MX29F4000 AUTOMATIC PROGRAMMING AUTOMATIC ERASE ALGORITHM The MX29F4000 is byte programmable using the Automatic Programming algorithm. The Automatic Programming algorithm makes the external system do not need to have time out sequence nor to verify the data programmed. The typical chip programming time at room temperature of the MX29F4000 is less than 4 seconds. MXIC's Automatic Erase algorithm requires the user to write commands to the command register using standard microprocessor write timings. The device will automatically pre-program and verify the entire array. Then the device automatically times the erase pulse width, provides the erase verification, and counts the number of sequences. A status bit toggling between consecutive read cycles provides feedback to the user as to the status of the programming operation. AUTOMATIC CHIP ERASE The entire chip is bulk erased using 10 ms erase pulses according to MXIC's Automatic Chip Erase algorithm. Typical erasure at room temperature is accomplished in less than 4 second. The Automatic Erase algorithm automatically programs the entire array prior to electrical erase. The timing and verification of electrical erase are controlled internally within the device. Register contents serve as inputs to an internal statemachine which controls the erase and programming circuitry. During write cycles, the command register internally latches address and data needed for the programming and erase operations. During a system write cycle, addresses are latched on the falling edge of WE or CE, whichever happeds later, and data are latched on the rising edge of WE or CE, whichever happeds first. AUTOMATIC SECTOR ERASE MXIC's Flash technology combines years of EPROM experience to produce the highest levels of quality, reliability, and cost effectiveness. The MX29F4000 electrically erases all bits simultaneously using FowlerNordheim tunneling. The bytes are programmed by using the EPROM programming mechanism of hot electron injection. The MX29F4000 is sector(s) erasable using MXIC's Auto Sector Erase algorithm. Sector erase modes allow sectors of the array to be erased in one erase cycle. The Automatic Sector Erase algorithm automatically programs the specified sector(s) prior to electrical erase. The timing and verification of electrical erase are controlled internally within the device. During a program cycle, the state-machine will control the program sequences and command register will not respond to any command set. During a Sector Erase cycle, the command register will only respond to Erase Suspend command. After Erase Suspend is completed, the device stays in read mode. After the state machine has completed its task, it will allow the command register to respond to its full command set. AUTOMATIC PROGRAMMING ALGORITHM MXIC's Automatic Programming algorithm require the user to only write program set-up commands (including 2 unlock write cycle and A0H) and a program command (program data and address). The device automatically times the programming pulse width, provides the program verification, and counts the number of sequences. A status bit similar to DATA polling and a status bit toggling between consecutive read cycles, provide feedback to the user as to the status of the programming operation. P/N:PM0629 REV. 1.0, DEC. 20, 1999 4 MX29F4000 TABLE1. SOFTWARE COMMAND DEFINITIONS Command First Bus Second Bus Third Bus Fourth Bus Fifth Bus Sixth Bus Bus Cycle Cycle Cycle Cycle Cycle Cycle Cycle Addr Data Addr Data Addr Data Addr Data 90H ADI DDI Addr Data Addr Data Reset 1 XXXH F0H Read 1 RA RD Read Silicon ID 4 555H AAH 2AAH 55H 555H Sector Protect Verify 4 555H AAH 2AAH 55H 555H 90H (SA)X 00H 02 01H Porgram 4 555H AAH 2AAH 55H 555H A0H PA PD Chip Erase 6 555H AAH 2AAH 55H 555H 80H 555H AAH 2AAH 55H 555H 10H Sector Erase 6 555H AAH 2AAH 55H 555H 80H 555H AAH 2AAH 55H SA Sector Erase Suspend 1 XXXH B0H Sector Erase Resume 1 XXXH 30H Unlock for sector 6 555H AAH 2AAH 55H 555H 80H 555H AAH 2AAH 55H 555H 20H 30H protect/unprotect Note: 1. ADI = Address of Device identifier; A1=0, A0 = 0 for manufacture code,A1=0, A0 = 1 for device code A2-A18=Do not care. (Refer to table 3) DDI = Data of Device identifier : C2H for manufacture code, 99H for device code. X = X can be VIL or VIH RA=Address of memory location to be read. RD=Data to be read at location RA. 2.PA = Address of memory location to be programmed. PD = Data to be programmed at location PA. SA = Address to the sector to be erased. 3.The system should generate the following address patterns: 555H or 2AAH to Address A10~A0 . Address bit A11~A18=X=Don't care for all address commands except for Program Address (PA) and Sector Address (SA). Write Sequence may be initiated with A11~A18 in either state. 