TI SN74AHCT273DW

SN54AHCT273, SN74AHCT273
OCTAL D-TYPE FLIP-FLOPS
WITH CLEAR
SCLS375D – JUNE 1997 – REVISED JANUARY 2000
D
D
D
CLR
1Q
1D
2D
2Q
3Q
3D
4D
4Q
GND
1
20
2
19
3
18
4
17
5
16
6
15
7
14
8
13
9
12
10
11
VCC
8Q
8D
7D
7Q
6Q
6D
5D
5Q
CLK
SN54AHCT273 . . . FK PACKAGE
(TOP VIEW)
2D
2Q
3Q
3D
4D
8Q
D
D
D
SN54AHCT273 . . . J OR W PACKAGE
SN74AHCT273 . . . DB, DGV, DW, N, OR PW PACKAGE
(TOP VIEW)
1D
1Q
CLR
VCC
D
D
EPIC  (Enhanced-Performance Implanted
CMOS) Process
Inputs Are TTL-Voltage Compatible
Contain Eight Flip-Flops With Single-Rail
Outputs
Direct Clear Input
Individual Data Input to Each Flip-Flop
Applications Include:
– Buffer/Storage Registers
– Shift Registers
– Pattern Generators
Latch-Up Performance Exceeds 250 mA Per
JESD 17
ESD Protection Exceeds JESD 22
– 2000-V Human-Body Model (A114-A)
– 200-V Machine Model (A115-A)
– 1000-V Charged-Device Model (C101)
Package Options Include Plastic
Small-Outline (DW), Shrink Small-Outline
(DB), Thin Very Small-Outline (DGV), Thin
Shrink Small-Outline (PW), and Ceramic
Flat (W) Packages, Ceramic Chip Carriers
(FK), and Standard Plastic (N) and Ceramic
(J) DIPs
4
3 2 1 20 19
18
5
17
6
16
7
15
8
14
9 10 11 12 13
8D
7D
7Q
6Q
6D
4Q
GND
CLK
5Q
5D
D
description
These devices are positive-edge-triggered D-type
flip-flops with a direct clear (CLR) input.
Information at the data (D) inputs meeting the setup time requirements is transferred to the Q outputs on the
positive-going edge of the clock (CLK) pulse. Clock triggering occurs at a particular voltage level and is not
directly related to the transition time of the positive-going pulse. When CLK is at either the high or low level, the
D input has no effect at the output.
The SN54AHCT273 is characterized for operation over the full military temperature range of –55°C to 125°C.
The SN74AHCT273 is characterized for operation from –40°C to 85 °C.
FUNCTION TABLE
(each flip-flop)
INPUTS
CLR
CLK
D
OUTPUT
Q
L
X
X
L
H
↑
H
H
H
↑
L
L
H
L
X
Q0
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC is a trademark of Texas Instruments Incorporated.
Copyright  2000, Texas Instruments Incorporated
UNLESS OTHERWISE NOTED this document contains PRODUCTION
DATA information current as of publication date. Products conform to
specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all
parameters.
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
1
SN54AHCT273, SN74AHCT273
OCTAL D-TYPE FLIP-FLOPS
WITH CLEAR
SCLS375D – JUNE 1997 – REVISED JANUARY 2000
logic symbol†
CLR
CLK
1D
2D
3D
4D
5D
6D
7D
8D
1
R
11
C1
3
2
1D
4
5
7
6
8
9
13
12
14
15
17
16
18
19
1Q
2Q
3Q
4Q
5Q
6Q
7Q
8Q
† This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
logic diagram (positive logic)
CLK
1D
2D
3D
4D
3
4
7
8
6D
13
7D
14
8D
17
18
11
1D
1D
C1
1D
C1
R
CLR
5D
1D
C1
R
1D
C1
R
1D
C1
R
1D
C1
R
1D
C1
R
C1
R
R
1
2
5
6
1Q
2Q
3Q
9
12
4Q
15
5Q
6Q
16
19
7Q
8Q
logic diagram, each flip-flop (positive logic)
D
C
C
TG
TG
Q
C
C
C
C
TG
CLK(I)
TG
C
C
C
C
R
2
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
SN54AHCT273, SN74AHCT273
OCTAL D-TYPE FLIP-FLOPS
WITH CLEAR
SCLS375D – JUNE 1997 – REVISED JANUARY 2000
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)†
Supply voltage range, VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 7 V
Input voltage range, VI (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 7 V
Output voltage range, VO (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to VCC + 0.5 V
Input clamp current, IIK (VI < 0) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –20 mA
Output clamp current, IOK (VO < 0 or VO > VCC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±20 mA
Continuous output current, IO (VO = 0 to VCC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±25 mA
Continuous current through VCC or GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±75 mA
Package thermal impedance, θJA (see Note 2): DB package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 70°C/W
DGV package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 92°C/W
DW package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58°C/W
N package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 69°C/W
PW package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 83°C/W
Storage temperature range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –65°C to 150°C
† Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. The package thermal impedance is calculated in accordance with JESD 51.
