ONSEMI CS5421GDR16

CS5421
Dual Out−of−Phase
Synchronous Buck
Controller with Remote
Sense
The CS5421 is a dual N−channel synchronous buck regulator
controller. It contains all the circuitry required for two independent
buck regulators and utilizes the V2™ control method to achieve the
fastest possible transient response and best overall regulation, while
using the least number of external components. The CS5421 features
out−of−phase synchronization between the channels, reducing the
input filter requirement. The CS5421 also provides undervoltage
lockout, Soft Start, built in adaptive FET non−overlap and remote
sense capability. The part is available in a 16 Lead SO Narrow package
allowing the designer to minimize solution size.
SO−16
D SUFFIX
CASE 751B
PIN CONNECTIONS AND
MARKING DIAGRAM
GATE(H)1
GATE(L)1
PGND
LGND
SGND
VFFB1
VFB1
COMP1
A
WL, L
YY, Y
WW, W
July, 2006 − Rev. 10
1
16
GATE(H)2
GATE(L)2
PGND2
VCC
ROSC
VFFB2
VFB2
COMP2
= Assembly Location
= Wafer Lot
= Year
= Work Week
ORDERING INFORMATION
Device
© Semiconductor Components Industries, LLC, 2006
1
CS5421
AWLYWW
Features
V2 Control Topology
150 ns Transient Response
Programmable Soft Start
25 ns Gate Rise and Fall Times (with 1.0 nF load)
40 ns Adaptive FET Nonoverlap Time
100% Duty Cycle for Enhanced Transient Response
Internal Slope Compensation
1.0 V 0.8% and 2.0% Error Amplifier References
150 kHz to 750 kHz Programmable Frequency Operation
Switching Frequency Set by Single Resistor
Out−Of−Phase Synchronization Between the Channels Reduces the
Input Filter Requirement
• Undervoltage Lockout
• On/Off Control Through Use of the COMP Pins
•
•
•
•
•
•
•
•
•
•
•
http://onsemi.com
Package
Shipping
CS5421GD16
SO−16
48 Units/Rail
CS5421GDR16
SO−16
2500 Tape & Reel
Publication Order Number:
CS5421/D
CS5421
VIN 5.0 V
VIN 12 V
1.0 μH
1.0 μF
3 × 1200 μF
3 × 1200 μF
13
VOUT
3.3 V/11 A
VCC
16
GATE(H)2
GATE(H)1
GATE(L)2
GATE(L)2
VOUT
1.5 V/9.0 A
1
1.2 μH
15
4 × 1200 μF
14
11
9
12
LGND
SGND
4
15 k
8
COMP1
VFB2
ROSC
6
VFFB1
COMP2
6 × 1200 μF
3
PGND1
VFFB2
0.1 μF 10
34.5 k
CS5421
PGND2
2.7 μH
2
0.1 μF
VFB1 7
5
15 k
30 k
GND SENSE
30.9 k
Figure 1. Application Diagram, 5.0 V/12 V to 3.3 V/11 A and 1.5 V/9.0 A Converter
for Processor I/O and Core Supplies
ABSOLUTE MAXIMUM RATINGS*
Rating
Value
Unit
150
°C
−65 to +150
°C
ESD Susceptibility (Human Body Model)
2.0
kV
Package Thermal Resistance:
Junction−to−Case, RθJC
Junction−to−Ambient, RθJA
28
115
°C/W
°C/W
230 peak
°C
Operating Junction Temperature, TJ
Storage Temperature Range, TS
Lead Temperature Soldering:
1. 60 second maximum above 183°C.
*The maximum package power dissipation must be observed.
Reflow: (SMD styles only) (Note 1)
ABSOLUTE MAXIMUM RATINGS
Pin Symbol
Pin Name
VMAX
VMIN
ISOURCE
ISINK
VCC
IC Power Input
16 V
−0.3 V
N/A
1.5 A peak
200 mA DC
COMP1, COMP2
Compensation Capacitor for
Channel 1 or 2
4.0 V
−0.3 V
1.0 mA
1.0 mA
VFB1, VFB2
Voltage Feedback Input for
Channel 1 or 2
5.0 V
−0.3 V
1.0 mA
1.0 mA
VFB1, VFB2
Fast Voltage Feedback
Input for Channel 1 or 2
5.0 V
−0.3 V
1.0 mA
1.0 mA
http://onsemi.com
2
CS5421
ABSOLUTE MAXIMUM RATINGS (continued)
