DAC161S055 www.ti.com SNAS503B – NOVEMBER 2010 – REVISED JANUARY 2012 DAC161S055 Precision 16-Bit, Buffered Voltage-Output DAC Check for Samples: DAC161S055 FEATURES DESCRIPTION • • • • The DAC161S055 is a precision 16-bit, buffered voltage output Digital-to-Analog Converter (DAC) that operates from a 2.7V to 5.25V supply with a separate I/O supply pin that operates down to 1.7V. The onchip precision output buffer provides rail-to-rail output swing and has a typical settling time of 5 µsec. The external voltage reference can be set between 2.5V and VA (the analog supply voltage), providing the widest dynamic output range possible. 1 2 • • • 16-bit DAC with a Two-buffer SPI Interface Asynchronous Load DAC and Reset Pins Compatibility with 1.8V Controllers Buffered Voltage Output with Rail-to-Rail Capability Wide Voltage Reference Range of +2.5V to VA Wide Temperature Range of −40°C to +105°C Packaged in a 16-pin WQFN APPLICATIONS • • • • • • • Process Control Automatic Test Equipment Programmable Voltage Sources Communication Systems Data Acquisition Industrial PLCs Portable Battery Powered Instruments KEY SPECIFICATIONS • • • • • • Resolution (Specified Monotonic) 16 bits INL ±3 LSB (max) Very Low Output Noise 120 nV/√Hz (typ) Glitch Impulse 7 nV-s (typ) Output Settling Time 5 µs (typ) Power Consumption 5.5 mW at 5.25 V (max) The 4-wire SPI compatible interface operates at clock rates up to 20 MHz. The part is capable of Diasy Chain and Data Read Back. An on board power-onreset (POR) circuit ensures the output powers up to a known state. The DAC161S055 features a power-up value pin (MZB), a load DAC pin (LDACB) and a DAC clear (CLRB) pin. MZB sets the startup output voltage to either GND or mid-scale. LDACB updates the output, allowing multiple DACs to update their outputs simultaneously. CLRB can be used to reset the output signal to the value determined by MZB. The DAC161S055 has a power-down option that reduces power consumption when the part is not in use. It is available in a 16-lead WQFN package. 1 2 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. All trademarks are the property of their respective owners. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright © 2010–2012, Texas Instruments Incorporated DAC161S055 SNAS503B – NOVEMBER 2010 – REVISED JANUARY 2012 www.ti.com BLOCK DIAGRAM VA Referenced Input VA MZB VDDIO VREF CLRB SDO FIFO/ SPI/ INTERFACE SDI SCLK 16 CLR PRE LOAD 16 PRE REG CLR PRE LOAD R-DAC DAC REG Bypass VOUT BUF CSB 10k WRAL WRUP COMMANDS GND SWB SEL_HIZ LDACB SEL_10K VDDIO Referenced Inputs CLR COMMAND VA 1 VOUT 2 VDDIO MZB CLRB LDACB 16 15 14 13 CONNECTION DIAGRAM 12 CSB 11 SDI WQFN 16 8 SDO NC 9 7 4 GND NC 6 SCLK VREF 10 5 3 NC NC DAP PIN DESCRIPTIONS Pin # WQFN-16 ESD Structure Type VDDIO 16 ESD Clamp Power SPI, CLRB, LDACB Supply Voltage. VA 1 ESD Clamp Power Analog Supply Voltage. Pin Name 2 Function and Connection Submit Documentation Feedback Copyright © 2010–2012, Texas Instruments Incorporated Product Folder Links: DAC161S055 DAC161S055 www.ti.com SNAS503B – NOVEMBER 2010 – REVISED JANUARY 2012 PIN DESCRIPTIONS (continued) Pin Name Pin # WQFN-16 ESD Structure Type Function and Connection TO OUT DRIVE VOUT 2 Analog Output DAC output. VREF 6 Analog Input GND 7 Ground SDI 11 Digital Input SPI data input . CSB 12 Digital Input Chip select signal for SPI interface. On the falling edge of CSB the chip begins to accept data and output data with the SCLK signal. This pin is active low. SCLK 10 Digital Input Serial data clock for SPI Interface. Voltage Reference Input. Ground (Analog and Digital). TO OUT DRIVE SDO 9 Digital Output Data Out for daisy chain or data read back verification. LDACB 13 Digital Input Load DAC signal. This signal transfers DAC data from the SPI input register to the DAC output register. The signal is active low. CLRB 14 Digital Input Asynchronous Reset. If this pin is pulled low, the output will be updated to its power up condition set by the MZB pin. This pin is active low. MZB 15 Digital Input Power up at Zero/Mid-scale. Tie this pin to GND to power up to Zero or to VA to power up to mid-scale. NC DAP 3,4,5,8 DAP No connect pins. Connect to GND in board layout will result in the lowest amount of coupled noise. Attach die attach paddle to GND for best noise performance. Submit Documentation Feedback Copyright © 2010–2012, Texas Instruments Incorporated Product Folder Links: DAC161S055 3 DAC161S055 SNAS503B – NOVEMBER 2010 – REVISED JANUARY 2012 www.ti.com These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. ABSOLUTE MAXIMUM RATINGS (1) (2) −0.3V to 6.0V Supply Voltage, VA −0.3V to VA+0.3V Supply Voltage VDDIO 6V, −0.3V Any pin relative to GND Voltage on MZB or VREF Input Pin Voltage on any other Input Pin (3) −0.3V to VA+0.3V (3) −0.3V to VDDIO+0.3V Voltage on VOUT (3) Voltage on SDO −0.3V to VA+0.3V (3) Input Current at Any Pin −0.3V to VDDIO+0.3V (3) 5mA Output Current Source or Sink by Vout 10mA Output Current Source or Sink by SDO 3mA Total Package Input and Output Current 20mA ESD Susceptibility Human Body Model Machine Model Charged Device Model (CDM) 3000V 250V 1250V −65°C to +150°C Storage Temperature Range Junction Temperature +150°C For soldering specifications: see product folder at www.ti.com and SNOA549 (1) (2) (3) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur, including inoperability and degradation of device reliability and/or performance. Functional operation of the device and/or non-degradation at the Absolute Maximum Ratings or other conditions