NSC ADC1038CIWM

ADC1038
10-Bit Serial I/O A/D Converter with Analog Multiplexer
and Track/Hold Function
General Description
Features
The ADC1038 is a 10-bit successive approximation A/D converters with serial I/O. The serial input controls a
single-ended analog multiplexer that selects one of 8 input
channels. The serial output data can be configured into a
left- or right-justified format.
An input track/hold is implemented by a capacitive reference
ladder and sampled-data comparator. This allows the analog
input to vary during the A/D conversion cycle.
Separate serial I/O and conversion clock inputs are provided
to facilitate the interface to various microprocessors.
n Serial I/O ( MICROWIRE™ compatible)
n Separate asynchronous converter clock and serial data
I/O clock
n Analog input track/hold function
n Ratiometric or absolute voltage referencing
n No zero or full scale adjustment required
n 0V to 5V analog input range with single 5V power
supply
n TTL/MOS input/output compatible
n No missing codes
Applications
Key Specifications
n
n
n
n
Engine control
Process control
Instrumentation
Test equipment
n
n
n
n
n
n
Resolution
Total unadjusted error
Single supply
Power dissipation
Max. conversion time (fC = 3 MHz)
Serial data exchange time (fS = 1 MHz)
10 bit
± 1 LSB (max)
5V ± 5%
20 mW (max)
13.7 µs (max)
10 µs (max)
Connection Diagrams
SO Package
DS010556-2
Top View
ADC1038 In NS Package
M20B
Ordering Information
Industrial −40˚C ≤ TA ≤ +85˚C
ADC1038CIWM
Package
M20B
TRI-STATE ® is a registered trademark of National Semiconductor Corporation.
MICROWIRE™ is a trademark of National Semiconductor Corporation.
© 1999 National Semiconductor Corporation
DS010556
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ADC1038 10-Bit Serial I/O A/D Converter with Analog Multiplexer and Track/Hold Function
June 1999
Absolute Maximum Ratings (Notes 1, 3)
Soldering Information
SO Package (Note 7) :
Vapor Phase (60 sec.)
Infrared (15 sec.)
Storage Temperature
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Supply Voltage (VCC)
Voltage at Inputs and Outputs
Input Current at Any Pin (Note 4)
Package Input Current (Note 4)
Package Dissipation
at TA = 25˚C (Note 5)
ESD Susceptability (Note 6)
6.5V
−0.3V to VCC + 0.3V
± 5 mA
± 20 mA
Operating Ratings
Temperature Range
ADC1038CIWM
Supply Voltage (VCC)
Reference Voltage
(VREF = VREF+ − VREF−)
500 mW
2000V
215˚C
220˚C
−65˚C to +150˚C
(Notes 2, 3)
TMIN ≤ TA ≤ TMAX
−40˚C ≤ TA ≤ +85˚C
4.75 VDC to 5.25 VDC
2.0 VDC to VCC + 0.05V
Electrical Characteristics
The following specifications apply for VCC = +5.0V, VREF = +4.6V, fS = 700 kHz, and fC = 3 MHz unless otherwise specified.
Boldface limits apply for TA = TJ = TMIN to TMAX ; all other limits TA = TJ = 25˚C.
