VIH
—
2.0
OVDD + 0.3
V
Input low voltage
VIL
—
–0.3
0.8
V
Input current
IIN
—
—
± 30
μA
Output high voltage
VOH
IOH = –8.0 mA
2.4
—
V
Output low voltage
VOL
IOL = 8.0 mA
—
0.5
V
Output low voltage
VOL
IOL = 3.2 mA
—
0.4
V
Notes:
• This table applies for pins PORESET and HRESET. The PORESET is input pin, thus stated output voltages are not relevant.
• HRESET and SRESET are open drain pin, thus VOH is not relevant for these pins.
5.2
RESET AC Electrical Characteristics
This table provides the reset initialization AC timing specifications of the device.
Table 11. RESET Initialization Timing Specifications
Parameter/Condition
Min
Max
Unit
Note
Required assertion time of HRESET to activate reset flow
32
—
tPCI_SYNC_IN
1
Required assertion time of PORESET with stable clock applied to CLKIN when
the device is in PCI host mode
32
—
tCLKIN
2
Required assertion time of PORESET with stable clock applied to PCI_CLK when
the device is in PCI agent mode
32
—
tPCI_SYNC_IN
1
HRESET assertion (output)
512
—
tPCI_SYNC_IN
1
HRESET negation to negation (output)
16
—
tPCI_SYNC_IN
1
Input setup time for POR config signals (CFG_RESET_SOURCE[0:3],
CFG_CLKIN_DIV, and CFG_LBMUX) with respect to negation of PORESET
when the device is in PCI host mode
4
—
tCLKIN
2
Input setup time for POR config signals (CFG_RESET_SOURCE[0:3],
CFG_CLKIN_DIV, and CFG_LBMUX) with respect to negation of PORESET
when the device is in PCI agent mode
4
—
tPCI_SYNC_IN
1
Input hold time for POR config signals with respect to negation of HRESET
0
—
ns
—
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
15
Table 11. RESET Initialization Timing Specifications (continued)
Parameter/Condition
Min
Max
Unit
Note
Time for the device to turn off POR config signals with respect to the assertion of
HRESET
—
4
ns
3
Time for the device to start driving functional output signals multiplexed with the
POR configuration signals with respect to the negation of HRESET
1
—
tPCI_SYNC_IN
1, 3
Notes:
1. tPCI_SYNC_IN is the clock period of the input clock applied to PCI_SYNC_IN. When the device is In PCI host mode the primary
clock is applied to the CLKIN input, and PCI_SYNC_IN period depends on the value of CFG_CLKIN_DIV. See the
MPC8379E Integrated Host Processor Reference Manual for more details.
2. tCLKIN is the clock period of the input clock applied to CLKIN. It is only valid when the device is in PCI host mode. See the
MPC8379E Integrated Host Processor Reference Manual for more details.
3. POR config signals consists of CFG_RESET_SOURCE[0:3], CFG_LBMUX, and CFG_CLKIN_DIV.
Table 12 provides the PLL lock times.
Table 12. PLL Lock Times
Parameter
PLL lock times
Min
Max
Unit
Note
—
100
μs
—
Note:
• The device guarantees the PLL lock if the clock settings are within spec range. The core clock also depends on the core PLL
ratio. See Section 22, “Clocking,” for more information.
6
DDR1 and DDR2 SDRAM
This section describes the DC and AC electrical specifications for the DDR SDRAM interface of the chip.
Note that DDR1 SDRAM is GVDD(typ) = 2.5 V and DDR2 SDRAM is GVDD(typ) = 1.8 V.
6.1
DDR1 and DDR2 SDRAM DC Electrical Characteristics
This table provides the recommended operating conditions for the DDR2 SDRAM component(s) of the
device when GVDD(typ) = 1.8 V.
Table 13. DDR2 SDRAM DC Electrical Characteristics for GVDD(typ) = 1.8 V
Parameter
Symbol
Min
Max
Unit
Note
I/O supply voltage
GVDD
1.71
1.89
V
1
I/O reference voltage
MV REF
0.49 × GVDD
0.51 × GVDD
V
2, 5
I/O termination voltage
VTT
MVREF – 0.04
MV REF + 0.04
V
3
Input high voltage
VIH
MVREF + 0.140
GVDD + 0.3
V
—
Input low voltage
VIL
–0.3
MVREF – 0.140
V
—
Output leakage current
IOZ
–50
50
μA
4
Output high current (VOUT = 1.40 V)
IOH
–13.4
—
mA
—
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
16
Freescale Semiconductor
Table 13. DDR2 SDRAM DC Electrical Characteristics for GVDD(typ) = 1.8 V (continued)
Parameter
Output low current (VOUT = 0.3 V)
Symbol
Min
Max
Unit
Note
IOL
13.4
—
mA
—
Notes:
1. GV DD is expected to be within 50 mV of the DRAM GVDD at all times.
2. MV REF is expected to be equal to 0.5 × GVDD, and to track GVDD DC variations as measured at the receiver. Peak-to-peak
noise on MV REF may not exceed ±2% of the DC value.
3. VTT is not applied directly to the device. It is the supply to which far end signal termination is made and is expected to be
equal to MVREF. This rail should track variations in the DC level of MVREF.
4. Output leakage is measured with all outputs disabled, 0 V ≤ VOUT ≤ GVDD.
5. See AN3665, “MPC837xE Design Checklist,” for proper DDR termination.
Table 14 provides the DDR2 capacitance when GVDD(typ) = 1.8 V.
Table 14. DDR2 SDRAM Capacitance for GVDD(typ) = 1.8 V
Parameter
Symbol
Min
Max
Unit
Note
Input/output capacitance: DQ, DQS, DQS
CIO
6
8
pF
1
Delta input/output capacitance: DQ, DQS, DQS
CDIO
—
0.5
pF
1
Note:
1. This parameter is sampled. GVDD = 1.8 V ± 0.090 V, f = 1 MHz, TA = 25°C, VOUT = GVDD/2, VOUT (peak-to-peak) = 0.2 V.
This table provides the recommended operating conditions for the DDR SDRAM component(s) when
GVDD(typ) = 2.5 V.
Table 15. DDR SDRAM DC Electrical Characteristics for GVDD (typ) = 2.5 V
Parameter
Symbol
Min
Max
Unit
Note
I/O supply voltage
GVDD
2.375
2.625
V
1
I/O reference voltage
MVREF
0.49 × GVDD
0.51 × GVDD
V
2, 5
I/O termination voltage
VTT
MVREF – 0.04
MVREF + 0.04
V
3
Input high voltage
VIH
MVREF + 0.18
GVDD + 0.3
V
—
Input low voltage
VIL
–0.3
MVREF – 0.18
V
—
Output leakage current
IOZ
–50
50
μA
4
Output high current (VOUT = 1.9 V)
IOH
–15.2
—
mA
—
Output low current (VOUT = 0.38 V)
IOL
15.2
—
mA
—
Notes:
1. GV DD is expected to be within 50 mV of the DRAM GVDD at all times.
2. MV REF is expected to be equal to 0.5 × GV DD, and to track GVDD DC variations as measured at the receiver. Peak-to-peak
noise on MV REF may not exceed ±2% of the DC value.
3. VTT is not applied directly to the device. It is the supply to which far end signal termination is made and is expected to be
equal to MVREF. This rail should track variations in the DC level of MVREF.
4. Output leakage is measured with all outputs disabled, 0 V ≤ VOUT ≤ GV DD.
5. See AN3665, “MPC837xE Design Checklist,” for proper DDR termination.
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
17
Table 16 provides the DDR capacitance when GVDD(typ) = 2.5 V.
Table 16. DDR SDRAM Capacitance for GVDD (typ) = 2.5 V
Parameter
Symbol
Min
Max
Unit
Note
Input/output capacitance: DQ, DQS
CIO
6
8
pF
1
Delta input/output capacitance: DQ, DQS
CDIO
—
0.5
pF
1
Note:
1. This parameter is sampled. GVDD = 2.5 V ± 0.125 V, f = 1 MHz, TA = 25°C, VOUT = GVDD/2, VOUT (peak-to-peak) = 0.2 V.
This table provides the current draw characteristics for MVREF.
Table 17. Current Draw Characteristics for MVREF
Parameter
Symbol
Min
Typ
Max
—
—
250
150
600
400
IMVREF
Current draw for MVREF
DDR1
DDR2
Unit
Note
μA
1, 2
Note:
1. The voltage regulator for MV REF must be able to supply up to the stated maximum current.
2. This current is divided equally between MVREF1 and MVREF2, where half the current flows through each pin.
6.2
DDR1 and DDR2 SDRAM AC Electrical Characteristics
This section provides the AC electrical characteristics for the DDR SDRAM interface.
6.2.1
DDR1 and DDR2 SDRAM Input AC Timing Specifications
This table provides the input AC timing specifications for the DDR2 SDRAM when GVDD(typ) = 1.8 V.
Table 18. DDR2 SDRAM Input AC Timing Specifications for 1.8-V Interface
Parameter
Symbol
Min
Max
Unit
AC input low voltage
VIL
—
MVREF – 0.25
V
AC input high voltage
VIH
MVREF + 0.25
—
V
This table provides the input AC timing specifications for the DDR1 SDRAM when GVDD(typ) = 2.5 V.
Table 19. DDR1 SDRAM Input AC Timing Specifications for 2.5-V Interface
Parameter
Symbol
Min
Max
Unit
AC input low voltage
VIL
—
MVREF – 0.31
V
AC input high voltage
VIH
MVREF + 0.31
—
V
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
18
Freescale Semiconductor
This table provides the input AC timing specifications for the DDR1 and DDR2 SDRAM interface.
Table 20. DDR1 and DDR2 SDRAM Input AC Timing Specifications
Parameter
Symbol
Controller skew for MDQS-MDQ/MECC/MDM
400 MHz data rate
333 MHz data rate
266 MHz data rate
tCISKEW
Min
Max
–500
–750
–750
500
750
750
Unit
Note
ps
1, 2
3
—
—
Note:
1. tCISKEW represents the total amount of skew consumed by the controller between MDQSn and any corresponding bit that
will be captured with MDQSn. This should be subtracted from the total timing budget.
2. The amount of skew that can be tolerated from MDQS to a corresponding MDQ signal is called tDISKEW. This can be
determined by the following equation: tDISKEW = ±[T/4 – |tCISKEW|] where T is the MCK clock period and |tCISKEW| is the
absolute value of tCISKEW.
3. This specification applies only to DDR2 interface.
6.2.2
DDR1 and DDR2 SDRAM Output AC Timing Specifications
This table shows the DDR1 and DDR2 SDRAM output AC timing specifications.
Table 21. DDR1 and DDR2 SDRAM Output AC Timing Specifications
Parameter
MCKn cycle time, MCKn/MCKn crossing
Symbol1
Min
Max
Unit
Note
tMCK
5
10
ns
2
ns
3, 7
1.95
2.40
3.15
4.20
—
—
—
—
ns
3, 7
1.95
2.40
3.15
4.20
—
—
—
—
ns
3
1.95
2.40
3.15
4.20
—
—
—
—
ns
3
1.95
2.40
3.15
4.20
—
—
—
—
–0.6
0.6
ns
4, 8
ADDR/CMD output setup with respect to MCK
400 MHz data rate
333 MHz data rate
266 MHz data rate
200 MHz data rate
tDDKHAS
ADDR/CMD output hold with respect to MCK
400 MHz data rate
333 MHz data rate
266 MHz data rate
200 MHz data rate
tDDKHAX
MCSn output setup with respect to MCK
400 MHz data rate
333 MHz data rate
266 MHz data rate
200 MHz data rate
tDDKHCS
MCSn output hold with respect to MCK
400 MHz data rate
333 MHz data rate
266 MHz data rate
200 MHz data rate
tDDKHCX
MCK to MDQS skew
tDDKHMH
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
19
Table 21. DDR1 and DDR2 SDRAM Output AC Timing Specifications (continued)
Parameter
Symbol1
MDQ//MDM output setup with respect to MDQS
400 MHz data rate
333 MHz data rate
266 MHz data rate
200 MHz data rate
tDDKHDS,
tDDKLDS
MDQ//MDM output hold with respect to MDQS
400 MHz data rate
333 MHz data rate
266 MHz data rate
200 MHz data rate
tDDKHDX,
tDDKLDX
MDQS preamble start
MDQS epilogue end
Min
Max
Unit
Note
550
800
1100
1200
—
—
—
—
ps
5, 8
700
800
1100
1200
—
—
—
—
ps
5, 8
tDDKHMP
–0.5 × tMCK –0.6
–0.5 × tMCK + 0.6
ns
6, 8
tDDKHME
–0.6
0.6
ns
6, 8
Notes:
1. The symbols used for timing specifications follow the pattern of t(first two letters of functional block)(signal)(state) (reference)(state) for
inputs and t(first two letters of functional block)(reference)(state)(signal)(state) for outputs. Output hold time can be read as DDR timing
(DD) from the rising or falling edge of the reference clock (KH or KL) until the output went invalid (AX or DX). For example,
tDDKHAS symbolizes DDR timing (DD) for the time tMCK memory clock reference (K) goes from the high (H) state until
outputs (A) are setup (S) or output valid time. Also, tDDKLDX symbolizes DDR timing (DD) for the time tMCK memory clock
reference (K) goes low (L) until data outputs (D) are invalid (X) or data output hold time.
2. All MCK/MCK referenced measurements are made from the crossing of the two signals ±0.1 V.
3. ADDR/CMD includes all DDR SDRAM output signals except MCK/MCK, MCS, and MDQ//MDM/MDQS.
4. Note that tDDKHMH follows the symbol conventions described in Note 1. For example, tDDKHMH describes the DDR timing
(DD) from the rising edge of the MCK[n] clock (KH) until the MDQS signal is valid (MH). tDDKHMH can be modified through
control of the DQSS override bits in the TIMING_CFG_2 register. This will typically be set to the same delay as the clock
adjust in the CLK_CNTL register. The timing parameters listed in the table assume that these 2 parameters have been set
to the same adjustment value. See the MPC8379E PowerQUICC II Pro Host Processor Reference Manual for a description
and understanding of the timing modifications enabled by use of these bits.
5. Determined by maximum possible skew between a data strobe (MDQS) and any corresponding bit of data MDQ, ECC, or
data mask (MDM). The data strobe should be centered inside of the data eye at the pins of the microprocessor.
6. All outputs are referenced to the rising edge of MCKn at the pins of the microprocessor. Note that tDDKHMP follows the
symbol conventions described in Note 1.
7. Clock Control register is set to adjust the memory clocks by 1/2 the applied cycle.
8. See AN3665, “MPC837xE Design Checklist,” for proper DDR termination.
The minimum frequency for DDR2 is 250 MHz data rate (125 MHz clock), 167 MHz data rate (83 MHz
clock) for DDR1. This figure shows the DDR1 and DDR2 SDRAM output timing for the MCK to MDQS
skew measurement (tDDKHMH).
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
20
Freescale Semiconductor
MCK[n]
MCK[n]
tMCK
tDDKHMHmax) = 0.6 ns
MDQS
tDDKHMH(min) = –0.6 ns
MDQS
Figure 4. DDR Timing Diagram for tDDKHMH
This figure shows the DDR1 and DDR2 SDRAM output timing diagram.
MCK[n]
MCK[n]
tMCK
tDDKHAS ,tDDKHCS
tDDKHAX ,tDDKHCX
ADDR/CMD
Write A0
NOOP
tDDKHMP
tDDKHMH
MDQS[n]
tDDKHDS
tDDKLDS
MDQ[x]
D0
tDDKHME
D1
tDDKLDX
tDDKHDX
Figure 5. DDR1 and DDR2 SDRAM Output Timing Diagram
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
21
This figure provides AC test load for the DDR bus.
Z0 = 50 Ω
Output
GVDD/2
RL = 50 Ω
Figure 6. DDR AC Test Load
7
DUART
This section describes the DC and AC electrical specifications for the DUART interface of the chip.
7.1
DUART DC Electrical Characteristics
This table provides the DC electrical characteristics for the DUART interface of the device.
Table 22. DUART DC Electrical Characteristics
Parameter
Symbol
Min
Max
Unit
High-level input voltage
VIH
2
OVDD + 0.3
V
Low-level input voltage OVDD
VIL
–0.3
0.8
V
High-level output voltage,
IOH = –100 μA
VOH
OVDD – 0.2
—
V
Low-level output voltage,
IOL = 100 μA
VOL
—
0.2
V
IIN
—
±30
μA
Input current,
(0 V ≤VIN ≤ OVDD)
Note: The symbol VIN, in this case, represents the OVIN symbol referenced in Table 2.
7.2
DUART AC Electrical Specifications
this table provides the AC timing parameters for the DUART interface of the device.
Table 23. DUART AC Timing Specifications
Parameter
Value
Unit
Note
Minimum baud rate
256
baud
—
Maximum baud rate
> 1,000,000
baud
1
16
—
2
Oversample rate
Notes:
1. Actual attainable baud rate will be limited by the latency of interrupt processing.
2. The middle of a start bit is detected as the 8th sampled 0 after the 1-to-0 transition of the start bit. Subsequent bit values are
sampled each 16th sample.
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
22
Freescale Semiconductor
8
Ethernet: Enhanced Three-Speed Ethernet (eTSEC)
This section provides the AC and DC electrical characteristics for the enhanced three-speed Ethernet
controller.
8.1
SGMII Interface Electrical Characteristics
Each SGMII port features a 4-wire AC-coupled serial link from the dedicated SerDes1 interface of the
MPC8378E as shown in Figure 7, where CTX is the external (on board) AC-coupled capacitor. Each output
pin of the SerDes transmitter differential pair features 50-Ω output impedance. Each input of the SerDes
receiver differential pair features 50-Ω on-die termination to SGND_SRDSn (xcorevss). The reference
circuit of the SerDes transmitter and receiver is shown in Figure 65.
When an eTSEC port is configured to operate in SGMII mode, the parallel interface’s output signals of
this eTSEC port can be left floating. Also, when operating in SGMII mode, the eTSEC EC_GTX_CLK125
clock is not required for this port. Instead, the SerDes reference clock is required on L1_SD_REF_CLK
and L1_SD_REF_CLK pins.
50 Ω SD_TXn
CTX
SD_RXm
50 Ω
Transmitter
Receiver
50 Ω
SD_TX n
SGMII SerDes
Interface
Receiver
SD_RXn
CTX
SD_RXm
CTX
SD_TXm
50 Ω
50 Ω
50 Ω
Transmitter
50 Ω
50 Ω
SD_RXn
CTX
SD_TXm
Figure 7. 4-Wire AC-Coupled SGMII Serial Link Connection Example
8.2
Enhanced Three-Speed Ethernet Controller (eTSEC)
(10/100/1000 Mbps)—SGMII/MII/RGMII/RTBI/RMII DC Electrical
Characteristics
The electrical characteristics specified here apply to serial gigabit media independent interface (SGMII),
media independent interface (MII), reduced gigabit media independent interface (RGMII), reduced ten-bit
interface (RTBI), reduced media independent interface (RMII) signals, management data input/output
(MDIO) and management data clock (MDC).
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
23
The MII and RMII interfaces are defined for 3.3 V, while the RGMII and RTBI interfaces can be operated
at 2.5 V. The SGMII interface conforms to the Serial-GMII Specification Version 1.8 with some
exceptions. The RGMII and RTBI interfaces follow the Reduced Gigabit Media-Independent Interface
(RGMII) Specification Version 1.3. The RMII interface follows the RMII Consortium RMII Specification
Version 1.2.
8.2.1
MII, RMII, RGMII, and RTBI DC Electrical Characteristics
MII and RMII drivers and receivers comply with the DC parametric attributes specified in Table 24 and
Table 25. The RGMII and RTBI signals in Table 25 are based on a 2.5 V CMOS interface voltage as
defined by JEDEC EIA/JESD8-5.
Table 24. MII and RMII DC Electrical Characteristics
Parameter
Symbol
Min
Max
Unit
Note
LV DD1
LV DD2
3.13
3.47
V
1
Output high voltage
(LVDD1/LVDD2 = Min, IOH = –4.0 mA)
VOH
2.40
LVDD1/LVDD2 + 0.3
V
—
Output low voltage
(LVDD1/LVDD2 = Min, IOL = 4.0 mA)
VOL
GND
0.50
V
—
Input high voltage
VIH
2.0
LVDD1/LVDD2 + 0.3
V
—
Input low voltage
VIL
–0.3
0.90
V
—
Input high current
(VIN = LVDD1, V IN = LVDD2)
IIH
—
30
μA
1
Input low current
(VIN = GND)
IIL
–600
—
μA
—
Supply voltage 3.3 V
Notes:
1. LVDD1 supports eTSEC 1. LVDD2 supports eTSEC 2.
Table 25. RGMII and RTBI DC Electrical Characteristics
Parameter
Symbol
Min
Max
Unit
Note
LVDD1
LVDD2
2.37
2.63
V
1
Output high voltage
(LVDD1/LVDD2 = Min, IOH = –1.0 mA)
VOH
2.00
LVDD1/LVDD2 + 0.3
V
—
Output low voltage
(LVDD1/LVDD2 = Min, IOL = 1.0 mA)
VOL
GND – 0.3
0.40
V
—
Input high voltage
VIH
1.7
LVDD1/LVDD2 + 0.3
V
—
Input low voltage
VIL
–0.3
0.70
V
—
Supply voltage 2.5 V
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
24
Freescale Semiconductor
Table 25. RGMII and RTBI DC Electrical Characteristics (continued)
Parameter
Symbol
Min
Max
Unit
Note
Input high current
(VIN = LVDD1, VIN = LVDD2)
IIH
—
–20
μA
1
Input low current
(VIN = GND)
IIL
–20
—
μA
—
Notes:
1. LVDD1 supports eTSEC 1. LVDD2 supports eTSEC 2.
8.2.2
SGMII DC Electrical Characteristics
Table 26 and Table 27 describe the SGMII DC electrical characteristics. Transmitter DC characteristics are
measured at the transmitter outputs (L1_SD1_TXn and L1_SD1_TXn) as depicted in Figure 8.
NOTE
The voltage levels of the transmitter and the receiver depend on the SerDes
control registers which should be programmed at the recommended values
for SGMII protocol (L1_nVDD = 1.0 V).
Table 26. SGMII DC Transmitter Electrical Characteristics
Parameter
Symbol
Min
Typ
Max
Unit
Note
XVDD_SRDS
0.95
1.0
1.05
V
—
Output high voltage
VOH
—
—
XVDD_SRDS-Typ/2
+ |VOD|-max/2
mV
1
Output low voltage
VOL
XVDD_SRDS-Typ/2
– |VOD|-max/2
—
—
mV
1
VRING
—
—
10
%
—
Supply voltage
(L1_SDAVDD_0,
L1_XCOREVDD)
Output ringing
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
25
Table 26. SGMII DC Transmitter Electrical Characteristics (continued)
Parameter
Output differential voltage 2, 3, 7
Symbol
Min
Typ
Max
Unit
Note
|VOD|
323
500
725
mV
Equalization
setting: 1.0×
296
459
665
Equalization
setting: 1.09×
269
417
604
Equalization
setting: 1.2×
243
376
545
Equalization
setting: 1.33×
215
333
483
Equalization
setting: 1.5×
189
292
424
Equalization
setting: 1.71×
162
250
362
Equalization
setting: 2.0×
Output offset voltage
VOS
425
500
575
mV
1, 6
Output impedance
(single-ended)
RO
40
—
60
Ω
—
Mismatch in a pair
Δ RO
—
—
10
%
—
Change in VOD between “0” and
“1”
Δ |VOD|
—
—
25
mV
—
Change in VOS between “0” and
“1”
Δ VOS
—
—
25
mV
—
Output current on short to GND
ISA, ISB
—
—
40
mA
—
Notes:
1. This will not align to DC-coupled SGMII. XVDD_SRDS-Typ = 1.0 V.
2. |VOD| = |VSD_TXn - VSD_TXn|. |VOD| is also referred as output differential peak voltage. V TX-DIFFp-p = 2 × |VOD|.
3. The |VOD| value shown in the table assumes the following transmit equalization setting in SRDSnCR0[DDPA] and
SRDSnCR0[TXEQA] for lane A, and SRDSnCR0[DDPE] and SRDSnCR0[TXEQE] for lane E.
4. DPPA or DPPE bit is set to zero (selecting the full V DD-DIFF-p-p amplitude – power up default);
5. TXEQA or TXDQE is set based on the equalization setting shown in table.
6. VOS is also referred to as output common mode voltage.
7. The |VOD| value shown in the Typ column is based on the condition of XVDD_SRDS-Typ = 1.0 V, no common mode offset
variation (VOS = 500 mV), SerDes1 transmitter is terminated with 100-Ω differential load between SD_TXn and SD_TXn.
Table 27. SGMII DC Receiver Electrical Characteristics
Parameter
Supply voltage
(L1_SDAVDD_0, L1_XCOREVDD)
DC input voltage range
Symbol
Min
Typical
Max
Unit
Note
XVDD_SRDS
0.95
1.0
1.05
V
—
—
1
—
N/A
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
26
Freescale Semiconductor
Table 27. SGMII DC Receiver Electrical Characteristics (continued)
Parameter
Symbol
Min
VRX_DIFFp-p
Input differential voltage
SEICx = 01
SEICx = 00
Loss of signal threshold
Max
Unit
Note
—
1200
mV
2, 4
mV
3, 4
100
175
—
VLOS
SEICx = 01
SEICx = 00
Input AC common mode voltage
Typical
100
175
30
65
VCM_ACp-p
—
100
mV
5
Receiver differential input
impedance
ZRX_DIFF
80
100
120
Ω
—
Receiver common mode input
impedance
ZRX_CM
20
—
35
Ω
—
Common mode input voltage
VCM
—
Vxcorevss
—
V
6
Notes:
1. Input must be externally AC-coupled.
2. VRX_DIFFp-p is also referred to as peak to peak input differential voltage.
3. The concept of this parameter is equivalent to the Electrical Idle Detect Threshold parameter in PCI Express. Refer to PCI
Express Differential Receiver (RX) Input Specifications section for further explanation.
4. The SEICx shown in the table refers to SRDSnCR[SEICA] for lane A and SRDSnCR[SEICE] for lane E.
5. VCM_ACp-p is also referred to as peak to peak AC common mode voltage.
6. On-chip termination to SGND_SRDSn (xcorevss).
MPC8378E SGMII
SerDes Interface
50 Ω L1_SD_TX n
50 Ω
Transmitter
Vos
VOD
50 Ω
L1_SD_TXn
50 Ω
Figure 8. SGMII Transmitter DC Measurement Circuit
8.2.3
DC Requirements for SGMII SD_REF_CLK and SD_REF_CLK_B
See Section 20.2.2, “DC Level Requirement for SerDes Reference Clocks.”
8.3
SGMII, MII, RGMII, RMII, and RTBI AC Timing Specifications
The AC timing specifications for SGMII, MII, RGMII, RMII, and RTBI are presented in this section.
