February 2007 AS6C6264 ® 8K X 8 BIT LOW POWER CMOS SRAM FEATURES GENERAL DESCRIPTION Access time :55ns Low power consumption: Operation current : 15mA (TYP.), VCC = 3.0V Standby current : 1µ A (TYP.), VCC = 3.0V Wide range power supply : 2.7 ~ 5.5V Fully Compatible with all Competitors 5V product Fully Compatible with all Competitors 3.3V product Fully static operation Tri-state output Data retention voltage : 2.0V (MIN.) All products ROHS Compliant Package : 28-pin 600 mil PDIP 28-pin 330 mil SOP 28-pin 8mm x 13.4mm sTSOP FUNCTIONAL BLOCK DIAGRAM DECODER DQ0-DQ7 I/O DATA CIRCUIT CE# CE2 WE# OE# CONTROL CIRCUIT 02/Feb/07, v1.0 The AS6C6264 is well designed for low power application, and particularly well suited for battery back-up nonvolatile memory application. The AS6C6264 operates with wide range power supply. PIN DESCRIPTION Vcc Vss A0-A12 The AS6C6264 is a 65,536-bit low power CMOS static random access memory organized as 8,192 words by 8 bits. It is fabricated using very high performance, high reliability CMOS technology. Its standby current is stable within the range of operating temperature. 8Kx8 MEMORY ARRAY SYMBOL DESCRIPTION A0 - A12 Address Inputs DQ0 – DQ7 Data Inputs/Outputs CE#, CE2 Chip Enable Inputs WE# Write Enable Input OE# Output Enable Input VCC Power Supply VSS Ground NC No Connection COLUMN I/O Alliance Memory Inc Page 1 of 12 ® 8K X 8 BIT LOW POWER CMOS SRAM PIN CONFIGURATION 1 28 Vcc 2 27 WE# A7 3 26 CE2 A6 4 25 A8 A5 5 24 A9 A4 6 A3 7 A2 8 A1 9 AS6C6264 NC A12 23 A11 22 OE# 21 A10 20 CE# A0 10 19 DQ7 DQ0 11 18 DQ6 DQ1 12 17 DQ5 DQ2 13 16 DQ4 Vss 14 15 DQ3 1 2 3 4 5 6 7 8 9 10 11 12 13 14 OE# A11 A9 A8 CE2 WE# Vcc NC A12 A7 A6 A5 A4 A3 AS6C6264 28 27 26 25 24 23 22 21 20 19 18 17 16 15 A10 CE# DQ7 DQ6 DQ5 DQ4 DQ3 Vss DQ2 DQ1 DQ0 A0 A1 A2 sTSOP PDIP/SOP ABSOLUTE MAXIMUM RATINGS* PARAMETER Terminal Voltage with Respect to VSS SYMBOL VTERM Operating Temperature RATING -0.5 to 7.0 0 to 70(C grade) ºC TA Storage Temperature Power Dissipation DC Output Current Soldering Temperature (under 10 sec) TSTG PD IOUT TSOLDER UNIT V -40 to 85(I grade) -65 to 150 1 50 260 ºC W mA ºC *Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to the absolute maximum rating conditions for extended period may affect device reliability. TRUTH TABLE MODE Standby Output Disable Read Write Note: CE# H X L L L CE2 X L H H H OE# X X H L X WE# X X H H L I/O OPERATION High-Z High-Z High-Z DOUT DIN SUPPLY CURRENT ISB,ISB1 ISB,ISB1 ICC,ICC1 ICC,ICC1 ICC,ICC1 H = VIH, L = VIL, X = Don't care. Page 2 of 12 February 2007 AS6C6264 ® 8K X 8 BIT LOW POWER CMOS SRAM DC ELECTRICAL CHARACTERISTICS SYMBOL TEST CONDITION MIN. PARAMETER Supply Voltage VCC 2.7 *1 Input High Voltage VIH 