NSC ADC16DV160

ADC16DV160
August 17, 2009
Dual Channel, 16-Bit, 160 MSPS Analog-to-Digital
Converter with DDR LVDS Outputs
General Description
The ADC16DV160 is a monolithic dual channel high performance CMOS analog-to-digital converter capable of converting analog input signals into 16-bit digital words at rates up to
160 Mega Samples Per Second (MSPS). This converter uses
a differential, pipelined architecture with digital error correction and an on-chip sample-and-hold circuit to minimize power consumption and external component count while providing excellent dynamic performance. Automatic power-up
calibration enables excellent dynamic performance and reduces part-to-part variation, and the ADC16DV160 can be recalibrated at any time through the 3-wire Serial Peripheral
Interface (SPI). An integrated low noise and stable voltage
reference and differential reference buffer amplifier eases
board level design. The on-chip duty cycle stabilizer with low
additive jitter allows a wide range of input clock duty cycles
without compromising dynamic performance. A unique sample-and-hold stage yields a full-power bandwidth of 1.4 GHz.
The interface between the ADC16DV160 and a receiver block
can be easily verified and optimized via fixed pattern generation and output clock position features. The digital data is
provided via dual data rate LVDS outputs – making possible
the 68-pin, 10 mm x 10 mm LLP package. The ADC16DV160
operates on dual power supplies of +1.8V and +3.0V with a
power-down feature to reduce power consumption to very low
levels while allowing fast recovery to full operation.
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On-chip low jitter duty-cycle stabilizer
Power-down and sleep modes
Output fixed pattern generation
Output clock position adjustment
3-wire SPI
Offset binary or 2's complement data format
68-pin LLP package (10x10x0.8, 0.5mm pin-pitch)
Key Specifications
■ Resolution
■ Conversion Rate
■ SNR
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(@FIN = 30 MHz)
(@FIN = 197 MHz)
SFDR
(@FIN = 30 MHz)
(@FIN = 197 MHz)
Full Power Bandwidth
Power Consumption
-Core per channel
-LVDS Driver
-Total
Operating Temperature Range
16 Bits
160 MSPS
78.5 dBFS (typ)
76.3 dBFS (typ)
95 dBFS (typ)
91.2 dBFS (typ)
1.4 GHz (typ)
591 mW (typ)
118 mW (typ)
1.3W (typ)
-40°C ~ 85°C
Features
Applications
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■ Multi-carrier, Multi-standard Base Station Receivers
Low power consumption
On-chip precision reference and sample-and-hold circuit
On-chip automatic calibration during power-up
Dual data rate LVDS output port
Dual Supplies: 1.8V and 3.0V operation
Selectable input range: 2.4, 2.0, 1.5 and 1.0VPP
Sampling edge flipping with clock divider by 2 option
Integer clock divider by 1 or 2
© 2009 National Semiconductor Corporation
301014
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-MC-GSM/EDGE, CDMA2000, UMTS, LTE and WiMAX
High IF Sampling Receivers
Diversity Channel Receivers
Test and Measurement Equipment
Communications Instrumentation
Portable Instrumentation
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ADC16DV160 Dual Channel, 16-Bit, 160 MSPS Analog-to-Digital Converter with DDR LVDS
Outputs
PRELIMINARY
ADC16DV160
Block Diagram
30101402
Functional Block Diagram
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2
ADC16DV160
Connection Diagram
30101401
Pin-Out of ADC16DV160
Ordering Information
Industrial (−40°C ≤ +85°C)
Package
ADC16DV160CILQ
68–pin LLP
ADC16DV160EB
Evaluation Board
3
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ADC16DV160
Pin Descriptions
Pin(s)
Name
Type
66
20
VIN+1
VIN+Q
Input
67
19
VIN−1
VIN−Q
Input
Function and Connection
ANALOG I/O
7, 8
10, 11
5, 6
12, 13
2
16
VRPI
VRPQ
VRNI
VRNQ
VRMI
VRMQ
Differential analog input pins. The differential full-scale input signal level
is 2.4 VPP by default, but can be set to 2.4/2.0/1.5/1.0 VPP via SPI. Each
input pin signal is centered on a common mode voltage, VCM.
Output
Upper reference voltage.
This pin should not be used to source or sink current. The decoupling
capacitor to AGND (low ESL 0.1 µF) should be placed very close to the
pin to minimize stray inductance. VRP needs to be connected to VRN
through a low ESL 0.1 µF and a low ESR 10 µF capacitors in parallel.
Output
Lower reference voltage.
This pin should not be used to source or sink current. The decoupling
capacitor to AGND (low ESL 0.1 µF) should be placed very close to the
pin to minimize stray inductance. VRN needs to be connected to VRP
through a low ESL 0.1 µF and a low ESR 10 µF capacitors in parallel.
Output
Common mode voltage
The decoupling capacitor to AGND (low ESL 0.1 µF) should be placed
as close to the pin as possible to minimize stray inductance. It is
recommended to use VRM to provide the common mode voltage for the
differential analog inputs.
Internal reference voltage output / External reference voltage input. By
default, this pin is the output for the internal 1.2V voltage reference. This
pin should not be used to sink or source current and should be
decoupled to AGND with a 0.1 µF, low ESL capacitor. The decoupling
capacitors should be placed as close to the pins as possible to minimize
inductance and optimize ADC performance. The decoupling capacitor
should not be larger than 0.1 µF, otherwise dynamic performance after
power-up calibration can decrease due to the extended VREF settling
time.
This pin can also be used as the input for a low noise external reference
voltage. The output impedance for the internal reference at this pin is
9kΩ and this can be overdriven provided the impedance of the external
source is < 9kΩ. Careful decoupling is just as essential when an external
reference is used. The 0.1 µF low ESL decoupling capacitor should be
placed as close to this pin as possible.
The default Input differential voltage swing is equal to 2 * VREF, although
this can be changed through the SPI.
9
VREF
Output/Input
26
CLK+
Input
25
CLK−
Input
SCLK
Input
Serial Clock. Serial data is shifted into and out of the device synchronous
with this clock signal.
Input/Output
Serial Data In/Out. Serial data is shifted into the device on this pin while
the CSB signal is asserted and data input mode is selected. Serial data
is shifted out of the device on this pin while CSB is asserted and data
output mode is selected.
Input
Serial Chip Select. When this signal is asserted SCLK is used to clock
input or output serial data on the SDIO pin. When this signal is deasserted, the SDIO pin is a high impedence and the input data is
ignored.
Differential clock input pins. DC biasing is provided internally. For singleended clock mode, drive CLK+ through AC coupling while decoupling
CLK- pin to AGND.
DIGITAL I/O
23
24
27
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SDIO
CSB
4
Name
28 - 43
61 - 46
D1/0+/-Q to
D15/14+/-Q
D1/0+/-I to
D15/14+/-I
Type
Function and Connection
Output
LVDS Data Output. The 16-bit digital output of the data converter is
provided on these ports in a dual data rate manner. A 100Ω termination
resistor must be placed between each pair of differential signals at the
far end of the transmission line. The odd bit data is output first and should
be captured first when de-interleaving the data.