beyond those indicated in the Recommended Operating Conditions is not implied. The recommended Operating Conditions indicate conditions at which the device is functional and the device should not be operated beyond such conditions. The Electrical characteristics tables list specifications under the listed Recommended Conditions except as otherwise modified or specified by the Electrical Characteristics Conditions and/or Notes. Typical specifications are estimations only and are NOT specified. When the input voltage (VI) at any pin exceeds the power supplies (VI < GND or VI > VDD) the current at that pin must be limited to 5mA and VI has to be within the Absolute Maximum Rating for that pin. The 20mA package input current rating limits the number of pins that can safely exceed the power supplies with current flow to four. RECOMMENDED OPERATING CONDITIONS (1) (2) −40°C to +105°C Operating Temperature Range Supply Voltage, VA +2.7V to 5.25V Supply Voltage VDDIO +1.7 V to VA Reference Voltage VREF +2.5V to VA Digital Input Voltage 0 to VDDIO Output Load 0 to 200 pF Package Thermal Resistance θJA (3) θJC (1) (2) (3) 4 41°C/W 6.5°C/W Absolute Maximum Ratings indicate limits beyond which damage to the device may occur, including inoperability and degradation of device reliability and/or performance. Functional operation of the device and/or non-degradation at the Absolute Maximum Ratings or other conditions beyond those indicated in the Recommended Operating Conditions is not implied. The recommended Operating Conditions indicate conditions at which the device is functional and the device should not be operated beyond such conditions. The Electrical characteristics tables list specifications under the listed Recommended Conditions except as otherwise modified or specified by the Electrical Characteristics Conditions and/or Notes. Typical specifications are estimations only and are NOT specified. The maximum power dissipation is a function of TJ(MAX) and θJA. The maximum allowable power dissipation at any ambient temperature is PD=(TJ(MAX)-TA)/θJA Submit Documentation Feedback Copyright © 2010–2012, Texas Instruments Incorporated Product Folder Links: DAC161S055 DAC161S055 www.ti.com SNAS503B – NOVEMBER 2010 – REVISED JANUARY 2012 ELECTRICAL CHARACTERISTICS The following specifications apply for VA = 2.7V to 5.25V, VDDIO = VA, VREF = 2.5V to VA, RL = 10k to GND, CL = 200 pF to GND, fSCLK = 20 MHz, input code range 512 to 65023. Boldface limits apply for TMIN ≤ TA ≤ TMAX: all other limits apply to TA = 25°C, unless otherwise specified. (1) (2) (3) Symbol Parameter Conditions Min Typ Max Units STATIC PERFORMANCE N Resolution 16 INL Integral Non-Linearity No load. From code 512 to Full Scale - 512. VA=5V, VREF=4.096V DNL Differential Non-Linearity No load. From code 512 to Full Scale - 512. VA=5V, VREF=4.096V Bits ±1 -1 ZE Zero Code Error 4 FSE Full Scale Error -15 OE Offset Error -11 Offset Error Drift GE Gain Error Gain Temperature Coefficient ±1 ±3 1.1 LSB 15 mV 15 mV 11 ±4 No load. From code 512 to Full Scale - 512. VA=5V, VREF=4.096V No load. From code 512 to Full Scale - 512. VA=5V, VREF=4.096V mV µV/°C ±0.05 -25 LSB % of FS 25 ±2 mV ppm FS/°C REFERENCE INPUT CHARACTERISTICS VREF Reference Input Voltage Range VA = 2.7V to 5.25V 2.5 Reference Input Impedance VA 12.5 V kΩ ANALOG OUTPUT CHARACTERISTICS Output Voltage Range No load. DC Output Impedance ZCO FSO CL Zero Code Output Full Scale Output Maximum Capacitive Load 0.015 VA-0.04 V Ω 2 VA=3V, IOUT=200 µA; VREF=2.5 3 VA=3V, IOUT=1mA; VREF=2.5 4 VA=5V, IOUT=200 µA; VREF=4.096 4 VA=5V, IOUT=1mA; VREF=4.096 4 VA=3V, IOUT=200 µA; VREF=2.5 2.495 VA=3V, IOUT=1mA; VREF=2.5 2.494 VA=5V, IOUT=200 µA; VREF=4.096 4.091 VA=5V, IOUT=1mA; VREF=4.096 4.089 mV V Parallel R = 10KΩ 500 pF Series R = 50Ω 15 µF RL Minimum Resistive Load 10 kΩ ISC Short Circuit Current VA = +5V, VREF=4.096 353 mA tPU Power-up Time From Power Down Mode 25 ms ANALOG OUTPUT DYNAMIC CHARCTERISTICS SR ts (1) (2) (3) Voltage Output Slew Rate Positive and negative 2 V/µs Voltage Output Settling Time 1/4 scale to 3/4 scale VREF= VA = +5V, settle to ±1 LSB. 5 µs Digital Feedthrough Code 0, all digital inputs from GND to VDDIO 1 nV-s Major Code Transition Analog Glitch Impulse VA=5V, VREF=2.5V. Transition from midscale − 1LSB to mid-scale. 7 nV-s Absolute Maximum Ratings indicate limits beyond which damage to the device may occur, including inoperability and degradation of device reliability and/or performance. Functional operation of the device and/or non-degradation at the Absolute Maximum Ratings or other conditions beyond those indicated in the Recommended Operating Conditions is not implied. The recommended Operating Conditions indicate conditions at which the device is functional and the device should not be operated beyond such conditions. The Electrical characteristics tables list specifications under the listed Recommended Conditions except as otherwise modified or specified by the Electrical Characteristics Conditions and/or Notes. Typical specifications are estimations only and are NOT specified. Typical values represent most likely parametric norms at specific conditions (Example VA; specific temperature) and at the recommended Operating Conditions at the time of product characterizations and are NOT specified. Submit Documentation Feedback Copyright © 2010–2012, Texas Instruments Incorporated Product Folder Links: DAC161S055 5 DAC161S055 SNAS503B – NOVEMBER 2010 – REVISED JANUARY 2012 www.ti.com ELECTRICAL CHARACTERISTICS (continued) The following specifications apply for VA = 2.7V to 5.25V, VDDIO = VA, VREF = 2.5V to VA, RL = 10k to GND, CL = 200 pF to GND, fSCLK = 20 MHz, input code range 512 to 65023. Boldface limits apply for TMIN ≤ TA ≤ TMAX: all other limits apply to TA = 25°C, unless otherwise specified.