Pin Symbol
Pin Name
VMAX
VMIN
ISOURCE
ISINK
ROSC
Oscillator Resistor
4.0 V
−0.3 V
1.0 mA
1.0 mA
GATE(H)1, GATE(H)2
High−Side FET Driver
for Channel 1 or 2
16 V
−0.3 V
1.5 A peak
200 mA DC
1.5 A peak
200 mA DC
GATE(L)1, GATE(L)2
Low−Side FET Driver for
Channel 1 or 2
16 V
−0.3 V
1.5 A peak
200 mA DC
1.5 A peak
200 mA DC
PGND1
Power Ground for Channel 1
0V
0V
1.5 A peak
200 mA DC
N/A
PGND2
Power Ground for Channel 2
0V
0V
1.5 A peak
200 mA DC
N/A
SGND
Ground for Internal Reference
150 mV
0V
1.0 mA
N/A
LGND
Logic Ground
0V
0V
50 mA
N/A
ELECTRICAL CHARACTERISTICS (0°C < TA < 70°C; 0°C < TJ < 125°C; ROSC = 30.9 k, CCOMP1,2 = 0.1 μF,
10.8 V < VCC < 13.2 V; CGATE(H)1,2 = CGATE(L)1,2 = 1.0 nF, unless otherwise specified.)
Characteristic
Test Conditions
Min
Typ
Max
Unit
Error Amplifier
VFB1(2) Bias Current
VFB1(2) = 0 V
−
0.1
1.0
μA
COMP1,2 Source Current
COMP1,2 = 1.2 V to 2.5 V; VFB1(2) = 0.8 V
15
30
60
μA
COMP1,2 Sink Current
COMP1,2 = 1.2 V; VFB1(2) = 1.2 V
15
30
60
μA
Reference Voltage 1
COMP1 = VFB1; 25°C < TJ < 125°C
0.992
1.000
1.008
V
Reference Voltage 2
COMP2 = VFB2
0.980
1.000
1.020
V
COMP1,2 Max Voltage
VFB1(2) = 0.8 V
3.0
3.3
−
V
COMP1,2 Min Voltage
VFB1(2) = 1.2 V
−
0.25
0.35
V
Open Loop Gain
−
−
95
−
dB
Unity Gain Band Width
−
−
40
−
kHz
PSRR @ 1.0 kHz
−
−
70
−
dB
Transconductance
−
−
32
−
mmho
Output Impedance
−
−
2.5
−
MΩ
GATE(H) and GATE(L)
High Voltage (AC)
Measure: VCC − GATE(L)1,2;
VCC − GATE(H)1,2; Note 2
−
0
0.5
V
Low Voltage (AC)
Measure:GATE(L)1,2 or GATE(H)1,2; Note 2
−
0
0.5
V
Rise Time
1.5 V < GATE(L)1,2 < VCC − 1.5 V
1.5 V < GATE(H)1,2 < VCC − 1.5 V
−
25
60
ns
Fall Time
VCC − 1.5 > GATE(L)1,2 > 1.5 V
VCC − 1.5 > GATE(H)1,2 > 1.5 V
−
20
60
ns
GATE(H) to GATE(L) Delay
GATE(H)1,2 < 1.0 V, GATE(L)1,2 > 1.0 V
40
70
100
ns
GATE(L) to GATE(H) Delay
GATE(L)1,2 < 1.0 V, GATE(H)1,2 > 1.0 V
40
70
100
ns
GATE(H)1(2) and GATE(L)1(2)
pull−down
Resistance to PGND
Note 2
50
125
280
kΩ
2. Guaranteed by design, not 100% tested in production.
http://onsemi.com
3
CS5421
ELECTRICAL CHARACTERISTICS (continued) (0°C < TA < 70°C; 0°C < TJ < 125°C; ROSC = 30.9 k, CCOMP1,2 = 0.1 μF,
10.8 V < VCC < 13.2 V; CGATE(H)1,2 = CGATE(L)1,2 = 1.0 nF, unless otherwise specified.)
Characteristic
Test Conditions
Min
Typ
Max
Unit
Transient Response
COMP1,2 = 1.0 V, VFB1(2) = VFFB1(2) = 0 to 1.2 V
−
150
300
ns
PWM Comparator Offset
VFFB1(2) = 0 V; Increase COMP1,2 until
GATE(H)1,2 starts switching
0.30
0.45
0.60
V
Artificial Ramp
Duty cycle = 50%, Note 3
40
70
100
mV
VFFB1(2) Bias Current
VFFB1(2) = 0 V
−
0.4
1.5
μA
PWM Comparator
VFFB1(2) Input Range
−
0.0
−
1.1
V
Minimum Pulse Width
−
−
−
300
ns
Oscillator
Switching Frequency
ROSC = 61.9 k; Measure GATE(H)2, Note 3
112
150
188
kHz
Switching Frequency
ROSC = 30.9 k; Measure GATE(H)2
224
300
376
kHz
Switching Frequency
ROSC = 11.8 k; Measure GATE(H)2, Note 3
600
750
900
kHz
ROSC Voltage
ROSC = 30.9 k, Note 3
0.970
1.000
1.030
V
−
180
−
°
−
16
22
mA
75
150
225
μA
Phase Difference
−
Supply Currents
VCC Current
COMP1,2 = 0 V (No Switching)
SGND Current
−
Undervoltage Lockout
Start Threshold
GATE(H) Switching; COMP1,2 charging
7.8
8.6
9.6
V
Stop Threshold
GATE(H) not switching; COMP1,2 discharging
7.0
7.8
8.6
V
Hysteresis
Start−Stop
0.5
0.8
1.5
V
3. Guaranteed by design, not 100% tested in production.
PACKAGE PIN DESCRIPTION
PACKAGE PIN #
16 Lead SO Narrow
PIN SYMBOL
1
GATE(H)1
High Side Switch FET driver pin for the channel 1 FET.
2
GATE(L)1
Low Side Synchronous FET driver pin for the channel 1 FET.
3
PGND1
4
LGND
Logic ground. All control circuits are referenced to this pin. IC
substrate connection.
5
SGND
Ground sense for the internal reference.
6
VFFB1
Input for the channel 1 PWM comparator.
7
VFB1
Error amplifier inverting input for channel 1.
8
COMP1
Channel 1 Error Amp output. PWM Comparator reference
input. A capacitor to LGND provides Error Amp compensation. The same capacitor provides Soft Start timing for channel 1. This pin also disables the channel 1 output when
pulled below 0.3 V.
9
COMP2
Channel 2 Error Amp output. PWM Comparator reference
input. A capacitor to LGND provides Error Amp compensation and Soft Start timing for channel 2. Channel 2 output is
disabled when this pin is pulled below 0.3 V.
FUNCTION
High Current ground for the GATE(H)1 and GATE(L)1 pins.
http://onsemi.com
4
CS5421
PACKAGE PIN DESCRIPTION (continued)
PACKAGE PIN #
16 Lead SO Narrow
PIN SYMBOL
10
VFB2
Error amplifier inverting input for channel 2.
11
VFFB2
Input for the channel 2 PWM comparator.
12
ROSC
A resistor from this pin to ground sets switching frequency.