OUTCLK+/-
Output
Output Clock. This pin is used to clock the output data. It has the same
frequency as the sampling clock. One word of data is output in each
cycle of this signal. A 100Ω termination resistor must be placed between
the differential clock signals at the far end of the transmission line. The
falling edge of this signal should be used to capture the odd bit data
(D15, D13, D11…D1). The rising edge of this signal should be used to
capture the even bit data (D14, D12, D10…D0).
4, 14, 22, 64
VA3.0
Analog Power
3.0V Analog Power Supply. These pins should be connected to a quiet
source and should be decoupled to AGND with 0.1 µF capacitors
located close to the power pins.
1 17
VA1.8
Analog Power
3.0V Analog Power Supply. These pins should be connected to a quiet
source and should be decoupled to AGND with 0.1 µF capacitors
located close to the power pins.
44 45
POWER SUPPLIES
0, 3, 15, 18, 21,
65, 68
AGND
Analog Ground
Analog Ground Return.
Pin 0 is the exposed pad on the bottom of the package. The exposed
pad must be connected to the ground plane to ensure rated
performance.
62
VDR
Analog Power
Output Driver Power Supply. This pin should be connected to a quiet
voltage source and be decoupled to DRGND with a 0.1 µF capacitor
close to the power pins.
63
DRGND
Ground
Output Driver Ground Return.
5
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ADC16DV160
Pin(s)
ADC16DV160
Absolute Maximum Ratings (Notes 1, 2)
Operating Ratings
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Specified Temperature
Range:
3.0V Analog Supply Voltage
Range: (VA3.0)
1.8V Supply Voltage Range:
VA1.8, VAD1.8, VDR
Clock Duty Cycle
Supply Voltage (VA3.0)
Supply Voltage (VA1.8, V, VDR)
Voltage at any Pin except
OUTCLK, CLK, VIN, CSB,
SCLK, SDIO, D15/14-D1/0
Voltage at CLK, VIN Pins
Voltage at D15/14-D1/0,
OUTCLK, CSB, SCLK, SDIO
Pins
Input Current at any Pin
Storage Temperature Range
Maximum Junction Temp (TJ)
−0.3V to 4.2V
−0.3V to 2.35V
−0.3V to (VA3.0 +0.3V)
(Not to exceed 4.2V)
-40°C to +85°C
+2.7V to +3.6V
+1.7V to +1.9V
30/70 %
-0.3V to (VA1.8 +0.3V)
(Not to exceed 2.35V)
0.3V to (VDR + 0.3V)
(Not to exceed 2.35V)
Thermal Resistance (θJA)
5 mA
-65°C to +150°C
+150°C
19.1°C/W
1.0°C/W
Thermal Resistance (θJC)
ESD Rating
Machine Model
Human Body Model
200V
2000V
Electrical Characteristics
Unless otherwise specified, the following specifications apply: VA3.0 = 3.0V, VA1.8 = 1.8V, VDR = 1.8V, Differential sinusoidal clock,
fCLK = 160 MSPS at 2.8 VPP, AIN = -1dBFS, LVDS Rterm = 100Ω, CL = 5 pF. Typical values are for TA = 25°C. Boldface limits
apply for TA = TMIN to TMAX. All other limits apply for TA = +25°C, unless otherwise noted.
Symbol
Parameter
Conditions
Typical Limits
Units
STATIC CONVERTER CHARACTERISTICS
Resolution with No Missing Codes
16
Bits
INL
Integral Non Linearity
±1.5
DNL
Differential Non Linearity
±0.45
LSB
LSB
PGE
Positive Gain Error
−4.2
%FS
NGE
Negative Gain Error
3.7
%FS
VOFF
Offset Error (VIN+ = VIN−)
0.12
%FS
Under Range Output Code
0
0
Over Range Output Code
65535
65535
REFERENCE AND ANALOG INPUT CHARACTERISTICS
VCM
Common Mode Input Voltage
VRM
Reference Ladder Midpoint Output
Voltage
VREF
Internal Reference Voltage
Differential Analog Input Range
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VRM is the common mode reference
voltage
Internal Reference, default input
range is selected
6
VRM
±0.05
V
1.15
V
1.20
V
2.4
VPP
Unless otherwise specified, the following specifications apply: VA3.0 = 3.0V, VA1.8 = 1.8V, VDR = 1.8V, Differential sinusoidal clock,
FCLK = 160 MSPS at 2.8 VPP, AIN = -1dBFS, LVDS RTERM = 100Ω, CL = 5 pF. Typical values are for TA = 25°C. Boldface limits
apply for TA = TMIN to TMAX. All other limits apply for TA = +25°C, unless otherwise noted.
Symbol
SNR
SFDR
THD
Parameter
Signal-to-Noise Ratio
Single-tone Spurious Free Dynamic Range
(Note 9)
Total Harmonic Distortion
Conditions
Typ
Limits
Units
Fin = 30 MHz at −1dBFS
78.5
dBFS
Fin = 197 MHz at −1dBFS
76.3
dBFS
Fin = 197 MHz at −7dBFS
77.3
dBFS
Fin = 30 MHz at −1dBFS
95
dBFS
Fin = 197 MHz at −1dBFS
91.2
dBFS
Fin = 197 MHz at −7dBFS
99
dBFS
Fin = 197 MHz at −1dBFS
−90
dBFS
Fin = 197 MHz at −7dBFS
−96
dBFS
Fin = 197 MHz at −1dBFS
−92
dBFS
Fin = 197 MHz at −7dBFS
−99
dBFS
Fin = 197 MHz at −1dBFS
H2
Second-order Harmonic (Note 9)
H3
Third-order Harmonic (Note 9)
−96
dBFS
Fin = 197 MHz at −7dBFS
−105
dBFS
SPUR
Worst Harmonic or Spurious Tone excluding H2 Fin = 197 MHz at −1dBFS
and H3
Fin = 197 MHz at −7dBFS
97.3
dBFS
102
dBFS
Full Power Bandwidth
-3dB Point
1.4
GHz
Crosstalk
32.5 MHz tested channel
102 MHz other channel
103
dBFS
Logic and Power Supply Electrical Characteristics
Unless otherwise specified, the following specifications apply: VA3.0 = 3.0V, VA1.8 = 1.8V, VDR = 1.8V, Differential sinusoidal clock,
FCLK = 160 MSPS at 2.8 VPP, AIN = -1dBFS, LVDS RTERM = 100Ω, CL = 5 pF. Typical values are for TA = 25°C. Boldface limits
apply for TA = TMIN to TMAX. All other limits apply for TA = +25°C, unless otherwise noted.
