LIGITEK LSBKSUG2662-R1

LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
BIPOLAR TYPE LED LAMPS
Pb
Lead-Free Parts
LSBKSUG2662/R1
DATA SHEET
DOC. NO :
QW0905- LSBKSUG2662/R1-0908
REV.
:
A
DATE
:
21 -Oct. - 2009
發行
立碁電子
DCC
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
Page 1/8
PART NO. LSBKSUG2662/R1
Package Dimensions
2.9
3.3
3.1
4.3
1.5MAX
Green
25.0MIN
□0.5
TYP
SBKS
1
1.0MIN
2.54TYP
1
2
Note : 1.All dimension are in millimeter tolerance is ±0.25mm unless otherwise noted.
2.Specifications are subject to change without notice.
Directivity Radiation
0°
-30°
30°
-60°
100% 75% 50%
60°
25%
0
25% 50% 75% 100%
2
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Page 2/8
PART NO. LSBKSUG2662/R1
Absolute Maximum Ratings at Ta=25 ℃
Ratings
Symbol
Parameter
UNIT
SBKS
Green
Forward Current
IF
30
25
mA
Peak Forward Current
Duty 1/10@10KHz
IFP
100
75
mA
Power Dissipation
PD
120
65
mW
Ir
50
10
μA
Electrostatic Discharge( * )
ESD
500
2000
V
Operating Temperature
Topr
-20 ~ +80
℃
Storage Temperature
Tstg
-30 ~ +100
℃
Reverse Current @5V
Static Electricity or power surge will damage the LED. Use of a conductive wrist band or anti-electrosatic
* glove
is recommended when handing these LED. All devices, equipment and machinery must be properly
grounded.
Typical Electrical & Optical Characteristics (Ta=25 ℃)
COLOR
PART NO
MATERIAL
Emitted
GaAsP/GaP
Blue
GaP
Green
LSBKSUG2662/R1
Peak Spectral
wave halfwidth
length △λ nm
λPnm
Forward
voltage
@20mA(V)
Luminous
intensity
Viewing
angle
@ 20 mA(mcd) 2 θ 1/2
(deg)
Min. Typ. Max. Min.
Lens
Max.
475
26
--- 3.5 4.2
65
350
100
574
20
1.7
---
28
160
100
White Diffused
Note : 1.The forward voltage data did not including ±0.1V testing tolerance.
2. The luminous intensity data did not including ± 15% testing tolerance.
2.6
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
PART NO. LSBKSUG2662/R1
Page 3/8
Brightness Code For Standard LED Lamps
SBKS CHIP
Group
Luminous Intensity(mcd) at 20 mA
Min.
Max.
A16
65
90
A17
90
120
A18
120
160
A19
160
220
A20
220
300
A21
300
350
Color Code
SBKS CHIP
Group
Dominant Wave length(nm) at 20 mA
Min.
Max.
0E
462
465
0D
465
468
0C
468
471
0B
471
474
0A
474
477
LIGITEK ELECTRONICS CO.,LTD.
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PART NO. LSBKSUG2662/R1
Page 4/8
Brightness Code For Standard LED Lamps
UG CHIP
Group
Luminous Intensity(mcd) at 20 mA
Min.
Max.
8
28
38
9
38
50
10
50
65
11
65
90
12
90
120
13
120
160
Color Code
UG CHIP
Group
Dominant Wave length(nm) at 20 mA
Min.
Max.
7
568
570
8
570
572
9
572
574
10
574
576
11
576
578
LIGITEK ELECTRONICS CO.,LTD.
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PART NO. LSBKSUG2662/R1
Page 5/8
Typical Electro-Optical Characteristics Curve
SBKS CHIP
Fig.2 Relative Intensity vs. Forward Current
30
1.5
Relative Intensity
Normalize @20mA
Forward Current(mA)
Fig.1 Forward current vs. Forward Voltage
25
20
15
10
5
0
1
2
3
4
1.25
1.0
0.75
0.5
0.25
0
5
0
5
Relative Intensity@20mA
Forward Current@20mA
40
30
20
10
0
50
75
Ambient Temperature( ℃)
20
25
30
Fig.4 Relative Intensity vs. Wavelength
Fig.3 Forward Current vs. Temperature
25
15
Forward Current(mA)
Forward Voltage(V)
0
10
100
1.0
0.5
0
380
430
480
530
580
Wavelength (nm)
630
680
LIGITEK ELECTRONICS CO.,LTD.
