ETC QA-1000HC

QA-1000HC
Full Featured Programmable
Analog Supply Current
Monitor
APPLICATIONS
FEATURES
Wide IDDX Measurement BW: 0 – 5 MHz
High IDDX resolution: 300 µARMS
High IDDX Measurement Range: 0 – 2 A
High Loading Capacitance: 0 – 100 µF
Low internal resistance: 25mΩ
Continuous Analog Supply Current Measurement
Static and transient Analog Supply Current
Measurements
Positive and negative supply and ground current
measurement
Analog Current Measurements
DESCRIPTION
The QA-1000HC is a configurable analog supply
current monitor, designed for loadboard applications. Its
low internal resistance ensures its transparency (causing
only a negligible voltage drop when inserted into the supply
or ground path of the device under test). The module is
designed to be inserted between the DUT supply provided
by the ATE and the supply pin of the DUT or between
ground and DUT ground. The VDUT supply can be positive
or negative (VDD/VCC or VSS/VEE).
The QA-1000HC is designed to accurately measure analog (supply) currents up to 2A (upon demand
the range can be adapted to 100mA, 200mA, 500mA, 1A or 5A), thereby providing a high
measurement repeatability. The monitor has a bandwidth of 5MHz, offers a resolution of 300µA @2A,
and is capable to drive high capacitive loads up to 100uF. The resolution and performance of the
monitor is a function of the selected bandwidth and the value of the loading capacitance CL (the DUT
local on-pin supply decoupling capacitance).
GND
DUT
L
DUT
DUT
SUPPLY
VEE
VDUT
VCC
The QA-1000HC has no digital control pins. It measures continuously and relies for further signal
processing and decision making on the capabilities of the mixed-signal ATE. The QA-1000HC
provides an analog output voltage, corresponding to the measured current. The figure shows a block
diagram of the QA-1000HC as well as a typical application diagram. The output has a 50Ω impedance
for optimum RF performance. The low resistive output can be customised when AF performance is
preferred.
The QA-1000HC consists of 2 active units, a
measurement unit (MU) and a processing unit (PU). The
SUPPLY
measurement unit is a fast and sensitive current
measurement device that converts the measured analog
current in a corresponding voltage. The processing unit is
QA-1000HC
configurable and provides amplification and filtering
VIDD
PU
MU
functionality. The QA-1000HC has a low internal resistance
between its VDUT and DUT terminals, therefore the
voltage at the DUT terminal closely follows the supply
C
voltage applied at its VDUT terminal within a -7V to +7V
range. The QA-1000HC has a broad application range.
ATE
Examples are the application to high-power ICs and during
TEST V ECT ORS
voltage stress test applications. By using two QA-1000-HC
monitors, supply currents of analog DUTs with
(symmetrical) +/- supply can also be measured
simultaneously.
© Q-Star Test nv, 2003
Revision C - page 1 of 6
L.Bauwensstraat 20, B-8200 Brugge, Belgium, Tel.: +32 50 319273, Fax: +32 50 312350, http://www.Qstar.be
QA-1000HC
ELECTRICAL SPECIFICATIONS
Measured at VDUT=+5.00V, VCC= +12.0V, VEE= -12.0V, T=20°C
SYMBOL PARAMETER
CONDITION
MIN
TYP
+11.5
-11.5
+12
-12
+12
-12
MAX UNITS
Power Supply
VCC
VEE
ICCQ
IEEQ
Positive Supply Voltage
Negative Supply Voltage
Quiescent Supply Current
Quiescent Supply Current
@ IDUT=0mA
@ IDUT=0mA
+16
-16
+40
-40
V
V
mA
mA
Input Range
IDUT
DUT Supply Current
VDUT
IVDUT
DUT Supply Voltage (1)
Input Bias Current
0
2
A
-7.0
+7.0
2
V
µA
DC Accuracy
∆IDUT Resolution
(2)
@ CL=100nF, f-3dB=50kHz
@ CL=100nF, f-3dB=500kHz
@ CL=100nF, f-3dB=5MHz
0.3
1
2
2
Measurement Offset
Gain error
I/V Conversion Ratio
I/V
0.1
2.5
5
mARMS
mARMS
mARMS
mA
0.5
%
mV/mA
AC Characteristics
IDUT –3dB bandwidth
SR
THD
Slew Rate
Total Harmonic Distortion
@ CL=100nF, JP2,3=OFF
@ CL=100nF, JP2=ON, JP3=OFF
@ CL=100nF, JP2=OFF, JP3=ON
@ CL=100nF, JP2,3=OFF
@ CL=100nF
5000
500
50
TBD
TBD
kHz
kHz
kHz
V/µs
dB
DUT Output
IDUT
CL
DUT current
Loading Capacitance CL
-2
0
2
100
A
uF
Internal Resistance
Between DUT & VDUT
DUT – VDUT voltage drop
(1)
(2)
25
50
@ IDUT=2A
mΩ
mV
The VDUT pin must be permanently connected to a voltage source and must notbe left floating.
