MOSEL V53C16126HT50

MOSEL VITELIC
V53C16126H
HIGH PERFORMANCE
128K X 16 BIT FAST PAGE MODE
CMOS DYNAMIC RAM
HIGH PERFORMANCE
30
35
40
45
50
Max. RAS Access Time, (tRAC)
30 ns
35 ns
40 ns
45 ns
50 ns
Max. Column Address Access Time, (tCAA)
16 ns
18 ns
20 ns
22 ns
24 ns
Min. Fast Page Mode Cycle Time, (tPC)
19 ns
21 ns
23 ns
25 ns
28 ns
Min. Read/Write Cycle Time, (tRC)
65 ns
70 ns
75 ns
80 ns
90 ns
Features
Description
■ 128K x 16-bit organization
■ Fast Page Mode for a sustained data rate
of 53 MHz
■ RAS access time: 30, 35, 40, 45, 50ns
■ Dual CAS Inputs
■ Low Power Dissipation
■ Read-Modify-Write, RAS-Only Refresh,
CAS-Before-RAS Refresh
■ Refresh Interval: 512 cycles/8 ms
■ Available in 40-pin 400 mil SOJ and 40/44L-pin
400 mil TSOP-II packages
■ Single +5V±10% Power Supply
■ TTL Interface
The V53C16126H is a 131,072 x 16 bit high
performance CMOS dynamic random access
memory. The V53C16126H offers Fast Page mode
with dual CAS inputs. The V53C16126H has
asymmetric address, 9-bit row and 8-bit column.
All inputs are TTL compatible. Fast Page Mode
operation allows random access up to 256 x 16
bits, within a page, with cycle times as short as
19ns.
The V53C16126H is ideally suited for a wide
variety of high performance computer systems and
peripheral applications.
Device Usage Chart
Operating
Temperature
Range
0°C to 70°C
Package Outline
Access Time (ns)
Power
K
T
30
35
40
45
50
Std.
Temperature
Mark
•
•
•
•
•
•
•
•
Blank
V53C16126H Rev. 1.3 February 1998
1
V53C16126H
MOSEL VITELIC
V
5
3
C
16
1
FAMILY
Description
Pkg.
Pin Count
SOJ
K
40
TSOP-II
T
40/44L
40-Pin Plastic SOJ
PIN CONFIGURATION
Top View
2
6
H
DEVICE
PKG
SPEED
( t RAC)
K (SOJ)
T (TSOP-II)
TEMP.
PWR.
BLANK (0°C to 70°C)
BLANK (NORMAL)
30
35
40
45
50
(30 ns)
(35 ns)
(40 ns)
(45 ns)
(50 ns)
16126H-01
40/44L-Pin Plastic TSOP-II
PIN CONFIGURATION
Top View
Pin Names
Vcc
I/O1
I/O2
I/O3
I/O4
Vcc
I/O5
I/O6
I/O7
I/O8
NC
NC
WE
RAS
NC
A0
A1
A2
A3
Vcc
1
40
2
39
3
38
4
37
5
36
6
35
7
34
8
33
9
32
10
31
11
30
12
29
13
28
14
27
15
26
16
25
17
24
18
23
19
22
20
21
Vss
I/O16
I/O15
I/O14
I/O13
Vss
I/O12
I/O11
I/O10
I/O9
NC
LCAS
UCAS
OE
A8
A7
A6
A5
A4
Vss
16126H-02
Vcc
I/O1
I/O2
I/O3
I/O4
Vcc
I/O5
I/O6
I/O7
I/O8
NC
NC
WE
RAS
NC
A0
A1
A2
A3
Vcc
1
44
2
43
3
42
4
41
5
40
6
39
7
38
8
37
9
36
10
35
13
32
14
31
15
30
16
29
17
28
18
27
19
26
20
25
21
24
22
23
Vss
I/O16
I/O15
I/O14
I/O13
Vss
I/O12
I/O11
I/O10
I/O9
NC
LCAS
UCAS
OE
A8
A7
A6
A5
A4
Vss
A0–A8
Address Inputs
RAS
Row Address Strobe
UCAS
Column Address
Strobe/Upper Byte
Control
LCAS
Column Address
Strobe/Lower Byte
Control
WE
Write Enable
OE
Output Enable
I/O1–I/O16
Data Input, Output
VCC
+5V Supply
VSS
0V Supply
NC
No Connect
16126H-03
Absolute Maximum Ratings*
Capacitance*
TA = 25°C, VCC = 5 V ± 10%, VSS = 0 V
Ambient Temperature
Under Bias ................................ –10°C to +80°C
Storage Temperature (plastic) ..... –55°C to +125°C
Voltage Relative to VSS .................–1.0 V to +7.0 V
Data Output Current ..................................... 50 mA
Power Dissipation .......................................... 1.0 W
Parameter
Typ.