Symbol
Parameter
Conditions
Typical Limits
Units
(Limits)
POWER SUPPLY CHARACTERISTICS
IA3.0
Analog 3.0V Supply Current
Full Operation (Note 11)
332
mA
IA1.8
Analog 1.8V Supply Current
Full Operation (Note 11)
103
mA
IDR
Output Driver Supply Current
Full Operation (Note 11)
66
mA
Core Power Consumption
VA3.0 + VA1.8 power per channel
591
mW
Driver Power Consumption
VDR power; Fin = 5MHz Rterm = 100Ω
118
mW
Power down state, no external clock
4.4
mW
Sleep state, no external clock
60
mW
Power Consumption in Power Down State
DIGITAL INPUT CHARACTERISTICS (SCLK, SDIO, CSB)
VIH
Logical “1” Input Voltage
VDR = 1.9V
1.25
V (min)
VIL
Logical “0” Input Voltage
VDR = 1.7V
0.45
V (max)
IIN1
Logical “1” Input Current
10
µA
IIN0
Logical “0” Input Current
−10
µA
CIN
Digital Input Capacitance
5
pF
DIGITAL OUTPUT CHARACTERISTICS (SDIO)
VOH
Logical “1” Output Voltage
IOUT = 0.5 mA, VDR = 1.8V
VOL
Logical “0” Output Voltage
IOUT = 1.6 mA, VDR = 1.8V
+ISC
Output Short Circuit Source Current
VOUT = 0V
−10
−ISC
Output Short Circuit Source Current
VOUT = VDR
10
7
1.2
V (min)
0.4
V (max)
mA
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ADC16DV160
Dynamic Converter Electrical Characteristics
ADC16DV160
LVDS Electrical Characteristics
Unless otherwise specified, the following specifications apply: VA3.0 = 3.0V, VA1.8 = 1.8V, VDR = 1.8V, Differential sinusoidal clock,
FCLK = 160 MSPS at 2.8 VPP, AIN = -1dBFS, LVDS RTERM = 100Ω, CL = 5 pF. Typical values are for TA = 25°C. Boldface limits
apply for TA = TMIN to TMAX. All other limits apply for TA = +25°C, unless otherwise noted.
Symbol
Parameter
Conditions
Min
Typ
Max
Units
LVDS DC SPECIFICATIONS (Apply to pins D0 to D15, OUTCLK)
VOD
Output Differential Voltage
100Ω Differential Load
200
250
300
mV
VOS
Output Offset Voltage
100Ω Differential Load
1.15
1.20
1.25
V
Timing Specifications
Unless otherwise specified, the following specifications apply: VA3.0 = +3.0V, VA1.8 = VAD1.8 = VDR = +1.8V, fCLK = 160 MSPS at
2.8 VPP, AIN = -1dBFS, LVDS RTERM = 100 Ω, CL = 5 pF. Typical values are for TA = 25°C. Boldface limits apply for TMIN ≤ TA
≤ TMAX. All other limits apply for TA = 25°C, unless otherwise noted.
Parameter
Conditions
Typ
Input Clock Frequency (FCLK)
Input Clock Frequency (FCLK)
Limits
Units
160
MHz
1
MHz (min)
Input Clock Amplitude
Measured at each pin (CLK+, CLK-).
Differential clock is 2.8 Vpp (typ)
1.4
Data Output Setup Time (TSU) (Note 10)
Measured @ VOD/2; FCLK = 160 MHz.
1.69
ns (min)
Data Output Hold Time (TH) (Note 10)
Measured @ VOD/2; FCLK = 160 MHz.
1.55
ns (min)
LVDS Rise/Fall Time (tR, tF)
CL= 5pF to GND, RL= 100Ω
270
Pipeline Latency
Aperture Jitter
VPP (min)
VPP (max)
0.85
1.7
ps (min)
ps (max)
11.5
Clock Cycles
80
fs rms
Power-Up Time
From assertion of Power to specified level
of performance.
0.5+ 103*(222+217)/FCLK
ms
Power-Down Recovery Time
From de-assertion of power down mode to
output data available.
0.1+ 103*(219+217)/FCLK
ms
Sleep Recovery Time
From de-assertion of sleep mode to output
data available.
μS
100
Unless otherwise specified, the following specifications apply: VA3.0 = 3.0V, VA1.8 = VAD1.8 = VDR = 1.8V, fCLK = 160 MSPS at
2.8 VPP, AIN = -1dBFS, LVDS RTERM = 100Ω, CL = 5 pF. Typical values are for TA = 25°C. Boldface limits apply for TMIN ≤ TA
≤ TMAX. All other limits apply for TA = 25°C, unless otherwise noted.
Symbol
Parameter
Conditions
Typ
Max
Units
fSCLK
Serial Clock Frequency
fSCLK = 1 / tP
20
MHz
(max)
tPH
SCLK Pulse Width - High
% of SCLK Period
40
60
% (min)
% (max)
tPL
SCLK Pulse Width - Low
% of SCLK Period
40
60
% (min)
% (max)
tSSU
SDI Setup Time
5
ns (min)
tSH
SDI Hold Time
5
ns (min)
tODZ
SDO Driven-to-Tri-State Time
5
ns (max)
tOZD
SDO Tri-State-to-Driven Time
5
ns (max)
tOD
SDO Output Delay Time
15
ns (max)
tCSS
CSB Setup Time
5
ns (min)
tCSH
CSB Hold Time
5
ns (min)
tIAG
Inter-access Gap
30
ns (min)
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Minimum time CSB must be
deasserted between accesses
8
Note 2: All voltages are measured with respect to GND = AGND = DRGND = 0V, unless otherwise specified.
Note 3: When the input voltage at any pin exceeds the power supplies (that is, VIN < AGND, or VIN > VA), the current at that pin should be limited to ±5 mA. The
±50 mA maximum package input current rating limits the number of pins that can safely exceed the power supplies with an input current of ±5mA to 10.
Note 4: Human Body Model is 100 pF discharged through a 1.5 kΩ resistor. Machine Model is 220 pF discharged through 0 Ω.
Note 5: Reflow temperature profiles are different for lead-free and non-lead-free packages.
Note 6: Typical figures are at TA = 25°C and represent most likely parametric norms at the time of product characterization. The typical specifications are not
guaranteed.
Note 7: The inputs are protected as shown below. Input voltage magnitudes above VA3.0 or below GND will not damage this device, provided current is limited
per (Note 3). However, errors in the A/D conversion can occur if the input goes above 2.6V or below GND as described in the Operating Ratings section.
30101457
Note 8: The input capacitance is the sum of the package/pin capacitance and the sample and hold circuit capacitance.
Note 9: This parameter is specified in units of dBFS – dB relative to the ADC's input full-scale voltage.
Note 10: ) This parameter is a function of the CLK frequency - increasing directly as the frequency is lowered.
Note 11: This parameter is guaranteed only at 25°C. For power dissipation over temperature range, refer to Core Power vs. Temperature plot in Typical
Performance Characteristics, Dynamic Performance.