4.For Sector Protect Verify Operation : If read out data is 01H, it means the sector has been protected.If read out data is 00H,it means the sector is still not being protected. COMMAND DEFINITIONS Device operations are selected by writing specific address and data sequences into the command register. Writing incorrect address and data values or writing them in the improper sequence will reset the device to the read mode. Table 1 defines the valid register command sequences. Note that the Erase Suspend (B0H) and Erase Resume (30H) commands are valid only while the Sector Erase operation is in progress. Either of the two reset command sequences will reset the device(when applicable). P/N:PM0629 REV. 1.0, DEC. 20, 1999 5 MX29F4000 TABLE 2. MX29F4000 BUS OPERATION Mode Pins CE OE WE A0 A1 A6 A9 Q0 ~ Q7 L L H L L X VID(2) C2H L L H H L X VID(2) 99H Read L L H A0 A1 A6 A9 DOUT Standby H X X X X X X HIGH Z Output Disable L H H X X X X HIGH Z Write L H L A0 A1 A6 A9 DIN(3) Sector Protect with 12V L VID(2) L X X L VID(2) X L VID(2) L X X H VID(2) X L L H X H X VID(2) Code(5) L H L X X L H X L H L X X H H X L L H X H X H Code(5) X X X X X X X HIGH Z Read Silicon ID Manfacturer Code(1) Read Silicon ID Device Code(1) system(6) Chip Unprotect with 12V system(6) Verify Sector Protect with 12V system Sector Protect without 12V system (6) Chip Unprotect without 12V system (6) Verify Sector Protect/Unprotect without 12V system (7) Reset NOTES: 1. Manufacturer and device codes may also be accessed via a command register write sequence. Refer to Table 1. 2. VID is the Silicon-ID-Read high voltage, 11.5V to 12.5V. 3. Refer to Table 1 for valid Data-In during a write operation. 4. X can be VIL or VIH. 5. Code=00H means unprotected. Code=01H means protected. A18~A16=Sector address for sector protect. 6. Refer to sector protect/unprotect algorithm and waveform. Must issue "unlock for sector protect/unprotect" command before "sector protect/unprotect without 12V system" command. 7. The "verify sector protect/unprotect without 12V sysytem" is only following "Sector protect/unprotect without 12V system" command. P/N:PM0629 REV. 1.0, DEC. 20, 1999 6 MX29F4000 READ/RESET COMMAND SET-UP AUTOMATIC CHIP/SECTOR ERASE The read or reset operation is initiated by writing the read/reset command sequence into the command register. Microprocessor read cycles retrieve array data. The device remains enabled for reads until the command register contents are altered. Chip erase is a six-bus cycle operation. There are two "unlock" write cycles. These are followed by writing the "set-up" command 80H. Two more "unlock" write cycles are then followed by the chip erase command 10H. The Automatic Chip Erase does not require the device to be entirely pre-programmed prior to executing the Automatic Chip Erase. Upon executing the Automatic Chip Erase, the device will automatically program and verify the entire memory for an all-zero data pattern. When the device is automatically verified to contain an all-zero pattern, a self-timed chip erase and verify begin. The erase and verify operations are completed when the data on Q7 is "1" at which time the device returns to the Read mode. The system is not required to provide any control or timing during these operations. If program-fail or erase-fail happen, the write of F0H will reset the device to abort the operation. A valid command must then be written to place the device in the desired state. SILICON-ID-READ COMMAND Flash memories are intended for use in applications where the local CPU alters memory contents. As such, manufacturer and device codes must be accessible while the device resides in the target system. PROM programmers typically access signature codes by raising A9 to a high voltage. However, multiplexing high voltage onto address lines is not generally desired system design practice. When using the Automatic Chip Erase algorithm, note that the erase automatically terminates when adequate erase margin has been achieved for the memory array(no erase verification command is required). The MX29F4000 contains a Silicon-ID-Read operation to supplement traditional PROM programming methodology. The operation is initiated by writing the read silicon ID command sequence into the command register. Following the command write, a read cycle with A1=VIL,A0=VIL retrieves the manufacturer code of C2H. A read cycle with A1=VIL, A0=VIH returns the device code of 99H for MX29F4000. If the Erase operation was unsuccessful, the data on Q5 is "1"(see Table 4), indicating the erase operation exceed internal timing limit. The automatic erase begins on the rising edge of the last WE or CE, whichever happeds first pulse in the command sequence and terminates when the data on Q7 is "1" and the data on Q6 stops toggling for two consecutive read cycles, at which time the device returns to the Read mode. TABLE 3. EXPANDED SILICON ID CODE Pins A0 A1 Q7 Q6 Q5 Q4 Q3 Q2 Q1 Q0 Code(Hex) Manufacture code VIL VIL 1 1 0 0 0 0 1 0 C2H Device code for MX29F4000 VIH VIL 1 0 1 0 0 0 1 1 99H Sector Protection Verification X VIH 0 0 0 0 0 0 0 1 01H(Protected) X VIH 0 0 0 0 0 0 0 0 00H(Unprotected) P/N:PM0629 REV. 1.0, DEC. 20, 1999 7 MX29F4000 SECTOR ERASE COMMANDS memory array (no erase verification command is required). Sector erase is a six-bus cycle operation. There are two "unlock" write cycles. These are followed by writing the set-up command 80H. Two more "unlock" write cycles are then followed by the sector erase command 30H. The sector address is latched on the falling edge of WE or CE, whichever happeds later, while the command(data) is latched on the rising edge of WE or CE, whichever happeds first. Sector addresses selected are loaded into internal register on the sixth falling edge of WE or CE, whichever happeds later. Each successive sector load cycle started by the falling edge of WE or CE, whichever happeds later must begin within 30us from the rising edge of the preceding WE or