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
27
8.3.1
SGMII AC Timing Specifications
This section describes the SGMII transmit and receive AC timing specifications. Transmitter and receiver
characteristics are measured at the transmitter outputs (L1_SD_TXn and L1_SD_TXn) or at the receiver
inputs (L1_SD_RXn and L1_SD_RXn) as depicted in Figure 9 respectively.
D+ Package Pin
C = CTX
TX
Silicon
+ Package
C = CTX
R = 50Ω
D– Package Pin
R = 50Ω
Figure 9. SGMII AC Test/Measurement Load
8.3.1.1
SGMII Transmit AC Timing Specifications
This table provides the SGMII transmit AC timing targets. Source synchronous clocking is not supported.
Table 28. SGMII Transmit AC Timing Specifications
At recommended operating conditions with XVDD_SRDS = 1.0 V ± 5%.
Parameter
Symbol
Min
Typical
Max
Unit
Note
Deterministic Jitter
JD
—
—
0.17
UIp-p
—
Total Jitter
JT
—
—
0.35
UIp-p
—
Unit Interval
UI
799.92
800
800.08
ps
1
VOD fall time (80%–20%)
tfall
50
—
120
ps
—
VOD rise time (20%–80%)
trise
50
—
120
ps
—
Note:
1. Each UI is 800 ps ± 100 ppm.
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
28
Freescale Semiconductor
8.3.1.2
SGMII Receive AC Timing Specifications
This table provides the SGMII receive AC timing specifications. Source synchronous clocking is not
supported; the clock is recovered from the data.
Table 29. SGMII Receive AC Timing Specifications
At recommended operating conditions with XVDD_SRDS = 1.0 V ± 5%.
Parameter
Symbol
Min
Typical
Max
Unit
Note
Deterministic jitter tolerance
JD
0.37
—
—
UIp-p
1
Combined deterministic and random jitter tolerance
JDR
0.55
—
—
UIp-p
1
Sinusoidal jitter tolerance
JSIN
0.1
—
—
UIp-p
1
JT
0.65
—
—
UIp-p
1
Bit error ratio
BER
—
—
10 -12
—
—
Unit interval
UI
799.92
800
800.08
ps
2
CTX
5
—
200
nF
3
Total jitter tolerance
AC-coupling capacitor
Notes:
1. Measured at the receiver.
2. Each UI is 800 ps ± 100 ppm.
3. The external AC coupling capacitor is required. It’s recommended to be placed near the device transmitter outputs.
Receiver Differential Input Voltage
This figure shows the SGMII receiver input compliance mask eye diagram.
VRX_DIFFp-p-max/2
VRX_DIFFp-p-min/2
0
–VRX_DIFFp-p-min/2
–V RX_DIFFp-p-max/2
0
0.275
0.4
0.6
0.725
1
Time (UI)
Figure 10. SGMII Receiver Input Compliance Mask
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
29
8.3.2
AC Requirements for SGMII L1_SD_REF_CLK and L1_SD_REF_CLK
This table lists the AC timing specifications. Note that L1_SD_REF_CLK and L1_SD_REF_CLK are not
intended to be used with, and should not be clocked by, a spread spectrum clock source.
Table 30. L1_SD_REF_CLK and L1_SD_REF_CLK AC Requirements
Parameter/Condition
Symbol
Min
L1_SD_REF_CLK/_B reference clock cycle time
100 MHz
125 MHz
tCK_REF
—
L1_SD_REF_CLK/_B rise/fall time (80%-20%)
Typical
Max
Unit
Note
—
ns
1, 2
10
8
tCK_RISE/tCK_FALL
—
—
1
ns
—
L1_SD_REF_CLK/_B duty cycle (@50% L1_nVDD)
tck_dty
45%
—
55%
ps
—
L1_SD_REF_CLK/_B cycle to cycle clock jitter (period
jitter)
tCKCJ
—
—
100
ps
—
L1_SD_REF_CLK/_B phase jitter peak-to-peak.
Deviation in edge location with respect to mean edge
location.
tCKPJ
–50
—
50
ps
—
Notes:
1. Both options provide serial interface bit rate of 1.25 Gbps. 8 ns only applies when 125 MHz SerDes1 clock frequency is
selected during POR.
2. Tolerance of ±100 ppm.
8.3.3
MII AC Timing Specifications
This section describes the MII transmit and receive AC timing specifications.
8.3.3.1
MII Transmit AC Timing Specifications
This table provides the MII transmit AC timing specifications.
Table 31. MII Transmit AC Timing Specifications
At recommended operating conditions with LVDD of 3.3 V ± 5%.
Symbol1
Min
Typical
Max
Unit
TX_CLK clock period 10 Mbps
tMTX
—
400
—
ns
TX_CLK clock period 100 Mbps
tMTX
—
40
—
ns
tMTXH/tMTX
35
—
65
%
tMTKHDX
1
5
15
ns
Parameter
TX_CLK duty cycle
TX_CLK to MII data TXD[3:0], TX_ER, TX_EN delay
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
30
Freescale Semiconductor
Table 31. MII Transmit AC Timing Specifications (continued)
At recommended operating conditions with LVDD of 3.3 V ± 5%.
Symbol1
Min
Typical
Max
Unit
TX_CLK data clock rise (20%–80%)
tMTXR
1.0
—
4.0
ns
TX_CLK data clock fall (80%–20%)
tMTXF
1.0
—
4.0
ns
Parameter
Note:
1. The symbols used for timing specifications herein follow the pattern of t(first two letters of functional block)(signal)(state) (reference)(state)
for inputs and t(first two letters of functional block)(reference)(state)(signal)(state) for outputs. For example, tMTKHDX symbolizes MII
transmit timing (MT) for the time tMTX clock reference (K) going high (H) until data outputs (D) are invalid (X). Note that, in
general, the clock reference symbol representation is based on two to three letters representing the clock of a particular
functional. For example, the subscript of tMTX represents the MII(M) transmit (TX) clock. For rise and fall times, the latter
convention is used with the appropriate letter: R (rise) or F (fall).
This figure shows the MII transmit AC timing diagram.
tMTX
tMTXR
TX_CLK
tMTXF
tMTXH
TXD[3:0]
TX_EN
TX_ER
tMTKHDX
Figure 11. MII Transmit AC Timing Diagram
8.3.3.2
MII Receive AC Timing Specifications
This table provides the MII receive AC timing specifications.
Table 32. MII Receive AC Timing Specifications
At recommended operating conditions with LVDD of 3.3 V ± 5%.
Symbol1
Min
Typical
Max
Unit
Input low voltage
VIL
—
—
0.7
V
Input high voltage
VIH
1.9
—
—
V
RX_CLK clock period 10 Mbps
tMRX
—
400
—
ns
RX_CLK clock period 100 Mbps
tMRX
—
40
—
ns
tMRXH/tMRX
35
—
65
%
RXD[3:0], RX_DV, RX_ER setup time to RX_CLK
tMRDVKH
10.0
—
—
ns
RXD[3:0], RX_DV, RX_ER hold time to RX_CLK
tMRDXKH
10.0
—
—
ns
Parameter
RX_CLK duty cycle
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
31
Table 32. MII Receive AC Timing Specifications (continued)
At recommended operating conditions with LVDD of 3.3 V ± 5%.
Symbol1
Min
Typical
Max
Unit
RX_CLK clock rise time (20%–80%)
tMRXR
1.0
—
4.0
ns
RX_CLK clock fall time (80%–20%)
tMRXF
1.0
—
4.0
ns
Parameter
Note:
1. The symbols used for timing specifications herein follow the pattern of t(first two letters of functional block)(signal)(state)
(reference)(state) for inputs and t(first two letters of functional block)(reference)(state)(signal)(state) for outputs. For example, tMRDVKH
symbolizes MII receive timing (MR) with respect to the time data input signals (D) reach the valid state (V) relative to the
tMRX clock reference (K) going to the high (H) state or setup time. Also, tMRDXKL symbolizes MII receive timing (GR) with
respect to the time data input signals (D) went invalid (X) relative to the tMRX clock reference (K) going to the low (L) state
or hold time. Note that, in general, the clock reference symbol representation is based on three letters representing the clock
of a particular functional. For example, the subscript of tMRX represents the MII (M) receive (RX) clock. For rise and fall times,
the latter convention is used with the appropriate letter: R (rise) or F (fall).
This figure provides the AC test load for eTSEC.
Z0 = 50 Ω
Output
LVDD/2
RL = 50 Ω
Figure 12. eTSEC AC Test Load
This figure shows the MII receive AC timing diagram.
tMRX
tMRXR
RX_CLK
tMRXF
tMRXH
RXD[3:0]
RX_DV
RX_ER
Valid Data
tMRDVKH
tMRDXKL
Figure 13. MII Receive AC Timing Diagram
8.3.4
RGMII and RTBI AC Timing Specifications
This table presents the RGMII and RTBI AC timing specifications.
Table 33. RGMII and RTBI AC Timing Specifications
At recommended operating conditions with LVDD of 2.5 V ± 5%.
Symbol1
Min
Typical
Max
Unit
Note
Data to clock output skew (at transmitter)
tSKRGT
–600
0
600
ps
—
Data to clock input skew (at receiver)
tSKRGT
1.0
—
2.8
ns
2
tRGT
7.2
8.0
8.8
ns
3
Parameter
Clock period
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
32
Freescale Semiconductor
Table 33. RGMII and RTBI AC Timing Specifications (continued)
At recommended operating conditions with LVDD of 2.5 V ± 5%.
Symbol1
Min
Typical
Max
Unit
Note
Duty cycle for 1000Base-T
tRGTH/tRGT
45
50
55
%
4
Duty cycle for 10BASE-T and 100BASE-TX
tRGTH/tRGT
40
50
60
%
3, 4
Rise time (20%–80%)
tRGTR
—
—
0.75
ns
—
Fall time (20%–80%)
tRGTF
—
—
0.75
ns
—
tG12
—
8.0
—
ns
5
tG125H/tG125
47
—
53
%
—
Parameter
EC_GTX_CLK125 reference clock period
EC_GTX_CLK125 reference clock duty cycle
measured at 0.5 × LVDD1
Notes:
1. Note that, in general, the clock reference symbol representation for this section is based on the symbols RGT to represent
RGMII and RTBI timing. Note also that the notation for rise (R) and fall (F) times follows the clock symbol that is being
represented. For symbols representing skews, the subscript is skew (SK) followed by the clock that is being skewed (RGT).
2. This implies that PC board design will require clocks to be routed such that an additional trace delay of greater than 1.5 ns
will be added to the associated clock signal.
3. For 10 and 100 Mbps, tRGT scales to 400 ns ± 40 ns and 40 ns ± 4 ns, respectively.
4. Duty cycle may be stretched/shrunk during speed changes or while transitioning to a received packet's clock domains as
long as the minimum duty cycle is not violated and stretching occurs for no more than three tRGT of the lowest speed
transitioned between
5. This symbol represents the external EC_GTX_CLK125 and does not follow the original signal naming convention.
This figure provides the AC test load for eTSEC.
Output
Z0 = 50 Ω
LVDD/2
RL = 50 Ω
Figure 14. eTSEC AC Test Load
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
33
This figure shows the RGMII and RTBI AC timing and multiplexing diagrams.
tRGT
tRGTH
GTX_CLK
(At Transmitter)
tSKRGT_TX
TXD[8:5][3:0]
TXD[7:4][3:0]
TXD[8:5]
TXD[3:0] TXD[7:4]
TXD[4]
TXEN
TX_CTL
TXD[9]
TXERR
tSKRGT_RX
TX_CLK
(At PHY)
RXD[8:5][3:0]
RXD[7:4][3:0]
RXD[8:5]
RXD[3:0] RXD[7:4]
tSKRGT_TX
RXD[4]
RXDV
RX_CTL
RXD[9]
RXERR
tSKRGT_RX
RX_CLK
(At PHY)
Figure 15. RGMII and RTBI AC Timing and Multiplexing Diagrams
8.3.5
RMII AC Timing Specifications
This section describes the RMII transmit and receive AC timing specifications.
8.3.5.1
RMII Transmit AC Timing Specifications
This table shows the RMII transmit AC timing specifications.
Table 34. RMII Transmit AC Timing Specifications
At recommended operating conditions with LVDD of 3.3 V ± 5%.
Symbol1
Min
Typical
Max
Unit
REF_CLK clock period
tRMT
15.0
20.0
25.0
ns
REF_CLK duty cycle
tRMTH
35
50
65
%
REF_CLK peak-to-peak jitter
tRMTJ
—
—
250
ps
Rise time REF_CLK (20%–80%)
tRMTR
1.0
—
2.0
ns
Parameter
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
34
Freescale Semiconductor
Table 34. RMII Transmit AC Timing Specifications (continued)
At recommended operating conditions with LVDD of 3.3 V ± 5%.
Symbol1
Min
Typical
Max
Unit
Fall time REF_CLK (80%–20%)
tRMTF
1.0
—
2.0
ns
REF_CLK to RMII data TXD[1:0], TX_EN delay
tRMTDX
2.0
—
10.0
ns
Parameter
Note:
1. The symbols used for timing specifications herein follow the pattern of t(first two letters of functional block)(signal)(state) (reference)(state)
for inputs and t(first two letters of functional block)(reference)(state)(signal)(state) for outputs. For example, tMTKHDX symbolizes MII
transmit timing (MT) for the time tMTX clock reference (K) going high (H) until data outputs (D) are invalid (X). Note that, in
general, the clock reference symbol representation is based on two to three letters representing the clock of a particular
functional. For example, the subscript of tMTX represents the MII(M) transmit (TX) clock. For rise and fall times, the latter
convention is used with the appropriate letter: R (rise) or F (fall).
This figure shows the RMII transmit AC timing diagram.
tRMT
tRMTR
REF_CLK
tRMTH
tRMTF
TXD[1:0]
TX_EN
TX_ER
tRMTDX
Figure 16. RMII Transmit AC Timing Diagram
8.3.5.2
RMII Receive AC Timing Specifications
This table shows the RMII receive AC timing specifications.
Table 35. RMII Receive AC Timing Specifications
At recommended operating conditions with LVDD of 3.3 V ± 5%.
Symbol1
Min
Typical
Max
Unit
Input low voltage at 3.3 LVDD
VIL
—
—
0.8
V
Input high voltage at 3.3 LVDD
VIH
2.0
—
—
V
tRMR
15.0
20.0
25.0
ns
REF_CLK duty cycle
tRMRH
35
50
65
%
REF_CLK peak-to-peak jitter
tRMRJ
—
—
250
ps
Rise time REF_CLK (20%–80%)
tRMRR
1.0
—
2.0
ns
Fall time REF_CLK (80%–20%)
tRMRF
1.0
—
2.0
ns
Parameter/Condition
REF_CLK clock period
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
35
Table 35. RMII Receive AC Timing Specifications (continued)
At recommended operating conditions with LVDD of 3.3 V ± 5%.
Parameter/Condition
Symbol1
Min
Typical
Max
Unit
RXD[1:0], CRS_DV, RX_ER setup time to REF_CLK rising edge
tRMRDV
4.0
—
—
ns
RXD[1:0], CRS_DV, RX_ER hold time to REF_CLK rising edge
tRMRDX
2.0
—
—
ns
Note:
1. The symbols used for timing specifications herein follow the pattern of t(first two letters of functional block)(signal)(state)
(reference)(state) for inputs and t(first two letters of functional block)(reference)(state)(signal)(state) for outputs. For example, tMRDVKH
symbolizes MII receive timing (MR) with respect to the time data input signals (D) reach the valid state (V) relative to the
tMRX clock reference (K) going to the high (H) state or setup time. Also, tMRDXKL symbolizes MII receive timing (GR) with
respect to the time data input signals (D) went invalid (X) relative to the tMRX clock reference (K) going to the low (L) state
or hold time. Note that, in general, the clock reference symbol representation is based on three letters representing the clock
of a particular functional. For example, the subscript of tMRX represents the MII (M) receive (RX) clock. For rise and fall times,
the latter convention is used with the appropriate letter: R (rise) or F (fall).
This figure provides the AC test load for eTSEC.
Z0 = 50 Ω
Output
LVDD/2
RL = 50 Ω
Figure 17. eTSEC AC Test Load
This figure shows the RMII receive AC timing diagram.
tRMR
tRMRR
REF_CLK
tRMRF
tRMRH
RXD[1:0]
CRS_DV
RX_ER
Valid Data
tRMRDV
tRMRDX
Figure 18. RMII Receive AC Timing Diagram
8.4
Management Interface Electrical Characteristics
The electrical characteristics specified here apply to MII management interface signals MDIO
(management data input/output) and MDC (management data clock).
This figure provides the AC test load for eTSEC.
Output
Z0 = 50 Ω
LVDD/2
RL = 50 Ω
Figure 19. eTSEC AC Test Load
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
36
Freescale Semiconductor
8.4.1
MII Management DC Electrical Characteristics
The MDC and MDIO are defined to operate at a supply voltage of 2.5 V or 3.3 V. The DC electrical
characteristics for MDIO and MDC are provided in Table 36 and Table 37.
Table 36. MII Management DC Electrical Characteristics When Powered at 2.5 V
Parameter
Conditions
Symbol
Min
Max
Unit
Supply voltage (2.5 V)
—
LVDD1
2.37
2.63
V
Output high voltage
IOH = –1.0 mA
LVDD1 = Min
VOH
2.00
LVDD1 + 0.3
V
Output low voltage
IOL = 1.0 mA
LVDD1 = Min
VOL
GND – 0.3
0.40
V
Input high voltage
—
LVDD1 = Min
VIH
1.7
—
V
Input low voltage
—
LVDD1 = Min
VIL
–0.3
0.70
V
Input high current
VIN = LVDD1
IIH
—
20
μA
Input low current
VIN = LVDD1
IIL
–15
—
μA
Table 37. MII Management DC Electrical Characteristics When Powered at 3.3 V
Parameter
Conditions
Symbol
Min
Max
Unit
Supply voltage (3.3 V)
—
LVDD1
3.135
3.465
V
Output high voltage
IOH = –1.0 mA
LVDD1 = Min
VOH
2.10
LVDD1 + 0.3
V
Output low voltage
IOL = 1.0 mA
LVDD1 = Min
VOL
GND
0.50
V
Input high voltage
—
VIH
2.00
—
V
Input low voltage
—
VIL
—
0.80
V
Input high current
LVDD1 = Max
VIN 1 = 2.1 V
IIH
—
30
μA
Input low current
LVDD1 = Max
VIN = 0.5 V
IIL
–600
—
μA
8.4.2
MII Management AC Electrical Specifications
This table provides the MII management AC timing specifications.
Table 38. MII Management AC Timing Specifications
Symbol1
Min
Typical
Max
Unit
Note
MDC frequency
fMDC
—
2.5
—
MHz
2
MDC period
tMDC
80
—
400
ns
—
MDC clock pulse width high
tMDCH
32
—
—
ns
—
MDC to MDIO valid
tMDKHDV
2 × (tplb_clk × 8)
—
—
ns
4
MDC to MDIO delay
tMDKHDX
10
—
2 × (tplb_clk × 8)
ns
2, 4
MDIO to MDC setup time
tMDDVKH
5
—
—
ns
—
MDIO to MDC hold time
tMDDXKH
0
—
—
ns
—
Parameter
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
37
Table 38. MII Management AC Timing Specifications (continued)
Symbol1
Min
Typical
Max
Unit
Note
MDC rise time (20%–80%)
tMDCR
—
—
10
ns
3
MDC fall time (80%–20%)
tMDCF
—
—
10
ns
3
Parameter
Notes:
1. The symbols used for timing specifications herein follow the pattern of t(first two letters of functional block)(signal)(state)
(reference)(state) for inputs and t(first two letters of functional block)(reference)(state)(signal)(state) for outputs. For example, tMDKHDX
symbolizes management data timing (MD) for the time tMDC from clock reference (K) high (H) until data outputs (D) are
invalid (X) or data hold time. Also, tMDDVKH symbolizes management data timing (MD) with respect to the time data input
signals (D) reach the valid state (V) relative to the tMDC clock reference (K) going to the high (H) state or setup time. For
rise and fall times, the latter convention is used with the appropriate letter: R (rise) or F (fall).
2. This parameter is dependent on the system clock speed.
3. Guaranteed by design.
4. tplb_clk is the platform (CSB) clock divided according to the SCCR[TSEC1CM].
This figure shows the MII management AC timing diagram.
tMDCR
tMDC
MDC
tMDCH
tMDCF
MDIO
(Input)
tMDDVKH
tMDDXKH
MDIO
(Output)
tMDKHDX
Figure 20. MII Management Interface Timing Diagram
9
USB
This section provides the AC and DC electrical characteristics for the USB dual-role controllers.
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
38
Freescale Semiconductor
9.1
USB DC Electrical Characteristics
This table provides the DC electrical characteristics for the ULPI interface at recommended
OVDD = 3.3 V ± 165 mV.
Table 39. USB DC Electrical Characteristics
Parameter
Symbol
Min
Max
Unit
Note
High-level input voltage
VIH
2
OV DD + 0.3
V
1
Low-level input voltage
VIL
–0.3
0.8
V
1
Input current
IIN
—
±30
μA
2
High-level output voltage, IOH = –100 μA
VOH
OVDD – 0.2
—
V
—
Low-level output voltage, IOL = 100 μA
VOL
—
0.2
V
—
Notes:
1. The minimum VIL and maximum VIH values are based on the respective minimum and maximum OVIN values found in
Table 3.
2. The symbol OVIN represents the input voltage of the supply and is referenced in Table 3.
9.2
USB AC Electrical Specifications
This table describes the general timing parameters of the USB interface of the device.
Table 40. USB General Timing Parameters (ULPI Mode Only)
Symbol 1
Min
Max
Unit
Note
tUSCK
15
—
ns
2, 3, 4, 5
Input setup to USB clock—all inputs
tUSIVKH
4
—
ns
2, 3, 4, 5
Input hold to USB clock—all inputs
tUSIXKH
1
—
ns
2, 3, 4, 5
USB clock to output valid—all outputs
tUSKHOV
—
7
ns
2, 3, 4, 5
Output hold from USB clock—all outputs
tUSKHOX
2
—
ns
2, 3, 4, 5
Parameter
USB clock cycle time
Notes:
1. The symbols for timing specifications follow the pattern of t(First two letters of functional block)(signal)(state) (reference)(state) for inputs
and t(First two letters of functional block)(reference)(state)(signal)(state) for outputs. For example, tUSIXKH symbolizes USB timing (US)
for the input (I) to go invalid (X) with respect to the time the USB clock reference (K) goes high (H). Also, tUSKHOX symbolizes
USB timing (US) for the USB clock reference (K) to go high (H) with respect to the output (O) going invalid (X) or output hold
time.
2. All timings are in reference to the USB clock, USBDR_CLK.
3. All signals are measured from OVDD/2 of the rising edge of the USB clock to 0.4 × OV DD of the signal in question for 3.3-V
signaling levels.
4. Input timings are measured at the pin.
5. For active/float timing measurements, the high impedance or off state is defined to be when the total current delivered
through the component pin is less than or equal to that of the leakage current specification.
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
39
These two figures provide the AC test load and signals for the USB, respectively.
Z0 = 50 Ω
Output
OVDD/2
RL = 50 Ω
Figure 21. USB AC Test Load
USBDR_CLK
tUSIXKH
tUSIVKH
Input Signals
tUSKHOX
tUSKHOV
Output Signals
Figure 22. USB Interface Timing Diagram
10 Local Bus
This section describes the DC and AC electrical specifications for the local bus interface of the chip.
10.1
Local Bus DC Electrical Characteristics
This tables provide the DC electrical characteristics for the local bus interface.
Table 41. Local Bus DC Electrical Characteristics (LBVDD = 3.3 V)
At recommended operating conditions with LBVDD = 3.3 V.
Parameter
Conditions
Symbol
Min
Max
Unit
—
LBVDD
3.135
3.465
V
Supply voltage 3.3 V
Output high voltage
IOH = –4.0 mA
LBVDD = Min
VOH
2.40
—
V
Output low voltage
IOL = 4.0 mA
LBVDD = Min
VOL
—
0.50
V
Input high voltage
—
—
VIH
2.0
LBVDD + 0.3
V
Input low voltage
—
—
VIL
–0.3
0.90
V
IIH
—
30
μA
IIL
–30
—
μA
Input high current
Input low current
VIN
1=
LBVDD
VIN 1 = GND
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
40
Freescale Semiconductor
Table 42. Local Bus DC Electrical Characteristics (LBVDD = 2.5 V)
At recommended operating conditions with LBVDD = 2.5 V.
Parameter
Conditions
Symbol
Min
Max
Unit
—
LBVDD
2.37
2.73
V
Supply voltage 2.5 V
Output high voltage
IOH = –1.0 mA
LBVDD = Min
VOH
2.00
—
V
Output low voltage
IOL = 1.0 mA
LBVDD = Min
VOL
—
0.40
V
Input high voltage
—
LBVDD = Min
VIH
1.7
LBV DD + 0.3
V
Input low voltage
—
LBVDD = Min
VIL
–0.3
0.70
V
Input high current
VIN 1 = LBVDD
IIH
—
20
μA
Input low current
VIN 1 = GND
IIL
–20
—
μA
Table 43. Local Bus DC Electrical Characteristics (LBVDD = 1.8 V)
At recommended operating conditions with LBVDD = 1.8 V.
Parameter
Conditions
Symbol
Min
Max
Unit
—
LBVDD
1.71
1.89
V
Supply voltage 1.8 V
Output high voltage
IOH = –1.0 mA
LBV DD = Min
VOH
LBVDD – 0.45
—
V
Output low voltage
IOL = 1.0 mA
LBV DD = Min
VOL
—
0.45
V
Input high voltage
—
LBV DD = Min
VIH
0.65 × LBV DD
LBVDD + 0.3
V
Input low voltage
—
LBV DD = Min
VIL
–0.3
0.35 × LBVDD
V
Input high current
VIN 1 = LBVDD
IIH
—
10
μA
Input low current
VIN 1 = GND
IIL
–10
—
μA
10.2
Local Bus AC Electrical Specifications
This table describes the general timing parameters of the local bus interface of the device when in PLL
enable mode.
