FREESCALE MPXY8020A

Freescale Semiconductor, Inc.
SEMICONDUCTOR TECHNICAL DATA
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GENERAL DESCRIPTION
The Motorola MPXY8020A is an 8–pin tire monitoring sensor which is
comprised of a variable capacitance pressure sensing element, a temperature
sensing element, and an interface circuit (with a wake–up feature) all on a
single chip. It is housed in a Super–Small Outline Package (SSOP), which
includes a media protection filter. Specifically designed for the low power
consumption requirements of tire pressure monitoring systems, it can combine
with a Motorola remote keyless entry (RKE) system to facilitate a low–cost
highly integrated system.
Detailed Description
The block diagram of the MPXY8020A is shown in Figure 1. The pressure
sensor is a capacitive transducer constructed using surface micromachining,
the temperature sensor is constructed using a diffused resistor, and the
interface circuit is integrated onto the same die as the sensors using a standard
silicon CMOS process.
The conditioning of the pressure signal begins with a capacitance to voltage
conversion (C to V) followed by a switched capacitor amplifier. This amplifier
has adjustable offset and gain trimming. The offset and gain are factory
calibrated, with calibration values stored in the EEPROM trim register. This
amplifier also has temperature compensation circuits for both sensitivity and
offset, which also are factory–adjusted using the EEPROM trim register.
The pressure is monitored by a voltage comparator, which compares the
measured value against an 8–bit threshold adjusted by a serial input. By
adjusting the threshold and monitoring the state of the OUT pin the external
device can check whether a low–pressure threshold has been crossed, or
perform up to 8–bit A/D conversions.
The temperature is measured by a diffused resistor with a positive
temperature coefficient driven by a current source, thereby creating a voltage.
The room temperature value of this voltage is factory–calibrated using the
EEPROM trim register. A two–channel multiplexer can route either the
pressure or temperature signal to a sampling capacitor that is monitored by a
voltage comparator with variable threshold adjust, providing a digital output for
temperature.
An internal low frequency, low power 5.4 kHz oscillator with a 14–stage
divider provides a periodic pulse to the OUT pin (divide by 16384 for 3
seconds). This pulse can be used to wake up an external MCU to begin an
interface with the device. An additional 10–stage divider will provide a pulse
every 52 minutes which can be used to reset an external MCU.
The power consumption can be controlled by several operational modes
selected by external pins.
TIRE PRESSURE MONITORING
SENSOR
OPTIMIZED FOR 250 kPa – 450 kPa
SUPER SMALL OUTLINE PACKAGE
CASE 1352
ORDERING INFORMATION
Shipped in Rails Shipped in Tape & Reel
MPXY8020A6U
MPXY8020A6T1
REV 1.0
Motorola Sensor Device Data
 Motorola, Inc. 2003
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Figure 1. MPXY8020A Block Diagram
Package Pinout
The pinout for this 8–pin SSOP device is shown in Figure 2.
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Figure 2. MPXY8020A Device Pinout
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Operating Modes
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The device has several operating modes dependent on
the applied voltages to the S1 and S0 pins as shown in Table
1. In all the modes listed the channel multiplexers, D/A Register, LFO, and the output pulse dividers will always be powered up as long as there is a voltage source connected to the
VDD pin.
When only the S0 pin is at a logic one the pressure measuring circuit in the device is powered up and the pressure
output signal is connected to the sample capacitor through a
multiplexer. When the S0 pin returns to the low state the multiplexer will first turn off to store the signal on the sample capacitor before powering down the measuring circuitry.
When only the S1 pin is at a logic one the temperature
measuring circuit in the device is powered up and the temperature output signal is connected to the sample capacitor
through a multiplexer. When the S1 pin returns to the low
state the multiplexer will first turn off to store the signal on the
sample capacitor before powering down the measuring circuitry.
NOTE: All of the EEPROM trim bits will be powered up regardless of whether the pressure or temperature measuring
circuitry is activated.
NOTE: If the voltage on the S1 pin exceeds 2.5 times the
voltage on the VDD pin the device will be placed into its Trim/
Test Mode.
NOTE: If the VDD supply source is switched off in order to
reduce current consumption, it is important that all input pins
be driven LOW to avoid powering up the device.