Max.
Unit
CIN1
Address Input
3
4
pF
CIN2
RAS, CAS, WE, OE
4
5
pF
COUT
Data Input/Output
5
7
pF
*Note: Capacitance is sampled and not 100% tested
*Note: Operation above Absolute Maximum Ratings can
adversely affect device reliability.
V53C16126H Rev. 1.3 February 1998
Symbol
2
V53C16126H
MOSEL VITELIC
Block Diagram
128K x 16
OE
WE
UCAS
LCAS
RAS
RAS CLOCK
GENERATOR
CAS CLOCK
GENERATOR
WE CLOCK
GENERATOR
OE CLOCK
GENERATOR
VCC
VSS
I/O 1
DATA I/O BUS
I/O2
COLUMN DECODERS
Y0–Y7
I/O3
I/O
BUFFER
I/O4
I/O 5
SENSE AMPLIFIERS
I/O6
REFRESH
COUNTER
I/O7
I/O8
I/O 9
256 x 16
A1
•
•
•
A7
A8
V53C16126H Rev. 1.3 February 1998
I/O10
I/O11
X0– X8
ROW
DECODERS
A0
ADDRESS BUFFERS
AND PREDECODERS
9
I/O12
I/O 13
512
MEMORY
ARRAY
I/O14
I/O15
I/O16
512 x 256 x 16
16126H-04
3
V53C16126H
MOSEL VITELIC
DC and Operating Characteristics (1-2)
TA = 0°C to 70°C, VCC = 5 V ± 10%, VSS = 0 V, unless otherwise specified.
Symbol
Parameter
Access
Time
V53C16126H
Min.
Typ.
Max.
Unit
Test Conditions
Notes
ILI
Input Leakage Current
(any input pin)
–10
10
µA
VSS ≤ VIN ≤ VCC
ILO
Output Leakage Current
(for High-Z State)
–10
10
µA
VSS ≤ VOUT ≤ VCC
RAS, CAS at VIH
ICC1
VCC Supply Current,
Operating
30
200
mA
tRC = tRC (min.)
35
190
40
180
45
170
50
160
2
mA
RAS, CAS at VIH,
other inputs ≥ VSS
30
200
mA
tRC = tRC (min.)
2
35
190
40
180
45
170
50
160
30
190
mA
Minimum Cycle
1, 2
35
180
40
170
45
160
50
150
ICC2
VCC Supply Current,
TTL Standby
ICC3
VCC Supply Current,
RAS-Only Refresh
ICC4
VCC Supply Current,
Fast Page Mode Operation
1, 2
ICC5
VCC Supply Current,
Standby Output Enable
other inputs ≥ VSS
2
mA
RAS = VIH
CAS = VIL
ICC6
VCC Supply Current,
CMOS Standby
1
mA
RAS ≥ VCC – 0.2 V,
CAS ≥ VCC – 0.2 V,
All other inputs ≥ VSS
VCC
Supply Voltage
4.5
5.5
V
VIL
Input Low Voltage
–1
0.8
V
3
VIH
Input High Voltage
2.4
VCC + 1
V
3
VOL
Output Low Voltage
0.4
V
IOL = 4.2 mA
VOH
Output High Voltage
2.4
V
IOH = –5 mA
V53C16126H Rev. 1.3 February 1998
2.4
4
1
V53C16126H
MOSEL VITELIC
AC Characteristics
TA = 0°C to 70°C, VCC = 5 V ±10%, VSS = 0V unless otherwise noted
AC Test conditions, input pulse levels 0 to 3V
30
35
40
45
50
#
Symbol
Parameter
1
tRAS
RAS Pulse Width
30
2
tRC
Read or Write Cycle Time
65
70
75
80
90
ns
3
tRP
RAS Precharge Time
25
25
25
25
30
ns
4
tCSH
CAS Hold Time
30
35
40
45
50
ns
5
tCAS
CAS Pulse Width
5
6
7
8
9
ns
6
tRCD
RAS to CAS Delay
15
7
tRCS
Read Command Setup Time
0
0
0
0
0
ns
8
tASR
Row Address Setup Time
0
0
0
0
0
ns
9
tRAH
Row Address Hold Time
5
6
7
8
9
ns
10
tASC
Column Address Setup Time
0
0
0
0
0
ns
11
tCAH
Column Address Hold Time
5
5
5
6
7
ns
12
tRSH (R)
RAS Hold Time (Read Cycle)
10
10
10
10
10
ns
13
tCRP
CAS to RAS Precharge Time
5
5
5
5
5
ns
14
tRCH
Read Command Hold Time
Referenced to CAS
0
0
0
0
0
ns
5
15
tRRH
Read Command Hold Time
Referenced to RAS
0
0
0
0
0
ns
5
16
tROH
RAS Hold Time
Referenced to OE
6
7
8
9
10
ns
17
tOAC
Access Time from OE
10
11
12
13
14
ns
12
18
tCAC
Access Time from CAS
10
11
12
13
14
ns
6,7,14
19
tRAC
Access Time from RAS
30
35
40
45
