HY5DV641622AT 64M(4Mx16) DDR SDRAM HY5DV641622AT This document is a general product description and is subject to change without notice. Hynix Electronics does not assume any responsibility for use of circuits described. No patent licenses are implied. Rev. 0.7/May. 02 1 HY5DV641622AT Revision History 4. Revision 0.7 (May. 02) 1) Input leakage current changed from +/-5uA to +/-2uA 3. Revision 0.6 (Dec. 01) 1) Separated ‘Function description’ and ‘Timing diagram’ parts - These are available in Web site (www.hynix.com) 2. Revision 0.5 (Nov. 01) 1) Changed tCK maximum value a) 300/275Mhz : Changed from 4.5ns to 4.0ns b) 250/200Mhz : Changed from 8.0ns to 6.5ns 2) Changed ‘VDDQ range’ from +/- 0.2V to +/- 5% - Changed from 2.3V/2.5V/2.7V to 2.375V/2.5V/2.625V (min/typ/max) 1. Revision 0.4 (Sep. 01) 1) Removed 183/166Mhz parts from speed bin 2) Changed Cas Latency from 3 to 4 at 300/275Mhz 3) Changed tRCD from 5clk to 6clk at 300/275Mhz 4) Changed tCK maximum value from 8ns to 4.5ns at 300/275Mhz 5) Changed VDD value a) 275Mhz : Changed from 3.15V/3.30V/3.45V to 3.20V/3.30V/3.45V (min/typ/max) b) 300Mhz : Changed from 3.15V/3.30V/3.45V to 3.35V/3.45V/3.55V (min/typ/max) 6) Modified ‘Burst Read followed by Burst Write’ function - Burst Write command must be issued after (CL + BL/2 + 1) ticks of clock from Burst Read command, not (CL + BL/2) ticks of clock at 300/275Mhz Rev. 0.7/May. 02 2 HY5DV641622AT DESCRIPTION The Hynix HY5DV641622 is a 67,108,864-bit CMOS Double Data Rate(DDR) Synchronous DRAM, ideally suited for the point-to-point applications which requires high bandwidth. The Hynix 4Mx16 DDR SDRAMs offer fully synchronous operations referenced to both rising and falling edges of the clock. While all addresses and control inputs are latched on the rising edges of the CK (falling edges of the /CK), Data, Data strobes and Write data masks inputs are sampled on both rising and falling edges of it. The data paths are internally pipelined and 2-bit prefetched to achieve very high bandwidth. All input and output voltage levels are compatible with SSTL_2. FEATURES • 3.3V for VDD and 2.5V for VDDQ power supply • All inputs and outputs are compatible with SSTL_2 interface • JEDEC standard 400mil 66pin TSOP-II with 0.65mm pin pitch • Fully differential clock inputs (CK, /CK) operation • Double data rate interface • Source synchronous - data transaction aligned to bidirectional data strobe (DQS) • x16 device has 2 bytewide data strobes (LDQS, UDQS) per each x8 I/O • Data outputs on DQS edges when read (edged DQ) Data inputs on DQS centers when write (centered DQ) • Data(DQ) and Write masks(DM) latched on the both rising and falling edges of the data strobe • All addresses and control inputs except Data, Data strobes and Data masks latched on the rising edges of the clock • Write mask byte controls by LDM and UDM • Programmable /CAS Latency 3 / 4 supported • Programmable Burst Length 2 / 4 / 8 with both sequential and interleave mode • Internal 4 bank operations with single pulsed /RAS • tRAS Lock-Out function supported • Auto refresh and self refresh supported • 4096 refresh cycles / 64ms • Full, Half and Matched Impedance(Weak) strength driver option controlled by EMRS ORDERING INFORMATION Part No. Power Supply HY5DV641622AT-33 Clock Frequency Max Data Rate 300MHz 600Mbps/pin HY5DV641622AT-36 VDD=3.3V 275MHz 550Mbps/pin HY5DV641622AT-4 VDDQ=2.5V 250MHz 500Mbps/pin 200MHz 400Mbps/pin HY5DV641622AT-5 Rev. 0.7/May. 02 interface SSTL_2 Package 400mil 66pin TSOP-II 3 HY5DV641622AT PIN CONFIGURATION VDD DQ0 VDDQ DQ1 DQ2 VSSQ DQ3 DQ4 VDDQ DQ5 DQ6 VSSQ DQ7 NC VDDQ LDQS NC VDD NC LDM /WE /CAS /RAS /CS NC BA0 BA1 A10/AP A0 A1 A2 A3 VDD 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 TOP VIEW 400mil X 875mil 66 Pin TSOP-II 0.65mm Pin Pitch 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51 50 49 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 VSS DQ15 VSSQ DQ14 DQ13 VDDQ DQ12 DQ11 VSSQ DQ10 DQ9 VDDQ DQ8 NC VSSQ UDQS NC VREF VSS UDM /CLK CLK CKE NC NC A11 A9 A8 A7 A6 A5 A4 VSS ROW and COLUMN ADDRESS TABLE Rev. 0.7/May. 02 Items 4Mx16 Organization 1M x 16 x 4banks Row Address A0 ~ A11 Column Address A0 ~ A7 Bank Address BA0, BA1 Auto Precharge Flag A10 Refresh 4K 4 HY5DV641622AT PIN DESCRIPTION PIN TYPE CK, /CK Input Clock: CK and /CK are differential clock inputs. All address and control input signals are sampled on the crossing of the positive edge of CK and negative edge of /CK. Output (read) data is referenced to the crossings of CK and /CK (both directions