QS54/74FCT240T, 244T, 2240T, 2244T Q QUALITY SEMICONDUCTOR, INC. High-Speed CMOS 8-Bit Buffers/Line Drivers QS54/74FCT240T QS54/74FCT244T QS54/74FCT2240T QS54/74FCT2244T FEATURES/BENEFITS DESCRIPTION • Pin and function compatible to the 74F240/4 74FCT240/4 and 74ABT240/4 • Industrial temperature –40°C to 85°C • CMOS power levels: <7.5mW static • Available in DIP, SOIC, QSOP, ZIP, HQSOP • Undershoot clamp diodes on all inputs • TTL-compatible input and output levels • Ground bounce controlled outputs • Reduced output swing of 0-3.5V • Military product compliant to MIL-STD-883, Class B The FCT240T and FCT244T are 8-bit buffers/line drivers with three-state outputs that are ideal for driving high-capacitance loads as in memory address and data buses. The FCT2240T and FCT2244T are 25Ω resistor output versions useful for driving transmission lines and reducing system noise. The 2240 and 2244 series parts can replace the 240/244 series to reduce noise in an existing design. All inputs have clamp diodes for undershoot noise suppression. All outputs have ground bounce suppression (see QSI Application Note AN-001), and outputs will not load an active bus when VCC is removed from the device. FCT-T 240T, 244T • JEDEC-FCT spec compatible • Std. thru D speed grades with 3.8ns tPD for D • IOL = 64mA Ind., 48mA Mil. y n pa m o C FCT-T 2240T, 2244T • Built-in 25Ω series resistor outputs reduce reflection and other system noise • Std. thru C speed grades with 4.1ns tPD for C • IOL = 12mA Ind. n a w Figure 1. Functional Block Diagram No FCT240 FCT2240 FCT244 FCT2244 1G(1) 1G(1) 1A1(2) 1Y1(18) 1A1(2) 1Y1(18) 1A2(4) 1Y2(16) 1A2(4) 1Y2(16) 1A3(6) 1Y3(14) 1A3(6) 1Y3(14) 1A4(8) 1Y4(12) 1A4(8) 1Y4(12) 2G(19) 2G(19) 2A1(11) 2Y1(9) 2A1(11) 2Y1(9) 2A2(13) 2Y2(7) 2A2(13) 2Y2(7) 2A3(15) 2Y3(5) 2A3(15) 2Y3(5) 2A4(17) 2Y4(3) 2A4(17) 2Y4(3) Note: Pin 19 is 2G on the FCT244. MDSL-00011-04 DECEMBER 28, 1998 QUALITY SEMICONDUCTOR, INC. 1 QS54/74FCT240T, 244T, 2240T, 2244T Figure 2. Pin Configurations (All Pins Top View) PDIP, SOIC, QSOP, HQSOP 1G 1A1 2Y4 1A2 2Y3 1A3 2Y2 1A4 2Y1 GND 1 2 3 4 5 6 7 8 9 10 20 19 18 17 16 15 14 13 12 11 ZIP 1G 2Y4 2Y3 2Y2 2Y1 2A1 2A2 2A3 2A4 2G VCC 2G 1Y1 2A4 1Y2 2A3 1Y3 2A2 1Y4 2A1 1 3 5 7 9 11 13 15 17 19 2 4 6 8 10 12 14 16 18 20 1A1 1A2 1A3 1A4 GND 1Y4 1Y3 1Y2 1Y1 VCC y n pa Table 1. Pin Description Name I/O Description xA4-xA0 I Data Inputs xY4-xY0 O Data Outputs - Three State 1G/2G I Output Enables m o C n a w No Table 2. Function Tables FCT240/FCT2240 1G 2G 1G/2G Input A Output Y H X Z L L H L H L FCT244/FCT2244 2 1G 2G 1G/2G Input A Output Y H X Z L L L L H H QUALITY SEMICONDUCTOR, INC. MDSL-00011-04 DECEMBER 28, 1998 QS54/74FCT240T, 244T, 2240T, 2244T Table 3. Absolute Maxuimum Ratings Supply Voltage to Ground ................................................. –0.5V