0.7*Vcc *2 Input Low Voltage VIL - 0.5 VCC ≧ VIN ≧ VSS Input Leakage Current ILI -1 Output Leakage VCC ≧ VOUT ≧ VSS, ILO -1 Current Output Disabled Output High Voltage VOH IOH = -1mA 2.4 Output Low Voltage VOL IOL = 2mA Cycle time = Min. CE# = VIL and CE2 = VIH, - 55 ICC II/O = 0mA Average Operating Cycle time = 1µs Power supply Current CE#≦0.2V and CE2≧VCC-0.2V, ICC1 II/O = 0mA other pins at 0.2V or VCC-0.2V -C CE# ≧VCC-0.2V Standby Power ISB1 Supply Current or CE2≦0.2V -I - TYP. 3.0 - *5 MAX. 5.5 VCC+0.3 0.6 1 - 1 UNIT V V V µA µA 3.0 - 0.4 V V 15 45 mA 3 10 mA 1 1 50 *4 80 *4 µA µA Notes: C = Commercial Temperature I = Industrial temperature 1. VIH(max) = V CC + 3.0V for pulse width less than 10ns. 2. VIL(min) = V width less than10ns. SS - 3.0V for pulse 3. Over/Undershoot specificationsare characterized, not 10 0% tested. 4. 10µA for special request 5. Typical valuesare included forreference only and are notguaranteed or tested. Typical valued are measuredt aVCC = VCC(TYP.) and TA = 25ºC CAPACITANCE (TA = 25℃, f = 1.0MHz) PARAMETER Input Capacitance Input/Output Capacitance SYMBOL CIN CI/O MIN. - MAX 6 8 UNIT pF pF Note :These parameters areguaranteed by device characterization, but notroduction p tested. AC TEST CONDITIONS Input Pulse Levels Input Rise and Fall Times Input and Output Timing Reference Levels Output Load 02/Feb/07, v1.0 0.2V to VCC - 0.2V 3ns 1.5V CL = 50pF + 1TTL, IOH/IOL = -1mA/2mA Alliance Memory Inc Page 3 of 12 ® 8K X 8 BIT LOW POWER CMOS SRAM AC ELECTRICAL CHARACTERISTICS (1) READ CYCLE PARAMETER Read Cycle Time Address Access Time Chip Enable Access Time Output Enable Access Time Chip Enable to Output in Low-Z Output Enable to Output in Low-Z Chip Disable to Output in High-Z Output Disable to Output in High-Z Output Hold from Address Change (2) WRITE CYCLE PARAMETER Write Cycle Time Address Valid to End of Write Chip Enable to End of Write Address Set-up Time Write Pulse Width Write Recovery Time Data to Write Time Overlap Data Hold from End of Write Time Output Active from End of Write Write to Output in High-Z SYM. tRC tAA tACE tOE tCLZ* tOLZ* tCHZ* tOHZ* tOH SYM. tWC tAW tCW tAS tWP tWR tDW tDH tOW* tWHZ* AS6C6264-55 MIN. MAX. 55 55 55 30 10 5 20 20 10 - AS6C6264-55 MIN. MAX. 55 50 50 0 45 0 25 0 5 20 UNIT ns ns ns ns ns ns ns ns ns UNIT ns ns ns ns ns ns ns ns ns ns *These parameters are guaranteed by device characterization, but not production tested. Page 4 of 12 ® 8K X 8 BIT LOW POWER CMOS SRAM TIMING WAVEFORMS READ CYCLE 1 (Address Controlled) (1,2) tRC Address tAA Dout tOH Previous Data Valid Data Valid READ CYCLE 2 (CE# and CE2 and OE# Controlled) (1,3,4,5) tRC Address tAA CE# tACE CE2 OE# tOE tOLZ tCLZ Dout High-Z tOH tOHZ tCHZ Data Valid High-Z Notes : 1.WE# is high for read cycle. 