CE, whichever happeds first. Otherwise, the loading period ends and internal auto sector erase cycle starts. (Monitor Q3 to determine if the sector erase timer window is still open, see section Q3, Sector Erase Timer.) Any command other than Sector Erase(30H) or Erase Suspend(B0H) during the time-out period resets the device to read mode. The Automatic Sector Erase does not require the device to be entirely pre-programmed prior to executing the Automatic Set-up Sector Erase command and Automatic Sector Erase command. Upon executing the Automatic Sector Erase command, the device will automatically program and verify the sector(s) memory for an all-zero data pattern. The system is not required to provide any control or timing during these operations. When the sector(s) is automatically verified to contain an all-zero pattern, a self-timed sector erase and verify begin. The erase and verify operations are complete when the data on Q7 is "1" and the data on Q6 stops toggling for two consecutive read cycles, at which time the device returns to the Read mode. The system is not required to provide any control or timing during these operations. When using the Automatic Sector Erase algorithm, note that the erase automatically terminates when adequate erase margin has been achieved for the Table 4. Write Operation Status Status Q7 Q6 Note1 Byte Program in Auto Program Algorithm Auto Erase Algorithm Erase Suspend Read In Progress Erase Suspend Read Q3 Q2 N/A No Toggle Note2 Q7 Toggle 0 0 Toggle 0 1 Toggle 1 No 0 N/A Toggle (Erase Suspended Sector) Erase Suspended Mode Q5 Toggle Data Data Data Data Data Q7 Toggle 0 N/A N/A Q7 Toggle 1 N/A No Toggle 0 Toggle 1 1 Toggle Q7 Toggle 1 N/A N/A (Non-Erase Suspended Sector) Erase Suspend Program Byte Program in Auto Program Algorithm Exceeded Auto Erase Algorithm Time Limits Erase Suspend Program Note: 1. Q7 and Q2 require a valid address when reading status information. Refer to the appropriate subsection for further details. 2. Q5 switches to '1' when an Auto Program or Auto Erase operation has exceeded the maximum timing limits. See "Q5:Exceeded Timing Limits " for more information. P/N:PM0629 REV. 1.0, DEC. 20, 1999 8 MX29F4000 ERASE SUSPEND If the program opetation was unsuccessful, the data on Q5 is "1"(see Table 4), indicating the program operation exceed internal timing limit. The automatic programming operation is completed when the data read on Q6 stops toggling for two consecutive read cycles and the data on Q7 and Q6 are equivalent to data written to these two bits, at which time the device returns to the Read mode(no program verify command is required). This command only has meaning while the state machine is executing Automatic Sector Erase operation, and therefore will only be responded during Automatic Sector Erase operation. However, When the Erase Suspend command is written during the sector erase time-out, the device immediately terminates the time-out period and suspends the erase operation. After this command has been executed, the command register will initiate erase suspend mode. The state machine will return to read mode automatically after suspend is ready. At this time, state machine only allows the command register to respond to the Read Memory Array, Erase Resume and program commands. DATA POLLING-Q7 The MX29F4000 also features Data Polling as a method to indicate to the host system that the Automatic Program or Erase algorithms are either in progress or completed. While the Automatic Programming algorithm is in operation, an attempt to read the device will produce the complement data of the data last written to Q7. Upon completion of the Automatic Program Algorithm an attempt to read the device will produce the true data last written to Q7. The Data Polling feature is valid after the rising edge of the fourth WE or CE, whichever happeds first pulse of the four write pulse sequences for automatic program. The system can determine the status of the program operation using the Q7 or Q6 status bits, just as in the standard program operation. After an erase-suspend program operation is complete, the system can once again read array data within non-suspended sectors. ERASE RESUME This command will cause the command register to clear the suspend state and return back to Sector Erase mode but only if an Erase Suspend command was previously issued. Erase Resume will not have any effect in all other conditions.Another Erase Suspend command can be written after the chip has resumed erasing. While the Automatic Erase algorithm is in operation, Q7 will read "0" until the erase operation is competed. Upon completion of the erase operation, the data on Q7 will read "1". The Data Polling feature is valid after the rising edge of the sixth WE or CE, whichever happeds first pulse of six write pulse sequences for automatic chip/ sector erase. SET-UP AUTOMATIC PROGRAM COMMANDS The Data Polling feature is active during Automatic Program/Erase algorithm or sector erase time-out.