Table 44. Local Bus General Timing Parameters—PLL Enable Mode
Symbol1
Min
Max
Unit
Note
tLBK
7.5
15
ns
2
Input setup to local bus clock (except LUPWAIT/LGTA)
tLBIVKH
1.5
—
ns
3, 4
Input hold from local bus clock
tLBIXKH
1.0
—
ns
3, 4
LUPWAIT/LGTA input setup to local bus clock
tLBIVKH1
1.5
—
ns
3, 4
LALE output fall to LAD output transition (LATCH hold time)
tLBOTOT1
1.5
—
ns
5
LALE output fall to LAD output transition (LATCH hold time)
tLBOTOT2
3
—
ns
6
LALE output fall to LAD output transition (LATCH hold time)
tLBOTOT3
2.5
—
ns
7
Local bus clock to LALE rise
tLBKHLR
—
4.5
ns
—
Local bus clock to output valid (except LALE)
tLBKHOV
—
4.5
ns
3
Parameter
Local bus cycle time
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
41
Table 44. Local Bus General Timing Parameters—PLL Enable Mode (continued)
Symbol1
Min
Max
Unit
Note
Local bus clock to output high impedance for LAD/LDP
tLBKHOZ
—
3.8
ns
3, 8
Output hold from local bus clock for LAD/LDP
tLBKHOX
1
—
ns
3
Parameter
Notes:
1. The symbols used for timing specifications herein follow the pattern of t(First two letters of functional block)(signal)(state)
(reference)(state) for inputs and t(First two letters of functional block)(reference)(state)(signal)(state) for outputs. For example, tLBIXKH1
symbolizes local bus timing (LB) for the input (I) to go invalid (X) with respect to the time the tLBK clock reference (K) goes
high (H), in this case for clock one(1). Also, tLBKHOX symbolizes local bus timing (LB) for the tLBK clock reference (K) to go
high (H), with respect to the output (O) going invalid (X) or output hold time.
2. All timings are in reference to rising edge of LSYNC_IN at LBVDD/2 and the 0.4 × LBVDD of the signal in question.
3. All signals are measured from LBVDD/2 of the rising/falling edge of LSYNC_IN to 0.5 × LBVDD of the signal in question.
4. Input timings are measured at the pin.
5. tLBOTOT1 should be used when LBCR[AHD] is set and the load on LALE output pin is at least 10pF less than the load on
LAD output pins.
6. tLBOTOT2 should be used when LBCR[AHD] is not set and the load on LALE output pin is at least 10pF less than the load
on LAD output pins.
7. tLBOTOT3 should be used when LBCR[AHD] is not set and the load on LALE output pin equals to the load on LAD output pins.
8. For purposes of active/float timing measurements, the Hi-Z or off state is defined to be when the total current delivered
through the component pin is less than or equal to the leakage current specification.
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
42
Freescale Semiconductor
This table describes the general timing parameters of the local bus interface of the device when in PLL
bypass mode.
Table 45. Local Bus General Timing Parameters—PLL Bypass Mode
Symbol1
Min
Max
Unit
Note
tLBK
15
—
ns
2
Input setup to local bus clock
tLBIVKH
7.0
—
ns
3, 4
Input hold from local bus clock
tLBIXKH
1.0
—
ns
3, 4
LALE output fall to LAD output transition (LATCH hold time)
tLBOTOT1
1.5
—
ns
5
LALE output fall to LAD output transition (LATCH hold time)
tLBOTOT2
3.0
—
ns
6
LALE output fall to LAD output transition (LATCH hold time)
tLBOTOT3
2.5
—
ns
7
Local bus clock to LALE rise
tLBKHLR
—
4.5
ns
—
Local bus clock to output valid
tLBKHOV
—
3.0
ns
3
Local bus clock to output high impedance for LAD/LDP
tLBKHOZ
—
4.0
ns
3, 8
Parameter
Local bus cycle time
Notes:
1. The symbols used for timing specifications herein follow the pattern of t(First two letters of functional block)(signal)(state)
(reference)(state) for inputs and t(First two letters of functional block)(reference)(state)(signal)(state) for outputs. For example, tLBIXKH1
symbolizes local bus timing (LB) for the input (I) to go invalid (X) with respect to the time the tLBK clock reference (K) goes
high (H), in this case for clock one(1). Also, tLBKHOX symbolizes local bus timing (LB) for the tLBK clock reference (K) to go
high (H), with respect to the output (O) going invalid (X) or output hold time.
2. All timings are in reference to falling edge of LCLK0 (for all outputs and for LGTA and LUPWAIT inputs) or rising edge of
LCLK0 (for all other inputs).
3. All signals are measured from LBVDD/2 of the rising/falling edge of LCLK0 to 0.4 × LBVDD of the signal in question for 3.3-V
signaling levels.
4. Input timings are measured at the pin.
5. tLBOTOT1 should be used when LBCR[AHD] is set and the load on LALE output pin is at least 10pF less than the load on
LAD output pins.
6. tLBOTOT2 should be used when LBCR[AHD] is not set and the load on LALE output pin is at least 10pF less than the load
on LAD output pins.
7. tLBOTOT3 should be used when LBCR[AHD] is not set and the load on LALE output pin equals to the load on LAD output pins.
8. For purposes of active/float timing measurements, the Hi-Z or off state is defined to be when the total current delivered
through the component pin is less than or equal to the leakage current specification.
This figure provides the AC test load for the local bus.
Output
Z0 = 50 Ω
RL = 50 Ω
OVDD/2
Figure 23. Local Bus AC Test Load
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
43
This figures show the local bus signals.
LSYNC_IN
tLBIXKH
tLBIVKH
Input Signals:
LAD[0:31]/LDP[0:3]
tLBIXKH
tLBIVKH
Input Signal:
LGTA
Output Signals:
LSDA10/LSDWE/LSDRAS/
LSDCAS/LSDDQM[0:3]
LA[27:31]/LBCTL/LBCKE/LOE
Output (Data) Signals:
LAD[0:31]/LDP[0:3]
Output (Address) Signal:
LAD[0:31]
LALE
tLBKHOV
tLBKHOV
tLBKHOV
tLBKHLR
tLBKHOX
tLBKHOZ
tLBKHOX
tLBKHOZ
tLBKHOX
tLBOTOT
Figure 24. Local Bus Signals, Non-special Signals Only (PLL Enable Mode)
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
44
Freescale Semiconductor
LCLK[n]
tLBIVKH
Input Signals:
LAD[0:31]
tLBIXKH
tLBIXKH
tLBIVKH
Input Signal:
LGTA
Output Signals:
LSDA10/LSDWE/LSDRAS/
LSDCAS/LSDDQM[0:3]
LA[27:31]/LBCTL/LBCKE/LOE
Output (Data) Signals:
LAD[0:31]/LDP[0:3]
Output (Address) Signal:
LAD[0:31]
LALE
tLBKHOV
tLBKHOV
tLBKHOV
tLBKHLR
tLBKHOZ
tLBKHOZ
tLBOTOT
Figure 25. Local Bus Signals, Non-special Signals Only (PLL Bypass Mode)
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
45
LSYNC_IN
T1
T3
tLBKHOV
tLBKHOX
GPCM Mode Output Signals:
LCS[0:7]/LWE[0:3]
tLBIVKH
tLBIXKH
UPM Mode Input Signal:
LUPWAIT
tLBIVKH
Input Signals:
LAD[0:31]/LDP[0:3]
UPM Mode Output Signals:
LCS[0:7]/LBS[0:1]/LGPL[0:5]
Output (Data) Signals:
LAD[0:31]/LDP[0:3]
Output (Address) Signal:
LAD[0:31]
tLBKHOV
tLBKHOV
tLBKHOV
tLBIXKH
tLBKHOX
tLBKHOZ
tLBKHOX
tLBKHOZ
tLBKHOX
Figure 26. Local Bus Signals, GPCM/UPM Signals for LCRR[CLKDIV] = 2 (PLL Enable Mode)
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
46
Freescale Semiconductor
LCLK
T1
T3
tLBKHOV
tLBKHOZ
GPCM Mode Output Signals:
LCS[0:7]/LWE[0:3]
tLBIVKH
tLBIXKH
UPM Mode Input Signal:
LUPWAIT
tLBIVKH
Input Signals:
LAD[0:31]/LDP[0:3]
UPM Mode Output Signals:
LCS[0:7]/LBS[0:1]/LGPL[0:5]
tLBIXKH
tLBKHOV
tLBKHOZ
Output (Data) Signals:
LAD[0:31]/LDP[0:3]
tLBKHOV
Output (Address) Signal:
LAD[0:31]
tLBKHOV
tLBKHOZ
Figure 27. Local Bus Signals, GPCM/UPM Signals for LCRR[CLKDIV] = 2 (PLL Bypass Mode)
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
47
LSYNC_IN
T1
T2
T3
T4
tLBKHOV
tLBKHOZ
GPCM Mode Output Signals:
LCS[0:7]/LWE[0:3]
tLBIVKH
tLBIXKH
UPM Mode Input Signal:
LUPWAIT
tLBIVKH
Input Signals:
LAD[0:31]
UPM Mode Output Signals:
LCS[0:7]/LBS[0:1]/LGPL[0:5]
tLBKHOV
tLBIXKH
tLBKHOX
tLBKHOZ
tLBKHOX
Output (Data) Signals:
LAD[0:31]/LDP[0:3]
Output (Address) Signal:
LAD[0:31]
tLBKHOV
tLBKHOV
tLBKHOZ
tLBKHOX
Figure 28. Local Bus Signals, GPCM/UPM Signals for LCRR[CLKDIV] = 4 (PLL Enable Mode)
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
48
Freescale Semiconductor
LCLK
T1
T2
T3
T4
tLBKHOV
tLBKHOZ
GPCM Mode Output Signals:
LCS[0:7]/LWE[0:3]
tLBIVKH
tLBIXKH
UPM Mode Input Signal:
LUPWAIT
tLBIVKH
Input Signals:
LAD[0:31]
tLBIXKH
tLBKHOV
UPM Mode Output Signals:
LCS[0:7]/LBS[0:1]/LGPL[0:5]
Output (Data) Signals:
LAD[0:31]/LDP[0:3]
Output (Address) Signal:
LAD[0:31]
tLBKHOV
tLBKHOZ
tLBKHOV
tLBKHOZ
Figure 29. Local Bus Signals, GPCM/UPM Signals for LCRR[CLKDIV] = 4 (PLL Bypass Mode)
11 Enhanced Secure Digital Host Controller (eSDHC)
This section describes the DC and AC electrical specifications for the eSDHC (SD/MMC) interface of the
chip.
The eSDHC controller always uses the falling edge of the SD_CLK in order to drive the
SD_DAT[0:3]/CMD as outputs and sample the SD_DAT[0:3] as inputs. This behavior is true for both fulland high-speed modes.
Note that this is a non-standard implementation, as the SD card specification assumes that in high-speed
mode, data is driven at the rising edge of the clock.
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
49
Due to the special implementation of the eSDHC, there are constraints regarding the clock and data signals
propagation delay on the user board. The constraints are for minimum and maximum delays, as well as
skew between the CLK and DAT/CMD signals.
In full speed mode, there is no need to add special delay on the data or clock signals. The user should make
sure to meet the timing requirements as described further within this document.
If the system is designed to support both high-speed and full-speed cards, the high-speed constraints
should be fulfilled. If the systems is designed to operate up to 25 MHz only, full-speed mode is
recommended.
11.1
eSDHC DC Electrical Characteristics
This table provides the DC electrical characteristics for the eSDHC (SD/MMC) interface of the device.
Table 46. eSDHC interface DC Electrical Characteristics
Parameter
Symbol
Condition
Min
Max
Unit
Input high voltage
VIH
—
0.625 × OVDD
OVDD + 0.3
V
Input low voltage
VIL
—
–0.3
0.25 × OV DD
V
Input current
IIN
—
—
±30
μA
Output high voltage
VOH
IOH = –100 uA,
at OVDD(min)
0.75 × OVDD
—
V
Output low voltage
VOL
IOL = +100 uA,
at OVDD(min)
—
0.125 × OVDD
V
11.2
eSDHC AC Timing Specifications (Full-Speed Mode)
This section describes the AC electrical specifications for the eSDHC (SD/MMC) interface of the device.
This table provides the eSDHC AC timing specifications for full-speed mode as defined in Figure 31 and
Figure 32.
Table 47. eSDHC AC Timing Specifications for Full-Speed Mode
At recommended operating conditions OVDD = 3.3 V ± 165 mV.
Symbol1
Min
Max
Unit
Note
SD_CLK clock frequency—full speed mode
fSFSCK
0
25
MHz
—
SD_CLK clock cycle
tSFSCK
40
—
ns
—
SD_CLK clock frequency—identification mode
fSIDCK
0
400
KHz
—
SD_CLK clock low time
tSFSCKL
15
—
ns
2
SD_CLK clock high time
tSFSCKH
15
—
ns
2
SD_CLK clock rise and fall times
tSFSCKR/
tSFSCKF
—
5
ns
2
Input setup times: SD_CMD, SD_DATx, SD_CD to
SD_CLK
tSFSIVKH
5
—
ns
2
Parameter
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Freescale Semiconductor
Table 47. eSDHC AC Timing Specifications for Full-Speed Mode (continued)
At recommended operating conditions OVDD = 3.3 V ± 165 mV.
Symbol1
Min
Max
Unit
Note
tSFSIXKH
0
—
ns
2
tINT_CLK_DLY
1.5
—
ns
4
Output valid: SD_CLK to SD_CMD, SD_DATx valid
tSFSKHOV
—
4
ns
2
Output hold: SD_CLK to SD_CMD, SD_DATx valid
tSFSKHOX
0
—
—
—
SD card input setup
tISU
5
—
ns
3
SD card input hold
tIH
5
—
ns
3
SD card output valid
tODLY
—
14
ns
3
SD card output hold
tOH
0
—
ns
3
Parameter
Input hold times: SD_CMD, SD_DATx, SD_CD to
SD_CLK
SD_CLK delay within device
Notes:
1. The symbols used for timing specifications herein follow the pattern of t(first three letters of functional block)(signal)(state)
(reference)(state) for inputs and t(first three letters of functional block)(reference)(state)(signal)(state) for outputs. For example, tSFSIXKH
symbolizes eSDHC full mode speed device timing (SFS) input (I) to go invalid (X) with respect to the clock reference (K)
going to high (H). Also tSFSKHOV symbolizes eSDHC full speed timing (SFS) for the clock reference (K) to go high (H), with
respect to the output (O) going valid (V) or data output valid time. Note that, in general, the clock reference symbol
representation is based on five letters representing the clock of a particular functional. For rise and fall times, the latter
convention is used with the appropriate letter: R (rise) or F (fall).
2. Measured at capacitive load of 40 pF.
3. For reference only, according to the SD card specifications.
4. Average, for reference only.
This figure provides the eSDHC clock input timing diagram.
eSDHC
External Clock
operational mode
VM
VM
VM
tSFSCKL
tSFSCKH
tSFSCK
VM = Midpoint Voltage (OVDD/2)
tSFSCKR
tSFSCKF
Figure 30. eSDHC Clock Input Timing Diagram
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
51
11.2.1
Full-Speed Output Path (Write)
This figure provides the data and command output timing diagram.
tSFSCK (clock cycle)
SD CLK at the
MPC8378E pin
Driving
Edge
tCLK_DELAY
SD CLK at
the card pin
Sampling
edge
Output valid time: tSFSKHOV
Output hold time: tSFSKHOX
Output from the
MPC8378E Pins
tSFSCKL
Input at the
MPC8378E pins
tDATA_DELAY
tIH (5 ns)
tISU (5 ns)
Figure 31. Full Speed Output Path
11.2.1.1
Full-Speed Write Meeting Setup (Maximum Delay)
The following equations show how to calculate the allowed skew range between the SD_CLK and
SD_DAT/CMD signals on the PCB.
No clock delay:
tSFSKHOV + tDATA_DELAY + tISU < tSFSCKL
Eqn. 1
tSFSKHOV + tDATA_DELAY + tISU < tSFSCKL + tCLK_DELAY
Eqn. 2
tDATA_DELAY + tSFSCKL < tSFSCK + tCLK_DELAY – tISU – tSFSKHOV
Eqn. 3
With clock delay:
This means that data can be delayed versus clock up to 11 ns in ideal case of tSFSCKL = 20 ns:
tDATA_DELAY + 20 < 40 + tCLK_DELAY – 5 – 4
tDATA_DELAY < 11 + tCLK_DELAY
11.2.1.2
Full-Speed Write Meeting Hold (Minimum Delay)
The following equations show how to calculate the allowed skew range between the SD_CLK and
SD_DAT/CMD signals on the PCB.
tCLK_DELAY < tSFSCKL + tSFSKHOX + tDATA_DELAY – tIH
Eqn. 4
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Freescale Semiconductor
tCLK_DELAY + tIH – tSFSKHOX < tSFSCKL+ tDATA_DELAY
Eqn. 5
This means that clock can be delayed versus data up to 15 ns (external delay line) in ideal case of
tSFSCLKL = 20 ns:
tCLK_DELAY + 5 – 0 < 20 + tDATA_DELAY
tCLK_DELAY < 15 + tDATA_DELAY
11.2.1.3
Full-Speed Write Combined Formula
The following equation is the combined formula to calculate the allowed skew range between the
SD_CLK and SD_DAT/CMD signals on the PCB.
tCLK_DELAY + tIH – tSFSKHOX < tSFSCKL + tDATA_DELAY < tSFSCK+ tCLK_DELAY – tISU – tSFSKHOV
11.2.2
Eqn. 6
Full-Speed Input Path (Read)
This figure provides the data and command input timing diagram.
tSFSCK (clock cycle)
SD CLK at the
MPC8378E pin
Sampling
edge
tCLK_DELAY
SD CLK at
the card pin
Driving
edge
tODLY
tOH
tDATA_DELAY
Output from the
SD card pins
Input at the
MPC8378E pins
(MPC8378E input hold)
tSFSIXKH
tSFSIVKH
Figure 32. Full Speed Input Path
11.2.2.1
Full-Speed Read Meeting Setup (Maximum Delay)
The following equations show how to calculate the allowed combined propagation delay range of the
SD_CLK and SD_DAT/CMD signals on the PCB.
tCLK_DELAY + tDATA_DELAY + tODLY + tSFSIVKH < tSFSCK
Eqn. 7
tCLK_DELAY + tDATA_DELAY < tSFSCK – tODLY – tSFSIVKH – tINT_CLK_DLY
Eqn. 8
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53
11.2.2.2
Full-Speed Read Meeting Hold (Minimum Delay)
There is no minimum delay constraint due to the full clock cycle between the driving and sampling of data.
tCLK_DELAY + tOH + t DATA_DELAY > tSFSIXKH
Eqn. 9
This means that Data + Clock delay must be greater than –2 ns. This is always fulfilled.
11.3
eSDHC AC Timing Specifications (High-Speed Mode)
This table provides the eSDHC AC timing specifications for high-speed mode as defined in Figure 34 and
Figure 35.
Table 48. eSDHC AC Timing Specifications for High-Speed Mode
At recommended operating conditions OVDD = 3.3 V ± 165 mV.
Symbol1
Min
Max
Unit
Note
SD_CLK clock frequency—high speed mode
fSHSCK
0
50
MHz
—
SD_CLK clock cycle
tSHSCK
20
—
ns
—
SD_CLK clock frequency—identification mode
fSIDCK
0
400
KHz
—
SD_CLK clock low time
tSHSCKL
7
—
ns
2
SD_CLK clock high time
tSHSCKH
7
—
ns
2
SD_CLK clock rise and fall times
tSHSCKR/
tSHSCKF
—
3
ns
2
Input setup times: SD_CMD, SD_DATx, SD_CD to
SD_CLK
tSHSIVKH
5
—
ns
2
Input hold times: SD_CMD, SD_DATx, SD_CD to SD_CLK
tSHSIXKH
0
—
ns
2
Output delay time: SD_CLK to SD_CMD, SD_DATx valid
tSHSKHOV
—
4
ns
2
Output Hold time: SD_CLK to SD_CMD, SD_DATx invalid
tSHSKHOX
0
—
ns
2
tINT_CLK_DLY
1.5
—
ns
4
SD Card Input Setup
tISU
6
—
ns
3
SD Card Input Hold
tIH
2
—
ns
3
SD Card Output Valid
tODLY
—
14
ns
3
SD Card Output Hold
tOH
2.5
—
ns
3
Parameter
SD_CLK delay within device
Notes:
1. The symbols used for timing specifications herein follow the pattern of t(first three letters of functional block)(signal)(state)
(reference)(state) for inputs and t(first three letters of functional block)(reference)(state)(signal)(state) for outputs. For example, tSFSIXKH
symbolizes eSDHC full mode speed device timing (SFS) input (I) to go invalid (X) with respect to the clock reference (K)
going to high (H). Also tSFSKHOV symbolizes eSDHC full speed timing (SFS) for the clock reference (K) to go high (H), with
respect to the output (O) going valid (V) or data output valid time. Note that, in general, the clock reference symbol
representation is based on five letters representing the clock of a particular functional. For rise and fall times, the latter
convention is used with the appropriate letter: R (rise) or F (fall).
2. Measured at capacitive load of 40 pF.
3. For reference only, according to the SD card specifications.
4. Average, for reference only.
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54
Freescale Semiconductor
This figure provides the eSDHC clock input timing diagram.
eSDHC
External Clock
operational mode
VM
VM
VM
tSHSCKL
tSHSCKH
tSHSCK
VM = Midpoint Voltage (OVDD/2)
tSHSCKR
tSHSCKF
Figure 33. eSDHC Clock Input Timing Diagram
11.3.1
High-Speed Output Path (Write)
This figure provides the data and command output timing diagram.
tSHSCK (clock cycle)
SD CLK at the
MPC8378E pin
Driving
Edge
tCLK_DELAY
SD CLK at
the card Pin
Sampling
edge
Output valid time: tSHSKHOV
Output hold time: tSHSKHOX
tSHSCKL
Output from the
MPC8378E pins
Input at the
SD card pins
tDATA_DELAY
tIH (2 ns)
tISU (6 ns)
Figure 34. High Speed Output Path
11.3.1.1
High-Speed Write Meeting Setup (Maximum Delay)
The following equations show how to calculate the allowed skew range between the SD_CLK and
SD_DAT/CMD signals on the PCB.
Zero clock delay:
tSHSKHOV + tDATA_DELAY + tISU < tSHSCKL
Eqn. 10
tSHSKHOV + tDATA_DELAY + t ISU < tSHSCKL + tCLK_DELAY
Eqn. 11
tDATA_DELAY – tCLK_DELAY < tSHSCKL – tISU – tSHSKHOV
Eqn. 12
With clock delay:
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Freescale Semiconductor
55
This means that data delay should be equal or less than the clock delay in the ideal case where
tSHSCLKL = 10 ns:
tDATA_DELAY – tCLK_DELAY < 10 – 6 – 4
tDATA_DELAY – tCLK_DELAY < 0
11.3.1.2
High-Speed Write Meeting Hold (Minimum Delay)
The following equations show how to calculate the allowed skew range between the SD_CLK and
SD_DAT/CMD signals on the PCB.
tCLK_DELAY < tSHSCKL + tSHSKHOX + tDATA_DELAY – tIH
Eqn. 13
tCLK_DELAY – tDATA_DELAY < tSHSCKL + tSHSKHOX – tIH
Eqn. 14
This means that clock can be delayed versus data up to 8 ns (external delay line) in ideal case of
tSHSCLKL = 10 ns:
tCLK_DELAY – tDATA_DELAY < 10 + 0 – 2
tCLK_DELAY – tDATA_DELAY < 8
11.3.2
High-Speed Input Path (Read)
This figure provides the data and command input timing diagram.
tSHSCK (Clock Cycle)
1/2 Cycle
Wrong Edge
SD CLK at the
MPC8378E Pin
Right Edge
Sampling
Edge
tCLK_DELAY
SD CLK at
the Card Pin
Driving
Edge
tODLY
tOH
tDATA_DELAY
Output from the
SD Card Pins
Input at the
MPC8378E Pins
tSHSIVKH
(MPC8378E Input Setup)
(MPC8378E Input Hold)
tSHSIXKH
Figure 35. High-Speed Input Path
For the input path, the device eSDHC expects to sample the data 1.5 internal clock cycles after it was
driven by the SD card. Since in this mode the SD card drives the data at the rising edge of the clock, a
sufficient delay to the clock and the data must exist to ensure it will not be sampled at the wrong internal
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56
Freescale Semiconductor
clock falling edge. Note that the internal clock which is guaranteed to be 50% duty cycle is used to sample
the data, and therefore used in the equations.
11.3.2.1
High-Speed Read Meeting Setup (Maximum Delay)
The following equations show how to calculate the allowed combined propagation delay range of the
SD_CLK and SD_DAT/CMD signals on the PCB.
tCLK_DELAY + tDATA_DELAY + tODLY + tSHSIVKH < 1.5 × tSHSCK
Eqn. 15
tCLK_DELAY + tDATA_DELAY < 1.5 × tSHSCK – tODLY – tSHSIVKH
Eqn. 16
This means that Data + Clock delay can be up to 11 ns for a 20 ns clock cycle:
tCLK_DELAY + tDATA_DELAY < 30 – 14 – 5
tCLK_DELAY + tDATA_DELAY < 11
11.3.2.2
High-Speed Read Meeting Hold (Minimum Delay)
The following equations show how to calculate the allowed combined propagation delay range of the
SD_CLK and SD_DAT/CMD signals on the PCB.
0.5 × tSHSCK < tCLK_DELAY + tDATA_DELAY + tOH – tSHSIXKH + tINT_CLK_DLY
Eqn. 17
0.5 × tSHSCK – tOH + tSHSIXKH – tINT_CLK_DLY < tCLK_DELAY + tDATA_DELAY
Eqn. 18
This means that Data + Clock delay must be greater than ~6 ns for a 20 ns clock cycle:
10 – 2.5 + (–1.5) < tCLK_DELAY + tDATA_DELAY
6 < tCLK_DELAY + tDATA_DELAY
11.3.2.3
High-Speed Read Combined Formula
The following equation is the combined formula to calculate the propagation delay range of the SD_CLK
and SD_DAT/CMD signals on the PCB.
0.5 × tSHSCK – tOH + tSHSIXKH < tCLK_DELAY + tDATA_DELAY < 1.5 × tSHSCK – tODLY – tSHSIVKH
Eqn. 19
12 JTAG
This section describes the DC and AC electrical specifications for the IEEE 1149.1 (JTAG) interface of
the chip.
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Freescale Semiconductor
57
12.1
JTAG DC Electrical Characteristics
This table provides the DC electrical characteristics for the IEEE 1149.1 (JTAG) interface of the chip.
Table 49. JTAG interface DC Electrical Characteristics
Parameter
Symbol
Condition
Min
Max
Unit
Input high voltage
VIH
—
2.5
OVDD + 0.3
V
Input low voltage
VIL
—
–0.3
0.8
V
Input current
IIN
—
—
±30
μA
Output high voltage
VOH
IOH = –8.0 mA
2.4
—
V
Output low voltage
VOL
IOL = 8.0 mA
—
0.5
V
Output low voltage
VOL
IOL = 3.2 mA
—
0.4
V
12.2
JTAG AC Timing Specifications
This section describes the AC electrical specifications for the IEEE 1149.1 (JTAG) interface of the device.
This table provides the JTAG AC timing specifications as defined in Figure 37 through Figure 40.
