TERIDIAN 71M6534

71M6533/H and 71M6534/H
Energy Meter IC
Simplifying System IntegrationTM
DATA SHEET
November 2009
GENERAL DESCRIPTION
FEATURES
rd
The 71M6533 and 71M6534 are Teridian’s 3 -generation polyphase metering SOCs with a 10MHz 8051-compatible MPU
core, low-power RTC, FLASH and LCD driver. Teridian’s patented Single Converter Technology® with a 22-bit delta-sigma
ADC, seven analog inputs, digital temperature compensation,
precision voltage reference and a 32-bit computation engine
(CE) supports a wide range of metering applications with very
few external components.
The 71M6533 and 71M6534 add several new features to Teridian’s flagship 71M6513 poly-phase meters including an SPI interface, advanced power management with <1 µA sleep current, 4 KB shared RAM and 128 KB (71M6533/H, 71M6534) or
256 KB (71M6534H) Flash which may be programmed in the
field with new code and/or data during meter operation. Higher
processing and sampling rates and larger memory offer a powerful metering platform for commercial and industrial meters
with up to class 0.2 accuracy.
A complete array of ICE and development tools, programming
libraries and reference designs enable rapid development and
certification of meters that meet all ANSI & IEC electricity metering standards worldwide.
LIVE
CT / COIL
LOAD
NEUT
LIVE
LIVE
POWER SUPPLY
NEUTRAL
CONVERTER
V3P3A V3P3SYS GNDA GNDD
IA
PWR MODE
CONTROL
VA
IB
VB
IC
TERIDIAN
71M6533
71M6534
REGULATOR
TEMP
SENSOR
LCD DRIVER
DIO ,PULSE
ID
VREF
RAM
SERIAL PORTS
TX
COMPUTE
ENGINE
MOD
RX
TX
COMPARATOR
POWER
FAULT
SEG
8888.8888
SEG/ DIO
DIO
V1
V2*
ICE
PULSES,
DIO
I2C or µWire
EEPROM
MPU
RTC
TIMERS
* 71M6534 only
v1.1
COM0..3
BATTERY
RX
FLASH
IR
VBAT
V2P5
VC
AMR
WAKE-up
• Accuracy < 0.1% over 2000:1 range
• Exceeds IEC62053 / ANSI C12.20 standards
• Seven sensor inputs with neutral current
measurement
• Low-jitter Wh and VARh plus two additional
pulse test outputs (4 total, 10 kHz maximum)
with pulse count
• Four-quadrant metering
• Phase sequencing
• Line frequency count for RTC
• Digital temperature compensation
• Independent 32-bit compute engine
• 46-64 Hz line frequency range with same
calibration. Phase compensation (± 7°)
• Three battery back-up modes with wake-up
on timer or push-button:
Brownout mode (82 µA typ., 71M6533)
LCD mode (21 µA typ., DAC active)
Sleep mode (0.7 µA typ.)
• Energy display during mains power failure
• 39 mW typical consumption @ 3.3 V, MPU
clock frequency 614 kHz
• 8-bit MPU (80515), 1 clock cycle per instruction, 10 MHz maximum, with integrated
ICE for debug
• LCD driver with 4 common segment drivers:
Up to 228 (71M6533) or 300 (71M6534)
pixels
• 4 dedicated plus 35 (71M6533) or
48 (71M6534) multi-function DIO pins
• RTC for TOU functions with clock-rate adjust
register
• Hardware watchdog timer, power fail monitor
2
• I C/Microwire EEPROM Interface
• High-speed slave SPI interface to data RAM
• Two UARTs for IR and AMR, IR driver with
modulation
• Flash memory with security and in-system
program update:
128 KB (71M6533/H, 71M6534)
256 KB (71M6534H)
• 4 KB RAM
• Industrial temperature range
• 100-pin (71M6533/H) or 120-pin
(71M6534/H) lead free LQFP package
OSC/ PLL
XIN
32 kHz
XOUT
9/24/2008
© 2007-2009 TERIDIAN Semiconductor Corporation
1
71M6533/71M6534 Data Sheet
FDS_6533_6534_004
Table of Contents
1
Hardware Description ......................................................................................................................... 9
1.1
Hardware Overview .................................................................................................................... 9
1.2
Analog Front End (AFE) .......................................................................................................... 10
1.2.1 Signal Input Pins ............................................................................................................ 10
1.2.2 Input Multiplexer ............................................................................................................ 10
1.2.3 A/D Converter (ADC) ..................................................................................................... 11
1.2.4 FIR Filter ........................................................................................................................ 11
1.2.5 Voltage References ....................................................................................................... 12
1.2.6 Temperature Sensor ...................................................................................................... 13
1.2.7 Battery Monitor............................................................................................................... 13
1.2.8 AFE Functional Description ........................................................................................... 13
1.2.9 Digital Computation Engine (CE) ................................................................................... 14
1.2.10 Meter Equations ............................................................................................................. 15
1.2.11 Real-Time Monitor ......................................................................................................... 15
1.2.12 Pulse Generators ........................................................................................................... 16
1.2.13 Data RAM (XRAM) ........................................................................................................ 16
1.2.14 CE Functional Overview ................................................................................................ 17
1.3
80515 MPU Core ....................................................................................................................... 19
1.3.1 Memory Organization and Addressing .......................................................................... 19
1.3.2 Special Function Registers (SFRs) ............................................................................... 21
1.3.3 Generic 80515 Special Function Registers ................................................................... 22
1.3.4 71M6533/71M6534-Specific Special Function Registers .............................................. 25
1.3.5 Instruction Set ................................................................................................................ 26
1.3.6 UARTs ........................................................................................................................... 26
1.3.7 Timers and Counters ..................................................................................................... 29
1.3.8 WD Timer (Software Watchdog Timer) ......................................................................... 30
1.3.9 Interrupts ........................................................................................................................ 30
1.4
On-Chip Resources ................................................................................................................. 37
1.4.1 Oscillator ........................................................................................................................ 37
1.4.2 PLL and Internal Clocks................................................................................................. 37
1.4.3 Real-Time Clock (RTC) ................................................................................................. 38
1.4.4 Temperature Sensor ...................................................................................................... 39
1.4.5 Physical Memory............................................................................................................ 39
1.4.6 UART and Optical Interface ........................................................................................... 41
1.4.7 Digital I/O ....................................................................................................................... 42
1.4.8 LCD Drivers ................................................................................................................... 45
1.4.9 Battery Monitor............................................................................................................... 46
1.4.10 EEPROM Interface ........................................................................................................ 46
1.4.11 SPI Slave Port................................................................................................................ 49
1.4.12 Hardware Watchdog Timer ............................................................................................ 51
1.4.13 Test Ports (TMUXOUT Pin) ........................................................................................... 51
1.4.14 V2 Comparator (71M6534/6534H only) ......................................................................... 52
2
Functional Description ..................................................................................................................... 53
2.1
Theory of Operation................................................................................................................. 53
2.2
System Timing Summary ........................................................................................................ 54
2.3
Battery Modes .......................................................................................................................... 55
2.3.1 BROWNOUT Mode ....................................................................................................... 56
2.3.2 LCD Mode ...................................................................................................................... 57
2
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
2.4
2.5
2.6
2.7
3
3.1
3.2
3.3
3.4
3.5
3.6
3.7
3.8
3.9
3.10
3.11
3.12
3.13
3.14
3.15
3.16
3.17
3.18
4
4.1
4.2
4.3
v1.1
71M6533/71M6534 Data Sheet
2.3.3 SLEEP Mode ................................................................................................................. 57
Fault and Reset Behavior ........................................................................................................ 62
2.4.1 Reset Mode.................................................................................................................... 62
2.4.2 Power Fault Circuit ........................................................................................................ 62
Wake Up Behavior ................................................................................................................... 63
2.5.1 Wake on PB ................................................................................................................... 63
2.5.2 Wake on Timer............................................................................................................... 63
Data Flow .................................................................................................................................. 64
CE/MPU Communication ......................................................................................................... 64
Application Information.................................................................................................................... 65
Connection of Sensors (CT, Resistive Shunt) ...................................................................... 65
Distinction between 71M6533/71M6534 and 71M6533H/71M6534H Parts .......................... 65
Connecting 5 V Devices .......................................................................................................... 66
Temperature Measurement ..................................................................................................... 66
Temperature Compensation ................................................................................................... 66
3.5.1 Temperature Coefficients .............................................................................................. 66
3.5.2 Temperature Compensation for VREF .......................................................................... 67
3.5.3 System Temperature Compensation ............................................................................. 67
3.5.4 Temperature Compensation for the RTC ...................................................................... 67
Connecting LCDs ..................................................................................................................... 67
Connecting I2C EEPROMs ....................................................................................................... 68
Connecting Three-Wire EEPROMs......................................................................................... 69
UART0 (TX/RX) ......................................................................................................................... 69
Optical Interface (UART1) ....................................................................................................... 70
Connecting the V1 Pin ............................................................................................................. 70
Connecting the Reset Pin ....................................................................................................... 71
Connecting the Emulator Port Pins ....................................................................................... 71
Connecting a Battery ............................................................................................................... 72
Flash Programming ................................................................................................................. 72
MPU Firmware Library ............................................................................................................. 73
Crystal Oscillator ..................................................................................................................... 73
Meter Calibration...................................................................................................................... 73
Firmware Interface ............................................................................................................................ 74
I/O RAM Map –Functional Order ............................................................................................. 74
I/O RAM Description – Alphabetical Order ............................................................................ 78
CE Interface Description ......................................................................................................... 91
4.3.1 CE Program ................................................................................................................... 91
4.3.2 CE Data Format ............................................................................................................. 91
4.3.3 Constants ....................................................................................................................... 91
4.3.4 Environment ................................................................................................................... 92
4.3.5 CE Calculations ............................................................................................................. 92
4.3.6 CE Front End Data (Raw Data) ..................................................................................... 92
4.3.7 CE Status and Control ................................................................................................... 93
4.3.8 CE Transfer Variables ................................................................................................... 95
4.3.9 Other Measurement and Control Parameters ............................................................... 97
4.3.10 CE Calibration Parameters ............................................................................................ 99
4.3.11 CE Flow Diagrams ......................................................................................................... 99
© 2007-2009 TERIDIAN Semiconductor Corporation
3
71M6533/71M6534 Data Sheet
FDS_6533_6534_004
5
Specifications .................................................................................................................................. 102
5.1
Absolute Maximum Ratings .................................................................................................. 102
5.2
Recommended External Components ................................................................................. 103
5.3
Recommended Operating Conditions ................................................................................. 103
5.4
Performance Specifications ................................................................................................. 104
5.4.1 Input Logic Levels ........................................................................................................ 104
5.4.2 Output Logic Levels ..................................................................................................... 104
5.4.3 Power-Fault Comparator ............................................................................................. 104
5.4.4 V2 Comparator (71M6534 only) .................................................................................. 104
5.4.5 Battery Monitor............................................................................................................. 105
5.4.6 Supply Current ............................................................................................................. 105
5.4.7 V3P3D Switch .............................................................................................................. 105
5.4.8 2.5 V Voltage Regulator............................................................................................... 106
5.4.9 Low-Power Voltage Regulator ..................................................................................... 106
5.4.10 Crystal Oscillator .......................................................................................................... 106
5.4.11 Optical Interface ........................................................................................................... 106
5.4.12 LCD DAC ..................................................................................................................... 106
5.4.13 LCD Drivers ................................................................................................................. 107
5.4.14 Temperature Sensor .................................................................................................... 107
5.4.15 VREF and VBIAS ......................................................................................................... 108
5.4.16 ADC Converter, V3P3A Referenced ........................................................................... 109
5.5
Timing Specifications ............................................................................................................ 110
5.5.1 Flash Memory .............................................................................................................. 110
5.5.2 EEPROM Interface ...................................................................................................... 110
5.5.3 RESET ......................................................................................................................... 110
5.5.4 RTC.............................................................................................................................. 110
5.5.5 SPI Slave Port (MISSION Mode) ................................................................................. 111
5.6
Typical Performance Data ..................................................................................................... 112
5.6.1 Accuracy over Current ................................................................................................. 112
5.6.2 Accuracy over Temperature ........................................................................................ 113
5.7
Package Outline Drawings .................................................................................................... 113
5.7.1 71M6533 (100 Pin LQFP) ............................................................................................ 113
5.7.2 71M6534/6534H (120 Pin LQFP) ................................................................................ 114
5.8
Pinout ...................................................................................................................................... 115
5.8.1 71M6533/71M6533H Pinout (100 Pin LQFP) .............................................................. 115
5.8.2 71M6534/71M6534H Pinout (120 Pin LQFP) .............................................................. 116
5.9
Pin Descriptions..................................................................................................................... 117
5.9.1 Power and Ground Pins............................................................................................... 117
5.9.2 Analog Pins .................................................................................................................. 117
5.9.3 Digital Pins ................................................................................................................... 118
5.9.4 I/O Equivalent Circuits ................................................................................................. 120
6
Ordering Information ...................................................................................................................... 121
7
Related Information ........................................................................................................................ 121
8
Contact Information ........................................................................................................................ 121
Appendix A: Acronyms .......................................................................................................................... 122
Appendix B: Revision History ............................................................................................................... 123
4
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
Figures
Figure 1: IC Functional Block Diagram ......................................................................................................... 8
Figure 2: General Topology of a Chopped Amplifier .................................................................................. 12
Figure 3: CROSS Signal with CHOP_E = 00 .............................................................................................. 13
Figure 4: AFE Block Diagram ..................................................................................................................... 14
Figure 5: Samples from Multiplexer Cycle .................................................................................................. 17
Figure 6: Accumulation Interval .................................................................................................................. 17
Figure 7: Interrupt Structure ........................................................................................................................ 36
Figure 8: Optical Interface ........................................................................................................................... 42
Figure 9: Connecting an External Load to DIO Pins ................................................................................... 45
Figure 10: 3-wire Interface. Write Command, HiZ=0. ................................................................................ 48
Figure 11: 3-wire Interface. Write Command, HiZ=1 ................................................................................. 48
Figure 12: 3-wire Interface. Read Command. ............................................................................................ 48
Figure 13: 3-Wire Interface. Write Command when CNT=0 ...................................................................... 49
Figure 14: 3-wire Interface. Write Command when HiZ=1 and WFR=1. ................................................... 49
Figure 15: SPI Slave Port: Typical Read and Write operations .................................................................. 50
Figure 16: Functions defined by V1 ............................................................................................................ 51
Figure 17: Voltage, Current, Momentary and Accumulated Energy ........................................................... 53
Figure 18: Timing Relationship between ADC MUX and Compute Engine ................................................ 54
Figure 19: RTM Output Format ................................................................................................................... 54
Figure 20: Operation Modes State Diagram ............................................................................................... 55
Figure 21: Functional Blocks in BROWNOUT Mode .................................................................................. 58
Figure 22: Functional Blocks in LCD Mode................................................................................................. 59
Figure 23: Functional Blocks in SLEEP Mode ............................................................................................ 60
Figure 24: Transition from BROWNOUT to MISSION Mode when System Power Returns ...................... 61
Figure 25: Power-Up Timing with V3P3SYS and VBAT tied together ........................................................ 61
Figure 26: Power-Up Timing with VBAT only.............................................................................................. 62
Figure 27: Wake Up Timing ........................................................................................................................ 63
Figure 28: MPU/CE Data Flow .................................................................................................................... 64
Figure 29: MPU/CE Communication ........................................................................................................... 64
Figure 30: Resistive Voltage Divider ........................................................................................................... 65
Figure 31: CT with Single Ended (Left) and Differential Input (Right) Connection ..................................... 65
Figure 32: Resistive Shunt (Left), Rogowski Sensor (Right) ...................................................................... 65
Figure 33: Connecting LCDs ....................................................................................................................... 68
Figure 34: I2C EEPROM Connection .......................................................................................................... 68
Figure 35: Three-Wire EEPROM Connection ............................................................................................. 69
Figure 36: Connections for UART0 ............................................................................................................. 69
Figure 37: Connection for Optical Components .......................................................................................... 70
Figure 38: Voltage Divider for V1 ................................................................................................................ 71
Figure 39: External Components for the RESET Pin: Push-Button (Left), Production Circuit (Right) ........ 71
Figure 40: External Components for the Emulator Interface ...................................................................... 72
Figure 41: Connecting a Battery ................................................................................................................. 72
Figure 42: CE Data Flow: Multiplexer and ADC........................................................................................ 100
Figure 43: CE Data Flow: Scaling, Gain Control, Intermediate Variables ................................................ 100
Figure 44: CE Data Flow: Squaring and Summation Stages.................................................................... 101
Figure 45: SPI Slave Port (MISSION Mode) Timing ................................................................................. 111
Figure 46: Wh Accuracy (0.1 A - 200 A, 240 V, Room Temperature) at Various Frequencies (Differential
Mode, CTs) ........................................................................................................................................ 112
Figure 47: Typical Wh Accuracy (0.02 A - 200 A, 240 V, Room Temperature), Various Load Angles
(Differential Mode, CTs) ..................................................................................................................... 112
Figure 48: 71M6533/6533H 100-pin LQFP Package Outline ................................................................... 113
Figure 49: 71M6534/6534H 120-pin LQFP Package Outline ................................................................... 114
Figure 50: Pinout for 71M6533/71M6533H LQFP-100 Package .............................................................. 115
Figure 51: Pinout for 71M6534/71M6534H LQFP-120 Package .............................................................. 116
v1.1
© 2007-2009 TERIDIAN Semiconductor Corporation
5
71M6533/71M6534 Data Sheet
FDS_6533_6534_004
Tables
Table 1: Signals Selected for the ADC with SLOTn_SEL and SLOTn_ALTSEL (MUX_DIV = 7) ................... 11
Table 2: ADC Resolution............................................................................................................................. 11
Table 3: ADC RAM Locations ..................................................................................................................... 12
Table 4: XRAM Locations for ADC Results ................................................................................................ 15
Table 5: Inputs Selected in Regular and Alternate Multiplexer Cycles ....................................................... 15
Table 6: CKMPU Clock Frequencies .......................................................................................................... 19
Table 7: Memory Map ................................................................................................................................. 20
Table 8: Internal Data Memory Map ........................................................................................................... 21
Table 9: Special Function Register Map ..................................................................................................... 22
Table 10: Generic 80515 SFRs - Location and Reset Values .................................................................... 22
Table 11: PSW Bit Functions (SFR 0xD0) ................................................................................................... 23
Table 12: Port Registers ............................................................................................................................. 24
Table 13: Stretch Memory Cycle Width ...................................................................................................... 25
Table 14: 71M6533/71M6534 Specific SFRs ............................................................................................. 25
Table 15: Baud Rate Generation ................................................................................................................ 27
Table 16: UART Modes............................................................................................................................... 27
Table 17: The S0CON (UART0) Register (SFR 0x98) ................................................................................. 28
Table 18: The S1CON (UART1) Register (SFR 0x9B) ................................................................................ 28
Table 19: PCON Register Bit Description (SFR 0x87) ............................................................................... 28
Table 20: Timers/Counters Mode Description ............................................................................................ 29
Table 21: Allowed Timer/Counter Mode Combinations .............................................................................. 29
Table 22: TMOD Register Bit Description (SFR 0x89) ................................................................................ 29
Table 23: The TCON Register Bit Functions (SFR 0x88)............................................................................ 30
Table 24: The IEN0 Bit Functions (SFR 0xA8)............................................................................................ 31
Table 25: The IEN1 Bit Functions (SFR 0xB8)............................................................................................ 31
Table 26: The IEN2 Bit Functions (SFR 0x9A)............................................................................................ 31
Table 27: TCON Bit Functions (SFR 0x88) ................................................................................................. 32
Table 28: The T2CON Bit Functions (SFR 0xC8) ....................................................................................... 32
Table 29: The IRCON Bit Functions (SFR 0xC0) ........................................................................................ 32
Table 30: External MPU Interrupts .............................................................................................................. 33
Table 31: Interrupt Enable and Flag Bits .................................................................................................... 33
Table 32: Interrupt Priority Level Groups .................................................................................................... 34
Table 33: Interrupt Priority Levels ............................................................................................................... 34
Table 34: Interrupt Priority Registers (IP0 and IP1) .................................................................................... 34
Table 35: Interrupt Polling Sequence.......................................................................................................... 35
Table 36: Interrupt Vectors.......................................................................................................................... 35
Table 37: Clock System Summary .............................................................................................................. 37
Table 38: Bank Switching with FL_BANK[2:0] ............................................................................................ 41
Table 39: Data/Direction Registers and Internal Resources for DIO Pin Groups ....................................... 43
Table 40: Selectable Resources using the DIO_Rn Bits ............................................................................. 45
Table 41: EECTRL Bits for 2-pin Interface ................................................................................................... 47
Table 42: EECTRL Bits for the 3-wire Interface ........................................................................................... 47
Table 43: SPI Command Description.......................................................................................................... 50
Table 44: TMUX[4:0] Selections ................................................................................................................. 52
Table 45: Available Circuit Functions.......................................................................................................... 56
Table 46: I/O RAM Map – Functional Order ............................................................................................... 74
Table 47: I/O RAM Description – Alphabetical (by Bit Name) .................................................................... 78
Table 48: CE EQU Equations and Element Input Mapping ........................................................................ 92
Table 49: CE Raw Data Access Locations ................................................................................................. 92
Table 50: CESTATUS Register ..................................................................................................................... 93
Table 51: CESTATUS Bit Definitions ............................................................................................................ 93
Table 52: CECONFIG Register .................................................................................................................... 93
Table 53: CECONFIG Bit Definitions ........................................................................................................... 94
Table 54: Sag Threshold and Gain Adjust Control ..................................................................................... 95
Table 55: CE Transfer Variables ................................................................................................................. 95
6
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
Table 56: CE Energy Measurement Variables............................................................................................ 96
Table 57: Other Transfer Variables ............................................................................................................. 96
Table 58: CE Temperature Registers ......................................................................................................... 97
Table 59: CE Pulse Generation Parameters............................................................................................... 98
Table 60: CE Parameters for Noise Suppression and Code Version ......................................................... 98
Table 61: CE Calibration Parameters ......................................................................................................... 99
Table 62: Absolute Maximum Ratings ...................................................................................................... 102
Table 63: Recommended External Components ...................................................................................... 103
Table 64: Recommended Operating Conditions ....................................................................................... 103
Table 65: Input Logic Levels ..................................................................................................................... 104
Table 66: Output Logic Levels .................................................................................................................. 104
Table 67: Power-fault Comparator Performance Specifications .............................................................. 104
Table 68: V2 Comparator Performance Specifications ............................................................................ 104
Table 69: Battery Monitor Performance Specifications (BM E= 1) ............................................................ 105
Table 70: Supply Current Performance Specifications ............................................................................. 105
Table 71: V3P3D Switch Performance Specifications .............................................................................. 105
Table 72: 2.5 V Voltage Regulator Performance Specifications ............................................................... 106
Table 73: Low-Power Voltage Regulator Performance Specifications ..................................................... 106
Table 74: Crystal Oscillator Performance Specifications .......................................................................... 106
Table 75: Optical Interface Performance Specifications ........................................................................... 106
Table 76: LCD DAC Performance Specifications ..................................................................................... 106
Table 77: LCD Driver Performance Specifications ................................................................................... 107
Table 78: Temperature Sensor Performance Specifications .................................................................... 107
Table 79: VREF Performance Specifications............................................................................................ 108
Table 80: ADC Converter Performance Specifications ............................................................................. 109
Table 81: Flash Memory Timing Specifications ........................................................................................ 110
Table 82: EEPROM Interface Timing........................................................................................................ 110
Table 83: RESET Timing .......................................................................................................................... 110
Table 84: RTC Range for Date ................................................................................................................. 110
Table 85: SPI Slave Port (MISSION Mode) Timing .................................................................................. 111
Table 86: Power and Ground Pins ............................................................................................................ 117
Table 87: Analog Pins ............................................................................................................................... 117
Table 88: Digital Pins ................................................................................................................................ 118
v1.1
© 2007-2009 TERIDIAN Semiconductor Corporation
7
71M6533/71M6534 Data Sheet
FDS_6533_6534_004
GNDA GNDD
VREF
IAP
IAN
VA
IBP
IBN
VB
ICP
ICN
VC
IDP
IDN
V3P3SYS
V3P3A
∆Σ ADC
CONVERTER
VBIAS
VADC
VREF
VREF_CAL
VREF_DIS
EQU
MUX_AL
MUX_DIV
VBAT
TEMP
RTCLK (32KHz)
OSC
(32KHz)
XIN
XOUT
PLS_INV
PLS_INTERVAL
PLS_MAXWIDTH
CE_LCTN
EQU
PRE_SAMPS
SUM_CYCLES
RTM_0...3
RTM_E
CE_E
CE_PROG
16
2.5V_NV
MCK
PLL
MPU_DIV
CKOUT_E
V3P3D
CE
FIR
FIR_LEN 22
VB_REF
ADC_E
VDDREFZ
VREF
FLASH
128KB
RTM
VBAT
to TMUX
VOLT
REG
RPULSE
WPULSE
LCD_ONLY
SLEEP
XPULSE
YPULSE
YPULSE
XPULSE
WPULSE
RPULSE
VBIAS
MUXP
CE_DATA
32
V2P5
2.5V to logic
2.5V_NV
XRAM
4kB
DIO_PV
DIO_PW
DIO_PX
DIO_PY
CK_CE
CK_MPU
RTCA_ADJ
CKTEST
RTC
2.5V_NV
MULTIPURPOSE
I/O
RST_SUBSEC
QREG,PREG
RTC_DAY
RTC_DATE
RTC_HR
RTC_MIN RTC_MO
RTC_SEC RTC_YR
TEST
4
5
3
LCD DISPLAY
DRIVER
TEST
MODE
LCD_DAC
LCD_MODE
LCD_CLK
LCD_E
LCD_BLKMAP
LCD_SEG
LCD_Y
8
MPU
DIGITAL I/O
RX
DIO_DIR
DIO_R
DIO
UART1
TX
XRAM BUS
PB
COM0..3
PCMD
EEPROM I/F
EEDATA
EECTRL
4
4
4
2
Segments
5
9
DIO_1..24
24
PCSZ
PCLK
PSI
PSO
SPI SLAVE
8
PB
3
2
SPE
DIO_EEX
UART2/OPTICAL
OPT_RXDIS
OPT_RXINV
OPT_TXE
OPT_TXINV
OPT_TXMOD
OPT_FDC
VBIAS
NV RAM
V2*
+
-
IRAM BUS
8
IRAM
256B
EMULATOR
OPT_TXE
4
7
2.5V_NV
E_RXTX
E_TCLK
E_RSTZ
ICE_E
V1
POWER FAULT
ICE_E
FAULTZ
COM3..0
DIO41/SEG61
DIO36/SEG56*...DIO39/SEG59*
DIO29/SEG49...DIO30/SEG50
DIO28/SEG48*
DIO23/SEG43...DIO27/SEG47
DIO22/SEG42*
DIO13/SEG33...DIO21/SEG41
DIO12/SEG32*
DIO10/SEG30...DIO11/SEG31
OPT_TX
OPT_RX
GP0-GP7
V2_OK*
DIO52/SEG72*...DIO55/SEG75*
DIO47/SEG67...DIO51/SEG71
DIO46/SEG66*
DIO43/SEG63...DIO45/SEG65
DIO42/SEG62*
DIO9/SEG29/YPULSE
DIO8/SEG28/XPULSE
DIO7/SEG27/RPULSE
DIO6/SEG26/WPULSE
DIO5/SEG25/SDATA
DIO4/SEG24/SDCK
DIO3
DIO2/OPT_TX
DIO1/OPT_RX
SDATA
SCLK
DIO56...DIO58
CKOUT_E
3
TEST
MUX
SEG20...SEG23
SEG12 ...SEG18
SEG11/E_RST
SEG10/E_TCLK
SEG9/E_RXTX
SEG8
SEG7/MUX_SYNC
SEG6/PSDI
SEG5/PCSZ
SEG4/PSDO
SEG3/PCLK
SEG0...SEG2
TMUXOUT
TMUX[4:0]
* 71M6534/6534H only
RESET
ICE_E
3/10/2009
Figure 1: IC Functional Block Diagram
8
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
1 Hardware Description
1.1
Hardware Overview
The Teridian 71M6533 and 71M6534 single-chip energy meter integrate all primary functional blocks required to implement a solid-state electricity meter. Included on the chip are:
•
•
•
•
•
•
•
•
•
An analog front end (AFE)
An Independent digital computation engine (CE)
An 8051-compatible microprocessor (MPU) which executes one instruction per clock cycle (80515)
A voltage reference
A temperature sensor
LCD drivers
RAM and Flash memory
A real time clock (RTC)
A variety of I/O pins
Various current sensor technologies are supported including Current Transformers (CT), Resistive Shunts
and Rogowski coils.
In a typical application, the 32-bit compute engine (CE) of the 71M6533/71M6534 sequentially processes
the samples from the voltage inputs on analog input pins and performs calculations to measure active
energy (Wh) and reactive energy (VARh), as well as A2h, and V2h for four-quadrant metering. These
measurements are then accessed by the MPU, processed further and output using the peripheral devices
available to the MPU.
In addition to advanced measurement functions, the real time clock function allows the 71M6533/71M6534
to record time of use (TOU) metering information for multi-rate applications and to time-stamp tamper
events. Measurements can be displayed on 3.3 V LCDs commonly used in low-temperature environments. Flexible mapping of LCD display segments facilitate integration of existing custom LCDs. Design
trade-off between the number of LCD segments and DIO pins can be implemented in software to accommodate various requirements.
In addition to the temperature-trimmed ultra-precision voltage reference, the on-chip digital temperature
compensation mechanism includes a temperature sensor and associated controls for correction of unwanted temperature effects on measurement and RTC accuracy, e.g. to meet the requirements of ANSI
and IEC standards. Temperature dependent external components such as a crystal oscillator, current
transformers (CTs) and their corresponding signal conditioning circuits can be characterized and their
correction factors can be programmed to produce electricity meters with exceptional accuracy over the
industrial temperature range.
One of the two internal UARTs is adapted to support an Infrared LED with internal drive and sense configuration and can also function as a standard UART. The optical output can be modulated at 38 kHz.
This flexibility makes it possible to implement AMR meters with an IR interface. A block diagram of the IC
is shown in Figure 1.
v1.1
© 2007-2009 TERIDIAN Semiconductor Corporation
9
71M6533/71M6534 Data Sheet
1.2
FDS_6533_6534_004
Analog Front End (AFE)
The AFE of the 71M6533/71M6534 consists of an input multiplexer, a delta-sigma A/D converter and a
voltage reference.
1.2.1
Signal Input Pins
All analog signal input pins are sensitive to voltage. The VA, VB, and VC pins are single-ended. Pins
IAP/IAN, IBP/IBN, ICP/ICN, and IDP/IDN can be programmed individually to be differential or single-ended.
The differential signal is applied between the InP and InN input pins. Single-ended signals are applied to
the InP input while the common signal, return, is the V3P3A pin. When using the differential mode, inputs
can be chopped, i.e. a connection from V3P3A to InP or InN alternates in each multiplexer cycle.
1.2.2
Input Multiplexer
The input multiplexer applies the input signals from the pins IAP/IAN, VA, IBP/IBN, VB, ICP/ICN, VC, and
IDP/IDN to the input of the ADC. Additionally, using the alternate multiplexer selection, it has the ability to
select temperature and the battery voltage. One input is applied per time slot.
The multiplexer can implement from one to 10 time slots (states) per frame as controlled by the I/O RAM
register MUX_DIV. The multiplexer always starts at state 1 and proceeds until as many states as defined
by MUX_DIV have been converted.
The multiplexer can be operated in two modes:
•
•
During a normal multiplexer cycle (MUX_ALT = 0), the signals selected in the SLOTn_SEL registers (I/O
RAM) are processed. These are typically the signals from the IA, IB, IC, ID and VA, VB, and VC pins.
During the alternate multiplexer cycle (MUX_ALT = 1), the signals selected in the SLOTn_SEL registers (I/O
RAM) are processed. These signals typically comprise the temperature signal (TEMP), the battery monitor (VBAT) and some of the voltage signals such as VA, VB, and VC. To prevent unnecessary drainage
on the battery, the battery monitor is enabled only with the BME bit (0x2020[6]) in the I/O RAM.
The alternate multiplexer cycles are usually performed infrequently (every second or so) by the MPU. In
order to prevent disruption of the voltage tracking mechanism and voltage allpass networks of the CE,
VA, VB, and VC are not replaced in the alternate cycles.
The current inputs can be configured to be used in differential mode, using the pin pairs IAP/IAN,
IBP/IBN, ICP/ICN, and IDP/IDN. The fourth current input is available to support measurement of a fourth
or neutral phase.
In a typical application, IAP/IAN, IBP/IBN, ICP/ICN, and IDP/IDN are connected to current transformers
that sense the current on each phase of the line voltage. VA, VB, and VC are typically connected to the
phase voltages via resistor dividers.
Multiplexer advance, FIR initiation and VREF chopping are controlled by the internal MUX_CTRL signal.
Additionally, MUX_CTRL launches each pass through the CE program. Conceptually, MUX_CTRL is
clocked by CK32, the 32768Hz clock from the PLL block. The behavior of MUX_CTRL is governed by
MUX_ALT, EQU, CHOP_E, and MUX_DIV.
The MUX_ALT bit requests an alternative multiplexer frame. The bit may be asserted on any MPU cycle
and may be subsequently deasserted on any cycle including the next one. A rising edge on MUX_ALT
will cause MUX_CTRL to wait until the next multiplexer frame and implement a single alternate multiplexer frame.
The inputs converted during normal and alternate frames are selectable using the pointers to signals.
SLOTn_SEL selects the input signal for the nth state in a standard multiplexer frame, while SLOTn_ALTSEL
selects the input for the nth state in an alternate multiplexer frame. For example, if SLOT0_SEL contains 0
and SLOT1_SEL contains 1, signal selection 0, equivalent to IA (see Table 1), will be applied for the first
time slot, while signal 1, equivalent to VA, will be applied for the second time slot. See Table 1 for a typi10
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
cal assignment of values for the SLOTn_SEL and SLOTn_ALTSEL registers assuming seven time slots
(MUX_DIV = 7) for the processing of three voltage and current phases plus an additional neutral current.
The correlation between signal numbers, CE memory addresses, and analog signals is given in Table 3.
For the processing of three voltage and current phases in a typical poly-phase meter without neutral
measurement, MUX_DIV is set to 6, and SLOT6_SEL as well as SLOT6_ALTSEL would be empty.
Table 1: Signals Selected for the ADC with SLOTn_SEL and SLOTn_ALTSEL (MUX_DIV = 7)
Regular Slot
Time Slot
0
1
2
3
4
5
6
Alternate Slot
Typical Selections
Register
Signal
Number
0
1
2
3
4
5
6
–
–
–
SLOT0_SEL
SLOT1_SEL
SLOT2_SEL
SLOT3_SEL
SLOT4_SEL
SLOT5_SEL
SLOT6_SEL
SLOT7_SEL
SLOT8_SEL
SLOT9_SEL
Signal for
ADC
IA
VA
IB
VB
IC
VC
ID
–
–
–
Typical Selections
Register
Signal
Number
A
1
B
3
4
5
6
SLOT0_ALTSEL
SLOT1_ALTSEL
SLOT2_ALTSEL
SLOT3_ALTSEL
SLOT4_ALTSEL
SLOT5_ALTSEL
SLOT6_ALTSEL
SLOT7_ALTSEL
SLOT8_ALTSEL
SLOT9_ALTSEL
Signal for
ADC
TEMP
VA
VBAT
VB
IC
VC
ID
The duration of each multiplexer state depends on the number of ADC samples processed by the FIR,
which is set by FIR_LEN. Each multiplexer state will start on the rising edge of CK32. FIR conversions
require 1, 2, or 3 CK32 cycles. The number of CK32 cycles is determined by FIR_LEN.
1.2.3
A/D Converter (ADC)
A single delta-sigma A/D converter digitizes the voltage and current inputs to the 71M6533/71M6534. The
resolution of the ADC is programmable using the I/O RAM registers M40MHZ and M26MHZ (see Table 2).
Table 2: ADC Resolution
Setting for [M40MHZ,
M26MHZ]
[00], [10] or [11]
[01]
FIR_LEN
FIR CE Cycles
Resolution
0
1
2
0
1
2
138
288
384
186
384
588
18 bits
21 bits
22 bits
19 bits
22 bits
24 bits
Initiation of each ADC conversion is controlled by MUX_CTRL as described above. At the end of each ADC
conversion, the FIR filter output data is stored into the CE RAM location determined by the MUX selection.
1.2.4
FIR Filter
The finite impulse response filter is an integral part of the ADC and it is optimized for use with the multiplexer. The purpose of the FIR filter is to decimate the ADC output to the desired resolution. At the end of
each ADC conversion, the output data is stored into the fixed CE RAM location determined by the multiplexer selection as shown in Table 3. FIR data is stored LSB justified, but shifted left by eight bits.
v1.1
© 2007-2009 TERIDIAN Semiconductor Corporation
11
71M6533/71M6534 Data Sheet
FDS_6533_6534_004
Table 3: ADC RAM Locations
Signal Number
0
1
2
3
4
5
6
0x0A
0x0B
1.2.5
Address (HEX)
0x00
0x01
0x02
0x03
0x04
0x05
0x06
0x0A
0x0B
Name
IA
VA
IB
VB
IC
VC
ID
TEMP
VBAT
Voltage References
The device includes an on-chip precision bandgap voltage reference that incorporates auto-zero techniques. The reference of the 71M6533H/71M6534H is trimmed in production to minimize errors caused
by component mismatch and drift. The result is a voltage output with a predictable temperature coefficient.
The amplifier within the reference is chopper stabilized, i.e. the polarity can be switched by the MPU using the I/O RAM register CHOP_E (0x2002[5:4]). The two bits in the CHOP_E register enable the MPU to
operate the chopper circuit in regular or inverted operation, or in toggling mode. When the chopper circuit
is toggled in between multiplexer cycles, DC offsets on the measured signals will automatically be averaged out.
The general topology of a chopped amplifier is shown in Figure 2.
A
Vinp
B
A
Vinn
A
+
G
-
B
Voutp
B
A
Voutn
B
CROSS
Figure 2: General Topology of a Chopped Amplifier
It is assumed that an offset voltage Voff appears at the positive amplifier input. With all switches, as controlled by CROSS, in the A position, the output voltage is:
Voutp – Voutn = G (Vinp + Voff – Vinn) = G (Vinp – Vinn) + G Voff
With all switches set to the B position by applying the inverted CROSS signal, the output voltage is:
Voutn – Voutp = G (Vinn – Vinp + Voff) = G (Vinn – Vinp) + G Voff, or
Voutp – Voutn = G (Vinp – Vinn) - G Voff
Thus, when CROSS is toggled, e.g. after each multiplexer cycle, the offset will alternately appear on the
output as positive and negative, which results in the offset effectively being eliminated, regardless of its
polarity or magnitude.
When CROSS is high, the connection of the amplifier input devices is reversed. This preserves the overall polarity of that amplifier gain; it inverts its input offset. By alternately reversing the connection, the amplifier’s offset is averaged to zero. This removes the most significant long-term drift mechanism in the
12
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
voltage reference. The CHOP_E bits control the behavior of CROSS. The CROSS signal will reverse the
amplifier connection in the voltage reference in order to negate the effects of its offset. On the first CK32
rising edge after the last multiplexer state of its sequence, the multiplexer will wait one additional CK32
cycle before beginning a new frame. At the beginning of this cycle, the value of CROSS will be updated
according to the CHOP_E bits. The extra CK32 cycle allows time for the chopped VREF to settle. During
this cycle, MUXSYNC is held high. The leading edge of MUXSYNC initiates a pass through the CE program sequence. The beginning of the sequence is the serial readout of the four RTM words.
