HAMAMATSU S7998

PHOTODIODE
Si photodiode with preamp
S7998
Photodiode (3 × 3 mm)/preamplifier assembly in compact package
S7998 is a UV to near IR detector using a 3 × 3 mm photodiode integrated with preamplifier. The photodiode chip and the preamplifier are
assembled at high density by direct bump connections. The preamplifier bias current is so small that a high feedback resistance of 1 GΩ can be
used. Built-in feedback resistance types and metal package types are also available upon request.
Features
Applications
l Compact ceramic package: 13.2 × 7.37 mm
l Uses a UV to near IR Si photodiode (3 × 3 mm)
for high-precision photometry
l Precision photometry
l General photometry
l Uses a low bias current preamplifier: Ib=64 pA Max.
l Low noise
l Low current consumption
■ Absolute maximum ratings (Ta=25 °C)
Parameter
Preamp supply voltage
Photodiode reverse voltage
Operating temperature
Storage temperature
Symbol
Vcc
VR
Topr
Tstg
Value
±6
5
-20 to +60
-20 to +80
Unit
V
V
°C
°C
■ Electrical and optical characteristics of photodiode (Ta=25 °C)
Parameter
Spectral response range
Peak sensitivity wavelength
Photo sensitivity
Dark current
Shunt resistance
Terminal capacitance
Symbol
l
lp
S
ID
Rsh
Ct
Condition
l=200 nm
l=lp
VR=10 mV
VR=10 mV
VR=0 V, f=10 kHz
Min.
0.1
-
Typ.
190 to 1100
880
0.12
0.43
50
0.2
120
Max.
250
-
Unit
nm
nm
A/W
A/W
pA
GW
pF
Typ.
±0.7
4
±1
0.5
±4.9
1.3
33
1.5
1.3
Max.
±5
±64
32
1.7
Unit
mV
µV/°C
pA
pA
V
MHz
nVrms/Hz1/2
fA/Hz1/2
mA
■ Electrical and optical characteristics of preamp (Ta=25 °C, Vcc=±5 V)
Parameter
Symbol
Condition
Input offset voltage
Vos
Input offset voltage temperature drift DVos
Input bias current
Ib
Input offset current
Ios
Output voltage amplitude
Vo
RL=2 kW
Gain bandwidth
GBW
Equivalent noise input voltage
Vn
f=10 kHz
Equivalent noise input current
In
f=10 kHz
Supply current
Icc
Min.
±4.8
-
1
Si photodiode with preamp
■ Spectral response (photodiode only)
■ Frequency response
(Typ. Ta=25 ˚C)
(Typ. Ta=25 ˚C)
0.7
10
Rf=100 kΩ
Cf=200 pF
(EXTERNALLY
CONNECTED)
0
RELATIVE OUTPUT (dB)
PHOTO SENSITIVITY (A/W)
0.6
0.5
0.4
0.3
0.2
Rf=10 MΩ
Cf=10 pF
(EXTERNALLY
CONNECTED)
-10
-20
-30
Rf=1 GΩ
Cf=0.5 pF
(EXTERNALLY
CONNECTED)
-40
0.1
0
190
400
600
800
1000
-50
0.01
1200
0.1
WAVELENGTH (nm)
1
10
100
1000
10000
FREQUENCY (kHz)
KSPDB0191EA
■ Output noise characteristics
10
NOISE EQUIVALENT POWER NEP (fW/Hz1/2)
OUTPUT NOISE DENSITY (µVrms/Hz1/2)
10
Rf=10 MΩ
Cf=10 pF
(EXTERNALLY
CONNECTED)
1
0.1
0.001
0.01
Rf=100 kΩ
Cf=200 pF
(EXTERNALLY CONNECTED)
(Typ. Ta=25 ˚C)
7
106
105
10
4
Rf=100 kΩ
Cf=200 pF
(EXTERNALLY
CONNECTED)
103
102
Rf=10 MΩ, Cf=10 pF (EXTERNALLY CONNECTED)
Rf=1 GΩ, Cf=0.5 pF (EXTERNALLY CONNECTED)
1
0.1
1
10
100
1000
10000
FREQUENCY (kHz)
10
0.01
0.1
1
10
100
1000
10000
FREQUENCY (kHz)
KSPDB0193EA
2
KSPDB0192EA
■ Noise equivalent power vs. frequency
(Typ. Ta=25 ˚C)
Rf=1 GΩ
Cf=0.5 pF
(EXTERNALLY
CONNECTED)
100
0.01
S7998
KSPDB0194EA
Si photodiode with preamp
■ Dimensional outline (unit: mm)
■ Application circuit example
13.2 ± 0.2
Vcc+
3.0
(4.02)
7.37 ± 0.2
GLASS
12.2 × 7.2 × 5.0
PREAMP
0.905