(see section Q3 Sector Erase Timer) To initiate Automatic Program mode, A three-cycle command sequence is required. There are two "unlock" write cycles. These are followed by writing the Automatic Program command A0H. Once the Automatic Program command is initiated, the next WE or CE pulse causes a transition to an active programming operation. Addresses are latched on the falling edge, and data are internally latched on the rising edge of the WE or CE, whichever happeds first pulse. The rising edge of WE or CE, whichever happeds first also begins the programming operation. The system is not required to provide further controls or timings. The device will automatically provide an adequate internally generated program pulse and verify margin. P/N:PM0629 REV. 1.0, DEC. 20, 1999 9 MX29F4000 Q6:Toggle BIT I Q2 toggles when the system reads at addresses within those sectors that have been selected for erasure. (The system may use either OE or CE to control the read cycles.) But Q2 cannot distinguish whether the sector is actively erasing or is erase-suspended. Q6, by comparison, indicates whether the device is actively erasing, or is in Erase Suspend, but cannot distinguish which sectors are selected for erasure. Thus, both status bits are required for sectors and mode information. Refer to Table 4 to compare outputs for Q2 and Q6. Toggle Bit I on Q6 indicates whether an Automatic Program or Erase algorithm is in progress or complete, or whether the device has entered the Erase Suspend mode. Toggle Bit I may be read at any address, and is valid after the rising edge of the final WE or CE, whichever happeds first pulse in the command sequence(prior to the program or erase operation), and during the sector timeout. During an Automatic Program or Erase algorithm operation, successive read cycles to any address cause Q6 to toggle. The system may use either OE or CE to control the read cycles. When the operation is complete, Q6 stops toggling. Reading Toggle Bits Q6/ Q2 Whenever the system initially begins reading toggle bit status, it must read Q7-Q0 at least twice in a row to determine whether a toggle bit is toggling. Typically, the system would note and store the value of the toggle bit after the first read. After the second read, the system would compare the new value of the toggle bit with the first. If the toggle bit is not toggling, the device has completed the program or erase operation. The system can read array data on Q7-Q0 on the following read cycle. After an erase command sequence is written, if all sectors selected for erasing are protected, Q6 toggles and returns to reading array data. If not all selected sectors are protected, the Automatic Erase algorithm erases the unprotected sectors, and ignores the selected sectors that are protected. The system can use Q6 and Q2 together to determine whether a sector is actively erasing or is erase suspended. When the device is actively erasing (that is, the Automatic Erase algorithm is in progress), Q6 toggling. When the device enters the Erase Suspend mode, Q6 stops toggling. However, the system must also use Q2 to determine which sectors are erasing or erase-suspended. Alternatively, the system can use Q7. However, if after the initial two read cycles, the system determines that the toggle bit is still toggling, the system also should note whether the value of Q5 is high (see the section on Q5). If it is, the system should then determine again whether the toggle bit is toggling, since the toggle bit may have stopped toggling just as Q5 went high. If the toggle bit is no longer toggling, the device has successfuly completed the program or erase operation. If it is still toggling, the device did not complete the operation successfully, and the system must write the reset command to return to reading array data. If a program address falls within a protected sector, Q6 toggles for approximately 2us after the program command sequence is written, then returns to reading array data. The remaining scenario is that system initially determines that the toggle bit is toggling and Q5 has not gone high. The system may continue to monitor the toggle bit and Q5 through successive read cycles, determining the status as described in the previous paragraph. Alternatively, it may choose to perform other system tasks. In this case, the system must start at the beginning of the algorithm when it returns to determine the status of the operation. Q6 also toggles during the erase-suspend-program mode, and stops toggling once the Automatic Program algorithm is complete. Table 4 shows the outputs for Toggle Bit I on Q6. Q2:Toggle Bit II The "Toggle Bit II" on Q2, when used with Q6, indicates whether a particular sector is actively eraseing (that is, the Automatic Erase alorithm is in process), or whether that sector is erase-suspended. Toggle Bit I is valid after the rising edge of the final WE or CE, whichever happeds first pulse in the command sequence. P/N:PM0629 REV. 1.0, DEC. 20, 1999 10 MX29F4000 with its control register architecture, alteration of the memory contents only occurs after successful completion of specific command sequences. The device also incorporates several features to prevent inadvertent write cycles resulting from VCC power-up and powerdown transition or system noise. Q5 Exceeded Timing Limits Q5 will indicate if the program or erase time has exceeded the specified limits(internal pulse count). Under these conditions Q5 will produce a "1". This time-out condition indicates that the program or erase cycle was not successfully completed. Data Polling and Toggle Bit are the only operating functions of the device under this condition. Q3 Sector Erase Timer After the completion of the