(1) (2) (3) Symbol Parameter Conditions Min Typ Max Units Output Noise Spot noise at 20 kHz 120 nV/√Hz Integrated Output Noise 1Hz to 10 kHz 18 µV DIGITAL INPUT CHARACTERISTICS IIN Input Current VIL Input Low Voltage VIH Input High Voltage VILMZB VIHMZB CIN MZB Input Low Voltage MZB Input High Voltage ±1 VDDIO=5V 0.8 VDDIO=3V 0.8 VDDIO=1.8V 0.4 VDDIO=5V 2.1 VDDIO=3V 2.1 VDDIO=1.8V 1.4 µA V V VA=5V 0.8 V VA=3V 0.8 V VA=5V 2.1 VA=3V 2.1 Input Capacitance V V 4 pF DIGITAL OUTPUT CHARACTERISTICS VOL Output Low Voltage Isink=200 µA; VDDIO>3V 400 Isink=2mA;VDDIO>3V 400 Isink=200 µA; VDDIO=1.8V 400 Isink=2mA;VDDIO=1.8V VOH Output High Voltage lOZH, lOZL COUT 400 Isink=200 µA; VDDIO>3V VDDIO - 0.2 Isink=2mA;VDDIO>3V VDDIO - 0.2 Isink=200 µA; VDDIO=1.8V VDDIO - 0.2 Isink=2mA;VDDIO=1.8V mV V 1.15 TRI-STATE Leakage Current <1n TRI-STATE Output Capacitance ±1µ 4 A pF POWER REQUIREMENTS VA Analog Supply Voltage Range 2.7 5.25 V VDDIO Digital Supply Voltage Range 1.7 VA V IVA 6 VA Supply Current No load. SCLK Idle. All digital inputs at GND or VDDIO. VA=5V 0.75 No load. SCLK Idle. All digital inputs at GND or VDDIO. VA=3.3V 0.62 0.5 IREF Reference Current IPDVA VA Power Down Supply Current All digital inputs at GND or VDDIO IPDVO VDDIO Power Down Supply Current All digital inputs at GND or VDDIO IPDVR VREF Power Down Supply Current 1 1 mA mA 350 3 1 µA 1 Submit Documentation Feedback Copyright © 2010–2012, Texas Instruments Incorporated Product Folder Links: DAC161S055 DAC161S055 www.ti.com SNAS503B – NOVEMBER 2010 – REVISED JANUARY 2012 DIGITAL INTERFACE TIMING CHARACTERISTICS These specifications apply for VA = 2.7V to 5.25V, VDDIO = 1.7V to VA, CL = 200 pF. Boldface limits apply for TA = −40°C to 105°C. All other limits apply to TA = 25°C, unless otherwise specified. Symbol fSCLK Parameter SCLK Frequency tH SCLK High Time tL SCLK Low Time tCSB Conditions 0 25 20 25 tCSH CSB Hold Time after the 24th Falling Edge of SCLK tZSDO CSB Falling Edge to SDO Valid Units 10 MHz 75 VDDIO=2.7V to 5.25V CSB Set-up Time Prior to SCLK Rising edge Max 20 15 VDDIO=1.7V to 2.7V CSB High Pulse width Typ 0 VDDIO=2.7V to 5.25V tCSS tSDOZ Min VDDIO=1.7V to 2.7V 40 10 0 CSB Rising Edge to SDO HiZ VDDIO=1.8V 40 VDDIO=3V 10 VDDIO=5V 6 VDDIO=1.8V 75 VDDIO=3V 40 VDDIO=5V 27 tCLRS CSB Rising Edge to CLRB Falling Edge CLRB must not transition anytime CSB is low. 5 tLDACS CSB Rising Edge to LDACB Falling Edge LDACB must not transition anytime CSB is low. 5 tLDAC LDACB Low Time 10 2.5 tCLR CLRB Low Time 10 2.5 tDS SDI Data Set-up Time prior to SCLK Rising Edge 10 tDH SDI Data Hold Time after SCLK Rising Edge 0 tDO SDO Output Data Valid ns VDDIO=1.7 62 VDDIO=3.3 25 VDDIO=5 15 TIMING DIAGRAMS 1 2 21 tL 22 23 24 tH | SCLK | | 1/fSCLK SDO D23 PD23 | | SDI PD0 D0 | tCSB | | | | | CS PD0 Figure 1. DAC161S055 Input/Output Waveforms Submit Documentation Feedback Copyright © 2010–2012, Texas Instruments Incorporated Product Folder Links: DAC161S055 7 DAC161S055 SNAS503B – NOVEMBER 2010 – REVISED JANUARY 2012 50% SCLK CSB www.ti.com CSB 50% 50% 50% 50% 50% LDACB tCSH tCSS CSB 50% tLDACS 50% tLDAC 50% SCLK SDO 50% SDO tDO tZSDO SCLK tSDOZ 50% CSB 50% SDI 50% CLRB tDS tCLRS tDH 50% tCLR Figure 2. Timing Parameter Specifics TRANSFER CHARACTERISTICS FSE 65535 x VA 65536 GE = FSE - ZE FSE = GE + ZE OUTPUT VOLTAGE ZE 0 0 65535 DIGITAL INPUT CODE Figure 3. Input/Output Transfer Characteristic 8 Submit Documentation Feedback Copyright © 2010–2012, Texas Instruments Incorporated Product Folder Links: DAC161S055 DAC161S055 www.ti.com SNAS503B – NOVEMBER 2010 – REVISED JANUARY 2012 SPECIFICATION DEFINITIONS DIFFERENTIAL NON-LINEARITY (DNL) is the measure of the maximum deviation from the ideal step size of 1 LSB, which is VREF / 65536. DIGITAL FEEDTHROUGH is a measure of the energy injected into the analog output of the DAC from the digital inputs when the DAC outputs are not updated. It is measured with a full-scale code change on the data bus. FULL-SCALE ERROR is the difference between the actual output voltage with a full scale code (FFFh) loaded into the DAC and the value of VREF x 65535 / 65536. GAIN ERROR is the deviation from the ideal slope of the transfer function. It can be calculated from Zero and Full-Scale Errors as GE = FSE - ZE, where GE is Gain error, FSE is Full-Scale Error and ZE is Zero Error. GLITCH IMPULSE is the energy injected into the analog output when the input code to the DAC register changes. It is specified as the area of the glitch in nanovolt-seconds. INTEGRAL NON_LINEARITY (INL) is a measure of the deviation of each individual code from a straight line through the input to output transfer function. The deviation of any given code from this straight line is measured from the center of that code value. The end point method is used. INL for this product is specified over a limited range, per the Electrical Tables. LEAST SIGNIFICANT BIT (MSB) is the bit that has the smallest value or weight of all bits in a word. This value is LSB = VREF / 2n where VREF is the reference voltage for this product, and "n" is the DAC resolution in bits, which is 16 for the DAC161S055. MAXIMUM LOAD CAPACITANCE is the maximum capacitance that can be driven by the DAC with output stability maintained, although