FREESCALE MRF6V2300NBR1

Freescale Semiconductor
Technical Data
Document Number: MRF6V2300N
Rev. 3, 1/2008
RF Power Field Effect Transistors
N - Channel Enhancement - Mode Lateral MOSFETs
MRF6V2300NR1
MRF6V2300NBR1
Designed primarily for CW large - signal output and driver applications with
frequencies up to 600 MHz. Devices are unmatched and are suitable for use in
industrial, medical and scientific applications.
• Typical CW Performance: VDD = 50 Volts, IDQ = 900 mA,
Pout = 300 Watts, f = 220 MHz
Power Gain — 25.5 dB
Drain Efficiency — 68%
• Capable of Handling 10:1 VSWR, @ 50 Vdc, 220 MHz, 300 Watts CW
Output Power
Features
• Integrated ESD Protection
• Excellent Thermal Stability
• Facilitates Manual Gain Control, ALC and Modulation Techniques
• 200°C Capable Plastic Package
• RoHS Compliant
• In Tape and Reel. R1 Suffix = 500 Units per 44 mm, 13 inch Reel.
10 - 600 MHz, 300 W, 50 V
LATERAL N - CHANNEL
SINGLE - ENDED
BROADBAND
RF POWER MOSFETs
CASE 1486 - 03, STYLE 1
TO - 270 WB - 4
PLASTIC
MRF6V2300NR1
CASE 1484 - 04, STYLE 1
TO - 272 WB - 4
PLASTIC
MRF6V2300NBR1
PARTS ARE SINGLE - ENDED
RFin/VGS
RFout/VDS
RFin/VGS
RFout/VDS
(Top View)
Note: Exposed backside of the package is
the source terminal for the transistor.
Figure 1. Pin Connections
Table 1. Maximum Ratings
Rating
Symbol
Value
Unit
Drain- Source Voltage
VDSS
- 0.5, +110
Vdc
Gate- Source Voltage
VGS
- 0.5, +10
Vdc
Storage Temperature Range
Tstg
- 65 to +150
°C
Case Operating Temperature
TC
150
°C
Operating Junction Temperature
TJ
200
°C
© Freescale Semiconductor, Inc., 2007 - 2008. All rights reserved.
RF Device Data
Freescale Semiconductor
MRF6V2300NR1 MRF6V2300NBR1
1
Table 2. Thermal Characteristics
Characteristic
Thermal Resistance, Junction to Case
Case Temperature 83°C, 300 W CW
Symbol
Value (1,2)
Unit
RθJC
0.24
°C/W
Table 3. ESD Protection Characteristics
Test Methodology
Class
Human Body Model (per JESD22 - A114)
2 (Minimum)
Machine Model (per EIA/JESD22 - A115)
A (Minimum)
Charge Device Model (per JESD22 - C101)
IV (Minimum)
Table 4. Moisture Sensitivity Level
Test Methodology
Per JESD 22 - A113, IPC/JEDEC J - STD - 020
Rating
Package Peak Temperature
Unit
3
260
°C
Table 5. Electrical Characteristics (TC = 25°C unless otherwise noted)
Characteristic
Symbol
Min
Typ
Max
Unit
Zero Gate Voltage Drain Leakage Current
(VDS = 100 Vdc, VGS = 0 Vdc)
IDSS
—
—
2.5
mA
Zero Gate Voltage Drain Leakage Current
(VDS = 50 Vdc, VGS = 0 Vdc)
IDSS
—
—
50
μAdc
V(BR)DSS
110
—
—
Vdc
IGSS
—
—
10
μAdc
Gate Threshold Voltage
(VDS = 10 Vdc, ID = 800 μAdc)
VGS(th)
1
1.63
3
Vdc
Gate Quiescent Voltage
(VDD = 50 Vdc, ID = 900 mAdc, Measured in Functional Test)
VGS(Q)
1.5
2.6
3.5
Vdc
Drain- Source On - Voltage
(VGS = 10 Vdc, ID = 2 Adc)
VDS(on)
—
0.28
—
Vdc
Reverse Transfer Capacitance
(VDS = 50 Vdc ± 30 mV(rms)ac @ 1 MHz, VGS = 0 Vdc)
Crss
—
2.88
—
pF
Output Capacitance
(VDS = 50 Vdc ± 30 mV(rms)ac @ 1 MHz, VGS = 0 Vdc)
Coss
—
120
—
pF
Input Capacitance
(VDS = 50 Vdc, VGS = 0 Vdc ± 30 mV(rms)ac @ 1 MHz)
Ciss
—
268
—
pF
Off Characteristics
Drain- Source Breakdown Voltage
(ID = 150 mA, VGS = 0 Vdc)
Gate- Source Leakage Current
(VGS = 5 Vdc, VDS = 0 Vdc)
On Characteristics
Dynamic Characteristics
Functional Tests (In Freescale Test Fixture, 50 ohm system) VDD = 50 Vdc, IDQ = 900 mA, Pout = 300 W, f = 220 MHz, CW
Power Gain
Gps
24
25.5
27
dB
Drain Efficiency
ηD
66
68
—
%
Input Return Loss
IRL
—
- 16
-9
dB
1. MTTF calculator available at http://www.freescale.com/rf. Select Software & Tools/Development Tools/Calculators to access
MTTF calculators by product.
2. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf.
Select Documentation/Application Notes - AN1955.
ATTENTION: The MRF6V2300N and MRF6V2300NB are high power devices and special considerations
must be followed in board design and mounting. Incorrect mounting can lead to internal temperatures which
exceed the maximum allowable operating junction temperature. Refer to Freescale Application Note AN3263
(for bolt down mounting) or AN1907 (for solder reflow mounting) PRIOR TO STARTING SYSTEM DESIGN to
ensure proper mounting of these devices.
MRF6V2300NR1 MRF6V2300NBR1
2
RF Device Data
Freescale Semiconductor
B3
VBIAS
+
+
+
C1
C2
C3
L2
C4
C5
C6
C8
Z1
C9
C10 C11 R2
Z2
Z3
Z4
C18
C19
C20
B2
R1
C7
C17
C14
L1
RF
INPUT
VSUPPLY
+
B1
R3
Z5
Z7
Z8
C15
C16
Z10
Z9
Z11
RF
OUTPUT
C23
Z6
C21
C22
C12
DUT
C13
Z1
Z2
Z3
Z4
Z5
Z6, Z7
0.352″ x 0.082″ Microstrip
1.567″ x 0.082″ Microstrip
0.857″ x 0.082″ Microstrip
0.276″ x 0.220″ Microstrip
0.434″ x 0.220″ Microstrip
0.298″ x 0.630″ Microstrip
Z8
Z9
Z10
Z11
PCB
0.085″ x 0.170″ Microstrip
2.275″ x 0.170″ Microstrip
0.945″ x 0.170″ Microstrip
0.443″ x 0.082″ Microstrip
Arlon CuClad 250GX - 0300- 55- 22, 0.030″, εr = 2.55
Figure 2. MRF6V2300NR1(NBR1) Test Circuit Schematic
Table 6. MRF6V2300NR1(NBR1) Test Circuit Component Designations and Values
Part
Description
Part Number
Manufacturer
B1, B2
95 Ω, 100 MHz Long Ferrite Beads, Surface Mount
2743021447
Fair- Rite
B3
47 Ω, 100 MHz Short Ferrite Bead, Surface Mount
2743019447
Fair- Rite
C1
47 μF, 50 V Electrolytic Capacitor
476KXM063M
Illinois Capacitor
C2
22 μF, 35 V Tantalum Capacitor
T494X226K035AT
Kemet
C3
10 μF, 35 V Tantalum Capacitor
T491D106K035AT
Kemet
C4, C19
10 K pF Chip Capacitors
ATC200B103KT50XT
ATC
C5, C18
20 K pF Chip Capacitors
ATC200B203KT50XT
ATC
C6, C11, C17
0.1 μF, 50 V Chip Capacitors
CDR33BX104AKYS
AVX
C7, C8, C15, C16
2.2 μF, 50 V Chip Capacitors
C1825C225J5RAC
Kemet
C10
220 nF Chip Capacitor
C1206C224Z5VAC
Kemet
C9, C12, C14, C23
1000 pF Chip Capacitors
ATC100B102JT50XT
ATC
C13
82 pF Chip Capacitor
ATC100B820JT500XT
ATC
C20
470 μF, 63 V Electrolytic Capacitor
477KXM063M
Illinois Capacitor
C21
24 pF Chip Capacitor
ATC100B240JT500XT
ATC
C22
39 pF Chip Capacitor
ATC100B390JT500XT
ATC
L1
4 Turn #18 AWG, 0.18” ID
None
None
L2
82 nH Inductor
1812SMS- 82NJ
Coilcraft
R1
270 Ω, 1/4 W Chip Resistor
CRCW12062700FKTA
Vishay
R2, R3
4.75 Ω, 1/4 W Chip Resistors
CRCW12064R75FKTA
Vishay
MRF6V2300NR1 MRF6V2300NBR1
RF Device Data
Freescale Semiconductor
3
C2
C1
C3
+
B1
B3
C4
C5
C6
C7
+
C19
C18
C17
C20
R1
C10
B2
C15*
C16*
C8
C11
C14
C9
C12
L2
L1
R2 R3
CUT OUT AREA
C13
C23
C22
C21
MRF6V2300N/NB
Rev. 3
* Stacked
Figure 3. MRF6V2300NR1(NBR1) Test Circuit Component Layout
MRF6V2300NR1 MRF6V2300NBR1
4