Table 50. JTAG AC Timing Specifications (Independent of CLKIN) 1
Symbol2
Min
Max
Unit
Note
JTAG external clock frequency of operation
fJTG
0
33.3
MHz
—
JTAG external clock cycle time
t JTG
30
—
ns
—
tJTKHKL
15
—
ns
—
tJTGR & tJTGF
0
2
ns
—
tTRST
25
—
ns
3
Boundary-scan data
TMS, TDI
tJTDVKH
tJTIVKH
4
4
—
—
Boundary-scan data
TMS, TDI
tJTDXKH
tJTIXKH
10
10
—
—
Boundary-scan data
TDO
tJTKLDV
tJTKLOV
2
2
11
11
Boundary-scan data
TDO
tJTKLDX
tJTKLOX
2
2
—
—
Parameter
JTAG external clock pulse width measured at 1.4 V
JTAG external clock rise and fall times
TRST assert time
ns
Input setup times:
4
Input hold times:
ns
4
Valid times:
ns
—
ns
Output hold times:
—
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Freescale Semiconductor
Table 50. JTAG AC Timing Specifications (Independent of CLKIN) 1 (continued)
Parameter
Symbol2
Min
Max
JTAG external clock to output high impedance:
Boundary-scan data
TDO
tJTKLDZ
tJTKLOZ
2
2
19
9
Unit
Note
ns
5
Notes:
1. All outputs are measured from the midpoint voltage of the falling/rising edge of tTCLK to the midpoint of the signal in
question. The output timings are measured at the pins. All output timings assume a purely resistive 50 Ω load (see
Figure 21). Time-of-flight delays must be added for trace lengths, vias, and connectors in the system.
2. The symbols used for timing specifications herein follow the pattern of t(first two letters of functional block)(signal)(state)
(reference)(state) for inputs and t(first two letters of functional block)(reference)(state)(signal)(state) for outputs. For example, tJTDVKH
symbolizes JTAG device timing (JT) with respect to the time data input signals (D) reaching the valid state (V) relative to
the tJTG clock reference (K) going to the high (H) state or setup time. Also, tJTDXKH symbolizes JTAG timing (JT) with respect
to the time data input signals (D) went invalid (X) relative to the tJTG clock reference (K) going to the high (H) state. Note
that, in general, the clock reference symbol representation is based on three letters representing the clock of a particular
functional. For rise and fall times, the latter convention is used with the appropriate letter: R (rise) or F (fall).
3. TRST is an asynchronous level sensitive signal. The setup time is for test purposes only.
4. Non-JTAG signal input timing with respect to tTCLK.
5. Non-JTAG signal output timing with respect to tTCLK.
This figure provides the AC test load for TDO and the boundary-scan outputs of the device.
Z0 = 50 Ω
Output
OVDD/2
R L = 50 Ω
Figure 36. AC Test Load for the JTAG Interface
This figure provides the JTAG clock input timing diagram.
JTAG
External Clock
VM
VM
VM
tJTGR
tJTKHKL
tJTGF
tJTG
VM = Midpoint Voltage (OVDD/2)
Figure 37. JTAG Clock Input Timing Diagram
This figure provides the TRST timing diagram.
TRST
VM
VM
tTRST
VM = Midpoint Voltage (OVDD/2)
Figure 38. TRST Timing Diagram
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Freescale Semiconductor
59
This figure provides the boundary-scan timing diagram.
JTAG
External Clock
VM
VM
tJTDVKH
tJTDXKH
Boundary
Data Inputs
Input
Data Valid
tJTKLDV
tJTKLDX
Boundary
Data Outputs
Output Data Valid
tJTKLDZ
Boundary
Data Outputs
Output Data Valid
VM = Midpoint Voltage (OVDD/2)
Figure 39. Boundary-Scan Timing Diagram
This figure provides the test access port timing diagram.
JTAG
External Clock
VM
VM
tJTIVKH
tJTIXKH
Input
Data Valid
TDI, TMS
tJTKLOV
tJTKLOX
Output Data Valid
TDO
tJTKLOZ
TDO
Output Data Valid
VM = Midpoint Voltage (OVDD/2)
Figure 40. Test Access Port Timing Diagram
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Freescale Semiconductor
13 I2C
This section describes the DC and AC electrical characteristics for the I2C interface of the chip.
13.1
I2C DC Electrical Characteristics
This table provides the DC electrical characteristics for the I2C interface of the chip.
Table 51. I2C DC Electrical Characteristics
At recommended operating conditions with OVDD of 3.3 V ± 165 mV.
Parameter
Symbol
Min
Max
Unit
Note
Input high voltage level
VIH
0.7 × OVDD
OVDD + 0.3
V
—
Input low voltage level
VIL
–0.3
0.3 × OVDD
V
—
Low level output voltage
VOL
0
0.2 × OVDD
V
1
Output fall time from VIH(min) to VIL(max) with a bus capacitance
from 10 to 400 pF
tI2KLKV
20 + 0.1 × CB
250
ns
2
Pulse width of spikes which must be suppressed by the input filter
tI2KHKL
0
50
ns
3
Capacitance for each I/O pin
CI
—
10
pF
—
Input current
(0 V ≤ VIN ≤ OVDD)
IIN
—
± 30
μA
4
Notes:
1. Output voltage (open drain or open collector) condition = 3 mA sink current.
2. CB = capacitance of one bus line in pF.
3. Refer to the MPC8379E PowerQUICC II Pro Integrated Host Processor Reference Manual for information on the digital filter
used.
4. I/O pins will obstruct the SDA and SCL lines if OVDD is switched off.
13.2
I2C AC Electrical Specifications
This table provides the AC timing parameters for the I2C interface of the device.
Table 52. I2C AC Electrical Specifications
All values refer to VIH (min) and VIL (max) levels (see Table 51).
Symbol1
Min
Max
Unit
Note
SCL clock frequency
fI2C
0
400
kHz
—
Low period of the SCL clock
tI2CL
1.3
—
μs
—
High period of the SCL clock
tI2CH
0.6
—
μs
—
Setup time for a repeated START condition
tI2SVKH
0.6
—
μs
—
Hold time (repeated) START condition (after this period, the first
clock pulse is generated)
tI2SXKL
0.6
—
μs
—
Data setup time
tI2DVKH
100
—
ns
—
Parameter
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Freescale Semiconductor
61
Table 52. I2C AC Electrical Specifications (continued)
All values refer to VIH (min) and VIL (max) levels (see Table 51).
Symbol1
Parameter
Min
Max
—
0
—
0.9
tI2DXKL
Data hold time
CBUS compatible masters
I2C bus devices
Unit
Note
μs
2, 3
Setup time for STOP condition
tI2PVKH
0.6
—
μs
—
Bus free time between a STOP and START condition
tI2KHDX
1.3
—
μs
—
Noise margin at the LOW level for each connected device (including
hysteresis)
VNL
0.1 × OVDD
—
V
—
Noise margin at the HIGH level for each connected device (including
hysteresis)
VNH
0.2 × OVDD
—
V
—
Notes:
1. The symbols used for timing specifications herein follow the pattern of t(first two letters of functional block)(signal)(state)
(reference)(state) for inputs and t(first two letters of functional block)(reference)(state)(signal)(state) for outputs. For example, tI2DVKH
symbolizes I2C timing (I2) with respect to the time data input signals (D) reach the valid state (V) relative to the tI2C clock
reference (K) going to the high (H) state or setup time. Also, tI2SXKL symbolizes I2C timing (I2) for the time that the data with
respect to the start condition (S) went invalid (X) relative to the tI2C clock reference (K) going to the low (L) state or hold time.
Also, tI2PVKH symbolizes I2C timing (I2) for the time that the data with respect to the stop condition (P) reaching the valid
state (V) relative to the tI2C clock reference (K) going to the high (H) state or setup time. For rise and fall times, the latter
convention is used with the appropriate letter: R (rise) or F (fall).
2. This chip provides a hold time of at least 300 ns for the SDA signal (referred to the VIHmin of the SCL signal) to bridge the
undefined region of the falling edge of SCL.
3. The maximum tI2DVKH has only to be met if the device does not stretch the LOW period (tI2CL) of the SCL signal.
This figure provides the AC test load for the I2C.
Output
Z0 = 50 Ω
OVDD/2
RL = 50 Ω
Figure 41. I2C AC Test Load
This figure shows the AC timing diagram for the I2C bus.
SDA
tI2CF
tI2DVKH
tI2CL
tI2KHKL
tI2SXKL
tI2CF
tI2CR
SCL
tI2SXKL
S
tI2CH
tI2DXKL
tI2SVKH
tI2PVKH
Sr
P
S
Figure 42. I2C Bus AC Timing Diagram
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62
Freescale Semiconductor
14 PCI
This section describes the DC and AC electrical specifications for the PCI bus of the chip.
14.1
PCI DC Electrical Characteristics
This table provides the DC electrical characteristics for the PCI interface of the device. The DC
characteristics of the PORESET signal, which can be used as PCI RST in applications where the device is
a PCI agent, deviates from the standard PCI levels.
Table 53. PCI DC Electrical Characteristics
Parameter
Condition
Symbol
Min
Max
Unit
High-level input voltage
VOUT ≥ VOH (min) or
VIH
2.0
OVDD + 0.5
V
Low-level input voltage
VOUT ≤ VOL (max)
VIL
–0.5
0.3 × OVDD
V
High-level output voltage
IOH = –500 μA
VOH
0.9 × OVDD
—
V
Low-level output voltage
IOL = 1500 μA
VOL
—
0.1 × OVDD
V
0 V ≤ VIN ≤ OVDD
IIN
—
± 30
μA
Input current
Note:
• The symbol VIN, in this case, represents the OVIN symbol referenced in Table 2.
14.2
PCI AC Electrical Specifications
This section describes the general AC timing parameters of the PCI bus of the device. Note that the
PCI_CLK/PCI_SYNC_IN or CLKIN signal is used as the PCI input clock depending on whether the chip
is configured as a host or agent device. CLKIN is used when the device is in host mode.
This table shows the PCI AC timing specifications at 66 MHz.
.
Table 54. PCI AC Timing Specifications at 66 MHz
PCI_SYNC_IN clock input levels are with next levels: VIL = 0.1 × OVDD, VIH = 0.7 × OVDD.
Symbol1
Min
Max
Unit
Note
Clock to output valid
tPCKHOV
—
6.0
ns
2
Output hold from clock
tPCKHOX
1
—
ns
2
Clock to output high impedance
tPCKHOZ
—
14
ns
2, 3
Input setup to clock
tPCIVKH
3.0
—
ns
2, 4
Parameter
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63
Table 54. PCI AC Timing Specifications at 66 MHz (continued)
PCI_SYNC_IN clock input levels are with next levels: VIL = 0.1 × OVDD, VIH = 0.7 × OVDD.
Symbol1
Min
Max
Unit
Note
Input hold from cock
tPCIXKH
0.25
—
ns
2, 4, 6
Output clock skew
tPCKOSK
—
0.5
ns
5
Parameter
Notes:
1. Note that the symbols used for timing specifications herein follow the pattern of t(first two letters of functional block)(signal)(state)
(reference)(state) for inputs and t(first two letters of functional block)(reference)(state)(signal)(state) for outputs. For example, tPCIVKH
symbolizes PCI timing (PC) with respect to the time the input signals (I) reach the valid state (V) relative to the
PCI_SYNC_IN clock, tSYS, reference (K) going to the high (H) state or setup time. Also, tPCRHFV symbolizes PCI timing (PC)
with respect to the time hard reset (R) went high (H) relative to the frame signal (F) going to the valid (V) state.
2. See the timing measurement conditions in the PCI 2.3 Local Bus Specifications.
3. For purposes of active/float timing measurements, the Hi-Z or off state is defined to be when the total current delivered
through the component pin is less than or equal to the leakage current specification.
4. Input timings are measured at the pin.
5. PCI specifications allows 1 ns skew for 66 MHz but includes the total allowed skew, board, connectors, etc.
6. Value does not comply with the PCI 2.3 Local Bus Specifications.
This table shows the PCI AC timing specifications at 33 MHz.
Table 55. PCI AC Timing Specifications at 33 MHz
PCI_SYNC_IN clock input levels are with next levels: VIL = 0.1 × OVDD, VIH = 0.7 × OVDD.
Symbol1
Min
Max
Unit
Note
Clock to output valid
tPCKHOV
—
11
ns
2
Output hold from clock
tPCKHOX
2
—
ns
2
Clock to output high impedance
tPCKHOZ
—
14
ns
2, 3
Input setup to clock
tPCIVKH
3.0
—
ns
2, 4
Input hold from clock
tPCIXKH
0.25
—
ns
2, 4, 6
Output clock skew
tPCKOSK
—
0.5
ns
5
Parameter
Notes:
1. Note that the symbols used for timing specifications herein follow the pattern of t(first two letters of functional block)(signal)(state)
(reference)(state) for inputs and t(first two letters of functional block)(reference)(state)(signal)(state) for outputs. For example, tPCIVKH
symbolizes PCI timing (PC) with respect to the time the input signals (I) reach the valid state (V) relative to the
PCI_SYNC_IN clock, tSYS, reference (K) going to the high (H) state or setup time. Also, tPCRHFV symbolizes PCI timing (PC)
with respect to the time hard reset (R) went high (H) relative to the frame signal (F) going to the valid (V) state.
2. See the timing measurement conditions in the PCI 2.3 Local Bus Specifications.
3. For purposes of active/float timing measurements, the Hi-Z or off state is defined to be when the total current delivered
through the component pin is less than or equal to the leakage current specification.
4. Input timings are measured at the pin.
5. PCI specifications allows 2 ns skew for 33 MHz but includes the total allowed skew, board, connectors, etc.
6. Value does not comply with the PCI 2.3 Local Bus Specifications.
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Freescale Semiconductor
This figure provides the AC test load for PCI.
Z0 = 50 Ω
Output
RL = 50 Ω
OVDD/2
Figure 43. PCI AC Test Load
This figure shows the PCI input AC timing conditions.
CLK
tPCIVKH
tPCIXKH
Input
Figure 44. PCI Input AC Timing Measurement Conditions
This figure shows the PCI output AC timing conditions.
CLK
tPCKHOV
tPCKHOX
Output Delay
tPCKHOZ
High-Impedance
Output
Figure 45. PCI Output AC Timing Measurement Condition
15 PCI Express
This section describes the DC and AC electrical specifications for the PCI Express bus.
15.1
DC Requirements for PCI Express SD_REF_CLK and
SD_REF_CLK
For more information see Section 20, “High-Speed Serial Interfaces (HSSI).”
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Freescale Semiconductor
65
15.2
AC Requirements for PCI Express SerDes Clocks
This table lists the PCI Express SerDes clock AC requirements.
Table 56. SD_REF_CLK and SD_REF_CLK AC Requirements
Parameter
Symbol
Min
Typical
Max
Unit
Note
tREF
—
10
—
ns
—
REFCLK cycle-to-cycle jitter. Difference in the period of any
two adjacent REFCLK cycles.
tREFCJ
—
—
100
ps
—
REFCLK phase jitter peak-to-peak. Deviation in edge
location with respect to mean edge location.
tREFPJ
–50
—
+50
ps
—
SD_REF_CLK/_B cycle to cycle clock jitter (period jitter)
tCKCJ
—
—
100
ps
—
SD_REF_CLK/_B phase jitter peak-to-peak. Deviation in
edge location with respect to mean edge location.
tCKPJ
–50
—
+50
ps
2, 3
REFCLK cycle time
Notes:
1. All options provide serial interface bit rate of 1.5 and 3.0 Gbps.
2. In a frequency band from 150 kHz to 15 MHz, at BER of 10-12.
3. Total peak-to-peak Deterministic Jitter “JD” should be less than or equal to 50 ps.
15.3
Clocking Dependencies
The ports on the two ends of a link must transmit data at a rate that is within 600 parts per million (ppm)
of each other at all times. This is specified to allow bit rate clock sources with a ±300 ppm tolerance.
15.4
Physical Layer Specifications
Following is a summary of the specifications for the physical layer of PCI Express on this device. For
further details as well as the specifications of the transport and data link layer, use the PCI Express Base
Specification, Rev. 1.0a.
NOTE
The voltage levels of the transmitter and the receiver depend on the SerDes
control registers which should be programmed at the recommended values
for PCI Express protocol (that is, L1_nVDD = 1.0 V).
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Freescale Semiconductor
15.4.1
Differential Transmitter (Tx) Output
This table defines the specifications for the differential output at all transmitters. The parameters are
specified at the component pins.
Table 57. Differential Transmitter (Tx) Output Specifications
Parameter
Conditions
Symbol
Min
Typical
Max
Units
Note
Unit interval
Each UPETX is 400 ps ± 300
ppm. UPETX does not account
for Spread Spectrum Clock
dictated variations.
UI
399.88
400
400.12
ps
1
Differential
peak-to-peak output
voltage
VPEDPPTX = 2 × |V TX-D+ –
VTX-D-|
VTX-DIFFp-p
0.8
—
1.2
V
2
De-emphasized
differential output
voltage (ratio)
Ratio of the VPEDPPTX of the
second and following bits after
a transition divided by the
VPEDPPTX of the first bit after a
transition.
VTX-DE-RATIO
–3.0
–3.5
–4.0
dB
2
Minimum Tx eye width
The maximum transmitter
jitter can be derived as
TTX-MAX-JITTER = 1 –
UPEEWTX= 0.3 UI.
TTX-EYE
0.70
—
—
UI
2, 3
Maximum time between
the jitter median and
maximum deviation
from the median
Jitter is defined as the
measurement variation of the
crossing points (V PEDPPTX = 0
V) in relation to a recovered Tx
UI. A recovered Tx UI is
calculated over 3500
consecutive unit intervals of
sample data. Jitter is
measured using all edges of
the 250 consecutive UI in the
center of the 3500 UI used for
calculating the Tx UI.
TTX-EYE-MEDIAN-to-
—
—
0.15
UI
2, 3
D+/D– Tx output
rise/fall time
—
TTX-RISE, T TX-FALL
0.125
—
—
UI
2, 5
VTX-CM-ACp
—
—
20
mV
2
VTX-CM-DC- ACTIVE-
0
—
100
mV
2
RMS AC peak common VPEACPCMTX = RMS(|VTXD+ –
mode output voltage
VTXD-|/2 – VTX-CM-DC)
VTX-CM-DC = DC(avg) of
|VTX-D+ – VTX-D-|/2
Absolute delta of DC
common mode voltage
during LO and electrical
idle
|VTX-CM-DC (during LO) –
VTX-CM-Idle-DC (During Electrical
Idle)|<=100 mV
VTX-CM-DC = DC(avg) of
|VTX-D+ – VTX-D-|/2 [LO]
VTX-CM-Idle-DC = DC(avg) of
|VTX-D+ – VTX-D-|/2 [Electrical
Idle]
MAX-JITTER
IDLE-DELTA
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67
Table 57. Differential Transmitter (Tx) Output Specifications (continued)
Parameter
Conditions
Symbol
Min
Typical
Max
Units
Note
|VTX-CM-DC-D+ – VTX-CM-DC-D-|
≤ 25 mV
VTX-CM-DC-D+ = DC(avg) of
|VTX-D+|
VTX-CM-DC-D- = DC(avg) of
|VTX-D-|
VTX-CM-DC-LINE-
0
—
25
mV
2
VTX-IDLE-DIFFp
0
—
20
mV
2
VTX-RCV-DETECT
—
XPADVDD/2
600
mV
6
VTX-DC-CM
0
XPADVDD/2
—
V
6
Tx short circuit current The total current the
limit
transmitter can provide when
shorted to its ground
ITX-SHORT
—
—
90
mA
—
Minimum time spent in Minimum time a transmitter
electrical idle
must be in electrical idle.
Utilized by the receiver to start
looking for an electrical idle
exit after successfully
receiving an electrical idle
ordered set.
TTX-IDLE-MIN
50
—
—
UI
—
Absolute delta of DC
common mode
between D+ and D–
VPEEIDPTX = |V TX-IDLE-D+
Electrical idle
differential peak output -V TX-IDLE-D-| ≤ 20 mV
voltage
The total amount of voltage
Amount of voltage
change allowed during change that a transmitter can
apply to sense whether a low
receiver detection
impedance receiver is
present.
Tx DC common mode
voltage
The allowed DC common
mode voltage under any
conditions.
DELTA
Maximum time to
transition to a valid
electrical idle after
sending an electrical
idle ordered set
After sending an electrical idle TTX-IDLE-SET-TO-IDLE
ordered set, the transmitter
must meet all electrical idle
specifications within this time.
This is considered a
debounce time for the
transmitter to meet electrical
idle after transitioning from
LO.
—
—
20
UI
—
Maximum time to
transition to valid Tx
specifications after
leaving an electrical idle
condition
Maximum time to meet all Tx TTX-IDLE-TO-DIFF-DATA
specifications when
transitioning from electrical
idle to sending differential
data. This is considered a
debounce time for the Tx to
meet all Tx specifications after
leaving electrical idle
—
—
20
UI
—
Differential return loss
Measured over 50 MHz to
1.25 GHz.
12
—
—
dB
4
RLTX-DIFF
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Freescale Semiconductor
Table 57. Differential Transmitter (Tx) Output Specifications (continued)
Parameter
Conditions
Symbol
Min
Typical
Max
Units
Note
RLTX-CM
6
—
—
dB
4
ZTX-DIFF-DC
80
100
120
Ω
—
Common mode return
loss
Measured over 50 MHz to
1.25 GHz.
DC differential Tx
impedance
Tx DC differential mode low
impedance
Transmitter DC
impedance
Required Tx D+ as well as D–
DC impedance during all
states
ZTX-DC
40
—
—
Ω
—
Lane-to-Lane output
skew
Static skew between any two
transmitter lanes within a
single link
LTX-SKEW
—
—
500 +
2 UI
ps
—
AC coupling capacitor
All transmitters should be AC
coupled. The AC coupling is
required either within the
media or within the
transmitting component itself.
CTX
75
—
200
nF
—
Crosslink random
timeout
This random timeout helps
resolve conflicts in crosslink
configuration by eventually
resulting in only one
downstream and one
upstream port.
Tcrosslink
0
—
1
ms
7
Notes:
1. No test load is necessarily associated with this value.
2. Specified at the measurement point into a timing and voltage compliance test load as shown in Figure 48 and measured
over any 250 consecutive Tx UIs. (Also refer to the transmitter compliance eye diagram shown in Figure 46.)
3. A T TX-EYE = 0.70 UI provides for a total sum of deterministic and random jitter budget of TTX-JITTER-MAX = 0.30 UI for the
transmitter collected over any 250 consecutive Tx UIs. The TTX-EYE-MEDIAN-to-MAX-JITTER median is less than half of the total
Tx jitter budget collected over any 250 consecutive Tx UIs. It should be noted that the median is not the same as the mean.
The jitter median describes the point in time where the number of jitter points on either side is approximately equal as
opposed to the averaged time value.
4. The transmitter input impedance will result in a differential return loss greater than or equal to 12 dB and a common mode
return loss greater than or equal to 6 dB over a frequency range of 50 MHz to 1.25 GHz. This input impedance requirement
applies to all valid input levels. The reference impedance for return loss measurements is 50 Ω to ground for both the D+
and D– line (that is, as measured by a vector network analyzer with 50-Ω probes, see Figure 48). Note that the series
capacitors, CTX, is optional for the return loss measurement.
5. Measured between 20%–80% at transmitter package pins into a test load as shown in Figure 48 for both V TX-D+ and VTX-D-.
6. See Section 4.3.1.8 of the PCI Express Base Specifications, Rev 1.0a.
7. See Section 4.2.6.3 of the PCI Express Base Specifications, Rev 1.0a.
15.4.2
Transmitter Compliance Eye Diagrams
The Tx eye diagram in Figure 46 is specified using the passive compliance/test measurement load (see
Figure 48) in place of any real PCI Express interconnect + Rx component. There are two eye diagrams that
must be met for the transmitter. Both diagrams must be aligned in time using the jitter median to locate the
center of the eye diagram. The different eye diagrams differ in voltage depending on whether it is a
transition bit or a de-emphasized bit. The exact reduced voltage level of the de-emphasized bit is always
relative to the transition bit.
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
69
The eye diagram must be valid for any 250 consecutive UIs.
A recovered Tx UI is calculated over 3500 consecutive unit intervals of sample data. The eye diagram is
created using all edges of the 250 consecutive UI in the center of the 3500 UI used for calculating the Tx
UI.
NOTE
It is recommended that the recovered Tx UI be calculated using all edges in
the 3500 consecutive UI interval with a fit algorithm using a minimization
merit function (that is, least squares and median deviation fits).
V TX-DIFF = 0 mV
(D+ D– Crossing Point)
V TX-DIFF = 0 mV
(D+ D– Crossing Point)
[Transition Bit]
VTX-DIFFp-p-MIN = 800 mV
[De-emphasized Bit]
566 mV (3 dB) >= V TX-DIFFp-p-MIN >= 505 mV (4 dB)
0.7 UI = UI – 0.3 UI(JTX-TOTAL-MAX)
[Transition Bit]
VTX-DIFFp-p-MIN = 800 mV
Figure 46. Minimum Transmitter Timing and Voltage Output Compliance Specifications
15.4.3
Differential Receiver (Rx) Input Specifications
This table defines the specifications for the differential input at all receivers. The parameters are specified
at the component pins.
Table 58. Differential Receiver (Rx) Input Specifications
Parameter
Comments
Unit interval
Each U PERX is 400 ps ± 300
ppm. U PERX does not account
for Spread Spectrum Clock
dictated variations.
Differential peak-to-peak
output voltage
VPEDPPRX = 2 × |V RX-D+ –
VRX-D-|
Symbol
Min
Typical
Max
Units
Note
UI
399.88
400
400.12
ps
1
VRX-DIFFp-p
0.175
—
1.200
V
2
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Table 58. Differential Receiver (Rx) Input Specifications (continued)
Parameter
Comments
Symbol
Min
Typical
Max
Units
Note
Minimum receiver eye
width
The maximum interconnect
media and transmitter jitter that
can be tolerated by the receiver
can be derived as
TRX-MAX-JITTER = 1 –
UPEEWRX = 0.6 UI.
TRX-EYE
0.4
—
—
UI
2, 3
Maximum time between
the jitter median and
maximum deviation from
the median.
Jitter is defined as the
TRX-EYE-MEDIAN-to
measurement variation of the
-MAX-JITTER
crossing points (VPEDPPRX = 0
V) in relation to a recovered Tx
UI. A recovered Tx UI is
calculated over 3500
consecutive unit intervals of
sample data. Jitter is measured
using all edges of the 250
consecutive UI in the center of
the 3500 UI used for calculating
the Tx UI.
—
—
0.3
UI
2, 3, 7
AC peak common mode
input voltage
VPEACPCMRX = |VRXD+ –
VRXD-|/2 – VRX-CM-DC
VRX-CM-DC = DC(avg) of |VRX-D+
– VRX-D-|/2
VRX-CM-ACp
—
—
150
mV
2
Differential return loss
Measured over 50 MHz to 1.25
GHz with the D+ and D– lines
biased at +300 mV and –300
mV, respectively.