some ringing may be present. MONOTONICITY is the condition of being monotonic, where the DAC output never decreases when the input code increases. MOST SIGNIFICANT BIT (MSB) is the bit that has the largest value or weight of all bits in a word. Its value is 1/2 of VREF. OFFSET ERROR is the difference between zero voltage and a where a straight line fit to the actual transfer function intersects the y axis. SETTLING TIME is the time for the output to settle to within 1 LSB of the final value after the input code is updated. WAKE-UP TIME is the time for the output to recover after the device is commanded to the active mode from any of the power down modes. ZERO CODE ERROR is the output error, or voltage, present at the DAC output after a code of 0000h has been entered. Submit Documentation Feedback Copyright © 2010–2012, Texas Instruments Incorporated Product Folder Links: DAC161S055 9 DAC161S055 SNAS503B – NOVEMBER 2010 – REVISED JANUARY 2012 www.ti.com TYPICAL PERFORMANCE CHARACTERISTICS DNL at VA = 3.0V 0.75 0.75 0.50 0.50 0.25 0.00 -0.25 0.25 0.00 -0.25 -0.50 -0.50 -0.75 -0.75 -1.00 -1.00 0 16,384 32,768 49,152 65,536 0 32,768 49,152 OUTPUT CODE Figure 4. Figure 5. 0.75 0.50 0.50 INL (LSBs) 0.75 0.25 0.00 65,536 INL at VA = 5.0V 1.00 -0.25 0.25 0.00 -0.25 -0.50 -0.50 -0.75 -0.75 -1.00 -1.00 0 16,384 32,768 49,152 65,536 0 32,768 49,152 OUTPUT CODE Figure 6. Figure 7. DNL vs. Supply 65,536 INL vs. Supply 1.0 0.7 0.5 -DNL +DNL INL (LSBs) 0.4 16,384 OUTPUT CODE 0.8 INL (LSBs) 16,384 OUTPUT CODE INL at VA = 3.0V 1.00 INL (LSBs) DNL at VA = 5.0V 1.00 DNL (LSBs) DNL (LSBs) 1.00 0.2 0.0 -0.2 -0.4 -INL +INL 0.0 -0.5 -0.6 -0.8 2.65 10 3.30 3.95 4.60 5.25 -1.0 2.65 3.30 3.95 4.60 SUPPLY VOLTAGE (V) SUPPLY VOLTAGE (V) Figure 8. Figure 9. Submit Documentation Feedback 5.25 Copyright © 2010–2012, Texas Instruments Incorporated Product Folder Links: DAC161S055 DAC161S055 www.ti.com SNAS503B – NOVEMBER 2010 – REVISED JANUARY 2012 TYPICAL PERFORMANCE CHARACTERISTICS (continued) DNL vs. VREF, VA=5V INL vs. VREF, VA=5V 1.100 0.8 0.7 0.576 -DNL +DNL 0.2 -INL +INL INL (LSBs) DNL (LSBs) 0.4 0.0 0.051 -0.2 -0.4 -0.475 -0.6 -0.8 2.00 2.65 3.30 3.95 4.60 5.25 -1.000 2.00 2.65 3.30 3.95 4.60 5.25 VREF(V) VREF(V) Figure 10. Figure 11. DNL vs. Temperature, VA=5V, VREF=4.096 INL vs. Temperature, VA=5V, VREF=4.096 0.8 1.00 0.7 0.75 0.0 -0.2 0.25 -DNL +DNL 0.00 -0.25 -0.4 -0.50 -0.6 -0.75 -0.8 -50 -30 -10 10 30 50 70 90 110 -1.00 -50 -30 -10 10 30 50 70 90 110 4.4 ZERO CODE ERROR (mV) 0.50 -DNL +DNL INL (LSBs) 0.2 TEMPERATURE (°C) TEMPERATURE (°C) Figure 12. Figure 13. Zero Code Error vs. IOUT -0.08 VA=3V VA=5V Full Scale Error vs. IOUT VA=3V VA=5V FULL SCALE ERROR (%FS) DNL (LSBs) 0.4 -0.10 3.3 -0.12 2.2 -0.14 1.1 0.0 200 -0.16 400 600 800 1,000 -0.18 200 400 600 800 LOAD CURRENT ( A) LOAD CURRENT ( A) Figure 14. Figure 15. 1,000 Submit Documentation Feedback Copyright © 2010–2012, Texas Instruments Incorporated Product Folder Links: DAC161S055 11 DAC161S055 SNAS503B – NOVEMBER 2010 – REVISED JANUARY 2012 www.ti.com TYPICAL PERFORMANCE CHARACTERISTICS (continued) IVA vs VA 890 460 230 NO CLOCK, 5V CLOCKING, 5V NO CLOCK, 3.3V CLOCKING, 3.3V 790 740 690 0 3 4 5 640 -50 6 -10 Figure 16. Figure 17. IREF vs VREF VA CURRENT ( A) 380 240 120 110 IREF vs TEMPERATURE 335 NO CLOCK, 5V CLOCKING, 5V NO CLOCK, 3.3V CLOCKING, 3.3V 290 245 1.8 2.4 3.0 3.6 200 -50 4.2 -10 70 TEMPERATURE °C Figure 18. Figure 19. Settling Time 5 2.0 2.30 1.5 1.0 VOUT CSB 101 102 103 CSB (V) 2.5 OUTPUT VOLTAGE (V) 3.0 1.65 110 POR 3.5 2.95 1.00 100 30 SUPPLY VOLTAGE (VREF) 3.60 VOUT (V) 70 TEMPERATURE °C 0 0.5 0.0 104 TIME ( S) VA VOUT 4 3 2 1 0 0 10 20 30 40 TIME (ms) Figure 20. 12 30 SUPPLY VOLTAGE (VA) 360 SUPPLY CURRENT ( A) IVA vs TEMPERATURE 840 690 VA CURRENT ( A) SUPPLY CURRENT ( A) 920 Figure 21. Submit Documentation Feedback Copyright © 2010–2012, Texas Instruments Incorporated Product Folder Links: DAC161S055 DAC161S055 www.ti.com SNAS503B – NOVEMBER 2010 – REVISED JANUARY 2012 TYPICAL PERFORMANCE CHARACTERISTICS (continued) 5V Glitch Response 1.275 Mid Scale-1 to Mid Scale OUTPUT VOLTAGE (V) 1.270 1.265 1.260 1.255 1.250 1.245 1.240 2,000 2,500 3,000 3,500 4,000 TIME (ns) Figure 22. Submit Documentation Feedback Copyright © 2010–2012, Texas Instruments Incorporated Product Folder Links: DAC161S055 13 DAC161S055 SNAS503B – NOVEMBER 2010 – REVISED JANUARY 2012 www.ti.com FUNCTIONAL DESCRIPTION DAC ARCHITECTURE OVERVIEW The DAC161S055 uses a resistor array to convert the input code to an analog signal, which in turn is buffered by the rail-to-rail output amplifier. The resistor array is factory trimmed to achieve 16-bit accuracy. An SPI interface shifts the input codes into the device. The acquired input code is stored in the PREREG register. After the input code is transferred to the DACREG register it affects the state of the resistor array and the output level of the DAC. The transfer can be initiated by the type of write command used, by a software LDAC command or by the state of the LDACB pin. The user can control the power up state of the output using the MZB pin and the power down state of the output using the CONFIG register. Additionally, there are external pins and CONFIG register bits that also control clearing the DAC. NOTE Although the DAC161S055 is a single channel device, the instruction set is for multichannel DACs. The user must address channel 0 (A2,A1,A0={000}). OUTPUT AMPLIFIER The output buffer amplifier is a rail to rail type which buffers the signal produced by the