SN75446, SN75447 DUAL PERIPHERAL DRIVERS SLRS020A – DECEMBER 1978 – REVISED NOVEMBER 1995 • • • • • • • • • D OR P PACKAGE (TOP VIEW) Very Low Power Requirements Very Low Input Current Characterized for Use to 350 mA No Output Latch-Up at 50 V (After Conducting 300 mA) High-Voltage Outputs (70 V Min) Output Clamp Diodes for Transient Suppression (350 mA, 70 V) TTL- or MOS-Compatible Diode-Clamped Inputs Standard Supply Voltage Suitable for Hammer-Driver Applications S 1A 1Y GND 1 8 2 7 3 6 4 5 VCC 2A 2Y CLAMP Function Tables SN75446 (each AND driver) INPUTS description The SN75446 and SN75447 dual peripheral drivers are designed for use in systems that require high current, high voltage, and fast switching times. The SN75446 and SN75447 provide AND and NAND drivers, respectively. These devices have diode-clamped inputs as well as high-current, high-voltage inductive-clamp diodes on the outputs. A S OUTPUT Y H L X H X L H L L SN75447 (each NAND driver) INPUTS A S OUTPUT Y H L X H X L L H H H = high level, L = low level X = irrelevant The SN75446 and SN75447 drivers are characterized for operation from 0°C to 70°C. schematics of inputs and outputs EQUIVALENT OF EACH INPUT VCC TYPICAL OF ALL OUTPUTS CLAMP Output Input GND Copyright 1995, Texas Instruments Incorporated PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 3–1 SN75446, SN75447 DUAL PERIPHERAL DRIVERS SLRS020A – DECEMBER 1978 – REVISED NOVEMBER 1995 logic symbols† logic diagrams (positive logic) SN75446 1A S 2A 2 1 SN75446 3 & CLAMP 7 6 5 1A 1Y S 2Y CLAMP 2A 2 1 3 6 7 5 4 1Y 2Y CLAMP GND Positive Logic: Y = AS or A+S SN75447 1A S 2A 2 1 SN75447 3 & 1A 1Y CLAMP 6 7 5 S 2Y CLAMP 2A 2 1 3 6 7 1Y 2Y 5 CLAMP 4 GND Positive Logic: Y = AS or A+S † This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC publication 617-12. absolute maximum ratings over operating free-air temperature range (unless otherwise noted)‡ Supply voltage, VCC (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 V Input voltage, VI . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5.5 V Output current, IO (see Note 2) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 400 mA Output clamp-diode current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 400 mA Continuous total power dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . See Dissipation Rating Table Operating free-air temperature range, TA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to 70°C Storage temperature range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 65°C to 150°C Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 260°C ‡ Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. NOTES: 1. Voltage values are with respect to network GND. 2. Both halves of this dual circuit may conduct rated current simultaneously; however, power dissipation averaged over a short time interval must fall within the continuous dissipation ratings. DISSIPATION RATING TABLE TA ≤ 25°C POWER RATING DERATING FACTOR ABOVE TA = 25°C TA = 70°C POWER RATING D 725 mW 5.8 mW/°C 464 mW P 1000 mW 8.0 mW/°C 640 mW PACKAGE 3–2 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 SN75446, SN75447 DUAL PERIPHERAL DRIVERS SLRS020A – DECEMBER 1978 – REVISED NOVEMBER 1995 recommended operating conditions Supply voltage, VCC MIN NOM MAX UNIT 4.75 5 5.25 V High-level input voltage, VIH 2 V Low-level input voltage, VIL Operating free-air temperature range, TA 0 0.8 V 70 °C electrical characteristics over recommended operating free-air temperature range PARAMETER VIK TEST CONDITIONS Input clamp voltage II = – 12 mA VOL Low level output voltage