Timing Diagrams
30101403
FIGURE 1. Digital Output Timing
9
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ADC16DV160
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is
guaranteed to be functional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see the Electrical Characteristics.
The guaranteed specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under
the listed test conditions. Operation of the device beyond the maximum Operating Ratings is not recommended.
ADC16DV160
30101411
FIGURE 2. SPI Clock Timing
30101412
FIGURE 3. SPI Data In Timing
30101413
FIGURE 4. SPI Data Output Timing
30101414
FIGURE 5. SPI Chip Select Timing
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10
APERTURE DELAY is the time after the falling edge of the
clock to when the input signal is acquired or held for conversion.
APERTURE JITTER (APERTURE UNCERTAINTY) is the
variation in aperture delay from sample to sample. Aperture
jitter manifests itself as noise in the output.
CLOCK DUTY CYCLE is the ratio of the time during one cycle
that a repetitive digital waveform is high to the total time of
one period. The specification here refers to the ADC clock
input signal.
COMMON MODE VOLTAGE (VCM) is the common DC voltage applied to both input terminals of the ADC.
CONVERSION LATENCY is the number of clock cycles between initiation of conversion and the time when data is
presented to the output driver stage. Data for any given sample is available at the output pins the Pipeline Delay plus the
Output Delay after the sample is taken. New data is available
at every clock cycle, but the data lags the conversion by the
pipeline delay.
DIFFERENTIAL NON-LINEARITY (DNL) is the measure of
the maximum deviation from the ideal step size of 1 LSB.
FULL POWER BANDWIDTH is a measure of the frequency
at which the reconstructed output fundamental drops 3 dB
below its low frequency value for a full scale input.
GAIN ERROR is the deviation from the ideal slope of the
transfer function. It can be calculated as:
Gain Error = Positive Full Scale Error − Negative Full Scale
Error
It can also be expressed as Positive Gain Error and Negative
Gain Error, which are calculated as:
PGE = Positive Full Scale Error - Offset Error
NGE = Offset Error - Negative Full Scale Error
INTEGRAL NON LINEARITY (INL) is a measure of the deviation of each individual code from a best fit straight line. The
deviation of any given code from this straight line is measured
from the center of that code value.
INTERMODULATION DISTORTION (IMD) is the creation of
additional spectral components as a result of two sinusoidal
frequencies being applied to the ADC input at the same time.
It is defined as the ratio of the power in the intermodulation
products to the total power in the original frequencies. IMD is
usually expressed in dBFS.
LSB (LEAST SIGNIFICANT BIT) is the bit that has the smallest value or weight of all bits. This value is VFS/2n, where
“VFS” is the full scale input voltage and “n” is the ADC resolution in bits.
MISSING CODES are those output codes that will never appear at the ADC outputs. The ADC16DV160 is guaranteed
not to have any missing codes.
where f12 is the power of the fundamental frequency and f22
through f102 are the powers of the first nine harmonics in the
output spectrum.
SECOND HARMONIC DISTORTION (2ND HARM or H2) is
the difference expressed in dB, from the power of its 2nd harmonic level to the power of the input signal.
THIRD HARMONIC DISTORTION (3RD HARM or H3) is the
difference expressed in dB, from the power of the 3rd harmonic level to the power of the input signal.
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ADC16DV160
MSB (MOST SIGNIFICANT BIT) is the bit that has the largest
value or weight. Its value is one half of full scale.
NEGATIVE FULL SCALE ERROR is the difference between
the actual first code transition and its ideal value of ½ LSB
above negative full scale.
OFFSET ERROR is the difference between the two input
voltages (VIN+ – VIN-) required to cause a transition from code
32767LSB and 32768LSB with offset binary data format.
PIPELINE DELAY (LATENCY) See CONVERSION LATENCY.
POSITIVE FULL SCALE ERROR is the difference between
the actual last code transition and its ideal value of 1½ LSB
below positive full scale.
POWER SUPPLY REJECTION RATIO is a measure of how
well the ADC rejects a change in the power supply voltage.
PSRR is the ratio of the Full-Scale output of the ADC with the
supply at the minimum DC supply limit to the Full-Scale output
of the ADC with the supply at the maximum DC supply limit,
expressed in dB.
SIGNAL TO NOISE RATIO (SNR) is the ratio, expressed in
dB, of the power of input signal to the total power of all other
spectral components below one-half the sampling frequency,
not including harmonics and DC.
SIGNAL TO NOISE AND DISTORTION (SINAD) Is the ratio,
expressed in dB, of the power of the input signal to the total
power of all of the other spectral components below half the
clock frequency, including harmonics but excluding DC.
SPURIOUS FREE DYNAMIC RANGE (SFDR) is the difference, expressed in dB, between the power of input signal and
the peak spurious signal power, where a spurious signal is
any signal present in the output spectrum that is not present
at the input.
TOTAL HARMONIC DISTORTION (THD) is the ratio, expressed in dB, of the total power of the first seven harmonic
to the input signal power. THD is calculated as:
Specification Definitions
ADC16DV160
2.0 ANALOG INPUTS
The analog input circuit of the ADC16DV160 is a differential
switched capacitor sample-and-hold circuit (see Figure 6) that
provides optimum dynamic performance wide input frequency
range with minimum power consumption. The clock signal alternates sample mode (QS) and hold mode (QH). An integrated low jitter duty cycle stabilizer ensures constant optimal
sample and hold time over a wide range of input clock duty
cycle. The duty cycle stabilizer is always turned on during
normal operation.
During sample mode, analog signals (VIN+, VIN-) are sampled
across two sampling capacitors (CS) while the amplifier in the
sample-and-hold circuit is idle. The dynamic performance of
the ADC16DV160 is likely determined during sampling mode.
The sampled analog inputs (VIN+, VIN-) are held during hold
mode by connecting input side of the sampling capacitors to
output of the amplifier in the sample-and-hold circuit while
driving pipeline ADC core.
The signal source, which drives the ADC16DV160, is recommended to have a source impedance less than 100Ω over a
wide frequency range for optimal dynamic performance.
A shunt capacitor can be placed across the inputs to provide
high frequency dynamic charging current during sample
mode and also absorb any switching charge coming from the
ADC16DV160. A shunt capacitor can be placed across each
input to GND for similar purpose. Smaller physical size and
low ESR and ESL shunt capacitors are recommended.
The value of shunt capacitance should be carefully chosen to
optimize the dynamic performance at specific input frequency
range. Larger value shunt capacitors can be used for lower
input frequencies, but the value has to be reduced at high
input frequencies.
Balancing impedance at positive and negative input pin over
entire signal path must be ensured for optimal dynamic performance.