resistor array and drives the external load. All amplifiers, including rail to rail amplifiers, exhibit a loss of linearity as the output nears the power rails (in this case GND and VA). Thus the linearity of the part is specified over less than the full output range. The user can program the CONFIG register to power down the amplifier and either place it in the high impedance state (HiZ), or have the output terminated by an internal 10 kΩ pull-down resistor. REFERENCE An external reference source is required to produce an output. The reference input is not internally buffered and presents a resistive load to the external source. Loading presented by the VREF pin varies by about 12.5% depending on the input code. Thus a low impedance reference should be used for best results. SERIAL INTERFACE The 4-wire interface is compatible with SPI, QSPI and MICROWIRE, as well as most DSPs. See the TIMING DIAGRAMS for timing information about the read and write sequences. The serial interface is the four signals CSB, SCLK, SDI and SDO. A bus transaction is initiated by the falling edge of the CSB. Once CSB is low, the input data is sampled at the SDI pin by the rising edge of the SCLK. The output data is put out on the SDO pin on the falling edge of SCLK. At least 24 SCLK cycles are required for a valid transfer to occur. If CSB is raised before 24th rising edge of the SCLK, the transfer is aborted. If the CSB is held low after the 24th falling edge of the SCLK, the data will continue to flow through the FIFO and out the SDO pin. Once CSB transitions high, the internal controller will decode the most recent 24 bits that were received before the rising edge of CSB. The DAC will then change state depending on the instruction sent and the state of the LDACB pin. CSB SCLK 1 2 3 4 SDI D23 D22 D21 D20 23 D1 24 D0 HiZ SDO 14 HiZ Preceeding Transfer Data Submit Documentation Feedback Copyright © 2010–2012, Texas Instruments Incorporated Product Folder Links: DAC161S055 DAC161S055 www.ti.com SNAS503B – NOVEMBER 2010 – REVISED JANUARY 2012 The acquired data is shifted into an internal 24 bit shift register (MSB first) which is configured as a 24 bit deep FIFO. As the data is being shifted into the FIFO via the SDI pin, the prior contents of the register are being shifted out through the SDO output. While CSB is high, SDO is in a high-Z state. At the falling edge of CSB, SDO presents the MSB of the data present in the shift register. SDO is updated on every subsequent falling edge of SCLK (note — the first SDO transition will happen on the first falling edge AFTER the first rising edge of SCLK when CSB is low). The 24 bits of data contained in the FIFO are interpreted as an 8 bit COMMAND word followed by 16 bits of DATA. The general format of the 24 bit data stream is shown below. The full Instruction Set is tabulated in Section INSTRUCTION SET. CSB SDI COMMAND 8 bits DATA 16 bits 1.4.1 SPI Write SPI write operation is the simplest transaction available to the user. There is no handshaking between master and the slave (DAC161S055), and the master is the source of all signals required for communication: SCLK, CSB, SDI. The format of the data transfer is described in the section 1.4. The user instruction set is shown in Section INSTRUCTION SET. SPI Read The read operation requires all 4 wires of the SPI interface: SCLK, SCB, SDI, SDO. The simplest READ operation occurs automatically during any valid transaction on the SPI bus since SDO pin of DAC161S055 always shifts out the contents of the internal FIFO. Therefore the user can verify the data being shifted in to the FIFO by initiating another transaction and acquiring data at SDO. This allows for verification of the FIFO contents only. The 3 internal registers (PREREG, DACREG, CONFIG) can be accessed by the user through the Register Read commands: RDDO, RDIN, RDCO respectively (see Section INSTRUCTION SET). These operations require 2 SPI transaction to recover the register data. The first transaction shifts in the Register Read command; an 8 bit command byte followed by 16 bit “dummy” data. The Register Read command will cause the transfer of contents of the internal register into the FIFO. The second transaction will shift out the FIFO contents; an 8 bit command byte (which is a copy of previous transaction) followed by the register data. The Register Read operation is shown in the figure below. CSB SDI SDO HiZ RDDO/RDCO/RDIN 8 bits 'RQ¶W &DUH 16 bits Prior Command 8 bits Prior Data 16 bits Next Command 8 bits HiZ RDDO/RDCO/RDIN 8 bits Next Data 16 bits REG DATA 16 bits HiZ SPI Daisy Chain It is possible to control multiple DACs or other SPI devices with a single master equipped with one SPI interface. This is accomplished by connecting the DACs in a Daisy Chain. The scheme is depicted in the figure below. An arbitrary length of the chain and an arbitrary number of control bits for other devices in the chain is possible since individual DAC devices do not count the data bits shifted in. Instead, they wait to decode the contents of their respective shift registers until CSB is raised high. A typical bus cycle for this scheme is initiated by the falling CSB. After the 24 SCLK cycles new data starts to appear at the SDO pin of the first device in the chain, and starts shifting into the second device. After 72 SCLK cycles following the falling CSB edge, all three devices in this example will contain new data in their input shift registers. Raising CSB will begin the process of decoding data in each DAC. When in the Daisy Chain the full READ and WRITE capability of every device is maintained. Submit Documentation Feedback Copyright © 2010–2012, Texas Instruments Incorporated Product Folder Links: DAC161S055 15 DAC161S055 SNAS503B – NOVEMBER 2010 – REVISED JANUARY 2012 www.ti.com SYNC CLK (1) (2) (3) SPI/QSPI MICROWIRE CSB CSB CSB MASTER SCLK SCLK SCLK SDI MOSI SDO DAC161S055 SDI SDO SDI DAC161S055 SDO DAC161S055 MISO A sample of SPI data transfer appropriate for a 3 DAC Daisy Chain is shown in the figure below. 