Symbol
Parameter
Conditions
Typical
Limit
Units
(Note 8)
(Note 9)
(Limits)
±1
LSB (max)
10
Bits (min)
5
kΩ (min)
CONVERTER AND MULTIPLEXER CHARACTERISTICS
Total Unadjusted
CIN, CIWM, CMJ
(Note 10)
Error
Differential Linearity
RREF
Reference Input Resistance
VREF
Reference Voltage
VIN
Analog Input Voltage
8
(Note 11)
On Channel Leakage Current
(Note 12)
Off Channel Leakage Current
On Channel = 5 VDC,
Off Channel = 0 VDC
On Channel = 0 VDC,
Off Channel = 5 VDC
On Channel = 5 VDC,
Off Channel = 0 VDC
On Channel = 0 VDC,
Off Channel = 5 VDC
(Note 12)
Power Supply
Zero Error
Sensitivity
Full Scale Error
kΩ
11
kΩ (max)
(VCC + 0.05)
V (max)
(VCC + 0.05)
V (max)
(GND − 0.05)
V (min)
5.0
200
nA (max)
500
nA (max)
5.0
−200
nA (max)
−500
nA (max)
5.0
5.0
4.75 VDC ≤ VCC ≤ 5.25 VDC
−200
nA (max)
−500
nA (max)
200
nA (max)
500
nA (max)
± 1/4
± 1/4
LSB (max)
LSB (max)
DIGITAL AND DC CHARACTERISTICS
VIN(1)
Logical “1” Input Voltage
VIN(0)
Logical “0” Input Voltage
IIN(1)
Logical “1” Input Current
IIN(0)
Logical “0” Input Current
VOUT(1)
Logical “1” Output Voltage
VOUT(0)
Logical “0” Output Voltage
IOUT
TRI-STATE Output Current
VCC = 5.25 VDC
VCC = 4.75 VDC
VIN = 5.0 VDC
VIN = 0 VDC
VCC = 4.75 VDC
V (min)
0.8
V (max)
0.005
2.5
µA (max)
−0.005
−2.5
µA (max)
2.4
V (min)
IOUT = −360 µA
IOUT = −10 µA
VCC = 4.75 VDC
IOUT = 1.6 mA
ISOURCE
Output Source Current
ISINK
Output Sink Current
VOUT = 0V
VOUT = 5V
VOUT = 0V
VOUT = VCC
ICC
Supply Current
CS = HIGH, VREF Open
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2.0
2
4.5
V (min)
0.4
V (max)
−0.01
−3
µA (max)
0.01
3
µA (max)
−14
−6.5
mA (min)
16
8.0
mA (min)
1.5
3
mA (max)
Electrical Characteristics
(Continued)
The following specifications apply for VCC = +5.0V, VREF = +4.6V, fS = 700 kHz, and fC = 3 MHz unless otherwise specified.
Boldface limits apply for TA = TJ = TMIN to TMAX ; all other limits TA = TJ = 25˚C.
Symbol
Parameter
Conditions
Typical
Limit
Units
(Note 8)
(Note 9)
(Limits)
3.0
MHz (max)
AC CHARACTERISTICS
fC
fS
Conversion Clock (CCLK)
0.7
Frequency
4.0
Serial Data Clock (SCLK)
Frequency (Note 13)
TC
tCA
fC = 3 MHz, R/L = “0”
fC = 3 MHz, R/L = “1”
fC = 3 MHz, R/L = “0” or R/L = “1”
MHz (min)
183
kHz (min)
622
2
kHz (min)
1.0
MHz (max)
(max)
Conversion Time
Not Including MUX Addressing and
41 (1/fC)
+ 200 ns
Analog Sampling Time
Analog Input Sampling Times
After Address is Latched,CS = Low
4.5 (1/fS)
(max)
+ 200 ns
tACC
Access Time Delay from CS or OE
OE = “0”
100
200
ns (max)
75
150
ns (min)
100
120
ns (max)
Falling Edge to DO Data Valid
tSET-UP
Set-up Time of CS Falling
Edge to SCLK Rising Edge
t1H, t0H
Delay from OE or CS Rising
RL = 3 kΩ, CL = 100 pF
Edge to DO TRI-STATE
tHDI
DI Hold Time from SCLK Rising Edge
0
50
ns (min)
tSDI
DI Set-up Time to SCLK Rising Edge
50
100
ns (min)
tHDO
DO Hold Time from SCLK Falling Edge
tDDO
Delay from SCLK Falling
RL = 30 kΩ, CL = 100 pF
RL = 30 kΩ, CL = 100 pF
70
10
ns (min)
150
250
ns (max)
Edge to DO Data Valid
tRDO
tFDO
CIN
DO Rise Time
DO Fall Time
Input Capacitance
RL = 30 kΩ,
CL = 100 pF
RL = 30 kΩ,
CL = 100 pF
TRI-STATE to High
35
75
ns (max)
Low to High
75
150
ns (max)
TRI-STATE to Low
35
75
ns (max)
High to Low
75
150
ns (max)
Analog Inputs (CH0–CH7)
50
pF
All Other Inputs
7.5
pF
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur.