initial sector erase command sequence, the sector erase time-out will begin. Q3 will remain low until the time-out is complete. Data Polling and Toggle Bit are valid after the initial sector erase command sequence. If this time-out condition occurs during sector erase operation, it specifies that a particular sector is bad and it may not be reused. However, other sectors are still functional and may be used for the program or erase operation. The device must be reset to use other sectors. Write the Reset command sequence to the device, and then execute program or erase command sequence. This allows the system to continue to use the other active sectors in the device. If Data Polling or the Toggle Bit indicates the device has been written with a valid erase command, Q3 may be used to determine if the sector erase timer window is still open. If Q3 is high ("1") the internally controlled erase cycle has begun; attempts to write subsequent commands to the device will be ignored until the erase operation is completed as indicated by Data Polling or Toggle Bit. If Q3 is low ("0"), the device will accept additional sector erase commands. To insure the command has been accepted, the system software should check the status of Q3 prior to and following each subsequent sector erase command. If Q3 were high on the second status check, the command may not have been accepted. If this time-out condition occurs during the chip erase operation, it specifies that the entire chip is bad or combination of sectors are bad. If this time-out condition occurs during the byte programming operation, it specifies that the entire sector containing that byte is bad and this sector maynot be reused, (other sectors are still functional and can be reused). WRITE PULSE "GLITCH" PROTECTION The time-out condition may also appear if a user tries to program a non blank location without erasing. In this case the device locks out and never completes the Automatic Algorithm operation. Hence, the system never reads a valid data on Q7 bit and Q6 never stops toggling. Once the Device has exceeded timing limits, the Q5 bit will indicate a "1". Please note that this is not a device failure condition since the device was incorrectly used. Noise pulses of less than 5ns(typical) on CE or WE will not initiate a write cycle. LOGICAL INHIBIT Writing is inhibited by holding any one of OE = VIL, CE = VIH or WE = VIH. To initiate a write cycle CE and WE must be a logical zero while OE is a logical one. DATA PROTECTION POWER SUPPLY DECOUPLING The MX29F4000 is designed to offer protection against accidental erasure or programming caused by spurious system level signals that may exist during power transition. During power up the device automatically resets the state machine in the Read mode. In addition, In order to reduce power switching effect, each device should have a 0.1uF ceramic capacitor connected between its VCC and GND. P/N:PM0629 REV. 1.0, DEC. 20, 1999 11 MX29F4000 SECTOR PROTECTION WITH 12V SYSTEM It is also possible to determine if the chip is unprotected in the system by writing the Read Silicon ID command. Performing a read operation with A1=VIH, it will produce 00H at data outputs(Q0-Q7) for an unprotected sector. It is noted that all sectors are unprotected after the chip unprotect algorithm is completed. The MX29F4000 features sector protection. This feature will disable both program and erase operations for these sectors protected. To activate this mode, the programming equipment must force VID on address pin A9 and control pin OE, (suggest VID = 12V) A6 = VIL and CE = VIL.(see Table 2) Programming of the protection circuitry begins on the falling edge of the WE or CE, whichever happeds later pulse and is terminated on the rising edge. Please refer to sector protect algorithm and waveform. POWER-UP SEQUENCE The MX29F4000 powers up in the Read only mode. In addition, the memory contents may only be altered after successful completion of the predefined command sequences. To verify programming of the protection circuitry, the programming equipment must force VID on address pin A9 ( with CE and OE at VIL and WE at VIH). When A1=1, it will produce a logical "1" code at device output Q0 for a protected sector. Otherwise the device will produce 00H for the unprotected sector. In this mode, the addresses, except for A1, are don't care. Address locations with A1 = VIL are reserved to read manufacturer and device codes.(Read Silicon ID) SECTOR PROTECTION WITHOUT 12V SYSTEM The MX29F4000 also feature a sector protection method in a system without 12V power suppply. The programming equipment do not need to supply 12 volts to protect sectors. The details are shown in sector protect algorithm and waveform. It is also possible to determine if the sector is protected in the system by writing a Read Silicon ID command. Performing a read operation with A1=VIH, it will produce a logical "1" at Q0 for the protected sector. CHIP UNPROTECT WITHOUT 12V SYSTEM CHIP UNPROTECT WITH 12V SYSTEM The MX29F4000 also feature a chip unprotection method in a system without 12V power supply. The programming equipment do not need to supply 12 volts to unprotect all sectors. The details are shown in chip unprotect algorithm and waveform. The MX29F4000 also features the chip unprotect mode, so that all sectors are unprotected after chip unprotect is completed to incorporate any changes in the code. It is recommended to protect all sectors before activating chip unprotect mode. To activate this mode, the programming equipment must force VID on control pin OE and address pin A9. The CE pins must be set at VIL. Pins A6 must be set to VIH.