Functional Description
Operating on dual +1.8V and +3.0V supplies, the ADC16DV160 digitizes a differential analog input signal to 16
bits, using a differential pipelined architecture with error correction circuitry and an on-chip sample-and-hold circuit to
ensure maximum performance. The user has the choice of
using an internal 1.2V stable reference, or using an external
1.2V reference. The internal 1.2V reference has a high output
impedance of > 9 kΩ and can be easily over-driven by an
external reference. A 3-wire SPI-compatible serial interface
facilitates programming and control of the ADC16DV160.
ADC Architecture
The ADC16DV160 architecture consists of a dual channel
highly linear and wide bandwidth sample-and-hold circuit, followed by a switched capacitor pipeline ADC. Each stage of
the pipeline ADC consists of low resolution flash sub-ADC
and an inter-stage multiplying digital-to-analog converter
(MDAC), which is a switched capacitor amplifier with a fixed
stage signal gain and DC level shifting circuits. The amount
of DC level shifting is dependent on sub-ADC digital output
code. A 16-bit final digital output is the result of the digital error
correction logic, which receives the digital output of each
stage including redundant bits to correct offset error of each
sub-ADC.
Applications Information
1.0 OPERATING CONDITIONS
We recommend that the following conditions be observed for
operation of the ADC16DV160:
2.7V ≤ VA3.0 ≤ 3.6V
1.7V ≤ VA1.8 ≤ 1.9V
1.7V ≤ VDR ≤ 1.9V
1 MSPS ≤ FCLK ≤ 160 MSPS
VREF ≤ 1.2V
VCM = 1.15V (from VRM)
30101406
FIGURE 6. Simplified Switched-Capacitor Sample-and-hold Circuit
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Driving Analog Inputs
For low frequency applications, either a flux or balun transformer can convert single-ended input signals into differential
and drive the ADC16DV160 without additive noise. An example is shown in Figure 7. The VRM pin is used to bias the input
common mode by connecting the center tap of the
transformer’s secondary ports. A flux transformer is used for
this example, but AC coupling capacitors enable the use of a
balun type transformer.
30101407
FIGURE 7. Transformer Drive Circuit for Low Input Frequency
Transformers act as band pass filters. The lower frequency
limit is set by saturation at frequencies below a few MHz and
parasitic resistance and capacitance set the upper frequency
limit. The transformer core will be saturated with excessive
signal power and it causes distortion as the equivalent load
termination becomes heavier at high input frequencies. This
is a reason to reduce shunt capacitors for high IF sampling
applications to balance the amount of distortion caused by the
transformer and charge kick-back noise from the device.
As input frequency goes higher with the input network in Figure 7, amplitude and phase unbalance increase between
positive and negative inputs (VIN+ and VIN-) due to the inherent
impedance mismatch between the two primary ports of the
transformer since one is connected to the signal source and
the other is connected to GND. Distortion increases as a result.
The cascaded transmission line (balun) transformers in Figure 8 can be used for high frequency applications like high IF
sampling base station receive channels. The transmission
line transformer has less stray capacitance between primary
and secondary ports and so the impedance mismatch at the
secondary ports is effectively less even with the given inherent impedance mismatch on the primary ports. Cascading two
transmission line transformers further reduces the effective
stray capacitance from the secondary of ports of the secondary transformer to primary ports of first transformer, where
the impedance is mismatched. A transmission line transformer, for instance MABACT0040 from M/A-COM, with a
center tap on the secondary port can further reduce amplitude
and phase mismatch.
30101408
FIGURE 8. Transformer Drive Circuit for High Input Frequency
ing pipeline ADC core. The equivalent impedance changes
drastically between sample and hold mode and a significant
amount of charge injection occurs during the transition between the two operating modes.
Distortion and SNR heavily rely on the signal integrity,
impedance matching during sample mode and charge injection due to the sampling switches.
Equivalent Input Circuit and Its S11
The input circuit of the ADC16DV160 during sample mode is
a differential switched capacitor as shown in Figure 9. The
bottom plate sampling switch is bootstrapped in order to reduce its turn on impedance and its variation across input
signal amplitude. Bottom plate sampling switches, and top
plate sampling switch are all turned off during hold mode. The
sampled analog input signal is processed through the follow13
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ADC16DV160
Input Common Mode
The analog inputs of the ADC16DV160 are not internally dc
biased and the range of input common mode is very narrow.
Hence it is highly recommended to use the common mode
voltage (VRM, typically 1.15V) as input common mode for optimal dynamic performance regardless of DC and AC coupling
applications. Input common mode signal must be decoupled
with low ESL 0.1 μF input bias resistors to minimize noise
performance degradation due to any coupling or switching
noise between the ADC16DV160 and input driving circuit.
ADC16DV160
30101409
FIGURE 9. Input Equivalent Circuit
The simulated S11 of the input circuit of the ADC16DV160 is
shown in Figure 10. (Measured data will be provided in a future datasheet revision. Note that the simulated S11 normally
closely matches the measured S11.) Up to 500 MHz, it is predominantly capacitive loading with small stray resistance and
inductance as shown in Figure 10. An appropriate resistive
termination at a given input frequency band has to be added
to improve signal integrity. Any shunt capacitor on the analog
input pin deteriorates signal integrity but it provides high frequency charge to absorb the charge injected by the sampling
switches. An optimal shunt capacitor is dependent on input
signal frequency as well as the impedance characteristic of
the analog input signal path including components like transformers, termination resistors, and AC coupling capacitors.
30101419
FIGURE 10. Simulated ADC16DV160 Input S11
tail current reduction leading to lowered jitter performance.
CLK+ and CLK- should never be lower than AGND. A high
speed back-to-back diode connected between CLK+ and
CLK- can limit the maximum swing, but this could cause signal
integrity concerns when the diode turns on and reduces the
load impedance instantaneously.
The preferred differential transformer coupled clocking approach is shown in Figure 12. A 0.1 μF decoupling capacitor
on the center tap of the secondary of a flux type transformer
stabilizes clock input common mode. Differential clocking in-
3.0 CLOCK INPUT CONSIDERATIONS
Clock Input Modes
The ADC16DV160 provides a low additive jitter differential
clock receiver for optimal dynamic performance over a wide
input frequency range. The input common mode of the clock
receiver is internally biased at VA1.8/2 through a 10 kΩ resistor
as shown in Figure 11. Normally the external clock input
should be AC-coupled. It is possible to DC-couple the clock
input, but the common mode (average voltage of CLK+ and
CLK-) must not be higher than VA1.8/2 to prevent substantial
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ADC16DV160
creases the maximum amplitude of the clock input at the pins
6dB vs. the singled-ended circuit shown in Figure 13. The
clock amplitude is recommended to be as large as possible
while CLK+ and CLK- both never exceed the supply rails of
VA1.8 and AGND. With the equivalent input noise of the differential clock receiver shown in Figure 11, a larger clock
amplitude at CLK+ and CLK- pins increases its slope around
the zero-crossing point so that higher signal-to-noise results.