13
VCC
14
PGND2
15
GATE(L)2
Low Side Synchronous FET driver pin for the channel 2 FET.
16
GATE(H)2
High Side Switch FET driver pin for the channel 2 FET.
VCC
FUNCTION
Input Power supply pin.
High Current ground for the GATE(H)2 and GATE(L)2 pins.
ROSC
BIAS
CURRENT
SOURCE
GEN
RAMP2
RAMP1
CLK1
OSC
VFFB1
VFFB2
CLK2
VCC
−
+
0.45 V
R
RAMP1
VCC
S
−
+
− 0.25 V
E/A OFF
VCC
GATE(L)2
R
RAMP2
PGND2
E/A OFF
0.45 V
E/A1
1.0 mA
FAULT
−
+
−
+
+
−
−
1.0 V
SGND
GATE(H)2
Reset
Dominant
FAULT
PWM
Comparator 2
1.0 V
GATE(L)1
PGND1
Set
Dominant
5.0 μA
VCC
+
Q FAULT
S
GATE(H)1
R
−
+
+
−
S
Reset
Dominant
FAULT
PWM
Comparator 1
−
+
8.6 V
7.8 V
VCC
VFB
COMP1
VFB2
Figure 2. Block Diagram
http://onsemi.com
5
+
E/A2
COMP2
LGND
CS5421
APPLICATIONS INFORMATION
THEORY OF OPERATION
time to the output load step is not related to the crossover
frequency of the error signal loop.
The error signal loop can have a low crossover frequency,
since the transient response is handled by the ramp signal
loop. The main purpose of this ‘slow’ feedback loop is to
provide DC accuracy. Noise immunity is significantly
improved, since the error amplifier bandwidth can be rolled
off at a low frequency. Enhanced noise immunity improves
remote sensing of the output voltage, since the noise
associated with long feedback traces can be effectively
filtered.
Line and load regulation is drastically improved because
there are two independent control loops. A voltage mode
controller relies on the change in the error signal to
compensate for a deviation in either line or load voltage.
This change in the error signal causes the output voltage to
change corresponding to the gain of the error amplifier,
which is normally specified as line and load regulations. A
current mode controller maintains a fixed error signal during
line transients, since the slope of the ramp signal changes in
this case. However, regulation of load transients still requires
a change in the error signal. The V2 method of control
maintains a fixed error signal for both line and load variation,
since the ramp signal is affected by both line and load.
The stringent load transient requirements of modern
microprocessors require the output capacitors to have very
low ESR. The resulting shallow slope in the output ripple
can lead to pulse width jitter and variation caused by both
random and synchronous noise. A ramp waveform
generated in the oscillator is added to the ramp signal from
the output voltage to provide the proper voltage ramp at the
beginning of each switching cycle. This slope compensation
increases the noise immunity particularly at higher duty
cycle (above 50%).
The CS5421 is a dual power supply controller that utilizes
the V2 control method. Two synchronous V2 buck regulators
can be built using a single controller. The fixed−frequency
architecture, driven from a common oscillator, ensures a
180° phase differential between channels.
V2 Control Method
The V2 method of control uses a ramp signal that is
generated by the ESR of the output capacitors. This ramp is
proportional to the AC current through the main inductor
and is offset by the DC output voltage. This control scheme
inherently compensates for variation in either line or load
conditions, since the ramp signal is generated from the
output voltage itself. The V2 method differs from traditional
techniques such as voltage mode control, which generates an
artificial ramp, and current mode control, which generates
a ramp using the inductor current.
PWM
Comparator
−
GATE(H)
+
GATE(L)
RAMP
VFFB
Slope
Compensation
COMP
Error
Signal
Error
Amplifier
Output
Voltage
Feedback
VFB
−
+
Reference
Voltage
Figure 3. V2 Control with Slope Compensation
The V2 control method is illustrated in Figure 3. The
output voltage generates both the error signal and the ramp
signal. Since the ramp signal is simply the output voltage, it
is affected by any change in the output, regardless of the
origin of that change. The ramp signal also contains the DC
portion of the output voltage, allowing the control circuit to
drive the main switch to 0% or 100% duty cycle as required.
A variation in line voltage changes the current ramp in the
inductor, which causes the V2 control scheme to compensate
the duty cycle. Since any variation in inductor current
modifies the ramp signal, as in current mode control, the V2
control scheme offers the same advantages in line transient
response.
A variation in load current will affect the output voltage,
modifying the ramp signal. A load step immediately changes
the state of the comparator output, which controls the main
switch. The comparator response time and the transition
speed of the main switch determine the load transient
response. Unlike traditional control methods, the reaction
Startup
The CS5421 features a programmable Soft Start function,
which is implemented through the Error Amplifier and the
external Compensation Capacitor. This feature prevents
stress to the power components and overshoot of the output
voltage during start−up. As power is applied to the regulator,
the CS5421 Undervoltage Lockout circuit (UVL) monitors
the IC’s supply voltage (VCC). The UVL circuit prevents the
MOSFET gates from switching until VCC exceeds the 8.6 V
threshold. A hysteresis function of 800 mV improves noise
immunity. The Compensation Capacitor connected to the
COMP pin is charged by a 30 μA current source. When the
capacitor voltage exceeds the 0.4 V offset of the PWM
comparator, the PWM control loop will allow switching to
occur. The upper gate driver GATE(H) is activated turning
on the upper MOSFET. The current then ramps up through
the main inductor and linearly powers the output capacitors
and load. When the regulator output voltage exceeds the
COMP pin voltage minus the 0.4 V PWM comparator offset
http://onsemi.com
6
CS5421
threshold and the artificial ramp, the PWM comparator
terminates the initial pulse.
current. For better transient response, several high
frequency and bulk output capacitors are usually used.