0.46 ± 0.1
2.54 ± 0.15
P 2.54 × 3 =7.62
0.89 ± 0.3
ACTIVE AREA
Cf
0.1 µF
Rf
7.62 ± 0.3
(SPECIFIED AT THE LEAD ROOT)
(0.9)
3.0
(4.5)
0.25 ± 0.1
(2.16)
(5.2)
S7998
PACKAGE
+
RL
PHOTOSENSITIVE
SURFACE
CATHODE
SL
Vcc+
OUT
SD
Vcc+IN
-IN (PD A)
0.1 µF
Vcc-
KSPDA0147EA
KSPDC0040EA
Precautions for use
● ESD
S7998 may be damaged or their performance may deteriorate by such factors as electro static discharge from the human
body, surge voltages from measurement equipment, leakage voltages from soldering irons and packing materials, etc. As a
countermeasure against electro static discharge, the device, operator, work place and measuring jigs must all be set at the
same potential. The following precautions must be observed during use:
· To protect the device from electro static discharge which accumulate on the operator or the operator's clothes, use a wrist
strap or similar tools to ground the operator's body via a high impedance resistor (1 MΩ).
· A semiconductive sheet (1 MΩ to 100 MΩ) should be laid on both the work table and the floor in the work area.
· When soldering, use an electrically grounded soldering iron with an isolation resistance of more than 10 MΩ.
· For containers and packing, use of a conductive material or aluminum foil is effective. When using an antistatic material, use
one with a resistance of 0.1 MΩ/cm2 to 1 GΩ/cm2.
● Wiring
If electric current or voltage is applied in reverse polarity to an electronic device such as a preamplifier, this can degrade
device performance or destroy the device. Always check the wiring and dimensional outline to avoid misconnection.
Information furnished by HAMAMATSU is believed to be reliable. However, no responsibility is assumed for possible inaccuracies or omissions.
Specifications are subject to change without notice. No patent rights are granted to any of the circuits described herein. ©2003 Hamamatsu Photonics K.K.
HAMAMATSU PHOTONICS K.K., Solid State Division
1126-1 Ichino-cho, Higashi-ku, Hamamatsu City, 435-8558 Japan, Telephone: (81) 53-434-3311, Fax: (81) 53-434-5184, http://www.hamamatsu.com
U.S.A.: Hamamatsu Corporation: 360 Foothill Road, P.O.Box 6910, Bridgewater, N.J. 08807-0910, U.S.A., Telephone: (1) 908-231-0960, Fax: (1) 908-231-1218
Germany: Hamamatsu Photonics Deutschland GmbH: Arzbergerstr. 10, D-82211 Herrsching am Ammersee, Germany, Telephone: (49) 08152-3750, Fax: (49) 08152-2658
France: Hamamatsu Photonics France S.A.R.L.: 19, Rue du Saule Trapu, Parc du Moulin de Massy, 91882 Massy Cedex, France, Telephone: 33-(1) 69 53 71 00, Fax: 33-(1) 69 53 71 10
United Kingdom: Hamamatsu Photonics UK Limited: 2 Howard Court, 10 Tewin Road, Welwyn Garden City, Hertfordshire AL7 1BW, United Kingdom, Telephone: (44) 1707-294888, Fax: (44) 1707-325777
North Europe: Hamamatsu Photonics Norden AB: Smidesvägen 12, SE-171 41 Solna, Sweden, Telephone: (46) 8-509-031-00, Fax: (46) 8-509-031-01
Italy: Hamamatsu Photonics Italia S.R.L.: Strada della Moia, 1/E, 20020 Arese, (Milano), Italy, Telephone: (39) 02-935-81-733, Fax: (39) 02-935-81-741
Cat. No. KSPD1053E02
Feb. 2003 DN