RF Device Data
Freescale Semiconductor
TYPICAL CHARACTERISTICS
1000
100
ID, DRAIN CURRENT (AMPS)
C, CAPACITANCE (pF)
Ciss
Coss
100
Measured with ±30 mV(rms)ac @ 1 MHz
VGS = 0 Vdc
10
Crss
10
TC = 25°C
1
1
0
10
30
20
50
40
Figure 4. Capacitance versus Drain - Source Voltage
Figure 5. DC Safe Operating Area
28
9
VGS = 3 V
7
6
2.75 V
5
2.63 V
4
2.5 V
3
IDQ = 1350 mA
27
8
Gps, POWER GAIN (dB)
ID, DRAIN CURRENT (AMPS)
100
VDS, DRAIN−SOURCE VOLTAGE (VOLTS)
10
2
1125 mA
26
900 mA
25
650 mA
24
450 mA
23
1
VDD = 50 Vdc
f1 = 220 MHz
2.25 V
22
10
0
0
20
40
60
80
100
120
100
600
DRAIN VOLTAGE (VOLTS)
Pout, OUTPUT POWER (WATTS) CW
Figure 6. DC Drain Current versus Drain Voltage
Figure 7. CW Power Gain versus Output Power
60
−15
VDD = 50 Vdc, f1 = 220 MHz, f2 = 220.1 MHz
−20 Two−Tone Measurements, 100 kHz Tone Spacing
P3dB = 55.76 dBm (377 W)
Pout, OUTPUT POWER (dBm)
IMD, THIRD ORDER INTERMODULATION
DISTORTION (dBc)
10
1
VDS, DRAIN−SOURCE VOLTAGE (VOLTS)
−25
IDQ = 450 mA
−30
900 mA
−35
650 mA
−40
1125 mA
−45
58
P1dB = 55.04 dBm (319 W)
56
Actual
54
52
VDD = 50 Vdc, IDQ = 900 mA
f = 220 MHz
−50
1350 mA
−55
1
10
100
600
Ideal
50
24
26
28
30
32
34
Pout, OUTPUT POWER (WATTS) PEP
Pin, INPUT POWER (dBm)
Figure 8. Third Order Intermodulation Distortion
versus Output Power
Figure 9. CW Output Power versus Input Power
MRF6V2300NR1 MRF6V2300NBR1
RF Device Data
Freescale Semiconductor
5
TYPICAL CHARACTERISTICS
60
28
TC = −30_C
Pout, OUTPUT POWER (dBm)
Gps, POWER GAIN (dB)
26
24
50 V
22
45 V
40 V
20
35 V
30 V
18
25 V
IDQ = 900 mA
f = 220 MHz
16
VDD = 20 V
50
100
150
200
250
300
400
350
25_C
85_C
50
45
VDD = 50 Vdc
IDQ = 900 mA
f = 220 MHz
40
35
10
14
0
55
15
20
25
30
Pout, OUTPUT POWER (WATTS) CW
Pin, INPUT POWER (dBm)
Figure 10. Power Gain versus Output Power
Figure 11. Power Output versus Power Input
29
35
80
25_C
70
85_C
−30_C
Gps
27
60
TC = −30_C
26
50
25_C
25
40
85_C
30
24
ηD
23
VDD = 50 Vdc
IDQ = 900 mA
f = 220 MHz
22
5
20
10
600
100
10
ηD, DRAIN EFFICIENCY (%)
Gps, POWER GAIN (dB)
28
Pout, OUTPUT POWER (WATTS) CW
Figure 12. Power Gain and Drain Efficiency
versus CW Output Power
65
60
23
55
Gps
22
50
ηD
21
45
20
40
19
18
35
IMD3
30
17
25
VDD = 50 V, Pout = 300 W (Peak)
IDQ = 1100 mA, Tone−Spacing = 100 kHz
16
15
160
170
180
190
200
210
220
230
−28
−29
−30
−31
20
−32
15
240
−33
IMD3 (dBc)
24
ηD, DRAIN EFFICIENCY (%)
Gps, POWER GAIN (dB)
25
f, FREQUENCY (MHz)
Figure 13. VHF Broadcast Broadband Performance
MRF6V2300NR1 MRF6V2300NBR1
6
RF Device Data
Freescale Semiconductor
TYPICAL CHARACTERISTICS
MTTF (HOURS)
108
107
106
105
90
110
130
150
170
190
210
230
250
TJ, JUNCTION TEMPERATURE (°C)
This above graph displays calculated MTTF in hours when the device
is operated at VDD = 50 Vdc, Pout = 300 W CW, and ηD = 68%.
