FREESCALE MC33794EKR2

Freescale Semiconductor
Technical Data
Document Number: MC33794
Rev 9, 11/2006
Electric Field Imaging Device
The MC33794 is intended for applications where noncontact sensing of
objects is desired. When connected to external electrodes, an electric field is
created.,The MC33794 is intended for use in detecting objects in this electric
field. The IC generates a low-frequency sine wave. The frequency is adjustable
by using an external resistor and is optimized for 120 kHz. The sine wave has
very low harmonic content to reduce harmonic interference.
MC33794
The MC33794 also contains support circuits for a microcontroller unit (MCU)
to allow the construction of a two-chip E-field system.
ELECTRIC FIELD
IMAGING DEVICE
Features
• Supports up to 9 Electrodes and 2 References or Electrodes
• Shield Driver for Driving Remote Electrodes Through Coaxial Cables
• +5.0 V Regulator to Power External Circuit
• ISO-9141 Physical Layer Interface
• Lamp Driver Output
• Watchdog and Power-ON Reset Timer
• Critical Internal Nodes Scaled and Selectable for Measurement
• High-Purity Sine Wave Generator Tunable with External Resistor
Typical Applications
• Occupant Detection Systems
• Appliance Control Panels and Touch Sensors
• Linear and Rotational Sliders
• Spill Over Flow Sensing Measurement
• Refrigeration Frost Sensing
• Industrial Control and Safety Systems Security
• Proximity Detection for Wake-Up Features
• Touch Screens
• Garage Door Safety Sensing
• Liquid Level Sensing
ORDERING INFORMATION
Device Name
Temperature Range (TA)
Package
Drawing
Package
MC33794EK/R2
-40°C to 85°C
1390-02
54 SOICW-EP
© Freescale Semiconductor, Inc., 2006. All rights reserved.
EK SUFFIX
54-LEAD SOICW-EP
CASE 1390-02
INTERNAL BLOCK DIAGRAM
4
A,B,C,D
CONTROL
LOGIC
TEST
22 kΩ (Nominal)
2.8 kΩ
CLK
R_OSC
OSC
700 Ω*
E1–E9
REF_A*, REF_B*
MUX
OUT
39 kΩ
2.8 kΩ
700 Ω*
* REF_A and REF_B are
not switched to ground
when not selected.
150 Ω
SHIELD
300 Ω
RECT
MUX
IN
LPF
VDD
VCC
LP_CAP
10 nF
GAIN AND
OFFSET
RST
WD_IN
SHIELD_EN
POR/
WD
LEVEL
VPWR
VCC
REG
AGND
VDD
REG
ATTN
SIGNAL
LAMP_SENSE
LAMP_MON
GND and HEAT SINK
PWR_MON
VDD_MON
LAMP_GND
LAMP_CTRL
ISO_OUT
ISO_IN
LAMP CKT
ISO-9141
LAMP_OUT
ISO-9141
(Note: All Resistor Values are Nominal)
Figure 1. Simplified Functional Block Diagram
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Freescale Semiconductor
SOICW-EP TERMINAL CONNECTIONS
RST
WD_IN
NC
LAMP_GND
NC
LAMP_OUT
NC
LAMP_SENSE
LAMP_MON
SHIELD_EN
D
C
B
A
SIGNAL
LEVEL
PWR_MON
LP_CAP
R_OSC
NC
NC
NC
NC
CLK
VDD_MON
VDD
VPWR
1
54
2
53
3
52
4
51
5
50
6
49
7
48
8
47
9
46
10
45
11
44
12
43
13
42
14
41
15
40
16
39
17
38
18
37
19
36
20
35
21
34
22
33
23
32
24
31
25
30
26
29
27
28
LAMP_CTRL
ISO-9414
NC
ISO_IN
NC
NC
NC
ISO_OUT
REF_B
REF_A
E9
E8
E7
E6
E5
E4
E3
E2
E1
TEST
NC
NC
GND
NC
SHIELD
AGND
VCC
Figure 2. SOICW-EP Terminal Connections
Table 1. SOICW-EP TERMINAL FUNCTION DESCRIPTION
Terminal
Terminal
Name
Formal Name
Definition
1
RST
Reset
This output is intended to generate the reset function of a typical MCU. It has a
delay for Power-ON Reset, level detectors to force a reset when VCC REG is
out-of-range high or low, and a watchdog timer that will force a reset if WD_IN
is not asserted at regular intervals. Timing is derived from the oscillator and will
change with changes in the resistor attached to R_OSC.