Considering clean supplies and no external noise pick up at VDUT/DUT terminals such as switching noise from ATE power
supply.
ABSOLUTE MAXIMUM RATINGS
Parameter
VCC
VEE
VDUT
IDUT
Operating Temperature Range
Storage Temperature
Lead Temperature (10sec) (1)
(1)
With Respect To
Min
Max
GND
GND
GND
GND
-0.3
-18
-0.3
-3
0
-40
+18
+0.3
10
3
+70
+80
+220
Units
V
V
V
A
°C
°C
°C
Manual soldering is recommended using standard eutectic Sn63Pb solder.
NOTE: Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a
stress rating only; functional operation of the device at these or other conditions above those indicated in the operational sections
of this specification is not implied. Exposure to absolute maximum ratings for extended periods may affect device reliability.
© Q-Star Test nv, 2003
Revision C - page 2 of 6
Due to continuous pursuit of innovation, the technical specifications listed are subject to change without notice.
QA-1000HC
CONFIGURING THE QA-1000HC
The processing unit of the QA-1000HC is configurable by
making the proper pin (jumper) connections. A set of
jumpers (JP2&3) determines the filter characteristics,
allowing to select the actual bandwidth (5MHz, 500kHz or
50kHz) in function of desired speed and accuracy. These
configurations can be changed upon request. More
information on how to configure the QA-1000HC can be
found in application note AN0024.
State
ON
JP
JP2
(1) (2)
500 kHz
JP3 (1) (2)
(1)
(2)
OFF
5 MHz
50 kHz
Setting of bandwidth
JP2 and JP3 must be closed exclusively, only one of
them might be closed for a given configuration.
CALIBRATION
Due to component tolerances and potential leakage currents caused by the test set-up (e.g. PMU
channel connected to DUT terminal), the current-to-voltage ratio (I/V) of the QA-1000HC can differ
from module to module and/or test set-up to test set-up. Therefore, to perform accurate
measurements, a calibration of each module in relation to the test set-up used is recommended. Once
the module has been calibrated, there is no need to repeat this procedure for every application
provided the measurement conditions remain. The calibration of the QA-1000HC can be easily
performed as the module has a linear transfer characteristic. More information on how to calibrate the
QA-1000HC module can be found in application note AN0025.
APPLICATION
The QA-1000HC should be placed as close as possible to the DUT. All connections to the QA1000HC should be well designed not to degrade the monitor’s accuracy. The QA-1000HC's power-on
delay time is about 1 second. The VDUT pin must be permanently connected to a voltage source (0V7V) and not left floating. Although the monitor has a very high ripple rejection ratio even at RF, the
ATE should deliver a good quality VDUT reference signal (DUT supply voltage reference) for the DUT.
The value of the on-pin decoupling capacitance (CL) is preferable in the 100pF – 1uF range, higher
values can be handled but decrease the monitor’s measurement bandwidth. Global decoupling
capacitors should be placed at the VDUT side of the monitor if RF operation of VDUT is not needed.
All possible application diagrams are shown below.
9
JP3
NC
JP23
7
11
VDUT
DUT
6
12
VDUT
14
GND
DUT
15
VDUT
5
16
VIDD
VCC
9
JP3
VEE
10
NC
4
11
VDUT
JP2
8
GND
DUT
3
2
100nF
NC
JP23
7
1
DUT
6
JP2
DUT
5
8
VEE
4
- 15V
- 15V
CL
DUT
VDD / VEE
GND
VDD / VEE
CL
DUT
GND
DUT
3
2
QA-1000HC
100nF
NC
1
QA-1000HC
13
100nF
12
14
GND
VDUT
15
VDUT
13
16
VIDD
+ 15V
To analog
ATE input
VCC
100nF
+ 15V
To analog
ATE input
ATE DUT Supply
100nF
100nF
+
10
ATE DUT Supply
47µF
+
2A RANGE, 500 kHz BANDWIDTH
47µF
2A RANGE, 5 MHz BANDWIDTH
GND
© Q-Star Test nv, 2003
Revision C - page 3 of 6
Due to continuous pursuit of innovation, the technical specifications listed are subject to change without notice.