recommended operating conditions (see Note 3)
SN54AHCT273
SN74AHCT273
MIN
MAX
MIN
MAX
4.5
5.5
4.5
5.5
UNIT
VCC
VIH
Supply voltage
VIL
VI
Low-level input voltage
0.8
V
Input voltage
0
5.5
0
5.5
V
VO
IOH
Output voltage
0
0
VCC
–8
V
High-level output current
VCC
–8
IOL
∆t/∆v
Low-level output current
8
8
mA
20
20
ns/V
High-level input voltage
2
2
0.8
Input transition rise or fall time
V
V
mA
TA
Operating free-air temperature
–55
125
–40
85
°C
NOTE 3: All unused inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report,
Implications of Slow or Floating CMOS Inputs, literature number SCBA004.
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
3
SN54AHCT273, SN74AHCT273
OCTAL D-TYPE FLIP-FLOPS
WITH CLEAR
SCLS375D – JUNE 1997 – REVISED JANUARY 2000
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
VOH
VOL
II
ICC
∆ICC‡
TEST CONDITIONS
VCC
IOH = –50 mA
MIN
TA = 25°C
TYP
MAX
4.4
45V
4.5
IOH = –8 mA
IOL = 50 mA
4.5
3.94
MAX
SN74AHCT273
MIN
4.4
4.4
3.8
3.8
MAX
UNIT
V
0.1
0.1
0.36
0.44
0.44
±0.1
±1*
±1
mA
5.5 V
4
40
40
mA
5.5 V
1.35
1.5
1.5
mA
10
pF
0 V to 5.5 V
VI = VCC or GND,
IO = 0
One input at 3.4 V,
Other inputs at VCC or GND
MIN
0.1
45V
4.5
IOL = 8 mA
VI = VCC or GND
SN54AHCT273
Ci
VI = VCC or GND
5V
2.5
10
* On products compliant to MIL-PRF-38535, this parameter is not production tested at VCC = 0 V.
† This is the increase in supply current for each input at one of the specified TTL voltage levels rather than 0 V or VCC.
V
timing requirements over recommended operating free-air temperature range, VCC = 5 V ± 0.5 V
(unless otherwise noted) (see Figure 1)
TA = 25°C
MIN
MAX
tw
Pulse duration
tsu
Setup time
th
Hold time, data after CLK↑
SN54AHCT273
MIN
MAX
SN74AHCT273
MIN
CLR low
5
6
6
CLK high or low
5
6.5
6.5
Data before CLK↑
5
5
5
CLR before CLK↑
2.5
2.5
2.5
0
0
0
MAX
UNIT
ns
ns
ns
switching characteristics over recommended operating free-air temperature range,
VCC = 5 V ± 0.5 V (unless otherwise noted) (see Figure 1)
PARAMETER
FROM
(INPUT)
TO
(OUTPUT)
fmax
tPHL
tPLH
tPHL
tPHL
tPLH
tPHL
tsk(o)