72 Clock Cycles SYNC MOSI DATA (3) DATA (2) DATA (1) POWER-UP DEFAULT OUTPUT It is possible to power up the DAC with the output either at GND or midscale. This functionality is achieved by connecting the MZB pin either to GND or to VA (note, the MZB pin is referenced to VA, not VDDIO). Usually this function is hardwired in the application, but can also be controlled by a GPIO pin of the µC. To power up with output at zero, tie the MZB pin low. To power up with output at midscale, tie MZB high. The MZB pin is level sensitive. CHANGING DAC OUTPUT There are multiple different ways to affect the DAC output. The CONFIG register can be changed so that a write to the PREREG is seen instantly at the output. The LDAC function or LDACB pin updates the output instantly. Finally, the type of write command (WRUP, WRAL, WR) can affect if the output updates instantly or not. Write-Through and Write-Block Modes Using the SWB bit of the CONFIG register, the user can set the part in WRITE-BLOCK or WRITE-THROUGH mode. If the DAC channel is configured in the WRITE-BLOCK mode (SWB=0, default), the DAC input DATA is held in the PREREG until the controller forces the transfer of DATA from PREREG to DACREG register. Only DATA in DACREG register is converted to the equivalent analog output. The transfer from PREREG into DACREG can be forced by both software and hardware LDAC commands. The Data Writing commands WRUP and WRAL update both PREREG and DACREG at the same time regardless of the channel mode. WRITE-BLOCK mode is used in multi device or multi channel applications. A user can preload all DAC channels with desired data, in multiple SPI transactions, and then issue a single software LDAC command (or toggle the LDACB pin) to simultaneously update all analog outputs. If the DAC channel is configured in WRITE-THROUGH mode (SWB=1) the controller updates both PREREG and DACREG registers simultaneously. Therefore in WRITE-THROUGH mode the channel output is updated as soon as the SPI transfer is completed i.e. upon the rising edge of CSB. LDAC Function The LDACB (Load DAC) pin provides a easy way to synchronize several DACs and update the output without any SPI latency. If the LDACB is asserted low, the content of the PREREG register is instantaneously moved into the DACREG register. The LDACB pin is level sensitive. If the LDACB pin is held low continuously, the DAC output will update as soon as the CSB pin goes high. 16 Submit Documentation Feedback Copyright © 2010–2012, Texas Instruments Incorporated Product Folder Links: DAC161S055 DAC161S055 www.ti.com SNAS503B – NOVEMBER 2010 – REVISED JANUARY 2012 CSB SCLK 2 1 3 4 23 24 LDACB LDACB must not transition here (may be held low for whole transaction) The DAC Configuration command LDAC (see Section INSTRUCTION SET below) will also update the DAC output as soon as it is received. The effect of hardware LDACB or software LDAC is the same i.e. data is transferred from the PREREG to DACREG and output of the DAC is updated. Write Commands There are three write commands available in the DAC command set. Issuing a WR command causes the DAC to update either the PREREG or the DACREG depending on the setting of the SWB bit (see Section Write-Through and Write-Block Modes). Issuing a WRUP command causes the specified channels output (for multiple channel parts) to update immediately, regardless of the SWB bit setting. Issuing a WRAL command causes all channels (for multiple channel parts) to update immediately with the same data, regardless of the SWB bit setting. CLEAR FUNCTION The CLRB pin provides a easy way to reset the DAC161S055 output. If the CLRB pin goes low, VOUT instantaneously slews to the value indicated by the MZB pin, either zero or midscale. The CLRB pin is level sensitive. CSB SCLK 1 2 3 4 23 24 CLRB CLRB must not be asserted here Clear function can also be accessed via the software instruction CLR, see Section INSTRUCTION SET below. The effect of hardware CLRB or software CLR is the same. POWER ON RESET An on-chip power on reset circuit (POR) ensures that the DAC always powers on in the same state. The registers will be loaded with the defaults shown in Section INSTRUCTION SET. The output state will be controlled by the state of the MZB pin. POWER DOWN Power down is achieved by writing the PD instruction and setting the appropriate bit to a logic '1'. In the PD command, it is possible to specify if the output is left in a high impedance (HIZ) state or if it is pulled to GND through a 10K resistor. During power down, the output amplifier is disabled and the resistor ladder is disconnected from Vref. The SPI interface remains active. To exit power down, write the PD command again, setting the appropriate bit to a logic '0'. Note that the SPI interface and the registers are all active during power down. Submit Documentation Feedback Copyright © 2010–2012, Texas Instruments Incorporated Product Folder Links: DAC161S055 17 DAC161S055 SNAS503B – NOVEMBER 2010 – REVISED JANUARY 2012 www.ti.com INTERNAL REGISTERS There