to 7.0V DC Output Voltage VOUT ................................................... –0.5V to 7.0V DC Input Voltage VIN ......................................................... –0.5V to 7.0V AC Input Voltage (for a pulse width ≤ 20ns) ................................. –3.0V DC Input Diode Current with VIN < 0 ........................................... –20mA DC Output Diode Current with VOUT < 0 ...................................... –50mA DC Output Current Max. Sink Current/Pin .................................. 120mA Maximum Power Dissipation ................................................... 0.5 watts TSTG Storage Temperature ............................................... –65° to 150°C Note: Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to QSI devices that result in functional or reliability type failures. Table 4. Capacitance(1) TA = 25°C, f = 1MHz, VIN = 0V, VOUT = 0V Pins(2) SOIC QSOP PDIP ZIP Unit 1, 19 4 4 5 7 pF 2-9,11-18 8 8 9 10 Notes: 1. Capacitance is characterized but not tested. 2. Pin reference for 20-pin package. n a w y n pa pF m o C Table 5. Power Supply Characteristics No Symbol Parameter Test Conditions(1) Quiescent Power Supply Current ∆ICC QCCD ICC Min Max Unit VCC = Max., freq = 0 0V ≤ VIN ≤ 0.2V or VCC-0.2V ≤ VIN ≤ VCC — 1.5 mA Supply Current per Input @ TTL HIGH VCC = Max., VIN = 3.4V, freq = 0(2) — 2.0 mA Supply Current per Input per MHz VCC = Max., Outputs Open and Enabled One BitToggling @ 50% Duty Cycle Other Inputs at GND or VCC(3,4) — 0.25 mA/ MHz Notes: 1. For conditions shown as Min. or Max., use the appropriate values specified under DC specifications. 2. Per TTL driven input (VIN = 3.4V). 3. For flip-flops, QCCD is measured by switching one of the data input pins so that the output changes every clock cycle. This is a measurement of device power consumption only and does not include power to drive load capacitance or tester capacitance. This parameter is guaranteed by design but not tested. 4. IC can be computed using the above parameters as explained in the Technical Overview section. MDSL-00011-04 DECEMBER 28, 1998 QUALITY SEMICONDUCTOR, INC. 3 QS54/74FCT240T, 244T, 2240T, 2244T Table 6. DC Electrical Characteristics Over Operating Range Industrial TA = –40°C to 85°C, VCC = 5.0V ±5% Symbol Military TA = –55°C to 125°C, VCC = 5.0V ±10% Parameter Test Conditions Min Typ(1) Max Unit VIH Input HIGH Voltage Logic HIGH for All Inputs 2.0 — — V VIL Input LOW Voltage Logic LOW for All Inputs — — 0.8 V ∆VT Input Hysteresis VTLH – VTHL for All Inputs — 0.2 — V | IIH | | IIL | Input Current Input HIGH or LOW VCC = Max., 0 ≤ VIN < VCC — — 5 µA | IOZ | Off-State Output Current (Hi-Z) VCC = Max., 0 ≤ VIN ≤ VCC — — 5 µA IOS Short Circuit Current (FCTXXX) VCC = Max., VOUT = GND(2,3) –60 — — mA IOR Current Drive (FCT2XXX – 25Ω) VCC = Min., VOUT = 2.0V(3) 50 — — mA VIC Input Clamp Voltage VCC = Min., IIN = –18mA, TA = 25°C(3) — VOH Output HIGH Voltage VCC = Min. IOH = –12mA (MIL) IOH = –15mA (IND) 2.4 2.4 VOL Output LOW Voltage (FCTXXX) VCC = Min. IOL = 48mA (MIL) IOL = 64mA (IND) VOL Output LOW Voltage (FCT2XXX – 25Ω) VCC = Min. ROUT Output Resistance (FCT2XXX – 25Ω) VCC = Min. w o N an y n pa –0.7 –1.2 V — — — — V — — — — 0.55 0.55 V IOL = 12mA (MIL) IOL = 12mA (IND) — — — — 0.50 0.50 V IOL = 12mA (MIL) IOL = 12mA (IND) — 20 25 28 — 40 Ω m o C Notes: 1. Typical values indicate VCC = 5.0V and TA = 25°C. 2. Not more than one output should be shorted and the duration is ≤1 second. 3. These parameters are guaranteed by design but not tested. 4 QUALITY SEMICONDUCTOR, INC. MDSL-00011-04 DECEMBER 28, 1998 QS54/74FCT240T, 244T, 2240T, 2244T Table 7. FCT240T, FCT2240T Switching Characteristics Over Operating Range Industrial TA = –40°C to 85°C, VCC = 5.0V ±5% CLOAD = 50pF, RLOAD = 500Ω unless otherwise noted. Military TA = –55°C to 125°C, VCC = 5.0V ±10% 2240 Symbol Description(1) Min 240A 2240A 240C 2240C 240D Max Min Max Min Max Min Max Unit tPHL tPLH Propagation Delay Ai to Yi (FCT240) IND MIL 1.5 1.5 8 9 1.5 1.5 4.8 5.1 1.5 1.5 4.1 4.7 1.5 — 3.8 — ns tPHL tPLH Propagation Delay Ai to Yi (FCT2240) IND MIL 1.5 1.5 8 9 1.5 1.5 4.8 5.1 1.5 1.5 4.1 4.7 — — — — ns tPZH tPZL Output Enable Time G to Yi (FCT240) IND MIL 1.5 1.5 10 10.5 1.5 1.5 6.2 6.5 1.5 1.5 5.8 6.5 1.5 — 5.6 — ns tPZH tPZL Output Enable Time G to Yi (FCT2240) IND MIL 1.5 1.5 10 10.5 1.5 1.5 6.2 6.5 1.5 1.5 5.8 6.5 — — — — ns tPHZ tPLZ Output Disable Time G to Yi IND(2) MIL(2) 1.5 1.5 9.5 10 1.5 1.5 5.6 5.9 1.5 1.5 5.2 5.7 y n pa 1.5 — 5.2 — ns m o C Table 8. FCT244T, FCT2244T Switching Characteristics Over Operating Range Industrial TA = –40°C to 85°C, VCC = 5.0V ±5% CLOAD = 50pF, RLOAD = 500Ω unless otherwise noted. w o N Symbol an Description Military TA = –55°C to 125°C, VCC = 5.0V ±10% 244 2244 (1) 244A 2244A 244C 2244C 244D Min Max Min Max Min Max Min Max Unit tPHL tPLH Propagation Delay Ai to Yi (FCT244) IND MIL 1.5 1.5 6.5 7.5 1.5 1.5 4.8 5.1 1.5 1.5 4.1 4.6 1.5 — 3.8 — ns tPHL tPLH Propagation Delay Ai to Yi (FCT2244) IND MIL 1.5 1.5 6.5 7.5 1.5 1.5 4.8 5.1 1.5 1.5 4.1 4.6 1.5 — 3.8 — ns tPZH tPZL Output Enable Time G to Yi (FCT244) IND MIL 1.5 1.5 8 8.5 1.5 1.5 6.2 6.5 1.5 1.5 5.8 6.5 1.5 — 5.6 — ns tPZH tPZL Output Enable Time G to Yi (FCT2244) IND MIL 1.5 1.5 8 8.5 1.5 1.5 6.2 6.5 1.5 1.5 5.8 6.5 1.5 — 5.6 — ns tPHZ tPLZ Output Disable Time G to Yi IND(2) MIL(2) 1.5 1.5 7 7.5 1.5 1.5 5.6 5.9 1.5 1.5 5.2 5.7 1.5 — 5.2 — ns Notes: 1. Minimums guaranteed but not tested. 2. This parameter is guaranteed by design but not tested. 3. See Test Circuit and Waveforms. MDSL-00011-04 DECEMBER 28, 1998 QUALITY SEMICONDUCTOR, INC. 5