2
WD_IN
Watchdog In
This terminal must be asserted and deserted at regular interval in order to
prevent RST from being asserted. By having the MCU program perform this
operation more often the allowed time, a check that the MCU is running and
executing its program is assured. If this doesn’t occur, the MCU will be reset. If
the watchdog function is not desired, this terminal may be connected to CLK to
prevent a reset from being issued.
3, 5, 7,
20–23, 31,
33, 34,
48–50, 52
NC
No connect
These terminals may be used at some future date and should be left open.
4
LAMP_GND
Lamp Ground
This is the ground for the current from the lamp. The current into LAMP_OUT
flows out through this terminal.
6
LAMP_OUT
Lamp Driver
This is an active low output capable of sinking current of a typical indicator lamp.
One end of the lamp should be connected to a positive supply (for example,
battery voltage) and the other side to this terminal. The current is limited to
prevent damage to the IC in the case of a short or surge during lamp turn-on or
burn-out.
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Table 1. SOICW-EP TERMINAL FUNCTION DESCRIPTION (continued)
Terminal
Terminal
Name
Formal Name
Definition
8
LAMP_SENSE
Lamp Sense
This terminal is normally connected to the LAMP_OUT terminal. The voltage at
this terminal is reduced and sent to LAMP_MON so the voltage at the lamp
terminal is brought into the range of the analog-to-digital converter (ADC) in the
MCU.
9
LAMP_MON
Lamp Monitor
This terminal is connected through a voltage divider to the LAMP_SENSE
terminal. The voltage divider scales the voltage at this terminal so that battery
voltage present when the lamp is off is scaled to the range of the MCU ADC.
With the lamp off, this terminal will be very close to battery voltage if the lamp is
not burned out and the terminal is not shorted to ground. This is useful as a lamp
check.
10
SHIELD_EN
Shield Driver
This terminal is used to enable the shield signal. The shield is disabled when
SHIELD_EN is a logic low (ground)
11–14
A, B, C, D
Selector Inputs
These input terminals control which electrode or reference is active. Selection
values are shown in Table 5, Electrode Selection, page 10. These are logic level
inputs.
15
SIGNAL
Undetected Signal
This is the undetected signal being applied to the detector. It has a DC level with
the low radio frequency signal superimposed on it. Care must be taken to
minimize DC loading of this signal. A shift of DC will change the center point of
the signal and adversely affect the detection of the signal.
16
LEVEL
Detected Level
This is the detected, amplified, and offset representation of the signal voltage on
the selected electrode. Filtering of the rectified signal is performed by a capacitor
attached to LP_CAP.
17
PWR_MON
Power Monitor
This is connected through a voltage divider to VPWR. It allows reduction of the
voltage so it will fall within the range of the ADC on the MCU.
18
LP_CAP
Low-Pass Filter Capacitor
A capacitor on this terminal forms a low pass filter with the internal series
resistance from the detector to this terminal. This terminal can be used to
determine the detected level before amplification or offset is applied. A 10 nF
capacitor connected to this terminal will smooth the rectified signal. More
capacitance will increase the response time.
19
R_OSC
Oscillator Resistor
24
CLK
Clock
25
VDD_MON
VDD Monitor
This is connected through an internal voltage divider to VDD REG. It allows
reduction of the voltage so it will fall within the range of the ADC on the MCU.
26
VDD
VDD Capacitor
A capacitor is connected to this terminal to filter the internal analog regulated
supply. This supply is derived from VPWR through internal VDD REG.
27
VPWR
Positive Power Supply
12 V power applied to this terminal will be converted to the regulated voltages
needed to operate the part. It is also converted to 5.0 V (internal VCC REG) and
8.5 V (internal VDD REG) to power the MCU and external devices.
28
VCC
5.0 V Regulator Output
This output terminal requires a 47 µF capacitor and internal VCC REG provides
a regulated 5.0 V for the MCU and for internal needs of the MC33794.