of crossing). CKE Input Clock Enable: CKE HIGH activates, and CKE LOW deactivates internal clock signals, and device input buffers and output drivers. Taking CKE LOW provides PRECHARGE POWER DOWN and SELF REFRESH operation (all banks idle), or ACTIVE POWER DOWN (row ACTIVE in any bank). CKE is synchronous for POWER DOWN entry and exit, and for SELF REFRESH entry. CKE is asynchronous for SELF REFRESH exit, and for output disable. CKE must be maintained high throughout READ and WRITE accesses. Input buffers, excluding CK, /CK and CKE are disabled during POWER DOWN. Input buffers, excluding CKE are disabled during SELF REFRESH. CKE is an SSTL_2 input, but will detect an LVCMOS LOW level after Vdd is applied. /CS Input Chip Select : Enables or disables all inputs except CK, /CK, CKE, DQS and DM. All commands are masked when CS is registered high. CS provides for external bank selection on systems with multiple banks. CS is considered part of the command code. BA0, BA1 Input Bank Address Inputs: BA0 and BA1 define to which bank an ACTIVE, Read, Write or PRECHARGE command is being applied. A0 ~ A11 Input Address Inputs: Provide the row address for ACTIVE commands, and the column address and AUTO PRECHARGE bit for READ/WRITE commands, to select one location out of the memory array in the respective bank. A10 is sampled during a precharge command to determine whether the PRECHARGE applies to one bank (A10 LOW) or all banks (A10 HIGH). If only one bank is to be precharged, the bank is selected by BA0, BA1. The address inputs also provide the op code during a MODE REGISTER SET command. BA0 and BA1 define which mode register is loaded during the MODE REGISTER SET command (MRS or EMRS). /RAS, /CAS, /WE Input Command Inputs: /RAS, /CAS and /WE (along with /CS) define the command being entered. LDM, UDM Input Input Data Mask: DM(LDM,UDM) is an input mask signal for write data. Input data is masked when DM is sampled HIGH along with that input data during a WRITE access. DM is sampled on both edges of DQS. Although DM pins are input only, the DM loading matches the DQ and DQS loading. LDM corresponds to the data on DQ0-Q7; UDM corresponds to the data on DQ8-Q15. LDQS, UDQS I/O Data Strobe: Output with read data, input with write data. Edge aligned with read data, centered in write data. Used to capture write data. LDQS corresponds to the data on DQ0-Q7; UDQS corresponds to the data on DQ8-Q15. DQ0 ~ DQ15 I/O Data input / output pin : Data Bus VDD/VSS Supply Power supply for internal circuits and input buffers. VDDQ/VSSQ Supply Power supply for output buffers for noise immunity. VREF Supply Reference voltage for inputs for SSTL interface. NC NC Rev. 0.7/May. 02 DESCRIPTION No connection. 5 HY5DV641622AT FUNCTIONAL BLOCK DIAGRAM 4Banks x 1Mbit x 16 I/O Double Data Rate Synchronous DRAM Input Buffer 16 Write Data Register 2-bit Prefetch Unit 32 1Mx16/Bank0 1Mx16/Bank2 32 1Mx16/Bank3 Mode Register 16 Output Buffer 1Mx16/Bank1 Command Decoder 2-bit Prefetch Unit Bank Control Sense AMP CLK /CLK CKE /CS /RAS /CAS /WE LDM UDM DS DQ[0:15] Row Decoder Column Decoder A0 ~ A11 BA0, BA1 LDQS, UDQS Address Buffer Column Address Counter CLK_DLL DS CLK Data Strobe Transmitter Data Strobe Receiver DLL Block Mode Register Rev. 0.7/May. 02 6 HY5DV641622AT SIMPLIFIED COMMAND TRUTH TABLE A10/ AP Command CKEn-1 CKEn CS RAS CAS WE Extended Mode Register Set H X L L L L OP code 1,2 Mode Register Set H X L L L L OP code 1,2 H X H X X X L H H H X 1 H X L L H H H X L H L H CA H X L H L L CA H X L L H L X Read Burst Stop H X L H H L X 1 Auto Refresh H H L L L H X 1 Entry H L L L L H Exit L H H X X X L H H H Entry H L H X X X L H H H H X X X L H H H 1 H X X X 1 L V V V Device Deselect No Operation Bank Active Read Read with Autoprecharge Write Write with Autoprecharge Precharge All Banks Precharge selected Bank Self Refresh Precharge Power Down Mode Active Power Down Mode Exit L H Entry H L Exit L H X ADDR RA BA V L H L H V V Note 1 1 1,3 1 1,4 H X 1,5 L V 1 1 X 1 1 X X 1 1 1 1 ( H=Logic High Level, L=Logic Low Level, X=Don’t Care, V=Valid Data Input, OP Code=Operand Code, NOP=No Operation ) Note : 1. LDM/UDM states are Don’t Care. Refer to below Write Mask Truth Table. 2. OP Code(Operand Code) consists of A0~A11 and BA0~BA1 used for Mode Register setting during Extended MRS or MRS. Before entering Mode Register Set mode, all banks must be in a precharge state and MRS command can be issued after tRP period from Prechagre command. 