2.Device is continuously selected OE# = low, CE# = low., CE2 = high. 3.Address must be valid prior to or coincident with CE# = low , CE2 = high; otherwise tAA is the limiting parameter. 4.tCLZ, tOLZ, tCHZ and tOHZ are specified with CL = 5pF. Transition is measured ±500mV from steady state. 5.At any given temperature and voltage condition, t CHZ is less than tCLZ , tOHZ is less than tOLZ. Page 5 of 12 ® 8K X 8 BIT LOW POWER CMOS SRAM WRITE CYCLE 1 (WE# Controlled) (1,2,3,5,6) tWC Address tAW CE# tCW CE2 tAS tWP tWR WE# tWHZ Dout TOW High-Z (4) tDW Din (4) tDH Data Valid WRITE CYCLE 2 (CE# and CE2 Controlled) (1,2,5,6) tWC Address tAW CE# tAS tWR tCW CE2 tWP WE# tWHZ Dout (4) High-Z tDW Din tDH Data Valid Notes : 1.WE#, CE# must be high or CE2 must be low during all address transitions. 2.A write occurs during the overlap of a low CE#, high CE2, low WE#. 3.During a WE#controlled write cycle with OE# low, tWP must be greater than tWHZ + tDW to allow the drivers to turn off and data to be placed on the bus. 4.During this period, I/O pins are in the output state, and input signals must not be applied. 5.If the CE#low transition and CE2 high transition occurs simultaneously with or after WE# low transition, the outputs remain in a high impedance state. 6.tOW and tWHZ are specified with CL = 5pF. Transition is measured ±500mV from steady state. Page 6 of 12 ® 8K X 8 BIT LOW POWER CMOS SRAM DATA RETENTION CHARACTERISTICS PARAMETER SYMBOL VCC for Data Retention VDR Data Retention Current IDR Chip Disable to Data Retention Time Recovery Time tRC* = Read Cycle Time tCDR TEST CONDITION CE# ≧ VCC - 0.2V or CE2 ≦ 0.2V VCC = 1.5V CE# ≧ VCC - 0.2V or CE2 ≦ 0.2V See Data Retention Waveforms (below) tR MIN. TYP. MAX. UNIT 1.5 - 5.5 V - 0.5 10 µA 0 - - ns tRC* - - ns DATA RETENTION WAVEFORM Low Vcc Data Retention Waveform (1) (CE# controlled) VDR ≧ 1.5V Vcc Vcc(min.) Vcc(min.) tCDR CE# VIH tR CE# ≧ Vcc-0.2V VIH Low Vcc Data Retention Waveform (2) (CE2 controlled) VDR ≧ 1.5V Vcc Vcc(min.) Vcc(min.) tCDR CE2 tR CE2 ≦ 0.2V VIL VIL Page 7 of 12 ® 8K X 8 BIT LOW POWER CMOS SRAM PACKAGE OUTLINE DIMENSION 28 pin 600 mil PDIP Package Outline Dimension UNIT SYM. A1 A2 B B1 c D E E1 e eB L S Q1 Θ INCH.(BASE) 0.010 (MIN) 0.150±0.005 0.020 (MAX) 0.055 (MAX) 0.012 (MAX) 1.430 (MAX) 0.6 (TYP) 0.52 (MAX) 0.100 (TYP) 0.625 (MAX) 0.180(MAX) 0.06 (MAX) 0.08(MAX) o 15 (MAX) MM(REF) 0.254 (MIN) 3.810±0.127 0.508(MAX) 1.397(MAX) 0.304 (MAX) 36.322 (MAX) 15.24 (TYP) 13.208 (MAX) 2.540(TYP) 15.87 (MAX) 4.572(MAX) 1.524 (MAX) 2.032(MAX) o 15 (MAX) Page 8 of 12 ® 8K X 8 BIT LOW POWER CMOS SRAM 28 pin 330 mil SOP Package Outline Dimension UNIT SYM. A A1 