QA-1000HC
2A RANGE, 50 kHz BANDWIDTH
ATE DUT Supply
NC
JP23
7
9
11
VDUT
DUT
6
12
DUT
5
VDUT
13
VCC
14
GND
VEE
15
VDUT
4
16
VIDD
JP3
+ 15V
To analog
ATE input
10
100nF
47µF
+
JP2
8
GND
DUT
3
2
100nF
NC
1
QA-1000HC
- 15V
DUT
VDD / VEE
CL
GND
PIN DESCRIPTION
The QA-1000HC has a standard 16 pins wide DIL footprint.
Pin #
Name
Type
Function
1
2
NC
DUT
O
Not Connected
DUT supply pin
3
4
5
GND
VEE
DUT
S
S
O
Monitor ground
Monitor negative supply pin ( -12V)
DUT supply pin
6
7
DUT
JP23
O
C
DUT supply pin
Monitor configuration pin – common pin for JP2 and JP3
C
Monitor configuration pin – JP2
JP2 and JP3 allow selecting the bandwidth of the module. If both JP2 and JP3 are
open (NOT connected) then the monitor operates with maximum bandwidth
(5MHz).
If JP2 is closed (JP2 shortened to JP23) then the bandwidth is limited to about
500kHz
C
Monitor configuration pin – JP3
JP2 and JP3 allow setting the bandwidth of the module. If both JP2 and JP3 are
open (NOT connected) then the monitor operates with maximum bandwidth
(5MHz).
If JP3 is closed (JP3 shortened to JP23) then the bandwidth is limited to about
50kHz
8
JP2
(1)(2)
(1)(2)
9
JP3
10
11
NC
(3)
VDUT
12
13
14
VDUT
VCC
GND
15
16
VDUT
VIDD
I
Not Connected
DUT supply reference input
(3)
I
S
S
DUT supply reference input
Monitor positive supply pin (+12V)
Monitor ground
(3)
I
O
DUT supply reference input
Analog IDD output voltage
(1) JP2 and JP3 should be closed exclusively, only one of them might be closed for a given configuration, they must
not be closed at the same time (if not, cut off frequency will be 45kHz instead of 50kHz).
(2) For optimum performance, the connection between JP2-JP23 or JP3-JP23 must be as short as possible.
(3) The VDUT pin must be permanently connected to a voltage source and must not be left floating.
© Q-Star Test nv, 2003
Revision C - page 4 of 6
Due to continuous pursuit of innovation, the technical specifications listed are subject to change without notice.
9
JP3
NC
JP23
7
10
VDUT
DUT
6
VDUT
DUT
5
11
12
13
VCC
VEE
4
14
GND
GND
3
15
VDUT
DUT
2
16
VIDD
QA-1000HC
p
Top View
JP2
8
1
NC
QA-1000HC
Land Pattern Recommendation
e
d2
p
d1
W2 W1
1
W2
E2
E1
L
Side View
MAX
Component Area
H3
H2
H1
SEATING PLANE
d3
d4
p
Unit
W1
W2
L
P
d1
d2
d3
d4
inches
0.700
0.600
1.525
0.10
0.035
0.067
0.020
0.039
mm
17.80
15.24
38.735
2.54
0.90
1.70
0.50
1.00
Unit
H1
H2
H3
E1
E2
e
inches
0.591
0.453
0.335
0.375
0.450
0.050
mm
15.00
11.50
8.50
9.525
11.43
1.27
© Q-Star Test nv, 2003
Revision C - page 5 of 6
Due to continuous pursuit of innovation, the technical specifications listed are subject to change without notice.
QA-1000HC
LIST OF APPLICATION NOTES
A series of applications notes concerning the QA-1000HC is listed below:
AN0024
AN0025
Performing measurements with the QA-1000HC
Calibrating the QA-1000HC
Information furnished by Q-Star Test is believed to be accurate and reliable. However, no
responsibility is assumed by Q-Star Test for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. No license is granted by implication or otherwise
under any patent or patent rights of Q-Star Test.
© Q-Star Test nv, 2003
Revision C - page 6 of 6
Due to continuous pursuit of innovation, the technical specifications listed are subject to change without notice.