3. If a Read with Autoprecharge command is detected by memory component in CK(n), then there will be no command presented to activated bank until CK(n+BL/2+tRP). 4. If a Write with Autoprecharge command is detected by memory component in CK(n), then there will be no command presented to activated bank until CK(n+BL/2+1+tDPL+tRP). Last Data-In to Prechage delay(tDPL) which is also called Write Recovery Time (tWR) is needed to guarantee that the last data has been completely written. 5. If A10/AP is High when Precharge command being issued, BA0/BA1 are ignored and all banks are selected to be precharged. Rev. 0.7/May. 02 7 HY5DV641622AT WRITE MASK TRUTH TABLE Function A10/ AP CKEn-1 CKEn /CS, /RAS, /CAS, /WE LDM UDM Data Write H X X L L X 1,2 Data-In Mask H X X H H X 1,2 Lower Byte Write / Upper Byte-In Mask H X X L H X 1,2 Upper Byte Write / Lower Byte-In Mask H X X H L X 1,2 ADDR BA Note Note : 1. Write Mask command masks burst write data with reference to LDQS/UDQS(Data Strobes) and it is not related with read data. 2. LDM and UDM control lower byte(DQ0~7) and Upper byte(DQ8~15) respectively. Rev. 0.7/May. 02 8 HY5DV641622AT OPERATION COMMAND TRUTH TABLE - I Current State IDLE ROW ACTIVE READ WRITE Rev. 0.7/May. 02 /CS /RAS /CAS /WE Address Command Action H X X X X DSEL NOP or power down3 L H H H X NOP NOP or power down3 L H H L X BST ILLEGAL4 L H L H BA, CA, AP READ/READAP ILLEGAL4 L H L L BA, CA, AP WRITE/WRITEAP ILLEGAL4 L L H H BA, RA ACT Row Activation L L H L BA, AP PRE/PALL NOP L L L H X AREF/SREF Auto Refresh or Self Refresh5 L L L L OPCODE MRS Mode Register Set H X X X X DSEL NOP L H H H X NOP NOP L H H L X BST ILLEGAL4 L H L H BA, CA, AP READ/READAP Begin read : optional AP6 L H L L BA, CA, AP WRITE/WRITEAP Begin write : optional AP6 L L H H BA, RA ACT ILLEGAL4 L L H L BA, AP PRE/PALL Precharge7 L L L H X AREF/SREF ILLEGAL11 L L L L OPCODE MRS ILLEGAL11 H X X X X DSEL Continue burst to end L H H H X NOP Continue burst to end L H H L X BST Terminate burst L H L H BA, CA, AP READ/READAP Term burst, new read:optional AP8 L H L L BA, CA, AP WRITE/WRITEAP ILLEGAL L L H H BA, RA ACT ILLEGAL4 L L H L BA, AP PRE/PALL Term burst, precharge L L L H X AREF/SREF ILLEGAL11 L L L L OPCODE MRS ILLEGAL11 H X X X X DSEL Continue burst to end L H H H X NOP Continue burst to end L H H L X BST ILLEGAL4 L H L H BA, CA, AP READ/READAP Term burst, new read:optional AP8 L H L L BA, CA, AP WRITE/WRITEAP Term burst, new write:optional AP 9 HY5DV641622AT OPERATION COMMAND TRUTH TABLE - II Current State WRITE READ WITH AUTOPRECHARGE WRITE AUTOPRECHARGE PRECHARGE Rev. 0.7/May. 02 /CS /RAS /CAS /WE Address Command Action L L H H BA, RA ACT ILLEGAL4 L L H L BA, AP PRE/PALL Term burst, precharge L L L H X AREF/SREF ILLEGAL11 L L L L OPCODE MRS ILLEGAL11 H X X X X DSEL Continue burst to end L H H H X NOP Continue burst to end L H H L X BST ILLEGAL L H L H BA, CA, AP READ/READAP ILLEGAL10 L H L L BA, CA, AP WRITE/WRITEAP ILLEGAL10 L L H H BA, RA ACT ILLEGAL4,10 L L H L BA, AP PRE/PALL ILLEGAL4,10 L L L H X AREF/SREF ILLEGAL11 L L L L OPCODE MRS ILLEGAL11 H X X X X DSEL Continue burst to end L H H H X NOP Continue burst to end L H H L X BST ILLEGAL L H L H BA, CA, AP READ/READAP ILLEGAL10 L H L L BA, CA, AP WRITE/WRITEAP ILLEGAL10 L L H H BA, RA ACT ILLEGAL4,10 L L H L BA, AP PRE/PALL ILLEGAL4,10 L L L H X AREF/SREF ILLEGAL11 L L L L OPCODE MRS ILLEGAL11 H X X X X DSEL NOP-Enter IDLE after tRP L H H H X NOP NOP-Enter IDLE after tRP L H H L X BST ILLEGAL4 L H L H BA, CA, AP READ/READAP ILLEGAL4,10 L H L L BA, CA, AP WRITE/WRITEAP ILLEGAL4,10 L L H H BA, RA ACT ILLEGAL4,10 L L H L BA, AP PRE/PALL NOP-Enter IDLE after tRP L L L H X AREF/SREF ILLEGAL11 L L L L OPCODE MRS ILLEGAL11 10 HY5DV641622AT OPERATION COMMAND TRUTH TABLE - III Current State ROW ACTIVATING WRITE RECOVERING WRITE RECOVERING WITH AUTOPRECHARGE REFRESHING Rev. 0.7/May. 02 /CS /RAS /CAS /WE Address Command Action H X X X X DSEL NOP - Enter ROW ACT after tRCD L H H H X NOP NOP - Enter ROW ACT after tRCD L H H L X BST ILLEGAL4 L H L H BA, CA, AP READ/READAP ILLEGAL4,10 L H L L BA, CA, AP WRITE/WRITEAP ILLEGAL4,10 L L H H BA, RA ACT ILLEGAL4,9,10 L L H L BA, AP PRE/PALL ILLEGAL4,10 L L L H X AREF/SREF ILLEGAL11 L L L L OPCODE MRS ILLEGAL11 H X X X X DSEL NOP - Enter ROW ACT after tWR L H H H X NOP NOP - Enter ROW ACT after tWR L H H L X BST ILLEGAL4 L H L H BA, CA, AP READ/READAP ILLEGAL L H L L BA, CA, AP WRITE/WRITEAP ILLEGAL L L H H BA, RA ACT ILLEGAL4,10 L L H L BA, AP PRE/PALL ILLEGAL4,11 L L L H X AREF/SREF ILLEGAL11 L L L L OPCODE MRS ILLEGAL11 H X X X X DSEL NOP - Enter