HSN-1000 - Designed In Rad-Hard w/Event Flag

HSN-1000
Nuclear Event Detector
VB
8
9
Threshold
Adjust
VH
VL
14
1
10 kΩ
2
Detector
(Pin Diode)
BIT 6
Amplifier
NED
Pulse Timer
LED
7
GND
5
C
4
RC
Logic Diagram
DESCRIPTION:
•
•
•
•
•
•
•
•
•
Maxwell Technologies’ HSN-1000 radiation-hardened Hybrid
Nuclear Event Detector (NED) senses ionizing radiation pulses
generated by a nuclear event, such as the detonation of a nuclear
weapon, and rapidly switches its output from the normal high
state to a low state with a propagation delay time of less than
20ns. The active low Nuclear Event Detection signal (NED) is
used to initiate a wide variety of circumvention functions, thus
preventing upset and burnout of electronic components. The NED
output is also used to initiate both hardware and software recovery. This high-speed, 14-pin hybrid detector is used in electronic
systems as a general-purpose circumvention device to protect
memory, stop data processing, and drive power supply switches
as well as signal clamps.
Detects ionizing radiation pulses
100% tested/certified detection threshold level
Adjustable circumvention period
100% testable with built-in test
Detection threshold adjustability
Single +5V operation
Radiation hardness guaranteed
Compliant to MIL-PRF-38534 Class H1
Flat pack (F) or DIP (L) packages
RADIATION HARDNESS
CHARACTERISTICS:
•
•
•
•
•
Dose Rate (operate-through): 1 x 1012 rad(Si)/sec
Total Dose: 1 x 106 rad(Si)
Neutron Fluence: 5 x 1013 n/cm2
Approximate Detection Range: 2 x 105 - 2 x 107 rad(Si)/sec
Maxwell Technologies Specified, Controlled, Tested and
Guaranteed
The HSN-1000 is guaranteed to operate through three critical
environments: ionizing dose rate [1012 rad(Si)/s], gamma total
dose [106 rad(Si)], and neutron fluence [5 x 1013 n/cm2]. In addition, the device is designed to function throughout the transient
neutron pulse. The hybrid’s discrete design ensures a controlled
response in these radiation environments as well as immunity to
latchup. Each HSN-1000’s detection level and functionality are
tested in an ionizing dose rate environment. A certificate is provided with each serialized hybrid, reporting the radiation test
results and guaranteeing its performance. The device is also lot
qualified in the total dose and neutron environments to ensure
performance.
The detection threshold of the HSN-1000 is adjustable within the
range of 2 x 105 rad(Si)/s to 2 x 107 rad(Si)/s. This detection level
can be preset by Maxwell or adjusted by the user. Less than a
30% variation in detection threshold can be expected over the
entire operating temperature range.
1.
Manufactured for Maxwell Technologies by Teledyne Microelectronic
Technologies to MIL-PRF-38534, Class H, no RHA
(858) 503-3300 - Fax: (858) 503-3301 - www.maxwell.com
01.07.05 Rev 3
All data sheets are subject to change without notice
1
©2005 Maxwell Technologies
All rights reserved.
Memory
FEATURES:
HSN-1000
Nuclear Event Detector
TABLE 1. PIN DESCRIPTION
PIN NUMBER PIN FUNCTION
Load Voltage, VL
2
Nuclear Event Detector, NED
3
No Connection
4
External Capacitor
5
External Capacitor
6
Built In Test, BIT
7
Package Ground and Case
8
PIN Diode Bias, VB
9
Threshold Adjust
10
No Connection
11
No Connection
12
No Connection
13
No Connection
14
Hardened Supply Voltage, VH
Memory
1
TABLE 2. ELECTRICAL CHARACTERISTICS
PARAMETER
SYMBOL
Hardened Supply Voltage
VH
Hardened Supply Current
- Standby 1
- Operational 2
IH
Load Voltage
VL
Load Current
- Standby 1
- Operational 2
IL
CONDITIONS
-55° C < TA < 125° C
MIN
MAX
UNIT
GROUP A
SUBGROUP
4.5
5.5
V
1,2,3
-30
120
mA
1,2,3
----
20
V
1,2,3
---
100
2.25
µA
mA
VH = 5.5V
VL = 20V
1,2,3
PIN Diode Bias Voltage - Standby 1
VB
4.5
20
V
1,2,3
1
IB
--
100
µA
1,2,3
VIL = 0.5V
Pin 9 Open, VIH = 4.0V
4.0
---10
5.5
25
0.5
10
--
V
mA
V
µA
µs
7,8
1,2,3
7,8
1,2,3
9,10,11
VL = 20V, IOH = -100 µ A
IOL = 10 mA
IOL = 100 mA
18.5
---
-0.6
1.0
V
1,2,3
1,2,3
--
20
ns
PIN Diode Bias Current - Standby
Built-In-Test (BIT)
3,4
NED
Radiation Propagation Delay Time 5
VIH
IIH
VIL
IIL
tPW
VOH
VOL
VIH = 4.0V
tD
01.07.05 Rev 3
All data sheets are subject to change without notice
2
©2005 Maxwell Technologies
All rights reserved.
HSN-1000
Nuclear Event Detector
Table 2. Notes
1. Standby mode is the normal state of the device, defined as having the NED output (pin 2) in the “high” state.
2. Operational mode is in effect during the timeout period of the NED signal, characterized by having the NED output in the “low”
state, causing the greatest current draw of the device.
3. BIT electrical characteristics are not guaranteed over the radiation range.
4. BIT may not meet specification when only a resistor is used to adjust the detection level. To use BIT in this situation, it is
advised that a series resistor/capacitor combination is used.
5. Guaranteed but not tested over temperature. Time delay, tD, is measured at 50% points from the rising edge of the radiation
pulse to the falling edge of the NED output at approximately 10 times the detection level.
0.600
0.015 ± 0.003
0.100
TYP
0.145 MAX
TOP VIEW
0.070 ± 0.002
0.795
0.600
0.500
MIN
9
8
0.495
1
2
3
4
5
6
Memory
14 13 12 11 10
0.100 TYP
14 13 12 11 10
9
8
1
6
7
2
3
4
5
0.300
0.495
7
0.145 MAX
0.795
0.200
0.010 ± 0.002
0.016
DIA
0.020
Flatpack Hybrid Package
HSN-1000F
DIP Hybrid Package
HSN-1000L
All tolerances are ± 0.005 unless specified
MECHANICAL DIMENSIONS
Note: All dimensions in inches.
01.07.05 Rev 3
All data sheets are subject to change without notice
3
©2005 Maxwell Technologies
All rights reserved.
HSN-1000
Nuclear Event Detector
Important Notice:
The specifications presented within these data sheets represent the latest and most accurate information available to
date. However, these specifications are subject to change without notice and Maxwell Technologies assumes no
responsibility for the use of this information.
Maxwell Technologies’ products are not authorized for use as critical components in life support devices or systems
without express written approval from Maxwell Technologies.
Any claim against Maxwell Technologies must be made within 90 days from the date of shipment from Maxwell Technologies. Maxwell Technologies’ liability shall be limited to replacement of defective parts.
Product Ordering Options
HSN-1000
X
Feature
Option Details
Package
L = Dual In-line Package (DIP)
F = Flat Pack
Base Product
Nomenclature
Nuclear Event Detector
01.07.05 Rev 3
Memory
Model Number
All data sheets are subject to change without notice
4
©2005 Maxwell Technologies
All rights reserved.