Out−of−Phase Synchronization
VIN
8.6 V
In out−of−phase synchronization, the turn−on of the
second channel is delayed by half the switching cycle. This
delay is supervised by the oscillator, which supplies a clock
signal to the second channel which is 180° out of phase with
the clock signal of the first channel.
The advantages of out−of−phase synchronization are
many. Since the input current pulses are interleaved with one
another, the overlap time is reduced. The effect of this
overlap reduction is to reduce the input filter requirement,
allowing the use of smaller components. In addition, since
peak current occurs during a shorter time period, emitted
EMI is also reduced, thereby reducing shielding
requirements.
VCOMP
0.45 V
VFB
GATE(H)1
GATE(H)2
UVLO
STARTUP
tS
NORMAL OPERATION
Figure 4. Idealized Waveforms
Overvoltage Protection
Normal Operation
Overvoltage Protection (OVP) is provided as a result of
the normal operation of the V2 control method and requires
no additional external components. The control loop
responds to an overvoltage condition within 200 ns, turning
off the upper MOSFET and disconnecting the regulator
from its input voltage. This results in a crowbar action to
clamp the output voltage preventing damage to the load. The
regulator remains in this state until the overvoltage
condition ceases.
During normal operation, the duty cycle of the gate drivers
remains approximately constant as the V2 control loop
maintains the regulated output voltage under steady state
conditions. Variations in supply line or output load
conditions will result in changes in duty cycle to maintain
regulation.
Gate Charge Effect on Switching Times
When using the onboard gate drivers, the gate charge has
an important effect on the switching times of the FETs. A
finite amount of time is required to charge the effective
capacitor seen at the gate of the FET. Therefore, the rise and
fall times rise linearly with increased capacitive loading,
according to the following graphs.
Average Fall Time
Remote Sense
When the load is far away from the regulator, the long
feedback traces can cause additional voltage drop and
induce noise which affects the accuracy of voltage
regulation. A separate signal ground is provided to improve
the noise immunity of remote voltage sensing. The 1.0 V
reference voltage of the error amplifiers is directly
referenced to this ground and no large currents flow through
this ground during normal operation. The noise immunity
and regulation accuracy can be improved significantly.
Average Rise Time
90
Fall/Rise Time (ns)
80
70
60
50
Output Enable
40
On/Off control of the regulator outputs can be
implemented by pulling the COMP pins low. The COMP
pins must be driven below the 0.4 V PWM comparator offset
voltage in order to disable the switching of the GATE
drivers.
30
20
10
0
0
1
2
3
4
5
6
7
8
Load (nF)
DESIGN GUIDELINES
Figure 5. Average Rise and Fall Times
Definition of the design specifications
Transient Response
The output voltage tolerance can be affected by any or all
of the following reasons:
1. buck regulator output voltage setpoint accuracy;
2. output voltage change due to discharging or charging
of the bulk decoupling capacitors during a load
current transient;
The 200 ns reaction time of the control loop provides fast
transient response to any variations in input voltage and
output current. Pulse−by−pulse adjustment of duty cycle is
provided to quickly ramp the inductor current to the required
level. Since the inductor current cannot be changed
instantaneously, regulation is maintained by the output
capacitors during the time required to slew the inductor
http://onsemi.com
7
CS5421
3. output voltage change due to the ESR and ESL of the
bulk and high frequency decoupling capacitors,
circuit traces, and vias;
4. output voltage ripple and noise.
Budgeting the tolerance is left up to the designer who must
take into account all of the above effects and provide an
output voltage that will meet the specified tolerance at the
load.
The designer must also ensure that the regulator
component temperatures are kept within the manufacturer’s
specified ratings at full load and maximum ambient
temperature.
800
Frequency (kHz)
700
600
500
400
300
200
100
10
20
30
Selecting Feedback Divider Resistors
40
50
60
ROSC (kW)
Figure 7. Switching Frequency
VOUT
Selecting the Switching Frequency
Selecting the switching frequency is a trade−off between
component size and power losses. Operation at higher
switching frequencies allows the use of smaller inductor and
capacitor values. Nevertheless, it is common to select lower
frequency operation because a higher frequency results in
lower efficiency due to MOSFET gate charge losses.
Additionally, the use of smaller inductors at higher
frequencies results in higher ripple current, higher output
voltage ripple, and lower efficiency at light load currents.
The value of the oscillator resistor is designed to be
linearly related to the switching period. If the designer
prefers not to use Figure 7 to select the necessary resistor, the
following equation quite accurately predicts the proper
resistance for room temperature conditions.
R1
VFB
R2
Figure 6. Selecting Feedback Divider Resistors
The feedback pins (VFB1(2)) are connected to
externalresistor dividers to set the output voltages. The error
amplifier is referenced to 1.0 V and the output voltage is
determined by selecting resistor divider values. Resistor R1
is selected based on a design trade−off between efficiency
and output voltage accuracy. The output voltage error can be
estimated due to the bias current of the error amplifier
neglecting resistor tolerance:
10*6
1.0
Error% + 1
R1
ROSC +
where:
ROSC = oscillator resistor in kΩ;
fSW = switching frequency in kHz.
100%
R2 can be sized after R1 has been determined:
Selection of the Output Inductor
ǒVOUT
* 1.0Ǔ
1.0
R2 + R1
The inductor should be selected based on its inductance,
current capability, and DC resistance. Increasing the
inductor value will decrease output voltage ripple, but
degrade transient response. There are many factors to
consider in selecting the inductor including cost, efficiency,
EMI and ease of manufacture. The inductor must be able to
handle the peak current at the switching frequency without
saturating, and the copper resistance in the winding should
be kept as low as possible to minimize resistive power loss.