precharge after tDPL L H H H X NOP NOP - Enter precharge after tDPL L H H L X BST ILLEGAL4 L H L H BA, CA, AP READ/READAP ILLEGAL4,8,10 L H L L BA, CA, AP WRITE/WRITEAP ILLEGAL4,10 L L H H BA, RA ACT ILLEGAL4,10 L L H L BA, AP PRE/PALL ILLEGAL4,11 L L L H X AREF/SREF ILLEGAL11 L L L L OPCODE MRS ILLEGAL11 H X X X X DSEL NOP - Enter IDLE after tRC L H H H X NOP NOP - Enter IDLE after tRC L H H L X BST ILLEGAL11 L H L H BA, CA, AP READ/READAP ILLEGAL11 11 HY5DV641622AT OPERATION COMMAND TRUTH TABLE - IV Current State WRITE MODE REGISTER ACCESSING /CS /RAS /CAS /WE Address Command Action L H L L BA, CA, AP WRITE/WRITEAP ILLEGAL11 L L H H BA, RA ACT ILLEGAL11 L L H L BA, AP PRE/PALL ILLEGAL11 L L L H X AREF/SREF ILLEGAL11 L L L L OPCODE MRS ILLEGAL11 H X X X X DSEL NOP - Enter IDLE after tMRD L H H H X NOP NOP - Enter IDLE after tMRD L H H L X BST ILLEGAL11 L H L H BA, CA, AP READ/READAP ILLEGAL11 L H L L BA, CA, AP WRITE/WRITEAP ILLEGAL11 L L H H BA, RA ACT ILLEGAL11 L L H L BA, AP PRE/PALL ILLEGAL11 L L L H X AREF/SREF ILLEGAL11 L L L L OPCODE MRS ILLEGAL11 Note : 1. H - Logic High Level, L - Logic Low Level, X - Don’t Care, V - Valid Data Input, BA - Bank Address, AP - AutoPrecharge Address, CA - Column Address, RA - Row Address, NOP - NO Operation. 2. All entries assume that CKE was active(high level) during the preceding clock cycle. 3. If both banks are idle and CKE is inactive(low level), then in power down mode. 4. Illegal to bank in specified state. Function may be legal in the bank indicated by Bank Address(BA) depending on the state of that bank. 5. If both banks are idle and CKE is inactive(low level), then self refresh mode. 6. Illegal if tRCD is not met. 7. Illegal if tRAS is not met. 8. Must satisfy bus contention, bus turn around, and/or write recovery requirements. 9. Illegal if tRRD is not met. 10. Illegal for single bank, but legal for other banks in multi-bank devices. 11. Illegal for all banks. Rev. 0.7/May. 02 12 HY5DV641622AT CKE FUNCTION TRUTH TABLE Current State CKEn1 CKEn /CS /RAS /CAS /WE /ADD Action H X X X X X X INVALID L H H X X X X Exit self refresh, enter idle after tSREX L H L H H H X Exit self refresh, enter idle after tSREX L H L H H L X ILLEGAL L H L H L X X ILLEGAL L H L L X X X ILLEGAL L L X X X X X NOP, continue self refresh SELF REFRESH1 POWER DOWN2 ALL BANKS IDLE4 ANY STATE OTHER THAN ABOVE H X X X X X X INVALID L H H X X X X Exit power down, enter idle L H L H H H X Exit power down, enter idle L H L H H L X ILLEGAL L H L H L X X ILLEGAL L H L L X X X ILLEGAL L L X X X X X NOP, continue power down mode H H X X X X X See operation command truth table H L L L L H X Enter self refresh H L H X X X X Exit power down H L L H H H X Exit power down H L L H H L X ILLEGAL H L L H L X X ILLEGAL H L L L H X X ILLEGAL H L L L L L X ILLEGAL L L X X X X X NOP H H X X X X X See operation command truth table H L X X X X X ILLEGAL5 L H X X X X X INVALID L L X X X X X INVALID Note : When CKE=L, all DQ and DQS must be in Hi-Z state. 1. CKE and /CS must be kept high for a minimum of 200 stable input clocks before issuing any command. 2. All command can be stored after 2 clocks from low to high transition of CKE. 3. Illegal if CK is suspended or stopped during the power down mode. 4. Self refresh can be entered only from the all banks idle state. 5. Disabling CK may cause malfunction of any bank which is in active state. Rev. 0.7/May. 02 13 HY5DV641622AT SIMPLIFIED STATE DIAGRAM MRS MODE REGISTER SET SREF SELF REFRESH IDLE SREX PDEN PDEX AREF ACT POWER DOWN POWER DOWN AUTO REFRESH PDEN BST PDEX BANK ACTIVE READ WRITE READ WRITE WRITEAP WRITE WITH AUTOPRECHARGE PRE(PALL) READAP READ READAP WITH AUTOPRECHARGE WRITEAP READ WRITE PRE(PALL) PRE(PALL) PRECHARGE POWER-UP Command Input Automatic Sequence POWER APPLIED Rev. 0.7/May. 02 14 HY5DV641622AT POWER-UP SEQUENCE AND DEVICE INITIALIZATION DDR SDRAMs must be powered up and initialized in a predefined manner. Operational procedures other than those specified may result in undefined operation. Power must first be applied to VDD, then to VDDQ, and finally to VREF (and to the system VTT). VTT must be applied after VDDQ to avoid device latch-up, which may cause permanent damage to the device. VREF can be applied anytime after VDDQ, but is expected to be nominally coincident with VTT. Except for CKE, inputs are not recognized as valid until after VREF is applied. CKE is an SSTL_2 input, but will detect an LVCMOS LOW level after VDD is applied. Maintaining an LVCMOS LOW level on CKE during power-up