If any input pin (S1, S0, DATA, or CLK) is driven HIGH
while the VDD supply is switched off, the device may be powered up through an ESD protection diode. In such a case, the
effective VDD voltage will be about 0.3 V less than the voltage
applied to the input pin, and the full device IDD current will be
drawn from the device driving input.
Table 1. Operating Modes
Circuitry Powered
Pressure
Measure
System
Temp
Measure
System
A/D
Output
Comp.
LFO
Oscill.
Serial Data
Counter
Standby/Reset
OFF
OFF
OFF
ON
ACTIVE
1
Measure Pressure
ON
OFF
OFF
ON
RESET
1
0
Measure Temperature
OFF
ON
OFF
ON
RESET
1
1
Output Read
OFF
OFF
ON
ON
ACTIVE
S1
S0
0
0
0
Operating Mode
Pin Functions
The following paragraphs give a description of the general
function of each pin.
VDD and VSS Pins
Power is supplied to the control IC through VDD and VSS.
VDD is the positive supply and VSS is the digital and analog
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ground. The control IC operates from a single power supply.
Therefore, the conductors to the power supply should be
connected to the VDD and VSS pins and locally decoupled as
shown in Figure 3.
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Figure 3. Recommended Power Supply Connections
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OUT Pin
The OUT pin normally provides a digital signal related to
the voltage applied to the voltage comparator and the
threshold level shifted into an 8–bit register from an external
device. When the device is placed in the standby mode the
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OUT pin is driven high and will be clocked low when an overflow is detected from a clock divider (divide by 16384) driven
by the LFO. This allows the OUT pin to wake up an external
device such as an MCU.
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Figure 4. Pulse on OUT Pin During Standby Mode
RST Pin
The RST pin is normally driven high and will be clocked
low when an overflow is detected from total clock divider (divide by 16,777,216) driven by the LFO. This allows the RST
pin to reset an external device such as an MCU. This pulse
will appear on the RST pin approximately every 52 minutes
regardless of the operating mode of the device. The pulse
lasts for two cycles of the LFO oscillator as shown in Figure
5. Since the RST pin is clocked from the same divider string
as the OUT pin, there will also be a pulse on the OUT pin
when the RST pin pulses every 52 minutes.
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Figure 5. Pulse on RST Pin
S0 Pin
The S0 pin is used to select the mode of operation as
shown in Table 1.
The S0 pin contains an internal Schmitt trigger as part of
its input to improve noise immunity. The S0 pin has an internal pull–down device in order to provide a low level when the
pin is left unconnected.
S1 Pin
The S1 pin is used to select the mode of operation, as
shown in Table 1.
The S1 pin contains an internal Schmitt trigger as part of
its input to improve noise immunity. This pin has an internal
pulldown device to provide a low level when the pin is left unconnected.
The S1 pin also serves the purpose of enabling factory trim
and test of the device.
The higher VPP programming voltage for the internal EEPROM trim register is also supplied through the S1 pin.
4
DATA Pin
The DATA pin is the serial data in (SDI) function for setting
the threshold of the voltage comparator.
The DATA pin contains an internal Schmitt trigger as part
of its input to improve noise immunity. This pin has an internal pull–down device to provide a low level when the pin is
left unconnected.
CLK Pin
The CLK pin is used to provide a clock used for loading
and shifting data into the DATA pin. The data on the DATA pin
is clocked into a shift register on the rising edge of the CLK
pin signal. The data is transferred to the D/A Register on the
eighth falling edge of the CLK pin. This protocol may be handled by the SPI or SIOP serial I/O function found on some
MCU devices.
The CLK pin contains an internal Schmitt trigger as part of
its input to improve noise immunity. The CLK pin has an internal pulldown device to provide a low level when the pin is left
unconnected.
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Output Threshold Adjust
rising edge of the CLK pin. On the falling edge of the 8th
clock the data in the serial shift register is latched into the
parallel DAR register. The DAR remains powered up whenever VDD is present. The serial data is clocked into the DATA
pin starting with the MSB first. This sequence of threshold
select bits is shown in Table 2.