Note 2: Operating Ratings indicate conditions for which the device is functional, but do not guarantee specific performance limits. For guaranteed specifications and
test conditions, see the Electrical Characteristics. The guaranteed specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test conditions.
Note 3: All voltages are measured with respect to AGND and DGND, unless otherwise specified.
Note 4: When the input voltage (VIN) at any pin exceeds the power supplies (VIN < DGND, or VIN > VCC) the current at that pin should be limited to 5 mA. The 20 mA
maximum package input current rating limits the number of pins that can safely exceed the power supplies with an input current of 5 mA to four pins.
Note 5: The maximum power dissipation must be derated at elevated temperatures and is dictated by TJmax, θJA and the ambient temperature, TA. The maximum
allowable power dissipation at any temperature is PD = (TJmax − TA)/θJA or the number given in the Absolute Maximum Ratings, whichever is lower. For this device,
TJmax = 125˚C. The typical thermal resistance (θJA) when board mounted is 64˚C/W.
Note 6: Human body model, 100 pF capacitor discharged through a 1.5 kΩ resistor.
Note 7: See AN450 “Surface Mounting Methods and Their Effect on Product Reliability” or Linear Databook section “Surface Mount” for other methods of soldering
surface mount devices.
Note 8: Typicals are at TJ = 25˚C and represent most likely parametric norm.
Note 9: Limits are guaranteed to National’s AOQL (Average Outgoing Quality Level).
Note 10: Total unadjusted error includes offset, full-scale, linearity, multiplexer, and hold step errors.
Note 11: Two on-chip diodes are tied to each analog input. They will forward-conduct for analog input voltages one diode drop below ground or one diode drop
greater than VCC supply. Be careful during testing at low VCC levels (4.5V), as high level analog inputs (5V) can cause an input diode to conduct, especially at elevated temperatures, which will cause errors for analog inputs near full-scale. The spec allows 50 mV forward bias of either diode; this means that as long as the
analog VIN does not exceed the supply voltage by more than 50 mV, the output code will be correct. Exceeding this range on an unselected channel will corrupt the
reading of a selected channel. To achieve an absolute 0 VDC to 5 VDC input voltage range will therefore require a minimum supply voltage of 4.950 VDC over temperature variations, initial tolerance and loading.
Note 12: Channel leakage current is measured after the channel selection.
Note 13: In order to synchronize the serial data exchange properly, SARS needs to go low after completion of the serial I/O data exchange. If this does not occur
the output shift register will be reset and the correct output data lost. The minimum limit for SCLK will depend on CCLK frequency and whether right-justified or
left-justified, and can be determined by the following equations:
fS > (8.5/41) (fC) with right-justification (R/L = “1”) and fS > (2.5/41) (fC) with left-justification (R/L = “0”).
3
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Typical Performance Characteristics
Power Supply Current
(ICC) vs CCLK
Power Supply Current (ICC)
vs Ambient Temperature
DS010556-29
DS010556-28
Linearity Error vs
CCLK Frequency
Linearity Error vs
Ambient Temperature
Zero Error vs
Reference Voltage
DS010556-34
4
DS010556-30
Linearity Error vs
Reference Voltage
DS010556-32
DS010556-31
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Reference Current (IREF)
vs Ambient Temperature
DS010556-33
Test Circuits
t1H, t0H
DO except “TRI-STATE”
Leakage Current
DS010556-6
DS010556-7
DS010556-8
Timing Diagrams
DO High to Low State
DS010556-9
DO Low to High State
DO “TRI-STATE” Rise
and Fall Times
DS010556-10
DS010556-11
DI Data Input Timing
DO Data Output Timing
DS010556-12
DS010556-13
5
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Timing Diagrams
(Continued)
ADC1038 CS High during Conversion
DS010556-15
CCLK continuously enabled
ADC1038 CS Low Continuously
DS010556-16
CCLK continuously enabled
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6
Multiplexer Address/Channel Assignment Table
MUX Address
A2
A1
MUX Address
Analog
A0
Channel
Analog
A2
A1
A0
Channel
0
0
CH4
Selected
Selected
0
0
0
CH0
1
0
0
1
CH1
1
0
1
CH5
0
1
0
CH2
1
1
0
CH6
0
1
1
CH3
1
1
1
CH7
7
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DS010556-17
ADC1038 Functional Block Diagram
1.0 Pin Descriptions
CCLK
The clock applied to this input controls the successive approximation conversion time interval.