50
ns
6, 8, 9
20
tCAA
Access Time from Column
Address
16
18
20
22
24
ns
6,7,10
21
tLZ
OE or CAS to Low-Z Output
0
ns
16
22
tHZ
OE or CAS to High-Z Output
0
ns
16
23
tAR
Column Address Hold Time from
RAS
26
24
tRAD
RAS to Column Address
Delay Time
10
25
tRSH (W)
RAS or CAS Hold Time in
Write Cycle
10
10
10
10
10
ns
26
tCWL
Write Command to CAS
Lead Time
10
11
12
13
14
ns
27
tWCS
Write Command Setup Time
0
0
0
0
0
ns
28
tWCH
Write Command Hold Time
5
5
5
6
7
ns
V53C16126H Rev. 1.3 February 1998
Min. Max. Min. Max. Min. Max. Min. Max. Min. Max. Unit Notes
75K
20
35
16
75K
24
0
5
0
11
5
17
75K
28
0
6
28
14
40
0
12
18
75K
32
0
6
30
17
45
0
13
19
75K
36
0
7
35
20
50
0
8
40
23
14
ns
ns
4
ns
26
ns
11
12, 13
V53C16126H
MOSEL VITELIC
AC Characteristics (Cont’d)
30
35
40
45
50
#
Symbol
Parameter
29
tWP
Write Pulse Width
5
5
5
6
7
ns
30
tWCR
Write Command Hold Time
from RAS
26
28
30
35
40
ns
31
tRWL
Write Command to RAS
Lead Time
10
11
12
13
14
ns
32
tDS
Data in Setup Time
0
0
0
0
0
ns
14
33
tDH
Data in Hold Time
5
5
5
6
7
ns
14
34
tWOH
Write to OE Hold Time
5
5
6
7
8
ns
14
35
tOED
OE to Data Delay Time
5
5
6
7
8
ns
14
36
tRWC
Read-Modify-Write Cycle Time
100
105
110
115
130
ns
37
tRRW
Read-Modify-Write Cycle
RAS Pulse Width
65
70
75
80
87
ns
38
tCWD
CAS to WE Delay
26
28
30
32
34
ns
12
39
tRWD
RAS to WE Delay in ReadModify-Write Cycle
50
54
58
62
68
ns
12
40
tCRW
CAS Pulse Width (RMW)
44
46
48
50
52
ns
41
tAWD
Col. Address to WE Delay
32
35
38
41
42
ns
42
tPC
Fast Page Mode Read
or Write Cycle Time
19
21
23
25
28
ns
43
tCP
CAS Precharge Time
3
4
5
6
7
ns
44
tCAR
Column Address to RAS
Setup Time
16
18
20
22
24
ns
45
tCAP
Access Time from Column
Precharge
46
tDHR
Data in Hold Time Referenced
to RAS
26
28
30
35
40
ns
47
tCSR
CAS Setup Time CAS- beforeRAS Refresh
10
10
10
10
10
ns
48
tRPC
RAS to CAS Precharge Time
0
0
0
0
0
ns
49
tCHR
CAS Hold Time CAS-beforeRAS Refresh
7
8
8
10
12
ns
50
tPCM
Fast Page Mode Read-ModifyWrite Cycle Time
56
58
60
65
70
ns
51
tT
Transition Time (Rise and Fall)
1.5
52
tREF
Refresh Interval (512 Cycles)
V53C16126H Rev. 1.3 February 1998
Min. Max. Min. Max. Min. Max. Min. Max. Min. Max. Unit Notes
19
50
21
1.5
8
50
8
6
23
1.5
50
8
25
1.5
50
8
27
1.5
ns
12
7
50
ns
15
8
ms
17
V53C16126H
MOSEL VITELIC
Notes:
1. ICC is dependent on output loading when the device output is selected. Specified ICC (max.) is measured with the
output open.
2. ICC is dependent upon the number of address transitions. Specified ICC (max.) is measured with a maximum of two
transitions per address cycle in Fast Page Mode.
3. Specified VIL (min.) is steady state operating. During transitions, VIL (min.) may undershoot to –1.0 V for a period
not to exceed 20 ns. All AC parameters are measured with VIL (min.) ≥ VSS and VIH (max.) ≤ VCC.
4. tRCD (max.) is specified for reference only. Operation within tRCD (max.) limits insures that tRAC (max.) and tCAA
(max.) can be met. If tRCD is greater than the specified tRCD (max.), the access time is controlled by tCAA and tCAC.
