HSN-500 Nuclear Event Detector VB 8 9 Threshold Adjust VH VL 14 1 10 kΩ 2 Detector (Pin Diode) BIT 6 Amplifier NED Pulse Timer LED 7 GND 5 C 4 RC Logic Diagram DESCRIPTION: • • • • • • • • • Maxwell Technologies’ HSN-500 radiation-hardened Hybrid Nuclear Event Detector (NED) senses ionizing radiation pulses generated by a nuclear event, such as the detonation of a nuclear weapon, and rapidly switches its output from the normal high state to a low state with a propagation delay time of less than 20 ns. The active low Nuclear Event Detection signal (NED) is used to initiate a wide variety of circumvention functions, thus preventing upset and burnout of electronic components. The NED output is also used to initiate both hardware and software recovery. This high-speed, 14-pin hybrid detector is used in electronic systems as a general-purpose circumvention device to protect memory, stop data processing, and drive power supply switches as well as signal clamps. Detects ionizing radiation pulses Tested/certified detection threshold level Adjustable circumvention period 100% testable with built-in test Detection threshold adjustability Single +5V operation Designed-in radiation hardness Compliant to MIL-PRF-38534 Class H1 Flat pack (F) or DIP (L) packages RADIATION HARDNESS CHARACTERISTICS • • • • • Dose Rate (operate-through): 1 x 1012 rad(Si)/sec Total Dose: 1 x 106 rad(Si) Neutron Fluence: 5 x 1013 n/cm2 Approximate Detection Range: 2 x 105 - 2 x 107 rad(Si)/sec Maxwell Technologies Specified, Controlled, and Tested The HSN-500 is designed to operate through three critical environments: ionizing dose rate [1012 rad(Si)/s], gamma total dose [106 rad(Si)], and neutron fluence [5 x 1013 n/cm2]. In addition, the device is designed to function throughout the transient neutron pulse. The hybrid’s discrete design ensures a controlled response in these radiation environments as well as immunity to latchup. The detection level and functionality of a sample of each HSN500 production lot are tested in an ionizing dose rate environment. A certificate is provided reporting the test results for the production lot. The detection threshold of the HSN-500 is adjustable within the range of 2 x 105 rad(Si)/s to 2 x 107 rad(Si)/s. This detection level can be preset by Maxwell or adjusted by the user. Less than a 30% variation in detection threshold can be expected over the entire operating temperature range. 1. Manufactured for Maxwell Technologies by Teledyne Micoelectronic Technologies to MIL-PRF-38534, Class H, no RHA 01.7.05 Rev 3 (858) 503-3300 - Fax: (858) 503-3301 - www.maxwell.com All data sheets are subject to change without notice 1 ©2005 Maxwell Technologies All rights reserved. Memory FEATURES: HSN-500 Nuclear Event Detector TABLE 1. PIN DESCRIPTION PIN NUMBER PIN FUNCTION Load Voltage, VL 2 Nuclear Event Detector, NED 3 No Connection 4 External Capacitor 5 External Capacitor 6 Built In Test, BIT 7 Package Ground and Case 8 PIN Diode Bias, VB 9 Threshold Adjust 10 No Connection 11 No Connection 12 No Connection 13 No Connection 14 Hardened Supply Voltage, VH Memory 1 TABLE 2. ELECTRICAL CHARACTERISTICS PARAMETER SYMBOL CONDITIONS < TA < 125° C MIN MAX UNIT GROUP A SUBGROUP 4.5 5.5 V 1,2,3 -30 120 mA 1,2,3 ---- 20 V 1,2,3 --- 100 2.25 µA mA -55° C Hardened Supply Voltage VH Hardened Supply Current - Standby 1 - Operational 2 IH Load Voltage VL Load Current - Standby 1 - Operational 2 IL VH = 5.5V VL = 20V 1,2,3 PIN Diode Bias Voltage - Standby 1 VB 4.5 20 V 1,2,3 1 IB -- 100 µA 1,2,3 VIL = 0.5V Pin 9 Open, VIH = 4.0V 4.0 ---10 5.5 25 0.5 10 -- V mA V µA µs 7,8 1,2,3 7,8 1,2,3 9,10,11 VL = 20V, IOH = -100 µ A IOL = 10 mA IOL = 100 mA 18.5 --- -0.6 1.0 V 1,2,3 1,2,3 -- 20 ns PIN Diode Bias Current - Standby Built-In-Test (BIT) 3,4 NED Radiation Propagation Delay Time 5 VIH IIH VIL IIL tPW VOH VOL VIH = 4.0V tD 01.07.05 Rev 3 All data sheets are subject to change without notice 2 ©2005 Maxwell Technologies All rights reserved. HSN-500 Nuclear Event Detector Table 2. Notes 1. Standby mode is the normal state of the device, defined as having the NED output (pin 2) in the “high” state. 2. Operational mode is in effect during the timeout period of the NED signal, characterized by having the NED output in the “low” state, causing the greatest current draw of the device. 3. BIT electrical characteristics are not guaranteed over the radiation range. 4. BIT may not meet specification when only a resistor is used to adjust the detection level. To use BIT in this situation, it is advised that a series resistor/capacitor combination is used. 5. Guaranteed but not tested over temperature. Time delay, tD, is measured at 50% points from the rising edge of the radiation pulse to the falling edge of the NED output at approximately 10 times the detection level. 0.600 0.015 ± 0.003 0.100 TYP 0.145 MAX TOP VIEW 0.070 ± 0.002 0.500 MIN 14 13 12 11 10 9 0.100 TYP 8 0.495 1 2 3 4 5 6 Memory 0.795 0.600 14 13 12 11 10 9 8 1 6 7 2 3 4 5 0.300 0.495 7 0.145 MAX 0.795 0.200 0.010 ± 0.002 0.016 DIA 0.020 Flatpack Hybrid Package HSN-500F DIP Hybrid Package HSN-500L All tolerances are ± 0.005 unless specified MECHANICAL DIMENSIONS Note: All dimensions in inches. 01.07.05 Rev 3 All data sheets are subject to change without notice 3 ©2005 Maxwell Technologies All rights reserved. HSN-500 Nuclear Event Detector Important Notice: The specifications presented within these data sheets represent the latest and most accurate information available to date. However, these specifications are subject to change without notice and Maxwell Technologies assumes no responsibility for the use of this information. Maxwell Technologies’ products are not authorized for use as critical components in life support devices or systems without express written approval from Maxwell Technologies. Any claim against Maxwell Technologies must be made within 90 days from the date of shipment from Maxwell Technologies. Maxwell Technologies’ liability shall be limited to replacement of defective parts. Product Ordering Options HSN-500 X Feature Option Details Package L = Dual In-line Package (DIP) F = Flat Pack Base Product Nomenclature Nuclear Event Detector 01.07.05 Rev 3 Memory Model Number All data sheets are subject to change without notice 4 ©2005 Maxwell Technologies All rights reserved.