The state of the OUT pin is driven by a voltage comparator
whose output state depends on the level of the input voltage
on the sample capacitor and the level of an adjustable 8–bit
threshold voltage. The threshold is adjusted by shifting data
bits into the D/A Register (DAR) via the DATA pin while
clocking the CLK pin. The timing of this data is shown in Figure 6. Data is transferred into the serial shift register on the
Table 2. D/A Threshold Bit Assignments
Function
Bit Weight
Data Bit
1
D0
2
D1
4
D2
8
D3
16
D4
32
D5
64
D6
128
D7
LSB
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Voltage Comparator Threshold Adjust (8 bits)
MSB
clock stream is corrupted during a transmission. In these two
modes the DATA and CLK pins should not be clocked to reduce noise in the captured pressure or temperature data.
Any change in the DAR contents should be done during the
Standby or Output Read Modes.
Both the serial bit counter and the state of the DAR are undefined following power up of the device. The serial bit counter can be reset by cycling either the SO pin or the S1 pin to a
high level and then back low. The DAR can then be reset to
the lowest level by holding the DATA pin low while bursting
the CLK pin with eight (8) clock pulses.
An analog to digital (A/D) conversion can be accomplished
with eight (8) different threshold levels in a successive
approximation algorithm; or the OUT pin can be set to trip at
some alarm level. The voltage on the sample capacitor will
maintain long enough for a single 8–bit conversion, but may
need to be refreshed with a new measured reading if the
read interval is longer than the specified hold time, tSH.
The counter that determines the number of clock pulses
into the device is reset whenever the device is placed into the
Measure Pressure or Measure Temperature Modes. This
provides a means to reset the data transfer count in case the
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Figure 6. Serial Data Timing
Pressure Sensor Output
The pressure channel compares the output of its analog
measurement circuit to the D/A reference voltage. The device is calibrated at two different nominal values depending
on the calibration option.
Motorola Sensor Device Data
Temperature Sensor Output
The temperature channel compares the output of a positive temperature coefficient (PTC) resistor driven by a
switched current source. The current source is only active
when the temperature channel is selected.
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APPLICATIONS
Suggested application example is shown in Figure 7.
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Figure 7. Application Example
ELECTRICAL SPECIFICATIONS
Maximum Ratings
Maximum ratings are the extreme limits to which the device can be exposed without permanently damaging it. The device
contains circuitry to protect the inputs against damage from high static voltages; however, do not apply voltages higher than
those shown in the table below. Keep VIN and VOUT within the range VSS ≤ (VIN or VOUT) ≤ VDD.
Rating
Symbol
Value
Unit
Supply Voltage
VDD
–0.3 to +4.0
V
Short Circuit Capability (all pins excluding VDD and VSS)
Maximum High Voltage for 5 minutes
Minimum Low Voltage for 5 minutes
VSC
VSC
VDD
VSS
V
V
ISUB
600
µA
Electrostatic Discharge
Human Body Model (HBM)
Charged Device Model (CDM)
Machine Model (MM)
VESD
VESD
VESD
±1000
±1000
±200
V
V
V
Storage Temperature Range
Standard Temperature Range
Tstg
–40 to +150
°C
Substrate Current Injection
Current from any pin to VSS – 0.3 VDC)
6
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Operating Range
The limits normally expected in the application which define range of operation.
Characteristic
Supply Voltage
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Operating Temperature Range
Standard Temperature Range
Supply Current Drain
Standby Mode
–40°C to +85°C
+85°C to +100°C
+100°C to +125°C
Read Mode
–40°C to +125°C
Measure Temperature Mode
–40°C to +125°C
Measure Pressure Mode
–40°C to +10°C
+10°C to +60°C
+60°C to +125°C
Motorola Sensor Device Data
Symbol
Min
Typ
Max
Units
VDD
2.1
3.0
3.6
V
TA
TL
–40
—
TH
+125
°C
Istby
Istby
Istby
—
—
—
0.6
0.8
1.5
0.9
1.2
2.2
µA
µA
µA
Iread
—
400
600
µA
Itemp
—
400
600
µA
Ipress
Ipress
Ipress
—
—
—
1400
1300
1200
1800
1700
1700
µA
µA
µA
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Electrical Characteristics
+2.1 V ≤ VDD ≤ +3.6 V, TL ≤ TA ≤ TH, unless otherwise specified.