5. Either tRRH or tRCH must be satisified for a Read Cycle to occur.
6. Measured with a load equivalent to one TTL input and 100 pF.
7. Access time is determined by the longest of tCAA, tCAC and tCAP.
8. Assumes that tRAD ≤ tRAD (max.). If tRAD is greater than tRAD (max.), tRAC will increase by the amount that tRAD exceeds tRAD (max.).
9. Assumes that tRCD ≤ tRCD (max.). If tRCD is greater than tRCD (max.), tRAC will increase by the amount that tRCD exceeds tRCD (max.).
10. Assumes that tRAD ≥ tRAD (max.).
11. Operation within the tRAD (max.) limit ensures that tRAC (max.) can be met. tRAD (max.) is specified as a reference
point only. If tRAD is greater than the specified tRAD (max.) limit, the access time is controlled by tCAA and tCAC.
12. tWCS, tRWD, tAWD and tCWD are not restrictive operating parameters.
13. tWCS (min.) must be satisfied in an Early Write Cycle.
14. tDS and tDH are referenced to the latter occurrence of CAS or WE.
15. tT is measured between VIH (min.) and VIL (max.). AC-measurements assume tT = 3 ns.
16. Assumes a three-state test load (5 pF and a 380 Ohm Thevenin equivalent).
17. An initial 200 µs pause and 8 RAS-containing cycles are required when exiting an extended period of bias without
clocks. An extended period of time without clocks is defined as one that exceeds the specified Refresh Interval.
V53C16126H Rev. 1.3 February 1998
7
V53C16126H
MOSEL VITELIC
Truth Table
RAS
LCAS
UCAS
WE
OE
ADDRESS
Standby
H
H
H
X
X
X
Read: Word
L
L
L
H
L
ROW/COL
Data Out
Read: Lower Byte
L
L
H
H
L
ROW/COL
Lower Byte, Data-Out
Upper Byte, High-Z
Read: Upper Byte
L
H
L
H
L
ROW/COL
Lower Byte, High-Z
Upper Byte, Data-Out
Write: Word (Early-Write)
L
L
L
L
X
ROW/COL
Data-In
Write: Lower Byte (Early)
L
L
H
L
X
ROW/COL
Lower Byte, Data-In
Upper Byte, High-Z
Read: Upper Byte (Early)
L
H
L
L
X
ROW/COL
Lower Byte, High-Z
Upper Byte, Data-In
Read-Write
L
L
L
H→L
L→H
ROW/COL
Data-Out, Data-In
Page-Mode Read
L
H→L
H→L
H
L
COL
Data-Out
2
Page-Mode Write
L
H→L
H→L
L
X
COL
Data-In
2
Page-Mode Read-Write
L
H→L
H→L
H→L
L→H
COL
Data-Out, Data-In
L→H→L
L
L
H
L
ROW/COL
L
H
H
X
X
ROW
High-Z
H→L
L
L
X
X
X
High-Z
Function
Hidden Refresh Read
RAS-Only Refresh
CBR Refresh
Notes:
1. Byte Write cycles LCAS or UCAS active.
2. Byte Read cycles LCAS or UCAS active.
3. Only one of the two CAS must be active (LCAS or UCAS).
V53C16126H Rev. 1.3 February 1998
8
I/O
Notes
High-Z
Data-Out
1,2
1,2
2
3
V53C16126H
MOSEL VITELIC
Waveforms of Read Cycle
t RC (2)
t RAS (1)
RAS
t RP (3)
t AR (23)
VIH
VIL
t CSH (4)
t CRP (13)
UCAS, LCAS
t RCD (6)
VIL
t CRP (13)
t RAD (24)
t RAH (9)
t ASR (8)
ADDRESS
t RSH (R)(12)
t CAS (5)
VIH
VIH
ROW ADDRESS
VIL
t CAH (11)
t ASC (10)
COLUMN ADDRESS
t RCH (14)
t CAR (44)
t RCS (7)
WE
t RRH (15)
VIH
VIL
t ROH (16)
t CAA (20)
OE
t OAC (17)
VIH
VIL
t CAC (18)
t RAC (19)
I/O
t HZ (22)
t HZ (22)
VOH
VALID DATA-OUT
VOL
t LZ (21)
16126H-05
Waveforms of Early Write Cycle
t RC (2)
t RAS (1)
RAS
t RP (3)
t AR (23)
V IH
V IL
t CSH (4)
t CRP (13)
UCAS, LCAS
t RCD (6)
t RSH (W)(25)
t CAS (5)
V IH
V IL
t CAR (44)
t CAH (11)
t RAH (9)