There are a variety of materials and types of magnetic
cores that could be used for this application. Among them
are ferrites, molypermalloy cores (MPP), amorphous and
powdered iron cores. Powdered iron cores are very
commonly used. Powdered iron cores are very suitable due
Calculating Duty Cycle
The duty cycle of a buck converter (including parasitic
losses) is given by the formula:
Duty Cycle + D +
21700 * fSW
2.31fSW
VOUT ) (VHFET ) VL)
VIN ) VLFET * VHFET * VL
where:
VOUT = buck regulator output voltage;
VHFET = high side FET voltage drop due to RDS(ON);
VL = output inductor voltage drop due to inductor wire
DC resistance;
VIN = buck regulator input voltage;
VLFET = low side FET voltage drop due to RDS(ON).
http://onsemi.com
8
CS5421
to its high saturation flux density and have low loss at high
frequencies, a distributed gap and exhibit very low EMI.
The minimum value of inductance which prevents
inductor saturation or exceeding the rated FET current can
be calculated as follows:
LMIN +
where:
IL(VALLEY) = inductor valley current.
Selection of the Output Capacitors
These components must be selected and placed carefully
to yield optimal results. Capacitors should be chosen to
provide acceptable ripple on the regulator output voltage.
Key specifications for output capacitors are their ESR
(Equivalent Series Resistance), and ESL (Equivalent Series
Inductance). For best transient response, a combination of
low value/high frequency and bulk capacitors placed close
to the load will be required.
In order to determine the number of output capacitors the
maximum voltage transient allowed during load transitions
has to be specified. The output capacitors must hold the
output voltage within these limits since the inductor current
can not change with the required slew rate. The output
capacitors must therefore have a very low ESL and ESR.
The voltage change during the load current transient is:
(VIN(MIN) * VOUT)VOUT
fSW VIN(MIN) ISW(MAX)
where:
LMIN = minimum inductance value;
VIN(MIN) = minimum design input voltage;
VOUT = output voltage;
fSW = switching frequency;
ISW(MAX) − maximum design switch current.
The inductor ripple current can then be determined:
V
DIL + OUT
L
(1.0 * D)
fSW
where:
ΔIL = inductor ripple current;
VOUT = output voltage;
L = inductor value;
D = duty cycle.
fSW = switching frequency
The designer can now verify if the number of output
capacitors will provide an acceptable output voltage ripple
(1.0% of output voltage is common). The formula below is
used:
DIL +
DVOUT + DIOUT
where:
ΔIOUT / Δt = load current slew rate;
ΔIOUT = load transient;
Δt = load transient duration time;
ESL = Maximum allowable ESL including capacitors,
circuit traces, and vias;
ESR = Maximum allowable ESR including capacitors
and circuit traces;
tTR = output voltage transient response time.
The designer has to independently assign values for the
change in output voltage due to ESR, ESL, and output
capacitor discharging or charging. Empirical data indicates
that most of the output voltage change (droop or spike
depending on the load current transition) results from the
total output capacitor ESR.
The maximum allowable ESR can then be determined
according to the formula:
DVOUT
ESRMAX
Rearranging we have:
ESRMAX +
DVOUT
DIL
where:
ESRMAX = maximum allowable ESR;
ΔVOUT = 1.0% × VOUT = maximum allowable output
voltage ripple ( budgeted by the designer );
ΔIL = inductor ripple current;
VOUT = output voltage.
The number of output capacitors is determined by:
Number of capacitors +
DVESR
ESRMAX +
DIOUT
ESRCAP
ESRMAX
where:
ΔVESR = change in output voltage due to ESR (assigned
by the designer)
Once the maximum allowable ESR is determined, the
number of output capacitors can be found by using the
formula:
where:
ESRCAP = maximum ESR per capacitor (specified in
manufacturer’s data sheet).
The designer must also verify that the inductor value
yields reasonable inductor peak and valley currents (the
inductor current is a triangular waveform):
IL(PEAK) + IOUT )
Number of capacitors +
DIL
2.0
ESRCAP
ESRMAX
where:
ESRCAP = maximum ESR per capacitor (specified in
manufacturer’s data sheet).
ESR = maximum allowable ESR.
The actual output voltage deviation due to ESR can then
be verified and compared to the value assigned by the
designer:
where:
IL(PEAK) = inductor peak current;
IOUT = load current;
ΔIL = inductor ripple current.
IL(VALLEY) + IOUT *
t
ǒESL
) ESR ) TR Ǔ
Dt
COUT
DIL
2.0
http://onsemi.com
9
CS5421
DVESR + DIOUT
leakage losses, 3) turn−on switching losses, 4) turn−off
switching losses, and 5) gate−transitions losses. The latter
three losses are proportional to frequency.
The most important aspect of FET performance is the
Static Drain−To−Source On−Resistance (RDS(ON)), which
effects regulator efficiency and FET thermal management
requirements. The On−Resistance determines the amount of
current a FET can handle without excessive power
dissipation that may cause overheating and potentially
catastrophic failure. As the drain current rises, especially
above the continuous rating, the On−Resistance also
increases. Its positive temperature coefficient is between
+0.6%/°C and +0.85%/°C. The higher the On−Resistance
the larger the conduction loss is. Additionally, the FET gate
charge should be low in order to minimize switching losses
and reduce power dissipation.
Both logic level and standard FETs can be used.
Voltage applied to the FET gates depends on the
application circuit used. Both upper and lower gate driver
outputs are specified to drive to within 1.5 V of ground when
in the low state and to within 2.0 V of their respective bias
supplies when in the high state. In practice, the FET gates
will be driven rail−to−rail due to overshoot caused by the
capacitive load they present to the controller IC.
ESRMAX
Similarly, the maximum allowable ESL is calculated from
the following formula:
ESLMAX +
DVESL
DI
Dt
Selection of the Input Inductor
A common requirement is that the buck controller must
not disturb the input voltage. One method of achieving this
is by using an input inductor and a bypass capacitor. The
input inductor isolates the supply from the noise generated
in the switching portion of the buck regulator and also limits
the inrush current into the input capacitors upon power up.