The clock frequency applied to this input can be
between 700 kHz and 4 MHz.
SCLK
The serial data clock input. The clock applied to
this input controls the rate at which the serial
data exchange occurs and the analog sampling
time available to acquire an analog input voltage. The rising edge loads the information on
the DI pin into the multiplexer address shift reg-
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DI
8
ister (address register). This address controls
which channel of the analog input multiplexer
(MUX) is selected.
The falling edge shifts the data resulting from
the previous A/D conversion out on DO. CS and
OE enable or disable the above functions.
The serial data input pin. The data applied to
this pin is shifted by SCLK into the multiplexer
address register. The first 3 bits of data (A0–A2)
are the MUX channel address (see the Multiplexer Address/Channel Assignment tables).
The fourth bit (R/L ) determines the data format
of the conversion result in the conversion to be
1.0 Pin Descriptions
DO
2.0 Functional Description
(Continued)
started. When R/L is low the output data format
is left-justified; when high it is right-justified.
When right-justified, six leading “0”s are output
on DO before the MSB information; thus the
complete conversion result is shifted out in 16
clock periods.
The data output pin. The A/D conversion result
(D0–D9) is output on this pin. This result can be
left- or right-justified depending on the value of
R/L bit shifted in on DI.
SARS
This pin is an output and indicates the status of
the internal successive approximation register
(SAR). When high, it signals that the A/D conversion is in progress. This pin is set high after
the analog input sampling time (tCA) and remains high for 41 CCLK periods. When SARS
goes low, the output shift register has been
loaded with the conversion result and another
A/D conversion sequence can be started.
CS
The chip select pin. When a low is applied to
this pin, the rising edge of SCLK shifts the data
on DI into the address register.
2.1 DIGITAL INTERFACE
The ADC1038 implement its serial interface via seven digital
control lines. There are two clock inputs for the ADC1038.
The SCLK controls the rate at which the serial data exchange
occurs and the duration of the analog sampling time window.
The CCLK controls the conversion time and must be continuously enabled. A low on CS enables the rising edge of SCLK
to shift in the serial multiplexer addressing data on the DI pin.
The first three bits of this data select the analog input channel (see the Channel Addressing Tables). The following bit,
R/L , selects the output data format (right-justified or
left-justified) for the conversion to be started. With CS and
OE low the DO pin is active (out of TRI-STATE ® ) and the falling edge of SCLK shifts out the data from the previous analog
conversion. When the first conversion is started the data
shifted out on DO is erroneous as it depends on the state of
the Parallel Load 16-Bit Shift Register on power up, which is
unpredictable.
The ADC1031 implements its serial interface with only four
control pins since it has only one analog input and comes in
an eight pin mini-dip package. The SCLK, CCLK, CS and DO
pins are available for the serial interface. The output data format cannot be selected and defaults to a left-justified format.
The state of DO is controlled by CS only.
OE
The output enable pin. When OE and CS are
both low the falling edge of SCLK shifts out the
previous A/D conversion data on the DO pin.
CH0–CH7 The analog inputs of the MUX. A channel input
is selected by the address information at the DI
pin, which is loaded on the rising edge of SCLK
into the address register.