CHOP_E has four states: positive, reverse, and two toggle states. In the positive state, CHOP_E = 01,
CROSS and CHOP_CLK are held low. In the reverse state, CHOP_E = 10, CROSS and CHOP_CLK are
held high. In the first toggle state, CHOP_E = 00, CROSS is automatically toggled near the end of each
multiplexer frame and an ALT frame is forced during the last multiplexer frame in each SUM cycle. It is
desirable that CROSS take on alternate values during each ALT frame. For this reason, if CHOP_E = 00,
CROSS will not toggle at the end of the multiplexer frame immediately preceding the ALT frame in each
accumulation interval.
Accumulation interval n
1
2
3
4
Multiplexer frames
Alternative MUX cycle
Accumulation interval n+1
2519 2520 1
2
3
4
Multiplexer frames
2519 2520
Alternative MUX cycle
CROSS
CROSS
Figure 3: CROSS Signal with CHOP_E = 00
Figure 3 shows CROSS over two accumulation intervals when CHOP_E = 00: At the end of the first
interval, CROSS is low, at the end of the second interval, CROSS is high. The offset error for the
two temperature measurements taken during the ALT multiplexer frames will be averaged to zero.
Note that the number of multiplexer frames in an accumulation interval is always even. Operation
with CHOP_E = 00 does not require control of the chopping mechanism by the MPU while eliminating
the offset for temperature measurement.
In the second toggle state, CHOP_E = 11, no ALT frame is forced during the last multiplexer cycle in an
accumulation interval, and CROSS always toggles near the end of each multiplexer frame.
The internal bias voltage, VBIAS (typically 1.6 V), is used by the ADC as a reference when measuring the
temperature and battery monitor signals.
1.2.6
Temperature Sensor
The 71M6533 and 71M6534 include an on-chip temperature sensor implemented as a bandgap reference. It is used to determine the die temperature. The MPU may request an alternate multiplexer cycle
containing the temperature sensor output by asserting MUX_ALT.
The primary use of the temperature data is to determine the magnitude of compensation required to offset
the thermal drift in the system (see Section 3.5 Temperature Compensation).
1.2.7
Battery Monitor
The battery voltage is measured by the ADC during alternative multiplexer frames if the BME (Battery
Measure Enable) bit in the I/O RAM is set. While BME is set, an on-chip 45 kΩ load resistor is applied to
the battery and a scaled fraction of the battery voltage is applied to the ADC input. After each alternative
MUX frame, the result of the ADC conversion is available at XRAM address 0x07. BME is ignored and
assumed zero when system power is not available (V1 < VBIAS). See Section 5.4.5 Battery Monitor
for details regarding the ADC LSB size and the conversion accuracy.
1.2.8
AFE Functional Description
The AFE functions as a data acquisition system, controlled by the MPU. The main signals (IA, VA, IB,
VB, etc.) are sampled and the ADC counts obtained are stored in XRAM where they can be accessed by
v1.1
© 2007-2009 TERIDIAN Semiconductor Corporation
13
71M6533/71M6534 Data Sheet
FDS_6533_6534_004
the CE and, if necessary, by the MPU. Alternate multiplexer cycles are initiated less frequently by the
MPU to gather access to the slow temperature and battery signals.
VREF
∆Σ ADC
CONVERTER
IAP
IAN
VA
IBP
IBN
VB
ICP
ICN
VC
IDP
IDN
VBIAS
VBIAS
FIR
VADC
FIR_LEN
MUX
VREF
EQU
MUX_ALT
MUX_DIV
VREF_CAL
VREF_DIS
22
VB_REF
ADC_E
VREF
VBAT
TEMP
Figure 4: AFE Block Diagram
1.2.9
Digital Computation Engine (CE)
The CE, a dedicated 32-bit signal processor, performs the precision computations necessary to accurately measure energy. The CE calculations and processes include:
•
•
•
•
•
•
•
Multiplication of each current sample with its associated voltage sample to obtain the energy per
sample (when multiplied with the constant sample time).
Frequency-insensitive delay cancellation on all six channels (to compensate for the delay between
samples caused by the multiplexing scheme).
90° phase shifter (for VAR calculations).
Pulse generation.
Monitoring of the input signal frequency (for frequency and phase information).
Monitoring of the input signal amplitude (for sag detection).
Scaling of the processed samples based on calibration coefficients. Scaling of all samples based on
temperature compensation information.
The CE program resides in flash memory. Common access to flash memory by the CE and MPU is controlled by a memory share circuit. Each CE instruction word is two bytes long. Allocated flash space for
the CE program cannot exceed 4096 16-bit words (8 KB). The CE program counter begins a pass
through the CE code each time multiplexer state 0 begins. The code pass ends when a HALT instruction
is executed. For proper operation, the code pass must be completed before the multiplexer cycle ends
(see Section 2.2 System Timing Summary).
The CE program must begin on a 1 KB boundary of the flash address. The I/O RAM register
CE_LCTN[7:0] defines which 1 KB boundary contains the CE code. Thus, the first CE instruction is located at 1024*CE_LCTN[7:0].
The CE can access up to 4 KB of data RAM (XRAM), or 1024 32-bit data words, starting at RAM address
0x0000.
The XRAM can be accessed by the FIR filter block, the RTM circuit, the CE, and the MPU. Assigned time
slots are reserved for FIR and MPU, respectively, to prevent bus contention for XRAM data access by the
CE.
The MPU can read and write the XRAM shared between the CE and MPU as the primary means of data
communication between the two processors.
14
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
Table 4 shows the CE addresses in XRAM allocated to analog inputs from the AFE.
Table 4: XRAM Locations for ADC Results
Address (HEX)
0x00
0x01
0x02
0x03
0x04
0x05
0x06
0x07 – 0x09
0x0A
0x0B
Name
IA
VA
IB
VB
IC
VC
ID
–
TEMP
VBAT
Description
Phase A current
Phase A voltage
Phase B current
Phase B voltage
Phase C current
Phase C voltage
Neutral current
Not used
Temperature
Battery Voltage
The CE is aided by support hardware to facilitate implementation of equations, pulse counters, and accumulators. This hardware is controlled through I/O RAM locations EQU (equation assist), DIO_PV and
DIO_PW (pulse count assist), and PRE_SAMPS and SUM_CYCLES (accumulation assist).
PRE_SAMPS and SUM_CYCLES support a dual-level accumulation scheme where the first accumulator
accumulates results from PRE_SAMPS samples and the second accumulator accumulates up to
SUM_CYCLES of the first accumulator results. The integration time for each energy output is
PRE_SAMPS * SUM_CYCLES/2520.6 (with MUX_DIV = 6). CE hardware issues the XFER_BUSY interrupt
when the accumulation is complete.
1.2.10 Meter Equations
The 71M6533 and 71M6534 provide hardware assistance to the CE in order to support various meter
equations. This assistance is controlled through I/O RAM location EQU (equation assist). The Compute
Engine (CE) firmware for industrial configurations can implement the equations listed in Table 5. EQU
specifies the equation to be used based on the meter configuration and on the number of phases used for
metering.
Table 5: Inputs Selected in Regular and Alternate Multiplexer Cycles
Wh and VARh formula
EQU Description
Element 0
Element 1
Element
2
VA · IA
VA · IB
N/A
VA(IA-IB)/2
N/A
N/A
0
1 element, 2 W, 1φ with
neutral current sense
1
1 element, 3 W, 1φ
2
2 element, 3 W, 3φ Delta
VA · IA
VB · IB
N/A
3
2 element, 4 W, 3φ Delta
VA(IA-IB)/2
VC ·IC
N/A
4
2 element, 4 W, 3φ Wye
VA(IA-IB)/2 VB(IC-IB)/2
5
3 element, 4 W, 3φ Wye
VA · IA
VB · IB
Mux
Sequence
ALT Mux Sequence
Sequence is
programmable
with
SLOTn_SEL
Sequence is
programmable
with
SLOTn_ALTSEL
N/A
VC · IC
1.2.11 Real-Time Monitor
The CE contains a Real-Time Monitor (RTM), which can be programmed to monitor four selectable XRAM
locations at full sample rate. The four monitored locations are serially output to the TMUXOUT pin via the
digital output multiplexer at the beginning of each CE code pass. The RTM can be enabled and disabled
with RTM_E. The RTM output is clocked by CKTEST. Each RTM word is clocked out in 35 cycles and contains a leading flag bit. See Figure 19 for the RTM output format. RTM is low when not in use.
v1.1
© 2007-2009 TERIDIAN Semiconductor Corporation
15
71M6533/71M6534 Data Sheet
FDS_6533_6534_004
1.2.12 Pulse Generators
The 71M6533 and 71M6534 provide four pulse generators, RPULSE, WPULSE, XPULSE and YPULSE,
as well as hardware support for the RPULSE and WPULSE pulse generators. The pulse generators can
be used to output CE status indicators, SAG for example, to DIO pins.
The polarity of the pulses may be inverted with PLS_INV. When this bit is set, the pulses are active high,
rather than the more usual active low. PLS_INV inverts all the pulse outputs.
XPULSE and YPULSE
Pulses generated by the CE may be exported to the XPULSE and YPULSE pulse outputs. Pins DIO8
and DIO9 are used for these pulses. Generally, the XPULSE and YPULSE outputs are updated once on
each pass of the CE code, resulting in a pulse frequency up to a maximum of 1260Hz (assuming a MUX
frame is 13 CK32 cycles).
Standard CE code permits the selection of either an energy indication or signaling of a sag event for the
YPULSE output. See Section 4.3 CE Interface Description for details.
RPULSE and WPULSE
During each CE code pass, the hardware stores exported WPULSE AND RPULSE sign bits in an 8-bit FIFO
and outputs them at a specified interval. This permits the CE code to calculate the RPULSE and WPULSE
outputs at the beginning of its code pass and to rely on hardware to spread them over the MUX frame. The
FIFO is reset at the beginning of each MUX frame. PLS_INTERVAL[7:0] controls the delay to the first pulse
update and the interval between subsequent updates. The LSB of PLS_INTERVAL[7:0] is equivalent to 4
CK_FIR cycles. If zero, the FIFO is deactivated and the pulse outputs are updated immediately. Thus,
NINTERVAL is 4*PLS_INTERVAL.
Since the FIFO resets at the beginning of each MUX frame, the user must specify PLS_INTERVAL so that
all of the pulse updates are output before the MUX frame completes. For instance, if the CE code outputs
6 updates per MUX interval, and if the MUX interval is 1950 cycles long, the ideal value for the interval is
1950/6/4 = 81.25. If PLS_INTERVAL = 82, the fifth output will occur too late and be lost. In this case, the
proper value for PLS_INTERVAL is 81.
Hardware also provides a maximum pulse width feature: PLS_MAXWIDTH[7:0] selects a maximum negative pulse width to be Nmax updates according to the formula: Nmax = (2*PLS_MAXWIDTH+1). If
PLS_MAXWIDTH=255, no width checking is performed.
The WPULSE and RPULSE pulse generator outputs are available on DIO6 and DIO7, respectively. They
can also be output on OPT_TX (see OPT_TXE[1:0] for details).
1.2.13 Data RAM (XRAM)
In the 71M6533/71M6534, the CE and MPU use a single general-purpose Data RAM (also referred to as
XRAM). The Data RAM is 1024 32-bit words, shared between the CE and the MPU using a time-multiplex method. This reduces MPU wait states when accessing CE data. When the MPU and CE are clocking at maximum frequency (10 MHz), the DRAM will make up to four accesses during each 100 ns interval. These consist of two MPU accesses, one CE access and one SPI access.
The Data RAM is 32 bits wide and uses an external multiplexer so as to appear byte-wide to the MPU.
The Data RAM hardware will convert an MPU byte write operation into a read-modify-write operation that
requires two Data RAM accesses. The second access is guaranteed to be available because the MPU
cannot access the XRAM on two consecutive instructions unless it is using the same address.
In addition to the reduction of wait states, this arrangement permits the MPU to easily use unneeded CE data
memory. Likewise, the amount of memory the CE uses is not limited by the size of a dedicated CE data RAM.
16
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
1.2.14 CE Functional Overview
The ADC processes one sample per channel per multiplexer cycle. Figure 5 shows the timing of the
samples taken during one multiplexer cycle (phases A, B, and C being processed). During an ALT multiplexer sequence, missing samples are filled in by the CE.
The number of samples processed during one accumulation cycle is controlled by the I/O RAM registers
PRE_SAMPS (0x2001[7:6]) and SUM_CYCLES (0x2001[5:0]). The integration time for each energy output is:
PRE_SAMPS * SUM_CYCLES / 2520.6, where 2520.6 is the sample rate in Hz
For example, PRE_SAMPS = 42 and SUM_CYCLES = 50 will establish 2100 samples per accumulation
cycle. PRE_SAMPS = 100 and SUM_CYCLES = 21 will result in the exact same accumulation cycle of 2100
samples or 833 ms. After an accumulation cycle is completed, the XFER_BUSY interrupt signals to the
MPU that accumulated data are available.
1/2520.6Hz = 397µs
IB
2/32768Hz =
61.04µs
B
VB
A
IC
VC
IA
VA
C
13/32768Hz = 397µs
per mux cycle
Figure 5: Samples from Multiplexer Cycle
The end of each multiplexer cycle is signaled to the MPU by the CE_BUSY interrupt. At the end of each
multiplexer cycle, status information, such as sag data and the digitized input signal, is available to the MPU.
833ms
20ms
XFER_BUSY
Interrupt to MPU
Figure 6: Accumulation Interval
Figure 6 shows the accumulation interval resulting from PRE_SAMPS = 42 and SUM_CYCLES = 50, consisting of 2100 samples of 397µs each, followed by the XFER_BUSY interrupt. The sampling in this example is applied to a 50 Hz signal.
v1.1
© 2007-2009 TERIDIAN Semiconductor Corporation
17
71M6533/71M6534 Data Sheet
FDS_6533_6534_004
There is no correlation between the line signal frequency and the choice of PRE_SAMPS or SUM_CYCLES
(even though when SUM_CYCLES = 42, one set of SUM_CYCLES happens to sample a period of 16.6 ms).
Furthermore, sampling does not have to start when the line voltage crosses the zero line, and the length
of the accumulation interval need not be an integer multiple of the signal cycles.
18
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
1.3
71M6533/71M6534 Data Sheet
80515 MPU Core
The 71M6533 and 71M6534 include an 80515 MPU (8-bit, 8051-compatible) that processes most instructions
in one clock cycle. Using a 10 MHz clock results in a processing throughput of 10 MIPS. The 80515 architecture eliminates redundant bus states and implements parallel execution of fetch and execution phases. Normally, a machine cycle is aligned with a memory fetch, therefore, most of the 1-byte instructions are performed
in a single machine cycle (MPU clock cycle). This leads to an 8x average performance improvement (in terms
of MIPS) over the Intel 8051 device running at the same clock frequency.
Table 6 shows the CKMPU frequency as a function of the allowed combinations of the MPU clock divider
MPU_DIV[2:0] and the MCK divider registers M40MHZ and M26MHZ. Actual processor clocking speed
can be adjusted to the total processing demand of the application (metering calculations, AMR management, memory management, LCD driver management and I/O management) using the I/O RAM register
MPU_DIV[2:0] and the MCK divider registers M40MHZ and M26MHZ, as shown in Table 6.
Table 6: CKMPU Clock Frequencies
MPU_DIV [2:0]
000
001
010
011
100
101
110
111
[M40MHZ, M26MHZ] Values
[1,0]
[0,1]
[0,0]
10 MHz
6.6 MHz
5 MHz
5 MHz
3.3 MHz
2.5 MHz
2.5 MHz
1.65 MHz
1.25 MHz
1.25 MHz
825 kHz
625 kHz
625 kHz
412.5 kHz
312.5 kHz
312.5 kHz
206.25 kHz
156.25 kHz
156.25 kHz
103.13 kHz
78.13 kHz
156.25 kHz
103.13 kHz
78.13 kHz
Typical measurement and metering functions based on the results provided by the internal 32-bit compute engine (CE) are available for the MPU as part of the Teridian standard library. A standard ANSI C
80515 application programming interface library is available to help reduce design cycle.
1.3.1
Memory Organization and Addressing
The 80515 MPU core incorporates the Harvard architecture with separate code and data spaces. Memory organization in the 80515 is similar to that of the industry standard 8051. There are four memory
areas: Program memory (Flash, shared by MPU and CE), external RAM (Data RAM, shared by the CE
and MPU), Configuration RAM and internal data memory (Internal RAM). Table 7 shows the memory
map.
Program Memory
The 80515 can address up to 64 KB of program memory space from 0x0000 to 0xFFFF. Program memory is read when the MPU fetches instructions or performs a MOVC operation. Access to program memory
above 0x7FFF is controlled by the FL_BANK[2:0] register (SFR 0xB6).
After reset, the MPU starts program execution from program memory location 0x0000. The lower part of
the program memory includes reset and interrupt vectors. The interrupt vectors are spaced at 8-byte intervals, starting from 0x0003.
MPU External Data Memory (XRAM)
Both internal and external memory is physically located on the 71M6533/71M6534 device. The external
memory referred to in this documentation is only external to the 80515 MPU core.
4 KB of RAM starting at address 0x0000 is shared by the CE and MPU. The CE normally uses the first
1 KB, leaving 3 KB for the MPU. Different versions of the CE code use varying amounts. Consult the
documentation for the specific code version being used for the exact limit.
v1.1
© 2007-2009 TERIDIAN Semiconductor Corporation
19
71M6533/71M6534 Data Sheet
FDS_6533_6534_004
If the MPU overwrites the CE’s working RAM, the CE’s output may be corrupted. If the CE is disabled, the first 0x40 bytes of RAM are still unusable because the 71M6533/71M6534 ADC writes to
these locations.
The 80515 writes into external data memory when the MPU executes a MOVX @Ri,A or MOVX
@DPTR,A instruction. The MPU reads external data memory by executing a MOVX A,@Ri or MOVX
A,@DPTR instruction (SFR PDATA provides the upper 8 bytes for the MOVX A,@Ri instruction).
Internal and External Memory Map
Table 7 shows the address, type, use and size of the various memory components.
Only the memory ranges shown in Table 7 contain physical memory.
Table 7: Memory Map
Address
(hex)
Memory
Technology
00000-1FFFF
Flash Memory
00000-3FFFF*
Flash Memory
on 1K boundary
Memory
Type
Nonvolatile
Name
Typical Usage
Memory Size
(bytes)
Program memory
MPU Program and
non-volatile data
128 KB
Nonvolatile
Program memory
MPU Program and
non-volatile data
256 KB*
Flash Memory
Nonvolatile
Program memory
CE program
8 KB max.
0000-0FFF
Static RAM
Volatile
External RAM
(XRAM)
Shared by CE and
MPU
4 KB
2000-20BF,
20C8-20FF
Static RAM
Volatile
Configuration RAM
(I/O RAM)
Hardware control
256
20C0-20C7
Static RAM
Nonvolatile
(battery)
Configuration RAM
(I/O RAM)
Battery-buffered
memory
8
0000-00FF
Static RAM
Volatile
Internal RAM
Part of 80515 Core
256
* For the 71M6534 only.
MOVX Addressing
There are two types of instructions differing in whether they provide an 8-bit or 16-bit indirect address to
the external data RAM.
In the first type, MOVX A,@Ri, the contents of R0 or R1 in the current register bank provide the eight
lower-ordered bits of address. The eight high-ordered bits of the address are specified with the PDATA
SFR. This method allows the user paged access (256 pages of 256 bytes each) to all ranges of the
external data RAM.
In the second type of MOVX instruction, MOVX A,@DPTR, the data pointer generates a 16-bit address.
This form is faster and more efficient when accessing very large data arrays (up to 64 KB), since no
additional instructions are needed to set up the eight high ordered bits of the address.
It is possible to mix the two MOVX types. This provides the user with four separate data pointers, two
with direct access and two with paged access, to the entire 64 KB of external memory range.
Dual Data Pointer
The Dual Data Pointer accelerates the block moves of data. The standard DPTR is a 16-bit register that
is used to address external memory or peripherals. In the 80515 core, the standard data pointer is called
DPTR, the second data pointer is called DPTR1. The data pointer select bit, located in the LSB of the DPS
register (DPS[0]), chooses the active pointer. DPTR is selected when DPS[0] = 0 and DPTR1 is selected
when DPS[0] = 1.
20
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
The user switches between pointers by toggling the LSB of the DPS register. The values in the data pointers are not affected by the LSB of the DPS register. All DPTR related instructions use the currently selected DPTR for any activity.
The second data pointer may not be supported by certain compilers.
DPTR1 is useful for copy routines, where it can make the inner loop of the routine two instructions faster compared to the reloading of DPTR from registers. Any interrupt routine using DPTR1 must save
and restore DPS, DPTR and DPTR1, which increases stack usage and slows down interrupt latency.
By selecting the Evatronics R80515 core in the Keil compiler project settings and by using the compiler
directive “MODC2”, dual data pointers are enabled in certain library routines.
An alternative data pointer is available in the form of the PDATA register (SFR 0xBF, sometimes referred
to as USR2). It defines the high byte of a 16-bit address when reading or writing XDATA with the instruction MOVX A,@Ri or MOVX @Ri,A.
Internal Data Memory Map and Access
The Internal data memory provides 256 bytes (0x00 to 0xFF) of data memory. The internal data memory
address is always 1 byte wide. Table 8 shows the internal data memory map.
The Special Function Registers (SFR) occupy the upper 128 bytes. The SFR area of internal data memory is available only by direct addressing. Indirect addressing of this area accesses the upper 128 bytes of
Internal RAM. The lower 128 bytes contain working registers and bit addressable memory. The lower 32
bytes form four banks of eight registers (R0-R7). Two bits on the program memory status word (PSW)
select which bank is in use. The next 16 bytes form a block of bit addressable memory space at addresses 0x00-0x7F. All of the bytes in the lower 128 bytes are accessible through direct or indirect addressing.
Table 8: Internal Data Memory Map
Address
0xFF
0x80
0x7F
0x30
0x2F
0x20
0x1F
0x00
1.3.2
Direct Addressing
Indirect Addressing
Special Function Registers (SFRs)
RAM
Byte addressable area
Bit addressable area
Register banks R0…R7
Special Function Registers (SFRs)
A map of the Special Function Registers is shown in Table 9.
Only a few addresses in the SFR memory space are occupied, the others are not implemented. A read
access to unimplemented addresses will return undefined data, while a write access will have no effect.
SFRs specific to the 71M6533/71M6534 are shown in bold print on a gray field. The registers at 0x80,
0x88, 0x90, etc., are bit addressable, all others are byte addressable.
v1.1
© 2007-2009 TERIDIAN Semiconductor Corporation
21
71M6533/71M6534 Data Sheet
FDS_6533_6534_004
Table 9: Special Function Register Map
Bit
Hex/
Addressable
Bin
X000
X001
F8
INTBITS
B
F0
E8
IFLAGS
A
E0
WDCON
D8
PSW
D0
T2CON
C8
IRCON
C0
IEN1
IP1
B8
B0
P3
IEN0
IP0
A8
A0
P2
DIR2
S0CON
S0BUF
98
90
P1
DIR1
TCON
TMOD
88
P0
SP
80
1.3.3
Byte Addressable
X010
S0RELH
FLSHCTL
S0RELL
DIR0
IEN2
DPS
TL0
DPL
X011
X100
X101
X110
S1RELH
S1CON
TL1
DPH
S1BUF
ERASE
TH0
DPL1
X111
FL_BANK
PDATA
PGADR
S1RELL
EEDATA
EECTRL
TH1
DPH1
CKCON
PCON
Bin/
Hex
FF
F7
EF
E7
DF
D7
CF
C7
BF
B7
AF
A7
9F
97
8F
87
Generic 80515 Special Function Registers
Table 10 shows the location, description and reset or power-up value of the generic 80515 SFRs. Additional descriptions of the registers can be found at the page numbers listed in the table.
Table 10: Generic 80515 SFRs - Location and Reset Values
Name
P0
SP
DPL
DPH
DPL1
DPH1
PCON
TCON
TMOD
TL0
TL1
TH0
TH1
CKCON
DPS
S0CON
S0BUF
IEN2
S1CON
22
Address
(Hex)
0x80
0x81
0x82
0x83
0x84
0x85
0x87
0x88
0x89
0x8A
0x8B
0x8C
0x8D
0x8E
0x92
0x98
0x99
0x9A
0x9B
Reset value
Description
(Hex)
0xFF
Port 0
0x07
Stack Pointer
0x00
Data Pointer Low 0
0x00
Data Pointer High 0
0x00
Data Pointer Low 1
0x00
Data Pointer High 1
0x00
UART Speed Control, Idle and Stop mode Control
0x00
Timer/Counter Control
0x00
Timer Mode Control
0x00
Timer 0, low byte
0x00
Timer 1, high byte
0x00
Timer 0, low byte
0x00
Timer 1, high byte
0x01
Clock Control (Stretch=1)
0x00
Data Pointer select Register
0x00
Serial Port 0, Control Register
0x00
Serial Port 0, Data Buffer
0x00
Interrupt Enable Register 2
0x00
Serial Port 1, Control Register
© 2007-2009 TERIDIAN Semiconductor Corporation
Page
24
24
24
24
24
24
28
32
29
29
29
29
29
24
20
28
26
31
28
v1.1
FDS_6533_6534_004
Name
S1BUF
S1RELL
IEN0
IP0
S0RELL
IEN1
IP1
S0RELH
S1RELH
PDATA
IRCON
T2CON
PSW
WDCON
A
B
Address
(Hex)
0x9C
0x9D
0xA8
0xA9
0xAA
0xB8
0xB9
0xBA
0xBB
0xBF
0xC0
0xC8
0xD0
0xD8
0xE0
0xF0
71M6533/71M6534 Data Sheet
Reset value
Description
(Hex)
0x00
Serial Port 1, Data Buffer
0x00
Serial Port 1, Reload Register, low byte
0x00
Interrupt Enable Register 0
0x00
Interrupt Priority Register 0
0xD9
Serial Port 0, Reload Register, low byte
0x00
Interrupt Enable Register 1
0x00
Interrupt Priority Register 1
0x03
Serial Port 0, Reload Register, high byte
0x03
Serial Port 1, Reload Register, high byte
0x00
High address byte for MOVX@Ri - also called USR2
0x00
Interrupt Request Control Register
0x00
Polarity for INT2 and INT3
0x00
Program Status Word
0x00
Baud Rate Control Register (only WDCON[7] bit used)
0x00
Accumulator
0x00
B Register
Page
26
26
31
34
26
31
34
26
26
20
32
32
23
26
23
23
Accumulator (ACC, A):
ACC is the accumulator register. Most instructions use the accumulator to hold the operand. The mnemonics for accumulator-specific instructions refer to accumulator as A, not ACC.
B Register:
The B register is used during multiply and divide instructions. It can also be used as a scratch-pad register to hold temporary data.
Program Status Word (PSW):
This register contains various flags and control bits for the selection of the register banks (see Table 11).
Table 11: PSW Bit Functions (SFR 0xD0)
PSW Bit
7
6
5
Symbol
CV
AC
F0
Function
Carry flag.
Auxiliary Carry flag for BCD operations.
General purpose Flag 0 available for user.
F0 is not to be confused with the F0 flag in the CESTATUS register.
v1.1
4
RS1
3
RS0
2
1
0
OV
–
P
Register bank select control bits. The contents of RS1 and RS0 select the
working register bank:
RS1/RS0
Bank selected
Location
00
Bank 0
0x00 – 0x07
01
Bank 1
0x08 – 0x0F
10
Bank 2
0x10 – 0x17
11
Bank 3
0x18 – 0x1F
Overflow flag.
User defined flag.
Parity flag, affected by hardware to indicate odd or even number of one bits in
the Accumulator, i.e. even parity.
© 2007-2009 TERIDIAN Semiconductor Corporation
23
71M6533/71M6534 Data Sheet
FDS_6533_6534_004
Stack Pointer (SP):
The stack pointer is a 1-byte register initialized to 0x07 after reset. This register is incremented before
PUSH and CALL instructions, causing the stack to begin at location 0x08.
Data Pointer:
The data pointer (DPTR) is 2 bytes wide. The lower part is DPL, and the highest is DPH. It can be loaded
as two registers (e.g. MOV DPL,#data8). It is generally used to access external code or data space (e.g.
MOVC A,@A+DPTR or MOVX A,@DPTR respectively).
Program Counter:
The program counter (PC) is 2 bytes wide and initialized to 0x0000 after reset. This register is incremented when fetching operation code or when operating on data from program memory.
Port Registers:
The I/O ports are controlled by Special Function Registers P0, P1 and P2. The contents of the SFR can
be observed on corresponding pins on the chip. Writing a 1 to any of the ports (see Table 12) causes the
corresponding pin to be at high level (V3P3). Writing a 0 causes the corresponding pin to be held at a
low level (GND). The data direction registers DIR0, DIR1, and DIR2 define individual pins as input or output pins (see Section 1.4.7 Digital I/O for details).
Table 12: Port Registers
Register
P0
DIR0
P1
DIR1
P2
DIR2
SFR AdR/W Description
dress
0x80
R/W Register for port 0 read and write operations.
0xA2
R/W Data direction register for port 0. Setting a bit to 1 means that the corresponding pin is an output.
0x90
R/W Register for port 1 read and write operations.
0x91
R/W Data direction register for port 1.
0xA0
R/W Register for port 2 read and write operations.
0xA1
R/W Data direction register for port 2.
All DIO ports on the chip are bi-directional. Each of them consists of a Latch (SFR P0 to P2), an output
driver and an input buffer, therefore the MPU can output or read data through any of these ports. Even if
a DIO pin is configured as an output, the state of the pin can still be read by the MPU, for example when
counting pulses issued via DIO pins that are under CE control.
The technique of reading the status of or generating interrupts based on DIO pins configured as
outputs can be used to implement pulse counting.
Clock Stretching (CKCON)
The three low order bits of the CKCON register define the stretch memory cycles that are used for
MOVX instructions when accessing external peripherals. The practical value of this register for the
71M6533/71M6534 is to guarantee access to XRAM between CE, MPU, and SPI. The default setting of
CKCON (001) should not be changed.
Table 13 shows how the signals of the External Memory Interface change when stretch values are set
from 0 to 7. The widths of the signals are counted in MPU clock cycles. The post-reset state of the
CKCON register (001), which is shown in bold in the table, performs the MOVX instructions with a stretch
value equal to 1.
24
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
Table 13: Stretch Memory Cycle Width
1.3.4
CKCON[2:0]
Stretch
Value
000
001
010
011
100
101
110
111
0
1
2
3
4
5
6
7
Read Signal Width
memaddr
memrd
1
1
2
2
3
3
4
4
5
5
6
6
7
7
8
8
Write Signal Width
memaddr
memwr
2
1
3
1
4
2
5
3
6
4
7
5
8
6
9
7
71M6533/71M6534-Specific Special Function Registers
Table 14 shows the location and description of the 71M6533/71M6534-specific SFRs.
Table 14: 71M6533/71M6534 Specific SFRs
Register
(Alternate
Name)
EEDATA
EECTRL
SFR
Address
Bit Field
Name
R/W
Description
0x9E
0x9F
R/W
R/W
ERASE
(FLSH_ERASE)
0x94
W
FL_BANK[2:0]
PGADDR
(FLSH_PGADR)
0xB6[2:0]
0xB7
FLSHCRL
0xB2[0]
FLSH_PWE
0xB2[1]
FLSH_MEEN
0xB2[4]
WRPROT_CE
0xB2[5]
WRPROT_BT
0xB2[6]
SECURE
0xB2[7]
PREBOOT
I2C EEPROM interface data register.
I2C EEPROM interface control register. See
Section 1.4.10 EEPROM Interface for a description of the command and status bits available
for EECTRL.
This register is used to initiate either the Flash
Mass Erase cycle or the Flash Page Erase cycle.
See the Flash Memory section for details.
Flash Bank Selection.
Flash Page Erase Address register. Contains
the flash memory page address (page 0 through
page 127) that will be erased (default = 0x00).
Must be re-written for each new Page Erase
cycle.
Program Write Enable:
0: MOVX commands refer to XRAM Space,
normal operation (default).
1: MOVX @DPTR,A moves A to Program
Space (Flash) @ DPTR.
Mass Erase Enable:
0: Mass Erase disabled (default).
1: Mass Erase enabled.
Must be re-written for each new Mass Erase cycle.
Protects flash from address CE_LCTN*1024 to
the end of memory from flash page erase.
Protects flash from address 0 to address
BOOT_SIZE*1024 from flash page erase.
Enables security provisions that prevent external
reading of flash memory and CE program RAM.
This bit is reset on chip reset and may only be set.
Attempts to write zero are ignored.
Indicates that the preboot sequence is active.
v1.1
R/W
R/W
R/W
W
R/W
R
© 2007-2009 TERIDIAN Semiconductor Corporation
25
71M6533/71M6534 Data Sheet
Register
(Alternate
Name)
IFLAGS
INTBITS
(INT0 … INT6)
SFR
Address
FDS_6533_6534_004
Bit Field
Name
R/W
Description
This flag monitors the XFER_BUSY interrupt. It
is set by hardware and must be cleared by the
interrupt handler.
This flag monitors the RTC_1SEC interrupt. It
is set by hardware and must be cleared by the
interrupt handler.
This flag indicates that a flash write was attempted while the CE was busy.
This flag indicates that a flash write was in progress when the CE was attempting to begin a
code pass.
This flag indicates that the wake-up pushbutton
was pressed.
This flag indicates that the MPU was awakened
by the autowake timer.
PLL_RISE Interrupt Flag:
Write 0 to clear the PLL_RISE interrupt flag.
PLL_FALL Interrupt Flag:
Write 0 to clear the PLL_FALL interrupt flag.
Interrupt inputs. The MPU may read these bits
to see the status of external interrupts INT0 up
to INT6. These bits do not have any memory
and are primarily intended for debug use.
The WDT is reset when a 1 is written to this bit.
0xE8[0]
IE_XFER
R/W
0xE8[1]
IE_RTC
R/W
0xE8[2]
FW_COL0
R/W
0xE8[3]
FW_COL1
R/W
0xE8[4]
IE_PB
R/W
0xE8[5]
IE_WAKE
R/W
0xE8[6]
PLL_RISE
R/W
0xE8[7]
PLL_FALL
R/W
0xF8[6:0]
INT6 … INT0
R
0xF8[7]
WD_RST
W
Only byte operations on the entire INTBITS register should be used when
writing. The byte must have all bits set except the bits that are to be cleared.
1.3.5
Instruction Set
All instructions of the generic 8051 microcontroller are supported. A complete list of the instruction set
and of the associated op-codes is contained in the 71M653X Software User’s Guide (SUG).
1.3.6
UARTs
The 71M6533 and 71M6534 include a UART (UART0) that can be programmed to communicate with a
variety of AMR modules and other external devices. A second UART (UART1) is connected to the optical
port, as described in the 1.4.6 UART and Optical Interface section.
The UARTs are dedicated 2-wire serial interfaces, which can communicate with an external host processor at up to 38,400 bits/s (with MPU clock = 1.2288 MHz). The operation of the RX and TX UART0 pins
is as follows:
•
•
UART0 RX: Serial input data are applied at this pin. Conforming to RS-232 standard, the bytes are
input LSB first.
UART0 TX: This pin is used to output the serial data. The bytes are output LSB first.
The 71M6533 and 71M6534 have several UART-related registers for the control and buffering of serial
data.
The serial buffers consist of sets of two separate registers (one set for each UART), a transmit buffer
(S0BUF, S1BUF) and a receive buffer (R0BUF, R1BUF). Writing data to the transmit buffer starts the
26
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
transmission by the associated UART. Received data are available by reading from the receive buffer.
Both UARTs can simultaneously transmit and receive data.
WDCON[7] selects whether timer 1 or the internal baud rate generator is used. All UART transfers are
programmable for parity enable, parity, 2 stop bits/1 stop bit and XON/XOFF options for variable communication baud rates from 300 to 38400 bps. Table 15 shows how the baud rates are calculated. Table 16
shows the selectable UART operation modes.
Table 15: Baud Rate Generation
Using Timer 1
(WDCON[7] = 0)
2smod * fCKMPU/ (384 * (256-TH1))
N/A
UART0
UART1
Using Internal Baud Rate Generator
(WDCON[7] = 1)
smod
2
* fCKMPU/(64 * (210-S0REL))
fCKMPU/(32 * (210-S1REL))
S0REL and S1REL are 10-bit values derived by combining bits from the respective timer reload registers.
SMOD is the SMOD bit in the SFR PCON register. TH1 is the high byte of timer 1.
Table 16: UART Modes
UART 0
Mode 0
Mode 1
Mode 2
Mode 3
N/A
Start bit, 8 data bits, stop bit, variable
baud rate (internal baud rate generator
or timer 1)
Start bit, 8 data bits, parity, stop bit,
fixed baud rate 1/32 or 1/64 of fCKMPU
Start bit, 8 data bits, parity, stop bit, variable baud rate (internal baud rate generator or timer 1)
UART 1
Start bit, 8 data bits, parity, stop bit, variable
baud rate (internal baud rate generator)
Start bit, 8 data bits, stop bit, variable baud
rate (internal baud rate generator)
N/A
N/A
Parity of serial data is available through the P flag of the accumulator. 7-bit serial modes with
parity, such as those used by the FLAG protocol, can be simulated by setting and reading bit 7 of
8-bit output data. 7-bit serial modes without parity can be simulated by setting bit 7 to a constant
1. 8-bit serial modes with parity can be simulated by setting and reading the 9th bit, using the
control bits TB80 (S0CON[3]) and TB81 (S1CON[3]) in the S0CON and S1CON SFRs for transmit
and RB81 (S1CON[2]) for receive operations.
The feature of receiving 9 bits (Mode 3 for UART0, Mode A for UART1) can be used as handshake signals for inter-processor communication in multi-processor systems. In this case, the slave processors
have bit SM20 (S0CON[5]) for UART0, or SM21 (S1CON[5] for UART1, set to 1. When the master processor outputs the slave’s address, it sets the 9th bit to 1, causing a serial port receive interrupt in all the
slaves. The slave processors compare the received byte with their address. If there is a match, the addressed slave will clear SM20 or SM21 and receive the rest of the message. The rest of the slave’s will
ignore the message. After addressing the slave, the host outputs the rest of the message with the 9th bit
set to 0, so no additional serial port receive interrupts will be generated.
UART Control Registers:
The functions of UART0 and UART1 depend on the setting of the Serial Port Control Registers S0CON
and S1CON shown in Table 17 and Table 18, respectively, and the PCON register shown in Table 19.
The UARTs require software to clear the interrupt bits. It is recommended to use bit manipulation instructions rather than byte instructions when using UART1 in full duplex mode. For example, the CLR TI0 instruction should be used instead of ANL #0FDH,S0CON. Further measures in code involve reducing and
combining the write operations to S1CON and reducing the time between the read and write operations on
v1.1
© 2007-2009 TERIDIAN Semiconductor Corporation
27
71M6533/71M6534 Data Sheet
FDS_6533_6534_004
S1CON. It is also recommended to have a timeout slightly longer than one character time on both interrupts that restarts the transmit or receive logic.