is required to guarantee that the DQ and DQS outputs will be in the High-Z state, where they will remain until driven in normal operation (by a read access). After all power supply and reference voltages are stable, and the clock is stable, the DDR SDRAM requires a 200us delay prior to applying an executable command. Once the 200us delay has been satisfied, a DESELECT or NOP command should be applied, and CKE should be brought HIGH. Following the NOP command, a PRECHARGE ALL command should be applied. Next a EXTENDED MODE REGISTER SET command should be issued for the Extended Mode Register, to enable the DLL, then a MODE REGISTER SET command should be issued for the Mode Register, to reset the DLL, and to program the operating parameters. 200 clock cycles are required between the DLL reset and any command. During the 200 cycles of CK, for DLL locking, executable commands are disallowed (a DESELECT or NOP command must be applied). After the 200 clock cycles, a PRECHARGE ALL command should be applied, placing the device in the all banks idle state. Once in the idle state, two AUTO REFRESH cycles must be performed. Additionally, a MODE REGISTER SET command for the Mode Register with the reset DLL bit deactivated (i.e. to program operating parameters without resetting the DLL) must be performed. Following these cycles, the DDR SDRAM is ready for normal operation. 1. Apply power - VDD, VDDQ, VTT, VREF in the following power up sequencing and attempt to maintain CKE at LVCMOS low state. (All the other input pins may be undefined.) • VDD and VDDQ are driven from a single power converter output. • VTT is limited to 1.44V (reflecting VDDQ(max)/2 + 50mV VREF variation + 40mV VTT variation. • VREF tracks VDDQ/2. • A minimum resistance of 42 Ohms (22 ohm series resistor + 22 ohm parallel resistor - 5% tolerance) limits the input current from the VTT supply into any pin. • If the above criteria cannot be met by the system design, then the following sequencing and voltage relationship must be adhered to during power up. Votage description Sequencing Voltage relationship to avoid latch-up VDDQ After or with VDD < VDD + 0.3V VTT After or with VDDQ < VDDQ + 0.3V VREF After or with VDDQ < VDDQ + 0.3V 2. Start clock and maintain stable clock for a minimum of 200usec. 3. After stable power and clock, apply NOP condition and take CKE high. 4. Issue Extended Mode Register Set (EMRS) to enable DLL. 5. Issue Mode Register Set (MRS) to reset DLL and set device to idle state with bit A8=High. (An additional 200 cycles of clock are required for locking DLL) 6. Issue Precharge commands for all banks of the device. Rev. 0.7/May. 02 15 HY5DV641622AT 7. Issue 2 or more Auto Refresh commands. 8. Issue a Mode Register Set command to initialize the mode register with bit A8 = Low. Power-Up Sequence VDD VDDQ tVTD VTT VREF BA0,BA1 DQ’s ≈ ≈ LDQS, UDQS T=200usec Power up VDD and CK stable tRP Precharge All ≈ ≈ A10 ≈ ≈ ≈ ≈ ≈ ≈ ≈ ADDR PRE ≈ ≈ LDM,UDM NOP ≈ ≈ ≈ ≈ ≈ ≈ ≈ CMD ≈≈ ≈ ≈ ≈ ≈ CKE ≈ ≈ tIS tIH tMRD 200 cycles of CK* tRP tRFC EMRS MRS CODE CODE CODE CODE CODE CODE EMRS Set MRS Set Reset DLL (with A8=H) ≈ ≈ ≈ ≈ ≈ ≈ ≈ CLK ≈ ≈ ≈ ≈ ≈ ≈ ≈ ≈ ≈ ≈ /CLK NOP PRE AREF Precharge All MRS CODE CODE CODE 2 or more Auto Refresh MRS Set (with A8=L) *200 cycles of CK are required (for DLL locking) before any executable command can be applied. Rev. 0.7/May. 02 16 HY5DV641622AT MODE REGISTER SET (MRS) The mode register is used to store the various operating modes such as /CAS latency, addressing mode, burst length, burst type, test mode, DLL reset. The mode register is program via MRS command. This command is issued by the low signals of /RAS, /CAS, /CS, /WE and BA0. This command can be issued only when all banks are in idle state and CKE must be high at least one cycle before the Mode Register Set Command can be issued. Two cycles are required to write the data in mode register. During the the MRS cycle, any command cannot be issued. Once mode register field is determined, the information will be held until resetted by another MRS command. BA1 BA0 0 0 A11 A10 RFU A9 A8 A7 DR TM A6 A5 A4 CAS Latency BA0 MRS Type A7 Test Mode 0 MRS 0 Normal 1 EMRS 1 Test A3 A2 BT A1 A0 Burst Length Burst Length Rev. 0.7/May. 02 A2 A1 A8 DLL Reset 0 No 0 0 1 Yes 0 A0 Sequential Interleave 0 Reserved Reserved 0 1 2 2 0 1 0 4 4 0 1 1 8 8 1 0 0 Reserved Reserved 1 0 1 Reserved Reserved 1 1 0 Reserved Reserved 1 1 1 Reserved Reserved A6 A5 A4 CAS Latency 0 0 0 Reserved 0 0 1 Reserved 0 1 0 Reserved 0 1 1 3 1 0 0 4 1 0 1 Reserved