RLRX-DIFF
10
—
—
dB
4
Common mode return
loss
Measured over 50 MHz to 1.25
GHz with the D+ and D– lines
biased at 0 V.
RLRX-CM
6
—
—
dB
4
DC differential input
impedance
RX DC differential mode
impedance.
ZRX-DIFF-DC
80
100
120
Ω
5
DC Input Impedance
Required RX D+ as well as DDC impedance (50 ± 20%
tolerance).
ZRX-DC
40
50
60
Ω
2, 5
Powered down DC input
impedance
Required RX D+ as well as D–
DC impedance when the
receiver terminations do not
have power.
ZRX-HIGH-IMP-DC
200 k
—
—
Ω
6
Electrical idle detect
threshold
VPEEIDT = 2 × |V RX-D+ -VRX-D-|
Measured at the package pins
of the receiver
VRX-IDLE-DET-DIFF
65
—
175
mV
—
p-p
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Freescale Semiconductor
71
Table 58. Differential Receiver (Rx) Input Specifications (continued)
Parameter
Comments
Unexpected Electrical Idle An unexpected electrical idle
(Vrx-diffp-p <
Enter Detect Threshold
Vrx-idle-det-diffp-p) must be
Integration Time
recognized no longer than
Trx-idle-det-diff-entertime to
signal an unexpected idle
condition.
Total Skew
Skew across all lanes on a link.
This includes variation in the
length of SKP ordered set (e.g.
COM and one to five SKP
Symbols) at the Rx as well as
any delay differences arising
from the interconnect itself.
Symbol
Min
Typical
Max
Units
Note
TRX-IDLE-DET-DIFF-
—
—
10
ms
—
—
—
20
ns
—
ENTERTIME
LRX-SKEW
Notes:
1. No test load is necessarily associated with this value.
2. Specified at the measurement point and measured over any 250 consecutive UIs. The test load in Figure 48 should be used
as the Rx device when taking measurements (also refer to the receiver compliance eye diagram shown in Figure 47). If the
clocks to the Rx and Tx are not derived from the same reference clock, the Tx UI recovered from 3500 consecutive UI must
be used as a reference for the eye diagram.
3. A TRx-EYE = 0.40 UI provides for a total sum of 0.60 UI deterministic and random jitter budget for the transmitter and
interconnect collected any 250 consecutive UIs. The TRx-EYE-MEDIAN-to-MAX-JITTER specification ensures a jitter
distribution in which the median and the maximum deviation from the median is less than half of the total. UI jitter budget
collected over any 250 consecutive Tx UIs. It should be noted that the median is not the same as the mean. The jitter median
describes the point in time where the number of jitter points on either side is approximately equal as opposed to the averaged
time value. If the clocks to the Rx and Tx are not derived from the same reference clock, the Tx UI recovered from 3500
consecutive UI must be used as the reference for the eye diagram.
4. The receiver input impedance will result in a differential return loss greater than or equal to 10 dB with the D+ line biased to
300 mV and the D– line biased to –300 mV and a common mode return loss greater than or equal to 6 dB (no bias required)
over a frequency range of 50 MHz to 1.25 GHz. This input impedance requirement applies to all valid input levels. The
reference impedance for return loss measurements for is 50 Ω to ground for both the D+ and D– line (that is, as measured
by a vector network analyzer with 50-Ω probes, see Figure 48). Note that the series capacitors, CTx, is optional for the return
loss measurement.
5. Impedance during all LTSSM states. When transitioning from a fundamental reset to detect (the initial state of the LTSSM)
there is a 5 ms transition time before receiver termination values must be met on all unconfigured lanes of a port.
6. The Rx DC common mode impedance that exists when no power is present or fundamental reset is asserted. This helps
ensure that the receiver detect circuit does not falsely assume a receiver is powered on when it is not. This term must be
measured at 300 mV above the Rx ground.
7. It is recommended that the recovered Tx UI is calculated using all edges in the 3500 consecutive UI interval with a fit algorithm
using a minimization merit function. Least squares and median deviation fits have worked well with experimental and
simulated data.
15.5
Receiver Compliance Eye Diagrams
The Rx eye diagram in Figure 47 is specified using the passive compliance/test measurement load (see
Figure 48) in place of any real PCI Express Rx component. In general, the minimum receiver eye diagram
measured with the compliance/test measurement load (see Figure 48) is larger than the minimum receiver
eye diagram measured over a range of systems at the input receiver of any real PCI Express component.
The degraded eye diagram at the input receiver is due to traces internal to the package as well as silicon
parasitic characteristics that cause the real PCI Express component to vary in impedance from the
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Freescale Semiconductor
compliance/test measurement load. The input receiver eye diagram is implementation specific and is not
specified. Rx component designer should provide additional margin to adequately compensate for the
degraded minimum receiver eye diagram (shown in Figure 47) expected at the input receiver based on an
adequate combination of system simulations and the return loss measured looking into the Rx package and
silicon. The Rx eye diagram must be aligned in time using the jitter median to locate the center of the eye
diagram.
The eye diagram must be valid for any 250 consecutive UIs.
A recovered Tx UI is calculated over 3500 consecutive unit intervals of sample data. The eye diagram is
created using all edges of the 250 consecutive UI in the center of the 3500 UI used for calculating the Tx
UI.
NOTE
The reference impedance for return loss measurements is 50 Ω to ground for
both the D+ and D– line (that is, as measured by a Vector Network Analyzer
with 50 Ω probes—see Figure 48). Note that the series capacitors,
CPEACCTX, are optional for the return loss measurement.
VRX-DIFF = 0 mV
(D+ D– Crossing Point)
VRX-DIFF = 0 mV
(D+ D– Crossing Point)
VRX-DIFFp-p-MIN > 175 mV
0.4 UI = TRX-EYE-MIN
Figure 47. Minimum Receiver Eye Timing and Voltage Compliance Specification
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
73
15.5.1
Compliance Test and Measurement Load
The AC timing and voltage parameters must be verified at the measurement point, as specified within
0.2 inches of the package pins, into a test/measurement load shown in Figure 48.
NOTE
The allowance of the measurement point to be within 0.2 inches of the
package pins is meant to acknowledge that package/board routing may
benefit from D+ and D– not being exactly matched in length at the package
pin boundary. If the vendor does not explicitly state where the measurement
point is located, the measurement point is assumed to be the D+ and D–
package pins.
D+ Package Pin
C = CTX
TX Silicon +
Package
C = CTX
R = 50 Ω
D– Package Pin
R = 50 Ω
Figure 48. Compliance Test/Measurement Load
16 Timers
This section describes the DC and AC electrical specifications for the timers of the chip.
16.1
Timers DC Electrical Characteristics
This table provides the DC electrical characteristics for the device timers pins, including TIN, TOUT,
TGATE, and RTC_CLK.
Table 59. Timers DC Electrical Characteristics
Parameter
Condition
Symbol
Min
Max
Unit
Output high voltage
IOH = –6.0 mA
VOH
2.4
—
V
Output low voltage
IOL = 6.0 mA
VOL
—
0.5
V
Output low voltage
IOL = 3.2 mA
VOL
—
0.4
V
Input high voltage
—
VIH
2.0
OVDD + 0.3
V
Input low voltage
—
VIL
–0.3
0.8
V
0 V ≤ VIN ≤ OVDD
IIN
—
± 30
μA
Input current
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
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16.2
Timers AC Timing Specifications
This table provides the timers input and output AC timing specifications.
Table 60. Timers Input AC Timing Specifications1
Parameter
Symbol 2
Min
Unit
tTIWID
20
ns
Timers inputs—minimum pulse width
Notes:
1. Input specifications are measured from the 50% level of the signal to the 50% level of the rising edge of CLKIN. Timings are
measured at the pin.
2. Timers inputs and outputs are asynchronous to any visible clock. Timers outputs should be synchronized before use by any
external synchronous logic. Timers inputs are required to be valid for at least tTIWID ns to ensure proper operation
This figure provides the AC test load for the timers.
Output
Z0 = 50 Ω
RL = 50 Ω
OVDD/2
Figure 49. Timers AC Test Load
17 GPIO
This section describes the DC and AC electrical specifications for the GPIO of the chip.
17.1
GPIO DC Electrical Characteristics
This table provides the DC electrical characteristics for the device GPIO.
Table 61. GPIO DC Electrical Characteristics
This specification applies when operating at 3.3 V ± 165 mV supply.
Parameter
Condition
Symbol
Min
Max
Unit
Output high voltage
IOH = –6.0 mA
VOH
2.4
—
V
Output low voltage
IOL = 6.0 mA
VOL
—
0.5
V
Output low voltage
IOL = 3.2 mA
VOL
—
0.4
V
Input high voltage
—
VIH
2.0
OVDD + 0.3
V
Input low voltage
—
VIL
–0.3
0.8
V
0 V ≤ VIN ≤ OVDD
IIN
—
± 30
μA
Input current
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17.2
GPIO AC Timing Specifications
This table provides the GPIO input and output AC timing specifications.
Table 62. GPIO Input AC Timing Specifications
Parameter
GPIO inputs—minimum pulse width
Symbol
Min
Unit
tPIWID
20
ns
Notes:
1. Input specifications are measured from the 50% level of the signal to the 50% level of the rising edge of SYS_CLKIN. Timings
are measured at the pin.
2. GPIO inputs and outputs are asynchronous to any visible clock. GPIO outputs should be synchronized before use by any
external synchronous logic. GPIO inputs are required to be valid for at least tPIWID ns to ensure proper operation.
This figure provides the AC test load for the GPIO.
Output
Z0 = 50 Ω
RL = 50 Ω
OVDD/2
Figure 50. GPIO AC Test Load
18 IPIC
This section describes the DC and AC electrical specifications for the external interrupt pins of the chip.
18.1
IPIC DC Electrical Characteristics
This table provides the DC electrical characteristics for the external interrupt pins of the chip.
Table 63. IPIC DC Electrical Characteristics
Parameter
Condition
Symbol
Min
Max
Unit
Input high voltage
—
VIH
2.0
OVDD + 0.3
V
Input low voltage
—
VIL
–0.3
0.8
V
Input current
—
IIN
—
±30
μA
Output low voltage
IOL = 6.0 mA
VOL
—
0.5
V
Output low voltage
IOL = 3.2 mA
VOL
—
0.4
V
Note:
1. This table applies for pins IRQ[0:7], IRQ_OUT, MCP_OUT.
2. IRQ_OUT and MCP_OUT are open drain pins, thus VOH is not relevant for those pins.
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18.2
IPIC AC Timing Specifications
This table provides the IPIC input and output AC timing specifications.
Table 64. IPIC Input AC Timing Specifications
Parameter
IPIC inputs—minimum pulse width
Symbol
Min
Unit
tPIWID
20
ns
Note:
1. Input specifications are measured from the 50% level of the signal to the 50% level of the rising edge of CLKIN. Timings are
measured at the pin.
2. IPIC inputs and outputs are asynchronous to any visible clock. IPIC outputs should be synchronized before use by any
external synchronous logic. IPIC inputs are required to be valid for at least tPIWID ns to ensure proper operation when working
in edge triggered mode.
19 SPI
This section describes the DC and AC electrical specifications for the SPI of the chip.
19.1
SPI DC Electrical Characteristics
This table provides the DC electrical characteristics for the device SPI.
Table 65. SPI DC Electrical Characteristics
Parameter
Condition
Symbol
Min
Max
Unit
Input high voltage
—
VIH
2.0
OVDD + 0.3
V
Input low voltage
—
VIL
–0.3
0.8
V
Input current
—
IIN
—
± 30
μA
Output high voltage
IOH = –8.0 mA
VOH
2.4
—
V
Output low voltage
IOL = 8.0 mA
VOL
—
0.5
V
Output low voltage
IOL = 3.2 mA
VOL
—
0.4
V
19.2
SPI AC Timing Specifications
This table provides the SPI input and output AC timing specifications.
Table 66. SPI AC Timing Specifications
Symbol1
Min
Max
Unit
SPI outputs—Master mode (internal clock) delay
tNIKHOV
0.5
6
ns
SPI outputs—Slave mode (external clock) delay
tNEKHOV
2
8
ns
SPI inputs—Master mode (internal clock) input setup time
tNIIVKH
4
—
ns
SPI inputs—Master mode (internal clock) input hold time
tNIIXKH
0
—
ns
SPI inputs—Slave mode (external clock) input setup time
tNEIVKH
4
—
ns
Parameter
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Table 66. SPI AC Timing Specifications (continued)
Parameter
Symbol1
Min
Max
Unit
tNEIXKH
2
—
ns
SPI inputs—Slave mode (external clock) input hold time
Notes:
1. The symbols used for timing specifications follow the pattern of t(first two letters of functional block)(signal)(state) (reference)(state) for
inputs and t(first two letters of functional block)(reference)(state)(signal)(state) for outputs. For example, tNIKHOV symbolizes the internal
timing (NI) for the time SPICLK clock reference (K) goes to the high state (H) until outputs (O) are invalid (X).
2. Output specifications are measured from the 50% level of the rising edge of CLKIN to the 50% level of the signal. Timings
are measured at the pin. The maximum SPICLK input frequency is 66.666 MHz.
This figure provides the AC test load for the SPI.
Output
Z0 = 50 Ω
OVDD/2
RL = 50 Ω
Figure 51. SPI AC Test Load
These figures represent the AC timing from Table 66. Note that although the specifications generally
reference the rising edge of the clock, these AC timing diagrams also apply when the falling edge is the
active edge.
This figure shows the SPI timing in slave mode (external clock).
SPICLK (input)
Input Signals:
SPIMOSI
(See Note)
tNEIVKH
Output Signals:
SPIMISO
(See Note)
tNEIXKH
tNEKHOV
Note: The clock edge is selectable on SPI.
Figure 52. SPI AC Timing in Slave Mode (External Clock) Diagram
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This figure shows the SPI timing in master mode (internal clock).
SPICLK (output)
Input Signals:
SPIMISO
(See Note)
tNIIVKH
Output Signals:
SPIMOSI
(See Note)
tNIIXKH
tNIKHOV
Note: The clock edge is selectable on SPI.
Figure 53. SPI AC Timing in Master Mode (Internal Clock) Diagram
20 High-Speed Serial Interfaces (HSSI)
This chip features two serializer/deserializer (SerDes) interfaces to be used for high-speed serial
interconnect applications. See Table 1 for the interfaces supported.
This section describes the common portion of SerDes DC electrical specifications, which is the DC
requirement for SerDes reference clocks. The SerDes data lane’s transmitter and receiver reference circuits
are also shown.
20.1
Signal Terms Definition
The SerDes utilizes differential signaling to transfer data across the serial link. This section defines terms
used in the description and specification of differential signals.
Figure 54 shows how the signals are defined. For illustration purpose, only one SerDes lane is used for
description. The figure shows waveform for either a transmitter output (SDn_TX and SDn_TX) or a
receiver input (SDn_RX and SDn_RX). Each signal swings between A volts and B volts where A > B.
Using this waveform, the definitions are as follows. To simplify illustration, the following definitions
assume that the SerDes transmitter and receiver operate in a fully symmetrical differential signaling
environment.
• Single-Ended Swing
The transmitter output signals and the receiver input signals SDn_TX, SDn_TX, SDn_RX and
SDn_RX each have a peak-to-peak swing of A – B volts. This is also referred as each signal wire’s
single-ended swing.
• Differential Output Voltage, VOD (or Differential Output Swing):
The differential output voltage (or swing) of the transmitter, VOD, is defined as the difference of
the two complimentary output voltages: VSDn_TX – VSDn_TX. The VOD value can be either positive
or negative.
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•
•
•
•
•
Differential Input Voltage, VID (or Differential Input Swing):
The differential input voltage (or swing) of the receiver, VID, is defined as the difference of the two
complimentary input voltages: VSDn_RX – VSDn_RX. The VID value can be either positive or
negative.
Differential Peak Voltage, VDIFFp
The peak value of the differential transmitter output signal or the differential receiver input signal
is defined as differential peak voltage, VDIFFp = |A – B| volts.
Differential Peak-to-Peak, VDIFFp-p
Since the differential output signal of the transmitter and the differential input signal of the receiver
each range from A – B to –(A – B) volts, the peak-to-peak value of the differential transmitter
output signal or the differential receiver input signal is defined as differential peak-to-peak voltage,
VDIFFp-p = 2 × VDIFFp = 2 × |(A – B)| volts, which is twice of differential swing in amplitude, or
twice of the differential peak. For example, the output differential peak-peak voltage can also be
calculated as VTX-DIFFp-p = 2 × |VOD|.
Differential Waveform
The differential waveform is constructed by subtracting the inverting signal (SDn_TX, for
example) from the non-inverting signal (SDn_TX, for example) within a differential pair. There is
only one signal trace curve in a differential waveform. The voltage represented in the differential
waveform is not referenced to ground. Refer to Figure 63 as an example for differential waveform.
Common Mode Voltage, Vcm
The common mode voltage is equal to one half of the sum of the voltages between each conductor
of a balanced interchange circuit and ground. In this example, for SerDes output,
Vcm_out = (VSDn_TX + VSDn_TX) ÷ 2 = (A + B) ÷ 2, which is the arithmetic mean of the two
complimentary output voltages within a differential pair. In a system, the common mode voltage
may often differ from one component’s output to the other’s input. Sometimes it may be even
different between the receiver input and driver output circuits within the same component. It is also
referred as the DC offset in some occasion.
A Volts
SDn_TX or
SDn_RX
Vcm = (A + B)/2
B Volts
SDn_TX or
SDn_RX
Differential Swing, VID or VOD = A – B
Differential Peak Voltage, VDIFFp = |A – B|
Differential Peak-Peak Voltage, VDIFFpp = 2 × VDIFFp (not shown)
Figure 54. Differential Voltage Definitions for Transmitter or Receiver
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To illustrate these definitions using real values, consider the case of a CML (Current Mode Logic)
transmitter that has a common mode voltage of 2.25 V and each of its outputs, TD and TD, has a swing
that goes between 2.5 V and 2.0 V. Using these values, the peak-to-peak voltage swing of each signal (TD
or TD) is 500 mVp-p, which is referred as the single-ended swing for each signal. In this example, since
the differential signaling environment is fully symmetrical, the transmitter output’s differential swing
(VOD) has the same amplitude as each signal’s single-ended swing. The differential output signal ranges
between 500 mV and –500 mV, in other words, VOD is 500 mV in one phase and –500 mV in the other
phase. The peak differential voltage (VDIFFp) is 500 mV. The peak-to-peak differential voltage (VDIFFp-p)
is 1000 mVp-p.
20.2
SerDes Reference Clocks
The SerDes reference clock inputs are applied to an internal PLL whose output creates the clock used by
the corresponding SerDes lanes. The SerDes reference clocks inputs are SD1_REF_CLK and
SD1_REF_CLK for both lanes of SerDes1, and SD2_REF_CLK and SD2_REF_CLK for both lanes of
SerDes2.
The following sections describe the SerDes reference clock requirements and some application
information.
20.2.1
SerDes Reference Clock Receiver Characteristics
Figure 55 shows a receiver reference diagram of the SerDes reference clocks.
• SerDes Reference Clock Receiver Reference Circuit Structure
— The SDn_REF_CLK and SDn_REF_CLK are internally AC-coupled differential inputs as
shown in Figure 55. Each differential clock input (SDn_REF_CLK or SDn_REF_CLK) has a
50 Ω termination to SGND_SRDSn (xcorevss) followed by on-chip AC-coupling.
— The external reference clock driver must be able to drive this termination.
— The SerDes reference clock input can be either differential or single-ended. Refer to the
Differential Mode and Single-ended Mode description below for further detailed requirements.
• The maximum average current requirement that also determines the common mode voltage range
— When the SerDes reference clock differential inputs are DC coupled externally with the clock
driver chip, the maximum average current allowed for each input pin is 8 mA. In this case, the
exact common mode input voltage is not critical as long as it is within the range allowed by the
maximum average current of 8 mA (refer to the following bullet for more detail), since the
input is AC-coupled on-chip.
— This current limitation sets the maximum common mode input voltage to be less than 0.4 V
(0.4 V ÷ 50 = 8 mA) while the minimum common mode input level is 0.1 V above
SGND_SRDSn (xcorevss). For example, a clock with a 50/50 duty cycle can be produced by
a clock driver with output driven by its current source from 0 mA to 16 mA (0–0.8 V), such
that each phase of the differential input has a single-ended swing from 0 V to 800 mV with the
common mode voltage at 400 mV.
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•
— If the device driving the SDn_REF_CLK and SDn_REF_CLK inputs cannot drive 50 Ω to
SGND_SRDSn (xcorevss) DC, or it exceeds the maximum input current limitations, then it
must be AC-coupled off-chip.
The input amplitude requirement
— This requirement is described in detail in the following sections.
50 Ω
SDn_REF_CLK
Input
Amp
SDn_REF_CLK
50 Ω
Figure 55. Receiver of SerDes Reference Clocks
20.2.2
DC Level Requirement for SerDes Reference Clocks
The DC level requirement for the device SerDes reference clock inputs is different depending on the
signaling mode used to connect the clock driver chip and SerDes reference clock inputs as described
below.
• Differential Mode
— The input amplitude of the differential clock must be between 400 mV and 1600 mV
differential peak-peak (or between 200 mV and 800 mV differential peak). In other words,
each signal wire of the differential pair must have a single-ended swing less than 800 mV and
greater than 200 mV. This requirement is the same for both external DC-coupled or
AC-coupled connection.
— For external DC-coupled connection, as described in Section 20.2.1, “SerDes Reference
Clock Receiver Characteristics,” the maximum average current requirements sets the
requirement for average voltage (common mode voltage) to be between 100 mV and 400 mV.
Figure 56 shows the SerDes reference clock input requirement for DC-coupled connection
scheme.
— For external AC-coupled connection, there is no common mode voltage requirement for the
clock driver. Since the external AC-coupling capacitor blocks the DC level, the clock driver
and the SerDes reference clock receiver operate in different command mode voltages. The
SerDes reference clock receiver in this connection scheme has its common mode voltage set to
SGND_SRDSn. Each signal wire of the differential inputs is allowed to swing below and above
the command mode voltage (SGND_SRDSn). Figure 57 shows the SerDes reference clock
input requirement for AC-coupled connection scheme.
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•
Single-ended Mode
— The reference clock can also be single-ended. The SD _REF_CLK input amplitude
(single-ended swing) must be between 400 mV and 800 mVp-p (from Vmin to Vmax) with
SDn_REF_CLK either left unconnected or tied to ground.
— The SDn_REF_CLK input average voltage must be between 200 mV and 400 mV. Figure 58
shows the SerDes reference clock input requirement for single-ended signaling mode.
— To meet the input amplitude requirement, the reference clock inputs might need to be DC or
AC-coupled externally. For the best noise performance, the reference of the clock could be DC
or AC-coupled into the unused phase (SDn_REF_CLK) through the same source impedance as
the clock input (SDn_REF_CLK) in use.
200 mV < Input Amplitude or Differential Peak < 800 mV
SDn_REF_CLK
Vmax < 800 mV
100 mV < V cm < 400 mV
Vmin > 0 V
SDn_REF_CLK
Figure 56. Differential Reference Clock Input DC Requirements (External DC-Coupled)
200 mV < Input Amplitude or Differential Peak < 800 mV
SDn_REF_CLK
150
fdafdV max < Vcm + 400 mV
Vmax < Vcm + 400 mV
Vcm
SDn_REF_CLK
Vmin > V cm – 400m V
Figure 57. Differential Reference Clock Input DC Requirements (External AC-Coupled)
400 mV < SDn_REF_CLK Input Amplitude < 800 mV
SD n_REF_CLK
0V
SDn_REF_CLK
Figure 58. Single-Ended Reference Clock Input DC Requirements
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20.2.3
Interfacing With Other Differential Signaling Levels
The following list provides information about interfacing with other differential signaling levels.
• With on-chip termination to SGND_SRDSn (xcorevss), the differential reference clocks inputs are
HCSL (high-speed current steering logic) compatible DC-coupled.
• Many other low voltage differential type outputs like LVDS (low voltage differential signaling) can
be used but may need to be AC-coupled due to the limited common mode input range allowed
(100 mV to 400 mV) for DC-coupled connection.
• LVPECL outputs can produce signal with too large amplitude and may need to be DC-biased at
clock driver output first, then followed with series attenuation resistor to reduce the amplitude, in
addition to AC-coupling.
NOTE
Figure 59 to Figure 62 below are for conceptual reference only. Due to the
fact that clock driver chip's internal structure, output impedance, and
termination requirements are different between various clock driver chip
manufacturers, it is very possible that the clock circuit reference designs
provided by the clock driver chip vendor are different from what is shown
below. They might also vary from one vendor to the other. Therefore,
Freescale Semiconductor can neither provide the optimal clock driver
reference circuits, nor guarantee the correctness of the following clock
driver connection reference circuits. The system designer is recommended
to contact the selected clock driver chip vendor for the optimal reference
circuits with the device SerDes reference clock receiver requirement
provided in this document.
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This figure shows the SerDes reference clock connection reference circuits for HCSL type clock driver. It
assumes that the DC levels of the clock driver chip is compatible with device SerDes reference clock
input’s DC requirement.
Chip
HCSL CLK Driver Chip
CLK_Out
33 Ω
SDn_REF_CLK
50 Ω
SerDes Refer.
CLK Receiver
100 Ω differential PWB trace
Clock Driver
33 Ω
SDn_REF_CLK
CLK_Out
Total 50 Ω. Assume clock driver’s
output impedance is about 16 Ω.
50 Ω
Clock driver vendor dependent
source termination resistor
Figure 59. DC-Coupled Differential Connection with HCSL Clock Driver (Reference Only)
This figure shows the SerDes reference clock connection reference circuits for LVDS type clock driver.
Since LVDS clock driver’s common-mode voltage is higher than the device SerDes reference clock input’s
allowed range (100 to 400 mV), AC-coupled connection scheme must be used. It assumes the LVDS
output driver features a 50-Ω termination resistor. It also assumes that the LVDS transmitter establishes its
own common mode level without relying on the receiver or other external component.
Chip
LVDS CLK Driver Chip
CLK_Out
10 nF
SDn_REF_CLK
50 Ω
SerDes Refer.
CLK Receiver
100 Ω differential PWB trace
Clock Driver
CLK_Out
10 nF
SDn_REF_CLK
50 Ω
Figure 60. AC-Coupled Differential Connection with LVDS Clock Driver (Reference Only)
Figure 61 shows the SerDes reference clock connection reference circuits for LVPECL type clock driver.
