ANADIGICS ATA06211D1C

ATA06211
AGC Transimpedance Amplifier
SONET OC-12
PRELIMINARY DATA SHEET-Rev 4
FEATURES
·
Single +5 Volt Supply
·
Automatic Gain Control
·
-32 dBm Sensitivity
·
0 dBm Optical Overload
·
550 MHz Bandwidth
APPLICATIONS
·
SONET OC-12 /SDH STM-4 (622Mb/s)
Receiver
·
FITL
·
BISDN
·
Workstation Interconnects
·
Low Noise RF Amplifier
D1
PRODUCT DESCRIPTION
The ANADIGICS ATA06211 is a 5V low noise
transimpedance amplifier with AGC designed to be
used in OC-12/STM-4 fiber optic links. The device is
used in conjunction with a photodetector (PIN diode
or avalanche photodiode) to convert an optical signal
into an output voltage. The ATA06211 offers a
bandwidth of 550MHz and a dynamic range of 32dB.
It is manufactured in a GaAs MESFET process and
is available in bare die form.
VDD1
VDD2
AGC
19 K
70K
CAGC
+
4pF
IIN
GND
or
neg.supply
- 35
+ 0.8
VGA
US PATENT
VOUT
GND
CBY
Photodector cathode must be connected
to IIin
for proper AGC operation
IN
Figure 1: Equivalent Circuit
08/2001
ATA06211
Figure 2: Bonding Pad Layout
Table 1: ATA06211D1C Pad Description
PAD
D ESC R IPTION
C OMMEN T
V DD1
V DD1
Posi ti ve supply for i nput gai n stage
V DD2
V DD2
Posi ti ve supply for second gai n stage
TIA Input C urrent
C onnect detector cathode for proper operati on
VOUT
TIA Output Voltage
Requi res external D C block
C AGC
External AGC C apaci tor
70K* C AGC = AGC Ti me C onstant
C BY
Input Gai n Stage Bypass
C apaci tor
>56 pF
IIN
ELECTRICAL CHARACTERISTICS
Table 2: Absolute Maximum Ratings
V DD1
7.0 V
V DD2
7.0 V
IIN
5 mA
TA
Operati ng Temp. - 40 °C to 125 °C
TS
Storage Temp. - 65 °C to 150 °C
Stresses in excess of the absolute ratings may cause
permanent damage. Functional operation is not
implied under these conditions. Exposure to absolute
ratings for extended periods of time may adversely
affect reliability.
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PRELIMINARY DATA SHEET - Rev 4
08/2001
ATA06211
Table 3: Electrical Specifications (1)
(TA = 25°C, VDD =+5.0V + 10%, CDIODE + CSTRAY = 0.5 pF, Det. cathode to IIN)
PAR AMETER
MIN
Transresi stance (RL=¥ ,IDC<500nA)
Transresi stance (RL=50 W )
(1)
Bandwi dth -3dB
2.5
500
Input Resi stance (2)
Output Resi stance
30
TYP
MAX
U N IT
6
KW
3
KW
550
MHz
280
W
50
60
W
Supply C urrent
15
30
45
mA
Input Offset Voltage
1.4
1.6
1.9
Volts
Output Offset Voltage
AGC Threshold (IIN)
Opti cal Overload
(3)
60
-3
(4)
1.8
Volts
100
mA
0
dB m
Input Noi se C urrent (5)
50
AGC Ti me C onstant
16
m se c
(6)
Offset Voltage D ri ft
60
nA
±1
mV/ º C
-31
-32
dB m
Operati ng Voltage Range
+ 4.5
+ 5.0
Operati ng Temperature Range
- 40
Opti cal Sensi ti vi ty (7)
+ 6.0
Volts
85
ºC
Notes:
1. f = 50MHz
2. Measured with Iin below AGC Threshold. During AGC, input impedance will decrease
proportionally to Iin.
3. Defined as the Iin where Transresistance has decreased by 50%.
4. See note on “Indirect Measurement of Optical Overload.”
5. See note on “Measurement of Input Referred Noise Current.”
6. CAGC = 220 pF
7. Parameter is guaranteed (not tested) by design and characterization data @622 Mb/s,
assuming dectector responsivity of 0.9.