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Page6/8
PART NO. LSBKSUG2662/R1
Typical Electro-Optical Characteristics Curve
UG CHIP
Fig.1 Forward current vs. Forward Voltage
Fig.2 Relative Intensity vs. Forward Current
3.0
Relative Intensity
Normalize @20mA
Forward Current(mA)
1000
100
10
1.0
0.1
2.5
2.0
1.5
1.0
0.5
0
1.0
2.0
3.0
4.0
5.0
1.0
10
Fig.4 Relative Intensity vs. Temperature
1.2
Relative Intensity @20mA
Normalize @25℃
Forward Voltage@20mA
Normaliz @25℃
Fig.3 Forward Voltage vs. Temperature
1.1
1.0
0.9
0.8
-20
0
20
40
60
80
100
Relative Intensity @20mA
Fig.5 Relative Intensity vs. Wavelength
1.0
0.5
0
550
600
Wavelength (nm)
3.0
2.5
2.0
1.5
1.0
0.5
0
-40
-20
0
20
40
60
80
Ambient Temperature( ℃)
Ambient Temperature( ℃)
500
1000
Forward Current(mA)
Forward Voltage(V)
-40
100
650
100
LIGITEK ELECTRONICS CO.,LTD.
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PART NO. LSBKSUG2662/R1
Page 7/8
Soldering Condition(Pb-Free)
1.Iron:
Soldering Iron:30W Max
Temperature 350° C Max
Soldering Time:3 Seconds Max(One time only)
Distance:2mm Min(From solder joint to body)
2.Wave Soldering Profile
Dip Soldering
Preheat: 120° C Max
Preheat time: 60seconds Max
Ramp-up
2°C/sec(max)
Ramp-Down:-5°C/sec(max)
Solder Bath:260° C Max
Dipping Time:3 seconds Max
Distance:2mm Min(From solder joint to body)
Temp(° C)
260° C3sec Max
260°
5° /sec
max
120°
25°
0°
2° /sec
max
0
Preheat
50
100
60 Seconds Max
Note: 1.Wave solder should not be made more than one time.
2.You can just only select one of the soldering conditions as above.
150
Time(sec)
LIGITEK ELECTRONICS CO.,LTD.
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PART NO. LSBKSUG2662/R1
Page 8/8
Reliability Test:
Test Item
Test Condition
Description
Reference
Standard
Operating Life Test
1.Under Room Temperature
2.If=20mA
3.t=1000 hrs (-24hrs, +72hrs)
This test is conducted for the purpose
of detemining the resistance of a part
in electrical and themal stressed.
MIL-STD-750: 1026
MIL-STD-883: 1005
JIS C 7021: B-1
High Temperature
Storage Test
1.Ta=105 ℃±5℃
2.t=1000 hrs (-24hrs, +72hrs)
The purpose of this is the resistance of
the device which is laid under condition
of high temperature for hours.
MIL-STD-883:1008
JIS C 7021: B-10
Low Temperature
Storage Test
1.Ta=-40 ℃±5 ℃
2.t=1000 hrs (-24hrs, +72hrs)
The purpose of this is the resistance
of the device which is laid under
condition of low temperature for hours.
High Temperature
High Humidity Test
1.Ta=65 ℃±5 ℃
2.RH=90 %~95%
3.t=240hrs ±2hrs
The purpose of this test is the resistance
of the device under tropical for hours.
1.Ta=105 ℃±5℃&-40 ℃±5℃
(10min) (10min)
2.total 10 cycles
The purpose of this is the resistance of
the device to sudden extreme changes
in high and low temperature.
MIL-STD-202: 107D
MIL-STD-750: 1051
MIL-STD-883: 1011
Solder Resistance
Test
1.T.Sol=260 ℃±5 ℃
2.Dwell time= 10 ±1sec.
This test intended to determine the
thermal characteristic resistance
of the device to sudden exposures
at extreme changes in temperature
when soldering the lead wire.
MIL-STD-202: 210A
MIL-STD-750: 2031
JIS C 7021: A-1
Solderability Test
1.T.Sol=230 ℃±5 ℃
2.Dwell time=5 ±1sec
This test intended to see soldering well
performed or not.
MIL-STD-202: 208D
MIL-STD-750: 2026
MIL-STD-883: 2003
JIS C 7021: A-2
Thermal Shock Test
JIS C 7021: B-12
MIL-STD-202:103B
JIS C 7021: B-11