SEME-LAB 2N2907AC3

SILICON PLANAR
EPITAXIAL PNP TRANSISTOR
2N2907AC3
•
Low Power, High Speed Saturated Switching
•
Hermetic Surface Mounted Package.
•
Ideally suited for High Speed Switching
and General Purpose Applications
•
Screening Options Available
ABSOLUTE MAXIMUM RATINGS (TA = 25°C unless otherwise stated)
VCBO
VCEO
VEBO
IC
PD
TJ
Tstg
Collector – Base Voltage
Collector – Emitter Voltage
Emitter – Base Voltage
Continuous Collector Current
TA = 25°C
Total Power Dissipation at
Derate Above 37.5°C
Junction Temperature Range
Storage Temperature Range
-60V
-60V
-5V
-600mA
500mW
3.08mW/°C
-65 to +200°C
-65 to +200°C
THERMAL PROPERTIES (Each Device)
Symbols
Parameters
RθJA
Thermal Resistance, Junction To Ambient
Min.
Typ.
Max.
Units
325
°C/W
Semelab Limited reserves the right to change test conditions, parameter limits and package dimensions without notice.
Information furnished by Semelab is believed to be both accurate and reliable at the time of going to press. However
Semelab assumes no responsibility for any errors or omissions discovered in its use. Semelab encourages customers to
verify that datasheets are current before placing orders.
Semelab Limited
Coventry Road, Lutterworth, Leicestershire, LE17 4JB
Telephone +44 (0) 1455 556565
Fax +44 (0) 1455 552612
Email: [email protected]
Website: http://www.semelab-tt.com
Document Number 8357
Issue 1
Page 1 of 4
SILICON PLANAR
EPITAXIAL PNP TRANSISTOR
2N2907AC3
ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise stated)
Symbols
(1)
V(BR)CEO
ICBO
Parameters
Test Conditions
Collector-Emitter
Breakdown Voltage
IC = -10mA
IB = 0
VCB = -60V
IE = 0
-10
µA
VCB = -50V
IE = 0
-10
nA
TA = 150°C
-10
µA
VEB = -5V
IC = 0
-10
µA
VEB = -4V
IC = 0
-50
nA
-50
nA
Collector Cut-Off Current
IEBO
Emitter Cut-Off Current
ICES
Collector Cut-Off Current
(1)
VCE(sat)
VBE(sat)
hFE
(1)
(1)
Collector-Emitter Saturation
Voltage
Base-Emitter Saturation
Voltage
Forward-current transfer
ratio
Min.
Typ
Max.
-60
VCE = -50V
V
IC = -150mA
IB = -15mA
-0.4
IC = -500mA
IB = -50mA
-1.6
IC = -150mA
IB = -15mA
IC = -500mA
IB = -50mA
IC = -0.1mA
VCE = -10V
75
IC = -1.0mA
VCE = -10V
100
IC = -10mA
VCE = -10V
100
TA = -55°C
50
IC = -150mA
VCE = -10V
100
IC = -500mA
VCE = -10V
50
IC = -20mA
VCE = -20V
-0.6
Units
V
-1.3
-2.6
450
300
DYNAMIC CHARACTERISTICS
| hfe |
Small signal forward-current
transfer ratio
hfe
Small Signal Current Gain
Cobo
Output Capacitance
Cibo
Input Capacitance
ton
Turn-On Time
toff
Turn-Off Time
2
f = 100MHz
IC = -1.0mA
VCE = -10V
f = 1.0KHz
VCB = -10V
100
IE = 0
8
f = 1.0MHz
VEB = -2V
pF
IC = 0
30
f = 1.0MHz
IC = -150mA
VCC = -30V
IB1 = -15mA
IC = -150mA
VCC = -30V
IB1 = - IB2 = -15mA
45
ns
300
Notes
(1) Pulse Width ≤ 300us, δ ≤ 2%
Semelab Limited
Coventry Road, Lutterworth, Leicestershire, LE17 4JB
Telephone +44 (0) 1455 556565
Fax +44 (0) 1455 552612
Email: [email protected]
Website: http://www.semelab-tt.com
Document Number 8357
Issue 1
Page 2 of 4
SILICON PLANAR
EPITAXIAL PNP TRANSISTOR
2N2907AC3
MECHANICAL DATA
Dimensions in mm (inches)
1.40 ± 0.15
(0.055 ± 0.006)
5.59 ± 0.13
(0.22 ± 0.005)
3
4
1.02 ± 0.20
(0.04 ± 0.008)
2
1
1.27 ± 0.05
(0.05 ± 0.002)
0.23 rad.
(0.009)
0.64 ± 0.08
(0.025 ± 0.003)
3.81 ± 0.13
(0.15 ± 0.005)
0.25 ± 0.03
(0.01 ± 0.001)
0.23 min.