t ASR (8)
ADDRESS
t CRP (13)
V IH
V IL
t ASC (10)
ROW ADDRESS
COLUMN ADDRESS
t WCH (28)
t RAD (24)
t CWL (26)
WE
t WP (29)
t WCS (27)
V IH
V IL
t WCR (30)
t RWL (31)
OE
V IH
V IL
t DHR (46)
t DS (32)
I/O
V IH
V IL
t DH (33)
VALID DATA-IN
HIGH-Z
16126H-06
Don’t Care
V53C16126H Rev. 1.3 February 1998
9
Undefined
V53C16126H
MOSEL VITELIC
Waveforms of OE-Controlled Write Cycle
t RC (2)
t RAS (1)
RAS
t RP (3)
t AR (23)
VIH
V IL
t CSH (4)
t CRP (13)
t RCD (6)
t RSH (W)(12)
t CAS (5)
V IH
UCAS, LCAS
V IL
t RAD (24)
t RAH (9)
t ASR (8)
ADDRESS
t CRP (13)
V IH
t ASC (10)
ROW ADDRESS
V IL
t CAR (44)
t CAH (11)
COLUMN ADDRESS
t CWL (26)
t RWL (31)
t WP (29)
WE
V IH
V IL
t WOH (34)
OE
V IH
V IL
t OED (35)
I/O
t DH (33)
t DS (32)
V IH
VALID DATA-IN
V IL
16126H-07
Waveforms of Read-Modify-Write Cycle
t RWC (36)
tRRW (37)
RAS
t RP (3)
t AR (23)
VIH
VIL
t CSH (4)
t CRP (13)
t RCD (6)
t RSH (W)(25)
t CRW (40)
VIH
UCAS, LCAS
VIL
t
t RAH (9)
VIH
VIL
ROW
ADDRESS
COLUMN
ADDRESS
t AWD (41)
t CWD (38)
t RAD (24)
t RWD (39)
WE
OE
CAH (11)
t ASC (10)
t ASR (8)
ADDRESS
t CRP (13)
t RWL (31)
t WP (29)
VIH
VIL
t CAA (20)
t OAC (17)
VIH
VIL
t OED (35)
t CAC (18)
t RAC (19)
I/O
t CWL (26)
t DH (33)
t HZ (22)
t DS (32)
VIH VOH
VALID
DATA-OUT
VIL VOL
VALID
DATA-IN
t LZ (21)
16126H-08
Don’t Care
V53C16126H Rev. 1.3 February 1998
10
Undefined
V53C16126H
MOSEL VITELIC
Waveforms of Fast Page Mode Read Cycle
RAS
t PC (42)
t CP (43)
t CSH (4)
t RAH (9)
t ASC (10)
V IH
ROW
ADDRESS
t CAR (44)
t ASC (10)
t CAH (11)
t CAH (11)
COLUMN
ADDRESS
COLUMN
ADDRESS
t RCH (14)
t CAH (11)
t RCS (7)
COLUMN
ADDRESS
t RCS (7)
t RCS (7)
V IL
t CAA (20)
t CAA (20)
t CAP (45)
t OAC (17)
t RRH (15)
t OAC (17)
V IH
V IL
t HZ (22)
t RAC (19)
t CAC (18)
t LZ (21)
t CAC (18)
t CAC (18)
t LZ (21)
t HZ (22)
t LZ (21)
I/O
t RCH (14)
V IH
t OAC (17)
OE
t CRP (13)
t CAS (5)
t CAS (5)
V IL
V IL
WE
t RSH (R)(12)
t CAS (5)
V IH
t ASR (8)
ADDRESS
RP (3)
V IL
t RCD (6)
t CRP (13)
UCAS, LCAS
t
t RASP (37)
t AR (23)
V IH
V OH
VALID
DATA OUT
V OL
t HZ (22)
t HZ (22)
t HZ (22)
t HZ (22)
VALID
DATA OUT
VALID
DATA OUT
16126H-09
Waveforms of Fast Page Mode Write Cycle
t RP (3)
t AR (23)
RAS
t RASP (37)
V IH
V IL
t CRP (13)
t RCD (6)
UCAS, LCAS
t PC (42)
t CP (43)
t CAS (5)
V IH
t CSH (4)
t ASC (10)
t ASR (8)
V IH
ROW
ADD
V IL
t ASC (10)
t CAH (11)
t CRP (13)
COLUMN
ADDRESS
t CWL (26)
t WCS (27)
t CAR (44)
t CAH (11)
COLUMN
ADDRESS
t RAD (24)
t WCS (27)
t WCH (28)
t CAH (11)
COLUMN
ADDRESS
t CWL (26)
t WCS (27)
t CWL (26)
t WCH (28)
t RWL (31)
t WCH (28)
t WP (29)
t WP (29)
t WP (29)
WE
t CAS (5)
t CAS (5)
V IL
t RAH (9)
ADDRESS
t RSH (W)(25)
V IH
V IL
OE
VIH
V IL
I/O
V IH
V IL
t DS (32)
t DH (33)
t DS (32)
t DH (33)
t DS (32)
VALID
DATA IN
VALID
DATA IN
OPEN
t DH (33)
VALID
DATA IN
OPEN
16126H-10
Don’t Care
V53C16126H Rev. 1.3 February 1998
11
Undefined
V53C16126H
MOSEL VITELIC
Waveforms of Fast Page Mode Read-Write Cycle
RAS
t RASP (37)
VIH
V
IL
t CSH (4)
t RCD (6)
t PCM (50)
IH
V
t RSH (W)(25)
t CRP (13)
t CAS (5)
t CP (43)
t CAS (5)
V
UCAS, LCAS
t RP (3)
t CAS (5)
t RAD (24)
IL
t RAH (9)