29
AGND
Analog Ground
This terminal is connected to the ground return of the analog circuitry. This
ground should be kept free of transient electrical noise like that from logic
switching. Its path to the electrical current return point should be kept separate
from the return for GND.
30
SHIELD
Shield Driver
A resistor from this terminal to circuit ground determines the operating frequency
of the oscillator. The MC33794 is optimized for operation around 120 kHz.
This terminal provides a square wave output at the same frequency as the
internal oscillator. The edges of the square wave coincide with the peaks
(positive and negative) of the sine wave.
This terminal connects to cable shields to cancel cable capacitance.
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Table 1. SOICW-EP TERMINAL FUNCTION DESCRIPTION (continued)
Terminal
Terminal
Name
Formal Name
32
GND
Ground
35
TEST
Test Mode Control
36–44
E1–E9
Electrode Connections
These are the electrode terminals. They are connected either directly or through
coaxial cables to the electrodes for measurements. When not selected, these
outputs are grounded through the internal resistance.
45, 46
REF_A,
REF_B
(E10, E11)
Reference Connections
(Or as additional electrodes)
These terminals can be individually selected to measure a known capacitance
value. Unlike E1-E9, these two inputs are not grounded when not selected.
47
ISO_OUT
ISO-9141 Output
51
ISO_IN
ISO-9141 Input
This terminal accepts data from the MCU to be sent over the ISO-9141
communications interface. It translates the 5.0 V logic levels from the MCU to
transmit levels on the ISO-9141 bus.
53
ISO-9141
ISO-9141 Bus
This terminal connects to the ISO-9141 bus. It provides the drive and detects
signaling on the bus and translates it from the bus level to logic levels for the
MCU.
54
LAMP_CTRL
Lamp Control
This signal is used to control the lamp driver. A high logic level turns on the lamp.
Definition
This terminal and metal backing is the IC power return and thermal radiator/
conductor.
This terminal is normally connected to circuit ground. There are special
operating modes associated with this terminal when it is not at ground.
This terminal translates ISO-9141 receive levels to 5.0 V logic levels for the
MCU.
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MAXIMUM RATINGS
Table 2. Maximum Ratings
All voltages are with respect to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or
permanent damage to the device.
Rating
Symbol
Value
Unit
Peak VPWR Voltage
VPWRPK
40
V
Double Battery
VDBLBAT
1 Minute Maximum TA = 30°C
V
26.5
ESD Voltage
V
Human Body Model (1)
Machine Model (2)
VESD1
VESD2
±2000
±200
Storage Temperature
TSTG
-55 to 150
°C
Operating Ambient Temperature
TA
-40 to 85
°C
Operating Junction Temperature
TJ
-40 to 150
°C
RθJA
41
Thermal Resistance
°C/W
Junction-to-Ambient
(3)
RθJC
0.2
(5)
RθJB
3.0
Lead Soldering Temperature (for 10 Seconds)
TSOLDER
260
Junction-to-Case (4)
Junction-to-Board
°C
Notes
1. ESD1 performed in accordance with the Human Body Model (CZAP = 100 pF, RZAP = 1500 Ω).
2.
ESD2 performed in accordance with the Machine Model (CZAP = 200 pF, RZAP = 0 Ω).
3.
Junction temperature is a function of on-chip power dissipation, package thermal resistance, mounting site (board) temperature,
ambient temperature, air flow, power dissipation of other components on the board, and board thermal resistance. In accordance with
SEMI G38-87 and JEDEC JESD51-2 with the single layer board horizontal.
Indicates the average thermal resistance between the die and the case top surface as measured by the cold plate method
(MILSPEC 883 Method 1012.1) with the cold plate temperature used for the case temperature.
Thermal resistance between the die and the printed circuit board per JEDEC JESD51-8. Board temperature is measured on the top
surface of the board near the package.
4.
5.