(see Table 2) Refer to chip unprotect algorithm and waveform for the chip unprotect algorithm. The unprotection mechanism begins on the falling edge of the WE or CE, whichever happeds later, pulse and is terminated on the rising edge. P/N:PM0629 REV. 1.0, DEC. 20, 1999 12 MX29F4000 CAPACITANCE (TA = 25oC, f = 1.0 MHz) SYMBOL PARAMETER CIN1 MIN. TYP MAX. UNIT CONDITIONS Input Capacitance 8 pF VIN = 0V CIN2 Control Pin Capacitance 12 pF VIN = 0V COUT Output Capacitance 12 pF VOUT = 0V READ OPERATION DC CHARACTERISTICS (TA = 0° C TO 70° C, VCC = 5V±10%) SYMBOL PARAMETER MIN. TYP MAX. UNIT CONDITIONS ILI Input Leakage Current 1 uA VIN = GND to VCC ILO Output Leakage Current 10 uA VOUT = GND to VCC ISB1 Standby VCC current 1 mA CE = VIH 5 uA CE = VCC + 0.3V ISB2 1 ICC1 Operating VCC current ICC2 30 mA IOUT = 0mA, f=5MH 50 mA IOUT = 0mA, f=10MHz VIL Input Low Voltage -0.3(NOTE 1) 0.8 V VIH Input High Voltage 2.0 VCC + 0.3 V 0.45 VOL Output Low Voltage V IOL = 2.1mA VOH1 Output High Voltage(TTL) 2.4 V IOH = -2mA VOH2 Output High Voltage(CMOS) VCC-0.4 V IOH = -100uA,VCC=VCC MIN NOTES: 1. VIL min. = -1.0V for pulse width is equal to or less than 50 ns. 2. VIH max. = VCC + 1.5V for pulse width is equal to or less VIL min. = -2.0V for pulse width is equal to or less than 20 ns. than 20 ns. If VIH is over the specified maximum value, read operation cannot be guaranteed. ±10%) AC CHARACTERISTICS (TA = 0oC to 70oC, VCC = 5V± 29F4000-55(note2) 29F4000-70 Symbol PARAMETER MIN. MAX. 29F4000-90 29F4000-12 MIN. MAX. MIN. MAX. MIN. MAX. Unit Conditions tACC Address to Output Delay 55 70 90 120 ns CE=OE=VIL tCE CE to Output Delay 55 70 90 120 ns OE=VIL tOE OE to Output Delay 30 40 40 50 ns CE=VIL tDF OE High to Output Float (Note1) 0 30 40 ns CE=VIL tOH Address to Output hold ns CE=OE=VIL 0 0 30 0 0 0 40 0 0 TEST CONDITIONS: NOTE: • Input pulse levels: 0.45V/2.4V 1. tDF is defined as the time at which the output achieves the • Input rise and fall times is equal to or less than 0ns open circuit condition and data is no longer driven. • Output load: 1 TTL gate + 100pF (Including scope and jig) 2.Under condition of VCC=5V±10%,CL=50pF,VIH/VIL=3.0/ • Reference levels for measuring timing: 0.8V, 2.0V 0V,VOH/VOL=1.5/1.5V,IOL=2mA,IOH=-2mA. P/N:PM0629 REV. 1.0, DEC. 20, 1999 13 MX29F4000 ABSOLUTE MAXIMUM RATINGS RATING VALUE Ambient Operating Temperature 0oC to 70oC Storage Temperature -65oC to 125oC Applied Input Voltage -0.5V to 7.0V Applied Output Voltage -0.5V to 7.0V VCC to Ground Potential -0.5V to 7.0V A9 & OE -0.5V to 13.5V NOTICE: Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended period may affect reliability. NOTICE: Specifications contained within the following tables are subject to change. READ TIMING WAVEFORMS VIH ADD Valid Addresses VIL tCE VIH CE VIL WE VIH VIL OE VIH tACC VIL Outputs tDF tOE VOH tOH HIGH Z HIGH Z DATA Valid VOL COMMAND PROGRAMMING/DATA PROGRAMMING/ERASE OPERATION ±10%) DC CHARACTERISTICS (TA = 0oC to 70oC, VCC = 5V± SYMBOL PARAMETER ICC1 (Read) Operating VCC Current MIN. TYP MAX. UNIT CONDITIONS 30 mA IOUT=0mA, f=5MHz ICC2 50 mA IOUT=0mA, F=10MHz ICC3 (Program) 50 mA In Programming ICC4 (Erase) 50 mA In Erase mA CE=VIH, Erase Suspended ICCES VCC Erase Suspend Current 2 NOTES: 1. VIL min. = -0.6V for pulse width is equal to or less than 3. ICCES is specified with the device de-selected. If the 20ns. device is read during erase suspend mode, current draw is 2. If VIH is over the specified maximum value, programming the sum of ICCES and ICC1 or ICC2. operation cannot be guranteed. 4. All current are in RMS unless otherwise noted. P/N:PM0629 REV. 1.0, DEC. 20, 1999 14 MX29F4000 AC CHARACTERISTICS TA = 0oC to 70oC, VCC = 5V ± 10% 29F4000-55(Note2) 29F4000-70 SYMBOL PARAMETER MIN. MAX. MIN. 29F4000-90 MAX. MIN. MAX. 29F4000-12 MIN. MAX. Unit tOES OE setup time 50 50 50 50 ns tCWC Command programming cycle 70 70 90 120 ns tCEP WE programming pulse width 45 45 45 50 ns tCEPH1 WE programming pluse width High 20 20 20 20 ns tCEPH2 WE programming pluse width High 20 20 20 20 ns tAS Address setup time 0 0 0 0 ns tAH Address hold time 45 45 45 50 ns tDS Data setup time 30 30 45 50 ns tDH Data hold time 0 0 0 0 ns tCESC CE setup time before command write 0 0 0 0 ns tDF Output disable time (Note 1) tAETC Total erase time in auto chip erase 4(TYP.) tAETB Total erase time in auto sector erase 1.3(TYP.)10.4 tAVT Total programming time in auto verify 7 tBAL Sector address load time 100 100 100 100 us tCH CE Hold Time 0 0 0 0 ns 30 32 210 30 40 40 32 4(TYP.) 32 4(TYP.) 32 s 1.3(TYP.) 10.4 1.3(TYP.)10.4 1.3(TYP.)10.4 s 7 7 7 us 4(TYP.) 210 210 210 ns tCS CE setup to WE going low 0 0 0 0 ns tVLHT Voltge Transition Time 4 4 4 4 us tOESP OE Setup Time to WE Active 4 4 4 4 us tWPP1 Write pulse width for sector protect 10 10 10 10 us tWPP2 Write pulse width for sector unprotect 12 12 12 12 ms NOTES: 1. tDF defined as the time at which the output achieves the open circuit condition and data is no longer driven. 