Table 17: The S0CON (UART0) Register (SFR 0x98)
Bit
S0CON[7]
Symbol
SM0
S0CON[6]
SM1
S0CON[5]
S0CON[4]
S0CON[3]
SM20
REN0
TB80
S0CON[2]
RB80
S0CON[1]
TI0
S0CON[0]
RI0
Function
The SM0 and SM1 bits set the UART0 mode:
Mode
Description
SM0
SM1
0
N/A
0
0
1
8-bit UART
0
1
2
9-bit UART
1
0
3
9-bit UART
1
1
Enables the inter-processor communication feature.
If set, enables serial reception. Cleared by software to disable reception.
The 9th transmitted data bit in Modes 2 and 3. Set or cleared by the
MPU, depending on the function it performs (parity check, multiprocessor
communication etc.)
In Modes 2 and 3 it is the 9th data bit received. In Mode 1, SM20 is 0,
RB80 is the stop bit. In mode 0, this bit is not used. Must be cleared by
software.
Transmit interrupt flag; set by hardware after completion of a serial transfer. Must be cleared by software.
Receive interrupt flag; set by hardware after completion of a serial reception. Must be cleared by software.
Table 18: The S1CON (UART1) Register (SFR 0x9B)
Bit
S1CON[7]
Symbol
SM
S1CON[5]
S1CON[4]
S1CON[3]
SM21
REN1
TB81
S1CON[2]
RB81
S1CON[1]
TI1
S1CON[0]
RI1
Function
Sets the baud rate and mode for UART1.
SM
Mode
Description
Baud Rate
0
A
9-bit UART
variable
1
B
8-bit UART
variable
Enables the inter-processor communication feature.
If set, enables serial reception. Cleared by software to disable reception.
The 9th transmitted data bit in Mode A. Set or cleared by the MPU, depending on the function it performs (parity check, multiprocessor communication etc.)
In Modes A and B, it is the 9th data bit received. In Mode B, if SM21 is 0,
RB81 is the stop bit. Must be cleared by software
Transmit interrupt flag, set by hardware after completion of a serial transfer. Must be cleared by software.
Receive interrupt flag, set by hardware after completion of a serial reception. Must be cleared by software.
Table 19: PCON Register Bit Description (SFR 0x87)
Bit
PCON[7]
PCON[6:2]
PCON[1]
Symbol
SMOD
–
STOP
PCON[0]
IDLE
28
Function
The SMOD bit doubles the baud rate when set
Not used.
Stops MPU flash access and MPU peripherals including timers and
UARTs when set until an external interrupt is received.
Stops MPU flash access when set until an internal interrupt is received.
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
1.3.7
71M6533/71M6534 Data Sheet
Timers and Counters
The 80515 has two 16-bit timer/counter registers: Timer 0 and Timer 1. These registers can be configured for counter or timer operations.
In timer mode, the register is incremented every machine cycle, i.e. it counts up once for every 12 periods of
the MPU clock. In counter mode, the register is incremented when the falling edge is observed at the corresponding input signal T0 or T1 (T0 and T1 are the timer gating inputs derived from certain DIO pins, see
Section 1.4.7 Digital I/O). Since it takes 2 machine cycles to recognize a 1-to-0 event, the maximum input
count rate is 1/2 of the clock frequency (CKMPU). There are no restrictions on the duty cycle, however to
ensure proper recognition of the 0 or 1 state, an input should be stable for at least 1 machine cycle.
Four operating modes can be selected for Timer 0 and Timer 1, as shown in Table 20 and Table 21. The
TMOD Register, shown in Table 22, is used to select the appropriate mode. The timer/counter operation
is controlled by the TCON Register, which is shown in Table 23. Bits TR1 (TCON[6]) and TR0 (TCON[4]) in
the TCON register start their associated timers when set.
Table 20: Timers/Counters Mode Description
M1
0
M0
0
Mode
Mode 0
0
1
1
0
Mode 1
Mode 2
1
1
Mode 3
Function
13-bit Counter/Timer mode with 5 lower bits in the TL0 or TL1 register and the remaining 8 bits in the TH0 or TH1 register (for Timer 0
and Timer 1, respectively). The 3 high order bits of TL0 and TL1 are
held at zero.
16-bit Counter/Timer mode.
8-bit auto-reload Counter/Timer. The reload value is kept in TH0 or
TH1, while TL0 or TL1 is incremented every machine cycle. When
TL(x) overflows, a value from TH(x) is copied to TL(x) (where x is 0
for counter/timer 0 or 1 for counter/timer 1.
If Timer 1 M1 and M0 bits are set to 1, Timer 1 stops.
If Timer 0 M1 and M0 bits are set to 1, Timer 0 acts as two independent 8-bit Timer/Counters.
In Mode 3, TL0 is affected by TR0 and gate control bits, and sets the TF0 flag on overflow, while TH0
is affected by the TR1 bit, and the TF1 flag is set on overflow.
Table 21 specifies the combinations of operation modes allowed for Timer 0 and Timer 1.
Table 21: Allowed Timer/Counter Mode Combinations
Timer 0 - mode 0
Timer 0 - mode 1
Timer 0 - mode 2
Mode 0
YES
YES
Not allowed
Timer 1
Mode 1
YES
YES
Not allowed
Mode 2
YES
YES
YES
Table 22: TMOD Register Bit Description (SFR 0x89)
Bit
Symbol
Timer/Counter 1:
Gate
TMOD[7]
TMOD[6]
C/T
TMOD[5:4]
M1:M0
v1.1
Function
If set, enables external gate control (signal INT1). When INT1 is high,
and the TR1 bit is set (see the TCON register), a counter is incremented
every falling edge on T1 input signal
Selects timer or counter operation. When set to 1, a counter operation is
performed. When cleared to 0, the corresponding register will function as a
timer.
Selects the mode for Timer/Counter 1 as shown in Table 20.
© 2007-2009 TERIDIAN Semiconductor Corporation
29
71M6533/71M6534 Data Sheet
FDS_6533_6534_004
Timer/Counter 0
TMOD[3]
Gate
TMOD[2]
TMOD[1:0]
If set, enables external gate control (signal INT0). When INT0 is high,
and the TR0 bit is set (see the TCON register), a counter is incremented
every falling edge on T0 input signal.
Selects timer or counter operation. When set to 1, a counter operation is
C/T
performed. When cleared to 0, the corresponding register will function as
a timer.
M1:M0
Selects the mode for Timer/Counter 0, as shown in Table 20.
Table 23: The TCON Register Bit Functions (SFR 0x88)
Bit
TCON[7]
Symbol
TF1
TCON[6]
TCON[5]
TR1
TF0
TCON[4]
TCON[3]
TR0
IE1
TCON[2]
IT1
TCON[1]
IE0
TCON[0]
IT0
1.3.8
Function
The Timer 1 overflow flag is set by hardware when Timer 1 overflows.
This flag can be cleared by software and is automatically cleared when
an interrupt is processed.
Timer 1 run control bit. If cleared, Timer 1 stops.
Timer 0 overflow flag set by hardware when Timer 0 overflows. This
flag can be cleared by software and is automatically cleared when an
interrupt is processed.
Timer 0 Run control bit. If cleared, Timer 0 stops.
Interrupt 1 edge flag is set by hardware when the falling edge on external pin int1 is observed. Cleared when an interrupt is processed.
Interrupt 1 type control bit set by the MPU. Selects either the falling
edge or low level on input pin to cause an external interrupt.
Interrupt 0 edge flag is set by hardware when the falling edge on external pin int0 is observed. Cleared when an interrupt is processed.
Interrupt 0 type control bit. Selects either the falling edge or low level
on input pin to cause interrupt.
WD Timer (Software Watchdog Timer)
There is no internal software watchdog timer. Use the standard watchdog timer instead (see Section
1.4.12 Hardware Watchdog Timer).
1.3.9
Interrupts
The 80515 provides 11 interrupt sources with four priority levels. Each source has its own request flag(s)
located in a special function register (TCON, IRCON, and SCON). Each interrupt requested by the corresponding flag can be individually enabled or disabled by the enable bits in SFRs IEN0, IEN1, and IEN2.
Figure 7 shows the device interrupt structure.
Interrupt Overview
When an interrupt occurs, the MPU will vector to the predetermined address as shown in Table 36. Once
the interrupt service has begun, it can be interrupted only by a higher priority interrupt. The interrupt service is terminated by a return from instruction, RETI. When an RETI is performed, the processor will return to the instruction that would have been next when the interrupt occurred.
When the interrupt condition occurs, the processor will also indicate this by setting a flag bit. This bit is
set regardless of whether the interrupt is enabled or disabled. Each interrupt flag is sampled once per
machine cycle, then samples are polled by the hardware. If the sample indicates a pending interrupt
when the interrupt is enabled, then the interrupt request flag is set. On the next instruction cycle, the interrupt will be acknowledged by hardware forcing an LCALL to the appropriate vector address, if the following conditions are met:
•
•
•
30
No interrupt of equal or higher priority is already in progress.
An instruction is currently being executed and is not completed.
The instruction in progress is not RETI or any write access to the registers IEN0, IEN1, IEN2, IP0 or IP1.
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
Special Function Registers for Interrupts
The following SFR registers control the interrupt functions:
•
•
•
•
The interrupt enable registers: IEN0, IEN1 and IEN2 (see Table 24, Table 25 and Table 26).
The Timer/Counter control registers, TCON and T2CON (see Table 27 and Table 28).
The interrupt request register, IRCON (see Table 29).
The interrupt priority registers: IP0 and IP1 (see Table 34).
Table 24: The IEN0 Bit Functions (SFR 0xA8)
Bit
IEN0[7]
IEN0[6]
IEN0[5]
IEN0[4]
IEN0[3]
IEN0[2]
IEN0[1]
IEN0[0]
Symbol
EAL
WDT
–
ES0
ET1
EX1
ET0
EX0
Function
EAL = 0 disables all interrupts.
Not used for interrupt control.
Not Used.
ES0 = 0 disables serial channel 0 interrupt.
ET1 = 0 disables timer 1 overflow interrupt.
EX1 = 0 disables external interrupt 1.
ET0 = 0 disables timer 0 overflow interrupt.
EX0 = 0 disables external interrupt 0.
Table 25: The IEN1 Bit Functions (SFR 0xB8)
Bit
IEN1[7]
IEN1[6]
IEN1[5]
IEN1[4]
IEN1[3]
IEN1[2]
IEN1[1]
IEN1[0]
Symbol
–
–
EX6
EX5
EX4
EX3
EX2
–
Function
Not used.
Not used.
EX6 = 0 disables external interrupt 6.
EX5 = 0 disables external interrupt 5.
EX4 = 0 disables external interrupt 4.
EX3 = 0 disables external interrupt 3.
EX2 = 0 disables external interrupt 2.
Not Used.
Table 26: The IEN2 Bit Functions (SFR 0x9A)
Bit
IEN2[0]
v1.1
Symbol
ES1
Function
ES1 = 0 disables the serial channel 1 interrupt.
© 2007-2009 TERIDIAN Semiconductor Corporation
31
71M6533/71M6534 Data Sheet
FDS_6533_6534_004
Table 27: TCON Bit Functions (SFR 0x88)
Bit
TCON[7]
TCON[6]
TCON[5]
TCON[4]
TCON[3]
TCON[2]
Symbol
TF1
TR1
TF0
TR0
IE1
IT1
TCON[1]
TCON[0]
IE0
IT0
Function
Timer 1 overflow flag.
Not used for interrupt control.
Timer 0 overflow flag.
Not used for interrupt control.
External interrupt 1 flag.
External interrupt 1 type control bit:
0 = interrupt on low level.
1 = interrupt on falling edge.
External interrupt 0 flag
External interrupt 0 type control bit:
0 = interrupt on low level.
1 = interrupt on falling edge.
Table 28: The T2CON Bit Functions (SFR 0xC8)
Bit
T2CON[7]
T2CON[6]
Symbol
–
I3FR
T2CON[5]
I2FR
T2CON[4:0]
–
Function
Not used.
Polarity control for INT3:
0 = falling edge.
1 = rising edge.
Polarity control for INT2:
0 = falling edge.
1 = rising edge.
Not used.
Table 29: The IRCON Bit Functions (SFR 0xC0)
Bit
IRCON[7]
IRCON[6]
IRCON[5]
IRCON[4]
IRCON[3]
IRCON[2]
IRCON[1]
IRCON[0]
Symbol
–
–
IEX6
IEX5
IEX4
IEX3
IEX2
–
Function
Not used
Not used
1 = External interrupt 6 occurred and has not been cleared.
1 = External interrupt 5 occurred and has not been cleared.
1 = External interrupt 4 occurred and has not been cleared.
1 = External interrupt 3 occurred and has not been cleared.
1 = External interrupt 2 occurred and has not been cleared.
Not used.
TF0 and TF1 (Timer 0 and Timer 1 overflow flags) will be automatically cleared by hardware when
the service routine is called (Signals T0ACK and T1ACK – port ISR – active high when the service
routine is called).
External MPU Interrupts
External interrupts are the interrupts external to the 80515 core, i.e. signals that originate in other parts of
the 71M6533/71M6534, for example the CE, DIO, RTC, EEPROM interface.
32
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
The MPUs of the 71M6533 and 71M6534 allow seven external interrupts. These are connected as shown
in Table 30. The polarity of interrupts 2 and 3 is programmable in the MPU via the I3FR and I2FR bits in
T2CON. Interrupts 2 and 3 should be programmed for falling sensitivity (I3FR = I2FR = 0). The generic
8051 MPU literature states that interrupts 4 through 6 are defined as rising-edge sensitive. Thus, the
hardware signals attached to interrupts 5 and 6 are inverted to achieve the edge polarity shown in Table
30.
Table 30: External MPU Interrupts
External
Interrupt
0
1
2
3
4
5
6
Connection
Polarity
Digital I/O High Priority
Digital I/O Low Priority
FWCOL0, FWCOL1, SPI
CE_BUSY
PLL_OK (rising), PLL_OK (falling)
EEPROM busy
XFER_BUSY, RTC_1SEC or WD_NROVF
see Section 1.4.7
see Section 1.4.7
falling
falling
rising
falling
falling
Flag Reset
automatic
automatic
automatic
automatic
automatic
automatic
manual
External interrupt 0 and 1 can be mapped to pins on the device using DIO resource maps. See Section
1.4.7 Digital I/O for more information.
FWCOLx interrupts occur when the CE collides with a flash write attempt. See the flash write description
in the Flash Memory section for more detail.
SFR enable bits must be set to permit any of these interrupts to occur. Likewise, each interrupt has its own
flag bit, which is set by the interrupt hardware, and reset by the MPU interrupt handler. XFER_BUSY,
RTC_1SEC, WD_NROVF, FWCOL0, FWCOL1, SPI, PLLRISE and PLLFALL have their own enable and
flag bits in addition to the interrupt 6, 4 and enable and flag bits (see Table 31).
IE0 through IEX6 are cleared automatically when the hardware vectors to the interrupt handler. The other
flags, IE_XFER through IE_PB, are cleared by writing a zero to them.
Since these bits are in an SFR bit addressable byte, common practice would be to clear them
with a bit operation, but this must be avoided. The hardware implements bit operations as a
byte wide read-modify-write hardware macro. If an interrupt occurs after the read, but before
the write, its flag will be cleared unintentionally.
The proper way to clear the flag bits is to write a byte mask consisting of all ones except for a zero in the
location of the bit to be cleared. The flag bits are configured in hardware to ignore ones written to them.
Table 31: Interrupt Enable and Flag Bits
Interrupt Enable
Name
Location
EX0
SFR A8[0]
EX1
SFR A8[2]
EX2
SFR B8[1]
EX3
SFR B8[2]
EX4
SFR B8[3]
EX5
SFR B8[4]
EX6
SFR B8[5]
EX_XFER
2002[0]
EX_RTC
2002[1]
IEN_WD_NROVF 20B0[0]
v1.1
Interrupt Flag
Name
Location
IE0
SFR 88[1]
IE1
SFR 88[3]
IEX2
SFR C0[1]
IEX3
SFR C0[2]
IEX4
SFR C0[3]
IEX5
SFR C0[4]
IEX6
SFR C0[5]
IE_XFER
SFR E8[0]
IE_RTC
SFR E8[1]
WD_NROVF_FLAG 20B1[0]
Interrupt Description
External interrupt 0
External interrupt 1
External interrupt 2
External interrupt 3
External interrupt 4
External interrupt 5
External interrupt 6
XFER_BUSY interrupt (INT 6)
RTC_1SEC interrupt (INT 6)
WDT near overflow (INT 6)
© 2007-2009 TERIDIAN Semiconductor Corporation
33
71M6533/71M6534 Data Sheet
IEN_SPI
20B0[4]
EX_FWCOL
2007[4]
EX_PLL
2007[5]
FDS_6533_6534_004
20B1[4]
SFR E8[3]
SFR E8[2]
SFRE8[6]
SFRE8[7]
SFRE8[5]
SFRE8[4]
SPI_FLAG
IE_FWCOL0
IE_FWCOL1
IE_PLLRISE
IE_PLLFALL
IE_WAKE
IE_PB
SPI Interface (INT2)
FWCOL0 interrupt (INT 2)
FWCOL1 interrupt (INT 2)
PLL_OK rise interrupt (INT 4)
PLL_OK fall interrupt (INT 4)
AUTOWAKE flag
PB flag
The AUTOWAKE and PB flag bits are shown in Table 31 because they behave similarly to interrupt flags,
even though they are not actually related to an interrupt. These bits are set by hardware when the MPU
wakes from a push button or wake timeout. The bits are reset by writing a zero. Note that the PB flag is
set whenever the PB is pushed, even if the part is already awake.
Interrupt Priority Level Structure
All interrupt sources are combined in groups, as shown in Table 32:
Table 32: Interrupt Priority Level Groups
Group
0
1
2
3
4
5
External interrupt 0
Timer 0 interrupt
External interrupt 1
Timer 1 interrupt
Serial channel 0 interrupt
–
Group Members
Serial channel 1 interrupt
–
–
–
–
–
External interrupt 2
External interrupt 3
External interrupt 4
External interrupt 5
External interrupt 6
Each group of interrupt sources can be programmed individually to one of four priority levels (as shown in
Table 33) by setting or clearing one bit in the SFR interrupt priority register IP0 and one in IP1 (Table 34).
If requests of the same priority level are received simultaneously, an internal polling sequence as shown
in Table 35 determines which request is serviced first.
Changing interrupt priorities while interrupts are enabled can easily cause software defects. It is best
to set the interrupt priority registers only once during initialization before interrupts are enabled.
Table 33: Interrupt Priority Levels
IP1[x]
0
0
1
1
IP0[x]
0
1
0
1
Priority Level
Level 0 (lowest)
Level 1
Level 2
Level 3 (highest)
Table 34: Interrupt Priority Registers (IP0 and IP1)
Register
Address
IP0
IP1
SFR 0xA9
SFR 0xB9
34
Bit 7
(MSB)
–
–
Bit 6
Bit 5
Bit 4
Bit 3
Bit 2
Bit 1
–
–
IP0[5]
IP1[5]
IP0[4]
IP1[4]
IP0[3]
IP1[3]
IP0[2]
IP1[2]
IP0[1]
IP1[1]
© 2007-2009 TERIDIAN Semiconductor Corporation
Bit 0
(LSB)
IP0[0]
IP1[0]
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
External interrupt 0
Serial channel 1 interrupt
Timer 0 interrupt
External interrupt 2
External interrupt 1
External interrupt 3
Timer 1 interrupt
External interrupt 4
Serial channel 0 interrupt
External interrupt 5
External interrupt 6
Polling sequence
Table 35: Interrupt Polling Sequence
Interrupt Sources and Vectors
Table 36 shows the interrupts with their associated flags and vector addresses.
Table 36: Interrupt Vectors
Interrupt Request Flag
IE0
TF0
IE1
TF1
RI0/TI0
RI1/TI1
IEX2
IEX3
IEX4
IEX5
IEX6
v1.1
Description
External interrupt 0
Timer 0 interrupt
External interrupt 1
Timer 1 interrupt
Serial channel 0 interrupt
Serial channel 1 interrupt
External interrupt 2
External interrupt 3
External interrupt 4
External interrupt 5
External interrupt 6
Interrupt Vector
Address
0x0003
0x000B
0x0013
0x001B
0x0023
0x0083
0x004B
0x0053
0x005B
0x0063
0x006B
© 2007-2009 TERIDIAN Semiconductor Corporation
35
71M6533/71M6534 Data Sheet
No.
0
FDS_6533_6534_004
External
Source
Internal
Source
Individual
Enable Bits
Individual Flags
DIO
DIO status
changed
DIO_Rn
TCON.1 (IE0)
byte received
UART1
(optical)
Logic and Polarity
Selection
Interrupt
Flags
Interrupt Enable
IEN0.7
(EAL)
IEN0.0
(EX0)
Priority
Assignment
IT0
IEN2.0
(ES1)
S1CON.0 (RI1)
IP1.0/
IP0.0
>=1
byte transmitted
S1CON.1 (TI1)
IEN0.1
(ET0)
SPI I/F
2
Write attempt, CE
Flash
busy
Write
CE code start,
Collision
overflow occurred
TCON.5 (TF0)
IEN_SPI
SPI_FLAG
>=1
DIO
3
CE_BUSY
DIO status
changed
EX_FWCOL
4
PLL OK
PLL status
changed
DIO_Rn
I3FR
overflow occurred
IEN0.3
(ET1)
TCON.7 (TF1)
IEN1.3
(EX4)
IE_PLLRISE
EX_PLL
IE_PLLFALL
UART0
byte transmitted
BUSY fell
EX_EEX
>=1
IEN0.4
(ES0)
>=1
IE_EEX
>=1
command
received
EX_SPI
IE_SPI
XFER_BUSY
accumulation
cycle completed
EX_XFER
IE_XFER
EX_RTC
IE_RTC
IEN_NR_
WDOVF
WD_NROVF_FLAG
RTC_1S
NR_OVF
MPU-external
sources
every second
WDT near
overflow
IP1.3/
IP0.3
IRCON.3
(IEX4)
S0CON.0 (TI0)
I2C
6
IP1.2/
IP0.2
IRCON.2
(IEX3)
S0CON.0 (RI0)
EEPROM
IEN0.2
(EX1)
IEN1.2
(EX3)
TCON.3 (IE1)
byte received
5
IP1.1/
IP0.1
IE_FWCOL1
CE completed code run and
has new status information
Timer 1
I2FR
IRCON.1
(IEX2)
IE_FWCOL0
flash write busy
1
IEN1.1
(EX2)
Polling Sequence
Timer 0
>=1
IP1.4/
IP0.4
IEN1.5
(EX6)
IP1.5/
IP0.5
IRCON.4
(IEX5)
IRCON.5
(IEX6)
Flag=1 means
that an interrupt has occurred and
has not been
cleared
MPU-internal
sources
IEN1.4
(EX5)
EX0 – EX6 are cleared
automatically when the
hardware vectors to the
interrupt handler
Interrupt
Vector
2/2/2009
Figure 7: Interrupt Structure
36
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
1.4
71M6533/71M6534 Data Sheet
On-Chip Resources
1.4.1
Oscillator
The 71M6533/71M6534 oscillator drives a standard 32.768 kHz watch crystal. These crystals are accurate
and do not require a high-current oscillator circuit. The oscillator has been designed specifically to handle
these crystals and is compatible with their high impedance and limited power handling capability. The oscillator power dissipation is very low to maximize the lifetime of any battery attached to VBAT.
Oscillator calibration can improve the accuracy of both the RTC and metering. Refer to Section
1.4.3 Real-Time Clock (RTC) for more information.
The oscillator is powered directly and only from VBAT, which therefore must be connected to a DC voltage source. The oscillator requires approximately 100 nA, which is negligible compared to the internal
leakage of a battery.
The oscillator may appear to work when VBAT is not connected, but this mode of operation is not recommended.
If VBAT is connected to a drained battery or disconnected, a battery test that sets BME may drain
VBAT’s supply and cause the oscillator to stop. A stopped oscillator may force the device to reset.
Therefore, an unexpected reset during a battery test should be interpreted as a battery failure.
1.4.2
PLL and Internal Clocks
Timing for the device is derived from the 32.768 kHz crystal oscillator output. On-chip timing functions
include:
•
•
•
•
•
The MPU clock (CKMPU)
The emulator clock (2 x CKMPU)
The clock for the CE (CKCE)
The clock driving the delta-sigma ADC along with the FIR (CKADC, CKFIR)
A real time clock (RTC).
The two general-purpose counter/timers contained in the MPU are controlled by CKMPU (see Section
1.3.7 Timers and Counters). Table 37 provides a summary of the clock functions provided.
Table 37: Clock System Summary
Clock
Derived
From
MCK Divider / [M40MHZ, M26MHZ]
÷2 / [1,0]
÷3 / [0,1] ÷4** / [0,0]
80 MHz
80 MHz
80 MHz
40 MHz
26.7 MHz
20 MHz
5 MHz † 10 MHz † 6.6 MHz
5 MHz
5 MHz
6.6 MHz
5 MHz
10 MHz***
6.6 MHz *** 5 MHz ***
32 kHz
32 kHz
32 kHz
Brownout Mode
32 kHz
CKPLL
Crystal
off
MCK
CKPLL
112 kHz
CKCE
MCK
off
CKADC / CKFIR
MCK
28 kHz
CKMPU maximum
MCK
28 kHz
CK32
MCK
**
Default state at power-up
***
This is the maximum CKMPU frequency. CKMPU can be reduced from this rate using MPU_DIV.
†
CKCE = 10 MHz when CE10MHZ is set, 5 MHz otherwise.
The master clock, MCK, is generated by an on-chip PLL that multiplies the crystal oscillator output frequency (CK32) by 2400 to provide 80 MHz (78.6432 MHz). A divider controlled by the I/O RAM registers
M40MHZ and M26MHZ permits scaling of MCK by ½, ⅓, and ¼. All other clocks are derived from this
scaled MCK output (making them multiples of 32768 Hz), and the clock skew is matched so that the rising
edges of CKADC, CKCE, CK32, and CKMPU are aligned.
v1.1
© 2007-2009 TERIDIAN Semiconductor Corporation
37
71M6533/71M6534 Data Sheet
FDS_6533_6534_004
The PLL has a 2x emulator clock which is controlled by ECK_DIS. Since clock noise from this feature
may disturb the ADC, it is recommended that this option be avoided when possible.
The MPU clock frequency CKMPU is determined by another divider controlled by the I/O RAM register
MPU_DIV and can be set to MCK/2(MPU_DIV+2) Hz where MPU_DIV varies from 0 to 6. The circuit also generates the 2 x CKMPU clock for use by the emulator. The emulator clock is not generated when
ECK_DIS is asserted.
During a power-on reset, [M40MHZ, M26MHZ] defaults to [0,0], and the MCK divider is set to divide by 4.
When [M40MHZ, M26MHZ] = [1,0], the CE clock frequency may be set to 5 MHz or 10 MHz, using the I/O
RAM register CE10MHZ. In this mode, the ADC and FIR clock frequencies remain at 5 MHz. When
[M40MHZ, M26MHZ] = [0,1], the CE, ADC, FIR, and MPU clock frequencies are shifted to 6.6 MHz. This
increases the ADC sample rate by 33%. In sleep mode, the M40MHZ and M26MHZ inputs to the clock
generator are forced low.
In brownout mode, the clocks are derived from the crystal oscillator, and the clock frequencies are scaled
by 7/8.
1.4.3
Real-Time Clock (RTC)
The RTC is driven directly by the crystal oscillator. It is powered by the net RTC_NV (battery-backed up
supply). The RTC consists of a counter chain and output registers. The counter chain consists of registers for seconds, minutes, hours, day of week, day of month, month, and year. The RTC is capable of
processing leap years. Each counter has its own output register. The RTC registers will not be affected
by the reset pin, watchdog timer resets, or by transitions between the battery modes and mission mode.
Whenever the MPU reads the seconds register, all other output registers are automatically updated.
Since the RTC clock is not coherent to the MPU clock, the MPU must read the seconds register until two
consecutive reads are the same (this requires either 2 or 3 reads). At this point, all RTC output registers
will have the correct time. Regardless of the MPU clock speed, RTC reads require one wait state.
RTC time is set by writing to the RTC_SEC through RTC_YR registers. Each write operation must be preceded by a write operation to the WE register in I/O RAM. The value written to the WE register is unimportant.
Time adjustments are written to the RTCA_ADJ, PREG and QREG registers. Updates to PREG and QREG
must occur after the one second interrupt, and must be finished before reaching the next one-second
boundary. The new values are loaded into the counters at the next one-second boundary.
PREG and QREG are separate registers in the device hardware, but the bits are 16-bit contiguous so the
MPU firmware can treat them as a single register. A single binary number can be calculated and then
loaded into them at the same time.
The 71M6533 and 71M6534 have two rate adjustment mechanisms. The first is an analog rate adjustment, using RTCA_ADJ[6:0], which trims the crystal load capacitance. Setting RTCA_ADJ[6:0] to 00 minimizes the load capacitance, maximizing the oscillator frequency. Setting RTCA_ADJ[6:0] to 0x3F maximizes the load capacitance, minimizing the oscillator frequency. The adjustable capacitance is approximately:
C ADJ =
RTCA _ ADJ
⋅ 16.5 pF
128
The adjustment range is approximately -12 ppm to +22 ppm. The precise amount of adjustment will depend on the crystal properties. The adjustment may occur at any time, and the resulting clock frequency
can be measured over a one-second interval.
The second rate adjustment is a digital rate adjust using PREG and QREG, which can be used to adjust
the clock rate up to ± 988 ppm, with a resolution of 3.8 ppm. Updates must occur after a one second in38
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
terrupt, and must finish before the next one second boundary. The rate adjustment will be implemented
starting at the next one-second boundary. Since the LSB results in an adjustment every four seconds,
the frequency should be measured over an interval that is a multiple of four seconds.
To adjust the clock rate using the digital rate adjust, the appropriate values must be written to PREG[16:0]
and QREG[1:0]. The default frequency is 32,768 RTCLK cycles per second. To shift the clock frequency
by ∆ ppm, calculate PREG and QREG using the following equation:

 32768 ⋅ 8
4 ⋅ PREG + QREG = floor
+ 0.5 
−6
1
10

 +∆⋅
For example, for a shift of -988 ppm, 4⋅PREG + QREG = 262403 = 0x40103. PREG = 0x10040, and
QREG = 0x03. The default values of PREG and QREG, corresponding to zero adjustment, are 0x10000
and 0x0, respectively.
Default values for RTCA_ADJ, PREG and QREG should be nominal values, at the center of the adjustment range. Uncalibrated extreme values (zero, for example) can cause incorrect operation.
If the crystal temperature coefficient is known, the MPU can integrate temperature and correct the RTC
time as necessary.
The sub-second register of the RTC, SUBSEC, can be read by the MPU after the one-second interrupt and
before reaching the next one second boundary. SUBSEC contains the count remaining, in 1/256 second
nominal clock periods, until the next one-second boundary. When the RST_SUBSEC bit is written, the
SUBSEC counter is restarted. Reading and resetting the sub-second counter can be used as part of an
algorithm to accurately set the RTC.
When setting the RTC_SEC register, it is important to take into account that the associated write operation
will be performed only in the next second boundary. This means that to set the RTC_SEC register to n,
the value n+1 has to be written. Similarly, increment and decrement operations need to be adjusted, i.e.
to increment the RTC_SEC register that is at count n, the value n+2 has to be written, and to decrement
the RTC_SEC register that is at count n, the value n has to be written.
1.4.4
Temperature Sensor
The device includes an on-chip temperature sensor for determining the temperature of the bandgap reference. If automatic temperature measurement is not performed by selecting CHOP_E = 00, the MPU
may request an alternate multiplexer frame containing the temperature sensor output by asserting
MUX_ALT. The primary use of the temperature data is to determine the magnitude of compensation required to offset the thermal drift in the system (see Section 3.5 Temperature Compensation).
1.4.5
Physical Memory
Flash Memory
The device includes 128 KB (71M6533/H, 71M6534) or 256 KB (71M6534H) of on-chip flash memory.
The flash memory primarily contains MPU and CE program code. It also contains images of the CE
RAM, MPU RAM and I/O RAM. On power-up, before enabling the CE, the MPU copies these images to
their respective locations.
The flash memory is segmented into individually erasable pages that contain 1024 bytes.
Flash space allocated for the CE program is limited to 4096 16-bit words (8 KB). The CE program must
begin on a 1 KB boundary of the flash address space. The CE_LCTN[7:0] word defines which 1 KB
boundary contains the CE code. Thus, the first CE instruction is located at 1024*CE_LCTN[7:0].
Flash Write Procedures
The MPU may write to the flash memory. This is one of the non-volatile storage options available to the
user in addition to external EEPROM.
v1.1
© 2007-2009 TERIDIAN Semiconductor Corporation
39
71M6533/71M6534 Data Sheet
FDS_6533_6534_004
FLSH_PWE (flash program write enable) differentiates 80515 data store instructions (MOVX@DPTR,A)
between Flash and XRAM writes. This bit must be cleared by the MPU after each byte write operation.
Write operations to this bit are inhibited when interrupts are enabled.
The MPU cannot write to flash while the CE is executing its code from flash. Two interrupts warn of collisions between the MPU firmware and the CE timing. If a flash write operation is attempted while the CE
is busy, the flash write will not execute and the FW_COL0 interrupt will be issued. If a flash write is still in
progress when the CE would otherwise begin a code pass, the code pass is skipped, the write operation
is completed, and the FW_COL1 interrupt is issued.
The simplest flash write procedure disables the CE during the write operation and interpolates the metering measurements. However, this results in the loss of at least one second of data, because the CE has
to resynchronize with the mains voltage.
There is a brief guaranteed interval (typically 1/32768 s) between CE executions which occurs 2520 times
per second. The start of the interval can be detected with the CE_BUSY interrupt which occurs on the
falling edge of CE_BUSY (an internal signal measurable from TMUXOUT). However, this guaranteed idle
time (30.5 µs) is too short to write a byte which takes 42 µs or to erase a page of flash memory which
takes at least 20 ms. Some CE code has substantially longer idle times, but in those cases, firmware interrupt latencies can easily consume the available write time. If a flash write fails in this scheme, the failure can be detected with the FWCOL0 or FWCOL1 interrupt and the write can be retried.
It is practical to pre-erase pages, disable interrupts and poll the CE_BUSY interrupt flag, IRCON[2]. This
method avoids problems with interrupt latency, but can still result in a write failure if the CE code takes
too much time. As mentioned above, polling FWCOL0 and FWCOL1 can detect write failures. However,
the speed in a polling write is only 2520 bytes per second and the firmware cannot respond to interrupts.
As an alternative to using flash, a small EEPROM can store data without compromises. EEPROM interfaces are included in the device.
Updating Individual Bytes in Flash Memory
The original state of a flash byte is 0xFF (all ones). Once a value other than 0xFF is written to a flash
memory cell, overwriting with a different value usually requires that the cell be erased first. Since cells
cannot be erased individually, the page has to be copied to RAM, followed by a page erase. After this,
the page can be updated in RAM and then written back to the flash memory.
Flash Erase Procedures
Flash erasure is initiated by writing a specific data pattern to specific SFR registers in the proper sequence.
These special pattern/sequence requirements prevent inadvertent erasure of the flash memory.
The mass erase sequence is:
1. Write 1 to the FLSH_MEEN bit (SFR address 0xB2[1].
2. Write the pattern 0xAA to FLSH_ERASE (SFR address 0x94).
The mass erase cycle can only be initiated when the ICE port is enabled.
The page erase sequence is:
1. Write the page address to FLSH_PGADR (SFR address 0xB7[7:2].
2. Write the pattern 0x55 to FLSH_ERASE (SFR address 0x94).
Bank-Switching
The program memory of the 71M6533/71M6534 consists of a fixed lower bank of 32 KB, addressable at
0x0000 to 0x7FFF plus an upper banked area of 32 KB, addressable at 0x8000 to 0xFFFF. The I/O RAM
register FL_BANKis used to switch one of four (71M6533/H, 71M6534) or eight (71M6534H) memory banks
of 32 KB each into the address range from 0x8000 to 0xFFFF. Note that when FL_BANK = 0, the upper
bank is the same as the lower bank. Table 38 illustrates the bank switching mechanism.
40
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
Table 38: Bank Switching with FL_BANK[2:0]
71M6533/H
71M6534
FL_BANK[1:0]
00
01
10
11
Not applicable
in 71M6533/H
and 71M6534
71M6534H
FL_BANK[2:0]
000
001
010
011
100
101
110
111
Address Range for Lower Bank Address Range for Upper Bank
(0x000-0x7FFF)
(0x8000-0xFFFF)
0x0000-0x7FFF
0x0000-0x7FFF
0x0000-0x7FFF
0x0000-0x7FFF
0x0000-0x7FFF
0x0000-0x7FFF
0x0000-0x7FFF
0x0000-0x7FFF
0x0000-0x7FFF
0x8000-0xFFFF
0x10000-0x17FFF
0x18000-0x1FFFF
0x20000-0x27FFF
0x28000-0x2FFFF
0x30000-0x37FFF
0x38000-0x3FFFF
Program Security
When enabled, the security feature limits the ICE to global flash erase operations only. All other ICE operations are blocked. This guarantees the security of the user’s MPU and CE program code. Security
should be enabled by MPU code that is executed during the pre-boot interval (60 CKMPU cycles before
the primary boot sequence begins). Once security is enabled, the only way to disable it is to perform a
global erase of the flash, followed by a chip reset.
The first 60 cycles of the MPU boot code are called the pre-boot phase because during this phase the
ICE is inhibited. A read-only status bit, PREBOOT, identifies these cycles to the MPU. Upon completion
of pre-boot, the ICE can be enabled and is permitted to take control of the MPU.
The security enable bit, SECURE, is reset whenever the chip is reset. Hardware associated with the bit
permits only ones to be written to it. Thus, pre-boot code may set SECURE to enable the security feature
but may not reset it. Once SECURE is set, the pre-boot code is protected and no external read of program
code is possible
Specifically, when SECURE is set, the following applies:
•
•
•
The ICE is limited to bulk flash erase only.
Page zero of flash memory, the preferred location for the user’s pre-boot code, may not be
page-erased by either MPU or ICE. Page zero may only be erased with global flash erase.
Writes to page zero, whether by MPU or ICE are inhibited.
MPU/CE RAM
The 71M6533 and 71M6534 includes 4K-bytes of static RAM memory on-chip (XRAM) plus 256 bytes of
internal RAM in the MPU core. The 4K-bytes of static RAM are used for data storage for both MPU and
CE operations.
1.4.6
UART and Optical Interface
In addition to the regular UART (UART0) the device includes an interface to implement an IR/optical port.
The pin OPT_TX is designed to directly drive an external LED for transmitting data on an optical link. The
pin OPT_RX has the same threshold as the RX pin, but can also be used to sense the input from an external photo detector used as the receiver for the optical link. OPT_TX and OPT_RX are connected to a
dedicated UART port (UART1).
The OPT_TX and OPT_RX pins can be inverted with configuration bits OPT_TXINV and OPT_RXINV, respectively. Additionally, the OPT_TX output may be modulated at 38 kHz. Modulation is available when
system power is present (i.e. not in BROWNOUT mode). The OPT_TXMOD bit enables modulation. The duty
cycle is controlled by OPT_FDC[1:0], which can select 50%, 25%, 12.5%, and 6.25% duty cycle. A 6.25%
duty cycle means OPT_TX is low for 6.25% of the period. Figure 8 illustrates the OPT_TX generator.
v1.1
© 2007-2009 TERIDIAN Semiconductor Corporation
41
71M6533/71M6534 Data Sheet
FDS_6533_6534_004
When not needed for the optical UART, the OPT_TX pin can alternatively be configured as DIO2,
WPULSE, or VARPULSE. The configuration bits are OPT_TXE[1:0]. Likewise, OPT_RX can alternately
be configured as DIO_1. Its control is OPT_RXDIS.
from
OPT_TX UART
OPT_TXINV
Internal
VARPULSE
3
2
WPULSE
1
DIO2
MOD
A
B
0
EN DUTY
OPT_TXE[1:0]
OPT_TXMOD
OPT_FDC
2
V3P3
OPT_TX
OPT_TXMOD = 1,
OPT_FDC = 2 (25%)
OPT_TXMOD = 0
A
A
B
B
1/38kHz
Figure 8: Optical Interface
In the 71M6534, a multiplexer allows the selection of alternate pins DIO18/MTX and DIO22/RTX for
UART1. This function is controlled with the I/O RAM registers UMUX_E and UMUX_SEL.