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STATIC ELECTRICAL CHARACTERISTICS
Table 3. Static Electrical Characteristics
Characteristics noted under conditions 9.0 V ≤ VPWR ≤ 18 V, -40°C ≤ TA ≤ 85°C unless otherwise noted. Typical values noted
reflect the approximate parameter means at TA = 25°C under normal conditions unless otherwise noted. Voltages are relative
to GND unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
Unit
Voltage Regulators
5.0 V Regulator Voltage
VCC
7.0 V ≤ VPWR ≤ 18 V, 1.0 mA ≤ IL ≤ 75 mA, CFILT = 47 µF
Analog Regulator Voltage
V
4.75
5.0
5.25
8.075
8.5
8.925
VANALOG
9.0 V ≤ VPWR ≤ 18 V, CFILT = 47 µF
V
Out-of-Range Voltage Detector (Terminal name VCC)
5.0 V Low Voltage Detector
VLV5
4.0
4.52
4.72
V
5.0 V High Voltage Detector
VHV5
5.26
5.55
5.83
V
5.0 V Out-of-Range Voltage Detector Hysteresis
VHYS5
–
0.05
–
V
Input Low Level (6)
VIFINLO
0.30
0.33
–
V/V
Input High Level (6)
VIFINHI
–
0.53
0.7
V/V
VIFINHYS
–
0.2
–
V/V
Output Low (6)
VIFOLO
–
–
0.2
V/V
(6)
VIFOHI
0.8
–
–
V/V
40
–
–
ISO-9141 Communications Interface
Input Hysteresis
Output High
(6)
Output Breakdown
VIFZ
IOUT = 20 mA
Output Resistance
RIFON
IOUT = 40 mA
Current Limit
Ω
–
58
–
IIFLIM
Sinking Current with VOUT < 0.3 VPWR IN
Output Propagation Delay
V
mA
60
90
120
–
–
8.0
TIFDLY
Out to ISO-9141, CLOAD = 20 pF
µs
ISO In
Logic Output Low
VIFOLO
ISINK = 1.0 mA
Logic Output Pull-Up Current
ISO-9141 to ISO_IN, RL = 10 kΩ, CL = 470 pF, 7.0 V ≤ VPWR ≤
18 V
–
–
1.0
100
–
–
–
–
5.4
IIFPU
VOUT = 0 V
Input to Output Propagation Delay
V
TIFDLY
µA
µs
Notes
6. Ratio to VPWR
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Table 3. Static Electrical Characteristics (continued)
Characteristics noted under conditions 9.0 V ≤ VPWR ≤ 18 V, -40°C ≤ TA ≤ 85°C unless otherwise noted. Typical values noted
reflect the approximate parameter means at TA = 25°C under normal conditions unless otherwise noted. Voltages are relative
to GND unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
–
–
3.0
–
-20
–
1.0
–
8.0
0
–
9.0
Unit
Electrode Signals
Total Variance Between Electrode Measurements (7)
ELVVAR
All CLOAD = 15 pF
Electrode Maximum Harmonic Level Below Fundamental (8)
ELHARM
5.0 pF ≤ CLOAD ≤ 100 pF
Electrode Transmit Output Range
%
dB
ELTXV
5.0 pF ≤ CLOAD ≤ 100 pF
Receive Input Voltage Range
RXV
Grounding Switch on Voltage
SWVON
ISW = 1.0 mA
V
V
V
–
–
5.0
1.0
–
8.0
SDIN
0
–
9.0
V
SWVON
–
–
1.5
V
CMOS Logic Input Low Threshold
VTHL
0.3
–
–
VCC
Logic Input High Threshold
VTHH
–
–
0.7
VCC
Voltage Hysteresis
VHYS
–
0.06
–
VCC
VIN = VCC
10
–
50
VIN = 0 V
-5.0
–
5.0
DETRO
–
50
–
kΩ
LP_CAP to LEVEL Gain
AREC
3.6
4.0
4.4
AV
LP_CAP to LEVEL Offset
VRECOFF
-3.3
-3.0
-2.7
V
Shield Driver
Shield Driver Output Level
SDTXV
0 pF ≤ CLOAD ≤ 500 pF
Shield Driver Input Range
Grounding Switch on Voltage
(9)