A3 Burst Type 1 1 0 Reserved 0 Sequential 1 1 1 Reserved 1 Interleave 17 HY5DV641622AT BURST DEFINITION Burst Length Starting Address (A2,A1,A0) Sequential Interleave XX0 0, 1 0, 1 XX1 1, 0 1, 0 X00 0, 1, 2, 3 0, 1, 2, 3 X01 1, 2, 3, 0 1, 0, 3, 2 X10 2, 3, 0, 1 2, 3, 0, 1 X11 3, 0, 1, 2 3, 2, 1, 0 000 0, 1, 2, 3, 4, 5, 6, 7 0, 1, 2, 3, 4, 5, 6, 7 001 1, 2, 3, 4, 5, 6, 7, 0 1, 0, 3, 2, 5, 4, 7, 6 010 2, 3, 4, 5, 6, 7, 0, 1 2, 3, 0, 1, 6, 7, 4, 5 011 3, 4, 5, 6, 7, 0, 1, 2 3, 2, 1, 0, 7, 6, 5, 4 100 4, 5, 6, 7, 0, 1, 2, 3 4, 5, 6, 7, 0, 1, 2, 3 101 5, 6, 7, 0, 1, 2, 3, 4 5, 4, 7, 6, 1, 0, 3, 2 110 6, 7, 0, 1, 2, 3, 4, 5 6, 7, 4, 5, 2, 3, 0, 1 111 0, 1, 2, 3, 4, 5, 6, 7 7, 6, 5, 4, 3, 2, 1, 0 2 4 8 BURST LENGTH & TYPE Read and write accesses to the DDR SDRAM are burst oriented, with the burst length being programmable. The burst length determines the maximum number of column locations that can be accessed for a given Read or Write command. Burst lengths of 2, 4 or 8 locations are available for both the sequential and the interleaved burst types. Reserved states should not be used, as unknown operation or incompatibility with future versions may result. When a Read or Write command is issued, a block of columns equal to the burst length is effectively selected. All accesses for that burst take place within this block, meaning that the burst wraps within the block if a boundary is reached. The block is uniquely selected by A1-Ai when the burst length is set to two, by A2-Ai when the burst length is set to four and by A3-Ai when the burst length is set to eight (where Ai is the most significant column address bit for a given configuration). The remaining (least significant) address bit(s) is (are) used to select the starting location within the block. The programmed burst length applies to both Read and Write bursts. Accesses within a given burst may be programmed to be either sequential or interleaved; this is referred to as the burst type and is selected via bit A3. The ordering of accesses within a burst is determined by the burst length, the burst type and the starting column address, as shown in Burst Definitionon Table Rev. 0.7/May. 02 18 HY5DV641622AT CAS LATENCY The Read latency or CAS latency is the delay in clock cycles between the registration of a Read command and the availability of the first burst of output data. The latency can be programmed 3 or 4 clocks. If a Read command is registered at clock edge n, and the latency is m clocks, the data is available nominally coincident with clock edge n + m. Reserved states should not be used as unknown operation or incompatibility with future versions may result. DLL RESET The DLL must be enabled for normal operation. DLL enable is required during power up initialization, and upon returning to normal operation after having disabled the DLL for the purpose of debug or evaluation. The DLL is automatically disabled when entering self refresh operation and is automatically re-enabled upon exit of self refresh operation. Any time the DLL is enabled, 200 clock cycles must occur to allow time for the internal clock to lock to the externally applied clock before an any command can be issued. OUTPUT DRIVER IMPEDANCE CONTROL The HY5DV641622A supports Full, Half strength driver and Matched impedance driver, intended for lighter load and/or point-to-point environments. The Full drive strength for all output is specified to be SSTL_2, CLASS II. Half strength driver is to define about 50% of Full drive strength and Matched impedance driver, about 30% of Full drive strength. Rev. 0.7/May. 02 19 HY5DV641622AT EXTENDED MODE REGISTER SET (EMRS) The Extended Mode Register controls functions beyond those controlled by the Mode Register; these additional functions include DLL enable/disable, output driver strength selection(optional). These functions are controlled via the bits shown below. The Extended Mode Register is programmed via the Mode Register Set command ( BA0=1 and BA1=0) and will retain the stored information until it is programmed again or the device loses power. The Extended Mode Register must be loaded when all banks are idle and no bursts are in progress, and the controller must wait the specified time before initiating any subsequent operation. Violating either of these requirements will result in unspecified operation. BA1 BA0 0 1 A11 A10 A9 RFU* BA0 MRS Type 0 MRS 1 EMRS A8 A7 A6 DS A5 A4 A3 RFU* A2 A1 A0 DS DLL A0 DLL enable 0 Enable 1 Diable A6 A1 Output Driver Impedance Control 0 0 Full 0 1 Half 1 0 