1.4.7
Digital I/O
The device includes up to 40 pins (71M6533) or 53 pins (71M6534) of general purpose digital I/O. These
pins are compatible with 5 V inputs (no current limiting resistors are needed). The Digital I/O pins can be
categorized as follows:
•
•
•
Dedicated DIO pins (5 pins): DIO3, DIO56, DIO57, DIO58, PB
DIO/LCD segment pins
o A total of 33 pins for the 71M6533:
DIO4/SEG24 - DIO11/SEG31 (8 pins)
DIO13/SEG33 - DIO21/SEG41 (9 pins)
DIO23/SEG43 – DIO27/SEG47 (5 pins)
DIO29/SEG49 - DIO30/SEG50 (2 pins)
DIO41/SEG61 (1 pin)
DIO43/SEG63 - DIO45/SEG65 (3 pins)
DIO47/SEG67 – DIO51/SEG71 (5 pins)
o A total of 46 pins for the 71M6534:
DIO4/SEG24 – DIO30/SEG50 (27 pins)
DIO36/SEG56 – DIO39/SEG59 (4 pins)
DIO41/SEG61 – DIO55/SEG75 (15 pins)
DIO pins combined with other functions (2 pins): DIO2/OPT_TX, DIO1/OPT_RX
On reset or power-up, all DIO pins are inputs until they are configured for the desired direction under
MPU control. The pin function can be configured by the I/O RAM registers LCD_BITMAPn. Setting
LCD_BITMAPn = 1 configures the pin for LCD, setting LCD_BITMAPn = 0 configures it for DIO.
Once a pin is configured as DIO, it can be configured independently as an input or output with the
DIO_DIR bits or the LCD_SEGn registers. Input and output data are written to or read from the pins using
SFR registers P0, P1, and P2.
Table 39 shows all the DIO pins with their configuration, direction control and data registers. Table entries marked with an asterisk and grayed are applicable to the 71M6534 only.
42
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
Table 39: Data/Direction Registers and Internal Resources for DIO Pin Groups
LCD_SEG57[0]*
LCD_SEG58[0]*
LCD_SEG59[0]*
–
–
–
–
LCD_SEG57[3]*
LCD_SEG58[3]*
LCD_SEG59[3]*
v1.1
LCD_SEG50[3]
LCD_SEG49[3]
LCD_SEG67[0]
LCD_SEG56[0]*
Direction Register
0 = input, 1 = output
–
LCD_SEG67[3]
–
LCD_SEG66[0]*
–
LCD_SEG66[3]*
–
LCD_SEG65[0]
–
44 45 46* 47
64 65 66* 67
31 38 – 22
37 44 5 27
0
1
2*
3
LCD_BITMAP[71:64]
LCD_SEG65[3]
Data Register
LCD_SEG48[3]*
43
63
40
46
7
LCD_SEG64[0]
42*
62*
–
118
6*
LCD_SEG64[3]
36* 37* 38* 39* – 41
56* 57* 58* 59* – 61
–
–
–
–
– 99
87 88 89 90 – 117
0* 1* 2* 3*
–
5
LCD_BITMAP[63:56]
LCD_SEG56[3]*
Configuration (DIO
or LCD segment)
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
LCD_BITMAP[55:48]
LCD_SEG63[0]
DIO
LCD Segment
71M6533 Pin #
71M6534 Pin #
DIO_DIR2 (SFR 0xA1)
LCD_SEG63[3]
Direction Register
0 = input, 1 = output
LCD_SEG47[3]
16 17 18 19 20 21 22* 23 24 25 26 27 28* 29 30 –
36 37 38 39 40 41 42* 43 44 45 46 47 48* 49 50 –
33 12 13 64 65 66 – 54 46 43 42 41 – 32 35 –
39 17 18 74 75 76 115 64 52 49 48 47 81 38 41
2*
3
4
5
6
7
0*
1
2
–
4
5
6
7
0
1
LCD_BITMAP[39:32]
LCD_BITMAP[47:40]
LCD_BITMAP[55:48]
0
1
2
3
4
5
6*
7
0
1
2
3
4*
5
6
–
DIO2 = P2 (SFR 0xA0)
DIO3 = P3 (SFR 0xB0)
0
1
2
3
4
5
6*
7
LCD_SEG46[3]
Data Register
6
7
8
9 10 11 12* 13 14 15
26 27 28 29 30 31 32* 33 34 35
62 63 67 68 69 70 – 44 29 30
72 73 77 78 79 80 120 50 35 36
2
3
4
5
6
7
0* 1
2
3
Always DIO
LCD_BITMAP[31:24]
LCD_BITMAP[39:32]
0
1
2
3
4
5
6
7
0
1
2
3
4*
5
6
7
DIO0 = P0 (SFR 0x80)
DIO1 = P1 (SFR 0x90)
–
1
2
3
4
5
6
7
0
1
2
3
4*
5
6
7
DIO_DIR0 (SFR 0xA2)
DIO_DIR1 (SFR 0x91)
–
–
–
–
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
Y
LCD_SEG62[0]*
Configuration (DIO
or LCD segment)
5
25
61
71
1
LCD_SEG62[3]*
DIO
LCD Segment
71M6533 Pin #
71M6534 Pin #
4
24
60
70
0
LCD_SEG45[3]
Direction Register
0 = input, 1 = output
Internal Resources
Configurable
3
–
17
22
LCD_SEG61[0]
Data Register
2
–
3
3
LCD_SEG61[3]
Configuration (DIO
or LCD segment)
PB 1
–
–
97 91
114 109
LCD_SEG44[3]
DIO
LCD Segment
71M6533 Pin #
71M6534 Pin #
© 2007-2009 TERIDIAN Semiconductor Corporation
43
71M6533/71M6534 Data Sheet
DIO
LCD Segment
71M6533 Pin #
71M6534 Pin #
Data Register
LCD_SEG69[0]
LCD_SEG70[0]
LCD_SEG71[0]
LCD_SEG72[0]*
LCD_SEG73[0]*
LCD_SEG74[0]*
LCD_SEG75[0]*
DIO_56[4]
DIO_57[4]
DIO_58[4]
Direction Register
0 = input, 1 = output
LCD_SEG69[3]
LCD_SEG70[3]
LCD_SEG71[3]
LCD_SEG72[3]*
LCD_SEG73[3]*
LCD_SEG74[3]*
LCD_SEG75[3]*
DIO_DIR56[7]
DIO_DIR57[7]
DIO_DIR58[7]
52* 53* 54* 55* 56 57 58
72* 73* 74* 75* –
–
–
–
–
–
– 14 15 16
57 58 59 60 19 20 21
0* 1* 2* 3*
Always DIO
LCD_BITMAP[80:72]
LCD_SEG68[0]
48 49 50 51
68 69 70 71
23 24 25 50
28 29 30 56
4
5
6
7
LCD_BITMAP[71:64]
LCD_SEG68[3]
Configuration (DIO
or LCD segment)
FDS_6533_6534_004
See the tables in the I/O RAM Description (Section 4.2) for exact bit locations. For example,
DIO43 is controlled by LCD_SEG63[0] which resolves to I/O RAM location 0x2045[4].
DIO24 and higher do not have SFR registers for direction control. DIO36 and higher do not have SFR
registers for data access. The direction control of these pins is achieved with the LCD_SEGn[3] registers
and data access is controlled with the LCD_SEGn[0] registers in I/O RAM. DIO56 through DIO58 are dedicated DIO pins. They are controlled with DIO_DIR56[7] through DIO_DIR58[7] (direction) and with
DIO_56[4] through DIO_58[4] (data) in I/O RAM.
Since the control for DIO_24 through DIO_55 is shared with the control for LCD segments, the firmware
must take care not to disturb the DIO pins when accessing the LCD segments and vice versa. Usually,
this requires reading the I/O RAM register, applying a mask and writing back the modified byte.
The PB pin is a dedicated digital input. In addition, if the optical UART is not used, OPT_TX and OPT_RX can
be configured as dedicated DIO pins, DIO1and DIO2, respectively (see Section 1.4.6 UART and Optical Interface).
DIO4 and DIO5 can be configured to implement the EEPROM Interface.
Additionally, if DIO6 and DIO7 are configured as DIO and defined as outputs, they can be used as dedicated pulse outputs (WPULSE = DIO6, VARPULSE = DIO7) using the DIO_PW and DIO_PV registers. In this
case, DIO6 and DIO7 are under CE control. Similarly, DIO8 and DIO9 can be declared pulse outputs
(XPULSE = DIO8, YPULSE = DIO9).
Tracking DIO pins configured as outputs is useful for pulse counting without external hardware.
Either the interrupts or the counter/timer clocks can be used to count the pulse outputs, or interrupt on the CE’s power failure output.
A 3-bit configuration word, I/O RAM register DIO_Rn (0x2009[2:0] through 0x200E[6:4]) can be used for
certain pins (when configured as DIO) to individually assign an internal resource such as an interrupt or a
timer control (DIO_RRX configures the RX pin). This way, DIO pins can be tracked even if they are configured as outputs. See Table 39 for DIO pins available for this option. Table 40 lists the internal resources which can be assigned using DIO_R0 (also called DIO_RPB) through DIO_R7. If more than one
input is connected to the same resource, the resources are combined using a logical OR.
44
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
Table 40: Selectable Resources using the DIO_Rn Bits
DIO_Rn
0
1
2
3
4
5
6
7
Resource Selected for DIO Pin
None
Reserved
T0 (counter0 clock)
T1 (counter1 clock)
High priority I/O interrupt (INT0 rising)
Low priority I/O interrupt (INT1 rising)
High priority I/O interrupt (INT0 falling)
Low priority I/O interrupt (INT1 falling)
When driving LEDs, relay coils etc., the DIO pins should sink the current into GNDD (as shown
in Figure 9, right), not source it from V3P3D (as shown in Figure 9, left). This is due to the resistance of the internal switch that connects V3P3D to either V3P3SYS or VBAT.
71M6533/71M6534
71M6533
71M6533/71M6534
VBAT
V3P3D
V3P3SYS
VBAT
V3P3D
DIO1
DIO1
V3P3SYS
3.3V
3.3V
LED
R
R
LED
DGND
DGND
Not recommended
Recommended
Figure 9: Connecting an External Load to DIO Pins
1.4.8
LCD Drivers
The device contains a total of 57 (71M6533) or 75 (71M6534) dedicated and multiplexed LCD drivers,
which are grouped as follows:
•
•
•
•
•
15 dedicated LCD segment drivers (SEG0 to SEG2, SEG8, SEG12 to SEG18, SEG20 to SEG23)
4 drivers multiplexed with the SPI port (SEG3 to SEG6)
2 drivers multiplexed with MUX_SYNC and CKTEST (SEG7 and SEG19)
3 or 8 drivers multiplexed with the ICE interface
o 71M6533 – 3 drivers (SEG9 to SEG11)
o 71M6534 – 8 drivers (SEG9 to SEG11 and SEG51 to SEG55)
33 or 46 multi-use LCD/DIO pins described in Section 1.4.7 Digital I/O
o 71M6533 – 33 pins
o 71M6534 – 46 pins
With a minimum of 15 driver pins always available and a total of 57 (71M6533) or 75 (71M6534) driver
pins in the maximum configuration, the device is capable of driving between 60 to 228 pixels (71M6533)
or 60 to 300 pixels (71M6534) of an LCD display with 25% duty cycle. At eight pixels per digit, this corresponds to 7.5 to 28 digits for the 71M6533 or 7.5 to 37 digits for the 71M6534.
v1.1
© 2007-2009 TERIDIAN Semiconductor Corporation
45
71M6533/71M6534 Data Sheet
FDS_6533_6534_004
For each multi-use pin, the corresponding LCD_BITMAP[] register (as described in Section 1.4.7 Digital I/O)
is used to select the pin for DIO or LCD operation. The mapping of the LCD_BITMAP[] registers is specified in Section 4.1 I/O RAM Map –Functional Order.
LCD segment data is written to the LCD_SEGn[3:0] I/O RAM registers as described in section 4.2 I/O RAM
Description – Alphabetical Order. Note that even though the register names call out bit numbers 3 to 0
some registers use physical bits 4 to 7.
The LCD drivers are grouped into four commons (COM0 – COM3) and up to 56 (71M6533) or 74
(71M6534) segment drivers. The LCD interface is flexible and can drive 7-segment digits, 14- segments
digits or enunciator symbols.
The segment driver SEG18 can be configured to blink at either 0.5 Hz or 1 Hz. The blink rate is controlled by LCD_Y. There can be up to four pixels/segments connected to this driver pin. The I/O RAM
register LCD_BLKMAP18[3:0] identifies which pixels, if any, are to blink.
The LCD bias may be compensated for temperature using the LCD_DAC bits in I/O RAM. The bias may
be adjusted from 1.4 V below the 3.3 V supply (V3P3SYS in mission mode and brownout modes, VBAT
in LCD mode). When the LCD_DAC bits are set to 000, the DAC is bypassed and powered down. This
can be used to reduce current in LCD mode.
1.4.9
Battery Monitor
The battery voltage is measured by the ADC during alternative MUX frames if the BME (Battery Measure
Enable) bit is set. While BME is set, an on-chip 45 kΩ load resistor is applied to the battery and a scaled
fraction of the battery voltage is applied to the ADC input. After each alternative MUX frame, the result of
the ADC conversion is available at XRAM address 0x07. BME is ignored and assumed zero when system
power is not available.
If VBAT is connected to a drained battery or disconnected, a battery test that sets BME may drain
VBAT’s supply and cause the oscillator to stop. A stopped oscillator may force the device to reset.
Therefore, an unexpected reset during a battery test should be interpreted as a battery failure.
Battery measurement is not very linear but is very reproducible. The best way to perform the calibration
is to set the battery input to the desired failure voltage and then have the MPU firmware record that measurement. After this, the MPU firmware’s battery measurement logic may use the recorded value as the
battery failure limit. The same value can also be a calibration offset for any battery voltage display.
See Section 5.4.5 Battery Monitor for details regarding the ADC LSB size and the conversion accuracy.
1.4.10 EEPROM Interface
The 71M6533 and 71M6534 provides hardware support for either a two-pin or a three-wire (µ-wire) type
of EEPROM interface. The interfaces use the EECTRL and EEDATA registers for communication.
Two-pin EEPROM Interface
The dedicated 2-pin serial interface communicates with external EEPROM devices. The interface is multiplexed onto the DIO4 (SCK) and DIO5 (SDA) pins and is selected by setting DIO_EEX = 1. The MPU
communicates with the interface through the SFR registers EEDATA and EECTRL. If the MPU wishes to
write a byte of data to the EEPROM, it places the data in EEDATA and then writes the Transmit code to
EECTRL. This initiates the transmit operation which is finished when the BUSY bit falls. INT5 is also asserted when BUSY falls. The MPU can then check the RX_ACK bit to see if the EEPROM acknowledged
the transmission.
A byte is read by writing the Receive command to EECTRL and waiting for the BUSY bit to fall. Upon
completion, the received data is in EEDATA. The serial transmit and receive clock is 78 kHz during each
transmission, and then holds in a high state until the next transmission. The EECTRL bits when the twopin interface is selected are shown in Table 41.
46
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
Table 41: EECTRL Bits for 2-pin Interface
Status
Bit
7
6
5
4
3:0
Reset
State
0
0
1
1
Polarity
Description
ERROR
BUSY
RX_ACK
TX_ACK
Read/
Write
R
R
R
R
Positive
Positive
Negative
Negative
1 when an illegal command is received.
1 when serial data bus is busy.
0 indicates that the EEPROM sent an ACK bit.
0 indicates when an ACK bit has been sent to the
EEPROM.
CMD[3:0]
W
0000
Positive
Name
CMD[3:0]
0000
0010
0011
0101
0110
1001
Others
Operation
No-op command. Stops the I2C clock
(SCK, DIO4). If not issued, SCK
keeps toggling.
Receive a byte from the EEPROM
and send ACK.
Transmit a byte to the EEPROM.
Issue a STOP sequence.
Receive the last byte from the
EEPROM and do not send ACK.
Issue a START sequence.
No operation, set the ERROR bit.
The EEPROM interface can also be operated by controlling the DIO4 and DIO5 pins directly. In
this case, a resistor has to be used in series with SDA to avoid data collisions due to limits in the
speed at which the SDA pin can be switched from output to input. However, controlling DIO4 and
DIO5 directly is discouraged, because it may tie up the MPU to the point where it may become too
busy to process interrupts.
Three-wire (µ-Wire) EEPROM Interface
A 500 kHz three-wire interface, using SDATA, SCK, and a DIO pin for CS is available. The interface is
selected by setting DIO_EEX = 3. The EECTRL bits when the three-wire interface is selected are shown in
Table 42. When EECTRL is written, up to 8 bits from EEDATA are either written to the EEPROM or read
from the EEPROM, depending on the values of the EECTRL bits.
The µ-Wire EEPROM interface is only functional when MPU_DIV[2:0] = 000.
Table 42: EECTRL Bits for the 3-wire Interface
Control
Bit
7
v1.1
WFR
Read/
Write
W
6
BUSY
R
5
HiZ
W
4
RD
W
Name
Description
Wait for Ready. If this bit is set, the trailing edge of BUSY will be delayed
until a rising edge is seen on the data line. This bit can be used during
the last byte of a Write command to cause the INT5 interrupt to occur
when the EEPROM has finished its internal write sequence. This bit is
ignored if HiZ=0.
Asserted while the serial data bus is busy. When the BUSY bit falls, an
INT5 interrupt occurs.
Indicates that the SD signal is to be floated to high impedance immediately after the last SCK rising edge.
Indicates that EEDATA is to be filled with data from EEPROM.
© 2007-2009 TERIDIAN Semiconductor Corporation
47
71M6533/71M6534 Data Sheet
3:0
CNT[3:0]
W
FDS_6533_6534_004
Specifies the number of clocks to be issued. Allowed values are 0
through 8. If RD=1, CNT bits of data will be read MSB first, and right
justified into the low order bits of EEDATA. If RD=0, CNT bits will be
sent MSB first to the EEPROM, shifted out of the MSB of EEDATA. If
CNT[3:0] is zero, SDATA will simply obey the HiZ bit.
The timing diagrams in Figure 10 through Figure 14 describe the 3-wire EEPROM interface behavior. All
commands begin when the EECTRL register is written. Transactions start by first raising the DIO pin that
is connected to CS. Multiple 8-bit or less commands such as those shown in Figure 10 through Figure 14
are then sent via EECTRL and EEDATA.
When the transaction is finished, CS must be lowered. At the end of a Read transaction, the EEPROM
will be driving SDATA, but will transition to HiZ (high impedance) when CS falls. The firmware should
then immediately issue a write command with CNT=0 and HiZ=0 to take control of SDATA and force it to
a low-Z state.
EECTRL Byte Written
INT5
CNT Cycles (6 shown)
Write -- No HiZ
SCLK (output)
SDATA (output)
D7
D6
D5
SDATA output Z
D4
D3
D2
(LoZ)
BUSY (bit)
Figure 10: 3-wire Interface. Write Command, HiZ=0.
EECTRL Byte Written
INT5
CNT Cycles (6 shown)
Write -- With HiZ
SCLK (output)
SDATA (output)
D7
D6
D5
SDATA output Z
D4
D3
D2
(LoZ)
(HiZ)
BUSY (bit)
Figure 11: 3-wire Interface. Write Command, HiZ=1
EECTRL Byte Written
INT5
CNT Cycles (8 shown)
READ
SCLK (output)
SDATA (input)
SDATA output Z
D7
D6
D5
D4
D3
D2
D1
D0
(HiZ)
BUSY (bit)
Figure 12: 3-wire Interface. Read Command.
48
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
EECTRL Byte Written
INT5 not issued
CNT Cycles (0 shown)
Write -- No HiZ
EECTRL Byte Written
Write -- HiZ
INT5 not issued
CNT Cycles (0 shown)
SCLK (output)
SCLK (output)
SDATA (output)
SDATA (output)
D7
SDATA output Z
SDATA output Z
(LoZ)
(HiZ)
BUSY (bit)
BUSY (bit)
Figure 13: 3-Wire Interface. Write Command when CNT=0
EECTRL Byte Written
INT5
CNT Cycles (6 shown)
Write -- With HiZ and WFR
SCLK (output)
SDATA (out/in)
D7
D6
D5
D4
D3
D2
(From 653X
6520)
From
SDATA output Z
(LoZ)
BUSY
READY
(From EEPROM)
(HiZ)
BUSY (bit)
Figure 14: 3-wire Interface. Write Command when HiZ=1 and WFR=1.
1.4.11 SPI Slave Port
The slave SPI port communicates directly with the MPU data bus and is able to read and write Data RAM
locations. It is also able to send commands to the MPU. The interface to the slave port consists of the
PCSZ, PCLK, PSDI and PSDO pins. These pins are multiplexed with the LCD segment driver pins SEG3
to SEG6. The port pins default to LCD driver pins. The port is enabled by setting the SPE bit in I/O RAM.
Access to I/O RAM (Configuration RAM) should not be attempted via the SPI Port.
A typical SPI transaction is as follows: While PCSZ is high, the port is held in an initialized/reset state.
During this state, PSDO is held in HiZ state and all transitions on PCLK and PSDI are ignored. When
PCSZ falls, the port will begin the transaction on the first rising edge of PCLK. A transaction consists of
an 8-bit command, a 16-bit address, and then one or more bytes of data. The transaction ends when
PCSZ is raised. Some transactions may consist of a command only.
The last issued SPI command and address (if part of the command) are available to the MPU in registers
SP_CMD and SP_ADDR.
The SPI port supports data transfers at 1 Mb/s in mission mode, and 16 kb/s in brownout mode. Figure
15 illustrates the read and write timing of the SPI Interface. The SPI commands are described in Table
43.
v1.1
© 2007-2009 TERIDIAN Semiconductor Corporation
49
71M6533/71M6534 Data Sheet
SERIAL READ
FDS_6533_6534_004
8 bit CMD
DATA[ADDR]
16 bit Address
DATA[ADDR+1]
PCSZ
Extended Read . . .
0
7
8
C0
A15
23
24
A0
x
31
32
D0
D7
39
PSCK
(From Host) PSDI
x
C7
C6
C5
A14
A1
HI Z
(From 653X) PSDO
SERIAL WRITE
D7
8 bit CMD
D6
D1
DATA[ADDR]
16 bit Address
D6
D1
D0
DATA[ADDR+1]
PCSZ
Extended Write . . .
0
7
8
C0
A15
23
24
A0
D7
31
32
D0
D7
39
PSCK
(From Host) PSDI
x
C7
C6
C5
A14
A1
D6
D1
D6
D1
D0
x
HI Z
(From 653X) PSDO
Figure 15: SPI Slave Port: Typical Read and Write operations
Table 43: SPI Command Description
Command
11xx xxxx ADDR Byte0 ... ByteN
10xx xxxx ADDR Byte0 ... ByteN
Description
Read data starting at ADDR. The ADDR will auto-increment until PCSZ
is raised. Upon completion:
SP__CMD=11xx xxxx, SP_ADDR=ADDR+N+1.
No MPU interrupt is generated if the command is 1100 0000. Otherwise, an SPI interrupt is generated.
Write data starting at ADDR. The ADDR will auto-increment until PCSZ
is raised. Upon completion:
SP_CMD=10xx xxxx, SP_ADDR=ADDR+N+1.
No MPU interrupt is generated if the command is 1000 0000. Otherwise, an SPI interrupt is generated.
Possible applications for the SPI interface are:
1) An external host reads data from CE locations to obtain metering information. This can be used
in applications where the 71M6533 or 71M6534 function as a smart front-end with preprocessing
capability. Since the addresses are in 16-bit format, any type of XRAM data can be accessed:
CE, MPU, I/O RAM, but not SFRs or the 80515-internal register bank.
2) A communication link can be established via the SPI interface: By writing into MPU memory locations, the external host can initiate and control processes in the 71M6533/71M6534 MPU. Writing to a CE or MPU location normally generates an interrupt, a function that can be used to signal
to the MPU that the byte that had just been written by the external host must be read and
processed. Data can also be inserted by the external host without generating an interrupt.
3) An external DSP can access front-end data generated by the ADC. This mode of operation uses
the 71M6533 or 71M6534 as an analog front-end (AFE).
50
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
1.4.12 Hardware Watchdog Timer
An independent, robust, fixed-duration, watchdog timer (WDT) is included in the 71M6533/71M6534. It
uses the RTC crystal oscillator as its time base and must be refreshed by the MPU firmware at least
every 1.5 seconds. When not refreshed on time, the WDT overflows and the part is reset as if the RESET
pin were pulled high, except that the I/O RAM bits will be in the same
V1
state as after a wake-up from SLEEP or LCD modes (see the I/O RAM
description in Section 4.2 for a list of I/O RAM bit states after RESET and
V3P3
WDT diswake-up). 4100 oscillator cycles (or 125 ms) after the WDT overflow, the
V3P3 - 10mV
abled
MPU will be launched from program address 0x0000.
V3P3 400mV
Normal
operation,
WDT
enabled
VBIAS
Battery
modes
0V
A status bit, WD_OVF, is set when the WDT overflow occurs. This bit is
powered by the nonvolatile supply and can be read by the MPU when
WAKE rises to determine if the part is initializing after a WDT overflow
event or after a power-up. After it is read, the MPU firmware must clear
WD_OVF. The WD_OVF bit is also cleared by the RESET pin.
There is no internal digital state that deactivates the WDT. The WDT can
be disabled by tying the V1 pin to V3P3 (see Figure 16). Of course, this
also deactivates V1 power fault detection. Since there is no method in
firmware to disable the crystal oscillator or the WDT, it is guaranteed that
whatever state the part might find itself in, upon watchdog overflow, the
part will be reset to a known state.
Asserting ICE_E will also deactivate the WDT. This is the only method
that will work in BROWNOUT mode. In normal operation, the WDT is reset by periodically writing a one to the WDT_RST bit.
Figure 16: Functions defined by V1
The watchdog timer is also reset when the internal signal WAKE=0 (see Section 2.5 Wake Up Behavior).
If enabled with the IEN_WD_NROVF register in I/O RAM, an interrupt occurs roughly 1 ms before the WDT
resets the chip. This can be used to determine the cause of a WDT reset since it allows the code to log
its state (e.g. the current PC value, loop counters, flags, etc.) before a WDT reset occurs.
1.4.13 Test Ports (TMUXOUT Pin)
One of the digital or analog signals listed in Table 44 can be selected to be output on the TMUXOUT pin.
The function of the multiplexer is controlled with the I/O RAM register TMUX (0x20AA[4:0]), as shown in
Table 44.
The TMUXOUT pin may be used for diagnosis purposes or in production test. The RTC 1-second output
may be used to calibrate the crystal oscillator. The RTC 4-second output provides even higher precision.
v1.1
© 2007-2009 TERIDIAN Semiconductor Corporation
51
71M6533/71M6534 Data Sheet
FDS_6533_6534_004
Table 44: TMUX[4:0] Selections
TMUX[4:0]
0
1
2
3
4
5
6
7
8 - 0x0F
0x10
0x11
0x12
0x13
0x14
0x15
0x16
0x17
0x18
0x19
0x1A
0x1B
0x1C
0X1D
0X1E
0X1F
Mode
Analog
Analog
Analog
Analog
Analog
Analog
Analog
Analog
–
Digital
Digital
–
Digital
Digital
Digital
Digital
Digital
Digital
Digital
–
Digital
Digital
Digital
Digital
Digital
Function
DGND
Reserved
DGND
Reserved
PLL_2P5
Output of the 2.5 V low-power regulator
Internal VBIAS voltage (nominally 1.6V)
Not used
Reserved
RTC 1-second output
RTC 4-second output
Not used
V1 comparator output, synchronized to RTCLK
Real-time output from the CE
WDTR_EN (comparator 1 output AND V1LT3)
V2 comparator output (71M6534 only)
V1 comparator output, unsynchronized
RXD (from Optical interface, w/ optional inversion)
MUX_SYNC
Not used
CKMPU (MPU clock)
Pulse output
RTCLK (output of the oscillator circuit, nominally 32,786Hz)
CE_BUSY (busy interrupt generated by CE, 396µs)
XFER_BUSY (transfer busy interrupt generated by the CE,
nominally every 999.7ms)
1.4.14 V2 Comparator (71M6534/6534H only)
The 71M6534/6534H offers a pin that is connected to an internal comparator. The voltage applied to this
pin is compared to the internal reference voltage (VBIAS). If the voltage at the V2 pin is above VBIAS,
the comparator output will be high (1). The comparator output is reflected at the TMUXOUT pin, when
0x16 is selected for TMUX[4:0].
52
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
2 Functional Description
2.1
Theory of Operation
The energy delivered by a power source into a load can be expressed as:
t
E = ∫ V (t ) I (t )dt
0
Assuming phase angles are constant, the following formulae apply:


P = Real Energy [Wh] = V * A * cos φ* t

S = Apparent Energy [VAh] =
Q = Reactive Energy [VARh] = V * A * sin φ * t
P2 + Q2
For a practical meter, not only voltage and current amplitudes, but also phase angles and harmonic content may change constantly. Thus, simple RMS measurements are inherently inaccurate. A modern solid-state electricity meter IC such as the Teridian 71M6533 and 71M6534 functions by emulating the
integral operation above, i.e. it processes current and voltage samples through an ADC at a constant frequency. As long as the ADC resolution is high enough and the sample frequency is beyond the harmonic
range of interest, the current and voltage samples, multiplied with the time period of sampling will yield an
accurate quantity for the momentary energy. Summing up the momentary energy quantities over time will
result in accumulated energy.
500
400
300
200
100
0
0
5
10
15
20
-100
-200
Current [A]
-300
Voltage [V]
Energy per Interval [Ws]
-400
Accumulated Energy [Ws]
-500
Figure 17: Voltage, Current, Momentary and Accumulated Energy
Figure 17 shows the shapes of V(t), I(t), the momentary power and the accumulated power, resulting from
50 samples of the voltage and current signals over a period of 20 ms. The application of 240 VAC and
100 A results in an accumulation of 480 Ws (= 0.133 Wh) over the 20 ms period, as indicated by the accumulated power curve. The described sampling method works reliably, even in the presence of dynamic
phase shift and harmonic distortion.
v1.1
© 2007-2009 TERIDIAN Semiconductor Corporation
53
71M6533/71M6534 Data Sheet
2.2
FDS_6533_6534_004
System Timing Summary
Figure 18 summarizes the timing relationships between the input MUX states, the CE_BUSY signal and
the two serial output streams. In this example, MUX_DIV=6 and FIR_LEN=2 (384). The duration of each
MUX frame is (M40MHZ/M26MHZ = 00, 10, or 11 assumed):
•
•
•
1 + MUX_DIV * 1, if FIR_LEN = 0 (138 CE cycles), complete MUX frame = 7 CK32 cycles
1 + MUX_DIV * 2, if FIR_LEN = 1 (288 CE cycles) , complete MUX frame = 13 CK32 cycles
1 + MUX_DIV * 3, if FIR_LEN = 2 (384 CE cycles) , complete MUX frame = 19 CK32 cycles
An ADC conversion will always consume an integer number of CK32 clocks. Following this is a single
CK32 cycle where the bandgap voltage is allowed to recover from the change in CROSS. Figure 18
shows a typical MUX frame with if FIR_LEN = 1and MUX_DIV = 6.
ADC MUX Frame
ADC TIMING
Settle
MUX_DIV Conversions (MUX_DIV=6 is shown)
CK32
150
MUX_SYNC
ADC EXECUTION
ADC0
CE TIMING
0
ADC1
300
ADC2
600
ADC3
900
ADC4
1200
ADC5
1500
1800
CE_EXECUTION
MAX CK COUNT
CK COUNT = CE_CYCLES + floor((CE_CYCLES + 2) / 4)
CE_BUSY
XFER_BUSY
INITIATED BY A CE OPCODE AT END OF SUM INTERVAL
RTM TIMING
140
RTM
NOTES:
1. ALL DIMENSIONS ARE 4.9152 MHz CK COUNTS.
2. XFER_BUSY OCCURS ONCE EVERY (PRESAMPS * SUM_CYCLES) CODE PASSES.
Figure 18: Timing Relationship between ADC MUX and Compute Engine
Each CE program pass begins when the ADC0 conversion (slot 0, as defined by SLOT0_SEL) begins.
Depending on the length of the CE program, it may continue running until the end of the last conversion.
CE opcodes are constructed to ensure that all CE code passes consume exactly the same number of
cycles. The result of each ADC conversion is inserted into the XRAM when the conversion is complete.
The CE code is written to tolerate sudden changes in ADC data. The exact CK count when each ADC
value is loaded into RAM is shown in Figure 18.
Figure 19 shows that the serial data stream, RTM, begins transmitting at the beginning of state S. RTM,
consisting of 140 CK cycles, will always finish before the next code pass starts.
CK32
MUX_SYNC
CKTEST
30
0
31
1
30
0
31
1
30
31
FLAG
SIGN
FLAG
SIGN
1
FLAG
LSB
0
31
LSB
30
SIGN
1
LSB
RTM DATA 0 (32 bits)
RTM DATA 1 (32 bits)
RTM DATA 2 (32 bits)
RTM DATA 3 (32 bits)
LSB
FLAG
SIGN
0
TMUXOUT/RTM
Figure 19: RTM Output Format
54
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
2.3
71M6533/71M6534 Data Sheet
Battery Modes
Shortly after system power (V3P3SYS) is applied, the part will be in MISSION mode. MISSION mode
means that the part is operating with system power and that the internal PLL is stable. This mode is the
normal operation mode where the part is capable of measuring energy.
When system power is not available (i.e. when V1<VBIAS), the 71M6533 and 71M6534 will be in one of
three battery modes: BROWNOUT, LCD, or SLEEP mode. Figure 20 shows a state diagram of the various operation modes, with the possible transitions between modes. For information on the timing of
mode transitions refer to Figure 24 through Figure 26.
When V1 falls below VBIAS or the part wakes up under battery power, the part will automatically enter
BROWNOUT mode (see Section 2.5 Wake Up Behavior). From BROWNOUT mode, the part may enter
either LCD mode or SLEEP mode, as controlled by the MPU via the I/O RAM bits LCD_ONLY and SLEEP.
RESET
MISSION
V3P3SYS
falls
IE_PLLRISE
V3P3SYS
rises
V1 > VBIAS
V1 <= VBIAS
IE_PLLFALL
V3P3SYS
rises
LCD_ONLY
BROWNOUT
V3P3SYS
rises
RESET &
VBAT_OK
IE_PB
IE_WAKE
PB
SLEEP or
VBAT_OK
timer
LCD
timer
PB
VBAT_OK
VBAT_OK
RESET &
VBAT_OK
SLEEP
Figure 20: Operation Modes State Diagram
The transition from MISSION mode to BROWNOUT mode is signaled by the IE_PLLFALL interrupt flag
(SFR 0xE8[7]). The transition in the other direction is signaled by the IE_PLLRISE interrupt flag (SFR
0xE8[6]), when the PLL becomes stable.
Transitions from both LCD and SLEEP mode are initiated by wake-up timer timeout conditions or pushbutton events. When the PB pin is pulled high (pushbutton is pressed), the IE_PB interrupt flag (SFR
0xE8[4]) is set, and when the wake-up timer times out, the IE_WAKE interrupt flag (SFR 0xE8[5]) is set.
In the absence of system power, if the voltage margin for the LDO regulator providing 2.5 V to the internal
circuitry becomes too low to be safe, the part automatically enters sleep mode (BAT_OK false). The battery
voltage must stay above 3 V to ensure that BAT_OK remains true. Under this condition, the 71M6533 and
71M6534 stays in SLEEP mode, even if the voltage margin for the LDO improves (BAT_OK true).
Table 45 shows the circuit functions available in each operating mode.
v1.1
© 2007-2009 TERIDIAN Semiconductor Corporation
55
71M6533/71M6534 Data Sheet
2.3.1
FDS_6533_6534_004
BROWNOUT Mode
In BROWNOUT mode, most non-metering digital functions are active (as shown in Table 45) including
ICE, UART, EEPROM, LCD and RTC. In BROWNOUT mode, a low-bias current regulator will provide
2.5 Volts to V2P5 and V2P5NV. The regulator has an output called BAT_OK to indicate that it has sufficient overhead. When BAT_OK = 0, the part will enter SLEEP mode. From BROWNOUT mode, the processor can voluntarily enter LCD or SLEEP modes. When system power is restored, the part will automatically transition from any of the battery modes to MISSION mode, once the PLL has settled.
Table 45: Available Circuit Functions
Circuit Function
CE
CE/MPU Data RAM
FIR
Analog circuits:
MPU clock rate
MPU_DIV
ICE
DIO Pins
Watchdog Timer
LCD
EEPROM Interface (2-wire)
EEPROM Interface (3-wire)
UART
Optical TX modulation
Flash Read
Flash Page Erase
Flash Write
XRAM Read and Write
Wakeup Timer
Oscillator and RTC
XRAM data preservation
V3P3D voltage output pin
GPO – GP7 registers
– indicates not active
System Power
MISSION
Yes
Yes
Yes
Yes
From PLL, as defined by MPU_DIV
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Battery Power (Nonvolatile Supply)
BROWNOUT
LCD
SLEEP
–
–
–
–
–
Yes
–
–
–
–
–
–
–
–
28.672 kHz
(7/8 of 32768 Hz)
–
–
–
–
–
Yes
–
–
Yes
–
–
Yes
–
Yes
Yes
–
–
Yes (8 kb/s)
–
–
Yes (16 kb/s)
–
–
300 bd
–
–
–
–
–
Yes
–
–
Yes
–
–
–
–
–
Yes
Yes
Yes
Yes
Yes
Yes
Yes
–
–
Yes
–
–
Yes
Yes
Yes
Yes
The MPU will run at 7/8 of the crystal clock rate in BROWNOUT mode. This permits the UARTs to be
operated at 300 bd. In this mode, the MPU clock has substantial short-term jitter.
The value of MPU_DIV will be remembered (not changed) as the part enters and exits BROWNOUT.
MPU_DIV will be ignored during BROWNOUT.
While PLL_OK = 0, the I/O RAM bits ADC_E and CE_E are held in the zero state disabling both the ADC
and the CE. When PLL_OK falls, the CE program counter is cleared immediately and all FIR processing
halts.
Figure 21 shows the functional blocks active in BROWNOUT mode.
56
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
2.3.2
71M6533/71M6534 Data Sheet
LCD Mode
In LCD mode, the data contained in the LCD_SEG registers is displayed. Up to four LCD segments connected to the pin SEG18 can be made to blink without the involvement of the MPU, which is disabled in
LCD mode. To minimize power, only segments that might be used should be enabled.
LCD mode can be exited only by system power up, a timeout of the wake-up timer, or a push button.
When the IC exits LCD mode, the MPU can discover the event that caused the exit by reading the interrupt flags and interpret them as follows:
•
•
•
•
IE_WAKE = 1 indicates that the wake timer has expired.
