LIGITEK LHRF9UG3392-P1-PF-TBS-8

LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
DURL COLOR LED LAMPS
Pb
Lead-Free Parts
LHRF9UG3392/P1-PF/TBS-8
DATA SHEET
DOC. NO :
QW0905-LHRF9UG3392/P1-PF/TBS-8
REV.
:
A
DATE
: 05 - Jan. - 2009
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
PART NO.LHRF9UG3392/P1-PF/TBS-8
Page 1/7
Package Dimensions
P2
ΔH
1.0
H2
H3
W2
1.3
H1
L
W0
W3
W1
D
+ - +
F
F
P1
9UG
HRF
P
+
1
T
2
+
3
1.ANODE GREEN
2.COMMON CATHODE
3.ANODE RED
LHRF9UG3392/PF-PF
5.0
5.9
7.6 8.6
10.5± 0.5
1.5
MAX
□0.5
TYP
9UG
HRF
18.0MIN
1
2
3
+
1
2.0MIN
2.0MIN
2.54TYP
2.54TYP
2
+
3
1.ANODE GREEN
2.COMMON CATHODE
3.ANODE RED
Note : 1.All dimension are in millimeter tolerance is ±0.25mm unless otherwise noted.
2.Specifications are subject to change without notice.
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
PART NO. LHRF9UG3392/P1-PF/TBS-8
Page 2/7
Absolute Maximum Ratings at Ta=25 ℃
Ratings
Symbol
Parameter
UNIT
HRF
9UG
Forward Current
IF
30
30
mA
Peak Forward Current
Duty 1/10@10KHz
IFP
90
60
mA
Power Dissipation
PD
75
75
mW
ESD
2000
V
Reverse Current @5V
Ir
10
μA
Operating Temperature
Topr
-40 ~ +85
℃
Storage Temperature
Tstg
-40 ~ +100
℃
Electrostatic Discharge( * )
Static Electricity or power surge will damage the LED. Use of a conductive wrist band or anti-electrosatic
* glove
is recommended when handing these LED. All devices, equipment and machinery must be properly
grounded.
Typical Electrical & Optical Characteristics (Ta=25 ℃)
PART NO
COLOR
MATERIAL
Emitted
AlGaInP
Lens
Red
Forward
Luminous
Viewing
Dominant Spectral
voltage
intensity
angle
wave
halfwidth
@20mA(V)
@20mA(mcd)
length
2
θ 1/2
△λ nm
λDnm
(deg)
Min. Max. Min. Typ.
630
20
1.5
2.4
220
350
70
574
20
1.7
2.6
120
220
70
White Diffused
LHRF9UG3392/P1-PF/TBS-8
AlGaInP
Green
Note : 1.The forward voltage data did not including ±0.1V testing tolerance.
2. The luminous intensity data did not including ± 15% testing tolerance.
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
PART NO.LHRF9UG3392/P1-PF/TBS-8
Page 3/7
•Dimension Symbol Information
SPECIFICATIONS
OPTION
SYMBOL
CODE
SYMBOL ITEMS
Minimum
Maximum
mm
inch
mm
inch
Tape Feed Hole Diameter
-------
D
3.8
0.15
4.2
0.17
Component Lead Pitch
-------
F
2.3
0.09
3.0
0.12
Front-To-Rear Deflection
-------
△H
-------
-------
2.0
0.08
0.96
25.5
TBS-8
H1
Feed Hole To Overall Component Height
-------
H2
-------
-------
36
1.42
Feed Hole To Tie Bar Bottom Component
-------
H3
18.15
0.71
19.15
0.75
Lead Length After Component Height
-------
L
11
0.43
Feed Hole Pitch
-------
P
12.4
0.49
13
0.51
Lead Location
-------
P1
4.4
0.17
5.8
0.23
Center Of Component Location
-------
P2
5.1
0.2
7.7
0.3
Overall Taped Package Thickness
-------
T
-------
-------
1.42
0.06
Feed Hole Location
-------
W0
8.5
0.33
9.75
0.38
Adhesive Tape Width
-------
W1
14.5
0.57
15.5
0.61
Adhesive Tape Position
-------
W2
0
0
4.0
0.16
Tape Width
-------
W3
17.5
0.69
19
0.75
Feed Hole To Bottom Of Component
24.5
W0
1.0
REMARK:TBS = Tape And Box Straight Leads
• Dimensions Symbol Information
• Package Dimensions
Specification
Description
Symbol
minimum
maxmum
mm
inch
mm
inch
Overall Length
L
330
13.0
340
13.4
Overall Width
W
265
10.4
275
10.8
Overall Thickness
H
50
1.97
60
2.4
Quantity/Box
2000PCS
W
L
H
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
PART NO. LHRF9UG3392/P1-PF/TBS-8
Page 4/7
Typical Electro-Optical Characteristics Curve
HRF CHIP
Fig.1 Forward current vs. Forward Voltage
Fig.2 Relative Intensity vs. Forward Current
3.5
Relative Intensity
Normalize @20mA
Forward Current(mA)
1000
100
10
1.0
0.1
3.0
2.5
2.0
1.5
1.0
0.5
0
1.0
1.5
2.0
2.5
3.0
1.0
10
1000
Forward Current(mA)
Forward Voltage(V)
Fig.3 Forward Voltage vs. Temperature
Fig.4 Relative Intensity vs. Temperature
3.0
