TC74HC670AP/AF TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic TC74HC670AP,TC74HC670AF 4 Word × 4 Bit Register File (3-state) The TC74HC670A is a high speed 4-WORDS × 4-BITS REGISTER FILE fabricated with silicon gate C2MOS technology. It achieves the high speed operation similar to equivalent LSTTL while maintaining the CMOS low power dissipation. The register file is organized as 4 words of 4 bits each. Separate read and write address inputs (RA, RB, and WA, WB) and enable inputs ( RE , WE ) are available permitting simultaneous writing into one word location and reading from another location. Four data inputs (D0~D3) are provided to store the 4-bit words. The write address inputs (WA, WB) determine the location of the stored word in the register. When write Enable ( WE ) is held low, the data is entered into addressed location. When WE is held high, data and address inputs are inhibited. The data acquisition from the four registers is made possible by the read address inputs (RA, RB) when the Read Enable ( RE ) is held low. When RE is held high the data outputs are in the high impedance state. All inputs are equipped with protection circuits against static discharge or transient excess voltage. TC74HC670AP TC74HC670AF Weight DIP16-P-300-2.54A SOP16-P-300-1.27A Features • High speed: tpd = 23 ns (typ.) at VCC = 5 V • Low power dissipation: ICC = 4 μA (max) at Ta = 25°C • High noise immunity: VNIH = VNIL = 28% VCC (min) • Output drive capability: 10 LSTTL loads • • Symmetrical output impedance: |IOH| = IOL = 4 mA (min) ∼ tpHL Balanced propagation delays: tpLH − • Wide operating voltage range: VCC (opr) = 2 to 6 V • Pin and function compatible with 74LS670 : 1.00 g (typ.) : 0.18 g (typ.) Pin Assignment 1 2007-10-01 TC74HC670AP/AF IEC Logic Symbol Truth Table Write Function Table Read Function Table Write Inputs Read Inputs Words Outputs WB WA WE 0 1 2 3 RB RA RE Q1 L L L Q=D Q0 Q0 Q0 L L L W0B1 W0B2 W0B3 W0B4 L H L Q0 Q=D Q0 Q0 L H L W1B1 W1B2 W1B3 W1B4 H L L Q0 Q0 Q=D Q0 H L L W2B1 W2B2 W2B3 W2B4 H H L Q0 Q0 Q0 Q=D H H L W3B1 W3B2 W3B3 W3B4 X X H Q0 Q0 Q0 Q0 X X H Z Q2 Z Q3 Z Q4 Z X: Don’t care Z: High impedance (Q = D): The four selected internal flip-flop outputs will assume the states applied to the four external data inputs. Q0: The level of Q before the indicated input conditions were established. W0B1: The first bit of word 0, etc. Block Diagram 2 2007-10-01 TC74HC670AP/AF System Diagram 3 2007-10-01 TC74HC670AP/AF Absolute Maximum Ratings (Note 1) Characteristics Symbol Rating Unit Supply voltage range VCC −0.5 to 7.0 V DC input voltage VIN −0.5 to VCC + 0.5 V VOUT −0.5 to VCC + 0.5 V Input diode current IIK ±20 mA Output diode current IOK ±20 mA DC output current IOUT ±25 mA DC VCC/ground current ICC ±50 mA Power dissipation PD 500 (DIP) (Note 2)/180 (SOP) mW Storage temperature Tstg −65 to 150 °C DC output voltage Note 1: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 2: 500 mW in the range of Ta = −40 to 65°C. From Ta = 65 to 85°C a derating factor of −10 mW/°C should be applied until 300 mW. Operating Ranges (Note) Characteristics Symbol Rating Unit Supply voltage VCC 2 to 6 V Input voltage VIN 0 to VCC V VOUT 0 to VCC V Operating temperature Topr −40 to 85 °C Input rise and fall time tr, tf Output voltage 0 to 1000 (VCC = 2.0 V) 0 to 500 (VCC = 4.5 V) ns 0 to 400 (VCC = 6.0 V) Note: The operating ranges must be maintained to ensure the normal operation of the device. Unused inputs must be tied to either VCC or GND. 4 2007-10-01 TC74HC670AP/AF Electrical Characteristics DC Characteristics Ta = 25°C Test Condition