Since LVPECL driver’s DC levels (both common mode voltages and output swing) are incompatible with
device SerDes reference clock input’s DC requirement, AC-coupling has to be used. Figure 61 assumes
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that the LVPECL clock driver’s output impedance is 50 Ω. R1 is used to DC-bias the LVPECL outputs
prior to AC-coupling. Its value could be ranged from 140 Ω to 240 Ω depending on clock driver vendor’s
requirement. R2 is used together with the SerDes reference clock receiver’s 50 Ω termination resistor to
attenuate the LVPECL output’s differential peak level such that it meets the device SerDes reference
clock’s differential input amplitude requirement (between 200 mV and 800 mV differential peak). For
example, if the LVPECL output’s differential peak is 900 mV and the desired SerDes reference clock input
amplitude is selected as 600 mV, the attenuation factor is 0.67, which requires R2 = 25 Ω. Consult clock
driver chip manufacturer to verify whether this connection scheme is compatible with a particular clock
driver chip.
Chip
LVPECL CLK Driver Chip
CLK_Out
R2
R1
Clock Driver
10 nF
SDn_REF_CLK
SerDes Refer.
CLK Receiver
100 Ω differential PWB trace
R2
10 nF
SDn_REF_CLK
CLK_Out
R1
50 Ω
50 Ω
Figure 61. AC-Coupled Differential Connection with LVPECL Clock Driver (Reference Only)
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This figure shows the SerDes reference clock connection reference circuits for a single-ended clock driver.
It assumes the DC levels of the clock driver are compatible with device SerDes reference clock input’s DC
requirement.
Single-Ended CLK
Driver Chip
Chip
Total 50 Ω. Assume clock driver’s
output impedance is about 16 Ω.
Clock Driver
CLK_Out
50 Ω
SDn_REF_CLK
33 Ω
SerDes Refer.
CLK Receiver
100 Ω differential PWB trace
50 Ω
SDn_REF_CLK
50 Ω
Figure 62. Single-Ended Connection (Reference Only)
20.2.4
AC Requirements for SerDes Reference Clocks
The clock driver selected should provide a high quality reference clock with low phase noise and
cycle-to-cycle jitter. Phase noise less than 100 KHz can be tracked by the PLL and data recovery loops and
is less of a problem. Phase noise above 15 MHz is filtered by the PLL. The most problematic phase noise
occurs in the 1–15 MHz range. The source impedance of the clock driver should be 50 Ω to match the
transmission line and reduce reflections which are a source of noise to the system.
This table describes some AC parameters common to SGMII and protocols
Table 67. SerDes Reference Clock Common AC Parameters
At recommended operating conditions with XVDD_SRDS or XVDD_SRDS = 1.0 V ± 5%.
Parameter
Symbol
Min
Max
Unit
Note
Rising Edge Rate
Rise Edge Rate
1.0
4.0
V/ns
2, 3
Falling Edge Rate
Fall Edge Rate
1.0
4.0
V/ns
2, 3
Differential Input High Voltage
VIH
200
—
mV
2
Differential Input Low Voltage
VIL
—
–200
mV
2
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Table 67. SerDes Reference Clock Common AC Parameters (continued)
At recommended operating conditions with XVDD_SRDS or XVDD_SRDS = 1.0 V ± 5%.
Parameter
Rising edge rate (SDn_REF_CLK) to falling edge rate
(SD n_REF_CLK) matching
Symbol
Min
Max
Unit
Note
Rise-Fall Matching
—
20
%
1, 4
Notes:
1. Measurement taken from single ended waveform.
2. Measurement taken from differential waveform.
3. Measured from –200 mV to +200 mV on the differential waveform (derived from SDn_REF_CLK minus SDn_REF_CLK).
The signal must be monotonic through the measurement region for rise and fall time. The 400 mV measurement window is
centered on the differential zero crossing. See Figure 63.
4. Matching applies to rising edge rate for SDn_REF_CLK and falling edge rate for SDn_REF_CLK. It is measured using a
200 mV window centered on the median cross point where SDn_REF_CLK rising meets SDn_REF_CLK falling. The
median cross point is used to calculate the voltage thresholds the oscilloscope is to use for the edge rate calculations. The
Rise Edge Rate of SDn_REF_CLK should be compared to the Fall Edge Rate of SDn_REF_CLK, the maximum allowed
difference should not exceed 20% of the slowest edge rate. See Figure 64.
Rise Edge Rate
Fall Edge Rate
VIH = +200 mV
0.0 V
VIL = –200 mV
SDn_REF_CLK
Minus
SDn_REF_CLK
Figure 63. Differential Measurement Points for Rise and Fall Time
SDn_REF_CLK
SDn_REF_CLK
TFALL
TRISE
VCROSS MEDIAN +100 mV
VCROSS MEDIAN
VCROSS MEDIAN
VCROSS MEDIAN –100 mV
SDn_REF_CLK
SDn_REF_CLK
Figure 64. Single-Ended Measurement Points for Rise and Fall Time Matching
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20.3
SerDes Transmitter and Receiver Reference Circuits
This figure shows the reference circuits for SerDes data lane’s transmitter and receiver.
50 Ω
SD1_TX n or
SD2_TX n
SD1_RXn or
SD2_RXn
50 Ω
Transmitter
Receiver
50 Ω
SD1_TXn or
SD2_TXn
SD1_RXn or
SD2_RXn
50 Ω
Figure 65. SerDes Transmitter and Receiver Reference Circuits
The DC and AC specification of SerDes data lanes are defined in each interface protocol section below in
this document based on the application usage:
•
•
Section 8, “Ethernet: Enhanced Three-Speed Ethernet (eTSEC)”
Section 15, “PCI Express”
Note that an external AC coupling capacitor is required for the above three serial transmission protocols
with the capacitor value defined in specification of each protocol section.
21 Package and Pin Listings
This section details package parameters, pin assignments, and dimensions.
21.1
Package Parameters for the MPC8378E TePBGA II
The package parameters are provided in the following list. The package type is 31 mm × 31 mm,
689 plastic ball grid array (TePBGA II).
Package outline
31 mm × 31 mm
Interconnects
689
Pitch
1.00 mm
Module height (typical)
2.0 mm to 2.46 mm (maximum)
Solder Balls
3.5% Ag, 96.5% Sn
Ball diameter (typical)
0.60 mm
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This figure shows the mechanical dimensions and bottom surface nomenclature of the TEPBGA II
package.
Figure 66. Mechanical Dimensions and Bottom Surface Nomenclature of the TEPBGA II
Note:
1 All dimensions are in millimeters.
2 Dimensioning and tolerancing per ASME Y14. 5M-1994.
3 Maximum solder ball diameter measured parallel to Datum A.
4 Datum A, the seating plane, is determined by the spherical crowns of the solder balls.
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5
Parallelism measurement should exclude any effect of mark on top surface of package.
21.2
Pinout Listings
This table provides the pinout listing for the TePBGA II package.
Table 68. TePBGA II Pinout Listing
Signal
Package Pin Number
Pin Type
Power Supply
Note
Clock Signals
CLKIN
K24
I
OVDD
—
PCI_CLK/PCI_SYNC_IN
C10
I
OVDD
—
PCI_SYNC_OUT
N24
O
OVDD
3
PCI_CLK0
L24
O
OVDD
—
PCI_CLK1
M24
O
OVDD
—
PCI_CLK2
M25
O
OVDD
—
PCI_CLK3
M26
O
OVDD
—
PCI_CLK4
L26
O
OVDD
—
RTC/PIT_CLOCK
AF11
I
OVDD
—
DDR SDRAM Memory Interface
MA0
U3
O
GVDD
—
MA1
U1
O
GVDD
—
MA2
T5
O
GVDD
—
MA3
T3
O
GVDD
—
MA4
T2
O
GVDD
—
MA5
T1
O
GVDD
—
MA6
R1
O
GVDD
—
MA7
P2
O
GVDD
—
MA8
P1
O
GVDD
—
MA9
N4
O
GVDD
—
MA10
V3
O
GVDD
—
MA11
M5
O
GVDD
—
MA12
N1
O
GVDD
—
MA13
M2
O
GVDD
—
MA14
M1
O
GVDD
—
MBA0
U5
O
GVDD
—
MBA1
U4
O
GVDD
—
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
91
Table 68. TePBGA II Pinout Listing (continued)
Signal
Package Pin Number
Pin Type
Power Supply
Note
MBA2
M3
O
GVDD
—
MCAS_B
W5
O
GVDD
—
MCK_B0
H1
O
GVDD
—
MCK_B1
K1
O
GVDD
—
MCK_B2
V1
O
GVDD
—
MCK_B3
W2
O
GVDD
—
MCK_B4
AA1
O
GVDD
—
MCK_B5
AB2
O
GVDD
—
MCK0
J1
O
GVDD
—
MCK1
L1
O
GVDD
—
MCK2
V2
O
GVDD
—
MCK3
W1
O
GVDD
—
MCK4
Y1
O
GVDD
—
MCK5
AB1
O
GVDD
—
MCKE0
M4
O
GVDD
3
MCKE1
R5
O
GVDD
3
MCS_B0
W3
O
GVDD
—
MCS_B1
P3
O
GVDD
—
MCS_B2
T4
O
GVDD
—
MCS_B3
R4
O
GVDD
—
MDIC0
AH8
I/O
GVDD
9
MDIC1
AJ8
I/O
GVDD
9
MDM0
B6
O
GVDD
—
MDM1
B2
O
GVDD
—
MDM2
E2
O
GVDD
—
MDM3
E1
O
GVDD
—
MDM4
Y6
O
GVDD
—
MDM5
AC6
O
GVDD
—
MDM6
AE6
O
GVDD
—
MDM7
AJ4
O
GVDD
—
MDM8
L6
O
GVDD
—
MDQ0
A8
I/O
GVDD
11
MDQ1
A6
I/O
GVDD
11
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
92
Freescale Semiconductor
Table 68. TePBGA II Pinout Listing (continued)
Signal
Package Pin Number
Pin Type
Power Supply
Note
MDQ2
C7
I/O
GVDD
11
MDQ3
D8
I/O
GVDD
11
MDQ4
A7
I/O
GVDD
11
MDQ5
A5
I/O
GVDD
11
MDQ6
A3
I/O
GVDD
11
MDQ7
C6
I/O
GVDD
11
MDQ8
D7
I/O
GVDD
11
MDQ9
E8
I/O
GVDD
11
MDQ10
B1
I/O
GVDD
11
MDQ11
D5
I/O
GVDD
11
MDQ12
B3
I/O
GVDD
11
MDQ13
D6
I/O
GVDD
11
MDQ14
C3
I/O
GVDD
11
MDQ15
C2
I/O
GVDD
11
MDQ16
D4
I/O
GVDD
11
MDQ17
E6
I/O
GVDD
11
MDQ18
F6
I/O
GVDD
11
MDQ19
G4
I/O
GVDD
11
MDQ20
F8
I/O
GVDD
11
MDQ21
E4
I/O
GVDD
11
MDQ22
C1
I/O
GVDD
11
MDQ23
G6
I/O
GVDD
11
MDQ24
F2
I/O
GVDD
11
MDQ25
G5
I/O
GVDD
11
MDQ26
H6
I/O
GVDD
11
MDQ27
H4
I/O
GVDD
11
MDQ28
D1
I/O
GVDD
11
MDQ29
G3
I/O
GVDD
11
MDQ30
H5
I/O
GVDD
11
MDQ31
F1
I/O
GVDD
11
MDQ32
W6
I/O
GVDD
11
MDQ33
AC1
I/O
GVDD
11
MDQ34
AC3
I/O
GVDD
11
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
93
Table 68. TePBGA II Pinout Listing (continued)
Signal
Package Pin Number
Pin Type
Power Supply
Note
MDQ35
AE1
I/O
GVDD
11
MDQ36
V6
I/O
GVDD
11
MDQ37
Y5
I/O
GVDD
11
MDQ38
AA4
I/O
GVDD
11
MDQ39
AB6
I/O
GVDD
11
MDQ40
AD3
I/O
GVDD
11
MDQ41
AC4
I/O
GVDD
11
MDQ42
AD4
I/O
GVDD
11
MDQ43
AF1
I/O
GVDD
11
MDQ44
AE4
I/O
GVDD
11
MDQ45
AC5
I/O
GVDD
11
MDQ46
AE2
I/O
GVDD
11
MDQ47
AE3
I/O
GVDD
11
MDQ48
AG1
I/O
GVDD
11
MDQ49
AG2
I/O
GVDD
11
MDQ50
AG3
I/O
GVDD
11
MDQ51
AF5
I/O
GVDD
11
MDQ52
AE5
I/O
GVDD
11
MDQ53
AD7
I/O
GVDD
11
MDQ54
AH2
I/O
GVDD
11
MDQ55
AG4
I/O
GVDD
11
MDQ56
AH3
I/O
GVDD
11
MDQ57
AG5
I/O
GVDD
11
MDQ58
AF8
I/O
GVDD
11
MDQ59
AJ5
I/O
GVDD
11
MDQ60
AF6
I/O
GVDD
11
MDQ61
AF7
I/O
GVDD
11
MDQ62
AH6
I/O
GVDD
11
MDQ63
AH7
I/O
GVDD
11
MDQS0
C8
I/O
GVDD
11
MDQS1
C4
I/O
GVDD
11
MDQS2
E3
I/O
GVDD
11
MDQS3
G2
I/O
GVDD
11
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
94
Freescale Semiconductor
Table 68. TePBGA II Pinout Listing (continued)
Signal
Package Pin Number
Pin Type
Power Supply
Note
MDQS4
AB5
I/O
GVDD
11
MDQS5
AD1
I/O
GVDD
11
MDQS6
AH1
I/O
GVDD
11
MDQS7
AJ3
I/O
GVDD
11
MDQS8
G1
I/O
GVDD
11
MECC0/MSRCID0
J6
I/O
GVDD
—
MECC1/MSRCID1
J3
I/O
GVDD
—
MECC2/MSRCID2
K2
I/O
GVDD
—
MECC3/MSRCID3
K3
I/O
GVDD
—
MECC4/MSRCID4
J5
I/O
GVDD
—
MECC5/MDVAL
J2
I/O
GVDD
—
MECC6
L5
I/O
GVDD
—
MECC7
L2
I/O
GVDD
—
MODT0
N5
O
GVDD
6
MODT1
U6
O
GVDD
6
MODT2
M6
O
GVDD
6
MODT3
P6
O
GVDD
6
MRAS_B
AA3
O
GVDD
—
MVREF1
K4
I
GVDD
11
MVREF2
W4
I
GVDD
11
MWE_B
Y2
O
GVDD
—
DUART Interface
UART_SIN1/
MSRCID2/LSRCID2
L28
I/O
OVDD
—
UART_SOUT1/
MSRCID0/LSRCID0
L27
O
OVDD
—
UART_CTS_B[1]/
MSRCID4/LSRCID4
K26
I/O
OVDD
—
UART_RTS_B1
N27
O
OVDD
—
UART_SIN2/
MSRCID3/LSRCID3
K27
I/O
OVDD
—
UART_SOUT2/
MSRCID1/LSRCID1
K28
O
OVDD
—
UART_CTS_B[2]/
MDVAL/LDVAL
K29
I/O
OVDD
—
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
95
Table 68. TePBGA II Pinout Listing (continued)
Signal
Package Pin Number
Pin Type
Power Supply
Note
UART_RTS_B[2]
L29
O
OVDD
—
Enhanced Local Bus Controller (eLBC) Interface
LAD0
E24
I/O
LBVDD
—
LAD1
G28
I/O
LBVDD
—
LAD2
H25
I/O
LBVDD
—
LAD3
F26
I/O
LBVDD
—
LAD4
C26
I/O
LBVDD
—
LAD5
J28
I/O
LBVDD
—
LAD6
F21
I/O
LBVDD
—
LAD7
F23
I/O
LBVDD
—
LAD8
E25
I/O
LBVDD
—
LAD9
E26
I/O
LBVDD
—
LAD10
A23
I/O
LBVDD
—
LAD11
F24
I/O
LBVDD
—
LAD12
G24
I/O
LBVDD
—
LAD13
F25
I/O
LBVDD
—
LAD14
H28
I/O
LBVDD
—
LAD15
G25
I/O
LBVDD
—
LA11/LAD16
F27
I/O
LBVDD
—
LA12/LAD17
B21
I/O
LBVDD
—
LA13/LAD18
A25
I/O
LBVDD
—
LA14/LAD19
C28
I/O
LBVDD
—
LA15/LAD20
H24
I/O
LBVDD
—
LA16/LAD21
E23
I/O
LBVDD
—
LA17/LAD22
B28
I/O
LBVDD
—
LA18/LAD23
D28
I/O
LBVDD
—
LA19/LAD24
A27
I/O
LBVDD
—
LA20/LAD25
C25
I/O
LBVDD
—
LA21/LAD26
B27
I/O
LBVDD
—
LA22/LAD27
H27
I/O
LBVDD
—
LA23/LAD28
E21
I/O
LBVDD
—
LA24/LAD29
F20
I/O
LBVDD
—
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
96
Freescale Semiconductor
Table 68. TePBGA II Pinout Listing (continued)
Signal
Package Pin Number
Pin Type
Power Supply
Note
LA25/LAD30
D29
I/O
LBVDD
—
LA26/LAD31
E20
I/O
LBVDD
—
LA27
H26
O
LBVDD
—
LA28
C29
O
LBVDD
—
LA29
E28
O
LBVDD
—
LA30
B26
O
LBVDD
—
LA31
J25
O
LBVDD
—
LA10/LALE
H29
O
LBVDD
—
LBCTL
A22
O
LBVDD
—
LCLK0
B22
O
LBVDD
—
LCLK1
C23
O
LBVDD
—
LCLK2
B23
O
LBVDD
—
LCS_B0
D25
O
LBVDD
—
LCS_B1
F19
O
LBVDD
—
LCS_B2
C27
O
LBVDD
—
LCS_B3
D24
O
LBVDD
—
LCS_B4/LDP0
C24
I/O
LBVDD
—
LCS_B5/LDP1
B29
I/O
LBVDD
—
LA7/LCS_B6/LDP2
E29
I/O
LBVDD
—
LA8/LCS_B7/LDP3
F29
I/O
LBVDD
—
LFCLE/LGPL0
D21
O
LBVDD
—
LFALE/LGPL1
A26
O
LBVDD
—
LFRE_B/LGPL2/LOE_B
F22
O
LBVDD
—
LFWP_B/LGPL3
C21
O
LBVDD
—
LGPL4/LFRB_B/LGTA_B/
LUPWAIT/LPBSE
J29
I/O
LBVDD
17
LA9/LGPL5
G29
O
LBVDD
—
LSYNC_IN
A21
I
LBVDD
—
LSYNC_OUT
D23
O
LBVDD
—
LWE_B0/LFWE0/LBS_B0
E22
O
LBVDD
—
LWE_B1/LFWE1/LBS_B1
B25
O
LBVDD
—
LWE_B2/LFWE2/LBS_B2
E27
O
LBVDD
—
LWE_B3/LFWE3/LBS_B3
F28
O
LBVDD
—
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
97
Table 68. TePBGA II Pinout Listing (continued)
Signal
Package Pin Number
Pin Type
Power Supply
Note
eTSEC1/GPIO1/GPIO2/CFG_RESET Interface
TSEC1_COL/GPIO2[20]
AF22
I/O
LVDD1
17
TSEC1_CRS/GPIO2[21]
AE20
I/O
LVDD1
17
TSEC1_GTX_CLK
AJ25
O
LVDD1
17
TSEC1_RX_CLK
AG22
I
LVDD1
17
TSEC1_RX_DV
AD19
I
LVDD1
17
TSEC1_RX_ER/GPIO2[25]
AD20
I/O
LVDD1
17
TSEC1_RXD0
AD22
I
LVDD1
17
TSEC1_RXD1
AE21
I
LVDD1
17
TSEC1_RXD2
AE22
I
LVDD1
17
TSEC1_RXD3
AD21
I
LVDD1
17
TSEC1_TX_CLK
AJ22
I
LVDD1
17
TSEC1_TX_EN
AG23
O
LVDD1
17
TSEC1_TX_ER/CFG_LBMUX
AH22
I/O
LVDD1
17
TSEC1_TXD0/
CFG_RESET_SOURCE[0]
AD23
I/O
LVDD1
17
TSEC1_TXD1/
CFG_RESET_SOURCE[1]
AE23
I/O
LVDD1
17
TSEC1_TXD2/
CFG_RESET_SOURCE[2]
AF23
I/O
LVDD1
17
TSEC1_TXD3/
CFG_RESET_SOURCE[3]
AJ24
I/O
LVDD1
17
EC_GTX_CLK125
AH24
I
LVDD1
17
EC_MDC/CFG_CLKIN_DIV
AJ21
I/O
LVDD1
17
EC_MDIO
AH21
I/O
LVDD1
17
eTSEC2/GPIO1 Interface
TSEC2_COL/GPIO1[21]/
TSEC1_TMR_TRIG1
AJ27
I/O
LVDD2
17
TSEC2_CRS/GPIO1[22]/
TSEC1_TMR_TRIG2
AG29
I/O
LVDD2
17
TSEC2_GTX_CLK
AF28
O
LVDD2
17
TSEC2_RX_CLK/
TSEC1_TMR_CLK
AF25
I
LVDD2
17
TSEC2_RX_DV/GPIO1[23]
AF26
I/O
LVDD2
17
TSEC2_RX_ER/GPIO1[25]
AG25
I/O
LVDD2
17
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
98
Freescale Semiconductor
Table 68. TePBGA II Pinout Listing (continued)
Signal
Package Pin Number
Pin Type
Power Supply
Note
TSEC2_RXD0/GPIO1[16]
AE28
I/O
LVDD2
17
TSEC2_RXD1/GPIO1[15]
AE29
I/O
LVDD2
17
TSEC2_RXD2/GPIO1[14]
AH26
I/O
LVDD2
17
TSEC2_RXD3/GPIO1[13]
AH25
I/O
LVDD2
17
TSEC2_TX_CLK/GPIO2[24]/
TSEC1_TMR_GCLK
AG28
I/O
LVDD2
17
TSEC2_TX_EN/GPIO1[12]/
TSEC1_TMR_ALARM2
AJ26
I/O
LVDD2
17
TSEC2_TX_ER/GPIO1[24]/
TSEC1_TMR_ALARM1
AG26
I/O
LVDD2
17
TSEC2_TXD0/GPIO1[20]
AH28
I/O
LVDD2
17
TSEC2_TXD1/GPIO1[19]/
TSEC1_TMR_PP1
AF27
I/O
LVDD2
17
TSEC2_TXD2/GPIO1[18]/
TSEC1_TMR_PP2
AJ28
I/O
LVDD2
17
TSEC2_TXD3/GPIO1[17]/
TSEC1_TMR_PP3
AF29
I/O
LVDD2
17
GPIO1 Interface
GPIO1[0]/GTM1_TIN1/
GTM2_TIN2/DREQ0_B
P25
I/O
OVDD
—
GPIO1[1]/GTM1_TGATE1_B/
GTM2_TGATE2_B/DACK0_B
N25
I/O
OVDD
—
GPIO1[2]/GTM1_TOUT1_B/
DDONE0_B
N26
I/O
OVDD
—
GPIO1[3]/GTM1_TIN2/
GTM2_TIN1/DREQ1_B
B9
I/O
OVDD
—
GPIO1[4]/GTM1_TGATE2_B/
GTM2_TGATE1_B/DACK1_B
N29
I/O
OVDD
—
GPIO1[5]/GTM1_TOUT2_B/
GTM2_TOUT1_B/DDONE1_B
M29
I/O
OVDD
—
GPIO1[6]/GTM1_TIN3/
GTM2_TIN4/DREQ2_B
A9
I/O
OVDD
—
GPIO1[7]/GTM1_TGATE3_B/
GTM2_TGATE4_B/DACK2_B
B10
I/O
OVDD
—
GPIO1[8]/GTM1_TOUT3_B/
DDONE2_B
J26
I/O
OVDD
—
GPIO1[9]/GTM1_TIN4/
GTM2_TIN3/DREQ3_B
J24
I/O
OVDD
—
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
99
Table 68. TePBGA II Pinout Listing (continued)
Signal
Package Pin Number
Pin Type
Power Supply
Note
GPIO1[10]/GTM1_TGATE4_B/
GTM2_TGATE3_B/DACK3_B
J27
I/O
OVDD
—
GPIO1[11]/GTM1_TOUT4_B/
GTM2_TOUT3_B/DDONE3_B
P24
I/O
OVDD
—
USB/GPIO2 Interface
USBDR_CLK/GPIO2[23]
AJ11
I/O
OVDD
—
USBDR_DIR_DPPULLUP/
GPIO2[9]
AG12
I/O
OVDD
—
USBDR_NXT/GPIO2[8]
AJ10
I/O
OVDD
—
USBDR_PCTL0/GPIO2[11]/
SD_DAT2
AF10
I/O
OVDD
—
USBDR_PCTL1/GPIO2[22]/
SD_DAT3
AE9
I/O
OVDD
—
USBDR_PWRFAULT/
GPIO2[10]/SD_DAT1
AG13
I/O
OVDD
—
USBDR_STP_SUSPEND
AH12
O
OVDD
12
USBDR_D0_ENABLEN/
GPIO2[0]
AG10
I/O
OVDD
—
USBDR_D1_SER_TXD/
GPIO2[1]
AF13
I/O
OVDD
—
USBDR_D2_VMO_SE0/
GPIO2[2]
AG11
I/O
OVDD
—
USBDR_D3_SPEED/GPIO2[3]
AH11
I/O
OVDD
—
USBDR_D4_DP/GPIO2[4]
AG9
I/O
OVDD
—
USBDR_D5_DM/GPIO2[5]
AF9
I/O
OVDD
—
USBDR_D6_SER_RCV/
GPIO2[6]
AH13
I/O
OVDD
—
USBDR_D7_DRVVBUS/
GPIO2[7]
AH10
I/O
OVDD
—
I2C Interface
IIC1_SCL
C12
I/O
OVDD
2
IIC1_SDA
B12
I/O
OVDD
2
IIC2_SCL
A10
I/O
OVDD
2
IIC2_SDA
A12
I/O
OVDD
2
I
OVDD
—
JTAG Interface
TCK
B13
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
100
Freescale Semiconductor
Table 68. TePBGA II Pinout Listing (continued)
Signal
Package Pin Number
Pin Type
Power Supply
Note
TDI
E14
I
OVDD
4
TDO
C13
O
OVDD
3
TMS
A13
I
OVDD
4
TRST_B
E11
I
OVDD
4
PCI Signals
PCI_AD0
P26
I/O
OVDD
—
PCI_AD1
N28
I/O
OVDD
—
PCI_AD2
P29
I/O
OVDD
—
PCI_AD3
P27
I/O
OVDD
—
PCI_AD4
R26
I/O
OVDD
—
PCI_AD5
R29
I/O
OVDD
—
PCI_AD6
T24
I/O
OVDD
—
PCI_AD7
T25
I/O
OVDD
—
PCI_AD8
R27
I/O
OVDD
—
PCI_AD9
P28
I/O
OVDD
—
PCI_AD10
U25
I/O
OVDD
—
PCI_AD11
R28
I/O
OVDD
—
PCI_AD12
U26
I/O
OVDD
—
PCI_AD13
U24
I/O
OVDD
—
PCI_AD14
T29
I/O
OVDD
—
PCI_AD15
V24
I/O
OVDD
—
PCI_AD16
Y26
I/O
OVDD
—
PCI_AD17
V28
I/O
OVDD
—
PCI_AD18
AA25
I/O
OVDD
—
PCI_AD19
AA26
I/O
OVDD
—
PCI_AD20
W29
I/O
OVDD
—
PCI_AD21
AA24
I/O
OVDD
—
PCI_AD22
AA27
I/O
OVDD
—
PCI_AD23
AC26
I/O
OVDD
—
PCI_AD24
AB25
I/O
OVDD
—
PCI_AD25
AB24
I/O
OVDD
—
PCI_AD26
AA28
I/O
OVDD
—
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
101
Table 68. TePBGA II Pinout Listing (continued)
Signal
Package Pin Number
Pin Type
Power Supply
Note
PCI_AD27
AA29
I/O
OVDD
—
PCI_AD28
AC24
I/O
OVDD
—
PCI_AD29
AC25
I/O
OVDD
—
PCI_AD30
AB28
I/O
OVDD
—
PCI_AD31
AE24
I/O
OVDD
—
PCI_C_BE_B0
T26
I/O
OVDD
—
PCI_C_BE_B1
T28
I/O
OVDD
—
PCI_C_BE_B2
V29
I/O
OVDD
—
PCI_C_BE_B3
Y29
I/O
OVDD
—
PCI_DEVSEL_B
U28
I/O
OVDD
5
PCI_FRAME_B
V27
I/O
OVDD
—
PCI_GNT_B0
AE27
I/O
OVDD
—
PCI_GNT_B[1]/
CPCI_HS_LED
AC28
O
OVDD
—
PCI_GNT_B[2]/
CPCI_HS_ENUM
AD27
O
OVDD
—
PCI_GNT_B[3]/PCI_PME
AC27
O
OVDD
—
PCI_GNT_B[4]
AE25
O
OVDD
—
PCI_IDSEL
W28
I
OVDD
5
PCI_INTA_B/IRQ_OUT_B
AD29
O
OVDD
2
PCI_IRDY_B
U29
I/O
OVDD
5
PCI_PAR
V25
I/O
OVDD
—
PCI_PERR_B
Y25
I/O
OVDD
5
PCI_REQ_B0
AE26
I/O
OVDD
—
PCI_REQ_B[1]/CPCI_HS_ES
AC29
I
OVDD
—
PCI_REQ_B2
AB29
I
OVDD
—
PCI_REQ_B3
AD26
I
OVDD
—
PCI_REQ_B4
W27
I
OVDD
—
PCI_RESET_OUT_B
AD28
O
OVDD
—
PCI_SERR_B
V26
I/O
OVDD
5
PCI_STOP_B
W26
I/O
OVDD
5
PCI_TRDY_B
Y24
I/O
OVDD
5
M66EN
AD15
I
OVDD
—
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
102
Freescale Semiconductor