2.Under conditions of VCC=5V±10%,CL=50pF,VIH/VIL=3.0/0V,VOL/VOH=1.5/1.5, IOL=2mA,IOH=-2mA. P/N:PM0629 REV. 1.0, DEC. 20, 1999 15 MX29F4000 SWITCHING TEST CIRCUITS 1.6K ohm DEVICE UNDER +5V TEST CL 1.2K ohm DIODES=IN3064 OR EQUIVALENT CL=100pF Including jig capacitance CL= 50pF for 29F4000-55 SWITCHING TEST WAVEFORMS 2.4V 2.0V 2.0V TEST POINTS 0.8V 0.8V 0.45V INPUT OUTPUT AC TESTING: Inputs are driven at 2.4V for a logic "1" and 0.45V for a logic "0". Input pulse rise and fall times are < 20ns.(5ns for 29F4000-55) Note:VIH/VIL=3.0/0V,VOH/VOL=1.5/1.5V for 29F4000-55 COMMAND WRITE TIMING WAVEFORM VCC Addresses 5V VIH ADD Valid VIL tAH tAS WE VIH VIL tOES tCEPH1 tCEP tCWC CE VIH VIL tCS OE tCH VIH VIL tDS tDH VIH Data DIN VIL P/N:PM0629 REV. 1.0, DEC. 20, 1999 16 MX29F4000 AUTOMATIC PROGRAMMING TIMING WAVEFORM bit checking after automatic verification starts. Device outputs DATA during programming and DATA after programming on Q7.(Q6 is for toggle bit; see toggle bit, DATA polling, timing waveform) One byte data is programmed. Verify in fast algorithm and additional programming by external control are not required because these operations are executed automatically by internal control circuit. Programming completion can be verified by DATA polling and toggle AUTOMATIC PROGRAMMING TIMING WAVEFORM Vcc 5V A11~A18 A0~A10 ADD Valid 2AAH 555H tAS WE ADD Valid 555H tCWC tAH tCEPH1 tCESC tAVT CE tCEP OE tDS Q0,Q1,Q2 tDH Command In tDF Command In Command In DATA Data In DATA polling Q4(Note 1) Q7 Command In Command #AAH Command In Command In Command #55H Command #A0H DATA Data In DATA tOE (Q0~Q7) Notes: (1). Q6:Toggle bit, Q5:Timing-limit bit, Q3: Time-out bit P/N:PM0629 REV. 1.0, DEC. 20, 1999 17 MX29F4000 AUTOMATIC PROGRAMMING ALGORITHM FLOWCHART START Write Data AAH Address 555H Write Data 55H Address 2AAH Write Data A0H Address 555H Write Program Data/Address Toggle Bit Checking Q6 not Toggled NO YES Invalid Command NO Verify Byte Ok YES NO Q5 = 1 Auto Program Completed YES Reset Auto Program Exceed Timing Limit P/N:PM0629 REV. 1.0, DEC. 20, 1999 18 MX29F4000 AUTOMATIC CHIP ERASE TIMING WAVEFORM All data in chip are erased. External erase verification is not required because data is erased automatically by internal control circuit. Erasure completion can be verified by DATA polling and toggle bit checking after automatic erase starts. Device outputs 0 during erasure and 1 after erasure on Q7.(Q6 is for toggle bit; see toggle bit, DATA polling, timing waveform) AUTOMATIC CHIP ERASE TIMING WAVEFORM Vcc 5V A11~A18 A0~A10 2AAH 555H 555H 555H tAS WE 2AAH 555H tCWC tAH tCEPH1 tAETC CE tCEP OE tDS tDH Q0,Q1, Command In Command In Command In Command In Command In Command In Q4(Note 1) Q7 DATA polling Command In Command In Command In Command In Command In Command In Command #AAH Command #55H Command #80H Command #AAH Command #55H Command #10H (Q0~Q7) Notes: (1). Q6:Toggle bit, Q5:Timing-limit bit, Q3: Time-out bit, Q2: Toggle bit P/N:PM0629 REV. 1.0, DEC. 20, 1999 19 MX29F4000 AUTOMATIC CHIP ERASE ALGORITHM FLOWCHART START Write Data AAH Address 555H Write Data 55H Address 2AAH Write Data 80H Address 555H Write Data AAH Address 555H Write Data 55H Address 2AAH Write Data 10H Address 555H NO Toggle Bit Checking Q6 not Toggled YES Invalid Command NO DATA Polling Q7 = 1 YES NO Auto Chip Erase Completed Q5 = 1 Reset Auto Chip Erase Exceed Timing Limit P/N:PM0629 REV. 1.0, DEC. 20, 1999 20 MX29F4000 AUTOMATIC SECTOR ERASE TIMING WAVEFORM checking after automatic erase starts. Device outputs 0 during erasure and 1 after erasure on Q7.(Q6 is for toggle bit; see toggle bit, DATA polling, timing waveform) Sector data indicated by A16 to A18 are erased. External erase verify is not required because data are erased automatically by internal control circuit. Erasure completion can be verified by DATA polling and toggle bit AUTOMATIC SECTOR ERASE TIMING WAVEFORM Vcc 5V Sector Address0 A16-A18 A0~A10 555H 2AAH 555H 555H Sector Address1 Sector Addressn 2AAH tAS tCWC tAH WE tCEPH1 tBAL tAETB CE tCEP OE tDS tDH Q0,Q1, Command In Command In Command In Command In Command In Command In Command In Command In Q4(Note 1) Q7 DATA polling Command In Command In Command In Command In Command In Command In Command #AAH Command #55H Command #80H Command #AAH Command #55H Command #30H (Q0~Q7) Command In Command #30H Command In Command #30H Notes: (1). Q6:Toggle bit, Q5:Timing-limit bit, Q3: Time-out bit, Q2: Toggle bit P/N:PM0629 REV. 1.0, DEC. 20, 1999 21 MX29F4000 AUTOMATIC SECTOR ERASE ALGORITHM FLOWCHART START Write Data AAH Address 555H Write Data 55H Address 2AAH Write Data 80H Address 555H Write Data AAH Address 555H Write Data 55H Address 2AAH Write Data 30H Sector Address Toggle Bit Checking Q6 Toggled ? NO Invalid Command YES Load Other Sector Addrss If Necessary (Load Other Sector Address) NO Last Sector to Erase YES Time-out Bit Checking Q3=1 ? NO YES Toggle Bit Checking Q6 not Toggled NO YES Q5 = 1 DATA Polling Q7 = 1 Reset Auto Sector Erase Completed Auto Sector Erase Exceed Timing Limit P/N:PM0629 REV. 1.0, DEC. 20, 1999 22 MX29F4000 ERASE SUSPEND/ERASE RESUME FLOWCHART START Write Data B0H NO Toggle Bit checking Q6 not toggled YES Read Array or Program Reading or Programming End NO YES Write Data 30H Continue Erase Another Erase Suspend ? NO YES P/N:PM0629 REV. 1.0, DEC. 20, 1999 23 MX29F4000 TIMING WAVEFORM FOR SECTOR PROTECTION FOR SYSTEM WITH 12V A1 A6 12V 5V A9 tVLHT Verify 12V 5V OE tVLHT tVLHT