V
Logic I/O
Input Current
IIN
µA
Signal Detector
Detector Output Resistance
Notes
7. Verified by design. Not tested in production.
8. Verified by design and characterization. Not tested in production.
9. Current into grounded terminal under test = 1.0 mA.
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Table 3. Static Electrical Characteristics (continued)
Characteristics noted under conditions 9.0 V ≤ VPWR ≤ 18 V, -40°C ≤ TA ≤ 85°C unless otherwise noted. Typical values noted
reflect the approximate parameter means at TA = 25°C under normal conditions unless otherwise noted. Voltages are relative
to GND unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
–
1.75
3.5
0.7
–
1.7
–
–
1.4
40
–
–
Unit
Lamp Driver
On Resistance
RLDDSON
IIN = 400 mA
Current Limit
ILDLIM
VOUT = 1.0 V
On-Voltage
Ω
A
VLDON
IOUT = 400 mA
Breakdown Voltage
V
VLDZ
IOUT = 100 µA, Lamp Off
V
Voltage Monitors
LAMP_MON to LAMP_SENSE Ratio
LMPMON
0.1950
0.20524
0.2155
V/V
PWR_MON to VPWR Ratio
PWRMON
0.2200
0.2444
0.2688
V/V
VDD_MON to VDD Ratio
VDD_MON
0.45
0.5
0.55
V/V
Ipwr
_
7.0
_
mA
Supply
Quiescent supply current (11)
VPWR = 14 V(10)
Notes
10. Verified by design and characterization. Not tested in production.
11. No external devices connected to internal voltage regulators.
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DYNAMIC ELECTRICAL CHARACTERISTICS
Table 4. Dynamic Electrical Characteristics
Characteristics noted under conditions 9.0 V ≤ VPWR ≤ 18 V, -40°C ≤ TA ≤ 85°C unless otherwise noted. Typical values noted
reflect the approximate parameter means at TA = 25°C under normal conditions unless otherwise noted. Voltages are relative
to GND unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
Unit
OSC Frequency Stability (12), (13)
f STAB
–
–
10
%
OSC Center Frequency
f OSC
OSC
R_OSC = 39 kΩ
kHz
–
120
–
2nd through 4th Harmonic Level
–
–
-20
5th and Higher
–
–
-60
–
-20
–
–
4.5
–
t PER
9.0
–
50
ms
Watchdog Time-Out Period
t WDPER
50
68
250
ms
Watchdog Reset Hold Time
t WDHLD
9.0
–
50
ms
t SCB
3.0
–
–
ms
Harmonic Content
(12)
OSCHARM
dB
Shield Driver
Shield Driver Maximum Harmonic level below Fundamental (12)
dB
SDHARM
10 pF ≤ CLOAD ≤ 500 pF
Shield Driver Gain Bandwidth Product (12)
MHz
SDGBW
Measured at 120 kHz
POR
POR Time-Out Period
Watchdog
Lamp Driver
Short Circuit to Battery Survival Time
Notes
12. Verified by design and characterization. Not tested in production.
13. Does not include errors in external reference parts.
ELECTRODE SELECTION
Table 5. Electrode Selection (continued)
Table 5. Electrode Selection
TERMINAL/SIGNAL
Source (internal)
E1
D
C
B
A
E8
1
0
0
0
1
E9
1
0
0
1
D
C
B
A
0
0
0
0
0
0
0
TERMINAL/SIGNAL
E2
0
0
1
0
REF_A
1
0
1
0
E3
0
0
1
1
REF_B
1
0
1
1
E4
0
1
0
0
Internal OSC
1
1
0
0
1
Internal OSC after 22 kΩ
1
1
0
1
0
Internal Ground
1
1
1
0
1
Reserved
1
1
1
1
E5
E6
E7
0
0
0
1
1
1
0
1
1
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FUNCTIONAL DESCRIPTION
INTRODUCTION
The MC33794 is intended for use in detecting objects
using an electric field. The IC generates a low radio
frequency sine wave. The frequency is set by an external
resistor and is optimized for 120 kHz. The sine wave has very
low harmonic content to reduce potential interference at
higher harmonically related frequencies. The internal
generator produces a nominal 5.0 V peak-to-peak output that
is passed through an internal resistor of about 22 kΩ. An
internal multiplexer routes the signal to one of 11 terminals
under control of the ABCD input terminals. A receiver
multiplexer simultaneously connected to the selected
electrode routes its signal to a detector, which converts the
sine wave to a DC level. This DC level is filtered by an
external capacitor and is multiplied and offset to increase
sensitivity. All of the unselected electrode outputs are
grounded by the device. The current flowing between the
selected electrode and the other grounded electrodes plus
other grounded objects around the electrode causes a
voltage drop across the internal resistance. Objects brought
into or out of the electric field change the current and resulting
voltage at the IC terminal, which in turn reduces the voltage
at LP_CAP and LEVEL.