Characteristics High-level input voltage Low-level input voltage High-level output voltage Low-level output voltage Symbol VOH VOL Typ. Max Min Max 2.0 1.50 ⎯ ⎯ 1.50 ⎯ 4.5 3.15 ⎯ ⎯ 3.15 ⎯ 6.0 4.20 ⎯ ⎯ 4.20 ⎯ 2.0 ⎯ ⎯ 0.50 ⎯ 0.50 4.5 ⎯ ⎯ 1.35 ⎯ 1.35 6.0 ⎯ ⎯ 1.80 ⎯ 1.80 2.0 1.9 2.0 ⎯ 1.9 ⎯ 4.5 4.4 4.5 ⎯ 4.4 ⎯ 6.0 5.9 6.0 ⎯ 5.9 ⎯ IOH = −4 mA 4.5 4.18 4.31 ⎯ 4.13 ⎯ IOH = −5.2 mA 6.0 5.68 5.80 ⎯ 5.63 ⎯ 2.0 ⎯ 0.0 0.1 ⎯ 0.1 4.5 ⎯ 0.0 0.1 ⎯ 0.1 6.0 ⎯ 0.0 0.1 ⎯ 0.1 IOL = 4 mA 4.5 ⎯ 0.17 0.26 ⎯ 0.33 IOL = 5.2 mA 6.0 ⎯ 0.18 0.26 ⎯ 0.33 6.0 ⎯ ⎯ ±0.5 ⎯ ±5.0 μA ⎯ VIL VIN = VIH or VIL VIN = VIH or VIL Unit Min ⎯ VIH Ta = −40 to 85°C VCC (V) IOH = −20 μA IOL = 20 μA VIN = VIH or VIL V V V V 3-state output off-state current IOZ Input leakage current IIN VIN = VCC or GND 6.0 ⎯ ⎯ ±0.1 ⎯ ±1.0 μA Quiescent supply current ICC VIN = VCC or GND 6.0 ⎯ ⎯ 4.0 ⎯ 40.0 μA VOUT = VCC or GND 5 2007-10-01 TC74HC670AP/AF Timing Requirements (input: tr = tf = 6 ns) Characteristics Minimum pulse width ( WE ) Minimum set-up time (Dn- WE ) Minimum set-up time (WA, WB- WE ) Minimum hold time (Dn- WE ) Minimum hold time (WA, WB- WE ) Minimum latch time ( WE -RA, RB) Note: Ta = 25°C Test Condition Symbol ⎯ tW (L) ⎯ ts ⎯ ts ⎯ th ⎯ th tlatch (Note) Ta = −40 to 85°C VCC (V) Typ. Limit Limit 2.0 ⎯ 75 95 4.5 ⎯ 15 19 6.0 ⎯ 13 16 2.0 ⎯ 50 65 4.5 ⎯ 10 13 6.0 ⎯ 9 11 2.0 ⎯ 0 0 4.5 ⎯ 0 0 6.0 ⎯ 0 0 2.0 ⎯ 5 5 4.5 ⎯ 5 5 6.0 ⎯ 5 5 2.0 ⎯ 0 0 4.5 ⎯ 0 0 6.0 ⎯ 0 0 2.0 ⎯ 75 95 4.5 ⎯ 15 19 6.0 ⎯ 13 16 Unit ns ns ns ns ns ns tlatch is the time allowed for the internal output of the latch to assume the state of new data. This is important only when attempting to read from a location immediately after that location has received new data. AC Characteristics (CL = 15 pF, VCC = 5 V, Ta = 25°C, input: tr = tf = 6 ns) Characteristics Output transition time Symbol Typ. Max Unit ⎯ ⎯ 4 8 ns ⎯ ⎯ 23 34 ns ⎯ ⎯ 24 38 ns ⎯ ⎯ 22 32 ns RL = 1 kΩ ⎯ 11 18 ns RL = 1 kΩ ⎯ 11 15 ns tTHL tpLH (RA, AB-Qn) tpHL Propagation delay time tpLH ( WE -Qn) tpHL Propagation delay time tpLH (Dn-Qn) tpHL 3-state output disable time Min tTLH Propagation delay time 3-state output enable time Test Condition tpZL tpZH tpLZ tpHZ 6 2007-10-01 TC74HC670AP/AF AC Characteristics (CL = 50 pF, input: tr = tf = 6 ns) Ta = 25°C Test Condition Characteristics Output transition time Symbol tTLH Propagation delay time tpLH (RA, AB-Qn) tpHL Propagation delay time tpLH ( WE -Qn) tpHL Propagation delay time tpLH (Dn-Qn) tpHL Output enable time Output disable time Input capacitance Output capacitance Power dissipation capacitance Note: ⎯ tTHL tpZH tpZL tpLZ tpHZ ⎯ ⎯ ⎯ RL = 1 kΩ RL = 1 kΩ Ta = −40 to 85°C VCC (V) Min Typ. Max Min Max 2.0 ⎯ 30 75 ⎯ 95 4.5 ⎯ 8 15 ⎯ 19 6.0 ⎯ 7 13 ⎯ 16 2.0 ⎯ 90 195 ⎯ 245 4.5 ⎯ 27 39 ⎯ 49 6.0 ⎯ 22 33 ⎯ 42 2.0 ⎯ 95 220 ⎯ 275 4.5 ⎯ 28 44 ⎯ 55 6.0 ⎯ 22 37 ⎯ 47 2.0 ⎯ 90 185 ⎯ 230 4.5 ⎯ 26 37 ⎯ 46 6.0 ⎯ 20 31 ⎯ 39 2.0 ⎯ 46 110 ⎯ 140 4.5 ⎯ 14 22 ⎯ 28 6.0 ⎯ 12 19 ⎯ 24 2.0 ⎯ 25 95 ⎯ 120 4.5 ⎯ 14 19 ⎯ 24 6.0 ⎯ 12 16 ⎯ 20 Unit ns ns ns ns ns ns CIN ⎯ ⎯ 5 10 ⎯ 10 pF COUT ⎯ ⎯ 10 ⎯ ⎯ ⎯ pF ⎯ ⎯ 101 ⎯ ⎯ ⎯ pF CPD (Note) CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current consumption without load. Average operating current can be obtained by the equation: ICC (opr) = CPD･VCC･fIN + ICC 7 2007-10-01 TC74HC670AP/AF Package Dimensions Weight: 1.00 g (typ.) 8 2007-10-01 TC74HC670AP/AF Package Dimensions Weight: 0.18 g (typ.) 9 2007-10-01 TC74HC670AP/AF RESTRICTIONS ON PRODUCT USE 20070701-EN GENERAL • The information contained herein is subject to change without notice. • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 10 2007-10-01