(0.009)
2.03 ± 0.20
(0.08 ± 0.008)
C3 (MO-041BA)
Underside View
PACKAGE VARIANT TABLE
Variant
A
B
C
Pad 1
Collector
Collector
Collector
Pad 2
N/C
N/C
Emitter
Pad 3
Emitter
Base
N/C
Pad 4
Base
Emitter
Base
N/C = No Connection
Semelab Limited
Coventry Road, Lutterworth, Leicestershire, LE17 4JB
Telephone +44 (0) 1455 556565
Fax +44 (0) 1455 552612
Email: [email protected]
Website: http://www.semelab-tt.com
Document Number 8357
Issue 1
Page 3 of 4
SILICON PLANAR
EPITAXIAL PNP TRANSISTOR
2N2907AC3
SCREENING OPTIONS
ORDERING INFORMATION
Space Level (JQRS/ESA) and High Reliability options are
available in accordance with the High Reliability and
Screening Options Handbook available for download from
the from the TT electronics Semelab web site.
Part number is built from part, package variant and
screening level. The part number can be extended to
include the additional options as shown below.
ESA Quality Level Products are based on the testing
procedures specified in the generic ESCC 5000 and in the
corresponding part detail specifications.
Type – See Electrical Stability Characteristics Table
Package Variant – See Mechanical Data
Screening Level – See Screening Options (ESA / JQRS)
Additional Options:
Semelabs QR216 and QR217 processing specifications
(JQRS), in conjunction with the companies ISO 9001:2000
approval present a viable alternative to the American MILPRF-19500 space level processing.
QR217 (Space Level Quality Conformance) is based on the
quality conformance inspection requirements of MIL-PRF19500 groups A (table V), B (table VIa), C (table VII) and
also ESA / ESCC 5000 (chart F4) lot validation tests.
QR216 (Space Level Screening) is based on the screening
requirements of MIL-PRF-19500 (table IV) and also ESA
/ESCC 5000 (chart F3).
JQRS parts are processed to the device data sheet and
screened to QR216 with conformance testing to Q217
groups A and B in accordance with MIL-STD-750 methods
and procedures.
Additional conformance options are available, for example
Pre-Cap Visual Inspection, Buy-Off Visit or Data Packs.
These are chargeable and must be specified at the order
stage (See Ordering Information). Minimum order
quantities may apply.
Alternative or additional customer specific conformance or
screening requirements would be considered. Contact
Semelab sales with enquires.
MARKING DETAILS
Parts are typically marked with specification number, serial
number (or week of seal) as shown in the example below. .
Customer specific marking requirements can be arranged at
time of order but is approximately limited to three lines of
7 Characters. This is to ensure text remains readable.
Example Marking:
Customer Pre-Cap Visual Inspection
Customer Buy-Off visit
Data Pack
Solderability Samples
Scanning Electron Microscopy
Radiography (X-ray)
Total Dose Radiation Test
.CVP
.CVB
.DA
.SS
.SEM
.XRAY
.RAD
MIL-PRF-19500 (QR217)
Group B charge
Group B destructive mechanical samples
Group C charge
Group C destructive electrical samples
Group C destructive mechanical samples
.GRPB
.GBDM (12 pieces)
.GRPC
.GCDE (12 pieces)
.GCDM (6 pieces)
ESA/ESCC
Lot Validation Testing (subgroup 1) charge
LVT1 destructive samples (environmental)
LVT1 destructive samples (mechanical)
Lot Validation Testing (subgroup 2) charge
LVT2 endurance samples (electrical)
Lot Validation Testing (subgroup 3) charge
LVT3 destructive samples (mechanical)
.LVT1
.L1DE (15 pieces)
.L1DM (15 pieces)
.LVT2
.L2D (15 pieces)
.LVT3
.L3D (5 pieces)
Additional Option Notes:
1) All ‘Additional Options’ are chargeable and must be specified at order stage.
2) When Group B,C or LVT is required, additional electrical and mechanical destructive
samples must be ordered
3) All destructive samples are marked the same as other production parts unless
otherwise requested.
Example ordering information:
The following example is for the 2N2907AC3 part, package
variant B, JQRS screening, additional Group C conformance
testing and a Data pack.
Part Numbers:
2N2907AC3B-JQRS (Include quantity for flight parts)
2N2907AC3B-JQRS.GRPC (chargeable conformance option)
2N2907AC3B-JQRS.GCDE (charge for destructive parts)
2N2907AC3B-JQRS.GCDM (charge for destructive parts)
2N2907AC3B-JQRS.DA (charge for Data pack)
Customers with any specific requirements (e.g. marking,
package or screening) may be supplied with a similar
alternative part number (there is maximum 20 character
limit to part numbers). Contact Semelab sales with all
enquiries
High Reliability and Screening Options Handbook link: http://www.semelab.co.uk/pdf/misc/documents/hirel_and_screening_options.pdf
Semelab Limited
Coventry Road, Lutterworth, Leicestershire, LE17 4JB
Telephone +44 (0) 1455 556565
Fax +44 (0) 1455 552612
Email: [email protected]
Website: http://www.semelab-tt.com
Document Number 8357
Issue 1
Page 4 of 4