IE_PB =1 indicates that the pushbutton input (PB) was activated.
COMPSTAT = 0 indicates that a reset occurred but that main power is not yet available.
If none of the above conditions applies, system power (V3P3SYS) must have been restored
After the transition from LCD mode to MISSION or BROWNOUT mode, the PC will be at 0x0000, the
XRAM is in an undefined state, and the I/O RAM is only partially preserved (see the description of I/O
RAM states in 4.2). GP0[7:0] through GP7[7:0] are preserved unless a hardware reset occurs (RESET
pin is pulled high or power to the part is cycled without a battery being present). Figure 22 shows the
functional blocks active in LCD mode.
2.3.3
SLEEP Mode
In SLEEP mode, the battery current is minimized and only the Oscillator and RTC functions are active.
This mode can be exited only by system power-up, a timeout of the wake-up timer, or a push button
event.
When the IC exits SLEEP mode, the MPU can discover the event that caused the exit by reading the interrupt flags and interpret them as follows:
•
•
•
•
IE_WAKE = 1 indicates that the wake timer has expired.
IE_PB =1 indicates that the pushbutton input (PB) was activated.
COMPSTAT = 0 indicates that a reset occurred but that main power is not yet available.
If none of the above conditions applies, system power (V3P3SYS) must have been restored
After the transition from SLEEP mode to MISSION or BROWNOUT mode the PC will be at 0x0000, the
XRAM is in an undefined state, and the I/O RAM is only partially preserved (see the description of I/O
RAM states in 4.2). GP0[7:0] through GP7[7:0] are preserved unless the a hardware reset occurs
(RESET pin is pulled high or power to the part is cycled without a battery being present). Figure 23
shows the functional blocks active in SLEEP mode.
v1.1
© 2007-2009 TERIDIAN Semiconductor Corporation
57
71M6533/71M6534 Data Sheet
FDS_6533_6534_004
GNDA GNDD
VREF
IAP
IAN
VA
IBP
IBN
VB
ICP
ICN
VC
IDP
IDN
V3P3SYS
V3P3A
∆Σ ADC
CONVERTER
VBIAS
FIR
FIR_LEN 22
VB_REF
ADC_E
VDDREFZ
VREF
VADC
VREF
VREF_CAL
VREF_DIS
EQU
MUX_AL
MUX_DIV
VBAT
CE_PROG
16
TEMP
2.5V_NV
RTCLK (32KHz)
OSC
(32KHz)
XIN
XOUT
MCK
PLL
MPU_DIV
CKOUT_E
V3P3D
CE
PLS_INV
PLS_INTERVAL
PLS_MAXWIDTH
CE_LCTN
EQU
PRE_SAMPS
SUM_CYCLES
RTM_0...3
RTM_E
CE_E
FLASH
128KB
RTM
VBAT
to TMUX
VOLT
REG
RPULSE
WPULSE
LCD_ONLY
SLEEP
XPULSE
YPULSE
YPULSE
XPULSE
WPULSE
RPULSE
VBIAS
MUXP
CE_DATA
32
V2P5
2.5V to logic
2.5V_NV
XRAM
4kB
DIO_PV
DIO_PW
DIO_PX
DIO_PY
CK_CE
CK_MPU
RTCA_ADJ
CKTEST
RTC
2.5V_NV
MULTIPURPOSE
I/O
RST_SUBSEC
QREG,PREG
RTC_DAY
RTC_DATE
RTC_HR
RTC_MIN RTC_MO
RTC_SEC RTC_YR
TEST
LCD_DAC
LCD_MODE
LCD_CLK
LCD_E
LCD_BLKMAP
LCD_SEG
LCD_Y
8
DIGITAL I/O
RX
DIO_DIR
DIO_R
DIO
UART1
TX
XRAM BUS
PB
COM0..3
PCMD
EEPROM I/F
EEDATA
EECTRL
4
4
4
2
Segments
5
9
DIO_1..24
24
PCSZ
PCLK
PSI
PSO
SPI SLAVE
8
PB
4
5
3
LCD DISPLAY
DRIVER
TEST
MODE
MPU
3
2
DIO_EEX
UART2/OPTICAL
OPT_RXDIS
OPT_RXINV
OPT_TXE
OPT_TXINV
OPT_TXMOD
OPT_FDC
VBIAS
NV RAM
V2*
+
-
IRAM BUS
8
IRAM
256B
EMULATOR
OPT_TXE
4
7
2.5V_NV
E_RXTX
E_TCLK
E_RSTZ
ICE_E
V1
POWER FAULT
ICE_E
FAULTZ
COM3..0
DIO41/SEG61
DIO36/SEG56*...DIO39/SEG59*
DIO29/SEG49...DIO30/SEG50
DIO28/SEG48*
DIO23/SEG43...DIO27/SEG47
DIO22/SEG42*
DIO13/SEG33...DIO21/SEG41
DIO12/SEG32*
DIO10/SEG30...DIO11/SEG31
OPT_TX
OPT_RX
GP0-GP7
V2_OK*
DIO52/SEG72*...DIO55/SEG75*
DIO47/SEG67...DIO51/SEG71
DIO46/SEG66*
DIO43/SEG63...DIO45/SEG65
DIO42/SEG62*
DIO9/SEG29/YPULSE
DIO8/SEG28/XPULSE
DIO7/SEG27/RPULSE
DIO6/SEG26/WPULSE
DIO5/SEG25/SDATA
DIO4/SEG24/SDCK
DIO3
DIO2/OPT_TX
DIO1/OPT_RX
SPE
SDATA
SCLK
DIO56...DIO58
CKOUT_E
3
TEST
MUX
SEG20...SEG23
SEG12 ...SEG18
SEG11/E_RST
SEG10/E_TCLK
SEG9/E_RXTX
SEG8
SEG7/MUX_SYNC
SEG6/PSDI
SEG5/PCSZ
SEG4/PSDO
SEG3/PCLK
SEG0...SEG2
TMUXOUT
TMUX[4:0]
* 71M6534/6534H only
RESET
ICE_E
3/10/2009
Figure 21: Functional Blocks in BROWNOUT Mode
(Inactive blocks in the figure are grayed out.)
58
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
GNDA GNDD
VREF
IAP
IAN
VA
IBP
IBN
VB
ICP
ICN
VC
IDP
IDN
V3P3SYS
V3P3A
∆Σ ADC
CONVERTER
VBIAS
FIR
FIR_LEN 22
VB_REF
ADC_E
VDDREFZ
VREF
VADC
VREF
VREF_CAL
VREF_DIS
EQU
MUX_AL
MUX_DIV
VBAT
CE_PROG
16
TEMP
2.5V_NV
RTCLK (32KHz)
OSC
(32KHz)
XIN
XOUT
MCK
PLL
MPU_DIV
CKOUT_E
V3P3D
CE
PLS_INV
PLS_INTERVAL
PLS_MAXWIDTH
CE_LCTN
EQU
PRE_SAMPS
SUM_CYCLES
RTM_0...3
RTM_E
CE_E
FLASH
128KB
RTM
VBAT
to TMUX
VOLT
REG
RPULSE
WPULSE
LCD_ONLY
SLEEP
XPULSE
YPULSE
YPULSE
XPULSE
WPULSE
RPULSE
VBIAS
MUXP
CE_DATA
32
V2P5
2.5V to logic
2.5V_NV
XRAM
4kB
CK_CE
DIO_PV
DIO_PW
DIO_PX
DIO_PY
CK_MPU
RTCA_ADJ
CKTEST
RTC
2.5V_NV
MULTIPURPOSE
I/O
RST_SUBSEC
QREG,PREG
RTC_DAY
RTC_DATE
RTC_HR
RTC_MIN RTC_MO
RTC_SEC RTC_YR
TEST
LCD_DAC
LCD_MODE
LCD_CLK
LCD_E
LCD_BLKMAP
LCD_SEG
LCD_Y
8
DIGITAL I/O
RX
DIO_DIR
DIO_R
DIO
UART1
TX
XRAM BUS
PB
COM0..3
PCMD
EEPROM I/F
EEDATA
EECTRL
4
4
4
2
Segments
5
9
DIO_1..24
24
PCSZ
PCLK
PSI
PSO
SPI SLAVE
8
PB
4
5
3
LCD DISPLAY
DRIVER
TEST
MODE
MPU
3
2
DIO_EEX
UART2/OPTICAL
OPT_RXDIS
OPT_RXINV
OPT_TXE
OPT_TXINV
OPT_TXMOD
OPT_FDC
VBIAS
NV RAM
V2*
+
-
IRAM BUS
8
IRAM
256B
EMULATOR
OPT_TXE
4
7
2.5V_NV
E_RXTX
E_TCLK
E_RSTZ
ICE_E
V1
POWER FAULT
ICE_E
FAULTZ
COM3..0
DIO41/SEG61
DIO36/SEG56*...DIO39/SEG59*
DIO29/SEG49...DIO30/SEG50
DIO28/SEG48*
DIO23/SEG43...DIO27/SEG47
DIO22/SEG42*
DIO13/SEG33...DIO21/SEG41
DIO12/SEG32*
DIO10/SEG30...DIO11/SEG31
OPT_TX
OPT_RX
GP0-GP7
V2_OK*
DIO52/SEG72*...DIO55/SEG75*
DIO47/SEG67...DIO51/SEG71
DIO46/SEG66*
DIO43/SEG63...DIO45/SEG65
DIO42/SEG62*
DIO9/SEG29/YPULSE
DIO8/SEG28/XPULSE
DIO7/SEG27/RPULSE
DIO6/SEG26/WPULSE
DIO5/SEG25/SDATA
DIO4/SEG24/SDCK
DIO3
DIO2/OPT_TX
DIO1/OPT_RX
SPE
SDATA
SCLK
DIO56...DIO58
CKOUT_E
3
TEST
MUX
SEG20...SEG23
SEG12 ...SEG18
SEG11/E_RST
SEG10/E_TCLK
SEG9/E_RXTX
SEG8
SEG7/MUX_SYNC
SEG6/PSDI
SEG5/PCSZ
SEG4/PSDO
SEG3/PCLK
SEG0...SEG2
TMUXOUT
TMUX[4:0]
* 71M6534/6534H only
RESET
ICE_E
3/10/2009
Figure 22: Functional Blocks in LCD Mode
(Inactive blocks in the figure are grayed out.)
v1.1
© 2007-2009 TERIDIAN Semiconductor Corporation
59
71M6533/71M6534 Data Sheet
FDS_6533_6534_004
GNDA GNDD
VREF
IAP
IAN
VA
IBP
IBN
VB
ICP
ICN
VC
IDP
IDN
V3P3SYS
V3P3A
∆Σ ADC
CONVERTER
VBIAS
FIR
FIR_LEN 22
VB_REF
ADC_E
VDDREFZ
VREF
VADC
VREF
VREF_CAL
VREF_DIS
EQU
MUX_AL
MUX_DIV
VBAT
CE_PROG
16
TEMP
2.5V_NV
RTCLK (32KHz)
OSC
(32KHz)
XIN
XOUT
MCK
PLL
MPU_DIV
CKOUT_E
V3P3D
CE
PLS_INV
PLS_INTERVAL
PLS_MAXWIDTH
CE_LCTN
EQU
PRE_SAMPS
SUM_CYCLES
RTM_0...3
RTM_E
CE_E
FLASH
128KB
RTM
VBAT
to TMUX
VOLT
REG
RPULSE
WPULSE
LCD_ONLY
SLEEP
XPULSE
YPULSE
YPULSE
XPULSE
WPULSE
RPULSE
VBIAS
MUXP
CE_DATA
32
V2P5
2.5V to logic
2.5V_NV
XRAM
4kB
CK_CE
DIO_PV
DIO_PW
DIO_PX
DIO_PY
CK_MPU
RTCA_ADJ
CKTEST
RTC
2.5V_NV
MULTIPURPOSE
I/O
RST_SUBSEC
QREG,PREG
RTC_DAY
RTC_DATE
RTC_HR
RTC_MIN RTC_MO
RTC_SEC RTC_YR
TEST
LCD_DAC
LCD_MODE
LCD_CLK
LCD_E
LCD_BLKMAP
LCD_SEG
LCD_Y
8
DIGITAL I/O
RX
DIO_DIR
DIO_R
DIO
UART1
TX
XRAM BUS
PB
COM0..3
PCMD
EEPROM I/F
EEDATA
EECTRL
4
4
4
2
Segments
5
9
DIO_1..24
24
PCSZ
PCLK
PSI
PSO
SPI SLAVE
8
PB
4
5
3
LCD DISPLAY
DRIVER
TEST
MODE
MPU
3
2
DIO_EEX
UART2/OPTICAL
OPT_RXDIS
OPT_RXINV
OPT_TXE
OPT_TXINV
OPT_TXMOD
OPT_FDC
VBIAS
NV RAM
V2*
+
-
IRAM BUS
8
IRAM
256B
EMULATOR
OPT_TXE
4
7
2.5V_NV
E_RXTX
E_TCLK
E_RSTZ
ICE_E
V1
POWER FAULT
ICE_E
FAULTZ
COM3..0
DIO41/SEG61
DIO36/SEG56*...DIO39/SEG59*
DIO29/SEG49...DIO30/SEG50
DIO28/SEG48*
DIO23/SEG43...DIO27/SEG47
DIO22/SEG42*
DIO13/SEG33...DIO21/SEG41
DIO12/SEG32*
DIO10/SEG30...DIO11/SEG31
OPT_TX
OPT_RX
GP0-GP7
V2_OK*
DIO52/SEG72*...DIO55/SEG75*
DIO47/SEG67...DIO51/SEG71
DIO46/SEG66*
DIO43/SEG63...DIO45/SEG65
DIO42/SEG62*
DIO9/SEG29/YPULSE
DIO8/SEG28/XPULSE
DIO7/SEG27/RPULSE
DIO6/SEG26/WPULSE
DIO5/SEG25/SDATA
DIO4/SEG24/SDCK
DIO3
DIO2/OPT_TX
DIO1/OPT_RX
SPE
SDATA
SCLK
DIO56...DIO58
CKOUT_E
3
TEST
MUX
SEG20...SEG23
SEG12 ...SEG18
SEG11/E_RST
SEG10/E_TCLK
SEG9/E_RXTX
SEG8
SEG7/MUX_SYNC
SEG6/PSDI
SEG5/PCSZ
SEG4/PSDO
SEG3/PCLK
SEG0...SEG2
TMUXOUT
TMUX[4:0]
* 71M6534/6534H only
RESET
ICE_E
3/10/2009
Figure 23: Functional Blocks in SLEEP Mode
(Inactive blocks in the figure are grayed out.)
60
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
System
(V3P3SYS)
V1_OK
Battery
Current
MPU Mode
300 nA
BROWNOUT
PLL_OK
MISSION
13..14 CK
cycles
WAKE
MPU Clock
Source
Transition
PLL
(4.2 MHz/MUX_DIV)
Xtal
2048...4096
CK32 cycles
Power
Figure 24: Transition from BROWNOUT to MISSION Mode when System Power Returns
V3P3SYS
and VBAT
V1_OK
Battery
Current
MPU Mode
MPU Clock
Source
WAKE
PLL_OK
Internal
RESETZ
300 nA
BROWNOUT
Xtal
MISSION
PLL
(4.2 MHz)
14.5 CK32
cycles
4096 CK32
cycles
1024 CK32
cycles
time
Figure 25: Power-Up Timing with V3P3SYS and VBAT tied together
v1.1
© 2007-2009 TERIDIAN Semiconductor Corporation
61
71M6533/71M6534 Data Sheet
FDS_6533_6534_004
VBAT
Battery
Current
BROWNOUT
MPU Mode
Xtal
MPU Clock
Source
14.5 CK32
cycles
WAKE
PLL_OK
Internal
RESETZ
1024 CK32
cycles
VBAT_OK
time
Figure 26: Power-Up Timing with VBAT only
2.4
2.4.1
Fault and Reset Behavior
Reset Mode
When the RESET pin is pulled high, all digital activity stops. The oscillator and RTC module continue to
run. Additionally, all I/O RAM bits are set to their default states. As long as V1, the input voltage at the
power fault block, is greater than VBIAS, the internal 2.5 V regulator will continue to provide power to the
digital section.
Once initiated, the reset mode will persist until the reset timer times out, signified by WAKE rising. This
will occur in 4100 cycles of the real time clock after RESET goes low, at which time the MPU will begin
executing its pre-boot and boot sequences from address 00. See the description of Program Security
in Section 1.4.5 for additional descriptions of pre-boot and boot.
If system power is not present, the reset timer duration will be 2 cycles of the crystal clock at which time
the MPU will begin executing in BROWNOUT mode, starting at address 00.
2.4.2
Power Fault Circuit
The 71M6533 and 71M6534 includes a comparator to monitor system power fault conditions. When the
output of the comparator falls (V1<VBIAS), the I/O RAM bits PLL_OK are zeroed and the part switches to
BROWNOUT mode if a battery is present. Once system power returns, the MPU remains in reset and
does not transition to MISSION mode until 2048 to 4096 CK32 clock cycles later, when PLL_OK rises. If
a battery is not present, as indicated by BAT_OK=0, WAKE will fall and the part will enter SLEEP mode.
There are several conditions the device could be in as system power returns. If the part is in
BROWNOUT mode, it will automatically switch to MISSION mode when PLL_OK rises. It will receive an
interrupt indicating this. No configuration bits will be reset or reconfigured during this transition.
If the part is in LCD or SLEEP mode when system power returns, it will also switch to MISSION mode
when PLL_OK rises. In this case, all configuration bits will be in the reset state due to WAKE having
been zero. The RTC clock will not be disturbed, but the MPU RAM must be re-initialized. The hardware
watchdog timer will become active when the part enters MISSION mode.
62
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
If there is no battery when system power returns, the part will switch to MISSION mode when PLL_OK
rises. All configuration bits will be in reset state, and RTC and MPU RAM data will be unknown and must
be initialized by the MPU.
2.5
Wake Up Behavior
As described above, the part will always wake up in MISSION mode when system power is restored. Additionally, the part will wake up in BROWNOUT mode when PB rises (push button is pressed) or when a
timeout of the wake-up timer occurs.
2.5.1
Wake on PB
If the part is in SLEEP or LCD mode, it can be awakened by a rising edge on the PB pin. This pin is normally pulled to GND and can be pulled high by a push button depression. Before the PB signal rises, the
MPU is in reset due to WAKE being low. When PB rises, WAKE rises and within three crystal cycles, the
MPU begins to execute. The MPU can determine whether the PB signal woke it up by checking the
IE_PB flag. Figure 27 shows the Wake Up timing.
For debouncing, the PB pin is monitored by a state machine operating from a 32 Hz clock. This circuit will
reject between 31 ms and 62 ms of noise. Detection hardware will ignore all transitions after the initial
rising edge. This will continue until the MPU clears the IE_PB bit.
System
Power
(V3P3SYS)
PB or wakeup timer
15 CK32
cycles
WAKE
MPU Mode
LCD
BROWNOUT
PLL_OK
time
Figure 27: Wake Up Timing
2.5.2
Wake on Timer
The wake-up timer can wake up the part if it is in SLEEP or LCD mode. Until this timer times out, the
MPU is in reset due to WAKE being low. When the wake-up timer times out, the WAKE signal rises and
within three CK32 cycles, the MPU begins to execute. The MPU can determine whether the timer woke it
by checking the AUTOWAKE interrupt flag (IE_WAKE).
The wake-up timer begins timing when the part enters LCD or SLEEP mode. Its duration is controlled by
WAKE_PRD[2:0] and WAKE_RES. WAKE_RES selects a timer LSB of either 1 minute (WAKE_RES = 1) or
2.0 seconds (WAKE_RES = 0).
When WAKE_RES = 0, the first wake-timer LSB may be 1.5 or 2.5 seconds; subsequent LSBs will be 2.0
seconds. WAKE_PRD[2:0] selects a duration of from 1 to 7 LSBs. When WAKE_RES = 0, the wake-up
timer duration will range from 1.5 + 2.0 *(WAKE_PRD[2:0] -1) seconds to 2.5 + 2.0 *(WAKE_PRD[2:0] -1)
seconds.
When WAKE_RES = 1, the time will be (WAKE_PRD[2:0] +1) minutes.
The timer is armed by WAKE_ARM = 1. It must be armed at least 64 RTC cycles (64 CK32 cycles), or 2
ms, before SLEEP or LCD_ONLY is initiated to ensure that WAKE_ARM is valid before entering the SLEEP
or LCD modes. Setting WAKE_ARM presets the timer with the values in WAKE_RES and WAKE_PRD and
v1.1
© 2007-2009 TERIDIAN Semiconductor Corporation
63
71M6533/71M6534 Data Sheet
FDS_6533_6534_004
readies the timer to start when the processor writes to the SLEEP or LCD_ONLY registers. The timer is
reset and disarmed whenever the processor is awake. Thus, if it is desired to wake the MPU periodically
(every 5 seconds, for example) the timer must be rearmed every time the part returns from SLEEP or
LCD mode.
2.6
Data Flow
The data flow between the Compute Engine (CE) and the MPU is shown in Figure 28. In a typical application, the 32-bit CE sequentially processes the samples from the voltage inputs on pins IA, VA, IB, and
VB, performing calculations to measure active power (Wh), reactive power (VARh), A2h, and V2h for fourquadrant metering. These measurements are then accessed by the MPU, processed further and output
using the peripheral devices available to the MPU. Figure 28 illustrates the CE/MPU data flow.
Pulses
IRQ
CE
Samples
Data
PreProcessor
Processed
Metering
Data
MPU
Post Processor
I/O RAM (Configuration RAM)
Figure 28: MPU/CE Data Flow
2.7
CE/MPU Communication
Figure 29 shows the functional relationships between the CE and the MPU. The CE is controlled by the
MPU via shared registers in the I/O RAM and in RAM.
The CE outputs two interrupt signals to the MPU: CE_BUSY and XFER_BUSY, which are connected to
the MPU interrupt service inputs as external interrupts. CE_BUSY indicates that the CE is actively processing data. This signal will occur once every multiplexer cycle. XFER_BUSY indicates that the CE is
updating data to the output region of the RAM. This will occur whenever the CE has finished generating a
sum by completing an accumulation interval determined by SUM_CYCLES * PRE_SAMPS samples. Interrupts to the MPU occur on the falling edges of the XFER_BUSY and CE_BUSY signals.
Refer to Section 4.3 CE Interface Description for additional information on setting up the device using the
MPU firmware.
WSUM
PULSES
W (DIO6)
VARSUM
VAR
(DIO7)
APULSEW
APULSER
EXT PULSE
SAG CONTROL
ADC
SAMPLES
SERIAL
(UART0/1)
MPU
DATA
CE
Mux Control
DISPLAY (Memory
mapped LCD
segments)
EEPROM
(I2C)
CE BUSY
XFER BUSY
DIO
INTERRUPTS
I/O RAM (Configuration RAM)
Figure 29: MPU/CE Communication
64
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
3 Application Information
3.1
Connection of Sensors (CT, Resistive Shunt)
Figure 30 through Figure 32 show how resistive dividers, current transformers, Rogowski coils and resistive shunts are connected to the voltage and current inputs of the 71M6533/71M6534.
VA = Vin * Rout/(Rout + Rin)
VA
Rin
Vin
Rout
Figure 30: Resistive Voltage Divider
Iout
Iin
IA
IIN
IOUT
InP
VDIFF
VOUT
Vout
R
R
V3P3A
V3P3
1/N
InN
1/N
Filter
Figure 31: CT with Single Ended (Left) and Differential Input (Right) Connection
Iin
IA
R
Vout
Iin
1/N
Vout = dIin /dt
IA
R
Vout
V3P3
VC
V3P3
Figure 32: Resistive Shunt (Left), Rogowski Sensor (Right)
3.2
Distinction between 71M6533/71M6534 and 71M6533H/71M6534H Parts
The 71M6533H/71M6534H parts go through an additional process of characterization during production
which makes them suitable to high-accuracy applications.
The first process, applied to both the 71M6533/71M6534 and the 71M6533H/71M6534H, is the trimming
of the reference voltage to the target value of 1.195V.
The second process, which is applied only to the 71M6533H/71M6534H, is the characterization of the
reference voltage over temperature. The coefficients for the reference voltage are stored in trim fuses
(I/O RAM registers TRIMBGA, TRIMBGB, TRIMM[2:0]. The MPU can read these trim fuses and calculate
the correction coefficients PPM1 and PPMC2 per the formulae given in Section 5.4.15 VREF. See Section
3.5 Temperature Compensation for additional details.
The fuse TRIMBGB is non-zero for the 71M6533H/71M6534H part and zero for the 71M6533/71M6533 part.
v1.1
© 2007-2009 TERIDIAN Semiconductor Corporation
65
71M6533/71M6534 Data Sheet
FDS_6533_6534_004
Only partial trim fuse information is available for non-H parts. The values for PPMC and PPMC2 that are
used by the CE to implement temperature compensation are calculated as follows:
•
•
PPMC = TC1 * 22.46 = (52.46 - TRIMT) * 3.18 * 22.46 = (52.46 - TRIMT) * 71.423
PPMC2 = TC2 * 1150.1 = –0.444 * 1150.1 = -510.6
The factor TRIMT used to calculate PPMC is derived from the trim fuse TRIMT[7:0].
3.3
Connecting 5 V Devices
All digital input pins of the 71M6533/71M6534 are compatible with external 5 V devices. I/O pins configured as inputs do not require current-limiting resistors when they are connected to external 5 V devices.
3.4
Temperature Measurement
Measurement of absolute temperature uses the on-chip temperature sensor and applying the following
formula:
T=
( N (T ) − N n )
+ Tn
Sn
In the above formula T is the temperature in °C, N(T) is the ADC count at temperature T, Nn is the ADC
count at 25°C, Sn is the sensitivity in LSB/°C as stated in the Electrical Specifications, and Tn is +25 °C.
Example: At 25°C a temperature sensor value of 483,203,000 (Nn) is read by the ADC. At an unknown
temperature T the value 449.648.000 is read at (N(T)). We determine the absolute temperature by dividing the difference of Nn and N(T) by 512 times the slope factor (-1180). After that, we add the 25C from
the reference measurement:
T=
449.648.000 - 483,203,000
+ 25C = 80.5C
512 ⋅ (−1180)
The divisor 512 accounts for the 8-bit shift of the ADC value and for the factor of 2 introduced into the
measurement by the CE which adds two consecutive temperature readings. It is recommended that temperature measurements be based on TEMP_RAW_X which is the sum of two consecutive temperature
readings, thus being higher by a factor of two than the raw sensor readings.
3.5
Temperature Compensation
In a typical application, the CE compensates for the temperature dependency of the reference voltage
(see Section 3.5.2). System-wide temperature correction over the entire meter is possible by involving
the MPU. The thermal coefficients processed by the MPU may include the current sensors, the voltage
sensors, and other influences.
3.5.1
Temperature Coefficients
For the 71M6533 and 71M6534, the temperature coefficient TC2 is given as a constant that represent
typical component behavior (in µV/°C2). TC1 can be calculated for the individual chip from the contents of
the TRIMT[7:0] I/O RAM register. TC1 and TC2 allow compensation for variations of the reference voltage to within ±40 PPM/°C.
For the 71M6533H/71M6534H, individualized coefficients TC1 and TC2 can be retrieved from the on-chip
fuses via TRIMBGA, TRIMBGB, TRIMM[2:0] (see Section 3.2 Distinction between 71M6533/71M6534 and
71M6533H/71M6534H Parts). For this part, TC1 and TC2 allow compensation for variations of the reference voltage to within ±15 PPM/°C
66
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
Since TC1 and TC2 are given in µV/°C and µV/°C2, respectively, the value of the VREF voltage
(1.195V) has to be taken into account when transitioning to PPM/°C and PPM/°C2. This means
that PPMC = 26.84*TC1/1.195 and PPMC2 = 1374*TC2/1.195).
3.5.2
Temperature Compensation for VREF
The bandgap temperature is used to digitally compensate the power outputs for the temperature dependence of VREF, using the CE register GAIN_ADJ (internal temperature compensation). Since the band
gap amplifier is chopper-stabilized via the CHOP_E bits, the most significant long-term drift mechanism in
the voltage reference is removed.
In internal temperature compensation mode, the CE applies the following formula to determine the
GAIN_ADJ value. In this formula TEMP_X is the deviation from nominal or calibration temperature expressed in multiples of 0.1 °C:
TEMP _ X ⋅ PPMC TEMP _ X 2 ⋅ PPMC 2
GAIN _ ADJ = 16385 +
+
214
2 23
3.5.3
System Temperature Compensation
In a production electricity meter, the 71M6533 and 71M6534 is not the only component contributing to
temperature dependency. A whole range of components (e.g. current transformers, resistor dividers,
power sources, filter capacitors) will contribute temperature effects.
Since the output of the on-chip temperature sensor is accessible to the MPU, temperature compensation
mechanisms with great flexibility are possible. MPU access to GAIN_ADJ permits a system-wide temperature correction over the entire meter rather than local to the chip.
3.5.4
Temperature Compensation for the RTC
In order to obtain accurate readings from the RTC, the following calibration procedures are recommended:
1. At the time of meter calibration, the crystal oscillator is calibrated using the RTCA_ADJ register in I/O
RAM to be as close to 32768 Hz as possible. The recommended procedure is to connect a highprecision frequency counter to the TMUXOUT pin and select 0x11 for TMUX[4:0]. This will generate a
4-second pulse at TMUXOUT that can be used to trim RTCA_ADJ to the best value.
2. When the meter is in service, the MPU takes frequent temperature readings. If the temperature characteristics of the crystal are known, the temperature readings can be used to modify the settings for
the I/O RAM registers PREG[16:0] and QREG[1:0] in order to keep the crystal frequency close to
32768 Hz.
3. After periods of operation under battery power, the temperature for the time the meter was not powered can be estimated by averaging the temperatures before and after battery operation. Based on
this, the overall correction for the RTC time can be calculated and applied to the RTC after main
power returns to the meter.
3.6
Connecting LCDs
The 71M6533 and 71M6534 has an on-chip LCD controller capable of controlling static or multiplexed
LCDs. Figure 33 shows the basic connection for an LCD.
v1.1
© 2007-2009 TERIDIAN Semiconductor Corporation
67
71M6533/71M6534 Data Sheet
FDS_6533_6534_004
The following dedicated and multi-use pins can be assigned as LCD segments:
•
•
•
•
15 dedicated LCD segment pins: SEG0 to SEG2, SEG8, SEG12 to SEG18, SEG20 to SEG23.
9 dual-function pins: MUX_SYNC/SEG7, CKTEST/SEG19, E_RXTX/SEG9, E_TCLK/SEG10,
E_RST/SEG11, SEG3/PCLK, SEG4/PSDO, SEG5/PCSZ, SEG6/PSDI.
5 additional dual-function pins in the 71M6534: SEG51/E_TBUS0, SEG52/E_TBUS1,
SEG53/E_TBUS2, SEG54/E_TBUS3, SEG55/E_ISYNC
33 (71M6533) or 46 (71M6534) combined DIO and segment pins
o 71M6533: SEG24/DIO4 to SEG31/DIO11, SEG33/DIO13 to SEG41/DIO21, SEG43/DIO23 to
SEG47/DIO27, SEG49/DIO29, SEG50/DIO30, SEG61/DIO41, SEG63/DIO43 to
SEG65/DIO45, and SEG67/DIO47 to SEG71/DIO51.
o 71M6534: SEG24/DIO4 to SEG50/DIO30, SEG56/DIO36 to SEG59/DIO39, SEG61/DIO41 to
SEG75/DIO55.
71M6533/71M6534
LCD
segments
commons
Figure 33: Connecting LCDs
3.7
Connecting I2C EEPROMs
I2C EEPROMs or other I2C compatible devices should be connected to the DIO pins DIO4 and DIO5, as
shown in Figure 34.
Pull-up resistors of roughly 10 kΩ to V3P3D (to ensure operation in BROWNOUT mode) should be used
for both SCL and SDA signals. The DIO_EEX register in I/O RAM must be set to 01 in order to convert
the DIO pins DIO4 and DIO5 to I2C pins SCL and SDA.
10 kΩ
V3P3D
10 kΩ
EEPROM
DIO4
SCL
DIO5
SDA
71M6533/71M6534
Figure 34: I2C EEPROM Connection
68
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
3.8
71M6533/71M6534 Data Sheet
Connecting Three-Wire EEPROMs
µWire EEPROMs and other compatible devices should be connected to the DIO pins DIO4 and DIO5, as
shown in Figure 35 and described below:
•
•
•
•
•
DIO5 connects to both the DI and DO pins of the three-wire device.
The CS pin must be connected to a vacant DIO pin of the 71M6533/71M6534.
In order to prevent bus contention, a 10 kΩ to resistor is used to separate the DI and DO signals.
The CS and CLK pins should be pulled down with a resistor to prevent operation of the three-wire
device on power-up, before the 71M6533/71M6534 can establish a stable signal for CS and CLK.
The DIO_EEX register in I/O RAM must be set to 2 (b10) in order to convert the DIO pins DIO4 and
DIO5 to µWire pins.
The µ-Wire EEPROM interface is only functional when MPU_DIV[2:0] = 000.
71M6533/71M6534
EEPROM
V3P3D
VCC
DIO4
CLK
DI
10 kΩ
DIO5
DO
DIOn
CS
100 kΩ
100 kΩ
Figure 35: Three-Wire EEPROM Connection
3.9
UART0 (TX/RX)
The UART0 RX pin should be pulled down by a 10 kΩ resistor and additionally protected by a 100 pF ceramic capacitor, as shown in Figure 36.
71M6533/71M6534
RX
100 pF 10 k Ω
TX
RX
TX
Figure 36: Connections for UART0
v1.1
© 2007-2009 TERIDIAN Semiconductor Corporation
69
71M6533/71M6534 Data Sheet
FDS_6533_6534_004
3.10 Optical Interface (UART1)
The OPT_TX and OPT_RX pins can be used for a regular serial interface (by connecting a RS_232 transceiver for example), or they can be used to directly operate optical components (for example, an infrared
diode and phototransistor implementing a FLAG interface). Figure 37 shows the basic connections for
UART1. The OPT_TX pin becomes active when the I/O RAM register OPT_TXE is set to 00.
The polarity of the OPT_TX and OPT_RX pins can be inverted with the configuration bits, OPT_TXINV
and OPT_RXINV, respectively.
The OPT_TX output may be modulated at 38 kHz when system power is present. Modulation is not
available in BROWNOUT mode. The OPT_TXMOD bit enables modulation. The duty cycle is controlled
by OPT_FDC[1:0], which can select 50%, 25%, 12.5%, and 6.25% duty cycle. A 6.25% duty cycle means
OPT_TX is low for 6.25% of the period. The OPT_RX pin uses digital signal thresholds. It may need an
analog filter when receiving modulated optical signals.
With modulation, an optical emitter can be operated at higher current than nominal, enabling it to
increase the distance along the optical path.
If operation in BROWNOUT mode is desired, the external components should be connected to V3P3D.
V3P3SYS
R1
71M6533/71M6534
OPT_RX
100 pF
10 kΩ
Phototransistor
V3P3SYS
R2
LED
OPT_TX
Figure 37: Connection for Optical Components
3.11 Connecting the V1 Pin
A voltage divider should be used to establish that V1 is in a safe range when the meter is in MISSION
mode (see Figure 38). V1 must be lower than 2.9 V in all cases in order to keep the hardware watchdog
timer enabled. The resistor divider ratio must be chosen so that V1 crosses the VBIAS threshold when
V3P3 is near the minimum supply voltage (3.0 VDC). A series resistor (R3) provides additional hysteresis, and a capacitor to ground (C1) is added for enhanced EMC immunity.
The amount of hysteresis depends on the choice of R1 and R3: If V1 < VBIAS, approximately 1 µA will
flow into the on-chip V1 comparator causing a voltage drop. If V1 ≥ VBIAS, almost no current will flow
into the comparator. The voltage drop will require V3P3 to be slightly higher for V1 to cross the VBIAS
threshold when V3P3 is rising as compared to when V3P3 is falling. Maintaining sufficient hysteresis
helps to eliminate rapid mode changes which may occur in cases where the power supply is unstable with
V1 close to the VBIAS threshold point.
70
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
R3
R1
V3P3
16.9kΩ
20kΩ
R2
C1
100pF
V1
GND
Figure 38: Voltage Divider for V1
3.12
Connecting the Reset Pin
Even though a functional meter will not necessarily need a reset switch, it is useful to have a reset pushbutton for prototyping as shown in Figure 39, left side. The RESET signal may be sourced from
V3P3SYS (functional in MISSION mode only), V3P3D (MISSION and BROWNOUT modes), or VBAT (all
modes, if a battery is present), or from a combination of these sources, depending on the application.
For a production meter, the RESET pin should be protected by the by the external components shown in
Figure 39, right side. R1 should be in the range of 100Ω and mounted as closely as possible to the IC.
Since the 71M6533 and 71M6534 generates its own power-on reset, a reset button or circuitry, as
shown in Figure 39, is only required for test units and prototypes.
VBAT/
V3P3D
V3P3D
R2
1k?
71M6533/
71M6533
71M6534
71M6533/
71M6534
Reset
Switch
RESET
RESET
0.1µF
10k ?
R1
100Ω
R1
DGND
DGND
Figure 39: External Components for the RESET Pin: Push-Button (Left), Production Circuit (Right)
3.13 Connecting the Emulator Port Pins
Even when the emulator is not used, small shunt capacitors to ground (22 pF) should be used for protection from EMI as illustrated in Figure 40. Production boards should have the ICE_E pin connected to
ground via a resistor of around 200 Ω.
The 71M6534 is capable of supporting a trace emulator. To connect this non-standard emulator, the pins
E_TBUS0 (SEG51) – E_TBUS3 (SEG54) and E_ISYNC (SEG55) have to be brought out to the emulator
interface.
v1.1
© 2007-2009 TERIDIAN Semiconductor Corporation
71
71M6533/71M6534 Data Sheet
FDS_6533_6534_004
LCD Segments
(optional)
V3P3D
71M6533/71M6534
ICE_E
62 Ω
E_RST
62 Ω
E_RXT
E_TCLK
62 Ω
22 pF 22 pF 22 pF
Figure 40: External Components for the Emulator Interface
3.14 Connecting a Battery
It is important that a valid voltage is connected to the VBAT pin at all times. For meters without a battery,
VBAT should be connected directly to V3P3SYS. Designs for meters with batteries need to ensure that
the meter functions even when the battery voltage decreases below the specified voltage for VBAT. This
can be achieved by connecting a diode from V3P3SYS to VBAT. However, the battery test will yield inaccurate results if that technique is used, since the voltage at V3P3SYS will feed current to the VBAT pin.
A better solution is shown in Figure 41: During the battery test, a DIO pin is activated as an output and
applies a low voltage to the anode of the diode. This prevents the voltage at the power supply to influence
the voltage at the VBAT pin.
Power
Supply
V3P3SYS
V3P3A
DIO
+
Battery or
Super-Cap
VBAT
71M6533/6534
Figure 41: Connecting a Battery
Meters equipped with batteries need to contain code that transitions the chip to SLEEP mode as
soon as the battery is attached in production. Otherwise, remaining in BROWNOUT mode would
add unnecessary drain to the battery.
3.15 Flash Programming
Operational or test code can be programmed into the flash memory using either an in-circuit emulator or
the Flash Programmer Module (TFP-2) available from Teridian. The flash programming procedure uses
the E_RST, E_RXTX, and E_TCLK pins. The FL_BANK register has to be set to the value corresponding
to the bank that is being programmed.