are 3 registers that are accessible to the user. The data registers (PREREG and DACREG) are both readable and writable from the command set. The CONFIG register is only readable from the command set. Bits in the CONFIG register are set by the commands detailed in Section INSTRUCTION SET. MSB LSB Bit15–0: MSB LSB Bit15–0: LSB Bit7–3: Bit2: Bit1: Bit0: 18 PREREG: DAC Preload Data Register(16Bits) R/W R/W R/W R/W R/W R/W R/W R/W PRD15 PRD14 PRD13 PRD12 PRD11 PRD10 PRD9 PRD8 Bit15 Bit14 Bit13 Bit12 Bit11 Bit10 Bit9 Bit8 R/W R/W R/W R/W R/W R/W R/W R/W PRD7 PRD6 PRD5 PRD4 PRD3 PRD2 PRD1 PRD0 Bit7 Bit6 Bit5 Bit4 Bit3 Bit2 Bit1 Bit0 16 16 bit data word to be converted. Bit 15 has a weight of 1/2*Vref. Bit 0 has a weight of Vref/2 . DACREG: DAC Output Data Register(16Bits) R/W R/W R/W R/W R/W R/W R/W R/W IND15 IND14 IND13 IND12 IND11 IND10 IND9 IND8 Bit15 Bit14 Bit13 Bit12 Bit11 Bit10 Bit9 Bit8 R/W R/W R/W R/W R/W R/W IND7 IND6 IND5 IND4 IND3 IND2 R/W IND1 R/W IND0 Bit7 Bit6 Bit5 Bit4 Bit3 Bit2 Bit1 Bit0 16 16 bit data word to be converted. Bit 15 has a weight of 1/2*Vref. Bit 0 has a weight of Vref/2 . CONFIG: DAC Configuration Reporting Register (8 Bits) R/W R/W R/W R/W R/W R/W R/W R/W IND7 IND6 IND5 IND4 IND3 IND2 IND1 IND0 Bit7 Bit6 Bit5 Bit4 Bit3 Bit2 Bit1 Bit0 Reserved. Read value is undefined and should be discarded. SWB: Set Write Block bit 0: Channel is in WRITE THROUGH mode. 1: Channel is in WRITE BLOCK mode. 0: Channel is either active or SEL_HIZ is set. 1: Channel is powered down and output is terminated by a 10K resistor to GND. 0: Channel is either active or SEL_10K is set. 1: Channel is powered down and output is in high impedance state. Submit Documentation Feedback Copyright © 2010–2012, Texas Instruments Incorporated Product Folder Links: DAC161S055 DAC161S055 www.ti.com SNAS503B – NOVEMBER 2010 – REVISED JANUARY 2012 INSTRUCTION SET The instruction set for the DAC161S055 is common to the family of single and multi channel devices (DAC16xS055). The DAC161S055 has only a single channel — Channel 0. NOTE DATA WRITING and REGISTER READING instructions encode the channel address as a binary triplet (A2,A1,A0) as the last three LSBs of the command byte. DAC CONFIGURATION instructions encode the channel selection by a bit set in the data bytes. For example, when executing the LDAC instruction a payload of {0100 0001} in the least significant byte of the instruction indicates channels 6 and 0 are targeted. MNEMONIC Command Byte[7:0] DATA[15:8] DATA [7:0] Description DEFAULT DAC Configuration NOP 0 0 0 0 0 0 0 0 xxxx xxxx xxxx xxxx No Operation CLR 0 0 0 0 0 0 0 1 xxxx xxxx xxxx xxxx Clear internal registers, return to Power-Up default state LDAC 0 0 0 1 1 0 0 0 xxxx xxxx CHANNEL[7:0] Software LOAD DAC. A '1' causes data stored in the specified channel's PREREG to be transferred to DACREG and the output updated. SWB 0 0 1 0 1 0 0 0 xxxx xxxx CHANNEL[7:0] Set WRITE BLOCK or WRITE THROUGH for the selected channels. 00FFh 0: WRITE THROUGH 1: WRITE BLOCK PD 0 0 1 1 0 0 0 0 CHANNEL[7:0] CHANNEL[7:0] Sets SEL_10K or SEL_HIZ. Upper 8 bits PD Hi-Z; 0000h Lower 8-bits PD 10K; if both are 1's; PD -> 10K 1: Upper 8 bits: SEL_HIZ 1: Lower 8 bits: SEL_10K 1: Both upper and lower: SEL_10K Data Writing WR 0 0 0 0 1 A2 A1 A0 DACDATA[15:8] DACDATA[7:0] Write to specified channel. WRITE BLOCK or WRITE TRHOUGH setting controls destination register (PREREG or DACREG). WRUP 0 0 0 1 0 A2 A1 A0 DACDATA[15:8] DACDATA[7:0] Update specified channel's DACREG and PREREG regardless of WRITE BLOCK or WRITE THROUGH setting. WRAL 0 0 1 0 0 0 0 0 DACDATA[15:8] DACDATA[7:0] Update all channel's DACREG and PREREG regardless of WRITE BLOCK or WRITE THROUGH setting. <Reserved> 1 0 0 0 0 x x x RDDO 1 0 0 0 1 A2 A1 A0 DACDATA[15:8] DACDATA[7:0] Register Reading <Reserved> Read PREREG register. Submit Documentation Feedback Copyright © 2010–2012, Texas Instruments Incorporated Product Folder Links: DAC161S055 19 DAC161S055 SNAS503B – NOVEMBER 2010 – REVISED JANUARY 2012 MNEMONIC www.ti.com Command Byte[7:0] DATA[15:8] RDCO 1 0 0 1 0 A2 A1 A0 0000 0000 RDIN 1 0 0 1 1 A2 A1 A0 DACDATA[15:8] 20 DATA [7:0] Description 0000 0,swb,sel_10k, sel_hiz Read CONFIG register. DACDATA[7:0] Read DACREG register. Submit Documentation Feedback DEFAULT 0004h Copyright © 2010–2012, Texas Instruments Incorporated Product Folder Links: DAC161S055 DAC161S055 www.ti.com SNAS503B – NOVEMBER 2010 – REVISED JANUARY 2012 APPLICATIONS INFORMATION SAMPLE INSTRUCTION SEQUENCE The following table shows an example instruction sequence to illustrate the usage of different modes of operation of the DAC. This sequence is for a one channel DAC. Step Instruction 8-bit Command 16 bit Payload Comments 1 CLR 0000 0001 0000 0000 0000 0000 Clear device - return to Power-Up Default State 2 WR 0000 1000 0100 0000 0000 0000 Write 1/4 FS into channel 0. Since device by default is in WRITE-BLOCK mode the data will be written into PREREG, and DAC output will not update 3 LDAC 0001 1000 xxxx xxxx 0000 0001 Issue LDAC command to channel 0. Data is transferred from PREREG into DACREG and DAC output updates to 1/4 FS 4 SWB 0010 1000 xxxx xxxx 1111 1110 Set channels 1 to 7 to WRITE-BLOCK mode, and channel 0 to WRITE-THROUGH mode 5 WR 0000 1000 1111 1111 1111 1111 DAC output updates immediately to FS since the channel is set to write through mode. 6 PD 0011 0000 0000 0001 0000 0000 Power down the device, and set the channel 0 DAC output to the HIZ state USING REFERENCES AS POWER SUPPLIES Although the DAC has a separate reference