Characteristic
Symbol
Min
Typ
Max
Units
Output High Voltage
DATA, OUT, RST (ILoad = 100 µA)
VOH
VDD–0.8
—
—
V
Output Low Voltage
DATA, OUT, RST (ILoad = –100 µA)
VOL
—
—
0.4
V
Input High Voltage
S1, S0, DATA, CLK
VIH
0.7 x VDD
—
—
V
Input Low Voltage
S1, S0, DATA, CLK
VIL
VSS
—
0.3 x VDD
V
VHYS
100
200
—
mV
Input Low Current (at VIL)
S1, S0, DATA, CLK
IIL
–5
–25
–100
µA
Input High Current (at VIH)
S1, S0, DATA, CLK
IIH
–5
–35
–140
µA
Temperature Measurement (+2.5V≤Vdd≤3.0V)
D/A Conversion Code at –40°C
D/A Conversion Code at –20°C
D/A Conversion Code at 25°C
D/A Conversion Code at 70°C
D/A Conversion Code at 100°C
D/A Conversion Code at 120°C
D/A Conversion Code at 125°C
T–40
T–20
T25
T70
T100
T120
T125
36
52
97
155
204
241
249
42
57
102
163
214
252
255
47
62
107
171
224
255
255
counts
counts
counts
counts
counts
counts
counts
Temperature Measurement (+2.1V≤Vdd≤3.6V)
D/A Conversion Code at –40°C
D/A Conversion Code at –20°C
D/A Conversion Code at 25°C
D/A Conversion Code at 70°C
D/A Conversion Code at 100°C
D/A Conversion Code at 120°C
D/A Conversion Code at 125°C
T–40
T–20
T25
T70
T100
T120
T125
36
52
97
154
203
240
249
42
57
102
163
214
252
255
49
64
107
172
225
255
255
counts
counts
counts
counts
counts
counts
counts
—
0.80
—
°C/bit
OUT = 74.7461 +0.9752 x Ta + 0.0041 x Ta^2
counts
Temperature Sensitivity at 25°C
Approximate Temperature Output Response
Temperature Error vs. Temperature (VDD = 3 V)
8
7
Temperature Error (C)
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Input Hysteresis (VIH – VIL)
S1, S0, DATA, CLK
6
5
4
3
2
1
0
–40
–20
0
20
40
60
80
100
120
Temperature (C)
8
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Control Timing
+2.1 V ≤ VDD ≤ +3.6 V, TL ≤ TA ≤ TH, unless otherwise specified.
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Characteristic
Symbol
Min
Typ
Max
Units
HFO Measurement Clock Frequency
fHF
100
135
150
kHz
LFO Wake Up Clock Frequency
Ta = –40°C, +2.1V ≤ Vdd ≤ +3.6
Ta = +25°C, +2.1V ≤ Vdd ≤ +3.6
Ta = +125°C, +2.1V ≤ Vdd ≤ +3.6
fLF
fLF
fLF
3300
3900
3800
5400
5400
5300
8000
7700
7000
Hz
Hz
Hz
Wake Up Pulse
Pulse Timing
Pulse Width
tWAKE
tWPW
—
—
16384
2
—
—
LFO clocks
LFO clocks
Reset Pulse
Pulse Timing
Pulse Width
tRESET
tRPW
—
—
16,777,216
2
—
—
LFO clocks
LFO clocks
Minimum Setup Time (DATA edge to CLK rise)
tSETUP
100
—
—
nSec
Minimum Hold Time (CLK rise to DATA change)
tHOLD
100
—
—
nSec
Measurement Response Time
Recommended time to hold
device in measurement mode
Temperature
Pressure
tTMEAS
tPMEAS
—
—
200
500
—
—
µSec
µSec
Read Response Time (see Figure 8)
From 90% VDD on S0
To OUT less than VOL or greater than VOH
tREAD
—
50
100
µSec
tSH
20
—
—
mSec
Sample Capacitor Discharge Time
From initial full scale D/A count (255)
to drop 2 counts (253)
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Figure 8. Control Timing Test Load for OUT and RST Pins
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SENSOR CHARACTERISTICS (MPXY8020A)
Pressure Transfer Function
kPa = 2.5 × Output ± (Pressure Error)