72
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
3.16 MPU Firmware Library
All application-specific MPU functions mentioned in Section 3 Application Information are available from
Teridian as a standard ANSI C library and as ANSI C source code. The code is available as part of the
Demonstration Kit for the 71M6533/71M6534. The Demonstration Kits come with the 71M6533/71M6534
preprogrammed with demo firmware and mounted on a functional sample meter Demo Board. The Demo
Boards allow for quick and efficient evaluation of the IC without having to write firmware or having to
supply an in-circuit emulator (ICE).
3.17 Crystal Oscillator
The oscillator of the 71M6533/71M6534 drives a standard 32.768 kHz watch crystal. The oscillator has
been designed specifically to handle these crystals and is compatible with their high impedance and limited power handling capability. The oscillator power dissipation is very low to maximize the lifetime of
any battery backup device attached to VBAT.
Board layouts with minimum capacitance from XIN to XOUT will require less battery current. Good
layouts will have XIN and XOUT shielded from each other.
Since the oscillator is self-biasing, an external resistor must not be connected across the crystal.
3.18 Meter Calibration
Once the Teridian 71M6533 and 71M6534 energy meter device has been installed in a meter system, it
must be calibrated. A complete calibration includes the following:
•
•
•
•
Calibration of the metrology section, i.e. calibration for tolerances of the current sensors, voltage dividers and signal conditioning components as well as of the internal reference voltage (VREF).
Establishment of the reference temperature (Section 3.2) for temperature measurement and temperature compensation (Section 3.5).
Calibration of the battery voltage measurement (Section 1.4.9).
Calibration of the oscillator frequency (Section 1.4.3) and temperature compensation for the RTC
(Section 3.5.4).
The metrology section can be calibrated using the gain and phase adjustment factors accessible to the
CE. The gain adjustment is used to compensate for tolerances of components used for signal conditioning, especially the resistive components. Phase adjustment is provided to compensate for phase shifts
introduced by the current sensors or by the effects of reactive power supplies.
Due to the flexibility of the MPU firmware, any calibration method, such as calibration based on energy, or
current and voltage can be implemented. It is also possible to implement segment-wise calibration (depending on current range).
The 71M6533 and 71M6534 supports common industry standard calibration techniques, such as singlepoint (energy-only), multi-point (energy, Vrms, Irms), and auto-calibration.
v1.1
© 2007-2009 TERIDIAN Semiconductor Corporation
73
71M6533/71M6534 Data Sheet
FDS_6533_6534_004
4 Firmware Interface
4.1
I/O RAM Map –Functional Order
Bits marked with an asterisk (e.g. UMUX_E*) apply to the 71M6534 only.
Table 46: I/O RAM Map – Functional Order
Name
Address
Configuration:
CE0
2000
Bit 7
Bit 6
Bit 5
EQU[2:0]
Bit 4
Bit 3
CE_E
CE10MHZ
Bit 2
Bit 1
Bit 0
Not Used
CE1
2001
PRE_SAMPS[1:0]
CE2
2002
Not Used
COMP0
2003
Not Used
PLL_OK
Not Used
CONFIG0
2004
VREF_CAL
PLS_INV
CONFIG1
2005
Reserved (0)
Not Used
VERSION
2006
CONFIG2
2007
CE3
209D
CE4
20A7
BOOT_SIZE[7:0]
CE5
20A8
CE_LCTN[7:0]
WAKE
20A9
WAKE_ARM
SLEEP
LCD_ONLY
TMUX
20AA
Not Used
Not Used
Not Used
ANACTRL
20AB
CONFIG3
20AC
Not Used
Not Used
SEL_IBN
CHOP_IB
Not Used
Not Used
SEL_IAN
CHOP_IA
CONFIG4
20AD
Not Used
Not Used
SEL_IDN
CHOP_ID
Not Used
Not Used
SEL_ICN
CHOP_IC
20AF
Not Used
Not Used
Not Used
Not Used
Not Used
OPT_RXDIS
OPT_RXINV
DIO_PW
SUM_CYCLES[5:0]
CHOP_E[1:0]
RTM_E
WD_OVF
EX_RTC
EX_XFR
Not Used
Not Used
Not Used
Not Used
COMP_STAT
Not Used
CKOUT_E
VREF_DIS
ECK_DIS
M26MHZ
ADC_E
MPU_DIV[2:0]
MUX_ALT
Not Used
M40MHZ
VERSION[7:0]
OPT_TXE[1:0]
Not Used
Not Used
EX_PLL
EX_FWCOL
Not Used
Not Used
Not Used
FIR_LEN[1:0]
OPT_FDC[1:0]
MUX_DIV[3:0]
WAKE_RES
WAKE_PRD[2:0]
TMUX[4:0]
Reserved (0000)
CHOP_I_EN
LCD_DAC[2:0]
Digital I/O:
DIO_RRX[2:0]
DIO0
2008
DIO1
2009
Not Used
DIO_R1[2:0]
Not Used
DI_RPB[2:0]
DIO2
200A
Not Used
DIO_R3[2:0]
Not Used
DIO_R2[2:0]
DIO3
200B
Not Used
DIO_R5[2:0]
Not Used
DIO_R4[2:0]
DIO4
200C
Not Used
DIO_R7[2:0]
Not Used
DIO_R6[2:0]
DIO5
200D
Not Used
DIO_R9[2:0]
Not Used
DIO_R8[2:0]
74
DIO_EEX[1:0]
© 2007-2009 TERIDIAN Semiconductor Corporation
DIO_PV
OPT_TXMOD
OPT_TXINV
v1.1
FDS_6533_6534_004
Name
DIO6
Address
200E
200F
71M6533/71M6534 Data Sheet
Bit 7
Bit 6
Not Used
Reserved (00)
UMUX_E*
UMUX_SEL*
DIO7/ P0
DIO8
DIO9 / P1
(Port 1)
SFR 80
SFR A2
SFR 90
DIO_1[7:5]
DIO10
SFR 91
DIO_DIR1[7:5]
DIO11/ P2 SFR A0
(Port 2)
DIO_2[7]
DIO12
SFR A1
DIO_DIR2[7]
P3
SFR B0
Not Used
Interrupts and WD Timer:
INTBITS
WD_RST
SFR F8
IFLAGS
SFR E8 IE_PLLFALL
Flash:
ERASE
SFR 94
FLSHCTL SFR B2
PREBOOT
FL_BANK SFR B6
Not Used
PGADR
SFR B7
Real Time Clock:
RTCCTRL 2010
RTCA_ADJ
SUBSEC1
RTC0
RTC1
RTC2
RTC3
RTC4
v1.1
2011
2014
2015
2016
2017
2018
2019
Bit 5
DIO_R11[2:0]
Not Used
Bit 4
Not Used
Bit 3
Not Used
DIO_PX
Bit 2
DIO_PY
DIO_0[7:0](Port 0)
DIO_DIR0[7:1]
Not Used
DIO_1[4]*
Not Used
DIO_DIR[4]*
Not Used
Not Used
DIO_DIR1[3:0]
Not Used
DIO_2[6]*
Not Used
DIO_DIR2[6]*
DIO3[6]
DIO3[5]
Not Used
DIO3[4]*
DIO3[3]
DIO3[2]
DIO3[1]
DIO3[0]
INT6
IE_PLLRISE
INT5
IE_WAKE
INT4
IE_PB
INT3
IE_FWCOL1
INT2
IE_FWCOL0
INT1
IE_RTC
INT0
IE_XFER
SECURE
Not Used
DIO_2[5:0]
DIO_DIR2[5:0]
WRPROT_BT
Not Used
Not Used
Not Used
Not Used
Not Used
Not Used
Not Used
Not Used
Not Used
Bit 0
DIO_1[3:0]
FLSH_ERASE[7:0]
WRPROT_CE
Not Used
Not Used
Not Used
Not Used
Not Used
Not Used
Not Used
Not Used
Not Used
Not Used
Not Used
Not Used
Not Used
Not Used
FLSH_MEEN
FLSH_PWE
FL_BANK[1:0]
FL_BANK[2:0]*
Not Used
Not Used
FLSH_PGADR[5:0]
Not Used
Bit 1
DIO_R10[2:0]
Not Used
Not Used
Not Used
Not Used
RST_SUBSEC
RTCA_ADJ[6:0]
SUBSEC[7:0]
RTC_SEC[5:0]
RTC_MIN[5:0]
RTC_HR[4:0]
Not Used
Not Used
© 2007-2009 TERIDIAN Semiconductor Corporation
RTC_DAY[2:0]
RTC_DATE[2:0]
75
71M6533/71M6534 Data Sheet
Name
RTC5
RTC6
Address
201A
201B
RTCADJ_H 201C
FDS_6533_6534_004
Bit 7
Not Used
Bit 6
Not Used
Bit 5
Not Used
Bit 4
Bit 3
Not Used
RTC_YR[7:0]
Not Used
Not Used
Not Used
Not Used
RTCADJ_M 201D
Bit 2
Bit 1
RTC_MO[3:0]
Not Used
Bit 0
PREG[16:14]
PREG[13:6]
RTCADJ_L 201E
PREG[5:0]
QREG[1:0]
WE
201F
RTC write protect register
LCD Display Interface:
LCDX
MUX_SYNC_E
BME
Reserved (0) Reserved (0)
Not Used
Not Used
Not Used
Not Used
2020
LCDY
LCD_Y
LCD_E
LCD_MODE[2:0]
LCD_CLK[1:0]
Not Used
2021
LCD_MAP0 2023
…
…
See the detailed description for LCD_BITMAP[ ] in Table 47: I/O RAM Description – Alphabetical
LCD_MAP5 2028
LCD_MAP6*
LCD0
…
LCD41
LCD_BLNK
2029
2030
…
2059
205A
RTM0H
2060
RTM0L
2061
RTM1H
2062
RTM1L
2063
RTM2H
2064
RTM2L
2065
RTM3H
2066
RTM3L
2067
SPI Interface:
SPI…
2070
SP_CMD
2071
SP_ADH
2072
SP_ADL
2073
76
See the detailed description for LCD_SEG[ ] in Table 47: I/O RAM Description – Alphabetical
LCD_BLKMAP19[3:0]
Area Reserved for Factory Test:
Not Used
RTM0[7:0]
Not Used
RTM1[7:0]
Not Used
RTM2[7:0]
Not Used
RTM3[7:0]
SPE
Not Used
Not Used
Not Used
Not Used
SP_CMD[7:0]
SP_ADDR[15:8]
SP_ADDR[7:0]
© 2007-2009 TERIDIAN Semiconductor Corporation
LCD_BLKMAP18[3:0]
RTM0[9:8]
RTM1[9:8]
RTM2[9:8]
RTM3[9:8]
Not Used
Not Used
Not Used
v1.1
FDS_6533_6534_004
Name
Address
Pulse Generator:
PLS_W
2080
PLS_I
2081
ADC Mux:
SLOT0
2090
SLOT1
2091
SLOT2
2092
SLOT3
2093
SLOT4
2094
SLOT5
2096
SLOT6
2097
SLOT7
2098
SLOT8
2099
SLOT9
209A
SPI Interrupt:
SPI0
20B0
SPI1
20B1
71M6533/71M6534 Data Sheet
Bit 7
Bit 6
Bit 4
Bit 3
Bit 2
Bit 1
Bit 0
PLS_MAXWIDTH[7:0]
PLS_INTERVAL[7:0]
SLOT1_SEL
SLOT3_SEL
SLOT5_SEL
SLOT7_SEL
SLOT9_SEL
SLOT1_ALTSEL
SLOT3_ALTSEL
SLOT5_ALTSEL
SLOT7_ALTSEL
SLOT9_ALTSEL
SLOT0_SEL
SLOT2_SEL
SLOT4_SEL
SLOT6_SEL
SLOT8_SEL
SLOT0_ALTSEL
SLOT2_ALTSEL
SLOT4_ALTSEL
SLOT6_ALTSEL
SLOT8_ALTSEL
Not Used
Not Used
Not Used
IEN_SPI
Not Used
Not Used
Not Used
Not Used
Not Used
Not Used
SPI_FLAG
Not Used
Not Used
Not Used
General-Purpose and Non Volatile Registers:
GP0
20C0
…
…
GP7
20C7
VERSION 20C8
Serial EEPROM:
EEDATA
SFR 9E
EECTRL
SFR 9F
v1.1
Bit 5
IEN_WD_
NROVF
WD_NROVF_
FLAG
GP0[7:0]
…
GP7[7:0]
VERSION[7:0]
EEDATA[7:0]
EECTRL[7:0]
© 2007-2009 TERIDIAN Semiconductor Corporation
77
71M6533/71M6534 Data Sheet
4.2
FDS_6533_6534_004
I/O RAM Description – Alphabetical Order
The following conventions apply to the descriptions in this table:
•
•
•
•
•
Bits with a W (write) direction are written by the MPU into configuration RAM. Typically, they are initially stored in flash memory and copied to
the configuration RAM by the MPU. Some of the more frequently programmed bits are mapped to the MPU SFR memory space. The remaining bits are mapped to 2xxx.
Bits with an R (read) direction can be read by the MPU.
Columns labeled Reset and Wake describe the bit values upon reset and wake, respectively. “NV” in the Wake column means the bit is powered by the nonvolatile supply and is not initialized. LCD-related registers labeled “L” retain data upon transition from LCD mode to
BROWNOUT mode and vice versa, but do not retain data in SLEEP mode. “–“ means that the value is undefined.
Write-only bits will return zero when they are read.
Bits marked with an asterisk (e.g. DIO_DIR1[4]*) are applicable to the 71M6534 only.
Table 47: I/O RAM Description – Alphabetical (by Bit Name)
Name
ADC_E
BME
Location
2005[3]
2020[6]
Reset
0
0
Wake
0
–
Dir
R/W
R/W
BOOT_SIZE[7:0]
20A7[7:0]
01
01
R/W
CE10MHZ
2000[3]
0
0
R/W
CE_E
CE_LCTN[7:0]
CHOP_E[1:0]
2000[4]
20A8[7:0]
2002[5:4]
0
0x31
00
0
0x31
00
R/W
R/W
R/W
CHOP_I_EN
20AB[0]
0
0
R/W
CHOP_IA
CHOP_IB
CHOP_IC
CHOP_ID
20AC[0]
20AC[4]
20AD[0]
20AD[4]
0
0
0
0
0
0
0
0
R/W
78
Description
Enables ADC and VREF. When disabled, removes bias current.
Battery Measure Enable. When set, a load current is immediately applied to the battery and it is connected to the ADC to be measured on Alternative Mux Cycles. See
the MUX_ALT bit.
End of space reserved for boot program. The ending address of the boot region is
1024*BOOT_SIZE.
CE clock select. When set, the CE is clocked at 10 MHz. Otherwise, the CE clock
frequency is 5 MHz.
CE enable.
CE program location. The starting address for the CE program is 1024*CE_LCTN.
Chop enable for the reference bandgap circuit. The value of CHOP will change on the
rising edge of MUXSYNC according to the value in CHOP_E:
00 = toggle, except at the mux sync edge at the end of SUMCYCLE, an alternative
MUX frame is automatically inserted at the end of each accumulation interval.
01 = positive.
10 = reversed.
11 = toggle, no alternative MUX frame is inserted
When CHOP_I_EN is set, chop mode for the analog current inputs can be enabled
with the CHOP_IA, CHOP_IB, CHOP_IC, and CHOP_ID bits.
When CHOP_I_EN is set, these bits enable chop mode for the respective channel.
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
CKOUT_E
2004[4]
0
0
R/W
COMPSTAT
DI_RPB[2:0]
DIO_R1[2:0]
DIO_R2[2:0]
DIO_R3[6:4]
DIO_R4[2:0]
DIO_R5[2:0]
DIO_R6[2:0]
DIO_R7[2:0]
DIO_R8[2:0]
DIO_R9[2:0]
DIO_R10[2:0]
DIO_R11[2:0]
DIO_RRX[2:0]
2003[0]
2009[2:0]
2009[6:4]
200A[2:0]
200A[6:4]
200B[2:0]
200B[6:4]
200C[2:0]
200C[6:4]
200D[2:0]
200D[6:4]
200E[2:0]
200E[6:4]
20AF[2:0]
--
--
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
R
R/W
DIO_DIR0[7:1]
SFR A2
0
–
R/W
DIO_DIR1[7:5,
3:0],
DIO_DIR1[4]*
SFR 91
0
–
R/W
DIO_DIR2[7,5:0] SFR A1
DIO_DIR2[6]*
0
–
R/W
2052[4]
2053[4]
2054[4]
2052[7]
2053[7]
2054[7]
0
0
0
0
0
0
–
–
–
R/W
The value on DIO pins 56 through 58. The MPU writes data to these registers to change
the data on these pins.
–
–
–
R/W
Programs the direction of DIO pins 56 through 58. Writing a 1 indicates an output.
DIO_56
DIO_57
DIO_58
DIO_DIR56
DIO_DIR57
DIO_DIR58
v1.1
Control bit for the SEG19/CKOUT pin:
0: The pin is the SEG19 LCD driver
1: The pin is the CK_FIR output (5 MHz in mission mode, 32 kHz in brownout mode)
Status bit for the V1 comparator (same as V1_OK, see TMUXOUT)
Connects dedicated I/O pins DIO1 through DIO11 as well as input pins PB to internal
resources. If more than one input is connected to the same resource, the “Multiple”
column in the table below specifies how they are combined.
DIO_RRX applies to the RX pin.
DIO_Rx[2:0]
000
001
010
011
100
101
110
111
Resource
NONE
Reserved
T0 (Counter /Timer 0 clock or gate)
T1 (Counter /Timer 1 clock or gate)
High priority IO interrupt (int0 rising)
Low priority IO interrupt (int1 rising)
High priority IO interrupt (int0 falling)
Low priority IO interrupt (int1 falling)
Multiple
-OR
OR
OR
OR
OR
OR
OR
Programs the direction of pins DIO7 through DIO1. Writing a 1 indicates an output. A bit
is ignored if the corresponding pin is not configured as DIO. See DIO_PV and DIO_PW
for special options for DIO6 and DIO7. See DIO_EEX for special options for DIO4 and
DIO5.
Programs the direction of pins DIO15 through DIO8. Writing a 1 indicates an output.
A bit is ignored if the corresponding pin is not configured as DIO. See DIO_PX and
DIO_PW for special options for the DIO8 and DIO9 outputs.
DIO_DIR1[4] controlling DIO12 is only applicable to the 71M6534.
Programs the direction of pins DIO23 through DIO16. Writing a 1 indicates an output.
A bit is ignored if the corresponding pin is not configured as a DIO.
DIO_DIR2[6] controlling DIO22 is only applicable to the 71M6534.
© 2007-2009 TERIDIAN Semiconductor Corporation
79
71M6533/71M6534 Data Sheet
FDS_6533_6534_004
DIO_0[7:0]
DIO_1[7:0]
DIO_2[7:0]
DIO_3[6:0]
SFR 80
SFR 90
SFR A0
SFR B0
0
0
0
0
–
–
–
–
R/W
DIO_EEX[1:0]
2008[7:6]
0
0
R/W
The value on the DIO pins. Pins configured as LCD will read zero. The MPU writes to
these registers to change the data on pins configured as outputs. Pins configured as LCD
or input will ignore writes.
DIO_0[7:0] corresponds to DIO7 through DIO1 and PB (PB is read on DIO_0[0]).
DIO_1[7:0] corresponds to DIO15 through DIO8. (DIO_1[4] corresponding to
DIO12 is only applicable to the 71M6534)
DIO_2[7:0] corresponds to DIO23 through DIO16. (DIO_2[4] corresponding to
DIO22 is only applicable to the 71M6534)
DIO_3[6:0] corresponds to DIO30 through DIO24. (DIO_3[4] corresponding to
DIO28 is only applicable to the 71M6534)
When set, converts DIO4 and DIO5 to interface with external EEPROM. DIO4 becomes SDCK and DIO5 becomes bi-directional SDATA.
DIO_EEX[1:0]
00
01
10
11
DIO_PV
DIO_PW
DIO_PX
DIO_PY
EEDATA[7:0]
EECTRL[7:0]
ECK_DIS
2008[2]
2008[3]
200F[3]
200F[2]
SFR 9E
SFR 9F
2005[5]
0
0
0
0
0
0
0
0
0
0
0
0
0
0
R/W
R/W
R/W
R/W
R/W
R/W
R/W
Function
Disable EEPROM interface
2-Wire EEPROM interface
3-Wire EEPROM interface
--not used--
Causes VARPULSE to be output on DIO7.
Causes WPULSE to be output on DIO6.
Causes XPULSE to be output on DIO8.
Causes YPULSE to be output on DIO9.
Serial EEPROM interface data.
Serial EEPROM interface control.
Emulator clock disable. When ECK_DIS = 1, the emulator clock is disabled.
If ECK_DIS is set, the emulator and programming devices will be unable to
erase or program the device.
EQU[2:0]
EX_XFR
EX_RTC
EX_FWCOL
EX_PLL
80
2000[7:5]
2002[0]
2002[1]
2007[4]
2007[5]
0
0
0
0
0
0
0
0
0
0
R/W
R/W
Specifies the power equation to be used by the CE.
Interrupt enable bits. These bits enable the XFER_BUSY, the RTC_1SEC, the FirmWareCollision (FWCOL), and PLL interrupts. Note that if one of these interrupts is to
be enabled, its corresponding MPU EX enable must also be set. See Section 1.3.9
Interrupts for details.
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
FIR_LEN[1:0]
2007[3:2]
1
1
R/W
FL_BANK[1:0]
FL_BANK[2:0]*
SFR B6[1:0]
SFR B6[2:0]
1
1
R/W
FLSH_ERASE
[7:0]
SFR 94[7:0]
0
0
W
FLSH_MEEN
SFR B2[1]
0
0
W
FLSH_PGADR
[5:0]
SFR B7 [7:2]
0
0
W
FLSH_PWE
SFR B2[0]
0
0
R/W
FOVRIDE
20FD[4]
0
0
R/W
v1.1
FIR_LEN[1:0] controls the length of the ADC decimation FIR filter.
Resulting FIR
Resulting
[M40MHZ, M26MHZ] FIR_LEN
Filter Cycles
ADC Gain
[00], [10], or [11]
00
138
0.110017
01
288
1.000
10
384
2.37037
[01]
00
186
0.113644
01
384
1.000
10
588
3.590363
Flash bank selection register. Flash memory above 32 k is mapped to the MPU address space from 0x8000 to 0xFFFF in 32 k banks. When MPU address[15] = 1, the
address in flash is mapped to FL_BANK[1:0] or FL_BANK[2:0], MPU Address[14:0].
FL_BANK is reset by the erase cycle.
Flash Erase Initiate. (Default = 0x00). FLSH_ERASE is used to initiate either the Flash
Mass Erase cycle or the Flash Page Erase cycle. Specific patterns are expected for
FLSH_ERASE in order to initiate the appropriate Erase cycle.
0x55 = Initiate Flash Page Erase cycle. Must be proceeded by a write to
FLSH_PGADR @ SFR 0xB7.
0xAA = Initiate Flash Mass Erase cycle. Must be proceeded by a write to
FLSH_MEEN @ SFR 0xB2 and the debug (CC) port must be enabled.
Any other pattern written to FLSH_ERASE will have no effect. The erase cycle is not
completed until 0x00 is written to FLSH_ERASE.
Mass Erase Enable.
0 = Mass Erase disabled (default).
1 = Mass Erase enabled.
Must be re-written for each new Mass Erase cycle.
Flash Page Erase Address. (Default = 0x00)
FLSH_PGADR[5:0] with FL_BANK[2:0], sets the Flash Page Address (page 0 through
127) that will be erased during the Page Erase cycle.
Must be re-written for each new Page Erase cycle.
Program Write Enable. This bit must be cleared by the MPU after each byte write operation. Writes to this bit are inhibited when interrupts are enabled.
0 = MOVX commands refer to XRAM Space, normal operation (default).
1 = MOVX @DPTR,A moves A to Program Space (Flash) @ DPTR.
Permits the values written by the MPU to temporarily override the values in the fuse
register (reserved for production test).
© 2007-2009 TERIDIAN Semiconductor Corporation
81
71M6533/71M6534 Data Sheet
FDS_6533_6534_004
R/W
GP0
…
GP7
IE_FWCOL0
IE_FWCOL1
IE_PB
20C0
…
20C7
SFR E8[2]
SFR E8[3]
SFR E8[4]
0
…
0
0
0
0
NV
…
NV
0
0
–
R/W
R/W
R/W
IE_PLLRISE
SFR E8[6]
0
0
R/W
IE_PLLFALL
SFR E8[7]
0
0
R/W
IEN_SPI
IEN_WD_NROVF
IE_XFER
IE_RTC
IE_WAKE
20B0[4]
20B0[0]
SFR E8[0]
SFR E8[1]
SFR E8[5]
INTBITS
R/W
R/W
0
0
0
0
0
0
0
–
R/W
SFR
F8[6:0]
–
–
R/W
LCD_BITMAP
[31:24]
2023[7:0]
0
L
R/W
LCD_BITMAP
[39:32]
2024[7:0]
0
L
R/W
LCD_BITMAP
[47:40]
2025[7:0]
0
L
R/W
82
R/W
Non-volatile general-purpose registers powered by the RTC supply. These registers
maintain their value in all power modes, but will be cleared on reset. The values of
GP0…GP7 will be undefined if VBAT drops below the minimum value.
Interrupt flags for the Firmware Collision Interrupt. See the Flash Memory section for
details.
PB flag. Indicates that a rising edge occurred on PB. Firmware must write a zero to
this bit to clear it. The bit is also cleared when the MPU requests SLEEP or LCD
mode. On bootup, the MPU can read this bit to determine if the part was woken with
the PB DIO0[0].
Indicates that the MPU was woken or interrupted (INT4) by system power becoming
available, or more precisely, by PLL_OK rising. The firmware must write a zero to this
bit to clear it.
Indicates that the MPU has entered BROWNOUT mode because system power has
become unavailable (INT4), or more precisely, because PLL_OK fell. This bit will not
be set if the part wakes into BROWNOUT mode because of PB or the WAKE timer.
The firmware must write a zero to this bit to clear it.
SPI interrupt enable.
Active high watchdog near overflow interrupt enable.
Interrupt flags. These flags monitor the XFER_BUSY interrupt and the RTC_1SEC
interrupt. The flags are set by hardware and clear automatically.
Indicates that the MPU was awakened by the autowake timer. This bit is typically read
by the MPU on bootup. The firmware must write a zero to this bit to clear it.
Interrupt inputs. The MPU may read these bits to see the status of external interrupts
INT0, INT1 up to INT6. These bits do not have any memory and are primarily intended
for debug use.
Configuration for DIO11/SEG31 through DIO4/SEG24. Unused bits should be set to zero.
1 = LCD pin, 0 = DIO pin.
Configuration for DIO19/SEG39 through DIO12/SEG32. LCD_BITMAP[32] corresponding to DIO12/SEG32 is only applicable to the 71M6534. Unused bits should be set
to zero.
1 = LCD pin, 0 = DIO pin.
Configuration for DIO27/SEG47 through DIO20/SEG40. (LCD_BITMAP[42] corresponding to DIO22/SEG42 is only applicable to the 71M6534. Unused bits should be set to
zero.
1 = LCD pin, 0 = DIO pin.
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
LCD_BITMAP
[50:48]
2026[2:0]
0
L
R/W
LCD_BITMAP
[63:61],
[59:56]*
2027[7:5,3:0]
0
L
R/W
LCD_BITMAP
[71:64]
2028[7:0]
0
L
R/W
LCD_BLKMAP18 205A[3:0]
[3:0]
LCD_CLK[1:0]
2021[1:0]
0
L
R/W
0
L
R/W
20AB[3:1]
0
L
R/W
LCD_DAC[2:0]
Configuration for DIO30/SEG50 through DIO28/SEG48. LCD_BITMAP[48] corresponding to DIO28/SEG48 is only applicable to the 71M6534. Unused bits should be set to zero.
1 = LCD pin, 0 = DIO pin.
Configuration for DIO43/SEG63 through DIO41/SEG61 and DIO39/SEG59 through
DIO36/SEG56. LCD_BITMAP[62] corresponding to DIO42/SEG62 and
LCD_BITMAP[59:56] corresponding to DIO39/SEG59 through DIO36/SEG56 are only
applicable to the 71M6534. Unused bits should be set to zero.
1 = LCD pin, 0 = DIO pin.
Configuration for DIO51/SEG71 through DIO44/SEG64. LCD_BITMAP[66] corresponding to DIO46/SEG66 is only applicable to the 71M6534. Unused bits should be set to zero.
1 = LCD pin, 0 = DIO pin.
Identifies which segments connected to SEG18 should blink. 1 means blink. The
most significant bit corresponds to COM3, the least significant bit to COM0.
Sets the LCD clock frequency for the COM/SEG pins (not the frame rate) according to
the following (fw = 32768 Hz):
00 = fw/512, 01 = fw/256, 10 = fw/128, 11 = fw/64
LCD contrast control DAC. Adjusts the LCD voltage in steps of 0.2 V from V3P3SYS
(mission mode) or VBAT (brownout/LCD modes).
LCD_DAC[2:0]
000
001
010
011
100
101
110
111
LCD_E
v1.1
2021[5]
0
L
R/W
Resulting LCD Voltage
V3P3 or VBAT
V3P3 or VBAT – 0.2V
V3P3 or VBAT – 0.4V
V3P3 or VBAT – 0.6V
V3P3 or VBAT – 0.8V
V3P3 or VBAT – 1.0V
V3P3 or VBAT – 1.2V
V3P3 or VBAT – 1.4V
Enables the LCD display. When disabled, VLC2, VLC1 and VLC0 are ground as are
the COM and SEG outputs.
© 2007-2009 TERIDIAN Semiconductor Corporation
83
71M6533/71M6534 Data Sheet
LCD_MODE[2:0] 2021[4:2]
LCD_ONLY
20A9[5]
LCD_SEG0[3:0] 2030[3:0]
…
…
LCD_SEG18[3:0] 2042[3:0]
LCD_SEG19[3:0]
2043[3:0]
…
…
LCD_SEG31[3:0] 204F[3:0]
LCD_SEG32[3:0]* 2050[3:0]
LCD_SEG33[3:0] 2051[3:0]
…
…
LCD_SEG41[3:0] 2059[3:0]
LCD_SEG42[3:0]* 2030[7:4]
LCD_SEG43[3:0] 2031[7:4]
…
…
LCD_SEG47[3:0] 2035[7:4]
LCD_SEG48[3:0]* 2036[7:4]
LCD_SEG49[3:0] 2037[7:4]
LCD_SEG50[3:0] 2038[7:4]
LCD_SEG51[3:0]* 2039[7:4]
…
…
LCD_SEG59[3:0]* 2041[7:4]
LCD_SEG61[3:0] 2043[7:4]
LCD_SEG62[3:0]* 2044[7:4]
84
FDS_6533_6534_004
0
L
R/W
The LCD bias mode. Use the LCD DAC to reduce saturation. The number of states is
the number of commons which are driven to multiplex the LCD.
Function
Notes
LCD_MODE[2:0]
000
4 states, ⅓ bias
⅓ bias modes can drive 3.3 V LCDs.
001
3 states, ⅓ bias
010
2 states, ½ bias
½ bias and static modes can drive
both 3.3 V and 5 V LCDs.
011
3 states, ½ bias
100
static display
Puts the 71M6533/71M6534 to sleep, but with the LCD display still active. LCD_ONLY
is ignored if system power is present. While in SLEEP mode, the device will wake up
on reset, when the autowake timer times out, when the push button is pushed, or when
system power returns.
0
0
W
0
…
0
0
…
0
0
0
…
0
0
0
…
0
0
0
0
0
…
0
0
0
L
…
L
L
…
L
L
L
…
L
L
L
…
L
L
L
L
L
…
L
L
L
R/W
LCD Segment Data. Each word contains information for 1 to 4 time divisions of each
segment.
R/W
In each word, bit 0 corresponds to COM0, bit 1 to COM1, bit 2 to COM2 and bit 3 to
COM3 of the first segment. Bits 4 through 7 correspond to COM0 to COM3, respectively, of the second segment.
R/W
R/W
R/W
R/W
Care should be taken when writing to LCD_SEG locations since some of them control
DIO pins.
LCD_SEG32, LCD_SEG42, LCD_SEG48, LCD_SEG51 through LCD_SEG59, LCD_SEG62,
LCD_SEG66, and LCD_SEG72 through LCD_SEG75 are only applicable to the 71M6534.
R/W
R/W
R/W
R/W
R/W
R/W
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
LCD_SEG63[3:0]
…
LCD_SEG65[3:0]
LCD_SEG66[3:0]*
LCD_SEG67[3:0]
…
LCD_SEG71[3:0]
LCD_SEG72[3:0]*
…
LCD_SEG75[3:0]*
LCD_Y
2045[7:4]
…
2047[7:4]
2048[7:4]
2049[7:4]
…
204D[7:4]
204E[7:4]
…
2051[7:4]
2021[6]
0
…
0
0
0
…
0
0
…
0
0
L
…
L
L
L
…
L
L
…
L
L
M26MHZ
M40MHZ
2005[4]
2005[0]
0
0
0
0
R/W
R/W
R/W
LCD Segment Data continued.
R/W
R/W
R/W
R/W
LCD Blink Frequency (ignored if blink is disabled or if the segment is off).
0 = 1 Hz (500 ms ON, 500 ms OFF)
1 = 0.5 Hz (1 s ON, 1 s OFF)
M26MHZ and M40MHZ set the master clock (MCK) frequency. These bits are reset on
chip reset and may only be set. Attempts to write zeroes to M40MHZ and M26MHZ are
ignored.
M40MHZ
0
0
1
1
MPU_DIV[2:0]
2004[2:0]
0
0
R/W
M26MHZ
0
1
0
1
The MPU clock divider (from MCK). These bits may be programmed by MPU without
risk of losing control.
MPU_DIV[2:0]
000
001
010
011
100
101
110
111
MUX_ALT
v1.1
2005[2]
0
0
R/W
MCK Frequency
20 MHz
26.7 MHz
40 MHz
40 MHz
Resulting Clock Frequency
MCK/4
MCK/8
MCK/16
MCK/32
MCK/64
MCK/128
MCK/265
MCK/265
The MPU asserts this bit when it wishes the MUX to perform ADC conversions on an
alternate set of inputs.
If CHOP_E is 00, MUX_ALT is automatically asserted once per sum cycle, when
XFER_BUSY falls.
© 2007-2009 TERIDIAN Semiconductor Corporation
85
71M6533/71M6534 Data Sheet
MUX_DIV[3:0]
MUX_SYNC_E
OPT_FDC[1:0]
209D[3:0]
2020[7]
2007[1:0]
FDS_6533_6534_004
0
0
0
0
0
0
R/W
R/W
R/W
The number of states in the input multiplexer.
When set, SEG7 outputs MUX_SYNC. Otherwise, SEG7 is an LCD pin.
Selects the modulation duty cycle for OPT_TX.
OPT_FDC[1:0]
00
01
10
11
OPT_RXDIS
2008[5]
0
0
R/W
OPT_RXINV
2008[4]
0
0
R/W
OPT_TXE[1:0]
2007[7:6]
00
00
R/W
Configures OPT_RX to an analog input to the optical UART comparator or as a digital
input/output, DIO1.
0 = OPT_RX, 1 = DIO1.
Inverts the result from the OPT_RX comparator when 1. Affects only the UART input.
Has no effect when OPT_RX is used as a DIO input.
Configures the OPT_TX output pin.
OPT_TXE[1:0]
00
01
10
11
OPT_TXINV
OPT_TXMOD
2008[0]
2008[1]
PLL_OK
2003[6]
PLS_MAXWIDTH 2080[7:0]
[7:0]
0
0
0
0
R/W
R/W
0
FF
0
FF
R
R/W
PLS_INTERVAL
[7:0]
2081[7:0]
0
0
R/W
PLS_INV
2004[6]
0
0
R/W
PREBOOT
SFRB2[7]
–
–
R
86
Function
50% Low
25% Low
12.5% Low
6.25% Low
Function
OPT_TX
DIO2
WPULSE
RPULSE
Inverts OPT_TX when 1. This inversion occurs before modulation.
Enables modulation of OPT_TX. When OPT_TXMOD is set, OPT_TX is modulated
when it would otherwise have been zero. The modulation is applied after any inversion caused by OPT_TXINV.
Indicates that system power is present and the clock generation PLL is settled.
Determines the maximum width of the pulse (low going pulse).
The maximum pulse width is (2*PLS_MAXWIDTH + 1)*TI. Where TI is PLS_INTERVAL.
If PLS_INTERVAL = 0, TI is the sample time (397 µs). If set to 255, pulse width control
is disabled and pulses are output with a 50% duty cycle.
For PULSE_W and PULSE_V only, if the FIFO is used, PLS_INTERVAL must be set to
81. If PLS_INTERVAL = 0, the FIFO is not used and pulses are output as soon as the
CE issues them.
Inverts the polarity of the pulse outputs Normally, these pulses are active low. When
inverted, they become active high.
Indicates that the preboot sequence is active.
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
201C[2:0]
201D[7:0]
201E[7:2]
4
0
0
4
0
0
R/W
R/W
R/W
PRE_SAMPS[1:0] 2001[7:6]
0
0
R/W
PREG[16:0]
RTC adjust. See Section 1.4.3 Real-Time Clock (RTC) for additional details.
0x0FFBF ≤ PREG ≤ 0x10040
PREG[16:0] and QREG[1:0] are separate in hardware but can be programmed with a
single number calculated by the MPU.
The duration of the pre-summer, in samples.
PRE_SAMPS[1:0]
00
01
10
11
QREG[1:0]
RST_SUBSEC
RTCA_ADJ[6:0]
RTC_SEC[5:0
RTC_MIN[5:0]
RTC_HR[4:0]
RTC_DAY[2:0]
RTC_DATE[4:0]
RTC_MO[3:0]
RTC_YR[7:0]
201E[1:0]
2010[0]
2011[6:0]
2015
2016
2017
2018
2019
201A
201B
0
0
40
*
*
*
*
*
*
*
0
0
–
NV
NV
NV
NV
NV
NV
NV
R/W
R/W
R/W
R/W
RTM_E
RTM0[7:0]
2002[3]
2060[9:8]
2061[7:0]
2062[9:8]
2063[7:0]
2064[9:8]
2064[7:0]
2065[9:8]
2066[7:0]
SFRB2[6]
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
R/W
R/W
0
–
R/W
RTM1[7:0]
RTM2[7:0]
RTM3[7:0]
SECURE
v1.1
Pre-Summer Duration
42
50
84
100
RTC adjust. See Section 1.4.3 Real-Time Clock (RTC) for additional details.
The sub-second counter is restarted when a 1 is written to this bit.
Analog RTC adjust. See Section 1.4.3 Real-Time Clock (RTC) for additional details.
These are the year, month, day, hour, minute and second parameters of the RTC.
Writing to these registers sets the time. Each write to one of these registers must be
preceded by a write to 0x201F (WE). Valid values for each parameter are:
SEC: 00 to 59, MIN: 00 to 59, HR: 00 to 23 (00 = Midnight)
DAY: 01 to 07 (01 = Sunday), DATE: 01 to 31, MO: 01 to 12
YR: 00 to 99 (00 and all others divisible by 4 are leap years)
Values in the RTC registers are undefined when the IC powers up without a battery but
are maintained through mission and battery modes when a sufficient voltage is maintained at the VBAT pin. Write operations to these registers are delayed by one
second.
* no change of value at reset if voltage at VBAT is within specification.
Real Time Monitor enable (RTM). When 0, the RTM output is low.