30101433
FIGURE 13. Singled-Ended 1.8V Clocking, Capacitive AC
Coupled
Duty Cycle Stabilizer
The highest operating speed with optimal performance can
only be achieved with a 50% clock duty cycle because the
switched-capacitor circuit of the ADC16DV160 is designed to
have equal amount of settling time between each stage. The
maximum operating frequency could be reduced accordingly
when the clock duty cycle departs from 50%.
The ADC16DV160 contains a duty cycle stabilizer that adjusts the non-sampling (rising) clock edge to make the duty
cycle of the internal clock 50% for a 30-to-70% input clock
duty cycle. The duty cycle stabilizer is always on because the
noise and distortion performance are not affected at all. It is
not recommended to use the ADC16DV160 at clock frequencies less than 1 MSPS where the feedback loop in the duty
cycle stabilizer becomes unstable.
30101431
FIGURE 11. Equivalent Clock Receiver
The differential receiver of the ADC16DV160 has an extremely low-noise floor but its bandwidth is also extremely wide. The
wide band clock noise folds back into the first Nyquist zone at
the ADC output. Increased slope of the input clock lowers the
equivalent noise contributed by the differential receiver.
A band-pass filter (BPF) with narrow pass band and low insertion loss can be added to the clock input signal path when
the wide band noise of the clock source is noticeably large
compared to the input equivalent noise of the differential clock
receiver.
Load termination can be a combination of R and C instead of
a pure R. This RC termination can improve the noise performance of the clock signal path by filtering out high frequency
noise through a low pass filter. The size of R and C is dependent on the clock rate and slope of the clock input.
An LVPECL and/or LVDS driver can also drive the ADC16DV160. However the full dynamic performance of the
ADC16DV160 might not be achieved due to the high noise
floor of the driving circuit itself especially in high IF sampling
applications.
Clock Jitter vs. Dynamic Performance
High speed and high resolution ADCs require a low-noise
clock input to ensure full dynamic performance over wide input frequency range. SNR (SNRFin) at a given input frequency
(Fin) can be calculated by:
30101434
with a given total noise power (VN2) of an ADC, total rms jitter
(Tj), and input amplitude (A) in dBFS.
The clock signal path must be treated as an analog signal
whenever aperture jitter affects the dynamic performance of
the ADC16DV160. Power supplies for the clock drivers have
to be separated from the ADC output driver supplies to prevent modulating the clock signal with the ADC digital output
signals. Higher noise floor and/or increased distortion/spur
may result from any coupling of noise from the ADC digital
output signals to the analog input and clock signals.
In IF sampling applications, the signal-to-noise ratio is particularly affected by clock jitter as shown in Figure 14. Tj is the
integrated noise power of the clock signal divided by the slope
of clock signal around the tripping point. The upper limit of the
noise integration is independent of applications and set by the
bandwidth of the clock signal path. However, the lower limit
of the noise integration highly relies on the application. In base
station receive channel applications, the lower limit is determined by the channel bandwidth and space from an adjacent
channel.
30101432
FIGURE 12. Differential Clocking, Transformer Coupled
A singled-ended clock can drive the CLK+ pin through a 0.1
µF AC coupling capacitor while CLK- is decoupled to AGND
through a 0.1 μF capacitor as shown in Figure 13.
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ADC16DV160
30101435
FIGURE 14. SNR with given Jitter vs. Input Frequency
two times VREF, which is the same as VBG (the on-chip
bandgap output with a 9 kΩ output impedance) as well as
VRP - VRN as shown in Figure 15. The input range can be
adjusted by changing VREF either internally or externally. An
external reference with low output impedance can easily overdrive the VREF pin. The default VREF is 1.2V. The input common mode voltage (VRM) is a fixed voltage level of 1.15V.
Maximum SNR can be achieved at the maximum input range
where VREF = 1.2V. Although the ADC16DV160's dynamic
and static performance is optimized at a VREF of 1.2V, reducing VREF can improve SFDR performance by sacrificing some
of the ADC16DV160's SNR performance.
4.0 CALIBRATION
The automatic calibration engine contained within the ADC16DV160 improves dynamic performance and reduces its
part-to-part variation. Digital output signals including output
clock (OUTCLK+/-) are all logic low while calibrating. The ADC16DV160 is automatically calibrated when the device is
powered up. Optimal dynamic performance might not be obtained if the power-up time is longer than the internal delay
time (~32 mS @ 160 MSPS clock rate). In this case, the ADC16DV160 can be re-calibrated by asserting and then deasserting power down mode. Re-calibration is recommended
whenever the operating clock rate changes.
5.0 VOLTAGE REFERENCE
A stable and low-noise voltage reference and its buffer amplifier are built into the ADC16DV160. The input full scale is
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ADC16DV160
30101436
FIGURE 15. Internal References and their Decoupling
log and digital areas of the board, with the ADC16DV160
between these areas, is required to achieve the specified
performance.
Even though LVDS outputs reduce ground bounce, the positive and negative signal path have to be well matched, and
their traces should be kept as short as possible. It is recommend to place an LVDS repeater between the ADC16DV160
and digital data receiver block to prevent coupling noise from
the receiving block when the length of the traces are long or
the noise level of the receiving block is high.
Capacitive coupling between the typically noisy digital circuitry and the sensitive analog circuitry can lead to poor performance. The solution is to keep the analog circuitry separated
from the digital circuitry, and to keep the clock line as short as
possible.
Since digital switching transients are composed largely of
high frequency components, total ground plane copper
weight will have little effect upon the logic-generated noise.
Because of the skin effect, the total surface area is more important than its thickness.
Generally, analog and digital lines should not cross. However
whenever it is inevitable, make sure that these lines are
crossing each other at 90° to minimize cross talk. Digital output and output clock signals must be separated from analog
input, references and clock signals unconditionally to ensure
the maximum performance from the ADC16DV160. Any coupling may result in degraded SNR and SFDR performance
especially for high IF applications.
Be especially careful with the layout of inductors and transformers. Mutual inductance can change the characteristics of
the circuit in which they are used. Inductors and transformers
should not be placed side by side, even with just a small part
Reference Decoupling
It is highly recommended to place the external decoupling
capacitors connected to VRP, VRN, VRM and VREF pins as close
to the pins as possible. The external decoupling capacitors
should have minimal ESL and ESR. During normal operation,
inappropriate external decoupling with large ESL and/or ESR
capacitors increase the settling time of the ADC core and result in lower SFDR and SNR performance. The VRM pin may
be loaded up to 1mA for setting input common mode. The
remaining pins should not be loaded. Smaller capacitor values might result in degraded noise performance. The decoupling capacitor on the VREF pin must not exceed 0.1 μF.
Additional decoupling on this pin will cause improper calibration during power-up. All the reference pins except VREF have
a very low output impedance. Driving these pins via a lowoutput impedance external circuit for a long time period may
damage the device.
When the VRM pin is used to set the input common mode level
via transformer, a smaller series resistor should be placed on
the signal path to isolate any switching noise between the
ADC core and input signal. The series resistor introduces a
voltage error between VRM and VCM due to charge injection
while the sampling switches are toggling. The series resistance should not be larger than 50Ω.