A shield driver is included to minimize the effect of
capacitance caused by using coaxial cables to connect to
remote electrodes. By driving the coax shield with this signal,
the shield voltage follows that of the center conductor,
significantly reducing the effective capacitance of the coax
and maintaining sensitivity to the capacitance at the
electrode.
The MC33794 is made to work with and support a
microcontroller. It provides two voltage regulators, a PowerON-reset/out-of-range voltage detector, watchdog circuit,
lamp driver and sense circuit, and a physical layer ISO-9141
communications interface.
BLOCK DIAGRAM COMPONENTS
Refer to Figure 1, MC33794 Internal Block Diagram,
page 2, for a graphic representation of the block diagram
information in this section.
OSC
This section generates a high purity sine wave. The center
frequency is controlled by a resistor attached to R_OSC. The
normal operating frequency is around 120 kHz. A square
wave version of the frequency output is available at CLK.
Timing for the Power-ON Reset and watchdog (POR/WD)
circuit are derived from this oscillator’s frequency.
MUX OUT
This circuit directs the output of the sine wave to one of
nine possible electrode outputs or two reference terminals.
All unused terminals are automatically grounded (except the
two reference terminals). The selected output is controlled by
the ABCD inputs.
ELECTRODES E1-E9
These are the electrode terminals. They are connected
either directly or through coaxial cables to the electrodes for
measurements. Every electrode has a 2.8K (± 20%) resistor
in series with the external pad and the internal electronics.
Only one of these electrodes can be selected at a time for
capacitance measurement. All of the other unselected
electrodes are switched to ground by an internal switch that
has an internal on-resistance of approximately 700 Ω. The
signal at the selected electrode terminal is routed to the
shield driver amplifier by an internal switch. All of the coaxial
cable shields should be isolated from ground and connected
SHIELD.
REF_A & REF_B ELECTRODES
These terminals can be individually selected like E1
through E9. Unlike E1 through E9, these terminals are not
grounded when not selected. Both terminals have a 2.8K
(± 20%) resistor in series with the external pad and the
internal electronics. The purpose of these terminals is to
allow known capacitors to be measured. By using capacitors
at the low and high end of the expected range, absolute
values for the capacitance on the electrodes can be
computed. These terminals can be used for electrodes E10
and E11 with the only difference is that these two electrodes
will not be grounded when not selected.
SHIELD DRIVE
This circuit provides a buffered version of the returned AC
signal from the electrode. Since it nearly has the same
amplitude and phase as the electrode signal, there is little or
no potential difference between the two signals thereby
cancelling out any electric field. In effect, the shield drives
and isolates the electrode signal from external virtual
grounds. A common application is to connect the Shield Drive
to the shield of a coax cable used to connect an electrode to
the corresponding electrode terminal. Another typical use is
to drive a ground plane that is used behind an array of touch
sensor electrodes in order to cancel out any virtual grounds
that could attenuate the AC signal.
MUX IN
This circuit connects the selected electrode, reference, or
one of two internal nodes to an amplifier/detector. The
selection is controlled by the ABCD inputs and follows the
driven electrode/reference when one is selected.
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RECT
The rectifier circuit detects the level from MUX IN by
offsetting the midpoint of the sine wave to zero volts and
inverting the waveform when it is below the midpoint. It is
important to avoid DC loading of the signal, which would
cause a shift in the midpoint voltage of the signal.
LPF
The rectified sine wave is filtered by a low pass function
formed by an internal resistance and an external capacitance
attached to LP_CAP. The nominal value of the internal
resistance is 50 kΩ. The value of the external capacitor is
selected to provide filtering of noise while still allowing the
desired settling time for the detector output. A 10 nF
capacitor would allow 99% settling in less than 5.0 ms. In
practice, it is recommended you wait at least 1.5 ms after
selecting an electrode before reading LEVEL.
GAIN AND OFFSET
This circuit multiplies the detected and filtered signal by a
gain and offsets the result by a DC level. This results in an
output range that covers 1.0 V to 4.0 V for capacitive loading
of the field in the range of 10 pF to 100 pF. This allows higher
sensitivity for a digital-to-analog converter with a 0 V-to-5.0 V
input range.