The four RTM probes. Before each CE code pass, the values of these registers are
serially output on the RTM pin. The RTM registers are ignored when RTM_E = 0.
When set, enables security provisions that prevent external reading of flash memory
and CE program RAM (zeros will be returned if the memory is read). It should be set
while PREBOOT is set. This bit is cleared when the flash is mass-erased and on chip
reset. The bit may only be set, attempts to write zero are ignored.
© 2007-2009 TERIDIAN Semiconductor Corporation
87
71M6533/71M6534 Data Sheet
FDS_6533_6534_004
SLEEP
20A9[6]
0
0
W
SEL_IAN
SEL_IBN
SEL_ICN
SEL_IDN
SLOT0_SEL[3:0]
SLOT1_SEL[3:0]
…
SLOT8_SEL[3:0]
SLOT9_SEL[3:0]
SLOT0_ALTSEL
[3:0]
SLOT1_ALTSEL
[3:0]
SLOT2_ALTSEL
[3:0]
…
SLOT8_ALTSEL
[3:0]
SLOT9_ALTSEL
[3:0]
SP_ADDR[15:8]
SP_ADDR[7:0]
SP_CMD
SPE
SPI_FLAG
20AC[1]
20AC[5]
20AD[1]
20AD[5]
2090[3:0]
2090[7:4]
0
0
0
0
0
1
…
8
9
10
R/W
2094[3:0]
2094[7:4]
2096[3:0]
0
0
0
0
0
1
…
8
9
10
2096[7:4]
1
1
2097[3:0]
11
11
…
209A[3:0]
…
8
…
8
209A[7:4]
9
9
2072[7:0]
2073[7:0]
2071
2070[7]
20B1[4]
–
–
–
0
–
0
SUBSEC[7:0]
2014[7:0]
–
–
R
SUM_CYCLES[5:0] 2001[5:0]
TMUX[4:0]
20AA[4:0]
0
2
0
–
R/W
R/W
88
Puts the 71M6533/71M6534 into SLEEP mode. This bit is ignored if system power is
present. The 71M6533 and 71M6534 will wake when the autowake timer times out,
when the push button is pushed, when system power returns or when RESET goes
high.
When set to 1, selects differential mode for the corresponding current input (IA, IB, IC,
or ID). When 0, the input remains single-ended.
R/W
Primary multiplexer frame analog input selection. These bits map the selected input,
0-9 to the multiplexer state. The ADC output is always written to the memory location
corresponding to the input, regardless of which multiplexer state an input is mapped to
(see Section 1.2 Analog Front End (AFE)).
R/W
Alternate multiplexer frame analog input selection. Maps the selected input, 0-11, to
the multiplexer state.
The additional inputs, 10 and 11 in the alternate frame are:
10 = TEMP
11 = VBAT
R
R
R
R/W
R/W
SPI Address. 16-bit address from the bus master.
SPI command. 8-bit command from the bus master.
SPI port enable. Enables the SPI interface on pins SEG3 through SEG5.
SPI interrupt flag. The flag is set by the hardware and is cleared by the firmware writing a 0. Firmware using this interrupt should clear the spurious interrupt indication during initialization.
The remaining count, in terms of 1/256 RTC cycles, to the next one second boundary.
SUBSEC may be read by the MPU after the one second interrupt and before reaching
the next one second boundary. Setting RST_SUBSEC will clear SUBSEC.
The number of pre-summer outputs summed in the final summer.
Selects one of 32 signals for TMUXOUT. For details, see Section 1.4.13 Test Ports
(TMUXOUT Pin).
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
TRIMSEL[3:0]
20FD[3:0]
71M6533/71M6534 Data Sheet
0
0
R/W
Selects the temperature trim fuse to be read with the TRIM register:
TRIMSEL[3:0]
1
4
5
6
TRIM[7:0]
20FF
0
0
R/W
UMUX_E*
200F[7]
0
0
R/W
UMUX_SEL*
S00F[6]
0
0
R/W
VB_REF
2005[6]
0
0
R/W
VDDREGZ
2005[7]
0
0
R/W
VERSION[7:0]
2006
20C8
–
–
–
–
R
R
2004[7]
2004[3]
20A9[7]
WAKE_PRD
20A9[2:0]
WAKE_RES
WD_NROVF_
FLAG
WD_RST
v1.1
0
0
0
0
0
–
R/W
R/W
W
001
–
R/W
20A9[3]
20B1[0]
0
–
–
0
R/W
R/W
SFR F8[7]
0
0
W
Purpose
Trim for the magnitude of VREF
Trim values related to temperature compensation
Contains TRIMBGA,TRIMBGB or TRIMM[2:0] depending on the value written to
TRIMSEL[3:0]. If TRIMBGB = 0, the device is a 71M6533/71M6534, else it is a
71M6533H/71M6534H.
Enables the optical UART multiplexer, selects the alternate function (MTX, MRX) for
DIO8, DIO9.
When UMUX_E = 1, selects between OPT_TX, OPT_RX and MTX, MRX as the optical
UART I/O pins. 0 = OPT_TX, OPT_RX, 1 = MTX, MRX
Configures the ADC so that VB is the zero reference.
When zero, changes the input reference of the ADC to V3P3A for the IA, IB, VA and
VB inputs. Otherwise, the reference is VBIAS.
The device version index. This word may be read by the firmware to determine the
silicon version.
VERSION[7:0]
0000 0101
VREF_CAL
VREF_DIS
WAKE_ARM
Trim Fuse
TRIMT[7:0]
TRIMM[2:0]
TRIMBGA
TRIMBGB
Silicon Version
A05
Brings VREF to the VREF pad. This feature is disabled when VREF_DIS =1.
Disables the internal voltage reference.
Writing a 1 to this bit arms the autowake timer and presets it with the values presently
in WAKE_PRD and WAKE_RES. The autowake timer is reset and disarmed whenever
the processor is in MISSION mode or BROWNOUT mode. The timer must be armed
at least three RTC cycles before the SLEEP or LCD-ONLY mode is commanded.
Sleep time. Time = WAKE_PRD[2:0]*WAKE_RES. The default = 001. The maximum
value is 7.
Resolution of WAKE timer: 1 = 1 minute, 0 = 2.5 seconds.
This flag is set approximately 1 ms before the watchdog timer overflows. It is cleared
by writing a 0 or on the falling edge of WAKE.
WD timer bit. This bit must be accessed with byte operations. Operations possible for
this bit are:
Write 0: Clears the flag.
Write 1: Resets the WDT.
© 2007-2009 TERIDIAN Semiconductor Corporation
89
71M6533/71M6534 Data Sheet
FDS_6533_6534_004
WD_OVF
2002[2]
0
0
WE
WRPROT_BT
WRPROT_CE
201F[7:0]
SFR B2[5]
SFR B2[4]
0
0
0
0
90
R/W
W
The WD overflow status bit. This bit is set when the WD timer overflows. It is powered
by the nonvolatile supply and at bootup will indicate if the part is recovering from a WD
overflow or a power fault. This bit should be cleared by the MPU on bootup. It is also
automatically cleared when RESET is high.
An 8-bit value has to be written to this address prior to accessing the RTC registers.
When set, this bit protects flash addresses from 0 to BOOT_SIZE*1024 from flash page erase.
When set, this bit protects flash addresses from CE_LCTN*1024 to the end of memory
from flash page erase.
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
4.3
71M6533/71M6534 Data Sheet
CE Interface Description
4.3.1
CE Program
The CE performs the precision computations necessary to accurately measure power. These computations include offset cancellation, phase compensation, product smoothing, product summation, frequency
detection, VAR calculation, sag detection and voltage phase measurement. All data computed by the CE
is dependent on the selected meter equation as given by EQU (in I/O RAM). As a function of EQU, the
element components V0 through I2 take on different meanings.
The CE program is supplied by Teridian as a data image that can be merged with the MPU operational
code for meter applications. Typically, the CE program covers most applications and does not need to be
modified. Other variations of CE code may be available from TERIDIAN. The description in this section
applies to CE code revision CE34A02D, which functions for both the 71M6533 and the 71M6534. This
version of the CE code does not process the ID current channel. CE codes capable of calculating and
measuring the ID channel are available from Teridian.
4.3.2
CE Data Format
All CE words are 4 bytes. Unless specified otherwise, they are in 32-bit two’s complement format
(-1 = 0xFFFFFFFF). Calibration parameters are defined in flash memory (or external EEPROM) and
must be copied to CE data memory by the MPU before enabling the CE. Internal variables are used in
internal CE calculations. Input variables allow the MPU to control the behavior of the CE code. Output
variables are outputs of the CE calculations. The corresponding MPU address for the most significant
byte is given by 0x0000 + 4 x CE_address and by 0x0003 + 4 x CE_address for the least significant byte.
4.3.3
Constants
Constants used in the CE Data Memory tables are:
•
•
•
•
•
•
•
•
•
Sampling Frequency: FS = 32768 Hz/13 = 2520.62 Hz.
F0 is the fundamental frequency of the mains phases.
IMAX is the external rms current corresponding to 250 mV pk at the inputs IA, IB and IC.
VMAX is the external rms voltage corresponding to 250 mV pk at the VA, VB and VC inputs.
NACC, the accumulation count for energy measurements is PRE_SAMPS*SUM_CYCLES. This value
also resides in SUM_PRE (CE address 0x23) where it is used for phase angle measurement.
The duration of the accumulation interval for energy measurements is PRE_SAMPS*SUM_CYCLES/FS.
ln_8 is a gain constant of the current channel, n. Its value is 8 or 1 and is controlled by In_SHUNT.
X is a gain constant of the pulse generators. Its value is determined by PULSE_FAST and PULSE_SLOW.
Voltage LSB for sag detection = VMAX * 7.879810-9 V.
The system constants IMAX and VMAX are used by the MPU to convert internal digital quantities (as used
by the CE) to external, i.e. metering quantities. Their values are determined by the scaling of the voltage
and current sensors used in an actual meter. The LSB values used in this document relate digital quantities at the CE or MPU interface to external meter input quantities. For example, if a SAG threshold of 80
V peak is desired at the meter input, the digital value that should be programmed into SAG_THR would be
80 V/SAG_THRLSB, where SAG_THRLSB is the LSB value in the description of SAG_THR.
The parameters EQU, CE_E, PRE_SAMPS, and SUM_CYCLES essential to the function of the CE are stored
in I/O RAM (see Section 4.2 I/O RAM Description – Alphabetical Order).
v1.1
© 2007-2009 TERIDIAN Semiconductor Corporation
91
71M6533/71M6534 Data Sheet
4.3.4
FDS_6533_6534_004
Environment
Before starting the CE using the CE_E bit, the MPU has to establish the proper environment for the CE by
implementing the following steps:
•
•
•
•
•
•
Load the CE data into RAM.
Establish the equation to be applied in EQU.
Establish the accumulation period and number of samples in PRE_SAMPS and SUM_CYCLES.
Establish the number of cycles per ADC multiplexer frame (MUX_DIV).
Apply proper values to SLOTn_SEL and SLOTn_ALTSEL.
Initialize any MPU interrupts, such as CE_BUSY, XFER_BUSY, or a power failure detection interrupt.
Typically, there are thirteen 32768 Hz cycles per ADC multiplexer frame (see Figure 18 in the System
Timing Summary section). This means that the product of the number of cycles per frame and the number of conversions per frame must be 12 (allowing for one settling cycle). The default configuration is
FIR_LEN = 0 (two cycles per conversion) and MUX_DIV = 6 (6 conversions per mux cycle).
4.3.5
CE Calculations
Table 48: CE EQU Equations and Element Input Mapping
EQU
0*
1*
2*
3*
4*
5
Watt & VAR Formula
(WSUM/VARSUM)
W0SUM/
VAR0SUM
W1SUM/
VAR1SUM
VA IA
VA*IA
–
(1 element, 2W 1φ)
VA*(IA-IB)/2
VA*(IA-IB)/2
–
(1 element, 3W 1φ)
VA*IA + VB*IB
VA*IA
VB*IB
(2 element, 3W 3φ Delta)
VA*(IA-IB)/2 + VC*IC
VA*(IA-IB)/2
–
(2 element, 4W 3φ Delta)
VA*(IA-IB)/2 + VB*(IC-IB)/2
VA*(IA-IB)/2 VB*(IC-IB)/2
(2 element, 4W 3φ Wye)
VA*IA + VB*IB + VC*IC
(3 element, 4W 3φ Wye)
VA*IA
VB*IB
W2SUM/
VAR2SUM
I0SQ
SUM
I1SQ
SUM
I2SQ
SUM
–
IA
–
–
–
IA-IB
IB
–
–
IA
IB
–
VC*IC
IA-IB
IB
IC
–
IA-IB
IC-IB
IC
VC*IC
IA
IB
IC
* Only EQU = 5 is supported by CE code version CE34A02D.
4.3.6
CE Front End Data (Raw Data)
Access to the raw data provided by the AFE is possible by reading addresses 0 through B shown in
Table 49.
Table 49: CE Raw Data Access Locations
Name
92
Address
MPU
0x00
IA FIR data
CE
0x00
Type
Input
VA FIR data
0x01
0x04
Input
IB FIR data
VB FIR data
IC FIR data
VC FIR data
ID FIR data
0x02
0x03
0x04
0x05
0x06
0x08
0x0C
0x10
0x14
0x18
Input
Input
Input
Input
Input
Description
ADC Input data, valid at the end of the
MUX frame. The address mapping of analog inputs to memory is hard-wired in the
ADC converter circuit.
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
Name
CE
0x0A
0x0B
TEMP FIR data
VBAT FIR data
…
Chip ID, Version bytes
…
Last Address
4.3.7
71M6533/71M6534 Data Sheet
Address
MPU
0x28
0x2C
…
Type
Input
Input
Internal
0x0F
003C
Read
Only
0x3FF
…
0xFFC
Internal
Internal
Description
…
Upper 16 bits are zero. Lower 16 bits are
CHIP_ID[15:8], VERSION[7:0]. This word is
read only.
…
Last Memory Location
CE Status and Control
The CE Status Word is useful for generating early warnings to the MPU (Table 50). It contains sag warnings for phase A, B, and C, as well as F0, the derived clock operating at the fundamental input frequency.
The MPU can read the CE status word at every CE_BUSY interrupt. Since the CE_BUSY interrupt occurs at 2520.6 Hz, it is desirable to minimize the computation required in the interrupt handler of the MPU.
Table 50: CESTATUS Register
CE Address
0x80
Name
CESTATUS
Description
See description of CESTATUS bits in Table 51.
CESTATUS provides information about the status of voltage and input AC signal frequency, which are useful for generating an early power fail warning to initiate necessary data storage. CESTATUS represents
the status flags for the preceding CE code pass (CE_BUSY interrupt). The significance of the bits in
CESTATUS is shown in Table 51.
Table 51: CESTATUS Bit Definitions
CESTATUS
[bit]
31:29
28
27
Not Used
F0
SAG_C
26
SAG_B
25
SAG_A
24:0
Not Used
Name
Description
These unused bits will always be zero.
F0 is a square wave at the exact fundamental input frequency.
Normally zero. Becomes one when |VC| remains below SAG_THR for
SAGCNT samples. Will not return to zero until |VC| rises above SAG_THR.
Normally zero. Becomes one when VB remains below SAG_THR for
SAG_CNT samples. Will not return to zero until VB rises above SAG_THR.
Normally zero. Becomes one when VA remains below SAG_THR for
SAG_CNT samples. Will not return to zero until VA rises above SAG_THR.
These unused bits will always be zero.
The CE is initialized by the MPU using CECONFIG (Table 52). This register contains in packed form
SAG_CNT, FREQSEL0, FREQSEL1, EXT_PULSE, I0_SHUNT, I1_SHUNT, PULSE_SLOW, and PULSE_FAST.
The CECONFIG bit definitions are given in Table 53.
Table 52: CECONFIG Register
CE Address
Name
Data
0x20
CECONFIG
0x5020
Description
See description of the CECONFIG bits in Table 53.
The SAG_MASKn bits enable sag detection for the respective phase when set to 1. When SAG_INT is set
to 1, a sag event will generate a transition on the YPULSE output.
v1.1
© 2007-2009 TERIDIAN Semiconductor Corporation
93
71M6533/71M6534 Data Sheet
FDS_6533_6534_004
The EXT_TEMP bit enables temperature compensation by the MPU, when set to 1. When 0, internal (CE)
temperature compensation is enabled.
I0_SHUNT, I1_SHUNT and I2_SHUNT can configure their respective current inputs to accept shunt resistor
sensors. In this case the CE provides an additional gain of 8 to the selected current input. WRATE may
need to be adjusted based on the values In_SHUNT.
The CE pulse generator can be controlled by either the MPU (external) or CE (internal) variables. Control is by
the MPU if EXT_PULSE = 1. In this case, the MPU controls the pulse rate by placing values into APULSEW
and APULSER. By setting EXT_PULSE = 0, the CE controls the pulse rate based on WSUM and VARSUM.
The 71M6533 Demo Code creep function halts both internal and external pulse generation.
Table 53: CECONFIG Bit Definitions
CECONFIG
[bit]
[20]
[19]
[18]
[17]
Name
Default
SAG_MASK2
SAG_MASK1
SAG_MASK0
SAG_INT
0
0
0
0
[16]
EXT_TEMP
0
[15:8]
SAG_CNT
80
(0x50)
[7]
FREQSEL1
0
[6]
FREQSEL0
0
[5]
EXT_PULSE
1
[4]
IC_SHUNT
0
[3]
[2]
[1]
IB_SHUNT
IA_SHUNT
PULSE_FAST
0
0
0
94
Description
When 1, enables sag interrupt based on phase C.
When 1, enables sag interrupt based on phase B.
When 1, enables sag interrupt based on phase A.
When 1, activates YPULSE/DIO8 output when a sag is detected (see also 1.4.7).
When 1, enables temperature compensation by the MPU.
When 0, internal (CE) temperature compensation is enabled.
The number of consecutive voltage samples below SAG_THR
before a sag alarm is declared. The maximum value is 255.
SAG_THR is at address 0x24.
The combination of FREQSEL1 and FEQSEL2 selects the
phase to be used for the frequency monitor, the phase-tophase lag calculation and for the zero crossing counter
(MAINEDGE_X).
Phases Used for Voltage
FREQ FREQ Phase
Phase Lag Calculation
SEL1
SEL0
Selected
PH_AtoB_X
PH_AtoC_X
0
0
A
A-B
A-C
0
1
B
B-C
B-A
1
0
C
C-A
C-B
1
1
Not allowed
When zero, causes the pulse generators to respond to internal
data (WPULSE = WSUM_X, RPULSE = VARSUM_X,
XPULSE = WSUM_X). Otherwise, the generators respond to
values the MPU places in APULSEW and APULSER.
When 1, the current gain of channel C is increased by 8. The
gain factor controlled by In_SHUNT is referred to as In_8
throughout this document.
When 1, the current gain of channel B is increased by 8.
When 1, the current gain of channel A is increased by 8.
When PULSE_FAST = 1, the pulse generator input is increased
16x. When PULSE_SLOW = 1, the pulse generator input is
reduced by a factor of 64. These two parameters control the
pulse gain factor X (see table below). Allowed values are ei-
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
PULSE_SLOW
[0]
ther 1 or 0. Default is 0 for both (X = 6).
PULSE_SLOW PULSE_FAST
X
0
0
1.5 * 22 = 6
0
1
1.5 * 26 = 96
1
0
1.5 * 2-4 = 0.09375
1
1
Do not use
0
Table 54: Sag Threshold and Gain Adjust Control
CE Address
Name
Default
Description
0x24
SAG_THR
2.39*107
0x40
GAIN_ADJ
16384
The voltage threshold for sag warnings. The default value is
equivalent to 80 V RMS if VMAX = 600 V.
This register scales all voltage and current channels. The
default value is equivalent to unity gain (1.000).
4.3.8
CE Transfer Variables
When the MPU receives the XFER_BUSY interrupt, it knows that fresh data is available in the transfer
variables. CE transfer variables are modified during the CE code pass that ends with an XFER_BUSY
interrupt. They remain constant throughout each accumulation interval. In this data sheet, the names of
CE transfer variables always end with _X. The transfer variables can be categorized as:
1. Fundamental energy measurement variables
2. Instantaneous (RMS) values
3. Other measurement parameters
Fundamental Energy Measurement Variables
Table 55 describes each transfer variable for fundamental energy measurement. All variables are signed
32-bit integers. Accumulated variables such as WSUM are internally scaled so they have at least 2x margin before overflow when the integration time is one second. Additionally, the hardware will not permit
output values to fold back upon overflow.
Table 55: CE Transfer Variables
CE Address
0x85
0x86
0x87
0x88
0x8A
0x8B
0x8C
0x8D
Name
WSUM_X
W0SUM_X
W1SUM_X
W2SUM_X
VARSUM_X
VAR0SUM_X
VAR1SUM_X
VAR2SUM_X
Description
The signed sum: W0SUM_X+W1SUM_X+W2SUM_X.
The sum of Wh samples from each wattmeter element.
LSB = 9.4045*10-13 VMAX IMAX / In_8 Wh.
The signed sum: VAR0SUM_X+VAR1SUM_X+VAR2SUM_X.
The sum of VARh samples from each wattmeter element.
LSB = 9.4045*10-13 VMAX IMAX / In_8 VARh.
WxSUM_X and VARSUM_X are the signed sum of Phase-A, Phase-B and Phase-C Wh or VARh values
according to the metering equation specified in the I/O RAM register EQU. WxSUM_X is the Wh value
accumulated for phase x in the last accumulation interval and can be computed based on the specified
LSB value.
For example, with VMAX = 600 V and IMAX = 208 A, the LSB for WxSUM_X is 0.1173 µWh.
v1.1
© 2007-2009 TERIDIAN Semiconductor Corporation
95
71M6533/71M6534 Data Sheet
FDS_6533_6534_004
Instantaneous Energy Measurement Variables
IxSQSUM_X and VxSQSUM are the squared current and voltage samples acquired during the last accumulation interval. INSQSUM_X can be used for computing the neutral current.
Table 56: CE Energy Measurement Variables
CE Address
0x8F
0x90
0x91
Name
Description
I0SQSUM_X
I1SQSUM_X
I2SQSUM_X
The sum of squared current samples from each element.
LSBI = 9.4045*10-13 IMAX2 / In_82 A2h
The sum of squared current samples from the calculated neutral:
0x92
INSQSUM_X
∑ (I
0
+ I1 + I 2 ) 2
LSB=9.4045*10-13 IMAX2 / In_82 A2h
0x99
0x9A
0x9B
0x9C
0x93
0x94
0x95
I0SQRES_X
I1SQRES_X
I2SQRES_X
INSQRES_X
V0SQSUM_X
V1SQSUM_X
V2SQSUM_X
Residual current measurements with double-precision accuracy. The
exact current is:
ISQn = InSQSUM_X + InSQRES_X
The sum of squared voltage samples from each element.
LSBV= 9.4045*10-13 VMAX2 V2h
The RMS values can be computed by the MPU from the squared current and voltage samples as follows:
Ix RMS =
IxSQSUM ⋅ LSBI ⋅ 3600 ⋅ FS
N ACC
Vx RMS =
VxSQSUM ⋅ LSBV ⋅ 3600 ⋅ FS
N ACC
Other Transfer variables include those available for frequency and phase measurement, and those reflecting the count of the zero-crossings of the mains voltage and the battery voltage. These transfer variables are listed in Table 57.
MAINEDGE_X reflects the number of half-cycles accounted for in the last accumulated interval for the AC
signal of the phase specified in the FREQSEL1 and FREQSEL0 registers. MAINEDGE_X is useful for implementing a real-time clock based on the input AC signal.
Table 57: Other Transfer Variables
96
CE Address
Name
0x82
FREQ_X
0x97
PH_AtoB_X
Description
Fundamental frequency: LSB ≡
FS
≈ 0.587 ⋅ 10 −6 Hz
2 32
Voltage phase lag. The selection of the reference phase is based on
FREQSEL1 and FREQSEL0 in the CECONFIG register:
If FREQSEL1/FREQSEL0 select phase A: Phase lag from A to B.
If FREQSEL1/FREQSEL0 select phase B: Phase lag from B to C.
If FREQSEL1/FREQSEL0 select phase C: Phase lag from C to A.
The angle in degrees is (0 to 360): PH_AtoB_X * 360/NACC + 2.4
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
CE Address
0x98
PH_AtoC_X
0x83
MAINEDGE_X
4.3.9
Name
Description
If FREQSEL1/FREQSEL0 select phase A: Phase lag from A to C.
If FREQSEL1/FREQSEL0 select phase B: Phase lag from B to A.
If FREQSEL1/FREQSEL0 select phase C: Phase lag from C to B.
Angle in degrees is (0 to 360): PH_AtoC_X * 360/NACC + 4.8
The number of edge crossings of the selected voltage in the previous
accumulation interval. Edge crossings are either direction and are debounced.
Other Measurement and Control Parameters
Temperature Measurement and Temperature Compensation
Table 58 describes the CE registers supporting temperature measurement and temperature compensation.
Table 58: CE Temperature Registers
CE Address
0x81
0x9D
Name
Default
TEMP_RAW
TEMP_X
N/A
N/A
0x39
DEGSCALE
21755
0x1F
TEMP_NOM
0
0x3A
0x3B
PPMC
PPMC2
0
0
Description
The filtered, unscaled reading from the temperature sensor.
This register contains the difference between the die temperature and the reference/calibration temperature as established in the TEMP_NOM register, measured in 0.1°C.
Scale factor for the temperature calculation. . It is not necessary to use values other than the default value.
This register holds the reference or calibration temperature
vale. At calibration time, the value read in TEMP_RAW must
be written to TEMP_NOM.
Linear temperature correction factor.
Quadratic temperature correction factor.
Pulse Generation
Table 59 describes the CE pulse generation parameters.
The combination of the PULSE_SLOW and PULSE_FAST parameters controls the speed of the pulse rate.
The default values of 0 and 0 will maintain the original pulse rate given by the Kh equation.
WRATE controls the number of pulses that are generated per measured Wh and VARh quantities. The
lower WRATE is the slower the pulse rate for measured energy quantity. The metering constant Kh is derived from WRATE as the amount of energy measured for each pulse. That is, if Kh = 1Wh/pulse, a power
applied to the meter of 120 V and 30 A results in one pulse per second. If the load is 240 V at
150 A, ten pulses per second will be generated.
Control is transferred to the MPU for pulse generation if EXT_PULSE = 1. In this case, the pulse rate is
determined by APULSEW and APULSER. The MPU has to load the source for pulse generation in
APULSEW and APULSER to generate pulses. Irrespective of the EXT_PULSE status, the output pulse rate
controlled by APULSEW and APULSER is implemented by the CE only. By setting EXT_PULSE = 1, the
MPU is providing the source for pulse generation. If EXT_PULSE is 1, W0SUM_X and VAR0SUM_X are the
default pulse generation sources. In this case, creep cannot be controlled since it is an MPU function.
The maximum pulse rate is 3*FS = 7.5 kHz.
PULSE_WIDTH allows adjustment of the pulse width for compatibility with calibration and other external
equipment. The minimum pulse width possible is 66.16µs.
v1.1
© 2007-2009 TERIDIAN Semiconductor Corporation
97
71M6533/71M6534 Data Sheet
FDS_6533_6534_004
The maximum time jitter is1/6 of the MUX cycle period (nominally 67 µs) and is independent of the number of pulses measured. Thus, if the pulse generator is monitored for one second, the peak jitter is 67
ppm. After 10 seconds, the peak jitter is 6.7 ppm. The average jitter is always zero. If it is attempted to
drive either pulse generator faster than its maximum rate, it will simply output at its maximum rate without
exhibiting any rollover characteristics. The actual pulse rate, using WSUM as an example, is:
RATE =
WRATE ⋅ WSUM ⋅ FS ⋅ X
Hz ,
2 46
where FS = sampling frequency (2520.6 Hz), X = Pulse speed factor derived from the CE variables
PULSE_SLOW and PULSE_FAST.
Table 59: CE Pulse Generation Parameters
CE Address
0x21
0x22
0x23
0x41
Name
Default
WRATE
KVAR
SUM_PRE
APULSEW
171
6448
2520
0
0x38
PULSEWIDTH
12
0x42
0x43
0x44
0x45
0x46
0x47
0x48
APULSER
APULSEX
APULSEY
WSUM_ACCUM
VSUM_ACCUM
SUM2_ACCUM
SUM3_ACCUM
0
0
0
0
0
0
0
Description
Kh = VMAX*IMAX*66.1782 / (In_8*WRATE*NACC*X) Wh/pulse.
Scale factor for VAR measurement.
PRE_SAMPS * SUM_CYCLES (NACC)
Wh pulse (WPULSE) generator input to be updated by the MPU
when using external pulse generation. The output pulse rate is:
APULSEW * FS * 2-32 * WRATE * X * 2-14.
This input is buffered and can be updated by the MPU during a
conversion interval. The change will take effect at the beginning of the next interval.
Register for pulse width control of XPULSE and YPULSE. The
maximum pulse width is (2*PULSEWIDTH+1)*(1/FS). The default
value will generate pulses of 10 ms width at FS = 2520.62 Hz.
VARh (RPULSE) pulse generator input.
Pulse generator input for XPULSE output.
Pulse generator input for YPULSE output.
Roll-over accumulator for WPULSE.
Roll-over accumulator for RPULSE.
Roll-over accumulator for the XPULSE pulse output.
Roll-over accumulator for the YPULSE pulse output.
Other CE Parameters
Table 60 shows the CE parameters used for suppression of noise due to scaling and truncation effects.
Table 60: CE Parameters for Noise Suppression and Code Version
CE Address
0x26
0x27
0x28
0x2A
0x2B
0x2C
98
Name
Default
QUANTA
QUANTB
QUANTC
QUANT_VARA
QUANT_VARB
QUANT_VARC
0
0
0
0
0
0
Description
These parameters are added in channel A to the Watt calculation to compensate for input noise and truncation.
LSB = (VMAX*IMAX / In_8) *1.04173*10-9 W
These parameters are added to the VAR calculation for element
A and B to compensate for input noise and truncation.
LSB = (VMAX*IMAX / In_8) * 1.04173*10-9 W
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
0x2E
QUANT_IA
0
0x2F
QUANT_IB
0
0x30
QUANT_IC
0
0x35
0x63653333
0x36
0x61303463
0x37
0x00000000
These parameters are added to compensate for input noise and
truncation in their respective channels in the squaring calculations for I2 and V2.
LSB=VMAX2*5.08656*10-13 V2 and
LSB= (IMAX2/In_82)* 5.08656*10-13 A2
Text strings holding the CE version information as supplied by
the CE data associated with the CE code. For example, the
words 0x63653333 and 0x61303463 form the text string
“ce33a04c”.
These locations are overwritten in operation.
4.3.10 CE Calibration Parameters
Table 61 lists the parameters that are typically entered to effect calibration of meter accuracy.
Table 61: CE Calibration Parameters
CE Address
0x10
0x11
0x12
0x13
0x14
0x15
Name
Default
CAL_IA
CAL_VA
CAL_IB
CAL_VB
CAL_IC
CAL_VC
16384
16384
16384
16384
16384
16384
0x18
PHADJ_A
0
0x19
PHADJ_B
0
0x1A
PHADJ_C
0
Description
These constants control the gain of their respective channels. The
nominal value for each parameter is 214 = 16384. The gain of each
channel is directly proportional to its CAL parameter. Thus, if the
gain of a channel is 1% slow, CAL should be increased by 1%.
These constants control the CT phase compensation. No compensation occurs when PHADJ_X = 0. As PHADJ_X is increased,
more compensation (lag) is introduced. The range is ± 215 – 1. If it
is desired to delay the current by the angle Φ, the equations are:
0.02229 ⋅ TANΦ
at 60Hz
PHADJ _ X = 2 20
0.1487 − 0.0131 ⋅ TANΦ
PHADJ _ X = 2 20
0.0155 ⋅ TANΦ
at 50Hz
0.1241 − 0.009695 ⋅ TANΦ
4.3.11 CE Flow Diagrams
Figure 42 through Figure 44 show the data flow through the CE in simplified form. Functions not shown
include delay compensation, sample interpolation, scaling and the processing of meter equations.
v1.1
© 2007-2009 TERIDIAN Semiconductor Corporation
99
71M6533/71M6534 Data Sheet
multiplexer
FDS_6533_6534_004
de-multiplexer
VREF
IA
VA
IB
VB
IC
VC
ΔΣ
mod
FS=
2520Hz
IA_RAW
VA_RAW
IB_RAW
VB_RAW
IC_RAW
VC_RAW
Decimator
FS=
2520Hz
FCLK=
4.9152MHz
Figure 42: CE Data Flow: Multiplexer and ADC
IA
IA_RAW
OFFSET
NULL
x
x
F0
PHASE
COMP
PHADJ_A
CAL_IA
x
x
LPF
LPF
VA_RAW
W0
VAR0
V0
OFFSET
NULL
x
x
90°
F0
CAL_VA
...other phases
F0
Generator
x
GAIN_ADJ
F0
Figure 43: CE Data Flow: Scaling, Gain Control, Intermediate Variables
100
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
SUM
WA
WB
WC
VARA
VARB
VARC
PRE_SAMPS
IA
IB
IC
VA
VB
VC
F0
Σ
Σ
WASUM_X
WBSUM_X
WCSUM_X
VARASUM_X
VARBSUM_X
VARCSUM_X
MPU
SUM_CYCLES=60 &
PRE_SAMPS = 42
SQUARE
I2
V2
IASQ
IBSQ
ICSQ
VASQ
VBSQ
VCSQ
SUM
Σ
Σ
IASQSUM_X
IBSQSUM_X
ICSQSUM_X
VASQSUM_X
VBSQSUM_X
VCSQSUM_X
F0
Figure 44: CE Data Flow: Squaring and Summation Stages
v1.1
© 2007-2009 TERIDIAN Semiconductor Corporation
101
71M6533/71M6534 Data Sheet
FDS_6533_6534_004
5 Specifications
5.1
Absolute Maximum Ratings
Table 62 shows the absolute maximum ranges for the device. Stresses beyond Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only and functional operation
at these or any other conditions beyond those indicated under recommended operating conditions (Section 5.3) is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect
device reliability. All voltages are with respect to GNDA.
Table 62: Absolute Maximum Ratings
Voltage and Current
Supplies and Ground Pins
V3P3SYS, V3P3A
VBAT
GNDD
Analog Output Pins
V3P3D
VREF
V2P5
Analog Input Pins
IA, VA, IB, VB, IC, VC, V1
XIN, XOUT
All Other Pins
Configured as SEG or COM drivers
Configured as Digital Inputs
Configured as Digital Outputs
−0.5 V to 4.6 V
-0.5 V to 4.6 V
-0.5 V to +0.5 V
-10 mA to 10 mA,
-0.5 V to 4.6 V
-10 mA to +10 mA,
-0.5 V to V3P3A+0.5 V
-10 mA to +10 mA,
-0.5 V to 3.0 V
-10 mA to +10 mA
-0.5 V to V3P3A+0.5 V
-10 mA to +10 mA
-0.5 V to 3.0 V
-1 mA to +1 mA,
-0.5 to V3P3D+0.5
-10 mA to +10 mA,
-0.5 to 6 V
-15 mA to +15 mA,
-0.5 V to V3P3D+0.5 V
All other pins
−0.5 V to V3P3D+0.5 V
Temperature and ESD Stress
Operating junction temperature (peak, 100ms)
Operating junction temperature (continuous)
Storage temperature
140 °C
125 °C
Solder temperature – 10 second duration
ESD stress on all pins
102
© 2007-2009 TERIDIAN Semiconductor Corporation
−45 °C to +165 °C
250 °C
4 kV
v1.1
FDS_6533_6534_004
5.2
71M6533/71M6534 Data Sheet
Recommended External Components
Table 63: Recommended External Components
Name
C1
C2
CSYS
C2P5
XTAL
From
V3P3A
V3P3D
V3P3SYS
V2P5
XIN
To
AGND
DGND
DGND
DGND
XOUT
CXS
XIN
AGND
CXL
XOUT
AGND
Function
Bypass capacitor for 3.3 V supply
Bypass capacitor for 3.3 V output
Bypass capacitor for V3P3SYS
Bypass capacitor for V2P5
32.768 kHz crystal – electrically similar to
ECS .327-12.5-17X or Vishay XT26T,
load capacitance 12.5 pF
Load capacitor for crystal (depends on
crystal specs and board parasitics).
Load capacitor for crystal (depends on
crystal specs and board parasitics).
Value
≥0.1 ±20% †
≥0.1 ±20% †
≥1.0 ±30%
0.1 ±20%
32.768
Unit
µF
µF
µF
µF
kHz
33 ±10%
pF
15 ±10%
pF
Max
3.6
3.6
Unit
V
V
Notes:
1. AGND and DGND should be connected together.
2. V3P3SYS and V3P3A should be connected together.
3. † For accuracy and EMI rejection, C1 + C2 should be 470 µF or higher.
5.3
Recommended Operating Conditions
Table 64: Recommended Operating Conditions
Parameter
V3P3SYS, V3P3A: 3.3 V Supply Voltage
V3P3A and V3P3SYS must be at the
same voltage
VBAT
Operating Temperature
v1.1
Condition
Normal Operation
Battery Backup
Min
3.0
0
Typ
3.3
No Battery
Battery Backup:
BRN and LCD modes
SLEEP mode
Externally Connect to V3P3SYS
3.0
3.8
V
2.0
3.8
V
-40
+85
ºC
© 2007-2009 TERIDIAN Semiconductor Corporation
103
71M6533/71M6534 Data Sheet
5.4
5.4.1
FDS_6533_6534_004
Performance Specifications
Input Logic Levels
Table 65: Input Logic Levels
Parameter
Digital high-level input voltagea, VIH
Digital low-level input voltagea, VIL
Input pull-up current, IIL
E_RXTX, E_ISYNC
E_RST, CKTEST
Other digital inputs
Input pull down current, IIH
ICE_E
RESET
PB
Other digital inputs
a
Condition
Min
2
Typ
Max
0.8
Unit
V
V
0
100
100
1
µA
µA
µA
0
0
100
100
1
1
µA
µA
µA
µA
VIN=0 V, ICE_E=1
10
10
-1
VIN = V3P3D
10
10
-1
-1
In battery powered modes, digital inputs should be below 0.3 V or above 2.5 V to minimize battery current.