All grounds associated with each reference and analog input
pin should be connected to a solid and quiet ground on the
PC board. Coupling noise from digital outputs and their supplies to the reference pins and their ground can cause degraded SNR and SFDR performance.
6.0 LAYOUT AND GROUNDING
Proper grounding and proper routing of all signals are essential to ensure accurate conversion. Maintaining separate ana17
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ADC16DV160
of their bodies beside each other. For instance, place transformers for the analog input and the clock input at 90° to one
another to avoid magnetic coupling. It is recommended to
place the transformers of the input signal path on the top side,
and the transformer for the clock signal path on the bottom
side. Every critical analog signal path like analog inputs and
clock inputs must be treated as a transmission line and should
have a solid ground return path with a small loop area.
The analog input should be isolated from noisy signal traces
to avoid coupling of spurious signals into the input. Any external component (e.g., a filter capacitor) connected between
the converter’s input pins and ground or to the reference pins
and ground should be connected to a very clean point in the
ground plane.
All analog circuitry (input amplifiers, filters, reference components, etc.) should be placed in the analog area of the board.
All digital circuitry and dynamic I/O lines should be placed in
the digital area of the board. The ADC16DV160 should be
between these two areas. Furthermore, all components in the
reference circuitry and the input signal chain that are connected to ground should be connected together with short
traces and enter the ground plane at a single, quiet point. All
ground connections should have a low inductance path to
ground.
The ground return current path can be well managed when
the supply current path is precisely controlled and the ground
layer is continuous and placed next to the supply layer. This
is because of the proximity effect. A ground return current
path with a large loop area will cause electro-magnetic coupling and results in poor noise performance. Note that even if
there is a large plane for a current path, the high-frequency
return current path is not spread evenly over the large plane,
but only takes the path with lowest impedance. Instead of a
large plane, using a thick trace for supplies makes it easy to
control the return current path. It is recommended to place the
supply next to the GND layer with a thin dielectric for a smaller
ground return loop. Proper location and size of decoupling
capacitors provides a short and clean return current path.
mended to separate VDR from VA1.8 supplies, any coupling
from VDR to the rest of the supplies and analog signals could
cause lower SFDR and noise performance. When VA1.8 and
VDR are both from the same supply source, coupling noise
can be mitigated by adding a ferrite-bead on the VDR supply
path.
Different decoupling capacitors can be used to provide current over wide frequency range. The decoupling capacitors
should be located close to the point of entry and close to the
supply pins with minimal trace length. A single ground plane
is recommended because separating ground under the
ADC16DV160 could cause an unexpected long return current
path.
The VA3.0 supply must turn on before VA1.8 and/or VDR reaches
a diode turn-on voltage level. If this supply sequence is reversed, an excessive amount of current will flow through the
VA3.0 supply. The ramp rate of the VA3.0 supply must be kept
less than 60 V/mS (i.e., 60 μS for 3.0V supply) in order to
prevent excessive surge current through ESD protection devices.
8.0 SERIAL CONTROL INTERFACE
The ADC16DV160 has a serial control interface that allows
access to the control registers. The serial interface is a generic 3-wire synchronous interface that is compatible with SPItype interfaces that are used on many microcontrollers and
DSP controllers. Each serial interface access cycle is exactly
16 bits long. A register-read or register-write can be accomplished in one cycle. Register space supported by this interface is 64. Figure 16 and Figure 17 show the access protocol
used by this interface. Each signal’s function is described below. The SPI must be in a static condition during the normal
operation of the ADC16DV160, otherwise the performance of
the ADC16DV160 may degrade due to the coupling noise
generated by the SPI control signals. When a SPI bus is used
for multiple devices on the board, it is recommended to reduce
the potential for noise coupling by placing logic buffers between the SPI bus and the ADC16DV160.
7.0 SUPPLIES AND THEIR SEQUENCE
There are three supplies for the ADC16DV160: one 3.0V supply VA3.0 and two 1.8V supplies VA1.8 and VDR. It is recom-
30101451
FIGURE 16. Serial Interface Protocol (Write Operation)
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ADC16DV160
30101452
FIGURE 17. Serial Interface Protocol (Read Operation)
•
Signal Descriptions
SCLK: Used to register the input date (SDI) on the rising
edge; and to source the output data (SDO) on the
falling edge. User may disable clock and hold it in the
low-state, as long as clock pulse width min. spec is
not violated when clock is enabled or disabled.
CLB: Chip Select Bar. Each assertion starts a new register
access – i.e., the SDATA field protocol is required.
CSB should be de-asserted after the 16th clock. If the
CSB is de-asserted before the 16th clock, no address
or data write will occur. The rising edge captures the
address just shifted-in and, in the case of a write operation, writes the addressed register.
SDIO: Serial Data. Must observe setup/hold requirements
with respect to the SCLK. Each cycle is 16-bit long.
•
•
•
R/W: A value of ‘1’ indicates a read operation, while a
value of ‘0’ indicates a write operation
Reserved: Reserved for future use. Must be set to 0.
ADDR: Up to 64 registers can be addressed.
DATA: In a write operation the value in this field will be
written to the register addressed in this cycle when CSB
is de-asserted. In a read operation this field is ignored.
9.0 FIXED PATTERN MODE
The ADC16DV160 provides user defined fixed patterns at
digital output pins to check timing and connectivity with the
receiving device on the board. The fixed pattern map is shown
in Figure 18; there are 6 hard-wired fixed patterns (PATTERN
(000) to PATTERN (101)) and 2 user-defined patterns (PATTERN (110) and PATTERN (111)). PATTERN (110) and
PATTERN (111) can be written via SPI and all ‘0’s are the
default values for both. See Register Map address 0CH
through 0FH for the details.
30101453
FIGURE 18. Fixed Pattern Map
For flexibility, the user can determine a fixed pattern with a
depth of 8 patterns as shown in Figure 19. The user can fill
these 8 sequences (SEQ0 – SEQ7) with an arbitrary pattern
(PATTERN (000) – PATTERN (111)). See Register Map ad-
dress 08h through 0Bh below for the details. The default
register value for all SEQ0 through SEQ7 sequences is 010,
which generates alternating 0xFF and 0x00 at the ADC output
as shown in Figure 20.
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ADC16DV160
30101454
FIGURE 19. State Machine Generating Fixed Pattern Sequence
30101455
FIGURE 20. Fixed Pattern at ADC Output with
Default SPI Register Values
21 below. If there is some timing skew of the SPI control signals and/or input clock between multiple ADCs with this clocking configuration, the sampling edge of some ADC, which is
ADC SLAVE I for this example, could be out of phase compared to the ADC MASTER as shown in Figure 21. The
sampling edge of the non-synchronized ADC can be synchronized if the internal clock can be inverted through some
control bit. This sampling edge flipping function is provided by
the ADC16DV160 via SPI. See the SPI Register Map below
for the details.