Output = 8–bit digital pressure measurement (between 0–255)
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Pressure Error (kPa): 50 kPa P 250 kPa
T[°C] \ VDD[V]
2.1
2.5
2.7
3.0
3.3
3.6
–40
72.5
72.5
32.5
32.5
32.5
35.0
–20
57.5
57.5
25.0
25.0
25.0
27.5
0
57.5
57.5
25.0
25.0
25.0
27.5
25
57.5
57.5
25.0
25.0
25.0
27.5
70
57.5
57.5
27.5
25.0
25.0
27.5
100
72.5
72.5
37.5
37.5
37.5
37.5
125
95.0
92.5
57.5
47.5
47.5
47.5
Pressure Error (kPa): 250 kPa P 450 kPa
T[°C] \ VDD[V]
2.1
2.5
2.7
3.0
3.3
3.6
–40
40.0
40.0
25.0
25.0
25.0
30.0
–20
32.5
25.0
15.0
15.0
15.0
20.0
0
30.0
25.0
10.0
10.0
10.0
15.0
25
30.0
25.0
7.5
7.5
7.5
15.0
70
35.0
25.0
10.0
7.5
7.5
15.0
100
40.0
40.0
25.0
25.0
25.0
30.0
125
62.5
60.0
35.0
35.0
35.0
35.0
Pressure Error (kPa): 450 kPa P 600 kPa
T[°C] \ VDD[V]
2.1
2.5
2.7
3.0
3.3
3.6
–40
70.0
70.0
37.5
37.5
37.5
40.0
–20
55.0
55.0
25.0
25.0
25.0
35.0
0
55.0
55.0
22.5
22.5
22.5
35.0
25
55.0
55.0
22.5
22.5
22.5
35.0
70
55.0
55.0
25.0
25.0
25.0
35.0
100
70.0
70.0
32.5
32.5
32.5
40.0
125
90.0
90.0
47.5
47.5
47.5
52.5
Areas marked in grey indicate the typical operating range.
10
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SENSOR CHARACTERISTICS (MPXY8020A)
Pressure Error
30.0
Error [kPa]
25.0
20.0
15.0
10.0
0.0
50
100
150
200
250
300
400
350
450
500
550
600
Pressure [kPa]
Figure 9. Pressure Error vs Pressure at T= 25C, 2.7 VDD +3.3 V
35
Error [kPa]
30
25
20
15
10
5
0
2.1
2.3
2.5
2.7
2.9
3.1
3.3
3.5
Vdd [V]
Figure 10. Pressure Error vs VDD at 25C, 250 kPa P 450 kPa
35.0
Pressure Error [kPa]
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5.0
30.0
25.0
20.0
15.0
10.0
5.0
0.0
–40.0
–20.0
0.0
20.0
40.0
60.0
80.0
100.0
120
Temperature [C]
Figure 11. Pressure Error vs. Temperature at VDD = 3 V, 250 kPa P 450 kPa
Motorola Sensor Device Data
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MECHANICAL SPECIFICATIONS
Maximum Ratings
Maximum ratings are the extreme limits to which the device can be exposed without permanently damaging it. Keep VIN and
VOUT within the range VSS ≤ (VIN or VOUT) ≤ VDD.
Rating
Symbol
Value
Unit
pmax
1400
kPa (1)
Centrifugal Force Effects (3 axis)
Pressure measurement change less than 1% FSS
gCENT
2000
g
Unpowered Shock (three sides, 0.5 mSec duration)
gshock
2000
g
Maximum Pressure
(1)
NOTES:
1. Tested for 5 min at 25°C
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Media Compatibility
Media compatibility is as specified in Motorola document “SPD TPM Media Test.”
12
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PACKAGE DIMENSIONS
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Freescale Semiconductor, Inc.
Freescale Semiconductor, Inc...
NOTES
14
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Freescale Semiconductor, Inc.
Freescale Semiconductor, Inc...
NOTES
Motorola Sensor Device Data
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Freescale Semiconductor, Inc...
Freescale Semiconductor, Inc.
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MPXY8020A/D