The inductor’s limiting effect on the input current slew rate
becomes increasingly beneficial during load transients. The
worst case is when the load changes from no load to full load
(load step), a condition under which the highest voltage
change across the input capacitors is also seen by the input
inductor. The inductor successfully blocks the ripple current
while placing the transient current requirements on the input
bypass capacitor bank, which has to initially support the
sudden load change.
The minimum inductance value for the input inductor is
therefore:
LIN +
DV
(dIńdt)MAX
Selection of the Switching (Upper) FET
The designer must ensure that the total power dissipation
in the FET switch does not cause the power component’s
junction temperature to exceed 150°C.
The maximum RMS current through the switch can be
determined by the following formula:
where:
LIN = input inductor value;
ΔV = voltage seen by the input inductor during a full load
swing;
(dI/dt)MAX = maximum allowable input current slew rate.
The designer must select the LC filter pole frequency so
that at least 40 dB attenuation is obtained at the regulator
switching frequency. The LC filter is a double−pole network
with a slope of −2, a roll−off rate of −40 dB/dec, and a corner
frequency:
fC +
2p
IRMS(H) +
Ǹ
ƪ
IL(PEAK)2 ) (IL(PEAK)
) IL(VALLEY)2 D
ƫ
IL(VALLEY))
3.0
where:
IRMS(H) = maximum switching MOSFET RMS current;
IL(PEAK) = inductor peak current;
IL(VALLEY) = inductor valley current;
D = duty cycle.
Once the RMS current through the switch is known, the
switching MOSFET conduction losses can be calculated:
1.0
ǸLC
where:
L = input inductor;
C = input capacitor(s).
PRMS(H) + IRMS(H)2
SELECTION OF THE POWER FET
RDS(ON)
where:
PRMS(H) = switching MOSFET conduction losses;
IRMS(H) = maximum switching MOSFET RMS current;
RDS(ON) = FET drain−to−source on−resistance
The upper MOSFET switching losses are caused during
MOSFET switch−on and switch−off and can be determined
by using the following formula:
FET Basics
The use of the MOSFET as a power switch is propelled by
two reasons: 1) Its very high input impedance; and 2) Its very
fast switching times. The electrical characteristics of a
MOSFET are considered to be those of a perfect switch.
Control and drive circuitry power is therefore reduced.
Because the input impedance is so high, it is voltage driven.
The input of the MOSFET acts as if it were a small capacitor,
which the driving circuit must charge at turn on. The lower
the drive impedance, the higher the rate of rise of VGS, and
the faster the turn−on time. Power dissipation in the
switching MOSFET consists of 1) conduction losses, 2)
PSWH + PSWH(ON) ) PSWH(OFF)
V
+ IN
IOUT
(tRISE ) tFALL)
6.0T
where:
PSWH(ON) = upper MOSFET switch−on losses;
http://onsemi.com
10
CS5421
PSWH(OFF) = upper MOSFET switch−off losses;
VIN = input voltage;
IOUT = load current;
tRISE = MOSFET rise time (from FET manufacturer’s
switching characteristics performance curve);
tFALL = MOSFET fall time (from FET manufacturer’s
switching characteristics performance curve);
T = 1/fSW = period.
The total power dissipation in the switching MOSFET can
then be calculated as:
PLFET(TOTAL) + PRMS(L) ) PSWL
where:
PLFET(TOTAL) = Synchronous (lower) FET total losses;
PRMS(L) = Switch Conduction Losses;
PSWL = Switching losses.
Once the total power dissipation in the synchronous FET
is known the maximum FET switch junction temperature
can be calculated:
TJ + TA ) [PLFET(TOTAL)
where:
TJ = MOSFET junction temperature;
TA = ambient temperature;
PLFET(TOTAL) = total synchronous (lower) FET losses;
RΘJA = lower FET junction−to−ambient thermal resistance.
PHFET(TOTAL) + PRMS(H) ) PSWH(ON) ) PSWH(OFF)
where:
PHFET(TOTAL) = total switching (upper) MOSFET losses;
PRMS(H) = upper MOSFET switch conduction Losses;
PSWH(ON) = upper MOSFET switch−on losses;
PSWH(OFF) = upper MOSFET switch−off losses;
Once the total power dissipation in the switching FET is
known, the maximum FET switch junction temperature can
be calculated:
TJ + TA ) [PHFET(TOTAL)
Control IC Power Dissipation
The power dissipation of the IC varies with the MOSFETs
used, VCC, and the CS5421 operating frequency. The
average MOSFET gate charge current typically dominates
the control IC power dissipation.
The IC power dissipation is determined by the formula:
RQJA]
where:
TJ = FET junction temperature;
TA = ambient temperature;
PHFET(TOTAL) = total switching (upper) FET losses;
RΘJA = upper FET junction−to−ambient thermal resistance.
PCONTROL(IC) + ICC1VCC1 ) PGATE(H)1
) PGATE(L)1 ) PGATE(H)2 ) PGATE(L)2
where:
PCONTROL(IC) = control IC power dissipation;
ICC1 = IC quiescent supply current;
VCC1 = IC supply voltage;
PGATE(H) = upper MOSFET gate driver (IC) losses;
PGATE(L) = lower MOSFET gate driver (IC) losses.
The upper (switching) MOSFET gate driver (IC) losses
are:
Selection of the Synchronous (Lower) FET
The switch conduction losses for the lower FET can be
calculated as follows:
PRMS(L) + IRMS2
+ [IOUT
RDS(ON)
Ǹ(1.0 * D)]2
RDS(ON)
PGATE(H) + QGATE(H)
where:
PRMS(L) = lower MOSFET conduction losses;
IOUT = load current;
D = Duty Cycle;
RDS(ON) = lower FET drain−to−source on−resistance.