t ASC (10)
t ASR (8)
V
ADDRESS
IH
IL
t CAH (11)
COLUMN
ADDRESS
t CAH (11)
COLUMN
ADDRESS
t RWD (39)
t RCS (7)
t CAR (44)
t ASC (10)
t CAH (11)
ROW
ADD
V
t ASC (10)
t CWL (26)
t CWD (38)
COLUMN
ADDRESS
t CWD (38)
t CWD (38)
t RWL (31)
t CWL (26)
t CWL (26)
V
WE
IH
V
IL
t CAA (20)
t OAC (17)
t AWD (41)
t AWD (41)
t AWD (41)
t WP (29)
t WP (29)
t WP (29)
t OAC (17)
t OAC (17)
V
OE
IH
V
IL
t CAA (20)
t OED (35)
t CAC (18)
t RAC (19)
t CAP (43)
t CAP (43)
t CAA (20)
t OED (35)
t CAC (18)
t HZ (22)
t HZ (22)
t DH (33)
t DH (33)
t DS (32)
t DS (32)
I/O
V I/OH
OUT
V I/OL
OUT
IN
t LZ (21)
t LZ (21)
t OED (35)
t CAC (18)
t HZ (22)
t DH (33)
t DS (32)
OUT
IN
t LZ (21)
IN
16126H-11
Waveforms of RAS-Only Refresh Cycle
t RC (2)
RAS
t RAS (1)
V IH
t RP (3)
V IL
t CRP (13)
UCAS, LCAS
V IH
V IL
t ASR (8)
ADDRESS
V IH
t RAH (9)
ROW ADDR
V IL
16126H-12
NOTE:
WE, OE = Don’t care
Don’t Care
V53C16126H Rev. 1.3 February 1998
12
Undefined
V53C16126H
MOSEL VITELIC
Waveforms of CAS-before-RAS Refresh Counter Test Cycle
t RAS (1)
RAS
t RP (3)
V IH
V IL
t CSR (47)
t CHR (49)
t RSH (W)(25)
t CAS (5)
t CP (43)
V IH
UCAS, LCAS
V IL
ADDRESS
V IH
V IL
READ
WE
t RRH (15)
t RCH (14)
t RCS (7)
V IH
V IL
t ROH (16)
t OAC (17)
OE
V IH
V IL
t HZ (22)
t HZ (22)
t LZ (21)
I/O
V IH
D OUT
V IL
t RWL (31)
t CWL (26)
WRITE
WE
t WCH (28)
t WCS (27)
V IH
V IL
OE
V IH
V IL
t
I/O
t DH (33)
DS (32)
V IH
D IN
V IL
16126H-13
Waveforms of CAS-before-RAS Refresh Cycle
t RC (2)
t RP (3)
RAS
t RAS (1)
t RP (3)
VIH
VIL
t RPC (48)
t CP (43)
t CHR (49)
t CSR (47)
CAS
VIH
V IL
t HZ (22)
I/O
VOH
VOL
16126H-14
NOTE: WE, OE, A 0 –A 8 = Don’t care
Don’t Care
V53C16126H Rev. 1.3 February 1998
13
Undefined
V53C16126H
MOSEL VITELIC
Waveforms of Hidden Refresh Cycle (Read)
t RC (2)
RAS
t RC (2)
tRP (3)
t RAS (1)
t AR (23)
V IH
t RP (3)
t RAS (1)
V IL
t RCD (6)
t CRP (13)
UCAS, LCAS
t CRP (13)
V IL
V IH
t RAD (24)
t ASC (10)
t CAH (11)
COLUMN
ADDRESS
ROW
ADD
V IL
t RCS (7)
WE
t CHR (49)
V IH
t ASR (8)
t RAH (9)
ADDRESS
t RSH (R)(12)
t RRH (15)
V IH
V IL
t CAA (20)
t OAC (17)
OE
V IH
V IL
t CAC (18)
t LZ (21)
t RAC (19)
t HZ (22)
t HZ (22)
V OH
I/O
VALID DATA
V OL
16126H-15
Waveforms of Hidden Refresh Cycle (Write)
t RC (2)
V IH
RAS
t RAS (1)
t RP (3)
V IL
t RCD (6)
t CRP (13)
UCAS, LCAS
t RC (2)
t RP (3)
t RAS (1)
t AR (23)
t RSH (12)
t CHR (49)
t CRP (13)
V IH
V IL
t RAD (24)
t ASC (10)
t ASR (8)
t RAH (9)
ADDRESS
V IH
V IL
t CAH (11)
ROW
ADD
COLUMN
ADDRESS
t WCH (28)
t WCS (27)
WE
V IH
V IL
V IH
OE
V IL
t DS (32)
V IH
I/O
V IL
t DH (33)
VALID DATA-IN
t DHR (46)
16126H-16
Don’t Care
V53C16126H Rev. 1.3 February 1998
14
Undefined
V53C16126H
MOSEL VITELIC
Functional Description
whether WE or CAS falls later. Consequently, the
input data must be valid at or before the falling
edge of WE or CAS, whichever occurs last. In the
CAS-controlled Write Cycle, when the leading edge
of WE occurs prior to the CAS low transition, the
I/O data pins will be in the High-Z state at the
beginning of the Write function. Ending the Write
with RAS or CAS will maintain the output in the
High-Z state.