tWPP 1 WE tOESP CE Data 01H F0H tOE A18-A16 Sector Address P/N:PM0629 REV. 1.0, DEC. 20, 1999 24 MX29F4000 TIMING WAVEFORM FOR CHIP UNPROTECTION FOR SYSTEM WITH 12V A1 12V 5V A9 tVLHT A6 Verify 12V 5V OE tVLHT tVLHT tWPP 2 WE tOESP CE Data 00H F0H tOE P/N:PM0629 REV. 1.0, DEC. 20, 1999 25 MX29F4000 SECTOR PROTECTION ALGORITHM FOR SYSTEM WITH 12V START Set Up Sector Addr (A18, A17, A16) PLSCNT=1 OE=VID,A9=VID,CE=VIL A6=VIL Activate WE Pulse Time Out 10us Set WE=VIH, CE=OE=VIL A9 should remain VID Read from Sector Addr=SA, A1=1 No PLSCNT=32? . No Data=01H? Yes Device Failed Protect Another Sector? Yes Remove VID from A9 Write Reset Command Sector Protection Complete P/N:PM0629 REV. 1.0, DEC. 20, 1999 26 MX29F4000 CHIP UNPROTECTION ALGORITHM FOR SYSTEM WITH 12V START Protect All Sectors PLSCNT=1 Write "unlock for sector protect/unprotect" Command (Table 1) Set OE=A9=VIH CE=VIL,A6=1 Activate WE Pulse to start Data do'nt care No Toggle bit checking Q6 not Toggled Increment PLSCNT Yes Set OE=CE=VIL A9=VIH,A1=1 Set Up First Sector Addr Read Data from Device No Data=00H? Increment No PLSCNT=1000? Sector Addr Yes No All sectors have been verified? Yes Device Failed Yes Write Reset Command Chip Unprotect Complete * It is recommended before unprotect whole chip, all sectors should be protected in advance. P/N:PM0629 REV. 1.0, DEC. 20, 1999 27 MX29F4000 TIMING WAVEFORM FOR SECTOR PROTECTION FOR SYSTEM WITHOUT 12V A1 A6 Toggle bit polling Verify 5V OE tCEP WE * See the following Note! CE Data Don't care (Note 2) 01H F0H tOE A18-A16 Sector Address Note1: Must issue "unlock for sector protect/unprotect" command before sector protection for a system without 12V provided. Note2: Except F0H P/N:PM0629 REV. 1.0, DEC. 20, 1999 28 MX29F4000 TIMING WAVEFORM FOR CHIP UNPROTECTION FOR SYSTEM WITHOUT 12V A1 A6 Toggle bit polling Verify 5V OE tCEP WE * See the following Note! CE Data Don't care (Note 2) 00H F0H tOE Note1: Must issue "unlock for sector protect/unprotect" command before sector unprotection for a system without 12V provided. Note2: Except F0H P/N:PM0629 REV. 1.0, DEC. 20, 1999 29 MX29F4000 SECTOR PROTECTION ALGORITHM FOR SYSTEM WITHOUT 12V START PLSCNT=1 Write "unlock for sector protect/unprotect" Command(Table1) Set Up Sector Addr (A18, A17, A16) OE=VIH,A9=VIH CE=VIL,A6=VIL Activate WE Pulse to start Data don't care Toggle bit checking Q6 not Toggled No . Yes Increment PLSCNT Set CE=OE=VIL A9=VIH Read from Sector Addr=SA, A1=1 No PLSCNT=32? No Data=01H? Yes Device Failed Protect Another Sector? Yes Write Reset Command Sector Protection Complete P/N:PM0629 REV. 1.0, DEC. 20, 1999 30 MX29F4000 CHIP UNPROTECTION ALGORITHM FOR SYSTEM WITHOUT 12V START Protect All Sectors PLSCNT=1 Set OE=A9=VID CE=VIL,A6=1 Activate WE Pulse Time Out 12ms Increment PLSCNT Set OE=CE=VIL A9=VID,A1=1 Set Up First Sector Addr Read Data from Device No Data=00H? Increment Sector Addr Yes No All sectors have been verified? No PLSCNT=1000? Yes Device Failed Yes Remove VID from A9 Write Reset Command Chip Unprotect Complete * It is recommended before unprotect whole chip, all sectors should be protected in advance. P/N:PM0629 REV. 1.0, DEC. 20, 1999 31 MX29F4000 ID CODE READ TIMING WAVEFORM VCC 5V ADD VID VIH A9 VIL ADD A0 VIH A1 VIH VIL tACC tACC VIL ADD A2-A8 A10-A18 CE VIH VIL VIH VIL WE VIH tCE VIL OE VIH tOE VIL tDF tOH tOH VIH DATA Q0-Q7 DATA OUT DATA OUT VIL 99H C2H P/N:PM0629 REV. 1.0, DEC. 20, 1999 32 MX29F4000 ORDERING INFORMATION PLASTIC PACKAGE PART NO. ACCESS TIME OPERATING CURRENT STANDBY CURRENT (ns) MAX.(mA) MAX.(uA) 30 5 MX29F4000PC-55 55 PACKAGE 32 Pin PDIP (EPROM pinout) MX29F4000PC-70 70 30 5 32 Pin PDIP (EPROM pinout) MX29F4000PC-90 90 30 5 32 Pin PDIP (EPROM pinout) MX29F4000PC-12 120 30 5 32 Pin PDIP (EPROM pinout) P/N:PM0629 REV. 1.0, DEC. 20, 1999 33 MX29F4000 ERASE AND PROGRAMMING PERFORMANCE(1) LIMITS TYP.(2) MAX.(3) UNITS 1.3 10.4 sec Chip Erase Time 4 32 sec Byte Programming Time 7 210 us Chip Programming Time 4 12 sec PARAMETER MIN. Sector Erase Time Erase/Program Cycles Note: 100,000 Cycles 1.Not 100% Tested, Excludes external system level over head. 2.Typical values measured at 25°C,5V. 3.Maximunm values measured at 25°C,4.5V. LATCHUP CHARACTERISTICS MIN. MAX. Input Voltage with respect to GND on all pins except I/O pins -1.0V 13.5V Input Voltage with respect to GND on all I/O pins -1.0V Vcc + 1.0V -100mA +100mA MIN. UNIT 20 Years Current Includes all pins except Vcc. Test conditions: Vcc = 5.0V, one pin at a time. DATA RETENTION PARAMETER Data Retention Time P/N:PM0629 REV. 1.0, DEC. 20, 1999 34 MX29F4000 REVISION HISTORY Revision Description Page Date 1.0 1.To remove "Advanced Information" datasheet marking and contain information on products in full production 2.The modification summary of Revision 0.1 & Revision 1.0: 2-1.Program/erase cycle times:10K cycles-->100K cycles 2-2.To add data retention 20 years 2-3.To modify timing of sector address loading period while operating multi-sector erase from 80us to 30us 2-4.To modify tBAL from 80us to 100us 2-5.To remove A9 from "timing waveform for sector protection for system without 12V" To remove A9 from "timing waveform for chip unprotection for system without 12V" P1 DEC/20/1999 P/N:PM0629 P1,34 P1,34 P8 P15 P28 P29 REV. 1.0, DEC. 20, 1999 35 MX29F4000 MACRONIX INTERNATIONAL CO., LTD. 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