The synchronous MOSFET has no switching losses,
except for losses in the internal body diode, because it turns
on into near zero voltage conditions. The MOSFET body
diode will conduct during the non−overlap time and the
resulting power dissipation (neglecting reverse recovery
losses) can be calculated as follows:
PSWL + VSD
ILOAD
non−overlap time
RQJA]
fSW
VCC
where:
PGATE(H) = upper MOSFET gate driver (IC) losses;
QGATE(H) = total upper MOSFET gate charge at VCC;
fSW = switching frequency;
The lower (synchronous) MOSFET gate driver (IC)
losses are:
PGATE(L) + QGATE(L)
fSW
where:
PSWL = lower FET switching losses;
VSD = lower FET source−to−drain voltage;
ILOAD = load current;
Non−overlap time = GATE(L)−to−GATE(H) or
GATE(H)−to−GATE(L) delay (from CS5421 data sheet
Electrical Characteristics section);
fSW = switching frequency.
The total power dissipation in the synchronous (lower)
MOSFET can then be calculated as:
http://onsemi.com
11
fSW
VGATE(L)
CS5421
THERMAL MANAGEMENT
where:
PGATE(L) = lower MOSFET gate driver (IC) losses;
QGATE(L) = total lower MOSFET gate charge at VCC;
fSW = switching frequency;
The junction temperature of the control IC is primarily a
function of the PCB layout, since most of the heat is removed
through the traces connected to the pins of the IC.
Thermal Considerations for Power MOSFET
As the plastic packaging of a semiconductor will
deteriorate at high temperatures, it is necessary to limit the
junction temperature of the control IC and power MOSFETs
to maintain high reliability. Most semiconductor devices
have a maximum junction temperature of 150°C, and
manufacturers recommend operating their products at lower
temperatures if at all possible.
Power dissipation in a semiconductor devices results in
the generation of heat in the pin junctions at the surface of
the chip. This heat is transferred to the surface of the IC
package, but a thermal gradient exists due to the resistive
properties of the package molding compound. The
magnitude of the thermal gradient is expressed in
manufacturer’s data sheets as ΘJA, or junction−to−air
thermal resistance. The on−chip junction temperature can be
calculated if ΘJA, the air temperature at the surface of the IC,
and the on−chip power dissipation are known.
Adding External Slope Compensation
Today’s voltage regulators are expected to meet very
stringent load transient requirements. One of the key factors
in achieving tight dynamic voltage regulation is low ESR.
Low ESR at the regulator output results in low output
voltage ripple. The consequence is, however, that very little
voltage ramp exists at the control IC feedback pin (VFB),
resulting in increased regulator sensitivity to noise and the
potential for loop instability. In applications where the
internal slope compensation is insufficient, the performance
of the CS5421−based regulator can be improved through the
addition of a fixed amount of external slope compensation
at the output of the PWM Error Amplifier (the COMP pin)
during the regulator off−time. Referring to Figure 7, the
amount of voltage ramp at the COMP pin is dependent on the
gate voltage of the lower (synchronous) FET and the value
of resistor divider formed by R1and R2.
VSLOPECOMP + VGATE(L)
ǒR1 R2
Ǔ
) R2
TJ + TA ) (PDQJA)
where:
TJ = IC or FET junction temperature (in degrees C);
TA = ambient temperature (in degrees C);
PD = power dissipated by part in question (in watts);
ΘJA = junction−to−ambient thermal resistance (in degrees
C per watt).
The value for ΘJA can be found in the Absolute Maximum
Ratings table on page 2 of this datasheet. Note that this
value is different for every package style and every
manufacturer.
The junction temperature should be calculated for all
semiconductor devices as a part of the design phase in order
to ensure that the devices are operated below the
manufacturer’s
maximum
junction
temperature
specification. If any component’s temperature exceeds the
manufacturer’s maximum temperature, some form of
heatsink will be required.
Heatsinking improves the thermal performance of any
component. Adding a heatsink will reduce the magnitude of
ΘJA by providing a larger surface area for the transfer of heat
from the component to the surrounding air. Typical
heatsinking techniques include the use of commercial
heatsinks for devices in TO−220 packages, or printed circuit
board techniques such as thermal bias and large copper foil
areas for surface mount packages.
When choosing a heatsink, it is important to realize that
ΘJA is comprised of several components:
−t
(1.0 * e t )
where:
VSLOPECOMP = amount of slope added;
VGATE(L) = lower MOSFET gate voltage;
R1, R2 = voltage divider resistors;
t = tON or tOFF (switch off−time);
τ = RC constant determined by C1 and the parallel
combination of R1, R2 neglecting the low driver
output impedance.
The artificial voltage ramp created by the slope
compensation scheme results in improved control loop
stability provided that the RC filter time constant is smaller
than the off−time cycle duration (time during which the
lower MOSFET is conducting). It is important that the series
combination of R1 and R2 is high enough in resistance to
avoid loading the GATE(L) pin.
COMP
CCOMP
CS5421
GATE(L)
R2
C1
R1
QJA + QJC ) QCS ) QSA
where:
ΘJC = the junction−to−case thermal resistance (in degrees
C per watt);
ΘCS = the case−to−sink thermal resistance (in degrees C
per watt);
To Synchronous
FET
Figure 8. Small RC Filter Provides the Proper
Voltage Ramp at the Beginning of Each
On−Time Cycle
http://onsemi.com
12
CS5421
ΘSA = the sink−to−ambient thermal resistance (in degrees
C per watt).
The value for ΘJC is included in the component
manufacturer’s data sheets. Its value is dependent on the
mold compound and lead frames used in assembly of the
semiconductor device in question.