In the WE controlled Write Cycle, OE must be in
the high state and tOED must be satisfied.
The V53C16126H is a CMOS dynamic RAM
optimized for high data bandwidth, low power
applications. It is functionally similar to a traditional
dynamic RAM. The V53C16126H reads and writes
data by multiplexing an 17-bit address into a 9-bit
row and a 8-bit column address. The row address is
latched by the Row Address Strobe (RAS). The
column address “flows through” an internal address
buffer and is latched by the Column Address Strobe
(CAS). Because access time is primarily dependent
on a valid column address rather than the precise
time that the CAS edge occurs, the delay time from
RAS to CAS has little effect on the access time.
Refresh Cycle
To retain data, 512 Refresh Cycles are required
in each 8 ms period. There are two ways to refresh
the memory:
Memory Cycle
A memory cycle is initiated by bringing RAS low.
Any memory cycle, once initiated, must not be
ended or aborted before the minimum tRAS time
has expired. This ensures proper device operation
and data integrity. A new cycle must not be initiated
until the minimum precharge time tRP /t CP has
elapsed.
1. By clocking each of the 512 row addresses (A0
through A8) with RAS at least once every 8 ms.
Any Read, Write, Read-Modify-Write or RASonly cycle refreshes the addressed row.
2. Using a CAS-before-RAS Refresh Cycle. If CAS
makes a transition from low to high to low after
the previous cycle and before RAS falls, CASb e f o r e -R A S r e f r e s h i s a c t i v a t e d . T h e
V53C8256H uses the output of an internal 9-bit
counter as the source of row addresses and ignore external address inputs.
Read Cycle
A Read cycle is performed by holding the Write
Enable (WE) signal High during a RAS/CAS
operation. The column address must be held for a
minimum specified by tAR. Data Out becomes valid
only when tOAC , t RAC , t CAA and t CAC are all
satisifed. As a result, the access time is dependent
on the timing relationships between these
parameters. For example, the access time is limited
by tCAA when tRAC, tCAC and tOAC are all satisfied.
CAS-before-RAS is a “refresh-only” mode and no
data access or device selection is allowed. Thus,
the output remains in the High-Z state during the
cycle. A CAS-before-RAS counter test mode is
provided to ensure reliable operation of the internal
refresh counter.
Write Cycle
A Write Cycle is performed by taking WE and
CAS low during a RAS operation. The column
address is latched by CAS. The Write Cycle can be
WE controlled or CAS controlled depending on
V53C16126H Rev. 1.3 February 1998
15
V53C16126H
MOSEL VITELIC
Fast Page Mode Operation
also disable the output drivers when CAS is low.
During a Write cycle, if WE goes low at a time in
relationship to CAS that would normally cause the
outputs to be active, it is necessary to use OE to
disable the output drivers prior to the WE low
transition to allow Data In Setup Time (tDS) to be
satisfied.
Fast Page Mode operation permits all 256
columns within a selected row of the device to be
randomly accessed at a high data rate. Maintaining
RAS low while performing successive CAS cycles
retains the row address internally and eliminates
the need to reapply it for each cycle. The column
address buffer acts as a transparent or flowthrough latch while CAS is high. Thus, access
begins from the occurrence of a valid column
address rather than from the falling edge of CAS,
eliminating tASC and tT from the critical timing path.
CAS latches the address into the column address
buffer and acts as an output enable. During Fast
Page Mode operation, Read, Write, Read-ModifyWrite or Read-Write-Read cycles are possible at
random addresses within a row. Following the initial
entry cycle into Fast Page Mode, access is tCAA or
tCAP controlled. If the column address is valid prior
to the rising edge of CAS, the access time is
referenced to the CAS rising edge and is
specified by tCAP. If the column address is valid
after the rising CAS edge, access is timed from
the occurrence of a valid address and is specified
by tCAA . In both cases, the falling edge of CAS
latches the address and enables the output.