ATTN
This circuit passes the undetected signal to SIGNAL for
external use.
SHIELD_EN
(with appropriate current setting resistor) is connected to a
positive voltage source and the other is connected to
LAMP_OUT, and LAMP_GND is connected to ground, the
lamp will light. This circuit provides current limiting to prevent
damage to itself in the case of a shorted lamp or during a
high-surge condition typical of an incandescent lamp
burnout.
LAMP_GND should always be connected to ground even
if the lamp circuit is not used.
ISO-9141
This circuit connects to an ISO-9141 bus to allow remote
communications. ISO_IN is data from the bus to the MCU
and ISO_OUT is data to drive onto the bus from the MCU.
POR/WD
This circuit is a combined Power-ON Reset and watchdog
timer. The RST output is held low until a certain amount of
time after the VCC REG output (VCC) has remained above a
minimum operating threshold. If VCC falls below the level at
any time, RST is pulled low again and held until the required
time after VCC has returned high. An over voltage circuit is
also included, which will force a reset if VCC rises above a
maximum voltage. The watchdog function also can force RST
low if too long an interval is allowed to pass between positive
transitions on WD_IN.
INTERNAL VCC REGULATOR
This circuit converts an unregulated voltage from VIN to a
regulated 5.0 V source, which is used internally and available
for other components requiring a regulated voltage source.
A logic low on this input disables the shield drive. The
purpose of doing this is to be able to detect that the shield
signal is not working or the connection to the coax shields is
broken. If either of these conditions exists, there will be little
or no change in the capacitance measured when the
SHIELD_EN is changed. If the SHIELD output is working and
properly connected, the capacitance of the coax will not be
cancelled when this terminal is asserted and the measured
capacitance will appear to change by approximately the
capacitance between the center conductor and the shield in
the coax.
This is a regulator for analog devices that require more
than 5.0 V. This is used by the device and some current is
available to operate op-amps and other devices. By having
this higher voltage available, some applications can avoid the
need for a rail-to-rail output amplifier and still achieve the 0 Vto-5.0 V output for a digital-to-analog converter input.
VDD_MON is a divided output from internal VDD REG, which
allows a 0.0 V-to-5.0 V ADC to measure VDD. Normal value
for VDD is 8.5 Volts.
LAMP CKT
CONTROL LOGIC
This section controls the operation of the LAMP_OUT
terminal. When LAMP_CTRL is asserted, LAMP_OUT is
pulled to LAMP_GND. If one side of an indicator lamp or LED
This contains the logic that decodes and controls the
MUXes and some of the test modes
INTERNAL VDD REGULATOR
APPLICATION INFORMATION
The MC33794 is intended to be used where an object’s
size and proximity are to be determined. This is done by
placing electrodes in the area where the object will be. The
proximity of an object to an electrode can be determined by
the increase in effective capacitance as the object gets closer
to the electrode and modifies the electric field between the
electrode and surrounding electrically common objects. The
shape and size of an object can be determined by using
multiple electrodes over an area and observing the
capacitance change on each of the electrodes. Those that
don’t change have nothing near them, and those that do
change have part of the object near them.
MC33794
12
Sensors
Freescale Semiconductor
A “capacitor” can be formed between the driving electrode
and the object, each forming a “plate” that holds the electric
charge. Capacitance is directly proportional to the area of the
electrode plates. Doubling the area doubles the capacitance.
Capacitance is also directly proportional to the dielectric
constant of the material between the plates. Air typically has
a dielectric constant of 1 (unity) whereas water can have a
dielectic constant of 80 (which means the capacitance is
roughly 80 times larger). Plastics and glass that are
commonly used in touch panel applications have dielectric
constants greater than unity. A third consideration is that
capacitance is inversely proportional to the distance between
the plates. Doubling the distance between the two plates will
reduce capacitance by four. This property can be exploited in
cases where small distances need to be measured.
From the above, it can be seen that increased detection
sensitivity is a function of the plate size, the dielectric
constant of the material between the plates, and the distance
between them.
The voltage measured at LEVEL is an inverse function of
the capacitance between the electrode being measured and
the surrounding electrodes and other objects in the electric
field surrounding the electrode. Increasing capacitance
results in decreasing voltage. The value of series resistance
(22 kΩ) was chosen to provide a nearly linear relationship at
120 kHz over a range of 10 pF to 100 pF.