ΘCS is the thermal impedance from the surface of the case
to the heatsink. This component of the thermal resistance is
dependent on the roughness of the heatsink and component
as well as on the pressure applied between the two. ΘCS can
be reduced by using thermal pads or by applying a thin layer
of thermal grease between the case and the heatsink. Such
materials reduce the air gap normally found between the
heatsink and the case and provide a better path for thermal
energy. Values of ΘCS are found in catalogs published by
manufacturers of heatsinks and thermal compounds.
Finally, ΘSA is the thermal impedance from the heatsink
to the ambient environment. ΘSA is the important parameter
when selecting a heatsink. Low values of ΘSA allow
increased power dissipation without exceeding the
maximum junction temperature of the component. Values of
ΘSA are found in catalogs published by heatsink
manufacturers.
The basic equation for selecting a heatsink is:
P+
input filter inductor may not be required because bulk filter
and bypass capacitors, as well as other loads located on the
board will tend to reduce regulator di/dt effects on the circuit
board and input power supply. Placement of the power
component to minimize routing distance will also help to
reduce emissions.
LAYOUT GUIDELINES
When laying out the CPU buck regulator on a printed
circuit board, the following checklist should be used to
ensure proper operation of the CS5421.
1. Rapid changes in voltage across parasitic capacitors
and abrupt changes in current in parasitic inductors
are major concerns for a good layout.
2. Keep high currents out of sensitive ground
connections.
3. Avoid ground loops as they pick up noise. Use star or
single point grounding.
4. For high power buck regulators on double−sided
PCB’s a single ground plane (usually the bottom) is
recommended.
5. Even though double sided PCB’s are usually
sufficient for a good layout, four−layer PCB’s are the
optimum approach to reducing susceptibility to
noise. Use the two internal layers as the power and
GND planes, the top layer for power connections and
component vias, and the bottom layers for the noise
sensitive traces.
6. Keep the inductor switching node small by placing
the output inductor, switching and synchronous FETs
close together.
7. The MOSFET gate traces to the IC must be short,
straight, and wide as possible.
8. Use fewer, but larger output capacitors, keep the
capacitors clustered, and use multiple layer traces
with heavy copper to keep the parasitic resistance
low.
9. Place the switching MOSFET as close to the +5.0 V
input capacitors as possible.
10. Place the output capacitors as close to the load as
possible.
11. Place the COMP capacitor as close as possible to the
COMP pin.
12. Connect the filter components of the following pins:
VFB, VOUT, and COMP to the GND pin with a single
trace, and connect this local GND trace to the output
capacitor GND.
13. Place the VCC bypass capacitors as close as possible
to the IC.
TJ * TA
QJC ) QCS ) QSA
where:
PD = power dissipated by part in question (in watts);
TJ = IC or FET junction temperature (in degrees C);
TA = ambient temperature (in degrees C);
ΘJC = the junction−to−case thermal resistance (in degrees
C per watt);
ΘCS = the case−to−sink thermal resistance (in degrees C
per watt);
ΘSA = the sink−to−ambient thermal resistance (in degrees
C per watt).
The choice of heatsink is dependent on the value of ΘSA
required to keep the calculated junction temperature at the
given level of power dissipation below the component
manufacturer’s maximum junction temperature.
EMI MANAGEMENT
As a consequence of large currents being turned on and off
at high frequency, switching regulators generate noise as a
consequence of their normal operation. When designing for
compliance with EMI/EMC regulations, additional
components may be added to reduce noise emissions. These
components are not required for regulator operation and
experimental results may allow them to be eliminated. The
http://onsemi.com
13
CS5421
PACKAGE DIMENSIONS
SO−16
D SUFFIX
CASE 751B−05
ISSUE J
−A−
16
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSIONS A AND B DO NOT INCLUDE
MOLD PROTRUSION.
4. MAXIMUM MOLD PROTRUSION 0.15 (0.006)
PER SIDE.
5. DIMENSION D DOES NOT INCLUDE DAMBAR
PROTRUSION. ALLOWABLE DAMBAR
PROTRUSION SHALL BE 0.127 (0.005) TOTAL
IN EXCESS OF THE D DIMENSION AT
MAXIMUM MATERIAL CONDITION.
9
−B−
1
P
8 PL
0.25 (0.010)
8
M
B
S
G
R
K
F
X 45 _
C
−T−
SEATING
PLANE
J
M
D
16 PL
0.25 (0.010)
M
T B
S
A
S
DIM
A
B
C
D
F
G
J
K
M
P
R
MILLIMETERS
MIN
MAX
9.80
10.00
3.80
4.00
1.35
1.75
0.35
0.49
0.40
1.25
1.27 BSC
0.19
0.25
0.10
0.25
0_
7_
5.80
6.20
0.25
0.50
INCHES
MIN
MAX
0.386
0.393
0.150
0.157
0.054
0.068
0.014
0.019
0.016
0.049
0.050 BSC
0.008
0.009
0.004
0.009
0_
7_
0.229
0.244
0.010
0.019
V2 is a trademark of Switch Power, Inc.
ON Semiconductor and
are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice
to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
“Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All
operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights
nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications
intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should
Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates,
and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death
associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal
Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner.
PUBLICATION ORDERING INFORMATION
LITERATURE FULFILLMENT:
Literature Distribution Center for ON Semiconductor
P.O. Box 5163, Denver, Colorado 80217 USA
Phone: 303−675−2175 or 800−344−3860 Toll Free USA/Canada
Fax: 303−675−2176 or 800−344−3867 Toll Free USA/Canada
Email: [email protected]
N. American Technical Support: 800−282−9855 Toll Free
USA/Canada
Europe, Middle East and Africa Technical Support:
Phone: 421 33 790 2910
Japan Customer Focus Center
Phone: 81−3−5773−3850
http://onsemi.com
14
ON Semiconductor Website: www.onsemi.com
Order Literature: http://www.onsemi.com/orderlit
For additional information, please contact your local
Sales Representative
CS5421/D