Table 68. TePBGA II Pinout Listing (continued)
Signal
Package Pin Number
Pin Type
Power Supply
Note
Programmable Interrupt Controller (PIC) Interface
MCP_OUT_B
AD14
O
OVDD
2
IRQ_B0/MCP_IN_B/GPIO2[12]
F9
I/O
OVDD
—
IRQ_B1/GPIO2[13]
E9
I/O
OVDD
—
IRQ_B2/GPIO2[14]
F10
I/O
OVDD
—
IRQ_B3/GPIO2[15]
D9
I/O
OVDD
—
IRQ_B4/GPIO2[16]/SD_WP
C9
I/O
OVDD
—
IRQ_B5/GPIO2[17]/
USBDR_PWRFAULT
AE10
I/O
OVDD
—
IRQ_B6/GPIO2[18]
AD10
I/O
OVDD
—
IRQ_B7/GPIO2[19]
AD9
I/O
OVDD
—
O
OVDD
—
PMC Interface
QUIESCE_B
D13
SerDes1 Interface
L1_SD_IMP_CAL_RX
AJ14
I
L1_XPADVDD
—
L1_SD_IMP_CAL_TX
AG19
I
L1_XPADVDD
—
L1_SD_REF_CLK
AJ17
I
L1_XPADVDD
—
L1_SD_REF_CLK_B
AH17
I
L1_XPADVDD
—
L1_SD_RXA_N
AJ15
I
L1_XPADVDD
—
L1_SD_RXA_P
AH15
I
L1_XPADVDD
—
L1_SD_RXE_N
AJ19
I
L1_XPADVDD
—
L1_SD_RXE_P
AH19
I
L1_XPADVDD
—
L1_SD_TXA_N
AF15
O
L1_XPADVDD
—
L1_SD_TXA_P
AE15
O
L1_XPADVDD
—
L1_SD_TXE_N
AF18
O
L1_XPADVDD
—
L1_SD_TXE_P
AE18
O
L1_XPADVDD
—
L1_SDAVDD_0
AJ18
SerDes PLL
Power
(1.0 or 1.05 V)
—
—
L1_SDAVSS_0
AG17
SerDes PLL
GND
—
—
L1_XCOREVDD
AH14, AJ16, AF17, AH20, AJ20
SerDes Core
Power
(1.0 or 1.05 V)
—
—
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
103
Table 68. TePBGA II Pinout Listing (continued)
Signal
Package Pin Number
Pin Type
Power Supply
Note
L1_XCOREVSS
AG14, AG15, AG16, AH16, AG18, AG20
SerDes Core
GND
—
—
L1_XPADVDD
AE16, AF16, AD18, AE19, AF19
SerDes I/O
Power (1.0 or
1.05 V)
—
—
L1_XPADVSS
AF14, AE17, AF20
SerDes I/O
GND
—
—
SerDes2 Interface
L2_SD_IMP_CAL_RX
C19
I
L2_XPADVDD
—
L2_SD_IMP_CAL_TX
C15
I
L2_XPADVDD
—
L2_SD_REF_CLK
B17
I
L2_XPADVDD
—
L2_SD_REF_CLK_B
A17
I
L2_XPADVDD
—
L2_SD_RXA_N
A19
I
L2_XPADVDD
—
L2_SD_RXA_P
B19
I
L2_XPADVDD
—
L2_SD_RXE_N
A15
I
L2_XPADVDD
—
L2_SD_RXE_P
B15
I
L2_XPADVDD
—
L2_SD_TXA_N
D18
O
L2_XPADVDD
—
L2_SD_TXA_P
E18
O
L2_XPADVDD
—
L2_SD_TXE_N
D15
O
L2_XPADVDD
—
L2_SD_TXE_P
E15
O
L2_XPADVDD
—
L2_SDAVDD_0
A16
SerDes PLL
Power
(1.0 or 1.05 V)
—
—
L2_SDAVSS_0
C17
SerDes PLL
GND
—
—
L2_XCOREVDD
A14, B14, D17, B18, B20
SerDes Core
Power
(1.0 or 1.05 V)
—
—
L2_XCOREVSS
C14, C16, A18, C18, A20, C20
SerDes Core
GND
—
—
L2_XPADVDD
D14, E16, F18, D19, E19
SerDes I/O
Power (1.0 or
1.05 V)
—
—
L2_XPADVSS
D16, E17, D20
SerDes I/O
GND
—
—
I/O
OVDD
—
SPI Interface
SPICLK/SD_CLK
AH9
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
104
Freescale Semiconductor
Table 68. TePBGA II Pinout Listing (continued)
Signal
Package Pin Number
Pin Type
Power Supply
Note
SPIMISO/SD_DAT0
AD11
I/O
OVDD
—
SPIMOSI/SD_CMD
AJ9
I/O
OVDD
—
SPISEL_B/SD_CD
AE11
I
OVDD
—
System Control Interface
SRESET_B
AD12
I/O
OVDD
2
HRESET_B
AE12
I/O
OVDD
1
PORESET_B
AE14
I
OVDD
—
Test Interface
TEST
E10
I
OVDD
10
TEST_SEL0
D10
I
—
13
TEST_SEL1
D12
I
OVDD
14
I
—
15
Thermal Management
Reserved
F15
Power Supply Signals
LVDD1
AC21, AG21, AH23
Power for
eTSEC 1 I/O
(2.5 V, 3.3 V)
LVDD1
—
LVDD2
AG24, AH27, AH29
Power for
eTSEC 2 I/O
(2.5 V, 3.3 V)
LVDD2
—
LBVDD
G20, D22, A24, G26, D27, A28
Power for eLBC
(3.3, 2.5, or
1.8 V)
LBVDD
—
VDD
K10, L10, M10, N10, P10, R10, T10, U10,
V10, W10, Y10, K11, R11, Y11, K12, Y12,
K13, Y13, K14, Y14, K15, L15, W15, Y15,
K16, Y16, K17, Y17, K18, Y18, K19, R19,
Y19, K20, L20, M20, N20, P20, R20, T20,
U20, V20, W20, Y20
Power for Core
(1.0 V or 1.5 V)
VDD
—
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
105
Table 68. TePBGA II Pinout Listing (continued)
Signal
Package Pin Number
Pin Type
Power Supply
Note
GND
(VSS)
A1, AJ1, H2, N2, AA2, AD2, D3, R3, AF3, A4,
F4, J4, L4, V4, Y4, AB4, B5, E5, P5, AH5, K6,
T6, AA6, AD6, AG6, F7, J7, Y7, AJ7, B8,
AE8, AG8, G9, AC9, B11, D11, F11, L11,
M11, N11, P11, T11, U11, V11, W11,L12,
M12, N12, P12, R12, T12, U12, V12, W12,
E12, E13, L13, M13, N13, P13, R13, T13,
U13, V13, W13, AE13, AJ13, F14, L14, M14,
N14, P14, R14, T14, U14, V14, W14, M15,
N15, P15, R15, T15, U15, V15, L16, M16,
N16, P16, R16, T16, U16, V16, W16, L17,
M17, N17, P17, R17, T17, U17, V17, W17,
L18, M18, N18, P18, R18, T18, U18, V18,
W18, L19, M19, N19, P19, T19, U19, V19,
W19, AC20, G21, AF21, C22, J23, AA23,
AJ23, B24, W24, AF24, K25, R25, AD25,
D26, G27, M27, T27, Y27, AB27, AG27, A29,
AJ29
—
—
—
AVDD_C
AD13
Power for e300
core PLL (1.0 V
or 1.05 V)
—
16
AVDD_L
F13
Power for eLBC
PLL (1.0 V or
1.05 V)
—
16
AVDD_P
F12
Power for
system PLL
(1.0 V or 1.05 V)
—
16
GVDD
A2, D2, R2, U2, AC2, AF2, AJ2, F3, H3, L3,
N3, Y3, AB3, B4, P4, AF4, AH4, C5, F5, K5,
V5, AA5, AD5, N6, R6, AJ6, B7, E7, K7, AA7,
AE7, AG7, AD8
Power for DDR
SDRAM I/O
Voltage (2.5 or
1.8 V)
GVDD
—
OVDD
AC10, AF12, AJ12, K23, Y23, R24, AD24,
L25, W25, AB26, U27, M28, Y28, G10, A11,
C11
PCI, USB, and
other Standard
(3.3 V)
OVDD
—
—
—
8
No Connect
NC
F16, F17, AD16, AD17
Pull Down
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
106
Freescale Semiconductor
Table 68. TePBGA II Pinout Listing (continued)
Signal
Package Pin Number
Pin Type
Power Supply
Note
Pull Down
B16, AH18
—
—
7
Notes:
1. This pin is an open drain signal. A weak pull-up resistor (1 kΩ) should be placed on this pin to OVDD.
2. This pin is an open drain signal. A weak pull-up resistor (2–10 kΩ) should be placed on this pin to OVDD.
3. This output is actively driven during reset rather than being released to high impedance during reset.
4. These JTAG pins have weak internal pull-up P-FETs that are always enabled.
5. This pin should have a weak pull up if the chip is in PCI host mode. Follow PCI Specification recommendation and see
AN3665, “MPC837xE Design Checklist,” for more details.
6. These are On Die Termination pins, used to control DDR2 memories internal termination resistance.
7. This pin must always be tied to GND using a 0 Ω resistor.
8. This pin must always be left not connected.
9. For DDR2 operation, it is recommended that MDIC0 be tied to GND using an 18.2 Ω resistor and MDIC1 be tied to DDR
power using an 18.2 Ω resistor.
10.This pin must always be tied low. If it is left floating it may cause the device to malfunction.
11.See AN3665, “MPC837xE Design Checklist,” for proper DDR termination.
12.This pin must not be pulled down during PORESET.
13.This pin must always be tied to GND.
14.This pin must always be tied to OVDD.
15.Open or tie to GND.
16.Voltage settings are dependent on the frequency used; see Table 3.
17.See AN3665, “MPC837xE Design Checklist,” for proper termination.
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
107
22 Clocking
This figure shows the internal distribution of clocks within this chip.
e300 core
Core PLL
csb_clk
to DDR
memory
controller
ddr_clk
System PLL
Clock
Unit lbiu_clk
core_clk
DDR
Clock
Div
/2
6
6
/n
MCK[0:5]
MCK[0:5]
DDR
Memory
Device
LCLK[0:2]
to local bus
memory
LBIU
controller
DLL
LSYNC_OUT
Local Bus
Memory
Device
LSYNC_IN
csb_clk to rest
of the device
PCI_CLK/
PCI_SYNC_IN
CFG_CLKIN_DIV
CLKIN
PCI_SYNC_OUT
PCI Clock
Divider
5
PCI_CLK[0:4]
Figure 67. Clock Subsystem
The primary clock source for the device can be one of two inputs, CLKIN or PCI_CLK, depending on
whether the device is configured in PCI host or PCI agent mode. When the device is configured as a PCI
host device, CLKIN is its primary input clock. CLKIN feeds the PCI clock divider (÷2) and the
multiplexors for PCI_SYNC_OUT and PCI_CLK_OUT. The CFG_CLKIN_DIV configuration input
selects whether CLKIN or CLKIN/2 is driven out on the PCI_SYNC_OUT signal. The OCCR[PCICOEn]
parameters select whether CFG_CLKIN_DIV is driven out on the PCI_CLK_OUTn signals.
PCI_SYNC_OUT is connected externally to PCI_SYNC_IN to allow the internal clock subsystem to
synchronize to the system PCI clocks. PCI_SYNC_OUT must be connected properly to PCI_SYNC_IN,
with equal delay to all PCI agent devices in the system, to allow the device to function. When the device
is configured as a PCI agent device, PCI_CLK is the primary input clock. When the device is configured
as a PCI agent device the CLKIN signal should be tied to GND.
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
108
Freescale Semiconductor
As shown in Figure 67, the primary clock input (frequency) is multiplied up by the system phase-locked
loop (PLL) and the clock unit to create the coherent system bus clock (csb_clk), the internal clock for the
DDR controller (ddr_clk), and the internal clock for the local bus interface unit (lbiu_clk).
The csb_clk frequency is derived from a complex set of factors that can be simplified into the following
equation:
csb_clk = {PCI_SYNC_IN × (1 + CFG_CLKIN_DIV)} × SPMF
Eqn. 20
In PCI host mode, PCI_SYNC_IN × (1 + CFG_CLKIN_DIV) is the CLKIN frequency.
The csb_clk serves as the clock input to the e300 core. A second PLL inside the e300 core multiplies up
the csb_clk frequency to create the internal clock for the e300 core (core_clk). The system and core PLL
multipliers are selected by the SPMF and COREPLL fields in the reset configuration word low register
(RCWLR) which is loaded at power-on reset or by one of the hard-coded reset options. See Chapter 4,
“Reset, Clocking, and Initialization,” in the MPC8379E Reference Manual for more information on the
clock subsystem.
The internal ddr_clk frequency is determined by the following equation:
ddr_clk = csb_clk × (1 + RCWLR[DDRCM])
Eqn. 21
Note that ddr_clk is not the external memory bus frequency; ddr_clk passes through the DDR clock divider
(÷2) to create the differential DDR memory bus clock outputs (MCK and MCK). However, the data rate
is the same frequency as ddr_clk.
The internal lbiu_clk frequency is determined by the following equation:
lbiu_clk = csb_clk × (1 + RCWLR[LBCM])
Eqn. 22
Note that lbiu_clk is not the external local bus frequency; lbiu_clk passes through the LBIU clock divider
to create the external local bus clock outputs (LCLK[0:2]). The eLBC clock divider ratio is controlled by
LCRR[CLKDIV].
Some of the internal units may be required to be shut off or operate at lower frequency than the csb_clk
frequency. Those units have a default clock ratio that can be configured by a memory mapped register after
the device comes out of reset. Table 69 specifies which units have a configurable clock frequency.
Table 69. Configurable Clock Units
Unit
Default Frequency
Options
eTSEC1, eTSEC2
csb_clk/3
Off, csb_clk, csb_clk/2, csb_clk/3
eSDHC and I2C11
csb_clk/3
Off, csb_clk, csb_clk/2, csb_clk/3
Security block
csb_clk/3
Off, csb_clk, csb_clk/2, csb_clk/3
USB DR
csb_clk/3
Off, csb_clk, csb_clk/2, csb_clk/3
PCI and DMA complex
csb_clk
PCI Express1, 2
1
csb_clk/3
Off, csb_clk
Off, csb_clk, csb_clk/2, csb_clk/3
This only applies to I2C1 (I2C2 clock is not configurable).
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
109
This table provides the operating frequencies for the TePBGA II package under recommended operating
conditions (see Table 3).
Table 70. Operating Frequencies for TePBGA II
Minimum Operating
Frequency (MHz)
Maximum Operating
Frequency (MHz)
e300 core frequency (core_clk)
333
800
Coherent system bus frequency (csb_clk)
133
400
DDR2 memory bus frequency (MCK)1
250
400
167
333
Local bus frequency (LCLKn)1
—
133
Local bus controller frequency (lbc_clk)
—
400
PCI input frequency (CLKIN or PCI_CLK)
25
66
eTSEC frequency
133
400
Security encryption controller frequency
—
200
USB controller frequency
—
200
eSDHC controller frequency
—
200
PCI Express controller frequency
—
400
Parameter1
DDR1 memory bus frequency (MCK)
2
Notes:
1. The CLKIN frequency, RCWLR[SPMF], and RCWLR[COREPLL] settings must be chosen such that the resulting csb_clk,
MCK, LCLK[0:2], and core_clk frequencies do not exceed their respective maximum or minimum operating frequencies.
The value of SCCR[xCM] must be programmed such that the maximum internal operating frequency of the Security core,
USB modules, SATA, and eSDHC will not exceed their respective value listed in this table.
2. The DDR data rate is 2× the DDR memory bus frequency.
3. The local bus frequency is ½, ¼, or 1/8 of the lbiu_clk frequency (depending on LCRR[CLKDIV]) which is in turn 1× or 2×
the csb_clk frequency (depending on RCWLR[LBCM]).
22.1
System PLL Configuration
The system PLL is controlled by the RCWLR[SPMF] parameter. The system PLL VCO frequency
depends on RCWLR[DDRCM] and RCWLR[LBCM]. Table 71 shows the multiplication factor encodings
for the system PLL.
NOTE
If RCWLR[DDRCM] and RCWLR[LBCM] are both cleared, the system
PLL VCO frequency = (CSB frequency) × (System PLL VCO Divider).
If either RCWLR[DDRCM] or RCWLR[LBCM] are set, the system PLL
VCO frequency = 2 × (CSB frequency) × (System PLL VCO Divider).
The VCO divider needs to be set properly so that the System PLL VCO
frequency is in the range of 400–800 MHz.
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
110
Freescale Semiconductor
Table 71. System PLL Multiplication Factors
RCWLR[SPMF]
System PLL Multiplication Factor
0000
Reserved
0001
Reserved
0010
×2
0011
×3
0100
×4
0101
×5
0110
×6
0111–1111
× 7 to × 15
As described in Section 22, “Clocking,” The LBIUCM, DDRCM, and SPMF parameters in the reset
configuration word low and the CFG_CLKIN_DIV configuration input signal select the ratio between the
primary clock input (CLKIN or PCI_CLK) and the internal coherent system bus clock (csb_clk). Table 73
and Table 74 show the expected frequency values for the CSB frequency for select csb_clk to
CLKIN/PCI_SYNC_IN ratios.
The RCWLR[SVCOD] denotes the system PLL VCO internal frequency as shown in Table 72.
Table 72. System PLL VCO Divider
RCWLR[SVCOD]
VCO Division Factor
00
4
01
8
10
2
11
1
Table 73. CSB Frequency Options for Host Mode
Input Clock Frequency (MHz)2
CFG_CLKIN_DIV
at Reset1
SPMF
csb_clk :
Input Clock Ratio 1
25
33.33
66.67
csb_clk Frequency (MHz)
High
0010
2:1
133
High
0011
3:1
200
High
0100
4:1
133
267
High
0101
5:1
167
333
High
0110
6:1
200
400
150
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
111
Table 73. CSB Frequency Options for Host Mode (continued)
Input Clock Frequency (MHz)2
CFG_CLKIN_DIV
at Reset1
SPMF
csb_clk :
Input Clock Ratio 1
25
33.33
66.67
csb_clk Frequency (MHz)
High
0111
7:1
175
233
High
1000
8:1
200
267
High
1001
9:1
225
300
High
1010
10 : 1
250
333
High
1011
11 : 1
275
367
High
1100
12 : 1
300
400
High
1101
13 : 1
325
High
1110
14 : 1
350
High
1111
15 : 1
375
Notes:
1. CFG_CLKIN_DIV select the ratio between CLKIN and PCI_SYNC_OUT.
2. CLKIN is the input clock in host mode; PCI_CLK is the input clock in agent mode.
Table 74. CSB Frequency Options for Agent Mode
Input Clock Frequency (MHz)2
CFG_CLKIN_DIV
at reset1
SPMF
csb_clk :
Input Clock Ratio1
25
33.33
66.67
csb_clk Frequency (MHz)
Low
0010
2:1
133
Low
0011
3:1
200
Low
0100
4:1
133
267
Low
0101
5:1
167
333
Low
0110
6:1
200
400
150
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
112
Freescale Semiconductor
Table 74. CSB Frequency Options for Agent Mode (continued)
Input Clock Frequency (MHz)2
CFG_CLKIN_DIV
at reset1
csb_clk :
Input Clock Ratio1
SPMF
25
33.33
66.67
csb_clk Frequency (MHz)
Low
0111
7:1
175
233
Low
1000
8:1
200
267
Low
1001
9:1
225
300
Low
1010
10 : 1
250
333
Low
1011
11 : 1
275
367
Low
1100
12 : 1
300
400
Low
1101
13 : 1
325
Low
1110
14 : 1
350
Low
1111
15 : 1
375
Notes:
1. CFG_CLKIN_DIV doubles csb_clk if set high.
2. CLKIN is the input clock in host mode; PCI_CLK is the input clock in agent mode.
22.2
Core PLL Configuration
RCWLR[COREPLL] selects the ratio between the internal coherent system bus clock (csb_clk) and the
e300 core clock (core_clk). Table 75 shows the encodings for RCWLR[COREPLL]. COREPLL values
that are not listed in Table 75 should be considered as reserved.
NOTE
Core VCO frequency = core frequency × VCO divider
VCO divider has to be set properly so that the core VCO frequency is in the
range of 800–1600 MHz.
Table 75. e300 Core PLL Configuration
RCWLR[COREPLL]
core_clk : csb_clk Ratio
VCO Divider 1
0–1
2–5
6
nn
0000
0
PLL bypassed
(PLL off, csb_clk clocks core directly)
PLL bypassed
(PLL off, csb_clk clocks core
directly)
11
nnnn
n
n/a
n/a
00
0001
0
1:1
2
01
0001
0
1:1
4
10
0001
0
1:1
8
00
0001
1
1.5:1
2
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
113
Table 75. e300 Core PLL Configuration (continued)
RCWLR[COREPLL]
core_clk : csb_clk Ratio
VCO Divider 1
0–1
2–5
6
01
0001
1
1.5:1
4
10
0001
1
1.5:1
8
00
0010
0
2:1
2
01
0010
0
2:1
4
10
0010
0
2:1
8
00
0010
1
2.5:1
2
01
0010
1
2.5:1
4
10
0010
1
2.5:1
8
00
0011
0
3:1
2
01
0011
0
3:1
4
10
0011
0
3:1
8
00
0011
1
3.5:1
2
01
0011
1
3.5:1
4
10
0011
1
3.5:1
8
00
0100
0
4:1
2
01
0100
0
4:1
4
10
0100
0
4:1
8
Notes:
1. Core VCO frequency = Core frequency × VCO divider. Note that VCO divider has to be set properly so that the core VCO
frequency is in the range of 800–1600 MHz.
22.3
Suggested PLL Configurations
This table shows suggested PLL configurations for different input clocks (LBCM = 0).
Table 76. Example Clock Frequency Combinations
eLBC 1
Ref 1 LBCM DDRCM SVCOD SPMF
DDR data
Sys
CSB1,3
rate1,4
VCO1,2
e300 Core 1
/2
/4
/8
×1
× 1.5
×2
× 2.5
×3
25.0
0
1
2
5
500
125
250
62.5
31.3
15.6
—
—
—
—
375
25.0
0
1
2
6
600
150
300
75 6
37.5
18.8
—
—
—
375
450
41.6
20.8
—
—
333
416
500
33.3
16.7
—
—
—
333
400
33.3
0
1
2
5
667
167
333
33.3
0
1
2
4
533
133
267
83.3
6
66.7
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
114
Freescale Semiconductor
Table 76. Example Clock Frequency Combinations (continued)
eLBC 1
Ref 1 LBCM DDRCM SVCOD SPMF
DDR data
Sys
CSB1,3
rate1,4
VCO1,2
e300 Core 1
/2
/4
/8
×1
× 1.5
×2
× 2.5
×3
48.0
0
1
2
3
576
144
288
72 6
36
18
—
—
—
360
432
66.7
0
1
2
2
533
133
266
66.7
33.3
16.7
—
—
—
333
400
25.0
0
0
4
8
800
200
200
100 6
50
25
—
—
400
500
600
6
66.7
33.3
—
400
533
667
800
50
25
—
—
400
500
600
50
—
600
800
—
—
33.3
—
400
533
667
800
41.6
333
500
667
—
—
50
400
600
800
—
—
33.3
0
0
2
8
533
266.7
267
133
50.0
0
0
4
4
800
200
200
100 6
50.0
0
0
2
8
800
400
66.7
0
0
2
4
533
266.7
400
5
267
—
133 6
100
6
66.7
6
66.7
0
0
2
5
667
333
333
—
83.3
66.7
0
0
2
6
800
400
400 5
—
100 6
Notes:
1. Values in MHz.
2. System PLL VCO range: 400–800 MHz.
3. CSB frequencies less than 133 MHz will not support Gigabit Ethernet rates.
4. Minimum data rate for DDR2 is 250 MHz and for DDR1 is 167 MHz.
5. Applies to DDR2 only.
6. Applies to eLBC PLL-enabled mode only.
23 Thermal
This section describes the thermal specifications of this chip.
