COMCHIP 1N4148

Fast Switching Diode
COMCHIP
www.comchiptech.com
1N4148 / 1N4448
DO-35
High Speed
Features
1.0 (25.4)
Min.
- Fast Switching Speed
- General Purpose Rectification
- Silicon Epitaxial Planar Construction
0.079 (2.0)
Max.
0.157 (4.0)
Max.
Mechanical Data
- Case: DO-35
- Terminals: Solderable per MIL-STD-202,
Method 208
- Polarity: Cathode Band
- Weight: 0.13 grams (approx.)
1.0 (25.4)
Min.
0.024 (0.60)
Max.
Dimensions in inches and (millimeters)
Maximum Ratings @ TA = 25°C unless otherwise specified
Characteristic
Symbol
Peak Repetitive Reverse Voltage
Working Peak Reverse Voltage
DC Blocking Voltage
1N4148
Unit
100
V
VRRM
VRWM
VR
75
V
VR(RMS)
RMS Reverse Voltage
1N4448
VRM
Non-Repetitive Peak Reverse Voltage
53
V
Forward Continuous Current (Note 1)
IFM
Average Rectified Output Current (Note 1)
IO
150
mA
IFSM
1.0
2.0
A
Pd
500
1.68
mW
mW/°C
RqJA
300
K/W
Tj , TSTG
-65 to +175
°C
Non-Repetitive Peak Forward Surge Current @ t = 1.0s
@ t = 1.0ms
Power Dissipation (Note 1)
Derate Above 25°C
Thermal Resistance, Junction to Ambient Air (Note 1)
Operating and Storage Temperature Range
Electrical Characteristics
300
500
mA
@ TA = 25°C unless otherwise specified
Characteristic
Symbol
Min
VFM
¾
0.62
¾
1.0
0.72
1.0
V
IF = 10mA
IF = 5.0mA
IF = 100mA
Maximum Peak Reverse Current
IRM
¾
5.0
50
30
25
mA
mA
mA
nA
VR = 75V
VR = 70V, Tj = 150°C
VR = 20V, Tj = 150°C
VR = 20V
Capacitance
Cj
¾
4.0
pF
VR = 0, f = 1.0MHz
Reverse Recovery Time
trr
¾
4.0
ns
IF = 10mA to IR =1.0mA
VR = 6.0V, RL = 100W
Maximum Forward Voltage
1N4148
1N4448
1N4448
Max
Unit
Test Condition
Notes: 1. Valid provided that device terminals are kept at ambient temperature.
MDS0312005A
Page 1
Fast Switching Diode
COMCHIP
www.comchiptech.com
1000
10,000
100
IR, LEAKAGE CURRENT (nA)
IF, INSTANTANEOUS FORWARD CURRENT (mA)
Ratings and Characteristic Curves (TA = 25°C unless otherwise noted)
10
1.0
0.1
1000
100
10
VR = 20V
1
0.01
0
1
2
VF, INSTANTANEOUS FORWARD VOLTAGE (V)
Fig. 1 Forward Characteristics
MDS0312005A
0
100
200
Tj, JUNCTION TEMPERATURE (°C)
Fig. 2, Leakage Current vs Junction Temperature
Page 2