5.4.2
Output Logic Levels
Table 66: Output Logic Levels
Parameter
Digital high-level output voltage VOH
Digital low-level output voltage VOL
OPT_TX VOH (V3P3D-OPT_TX)
OPT_TX VOL
5.4.3
Condition
ILOAD = 1 mA
ILOAD = 15 mA
ILOAD = 1 mA
ILOAD = 15 mA
ISOURCE=1 mA
ISINK=20 mA
Min
V3P3D–0.4
V3P3D-0.6
0
Typ
Max
0.4
0.8
0.4
0.7
Unit
V
V
V
V
V
V
Power-Fault Comparator
Table 67: Power-fault Comparator Performance Specifications
Parameter
Offset Voltage: V1-VBIAS
Hysteresis Current: V1
Response Time: V1
WDT Disable Threshold: V1-V3P3A
5.4.4
Condition
Vin = VBIAS – 100 mV
+100 mV overdrive
Min
-20
0.8
10
-400
Typ
37
Max
+15
1.2
100
-10
Unit
mV
μA
μs
mV
Max
+15
1.2
1
Unit
mV
μA
μs
V2 Comparator (71M6534 only)
Table 68: V2 Comparator Performance Specifications
Parameter
Offset Voltage: V2-VBIAS
Hysteresis Current
Response Time
104
Condition
Vin = VBIAS – 100 mV
+100 mV overdrive
Min
-20
0.8
© 2007-2009 TERIDIAN Semiconductor Corporation
Typ
v1.1
FDS_6533_6534_004
5.4.5
71M6533/71M6534 Data Sheet
Battery Monitor
Table 69: Battery Monitor Performance Specifications (BM E= 1)
Parameter
Load Resistor
Condition
[M40MHZ, M26MHZ]
= [00], [10], or [11]
LSB Value
[M40MHZ, M26MHZ]
= [01]
FIR_LEN=0
FIR_LEN=1
FIR_LEN=2
FIR_LEN=0
FIR_LEN=1
FIR_LEN=2
(L=138)
(L=288)
(L=384)
(L=186)
(L=384)
(L=588)
Offset Error
5.4.6
Min
27
(-10%)
(-10%)
-200
Typ
45
-48.7
-5.35
-2.26
-19.8
-2.26
-0.63
0
Max
63
(+10%)
+100
Unit
kΩ
μV
μV
μV
μV
μV
μV
mV
Typ
4.2
Max
5.3
Unit
mA
8.4
9.6
mA
3.5
3.8
mA
+400
nA
10
12
mA
82
112
250
250
µA
µA
11
21
0.7
40
46
1.5
µA
µA
µA
Max
15
45
Unit
Ω
Ω
(+10%)
Supply Current
Table 70: Supply Current Performance Specifications
Parameter
V3P3SYS current (CE off)
V3P3SYS current (CE on)
V3P3A current
VBAT current
Condition
Normal Operation,
V3P3A = V3P3SYS = 3.3 V
CKMPU = 614 kHz
No Flash Memory write
RTM_E=0, ECK_DIS=1,
ADC_E=1, ICE_E=0
V3P3SYS current,
Write Flash
Normal Operation as above, except write Flash at maximum rate,
CE_E = 0, ADC_ E = 0
VBAT current
VBAT=3.6V
BROWNOUT mode
71M6533/6533H
71M6534H
LCD Mode
LCD DAC off
LCD DAC on
SLEEP Mode
5.4.7
Min
-400
V3P3D Switch
Table 71: V3P3D Switch Performance Specifications
Parameter
On resistance – V3P3SYS to V3P3D
On resistance – VBAT to V3P3D
v1.1
Condition
| IV3P3D | ≤ 1 mA
| IV3P3D | ≤ 1 mA
Min
Typ
9
32
© 2007-2009 TERIDIAN Semiconductor Corporation
105
71M6533/71M6534 Data Sheet
5.4.8
FDS_6533_6534_004
2.5 V Voltage Regulator
Unless otherwise specified, the load = 5 mA.
Table 72: 2.5 V Voltage Regulator Performance Specifications
Parameter
Condition
V2P5
V2P5 load regulation
Voltage overhead V3P3SYS-V2P5
Iload = 0
Iload = 0 mA to 5 mA
Iload = 5 mA, reduce V3P3
until V2P5 drops 200 mV
RESET=0, iload=0
PSSR ∆V2P5/∆V3P3
5.4.9
Min
2.3
Typ
2.5
Max
2.7
40
Unit
V
mV
mV
+2
mV/V
460
-2
Low-Power Voltage Regulator
Unless otherwise specified, V3P3SYS = V3P3A = 0, PB=GND (BROWNOUT).
Table 73: Low-Power Voltage Regulator Performance Specifications
Parameter
Condition
V2P5
V2P5 load regulation
ILOAD = 0
ILOAD = 0 mA to 1 mA
ILOAD = 1 mA, reduce VBAT
until REG_LP_OK = 0
ILOAD = 0
VBAT voltage requirement
PSRR ΔV2P5/ΔVBAT
Min
2.3
Typ
2.5
Max
2.7
30
Unit
V
mV
3.0
V
50
mV/V
Max
1
3
Unit
μW
pF
5
5
pF
pF
Typ
Max
0.4
0.7
Unit
V
V
Typ
Max
Unit
+10
%
-50
5.4.10 Crystal Oscillator
Table 74: Crystal Oscillator Performance Specifications
Parameter
Maximum Output Power to Crystal 4
XIN to XOUT Capacitance 1
Capacitance to DGND 1
XIN
XOUT
Condition
Crystal connected
Min
Typ
RTCA_ADJ = 0
5.4.11 Optical Interface
Table 75: Optical Interface Performance Specifications
Parameter
OPT_TX VOH (V3P3D-OPT_TX)
OPT_TX VOL
Condition
ISOURCE =1 mA
ISINK = 20 mA
Min
5.4.12 LCD DAC
Table 76: LCD DAC Performance Specifications
Parameter
Condition
Min
VLCD Voltage
VLCD = V 3P3 ⋅ (1 − 0.059 ⋅ LCD _ DAC ) − 0.019V 1 ≤ LCD_DAC ≤ 7
106
-10
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
5.4.13 LCD Drivers
The information in Table 77 applies to all COM and SEG pins with LCD_DAC[2:0] = 000.
Table 77: LCD Driver Performance Specifications
Parameter
VLC2 Voltage
VLC1 Voltage†,
⅓ bias
½ bias
½ bias, minimum output level
VLC0 Voltage†,
⅓ bias
VLC1 Impedance
VLC0 Impedance
Condition
With respect to VLCDa
Min
-0.1
Typ
Max
+0.1
Unit
V
With respect to 2*VLC2/3
With respect to VLC2/2
-3
-3
+2
+2
1.0
% VLC2
% VLC2
V
With respect to VLC2/3
∆ILOAD = 100 µA (Isink)
∆ILOAD = -100 µA (Isource)
∆ILOAD = 100 µA (Isink)
∆ILOAD = -100 µA (Isource)
-4
+1
15
15
15
15
%
9
9
9
9
kΩ
kΩ
a
VLCD is V3P3SYS in MISSION mode and VBAT in BROWNOUT and LCD modes.
Specified as percentage of VLC2, the maximum LCD voltage.
†
5.4.14 Temperature Sensor
Table 78 shows the performance for the temperature sensor. The LSB values do not include the 8-bit left
shift at CE input.
Table 78: Temperature Sensor Performance Specifications
Parameter
Condition
Nominal relationship: N(T) = Sn*(T-Tn) + Nn, Tn = 25ºC
FIR_LEN=0 (L=138)
[M40MHZ, M26MH] =
FIR_LEN=1
(L=288)
Nominal Sensi[00], [10], or [11]
FIR_LEN=2 (L=384)
tivity (Sn)4
3
FIR_LEN=0 (L=186)
L
S n = −0.00109 ⋅  
[M40MHZ, M26MHZ] =
3
FIR_LEN=1 (L=384)
[01]
FIR_LEN=2 (L=588)
FIR_LEN=0 (L=138)
[M40MHZ, M26MHZ] =
Nominal Offset
FIR_LEN=1 (L=288)
[00], [10], or [11]
(Nn) 4
FIR_LEN=2 (L=384)
3
FIR_LEN=0 (L=186)
L
N n = 0.508 ⋅  
[M40MHZ, M26MHZ] =
FIR_LEN=1 (L=384)
3
[01]
FIR_LEN=2 (L=588)
1†
Tn = 25°C,
Temperature Error
T
= -40ºC to +85ºC
 ( N (T ) − N n ) 
ERR = T − 

Sn


Min
Typ
Max
-106
-964
-2286
-260
-2286
-8207
Unit
LSB/ºC
49447
449446
1065353
LSB
121071
1065353
3825004
-10
+10
ºC
† Temperature error is calculated with the value Nn, which is measured at Tn during meter calibration and
stored in MPU or CE for use in temperature calculations.
v1.1
© 2007-2009 TERIDIAN Semiconductor Corporation
107
71M6533/71M6534 Data Sheet
FDS_6533_6534_004
5.4.15 VREF and VBIAS
Table 79 shows the performance specifications for VREF and VBIAS. Unless otherwise specified,
VREF_DIS = 0.
Table 79: VREF Performance Specifications
Parameter
VREF output voltage, VREF(22)
VREF chop step
VREF power supply sensitivity
ΔVREF / ΔV3P3A
Condition
Ta = 22ºC
V3P3A = 3.0 to 3.6 V
VREF_DIS = 1,
VREF = 1.3 to 1.7 V
CAL =1,
ILOAD = 10 µA, -10 µA
VREF input impedance
VREF output impedance
Min
1.193
Typ
1.195
-1.5
Max
1.197
40
Unit
V
mV
1.5
mV/V
kΩ
100
2.5
VNOM (T ) = VREF (22) + (T − 22)TC1 ⋅ 10 −6 + (T − 22) 2 TC 2 ⋅ 10 −6
VNOM definitiona
kΩ
V
If TRIMBGA and TRIMBGB are available (71M6533H/71M6534H)
γ = 0.1·TRIMBGB - 0.143·(TRIMM+0.5),
Definitions
ξ=
TEMP22 − 500 ⋅ TRIMBGA − 370000
900
,
η = (56.2 – TRIMT)·0.55
VNOM temperature coefficients b
TC1
TC2
VREF(T) deviation from VNOM(T)
VREF (T ) − VNOM (T )
10 6
VNOM (T )
max( T − 22 ,40)
η+ 19γ - 0.065γξ +0.34ξ + 8.0
0.015γ - 0.0013ξ – 0.35
-15
+15
If TRIMBGA and TRIMBGB are not available (71M6533/71M6534)
VNOM temperature coefficients:
TC1
3.18·(52.46-TRIMT)
TC2
-0.444
VREF(T) deviation from VNOM(T)
VREF (T ) − VNOM (T )
10 6
-40
VNOM (T )
max( T − 22 ,40)
a
b
Ta = 25 °C
Ta = -40 °C to 85 °C
(-1%)
(-4%)
1.6
1.6
PPM/ºC
µV/ºC
µV/°C2
+40
PPM/ºC
(+1%)
(+4%)
PPM/
year
V
V
±25
VREF aging
VBIAS Voltage
µV/ºC
µV/ºC2
This relationship describes the nominal behavior of VREF at different temperatures.
TEMP22 is the value read from the temperature sensor at 22°C.
108
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
5.4.16 ADC Converter, V3P3A Referenced
Table 80 shows the performance specifications for the ADC converter, V3P3A referenced. For this data,
FIR_LEN=2, [M40MHZ, M26MHZ]=[00], unless stated otherwise, VREF_DIS=0. LSB values do not include
the 8-bit left shift at the CE input.
Table 80: ADC Converter Performance Specifications
Parameter
Recommended Input Range
(Vin-V3P3A)
Voltage to Current Crosstalk
6
10 *Vcrosstalk
cos(∠Vin − ∠Vcrosstalk )
Vin
THD (First 10 harmonics): 1
250 mV-pk
20 mV-pk
Input Impedance
Temperature coefficient of Input Impedance
LSB size
[M40MHZ,
3
M26MHZ]
=
1.25  3 
VLSB = VREF ⋅
⋅ 
4.75  L  [00], [10], or [11]
L = FIR length
[M40MHZ,
M26MHZ] =
[01]
Digital Full Scale [M40MHZ,
3
M26MHZ] =
 L
 
[00], [10], or [11]
3
 
L = FIR length
[M40MHZ,
M26MHZ] =
[01]
ADC Gain Error vs
%Power Supply Variation
10 6 ∆Nout PK 357nV / VIN
100 ∆V 3P3 A / 3.3
Input Offset (Vin-V3P3A)
v1.1
Condition
Min
-250
Vin = 200 mV peak,
65 Hz, on VA.
Vcrosstalk = largest
measurement on IA or IB
Vin=65 Hz,
64 kpts FFT, BlackmanHarris window
At 65 Hz
Max
250
Unit
mV
peak
-10
10
μV/V
40
-75
-90
90
dB
dB
kΩ
At 65 Hz
FIR_LEN=0
FIR_LEN=1
FIR_LEN=2
FIR_LEN=0
FIR_LEN=1
FIR_LEN=2
FIR_LEN=0
FIR_LEN=1
FIR_LEN=2
FIR_LEN=0
FIR_LEN=1
FIR_LEN=2
Vin=200 mV pk, 65 Hz
V3P3A=3.0 V, 3.6 V
Typ
1.7
Ω/°C
3231
355
150
1319
150
42
± 97336
± 884736
± 2097152
± 238328
± 2097152
± 7529536
nV/LSB
-10
© 2007-2009 TERIDIAN Semiconductor Corporation
nV/LSB
LSB
LSB
50
PPM /
%
10
mV
109
71M6533/71M6534 Data Sheet
5.5
5.5.1
FDS_6533_6534_004
Timing Specifications
Flash Memory
Table 81: Flash Memory Timing Specifications
Parameter
Flash Read Pulse Width
Condition
V3P3A = V3P3SYS = 0
(BROWNOUT Mode)
Flash write cycles
Flash data retention
Flash data retention
Flash byte writes between page or
mass erase operations
Write Time per Byte
Page Erase (1024 bytes)
Mass Erase
-40°C to +85°C
25°C
85°C
5.5.2
Min
30
Typ
Max
100
Unit
ns
2
Cycles
Years
Years
Cycles
42
20
200
µs
ms
ms
Max
Unit
kHz
20,000
100
10
EEPROM Interface
Table 82: EEPROM Interface Timing
Parameter
Write Clock frequency (I2C)
Write Clock frequency (3-wire)
5.5.3
Condition
CKMPU = 4.9 MHz,
Using interrupts
CKMPU = 4.9 MHz,
bit-banging DIO4/5
CKMPU=4.9 MHz
Min
Typ
78
150
kHz
500
kHz
RESET
Table 83: RESET Timing
Parameter
Reset pulse width
Reset pulse fall time
5.5.4
Condition
Min
5
Typ
Max
1
Unit
µs
µs
Max
2255
Unit
year
RTC
Table 84: RTC Range for Date
Parameter
Range for date
110
Condition
Min
2000
© 2007-2009 TERIDIAN Semiconductor Corporation
Typ
-
v1.1
FDS_6533_6534_004
5.5.5
71M6533/71M6534 Data Sheet
SPI Slave Port (MISSION Mode)
Table 85: SPI Slave Port (MISSION Mode) Timing
tSPISCK
Parameter
PCLK cycle time
Enable lead time
Enable lag time
PCLK pulse width:
High
Low
PCSZ to first PCLK fall
tSPIDIS
tSPIEV
tSPISU
tSPIH
Disable time
PCLK to Data Out
Data input setup time
Data input hold time
tSPIcyc
tSPILead
tSPILag
tSPIW
Condition
Min
1
15
0
Ignore if PCLK is low
when PCSZ falls.
Typ
Max
Unit
µs
ns
ns
40
40
2
ns
ns
ns
0
ns
ns
ns
ns
15
10
5
PCSZ
tSPILead
tSPILag
tSPIcyc
PCLK
PSDO
tSPISCK
tSPIW
tSPIEV
tSPIW
LSB OUT
MSB OUT
tSPIDIS
tSPIH
PSDI
MSB IN
LSB IN
Figure 45: SPI Slave Port (MISSION Mode) Timing
5.5.5.1 Electrical Specification Footnotes
1. This spec will be guaranteed and verified in production samples, but will not be measured in production.
2. This spec will be guaranteed and verified in production samples, but will be measured in production
only at DC.
3. This spec will be measured in production at the limits of the specified operating temperature.
4. This spec defines a nominal relationship rather than a measured parameter. Correct circuit operation
will be verified with other specs that use this nominal relationship as a reference.
v1.1
© 2007-2009 TERIDIAN Semiconductor Corporation
111
71M6533/71M6534 Data Sheet
5.6
FDS_6533_6534_004
Typical Performance Data
5.6.1
Accuracy over Current
Figure 46 shows meter accuracy over current for various line frequencies. Figure 47 shows meter accuracy over current at various load angles.
6533/34 Wh Performance, Equation 5, 45 Hz, 55 Hz, 65 Hz - 240 V - 0° Phase
Angle
0.5
0.4
0.3
45 Hz
55 Hz
0.2
65 Hz
% Error
0.1
0
-0.1
-0.2
-0.3
-0.4
-0.5
0.1
1
10
100
1000
Current (A rms)
Figure 46: Wh Accuracy (0.1 A - 200 A, 240 V, Room Temperature) at Various Frequencies (Differential Mode, CTs)
71M6533/6534 Wh Accuracy at Various Phase Angles
Equation 5, 240 V
1
0.8
0°
60°
300°
0.6
Error (%)
0.4
0.2
0
-0.2
-0.4
-0.6
-0.8
I [A]
-1
0.01
0.1
1
10
100
Figure 47: Typical Wh Accuracy (0.02 A - 200 A, 240 V, Room Temperature), Various Load Angles
(Differential Mode, CTs)
112
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
5.6.2
71M6533/71M6534 Data Sheet
Accuracy over Temperature
With digital temperature compensation enabled, the temperature characteristics of the reference voltage
(VREF) are compensated to within ±40 PPM/°C for the 71M6533/71M6534 and within ±15 PPM/°C for the
71M6533H/71M6534H.
5.7
5.7.1
Package Outline Drawings
71M6533 (100 Pin LQFP)
Controlling dimensions are in mm.
15.7(0.618)
16.3(0.641)
1
15.7(0.618)
16.3(0.641)
Top View
14.000 +/- 0.200
MAX. 1.600
1.50 +/- 0.10
0.225 +/- 0.045
0.50 TYP.
0.10 +/- 0.10
0.60 TYP>
Side View
Figure 48: 71M6533/6533H 100-pin LQFP Package Outline
v1.1
© 2007-2009 TERIDIAN Semiconductor Corporation
113
71M6533/71M6534 Data Sheet
5.7.2
FDS_6533_6534_004
71M6534/6534H (120 Pin LQFP)
Controlling dimensions are in mm.
16.000 +/- 0.200
14.000 +/- 0.100
7.000
8.000
120
16.000 +/- 0.200
8.000
14.000 +/- 0.100
7.000
1
13.950 +/- 0.100
MAX. 1.600
1.400 +/- 0.050
0.180 +/- 0.050
0.400
0.100 +/- 0.050
0.600 +/- 0.150
Figure 49: 71M6534/6534H 120-pin LQFP Package Outline
114
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
5.8
Pinout
71M6533/71M6533H Pinout (100 Pin LQFP)
100
99
98
97
96
95
94
93
92
91
90
89
88
87
86
85
84
83
82
81
80
79
78
77
76
SEG10/E_TCLK
SEG61/DIO41
SEG11/E_RST
PB
NC
XOUT
TEST
XIN
GNDD
DIO1/OPT_RX
V1
VREF
IAP
IAN
IBP
IBN
ICP
ICN
IDP
IDN
VA
VB
VC
V3P3A
GNDA
5.8.1
71M6533/71M6534 Data Sheet
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
Teridian
71M6533/
71M6533H
75
74
73
72
71
70
69
68
67
66
65
64
63
62
61
60
59
58
57
56
55
54
53
52
51
GNDD
RESET
V2P5
VBAT
RX
SEG31/DIO11
SEG30/DIO10
SEG29/DIO9/YPULSE
SEG28/DIO8/XPULSE
SEG41/DIO21
SEG40/DIO20
SEG39/DIO19
SEG27/DIO7/RPULSE
SEG26/DIO6/WPULSE
SEG25/DIO5/SDATA
SEG24/DIO4/SDCK
SEG23
SEG22
SEG21
SEG20
ICE_E
SEG43/DIO23
SEG18
SEG17
SEG16
SEG0/TEST0
SEG1/TEST1
SEG2/TEST2
SEG34/DIO14
SEG35/DIO15
SEG64/DIO44
SEG49/DIO29
SEG36/DIO16
SEG6/PSDI
SEG50/DIO30
SEG7/MUX_SYNC
SEG8
SEG65/DIO45
GNDD
SEG63/DIO43
SEG47/DIO27
SEG46/DIO26
SEG45/DIO25
SEG33/DIO13
SEG12
SEG44/DIO24
SEG13
SEG14
SEG15
SEG71/DIO51
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
GNDD
SEG9/E_RXTX
DIO2/OPT_TX
TMUXOUT
TX
SEG3/PCLK
V3P3D
SEG19/CKTEST
V3P3SYS
SEG4/PSDO
SEG5/PCSZ
SEG37/DIO17
SEG38/DIO18/MTX
DIO56
DIO57
DIO58
DIO3
COM0
COM1
COM2
COM3
SEG67/DIO47
SEG68/DIO48
SEG69/DIO49
SEG70/DIO50
Figure 50: Pinout for 71M6533/71M6533H LQFP-100 Package
v1.1
© 2007-2009 TERIDIAN Semiconductor Corporation
115
71M6533/71M6534 Data Sheet
71M6534/71M6534H Pinout (120 Pin LQFP)
120
119
118
117
116
115
114
113
112
111
110
109
108
107
106
105
104
103
102
101
100
99
98
97
96
95
94
93
92
91
SEG32/DIO12
SEG10/E_TCLK
SEG62/DIO42
SEG61/DIO41
SEG11/E_RST
SEG42/DIO22/MRX
PB
XOUT
TEST
XIN
GNDD
DIO1/OPT_RX
V1
V2
NC
VREF
IAP
IAN
IBP
IBN
ICP
ICN
IDP
IDN
VBIAS
VA
VB
VC
V3P3A
GNDA
5.8.2
FDS_6533_6534_004
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
Teridian
71M6534/
71M6534H
90
89
88
87
86
85
84
83
82
81
80
79
78
77
76
75
74
73
72
71
70
69
68
67
66
65
64
63
62
61
SEG59/DIO39
SEG58/DIO38
SEG57/DIO37
SEG56/DIO36
GNDD
RESET
V2P5
VBAT
RX
SEG48/DIO28
SEG31/DIO11
SEG30/DIO10
SEG29/DIO9/YPULSE
SEG28/DIO8/XPULSE
SEG41/DIO21
SEG40/DIO20
SEG39/DIO19
SEG27/DIO7/RPULSE
SEG26/DIO6/WPULSE
SEG25/DIO5/SDATA
SEG24/DIO4/SDCK
SEG23
SEG22
SEG21
SEG20
ICE_E
SEG43/DIO23
SEG18
SEG17
SEG16
SEG0/TEST0
SEG1/TEST1
SEG2/TEST2
SEG55/E_ISYNC
SEG34/DIO14
SEG35/DIO15
SEG64/DIO44
SEG49/DIO29
SEG36/DIO16
SEG6/PSDI
SEG50/DIO30
SEG7/MUX_SYNC
SEG8
SEG65/DIO45
GNDD
SEG63/DIO43
SEG47/DIO27
SEG46/DIO26
SEG45/DIO25
SEG33/DIO13
SEG12
SEG44/DIO24
SEG13
SEG14
SEG15
SEG71/DIO51
SEG72/DIO52
SEG73/DIO53
SEG74/DIO54
SEG75/DIO55
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
51
52
53
54
55
56
57
58
59
60
GNDD
SEG9/E_RXTX
DIO2/OPT_TX
TMUXOUT
SEG66/DIO46
TX
SEG3/PCLK
V3P3D
SEG19/CKTEST
V3P3SYS
SEG4/PSDO
SEG5/PCSZ
SEG54/E_TBUS3
SEG53/E_TBUS2
SEG52/E_TBUS1
SEG51/E_TBUS0
SEG37/DIO17
SEG38/DIO18/MTX
DIO56
DIO57
DIO58
DIO3
COM0
COM1
COM2
COM3
SEG67/DIO47
SEG68/DIO48
SEG69/DIO49
SEG70/DIO50
Figure 51: Pinout for 71M6534/71M6534H LQFP-120 Package
116
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
5.9
71M6533/71M6534 Data Sheet
Pin Descriptions
Pins marked with an asterisk (e.g. V2*) are only available on the 71M6534.
5.9.1
Power and Ground Pins
Table 86: Power and Ground Pins
Name
GNDA
GNDD
V3P3A
Type
P
P
P
Circuit
–
–
–
V3P3SYS
P
–
V3P3D
O
13
VBAT
P
12
V2P5
O
10
5.9.2
Description
Analog ground: This pin should be connected directly to the ground plane.
Digital ground: This pin should be connected directly to the ground plane.
Analog power supply: A 3.3 V power supply should be connected to this
pin, must be the same voltage as V3P3SYS.
System 3.3 V supply. This pin should be connected to a 3.3 V power supply.
Auxiliary voltage output of the chip. In mission mode, this pin is connected to V3P3SYS by the internal selection switch. In BROWNOUT
mode, it is internally connected to VBAT. V3P3D is floating in LCD and
sleep mode. A bypass capacitor to ground should not exceed 0.1 µF.
Battery backup and oscillator power supply. A battery or super-capacitor
is to be connected between VBAT and GNDD. If no battery is used, connect VBAT to V3P3SYS.
Output of the internal 2.5 V regulator. A 0.1 µF capacitor to GNDA
should be connected to this pin.
Analog Pins
Table 87: Analog Pins
Name
IAP/IAN,
IBP/IBN,
ICP/ICN
IDP/IDN
VA, VB,
VC
Type
I
Circuit
6
Description
Differential or single-ended Line Current Sense Inputs: These pins are voltage inputs to the internal A/D converter. Typically, they are connected to
the outputs of current sensors. Unused pins must be tied to V3P3A.
I
6
V1
I
7
V2*
I
7
VBIAS*
VREF
O
O
9
9
XIN
XOUT
I
8
Line Voltage Sense Inputs: These pins are voltage inputs to the internal
A/D converter. Typically, they are connected to the outputs of resistor dividers. Unused pins must be tied to V3P3A.
Comparator Input: This pin is a voltage input to the internal comparator.
The voltage applied to the pin is compared to the internal BIAS voltage
(1.6 V). If the input voltage is above VBIAS, the comparator output will be
high (1). If the comparator output is low, a voltage fault will occur. A series 5 kΩ resistor should be connected from V1 to the resistor divider.
Comparator Input (71M6534 only): This pin is a voltage input to an internal
comparator. The voltage applied to this pin is compared to an internal reference voltage (VBIAS). If the input voltage is above VBIAS, the comparator output will be high (1).
Low-impedance output for use in biasing current sensors and voltage dividers.
Voltage Reference for the ADC. This pin should be left unconnected
(floating).
Crystal Inputs: A 32 kHz crystal should be connected across these pins.
Typically, a 33 pF capacitor is also connected from XIN to GNDA and a
15 pF capacitor is connected from XOUT to GNDA. It is important to minimize the capacitance between these pins. See the crystal manufacturer
datasheet for details.
If an external clock is used, a 150 mV (p-p) clock signal should be applied
to XIN, and XOUT should be left unconnected.
Pin types: P = Power, O = Output, I = Input, I/O = Input/Output
The circuit number denotes the equivalent circuit, as specified under Section 5.9.4 I/O Equivalent Circuits.
v1.1
© 2007-2009 TERIDIAN Semiconductor Corporation
117
71M6533/71M6534 Data Sheet
5.9.3
FDS_6533_6534_004
Digital Pins
Table 88: Digital Pins
Name
Type Circuit
COM3,COM2,
O
5
COM1,COM0
SEG0…SEG2,
O
5
SEG8,
SEG12…SEG18,
SEG20…SEG23
SEG24/DIO4
I/O
3, 4, 5
…
SEG31/DIO11,
SEG32/DIO12*
SEG33/DIO13
…
SEG41/DIO21,
SEG42/DIO22*
SEG43/DIO23
…
SEG47/DIO27,
SEG48/DIO28*
SEG49/DIO29,
SEG50/DIO30,
SEG56/DIO36*
…
SEG59/DIO39*
SEG61/DIO41,
SEG62/DIO42*
SEG63/DIO43
…
SEG65/DIO45,
SEG66/DIO45*
SEG67/DIO47
…
SEG71/DIO51
SEG72/DIO52*
…
SEG75/DIO55*
SEG51/E_TBUS0* I/O
5
SEG52/E_TBUS1*
SEG53/E_TBUS2*
SEG54/E_TBUS3*
SEG55/E_ISYNC_
BRKRQ*
SEG3/PCLK
I/O
3, 4, 5
SEG4/PSDO
SEG5/PCSZ
SEG6/PSDI
DIO3, DIO56,
I/O
3
DIO57, DIO58
118
Description
LCD Common Outputs: These 4 pins provide the select signals for
the LCD display.
Dedicated LCD Segment Output pins.
Multi-use pins, configurable as either LCD SEG driver or DIO.
(DIO4 = SCK, DIO5 = SDA when configured as EEPROM interface; WPULSE = DIO6, VARPULSE = DIO7, DIO8 = XPULSE,
DIO9 = YPULSE when configured as pulse outputs).
Unused pins must be configured as outputs or terminated to
V3P3/GNDD.
SEG32/DIO12, SEG42/DIO22, SEG48/DIO28, SEG56/DIO36
through SEG59/DIO39, SEG62/DIO42, SEG66/DIO45,
SEG72/DIO52 through SEG75/DIO55 are only available in the
71M6534.
SEG38/DIO18 and SEG42/DIO22 can be assigned to the multiplexed UART outputs/inputs MTX and MRX (71M6534 only). This
function is controlled by the I/O RAM registers UMUX_E and
UMUX_SEL.
Multiuse pins, configurable as either LCD SEG driver or emulator
trace bus or handshake (71M6534 only).
Multi-use pins, configurable as either LCD SEG driver or SPI
PORT.
Dedicated DIO Pins.
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
Type
I/O
I/O
O
I
Cicuit
1, 4, 5
1, 4, 5
4, 5
2
CKTEST/SEG19,
MUXSYNC/SEG7
O
4, 5
TMUXOUT
O
4
OPT_RX/DIO1
I/O
3, 4
OPT_TX/DIO2
I/O
3, 4
RESET
I
2
RX
I
3
TX
TEST
O
I
4
7
PB
I
3
Name
E_RXTX/SEG9
E_RST/SEG11
E_TCLK/SEG10
ICE_E
Description
Multi-use pins, configurable as either emulator port pins (when
ICE_E pulled high) or LCD SEG drivers (when ICE_E tied to GND).
ICE enable. When zero, E_RST, E_TCLK, and E_RXTX become
SEG9, SEG10, and SEG11 respectively. For production units, this
pin should be pulled to GND to disable the emulator port.
Multi-use pins, configurable as either multiplexer/clock output or
LCD segment driver using the I/O RAM registers CKOUT_E or
MUX_SYNC_E.
Pin connected to the output test multiplexer. Controlled by
TMUX[3:0].
Multi-use pin, configurable as Optical Receive Input or general DIO.
When configured as OPT_RX, this pin is a regular UART RX pin.
If this pin is unused it must be configured as an output or terminated to V3P3D or GNDD.
Multi-use pin, configurable as either Optical LED Transmit Output
or general DIO. When configured as OPT_TX, this pin is capable
of directly driving an LED for transmitting data in an IR serial interface.
Chip reset: This input pin is used to reset the chip into a known
state. For normal operation, this pin is pulled low. To reset the
chip, this pin should be pulled high. This pin has an internal 30 μA
(nominal) current source pull-down. No external reset circuitry is
necessary.
UART input. If this pin is unused it must be terminated to
V3P3D or GNDD.
UART output.
Enables Production Test.
This pin must be grounded in normal operation.
Push button input. This pin must be at GNDD when not active or unused. A rising edge sets the IE_PB flag. It also causes the part to
wake up if it is in SLEEP or LCD mode. PB does not have an internal
pull-up or pull-down resistor.
Pin types: P = Power, O = Output, I = Input, I/O = Input/Output.
The circuit number denotes the equivalent circuit, as specified in Section 5.9.4.
v1.1
© 2007-2009 TERIDIAN Semiconductor Corporation
119
71M6533/71M6534 Data Sheet
5.9.4
FDS_6533_6534_004
I/O Equivalent Circuits
V3P3D
V3P3A
V3P3D
110K
Digital
Input
Pin
CMOS
Input
from
internal
reference
LCD SEG
Output
Pin
LCD
Driver
VREF
Pin
GNDA
GNDD
GNDD
LCD Output Equivalent Circuit
Type 5:
LCD SEG or
pin configured as LCD SEG
Digital Input Equivalent Circuit
Type 1:
Standard Digital Input or
pin configured as DIO Input
with Internal Pull-Up
VREF Equivalent Circuit
Type 9:
VREF
V3P3A
V3P3D
V3P3D
Digital
Input
Pin
CMOS
Input
Analog
Input
Pin
GNDD
GNDD
V2P5 Equivalent Circuit
Type 10:
V2P5
Analog Input Equivalent Circuit
Type 6:
ADC Input
Digital Input
Type 2:
Pin configured as DIO Input
with Internal Pull-Down
V3P3A
Comparator
Input
Pin
V3P3D
To
Comparator
VLCD
Pin
LCD
Drivers
GNDA
Digital
Input
Pin
V2P5
Pin
GNDA
110K
GNDD
from
internal
reference
To
MUX
CMOS
Input
GNDD
Comparator Input Equivalent
Circuit Type 7:
Comparator Input
VLCD Equivalent Circuit
Type 11:
VLCD Power
GNDD
Oscillator
Pin
Digital Input Type 3:
Standard Digital Input or
pin configured as DIO Input
To
Oscillator
Power
Down
Circuits
VBAT
Pin
GNDD
GNDD
V3P3D
Oscillator Equivalent Circuit
Type 8:
Oscillator I/O
V3P3D
10
Digital
Output
Pin
CMOS
Output
from
V3P3SYS
V3P3D
Pin
GNDD
40
from
VBAT
GNDD
Digital Output Equivalent Circuit
Type 4:
Standard Digital Output or
pin configured as DIO Output
120
VBAT Equivalent Circuit
Type 12:
VBAT Power
V3P3D Equivalent Circuit
Type 13:
V3P3D
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
6 Ordering Information
Part
71M6533
71M6533H
71M6533
71M6533H
71M6534
71M6534H
71M6534
71M6534H
Part Description
(Package, accuracy)
100-pin LQFP Lead Free, 0.5%
100-pin LQFP Lead Free, 0.1%
100-pin LQFP Lead Free, 0.5%
100-pin LQFP Lead Free, 0.1%
120-pin LQFP Lead Free, 0.5%
120-pin LQFP Lead Free, 0.1%
120-pin LQFP Lead Free, 0.5%
120-pin LQFP Lead Free, 0.1%
Flash
Size
128 KB
128 KB
128 KB
128 KB
128 KB
256 KB
128 KB
256 KB
Packaging
Package
Marking
bulk
71M6533-IGT/F
71M6533-IGT
bulk
71M6533H-IGT/F 71M6533H-IGT
tape and reel 71M6533-IGTR/F 71M6533-IGT
tape and reel 71M6533H-IGTR/F 71M6533H-IGT
bulk
71M6534-IGT/F
71M6534-IGT
bulk
71M6534H-IGT/F 71M6534H-IGT
tape and reel 71M6534-IGTR/F 71M6534-IGT
tape and reel 71M6534H-IGTR/F 71M6534H-IGT
Order Number
7 Related Information
The following documents related to the 71M6533 and 71M6534 are available from Teridian Semiconductor Corporation:
71M6533/71M6534 Data Sheet (this document)
71M653X Software User’s Guide (SUG)
8 Contact Information
For more information about Teridian Semiconductor products or to check the availability of the
71M6533/33H and 71M6534/34H, contact us at:
6440 Oak Canyon Road
Suite 100
Irvine, CA 92618-5201
Telephone: (714) 508-8800
FAX: (714) 508-8878
Email: [email protected]
For a complete list of worldwide sales offices, go to http://www.teridian.com.
v1.1
© 2007-2009 TERIDIAN Semiconductor Corporation
121
71M6533/71M6534 Data Sheet
FDS_6533_6534_004
Appendix A: Acronyms
AFE
AMR
ANSI
CE
DIO
DSP
FIR
ICE
IEC
MPU
PLL
RMS
SFR
SOC
TOU
UART
122
Analog Front End
Automatic Meter Reading
American National Standards Institute
Compute Engine
Digital I /O
Digital Signal Processor
Finite Impulse Response
In-Circuit Emulator
International Electrotechnical Commission
Microprocessor Unit (CPU)
Phase-locked loop
Root Mean Square
Special Function Register
System on Chip
Time of Use
Universal Asynchronous Receiver/Transmitter
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1
FDS_6533_6534_004
71M6533/71M6534 Data Sheet
Appendix B: Revision History
Revision
1.0
1.1
v1.1
Date
March 6, 2009
November 9,
2009
Description
First publication with changes with respect to the preliminary data sheet
(PDS) as follows:
1) Corrected reversed labels for Timer/Counter 1 and 2 in Table 22.
2) Updated Figure 7 (Interrupt structure).
3) Updated range for RTC_A from 1.9 PPM to 3.8 PPM.
4) Changed sleep mode current at 25°C to 0.7 µV and deleted entry
for typical sleep mode current over temperature.
5) Corrected bit enumeration for FLSH_PGADR[7:2].
6) Corrected various typographical errors (TRIMMT etc.).
7) Corrected entries under “Wk.” Column for GP0-GP7 in alphabetical
I/O RAM table.
8) Added explanation for hysteresis at the V1 pin in Applications section.
9) Replaced graph showing system performance specification over
temperature with specification on accuracy of VREF compensation.
10) Changed accuracy of VREF compensation over temperature to
±15 PPM/°C
11) Changed LSB values provided for temperature sensor.
12) Added minimum output level for VLC1 LCD voltage.
13) Removed access to I/O RAM from SPI Port description.
14) Updated numerous parameters in Electrical Specification (temperature sensor, supply current for mission and battery modes).
15) Corrected number of pre-boot cycles in Flash Memory Section.
16) Updated entries in I/O RAM table under “Wake” column.
17) Updated CE register tables.
Changes and corrections:
1) Stated < 0.1% for accuracy for both H and non-H parts over
2000:1 range on title page.
2) Added STOP and IDLE bits in description of PCOM SFR.
3) Consolidated spelling of RTCA_ADJ.
4) Added explanation for Figure 18.
5) Completely revised section 2.5.2 (Wake on Timer).
6) Improved description of hysteresis in Application Section (3.11).
7) Corrected bit range for CE_LCTN to CE_LCTN[7:0].
8) Corrected bit assignment for control of DIO56 – DIO58 (DIO_56[4]
and DIO_DIR56[7].
9) Added LCD_SEG19[ ] to Table 47.
10) Added text in Table 47 stating that registers RTC_SEC to RTC_YR
do not change at reset.
11) Specified Voltage LSB in CE Interface Description (for sag detection).
12) Corrected formulae for RMS calculation below Table 56.
13) Updated package outline drawing.
14) Added text describing connection of a trace emulator to the
71M6534 in section 3.13.
15) Clarified write delay that applies to the RTC_SEC and other RTC
registers in section 1.4.3 and Table 47.
16) Added note describing firmware measures to be applied when
using UART1 in full-duplex mode.
© 2007-2009 TERIDIAN Semiconductor Corporation
123
71M6533/71M6534 Data Sheet
FDS_6533_6534_004
© 2008 Teridian Semiconductor Corporation. All rights Reserved.
Teridian Semiconductor Corporation is a registered trademark of Teridian Semiconductor Corporation.
TM
Simplifying System Integration is a registered trademark of Teridian Semiconductor Corporation.
Intel is a registered trademark of Intel Corporation.
All other trademarks are the property of their respective owners.
Teridian Semiconductor Corporation makes no warranty for the use of its products, other than expressly
contained in the Company’s warranty detailed in the Teridian Semiconductor Corporation standard Terms
and Conditions. The company assumes no responsibility for any errors which may appear in this document, reserves the right to change devices or specifications detailed herein at any time without notice and
does not make any commitment to update the information contained herein. Accordingly, the reader is
cautioned to verify that this document is current by comparing it to the latest version on
http://www.teridian.com or by checking with your sales representative.
124
© 2007-2009 TERIDIAN Semiconductor Corporation
v1.1