A2 b c D E E1 e L L1 S y Θ INCH(BASE) 0.120 (MAX) 0.002(MIN) 0.098±0.005 0.016 (TYP) 0.010 (TYP) 0.728 (MAX) 0.340 (MAX) 0.465±0.012 0.050 (TYP) 0.05 (MAX) 0.067±0.008 0.047 (MAX) 0.003(MAX) o o 0 ～10 MM(REF) 3.048 (MAX) 0.05(MIN) 2.489±0.127 0.406(TYP) 0.254(TYP) 18.491 (MAX) 8.636 (MAX) 11.811±0.305 1.270(TYP) 1.270 (MAX) 1.702 ±0.203 1.194 (MAX) 0.076(MAX) o o 0 ～10 Page 9 of 12 February 2007 AS6C6264 ® 8K X 8 BIT LOW POWER CMOS SRAM 28 pin 8mm x 13.4mm sTSOP Package Outline Dimension UNIT SYM. A A1 A2 b c Db E e D L L1 y Θ INCH(BASE) MM(REF) 0.047 (MAX) 0.004±0.002 0.039±0.002 0.006 (TYP) 0.010 (TYP) 0.465±0.004 0.315±0.004 0.022 (TYP) 0.528±0.008 0.020±0.004 0.0315±0.004 0.08(MAX) o o 0 ～5 1.20 (MAX) 0.10±0.05 1.00±0.05 0.15(TYP) 0.254(TYP) 11.80±0.10 8.00±0.10 0.55(TYP) 13.40±0.20 0.50±0.10 0.80±0.10 0.003(MAX) o o 0 ～5 Note：E dimension is not including end flash. The total of both sides’ end flash is not above 0.3mm. 02/Feb/07, v1.0 Alliance Memory Inc Page 10 of 12 February 2007 AS6C6264 ® 8K X 8 BIT LOW POWER CMOS SRAM ORDERING INFORMATION Ordering Codes Alliance Organization VCC range Package AS6C6264-55PCN 8k x 8 2.7-5.5V 28pin 600mil PDIP AS6C6264-55SCN 8k x 8 2.7-5.5V 28pin 330mil SOP AS6C6264-55SIN 8k x 8 2.7-5.5V 28pin 330mil SOP AS6C6264-55STCN 8k x 8 2.7-5.5V 28pin sTSOP (8 x 13.4 mm) AS6C6264-55STIN 8k x 8 2.7-5.5V 28pin sTSOP (8 x 13.4 mm) Operating Speed Temp ns Commercial ~ 0º C to 70º C 55 Commercial ~ 0º C to 70º C 55 Industrial ~ -40ºC to 85º C 55 Commercial ~ 0º C to 70º C 55 Industrial ~ -40ºC to 85º C 55 Part numbering system AS6C 6264 low power Device SRAM Number prefix 6264 - 55 X Package Options: P = 28 pin 600 mil P-DIP Access S = 28 pin 330 mil SOP Time ST = 28 pin sTSOP (8mm x 13.4 mm) 02/Feb/07, v1.0 Alliance Memory Inc X N Temperature Range: C = Commercial N = Lead (0ºC to +70º C) Free ROHS I = Industrial Compliant (-40º to +85º C) Part Page 11 of 12 February 2007 AS6C6264 ® ® Alliance Memory, Inc. 1116 South Amphlett, #2, San Mateo, CA 94402 Tel: 650-525-3737 Fax: 650-525-0449 Copyright © Alliance Memory All Rights Reserved Part Number: AS6C6264 Document Version: v. 1.0 www.alliancememory.com © Copyright 2003 Alliance Memory, Inc. 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Alliance does not authorize its products for use as critical components in life-supporting systems where a malfunction or failure may reasonably be expected to result in significant injury to the user, and the inclusion of Alliance products in such life-supporting systems implies that the manufacturer assumes all risk of such use and agrees to indemnify Alliance against all claims arising from such use. 02/Feb/07, v1.0 Alliance Memory Inc Page 12 of 12