Low-level VCC = 4.75 V, VIH = 2 V V, VIL = 0.8 V VO(BR) VR(K) Output breakdown voltage VF(K) MIN IOL = 100 mA IOL = 200 mA IOL = 300 mA IOL = 350 mA TYP† MAX UNIT – 0.9 – 1.5 V 0.1 0.3 0.22 0.45 0.45 0.65 0.55 0.75 V IOH = 100 µA IR = 100 µA 70 100 V Output clamp-diode reverse voltage VCC = 4.75 V, VCC = 4.75 V, 70 100 V Output clamp-diode forward voltage VCC = 4.75 V, IF = 350 mA 0.6 1.2 1.6 V IOH High level output current High-level VCC = 4.75 V,, VIL = 0.8 V, VIH = 2 V,, VOH = 70 V 1 100 µA IIH High-level input current VCC = 5.25 V, VI = 5.25 V 0.01 10 µA IIL Low level input current Low-level 25 V VCC = 5 5.25 V, 8V VI = 0 0.8 – 0.5 – 10 –1 – 20 ICCH Supply current, current outputs high VCC = 5 5.25 25 V VI = 5 V VI = 0 11 18 11 18 ICCL Supply current, current outputs low VCC = 5 5.25 25 V VI = 0 VI = 5 V 11 18 11 18 TYP MAX UNIT 300 750 ns 200 500 ns 50 100 ns 50 100 ns A input S input SN75446 SN75447 SN75446 SN75447 µA mA mA † All typical values are at VCC = 5 V, TA = 25°C. switching characteristics, VCC = 5 V, TA = 25°C PARAMETER TEST CONDITIONS tPLH tPHL Propagation delay time, low-to-high-level output tTLH tTHL Transition time, low-to-high-level output VOH High level output voltage after switching High-level Propagation delay time, high-to-low-level output CL = 15 pF,, See Figure 1 RL = 100 Ω,, Transition time, high-to-low-level output VS = 55 V, See Figure 2 POST OFFICE BOX 655303 MIN IO [ 300 mA, • DALLAS, TEXAS 75265 018 VS – 0 0.018 V 3–3 SN75446, SN75447 DUAL PERIPHERAL DRIVERS SLRS020A – DECEMBER 1978 – REVISED NOVEMBER 1995 PARAMETER MEASUREMENT INFORMATION Input VCC 2.4 V 30 V SN75446 SN75447 RL = 100 Ω A /S Pulse Generator (see Note A) Output Circuit Under Test S/A CL = 15 pF (see Note B) 0.4 V Open TEST CIRCUIT ≤ 5 ns ≤ 10 ns 3V 2.7 V SN75446 Input 1.5 V 2.7 V 1.5 V 0.3 V 0.3 V 0V 5 µs ≤ 5 ns ≤ 10 ns 2.7 V 1.5 V SN75447 Input 0.7 V 0.7 V tPHL 0V tPLH 90% Output 3V 2.7 V 1.5 V 90% 50% 10% 50% 10% tTHL VOH VOL tTLH VOLTAGE WAVEFORMS NOTES: A. The pulse generator has the following characteristics: PRR = 100 kHz, ZO = 50 Ω. B. CL includes probe and jig capacitance. Figure 1. Test Circuit and Voltage Waveforms, Switching Characteristics 3–4 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 SN75446, SN75447 DUAL PERIPHERAL DRIVERS SLRS020A – DECEMBER 1978 – REVISED NOVEMBER 1995 PARAMETER MEASUREMENT INFORMATION VS = 55 V 2.4 V Input 5V 2 mH SN75446 SN75447 180 Ω Pulse Generator (see Note A) A Circuit Under Test S Output CL = 15 pF (see Note B) 0.4 V GND TEST CIRCUIT ≤ 5 ns SN75446 Input ≤ 10 ns 3V 90% 1.5 V 90% 1.5 V 10 % 10% 0V 40 µs ≤ 5 ns ≤ 10 ns 90% 1.5 V SN75447 Input 3V 90% 1.5 V 10% 10% 0V VOH Output VOL VOLTAGE WAVEFORMS NOTES: A. The pulse generator has the following characteristics: PRR = 12.5 kHz, ZO = 50 Ω. B. CL includes probe and jig capacitance. Figure 2. Latch-Up Test Circuit and Voltage Waveforms POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 3–5 3–6 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 IMPORTANT NOTICE Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue any product or service without notice, and advise customers to obtain the latest version of relevant information to verify, before placing orders, that information being relied on is current and complete. All products are sold subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those pertaining to warranty, patent infringement, and limitation of liability. TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent TI deems necessary to support this warranty. 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