75**
120**
65**
65
CL = 50 pF
50
75
45
45
CL = 15 pF
CLK
Q
CL = 15 pF
CLR
Q
CL = 50 pF
CL = 50 pF
MAX
MIN
MAX
1**
11.6**
1
11.6
5.5**
7.5**
1**
8.8**
1
8.8
5.8**
8.2**
1**
10**
1
10
8.5
11
1
12.6
1
12.6
6.5
8.5
1
9.8
1
9.8
6.8
9.2
1
11
1
11
1***
• DALLAS, TEXAS 75265
UNIT
MHz
10**
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
POST OFFICE BOX 655303
MIN
7.5**
CL = 50 pF
** On products compliant to MIL-PRF-38535, this parameter is not production tested.
*** On products compliant to MIL-PRF-38535, this parameter does not apply.
4
SN74AHCT273
CL = 15 pF
Q
Q
SN54AHCT273
MIN
CLR
CLK
TA = 25°C
TYP
MAX
LOAD
CAPACITANCE
1
ns
ns
ns
ns
ns
SN54AHCT273, SN74AHCT273
OCTAL D-TYPE FLIP-FLOPS
WITH CLEAR
SCLS375D – JUNE 1997 – REVISED JANUARY 2000
noise characteristics, VCC = 5 V, CL = 50 pF, TA = 25°C (see Note 4)
SN74AHCT273
PARAMETER
MIN
TYP
MAX
UNIT
VOL(P)
VOL(V)
Quiet output, maximum dynamic VOL
0.76
V
Quiet output, minimum dynamic VOL
–0.48
V
VOH(V)
VIH(D)
Quiet output, minimum dynamic VOH
4.4
High-level dynamic input voltage
V
2
VIL(D)
Low-level dynamic input voltage
NOTE 4: Characteristics are for surface-mount packages only.
V
0.8
V
TYP
UNIT
operating characteristics, TA = 25°C
PARAMETER
Cpd
TEST CONDITIONS
Power dissipation capacitance
No load,
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
f = 1 MHz
27
pF
5
SN54AHCT273, SN74AHCT273
OCTAL D-TYPE FLIP-FLOPS
WITH CLEAR
SCLS375D – JUNE 1997 – REVISED JANUARY 2000
PARAMETER MEASUREMENT INFORMATION
Test
Point
From Output
Under Test
RL = 1 kΩ
From Output
Under Test
VCC
Open
S1
TEST
GND
CL
(see Note A)
CL
(see Note A)
S1
tPLH/tPHL
tPLZ/tPZL
tPHZ/tPZH
Open Drain
Open
VCC
GND
VCC
LOAD CIRCUIT FOR
3-STATE AND OPEN-DRAIN OUTPUTS
LOAD CIRCUIT FOR
TOTEM-POLE OUTPUTS
3V
1.5 V
Timing Input
0V
tw
3V
1.5 V
Input
1.5 V
th
tsu
3V
1.5 V
Data Input
1.5 V
0V
0V
VOLTAGE WAVEFORMS
PULSE DURATION
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
3V
1.5 V
Input
1.5 V
0V
tPLH
In-Phase
Output
tPHL
50% VCC
tPHL
Out-of-Phase
Output
VOH
50% VCC
VOL
Output
Waveform 1
S1 at VCC
(see Note B)
VOH
50% VCC
VOL
1.5 V
tPLZ
≈VCC
50% VCC
Output
Waveform 2
S1 at GND
(see Note B)
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
INVERTING AND NONINVERTING OUTPUTS
1.5 V
0V
tPZL
tPZH
tPLH
50% VCC
3V
Output
Control
VOL + 0.3 V
VOL
tPHZ
50% VCC
VOH – 0.3 V
VOH
≈0 V
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
LOW- AND HIGH-LEVEL ENABLING
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 1 MHz, ZO = 50 Ω, tr ≤ 3 ns, tf ≤ 3 ns.
D. The outputs are measured one at a time with one input transition per measurement.
Figure 1. Load Circuit and Voltage Waveforms
6
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
IMPORTANT NOTICE
Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICATIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERSTOOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright  2000, Texas Instruments Incorporated