RFU* 1 1 Matched Impedance (Weak) * All bits in RFU address fields must be programmed to Zero, all other states are reserved for future usage. Rev. 0.7/May. 02 20 HY5DV641622AT ABSOLUTE MAXIMUM RATINGS Parameter Symbol Rating Ambient Temperature TA 0 ~ 70 Storage Temperature TSTG -55 ~ 125 oC VIN, VOUT -0.5 ~ 3.6 V VDD -0.5 ~ 3.6 V VDDQ -0.5 ~ 3.6 V Output Short Circuit Current IOS 50 mA Power Dissipation PD 1 W TSOLDER 260 ⋅ 10 Voltage on Any Pin relative to VSS Voltage on VDD relative to VSS Voltage on VDDQ relative to VSS Soldering Temperature ⋅ Time Unit o o C C ⋅ sec Note : Operation at above absolute maximum rating can adversely affect device reliability DC OPERATING CONDITIONS (TA=0 to 70oC, Voltage referenced to VSS = 0V) Parameter Min Typ. Max Unit Note 3.15 3.3 3.45 V 1 3.2 3.3 3.45 V 2 3.35 3.45 3.55 V 3 VDDQ 2.375 2.5 2.625 V 4 Input High Voltage VIH VREF + 0.15 - VDDQ + 0.3 V Input Low Voltage VIL -0.3 - VREF - 0.15 V Termination Voltage VTT VREF - 0.04 VREF VREF + 0.04 V Reference Voltage VREF 0.49*VDDQ 0.5*VDDQ 0.51*VDDQ V Power Supply Voltage Power Supply Voltage Symbol VDD 5 6 Note : 1. VDD specification for 250/200Mhz 2. VDD specification for 275Mhz 3. VDD specification for 300Mhz 4. VDDQ must not exceed the level of VDD. 5. VIL (min) is acceptable -1.5V AC pulse width with ≤ 5ns of duration. 6. VREF is expected to be equal to 0.5*VDDQ of the transmitting device, and to track variations in the dc level of the same. Peak to peak noise on VREF may not exceed ± 2% of the dc value. Rev. 0.7/May. 02 21 HY5DV641622AT DC CHARACTERISTICS I Parameter (TA=0 to 70oC, Voltage referenced to VSS = 0V) Symbol Min. Max Unit Note Input Leakage Current ILI -2 2 uA 1 Output Leakage Current ILO -5 5 uA 2 Output High Voltage VOH VTT + 0.76 - V IOH = -15.2mA Output Low Voltage VOL - VTT - 0.76 V IOL = +15.2mA Note : 1. VIN = 0 to 3.6V, All other pins are not tested under VIN = 0V. 2. DOUT is disabled, VOUT = 0 to 2.7V DC CHARACTERISTICS II (TA=0 to 70oC, Voltage referenced to VSS = 0V) Speed Parameter Symbol Test Condition Unit Note 33 36 4 5 150 130 120 100 Operating Current IDD1 Burst length=2, One bank active tRC ≥ tRC(min), IOL=0mA Precharge Standby Current in Power Down Mode IDD2P CKE ≤ VIL(max), tCK = min Precharge Standby Current in Non Power Down Mode IDD2N CKE ≥ VIH(min), CS ≥ VIH(min), tCK = min Input signals are changed one time during 2clks Active Standby Current in Power Down Mode IDD3P CKE ≤ VIL(max), tCK = min Active Standby Current in Non Power Down Mode IDD3N CKE ≥ VIH(min), CS ≥ VIH(min), tCK = min Input signals are changed one time during 2clks 100 90 80 70 mA Burst Mode Operating Current IDD4 tCK ≥ tCK(min), IOL= 0mA All banks active 250 230 210 190 mA 1 Auto Refresh Current IDD5 tRC ≥ tRFC (min), All banks active 200 mA 1,2 Self Refresh Current IDD6 CKE ≤ 0.2V 2 mA 20 100 90 mA 1 mA 80 70 20 mA mA Note : 1. IDD1, IDD4 and IDD5 depend on output loading and cycle rates. Specified values are measured with the output open. 2. Min. of tRFC (Auto Refresh Row Cycle Time) is shown at AC CHARACTERISTICS. Rev. 0.7/May. 02 22 HY5DV641622AT AC OPERATING CONDITIONS (TA=0 to 70oC, Voltage referenced to VSS = 0V) Parameter Symbol Min Max Input High (Logic 1) Voltage, DQ, DQS and DM signals VIH(AC) VREF + 0.35 Input Low (Logic 0) Voltage, DQ, DQS and DM signals VIL(AC) Input Differential Voltage, CK and /CK inputs VID(AC) Input Crossing Point Voltage, CK and /CK inputs VIX(AC) Unit Note V VREF - 0.35 V 0.7 VDDQ + 0.6 V 1 0.5*VDDQ-0.2 0.5*VDDQ+0.2 V 2 Note : 1. VID is the magnitude of the difference between the input level on CK and the input on CK. 2. The value of VIX is expected to equal 0.5*VDDQ of the transmitting device and must track variations in the DC level of the same. AC OPERATING TEST CONDITIONS (TA=0 to 70oC, Voltage referenced to VSS = 0V) Parameter Value Unit Reference Voltage VDDQ x 0.5 V Termination Voltage VDDQ x 0.5 V AC Input High Level Voltage (VIH, min) VREF + 0.35 V AC Input Low Level Voltage (VIL, max) VREF - 0.35 V Input Timing Measurement Reference Level Voltage VREF V Output Timing Measurement Reference Level Voltage VTT V Input Signal maximum peak swing 1.5 V Input minimum Signal Slew Rate 1 V/ns Termination Resistor (RT) 50 Ω Series Resistor (RS) 25 Ω Output Load Capacitance for Access Time Measurement (CL) 30 pF Rev. 0.7/May. 02 23 HY5DV641622AT AC CHARACTERISTICS - I (AC operating conditions unless otherwise noted) Parameter Symbol 33 36 4 5 Min Max Min Max Min Max Min Max Unit Note Row Cycle Time tRC 52.8 - 54 - 56 - 60 - ns Auto Refresh Row Cycle Time tRFC 72 - 72 - 72 - 75 - ns Row Active Time tRAS 36.3 120K 36 120K 36 120K 40 120K ns Row Address to Column Address Delay tRCD 6 - 6 - 5 - 4 - CK Row Active to Row Active Delay tRRD 2 - 2 - 2 - 2 - CK Column Address to Column Address Delay tCCD 1 - 1 - 1 - 1 - CK Row Precharge Time tRP 5 - 5 - 5 - 4 - CK Last Data-In to Precharge Delay Time (Write Recovery Time : tWR) tDPL 3 - 3 - 2 - 2 - CK Last Data-In to Read Command tDRL 2 - 2 - 2 - 1 - CK Auto Precharge Write Recovery + Precharge Time tDAL 8 - 8 - 7 - 6 - CK CL = 4.0 tCK 3.3 4.0 3.6 4.0 - - - - ns CL = 3.0 tCK - - - - 4 6.5 5 6.5 ns Clock High Level Width tCH 0.45 0.55 0.45 0.55 0.45 0.55 0.45 0.55 CK Clock Low Level Width tCL 0.45 0.55 0.45 0.55 0.45 0.55 0.45 0.55 CK Data-Out edge to Clock edge Skew tAC -1.0 0.5 -1.0 0.5 -1.0 0.5 -1.0 0.5 ns DQS-Out edge to Clock edge Skew tDQSCK -1.0 0.5 -1.0 0.5 -1.0 0.5 -1.0 0.5 ns DQS-Out edge to Data-Out edge Skew tDQSQ - 0.4 - 0.4 - 0.4 - 0.4 ns Data-Out hold time from DQS tQH tHPmin -tQHS - tHPmin -tQHS - tHPmin -tQHS - tHPmin -tQHS - ns 1, 6 Clock Half Period tHP tCH/L min - tCH/L min - tCH/L min - tCH/L min - ns 1, 5 Data Hold Skew Factor tQHS - 0.4 - 0.4 - 0.4 - 0.75 ns 6 Input Setup Time tIS 0.9 - 0.9 - 0.9 - 0.9 - ns 2 Input Hold Time tIH 0.9 - 0.9 - 0.9 - 0.9 - ns 2 Write DQS High Level Width tDQSH 0.4 0.6 0.4 0.6 0.4 0.6 0.4 0.6 CK Write DQS Low Level Width tDQSL 0.4 0.6 0.4 0.6 0.4 0.6 0.4 0.6 CK Clock to First Rising edge of DQS-In tDQSS 0.8 1.25 0.8 1.25 0.8 1.25 0.75 1.25 CK System Clock Cycle Time Rev. 0.7/May. 02 24 HY5DV641622AT Parameter Symbol 33 36 4 5 Min Max Min Max Min Max Min Max Unit Note Data-In Setup Time to DQS-In (DQ & DM) tDS 0.4 - 0.4 - 0.4 - 0.5 - ns 3 Data-In Hold Time to DQS-In (DQ & DM) tDH 0.4 - 0.4 - 0.4 - 0.5 - ns 3 Read DQS Preamble Time tRPRE 0.9 1.1 0.9 1.1 0.9 1.1 0.9 1.1 CK Read DQS Postamble Time tRPST 0.4 0.6 0.4 0.6 0.4 0.6 0.4 0.6 CK Write DQS Preamble Setup Time tWPRES 0 - 0 - 0 - 0 - ns Write DQS Preamble Hold Time tWPREH 1.5 - 1.5 - 1.5 - 1.5 - ns Write DQS Postamble Time tWPST 0.4 0.6 0.4 0.6 0.4 0.6 0.4 0.6 CK Mode Register Set Delay tMRD 3 - 3 - 3 - 2 - CK Exit Self Refresh to Any Execute Command tXSC 200 - 200 - 200 - 200 - CK Average Periodic Refresh Interval tREFI - 15.6 - 15.6 - 15.6 - 15.6 us 4 Note : 1. This calculation accounts for tDQSQ(max), the pulse width distortion of on-chip circuit and jitter. 2. Data sampled at the rising edges of the clock : A0~A11, BA0~BA1, CKE, /CS, /RAS, /CAS, /WE. 3. Data latched at both rising and falling edges of Data Strobes(LDQS/UDQS) : DQ, LDM/UDM. 4. Minimum of 200 cycles of stable input clocks after Self Refresh Exit command, where CKE is held high, is required to complete Self Refresh Exit and lock the internal DLL circuit of DDR SDRAM. 5. Min (tCL, tCH) refers to the smaller of the actual clock low time and the actual clock high time as provided to the device (i.e. this value can be greater than the minimum specification limits for tCL and tCH). 6. tHP = minimum half clock period for any given cycle and is defined by clock high or clock low (tCH, tCL). tQHS consists of tDQSQmax, the pulse width distortion of on-chip clock circuits, data pin to pin skew and output pattern effects, and p-channel to n-channel variation of the output drivers. 7. DQS, DM and DQ input slew rate is specified to prevent double clocking of data and preserve setup and hold times. Signal transitions through the DC region must be monotonic. Rev. 0.7/May. 02 25 HY5DV641622AT CAPACITANCE (TA=25oC, f=1MHz ) Parameter Pin Symbol Min Max Unit Input Clock Capacitance CK, CK CCK 2.0 3.0 pF Input Capacitance All other input-only pins CIN 2.0 3.0 pF Input / Output Capacitanc DQ, DQS, DM CIO 4.0 5.0 pF Note : 1. VDD = min. to max., VDDQ = 2.3V to 2.7V, VODC = VDDQ/2, VOpeak-to-peak = 0.2V 2. Pins not under test are tied to GND. 3. These values are guaranteed by design and are tested on a sample basis only. OUTPUT LOAD CIRCUIT VTT VTT RT=50Ω RT=50Ω Output RS=25Ω Zo=50Ω VREF CL=30pF Rev. 0.7/May. 02 26 HY5DV641622AT PACKAGE INFORMATION 400mil 66pin Thin Small Outline Package Unit : mm(Inch) 11.94 (0.470) 11.79 (0.462) 10.26 (0.404) 10.05 (0.396) BASE PLANE 22.33 (0.879) 22.12 (0.871) 0.65 (0.0256) BSC 1.194 (0.0470) 0.991 (0.0390) 0.35 (0.0138) 0.25 (0.0098) 0 ~ 5 Deg. SEATING PLANE 0.15 (0.0059) 0.05 (0.0020) 0.597 (0.0235) 0.406 (0.0160) 0.210 (0.0083) 0.120 (0.0047) Note : Package do not mold protrusion. Allowable protrusion of both sides is 0.4mm. Rev. 0.7/May. 02 27