MTTF calculator available at http:/www.freescale.com/rf. Select
Software & Tools/Development Tools/Calculators to access MTTF
calculators by product.
Figure 14. MTTF versus Junction Temperature
MRF6V2300NR1 MRF6V2300NBR1
RF Device Data
Freescale Semiconductor
7
Zsource
f = 220 MHz
Zo = 5 Ω
Zload
f = 220 MHz
VDD = 50 Vdc, IDQ = 900 mA, Pout = 300 W CW
f
MHz
Zsource
W
Zload
W
220
1.23 + j3.69
2.43 + j2.04
Zsource = Test circuit impedance as measured from
gate to ground.
Zload
= Test circuit impedance as measured
from drain to ground.
Output
Matching
Network
Device
Under
Test
Input
Matching
Network
Z
source
Z
load
Figure 15. Series Equivalent Source and Load Impedance
MRF6V2300NR1 MRF6V2300NBR1
8
RF Device Data
Freescale Semiconductor
PACKAGE DIMENSIONS
MRF6V2300NR1 MRF6V2300NBR1
RF Device Data
Freescale Semiconductor
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MRF6V2300NR1 MRF6V2300NBR1
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RF Device Data
Freescale Semiconductor
MRF6V2300NR1 MRF6V2300NBR1
RF Device Data
Freescale Semiconductor
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MRF6V2300NR1 MRF6V2300NBR1
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RF Device Data
Freescale Semiconductor
MRF6V2300NR1 MRF6V2300NBR1
RF Device Data
Freescale Semiconductor
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MRF6V2300NR1 MRF6V2300NBR1
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RF Device Data
Freescale Semiconductor
PRODUCT DOCUMENTATION
Refer to the following documents to aid your design process.
Application Notes
• AN1907: Solder Reflow Attach Method for High Power RF Devices in Plastic Packages
• AN1955: Thermal Measurement Methodology of RF Power Amplifiers
• AN3263: Bolt Down Mounting Method for High Power RF Transistors and RFICs in Over - Molded Plastic Packages
Engineering Bulletins
• EB212: Using Data Sheet Impedances for RF LDMOS Devices
REVISION HISTORY
The following table summarizes revisions to this document.
Revision
Date
Description
0
Feb. 2007
• Initial Release of Data Sheet
1
Feb. 2007
• Added Fig. 1, Pin Connections, p. 1
• Removed footnote references listed for Operating Junction Temperature, Table 1, Maximum Ratings, p. 1
• Added Max value to Power Gain, Table 5, Functional Tests, p. 2
2
May 2007
• Corrected Test Circuit Component part numbers in Table 6, Component Designations and Values for C4,
C19, C5, C18, C9, C12, C14, and C23, p. 3
3
Jan. 2008
• Increased operating frequency to 600 MHz, p. 1
• Added Case Operating Temperature limit to the Maximum Ratings table and set limit to 150°C, p. 1
• Corrected Ciss test condition to indicate AC stimulus on the VGS connection versus the VDS connection,
Dynamic Characteristics table, p. 2
• Updated PCB information to show more specific material details, Fig. 2, Test Circuit Schematic, p. 3
• Replaced Case Outline 1486 - 03, Issue C, with 1486 - 03, Issue D, p. 9 - 11. Added pin numbers 1 through 4
on Sheet 1.
• Replaced Case Outline 1484 - 04, Issue D, with 1484 - 04, Issue E, p. 12 - 14. Added pin numbers 1 through
4 on Sheet 1, replacing Gate and Drain notations with Pin 1 and Pin 2 designations.
MRF6V2300NR1 MRF6V2300NBR1
RF Device Data
Freescale Semiconductor
15
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© Freescale Semiconductor, Inc. 2007 - 2008. All rights reserved.
MRF6V2300NR1 MRF6V2300NBR1
Document Number: MRF6V2300N
Rev. 3, 1/2008
16
RF Device Data
Freescale Semiconductor