PRELIMINARY DATA SHEET - Rev 4
08/2001
3
ATA06211
APPLICATION INFORMATION
VDD
56pF
56pF
GND
ATA06211D1C Bonding Pads
VDD2
925 um
VDD1
GND
7I
GND
PIN
IIN
1992
GND
VOUT
OUT
GND
GND GND
CBY
CBY
GND
CAGC
GND
1250 um
56pF
56pF
Figure 3: Typical Bonding Diagram
General Layout Considerations
Since the gain stages of the transimpedance
amplifier have an open loop bandwidth in excess of
1.0 GHz, it is essential to maintain good high
frequency layout practices. To prevent oscillations, a
low inductance RF ground plane should be made
the utmost care should available for power supply
bypassing. Traces that can be made short should
be made short, and be taken to maintain very low
capacitance at the photodiode-TIA interface (IIN), as
excess capacitance at this node will cause a
4
degradation in bandwidth and sensitivity (see
Bandwidth vs. CT curves).
C T = 0.5 pF
0.90
Bandwidth (MHz)
Power Supplies and General Layout Considerations
The ATA06211D1C may be operated from a positive
supply as low as + 4.5 V and as high as + 6.0 V.
Below + 4.5 V, bandwidth, overload and sensitivity
will degrade, while at + 6.0 V, bandwidth, overload
and sensitivity improve (see “Bandwidth vs.
Temperature” curves). Use of surface mount
(preferably MIM type capacitors), low inductance
power supply bypass capacitors (>=56pF) are
essential for good high frequency and low noise
performance. The power supply bypass capacitors
should be mounted on or connected to a good low
inductance ground plane.
V = 5.5 V
0.80
0.70
DD
V = 5.0 V
DD
0.60
0.50
V = 4.5 V
0.40
-40
10
DD
60
85
Temperature (O C)
Figure 4: Bandwidth vs. Temperature
Note: All performance curves are typical @ TA =25 C°
unless otherwise noted.
PRELIMINARY DATA SHEET - Rev 4
08/2001
ATA06211
800
1.1
VDD = 5.5 V
VDD = 5.5 V
700
1.0
VDD = 5.0 V
600
0.9
0.8
500
VDD = 4.5 V
400
VDD = 4.5 V
0.7
0
0 .2
0 .4
0 .6
0 .8
1 .0
1 .2
1 .4
0.5
2.1
- 1.6
- 1.1
Figure 5: Bandwidth vs. CT
IIN
4
3
50
2
VDD = 5.5 V
1
VDD = 4.5 V
- 1.6
-1.1
- 0.6
Transimpedance (K Ohm)
5
I
- 0.6
- 0.1
IIN (mA DC)
IIN Connection
(Refer to the equivalent circuit diagram.) Bonding the
detector cathode to IIN (and thus drawing current from
the ATA06211) improves the dynamic range. Although
the detector may be used in the reverse direction for
input currents not exceeding 25 mA, the specifications
for optical overload will not be met.
Rf
50
1 .6
CT (pF)
-2.1
0.6
IIN
300
BANDWIDTH (MHz)
1.2
B(3dB) A / 2 π Rf (Cin +Ct)
Figure 7: Bandwidth vs. IIN
VOUT Connection
The output pad should be connected via a coupling
capacitor to the next stage of the receiver channel
(filter or decision circuits), as the output buffers are
not designed to drive a DC coupled 50 ohm load
(this would require an output bias current of
approximately 36 mA to maintain a quiescent 1.8
Volts across the output load). If VOUT is connected to a
high input impedance decision circuit (>500 ohms),
then a coupling capacitor may not be required,
although caution should be exercised since DC
offsets of the photo detector/TIA combination may
cause clipping of subsequent gain or decision
circuits.
heavy AGC
Output Collapse
VDD =5.5 V
Linear Region
- 0.1
Rf
IIN (mA DC)
IIN
VOUT
Figure 6: Transimpedance vs. IIN
VDD=4.5 V
-4
-3
-2
3.4
3.2
3.0
2.9
2.7
2.5
2.4
2.2
2.0
1.9
1.7
1.5
1.4
1.2
1.0
0.8
0.7
0.5
0.3
0.2
0.0
VOUT(Volts)
Bandwith (MHz)
900
-1
IIN(mA DC)
Figure 8: VOUT vs. IIN
PRELIMINARY DATA SHEET - Rev 4
08/2001
5
Input Offset Voltage
ATA06211
1.9
1.85
1.8
1.75
1.7
1.65
1.6
1.55
1.5
- 40
VDD = 5.5 V VDD = 5.0V
Measurement of Input Referred Noise Current
The “Input Noise Current” is directly related to
sensitivity . It can be defined as the output noise
voltage (Vout), with no input signal, (including a 450
MHz lowpass filter at the output of the TIA) divided by
the AC transresistance.
VDD = 4.5V
10
(see VOUT vs IIN figure) from the TIA and determining
the point of output voltage collapse. Also the input
node virtual ground during “heavy AGC” is checked
to verify that the linearity (i.e. pulse width distortion)
of the amplifier has not been compromised.