and analog power pin, it is still possible to use a reference to drive both. This arrangement will avoid a separate voltage regulator for VA and will provide a more stable voltage source. The LM4140 has an initial accuracy of 0.1%, is capable of driving 8mA and comes in a 4.096V version. Bypassing both the input and the output will improve noise performance. Input Voltage LM41204.096 C3 0.022 PF C2 0.022 PF C1 0.1 PF VREF VA DAC161S055 CSB VOUT = 0V to 4.095V SDI SCLK SDO Figure 23. Using the LM4120 as a power supply A LOW NOISE EXAMPLE A LM4050 powered off of a battery is a good choice for very low noise prototype circuits. The minimum value for R must be chosen so that the LM4050 does not draw more than its 15mA rating. Note the largest current through the LM4050 will occur when the DAC is shutdown. The maximum resistor value must allow the LM4050 to draw more than its minimum current for regulation plus the maximum VREF current. 4.5V Battery (3 AA) 9V Battery R VZ 0.47 PF LM4050-4.1 VREF VA DAC161S055 CSB VOUT SDI SCLK SDO Figure 24. Using the LM4050 in a low noise circuit Submit Documentation Feedback Copyright © 2010–2012, Texas Instruments Incorporated Product Folder Links: DAC161S055 21 DAC161S055 SNAS503B – NOVEMBER 2010 – REVISED JANUARY 2012 www.ti.com LAYOUT, GROUNDING AND BYPASSING For best accuracy and minimum noise, the printed circuit board containing the DAC should have separate analog and digital areas. These areas are defined by the locations of the analog and digital power planes. Both power planes should be in the same board layer. There should be a single ground plane. Frequently a single ground plane design will utilize a fencing technique to prevent the mixing of analog and digital ground currents. Separate ground planes should only be used if the fencing technique proves inadequate. The separate ground planes must be connected in a single place, preferably near the DAC. Special care is required to specify that digital signals with fast edge rates do not pass over split ground planes. The fast digital signals must always have a continuous return path below their traces. When possible, the DAC power supply should be bypassed with a 10µF and a 0.1µF capacitor placed as close as possible to the device with the 0.1µF closest to the supply pin. The 10µF capacitor should be a tantalum type and the 0.1µF capacitor should be a low ESL, low ESR type. Sometime, the loading requirements of the regulator driving the DAC do not allow such capacitance to be placed on the regulator output. In those cases, bypass should be as large as allowed by the regulator using a low ESL, low ESR capacitance. In the LM4120 example above, the supply is bypassed with 0.022µF ceramic capacitors. The DAC should be fed with power that is only used for analog circuits. Avoid crossing analog and digital signals and keep the clock and data lines on the component side of the board. The clock and data lines should have controlled impedances. 22 Submit Documentation Feedback Copyright © 2010–2012, Texas Instruments Incorporated Product Folder Links: DAC161S055 PACKAGE OPTION ADDENDUM www.ti.com 11-Apr-2013 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Pins Package Drawing Qty Eco Plan Lead/Ball Finish (2) MSL Peak Temp Op Temp (°C) Top-Side Markings (3) (4) DAC161S055CISQ/NOPB ACTIVE WQFN RGH 16 1000 Green (RoHS & no Sb/Br) CU SN Level-3-260C-168 HR -40 to 105 161S055 DAC161S055CISQE/NOPB ACTIVE WQFN RGH 16 250 Green (RoHS & no Sb/Br) CU SN Level-3-260C-168 HR -40 to 105 161S055 DAC161S055CISQX/NOPB ACTIVE WQFN RGH 16 4500 Green (RoHS & no Sb/Br) CU SN Level-3-260C-168 HR -40 to 105 161S055 (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability information and additional product content details. TBD: The Pb-Free/Green conversion plan has not been defined. Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes. Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above. Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material) (3) MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature. (4) Multiple Top-Side Markings will be inside parentheses. Only one Top-Side Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation of the previous line and the two combined represent the entire Top-Side Marking for that device. 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Addendum-Page 1 Samples PACKAGE MATERIALS INFORMATION www.ti.com 26-Mar-2013 TAPE AND REEL INFORMATION *All dimensions are nominal Device Package Package Pins Type Drawing DAC161S055CISQ/NOPB WQFN SPQ Reel Reel A0 Diameter Width (mm) (mm) W1 (mm) B0 (mm) K0 (mm) P1 (mm) W Pin1 (mm) Quadrant RGH 16 1000 178.0 12.4 4.3 4.3 1.3 8.0 12.0 Q1 DAC161S055CISQE/NOP B WQFN RGH 16 250 178.0 12.4 4.3 4.3 1.3 8.0 12.0 Q1 DAC161S055CISQX/NOP B WQFN RGH 16 4500 330.0 12.4 4.3 4.3 1.3 8.0 12.0 Q1 Pack Materials-Page 1 PACKAGE MATERIALS INFORMATION www.ti.com 26-Mar-2013 *All dimensions are nominal Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm) DAC161S055CISQ/NOPB WQFN RGH 16 1000 213.0 191.0 55.0 DAC161S055CISQE/NOP B WQFN RGH 16 250 213.0 191.0 55.0 DAC161S055CISQX/NOP B WQFN RGH 16 4500 367.0 367.0 35.0 Pack Materials-Page 2 MECHANICAL DATA RGH0016A SQA16A (Rev A) www.ti.com IMPORTANT NOTICE Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, enhancements, improvements and other changes to its semiconductor products and services per JESD46, latest issue, and to discontinue any product or service per JESD48, latest issue. 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