Fast Page Mode provides sustained data rates
up to 53 MHz for applications that require high data
rates such as bit-mapped graphics or high-speed
signal processing. The following equation can be
used to calculate the maximum data rate:
Power-On
After application of the VCC supply, an initial
pause of 200 µs is required followed by a minimum
of 8 initialization cycles (any combination of cycles
containing a RAS clock). Eight initialization cycles
are required after extended periods of bias without
clocks (greater than the Refresh Interval).
During Power-On, the VCC current requirement
of the V53C16126H is dependent on the input
levels of RAS and CAS. If RAS is low during
Power-On, the device will go into an active cycle
and ID D will exhibit current transients. It is
recommended that RAS and CAS track with VCC or
be held at a valid VIH during Power-On to avoid
current surges.
Table 1. V53C16126H Data Output
Operation for Various Cycle Types
256
Data Rate = ---------------------------------------t RC + 255 × t PC
Data Output Operation
The V53C16126H Input/Output is controlled by
OE, CAS, WE and RAS. A RAS low transition
enables the transfer of data to and from the
selected row address in the Memory Array. A RAS
high transition disables data transfer and latches
the output data if the output is enabled. After a
memory cycle is initiated with a RAS low transition,
a CAS low transition or CAS low level enables the
internal I/O path. A CAS high transition or a CAS
high level disables the I/O path and the output
driver if it is enabled. A CAS low transition while
RAS is high has no effect on the I/O data path or on
the output drivers. The output drivers, when
otherwise enabled, can be disabled by holding OE
high. The OE signal has no effect on any data
stored in the output latches. A WE low level can
V53C16126H Rev. 1.3 February 1998
16
Cycle Type
I/O State
Read Cycles
Data from Addressed
Memory Cell
CAS-Controlled Write Cycle
(Early Write)
High-Z
WE-Controlled Write Cycle
(Late Write)
OE Controlled.
High OE = High-Z I/Os
Read-Modify-Write Cycles
Data from Addressed
Memory Cell
Fast Page Mode Read
Data from Addressed
Memory Cell
Fast Page Mode Write Cycle
(Early Write)
High-Z
Fast Page Mode Read-ModifyWrite Cycle
Data from Addressed
Memory Cell
RAS-only Refresh
High-Z
CAS-before-RAS Refresh Cycle
Data remains as in
previous cycle
CAS-only Cycles
High-Z
V53C16126H
MOSEL VITELIC
Package Outlines
40-Pin Plastic SOJ
Unit in inches [mm]
20
0.026 MIN
[0.660 MIN]
+0.004
0.025 –0.002
+0.102
0.635 –0.051
0.368 ± 0.010
[9.35 ± 0.254]
1
0.010
0.144 MAX
[3.66 MAX]
21
0.400 ±0.005
[10.16 ± 0.127]
40
0.440 ±0.005
[11.18 ± 0.127]
1.025 TYP. (1.035 MAX.)
[26.04 TYP. (26.29 MAX.)]
+ 0.004
– 0.002
+0.102
0.254 –0.051
0.04 [0.1]
0.050 ± 0.006
[1.27 ± 0.152]
0.018
+0.004
–0.002
+0.102
0.457 –0.051
40/44L-Pin TSOP-II
40
21
1
20
0°–5°
0.0315 BSC
[.8001 BSC]
0.012 – 0.016
[0.305 – 0.406]
0.039 – 0.047
[0.991 – 1.193]
0.002 – 0.008
[0.051 – 0.203]
BASE PLANE
SEATING PLANE
0.721 – 0.729
[18.31 – 18.52]
V53C16126H Rev. 1.3 February 1998
17
Unit in inches [mm]
0.017 – 0.023
[0.432 – 0.584]
0.396 – 0.404
[10.06 – 10.26]
0.462 – 0.470
[11.73 – 11.94]
0.0047 – 0.0083
[0.119 – .211]
MOSEL VITELIC
WORLDWIDE OFFICES
V53C16126H
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© Copyright 1998, MOSEL VITELIC Inc.
The information in this document is subject to change without notice.
MOSEL VITELIC makes no commitment to update or keep current the information contained in this document. No part of this
document may be copied or reproduced in any form or by any
means without the prior written consent of MOSEL-VITELIC.
MOSEL VITELIC
2/98
Printed in U.S.A.
MOSEL VITELIC subjects its products to normal quality control
sampling techniques which are intended to provide an assurance
of high quality products suitable for usual commercial applications. MOSEL VITELIC does not do testing appropriate to provide
100% product quality assurance and does not assume any liability for consequential or incidental arising from any use of its products. If such products are to be used in applications in which
personal injury might occur from failure, purchaser must do its
own quality assurance testing appropriate to such applications.
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