60
Temperature (OC)
Sensitivity and Bandwidth
In order to guarantee sensitivity and bandwidth
performance, the TIA is subjected to a
comprehensive series of tests at the die sort level
(100% testing at 25 oC) to verify the DC parametric
performance and the high frequency performance
(i.e. adequate |S21|) of the amplifier. Acceptably high
|S21| of the internal gain stages will ensure low
amplifier input capacitance and hence low input
referred noise current. Transimpedance sensitivity
and bandwidth are then guaranteed by design and
correlation with RF and DC die sort test results.
Indirect Measurement of Optical Overload
Optical overload can be defined as the maximum
optical power above which the BER (bit error rate)
increases beyond 1 error in 10 10 bits. The
ATA06211D1C is 100% tested at die sort by a DC
measurement which has excellent correlation with
an PRBS optical overload measurement. The
measurement consists of sinking a negative current
6
Hz
6.5
pA/
CBY Connection
The CBY pad must be connected via a low inductance
path to a surface mount capacitor of at least 56pF
(additional capacitance can be added in parallel with
the 56 pF or 220 pF capacitors to improve low
frequency response and noise performance).
Referring to the equivalent circuit diagram and the
typical bonding diagram, it is critical that the
connection from CBY to the bypass capacitor use
two bond wires for low inductance, since any high
frequency impedance at this node will be fed back to
the open loop amplifier with a resulting loss of
transimpedance bandwidth. Two pads are provided
for this purpose
7.5
4.5
Rf
5.5
CT
3.5
50
CT=1.0pF
2.5
1.5
CT =0.5pF
- 0.1
1
10
100
1000
Frequency (MHz)
Figure 10: Input Referred Noise Spectral Density
Input Referred Noise in (nA RMS)
Figure 9: Input Offset Voltage vs. Temperature
Input referred noise test circuit
70
VDD = 4.5 V
25dB
60
58
0.5pF
TIA
400
MHz
LPF
54
VDD = 5.5V
50
η(dBm) = 10 LOG
46
42
-40
0
40
6500in
R
80
O
Temperature ( C)
FIgure 11: Input Referred Noise vs Temperature
PRELIMINARY DATA SHEET - Rev 4
08/2001
ATA06211
AGC Capacitor
It is important to select an external AGC capacitor of
high quality and appropriate size. The ATA06211D1C
has an on-chip 70 KW resistor with a shunt 4 pF
capacitor to ground. Without external capacitance the
chip will provide an AGC time constant of 280 nS. For
the best performance in a typical 622 MB/s SONET
receiver, a minimum AGC capacitor of 56pF is
recommended. This will provide the minimum
amount of protection against pattern sensitivity and
pulse width distortion on repetitive data sequences
during high average optical power conditions.
Conservative design practices should be followed
when selecting an AGC capacitor, since unit to unit
variability of the internal time constant and various
data conditions can lead to data errors if the chosen
value is too small.
Phase Response
At frequencies below the 3dB bandwidth of the device,
the transimpedance phase response is
characteristic of a single pole transfer function (as
shown in the Phase vs Frequency curve). The output
impedance is essentially resistive up to 1000 MHz.
Degrees
180
200
Rf
220
240
VOUT
IIN
0.5pF
50
100
150
Frequency (MHz)
Figure 12: Phase (IIN to VOUT)
PRELIMINARY DATA SHEET - Rev 4
08/2001
7
ATA06211
ORDERING INFORMATION
PAR T N U MB ER
PAC K AGE OPTION
PAC K AGE D ESC R IPTION
ATA06211D 1C
D 1C
Die
ANADIGICS, Inc.
141 Mount Bethel Road
Warren, New Jersey 07059, U.S.A
Tel: +1 (908) 668-5000
Fax: +1 (908) 668-5132
http://www.anadigics.com
[email protected]
IMPORTANT NOTICE
ANADIGICS, Inc. reserves the right to make changes to its products or to discontinue any product at any time without
notice. The product specifications contained in Advanced Product Information sheets and Preliminary Data Sheets are
subject to change prior to a product’s formal introduction. Information in Data Sheets have been carefully checked and are
assumed to be reliable; however, ANADIGICS assumes no responsibilities for inaccuracies. ANADIGICS strongly urges
customers to verify that the information they are using is current before placing orders.
WARNING
ANADIGICS products are not intended for use in life support appliances, devices, or systems. Use of an ANADIGICS
product in any such application without written consent is prohibited.
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PRELIMINARY DATA SHEET - Rev 4
08/2001