23.1
Thermal Characteristics
This table provides the package thermal characteristics for the 689 31 × 31mm TePBGA II package.
Table 77. Package Thermal Characteristics for TePBGA II
Parameter
Symbol
Value
Unit
Note
Junction-to-ambient natural convection on single layer board (1s)
RθJA
21
°C/W
1, 2
Junction-to-ambient natural convection on four layer board (2s2p)
RθJA
15
°C/W
1, 2, 3
Junction-to-ambient (at 200 ft/min) on single layer board (1s)
RθJMA
16
°C/W
1, 3
Junction-to-ambient (at 200 ft/min) on four layer board (2s2p)
RθJMA
12
°C/W
1, 3
Junction-to-board thermal
RθJB
8
°C/W
4
Junction-to-case thermal
RθJC
6
°C/W
5
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
115
Table 77. Package Thermal Characteristics for TePBGA II (continued)
Parameter
Junction-to-package natural convection on top
Symbol
Value
Unit
Note
ψ JT
6
°C/W
6
Notes:
1. Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting site (board)
temperature, ambient temperature, air flow, power dissipation of other components on the board, and board thermal
resistance.
2. Per JEDEC JESD51-2 with the single layer board horizontal. Board meets JESD51-9 specification.
3. Per JEDEC JESD51-6 with the board horizontal.
4. Thermal resistance between the die and the printed circuit board per JEDEC JESD51-8. Board temperature is measured
on the top surface of the board near the package.
5. Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883 Method
1012.1).
6. Thermal characterization parameter indicating the temperature difference between package top and the junction
temperature per JEDEC JESD51-2. When Greek letters are not available, the thermal characterization parameter is written
as Psi-JT.
23.2
Thermal Management Information
For the following sections, PD = (VDD × IDD) + PI/O where PI/O is the power dissipation of the I/O drivers.
23.2.1
Estimation of Junction Temperature with Junction-to-Ambient
Thermal Resistance
An estimation of the chip junction temperature, TJ, can be obtained from the equation:
TJ = TA + (RθJA × PD)
where:
TJ = junction temperature (°C)
TA = ambient temperature for the package (°C)
RθJA = junction to ambient thermal resistance (°C/W)
PD = power dissipation in the package (W)
The junction to ambient thermal resistance is an industry-standard value that provides a quick and easy
estimation of thermal performance. Generally, the value obtained on a single layer board is appropriate for
a tightly packed printed circuit board. The value obtained on the board with the internal planes is usually
appropriate if the board has low power dissipation and the components are well separated. Test cases have
demonstrated that errors of a factor of two (in the quantity TJ – TA) are possible.
23.2.2
Estimation of Junction Temperature with Junction-to-Board
Thermal Resistance
NOTE
The heat sink cannot be mounted on the package.
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
116
Freescale Semiconductor
The thermal performance of a device cannot be adequately predicted from the junction to ambient thermal
resistance. The thermal performance of any component is strongly dependent on the power dissipation of
surrounding components. In addition, the ambient temperature varies widely within the application. For
many natural convection and especially closed box applications, the board temperature at the perimeter
(edge) of the package is approximately the same as the local air temperature near the device. Specifying
the local ambient conditions explicitly as the board temperature provides a more precise description of the
local ambient conditions that determine the temperature of the device.
At a known board temperature, the junction temperature is estimated using the following equation:
TJ = TA + (RθJB × PD)
where:
TA = ambient temperature for the package (°C)
RθJB = junction to board thermal resistance (°C/W) per JESD51-8
PD = power dissipation in the package (W)
When the heat loss from the package case to the air can be ignored, acceptable predictions of junction
temperature can be made. The application board should be similar to the thermal test condition: the
component is soldered to a board with internal planes.
23.2.3
Experimental Determination of Junction Temperature
NOTE
The heat sink cannot be mounted on the package.
To determine the junction temperature of the device in the application after prototypes are available, use
the thermal characterization parameter (ΨJT) to determine the junction temperature and a measure of the
temperature at the top center of the package case using the following equation:
TJ = TT + (ΨJT × PD)
where:
TJ = junction temperature (°C)
TT = thermocouple temperature on top of package (°C)
ΨJT = junction to ambient thermal resistance (°C/W)
PD = power dissipation in the package (W)
The thermal characterization parameter is measured per the JESD51-2 specification using a 40 gauge type
T thermocouple epoxied to the top center of the package case. The thermocouple should be positioned so
that the thermocouple junction rests on the package. A small amount of epoxy is placed over the
thermocouple junction and over about 1 mm of wire extending from the junction. The thermocouple wire
is placed flat against the package case to avoid measurement errors caused by cooling effects of the
thermocouple wire.
23.2.4
Heat Sinks and Junction-to-Case Thermal Resistance
For the power values the device is expected to operate at, it is anticipated that a heat sink will be required.
A preliminary estimate of heat sink performance can be obtained from the following first-cut approach.
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
117
The thermal resistance is expressed as the sum of a junction to case thermal resistance and a
case-to-ambient thermal resistance:
RθJA = RθJC + RθCA
where:
RθJA = junction to ambient thermal resistance (°C/W)
RθJC = junction to case thermal resistance (°C/W)
RθCA = case to ambient thermal resistance (°C/W)
RθJC is device-related and cannot be influenced by the user. The user controls the thermal environment to
change the case to ambient thermal resistance, RθCA. For instance, the user can change the size of the heat
sink, the air flow around the device, the interface material, the mounting arrangement on printed circuit
board, or change the thermal dissipation on the printed circuit board surrounding the device.
This first-cut approach overestimates the heat sink size required, since heat flow through the board is not
accounted for, which can be as much as one-third to one-half of the power generated in the package.
Accurate thermal design requires thermal modeling of the application environment using computational
fluid dynamics software which can model both the conduction cooling through the package and board and
the convection cooling due to the air moving through the application. Simplified thermal models of the
packages can be assembled using the junction-to-case and junction-to-board thermal resistances listed in
the thermal resistance table. More detailed thermal models can be made available on request.
The thermal performance of devices with heat sinks has been simulated with a few commercially available
heat sinks. The heat sink choice is determined by the application environment (temperature, air flow,
adjacent component power dissipation) and the physical space available. Because of the wide variety of
application environments, a single standard heat sink applicable to all cannot be specified.
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
118
Freescale Semiconductor
This table shows the heat sink thermal resistance for TePBGA II package with heat sinks, simulated in a
standard JEDEC environment, per JESD 51-6.
Table 78. Thermal Resistance with Heat Sink in Open Flow (TePBGA II)
Thermal Resistance
Heat Sink Assuming Thermal Grease
Air Flow
(°/W)
AAVID 30 × 30
× 9.4 mm Pin Fin
AAVID 31 × 35 × 23 mm Pin Fin
AAVID 43× 41× 16.5mm Pin Fin
Wakefield, 53
× 53 × 25 mm Pin Fin
Natural Convection
13.1
0.5 m/s
10.6
1 m/s
9.3
2 m/s
8.2
4 m/s
7.5
Natural Convection
11.1
0.5 m/s
8.5
1 m/s
7.7
2 m/s
7.2
4 m/s
6.8
Natural Convection
11.3
0.5 m/s
9.0
1 m/s
7.8
2 m/s
7.0
4 m/s
6.5
Natural Convection
9.7
0.5 m/s
7.7
1 m/s
6.8
2 m/s
6.4
4 m/s
6.1
Heat sink vendors include the following:
Aavid Thermalloy
www.aavidthermalloy.com
Alpha Novatech
www.alphanovatech.com
International Electronic Research Corporation (IERC)
www.ctscorp.com
Millennium Electronics (MEI)
www.mei-thermal.com
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
119
Tyco Electronics
Chip Coolers™
www.chipcoolers.com
Wakefield Engineering
www.wakefield.com
Interface material vendors include the following:
Chomerics, Inc.
www.chomerics.com
Dow-Corning Corporation
Dow-Corning Electronic Materials
www.dowcorning.com
Shin-Etsu MicroSi, Inc.
www.microsi.com
The Bergquist Company
www.bergquistcompany.com
23.3
Heat Sink Attachment
The device requires the use of heat sinks. When heat sinks are attached, an interface material is required,
preferably thermal grease and a spring clip. The spring clip should connect to the printed circuit board,
either to the board itself, to hooks soldered to the board, or to a plastic stiffener. Avoid attachment forces
that can lift the edge of the package or peel the package from the board. Such peeling forces reduce the
solder joint lifetime of the package. The recommended maximum compressive force on the top of the
package is 10 lb force (4.5 kg force). Any adhesive attachment should attach to painted or plastic surfaces,
and its performance should be verified under the application requirements.
23.3.1
Experimental Determination of the Junction Temperature with a
Heat Sink
When a heat sink is used, the junction temperature is determined from a thermocouple inserted at the
interface between the case of the package and the interface material. A clearance slot or hole is normally
required in the heat sink. Minimize the size of the clearance to minimize the change in thermal
performance caused by removing part of the thermal interface to the heat sink. Because of the experimental
difficulties with this technique, many engineers measure the heat sink temperature and then back calculate
the case temperature using a separate measurement of the thermal resistance of the interface. From this
case temperature, the junction temperature is determined from the junction to case thermal resistance.
TJ = TC + (RθJC × PD)
where:
TJ = junction temperature (°C)
TC = case temperature of the package (°C)
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
120
Freescale Semiconductor
RθJC = junction to case thermal resistance (°C/W)
PD = power dissipation (W)
24 System Design Information
This section provides electrical and thermal design recommendations for successful application of this
chip.
24.1
PLL Power Supply Filtering
Each of the PLLs listed above is provided with power through independent power supply pins. The AVDD
level should always be equivalent to VDD, and preferably these voltages will be derived directly from VDD
through a low frequency filter scheme.
There are a number of ways to reliably provide power to the PLLs, but the recommended solution is to
provide five independent filter circuits as illustrated in Figure 68, one to each of the five AVDD pins. By
providing independent filters to each PLL, the opportunity to cause noise injection from one PLL to the
other is reduced.
This circuit is intended to filter noise in the PLLs resonant frequency range from a 500 kHz to 10 MHz
range. It should be built with surface mount capacitors with minimum Effective Series Inductance (ESL).
Consistent with the recommendations of Dr. Howard Johnson in High Speed Digital Design: A Handbook
of Black Magic (Prentice Hall, 1993), multiple small capacitors of equal value are recommended over a
single large value capacitor.
Each circuit should be placed as close as possible to the specific AVDD pin being supplied to minimize
noise coupled from nearby circuits. It should be possible to route directly from the capacitors to the AVDD
pin, which is on the periphery of package, without the inductance of vias.
This figure shows the PLL power supply filter circuit.
10 Ω
VDD
AVDD (or L2AVDD)
2.2 µF
2.2 µF
GND
Low ESL Surface Mount Capacitors
Figure 68. PLL Power Supply Filter Circuit
24.2
Decoupling Recommendations
Due to large address and data buses, and high operating frequencies, the device can generate transient
power surges and high frequency noise in its power supply, especially while driving large capacitive loads.
This noise must be prevented from reaching other components in the device system, and the device itself
requires a clean, tightly regulated source of power. Therefore, it is recommended that the system designer
place at least one decoupling capacitor at each VDD, OVDD, GVDD, and LVDD pins of the device. These
decoupling capacitors should receive their power from separate VDD, OVDD, GVDD, LVDD, and GND
power planes in the PCB, utilizing short traces to minimize inductance. Capacitors may be placed directly
under the device using a standard escape pattern. Others may surround the part.
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
121
These capacitors should have a value of 0.01 or 0.1 µF. Only ceramic SMT (surface mount technology)
capacitors should be used to minimize lead inductance, preferably 0402 or 0603 sizes.
In addition, it is recommended that there be several bulk storage capacitors distributed around the PCB,
feeding the VDD, OVDD, GVDD, and LVDD planes, to enable quick recharging of the smaller chip
capacitors. These bulk capacitors should have a low ESR (equivalent series resistance) rating to ensure the
quick response time necessary. They should also be connected to the power and ground planes through two
vias to minimize inductance. Suggested bulk capacitors—100–330 µF (AVX TPS tantalum or Sanyo
OSCON).
24.3
Connection Recommendations
To ensure reliable operation, it is highly recommended that unused inputs be connected to an appropriate
signal level. Unused active low inputs should be tied to OVDD, GVDD, or LVDD as required. Unused
active high inputs should be connected to GND. All NC (no-connect) signals must remain unconnected.
Power and ground connections must be made to all external VDD, GVDD, LVDD, OVDD, and GND pins
of the device.
24.4
Output Buffer DC Impedance
The device drivers are characterized over process, voltage, and temperature. For all buses, the driver is a
push-pull single-ended driver type (open drain for I2C).
To measure Z0 for the single-ended drivers, an external resistor is connected from the chip pad to OVDD
or GND. Then, the value of each resistor is varied until the pad voltage is OVDD/2 (see Figure 69). The
output impedance is the average of two components, the resistances of the pull-up and pull-down devices.
When data is held high, SW1 is closed (SW2 is open) and RP is trimmed until the voltage at the pad equals
OVDD/2. RP then becomes the resistance of the pull-up devices. RP and RN are designed to be close to each
other in value. Then, Z0 = (RP + RN)/2.
OVDD
RN
SW2
Data
Pad
SW1
RP
OGND
Figure 69. Driver Impedance Measurement
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
122
Freescale Semiconductor
The value of this resistance and the strength of the driver’s current source can be found by making two
measurements. First, the output voltage is measured while driving logic 1 without an external differential
termination resistor. The measured voltage is V1 = Rsource × Isource. Second, the output voltage is measured
while driving logic 1 with an external precision differential termination resistor of value Rterm. The
measured voltage is V2 = (1/(1/R1 + 1/R2)) × Isource. Solving for the output impedance gives Rsource =
Rterm × (V1/V2 – 1). The drive current is then Isource = V1/Rsource.
This table summarizes the signal impedance targets. The driver impedance are targeted at minimum VDD,
nominal OVDD, 105°C.
Table 79. Impedance Characteristics
Impedance
Local Bus, Ethernet,
DUART, Control,
Configuration, Power
Management
PCI Signals
(not including PCI
output clocks)
PCI Output Clocks
(including
PCI_SYNC_OUT)
DDR DRAM
Symbol
Unit
RN
42 Target
25 Target
42 Target
20 Target
Z0
W
RP
42 Target
25 Target
42 Target
20 Target
Z0
W
Differential
NA
NA
NA
NA
ZDIFF
W
Note: Nominal supply voltages. See Table 2, Tj = 105°C.
24.5
Configuration Pin Muxing
The device provides the user with power-on configuration options which can be set through the use of
external pull-up or pull-down resistors of 4.7 kΩ on certain output pins (see customer visible configuration
pins). These pins are generally used as output only pins in normal operation.
While HRESET is asserted however, these pins are treated as inputs. The value presented on these pins
while HRESET is asserted, is latched when PORESET deasserts, at which time the input receiver is
disabled and the I/O circuit takes on its normal function. Careful board layout with stubless connections
to these pull-up/pull-down resistors coupled with the large value of the pull-up/pull-down resistor should
minimize the disruption of signal quality or speed for output pins thus configured.
24.6
Pull-Up Resistor Requirements
The device requires high resistance pull-up resistors (10 kΩ is recommended) on open drain type pins
including I2C pins and IPIC interrupt pins.
For more information on required pull-up resistors and the connections required for the JTAG interface,
see AN3665, “MPC837xE Design Checklist.”
25 Ordering Information
Ordering information for the parts fully covered by this specification document is provided in
Section 25.1, “Part Numbers Fully Addressed by This Document.”
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
Freescale Semiconductor
123
25.1
Part Numbers Fully Addressed by This Document
Table 80 provides the Freescale part numbering nomenclature for this chip. Note that the individual part
numbers correspond to a maximum processor core frequency. For available frequencies, contact your local
Freescale sales office. In addition to the processor frequency, the part numbering scheme also includes an
application modifier which may specify special application conditions. Each part number also contains a
revision code which refers to the die mask revision number.
Table 80. Part Numbering Nomenclature
MPC
8378
E
Encryption
Product
Part
Acceleratio
Code Identifier
n
MPC
8378
C
ZQ
AF
D
A
Temperature
Range 1
Package 2
e300 core
Frequency 3
DDR
Data Rate
Revision
Level 4
Blank = Not Blank = 0°C (Ta) VR = Pb-free
included
to 125°C (Tj)
689 TePBGA II
E = included C = –40°C (Ta)
to 125°C (Tj)
AN = 800 MHz G = 400 MHz Blank = Freescale
ATMC fab
AL = 667 MHz F = 333 MHz
AJ = 533 MHz D = 266 MHz A =
GlobalFoundries
AG = 400 MHz
fab
Note:
Contact local Freescale office on availability of parts with an extended temperature range.
2 See Section 21, “Package and Pin Listings,” for more information on the available package type.
3 Processor core frequencies supported by parts addressed by this specification only. Not all parts described in this
specification support all core frequencies. Additionally, parts addressed by Part Number Specifications may support
other maximum core frequencies.
4 No design changes occurred between initial parts and the revision “A” parts. Only the fab source has changed in moving
to revision “A” parts. Initial revision parts and revision “A” parts are form, fit, function, and reliability equivalent.
1
This table lists the available core and DDR data rate frequency combinations.
Table 81. Available Parts (Core/DDR Data Rate)
MPC8377E
MPC8378E
MPC8379E
800 MHz/400 MHz
800 MHz/400 MHz
800 MHz/400 MHz
667 MHz/400 MHz
667 MHz/400 MHz
667 MHz/400 MHz
533 MHz/333 MHz
533 MHz/333 MHz
533 MHz/333 MHz
400 MHz/266 MHz
400 MHz/266 MHz
400 MHz/266 MHz
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
124
Freescale Semiconductor
This table shows the SVR and PVR settings by device.
Table 82. SVR and PVR Settings by Product Revision
SVR
Device
PVR
Package
Rev 1.0
Rev. 2.1
MPC8377
0x80C7_0010
0x80C7_0021
MPC8377E
0x80C6_0010
0x80C6_0021
0x80C5_0010
0x80C5_0021
MPC8378E
0x80C4_0010
0x80C4_0021
MPC8379
0x80C3_0010
0x80C3_0021
MPC8379E
0x80C2_0010
0x80C2_0021
MPC8378
TePBGA II
25.2
Rev. 1.0
Rev. 2.1
0x8086_1010
0x8086_1011
Part Marking
Parts are marked as in the example as shown in this figure.
MPCnnnnetppaaar
core/platform MHZ
ATWLYYWW
CCCCC
*MMMMM
YWWLAZ
TePBGA II
Notes:
ATWLYYWW is the traceability code.
CCCCC is the country code.
MMMMM is the mask number.
YWWLAZ is the assembly traceability code.
Figure 70. Freescale Part Marking for TePBGA II Devices
26 Document Revision History
This table provides a revision history for this document.
Table 83. Document Revision History
Revision
Date
Substantive Change(s)
8
05/2012 In Table 15, “DDR SDRAM DC Electrical Characteristics for GV DD (typ) = 2.5 V,” updated Output leakage
current (IOZ) min and max values.
7
10/2011 • In Table 80, “Part Numbering Nomenclature,” updated “Revision Level description”and added footnote 4.
6
07/2011 In Section 2.2, “Power Sequencing,” updated power down sequencing information.
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
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125
Table 83. Document Revision History (continued)
Revision
Date
Substantive Change(s)
5
07/2011 • In Table 2, “Absolute Maximum Ratings1,” removed footnote 5 from LB IN to OVIN. Also, corrected
footnote 5.
• In Table 3, “Recommended Operating Conditions,” added footnote 2 to AVDD.
• In Figure 2, “Overshoot/Undershoot Voltage for GVDD/LVDD/OVDD/LBV DD,” added LBV DD.
• In Table 13, “DDR2 SDRAM DC Electrical Characteristics for GVDD(typ) = 1.8 V,” updated IOZ min/max
to –50/50.
• In Figure 15, “RGMII and RTBI AC Timing and Multiplexing Diagrams,” added distinction between
tSKRGT_RX and tSKRGT_TX signals.
• In Table 38, “MII Management AC Timing Specifications,” updated MDC frequency—removed Min and
Max values, added Typical value. Also, updated footnote 2 and removed footnote 3.
• In Table 53, “PCI DC Electrical Characteristics,” updated V IH min value to 2.0.
• In Table 68, “TePBGA II Pinout Listing,” added Note to LGPL4/LFRB_B/LGTA_B/LUPWAIT/LPBSE (to
be consistent with AN3665, “MPC837xE Design Checklist.”
• In Table 70, “Operating Frequencies for TePBGA II,” added Minimum Operating Frequency for eTSEC,
and corrected DDR2 Minimum and Maximum Operating Frequency values.
4
11/2010 • In Table 25, “RGMII and RTBI DC Electrical Characteristics,” updated VIH min value to 1.7.
• In Table 45, “Local Bus General Timing Parameters—PLL Bypass Mode,” added row for tLBKHLR.
• In Section 10.2, “Local Bus AC Electrical Specifications,” and in Section 22, “Clocking,” updated LCCR
to LCRR.
• In Table 68, “TePBGA II Pinout Listing,” added SD_WP to pin C9. Also clarified TEST_SEL0 and
TEST_SEL1 pins—no change in functionality.
3
03/2010 • Added Section 4.3, “eTSEC Gigabit Reference Clock Timing.”
• In Table 39, “USB DC Electrical Characteristics,” and Table 40, “USB General Timing Parameters (ULPI
Mode Only),” added table footnotes .
• In Table 44, “Local Bus General Timing Parameters—PLL Enable Mode,” and Table 45, “Local Bus
General Timing Parameters—PLL Bypass Mode,” corrected footnotes for tLBOTOT1, tLBOTOT2, tLBOTOT3.
• In Figure 26, “Local Bus Signals, GPCM/UPM Signals for LCRR[CLKDIV] = 2 (PLL Enable Mode),” and
Figure 28, “Local Bus Signals, GPCM/UPM Signals for LCRR[CLKDIV] = 4 (PLL Enable Mode),” shifted
“Input Signals: LAD[0:31]/LDP[0:3]” from the falling edge to the rising edge of LSYNC_IN.
• In Figure 66, “Mechanical Dimensions and Bottom Surface Nomenclature of the TEPBGA II,” added
heat spreader.
• In Section 24.6, “Pull-Up Resistor Requirements,” removed “Ethernet Management MDIO pin” from list
of open drain type pins.
• In Table 68, “TePBGA II Pinout Listing,” updated the Pin Type column for AVDD_C, AVDD_L, and
AVDD_P pins.
• in Table 68, “TePBGA II Pinout Listing,” added Note 17 to eTSEC pins.
• In Table 73, “CSB Frequency Options for Host Mode,” and Table 74, “CSB Frequency Options for Agent
Mode,” updated csb_clk frequencies available.
• In Table 80, “Part Numbering Nomenclature,” removed footnote to “e300 core Frequency.”
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Freescale Semiconductor
Table 83. Document Revision History (continued)
Revision
2
Date
Substantive Change(s)
10/2009 •
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
In Table 3, “Recommended Operating Conditions,” added “Operating temperature range” values.
In Table 5, “Power Dissipation 1,” corrected maximal application for 800/400 MHz to 4.3 W.
In Table 5, “Power Dissipation 1,” added a column for “Typical Application at Tj = 65°C (W)”.
In Table 5, “Power Dissipation 1,” added a column for “Sleep Power at Tj = 65°C (W)”.
In Table 11, removed overbar from CFG_CLKIN_DIV.
In Table 17, “Current Draw Characteristics for MVREF,” updated IMVREF maximum value for both DDR1
and DDR2 to 600 and 400 μA, respectively. Also, updated Note 1 and added Note 2.
In Table 20, “DDR1 and DDR2 SDRAM Input AC Timing Specifications,” column headings renamed to
“Min” and “Max”. Footnote 2 updated to state “T is the MCK clock period”.
In Table 20, “DDR1 and DDR2 SDRAM Input AC Timing Specifications,” and Table 21, “DDR1 and
DDR2 SDRAM Output AC Timing Specifications,” clarified that the frequency parameters are data rates.
In Table 26, “SGMII DC Transmitter Electrical Characteristics,” updated footnote 3.
In Table 27, “SGMII DC Receiver Electrical Characteristics,” updated bit name LSTS to SEIC x, the
parameter values, and the maximum value of SEICx = 01 to 100.
In Table 27, “SGMII DC Receiver Electrical Characteristics,” updated VLOS maximum value for LSTS =0
to 150 mV .
In Table 34, “RMII Transmit AC Timing Specifications,” updated tRMTDXI to 2.0 ns.
In Table 68, “TePBGA II Pinout Listing,” removed pin THERM0; it is now Reserved. Also added 1.05 V
to VDD pin.
In Table 70, “Operating Frequencies for TePBGA II,” corrected “DDR2 memory bus frequency (MCK)”
range to 125–200.
In Table 75, “e300 Core PLL Configuration,” added 3.5:1 and 4:1 core_clk: csb_clk ratio options.
In Table 76, “Example Clock Frequency Combinations,” updated column heading to “DDR data rate” .
In Section 19.2, “SPI AC Timing Specifications,” corrected tNIKHOX and tNEKHOX to tNIKHOV and tNEKHOV,
respectively.
1
02/2009 • In Table 3, “Recommended Operating Conditions,” added two new rows for 800 MHz, and created two
rows for SerDes. In addition, changed 666 to 667 MHz.
• In Table 5, “Power Dissipation 1,” added Notes 4 and 5. In addition, changed 666 to 667 MHz.
• In Table 13, “DDR2 SDRAM DC Electrical Characteristics for GVDD(typ) = 1.8 V,” Table 21, “DDR1 and
DDR2 SDRAM Output AC Timing Specifications,” and Table 68, “TePBGA II Pinout Listing,” added
footnote to references to MVREF, MDQ, and MDQS, referencing AN3665, MPC837xE Design Checklist.
• In Table 21, updated tDDKHCX minimum value for 333 MHz to 2.40.
• In Table 68, “TePBGA II Pinout Listing,” added footnote to USBDR_STP_SUSPEND and modified
footnote 10 and added footnote 15.
• In Table 70, “Operating Frequencies for TePBGA II,” changed 667 to 800 MHz for core_clk.
• In Table 76, “Example Clock Frequency Combinations,” added 800 MHz cells for e300 core.
• Updated part numbering information in AF column in Table 80, “Part Numbering Nomenclature.” In
addition, modified extended temperature information in notes 1 and 4.
• In Table 81, “Available Parts (Core/DDR Data Rate),” added new row for 800/400 MHz.
0
12/2008 Initial public release.
MPC8378E PowerQUICC II Pro Processor Hardware Specifications, Rev. 8
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127
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