Relative Intensity@20mA
Normalize@25 ℃
1.2
Forward Voltage@20mA
Normalize @25℃
100
1.1
1.0
0.9
0.8
-40
-20
-0
20
40
60
80
100
2.5
2.0
1.5
1.0
0.5
0
-40
-20
0
20
40
60
80
Ambient Temperature( ℃)
Ambient Temperature( ℃)
Relative Intensity@20mA
Fig.5 Relative Intensity vs. Wavelength
1.0
0°
-30°
0.5
30°
-60°
0
550
600
650
Wavelength (nm)
700
100% 75% 50%
60°
25%
0
25% 50% 75% 100%
100
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
PART NO. LHRF9UG3392/P1-PF/TBS-8
Page 5/7
Typical Electro-Optical Characteristics Curve
9UG CHIP
Fig.1 Forward current vs. Forward Voltage
Fig.2 Relative Intensity vs. Forward Current
3.0
Relative Intensity
Normalize @20mA
Forward Current(mA)
1000
100
10
1.0
0.1
2.5
2.0
1.5
1.0
0.5
0
1.0
2.0
3.0
4.0
5.0
1.0
10
1.2
Fig.4 Relative Intensity vs. Temperature
Relative Intensity @20mA
Normalize @25℃
Forward Voltage@20mA
Normaliz @25℃
Fig.3 Forward Voltage vs. Temperature
1.1
1.0
0.9
0.8
-20
0
20
40
60
1000
Forward Current(mA)
Forward Voltage(V)
-40
100
80
100
3.0
2.5
2.0
1.5
1.0
0.5
0
-40
0
-20
20
40
60
80
100
Ambient Temperature( ℃)
Ambient Temperature( ℃)
Relative Intensity @20mA
Fig.5 Relative Intensity vs. Wavelength
1.0
0°
-30°
0.5
30°
-60°
60°
0
100% 75% 50%
500
550
600
Wavelength (nm)
650
25%
0
25% 50% 75% 100%
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
Page 6/7
PART NO. LHRF9UG3392/P1-PF/TBS-8
Soldering Condition(Pb-Free)
1.Iron:
Soldering Iron:30W Max
Temperature 350°C Max
Soldering Time:3 Seconds Max(One time only)
Distance:2mm Min(From solder joint to body)
2.Wave Soldering Profile
Dip Soldering
Preheat: 120° C Max
Preheat time: 60seconds Max
Ramp-up
2° C/sec(max)
Ramp-Down:-5°C/sec(max)
Solder Bath:260° C
Dipping Time:3 seconds Max
Distance:2mm Min(From solder joint to body)
Temp(° C)
260° C3sec Max
260°
5° /sec
max
120°
25°
0° 0
2° /sec
max
Preheat
50
100
60 Seconds Max
Note: 1.Wave solder should not be made more than one time.
2.You can just only select one of the soldering conditions as above.
150
Time(sec)
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
PART NO. LHRF9UG3392/P1-PF/TBS-8
Page 7/7
Reliability Test:
Test Item
Test Condition
Description
Reference
Standard
Operating Life Test
1.Under Room Temperature
2.If=20mA
3.t=1000 hrs (-24hrs, +72hrs)
This test is conducted for the purpose
of detemining the resistance of a part
in electrical and themal stressed.
MIL-STD-750: 1026
MIL-STD-883: 1005
JIS C 7021: B-1
High Temperature
Storage Test
1.Ta=105 ℃±5℃
2.t=1000 hrs (-24hrs, +72hrs)
The purpose of this is the resistance of
the device which is laid under condition
of high temperature for hours.
MIL-STD-883:1008
JIS C 7021: B-10
Low Temperature
Storage Test
1.Ta=-40 ℃±5 ℃
2.t=1000 hrs (-24hrs, +72hrs)
The purpose of this is the resistance
of the device which is laid under
condition of low temperature for hours.
High Temperature
High Humidity Test
1.Ta=65 ℃±5 ℃
2.RH=90 %~95%
3.t=240hrs ±2hrs
The purpose of this test is the resistance
of the device under tropical for hours.
1.Ta=105 ℃±5℃&-40 ℃±5℃
(10min) (10min)
2.total 10 cycles
The purpose of this is the resistance of
the device to sudden extreme changes
in high and low temperature.
MIL-STD-202: 107D
MIL-STD-750: 1051
MIL-STD-883: 1011
Solder Resistance
Test
1.T.Sol=260 ℃±5 ℃
2.Dwell time= 10 ±1sec.
This test intended to determine the
thermal characteristic resistance
of the device to sudden exposures
at extreme changes in temperature
when soldering the lead wire.
MIL-STD-202: 210A
MIL-STD-750: 2031
JIS C 7021: A-1
Solderability Test
1.T.Sol=230 ℃±5 ℃
2.Dwell time=5 ±1sec
This test intended to see soldering well
performed or not.
MIL-STD-202: 208D
MIL-STD-750: 2026
MIL-STD-883: 2003
JIS C 7021: A-2
Thermal Shock Test
JIS C 7021: B-12
MIL-STD-202:103B
JIS C 7021: B-11