Source impedances (RS) driving these inputs
should be kept below 1 kΩ. If RS is greater than
1 kΩ, the sampled data comparator will not
have enough time to acquire the correct value of
the applied input voltage.
The voltage applied to these inputs should not
exceed VCC or go below DGND or AGND by
more than 50 mV. Exceeding this range on an
unselected channel will corrupt the reading of a
selected channel.
VREF+ The positive analog voltage reference for the analog inputs. In order to maintain accuracy the voltage range of VREF (VREF = VREF+ − VREF−) is
2.5 VDC to 5.0 VDC and the voltage at VREF+ cannot
exceed VCC + 50 mV.
VREF− The negative voltage reference for the analog inputs. In order to maintain accuracy the voltage at
this pin must not go below DGND and AGND by
more than 50 mV or exceed 40% of VCC (for VCC =
5V, VREF− (max) = 2V).
The power supply pin. The operating voltage range
VCC
of VCC is 4.75 VDC to 5.25 VDC. VCC should be bypassed with 10 µF and 0.1 µF capacitors to digital
ground for proper operation of the A/D converter.
2.2 OUTPUT DATA FORMAT
When R/L is low the output data format is left-justified; when
high it is right-justified. When right-justified, six leading “0”s
are output on DO before the MSB, and the complete conversion result is shifted out in 16 clock periods.
2.3 CS HIGH DURING CONVERSION
With a continuous SCLK input, CS must be used to synchronize the serial data exchange. A valid CS is recognized if it
occurs at least 100 ns (tSET-UP) before the rising edge of
SCLK, thus causing data to be input on DI. If this does not occur there will be an uncertainty as to which SCLK rising edge
will clock in the first bit of data. CS must remain low during
the complete I/O exchange. Also, OE needs to be low if data
from the previous conversion needs to be accessed.
2.3.1 CS LOW CONTINUOUSLY
Another way to accomplish synchronous serial communication is to tie CS low continuously and use SARS and SCLK to
synchronize the serial data exchange. SCLK can be disabled
low during the conversion time and enabled after SARS
goes low. With CS low during the conversion time a zero will
remain on DO until the conversion is completed. Once the
conversion is complete, the falling edge of SARS will shift
out on DO the MSB before SCLK is enabled. This MSB would
be a leading zero if right-justified or D9 if left-justified. The
rest of the data will be shifted out once SCLK is enabled as
discussed previously. If CS goes high during the conversion
sequence DO is put into TRI-STATE, and the conversion result is not affected so long as CS remains high until the end
of the conversion.
DGND,
AGND
The digital and analog ground pins. In order to maintain accuracy the voltage difference between these
two pins must not exceed 300 mV.
2.4 TYING SCLK and CCLK TOGETHER
SCLK and CCLK can be tied together. The total conversion
time will increase because the maximum clock frequency is
now 1 MHz. The timing diagrams and the serial I/O exchange time (10 SCLK cycles) remain the same, but the conversion time (TC = 41 CCLK cycles) lengthens from a minimum of 14 µs to a minimum of 41 µs. In the case where CS
GND The digital and analog ground pin for the ADC1031.
9
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2.0 Functional Description
of the full scale input signal amplitude to the value of the total
error amplitude (including noise) caused by the transfer
function of the A/D. An ideal 10 bit A/D converter with a total
unadjusted error of 0 LSB would have a signal to noise ratio
of about 62 dB, which can be derived from the equation:
S/N = 6.02(N) + 1.76
(Continued)
is low continuously, since the applied clock cannot be disabled, SARS must be used to synchronize the data output
on DO and initiate a new conversion. The falling edge of
SARS sends the MSB information out on DO. The next rising
edge of the clock shifts in MUX address bit A2 on DI. The following clock falling edge will clock the next data bit of information out on DO. A conversion will be started after MUX addressing information has been loaded in (3 more clocks) and
the analog sampling time (4.5 clocks) has elapsed.
where S/N is in dB and N is the number of bits. Figure 2
shows the signal to noise ratio vs. input frequency of a typical ADC1038 with 1⁄2 LSB total unadjusted error. The dotted
lines show signal-to-noise ratios for an ideal (noiseless) 10
bit A/D with 0 LSB error and an A/D with a 1 LSB error.