10.0 SAMPLING EDGE
The internal clock divider features allows more flexible design
from the perspective of the system clocking scheme. The
ADC16DV160 supports divide by 1 or 2 clocking. This feature
may cause a potential issue when synchronizing the sample
edge of multiple ADCs when the internal clock is divided by 2
from the input clock (CLKIN). The ADC16DV160 samples the
analog input signal at the falling edge of the input clock, which
will be the falling edge of the internally divided by 2 clock when
divide by 2 is configured as shown as dashed lines in Figure
30101456
FIGURE 21. Sampling Edge of Multiple ADCs with
Internal Division On
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Note: Accessing unspecified addresses may cause functional failure or damage. All reserved bits must be written with the listed
default values.
Operation Mode
7
6
5
DF
Operation Mode
Bit 7
Data Format
Bits (6:5)
Bit 4
Bit 3
Bit (2:1)
Bit 0
Bit 7
Bit 6
Bit 5
Bits (4:2)
Bit 1
Bit 0
Reserved
R/W
2
1
Full Scale
1
0
Operation Mode
0
0
0
1
1
0
1
1
Two's Complement
Offset Binary (Default)
0
0
1.0VPP
0
1
1.5VPP
1
0
2.0VPP
1
1
2.4VPP (default)
0
Default
Normal Operation (Default)
Sleep Mode. Device is powered down, but it can wake up quickly.
Power down mode. Device is powered down at lowest power dissipation.
Fixed pattern mode. Device outputs fixed patterns to check connectivity with interfacing
components.
Reserved. Must be set to 0.
Reserved. Must be set to 0.
Full scale. Full scale can be adjusted from 1.0 to 2.4VPP.
Restore Default Register Values. Default values of SPI registers can be restored at the rising edge of this bit.
1
Restore default register values
0
As is (default)
Synchronization Mode
7
6
Sample
Phase
Addr: 00h
3
4
Clock Divider
5
Reserved
4
Addr: 01h
3
Output Clock Phase
R/W
2
1
0
Reserved
Reserved
Sampling Clock Phase. This is for synchronizing sampling edge for multiple devices while the ADC16DV160 is
configured at clock divide by 2.
0 Keep sampling edge as is (default).
1 Invert internal clock to adjust sampling edge.
Clock divider. Internal operating clock frequency can be programmed either to be divided by 1 or 2.
0 Divide by 1 (default).
1 Divide by 2
Reserved. Must be set to 0.
Output Clock Phase Adjustment. User can adjust output clock phase from 31° to 143°. Each 1 LSB increment
results in about 16° of output clock phase increase.
0
0
0
31°
0
0
1
47°
0
1
0
63°
0
1
1
79°
1
0
0
95° (default)
1
0
1
111°
1
1
0
127°
1
1
1
143°
Reserved. Must be set to 0.
Reserved. Must be set to 0.
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ADC16DV160
Register Map
ADC16DV160
Fixed Pattern Mode:
SEQ0 and SEQ1
7
SEQ1<2>
Bits (7:5)
Bits (5:3)
Bit 1
Bit 0
SEQ3<2>
5
4
3
2
1
0
SEQ1<1>
SEQ1<0>
SEQ1<2>
SEQ1<1>
SEQ1<0>
Reserved
Reserved
3 bits pattern code for SEQ3. 010 is the default.
3 bits pattern code for SEQ2. 010 is the default.
Reserved, Must be set to 0.
Reserved, Must be set to 0.
Bits (7:5)
Bits (5:3)
Bit 1
Bit 0
Bits (7:5)
Bits (5:3)
Bit 1
Bit 0
4
3
2
1
0
SEQ3<1>
SEQ3<0>
SEQ2<2>
SEQ2<1>
SEQ2<0>
Reserved
Reserved
3 bits pattern code for SEQ3. 010 is the default.
3 bits pattern code for SEQ2. 010 is the default.
Reserved, Must be set to 0.
Reserved, Must be set to 0.
Addr: 0Ah
Bits (7:5)
6
5
4
3
2
1
0
SEQ5<0>
SEQ4<2>
SEQ4<1>
SEQ4<0>
Reserved
Reserved
3 bits pattern code for SEQ5. 010 is the default.
3 bits pattern code for SEQ4. 010 is the default.
Reserved, Must be set to 0.
Reserved, Must be set to 0.
Addr: 0Bh
Bits (7:5)
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R/W
6
5
4
3
2
1
0
SEQ7<1>
SEQ7<0>
SEQ6<2>
SEQ6<1>
SEQ6<0>
Reserved
Reserved
3 bits pattern code for SEQ7. 010 is the default.
3 bits pattern code for SEQ6. 010 is the default.
Reserved, Must be set to 0.
Reserved, Must be set to 0.
D<6>
Addr: 0Ch
R/W
5
4
3
2
1
0
D<5>
D<4>
D<3>
D<2>
D<1>
D<0>
8 LSBs of a fixed pattern for Sequence >110>
All '0' for default.
Fixed Pattern Mode:
MSB PATTERN <110>
7
6
D<7>
R/W
SEQ5<1>
Fixed Pattern Mode:
LSB PATTERN <110>
7
6
D<7>
R/W
5
Fixed Pattern Mode:
SEQ7 and SEQ8
7
SEQ7<2>
Addr: 09h
6
Fixed Pattern Mode:
SEQ4 and SEQ5
7
SEQ5<2>
R/W
6
Fixed Pattern Mode:
SEQ2 and SEQ3
7
Bits (7:5)
Bits (5:3)
Bit 1
Bit 0
Addr: 08h
D<6>
Addr: 0Dh
R/W
5
4
3
2
1
0
D<5>
D<4>
D<3>
D<2>
D<1>
D<0>
8 MSBs of a fixed pattern for Sequence >110>
All '0' for default.
22
D<7>
Bits (7:5)
D<6>
Bits (7:5)
R/W
5
4
3
2
1
0
D<5>
D<4>
D<3>
D<2>
D<1>
D<0>
8 LSBs of a fixed pattern for Sequence >111>
All '0' for default.
Fixed Pattern Mode:
MSB PATTERN <1110>
7
6
D<7>
Addr: 0Eh
D<6>
Addr: 0Fh
R/W
5
4
3
2
1
0
D<5>
D<4>
D<3>
D<2>
D<1>
D<0>
8 MSBs of a fixed pattern for Sequence >111>
All '0' for default.
23
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ADC16DV160
Fixed Pattern Mode:
LSB PATTERN <111>
7
6
ADC16DV160
Physical Dimensions inches (millimeters) unless otherwise noted
68-Lead LLP Package
Ordering Number ADC16DV160CILQ
NS Package Number LQA68A
www.national.com
24
ADC16DV160
Notes
25
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ADC16DV160 Dual Channel, 16-Bit, 160 MSPS Analog-to-Digital Converter with DDR LVDS
Outputs
Notes
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