The measured value may change with any change in
frequency, series resistance, driving voltage, the dielectric
constant of the capacitor, or detector sensitivity. These can
change with temperature and time. There are several ways to
compensate for these changes. One method uses the
REF_A and REF_B capacitors. Another method may use
long term averages to set a baseline value.
Using REF_A and REF_B, a typical measurement
algorithm would start by measuring the voltage for two known
value capacitors (attached to REF_A and REF_B). The value
of these capacitors would be chosen to be near the minimum
and maximum values of capacitance expected to be seen at
the electrodes. These reference voltages and the known
capacitance values are then used with the electrode
measurement voltage to determine the capacitance seen by
the electrode. This method can be used to detect short- and
long-term changes due to objects in the electric field and
significantly reduce the effect of temperature-and timeinduced changes.
Another approach is to run long term averaging of the
electrode values. Long term, in this case, may mean several
seconds. These long term averages are then used as a set
point so that short term changes in the field intensity can be
reliably determined. This is typically the method used for
touch panel applications.
The MC33794 does not contain an ADC. It is intended to
be used with an MCU that contains one. Offset and gain have
been added to the MC33794 to maximize the sensitivity over
the range of 0 pF to 100 pF. An 8-bit ADC can resolve around
0.4 pF of change and a 10-bit converter around 0.1 pF.
Higher resolution results in more distant detection of smaller
objects. Due to the relatively slow data access requirements
(approximately 2 ms per electrode), digital over-sampling
techniques can be used to extend the resolution of 8- or 10bit converters by 2 or 3 bits.
DC loading on the electrodes should be avoided. A typical
situation where this might occur is if moisture gets in direct
contact between electrodes, or between an electrode and
ground or shield drive. The signal is generated with a DC
offset that is more than half the peak-to-peak level. This
keeps the signal positive above ground at all times. The
detector uses this voltage level as the midpoint for detection.
All signals below this level are inverted and added to all
signals above this level. Loading of the DC level will cause
some of the positive half of the signal to be inverted and
added and will change the measurement.
If it is not possible to assure that the electrodes will always
have a high DC resistance to ground source, a series
capacitor of about 10 nF should be connected between the IC
electrode terminals and the electrodes. This capacitor will
block DC bias voltages to the detector. Note that it is also
advisable to add a DC blocking capacitor in series with the
Shield Driver output as well.
MC33794
Sensors
Freescale Semiconductor
13
EXAMPLE APPLICATION DIAGRAM
+9 to +18 V
Indicator
Lamp
47 µF
0.1 µF
VCC
33794
VPWR
10 nF
LAMP_OUT
LP_CAP
Analog_IN
Analog_IN
Analog_IN
Analog_IN
(Optional)
(Optional)
(Optional)
10 kΩ
VCC
VDD
LEVEL
VDD_MON
47 µF
PWR_MON
LAMP_MON
ISO-9141 Bus
ISO-9141
LAMP_SENSE
MCU
ISO_Tx
ISO_IN
ISO_Rx
ISO_OUT
Watchdog
Reset
SIGNAL
WD_IN
REF_A
RST
REF_B
10 pF
100 pF
LAMP_CTRL
GPx
Monitor (Optional)
LAMP_GND
TEST
Electrode Select
Shield Disable
4
E1
1
E2
2
E9
9
A, B, C, D
SHIELD_EN
Field
Electrodes
SHIELD
GND
R_OSC
AGND
39 kΩ
Figure 3. Example Application Diagram
MC33794
14
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PACKAGE DIMENSIONS
PAGE 1 OF 3
EK SUFFIX
CASE 1390-02
ISSUE C
MC33794
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15
PACKAGE DIMENSIONS
PAGE 2 OF 3
PAGE 2 OF 3
EK SUFFIX
CASE 1390-02
ISSUE C
MC33794
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16
PACKAGE DIMENSIONS
PAGE 1 OF 3
PAGE 3 OF 3
PAGE 3 OF 3
EK SUFFIX
CASE 1390-02
ISSUE C
MC33794
Sensors
Freescale Semiconductor
17
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MC33794
Rev 9
11/2006