The sample-and-hold error specifications are included in the
error and timing specifications of the A/D. The hold step and
gain error sample/hold specs are taken into account in the
total unadjusted error specification, while the hold settling
time is included in the A/D’s maximum conversion time
specification. The hold droop rate can be thought of as being
zero since an unlimited amount of time can pass between a
conversion and the reading of data. However, once the data
is read it is lost and another conversion is started.
3.0 Analog Considerations
3.1 THE INPUT SAMPLE AND HOLD
The sample/hold capacitor is implemented in its capacitive
ladder structure. After the channel address is received, the
ladder is switched to sample the proper analog input. This
sampling mode is maintained for 4.5 SCLK cycles after the
multiplexer addressing information is loaded in. The sampling of the analog input starts on SCLK’s 4th rising edge.
3.2 INPUT FILTERING
Due to the sampling nature of the analog input, transients
will appear on the input pins. They are caused by the ladder
capacitance and internal stray capacitance charging current
flowing into VIN. These transients will not degrade the A/D’s
performance if they settle out within the sampling window.
This will occur if external source resistance is kept to a
minimum.
DS010556-18
FIGURE 1. Analog Input Model
An acquisition window of 4.5 SCLK cycles is available to allow the ladder capacitance to settle to the analog input voltage. Any change in the analog voltage before or after the acquisition window will not effect the A/D conversion result.
In the most simple case, the ladder’s acquisition time is determined by the Ron (9 kΩ) of the multiplexer switches, the
CS1 (3.5 pF) and the total ladder (CL) and stray (CS2) capacitance (48 pF). For large source resistance the analog input
can be modeled as an RC network as shown in Figure 1. The
values shown yield an acquisition time of about 3 µs for 10
bit accuracy with a zero to a full scale change in the reading.
External source resistance and capacitance will lengthen the
acquisition time and should be accounted for.
The curve “Signal to Noise Ratio vs Output Frequency” (Figure 2) gives an indication of the usable bandwidth. The signal to noise ratio of an ideal A/D is the ratio of the RMS value
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DS010556-19
FIGURE 2. ADC1038 Signal to
Noise Ratio vs Input Frequency
10
3.0 Analog Considerations
(Continued)
External Reference 2.5V Full Scale
Power Supply as Reference
DS010556-20
DS010556-21
Input Not Referred to GND
DS010556-22
Note 14: *Current path must still exist from VIN(−) to ground
FIGURE 3. Analog Input Options
eration and in many cases the chip power supply can be
used for transducer power as well as the VREF source.
3.3 REFERENCE AND INPUT
The two VREF inputs are fully differential and define the zero
to full-scale input range of the A to D converter. This allows
the designer to easily vary the span of the analog input since
this range will be equivalent to the voltage difference between VREF+ and VREF−. By reducing VREF (VREF = VREF+ −
VREF−) to less than 5V, the sensitivity of the converter can be
increased (i.e., if VREF = 2V then 1 LSB = 1.95 mV). The
input/reference arrangement also facilitates ratiometric op-
This reference flexibility lets the input span not only be varied
but also offset from zero. The voltage at VREF− sets the input
level which produces a digital output of all zeros. Though VIN
is not itself differential, the reference design allows nearly
differential-input capability for many measurement applications. Figure 3 shows some of the configurations that are
possible.
Power Supply Bypassing
DS010556-23
DS010556-24
11
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Protecting the Analog Inputs
DS010556-26
DS010556-25
Diodes are IN914
Zero-Shift and Span-Adjust (2V ≤ VIN ≤ 4.5V)
DS010556-27
*1% resistors
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12
inches (millimeters) unless otherwise noted
Order Number ADC1038CIWM
NS Package Number M20B
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ADC1038 10-Bit Serial I/O A/D Converter with Analog Multiplexer and Track/Hold Function
Physical Dimensions